Optics: measuring and testing inventions 07/06

20060164624 - Apparatus and method for providing spot lighting for gemstone observation: An apparatus, system and method for providing spot lighting for observing a gemstone is presented. In particular, the spot lighting provided by the invention allows for observing of the fire of a gemstone, i.e. the visible effects of light dispersion into separate colors. The apparatus includes a tube for receiving...

20060164625 - Fluorescence measuring device for gemstones: A gemstone fluorescence measuring device according to the invention generally includes an ultraviolet (“UV”) emission chamber, a UV radiation source, and a light meter assembly. The UV radiation source includes an upper light emitting diode (“LED”) and a lower LED that radiate a gemstone under test from both above and...

20060164623 - Method and system for online evaluation of gemstones: An online method and system for evaluating a gemstone is provided that enables a consumer to use a personal computer to evaluate the visual appearance and measurement data of the gemstone by emulating the laboratory instruments that previously collected the data for the gemstone. The computer is connected to the...

20060164626 - Wide spatial frequency topography and roughness measurement: In one embodiment, a system for inspecting a first surface of a substrate, comprises a first reflected radiation collector to generate a first signal set representing one or more characteristics of radiation reflected from the first surface from a radiation source disposed in a first plane of incidence, a spatial...

20060164628 - Device and method of optical fiber condition monitoring in optical networks: A device and method of optical fiber condition monitoring in optical networks is described. The front end of each branch of the optical network is installed with an optical filter that can filter an optical signal with a different wavelength. Optical signals of different wavelengths enter each of the branches...

20060164627 - Polarization diversity detection without a polarizing beam splitter: A fiber optic measurement device including an optical frequency domain reflectometer (10) performs polarization diversity detection without using a polarizing beam splitter....

20060164629 - Portable refractometer: A portable refractometer is provided that includes a lens barrel having a lens barrel axis. A prism is secured to one end of the lens barrel, the prism having an entry face that provides a boundary surface between the prism and a substance to be measured. A tube shaped optical...

20060164630 - Method and measuring device for contactless measurement of angles or angle changes on objects: The invention relates to a method for the contactless measurement of angles or angle modifications, distances or lateral displacements in objects. According to said method, an aperture is transilluminated by means of a ray bundle and after being reflected by a distant reflective element, which generates or is subjected to...

20060164631 - Optical scanner package having heating dam: An optical scanner package having a heating dam is provided. The optical scanner package having a heating dam includes: an optical scanner on which a mirror surface is formed; a ceramic package in which the optical scanner is installed at the bottom of a cavity thereof; a glass lid covering...

20060164632 - Method and apparatus for position-dependent optical metrology calibration: A calibration method suitable for highly precise and highly accurate surface metrology measurements is described. In preferred embodiments, an optical inspection tool including a movable optics system is characterized in terms of position and wavelength dependent quantities over a range of motion. Once the position-dependant quantities are determined at various...

20060164633 - Attenuated-total-reflection measurement apparatus: An attenuated-total-reflection measurement apparatus 10 of the present invention collects light onto a contact surface between a sample and an ATR prim 14 at an incident angle greater than or equal to a critical angle and measures total-reflection light from the contact surface. The attenuated-total-reflection measurement apparatus 10 comprises: a...

20060164636 - Integrated modular system and method for enhanced raman spectroscopy: Devices, systems, and methods for enhancing Raman spectroscopy and hyper-Raman are disclosed. A molecular analysis device for performing Raman spectroscopy comprises a substrate and a laser source disposed on the substrate. The laser source may be configured for emanating a laser radiation, which may irradiate an analyte disposed on a...

20060164637 - Integrated system and method for transversal enhanced raman spectroscopy: Devices and methods for enhancing Raman Spectroscopy are disclosed. A molecular analysis device for performing Raman spectroscopy comprises a substrate and a laser source disposed on the substrate. The laser source is configured for generating a laser radiation with a direction substantially parallel with the substrate. The molecular analysis device...

20060164635 - Monolithic system and method for enhanced raman spectroscopy: Devices, systems, and methods for enhancing Raman spectroscopy and hyper-Raman are disclosed. A molecular analysis device for performing Raman spectroscopy comprises a substrate and a laser source disposed on the substrate. The laser source may be configured for emanating a laser radiation, which may irradiate an analyte disposed on a...

20060164634 - Nano-enhanced raman spectroscopy-active nanostructures including elongated components and methods of making the same: An NERS-active structure is disclosed that includes a substrate and at least one elongated component disposed on the substrate. The at least one elongated component may include two conducting strips including an NERS-active material and an insulating strip positioned between the two conducting strips. Alternatively, the at least one elongated...

20060164638 - Near-field film-thickness measurement apparatus: A near-field film-thickness measurement apparatus having a spatial resolution at or below the wavelength of light and having sufficient film-thickness measurement precision. The near-field film-thickness measurement apparatus 10 comprises a scattering near-field probe 12, a light source 14, a detector 18, a spectroscope 16 disposed in an optical path between...

20060164639 - Cross-dispersed spectrometer in a spectral domain optical coherence tomography system: A spectral-domain optical coherence tomography system using a cross-dispersed spectrometer is disclosed. The interfered optical signal is dispersed by a grating into several orders of diffraction, and these orders of diffraction are separated by an additional dispersive optical element. The spectral interferogram is recorded by a set of linear detector...

20060164640 - Near infrared chemical imaging microscope: A chemical imaging system is provided which uses a near infrared radiation microscope. The system includes an illumination source which illuminates an area of a sample using light in the near infrared radiation wavelength and light in the visible wavelength. A multitude of spatially resolved spectra of transmitted, reflected, emitted...

20060164641 - Calibration system and method for calibration of various types of polarimeters: A calibration system is integrally provided with a polarimeter in which the calibration system and the polarimeter each receives a radiance sample from a spectral band of a scene. Radiances provided by the calibration system used to provide the relative responsivity calibrations among the polarimeter channels are essentially depolarized so...

20060164642 - Achromatic spectroscopie ellipsometer with high spatial resolution: The invention concerns an achromatic spectroscopic ellipsometer for analysing small regions of a sample (1) over a wide range of wavelengths from ultraviolet (UV) to infrared (IR). The spectroscopic ellipsometer contains a light source (2) emitting a light beam (3). The light beam (3) goes through a polarisation state generator...

20060164643 - Multispectral, multifusion, laser-polarimetric optical imaging system: A multi-energy polarization imaging method consisting of a multi-fusion, dual-rotating retarder/multiple-energy complete Mueller matrix-based polarimeter and dual-energy capabilities, has been invented. The term multifusion describes the use of several imaging functions altogether such as polarimetric imaging, dual-energy subtraction, multifocal imaging and other. By substracting polarimetric parameters such as degree of...

20060164644 - Robotic apparatus for picking of cells and other applications with integrated spectroscopic capability: A robotic apparatus of the kind having a sample manipulation head with associated positioning system mounted above the main bed of the apparatus, as used for picking of cells, in particular animal cells, or for other biological or chemical applications. An imaging station is arranged on the main bed where...

20060164647 - Apparatus for marking a defect: An apparatus for marking a defect detects a defect in a long sheet product transferred in a longitudinal direction by an inspection apparatus and places a mark at the defect at a position downstream of the inspection apparatus. An oil-based marking pen is contained in a container tube having a...

20060164646 - Device for scanning a thread by an optical beam: The invention relates to a device for scanning a thread, which is displaceable in the longitudinal direction thereof inside a measuring slot, by means of an optical beam emitted by a light source. The device includes a receiver of light reflected on the thread and a unit for processing electrical...

20060164645 - Synchronous optical measurement and inspection method and means: A method for finding holes, and other related defects and measuring characteristics of sheets of industrial material. Optical detections systems are constantly plagued by intense ambient light and challenged in accuracy. The invention exhibits a defect detection method and apparatus that is resistant to intense ambient light and is capable...

20060164649 - Multi-spectral techniques for defocus detection: A method and apparatus for improved defocus detection on wafers. The use of hyperspectral imaging provides increased sensitivity for local defocus defects, and the use of Fourier Space analysis provides increased sensitivity for extended defocus defects. A combination of the two provides improved overall sensitivity to local and extended defocus...

20060164648 - Optical accelerometer, gravitometer, and gradiometer: An optical accelerometer, gravitometer, and gradiometer have a light source, a beam splitter, a light medium, and a plurality of mirrors. The light beam from the light source is split into two beams that counter-propagate through the accelerometer. The acceleration experienced by the accelerometer causes a phase shift in the...

20060164650 - Single sensor ring laser gyroscope: A ring laser gyroscope is described which includes a laser cavity configured to provide an optical laser path for a pair of counter-propagating laser beams, an optical sensor configured to receive a portion of the energy from the counter-propagating laser beams, and a unit configured to receive outputs from the...

20060164651 - Method for regulating the operating frequency and multifunctional integrated circuit chip for a fiber-optic gyroscope: A method for regulating the operating frequency of a closed loop fiber optic gyroscope. The demodulated output signal of a detector, as actual signal, is applied to the input of a main controller and, via a gating filter, to a VCO that determines the system clock of the FOG. An...

20060164652 - Method and apparatus for measuring polarization mode dispersion: m

20060164653 - Method of motion correction in optical coherence tomography imaging: An image data set acquired by an optical coherence tomography (OCT) system is corrected for effects due to motion of the sample. A first set of A-scans is acquired within a time short enough to avoid any significant motion of the sample. A second more extensive set of A-scans is...

20060164654 - Single metal nanoparticle scattering interferometer: An interferometer and a method for generating scattered light interference are provided. A beam splitter is provided by a single metal nanoparticle to split an incoming excitation light. Scattered light from the single metal nanoparticle and its mirror image shows interference in both spatial and spectral domains. A mirror modifies...

20060164655 - Method for determining wavefront aberrations: In a method for manufacturing an optical imaging system, wavefront aberrations caused by an optical imaging system are determined before and after transporting the optical imaging system. At least some of the aberration parameters which are determined in the preceding determination are used as a given precondition for determining aberration...

20060164657 - Determining wafer orientation in spectral imaging: Devices and methods for determining wafer orientation in spectral imaging are described. The devices and methods generate an image of a wafer that includes at least one spectral dimension. One or more properties are determined from the spectral dimension, and a map is generated based on the property. The generated...

20060164656 - Method and system for measuring overcoat layer thickness on a thin film disk: A method for measuring the thickness of a thin film disk overcoat layer includes radiating x-rays on a thin film disk comprising at least one base layer and an overcoat layer, collecting fluorescence data on electromagnetic radiation fluoresced from the thin film disk, reflecting polarized light from a surface of...

20060158639 - Eye tracker and pupil characteristic measurement system and associated methods: Systems and methods for tracking eye movement includes directing an incident light beam onto each facet of a pyramidal prism to produce a plurality of beams that form a plurality of light spots, at least two of the light spots having different diameters. The prism is translatable to effect a...

20060158640 - Method and apparatus for humidifying gas and for condensing steam on condensation nuclei: For the reliable condensation of steam on condensation nuclei in an aerosol flow and therefore for enlarging the particles in the aerosol, the invention provides a method which is characterized in that condensation nuclei are passed through an inner area of an evaporating zone forming a flow area, the liquid...

20060158641 - Methods and devices for measuring a concentrated light beam: Methods and devices are provided for profiling a beam of light that includes a wavelength λ. The beam of light is received. Secondary light is generated at a wavelength λ′ different from wavelength λ by fluorescing a material with the received beam of light. The secondary light is separated from...

20060158642 - Apparatus and method of inspecting mura-defect and method of fabricating photomask: A mura-defect inspection apparatus 10 includes: a light source 12 which irradiates light onto a photomask 50 having a repeated pattern that a unit pattern is regularly arranged on a surface 52A of a transparent substrate 52; and a photoreceptor 13 which receives reflected light from the photomask to convert...

20060158643 - Method and system of inspecting mura-defect and method of fabricating photomask: In a mura-defect inspection method which inspects a mura-defect generated in a repeated pattern of a photomask 50 having a repeated pattern that a large number of unit patterns are regularly arranged, an area having a repeated pattern to be a target for a mura-defect inspection is specified as an...

20060158644 - Near re-entrant dense pattern optical multipass cell: A multiple pass optical cell and method comprising providing a pair of opposed mirrors, one cylindrical and one spherical, introducing light into the cell via an entrance mechanism, and extracting light from the cell via an exit mechanism, wherein the entrance mechanism and exit mechanism are coextensive or non-coextensive....

20060158645 - Method for raman computer tomography imaging spectroscopy: A method for measuring spatial and spectral information from a sample using computed tomography imaging spectroscopy. An area of the sample is illuminated using an illumination source having substantially monochromatic light. Raman scattered light is directed from said illuminated area of said sample onto a two dimensional grating disperser. Light...

20060158646 - Method and system for remote sensing of optical instruments and analysis thereof: A sensor is provided for analyzing an object at a focal point of a lens. The sensor includes a focused radiant energy source directed at the lens. The focused radiant energy source transmits a first beam of energy to the lens, vaporizing a portion of the object at the focal...

20060158648 - Device for the analysis of the qualitative composition of gases: A device for the analysis of the qualitative, optionally also the quantitative composition of gases, uses measuring light of known spectral composition that can pass through the gas to be analyzed and the gas can be caused to interact. A detector arrangement is present, which can detect light originating from...

20060158647 - Video tracking-based real-time hyperspectral data acquisition: A spectroscopy system for high-accuracy, highly automated spectral imaging of a target is provided. Video and spectrometry information are obtained via an integrated video, spectrometry and distance sensing platform and processed by a computer. The processed video and spectrometry information are presented in real-time on an integrated display, with a...

20060158649 - Method for wavelength calibration of an optical measurement system: An optical measurement system having a spectrophotometer and a ellipsometer is calibrated, the spectrophotometer and the ellipsometer first being calibrated independently of one another. A spectrophotometer layer thickness (dphoto) of a specimen is then determined at an initial angle of incidence (θinit) using the spectrophotometer. An ellipsometer layer thickness (delli)...

20060158650 - Substrate processing apparatus: In order to perform a measurement operation of a pattern and a processing operation in parallel while the positions of two substrate stages are accurately measured and wire/hose units are prevented from becoming tangled, a substrate processing apparatus includes an alignment system for measuring the pattern arrangements of the substrates,...

20060158651 - Scatterometry alignment for imprint lithography: Described are methods for patterning a substrate by imprint lithography. Imprint lithography is a process in which a liquid is dispensed onto a substrate. A template is brought into contact with the liquid and the liquid is cured. The cured liquid includes an imprint of any patterns formed in the...

20060158652 - Measuring soil light response: A soil measurement probe (21) includes a window (38) mounted in an opening (40) in the outer surface (34) of the probe, a light source (42) disposed within the probe and directed toward the window for illuminating the soil in situ, with light of wavelengths corresponding to the colors red,...

20060158653 - Metal ion concentration analysis for liquids: An apparatus utilizes miniaturized surface plasmon resonance (SPR) and ion-selective self-assembled monolayer (SAM) and hydrogel chemistry to measure metal ion concentrations in liquids. The SPR optical system is packaged in a compact and cost-effective form factor. An electronic circuit drives the optical system. The SPR system utilizes an optical window...

20060158654 - Optical detecting module and optical detector thereof: An optical detector measuring a movement of an object in a space on a measurement axis comprises a light source, a reflective portion, a detection unit and a converting unit. The light source comprises a resonance chamber, the light source emitting a laser beam toward the object, the laser beam...

20060158655 - Apparatus and method for combined optical-coherence-tomographic and confocal detection: This invention provides a better apparatus and method for the generation of Optical Coherence Tomography (OCT) and Confocal Scanning Laser Ophthalmoscope (CSLO) images, using a dual-waveguiding module. A dual-waveguiding structure consists of a single-mode and a multi-mode waveguide each with optimum size and numerical aperture for highly efficient collection of...

20060158656 - Apparatus for direct-to-digital spatially-heterodyned holography: An apparatus operable to record a spatially low-frequency heterodyne hologram including spatially heterodyne fringes for Fourier analysis includes: a laser; a beamsplitter optically coupled to the laser; an object optically coupled to the beamsplitter: a focusing lens optically coupled to both the beamsplitter and the object; a digital recorder optically...

20060158659 - Interferometer for determining characteristics of an object surface: Disclosed is a system including: (i) an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference pattern, the electromagnetic radiation being derived from a common source; (ii) a multi-element detector;...

20060158657 - Interferometer for determining characteristics of an object surface, including processing and calibration: Disclosed is a system including: (i) an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference pattern, the electromagnetic radiation being derived from a common source; (ii) a multi-element detector;...

20060158658 - Interferometer with multiple modes of operation for determining characteristics of an object surface: Disclosed is a system including: (i) an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference pattern, the electromagnetic radiation being derived from a common source; (ii) a multi-element detector;...

20060158660 - Non-destructive optical imaging system for enhanced lateral resolution: In some embodiments, an optical imaging system comprises a non-destructive optical device that obtains information concerning a target object and a X,Y positioning system that is capable of positioning one or both of the target object and the optical device to pre-determined offset locations more closely spaced than the obtainable...

20060158661 - Three-dimensional shape detecting device, three-dimensional shape detecting system, and three-dimensional shape detecting program: In a three-dimensional shape detecting system comprising a three-dimensional shape detecting device and an external calculating device, the three-dimensional shape detecting device includes: projection means which projects pattern light onto a subject; image data obtaining means which captures a pattern light projection image of the subject and thereby obtains image...

20060158663 - Apparatus for and method of measurements of components: An arrangement for measuring components has a manipulator, at least one measuring system in operative connection with the manipulator, the at least one measuring system including at least one contour measuring device associated with the manipulator and generating an optical sensing surface sweeping a measuring region, an at least one...

20060158662 - Scanner and method for operating a scanner: A scanner for providing a possibility of detecting a surface relief of an object includes a projector configured to guide a light beam in an illumination line over the surface relief to obtain an illuminated location on the surface relief, the projector being further configured to output a projection signal...

20060158664 - Three-dimensional image measuring apparatus: The present invention relates to a three-dimensional image measuring apparatus comprising: an XYZ shaft transfer means mounted onto a base member; a work stage mounted to the base member, for moving a measuring object to a measuring position and thereafter supporting it and having a predetermined reference surface set at...

20060158665 - Method and apparatus for imaging three-dimensional structure: Determining surface topology of a portion (26) of a three-dimensional structure is provided. An array of incident light beams (36) passing through a focusing optics (42) and a probing face is shone on said portion. The focusing optics defines one or more focal planes forward the probing face in a...

20060158666 - Device for determining a position of a light beam and method for operating a device for determining a position of a light beam: A device for determining a position of a light beam within an illumination line includes a light source for providing the light beam, wherein the light source is configured to move the light beam with a predefined movement in a movement area. Further, the device for determining includes a shutter...

20060152704 - Remote center range finder: A system for measuring the distance from a first point spaced away from a surface of an object to a second point on a surface of the object along an axis extending through the first and second points includes one or more light projection assemblies for projecting light stripes onto...

20060152705 - Radar apparatus: In a radar apparatus, a radar device emits a transmission wave to a periphery of a vehicle and detects a reflected wave of the transmission wave through a window part. As a member for restricting or reducing adhesion of dirt and foreign materials to the window part, an air duct...

20060152706 - Multi-modal authentication, anti-diversion and asset management and method: The present invention employs multi-modalities for authentication, anti-diversion, and asset management (AADAM). The multi-modalities employed in the AADAM system include combinations of Raman spectral analysis; DNA/RNA and other biologic taggants, optionally animal consumable; pit & land marks; algorithmic marks; and spectral analysis with quantum dots (QD's)....

20060152708 - Multiparametric detection in a fluidic microsystem: Disclosed is a method for measuring properties of particles that move through a fluidic microsystem, the particles being suspended in a liquid. According to the inventive method, a first parameter of a specific particle is first measured at a first test station (11). A second parameter of the particle is...

20060152707 - System for collecting information on biological particles: A system (1) for collecting biological information on a dyed biological particle (cell or chromosome) by irradiating light onto liquid containing the dyed biological particles and for detecting information light therefrom is provided according to the present invention. The system includes a path-defining structure (2) of transparent material defining a...

20060152709 - Lens meter: A lens meter having a simple configuration, which is capable of precisely measuring optical characteristics such as refractive power distribution in a wide range of a subject lens to be measured at a time. The lens meter has a projection unit which projects a measurement light bundle, a projection lens...

20060152711 - Non-contact vehicle measurement method and system: An image-based, non-contact measurement method and system for determining spatial characteristics and parameters of an object under measurement. Image capturing devices, such as cameras, are used to capture images of an object under measurement from different viewing angles. A data processing system performs computations of spatial characteristics of the object...

20060152710 - Optical inclinometer: The invention relates to an optical inclinometer. According to the invention, an incline-dependent medium, e.g. a liquid surface, is positioned in the pupil of an optical subsystem and a detectable wave front is imaged onto a detector by means of said medium. A phase displacement of radiation emitted from a...

20060152712 - Apparatus and methods for inspecting tape lamination: A system for inspecting a composite material laid onto a substrate by a lamination machine. An imaging assembly attached to a rear portion of a delivery head of the machine obtains an image of at least a portion of the laid material beneath the imaging assembly. A processor inspects the...

20060152713 - Optical laminate: The present invention disclosed an optical laminate that can realize excellent contrast and image visibility. The optical laminate comprises: a light transparent base material; and an antistatic agent-containing hardcoat layer and a lower-refractive index layer provided in that order on the light transparent base material, wherein the optical laminate has...

20060152716 - Double sided optical inspection of thin film disks or wafers: A double-sided optical inspection system is presented which may detect and classify particles, pits and scratches on thin film disks or wafers in a single scan of the surface. In one embodiment, the invention uses a pair of orthogonally oriented laser beams, one in the radial and one in the...

20060152714 - Test head for optically inspecting workpieces: An optical test apparatus comprises a first: a) a motor that rotates a spindle which in turn rotates a workpiece such as a magnetic disk substrate; b) an upper test head comprising a laser for providing an upper laser beam to the upper surface of the workpiece, an upper lens...

20060152715 - Test head for optically inspecting workpieces comprising a lens for elongating a laser spot on the workpieces: An optical test head comprises a laser source for providing a laser beam. The laser beam passes through a cylindrical lens for modifying the shape of the beam and a spherical lens for concentrating the beam onto a workpiece (typically a magnetic disk platter). The cylindrical lens both a) elongates...

20060152717 - Method and system for detecting defects: System for scanning a surface, comprising a light source producing an illuminating light beam; an objective lens assembly, located between the light source and the surface; a plurality of interchangeable telescopes, a selected one of the interchangeable telescopes being located between the light source and the objective lens assembly; and...

20060152718 - Systems and methods for selecting a reference database for determining a spectrum of an object based on fluorescence of the object: To determine the spectra of objects that have different degrees of fluorescence, a plurality of reference databases are provided, each reference database being suited to a different degree of fluorescence. A most appropriate one of the reference databases is selected based on a predicted degree of fluorescence of an object...

20060152719 - Method and apparatus for performing twin entangled co-incident photon enhanced raman spectroscopy and an inspection apparatus using the same: A method and apparatus to perform non-invasive molecular detection and analysis are disclosed. The apparatus incorporates co-incident biphotons as the Raman backscattering excitation source and the detection and analysis of the resulting backscatter characteristics is performed through quantum state transfer between entangled biphotons, as well as conventional means....

20060152720 - Method and device for the detection of the presence, and the real-time analysis of, chemical and/or biological substances in the atmosphere: The invention relates to a device for analysing a gaseous composition by means of flame spectrophotometry, which can be used to identify a current test spectrum and which is based on a knowledge acquisition and diagnostic method. The inventive method comprises the following steps: the main component analysis of reduced...

20060152721 - Method and device for identifying micro organisms: The invention relates to a method and device for identifying at least one micro organism and/or micro organism species and for measuring the portion of at least one micro organism and/or micro organism species from a sample. The method includes the use of two different fluorescent agents and the excitation...

20060152722 - Method and apparatus for measuring particle motion optically: A method and apparatus for measuring particle motion using electromagnetic radiation uses beams of radiation modulated with a distinct frequency and/or phase. A particle traversing these beams scatters a portion of the radiation. Scattered radiation, which retains its modulation information, is then detected, and a cross-correlation technique is used to...

20060152723 - Complementary division mask having alignment mark, method for forming alignment mark of the complementary division mask, semiconductor device manufactured by using the complementary division mask, and its manufacturing method: In fabrication of a semiconductor device having plural patterns on a plurality of layers by using complementary divided masks each having alignment marks distributed therein, because of the presence of a plurality of complementary divided mask layers, misalignment between respective layers tends to occur. To solve this problem, divided alignment...

20060152724 - Color measurement instrument: An LED-based color measurement instrument including an illumination system and a sensing system. The illumination system includes modulated LEDs and a temperature control system for regulating the temperature of the LEDs, thereby improving the consistency of their performance. The sensing system includes a photodiode, a transimpedance amplifier, and an integrator...

20060152725 - Color measurement instrument: An LED-based color measurement instrument including an illumination system and a sensing system. The illumination system includes modulated LEDs and a temperature control system for regulating the temperature of the LEDs, thereby improving the consistency of their performance. The sensing system includes a photodiode, a transimpedance amplifier, and an integrator...

20060152726 - Ultrasensitive spectrophotometer: The invention concerns measurements in which light interacts with matter giving rise to changes in light intensity, and preferred embodiment spectrophotometer devices of the invention provide for ultrasensitive measurements through a reflection interaction with matter. The level of light source noise in these measurements can be reduced in accordance with...

20060152727 - Fluorescence detection system: Apparatus and methods for exciting and detecting fluorescence in samples are disclosed. In one embodiment, a sample holder for holding a plurality of samples is provided together with an optical manifold having an excitation source, a photo receiver, or both, for each of the plurality of samples. In another embodiment,...

20060152728 - Illuminator for inspecting substantially flat surfaces: Illuminating apparatus for illuminating a workpiece during visual inspection thereof, including a first light source emitting light over a continuous angle of illumination toward the workpiece, blocking element arranged to block light over a portion of the continuous angle such that two portions of the illumination, separated by a blocked...

20060152729 - Tunable laser-based process monitoring apparatus: A chemical imaging and process monitoring device which utilizes a computer controlled tunable laser to provide light at discrete wavelengths in the near infrared band and a focal plane array to image or a single-point photo detector to detect the intensity of light reflected from a sample illuminated at various...

20060152730 - Optical sensor for determining the concentrations of dyes and/or particles in liquid or gaseous media and method for operating the same: The invention relates to an optical sensor (1) for determining particle and/or dye concentrations in liquid or gaseous media and to a method for operating the same. The optical sensor (1) comprises at least one measuring head. The measuring head consists of an emitter unit (2) with a semiconductor emitting...

20060152731 - Spectrometer: A reflection spectrometer provided with a probe to which the radiation of at least one radiation source can be transmitted by at least one radiation emission conductor transmitter in such a way that said radiation source can be directed to or in an investigated object and which makes it possible...

20060152732 - Device for the generation of a carrier for an interferogramme: A process for generating a carrier in an interferogram in an interferometry device either of the “real-time holographic interferometry” type or of the “double-exposure holographic interferometry” type, including recording a first wave front on a hologram and coming from an object; generating a second wave front, which two wave fronts...

20060152733 - Method and apparatus for reducing crosstalk interference in an inline fabry-perot sensor array: A method and apparatus for reducing crosstalk between sensors in an inline Fabry-Perot (FP) sensor array. The inline FP sensor array comprises a plurality of fiber Bragg gratings arranged periodically along an optical fiber. The sensors are formed between each of the Bragg gratings. A light source provides multiplexed pulses...

20060152734 - Temperature/thickness measuring apparatus, temperature/thickness measuring method, temperature/thickness measuring system, control system and control method: A measuring apparatus comprises a light source that emits light with a wavelength that allows the light to be transmitted through and reflected at each measurement target, a splitter that splits the light from the light source into measurement light and reference light, a reference mirror at which the reference...

20060152735 - Vibration measurement device and vibration measurement method: This invention provides a device or method for measuring vibration with high sensitivity and over a wide bandwidth. A curved section is formed in an optical fiber. The curved section is disposed on a place to be measured. Light is input in the optical fiber, and then variation of frequency...

20060152736 - Thickness measuring device: A Michelson interferometer 1 of a thickness measuring device 100 comprises two optical cables 4 and 5 connected by an optical coupler 3, and the optical cables 4 and 5 are formed by polarization optical fibers 41 or the like, connected by the optical connectors 42 or the like. The...

20060152737 - Method and apparatus for electronically generating an outline indicating the size of an energy zone imaged onto the ir detector of a radiometer: A radiometer includes a sighting system that generates a digital image of an object surface having an area that is to be imaged onto the IR detector. A shape outline is overlaid on the digital image of an object surface to indicate the extent of the energy zone that is...

20060152738 - Three-dimensional shape detecting device, image capturing device, and three-dimensional shape detecting method: There is provided a three-dimensional shape detecting device comprising: pattern beam projection means which projects a plurality of pattern beams including two pattern beams having different angular widths; image capturing means which captures an image of a subject onto which the pattern beams are projected, from a position a prescribed...

20060152740 - Method and a device for optically detecting the position of an object by measuring the light reflected by this object: This detection method comprises: a step during which a receiver measures the quantity of light reflected by an object when the object is illuminated by an emitter for at least two different emitter—receiver pairs on the same side relative to the object, a step of calculating at least two characteristic...

20060152739 - Miniature electro-optic device and corresponding uses thereof: A miniaturized electro-optical device having a first zone facing a second zone, a first condenser plate, a second condenser plate arranged in the second zone and smaller than or equal to the first condenser plate, an intermediate space between both zones, with a conductive element arranged therein and which is...

20060152741 - Method and apparatus for backlighting and imaging multiple views of isolated features of an object: Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for imaging an object having a first side and a...

20060146314 - Elastic-wave monitoring device and surface-acoustic-wave device: An elastic-wave monitoring device includes an optical system which is arranged so that a circularly polarized light from a light source is incident to a measured object and a light beam from the measured object passes through a polarizing filter to a photodetector. A detection unit detects periodic fluctuation components...

20060146315 - Method and apparatus for compact dispersive imaging spectrometer: The disclosure generally relates to a method and apparatus for compact dispersive imaging spectrometer. More specifically, one embodiment of the disclosure relates to a portable system for obtaining a spatially accurate wavelength-resolved image of a sample having a first and a second spatial dimension. The portable system can include a...

20060146316 - Method for monitoring micro-lens curvature in-line: A method and system for monitoring a curvature of a micro-lens in-line is disclosed. According to embodiments, sizes of circles (or circle images) from a top view of a micro-lens are measured and correlated to a change in focus depth of an optical scope. A method in accordance with embodiments...

20060146317 - Label-independent detection of unpurified analytes: The present invention features use of evanescent field sensing to detect or evaluate unpurified, unlabeled analytes in raw samples. Capture molecules capable of binding to an analyte of interest can be immobilized to a sensing surface of an evanescent field sensor. The interaction between the analyte of interest in a...

20060146318 - Method and apparatus for self-testing of test equipment: A method of self-testing includes transmitting a plurality of self-test signals and receiving the plurality of self-test signals. In addition, the method includes storing the received self-test signal in a first database; and comparing the received self-test signal with data from a second database. An self-testing apparatus and a method...

20060146319 - Optical inspection of a specimen using multi-channel responses from the specimen: A method and inspection system to inspect a first pattern on a specimen for defects against a second pattern that is intended to be the same where the second pattern has known responses to at least one probe. The inspection is performed by applying at least one probe to a...

20060146321 - Method and apparatus for position-dependent optical metrology calibration: A calibration method suitable for highly precise and highly accurate surface metrology measurements is described. In preferred embodiments, an optical inspection tool including a movable optics system is characterized in terms of position and wavelength dependent quantities over a range of motion. Once the position-dependant quantities are determined at various...

20060146320 - Mortar projectile inspection apparatus and method: A structural member of a mortar projectile is inspected. The structural member is a composite structure having a thermoplastic matrix with a filler of steel balls. The composite structure has a central cavity into which is placed a strobe light. Surrounding the composite structure is a detection arrangement having a...

20060146323 - Nanowires for surface-enhanced raman scattering molecular sensors: A SERS-active structure is disclosed that includes a substrate and at least two nanowires disposed on the substrate. Each of the at least two nanowires has a first end and a second end, the first end being attached to the substrate and the second end having a SERS-active tip. A...

20060146322 - Raman probe and raman spectrum measuring apparatus utilizing the same: A Raman probe that can be used with high-intensity excitation light without producing light that interferes with the measurement of Raman scattering. A receiving-end filter is doughnut-shaped, with an exciting-end filter disposed at the center thereof. A light-blocking structure is provided between the exciting-end filter and the receiving-end filter such...

20060146324 - Spectrophotometer: An analyser or spectrophotometer for the detection of material is described with a single source with variable intensity, a single detector having a variable spectral response where the sample is able to be analyzed based on varying the intensity and spectral response. Various methods are described for varying the intensity,...

20060146325 - Device for multifocal confocal microscopic determination of spatial distribution and for multifocal fluctuation analysis of fluorescent molecules and structures with flexible spectral detection: Many points on a sample are tested simultaneously in parallel in an FCS method with multifocal illumination and/or detection....

20060146326 - Light measuring apparatus and method for measuring monochromatic light: A color luminance meter 1 is provided with a polychrometer 4 as a spectral optical system including a light receiving sensor array 43, a signal processing circuit 5 and an operation control unit 6. The operation control unit 6 carries out calculations to obtain characteristics of a measurement light based...

20060146327 - Aerosol mobility size spectrometer: A device for measuring aerosol size distribution within a sample containing aerosol particles. The device generally includes a spectrometer housing defining an interior chamber and a camera for recording aerosol size streams exiting the chamber. The housing includes an inlet for introducing a flow medium into the chamber in a...

20060146328 - Magneto-optical imaging method and device: A quantitative magneto-optical imaging method is used to form an image of a target material. An active material is placed close to the target material and produces a Faraday rotation in a polarized light beam. The Faraday rotation of the active material is essentially proportional to the magnetization of the...

20060146329 - Device for aligning substrate with mask and method using the same: A device for aligning a substrate and a mask, and a method using the same, where the device includes aligning marks in unused portions of the substrate and the mask, a sensing unit for determining overlap of the aligning marks when the substrate is aligned with the mask, and a...

20060146330 - Color measurements of ambient light: A technique for measuring the color of ambient light involves a color sensor with color-specific interference filters and a diffuse reflecting surface that is configured to ensure that the ambient light is incident on the color-specific interference filters at the angle that produces optimal filtering. The diffuse reflecting surface causes...

20060146331 - Method and apparatus for imaging through scattering or obstructing media: Method and system for determining the optical temporal response of a medium (12) to a short optical pulse excitation, by sending light (11) that comprises spectral frequencies which make up the Fourier Transform of the short pulse to be emulated through the medium. The relative amplitude and phase change (20)...

20060146332 - Linear wave guide type surface plasmon resonance microsensor: An improved linear wave guide type surface plasmon resonance (SPR) microsensor, particularly a microsensor employing a dual-opening multi-channel design, adopts a cross differential comparison to enhance the performance of the microsensor and uses a surface plated metal thin film to provide a wavelength absorption according to a SPR characteristic and...

20060146333 - Sensor unit for assay in utilizing attenuated total reflection: A surface plasmon resonance sensor unit includes a prism. A thin film has a first surface and a sensing surface. The first surface, overlies the prism to constitute a thin film/prism interface. The sensing surface immobilizes a sample in sample fluid. Illuminating light is applied to the interface in a...

20060146334 - Apparatus for varying the path length of a beam of radiation: An apparatus for varying the path length of a beam of radiation, the apparatus comprising: an element (51) rotatably mounted about an axis, said element comprising two reflective surfaces in fixed relation to one another such that radiation may be reflected between said reflective surfaces and out of the element...

20060146335 - Apparatus and method to facilitate laser gyroscope ionization: An apparatus and method is provided for facilitating ionization of a gas medium of a laser gyroscope. The apparatus and method employ a solid state light emitting device as a start aid for the laser gyroscope. The solid state light emitting device has a wavelength at or below a threshold...

20060146336 - Interferometer arrangement and interferometric measuring method: The invention relates to an interferometer arrangement (1000) having at least one measuring beam path for providing light in an object area, at least one reference beam path and at least one unit for superposing light of the measuring beam path with light of the reference beam path and a...

20060146337 - Interferometric method and apparatus for measuring physical parameters: A method of measuring a selected physical parameter at a location within a region of interest comprises the steps of: launching optical pulses at a plurality of reselected interrogation wavelengths into an optical fibber (1) deployed along the region of interest, reflectors (20,21,2n) being arrayed along the optical fibber (1)...

20060146338 - Optical tomographic apparatus: An optical tomographic apparatus is provided and includes a light source portion, and an interferometer including a probe. A vicinity of a fore-end of a probe is provided with a concave mirror and a portion spaced apart from the concave mirror by a distance therebetween is provided with a semitransparent...

20060146339 - Optical tomographic apparatus: An optical tomographic apparatus is provided and includes a light source portion, an interferometer, and a signal processing portion. The light source portion including two low coherent light sources capable of simultaneously emitting light having wavelength bands different from each other. The emitted light is divided in two of a...

20060146341 - Interferometric system with reduced vibration sensitivity and realated method: A source module (12) generates mutually orthogonally polarized beams of light as emanating from two spatially separated point sources (Sv, Sw) for use in a phase shifting interferometer....

20060146340 - Simultaneous phase shifting module for use in interferometry: A back-end assembly for use with a front-end assembly in acquiring phase-shifted interferograms having a plurality of imaging modules (Ma, Mb, Mc). Each module (Ma, Mb, Mc) has a quarter wave plate (30a, 30b, 30c), a polarizer (32a, 32b, 32c), and an image sensor (34a, 34b, 34c) so that each...

20060146342 - Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element: A phase shifting interferometric method and apparatus comprises generating at least four different phase shifts and recording interferograms corresponding to the different phase settings and recording interferograms corresponding to the different phase settings. In the analysis of the recorded interferograms the generated phase shifts between the at least four different...

20060146343 - Scatterometer and a method for observing a surface: A scatterometer comprising light source means (11) for providing an incident light beam (8) at different angles in the direction of a sample (5) to be analyzed, and a concave screen (1,2) for receiving the reflection (19) of the incident light beam (8). The screen (1,2) has substantially the shape...

20060146344 - Method for determining optimum grating parameters for producing a diffraction grating for a vuv spectrometer: The invention relates to a method for determining a set of grating parameters for producing a diffraction grating for a VUV spectrometer, the parameters used being the small and the large radius of the toroidal grating substrate (ρ and R), the two distances between the two holographic illumination points and...

20060146345 - Methods and apparatus for measurement of a dimensional characteristic and methods of predictive modeling related thereto: A method of optically determining a change in magnitude of at least one dimensional characteristic of a sample in response to a selected chamber environment. A magnitude of at least one dimension of the at least one sample may be optically determined subsequent to altering the at least one environmental...

20060146347 - Scatterometry method with characteristic signatures matching: A system and method for efficiently and accurately determining grating profiles uses characteristic signature matching in a discrepancy enhanced library generation process. Using light scattering theory, a series of scattering signatures vs. scattering angles or wavelengths are generated based on the designed grating parameters, for example. CD, thickness and Line:Space...

20060146346 - Systems and methods for in-vivo optical imaging and measurement: Disclosed are methods and systems for: collecting radiation emitted from an object embedded in a biological sample from multiple sides of the sample; and estimating the size of the object based on the collected radiation....