Optics: measuring and testing inventions 05/06

20060109450 - Laser distance measuring device: A laser distance measuring device is provided for measuring distance to an object. The laser distance measuring device comprises a laser emitter, a collimator objective lens, a optoelectronic converter, a receiving objective lens, and a control and analysis system, wherein the collimator objective lens and the receiving objective lens are...

20060109452 - Device and method for chromatic dispersion measurement: In a method for measuring the chromatic dispersion of an optical transmission line, preferably of an optical fiber, an amplitude-modulated optical signal is fed into the optical transmission line to be measured, the transmitted signal is split in an imaging dispersive optical means into several spatially separated partial spectra which...

20060109451 - Device for optical spectra analysis by means of brillouin scattering and associated measurement method: The invention relates to a device which is used for the spectral analysis of optical signals and which is based on the stimulated Brillouin scattering effect. The invention also relates to the associated measurement method which makes use of the optical signal amplification caused by the Brillouin scattering effect. The...

20060109453 - Apparatuses and methods for measuring head suspensions and head suspension assemblies: The present invention provides apparatuses and methods for determining spatial information of a workpiece surface positioned in a predetermined coordinate system. Apparatuses and methods of the present invention can be used to determine one or more coordinates of one or more measurement locations of a workpiece within a predetermined coordinate...

20060109454 - In-process vision detection of flaw and fod characteristics: An inspection system (9) includes an idler wheel (61) that is coupled to a fabrication system (8) and is in contact with a backing layer (65) of an applied material (64). A rotation sensor (63) monitors the idler wheel (61) and generates a rotational signal. A controller (24) is coupled...

20060109455 - Optical inspection system and radiation source for use therein: Disclosed is a system for inspecting an object. Such system comprises; a) an irradiation system for irradiating the object to be inspected, said irradiation system comprising a radiation source, b) an objective, imaging the irradiated object onto an image sensor, and c) an image sensor for transforming the radiation coming...

20060109456 - Method of detecting foreign objects for display panel fabrication: A method of detecting foreign objects in display manufacturing process, wherein the method comprising steps as flows: First a laser source and a laser detector are provided on a first side of a target to be measured, wherein the laser detector is supported by an adjustable gauge to provide the...

20060109457 - Surface inspection system with improved capabilities: Pixel intensities indicative of scattered radiation from portions of the inspected surface surrounding a location of a potential anomaly are also stored so that such data is available for quick review of the pixel intensities within a patch on the surface containing the location of the potential anomaly. Where rotational...

20060109458 - Standard plane sample and optical characteristic measurement system: A standard plane sample which supplies an optical characteristic measuring device with reference data. The standard plane sample including a sample portion that is measured by the optical characteristic measuring device to supply measurement data, and a recording medium that stores identification data for identifying a kind of the sample...

20060109459 - Microscope with laser light source and protective device for preventing eye damage: The invention is directed to a microscope in which laser light is used to irradiate a sample to be examined and which is outfitted with a protective device for preventing eye damage due to laser light. It is the object of the invention to provide a protective device for microscopes...

20060109460 - Fluorescence detection method, detection apparatus and fluorescence detection program: In fluorescence detection, complicated concentration adjustment and retry of detection operation can be eliminated. In a fluorescence detection method for irradiating an exciting light ray on a fluorescent material or a sample having the fluorescent material to detect fluorescent luminescent rays emanated under the irradiation, the fluorescent luminescence rays parameterized...

20060109461 - Spectroscopy analysis apparatus: A spectroscopy analysis apparatus contains a focusing unit which focuses light from a light source on a sample, an optical scanner which scans the light on the sample, an optical detector which detects light intensity of the light emitted from the sample, and a cross-correlation calculating unit which calculates cross-correlation...

20060109462 - Method to selectively identify at risk die based on location within the reticle: A method and system of selectively identifying at risk die based on location within the reticle. Reticle and stepping information is stored in a database. All reticle shots in a wafer and in a lot are overlaid on top of each other. The reticle and stepping information is used to...

20060109463 - Latent overlay metrology: An apparatus and method for improved latent overlay metrology is disclosed. In an embodiment, a scatterometer and an overexposed overlay target are used to obtain more robust overlay measurement....

20060109464 - Method for detecting alignment accuracy: A method for checking with high accuracy the mismatch of two patterns by using a circuit pattern whose change in electrical resistance is highly sensitive to matching shifts. The method includes finding the amount of matching shift of a semiconductor device circuit pattern from the trend in the change in...

20060109465 - Fluorescence analysis optical multiplexer/demultiplexer, fluorescence analysis optical module, fluorescence analyzer, fluorescence/photothermal conversion spectroscopic analyzer, and fluorescence analysis chip: A fluorescence analysis optical multiplexer/demultiplexer, a fluorescence analysis optical module, a fluorescence analyzer, a fluorescence/photothermal conversion spectroscopic analyzer, and a fluorescence analysis chip, according to which LIF analysis can be carried out easily and with high sensitivity, and moreover photothermal conversion spectroscopic analysis can be carried out easily and simultaneously...

20060109466 - Copper foil inspection device copper foil inspection method defect inspection device and defeat inspection method: A surface of copper foil wound onto a guide roller 26 is irradiated with light. Specular light from the copper foil surface is received by CCD cameras 14a, and scattered light from the copper foil surface is received by CCD cameras 14b. When, in a region in which the amount...

20060109467 - Devices, methods, and systems for measuring an optical property of a sample: Devices and methods are provided for measuring a property of a sample, such as an optical property. Embodiments of the subject invention include a device having sample measurement componentry and one or more enclosure-forming components, wherein one or more of the enclosure-forming components are movable, and wherein the device is...

20060109468 - Devices, methods, and systems for measuring an optical property of a sample: Devices and methods are provided for measuring a property of a sample, such as an optical property. Embodiments of the subject invention include a device having sample measurement componentry and one or more enclosure-forming components, wherein one or more of the enclosure-forming components are movable, and wherein the device is...

20060109469 - Methods and systems for selecting pathlength in absorbance measurements: Methods and sub-system for substantially optimizing the absorbance measurement in optical instruments....

20060109470 - Measuring environmental parameters: Intensity measurements characterizing at least two absorption lines for a molecule of interest within at least one sample of gas may be used to calculate at least one ratio which may be associated with a level of an environmental parameter of interest. Related apparatuses, techniques, systems, computer program products are...

20060109472 - Apparatus for assay in utilizing attenuated total reflection: An assay apparatus of a surface plasmon resonance biosensor system includes a flow channel block loadable with a sensor unit of the chip type removably. A metal film has a sensing surface and a metal/dielectric interface being defined on a dielectric glass substrate. An optical assay unit applies illumination through...

20060109471 - Miniature surface plasmon resonance waveguide device with sinusoidal curvature compensation: The present invention is in related to a miniature surface plasmon resonance waveguide device with sinusoidal curvature compensation and at least comprises: a substract, a waveguide structure, a sensing film layer and a cover layer, wherein the waveguide structure is configured with the function of sinusoidal curvature compensation and installed...

20060109473 - Multi-grade object sorting system and method: A paper sorting system allows the high speed determination of color, glossiness and the presence of printed matter for individual sheets of paper in a stream of waste paper. Sorting criteria may be selected from a plurality of predefined options to sort the paper stream....

20060109474 - Optical measuring apparatus, illumination system, and light detecting system: An optical measuring apparatus includes: an illumination system having a toroidal mirror which is by circularly rotating a parabolic curve or its approximate curve around an axis with the focal point of the parabolic curve or the substantial light focusing point of the approximate curve forming a focal point arc;...

20060109475 - Reflectometer and associated light source for use in a chemical analyzer: A light source for a reflectometer which is used in a chemical analyzer includes a plurality of light emitting devices. Some of the light emitting devices emit light of different wavelengths. The light emitting devices are arcuately arranged about a circle having a predetermined radius. Adjacent light emitting devices are...

20060109476 - Bessel beam interferometer and measurement method: A measurement method and apparatus rely upon the coherent optical interference between a reference beam and a diffractionless sensing beam having an optical path length that has been disturbed. The interference pattern can be analyzed to determine a measurement parameter of the disturbance. The diffractionless beam is particularly a Bessel...

20060109478 - Devices and arrangements for performing coherence range imaging using a common path interferometer: Devices, arrangements and apparatus adapted to propagate at least one electro-magnetic radiation are provided. In particular, a probe housing, a sample arm section and a reference arm section can be included. For example, the sample arm section can be at least partially situated within the probe housing, and configured to...

20060109477 - High efficiency balanced detection interferometer: An interferometer configured for use in optical coherence domain (OCT) reflectometry systems is disclosed. In the preferred embodiments, efficient routing of light and a balanced detection arrangement provide a high signal to noise ratio. In a first set of embodiments, a 3×3 coupler is used to split light along separate...

20060109479 - Fiber optic interferometric position sensor and measurement method thereof: A fiber optic interferometric position sensor and measurement method thereof suitable for determining the moving direction of a measurement object in an environment of high electric or magnetic field strengths are disclosed. The fiber optic interferometric position sensor comprises at least one light source, a plurality of fiber optic couplers,...

20060109480 - Surface texture measuring instrument: A surface texture measuring instrument provided with a near-field measuring unit (30) including a near-field probe (33) that forms a near-field light at a tip end thereof when a laser beam is irradiated, a laser source (35) that generates the laser beam to be irradiated on the near-field probe (33),...

20060109481 - Method and apparatus for creating cavities in packaging materials for artifacts, art objects and fragile or other valuable items: The invention describes a non-contact surface measurement systems, methods and apparatus which provides data to computers so that the topography of the surface of an object can be digitally recreated, prepared as 3-D images so that tool paths can be created from the data. Resulting cavities may be formed in...

20060109482 - 3d and 2d measurement system and method with increased sensitivity and dynamic range: The present invention provides a Fast Moiré Interferometry (FMI) method and system for measuring the height profile of an object with an increase precision by combining a plurality of image features. In one large aspect of the invention, two or several images are acquired under different conditions, to yield two...

20060109483 - Trench measurement system employing a chromatic confocal height sensor and a microscope: A system for the measurement of high aspect ratio trenches. The preferred embodiment consists of three elements: a) an integrated microscope and optical height sensor, b) an axially dispersive, afocal lens system, which is included in the optical height sensor, and c) an algorithm for processing the optical height sensor...

20060109484 - Shape measuring apparatus: A shape measuring apparatus includes a point light source including a white light-emitting diode, a collimator lens for forming a parallel beam as a result of causing light emitted from the point light source to be incident upon the collimator lens, a telecentric lens device, including two-side telecentric optics or...

20060109485 - Measuring the diameter of rod-shaped articles of the tobacco-processing industry: Device and machine for determining the diameter and/or the cross-sectional shape of rod-shaped articles of the tobacco-processing industry. Several, in particular more than three, light sources for emitting in particular linear light to the article and respectively one sensor for each light source for receiving light scattered from the article...

20060109486 - Method of deciding measurement value: A method of deciding a measurement value as decides the quality of the measurement value of the line width, the line interval or the like of a pattern on an object to-be-measured, comprising the steps of acquiring the signal intensity distribution of the pattern on the object to-be-measured (2 in...

20060103834 - Sight adjuster: The present invention provides a sight adjuster for a velocity measurement system for sighting a projectile. A velocity measurement unit has a front sensor area and a back sensor area, and the sight adjuster has a front panel with a sighting bore such that the front panel is for positioning...

20060103835 - Optical fiber detection method and system: An optical fiber detector, and a method and system for optical fiber detection are disclosed. One embodiment of the optical fiber detector of this invention comprises: a receptacle, to receive and position an optical fiber connector; an infra-red (“IR”) source for providing an incident IR beam onto a cross-sectional face...

20060103836 - System method and structure for determining focus accuracy: Within a lithography process having a critical dimension, a method, system and structure for determining a focus deviation value relative to an ideal focus position said is disclosed. By projecting a series of lines or spots characterized by the constant pitch size which is greater than the projection devise optical...

20060103837 - Glare-directed imaging: Imaging that uses glare to confirm proper measurement of a sample. An imaging device illuminates an object and generates glare (i.e., specular reflection, diffuse reflection or a combination of the two) off the object's surface, which is displayed on a display as a glare artifact. The location of the glare...

20060103838 - Method for inspecting a wafer: The examination of a wafer (10) has until now been implemented by means of wafer-to-wafer comparison of the entire wafer (10). In order to ensure timely detection of defects, or the development of defects, on a wafer (10) wafer-to-wafer comparison is limited to particular comparison regions (22) selected by the...

20060103839 - Methods and systems for laser calibration and eye tracker camera alignment: The present invention provides methods, systems, and apparatus for calibrating a laser ablation system, such as an excimer laser system for selectively ablating a cornea of a patient's eye. The invention also facilitates alignment of eye tracking cameras that measure a position of the eye during laser eye surgery. A...

20060103840 - Raman detection based flow cytometer: A method and apparatus for enabling chemical identification of individual particles, cells of molecules by obtaining a Raman spectrum of a particle, cell or molecule as it flows past a sensing point in a flow cytometer. The particles, which may be cells or molecules, are associated with a suitable noble...

20060103841 - Optical spectrum analyzer: An object of the invention is to realize an optical spectrum analyzer capable of performing high-speed waveform sweep. The invention is to make improvements to an optical spectrum analyzer for measuring a spectrum of light to be measured by collimating light to be measured by collimator means, spectroscopically separating the...

20060103842 - Turbidity sensor: A turbidity measuring system is provided with a chamber and a sensor having a watertight housing, a light source, a first light focusing device for focusing a light emitted from the light source and passing therethough into a sample liquid, a second light focusing device for collecting at least one...

20060103843 - Device and method for automatically calibrating an lcd panel: An LCD panel testing device and method thereof, wherein the LCD panel comprises in the sequence of a first polarizer, a first retardation plate, a liquid crystal unit, a second retardation plate, and a second polarizer. The LCD panel testing device includes: a light generation device, capable of providing a...

20060103844 - Beam profile ellipsometer with rotating compensator: An optical inspection device includes a light source for generating a probe beam. The probe beam is focused onto a sample to create a spread of angles of incidence. After reflecting from the sample, the light is imaged onto a two dimensional array of photodetectors. Prior to reaching the detector...

20060103845 - Position detection apparatus and method: A position detection method of detecting a position of a detection mark. The method includes a matching step of calculating a value of a correlation using a template for an image including the detection mark, a change step of changing the template to be used for the correlation, a repeat...

20060103846 - Apparatus for measuring the optical absorbency of samples of liquids, method and reaction container for its implementation: Apparatus for measuring the optical absorbency of samples of liquids, method and reaction container for its implementation. The apparatus comprises a receiving body for receiving the reaction containers carrying the samples to be analyzed, with means for causing each of the reaction containers to be passed through by a luminous...

20060103847 - Device for the detection of holes in continuously-advancing bands of material: A device to detect holes in a continuously winding strip of material of the type formed of a vertical frame which, placed in the path of said strip of material via a horizontal slot delimiting said frame into two upper and lower bodies, each opening onto said slot via windows...

20060103848 - Absorption spectrum photometry microchip testing device and components thereof: A microchip testing device with a microchip having an absorbance measuring chamber for measuring absorbance, a transmitted light receiving unit for receiving light which has been emitted from a light source and has been transmitted through the absorbance measuring chamber, an aperture which extends in a straight line in the...

20060103849 - Apparatus and methods for evaluating an optical property of a liquid sample: An apparatus for acquiring and holding minimum size liquid samples with predetermined pathlength and methods using the same....

20060103850 - Single trace multi-channel low coherence interferometric sensor: Interferometers and autocorrelator based sensors are disclosed that are configured to have multiple sample arms which can be scanned and the backscattered low coherence source light from a sample resolved in a single sweep of one or more variable delays of the sensor. Borescopes and catheters capable of scanning multiple...

20060103851 - Displacement sensor based on photonic crystal waveguides: A displacement sensor comprising at least one pair of co-planar photonic crystal waveguide (PCWG) sections aligned along or parallel to a common axis and separated by a gap, one PCWG section of a pair operative to perform a displacement relative to the other section of the pair. In some embodiments,...

20060103852 - Measurement of a 3d surface of an object during pressure exposure: A method for measuring the 3D surface (15) of an object (14) in order to describe its form digitally. The object is pressed down on a membrane (6) so as to make an imprint to be transferred to a medium (4) below. Said medium can at the same time be...

20060103853 - Optical projection system: There is provided an optical projection system for projecting an image onto an object that is being manufactured and/or inspected. The system includes an image-projecting device, a target-locating device for determining the orientation of the image-projecting device relative to the object, and an image-rendering device for rendering the image that...

20060103854 - Non-contact apparatus and method for measuring surface profile: Embodiments of the invention provide a non-contact method for measuring the surface profile of an object that can include generating a point-type optical signal and projecting it on a rotatable precision optical grating, generating a rotating pattern of light and dark lines onto the object, recording a series of images...

20060103855 - Optical method of examining reliefs on a structure: A method for studying a surface provided with relief features, wherein a measurement spectrum is taken and then compared with test spectra representative of arbitrary structures that are adjusted stepwise. A correlation over representative points of the spectra is selected while optimizing the determination by a hierarchized adjustment of the...

20060103856 - Surface inspection apparatus: A surface inspection apparatus (100) comprises a light (10) source for emitting a light beam L0, an optical illumination system (30) for projecting the light beam on an inspected surface (220) formed by a film 210, an optical detection system (50) having lenses to spatially split reflection lights and an...

20060098186 - Imaging device, display controller, and display apparatus: An imaging device includes a display unit for displaying an image, an imaging optical system, an imaging unit, a posture detector for detecting a posture of the imaging device in shooting, a recording unit for recording a reduced image of a shot image, and posture information on a posture of...

20060098187 - Method for discerning colourless and almost colourless diamonds and arrangement for carrying out this method: The invention concerns a method for qualifying a diamond on the basis of a measured light transmission through the diamond, whereby the diamond is radiated by a light source which emits light having a wavelength in a range of 225 nm to 300 nm, whereby the transmission of said light...

20060098188 - Method of localizing fluorescent markers: The invention describes a method of determining the position of fluorescent markers in a sample (4), with a high spatial resolution. To this end, the sample (4) is illuminated with an exciting light beam (11), while the sample (4) is simultaneously scanned by a particle beam (3). During scanning, markers...

20060098189 - Surface inspection apparatus, surface inspection method and exposure system: A surface inspection apparatus includes an illumination means for illuminating a pattern formed through a predetermined pattern forming process containing a process of exposure of a resist layer formed on a substrate having a periodicity with a linearly polarized light, a setting means for setting a direction of the substrate...

20060098190 - Device and method for evaluating optical distortion of transparent plate body: Upon picking-up a grid pattern via a glass plate by an image pickup device 4, 4n±α CCD pixels correspond to n grids (pair of a bright portion and a dark portion), thereby generating α moire fringes. Sine waves with a phase A and sine waves with a phase B deviated...

20060098191 - Optical inspection of container walls: An apparatus for detecting blisters in a container wall includes a light source for directing light energy onto a container wall in such a way that portions of the light energy are reflected from surfaces of the container wall, including surfaces of blisters in the container wall. A light sensor...

20060098192 - System for the preparation of multiple solid state samples, in particular for spectroscopic and microscopic analysis: A system for the preparation and handling of multiple solid state samples, in particular for spectroscopic and microscopic analysis. The system comprises a sample holder assembly for multiple solid-state samples. The sample holder assembly comprises a sample holding body having first and second sides (3a, 4a), provided with multiple sample...

20060098193 - Method for validating a dispensed pharmaceutical: An apparatus for verifying the identity of a dispensed pharmaceutical comprises an analysis unit adapted to determine a property of the dispensed pharmaceutical, an input device adapted to receive predetermined identifying information corresponding to the dispensed pharmaceutical, and a comparison unit adapted to compare the determined property of the dispensed...

20060098194 - Method and apparatus for determining change in an attribute of a sample during nucleation, aggregation, or chemical interaction: The present disclosure describes methods and apparatus to produce a streaming image of a sample during a time period when an attribute of the sample is changing. The streaming image can be viewed in such a manner so as to be able to follow a visible change in an attribute...

20060098195 - Optical measurements of patterned structures: A method and a system for optical measuring in a structure having a pattern in the form of spaced-apart parallel elongated regions of optical properties different from that of spaces between said regions. The system comprises a broadband illuminator (8) for generating incident radiation, a spectrophotometer arrangement (30) for detecting...

20060098196 - Optical switch: A highly reliable optical switch which can output (switch) accurately to an optical fiber for output without being affected by a change in an environment and a change due to an elapsed time is provided. The optical switch includes a first spectroscope which separates spatially light from an optical fiber...

20060098197 - Method and apparatus for improved ellipsometric measurement of ultrathin films: A method for implementing ellipsometry for an ultrathin film includes directing a polarized light beam incident upon a sample surface, receiving an initial reflected beam from the sample surface and redirecting the initial reflected beam back upon said sample surface one or more times so as to produce a final...

20060098198 - Polarization modulation photoreflectance characterization of semiconductor electronic interfaces: A polarization modulation photoreflectance technique has been developed for optical characterization of semiconductor electronic interfaces. By using a laser source in conjunction with polarization state modulation, a polarization modulation spectroscopy technique may be used to characterize the optical response of semiconductor materials and structures. Disclosed methods and instruments are suitable...

20060098199 - Overlay error detection: An overlay target with gratings thereon is illuminated and radiation scattered by the target is imaged onto detectors. A phase difference is then detected between the outputs of the detectors to find the mis-alignment error. In another aspect, an overlay target with gratings or box-in-box structures is illuminated and radiation...

20060098200 - Yarn sensor: A yam sensor for textile spinning and bobbin-winding machines for optically scanning a longitudinally traveling yarn (3) within a measurement gap (19), particularly for detecting extraneous fibers, includes a light source (20), a first receiver (23) for directly transmitted light, two further receivers (21, 22) for light reflected from the...

20060098201 - Yarn sensor: A yarn sensor for optically scanning a yarn (3), traveling longitudinally through a measurement gap (19), includes a light source (20) projecting a beam of light into the measurement gap (19), at least one receiver (23) for directly transmitted light, and light transmitting elements (24, 25, 26, 27) transmitting the...

20060098202 - Gas detection method and gas detector device: A gas detector device comprises at least a VCSEL source (34, 36) and at least a light sensor (54, 56) for detecting a light beam (50, 52) having passed through a sample chamber (48) containing a given gas to be detected. The sensor is a photodiode in a first embodiment...

20060098203 - Measuring device for the optical analysis of a test strip: The invention concerns a measuring device for the optical analysis of a diagnostic test element (10) comprising a light source (16), a photodetector (24) and a device (12) for positioning the test element (10) between the light source (16) and photodetector (24) where the light source (16) has one or...

20060098204 - Arrangement for building a miniaturized fourier transform interferometer for optical radiation according to the michelson principle a principle derived therefrom: An arrangement for building a compact Fourier transform interferometer for optical radiation according to the Michelson principle or a principle derived therefrom. According to the invention, this arrangement is characterized in that the optical modulation of the radiation in at least one of the interferometer arms is produced by the...

20060098205 - Optical connection for interferometry: A method including: (i) directing a beam to an interferometer head using an optical connection, the beam including a first beam component having a first polarization and a first frequency and a second beam component having a second polarization different from the first polarization and a second frequency; (ii) rotating...

20060098206 - Apparatus and method for measuring thickness and profile of transparent thin film using white-light interferometer: Disclosed herein is an apparatus and method for measuring the thickness and profile of a transparent thin film using a white-light interferometer. The apparatus and method separate coherent light according to frequency, obtain a first interference pattern at each frequency, separate composite coherent light according to frequency, and obtain a...

20060098207 - Interferometric method for the measurement of separations between planes with subnanometer precision: Method for the interferometric determination of the change to an optical spacing between two planes in a sample at a transition from a first to a second measurement point on the sample, the sample being illuminated with high band width light and the sample is at least partly transmitting for...

20060098208 - System and method for surface profiling: The present invention relates to microinterferometers and the application of such to profile surface geometries. A representative method for profiling a target surface of an object includes: illuminating the target surface with an incident light beam through a phase-sensitive, reflective diffraction grating, such that a first portion of the incident...

20060098209 - Method for calibration and removal of wavefront errors: Apparatus and methods for generating an empirically determined mathematical model of wavefront error in an interferometer as a function of aperture misalignment and then applying the model to correct subsequent measurements. The methods are useful in Fizeau and other types of interferometers in which carrier fringe analysis may be used...

20060098210 - Projection exposure system and method of manufacturing a miniaturized device: A projection exposure system and method of manufacturing a miniaturized device using the projecting exposure system uses an imaging of a patterning structure onto a substrate using a projection optical system. Measuring light is directed through the projection optical system to be incident on the substrate and measuring light reflected...

20060098211 - Device, method and system for measuring the distribution of selected properties in a material: A device for measuring a distribution of selected properties of a material. The device includes an emitter configured to emit electromagnetic radiation at at least a first and second frequency in a selected frequency range through the material, at least one sensor configured to detect electromagnetic radiation transmitted through the...

20060098212 - Method and device for three-dimensionally detecting objects and the use of this device and method: In order to determine three-dimensional coordinates of a surface (2) of an object (3) to be detected, the changes in color of a color pattern (5), which is projected by a projector (4) onto the surface (2), are to be encoded by using a redundant code. An analyzing method, which...

20060098213 - Confocal optical device, and spherical-aberration correction method: A confocal optical device and a spherical-aberration correction method are provided which reduce the generation of a spherical aberration. This confocal optical device includes: a drive mechanism which moves a sample board so as to change the distance between an objective lens and the sample board; a spherical-aberration correction element...

20060098214 - Method and apparatus for determining one or more physical properties of a rolled smoking article or filter rod: A method of determining one or more physical properties of a rolled smoking article is disclosed, the method comprising disposing a rolled smoking article within a field of view, illuminating the field of view, imaging the rolled smoking article to form an image, and analysing the image to determine one...

20060092401 - Actively-illuminating optical sensing system for an automobile: An automotive occupant position restraint apparatus senses a position of an occupant of a motor vehicle. An optical energy source emits optical energy that is substantially limited to a first range of wavelengths that corresponds to an atmospheric absorption peak. An optical energy receiver receives the optical energy emitted by...

20060092402 - Laser crystal evaluating system: A laser crystal evaluating system, comprising a light emitting source for emitting an excitation light, a laser crystal support base for supporting a laser crystal, a photodetection unit for receiving a laser beam emitted from the laser crystal, a moving device for relatively moving the light emitting source and the...

20060092403 - Method and a system for automatic measurement and tracking of logs, industrial wood and boards: A method for tracking and measuring volume, shape and surfaces of objects, such as logs, simultaneously. In series of load and unload operations along a procurement line, series of images are captured by e.g., CCD stereo cameras with sufficient spatial resolution capabilities. Simultaneously, the location of objects (logs) are registered...

20060092404 - Method and apparatus for testing optical fiber based networks: A method offering the capacity for safe in service testing of optical network using time domain reflectometer is disclosed. The network utilizes end equipment devices having filters designed to reject specific frequency range, and preferably a frequency range that lies between two desired frequency ranges. The signal used for the...

20060092405 - Measuring instrument of polygon-mirror motor: A measuring instrument of polygon mirror motors includes a first light source, a first photo detecting element for detecting first reflecting light beam, i.e. first measuring light beam emitted from the first light source and reflected on the polygon mirror, a second light source, a second photo detecting element for...

20060092406 - Fluorescence based laser alignment and testing of complex beam delivery systems and lenses: Aligning and testing alignment of optical elements in a laser beam delivery system using non-visible radiation. An alignment mirror replaces a beam redirection mirror and includes a fluorescing substrate and a dielectric coating on an incident face of the fluorescing substrate that reflects a major part of an incident laser...

20060092407 - Method and apparatus for identifying a sensed light environment: In one embodiment, a sensed dataset includes data produced by a plurality of light sensors that have been exposed to a light environment. The data of the sensed dataset corresponds to different ranges of light, and at least a portion of one of the ranges of light is outside the...

20060092408 - Process and station for inspecting the painting of motor vehicle bodywork parts: A method for inspecting the painting of bodywork parts using an optical measurement instrument that is moved parallel to the parts being inspected. An inspection station for implementing the method....

20060092409 - Use of laser reflection pickup unit for detection of small particles on a relatively smooth and reflective surface: A method and apparatus for detecting stray particles upon a relatively smooth surface by measuring the amount of collimated light reflected from the surface from clear areas of the surface and from particles resting on the surface. Optical pick-up units similar to those used in DVD's and CD's can be...

20060092410 - Container inspection by directly focusing a light emitting die element onto the container: An apparatus for optical inspection of containers includes a light source having at least one light emitting diode with a light emitting die surface. Lenses and/or mirrors focus the light emitting die surface onto a selected portion of a container, and a light sensor receives an image of the selected...

20060092411 - Process and compositions for synthetic calibration of bio-photonic scanners: A method, apparatus, and set of compositions are disclosed for calibrating a bio-photonic scanner. The scanner detects selected molecular structures of tissues, nondestructively, in vivo. The apparatus may include a computer, including processor and memory connecting to the scanner, including an illuminator to direct light nondestructively onto tissue in vivo,...

20060092412 - Specular gloss simulation device, specular gloss simulation method, control program for specular gloss simulation device and storage medium thereof: The present invention realizes a specular gloss simulation device which can accurately simulate, by using a Bidirectional Reflectance Distribution Function, specular glossiness of an image even if the image has a low density and low gloss. A specular gloss simulation device according to the present invention is for simulating specular...

20060092413 - Anti-resonant waveguide sensors: An improved method of analyzing target analytes in a sample is described. The method is based on anti-resonant guided optical waveguides which enables a strongly improved light-target interaction since the light can be guided within the target-containing medium. The light-target interaction can be monitored by many different means to determine...

20060092414 - Devices and method for spectral measurements: A spectral measurement device comprising an entrance aperture for receiving an electromagnetic energy and a mask located at the entrance aperture in the form of a two-dimensional encodement pattern. An optical element conditions the electromagnetic energy received from the mask for presentation to the spectral dispersion element and the and...

20060092415 - Method and device for carrying out emission spectrometry: The invention relates to a method and a device for carrying out emission spectroscopy, in particular laser emission spectroscopy. According to said method, a pulsed laser beam is automatically focussed on a workpiece to generate a laser-induced plasma, the radiation emitted from the plasma is detected and an elemental analysis...

20060092416 - In-situ micro-spectro-sensor for detecting gas leakage from vacuum chamber during plasma-based process: The in-situ micro-spectro-sensor determines whether a leakage occurs during the plasma process by taking the advantage of detecting the target leak in gas specifically composed of 99% of nitrogen and oxygen which are four to one in ratio. Warning signals with light and sound are available. The main part is...

20060092417 - Device for the examination of optical properties of surfaces: A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle; at least one first detector device for capturing the radiation emitted to and reflected back from the surface, wherein...

20060092418 - Optical detection method for separating surface and deepness: This invention relates to an optical detection method for non-contact measuring an object and separating the surface and deep information of a medium in an object. A light beam that irradiates on the object from an incident unit is received by a receiving unit and detected by a detector. The...

20060092419 - Optical position assessment apparatus and method: A lithographic apparatus comprises a substrate table that supports a substrate having alignment marks on a surface thereof. The apparatus further comprises a frame moveable relative to the substrate to provide for a scanning or stepping mode of operation. An array of projection systems is disposed across the frame for...

20060092420 - Position detecting method: A method detects a position of a mark based on an image signal of the mark. The method includes steps of obtaining a first position of the mark by performing a first process for the image signal, extracting plural feature values from the image signal based on the first position,...

20060092421 - System and method for attenuating the effect of ambient light on an optical sensor: The present invention provides systems and methods for attenuating the effect of ambient light on optical sensors and for measuring and compensating quantitatively for the ambient light....

20060092422 - Method and device for the diffrential spectrophotometry of non-clear media by means of spectro-temporal imaging in counting mode: According to the invention, to analyse a non-limpid medium, this medium is lit by at least one light pulse, a spectral and temporal transmission image, in counting mode, is acquired from the lit medium, and the image and derivatives thereof are processed so as to acquire information about the non-limpid...

20060092423 - Method and apparatus for optically measuring the heating value of a multi-component fuel gas using nir absorption spectroscopy: A method and system for measuring heat energy of a combustible fluid in which light having wavelengths in the near-infrared is directed into a test cell containing the combustible fluid and portions of the light not absorbed by the combustible fluid and passing out of the cell are spatially dispersed...

20060092425 - Modulated reflectance measurement system with multiple wavelengths: A modulated reflectance measurement system includes three monochromatic diode-based lasers. Each laser can operate as a probe beam or as a pump beam source. The laser outputs are redirected using a series of mirrors and beam splitters to reach an objective lens. The objective lens focuses the laser outputs on...

20060092424 - Swept-angle spr measurement system: A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles....

20060092426 - Apparatus for visual inspection: An apparatus is provided which reduces the dependency of the direction of polarization on channels of an image sensor so as to improve the sensitivity of inspection. In the apparatus, the direction of an illumination beam incident on a polarizing beam splitter is made to be substantially parallel to the...

20060092427 - Detection system for nanometer scale topographic measurements of reflective surfaces: A linear position array detector system is provided which imparts light energy to a surface of a specimen, such as a semiconductor wafer, receives light energy from the specimen surface and monitors deviation of the retro or reflected beam from that expected to map the contours on the specimen surface....

20060092428 - Position measuring system: A position measuring system for determining the relative position of two objects includes a power supply unit for generating a variable operating current for a laser light source. At least one photodetector generates position-dependent output signals from the light received from the laser light source. In measurement operation, the power...

20060092429 - Catoptric and catadioptric imaging systems with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces: An interferometric system including: an interferometer that directs a measurement beam at an object point to produce a return measurement beam, focuses the return measurement beam to an image point in an image plane, and mixes the return measurement beam with a reference beam at the image point to form...

20060092430 - Displacement and flatness measurements by use of a laser with diffractive optic beam shaping and a multiple point sensor array using the back reflection of an illuminating laser beam: A laser beam system for measuring an aspect of a surface wherein a laser beam is reshaped into a corrected shaped laser beam having a corrected energy profile and subsequently reshaped into a measurement shaped laser beam having an measurement energy profile shaped to be effected by the at least...