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Optics: measuring and testing inventions 04/06

Recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing format for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application.    04/27/2006 > 23 patent applications in 21 patent subcategories.

20060087640 - Optical distance measuring sensor, self-propelled cleaner, and air conditioner: An optical distance measuring device has a substrate (10), a plurality of light emitting elements (1) mounted to the substrate (10), a plurality of light emitting-side lenses (2) placed in one-to-one correspondence with the light emitting elements (1), a position sensing photodetector (3) mounted to the substrate (10), a light...

20060087641 - Direct reading stadia rod for use with laser level: A direct-reading stadia rod for use with a laser level includes a flexible tape and a sensing head that is movable therealong. The sensing head includes a keyboard, a movement sensor, a laser beam receiver, and a display. The rod is calibrated with a benchmark elevation by placing the base...

20060087642 - Polariscope toy and ornament with accompanying photoelastic and/or photoplastic devices: A variety of toy polariscopes are simpler in design and less costly than precision instruments used in scientific research and stress analysis of materials and structures. The toy polariscopes are designed for a variety of objects that may exhibit photoelastic properties such as glass, plastic, Plexiglas, gel candle material and...

20060087643 - Laser microdissection apparatus and method: Systems and methods for automated laser microdissection are disclosed. In one variation, targeted biological material is manually or automatically selected and a transfer film is placed in juxtaposition to the location of an interior of a cut path. In another variation, a sample of biological material is mounted onto a...

20060087644 - Method and apparatus for etch endpoint detection: Broadly speaking, an invention is provided for monitoring a plasma optical emission. More specifically, the present invention provides a method for monitoring the plasma optical emission through a variable aperture to detect an endpoint of a plasma etching process without interferences that could lead to false endpoint calls. The method...

20060087645 - Method and apparatus for the correction of nonlinear field of view distortion of a digital imaging system: Nonlinear distortions of imaging optics within a computer vision system are quantified as corrective values within a viewing window defined by a pixel array. A test artifact is displaced within an object plane through increments of measured distances and the corresponding displacements of the test artifact within an image plane...

20060087646 - Photo-detector filter: Method and systems related to obstructing a first predefined portion of at least one defined wavelength of light incident upon a first photo-detector array; and detecting the at least one defined wavelength of light with a photo-detector in a second photo-detector array....

20060087647 - Sensors for dynamically detecting substrate breakage and misalignment of a moving substrate: An apparatus and method incorporating at least two sensors that detect the presence of substrate defects, such as breakage or misalignment, along the lengths of at least two parallel edges of a moving substrate. In one embodiment, an apparatus for detecting substrate defects includes a sensor arrangement including at least...

20060087648 - System for inspecting a surface employing configurable multi angle illumination modes: Apparatus for inspection of a surface, the apparatus including an objective having central and peripheral regions, which is positioned to focus an input beam through the central region in a normal direction onto the surface. The apparatus further includes a first periscope which is positionable to divert the input beam...

20060087649 - Defect inspecting apparatus and defect inspection method: In a defect inspecting apparatus, an illumination optical system illuminate a mask having a patterned surface, the optical beam passing through the mask is split into two beam components which is guided in first and second image pickup sensors. The pickup sensors has first and second pickup fields on the...

20060087650 - Cuvette holder for spectrophotometers: A cuvette holder for spectrophotometers to hold various types of test tubes/cuvettes includes a dock which has three housing spaces that may form different combinations of capacity to accommodate different sizes of test tubes/cuvettes. Five standard test cuvettes of different specifications may be held in this holder fixed inside a...

20060087651 - In-situ droplet monitoring for self-tuning spectrometers: A laser scattering based imaging technique is utilized in order to visualize the aerosol droplets in an inductively coupled plasma (ICP) torch from an aerosol source to the site of analytical measurements. The resulting snapshots provide key information about the spatial distribution of the aerosol introduced by direct and indirect...

20060087652 - Method for determining properties of a fibrous suspension: Method and a sensor for determining measured values of properties of a suspension in a machine for producing a fibrous web, in which light interacts with the fibrous suspension. The sensor picking up a scattered light signal and a transmitted light signal and measured values of at least one property...

20060087653 - Optical rotatory power measuring instrument: A linearly polarized light output unit (701) outputs a linearly polarized light. A first phase modulation unit (703) includes a first polarization axis and modulates a phase of the linearly polarized light. A second phase modulation unit (704) includes a second polarization axis orthogonal to the first polarization axis and...

20060087654 - Method and system for diffusion attenuated total reflection based concentration sensing: A system for measuring light absorption levels for a liquid for use in a printing system includes a light source adapted to provide a divergent beam of light, a liquid container with a hole that acts as a focusing lens, and a prism disposed over the hole to split the...

20060087655 - System and method for controlling a light source for cavity ring-down spectroscopy: An apparatus and method for controlling a light source used in Cavity Ring-Down Spectroscopy. The apparatus comprises a controller that generates a control signal to activate and deactivate the light source based on a comparison of an energy signal from a resonant cavity and a threshold. The light source is...

20060087656 - Nonlinear filtering for events in spr sensing: A nonlinear filtering system determines the duration of a designated event in an SPR sensorgram, selects a filter length based on the determined duration of the designated event in the SPR sensorgram, and applies a nonlinear filter, having the selected filter length to the SPR sensorgram, to establish an output...

20060087657 - Precompensation of polarization errors in heterodyne interferometry: Apparatus and methods for adjusting the polarizations of the components of an input beam to reduce leakage caused by imperfections in an interferometer are disclosed. The apparatus includes an interferometer positioned to receive an input beam that includes two components having different frequencies and different polarizations, the interferometer including a...

20060087658 - Monolithic quadrature detector: A compact monolithic quadrature detector generates four signals from an input beam including orthogonally polarized object and reference beam components provided by an interferometer. The single input beam may be split into four output beams using a first beam splitting interface between two prisms, reflections at two air interface surfaces...

20060087659 - Low walk-off interferometer: An interferometer can achieve a high dynamic range for measurements along vertical and horizontal directions using a first measurement channel providing a high dynamic range measurement of a path including components respectively parallel and perpendicular to the optics-object separation and a second measurement channel providing a high dynamic range measurement...

20060087660 - Device for measuring in three dimensions a topographical shape of an object: A device for measuring in three dimensions a topographical shape of an object. The device comprises an arrayed confocal imaging system having a confocal topographical mask provided for converting light produced by a light source into an array of small spots. The mask being mounted on a scanning member provided...

20060087661 - Wafer detecting device: Provided is a detecting device for an FIMS system, for easily and simply detecting a slip-out of a glass wafer from an FOUP or detective storage thereof. The detecting device includes a light transmission sensor and a light reflection sensor. A light emitting portion of the light reflection sensor, a...

20060087662 - Illumination system for measurement system: An improved method and device for reflectively measuring a subject such as a throat area in a vane ring for a gas turbine engine uses improved lighting arrangements to improve the quality of reflection to thereby reduce problems associated with poor quality reflection which may adversely affect the image processing...

  
04/20/2006 > 36 patent applications in 29 patent subcategories.

20060082757 - Pulse shifted array: A laser-radar receiver comprising an array of optical fibres, wherein the opposite ends of the optical fibres are connected to at least one electromagnetic radiation detector, each of the optical fibres having differing physical characteristics which result in konwn delays in the transmission time of pulsed electromagnetic radiation....

20060082758 - Electric optical distance wavelength meter: It is an object of the present invention to provide an electric optical distance wavelength meter detecting the time when the switching is completed and shortening the time required for distance measurement by immediately starting the distance measurement when measurement light and reference light are switched by a light path...

20060082759 - Methods and apparatus for identifying and diagnosing live eggs using heart rate and embryo motion: Identifying live eggs includes: a) illuminating eggs with light; b) receiving light passing through each egg at a light detector; c) generating an output signal that corresponds to light received at a light detector for each respective egg; d) analyzing the output signals to identify an indication of an external...

20060082760 - Optical sensing module, optical sensing and image capturing architecture, and method for optically scanning fingerprints with a portable communications system: An optical sensing module, an optical sensing and image capturing architecture, and a method for optically scanning fingerprints with a portable communications system are applied to a mobile phone to capture a group of images of a fingerprint on a finger of the user holding having the mobile phone. The...

20060082761 - Recorded article with anti-counterfeit measures: An object is to provide a recorded article or sticker whereby counterfeited articles and genuine articles can be visually distinguished in simple fashion in the market and wherein it is not possible to identify in the market the location and type of the anti-counterfeiting measures that have been taken. Both...

20060082762 - Automated polarized light microscope combined with a spectroscopy/spectral imaging apparatus: There is disclosed a device or apparatus that is particularly suitable for use in the analytical fields of polarized light microscopy and spectroscopy/spectral imaging. The apparatus comprises an automated polarized light microscope combined with means for achieving spectroscopic analysis. The apparatus may optionally include means for spectral imaging associated with...

20060082763 - Computer-implemented methods and systems for classifying defects on a specimen: Various computer-implemented methods for classifying defects on a specimen are provided. One method includes assigning individual defects detected on the specimen to defect groups based on one or more characteristics of the individual defects. The method also includes displaying information about the defect groups to a user. In addition, the...

20060082764 - Methods and apparatus for calibrating an electromagnetic measurement device: Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate and calibrating an electromagnetic measurement device are disclosed. The methods and apparatus generate electromagnetic waves and capture a portion of the generated waves after the waves pass through a first polarized filter, reflect from a substrate,...

20060082765 - Specific density detector: An object is placed at a particular distance away from the nonreflecting side of a mirror, such that the gravitational force of the object affects the mirror. A laser is then pointed at the opposite, reflecting side of the mirror, thereby itself reflecting off the mirror and going back in...

20060082767 - Darkfield inspection system having a programmable light selection array: An inspection tool embodiment includes an illumination source for directing a light beam onto a workpiece to generate scattered light that includes the ordinary scattering pattern of the workpiece as well as light scattered from defects of the workpiece. The embodiment includes a programmable light selection array that receives light...

20060082766 - Method of inspecting defects and apparatus for performing the same: In a method of inspecting defects, a first actual region of an actual object is inspected based on a first characteristic parameter as an inspection condition. A point where an inspection region of the actual object is changed into a second actual region from the first actual region is determined....

20060082768 - Miniaturized fluorescence analysis system: According to embodiments of the present invention, a fluorescence analysis system includes a light emitting diode (LED) array to excite a fluorophor sample for analysis. The system includes an LED array driver that pulses the LEDs in the array with currents in excess of maximum rated current at low duty...

20060082770 - Method and instrument for detecting biomolecular interactions: Method and apparatus for detecting biomolecular interactions. The use of labels is not required and the methods may be performed in a high-throughput manner. An instrument system for detecting a biochemical interaction on a biosensor. The system includes an array of detection locations comprises a light source for generating collimated...

20060082769 - Multiple-channel uv spectrometer assembly: A multiple-channel spectrometer assembly for analyzing a plurality of sample flows. The assembly includes a plurality of spectrometer channels, each fluidly connectable to a respective one of the sample flows. Each channel has a sample inlet and a sample outlet. A spectrometer module is optically coupled a light outlet portion...

20060082771 - Mount of optical components: A casing for an optical set-up is described, with the casing comprising a cutout adapted for accommodating an optical component, wherein the geometry of the cutout is adapted for mounting the optical component from the exterior of the casing, and wherein the geometry of the cutout is adapted for mechanically...

20060082772 - Scalable imaging spectrometer: A scalable imaging spectrometer, using anamorphic optical elements to form an intermediate focus in only one dimension. Light reflects off an object to form an incident beam. The beam reflects off an anamorphic objective mirror to form a line focus at a slit. At the slit, the beam is focused...

20060082773 - Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate: Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate are disclosed. The methods and apparatus generate electromagnetic waves and capture a portion of the generated waves after the waves pass through a first polarized filter, reflect from a substrate, and pass through a second polarized...

20060082774 - Reference body for alignment of laser projectors and an image data acquisition system, and tomography apparatus including same: A reference body for alignment of laser projectors and an acquisition system of a tomography apparatus relative to one another, has at least two reference indicators, with each reference indicator establishing a reference plane. Each reference plane serves for alignment of one of the laser projectors. The at least two...

20060082775 - Mark position detecting apparatus: A mark position detecting apparatus includes: an illuminating unit that illuminates a mark on a substrate; an image forming optical system that forms an image of the mark with light from the mark; an adjustment unit that adjusts distortion manifesting at the image forming optical system; an image capturing unit...

20060082776 - Method and apparatus for improved colorimetry: A colorimeter method and apparatus is described. The colorimeter includes a plurality of sensors/filter systems with non overlappng spectral responses, adequate for providing data capable of translation into standard coordinates system such as, CIE XYZ, CIE L* a* b*, or CIE Luv, as well as non-standard operable coordinate systems. The...

20060082777 - Tunable laser-based chemical imaging system: A chemical imaging device which utilizes a computer controlled tunable laser to provide light of wavelengths in the near infrared band and a focal plane array to image a sample illuminated at various wavelengths of light. The device also provides light intensity reference detectors at the source and terminus of...

20060082778 - Method for increasng the dynamic range of a cavity enhanced optical spectrometer: A gaseous target analyte present as a minor constituent in an admixture with at least one other gaseous species can be detected using a cavity enhanced optical spectrometer by a process comprising the steps of: i) identifying a plurality of strong spectral absorption peaks of the target analyte which are...

20060082779 - One dimensional measuring unit: Accurate positioning of a one dimensional measuring unit in a measuring apparatus that utilizes evanescent waves is enabled. The one dimensional measuring unit is constituted by: a transparent elongate dielectric block; a thin film layer, formed on a flat surface of the dielectric block; and a flow path forming member,...

20060082780 - Detecting radiation events: A system for detecting radiation events in a ring laser gyro is provided. The system includes one or more photodetectors, that produce photocurrent signals to monitor the ring laser gyro. Further, the system includes one or more comparator circuits actuating at one or more thresholds. The one or more comparator...

20060082782 - Defect inspecting apparatus: In a defect inspecting apparatus, a differential interference optical system forms a differential interference image which is produced from an optical interference of images in a predetermined direction, the images corresponding to inspecting parts of a pattern formed on a mask. A control part varies the predetermined direction so as...

20060082781 - Optical image measuring apparatus: An optical image measuring apparatus capable of measuring an object to be measured which includes a birefringent layer in a short time is provided. The optical image measuring apparatus includes a broad-band light source, lenses for increasing a diameter of the light beam, a polarizing plate, a half mirror, a...

20060082783 - Position detection apparatus and method: Position detection apparatus comprises: an incident unit that forms a parallel beam from a light beam of a light source and supplies the parallel beam to a beam splitter in a way that the separated beams, obtained from the parallel beam by the beam splitter, are respectively incident upon the...

20060082784 - Stage apparatus: A stage apparatus has: a stage capable of moving an object; first and second measurement units to measure a displacement of the stage in a predetermined direction based on a variation of an optical path length of measurement light, arranged so as to have an overlap area to simultaneously measure...

20060082785 - In-situ absolute measurement process and apparatus for film thickness, film removal rate, and removal endpoint prediction: An apparatus and process for in-situ measurement of thin film thickness, ash rate, and end point generally include generating and measuring shallow angle interference patterns. The apparatus generally includes a chamber having a first viewing port and a second viewing port. The first viewing port includes receiving optics configured to...

20060082786 - Apparatus and method for measurement of film thickness using improved fast fourier transformation: The present invention relates to an apparatus and method for a measurement of a film thickness using an improved fast Fourier transformation. The apparatus includes a light source, a light receiving unit for converging a light from the light source, a detection unit for splitting a reflection light reflected by...

20060082787 - Non-contact apparatus and method for measuring surface profile: Embodiments of the invention provide a non-contact method for measuring the surface profile of an object that can include generating a point-type optical signal and projecting it on a rotatable precision optical grating, generating a rotating pattern of light and dark lines onto the object, recording a series of images...

20060082788 - Specific density detector and optical multiplexer improvement: An object is placed at a particular distance away from the nonreflecting side of a mirror, such that the gravitational force of the object affects the mirror. A laser is then pointed at the opposite, reflecting side of the mirror, thereby itself reflecting off the mirror and going back in...

20060082789 - Positional marker system with point light sources: A positional marker system is disclosed. The positional marker system includes at least one light-emitting or light-reflecting marker that can be positionally detected by an optical tracking system, such as a medical tracking system, wherein the emitting and/or reflecting portion of the marker or markers is formed as a point...

20060082791 - Inspection device of a tape reel: An inspection device of a tape reel comprises a first inspection device 10 consisting of a light projector 11, a mirror 12, and a light receiver 13, a second inspection device 20 consisting of a light projector 21, a mirror 22, and a light receiver 23, and a rotator 30...

20060082790 - Strobe light and laser beam detection for laser receiver: A laser receiver detects a thin beam of laser light and distinguishes between the beam of laser light and an omni-directional pulse of light from a strobe by the use of an additional photo-detector. The device takes into account the possibility that the additional photo-detector could be illuminated simultaneously with...

20060082792 - Overlay targets with isolated, critical-dimension features and apparatus to measure overlay: An optical metrology system is disclosed which is configured to minimize the measurement of specularly reflected light and measure primarily scattered light. The system is similar to prior art beam profile measurements but includes an optical arrangement for increasing the amount of scattered light being monitored in comparison to the...

  
04/13/2006 > 29 patent applications in 28 patent subcategories.

20060077375 - Method, device, and computer program for determining a range to a target: A method, device, and computer program for determining range to a target is disclosed. Specifically, the invention provides a method, device and computer program for determining a second range to a target based on a first range to the target and an angle to the target such that the parabolic...

20060077376 - Determination of the boundaries between fractions and extraction of selected fractions in a fractionated sample: An apparatus and method are provided for determining boundaries between fractions in a fractionated sample. The method includes the steps of providing the fractionated sample in a receptacle, the receptacle having a transparent window, positioning the receptacle in a known position relative to datum means, capturing an image of the...

20060077377 - Personal identification verification and controlled substance detection and identification system: A personal identification and security system including a personal identification verification system, a controlled substance detection and identification system and an alarm indicator responsive to outputs of the personal identification verification system and the controlled substance detection and identification system for providing an alarm indication in response to fulfillment of...

20060077378 - Optical system for automatic lens meter: An optical system for an automatic lens meter for measuring the refractive power of a lens to be examined. The optical system includes a light source for generating a measuring light beam, a convex collimator lens, disposed a predetermined focal distance from the light source, for collimating the measuring light...

20060077379 - Corrosion detecting device: The invention relates to a device for detecting the corrosion induced by a medium on a structure. The device comprises a chamber (5) closed by a closing disc (4) made of such a material that the disc becomes permeable to the medium once corroded by the medium, and means for...

20060077380 - Target for surveying instrument: A target for a surveying instrument, which receives from the surveying instrument a laser point light indicating a position and a distance measuring light to measure a distance, comprising a reflection diffusion layer for reflecting and diffusing the distance measuring light, a wavelength filter layer for selectively transmitting the laser...

20060077381 - Process control monitors for interferometric modulators: Process control monitors are disclosed that are produced using at least some of the same process steps used to manufacture a MEMS device. Analysis of the process control monitors can provide information regarding properties of the MEMS device and components or sub-components in the device. This information can be used...

20060077383 - Device for selecting and detecting at least two spectral regions of a light beam: An apparatus for selecting and detecting at least two spectral regions of a light beam includes a selection device, a detection device, and a light suppression device. The light suppression device suppresses reflected and/or scattered light of an illuminating light of a microscope. The light suppression device is located in...

20060077382 - In situ excitation for surface enhanced raman spectroscopy: Devices, systems, and methods using Surface Enhanced Raman Spectroscopy (SERS) are disclosed. A device for generating Raman scattered radiation comprises a laser source and a SERS-active structure. The laser source may be configured for emanating radiation from an emanating surface or by forming a depression in the laser source, which...

20060077384 - Illumination structure, electronic device using the same structure, and illumination lens mounted thereon: Provided is an illumination structure which includes a light source and an illumination lens. The light source emits light in at least one wavelength band. The illumination lens includes a light receiving portion and a light outgoing portion. The light receiving portion divides the light from the light source in...

20060077385 - Apparatus for measuring imaging spectrograph: The present invention discloses an apparatus for measuring spectrum and image with high spatial resolution and spectral resolution. The apparatus comprises an imaging side telecentric lens for collecting light from an object, an optical slit positioned behind the imaging side telecentric lens, an aspheric lens for collimating lights from the...

20060077386 - Method for the optical characterisation of materials without using a physical model: A method of optical characterization of materials without using a model. To characterize a layer of material over an interval A of values taken by a function α(λ) (λ: wavelength), the method (1) obtains, via reflectometry and/or ellipsometry over A, a measured spectrum ψ, (2) chooses m values α1 ....

20060077387 - Apparatus, method and program for generating a recipe for an inspection tool: An apparatus for generating a recipe for an inspection tool includes an extracting module extracting recipe parameters to be set to the inspection tool from among a group of recipe, a recipe candidate generator generating recipe candidates by combining settings of recipe parameters, a calculator calculating detecting parameters for each...

20060077388 - Exposure method and apparatus, and device manufacturing method: An exposure method exposes a substrate arranged on a stage, which holds the substrate and moves, to light through an original and a projection optical system. The method includes steps of a first measurement of measuring a first drive characteristic of the stage by detecting a position of a pattern...

20060077389 - Calibration for optical filter: Calibrating each of a plurality of driven optical filters. The color parameters of the driven optical filters are characterized for the individual optical filter. These color parameters are used as calibration data to calibrate more standard information....

20060077390 - Optical devices, systems and method for producing a collimated light path: Devices, systems and methods are provided for producing a collimated light path. Theses devices, systems and methods may be used to determine an optical property of a small volume sample....

20060077391 - Measuring method and system: A measuring signal in the detecting area is calibrated on the basis of a measuring signal in the reference area by the reference method. The rate of change with time of the difference between the measuring signal and an estimated result of the measurement (ORU constant) is calculated in the...

20060077392 - Method and device for measuring reflected optical radiation: The present invention provides an optics assembly, a reflectometer, and a diagnostic device for providing quantitative measurement of optical radiation reflected from a sampling area on an assay matrix. The reflectometer includes an optical radiation source and a detector. The optical radiation source and the detector are mounted in a...

20060077393 - System and method for implementation of interferometric modulator displays: This invention generally relates to methods and systems that interferometric modulators, and in particular, for providing three-dimentional displays. One embodiment comprises a system for displaying to a user a stereoscopic image comprising pixels formed on a single substrate, wherein each pixel comprises at least a first interferometric modulator, and wherein...

20060077394 - Temperature measuring apparatus, temperature measurement method, temperature measurement system, control system and control method: Light from a light source is split at a first splitter into a temperature measurement beam and a reference beam, the temperature measurement beam is further split at a second splitter into first through nth measurement beams, and the reference beam is reflected at a reference beam reflecting means. The...

20060077395 - Optical image measuring apparatus and optical image measuring method: Provided is an optical image measuring apparatus forming a three-dimensional image based on tomographic images of an object, acquired at various depths even when the object moves during measurement. Including a half mirror (6) for dividing a light beam signal light (S) and reference light (R), a frequency shifter (8),...

20060077396 - Interferometer systems for measuring displacement and exposure systems using the same: Interferometer systems for measuring displacement include a displacement interferometer. This interferometer includes a displacement converter responsive to a measuring beam of light. The displacement converter is configured to transform movement thereof in a direction orthogonal to the measuring beam of light into a change in path length between a reflective...

20060077397 - Semiconductor fabricating apparatus with function of determining etching processing state: A semiconductor fabricating apparatus for etching a semiconductor wafer, which is placed in a chamber and which has a multiple-layer film composed of a first film formed on a surface thereof and a second film formed on the first film, using plasma generated in the chamber. The semiconductor fabricating apparatus...

20060077398 - System and method for height profile measurement of reflecting objects: The present invention provides an interferometric method and system to measure the height profile of reflecting objects with respect of a reference surface. The method comprises obtaining an image of the object along a specular reflection axis, wherein the image corresponds to an intensity pattern projected on the object along...

20060077399 - Translation mechanism for opto-mechanical inspection: An apparatus is disclosed for moving an optical component of an opto-mechanical inspection system relative to an object to be inspected using a linear actuator comprising a coil located in a magnetic field created by a magnet assembly. A translation stage is coupled to either of said coil and magnet...

20060077400 - Systems and methods for measuring sample surface flatness of continuously moving samples: Measurement of sample surface flatness of a continuously moving sample. A conveyor continuously conveys a sample beneath a grating disposed at a non-zero angle with respect to the plane of conveyance. The relative distance between the sample and the angled grating changes with the horizontal translation of the sample. A...

20060077401 - Measurement of the dynamic characteristics of interferometric modulators: Various systems and methods of lighting a display are disclosed. In one embodiment, for example, a method includes applying a voltage waveform to the interferometric modulators, applying a voltage pulse to the interferometric modulators, detecting reflectivity of light from the interferometric modulators, and determining one or more quality parameters of...

20060077402 - Co-ordinate-measuring instrument: A co-ordinate-measuring instrument is provided with a translumination device which includes at least one illumination body and an image processing sensor system which is provided with a lens measuring along an optical axis. In order to perform high-accuracy measurement without the necessity of placing and removing the illumination body and...

20060077403 - Optical system and method for measuring small dimensions: Disclosed is system and method for measuring small integrated circuit features without destroying the wafer. A preferred embodiment comprises measuring the deviation from the characteristic refractive index of a wafer surface as indicative of the size of the circuit features. The method further comprises irradiating a plurality of the features,...

  
04/06/2006 > 28 patent applications in 24 patent subcategories.

20060072099 - Vehicular radar system: An integrator of a vehicular radar system has multiple switches and multiple capacitors, which are connected with the switches, for each one of photoreceptive elements. The integrator integrates light reception signals, which are output from the photoreceptive elements, by switching the switches to a connected state one after another in...

20060072100 - Distance measuring system: A distance measuring system, comprising a laser light source for projecting a pulsed laser beam to an object to be measured, a photodetection element for receiving an external light reflected by the object to be measured and an internal light which is a divided part of said laser beam, a...

20060072101 - System and method for measuring tip velocity of sprayed fuel: A system and method for measuring tip velocity of sprayed fuel in an engine includes a light source, a lens, a Charge-Coupled Device (CCD) camera, and a control unit. The lens allows light, which is emitted from the light source, to enter into a combustion chamber. The CCD camera photographs...

20060072102 - Data input devices and methods for detecting movement of a tracking surface by detecting laser doppler self-mixing effects of a frequency modulated laser light beam: A data input device for use with a tracking surface having light-scattering properties with respect to the device. The device comprising a single laser having a modulated light beam. A beam splitter splits the modulated light beam into two light beams projected along separate paths toward the tracking surface. A...

20060072103 - Apparatus and method for automatically measuring characteristics of a hard disk drive carriage arm: An apparatus and method for automatically measuring characteristics of a hard disk drive carriage arm. The method provides a first measuring device for automatically measuring a first side of a carriage arm. A second measuring device for automatically measuring a second side of the carriage arm is also provided. The...

20060072104 - Method for determining the image quality of an optical imaging system: The invention is directed to a method for determining the image quality of an optical imaging system and to the use of the method according to the invention for determining the influence of samples on the amplitude distribution and phase front distribution of the illumination light, of which the amplitude...

20060072105 - Method and apparatus for optically controlling the quality of objects having a circular edge: Method and apparatus for optically testing the quality of objects such as silicon wafers which have a circular peripheral edge, wherein light is directed onto the edge region of the object, and the light radiating from the object due to reflection, refraction and/or diffraction is detected by means of a...

20060072106 - Image viewing method for microstructures and defect inspection system using it: A non-polarization beam splitter is used for splitting optical paths of an illumination system and an image formation system. MTF characteristics independent of an orientation of a pattern on a sample is obtained by illumination with a circularly-polarized light by combining a polarizer and a λ/4 plate. A partial polarizer...

20060072107 - Particle detection device, lithographic apparatus and device manufacturing method: To enable differentiation between a particle and a ghost particle, a detector system is presented. The detector system is configured to output at least two detector signals corresponding to an intensity of radiation being incident on the detector system. If radiation is received from a ghost particle, not all of...

20060072108 - Particle detection device, lithographic apparatus and device manufacturing method: To enable differentiation between a particle and a ghost particle, a detector system resolves radiation from a ghost particle from radiation from an actual particle. The detector system outputs at least two detector signals corresponding to intensities of radiation being incident on different parts of the detector system or the...

20060072109 - Hyperspectral imaging systems: Hyperspectral imaging systems that may be used for imaging objects in three-dimensions with no moving parts are disclosed. A lenslet array and/or a pinhole array may be used to reimage and divide the field of view into multiple channels. The multiple channels are dispersed into multiple spectral signatures and observed...

20060072110 - Optical monitoring system with molecular filters: An optical monitoring system for determining the constituents of a sample or specimen. An absorption spectrum is obtained from a sample and is passed through one or more filters having a specified absorption spectrum defined by a single atom or a compound. If the filter's absorption spectrum is included in...

20060072111 - Automated visual inspection system for the detection of microbial growth in solutions: Essential prerequisites for any injectable product are its sterility, its freedom from pathogens and its freedom from visible particle contamination . . . . These requirements must be satisfied prior to the release of an injectable product batch for sale and use. A major difficulty in responding to these assay...

20060072112 - Method and system for spectral stitching of tunable semiconductor sources: A multi semiconductor source tunable spectroscopy system has two or more semiconductor sources for generating tunable optical signals that are tunable over different spectral bands. The system enables the combination of these tunable signals to form an output signal that is tunable over a combined band including these individual spectral...

20060072115 - Analytical method and apparatus: A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially...

20060072114 - Apparatus and mehod for sensing with metal optical filters: A method and apparatus for sensing with metal optical filters. Metal optical filters exhibit cut-off frquency behavior which may be used to sense the presence of materials, even in very small amounts....

20060072113 - Surface plasmon resonance sensor: An SPR sensor comprising: a thin conducting layer comprising at least one conductive element formed on a surface of a transparent substrate; an illumination system controllable to illuminate an interface between the conducting layer and the substrate; a photosensitive surface that generates signals responsive to light from the light source...

20060072116 - Method and apparatus for determining presence of a component in a printed circuit board: A method and apparatus for determining color, presence and/or polarity of a component in a printed circuit board includes a sensor and an LED positioned behind a faceplate. The faceplate abuts the component and light is reflected from the LED off the component and received by the sensor. A resulting...

20060072117 - Resonator-amplified absorption spectrometer: The invention relates to a device (10) for determining absorption of a sample, comprising an incoherent radiation source (12) for generating a measuring light beam (20), a resonator that is provided with at least two mirrors (30, 32) into which the measuring light beam can be coupled, a sample volume...

20060072118 - Optical image measuring apparatus: An optical image measuring apparatus forming an image expressing functional information on a living tissue. The optical image measuring apparatus includes a light emitting portion (2) outputting light (B1 and B2(B)) having different wavelengths intensity-modulating the light periodically, a polarizing plate (3) converting a light (B) to linearly polarized light,...

20060072119 - Error correction in interferometry systems: In general, in one aspect, the invention features methods that include using an interferometer to produce an output beam having a phase related to an optical path difference between a path of a first beam and a path of a second beam, wherein the first beam contacts a measurement object...

20060072120 - Measuring elastic moduli of dielectric thin films using an optical metrology system: An optical metrology system is provided with a data analysis method to determine the elastic moduli of optically transparent dielectric films such as silicon dioxide, other carbon doped oxides over metal or semiconductor substrates. An index of refraction is measured by an ellipsometer and a wavelength of a laser beam...

20060072121 - Digitizer using plural capture methods to image features of 3-d objects: A method and apparatus to digitize three-dimensional objects. A projection assembly is retained in fixed relation to an imaging assembly. The projection assembly projects a fixed gradient light pattern into a focal zone of the imaging assembly. The imaging assembly integrates the illumination over time such that the fixed gradient...

20060072122 - Method and apparatus for measuring shape of an object: In accordance with one aspect of the present technique, a system for measuring a shape of an object is provided. The system comprises a projection system operable to project a fringe pattern having a reference mark onto the object. The system further comprises an image-processing system operable to capture an...

20060072123 - Methods and apparatus for making images including depth information: A method for making an image of an object including depth information comprising the steps of: illuminating the object with a periodic pattern of light from an illuminating arrangement; the illuminating arrangement being such that the pattern is in focus in a focal plane and defocuses progressively away from said...

20060072124 - System and tracker for tracking an object, and related methods: A system to track a three-dimensional position and an orientation of a movable object and associated methods are provided. The system includes a tracker having an optically trackable body adapted to connect to the movable object. A plurality of optical indicators are connected or mounted to the optically trackable body...

20060072125 - Lens substrate, a method of manufacturing a lens substrate, a transmission screen and a rear projection: A lens substrate 1 having a first surface and a second surface opposite to the first surface is disclosed. Light is allowed to enter the lens substrate 1 from the first surface thereof and then exit from the second surface thereof. The lens substrate includes: a plurality of convex lenses...

20060072126 - Material independent optical profilometer: A system and method for measuring defects, film thickness, contamination, particles and height of a thin film disk or a silicon wafer. The system includes a processor for determining height. In addition to measuring the height the system can measure film thickness and defects through the measurement of the phase...

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