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N. Kenneth Burraston Kirton & Mcconkie patentsThe following is a sampling of recent N. Kenneth Burraston Kirton & Mcconkie patent applications (USPTO Patent Application #, Patent Title) sorted by month.
June 2009 - N. Kenneth Burraston Kirton & Mcconkie patents
20090158586 - Method and apparatus for adjusting a multi-substrate probe structure
20090158586 - Method and apparatus for adjusting a multi-substrate probe structure
20090160432 - Probe card assembly with an interchangeable probe insert
20090160432 - Probe card assembly with an interchangeable probe insert
20090160464 - Method and apparatus for making a determination relating to resistance of probes
20090160464 - Method and apparatus for making a determination relating to resistance of probes
20090139040 - Apparatuses and methods for cleaning test probes
20090139965 - Probe array and method of its manufacture
20090142707 - Method to build a wirebond probe card in a many at a time fashion
May 2009 - N. Kenneth Burraston Kirton & Mcconkie patents
20090134895 - High performance probe system
20090134897 - Apparatus and method for limiting over travel in a probe card assembly
20090134905 - System for measuring signal path resistance for an integrated circuit tester interconnect structure
20090132190 - Method and apparatus for remotely buffering test channels
April 2009 - N. Kenneth Burraston Kirton & Mcconkie patents
20090102494 - Contactless interfacing of test signals with a device under test
20090102494 - Contactless interfacing of test signals with a device under test
20090102494 - Contactless interfacing of test signals with a device under test
20090085592 - Probing a device
20090085592 - Probing a device
March 2009 - N. Kenneth Burraston Kirton & Mcconkie patents
20090079452 - Component assembly and alignment
20090072848 - Electrical contactor, especially wafer level contactor, using fluid pressure
20090066352 - Making and using carbon nanotube probes
February 2009 - N. Kenneth Burraston Kirton & Mcconkie patents
20090051378 - Air bridge structures and methods of making and using air bridge structures
20090055791 - Process and apparatus for adjusting traces
20090032938 - Electronic package with direct cooling of active electronic components
20090035959 - Interconnect assemblies and methods
October 2008 - N. Kenneth Burraston Kirton & Mcconkie patents
20080254651 - Spring interconnect structures
20080238458 - Method of designing a probe card apparatus with desired compliance characteristics
20080241482 - Rhodium electroplated structures and methods of making same
September 2008 - N. Kenneth Burraston Kirton & Mcconkie patents
20080231305 - Contact carriers (tiles) for populating larger substrates with spring contacts
August 2008 - N. Kenneth Burraston Kirton & Mcconkie patents
20080203268 - Adjustment mechanism
20080191722 - Isolation buffers with controlled equal time delays
July 2008 - N. Kenneth Burraston Kirton & Mcconkie patents
20080180121 - Probe card assembly and kit
20080174328 - Probing structure with fine pitch probes
20080157808 - Wafer-level burn-in and test
June 2008 - N. Kenneth Burraston Kirton & Mcconkie patents
20080150566 - Alignment features in a probing device
20080150571 - High density planar electrical interface
20080143358 - Electrical guard structures for protecting a signal trace from electrical interference
20080136432 - Sharing resources in a system for testing semiconductor devices
20080132095 - Method of making a socket to perform testing on integrated circuits and socket made
May 2008 - N. Kenneth Burraston Kirton & Mcconkie patents
20080120833 - Interconnect for microelectronic structures with enhanced spring characteristics
20080115353 - Lithographic contact elements
20080116927 - Contact tip structure for microelectronic interconnection elements and methods of making same
20080100312 - Method and apparatus for providing active compliance in a probe card assembly
20080100320 - Intelligent probe card architecture
April 2008 - N. Kenneth Burraston Kirton & Mcconkie patents
20080094088 - Method and system for compensating thermally induced motion of probe cards
20080088010 - Electronic device with integrated micromechanical contacts and cooling system
20080088030 - Attaching and interconnecting dies to a substrate
March 2008 - N. Kenneth Burraston Kirton & Mcconkie patents
20080074131 - Attachment of an electrical element to an electronic device using a conductive material
20080074132 - Single support structure probe group with staggered mounting pattern
20080061803 - Method and apparatus for making a determination relating to resistance of probes
20080063594 - Rhodium sulfate production for rhodium plating
20080054917 - Method and appartus for switching tester resources
February 2008 - N. Kenneth Burraston Kirton & Mcconkie patents
20080048688 - Methods for planarizing a semiconductor contactor
20080042668 - Apparatus and method for managing thermally induced motion of a probe card assembly
20080036480 - Adjustment mechanism
January 2008 - N. Kenneth Burraston Kirton & Mcconkie patents
20080024143 - Closed-grid bus architecture for wafer interconnect structure
20080020227 - method to build robust mechanical structures on substrate surfaces
20080010814 - Tester channel to multiple ic terminals
December 2007 - N. Kenneth Burraston Kirton & Mcconkie patents
20070296422 - Method of expanding tester drive and measurement capability
20070296433 - Contactor having a global spring structure and methods of making and using the contactor
20070296435 - Ac coupled parameteric test probe
20070290676 - Bi-directional buffer for interfacing test system channel
20070290705 - Sawing tile corners on probe card substrates
20070285114 - Socket for making with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component
20070287304 - Electrical contactor, espcecially wafer level contactor, using fluid pressure
20070279151 - Adjustable delay transmission line
November 2007 - N. Kenneth Burraston Kirton & Mcconkie patents
20070267041 - Apparatuses and methods for cleaning test probes
20070269909 - Method for processing an integrated circuit
20070269997 - Electronic components with plurality of contoured microelectronic spring contacts
20070270041 - Microelectronic contact structure
20070271071 - Remote test facility with wireless interface to local test facilities
20070262767 - Probing a device
20070265795 - Air bridge structures and methods of making and using air bridge structures
20070257696 - Predictive, adaptive power supply for an integrated circuit under test
20070259456 - Extended probe tips
20070261009 - Programmable devices to route signals on probe cards
October 2007 - N. Kenneth Burraston Kirton & Mcconkie patents
20070247175 - Probe structures with electronic components
20070247176 - Method of manufacturing a probe card
20070248896 - Photoresist formulation for high aspect ratio plating
20070241836 - Efficient wired interface for differential signals
20070228110 - Method of wirebonding that utilizes a gas flow within a capillary from which a wire is played out
20070229100 - High performance probe system
20070229102 - Mechanically reconfigurable vertical tester interface for ic probing
September 2007 - N. Kenneth Burraston Kirton & Mcconkie patents
20070210822 - Wireless test system
20070205780 - Stacked guard structures
August 2007 - N. Kenneth Burraston Kirton & Mcconkie patents
20070194779 - Method of assembling and testing an electronics module
20070182438 - Wireless test cassette
20070176619 - Probe for semiconductor devices
July 2007 - N. Kenneth Burraston Kirton & Mcconkie patents
20070170941 - Composite motion probing
20070152685 - A probe array structure and a method of making a probe array structure
June 2007 - N. Kenneth Burraston Kirton & Mcconkie patents
20070139060 - Method and system for compensating thermally induced motion of probe cards
20070139061 - Probing apparatus with guarded signal traces
20070141743 - Three dimensional microstructures and methods for making three dimensional microstructures
20070132478 - Semiconductor fuse covering
20070126435 - Apparatus and method for adjusting an orientation of probes
20070126440 - Probe card assembly with a mechanically decoupled wiring substrate
20070126443 - Method of manufacturing a probe card
May 2007 - N. Kenneth Burraston Kirton & Mcconkie patents
20070119051 - Inductive heating of microelectronic components
20070123082 - Interconnect assemblies and methods
20070103183 - Isolation buffers with controlled equal time delays
April 2007 - N. Kenneth Burraston Kirton & Mcconkie patents
20070075715 - Contact carriers (tiles) for populating larger substrates with spring contacts
March 2007 - N. Kenneth Burraston Kirton & Mcconkie patents
20070045874 - Lithographic type microelectronic spring structures with improved contours
20070046313 - Mounting spring elements on semiconductor devices, and wafer-level testing methodology
January 2007 - N. Kenneth Burraston Kirton & Mcconkie patents
20070013401 - Wafer-level burn-in and test
20070007977 - Probe card assembly with an interchangeable probe insert
20070007980 - High density planar electrical interface
20070007989 - System for measuring signal path resistance for an integrated circuit tester interconnect structure
December 2006 - N. Kenneth Burraston Kirton & Mcconkie patents
20060290367 - Method and apparatus for adjusting a multi-substrate probe structure
20060294008 - Method and system for designing a probe card
20060286828 - Contact structures comprising a core structure and an overcoat
20060279300 - Probe card assembly and kit
November 2006 - N. Kenneth Burraston Kirton & Mcconkie patents
20060261827 - Apparatus and method for limiting over travel in a probe card assembly
20060255814 - Apparatus and method for managing thermally induced motion of a probe card assembly
20060244469 - Segmented contactor
October 2006 - N. Kenneth Burraston Kirton & Mcconkie patents
20060237856 - Microelectronic contact structure and method of making same
20060238211 - Method and system for compensating thermally induced motion of probe cards
20060223345 - Sockets for springed semiconductor devices
September 2006 - N. Kenneth Burraston Kirton & Mcconkie patents
20060208830 - Adjustable delay transmission line
20060211234 - Re-assembly process for mems structures
20060211278 - Interconnect for microelectronic structures with enhanced spring characteristics
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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with N. Kenneth Burraston Kirton & Mcconkie in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for N. Kenneth Burraston Kirton & Mcconkie with additional patents listed. Browse our Agent directory for other possible listings.
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