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Method of repairing short circuit defect, and display apparatus and organic light emitting display apparatus manufactured according to the repairing method

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Method of repairing short circuit defect, and display apparatus and organic light emitting display apparatus manufactured according to the repairing method


A method of repairing a defective pixel in a display apparatus that includes forming an insulating layer to cover the plurality of second signal wires, cutting both sides of a region of the corresponding second signal wire of the defective pixel and the insulating layer to form both sides of a cut region, forming contact holes adjacent to the both sides of the cut region, respectively, such that an upper portion of the corresponding second signal wire is exposed, forming a repair metal layer on the insulating layer to contact the contact holes and the second signal wire, and forming a repair insulating layer to cover the repair metal layer.
Related Terms: Defect

USPTO Applicaton #: #20130328020 - Class: 257 40 (USPTO) - 12/12/13 - Class 257 
Active Solid-state Devices (e.g., Transistors, Solid-state Diodes) > Organic Semiconductor Material

Inventors: Yul-kyu Lee, Sun Park, Kyu-sik Cho

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The Patent Description & Claims data below is from USPTO Patent Application 20130328020, Method of repairing short circuit defect, and display apparatus and organic light emitting display apparatus manufactured according to the repairing method.

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CROSS-REFERENCE TO RELATED PATENT APPLICATION

This application claims priority under 35 U.S.C. §119 to Korean Patent Application No. 10-2012-0061673, filed on Jun. 8, 2012, in the Korean Intellectual Property Office, the disclosure of which is incorporated herein in its entirety by reference.

BACKGROUND

Recently, display apparatuses are being manufactured as portable thin film flat panel display apparatuses. An organic light emitting display apparatus is a self-emitting display apparatus and has a larger viewing angle, improved contrast characteristics, and a faster response speed, compared to some other flat panel display apparatuses. Thus, the organic light emitting display apparatus has drawn attention as a next-generation display apparatus.

An organic light-emitting display apparatus includes a thin film transistor (TFT), an organic electroluminescent (EL) device that is driven by the TFT to form an image, and the like. When current is supplied to the organic EL device via the TFT, light is emitted from the organic EL device, thereby forming an image.

SUMMARY

Embodiments may be realized by providing a method of repairing a defective pixel, caused by a short circuit defect occurring in a first signal wire and a second signal wire included in a display apparatus including pixels each being defined by one of a plurality of first signal wires and one of a plurality of second signal wires intersecting the first signal wires, the method including forming an insulating layer to cover the second signal wires; cutting both sides of a region of the second signal wire in which the short circuit defect occurs, and the insulating layer; forming contact holes at the both sides of the cut region, respectively, so as to expose an upper surface of the second signal wire; forming a repair metal layer on the insulating layer to contact the contact holes and the second signal wire; and forming a repair insulating layer to cover the repair metal layer.

The forming of the insulating layer may include a last photolithographical process performed during manufacture of the display apparatus. The forming of the insulating layer may include forming a pixel defining layer of the display apparatus. The cutting of the both sides of the region and the insulating layer may use laser.

The repair insulating layer and the insulating layer covering the second signal wire may be each formed of an organic insulating layer. The repair insulating layer may be formed on a part of the display apparatus. The repair metal layer may be formed of a material used to form the second signal wire. The repair metal layer may be formed not to overlap with a line on which the second signal wire is formed.

Embodiments may also be realized by providing a display apparatus in which a defective pixel, caused by a short circuit defect occurring in a first signal wire and a second signal wire is repaired from among pixels each being defined by one of a plurality of first signal wires and one of a plurality of second signal wires intersecting the first signal wires, the repaired pixel including an insulating layer including cut lines formed at both sides of a region of the second signal wire in which the short circuit defect occurs, and contact holes disposed apart from the cut lines to expose an upper surface of the second signal wire; a repair metal layer formed on the insulating layer and connected to the second signal wire via the contact holes; and a repair insulating layer covering the cut lines and the repair metal layer.

Each of the plurality of first signal wires and the plurality of second signal wires may be one of scan lines and data lines. The cut lines may be formed along the both sides of the region of the second signal wire in which the short circuit defect occurs, to extend in the insulating layer. The repair metal layer may be formed to route a line on which the second signal wire is formed.

The repair insulating layer may be formed only on the defective pixel. The insulating layer and the repair insulating layer may be organic insulating layers.

Embodiments may also be realized by providing an organic light emitting display apparatus in which a defective pixel, caused by a short circuit defect occurring in a first signal wire and a second signal wire is repaired from among pixels each being defined by one of a plurality of first signal wires and one of a plurality of second signal wires intersecting the first signal wires, each of the pixels including a first electrode, a second electrode, and an organic emission layer between the first and second electrodes, the repaired pixel including an insulating layer including cut lines formed at both sides of a region of the second signal wire in which the short circuit defect occurs, and contact holes disposed apart from the cut lines to expose an upper surface of the second signal wire; a repair metal layer formed on the insulating layer to route a line on which the second signal wire is formed, and connected to the second signal wire via the contact holes; and a repair insulating layer covering the cut lines and the repair metal layer.

Each of the plurality of first signal wires and the plurality of second signal wires may be one of scan lines and data lines. Each of the pixels may include at least one thin film transistor (TFT), and the scan lines and the data lines may be formed on a layer on which a gate electrode and source and drain electrodes of the at least one TFT are disposed.

The gate electrode and the first electrode may be formed on the same layer. The insulating layer may be a pixel defining layer that defines formed a light emitting device formed on the first electrode. The repair insulating layer may be formed only on the defective pixel.

BRIEF DESCRIPTION OF THE DRAWINGS

Features will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings in which:

FIG. 1 is a schematic plan view of an organic light emitting display apparatus according to an exemplary embodiment;

FIG. 2 is a diagram schematically illustrating a structure of wires included in a region II of FIG. 1, according to an exemplary embodiment;

FIG. 3 is a circuit diagram of one of pixels illustrated in FIG. 2, according to an exemplary embodiment;

FIG. 4 is a cross-sectional view of some elements of each of pixels illustrated in FIG. 2, according to an exemplary embodiment;

FIGS. 5A to 5E are schematic cross-sectional views depicting stages in a method of manufacturing the pixel of FIG. 4, according to an exemplary embodiment;

FIGS. 6A, 7A, 8A, 9A, and 10A are plan views of a process of repairing a short circuit defect occurring at an intersection of a scan line and a data line, according to an exemplary embodiment;

FIGS. 6B, 7B, 8B, 9B, and 10B are schematic cross-sectional views, taken along lines A-B of FIGS. 6A, 7A, 8A, 9A, and 10A, respectively;

FIG. 11A is a plan view illustrating another case where a short circuit defect occurs at an intersection of a scan line and a data line of an organic light emitting display apparatus; and



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stats Patent Info
Application #
US 20130328020 A1
Publish Date
12/12/2013
Document #
13665008
File Date
10/31/2012
USPTO Class
257 40
Other USPTO Classes
257 72, 257 88, 438/4, 257E27121, 257E51018, 257E21211
International Class
/
Drawings
11


Defect


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