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06/07/07 | 71 views | #20070126443 | Prev - Next | USPTO Class 324 | About this Page  324 rss/xml feed  monitor keywords

Method of manufacturing a probe card

USPTO Application #: 20070126443
Title: Method of manufacturing a probe card
Abstract: A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data regarding a newly designed semiconductor device is received along with data describing the tester and testing algorithms to be used to test the semiconductor device. Using the received data, one or more of the prefabricated elements is selected. Again using the received data, one or more of the selected prefabricated elements is customized. The probe card assembly is then built using the selected and customized elements. (end of abstract)
USPTO Applicaton #: 20070126443 - Class: 324754000 (USPTO)


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Apparatus and method for adjusting an orientation of probes
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Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment
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Electricity: measuring and testing

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