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01/25/07 - USPTO Class 435 | 63 views | #20070020645 | Prev - Next | About this Page

Method of analysis of samples by determination of a function of specific brightness

USPTO Application #: 20070020645
Title: Method of analysis of samples by determination of a function of specific brightness

Abstract: A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps: a) measuring in a repetitive mode a number of photon counts per time interval of defined length, b) determining a function of the number of photon counts per said time interval, c) determining a function of specific brightness of said units on basis of said function of the number of photon counts. (end of abstract)

Agent: Jacobson Holman PLLC - Washington, DC, US
Inventor: Peet Kask
USPTO Applicaton #: 20070020645 - Class: 435006000 (USPTO)

Method of analysis of samples by determination of a function of specific brightness description/claims

The Patent Description & Claims data below is from USPTO Patent Application 20070020645, Method of analysis of samples by determination of a function of specific brightness.

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