| Method for test of electronic component -> Monitor Keywords |
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  Method for test of electronic componentRelated Patent Categories: Data Processing: Measuring, Calibrating, Or Testing, Testing System, Of Circuit, Including Program Initialization (e.g., Program Loading) Or Code Selection (e.g., Program Creation)The Patent Description & Claims data below is from USPTO Patent Application 20070250285. Brief Patent Description - Full Patent Description - Patent Application Claims
BACKGROUND [0001] Determining the range of signal levels at which an electronic component switches from one state to another in the presence of noise is typically a time consuming task. Current methods for determining this range for electronic components such as comparators often employ pairs of linear searches. One such search begins by running a set of tests at an input signal level for which the results are known to indicate that the component is in a first state for all of the tests of the set and runs successive sets of tests at increased input signal levels until the results indicate that the component is in a second state for a preselected number of the tests in the current set. The other search begins by running a set of tests at an input signal level for which the results are known to indicate that the component is in the second state for all of the tests of the set and runs successive sets of tests at decreased input signal levels until the results indicate that the component is in the first state for a preselected number of the tests in the current set. The searches begin by setting a signal level a short distance away from the expected "comparator trip point" and running a pattern that performs a set of N comparisons in anticipation of obtaining either "all fail" results for one direction of incrimination of the input signal or "all pass" results for the other direction of incrimination of the input signal. If either of these conditions occurs, the signal level is incremented in the appropriate direction and the test pattern is run again for another set of N comparisons. These actions are repeated until one or more of the set of comparisons no longer yields the same result (a "fail" or a "pass") as at the start of the search. [0002] Linear searches are typically time consuming. The speed of the search can be increased by decreasing the span and/or precision of the search. However, if it is preferred to find the comparator trip region over a reasonably wide range so that the set point accuracy can be quantified and if it is preferred to find the bounds of the comparator trip region precisely so that comparison noise can be quantified, a large number of search steps will typically be required. The situation is compounded if the comparator comprises a number of channels rather than just one. SUMMARY [0003] In a representative embodiment, a method for testing an electronic component is disclosed. The method comprises connecting the electronic component to a test machine; specifying search range limits, low-to-high transition edge and high-to-low transition edge found criterion, and number of outcomes in a trial comprising multiple tests specified as proof of low-to-high transition or as high-to-low transition; computing values for initial trial parameters; if low-to-high transition edge not found: executing a low-to-high trial and adjusting trial parameter values based on results of step executing low-to-high trial; if high-to-low transition edge not found: executing high-to-low trial; and if either low-to-high or high-to-low transition edge not found: adjusting trial parameter values based on results of step executing high-to-low trial and repeating above steps beginning with the step having the condition if low-to-high transition edge has not been found. The trial parameters comprise low-to-high band limits for a low-to-high trial and a low-to-high trial value, high-to-low band limits for a high-to-low trial and a high-to-low trial value, and number of high indicating comparison outcomes, wherein the initial number is for an assumed previous trial. [0004] In another representative embodiment, a computer readable memory device is disclosed. The computer readable memory device embodies a computer program of instructions executable by the computer for testing an electronic component. The instructions comprise connecting the electronic component to a test machine; specifying search range limits, low-to-high transition edge and high-to-low transition edge found criterion, and number of outcomes in a trial comprising multiple tests specified as proof of low-to-high transition or as high-to-low transition; computing values for initial trial parameters; if low-to-high transition edge not found: executing a low-to-high trial and adjusting trial parameter values based on results of step executing low-to-high trial; if high-to-low transition edge not found: executing high-to-low trial; and if either low-to-high or high-to-low transition edge not found: adjusting trial parameter values based on results of step executing high-to-low trial and repeating above steps beginning with the step having the condition if low-to-high transition edge has not been found. The trial parameters comprise low-to-high band limits for a low-to-high trial and a low-to-high trial value, high-to-low band limits for a high-to-low trial and a high-to-low trial value, and number of high indicating comparison outcomes, wherein the initial number is for an assumed previous trial. [0005] In still another representative embodiment, another method for testing an electronic component is disclosed. The method comprises connecting the electronic component to a test machine; specifying search range limits and low-to-high transition edge and high-to-low transition edge found criterion; computing values for initial trial parameters; if low-to-high transition edge not found: ensuring that the electronic component is in its low state, executing a low-to-high trial, and adjusting trial parameter values based on results of step executing low-to-high trial; if high-to-low transition edge not found: ensuring that the electronic component is in its high state and executing high-to-low trial; and if either low-to-high or high-to-low transition edge not found: adjusting trial parameter values based on results of step executing high-to-low trial and repeating above steps beginning with the step having the condition if low-to-high transition edge has not been found. The trial parameters comprise low-to-high band limits for a low-to-high trial and a low-to-high trial value and high-to-low band limits for a high-to-low trial and a high-to-low trial value. [0006] In yet another representative embodiment, a computer readable memory device is disclosed. The computer readable memory device embodies a computer program of instructions executable by the computer for testing an electronic component. The instructions comprise connecting the electronic component to a test machine; specifying search range limits and low-to-high transition edge and high-to-low transition edge found criterion; computing values for initial trial parameters; if low-to-high transition edge not found: ensuring that the electronic component is in its low state, executing a low-to-high trial, and adjusting trial parameter values based on results of step executing low-to-high trial; if high-to-low transition edge not found: ensuring that the electronic component is in its high state and executing high-to-low trial; and if either low-to-high or high-to-low transition edge not found: adjusting trial parameter values based on results of step executing high-to-low trial and repeating above steps beginning with the step having the condition if low-to-high transition edge has not been found. The trial parameters comprise low-to-high band limits for a low-to-high trial and a low-to-high trial value and high-to-low band limits for a high-to-low trial and a high-to-low trial value. [0007] Other aspects and advantages of the representative embodiments presented herein will become apparent from the following detailed description, taken in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS [0008] The accompanying drawings provide visual representations which will be used to more fully describe various representative embodiments and can be used by those skilled in the art to better understand them and their inherent advantages. In these drawings, like reference numerals identify corresponding elements. [0009] FIG. 1 is a block diagram of an electronic component attached to a test machine as described in various representative embodiments. [0010] FIG. 2A is a drawing of a graph of the output state of the component vs. applied stimulus in the absence of hysteresis and noise. [0011] FIG. 2B is a drawing of another graph of the output state of the component vs. applied stimulus in the presence of hysteresis and the absence of noise. [0012] FIG. 2C is a drawing of still another graph of the output state of the component vs. applied stimulus in the absence of hysteresis and in the presence of noise as described in various representative embodiments. [0013] FIG. 2D is a drawing of yet another graph of the output state of the component vs. applied stimulus in the absence of hysteresis and in the presence of noise as described in various representative embodiments. [0014] FIG. 3 is a drawing of a flow chart of a method for obtaining lower and upper transition level information as described in various representative embodiments. [0015] FIG. 4A is a drawing of an expansion of a block of the flow chart of FIG. 3. [0016] FIG. 4B is a drawing of an expansion of another block of the flow chart of FIG. 3. [0017] FIG. 5A is a drawing of an expansion of a block of the flow chart of FIG. 4A. [0018] FIG. 5B is a drawing of an expansion of a block of the flow chart of FIG. 4B. [0019] FIG. 6A is a drawing of still another expansion of a block of the flow chart of FIG. 4A. [0020] FIG. 6B is a drawing of still another expansion of a block of the flow chart of FIG. 4B. [0021] FIG. 7A is a drawing of an expansion of a block of the flow chart of FIG. 6A. Continue reading... Full patent description for Method for test of electronic component Brief Patent Description - Full Patent Description - Patent Application Claims Click on the above for other options relating to this Method for test of electronic component patent application. ###  How KEYWORD MONITOR works... a FREE service from FreshPatents1. Sign up (takes 30 seconds). 2. Fill in the keywords to be monitored. 3. Each week you receive an email with patent applications related to your keywords. Start now! - Receive info on patent apps like Method for test of electronic component or other areas of interest. ### Previous Patent Application: Semiconductor integrated circuit and testing method for the same Next Patent Application: Motion monitoring and analysis system Industry Class: Data processing: measuring, calibrating, or testing ### FreshPatents.com Support Thank you for viewing the Method for test of electronic component patent info. IP-related news and info Results in 0.1767 seconds Other interesting Feshpatents.com categories: Accenture , Agouron Pharmaceuticals , Amgen , AT&T , Bausch & Lomb , Callaway Golf |
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