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Method for positioning a probeMethod for positioning a probe description/claimsThe Patent Description & Claims data below is from USPTO Patent Application 20080024125, Method for positioning a probe. Brief Patent Description - Full Patent Description - Patent Application Claims
CROSS-REFERENCE TO RELATED APPLICATION(S) [0001] This application is a divisional of U.S. patent application Ser. No. 10/975,328, filed Oct. 28, 2004. BACKGROUND [0002] The present invention generally relates to nondestructive inspection methods and, more particularly, to detecting substructure using precision eddy current scanning. [0003] Automated assembly systems in the aerospace industry, for example, for airframe assembly of aircraft, generally employ some type of vision system for locating structure components and key features of components, such as edges of flanges, machined steps, and tooling holes. Knowledge of the exact location of these features is necessary, since these features are used to adjust numerically controlled programs for drilling holes or other machining operations, such as trimming or reaming, to maintain blueprint tolerances. Currently, it is often necessary to manually record where the substructure is located. In order to do this, the outer mold line skins, for example of a section of the fuselage or the wing, need to be removed to make the substructure underneath visible. Once a map of the substructure is created, the outer mold line skins are temporarily fastened to the structure and the created map of the substructure needs to be transferred to the skin. Since this step is performed while the assembly is in the machine bed, the flow time is impacted and the percentage of the machine time actually used for the intended function, such as drilling, is reduced. [0004] Eddy current as a nondestructive inspection process is commonly used in the aerospace industry to detect subsurface flaws or anomalies in conductive materials. The advantage of eddy current for nondestructive inspection is the ability to perform scanning through the outer skin material. Eddy current data can be collected using automated scanning systems to improve the quality of the measurements and to construct images of scanned areas. The most common type of scanning is line scanning where an automated system is used to push the probe at a fixed speed. The data is usually presented as a strip chart recording. The advantage of using a linear scanning system is that the probe is moved at a constant speed such that an indication on the strip chart can be correlated to a position on the part being scanned. Two-dimensional scanning systems are used to scan a two-dimensional area. This could be a scanning system that scans over a relatively flat area in an x-y raster mode. The data is typically displayed in a C-scan, which is a false-color plot of signal strength or phase angle shift as a function of position. Mobile automated scanners, such as MAUS.RTM. IV and V developed by The Boeing Company, St. Louis, are generally used in the aerospace industry for nondestructive testing utilizing eddy current and ultrasonic waves. MAUS IV eddy current C-scans are used, for example, for corrosion detection or crack detection around fastener holes. [0005] As can be seen, there is a need for a method to accurately and effectively locate and map the substructure features of an aircraft airframe that are located underneath the outer mold line skins. Furthermore, there is a need to eliminate the step of the outer skin removal in order to see the substructure and the step of skin installation after recording the substructure. Still further, there is a need to improve the product flow and automation of aircraft assemblies. [0006] There has, therefore, arisen a need to provide a method for detecting substructure using nondestructive techniques. There has further arisen a need to locate substructure features with sufficient accuracy to control assembly operations and meet engineering tolerances. There has still further arisen a need to provide a device that allows detection and location of substructure features within the tolerances required. BRIEF SUMMARY [0007] The present invention provides for precisely detecting substructure using precision eddy current scanning. The present invention further provides a precision motion carriage that enables the location of substructure features within the engineering tolerances required. The present invention still further provides a method for the location of substructure features through an outer panel with sufficient accuracy to control assembly operations that may be used for, but is not limited to, the location of substructure features, such as edges of flanges, machined steps, or tooling holes, covered by outer mold line skins of an aircraft airframe. [0008] In one aspect of the present invention, a method for detecting substructure comprises the steps of: nondestructively scanning an assembly using a substructure scanning system including a precision motion carriage and a nondestructive scanning sensor; positioning the assembly including a substructure covered with an outer skin under the substructure scanning system; positioning the scanning sensor on the outer skin of the assembly; moving the scanning sensor over the outer skin with the precision motion carriage; locating the substructure through the outer skin by evaluating signals received from the scanning sensor to locate the substructure; and controlling an assembly process using the location of the substructure. [0009] In another aspect of the present invention, a method for precisely positioning and moving a probe comprises the steps of: enclosing a two-dimensional area using a frame; inserting a first probe positioner including a first opening into the frame; inserting a second probe positioner including a second opening into the frame; forming a window with the first opening and with the second opening; inserting a probe into the window; using the first probe positioner and the second probe positioner to accurately position the probe on the two-dimensional area; and using the first probe positioner and the second probe positioner to accurately move the probe across the two-dimensional area in an x-y raster mode. The first probe positioner is movable in y-direction within the frame. The first probe positioner is movable in x-direction within the frame. The second probe positioner is located above the first probe positioner. [0010] In still another aspect of the present invention, a method for detecting substructure of an aircraft wing comprises the steps of: scanning an aircraft wing using a gantry motion system including a gantry, a bar, a pole, and an eddy current scanning sensor; inserting the bar into the gantry extending in y-direction across the gantry and being movable in x-direction; attaching the pole to the bar; attaching the eddy current scanning sensor to the pole; positioning the aircraft wing including a substructure covered with outer mold line skins under the gantry; moving the eddy current scanning sensor towards the wing; positioning the eddy current scanning sensor on the outer mold line skin of the wing; moving the eddy current scanning sensor over the outer mold line skin in an x-y raster mode; locating the substructure through the outer skin; and controlling a numerically controlled assembly process using the location of the substructure. The pole is movable in y-direction along the bar and in z-direction. [0011] In a further aspect of the present invention, an assembly process comprises the steps of: fitting outer skins on a substructure to form an assembly; moving the assembly to a assembly machine; loading a substructure scanning system into the machine; activating the substructure scanning system; executing scanning programs; obtaining and saving scan point data; deactivating and removing the substructure scanning system; executing numerically controlled programs for the machine; using the scan point data to correct points and to align the assembly relative to machining tools of the machine; completing all numerically controlled programs with the machine; and removing the assembly from the assembly machine. [0012] In still a further aspect of the present invention, a method for machine coordinate correction comprises the steps of: sending a correction request from an assembly machine to a substructure scanning system; positioning an eddy current scanning sensor on the outer skin of an assembly using the substructure scanning system; moving the eddy current scanning sensor over the outer skin of the assembly using the substructure scanning system; collecting scanning sensor data each time the eddy current scanning sensor is moved by a small increment; compiling a data file containing position information and the scanning sensor data; analyzing the data file to identify features of a substructure located underneath the outer skin; computing coordinates of the assembly machine to identify location of the substructure features relative to the assembly machine position; and returning machine coordinates orienting the assembly machine relative to the substructure features. [0013] In still another aspect of the present invention, a gantry motion system comprises a gantry covering a two-dimensional area, a bar inserted into the gantry, a pole attached to the bar, and a probe attached to the pole. The bar extends in y-direction across the gantry and wherein the bar is movable in x-direction. The pole is movable horizontally in y-direction along the bar and vertically in z-direction. [0014] These and other features, aspects and advantages of the present invention will become better understood with reference to the following drawings, description and claims. BRIEF DESCRIPTION OF THE DRAWINGS [0015] FIG. 1 is a schematic view of a dependent scanning system according to one embodiment of the present invention; [0016] FIG. 2a is a top view of a test specimen according to one embodiment of the present invention; [0017] FIG. 2b is a side view of a test specimen according to one embodiment of the present invention; [0018] FIG. 2c is a C-scan of a test specimen according to one embodiment of the present invention; [0019] FIG. 3 is a perspective top view of a gantry motion system according to one embodiment of the present invention; [0020] FIG. 4 is a perspective side view of a robot motion system according to one embodiment of the present invention; Continue reading about Method for positioning a probe... 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