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Kunihiko Nagamine patents

Recent patents with Kunihiko Nagamine listed as an inventor - additional entries may be under other spellings.


Kunihiko Nagamine - Related organizations: Sony Corporation patents

Unevenness inspection apparatus and unevenness inspection method

03/16/17 - 20170074724 - An unevenness inspection apparatus includes circuitry that is configured to obtain a pickup image of a test object and modify a chroma value of a pixel in the pickup image to correct a gain of the pickup image associated with the pixel for generating a color unevenness inspection image. The
Inventors: Kunihiko Nagamine, Satoshi Tomioka

Unevenness inspection apparatus and unevenness inspection method

01/22/15 - 20150022672 - An unevenness inspection apparatus including: an image pickup section obtaining a pickup image of a test object; an image generating section generating each of a color unevenness inspection image and a luminance unevenness inspection image based on the pickup image; a calculating section calculating an evaluation parameter using both of
Inventors: Kunihiko Nagamine, Satoshi Tomioka

Unevenness inspection apparatus and unevenness inspection method

12/27/12 - 20120327399 - An unevenness inspection apparatus including: an image pickup section obtaining a pickup image of a test object; an image generating section generating each of a color unevenness inspection image and a luminance unevenness inspection image based on the pickup image; a calculating section calculating an evaluation parameter using both of
Inventors: Kunihiko Nagamine, Satoshi Tomioka

Color-unevenness inspection apparatus and method

09/08/11 - 20110216189 - A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target in a color-unevenness inspection; and an image generation section generating an uneven-color image by, in the picked-up image of the inspection target obtained by the image pickup section, calculating a chroma in each
Inventors: Kunihiko Nagamine, Satoshi Tomioka

Color-unevenness inspection apparatus and method

04/28/11 - 20110096191 - A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target for a color-unevenness inspection; an image generation section generating an uneven-color image by determining one or more uneven-color regions existing in the picked-up image of the inspection target obtained by the image pickup
Inventors: Kunihiko Nagamine, Satoshi Tomioka


### Kunihiko Nagamine patent invention listings

The bibliographic references displayed about Kunihiko Nagamine's patents are for a recent sample of Kunihiko Nagamine's publicly published patent applications. The inventor/author may have additional bibliographic citations listed at the USPTO.gov. FreshPatents.com is not associated or affiliated in any way with the author/inventor or the United States Patent/Trademark Office but is providing this non-comprehensive sample listing for educational and research purposes using public bibliographic data published and disseminated from the United States Patent/Trademark Office public datafeed. This information is also available for free on the USPTO.gov website. If Kunihiko Nagamine filed recent patent applications under another name, spelling or location then those applications could be listed on an alternate page. If no bibliographic references are listed here, it is possible there are no recent filings or there is a technical issue with the listing--in that case, we recommend doing a search on the USPTO.gov website.

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