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Kai Frohberg

Recent sampling of patent applications for Kai Frohberg listed and published in the public domain by the USPTO (USPTO Patent Application #,Title):

20080157075 - Test structure for estimating electromigration effects with increased robustness with respect to barrier defects in vias
20080160762 - Method for the protection of metal layers against external contamination

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The patent applicatons displayed about Kai Frohberg's patent applications are for a recent sample of publicly published patent applications. FreshPatents.com is not associated or affiliated in any way with the author/inventor or the United States Patent/Trademark Office but is providing this non-comprehensive sample listing for educational and research purposes using public data published from the United States Patent/Trademark Office public datafeed. This information is also available for free on the USPTO.gov website. If Kai Frohberg filed recent patent applications under another name, spelling or location then those applications could be listed on an alternate page.

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Patent data source: patents published by the United States Patent and Trademark Office (USPTO)
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