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  Fluid flow measuring and proportional fluid flow control deviceUSPTO Application #: 20080033901Title: Fluid flow measuring and proportional fluid flow control device Abstract: Embodiments disclosed herein provide restrictive-flow flow measurement devices, valve improvements and signal control devices and processes that control the flow of liquids, including control processes for single-liquid calibration. In some embodiments, a valve can be adjusted by application of fuzzy logic which involves quantizing input variables into the degree to which a small set of logical values is true. In one embodiment, variables related to flow rate and change in flow rate over time can be compared to membership functions to generate fuzzy inputs, based upon which fuzzy outputs can be generated. (end of abstract) Agent: SprinkleIPLaw Group - Austin, TX, US Inventors: Christopher Wargo, J. Karl Niermeyer, Jieh-Hwa Shyu, Craig L. Brodeur, William Basser USPTO Applicaton #: 20080033901 - Class: 706052000 (USPTO) Related Patent Categories: Data Processing: Artificial Intelligence, Knowledge Processing System, Knowledge Representation And Reasoning Technique, Reasoning Under Uncertainty (e.g., Fuzzy Logic) The Patent Description & Claims data below is from USPTO Patent Application 20080033901. Brief Patent Description - Full Patent Description - Patent Application Claims
CROSS-REFERENCE TO RELATED APPLICATIONS [0001] This is a divisional application of U.S. patent application Ser. No. 10/521,697, filed Jan. 19, 2005 under 35 USC 371, now allowed, entitled "FLUID FLOW MEASURING AND PROPORTIONAL FLUID FLOW CONTROL DEVICE," which claims priority under 35 USC 119 to PCT Application No. PCT/US03/22533, filed Jul. 18, 2003, entitled "FLUID FLOW MEASURING AND PROPORTIONAL FLUID FLOW CONTROL DEVICE," which claims priority from U.S. Provisional Application Ser. Nos. 60/397,053, filed Jul. 19, 2002, entitled "LIQUID FLOW CONTROLLER AND PRECISION DISPENSE APPARATUS AND SYSTEM" and 60/397,162, filed Jul. 19, 2002, entitled "FLUID FLOW MEASURING AND PROPORTIONAL FLUID FLOW CONTROL DEVICE," the disclosures of which are hereby incorporated by reference. The present application relates to U.S. patent application Ser. No. 09/991,392, filed Nov. 16, 2001, issued as U.S. Pat. No. 6,527,862, entitled "FLOW CONTROLLER," which is a divisional application of U.S. patent application Ser. No. 09/488,146, filed Jan. 20, 2000, issued as U.S. Pat. No. 6,348,098, entitled "FLOW CONTROLLER," both of which claim priority from U.S. Provisional Application Ser. Nos. 60/116,511, filed Jan. 20, 1999, entitled "UNIVERSAL EXTERNAL STOP/SUCKBACK VALVE CONTROLLER," and 60/143,370, filed Jul. 12, 1999, entitled "UNIVERSAL EXTERNAL STOP/SUCKBACK VALVE CONTROLLER," the disclosures of which are hereby incorporated by reference. The present application also relates to U.S. patent application Ser. No. 10/489,288, filed Mar. 11, 2004, issued as U.S. Pat. No. 7,249,628, entitled "APPARATUS FOR CONDITIONING THE TEMPERATURE OF A FLUID," which is a national stage entry of PCT Application No. PCT/US02/30494, filed Sep. 26, 2002, entitled "APPARATUS FOR CONDITIONING THE TEMPERATURE OF A FLUID," which claims priority from U.S. Provisional Application Ser. No. 60/326,357, filed Oct. 1, 2001, entitled "CLOSED LOOP HEAT EXCHANGE APPARATUS," the disclosures of which are hereby incorporated by reference. BACKGROUND [0002] The present invention relates to the field of flow measurement and specifically the sensing of flow in aggressive, ultra-pure chemicals such as those typically used in semiconductor manufacturing. The present invention allows for the determination of a fluid flow rate based on differential pressure caused by a flow restriction. The pressure signals are processed by a DSP based electronic circuit, quantified by a microprocessor, and communicated to the end-user via a PC based graphical user interface or other display. The differential pressure sensor is highly accurate owing to the dimensions of the flow restriction and pressure sensor cavities, and permits pressure measurement in the restriction region in order to generate a large differential pressure. This maximized pressure differential increases the sensitivity and accuracy of the final flow rate measurement. Also, the dimensions of these critical regions reduce the overall pressure loss due to the measurement, a further enhancement over existing designs and of substantial benefit when measuring aggressive, high-purity fluids at relatively low flow rates. [0003] During the manufacture of semiconductors, many different fluids must be precisely and accurately dispensed and deposited on the substrate being treated, such as deionized water, photoresist, spin on dielectrics, polyimides, developer and chemical mechanical polishing (CMP) slurries, to name a few. For example, in conventional apparatus for such applications, wafers to be processed are positioned beneath a suitable nozzle that then dispenses a predetermined amount of liquid or slurry to coat or treat the wafer. The predetermined amount is premised on pump cycles, tubing diameters and other characteristics of the fluid containment environment, not on the absolute amount or mass of fluid deposited on the wafer. Typically the wafer is then rotated to disperse the deposited liquid evenly over the entire surface of the wafer. It is readily apparent that the rate of dispensing and the amount of liquid dispensed are critical in this process. [0004] When fluid flow is stopped through the nozzle, such as between wafer treatments, the potential exists for droplets of liquid from the nozzle to form and fall onto the wafer positioned below the nozzle. This can destroy the pattern being formed on the wafer, requiring that the wafer be discarded or reprocessed. In order to avoid the formation of deleterious droplets on the nozzle, external suckback or stop/suckback valves are commonly used. The latter such valves are typically a dual pneumatically controlled valve pair, with one valve stopping the flow of liquid to the nozzle, and the other drawing the liquid back from the dispense end or outlet port of the nozzle. This not only helps prevent droplet formation and dripping at the port, but also helps prevent drying of the exposed surface of the liquid, which can lead to clogging of the nozzle, and reduces fluid contamination at the outlet. [0005] The coating of larger wafers (e.g., 300 mm in diameter and larger) is also problematic, as turbulence issues arise. The rotational speed of the wafer is conventionally used to spread the coating fluid from the center of the wafer where it is applied, radially outwardly to the edge of the wafer. However, this approach creates turbulent air flow over the wafer and can result in uneven or nonuniform coatings. Reducing the spin speed with larger wafers reduces the turbulence at the surface of the wafer, but can introduce new problems. With the reduced speed, the fluid moves across the wafer more slowly, and thus spreading the fluid to the wafer edge before the fluid begins to setup or dry becomes an issue. [0006] Pumps conventionally have been used to dispense liquids in semiconductor manufacturing operations. However, the pumps suitable for such applications are expensive and require frequent replacement due to excessive wear. [0007] It therefore would be desirable to provide a valve system that results in precise, reproducible dispensing of fluid without the foregoing disadvantages. Such a valve system should not be affected by changes in fluid temperature or effects of upstream fluid pressure. In addition, the present invention has broader applications to any fluid control device, especially where precise control of fluid flow is desired or required. SUMMARY OF THE INVENTION [0008] The problems of the prior art have been overcome by the present invention, which provides a fluid flow measuring and proportional fluid flow control device. The device controls fluid flow using a proportioning valve in response to a pressure loss measured in a flow restriction element. Pressure is sensed at or near the inlet and at or near the outlet of the restrictive flow element, and the resulting pressure drop therebetween is converted to a flow rate of the fluid being controlled. The pressure drop can be continually or continuously monitored, and one or more valves modulated to obtain the desired flow rate. The control system has applicability to fluids having a wide range of viscosities, it being capable of accurately and repeatably dispensing such fluids with minimal operator involvement. It offers accurate and repeatable performance in a cost-effective and flexible manner, responding quickly to real-time process variations. In a preferred embodiment, the design of the pressure drop element allows recovery of most of the pressure loss due to the restrictive element. [0009] Another embodiment of the present invention can include a proportional flow valve having a fluid inlet and a fluid outlet; an actuator for said proportional flow valve for modulating said proportional flow valve; a restrictive flow element having a restrictive flow element fluid inlet and a restrictive flow element fluid outlet in fluid communication with said fluid inlet of said proportional flow valve, said restrictive flow element creating a pressure drop between said restrictive flow element fluid inlet and restrictive flow element fluid outlet; an upstream pressure sensor; a downstream pressure sensor; and a controller in communication with said upstream pressure sensor and said downstream pressure sensor. The controller can further comprise one or more processors; one or more computer readable memories; and a set of computer readable instructions stored on said one or more computer readable memories and executable by said one or more processors. The set of computer readable can comprise instructions executable to receive an upstream pressure signal; receive a downstream pressure signal; and calculate a fluid flow rate based on said upstream pressure signal and said downstream pressure signal. [0010] Yet another embodiment of the present invention can include a device comprising a set of computer readable instructions stored on one or more computer readable memories and executable by said one or more processors, said set of computer readable instructions comprising instructions executable to calculate a fluid flow and calculate an overall change in valve output based on fuzzy logic. [0011] Yet another embodiment of the present invention can include a device comprising a set of computer readable instructions stored on one or more computer readable memories and executable by said one or more processors, said set of computer readable instructions comprising instructions executable to: calculate a fluid flow rate and calculate an overall change in valve output based on fuzzy logic. The overall change in valve output can be calculated by comparing an error to a first set of membership functions to generate a first set of fuzzy inputs; comparing a change in flow rate to a second set of membership functions to generate a second set of fuzzy inputs, wherein each fuzzy input from the first set of fuzzy inputs and the second set of fuzzy inputs is associated with an input degree of truth; applying a set of rules to the first set of fuzzy inputs and the second set of fuzzy inputs to generate a set of fuzzy outputs, wherein each fuzzy output is associated with an output degree of truth; associating each fuzzy output with a discrete change in valve output value; and calculating the overall change in valve output based on the output degree of truth of one or more of the fuzzy outputs and the discrete change in valve output value associated with each of the one or more fuzzy outputs. [0012] Embodiments of the present invention provide an advantage over prior art PID controllers, because it can provide greater stability. [0013] Embodiments of the present invention provide an advantage over prior art PID controllers, because it can be used over a greater set of operating conditions because the fuzzy logic can be programmed to account for changes in operating environment. BRIEF DESCRIPTION OF THE DRAWINGS [0014] FIG. 1 is a perspective view of a housing including the restrictive flow element and proportional valve in accordance with an embodiment of the present invention; [0015] FIG. 2 is a diagram of a concentric venturi in accordance with an embodiment of the present invention; [0016] FIG. 3 is a cross-sectional view of the concentric venturi of FIG. 1; [0017] FIG. 4 is diagram of an eccentric flat channel venturi in accordance with another embodiment of the present invention; [0018] FIG. 5 is an exploded view of a proportional valve in accordance with an embodiment of the present invention; [0019] FIG. 6 is a perspective view of the valve of FIG. 5; [0020] FIG. 7 is a cross-sectional view of a modified poppet for the valve of FIG. 5; Continue reading... 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