Electricity: measuring and testing inventions

20080106249 - Generating sample error coefficients: This invention relates to generation of a sample error coefficient suitable for use in an audio signal quality assessment system. The invention provides a method of determining a sample error coefficient between a first signal and a similar second signal comprising the steps of: determining a first periodicity measure from... Agent: Bourque & Associates Intellectual Property Attorneys, P.A.

20080106250 - Method of monitoring a photvoltaic generator: The subject matter of the present invention is a method for monitoring a photovoltaic generator (1) for generating current with a number of solar cells connected between two external connections by repeated feeding of a current with a frequency spectrum into the generator current circuit, detecting thereby a respective frequency... Agent: Pyle & Piontek Attn: Thomas R. Vigil

20080106251 - Daylight-readable digital panel meter with auto-brightness adjusting led display: A digital panel meter includes a light-emitting diode (LED) display that is sufficiently bright to be easily read in direct sunlight. The digital panel meter also includes an ambient light-sensing circuit which automatically and continuously adjusts the brightness of the LED display in order to provide adequate readability in ambient... Agent: Murata Power Solutions C/o Keating & Bennett, LLP

20080106252 - Integrated current sensing transformer and current sensing circuit using such transformer: An integrated current sensing transformer includes a bobbin, a magnetic core assembly, a first primary winding element, a second primary winding element, a secondary winding element. The bobbin has a receptacle therein. The magnetic core assembly is partially embedded into the receptacle for providing a closed path of magnetic flux.... Agent: Madson & Austin

20080106253 - Shielded rogowski coil assembly and methods: Shielded Rogowski coil systems having separate interface cables and methods for eliminating and monitoring noise in signal transmissions over the cables.... Agent: King & Spalding LLP

20080106254 - Split rogowski coil current measuring device and methods: A split Rogowski coil assembly having distinct coil loops formed on printed circuit boards that are not joined to one another.... Agent: King & Spalding LLP

20080106255 - Voltage monitoring: Embodiments of voltage monitoring are disclosed.... Agent: Hewlett Packard Company

20080106256 - Revolution indicator and a program for the revolution indicator: The object of the invention is providing a revolution indicator and a program for the indicator, which can detect a varying number of revolutions precisely. The indicator includes: a detecting portion detecting a physical phenomenon resulting from the revolution movement of a measuring object; a FFT computation portion performing a... Agent: Scully Scott Murphy & Presser, PC

20080106257 - Probe card and method for testing magnetic sensor: A probe card comprises a plurality of coils for impressing a magnetic field in changeable directions to a magnetic sensor and a group of probes for detecting an output signal of the magnetic sensor. A manufacturing cost of the magnetic sensor can be decreased.... Agent: Dickstein Shapiro LLP

20080106258 - Compliant tactile sensor: Tactile sensor. The sensor includes a compliant convex surface disposed above a sensor array, the sensor array adapted to respond to deformation of the convex surface to generate a signal related to an applied force vector.... Agent: Choate, Hall & Stewart LLP

20080106259 - Linear displacement sensor utilizing four pole magnet array: A linear sensor uses four spaced apart magnets arranged in a rectangular array and has an axis of symmetry. Each magnet has a staircase shape of at least two steps ascending towards a centerline. Each magnet of the array has a single N-S with magnets arranged as mirror images about... Agent: Key Safety Systems, Inc. Patent Department

20080106260 - Magnetic flux leakage system and method: A system for detecting defects in a string being pulled from the well includes an AC exciter (14) to induce eddy currents in the string, and a plurality of magnetic flux leakage detectors (16) circumferentially spaced about the string, each for detecting magnetic flux leakage indicative of a defect. Magnetic... Agent: Loren G. Helmreich

20080106261 - Subfemtotesla radio-frequency atomic magnetometer for nuclear quadrupole resonance detection: A radio-frequency tunable atomic magnetometer for detection of nuclear quadrupole resonance (NQR) from room temperature solids, including detection of nitrogen-containing explosives placed external to a sensor unit. A potassium radio-frequency magnetometer with sensitivity of 0.24 fT/Hz1/2 operating at 423 kHz is provided. The magnetometer detected a 14N NQR signal from... Agent: Blank Rome LLP

20080106262 - Magnetic resonance imaging apparatus: A magnetic resonance imaging apparatus includes a gantry having an imaging space therein, a receiving circuit that receives a magnetic resonance signal emitted from a subject arranged in the imaging space, and a bed device on which the subjected is mounted, wherein the bed device includes a top panel on... Agent: Nixon & Vanderhye, PC

20080106263 - Sample holder for nmr measurements with field homogenization in the sample volume by means of the bordering surfaces of the sample holder: A sample vessel (80) made of material with magnetic susceptibility χ2, for containing a sample substance (87) with magnetic susceptibility χ3≠χ2 to be analyzed in a nuclear magnetic resonance (NMR) spectrometer, has an inner interface G2 toward the sample substance and an outer interface G1 toward the environment (85) that... Agent: Kohler Schmid Moebus

20080106264 - Magnetic resonance system with reception antenna device: A magnetic resonance system that has a magnet system that generates magnetic fields in an excitation region, allowing nuclei in an examination subject in the excitation region to be excited to emit a magnetic resonance signal. A reception antenna device with multiple local coils for reception of the magnetic resonance... Agent: Schiff Hardin, LLP Patent Department

20080106265 - Time segmentation of frequencies in controlled source electromagnetic (csem) applications: A method for measuring a resistivity of a subsurface formation that includes transmitting continuously a signal at a first fundamental frequency at full power for a first period of time within a single window of time causing electromagnetic energy to propagate in the subsurface formations, transmitting continuously the signal at... Agent: Westerngeco L.L.C.

20080106266 - Series terminal, test plug and test terminal block: An electrical series terminal with a terminal housing, with two conductor connecting elements located in it, and with two current busses, first end regions of which are each assigned to a conductor connecting element and second end regions of which together form an elastic contact region for accommodating the contact... Agent: Roberts, Mlotkowski & Hobbes

20080106267 - Battery maintenance tool with probe light: A battery maintenance tool, which electrically couples to a battery, includes a maintenance tool housing and electronic circuitry within the maintenance tool housing. A cable, substantially external to the maintenance tool housing includes a plurality of conductors. At least some conductors of the plurality conductors are configured to electrically couple... Agent: Westman Champlin & Kelly, P.A.

20080106268 - Methods and apparatus to facilitate ground fault detection with a single coil: An example method of detecting a ground fault includes driving a first capacitor with an inductor to generate a resonance signal component and monitoring an inductor signal to determine at least one of a neutral-to-ground fault, a line-to-ground fault, or a non-fault condition. The example method also includes generating a... Agent: Texas Instruments Incorporated

20080106269 - Methods and apparatus to facilitate ground fault detection with a single coil and an oscillator: Methods and apparatus to facilitate ground fault detection with a single coil and an oscillator are disclosed. An example ground fault detection device includes a sense coil including a secondary winding surrounding a line conductor and a neutral conductor, the line conductor and the neutral conductor forming a primary winding.... Agent: Texas Instruments Incorporated

20080106270 - Apparatus for detecting imbalances in a paired line: A device for measuring and isolating noise-creating imbalances in a paired telecommunications line has an internal circuit which comprises a balanced center tapped termination consisting of precisely equal resistor pairs. The circuit includes an adjustable sine wave burst generator which generates a low voltage longitudinal ac signal that is transmitted... Agent: Russo & Duckworth, LLP

20080106271 - Method for detecting an interface between first and second strata of materials: Methods of detecting an interface between first and second materials having different dielectric loss factors disposed in a stratified manner in a volume of materials using a sensing apparatus having a length of transmission line that includes an inner conductor surrounded by a dielectric material and at least one shielding... Agent: George M. Medwick E.i. Du Pont De Nemours And Company

20080106272 - A position detecting device with a microwave antenna arrangement: A position detecting device finds the position of a specimen arranged in a conductive structure on the basis of microwaves and comprises an electrical circuit for the production and/or reception of the microwaves and a microwave antenna arrangement for emitting and/or receiving the microwaves. Said position detecting device includes a... Agent: Hoffmann & Baron, LLP

20080106273 - Signal processing system and method: First and second complementary voltage signals are operatively coupled across a series circuit comprising first and second sense resistors and a circuit element therebetween. A voltage across the circuit element is regulated in reference to a predetermined level, and an output signal responsive to the self-impedance of the circuit element... Agent: Raggio & Dinnin, P.C.

20080106274 - Method for measuring intrinsic capacitance of a metal oxide semiconductor (mos) device: A method for measuring intrinsic capacitance of a MOS device is provided. The MOS device includes a first terminal, a second terminal, a third terminal and a fourth terminal. First, provide a first input signal to the second terminal and ground the third terminal and fourth terminal. Then, charge the... Agent: Bacon & Thomas, PLLC

20080106275 - Sensor and method for measuring a variable affecting a capacitive component: The invention relates to a sensor and method for measuring a variable affecting a micro-electromechanical component. The invention is based on creating electronics, which are preferably integrated in a single circuit and which exploit the pull-in point of a micro-electromechanical sensor component such as a direct-current reference, for measuring a... Agent: Birch Stewart Kolasch & Birch

20080106276 - Hydrogen gas sensor: A hydrogen gas sensor and/or switch fabricated from arrays nanowires composed of metal or metal alloys that have stable metal hydride phases. The sensor and/or switch response times make it quite suitable for measuring the concentration of hydrogen in a flowing gas stream. The sensor and/or switch preferably operates by... Agent: Orrick, Herrington & Sutcliffe, LLPIPProsecution Department

20080106277 - Chip-based prober for high frequency measurements and methods of measuring: A chip-based prober for measuring a device-under-test is provided. The prober includes a probe tip, a voltage and control connector, a chip carrier, and a programmable termination chip. The probe tip is configured to contact the device-under-test. The voltage and control connector is in electrical communication with the probe tip.... Agent: Ohlandt, Greeley, Ruggiero & Perle, LLP

20080106288 - Circuit boards including removable test point portions and configurable testing platforms: Circuit boards are provided that include a functional portion and at least one removable test point portion. The removable test point portion may include test points which are accessed to verify whether the functional portion is operating properly or whether installed electronic components are electrically coupled to the board. If... Agent: Ropes & Gray LLP

20080106278 - Method and system for centrally-controlled semiconductor wafer correlation: A centrally-controlled correlation system for testing a correlation wafer and comparing the testing results with the wafer's reference data that has been determined previously. The testing instructions and the correlation criteria are stored and transmitted from a central database. Such centrally-controlled correlation system improves the reliability of the correlation results... Agent: Baker & Mckenzie On Behalf Of Tsmc

20080106279 - Probe card layout: Multi-touchdown, parallel test probe cards having probe elements arranged to provide greater than 99% efficiency during testing of a substrate having a plurality of die thereon, and methods of use.... Agent: Fletcher Yoder (micron Technology, Inc.)

20080106286 - Routing engine, method of routing a test probe and testing system employing the same: Embodiments of the present disclosure provide a routing engine, a method of routing a test probe and a testing system employing the router or the method. In one embodiment, the routing engine is for use with a test unit having at least one test probe and includes an analysis unit... Agent: Texas Instruments Incorporated

20080106281 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080106282 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080106283 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080106284 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080106285 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080106287 - Scan testing system, method and apparatus: Test circuits located on semiconductor die enable a tester to test a plurality of die/ICs in parallel by inputting both stimulus and response patterns to the plurality of die/ICs. The response patterns from the tester are input to the test circuits along with the output response of the die/IC to... Agent: Texas Instruments Incorporated

20080106289 - Torsion spring probe contactor design: The present invention relates to a probe for making electrical connection to a contact pad on a microelectronic device. A foot having a length, a thickness, a width, a proximal end, and a distal end, is connected to a substrate. The length of the foot is greater than its width.... Agent: Pillsbury Winthrop Shaw Pittman LLP

20080106280 - Vertical microprobes for contacting electronic components and method for making such probes: Multilayer probe structures for testing or otherwise making electrical contact with semiconductor die or other electronic components are electrochemically fabricated via depositions of one or more materials in a plurality of overlaying and adhered layers. In some embodiments the structures may include configurations intended to enhance functionality, buildability, or both.... Agent: Microfabrica Inc. Att: Dennis R. Smalley

20080106290 - Wafer probe station having environment control enclosure: A wafer probe station is equipped with an integrated environment control enclosure substantially surrounding a supporting surface for holding a test device, such enclosure limiting fluid communication between the interior and exterior of the enclosure and preferably also providing EMI shielding and a dark environment. The limited communication between the... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080106291 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer forms or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Daniel P. Morris Intellectual Property Law Dept.

20080106292 - Probe card having cantilever probes: A probe card includes a printed circuit board (PCB) and a probe ring coupled to the PCB. The probe card further includes a plurality of probes coupled to the PCB and to the probe card, and includes a plurality of tubes respectively associated with the plurality of probes. Each tube... Agent: Townsend And Townsend And Crew, LLP

20080106293 - Drive method and drive circuit of peltier element, attaching structure of peltier module and electronic device handling apparatus: By limiting a current change rate of a power to be supplied to a peltier element by using a pulse width control means for controlling to increase/decrease a pulse width of a pulse signal so that a temperature change of the peltier element does not exceed a predetermined temperature gradient... Agent: Posz Law Group, PLC

20080106294 - Apparatus and method for universal connectivity in test applications: A method and apparatus for using a Universal Test interface in test and measurement applications containing a base unit with at least one electrical, optical, or electromagnetic connection, between this and a parallel interposer with at least one electrical, optical, or electromagnetic connection, a precision alignment and fast attach/release mechanism,... Agent: Stephen William Smith

20080106295 - System and method for measuring negative bias thermal instability with a ring oscillator: An integrated circuit, in accordance with one embodiment of the present invention, includes a first device under test (DUT), a first ring oscillator, a second DUT and a second ring oscillator. The first DUT is biased such that interface traps are generated during a first mode. The generated interface traps... Agent: Murabito, Hao & Barnes LLP Third Floor

20080106296 - Test system of multi-chip package with improved signal integrity by restraining reflection wave: A test system includes: a tester; and a test board, on which a multi-chip package including plural memories is mounted, being connected to the tester by way of a transmission line. The transmission line includes a compensation unit for compensating signal distortion.... Agent: Mills & Onello LLP

20080100279 - Nano-based device for detection of disease biomarkers and other target molecules: The present invention pertains to a nano-based sensing device (a sensor) comprising a nano-scale working electrode that can be used for the ultra-sensitive detection of blood analytes, disease biomarkers, and other target molecules. The present invention also pertains to a method for detecting analytes using the sensor as the sensor... Agent: Saliwanchik Lloyd & Saliwanchik A Professional Association

20080100280 - Method and device for measuring with synchronous detection and correlated sampling: The invention relates to electronic circuits for measuring, by synchronous detection, weak signals whose reference level is not well known and is subject to large fluctuations. A first correlated double sampling is performed between a time T1 situated just before the start of the measurement pulse and a time T2... Agent: Lowe Hauptman & Berner, LLP

20080100281 - Method of optical frequency measurement: A method of absolute optical frequency measurement is realized by using mode-locked laser frequency combs to measure the optical frequency of an unknown laser. By varying the repetition frequency, the relative frequency location of the unknown laser to the beating comb line is determined according to the corresponding variation of... Agent: Wpat, PC Intellectual Property Attorneys

20080100282 - Ground resistance test apparatus: The “Ground Resistance Test” provides a circuit and test setup for measuring the resistance of earth grounds. The ground resistance test uses the central office battery from a working telephone pair to source current into the “Tested Ground”. First the quiescent voltage (Vo) on the Tested Ground with respect to... Agent: Russo & Duckworth, LLP

20080100283 - Methods for measuring capacitance: Methods for determining capacitance values of a metal on semiconductor (MOS) structure are provided. A time domain reflectometry circuit may be loaded with a MOS structure. The MOS structure may be biased with various voltages, and reflectometry waveforms from the applied voltage may be collected. The capacitance of the MOS... Agent: Fulbright & Jaworski L.L.P.

20080100284 - Magneto-sensitive angular-movement sensor: A sensor system for measuring angular movements of measurement objects with at least one magnet (1) and a magneto-sensitive sensor (3), where according to the invention the magnet (1) is imbedded in a magnet support (2) and is circularly arcuate, and the magnet (1) has a cross section that varies... Agent: K.f. Ross P.C.

20080100285 - Rotation angle detecting device: A rotation angle detecting device includes a permanent magnet member, a pair of magnetic sensor elements disposed in a magnetic field formed by the permanent magnet member to provide a pair of output voltage signals when the magnetic field changes as the rotating object rotates; and a rotation angle calculating... Agent: Nixon & Vanderhye, PC

20080100286 - Automatic head alignment: A spinstand includes a baseplate, a spindle mounted to the baseplate and a platform connected to the baseplate. A first component and a second component are mounted to the platform. An actuator moves the platform in a first direction relative to the baseplate, and mechanism moves the second component in... Agent: Raghunath S. Minisandram Seagate Technology LLC

20080100287 - Disc media testing control system: Techniques are described in which a hard disc media tester uses busses conforming to a single bus format to connect control components within a control system of the hard disc media tester. A hard disc media tester may include several control components such as a testing control module, a motion... Agent: Raghunath S. Minisandram Seagate Technology LLC

20080100288 - Seal inspection apparatus and method: A seal inspector and a method of inspecting a seal are described. A seal inspector includes an eddy current sensor for detecting changes in an eddy current within a lid seal of a can. The eddy current sensor includes a signal line for creating a magnetic field, which induces the... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20080100290 - Magnetic sensor and manufacturing method thereof: First and second MR elements are provided with a plurality of element patterns each having a stacked structure. The stacked structure includes a free layer changing its magnetization direction depending on an external magnetic field, an intermediate layer generating no specific magnetization direction, and a pinned layer having magnetization pinned... Agent: Oliff & Berridge, PLC

20080100289 - Magnetoresistive sensor element for sensing a magnetic field: A magnetoresistive sensor element has a first magnetic layer structure, a second magnetic layer structure, and a barrier layer. The resistance R1 of the first magnetic layer structure, the resistance R2 of the second magnetic layer structure and resistance-area product RA define a characteristic length λ of the magnetoresistive sensor... Agent: Eschweiler & Associates LLC

20080100291 - Solid high aspect ratio via hole used for burn-in boards, wafer sort probe cards, and package test load boards with electronic circuitry: A method, and apparatus resulting from the method, for fabricating a circuit board suitable for mounting electronic components. The method includes drilling a plurality of through-holes in a plurality of dielectric sheets, forming a conductive film on at least one side of each of the plurality of dielectric sheets, and... Agent: Schneck & Schneck

20080100292 - System and method for fast mr coil sensitivity mapping: A system and method for mapping the sensitivity of MR coils includes a neural network or other computer intelligence trained from sample MR data to determine coil sensitivity profiles or sensitivity normalizations. Once the network is trained, subsequent coil mapping determinations may include fewer mapping acquisitions per coil. The resulting... Agent: General Electric Company Global Research

20080100293 - Method of carrying out dynamic nuclear polarization: A method of carrying out DNP on a sample with a molecular structure containing at least two J-coupled non-integer spin nuclear species, the method comprising hyperpolarizing the sample in a cooled, solid form while it is exposed to a homogeneous magnetic field of suitable strength; dissolving or melting the hyperpolarized... Agent: Blank Rome LLP

20080100294 - Flexible rf coil assembly and method of making same: An RF coil assembly includes a plurality of coil supports rotatably interconnected to each other. Each coil support is configured to rotate with respect to at least one adjoining coil support. A plurality of RF coils is connected to each coil support.... Agent: General Electric Company Global Research

20080100295 - Superconductive magnetic apparatus for magnetic resonance imaging unit: A super-conducting magnet apparatus in an MRI system which may reduce unevenness among magnetization characteristics of ferromagnetic elements arranged between super-conductive shield coils and superconducting main coils. There are provided a pair of super-conducting main coils, a pair of superconductive shield coils arranged on the axes of the pair of... Agent: Dickstein Shapiro LLP

20080100296 - Flow-through microfluidic nuclear magnetic resonance(=nmr)-chip: A flow-through microfluidic NMR-chip comprising a substrate (5) which is planar in an yz-plane with a sample chamber (2) within the substrate (5), the sample chamber (2) being elongated and having walls which run parallel to the z-direction, the substrate (5) having a thickness in x-direction of a Cartesian xyz-coordinate... Agent: Kohler Schmid Moebus

20080100297 - High frequency coil device: A magnetic resonance diagnostic apparatus, for receiving a magnetic resonance signal occurred in a subject, includes a plurality of high frequency loop coils arranged so that a part of their inner loop surface overlaps each other in a predetermined direction, and a first electric circuit arranged to overlap the inner... Agent: Nixon & Vanderhye, PC

20080100298 - Battery management system and driving method thereof: A battery management system and a driving method include a first switch coupled to an end of a resistor. When calculating an internal resistance of a battery, the first switch is turned on and the battery and the resistor are coupled in parallel. Then, the internal resistance of the battery... Agent: Stein, Mcewen & Bui, LLP

20080100299 - Apparatus and method for identifying the presence of high conductivity or permittivity conditions in electrically insulating materials: An apparatus and method for detecting the presence of high conductivity or permittivity conditions in electrically insulating materials, including a first electrode and a second electrode for being placed in spaced-apart relation on an insulator to be tested for a high conductivity or permittivity condition, and a high voltage source... Agent: Trego, Hines & Ladenheim, PLLC

20080100300 - Electrostatic voltmeter: An electrostatic voltmeter has an input sensing terminal, a first operational amplifier, a second operational amplifier, a first reference voltage terminal electrically connected to the non-inverting input of the second operational amplifier, a low reference voltage terminal electrically connected to the output of the second operational amplifier, and a voltage... Agent: Hodgson Russ LLP The Guaranty Building

20080100301 - Method and apparatus for shielding feedthrough pin insulators in an ionization gauge operating in harsh environments: Shields for feedthrough pin insulators of a hot cathode ionization gauge are provided to increase the operational lifetime of the ionization gauge in harmful process environments. Various shield materials, designs, and configurations may be employed depending on the gauge design and other factors. In one embodiment, the shields may include... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20080100302 - Apparatus and method for measuring and monitoring layer properties in web-based processes: An apparatus and method for measuring and monitoring layer properties in web-based processes are described. The apparatus includes multiple electrode devices adjacently positioned on a surface of a web material, which advances with a predetermined speed. The electrode devices perform measurements of electrical parameters of a layer of the web... Agent: Hewlett Packard Company

20080100303 - Circuit and method for determining potentiometer wiper resistance: A circuit and method for determining the wiper resistance of a potentiometer that includes a first terminal, a second terminal, a third terminal, a resistive element having a potentiometer resistance electrically coupled between the first and second terminals, and a wiper electrically coupled between the resistive element and the third... Agent: Honeywell International Inc.

20080100304 - Network device, network connection detector and detection method thereof: A network device, a network connection detector and a detection method thereof are disclosed. The network device comprises a socket, a waveform generator and a reflected wave detector. The waveform generator sends a first test wave to at least a first contact of a plurality of contacts of a socket... Agent: Rosenberg, Klein & Lee

20080100305 - Automated arc generator and method to repeatably generate electrical arcs for afci testing: An apparatus for repeatably generating electrical arcs for testing an electrical switching device, such as an arc fault circuit interrupter, includes a stationary electrode and a movable electrode that is moved along a path of travel by an electromechanical device under the control of a controller that receives data from... Agent: Martin J. Moran Eaton Electrical, Inc.

20080100306 - Connector: A connector housing (10) has a front surface with projecting walls that form a groove (31). A front mask (60) is mountable at a mount position on the front surface of the housing (10). The front mask (60) has a fittable portion (62) that fits the groove (31) when the... Agent: Casella & Hespos

20080100307 - Cable fault detection: A cable fault detection component (168) receives input data indicative of a fault in an electrical power system. The component (168) analyzes the input data to determine if the fault is indicative of a self-clearing cable fault and generates corresponding output data (276). In one implementation, the cable fault detection... Agent: Driggs, Hogg & Fry Co., L.p.a. Dept. Abb

20080100308 - Apparatus for detecting imbalances in a paired line: A device for measuring and isolating noise-creating imbalances in a paired telecommunications line has an internal circuit which comprises a balanced center tapped termination consisting of precisely equal resistor pairs. The circuit includes an adjustable sine wave burst generator which generates a low voltage longitudinal ac signal that is transmitted... Agent: Russo & Duckworth, LLP

20080100309 - Liquid property sensor: A liquid property sensor for detecting property of liquid includes a semiconductor board, a first electrode and a second electrode, and a protection film. The first and second electrodes are disposed on the semiconductor board to be spaced from each other at a predetermined distance. The protection film has resistance... Agent: Posz Law Group, PLC

20080100310 - Linearity tuning temperature control circuit: A linear heater control circuit has a more linear relationship between sensed temperature and a variable resistance. As the user adjusts the variable resistance, the temperature increases linearly rather than abruptly. The linear control circuit has a parallel resistor that is in parallel with the variable resistor and one or... Agent: Stuart T Auvinen

20080100311 - Electrical measurement of the thickness of a semiconductor layer: A method for the electrical measurement of the thickness of a semiconductor layer ( 10, 11, 12) is disclosed. Active layers on SOI wafers, EPI layers with inverse conductivity tape and membrane thickness can be measured by use of a test structure which can routinely be measured during a production... Agent: Hunton & Williams LLP Intellectual Property Department

20080100313 - Charge eliminating apparatus and method, and program storage medium: A charge eliminating apparatus eliminates, when an electrical characteristics test of a target object is performed by moving a mounting table mounting the target object thereon and a probe card relative to each other to bring the target object into electrical contact with the probe card, static electricity of the... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080100314 - Electrical test system including coaxial cables: An electrical test system includes a test head, a performance board, a probe card and coaxial cables. The performance board includes a first side and an opposite second side, where the first side of the performance board is electrically connected to the test head and the second side of the... Agent: Volentine & Whitt PLLC

20080100312 - Method and apparatus for providing active compliance in a probe card assembly: A probe card assembly can comprise a first source of compliance and a second source of compliance. The probe card assembly can further comprise a controller, which can be configured to apportion a total compliance demand placed on the probe card assembly between the first source of compliance and the... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080100315 - Electrochemically fabricated microprobes: Multilayer test probe structures are electrochemically fabricated via depositions of one or more materials in a plurality of overlaying and adhered layers. In some embodiments each probe structure may include a plurality of contact arms or contact tips that are used for contacting a specific pad or plurality of pads... Agent: Dennis R. Smalley Microfabrica Inc.

20080100316 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080100317 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080100318 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080100320 - Intelligent probe card architecture: A probe card for a wafer test system is provided with a number of on board features enabling fan out of a test system controller channel to test multiple DUTs on a wafer, while limiting undesirable effects of fan out on test results. On board features of the probe card... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080100319 - Intra-chip power and test signal generation for use with test structures on wafers: The fabrication of the wafer may be analyzed starting from when the wafer is in a partially fabricated state. The value of a specified performance parameter may be determined at a plurality of locations on an active area of a die of the wafer. The specified performance parameter is known... Agent: Shemwell Mahamedi LLP

20080100321 - Methods and apparatuses for improved stabilization in a probing system: Improved methods and apparatuses for automatically and accurately maintaining the alignment of a wafer prober to the bonding pads of a semiconductor device in the presence of motion disturbances are provided. In one embodiment of one aspect of the invention, a feedback control system incorporating information from a number of... Agent: Blakely Sokoloff Taylor & Zafman

20080100322 - Portable manipulator for stackable semiconductor test system: This invention provides a manipulator for positioning a test head relative to a prober or other reference. The manipulator has a frame; a linkage coupled to the frame and including first and second links having freedom of rotation about respective pivots and a third link coupled to the first and... Agent: Dorsey & Whitney LLP US Bank Center

20080100325 - Integrated circuit test probe with hollow tubular contact configuration: An electrical test probe for a connector assembly includes an elongated contact, an elongated helical coil spring, and an elongated, electrically conductive tubular member disposed about the assembly of said elongated contact and elongated helical coil spring. The bottom portion of the tubular member includes a bullet-nosed portion which protects... Agent: Casella & Hespos

20080100323 - Low cost, high pin count, wafer sort automated test equipment (ate) device under test (dut) interface for testing electronic devices in high parallelism: An interference device to communicate electrical signals from a probe card used to test electronic circuits. The interface device includes at least one interposer configured to electrically couple to the probe card and a plurality of mechanical springs mechanically coupled to the at least one interposer. Each of the plurality... Agent: Schneck & Schneck

20080100324 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080100326 - Cantilever microprobes for contacting electronic components and methods for making such probes: Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to various designs of cantilever-like probe structures. Some embodiments are directed to methods for fabricating such cantilever structures. In some embodiments, for example, cantilever... Agent: Microfabrica Inc. Att: Dennis R. Smalley

20080100327 - Apparatuses and methods for outputting signals during self-heat burn-in modes of operation: An apparatus and method for selecting and outputting test patterns and internal signals during various SHBI modes of operation. The apparatus may include multiple input/output (I/O) pins, one or more functional blocks, a Self-Heat Burn-In (SHBI) state machine that is coupled to the I/O pins and the one or more... Agent: Schwabe, Williamson & Wyatt, P.C.

20080100328 - Method and apparatus for testing to determine minimum operating voltages in electronic devices: In one embodiment, a test system tests a device under test (DUT). The DUT includes an internal test controller that executes built-in self-test (BIST programs. Built-in self-test programs include array-based automatic built-in self-test programs, discrete and combinational logic built-in self-test programs, and functional architecture verification programs (AVPs). An external manufacturing... Agent: Mark P. Kahler

20080100329 - System and method for multi-up inline testing of radio frequency identification (rfid) inlays: Methods, systems, and apparatuses for ways of testing tags are provided. In an aspect of the present invention, an antenna is mounted in a cavity of a surface. The antenna transmits a test signal, such as a radio frequency (RF) test signal, to the antenna of an adjacent tag, to... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20080100330 - Test apparatus, performance board and interface plate: A semiconductor testing device 20 is provided that can connect en bloc a variety of connectors of a performance board 200. The semiconductor testing device 20 includes a test head main body 100 that includes a signal module 110 that generates and processes test signals input and output to a... Agent: Jianq Chyun Intellectual Property Office

20080100331 - Liquid crystal display having discharging circuit: An exemplary liquid crystal display (200) includes a liquid crystal panel, a gate driving circuit (210), and a data driving circuit (220). The liquid crystal panel includes a pixel array (230), a short-circuit test circuit (240), and a control circuit (290). The short-circuit test circuit and the control circuit cooperatively... Agent: Wei Te Chung Foxconn International, Inc.

20080100332 - System and method for detecting a motor shorting relay failure: Methods and systems for detecting a motor shorting relay failure. Exemplary embodiments include methods and systems for determining a motor shorting relay failure in a motor, the motor having first phase winding in a first leg of the motor, a second phase winding in a second leg of the motor,... Agent: Delphi Technologies, Inc.

20080094051 - Demultiplexed nanowire sensor array for detection of chemical and biological species: A demultiplexed nanowire sensor array for detecting different chemical and biological species are provided, comprising a sensor array and a demultiplexer array. Methods of detecting at least two chemical and/or biological species are also provided, using the demultiplexed nanowire sensor array.... Agent: Hewlett Packard Company

20080094053 - Test circuits having ring oscillators and test methods thereof: In a test circuit, an oscillation signal is generated based on a design rule pattern of a chip formed on a wafer. The oscillation signal is counted using a counter, and an N-bit signal is generated from the counting of the oscillation signal. The N-bit signal is serialized and output.... Agent: Harness, Dickey & Pierce, P.L.C

20080094052 - Voltage detector circuit: A voltage detection circuit for accurately detecting a voltage that is unaffected by fluctuation due to variations in transistor characteristics and threshold voltage. The voltage detection circuit includes a reference current generating section and a detecting section. The reference current generating section includes a voltage-controlled current source that includes a... Agent: Murabito, Hao & Barnes LLP

20080094054 - Fuel cell state monitor apparatus and method: An object of the present invention is to provide a fuel cell state monitor apparatus and method wherein detection errors can be reduced in a stable manner even when the ambient temperature fluctuates. The present invention includes temperature detection means for detecting the ambient temperature of fuel cells, state value... Agent: Kenyon & Kenyon LLP

20080094055 - Chopped hall effect sensor: A chopped Hall effect sensor topology includes a switched Hall plate, an amplifier responsive to an output of the switched Hall plate and a filter stage responsive to the output of the amplifier and including an anti-aliasing filter and a selective filter that is tuned to the modulation frequency. The... Agent: Daly, Crowley, Mofford & Durkee, LLP

20080094056 - Device and method for detecting battery voltage level: A device and an associated method for detecting a voltage level of a battery are disclosed. The device employs an analog-to-digital converter or digital-to-analog converter to accurately detecting the voltage level. In one embodiment, the device includes a digital-to-analog converter, a comparison circuit, and a microprocessor. The digital-to-analog circuit outputs... Agent: Troxell Law Office PLLC Suite 1404

20080094057 - Position measurement system employing total transmitted flux quantization: A device for measuring the position (location and orientation) in the six degrees of freedom of a receiving antenna with respect to a transmitting antenna utilizing transmitter charge quantization. The transmitting component consists of a transmitting antenna of known location. The transmitting antenna is driven by a pulsed excitation. The... Agent: H. Jay Spiegel - H. Jay Spiegel & Associates

20080094058 - Magnetic rotor and rotational angle sensing apparatus having the same: In a magnetic rotor, a rotatable shaft is received through a holder. A positioner is made of a magnetic material and is fitted into at least one of an outer peripheral wall of the rotatable shaft and an inner peripheral wall of the holder to position the holder relative to... Agent: Nixon & Vanderhye, PC

20080094059 - Magnetic film sensor and method of manufacturing the same: A magnetic film sensor comprises a magnetic film for generating a magnetostriction, and a magnetostrictive structure for generating a magnetostriction in the magnetic film. The magnetostrictive structure is constructed so as to generate a magnetostriction by curving the magnetic film, for example. The magnetostrictive structure is obtained, for example, by... Agent: Oliff & Berridge, PLC

20080094060 - Electric current detector: An electric current detector has a bus bar with a current direction changing section for changing a direction of electric current through the bus bar, and a magnetic detector disposed in the current direction changing section of the bus bar. The current direction changing section of the bus bar has... Agent: Scully Scott Murphy & Presser, PC

20080094062 - Active-passive electromagnetic shielding to reduce mri acoustic noise: The present invention provides an apparatus for reducing acoustic noise in a magnetic resonance imaging device including passive shielding located outside the actively shielded gradient winding elements in order to reduce the magnitude of fields that spread outside the gradient coil assembly in unwanted directions and interact with the magnet... Agent: Hoffman Warnick & D'alessandro, LLC

20080094063 - Birdcage resonator with coupling rings in addition to the ferrules: A birdcage resonator for magnetic resonance applications has two ferrules disposed in spaced-apart parallel ferrule planes. A line connecting the ferrule centers defines the antenna axis of the birdcage resonator, which orthogonally intersects the ferrule planes. The birdcage resonator has a number of antenna rods regularly distributed around the antenna... Agent: Schiff Hardin, LLP Patent Department

20080094061 - Use of multiple sensors in a nuclear quadropole resonance detection system to improve measurement speed: The use of multiple sensors improves the measurement speed of a nuclear quadrupole resonance detection system when the nuclear quadrupole resonance frequency is known only within a range of frequencies.... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center

20080094064 - Magnetic resonance system with circular gradient system and non-circular whole-body coil: A magnetic resonance system has a basic field magnet system that annularly surrounds an examination volume, a gradient system arranged radially within the basic magnetic system, a radio-frequency shield arranged radially within the gradient system and a whole-body coil arranged radially within the radio-frequency shield. The gradient system is essentially... Agent: Schiff Hardin, LLP Patent Department

20080094065 - Metal detector: A real time electronic metal detector including a magnetic transmitter (1) and a receiver (3), wherein the receiver includes approximate sine-wave weighted synchronous demodulation and a switched voltage signal is applied to the magnetic transmitter and the said receiver approximate sine-wave weighted synchronous demodulation is selected to receive synchronously with... Agent: Brooks Kushman P.C.

20080094066 - Methods and apparatus for subsurface geophysical exploration using joint inversion of steady-state and transient data: Methods and apparatus are provided for controlled source electromagnetic surveying. In particular, a time-varying electromagnetic signal is transmitted at a first location, and an electromagnetic signal responsive to the transmitted signal is received at a second location, wherein the received signal includes a transient response component and a steady-state component.... Agent: Law Office Of James Trosino

20080094067 - Three-axis marine electric field sensor for seafloor electrical resistivity measurement: A sensor for electric field measurement at the floor of a body of water has at least one pair of square or rectangular electrodes (139, 140) with a known area positioned in parallel separated by a distance and connected by a resistor (120) having a value that matches the resistance... Agent: Procopio, Cory, Hargreaves & Savitch LLP

20080094068 - Kelvin connector including temperature sensor: The electrical measuring apparatus (17) and temperature sensing apparatus minimises the number of connections required for each contact (30, 31) of a battery (18). The present invention measures the core temperature of the battery (18) which is useful in monitoring the health of the battery (18). The apparatus comprises first... Agent: Baker & Daniels LLP

20080094069 - Method and apparatus for monitoring the condition of a battery by measuring its internal resistance: A method for evaluating the condition of a battery comprises coupling a first power transistor as or as part of a first external load in series with the battery, coupling a second power transistor as or as part of a second external load in series with the battery, and conducting... Agent: Michael De Angeli Michael M. De Angeli, P.C.

20080094070 - Linear analog sensor for in line measurement of the conductivity of beer and similar liquids: A fluid conductivity test device for testing the conductivity of a fluid in a container. The device includes a fitting that may mate either directly to or indirectly to a tap on, for example, a keg, to allow the fluid in the container to come into contact with the sensor... Agent: St. Onge Steward Johnston & Reens, LLC

20080094071 - Semiconductor device and test system which output fuse cut information sequentially: A semiconductor device includes a plurality of fuses, and a plurality of latch circuits respectively electrically connected to the plurality of fuses. The plurality of latch circuits are configured to store respective fuse-cut information from the plurality of fuses, and to then sequentially transmit the fuse-cut information through the latch... Agent: Volentine & Whitt PLLC

20080094072 - Apparatus for extending the bandwidth of vector network analyzer receivers: A system for measuring a frequency response of an electrical network, comprises a signal source, a signal source path, a reflectometer receiver interactively associated with the signal source path by a directional coupler, and one or more additional reflectometer receivers arranged in series along the signal source path and associated... Agent: Fliesler Meyer LLP

20080094073 - Method and device for measuring width direction end position of stripe body, and method and device for measuring width direction center position of stripe body: A microwave sending antenna 3R and a microwave receiving antenna 4R are provided to a right-side furnace wall 1R, and the system is devised so that the microwaves emitted from the microwave sending antenna 3R are reflected by the right-side edge of a cold-rolled steel plate 2, and the reflected... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080094074 - Transistor with floating gate and electret: A sensor includes a field effect transistor having a source, drain, a control gate and floating gate, wherein the floating gate has an extended portion extending away from the control gate. A sensing gate is capacitively coupled to the extended portion of the floating gate. A polymer electret sensing coating... Agent: Schwegman, Lundberg & Woessner, P.A.

20080094075 - Micromachined capacitive sensor and linkage: In accordance with the invention, a surface capacitive sensor is mechanically coupled to a conventional macrostructure actuator to measure the displacement of the actuator along a measurement axis with high accuracy.... Agent: Agilent Technologies Inc.

20080094077 - Capacitive position sensor: A capacitive touch sensor is provided having sensing path for setting a parameter to a desired value within a range. The sensor has a first mode of operation in which a parameter can be set approximately to a desired value and a second mode in which the value can be... Agent: David Kiewit

20080094076 - Method and apparatus for sensing a time varying current passing through an ion channel: A capacitive sensing system (2, 2′, 2″) is used to measure a timevarying ion current through a channel (50), such as an ion channel or protein pore. Such a capacitive system (2, 2′, 2″) does not suffer problems of electrode corrosion and, when used with methods to control a build... Agent: Diederiks & Whitelaw, PLC

20080094078 - Carbon nanotube biosensors with aptamers as molecular recognition elements and method for sensing target material using the same: The present invention relates to a carbon nanotube transistor biosensor with aptamers and a method for detecting a target material using the same, more particularly to a carbon nanotube transistor biosensor recognizing the target material, i.e., a specific molecule (such as a protein, a peptide, an amino acid, and an... Agent: Frommer Lawrence & Haug

20080094079 - Gas concentration detection apparatus having function for detecting sensor element activation status: A gas concentration detection apparatus includes a series-connected combination of a sensor element and a resistor, with an AC voltage being applied to one of the outer terminals of that combination and with the other outer terminal being held at a fixed potential. A DC voltage signal at a level... Agent: Nixon & Vanderhye, PC

20080094080 - Method for evaluating a potentiometer and circuit arrangement having a potentiometer: A potentiometer (PT1, PT2) has a first terminal (A1), a second terminal (A2) and an intermediate tap (ZA), a resistor being between the first terminal (A1) and the second terminal (A2) irrespective of the position of the potentiometer (PT1, PT2). In an evaluation method, a first drive voltage (GND) and... Agent: Alston & Bird LLP

20080094081 - Continuous linear scanning of large flat panel media: A system performs continuous full linear scan of a flat media. The system includes, in part, a chuck, and at least first, second and third gantries. The chuck is adapted to support the flat media during the test. The first gantry includes at least one linear array of non-contacting sensors... Agent: Townsend And Townsend And Crew, LLP

20080094082 - Die infrared transceiver bus: A semiconductor wafer adapted to wirelessly transfer data to a testing system. The wafer comprises a plurality of dies, each die adjacent another die and each die comprising an infrared transceiver. A first infrared transceiver transfers data to a second infrared transceiver by emitting a pattern of infrared light pulses... Agent: Texas Instruments Incorporated

20080094084 - Multi-layer electric probe and fabricating method thereof: A multi-layer electric probe, suitable for testing a to-be-tested device, includes a first strip layer and a second strip layer. The first strip layer has a first conductivity and a first mechanical strength. The second strip layer has a second conductivity and a second mechanical strength. The first strip layer... Agent: Jianq Chyun Intellectual Property Office

20080094083 - Versatile materials probe: Disclosed is an electrical measurement probe including two probe blocks, each probe block having a connection face and a measurement face. Each probe block also includes a plurality of spring loaded pogo pins. Each pogo pin has a first end that extends to the connection face and a second end... Agent: Cantor Colburn LLP - IBM Rochester Division

20080094085 - Metalized elastomeric probe structure: A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously... Agent: Wayne L. Ellenbogen Ryan, Mason & Lewis, LLP

20080094086 - Stack-type semiconductor package sockets and stack-type semiconductor package test systems: A stack-type semiconductor package socket may include: a first package connection portion for connection with leads of a lowermost package of a stack-type semiconductor package; a second package connection portion for connection between pads of an odd-numbered package and leads of an even-numbered package, wherein the odd-numbered package and the... Agent: Harness, Dickey & Pierce, P.L.C

20080094087 - Device for detecting chip location and method of detecting chip location using the device: In a device for detecting a chip location and a method of detecting a chip location using the device, the device includes a chuck to which a wafer to be inspected is fixable, an infrared irradiation unit capable of irradiating infrared light to a target semiconductor chip of the wafer... Agent: Mills & Onello LLP

20080094088 - Method and system for compensating thermally induced motion of probe cards: The present invention discloses a method and system compensating for thermally induced motion of probe cards used in testing die on a wafer. A probe card incorporating temperature control devices to maintain a uniform temperature throughout the thickness of the probe card is disclosed. A probe card incorporating bi-material stiffening... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080094090 - Probe: A probe available for a narrow pitch pad without the need of cleaning is realized by providing a z deformed portion that is elastically deformed in a vertical direction, and a zθ deformed portion that is serially connected to the z deformed portion to rotate while being elastically deformed at... Agent: Haynes And Boone, LLP

20080094089 - Semiconductor probe having embossed resistive tip and method of fabricating the same: A semiconductor probe having an embossed resistive tip and a method of fabricating the semiconductor probe are provided. The semiconductor probe includes a protrusion portion protruded to a predetermined height on a cantilever in a first direction crossing a length direction of the cantilever, an embossed resistive tip formed on... Agent: Sughrue Mion, PLLC

20080094091 - Dynamic burn-in systems and apparatuses: A burn-in apparatus with a radio frequency signal generator is provided. One embodiment includes a printed circuit board to carry a plurality of semiconductor devices for a burn-in process and a radio frequency signal generator mounted on the printed circuit board to provide a plurality of radio frequency signals to... Agent: Ivy Y. Mei

20080094092 - Mechanism for detection and compensation of nbti induced threshold degradation: The embodiments of the invention provide an apparatus and method for detection and compensation of negative bias temperature instability (NBTI) induced threshold degradation. A semiconductor device is provided comprising at least one stress device having a voltage applied to its gate node and at least one reference device having a... Agent: Frederick W. Gibb, Iii Gibb & Rahman, LLC

20080094096 - Semiconductor testing equipment and semiconductor testing method: In testing a large number of semiconductor devices, semiconductor testing equipment of the present invention is provided with combination determining unit 105 that determines the combination of semiconductor devices to be simultaneously tested among semiconductor devices to be tested, on the basis of one of determination results or measured values... Agent: Steptoe & Johnson LLP

20080094093 - Universal array type probe card design for semiconductor device testing: A universal system for testing different semiconductor devices provides a probe head with a probe pattern that may be used to test different test patterns formed on different semiconductor devices. Each of a plurality of bumps or pads of the test pattern contacts a corresponding probe of the probe head... Agent: Duane Morris LLPIPDepartment (tsmc)

20080094095 - Apparatus and method for linked slot-level burn-in: A Burn-In Board (BIB) transfer module that links a Burn-In Board (BIB) Loader/Unloader (BLU) to a burn-in chamber rack. The BIB transfer module is capable of transferring a BIB between the BLU and the burn-in chamber rack by moving the BIB in at least two perpendicular directions while minimizing the... Agent: Marger Johnson & Mccollom, P.C. - Intel

20080094094 - Apparatus for testing a semiconductor device: An apparatus for testing a semiconductor device that has opposing first and second sides is provided. The semiconductor device includes at least one functional unit on the first side and a plurality of terminals on the second side. The apparatus may include, but is not limited to, a mounting structure,... Agent: Dickstein Shapiro LLP

20080094098 - Device under test power supply: A power supply includes a first amplifier, a first current stage, and a second current stage. The first amplifier is configured to set an output voltage equal to a fixed input voltage for supplying to a device. The first current stage is configured to source and sink a first range... Agent: Dicke, Billig & Czaja

20080094097 - Method of testing a power supply controller and structure therefor: A power supply controller (20) is configured to operate in a test mode that facilitates measuring the value of an output signal of an error amplifier (36) of the power supply controller (20).... Agent: Semiconductor Components Industries, LLC Intellectual Property Dept. - A700

20080088295 - Miniature modified faraday cup for micro electron beams: A micro beam Faraday cup assembly includes a refractory metal layer with an odd number of thin, radially positioned traces in this refractory metal layer. Some of the radially positioned traces are located at the edge of the micro modified Faraday cup body and some of the radially positioned traces... Agent: Eddie E. Scott Assistant Laboratory Counsel

20080088296 - Load side voltage sensing for ami metrology: Disclosed are apparatus and methodology subject matters for providing improved functionality of a meter in a 2-way communications arrangement, such as an Advanced Metering System (AMS) or Infrastructure (AMI). More particularly, the present technology relates to methodologies and apparatus for providing load side voltage sensing for utility meters which preferably... Agent: Dority & Manning, P.A.

20080088297 - Load side voltage sensing for ami metrology: Disclosed are apparatus and methodologies for providing improved functionality of a meter in a 2-way communications arrangement, such as an Advanced Metering System (AMS) or Infrastructure (AMI). More particularly, the present technology relates to methodologies and apparatus for providing load side voltage sensing for utility meters which preferably are operable... Agent: Dority & Manning, P.A.

20080088298 - Hall sensor temperature drift control: Disclosed are apparatus and methodology for providing approaches to remove or reduce thermal drift of the magnetic sensitivity of Hall sensor devices, to improve the stability of resulting signals of interest. Samples of a particular signal or signals of interest having improved stability make for advantageous use in conjunction with... Agent: Dority & Manning, P.A.

20080088299 - Attachment device and method for fastening electrical cable monitoring instruments to electrical cables: The present invention is an attachment device and a method for fastening and removing an electrical cable monitoring instrument to an electrical cable. The attachment device comprises monitoring instrument sensor with opening for positioning electrical cable such that said electrical cable can be positioned to pass through the sensitive volume... Agent: Intellectual Property Strategists, LLC

20080088300 - Device for determining electrical variables: A device for determining electrical variables, having a housing and an electrical main conductor, which is provided for conducting a load current, and which has a measuring section, having an electrical evaluation unit which is connected to the electrical main conductor in an electrically conductive manner, the measuring section being... Agent: Kenyon & Kenyon LLP

20080088301 - Testing device handler: A semiconductor testing handler includes a chamber, at least one chuck attached within the chamber, and a plurality of heating elements disposed to place heat into the chamber. The semiconductor testing handler also includes an air handler disposed to move air through the chamber, and at least one temperature sensor... Agent: Schwegman, Lundberg & Woessner, P.A.

20080088302 - Bipolar interrogation for magnetostrictive transducers: A magnetostrictive-based sensor is disclosed which obtains higher return signals through the use of multiple consecutive input pulses... Agent: Westman Champlin & Kelly, P.A.

20080088303 - Concept for detecting a contact with a game device: A method of detecting a contact between a player and a ball in a ball game, comprising a step of generating a magnetic field which may be associated with the player, the magnetic field being generated with a code sequence or a frequency which differ from a code sequence or... Agent: Glenn Patent Group

20080088304 - Method and apparatus for measuring magnetic anisotropy of a conductive wire or tape: A method and apparatus for measuring the magnetic field anisotropy of critical currents in conductive wires and conductive tapes having lengths of at least one meter. In one embodiment, the method and apparatus are adapted to measure the magnetic field anisotropy of critical currents in superconducting wires and tapes. The... Agent: Los Alamos National Security, LLC

20080088306 - Method for adjustment of a shim device of a magnetic resonance apparatus: In a method for adjustment of a shim device of a magnetic resonance apparatus before an image acquisition in a body region that has a volume of interest, a field distribution is measured in a region encompassing the volume of interest produced with a shim device set according to a... Agent: Schiff Hardin, LLP Patent Department

20080088307 - Method for determination and evaluation of a shim parameter set for controlling a shim device in a magnetic resonance apparatus: In a method for determination and evaluation of a shim parameter set for controlling a shim device in a magnetic resonance (MR) apparatus, the shim device is set using a first shim parameter set, a first field distribution is measured in a body region encompassing a target volume from which... Agent: Schiff Hardin, LLP Patent Department

20080088305 - Radio frequency field localization: Technology for controlling non-uniformity in the B1 field includes selecting the phase, magnitude, frequency, time, or spatial relationship among various elements of a multi-channel excitation coil in order to control the radio frequency (RF) power emanating from the coil antenna elements. Non-uniformity can be used to steer a constructively interfering... Agent: Glenn M. Seager Crompton Seager Tufte LLC

20080088308 - Methods of in vitro analysis using time-domain nmr spectroscopy: An in vitro method of determining an analyte concentration of a sample includes placing the sample into a low-field, bench-top time-domain nuclear magnetic resonance (TD-NMR) spectrometer. The NMR spectrometer is tuned to measure a selected type of atom. A magnetic field is applied to the sample using a fixed, permanent... Agent: Nixon Peabody LLP

20080088309 - Field generating unit of a combined mr/pet system: An RF antenna arrangement of a combined MR/PET system is disclosed. In at least one embodiment, the RF antenna arrangement includes a first part installed in the examination tunnel in a fashion fixed to the system such that it is arranged underneath the couch board when the latter is introduced,... Agent: Harness, Dickey & Pierce, P.L.C

20080088310 - Magnetic field generating apparatus and mri apparatus: To achieve a good balance among the magnetic field intensity, region of homogeneous magnetic field intensity and cost, a magnetic field generating apparatus for generating a magnetic field in a vertical direction comprises: a pair of magnets having respective magnetic poles with mutually opposite polarities disposed to face each other... Agent: Patrick W. Rasche (20459) Armstrong Teasdale LLP

20080088311 - Magnetic resonance apparatus: A magnetic resonance apparatus in which magnetic metal pieces are accommodated in an accommodation section so as to correct uniformity in a main magnetic field, includes an acquisition unit which acquires temperature information related to at least one of a temperature of the magnetic metal pieces accommodated in the accommodation... Agent: Nixon & Vanderhye, PC

20080088312 - Completely automatic mas-nmr apparatus: A MAS (magic angle spinning) NMR (nuclear magnetic resonance) apparatus, with automatic sample supply by a supply unit (45), is characterized in that an automatic preparation station (44) for samples is provided, with a rotor storage (49) having several rotors (1) for receiving sample material (53) soaked with NMR solution... Agent: Kohler Schmid Moebus

20080088313 - Method and apparatus for combined induction and imaging well logging: An induction logging device is provided with additional electrodes. One set of electrodes provides voltages that are indicative of the current distribution in the borehole. The output of the first set of electrodes may be used for estimating formation resistivity. A second set of electrodes may be used to provide... Agent: Madan, Mossman & Sriram, P.C.

20080088316 - Latent-image measuring device and latent-image carrier: A latent-image measuring device that measures the state of a photoconductor. The latent-image measuring device emits a charged-particle beam to the photoconductor to detects a charged-particle signal obtained through the emission of the charged-particle beam. The latent-image measuring device then exposes the photoconductor a plurality of times to form electrostatic... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080088314 - Methods and apparatus for analyzing partial discharge in electrical machinery: Methods and apparatus for analyzing electrical insulation of an electrical machine are provided. The method includes receiving a first signal that includes a plurality of partial discharge pulses from the electrical machine and a plurality of noise pulses, receiving other signals that includes information relative to at least one process... Agent: John S. Beulick (17851)

20080088315 - Device and system for the measurement of an external electrostatic field, and system and method for the detection of storms: The invention relates to a device for measuring an external electrostatic field, for example, for the detection of storms. The inventive device consists of a first conductor element (1); an amplifier (2) in charge configuration; an electronic control device (3) comprising an input (3a) which can be connected to the... Agent: Katten Muchin Rosenman LLP

20080088317 - Detection circuit for measurement of test lead and using the same: A low error, plugged test lead detecting circuit for providing accurate current measurement and the method using the same. When a test lead of the plugged detecting circuit is plugged into a split contact jack of the plugged detecting circuit, the circuit stops oscillating during operations for a test lead... Agent: Birch Stewart Kolasch & Birch

20080088318 - Method to test transparent-to-test capacitors: An inexpensive process for verifying that a capacitor, which would be difficult to detect using in-circuit testing techniques if the capacitor were a conventional two-terminal capacitor, has been properly installed on a circuit board involves incorporating into the circuit a feedthrough capacitor having at least two internally electrically connected terminals,... Agent: Delphi Technologies, Inc.

20080088319 - Calibration apparatus, calibration method, and testing apparatus: There is provided a calibration apparatus that calibrates a jitter measuring circuit. The jitter measuring circuit includes a jitter signal generating section that generates a jitter signal of which duration of at least one of High logic or Low logic changes according to a jitter in an input signal, and... Agent: Osha Liang L.L.P.

20080088320 - Network measuring and apparatus for magnitude and phase portion independently: Reference demodulated signals are applied to the device under test, or reference modulated signals are generated from the output signals of the device under test; each component of the output signals is generated from the output signals of the device under test; each component of the reference modulated signals is... Agent: Agilent Technologies Inc.

20080088321 - Ice measurement: A method and apparatus are provided for directly measuring the ice fraction in an ice slurry. Spaced electrodes measure the electrical property of the slurry, such as capacitance across the electrodes, or alternatively conductance or other electrical characteristics. That signal is then translated into an ice fraction by a microprocessor... Agent: Pyle & Piontek LLC

20080088322 - Semiconductor device fabrication method and semiconductor device: A semiconductor device having sufficient sensitivity, strength, and the like and a method for fabricating such a semiconductor device. In a method for fabricating a semiconductor device which detects the shape of a skin surface by detecting capacitance formed between the skin surface and a conductive film between which a... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080088323 - Control and method for a capacitive sensor system: A control and method for an e-field sensor touch switch system includes an output having a first output voltage based on a static capacitance sensed by an e-field sensor and a gain module that generates a final output voltage based on amplifying a difference between an offset voltage and the... Agent: Harness, Dickey & Pierce, P.L.C

20080088324 - Method and installation for analyzing an integrated circuit: The invention concerns a method for analyzing an integrated circuit. The method includes, for a plurality of surface points of the integrated circuit, following steps: applying (102) a laser radiation, in one point of the surface of the integrated circuit; exciting (106) the circuit; collecting (108) the response of the... Agent: Young & Thompson

20080088328 - Grounding scheme for high speed probing with reduced loop area: A grounding scheme for improved high speed probing of a system-under-test (“SUT”) using a ground rail positioned on the SUT near each side of a package attached to the SUT having signal access points, whereby each of the ground rails are electrically connected to a ground access point of the... Agent: Mcandrews Held & Malloy, Ltd

20080088325 - Method and system for performing embedded diagnostic application at subassembly and component level: A