|Electricity: measuring and testing patents - Monitor Patents|
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Electricity: measuring and testing February patent applications/inventions, industry category 02/13Below are recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application. 02/28/2013 > 64 patent applications in 44 patent subcategories. patent applications/inventions, industry category
20130049731 - Coax ribbonizing header: Disclosed herein is a system and method for identifying individual coaxial cables in a bundle of coaxial cables. The system includes a coaxial cable header that is configured for receiving one or more coaxial cables and establishing electrical conductive contact with only a conductive shield on a first end of... Agent: Technical Services For Electronics, Inc.
20130049732 - Phase identification system and method: A phase identification system includes a power distribution station and a phase detection device. The power distribution station includes a phase distortion device for generating voltage distortions of a known harmonic frequency in at least one of three phase voltage signals of the power distribution station. The phase detection is... Agent: General Electric Company
20130049733 - Fault detection based on current signature analysis for a generator: A method of detecting faults in a wind turbine generator based on current signature analysis is disclosed herein. The method includes acquiring a set of electrical signals representative of an operating condition of a generator. Further, the electrical signals are processed to generate a normalized spectrum of electrical signals. A... Agent: General Electric Company
20130049734 - Wind turbine lightning protection and monitoring systems: A wind turbine hub (8) and nacelle (4) assembly including lightning conducting means (26, 30, 32, 40) for conducting lightning between the hub (8) and the nacelle (4), the hub (8) being mounted for rotation relative to the nacelle (4) and being adapted to support turbine blades, the hub (8)... Agent: Tyco Electronics Uk Ltd
20130049737 - Electric current detection circuit: An electric current detection circuit for detecting an electric current flowing to a load includes a voltage generation circuit, a plurality of comparators, and a reference voltage shift circuit. The voltage generation circuit includes a plurality of resistors coupled in series and generates different voltages by dividing a reference voltage... Agent: Anden Co., Ltd.
20130049735 - Radio frequency power amplifier protection system: A radio frequency (RF) power amplifier protection system for a radio. The protection system utilizes a resistive tap connected to the drain of a power amplifier transistor and a high speed voltage detector. The protection system uses short, low-power tests pulses to determine the quality of an antenna load upon... Agent:
20130049736 - Voltage monitoring test circuit and voltage monitoring method using the same: A voltage monitoring test circuit includes a switching control signal generation unit configured to receive first and second switching signals, control the first and second switching signals such that an enable period of the first switching signal and an enable period of the second switching signal do not overlap with... Agent: Hynix Semiconductor Inc.
20130049738 - Quantum dot photo-field-effect transistor: Photo-field-effect transistor devices and associated methods are disclosed in which a photogate, consisting of a quantum dot sensitizing layer, transfers photoelectrons to a semiconductor channel across a charge-separating (type-II) heterointerface, producing a sustained primary and secondary flow of carriers between source and drain electrodes. The light-absorbing photogate thus modulates the... Agent:
20130049739 - Circuit arrrangement for detecting a maximum in the profile of a measurement signal: A circuit arrangement detects a maximum in a profile of a measurement signal. The circuit arrangement has an operational amplifier with a non-inverting input connected to a reference potential and an output connected to an inverting input via a first resistor. The first resistor has an input connection, to which... Agent: Continental Automotive Gmbh
20130049740 - L.e.d. test leads: A pair of light shining electrical test leads, the pair using L.E.D. or other lights. The lights are showing to the test point of the electrical leads. The lights receive power from a battery. The lights may be turned off when not needed and turned on when the user is... Agent:
20130049741 - Rotation sensor and rotational angle detection apparatus: A resolver includes three resolver coils, which are arranged spaced apart in a circumferential direction of a rotor, and an excitation coil that generates a magnetic field to induce voltages in the resolver coils when receiving electric power. When the magnetic fields provided from the excitation coil to the three... Agent: Jtekt Corporation
20130049742 - Variable reluctance resolver: In a variable reluctance resolver having terminal pins at an insulator, a technique for preventing deformation of the terminal pins, shorting between the terminal pins, and contact failure at portions of the terminal pins is provided. A first insulator 300 is formed together with a terminal pin base 311 on... Agent: Minebea Co., Ltd.
20130049743 - Float position sensor: [Means for Resolution] A float position sensor including a float and a magnetic sensor provided in a lateral direction with respect to a movement direction of the float for detecting a change of a magnetic field caused by movement of the float, characterized in that the change of the magnetic... Agent: Toflo Corporation
20130049744 - High frequency loss measurement apparatus and methods for inductors and transformers: Core loss in an inductor is measured with reduced sensitivity to phase measurement error by connecting a reactive component to resonate with the inductor and thus cancel a portion of the reactive voltage on the inductor; reducing the phase difference between the inductor voltage and current and making the observed... Agent:
20130049745 - Metal detection apparatus: A metal detection apparatus that uses one or more operating frequencies. The metal detection apparatus comprises, among other things, a transmitter unit that provides transmitter signals to a transmitter coil that is coupled to a receiver coil, which is connected to the input of a receiver unit. The transmitter unit... Agent: Mettler-toledo Safeline Ltd.
20130049746 - Semiconductor chip package and method: A semiconductor chip package and a method to manufacture a semiconductor chip package are disclosed. An embodiment of the present invention comprises a substrate and a semiconductor chip disposed on the substrate and laterally surrounded by a packaging material. The package further comprises a current rail adjacent the semiconductor chip,... Agent: Infineon Technologies Ag
20130049750 - Giant magnetoresistance current sensor: A giant magnetoresistance current sensor comprises an amorphous alloy magnetic ring having an air gap; a DC magnetic bias coil wound onto the amorphous alloy magnetic ring; a DC constant current source supplying power for the DC magnetic bias coil; a giant magnetoresistance chip disposed in the air gap and... Agent: Tsinghua University
20130049748 - Magnetic sensor with low electric offset: A magnetic sensing system, including: a magnetic component proximate a movable mechanical component; and a magnetic sensor configured to determine a movement of the mechanical component based on a magnetic field produced by the magnetic component. The magnetic sensor includes: a low-offset magnetic sensing element; a high-sensitivity magnetic sensing element;... Agent: Nxp B.v.
20130049747 - Mr sensor with back edge flux guide: An MR sensor, and a method for making it, is described. Part of the MR stack, from the free layer on up, is removed and then replaced by a flux guide. Additional stabilizing means for this flux guide are provided, either as hard bias or through exchange coupling.... Agent: Headway Technologies, Inc.
20130049749 - Semiconductor fluxgate magnetometer: A fluxgate magnetometer is formed in a semiconductor wafer fabrication sequence, which significantly reduces the size and cost of the fluxgate magnetometer. The semiconductor wafer fabrication sequence attaches a die, which has drive and sense circuits, to the bottom surface of a cavity formed in a larger structure, and forms... Agent:
20130049751 - Method and apparatus for detecting a magnetic characteristic variable in a core: A technique is provided for detecting a magnetic characteristic variable in particular the magnetic field strength in a section of a core permeated by a magnetic flux. A portion of the magnetic flux is branched off from the core and passed via a magnetic shunt branch, in which at least... Agent:
20130049753 - Magnetic resonance imaging apparatus: The present invention provides an image processing technique which enables various contrast control, by quantitatively handling a degree of phase enhancement in a contrast control as a post-processing of the image reconstruction. A complex operation is performed on each pixel value of a complex image obtained by an MRI, thereby... Agent:
20130049752 - Sampling pattern for iterative magnetic resonance image reconstruction: In a method to generate magnetic resonance (MR) images of an examination subject, MR signals are detected simultaneously with multiple coils, each coil having its own coil characteristic. In the detection of the MR signals, raw data space is incompletely filled with MR signals; with raw data space being undersampled... Agent: Siemens Aktiengesellschaft
20130049755 - Helical gradient coil for magnetic resonance imaging apparatus: A gradient coil is provided. The gradient coil comprises: a first layer comprised of a first plurality of turns of wires; and a second layer of coil comprised of a second plurality of turns of wires. Each turn of wire in the first and second plurality of turns of wires... Agent:
20130049754 - Iterative reconstruction method with penalty terms from examination objects: A method is disclosed for calculating an MR image of a target layer from an examination object, wherein the MR image is calculated using iterative reconstruction. In at least one embodiment, the method includes: acquiring MR data from an initial layer of the examination object, determining information produced by the... Agent: Siemens Aktiengesellschaft
20130049756 - Methods, systems, and devices for intra-scan motion correction: Systems, methods, and devices for intra-scan motion correction to compensate not only from one line or acquisition step to the next, but also within each acquisition step or line in k-space. The systems, methods, and devices for intra-scan motion correction can comprise updating geometry parameters, phase, read, and/or other encoding... Agent: Kineticor, Inc.
20130049757 - Device and method for detecting an underground power line: A device for detecting an underground power line includes, for example, a sensor unit that has a magnetic field sensor element that is configured for receiving a received signal depending on the features of the power line and the underground, a control and evaluation unit configured for controlling the sensor... Agent:
20130049758 - Stun device testing apparatus and methods: A method of testing an electric discharge stun device includes the steps of identifying a stun device to be tested and absorbing a discharge from the stun device into a tester. The discharge is characterized by a discharge characteristic that is then compared automatically to information such as (a) a... Agent:
20130049759 - Combinatorial material screening method for an electrochemical cell: An electrochemical test cell, containing an anode comprising a metal as an active component; a cathode comprising a porous chemically inert tube containing an active material compatible with the metal of the anode; and an electrolyte; wherein the only metal in contact with the electrolyte is the metal of the... Agent: Toyota Motor Engineering & Manufacturing Na
20130049760 - Switch, charge monitoring apparatus and rechargeable battery module: Disclosed herein is a switch for turning on/off the connection between a first terminal and a second terminal. The switch includes a first transistor circuit configured from two transistors connected in series between the first terminal and the second terminal; and a second transistor circuit having a gate terminal connected... Agent: Sony Corporation
20130049762 - Battery management: Battery management may be provided. First, a battery string in a battery bank may be charged for a charge time. After charging the battery string, the battery string may be isolated from charging for a rest time. Once the charging and resting from charging is complete, a test open circuit... Agent: Encell Technology, Inc.
20130049761 - Battery stack cell monitor: A battery monitor system for determining a cell voltage between a low side contact and a high side contact of a cell in situ as one of a plurality of cells connected in series to form a battery. The system uses an arrangement of switches and capacitors to shift relatively... Agent: Delphi Technologies, Inc.
20130049763 - Real-time short-circuit detection: Presented are circuits and methods for providing real-time short-circuit detection, capable of detecting a short-circuit prior to occurrence of an over-limit current event. Such a circuit can be used to provide real-time short-circuit detection for a switched-mode system for a switched-mode system having a pre-driver and a power stage, and... Agent: Broadcom Corporation
20130049764 - Systems, methods, and apparatus for locating faults on an electrical distribution network: Certain embodiments of the invention include systems, methods, and apparatus for locating faults on an electrical distribution network. According to an example embodiment of the invention, a method is provided for locating faults on an electrical distribution network. The method can include monitoring, by one or more smart meters, a... Agent: General Electric Company
20130049765 - In-situ cable unplug detector operating during normal signaling mode: An in-situ unplug detector circuit detects when a cable is disconnected or unplugged. Detection does not have to wait for normal signaling to pause, such at the end of a frame or timeout. Instead, detection occurs during normal signaling. When the cable is disconnected, the transmitter no longer drives the... Agent: Pericom Semiconductor Corp.
20130049766 - Measuring device and a method for measuring a chip-to-chip-carrier connection: A measuring device is provided: the measuring device including: a power supply configured to provide electric power to a chip via at least one of a chip connection and a chip-carrier connection; a chip arrangement receiving portion configured to receive a chip arrangement, the chip arrangement including a chip and... Agent: Infineon Technologies Ag
20130049767 - High speed data bus tester: A circuit for testing a high speed data bus comprises a test port, a data bus port, a signal generator, a polarity monitor, and an attenuation monitor. The test port is coupled to a test controller. The data bus port is coupled to the data bus. The signal generator may... Agent: Dit-mco International Corporation
20130049768 - Proximity or touch sensor: A sensor for sensing proximity or touch of an object includes a sensing region, an oscillating signal generator for generating an oscillating signal having an oscillation period, a gating signal generator for generating a gating signal having a gating duration, a controller for controlling the oscillation period or the gating... Agent: Freescale Semiconductor, Inc.
20130049769 - Method and apparatus for detecting radome damage: A method and system for detecting and localizing damage on a radome. In one example, the system includes a detection mesh made up of an arrangement of conductive wires integral with the radome structure, and a digital strobe circuit coupled to the detection mesh that measures the detection mesh and... Agent: Raytheon Company
20130049770 - Transducer configurations and methods for transducer positioning in electrical impedance tomography: Transducer configurations and methods for transducer positioning in electrical impedance tomography are provided. A plurality of transducers for one electrical impedance tomography arrangement are configured for positioning proximate a surface of an object and spaced apart along the object, wherein the transducers are one or more conductive rings and have... Agent: General Electric Company
20130049772 - Device and method for measuring currents in a bearing: A measuring method and a device that permit a better evaluation of bearing currents are disclosed. The method uses non-contact measurement of a bearing voltage. A non-contact voltage measurement is performed by means of a series circuit of capacitors. The bearing voltage can be detected especially well in this manner... Agent: Siemens Aktiengesellschaft
20130049771 - Edge accuracy in a capacitive sense array: A capacitive sense array configured to improve edge accuracy in detecting a presence of a conductive object is described. In one embodiment, a capacitive sense array includes at least a first set of sense elements having non-homogenous pitches disposes in a first longitudinal axis of the capacitive sense array. The... Agent:
20130049773 - Measurement tool and method of use: This invention relates to a measurement tool and method of use, and in particular to a measurement tool for use in determining a parameter of a stationary or moving fluid. The measurement tool has been designed primarily for use in borehole formation testing. The measurement tool can measure the dielectric... Agent: Precision Energy Services, Inc.
20130049776 - Readout circuit for self-balancing capacitor bridge: A capacitive transducer and a readout circuit for processing a signal from a capacitive transducer. The readout circuit includes a high gain circuit element, two summing amplifiers and two feedback path. The high gain circuit element generates an amplified transducer signal, and the summing amplifiers sum the amplified transducer signal... Agent: Robert Bosch Gmbh
20130049774 - Surface charge reduction technique for capacitive sensors: A differential capacitive transducer system is disclosed that includes first and second capacitive cores and a chopping system. The first core a first input coupled to a first capacitor, a second input coupled to a second capacitor, and a first output. The second core includes a third input coupled to... Agent: Robert Bosch Gmbh
20130049775 - Surface charge reduction technique for capacitive sensors: A differential capacitive transducer system is disclosed that includes first and second capacitive cores and a chopping system. The first core a first input coupled to a first capacitor, a second input coupled to a second capacitor, and a first output. The second core includes a third input coupled to... Agent: Robert Bosch Gmbh
20130049777 - Device identification and temperature sensor circuit: An integrated circuit includes a device identification circuit and a temperature sensor diode connected in parallel from a common node. The device identification circuit includes a resistor connected to a diode-connected transistor. The device identification circuit and the temperature sensor diode are adapted to not be simultaneously operating in an... Agent:
20130049778 - Balancing resistor testing apparatus: A balancing resistor testing apparatus is configured for acquiring a resistance of a balancing resistor electronically connected to a supercapacitor of a series supercapacitor assembly in parallel. The balancing resistor testing apparatus includes a controller and a digital potentiometer. The controller detects a voltage across each supercapacitor of the series... Agent: Hong Fu Jin Precision Industry (shenzhen) Co., Ltd.
20130049779 - Integrated circuit: An integrated circuit comprising a first pair (11, 12) of switching devices arranged in series between positive and negative supply terminals is disclosed. The integrated circuit is switchable between an operational mode, in which the first pair (11, 12) of switching devices are driven to couple either the positive or... Agent: Nxp B.v.
20130049781 - Semiconductor devices with self-heating structures, methods of manufacture thereof, and testing methods: Semiconductor devices with self-heating structures, methods of manufacture thereof, and testing methods are disclosed. In one embodiment, a semiconductor device includes a workpiece, an active electrical structure disposed over the workpiece, and at least one self-heating structure disposed proximate the active electrical structure.... Agent: Taiwan Semiconductor Manufacturing Company, Ltd.
20130049780 - Built-in self-test for radio frequency systems: Techniques for performing built-in self-test (BIST) of performance of an RF system are disclosed. The techniques may be used, for example, for measuring distortion generated by the RF system under test, detecting faults in the system, determining calibration of the system, and/or assisting in compensating analog circuitry that is sensitive... Agent: Bae Systems Information And Electonic Systems Integration Inc.
20130049782 - Method for cleaning a contact pad of a microstructure and corresponding cantilever contact probe and probe testing head: A method for cleaning a contact pad of a microstructure or device to be tested when it is in electric contact with a measure apparatus, being obtained by electrically contacting a flexible probe with said contact pad. The method includes mechanically engaging a free end of the flexible probe in... Agent: Technoprobe S.p.a.
20130049784 - Contact probe: Provided are a contact probe that can realize low adhesion property to an adherend (particularly, Sn contained in the adherend) and secure stable contact resistance over a long period of time, and a connection device including the same. The present invention relates to a contact probe which repeatedly contacts with... Agent: Kabushiki Kaisha Kobe Seiko Sho (kobe Steel, Ltd.)
20130049783 - Voltage clamping circuit and use thereof: A voltage clamp circuit for reflecting a voltage at an input node includes a circuit for providing at least two currents at its output terminal, and at least two diodes each being connected to an output terminal of the circuit for providing at least two currents. The diodes also are... Agent:
20130049785 - Inspection device for glass substrate: Disclosed is an inspection device for a glass substrate, comprising at least one probe, a holder, a stretch controller and a control circuit. The probe is installed on the stretch controller, the stretch controller is employed to stretch the probe out of the holder as an electrical signal is received;... Agent: Shenzhen China Star Optoelectronics Technology Co., Ltd.
20130049786 - Non-synchronized radio-frequency testing: A device under test (DUT) may be tested using a test station having a test host, a non-signaling tester, and a test cell. During testing, the DUT may be placed within the test cell, and the DUT may be coupled to the test host and the tester. In one suitable... Agent:
20130049787 - Method of testing stacked semiconductor device structure: The present invention provides a method of testing a stacked semiconductor device structure. This method includes the following steps: providing a testing board having a plurality of testing points and a probe card; providing a substrate which is disposed on the testing board; providing a plurality of semiconductor devices; mounting... Agent:
20130049789 - Die having wire bond alignment sensing structures: A semiconductor die includes a substrate having a topside including active circuitry having an array of bond pads thereon separated by gaps including a minimum gap. At least a portion of the array of bond pads are connected to nodes in the active circuitry. At least one wire bond alignment... Agent: Texas Instruments Incorporated
20130049790 - Electrical characterization for a semiconductor device pin: Embodiments related to electrically characterizing a semiconductor device are provided. In one example, a method for characterizing a pin of a semiconductor device is provided, the method comprising providing a test pattern to the semiconductor device. Further, the method includes adjusting a selected electrical state of a pin of the... Agent: Teseda Corporation
20130049788 - Mofset mismatch characterization circuit: A semiconductor device comprises a plurality of transistor mismatch circuits formed on a semiconductor wafer; and a characterization circuit formed on the semiconductor wafer. The characterization circuit is coupled to receive input provided by the absolute value circuits simultaneously which themselves receive inputs from the mismatch circuits simultaneously and is... Agent:
20130049791 - On-chip delay measurement through a transistor array: A delay is measured through an array of transistors by selecting one transistor in the array; and applying a clock signal to the selected transistor. An output of the selected transistor is applied to a first input of a logic gate and a second clock signal based on the clock... Agent: International Business Machines Corporation
20130049793 - Analyzing em performance during ic manufacturing: A testing structure, system and method for monitoring electro-migration (EM) performance. A system is described that includes an array of testing structures, wherein each testing structure includes: an EM resistor having four point resistive measurement, wherein a first and second terminals provide current input and a third and fourth terminals... Agent: International Business Machines Corporation
20130049792 - Measuring device and a method for measuring a chip-to-chip-carrier connection: A measuring device is provided, the measuring device including: a power supply to provide electric power to a chip via at least one of a chip connection and a chip-carrier connection; a chip arrangement receiving portion configured to receive a chip arrangement, the chip arrangement including a chip and a... Agent: Infineon Technologies Ag
20130049794 - Extended systems and methods for testing power supplies: A system and method for testing multiple power supplies. Multiple power supplies are received including a power-end and an adapter end for connection to a power supply tester. Programmable loads and test parameters are configured for the power supply tester in response to a user selection. The multiple power supplies... Agent: Atc Logistics & Electronics, Inc.02/21/2013 > 38 patent applications in 34 patent subcategories. patent applications/inventions, industry category
20130043860 - Rfid sensor devices having drive elements: An RFID-based sensor is provided with an RFID chip and an antenna electrically connected to the RFID chip. The sensor further includes a sensing material electrically connected to the antenna and a drive element. At least a portion of the sensor is movable between a closed condition in which the... Agent: Avery Dennison Corporation
20130043861 - Voltage detection device for fuel cell: A voltage detection device includes voltage detection sections that measure cell voltages in the blocks, a control section, and (N−1) or less converters that raise the voltage, which is supplied from a DC power source, to a voltage of a driving power source for the voltage detection section. In a... Agent: Yazaki Corporation
20130043862 - Biosensor detecting thiol group and method for preparing the biosensor: There is provided a biosensor for detecting a thiol group and a method of manufacturing the biosensor. In detail, in the method, Au nano particles are manufactured by irradiating radiation (Step 1), a PTh-EDOT/ITO film is manufactured by forming a poly(thiophene-co-3,4-ethylenedioxythiophene) (PTh-EDOT) layer on an indium tin oxide (ITO) coated... Agent: Korea Atomic Energy Research Institute
20130043864 - Winding method and winding structure of stator for rotation detector, and electric motor comprising rotation detector: The N1(s) turns of a first output winding is divided by a split ratio α into N1a(s) turns of a lower-layer first output winding and N1b(s) of an upper-layer first output winding. The lower-layer first output winding is continuously wound around all slots as the undermost layer. A second output... Agent: Panasonic Corporation
20130043863 - Magnetic position sensors, systems and methods: Magnetic position sensors, systems and methods are disclosed. In an embodiment, a position sensing system includes a magnetic field source with a dipole moment in a direction along a z-axis; and a sensor module spaced apart from a center of the dipole moment a distance y0 along a y-axis and... Agent:
20130043865 - Pair comprising printed circuit board and further board and method for measuring current intensity: A current measurement is implemented with the aid of magnetoresistive sensors or Hall sensors. The sensors are arranged on one or two printed circuit boards, which provide a passage when coupled to one another, through which passage an electrical line passes. The printed circuit boards can also be fitted retrospectively... Agent: Siemens Aktiengesellschaft
20130043866 - Method and apparatus for enhancing signal in magnetic resonance imaging: A method and an apparatus for enhancing signals in magnetic resonance imaging are provided. The method includes the following steps. Applying one or more than one RF pulse, which carries at least two frequency components, and a slice/slab selection gradient to a subject, so that at least two slices/slabs of... Agent: National Taiwan University
20130043869 - Deconvolution of chemical mixtures with high complexity by nmr consensus trace clustering: This disclosure provides new multidimensional-NMR approaches that are useful in the analysis of mixtures with high complexity at natural 13C abundance, including ones encountered in metabolomics. Common to all three approaches is the concept of the extraction of 1D consensus spectral traces or 2D consensus planes followed by clustering, which... Agent: Florida State University Research Foundation, Inc.
20130043868 - Method and apparatus for simultaneously generating multi-type magnetic resonance images: An electromagnetic wave signal, having a pulse train in which pulses having a plurality of frequencies corresponding to multi-type atomic nuclei are arranged in a line, is applied to a target object located in a magnetic field by using a radio frequency (RF) coil in the magnetic field. Data of... Agent: Samsung Electronics Co., Ltd.
20130043867 - Sideband processing for magnetic resonance: A method includes applying a pulse train to a spin system in a scanner. The pulse train has a plurality of discontinuities in a time domain. The method includes receiving a response from the spin system. The response corresponds to a gated signal. The method includes accessing a correction factor... Agent: Regents Of The University Of Minnesota
20130043870 - Thermoacoustic rf body coil liner for reduced acoustic noise in an mr system: A composite RF body coil liner for reducing acoustic noise in an MR System is disclosed. The composite RF body coil liner includes an inner surface layer, an outer surface layer, a fire retardant layer positioned between the inner surface layer and the outer surface layer, and an acoustic barrier... Agent:
20130043871 - Method and apparatus for controlling an amplifier of a magnetic resonance imaging device: An magnetic resonance imaging (MRI) device includes at least one amplifier, a control module which controls an operating module of the at least one amplifier, a back-up control module, a determination unit for determining whether the control module is operating normally, and a switching module for performing a switching operation... Agent: Samsung Electronics Co., Ltd.
20130043872 - Device and method for detecting an object in a subsurface: A device for detecting an object in a subsurface, including a transmitting unit having a transmitting element designed to emit a transmission signal into the subsurface, a receiving unit having two or more receiving elements designed to receive a reception signal which is a function of the transmission signal and... Agent: Hilti Aktiengesellschaft
20130043873 - Apparatus and methods for providing information about one or more subterranean feature: A method of approximating or determining at least one dimension or other characteristic of at least one underground geological feature in a zone of interest proximate to a well bore includes generating an electric field in the zone of interest. At least two sensing electrodes are provided in the well... Agent:
20130043874 - Drill bit assembly having electrically isolated gap joint for measurement of reservoir properties: A drill bit assembly for measuring reservoir formation properties comprises a bit head and a pin body, and an electrically insulated gap joint between two conductive parts of the drill bit assembly. The bit head has a cutting end and an opposite connecting end with an engagement section. The pin... Agent:
20130043875 - Testing of electroluminescent semiconductor wafers: Forward voltage drift in a probe system for the characterization of a light-emitting wafer is virtually eliminated by directing compressed air to the probe so as to ensure that the exact same temperature conditions exist during repeated measurements of the wafer. In one embodiment of the invention, an air flow... Agent: Bruker Nano, Inc.
20130043876 - Method for estimating state-of-charge of lithium ion battery: The invention relates to the technical field of lithium-ion batteries, in particular to a method for estimating the state of charge of a lithium-ion battery. The method includes: charging a lithium-ion battery, recording multiple groups of ampere-hour integral values, and states of charge and voltage values corresponding to the ampere-hour... Agent: Huizhou Epower Electronics Co., Ltd.
20130043877 - Operational amplifier with different power supply voltages: An operational amplifier with different power supply voltages includes an input stage and an output stage. The input stage includes a current source for providing a bias current, and a differential input circuit for receiving the bias current and differential input voltage signals, and converting the differential input voltage signal... Agent:
20130043878 - Communication line driver protection circuitry, systems and methods: Embodiments relate to fault detection comparator circuitry and methods that can operate in conjunction with a power-on-reset (POR) scheme to put a chip into a reliable power-down mode upon fault detection to avoid disrupting the communication bus link such that other connected chips and the host can continue to operate.... Agent:
20130043880 - Determination of the fault current component of a differential current: For the purpose of determining a fault current component of a differential current which is measured as a current sum over a plurality of lines carrying a current of an AC current generator, an electric signal which depends on generator voltages present at the AC current generator with respect to... Agent: Sma Solar Technology Ag
20130043879 - Method and apparatus for detecting earth fault: A method and an apparatus for detecting an earth fault on a three-phase electric line are provided. The apparatus includes means for determining a neutral admittance on the basis of a residual current and a residual voltage, means for comparing the determined neutral admittance to a predetermined operation characteristic to... Agent: Abb Technology Ag
20130043881 - Apparatus and method for identifying high risk non-ceramic insulators (nci) with conductive or high permittivity defects: An apparatus and method for identifying the presence of high conductivity or permittivity conditions in a wide range of electrically insulating materials is disclosed. The apparatus includes a grounded enclosure containing electronics for controlling measurement and communication processes and first and second spaced-apart electrode assemblies for engaging an insulator to... Agent: Electric Power Research Institute, Inc.
20130043882 - Apparatus and method for testing electronic equipment: A thermal wrap for testing electronic components has a web having an inside and an outside surface and a first end and a second end and a thermal element incorporated in said web. An edge element incorporated substantially along at least one edge of said web promotes a thermal seal... Agent: Teleplan International Nv
20130043883 - Signal test apparatus for sas devices: A signal test apparatus for a serial attached Small Computer System Interface (SAS) device includes an SAS female connector to be connected to the SAS device, an SAS male connector to be connected to a server, first and second pairs of subminiature version A (SMA) connectors, and first and second... Agent: Hong Fu Jin Precision Industry (shenzhen) Co., Ltd.
20130043884 - Method and apparatus for calibrating deep-reading multi-component induction tools with minimal ground effects: An apparatus and method for calibrating a multi-component induction logging tool. The method may include orienting a Z-transmitter coil to be substantially orthogonal to at least one Z-receiver coil, positioning an X-transmitter coil disposed on the logging tool so that the X-transmitter coil is substantially parallel to a conducting surface;... Agent: Baker Hughes Incorporated
20130043885 - Antenna system for electromagnetic compatibility testing: An antenna system for electromagnetic compliance testing within a frequency range includes a driven element mounted on a boom and including opposed first and second length-adjustable conductors. A length-adjustable passive element is mounted on the boom and spaced apart from the driven element and including opposed third and fourth length-adjustable... Agent: Fluid Motion, Inc.
20130043886 - System for measuring a peak frequency of a signal for analyzing condition of a subject: A system for measuring a peak frequency of a signal applies a Maximum Entropy Method (MEM) to the signal obtained through transmission and reception of an electromagnetic wave to a subject to obtain a frequency of a peak component to be measured, thus permitting to make an appropriate assessment on... Agent: Kyushu University, National University Corporation
20130043887 - Communication method for monitoring pipelines: A method for underground pipeline monitoring in which a continuous alternating electrical current having a current frequency in a range of about 1 kHZ to about 8 kHz is imparted onto a pipeline, producing an alternating magnetic field at the current frequency along the pipeline. Distributed along the pipeline is... Agent: Gas Technology Institute
20130043888 - Wireless method and apparatus for detecting damage in ceramic body armor: A wireless damage detector for ceramic armor plates includes an interrogator and a body armor ceramic plate. The interrogator includes an inductive primary coil having a resonant frequency. The plate includes a corresponding inductive secondary coil adapted to cooperate with the primary coil when the interrogator is positioned in an... Agent:
20130043889 - Capacitance evaluation apparatuses and methods: Apparatus and methods for evaluating leakage currents of capacitances are described. Capacitances having excessive leakage currents may be disabled from use. An example apparatus includes a leakage detection circuit configured to be coupled to a capacitance block. The leakage detection circuit is configured to determine whether a leakage current of... Agent: Micron Technology, Inc.
20130043890 - Sensing method and circuit for use with capacitive sensing devices: A sensing method is used for a capacitive sensing device, wherein the capacitive sensing device has a plurality of capacitive sensing components, each of which is charged or discharged by a charging component respectively. The sensing method comprises the steps of: a first sampling step of sampling at least one... Agent: Stmicroelectronics (china) Investment Co.
20130043891 - High voltage sensing capacitor and indicator device: A high-voltage sensing capacitor as an interface apparatus that may be used to attach an indicator unit to a high-voltage AC electrical bus and to provide safety to maintenance personnel. The high-impedance nature of the sensing capacitor effectively isolates the indicator unit from the high-voltage source to which it is... Agent: Smc Electrical Products, Inc.
20130043892 - Resistance measurement circuit: A resistance measuring circuit for measuring a resistor includes an amplifier, a transistor, a variable resistor, a first resistor, and a second resistor. The transistor includes a base connected to the output of the amplifier, a collector connected to a direct current (DC) power supply, and an emitter. The first... Agent: Hong Fu Jin Precision Industry (shenzhen) Co., Ltd.
20130043893 - Use of specific resistivity measurement for indirect determination of the purity of silanes and germanes and a corresponding process: The invention relates to a method for indirectly determining the purity of silanes and germanes using a device for measuring specific resistance. The invention further relates to a system for industrially producing and/or filling containers with silanes or germanes, including a quality control in which a device is used for... Agent: Evonik Degussa Gmbh
20130043894 - Method and arrangement for determining impedance values: A method and an arrangement are provided for determining values of impedance parameters related to a transformer configuration including three single pole voltage transformers each respectively having at least a primary winding, a secondary winding and a tertiary winding. The primary windings are connected to phases of a three phase... Agent: Abb Technology Ag
20130043895 - Fan speed control device: A fan speed control device is applied to a fan including a speed control signal port and a speed signal port. The fan speed control device includes a speed regulating circuit. The speed regulating circuit includes a signal control unit electrically connected to the speed signal port of the fan,... Agent: Hong Fu Jin Precision Industry (shenzhen) Co., Ltd.
20130043896 - Test device for printed circuit board: A test device for testing a printed circuit board (PCB) includes a base and a measuring device. The measuring device includes a testing pin and is capable of measuring any desired point of the PCB on condition that the pin makes contact with the point at an included angle between... Agent: Hong Fu Jin Precision Industry (shenzhen) Co., Ltd.
20130043897 - Testing stacked die: An integrated circuit configured for at-speed testing is described. The integrated circuit includes a first die. The first die includes a transition launch point. The integrated circuit also includes a second die. The second die includes a first observe point. The integrated circuit further includes a first through silicon via.... Agent: Qualcomm Incorporated02/14/2013 > 28 patent applications in 22 patent subcategories. patent applications/inventions, industry category
20130038318 - Ac voltage detecting circuit and image forming apparatus having the same: An AC voltage detecting circuit comprises: a first capacitor including a first electrode configured to connect to one end of an AC power supply, and a second electrode; a second capacitor including a first electrode configured to connect to the other end of the AC power supply, and a second... Agent: Brother Kogyo Kabushiki Kaisha
20130038319 - Plastic speed target wheel and method of manufacture: A speed target wheel includes an annular body portion and a plurality of gear teeth. The annular body portion consists of a plastic material and the plurality of gear teeth project from the annular body portion. Each of the plurality of gear teeth includes a base portion adjacent the annular... Agent: Gm Global Technology Operations LLC
20130038320 - Proximity detection system with concurrent rf and magnetic fields: This disclosure provides a method and system for extending the capability of a proximity detection system that is based on use of low frequency magnetic fields, to avoid conflicts in crowded work sites. The improvement is attained by combining the advantages of these low frequency magnetic fields with the advantages... Agent:
20130038321 - Inspection apparatus and inspection method of magnetic sensor: A magnetic sensor inspection apparatus has a rectangular frame including a stage, a probe card, and a plurality of magnetic field generating coils. A wafer-like array of magnetic sensors is mounted on the stage, which is movable in horizontal and vertical directions. The probe card includes a plurality of probes... Agent: Yamaha Corporation
20130038322 - Eddy current measuring sensor: An eddy current measuring sensor including a probe which is configured as a regular triangle and is provided with an excitation unit for applying a given AC excitation signal to a workpiece and a detection unit for detecting a detection signal occurring in an object to be measured responsive to... Agent: Toyota Jidosha Kabushiki Kaisha
20130038323 - Magneto-impedance element and magneto-impedance senor including detection coil.: A magneto-impedance element includes a magnetic sensitive member having a form of a line, whose electromagnetic characteristics vary depending on an external magnetic field, a pulse current flowing from one to another end portion thereof in an axial direction. A conductive layer is arranged on an insulating layer provided on... Agent: Aichi Steel Corporation
20130038324 - Apparatus method and system of an ultra sensitivity optical fiber magneto optic field sensor: An apparatus and system, capable of measuring the magnitude and direction of magnetic fields including an ultra-sensitive, wideband magneto optic (MO) sensor having magneto-optic crystals is disclosed herein. The sensor exploits the Faraday Effect and is based on a polarimetric technique. An ultra sensitivity optical-fiber magneto-optic field sensor measures a... Agent:
20130038325 - Modular arrays of primary source mirrors for biomagnetometry: Apparatus and methods enabling the improved noninvasive measurement of electric currents flowing in the body of a human being or animal or in a biological sample by means of a modular array of primary source mirrors and a magnetometer.... Agent: Moment Technologies, LLC
20130038328 - Magnetic resonance imaging apparatus and gradient coil cooling control method: A feedforward control unit predicts the maximum value of the temperature of a gradient coil based on a power duty and a scan time of a pulse sequence, and a present temperature of the gradient coil. When the maximum value exceeds a predetermined upper limit, the feedforward control unit then... Agent: Kabushiki Kaisha Toshiba
20130038326 - Method and apparatus for compensating for b1 inhomogeneity in magnetic resonance imaging by nonselective tailored rf pulses: A method of exciting nuclear spins in a body, the method comprising the steps of: (a) immerging said body (PB) in a static magnetic field (B0) for aligning nuclear spins along a magnetization axis (z), said static magnetic field being substantially uniform over at least a volume of interest (VOI)... Agent:
20130038327 - Method to acquire a magnetic resonance image data set of a target volume: In a method to acquire a magnetic resonance image data set of a target volume with a magnetic resonance device, wherein the target volume is composed of a number of sub-volumes defined in a two-dimensional plane orthogonal to the readout direction, for each sub-volume, in order to acquire a partial... Agent: Siemens Aktiengesellschaft
20130038329 - Magnetic resonance system having variable frequency transmit pulses: A controller of a magnetic resonance system outputs a low frequency base signal to a conversion device. While outputting the base signal to the conversion device, the controller outputs an oscillator control signal to an oscillator. The oscillator outputs a frequency signal corresponding to the oscillator control signal to the... Agent: Siemens Aktiengesellschaft
20130038331 - Coil capable of generating an intense magnetic field and method for manufacturing said coil: Another object of the invention relates to a coil for generating an intense magnetic field when an electric current passes through it, comprising at least un tube (2) made of conducting or superconducting material and cut out along a cut-out line to form turns (3), having insulating material at least... Agent: Centre National De La Recherche Scientifique (cnrs)
20130038330 - Systems, devices, methods, and compositions including ferromagnetic structures: Magnetic resonance systems, devices, methods, and compositions are provided. A nuclear magnetic resonance imaging composition includes, but is not limited to, a plurality of ferromagnetic microstructures configured to generate a time-invariant magnetic field within at least a portion of one or more internal surface-defined voids. In an embodiment, at least... Agent: Searete LLC, A Limited Liability Corporation Of The State Of Delaware.
20130038332 - Short range data transmission in a borehole: The present disclosure is directed to an antenna for transfer of information along a drill string. The antenna has an antenna coil having a long side and short side. The antenna coil is adapted to be affixed to the drill string such that the long side of the antenna coil... Agent: Scientific Drilling International, Inc.
20130038333 - Deterioration degree calculating apparatus for secondary battery, vehicle equipped with the apparatus, and deterioration degree calculating method for secondary battery: A deterioration degree calculating apparatus for a secondary battery of the invention includes: obtaining a voltage value at a stop time of charge and discharge of a target secondary battery; obtaining a voltage value at a first start time of charge and discharge after that; obtaining an SOC of the... Agent:
20130038335 - Switching apparatus and test apparatus: Provided is a switching apparatus comprising a contact point section that includes a first contact point; an actuator that includes a second contact point and moves the second contact point to contact or move away from the first contact point; and a control section that controls a first drive voltage.... Agent: Advantest Corporation
20130038334 - Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migration: Test structures for simultaneously testing for electromigration or stress migration fails and time dependent dielectric breakdown fails in integrated circuits, test circuits using four test structures arranged as a bridge balance circuit and methods of testing using the test circuits. The electromigration or stress migration portions of the test structures... Agent: International Business Machines Corporation
20130038336 - Probe calibration device and calibration method: A calibration device applied for a test apparatus with at least a first probe and a second probe, the calibration device comprising: a first testing region and a second testing region, the first testing region and the second testing region divides into n×n sensing units respectively, the first testing region... Agent: United Microelectronics Corporation
20130038337 - Measurements in metallurgical vessels: A method, implemented by a software-controlled computer device and/or by dedicated hardware, for probing an electrically conductive target material, e.g. molten metal or semiconductor material, in a metallurgical vessel. In the method, a measurement signal is acquired from a sensor, which is inserted into the target material, during a relative... Agent: Agellis Group Ab
20130038338 - Parasitic capacitive canceling in a sensor interface: In one embodiment, a method includes communicating a first voltage to a drive line of a touch sensor; setting a sense line of the touch sensor to a predetermined voltage; and communicating a second voltage to the drive line. A resulting transition at the drive line from the first voltage... Agent:
20130038339 - Methods and apparatus to detect a presence of a conductive object: A method and apparatus determine a plurality of regions, each of the plurality of regions having a detected change in capacitance value that meets or exceeds a threshold value. In an embodiment, the method and apparatus fit a shape to the plurality of regions and determine another region, the other... Agent: Cypress Semiconductor Corporation
20130038341 - Contactor health monitor circuit and method: In one possible implementation, a method is provided for determining contactor health including measuring a differential voltage between a first utility line voltage and a second utility line voltage on a primary side of a contactor and on a secondary side of the contactor. The measuring is performed with both... Agent:
20130038340 - Measuring apparatus and measuring method: A measurement apparatus comprising a serial resistor in series with an element under measurement; a switching section that sequentially selects ends of a serial circuit including the element under measurement and the serial resistor, and ends of the serial resistor; an applying section that applies an application voltage or application... Agent: Advantest Corporation
20130038342 - Motor control apparatus: Provided is a motor control apparatus that can easily distinguish between a current sensor abnormality and a rotation-angle sensor abnormality, without making a current sensor a duplex system. An MGECU (140) estimates a W-phase current on the basis of a V-phase current detected by a current sensor (125), and estimates... Agent:
20130038343 - Test circuit for testing short-circuit: A test circuit includes two probes, a comparison circuit, a switch circuit, and an indication circuit. The probes are connected to an electronic component to be tested, and a low level signal is output if the electronic component is short-circuited. The comparison circuit outputs a comparison signal based on the... Agent: Hong Fu Jin Precision Industry (shenzhen) Co., Ltd.
20130038344 - Probe assembly: A probe assembly includes probe heads, a first connector, and groups of second connectors. Each probe head includes a first connection portion defining two first holes, and a data cable connected to an oscilligraph. The first connector includes a fixing portion and groups of rods fixed to the fixing portion.... Agent: Hon Hai Precision Industry Co., Ltd.
20130038345 - Probe structure, probe apparatus, probe structure manufacturing method, and test apparatus: Probes are arranged precisely and at a narrow pitch. Provided is a probe structure receiving and transmitting an electric signal from/to a device. The probe structure includes a contact point that transmits an electric signal, a probe on which the contact point is formed, a probe pad section that is... Agent: Advantest Corporation02/07/2013 > 35 patent applications in 32 patent subcategories. patent applications/inventions, industry category
20130033252 - Monitoring and manipulating cellular transmembrane potentials using nanostructures: The use of nanostructures to monitor or modulate changes in cellular membrane potentials is disclosed. Nanoparticles having phospholipid coatings were found to display improved responses relative to nanoparticles having other coatings that do not promote localization or attraction to membranes.... Agent: Life Technologies Corporation
20130033253 - Multimeter having clamping means for test probe: A multi-meter for a test probe includes a main body, two test probes and a clamping means. The test probe includes a test pin, a connecting portion, and a lead electrically connected between the test pin and the connecting portion. The connecting portion is inserted into the main body and... Agent: Chung Instrument Electronics Industrial Co., Ltd.
20130033254 - Rotor phase/speed estimating device for an ac motor: A rotor phase/speed estimating device includes a high-frequency voltage injection unit, a high-frequency current amplitude detection unit of a fundamental wave component, a correlation signal generation unit, and a rotor phase generation unit. The high-frequency voltage injection unit applies a high-frequency voltage to an AC motor. The high-frequency current amplitude... Agent: Nidec Corporation
20130033255 - Gas magnetometer: Measurement of a precessional rate of a gas, such as an alkali gas, in a magnetic field is made by promoting a non-uniform precession of the gas in which substantially no net magnetic field affects the gas during a majority of the precession cycle. This allows sensitive gases that would... Agent:
20130033256 - Sensor and sensor element: Sensor with a one-layer or multi-layer sensor element operating in a contact-free manner and a housing comprising an electric/electronic connection and, in given cases, electronic components, where the sensor element comprises a coil arrangement whose windings have a defined line width, line thickness, and line spacing per layer and whose... Agent: Micro-epsilon Messtechnik Gmbh & Co. Kg
20130033257 - Electromagnetic induction type absolute position measuring encoder: An electromagnetic induction type absolute position measuring encoder having two or more rows of scale coils, each of the rows having a scale pitch different from that of another row; a transmitter coil and a receiver coil arranged on a grid that is movable relative to the scale in the... Agent: Mitutoyo Corporation
20130033258 - Power line proximity monitoring system and method: Several systems and methods for monitoring the proximity of a device to a power line are disclosed. Electric field monitoring systems are mounted to the device and include a plurality of electric field sensors and a monitoring system base unit. Each electric field monitoring sensor senses the strength of a... Agent:
20130033259 - Position detector: A permanent magnet is fixed to a stationary portion. A yoke made of magnetic material is provided to a rotating portion. The yoke is tube-shaped to surround the permanent magnet and has a chord portion into which a magnetic flux generated by the permanent magnet preferentially flows. The chord portion... Agent: Denso Corporation
20130033260 - Current sensor: A current sensor includes a pair of magnetic balance sensors and a switching circuit. The magnetic balance sensors each include a magnetic sensor element and a feedback coil. The magnetic sensor element varies in characteristics due to an induction field caused by measurement current. The feedback coil is disposed near... Agent: Alps Green Devices Co., Ltd.
20130033261 - Noble gas magnetic resonator: Precise measurements of a precessional rate of noble gas in a magnetic field is obtained by constraining the time averaged direction of the spins of a stimulating alkali gas to lie in a plane transverse to the magnetic field. In this way, the magnetic field of the alkali gas does... Agent:
20130033262 - Method to generate magnetic resonance exposures: In a method described for generating magnetic resonance exposures in which diffusion-coded raw data are acquired with of a diffusion gradient measurement sequence having a number of partial diffusion gradient sequences, at least one diffusion coding gradient pulse is emitted in each partial data set, and raw data of a... Agent:
20130033264 - Magnetic resonance imaging apparatus and scanning-condition setting method: According to a Magnetic Resonance Imaging (MRI) apparatus, a scanning-parameter limit calculating unit creates examination information that represents scanning conditions for collection of magnetic resonance signal data based on scanning parameters set by an operator; a scanning-condition edit/scan positioning unit creates a time chart that indicates the type and a... Agent: Toshiba Medical Systems Corporation
20130033265 - Electrical and fluid connection system for magnetic imaging: Imaging signals from one or more surface coils are directed outwardly through a rear end portion of an imaging bore of an imaging machine, such as a magnetic resonance imaging machine (MRI). Initial processing of the imaging signals can be carried out within the imaging bore and transmitted through a... Agent:
20130033266 - Testing apparatus for piezoelectric/electrostrictive device: There is provided a method for testing a piezoelectric/electrostrictive actuator, wherein the displacement of a piezoelectric/electrostrictive actuator is estimated on the basis of the relations between one or more frequency characteristic values selected from the group consisting of the heights and areas of the peaks of the resonance waveforms and... Agent: Ngk Insulators, Ltd.
20130033267 - Optical sensor assembly for installation on a current carrying cable: An optical sensor assembly, for installation on a current carrying cable, senses the current in the cable and provides an electrical output indicating the current. To sense the current, a magnetic concentrator is placed in close proximity to the cable and creates a magnetic field representing current in the cable.... Agent:
20130033268 - Test system for wind turbine dump load: The present invention relates to a dump load applied in a wind turbine generator; normally it is only operating to absorb the energy during faults. Therefore in the majority time of wind turbine generator operation, the dump load is not applied, and its health condition is unknown. This invention is... Agent: Vestas Wind Systems A/s
20130033269 - Fuse tester and puller: A fuse tester (20) that includes a plurality of contacts (22, 24) with one of the contacts (24) having pad portions (102, 104, 106) enabling connection with one spade (44, 46) of a plurality of sizes of fuses (28a, 28b, 28c) when the other spade (44, 46) is electrically connected... Agent:
20130033270 - Electromagnetic interference test sytem with self-checking function and self-checking method: An electromagnetic interference (EMI) test system with self-checking function for detecting electromagnetic interference includes a signal source, a line impedance stabilization network (LISN), a coupling decoupling network (CDN), an impedance stabilization network (ISN) and a receiver. The signal source provides an electronic signal, the LISN separates interference signal from the... Agent: Hong Fu Jin Precision Industry (shenzhen) Co., Ltd.
20130033271 - Wireless open-circuit in-plane strain and displacement sensor requiring no electrical connections: A wireless in-plane strain and displacement sensor includes an electrical conductor fixedly coupled to a substrate subject to strain conditions. The electrical conductor is shaped between its ends for storage of an electric field and a magnetic field, and remains electrically unconnected to define an unconnected open-circuit having inductance and... Agent: U.s.a. As Represented By The Administrator Of The National Aeronautics And Space
20130033272 - Inline measuring apparatus and method: An inline measuring apparatus (10) is operable to measure hydrate, wax, break-through of formation water and/or scale (150) on an inside surface of a wall (100) of a pipe (40) for guiding fluid. The apparatus (10) includes an electronics unit (30) coupled to a sensor arrangement (20) disposed in a... Agent: Tecom As
20130033273 - Inductive proximity sensor: An inductive proximity sensor and a method comprising a transmitter coil, a receiver coil, an excitation device which is connected to the transmitter coil and an evaluation device, wherein the evaluation device is designed to generate an output signal which depends on a voltage ratio between a transmission voltage of... Agent: Sick Ag
20130033274 - Microelectromechanical sensor with differentiated performances and method of controlling a microelectromechanical sensor: A microelectromechanical sensor includes a supporting structure and a sensing mass, which is elastically coupled to the supporting structure, is movable with respect thereto with one degree of freedom in response to movements according to an axis and is coupled to the supporting structure through a capacitive coupling. A sensing... Agent: Stmicroelectronics S.r.l.
20130033275 - Fuel property detection device: A first electrode has a fuel passage. A second electrode defines a predetermined gap with the first electrode in the fuel passage. A third electrode defines a predetermined gap with the second electrode in the fuel passage. The first electrode and the second electrode form a first capacitance therebetween. The... Agent: Denso Corporation
20130033276 - Automatic testing equipment, automatic testing system and method for controlling automatic testing thereof: An automatic testing equipment, an automatic testing system, an a method for controlling automatic testing thereof are disclosed. The automatic testing equipment is used for receiving a control signal to test a durability of a connecting port of a device under test (DUT). The automatic testing equipment includes a testing... Agent:
20130033277 - Thermal and stress gradient based rc extraction, timing and power analysis: Timing, power and SPICE analysis are performed on a circuit layout, based on temperature and stress variations or gradient across the circuit layout. Specifically, the temperature and stress values of individual window locations across the layout are used to obtain temperature and stress variation aware resistance/capacitance (RC), timing, leakage and... Agent: Qualcomm Incorporated
20130033278 - Inspection contact element and inspecting jig: Provided is a micro contact element which is capable of coping with the miniaturization and greater complexity of substrates or boards, which is simplified due to a reduction in the number of components, and which creates sufficient contact pressure and stroke. Also provided is an inspection jig using this contact... Agent: Nidec-read Corporation
20130033279 - Electromagnetic test enclosure: The present disclosure is directed to systems and methods for operating, designing, testing and verifying the performance of wireless communication devices. Specifically, the present systems and methods can reliably determine the operating behavior of wireless communication modules within electronic products and devices in a relatively inexpensive and compact testing cabinet,... Agent:
20130033282 - Contact structure and method of manufacturing contact structure: A contact structure has a probe and a housing disposed on an outer circumference thereof. The housing has a housing main body in which a hollow section vertically penetrating the same is formed, and a conductive coat film with which an inner wall surface of the hollow section is coated.... Agent: Tokyo Electron Limited
20130033281 - Probe assembly: A probe assembly includes a probe, a transducer, and a cable electronically connecting the probe with the transducer. The cable has a jacket made of an extreme-environment resistant material.... Agent: Hong Fu Jin Precision Industry (shenzhen) Co., Ltd.
20130033280 - Self-retaining via probe: A planar body is configured such that its edges engage the sidewall of a via of a device under test to create point electrical contacts and the planar body resists removal of the planar body from the via after insertion. The edges of the planar body may include barbs that... Agent: Tektronix, Inc.
20130033283 - Probing device: A probing device includes a circuit board, a reinforcing plate, at least one space transformer and at least one probe assembly. The reinforcing plate is disposed on the circuit board, and the reinforcing plate has a plurality of inner conductive wires electrically connecting to those of the circuit board. The... Agent: Mpi Corporation
20130033284 - Disguising test pads in a semiconductor package: A method of forming a semiconductor package is disclosed including disguising the test pads. Test pads are defined in the conductive pattern of the semiconductor package for allowing electrical test of the completed package. The test pads are formed in shapes such as letters or objects so that they are... Agent: Sandisk Technologies Inc.
20130033285 - Methods for reliability testing of semiconductor devices: In accordance with a exemplary embodiments, methods for performing reliability testing of a plurality of transistors formed on a substrate includes simultaneously stressing the plurality of transistors by applying a voltage potential from each of a plurality of voltage sources to respective drain contacts of a like plurality of row... Agent: Globalfoundries Inc.
20130033286 - Non-destructive tilt data measurement to detect defective bumps: The present disclosure includes techniques and apparatus for making non-contact differential measurements of various dimensions of electronic components surface mounted on circuit boards. Tilt data relating to the electronic components is derived from the differential measurements to provide an indication of the integrity of the electrical connection between the electronic... Agent: Medtronic, Inc.Previous industry: Electricity: power supply or regulation systems
Next industry: Electronic digital logic circuitry
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