|Electricity: measuring and testing patents - Monitor Patents|
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Electricity: measuring and testing February patent applications/inventions, industry category 02/11Below are recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application. 02/24/2011 > patent applications in patent subcategories. patent applications/inventions, industry category
20110043187 - Method and circuit for tracking maximum power of a photo-voltaic array: A method and a circuit for tracking maximum power of a photo-voltaic array performs the operation of load increase/decrease with a preset current difference and determines if the photo-voltaic array operates at zone A or zone B based on change of the output voltage before and after the operation to... Agent: G. Link Co., Ltd.
20110043188 - Voltage margin test device: A voltage margin test device tests an allowable minimum and an allowable maximum of an electronic device to obtain the voltage margin within which the electronic device can work normally.... Agent: Altis Law Group, Inc. Attn: Steven Reiss
20110043189 - Method for the secure acquisition of multiple analog input signals, analog input circuit, and measuring sensor and measuring transducer having an analog input circuit of this type: A method for securely acquiring multiple analog input signals that are converted using a plurality of A/D converters into corresponding digital single measured values. A first measurement averaging cycle having a predetermined total number of measuring intervals is predetermined by a higher-order control unit. First and second input signals are... Agent: Cohen, Pontani, Lieberman & Pavane LLP
20110043190 - Rogowski coil, medium voltage electrical apparatus including the same, and method of providing electrostatic shielding for a rogowski coil: A Rogowski coil includes a core, a Rogowski coil winding disposed on the core, an insulator disposed on the Rogowski coil winding disposed on the core, and a conductive winding disposed on the insulator disposed on the Rogowski coil winding disposed on the core. The conductive winding includes an electrical... Agent: Martin J. Moran Eaton Electrical, Inc.
20110043191 - Phoenix probe x voltage tester: The present invention a cordless power tester that is capable of reading multiple input and output voltage. This tool will provide a mechanic or electrician with all the information that is needed when searching for a short circuit, or other circuit interruption in an electrical circuit. When such a short... Agent: Ruth Eure
20110043192 - Coaxial-cable probe structure: A coaxial-cable probe structure comprises a coaxial cable and a probing element. The coaxial cable is formed by filling and fixing an inner conductor into an outer conductor via a dielectric material. The dielectric material of the coaxial cable and the outer conductor are provided with a cutting surface. The... Agent: Muncy, Geissler, Olds & Lowe, PLLC
20110043195 - Magnetic displacement sensor: A magnetic displacement sensor, where, in order to achieve an improved measurement behavior, magnets are formed in a direction of an x-axis such that a z-component (Bz) of the flux density has an essentially linear characteristic curve in a region of travel and/or the magnets are formed in a direction... Agent: Ratnerprestia
20110043194 - Variable reluctance position sensor: A variable reluctance analog position device designed to determine the position variation of a target made from a ferromagnetic material. The device includes at least one magnet, the target and the magnet defining a gap therebetween. A magnetosensitive element detects induction variation produced in the gap by relative movement of... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.
20110043196 - Sheet coil type resolver: A sheet coil type resolver includes: a stator section in which a stator transformer coil composed of first and second stator transformer coil layers is disposed to axially overlap with a resolver stator coil composed of first and second resolver stator coil layers; and a rotor section in which a... Agent: Foley And Lardner LLP Suite 500
20110043193 - Magnetic linear sensor arrangement: A magnetic linear sensor arrangement for detecting the position of a component that can be moved along a predefined movement path includes a device disposed along the movement path for generating a magnetic field whose polarity changes along the movement path of the component, and at least one galvanomagnetic detector... Agent: Buchanan, Ingersoll & Rooney PC
20110043198 - Arrangement for detecting a rotation angle: The invention relates to an arrangement for detecting rotation angles on a rotating component, having transducers and sensors, detecting a physical variable as digitally processable signals as a function of the rotation angle change of the rotating component. The rotating component has at least one satellite of a smaller circumference... Agent: Osha Liang L.L.P.
20110043197 - Method and device for contactless sensing rotation and angular position using orientation tracking: 1. Method and device for contactless sensing rotation and angular position using orientation tracking. 2.1 To improve the accuracy and possible resolution of a magnetic positioning system, a method and a device using a special tracking technique is proposed. 2.2. The method and the device are using multiple magnetic field... Agent: Dority & Manning, P.A.
20110043199 - Sensor assembly: A rail inspection device comprises a sensor (24) and a compliant spacer (26). The compliant spacer (26) has an inner surface and outer surface. The sensor (24) is urged against the inner surface of the spacer (26) and, when in use, the outer surface of the spacer (26) is in... Agent: Mccormick, Paulding & Huber LLP
20110043200 - Current sensing device and manufacturing method of the same: A current sensing device and a manufacturing method of the same are disclosed. The current sensing device includes: a core having a gap; and a magnetic sensor inserted in the gap. The core includes a first core member and a second core member each made of a grain-oriented magnetic steel... Agent: Posz Law Group, PLC
20110043201 - Detection of magnetic beads using a magnetoresistive device together with ferromagnetic resonance: A method and apparatus for detecting the presence of magnetic beads is disclosed. By providing both a static magnetic field and a magnetic field that alternates in the MHz range, or beyond, the bead can be excited into FMR (ferromagnetic resonance). The appearance of the latter is then detected by... Agent: Saile Ackerman LLC
20110043202 - Fluid saturation estimation: In some embodiments, apparatus and systems, as well as methods, may operate to acquire signature data representing a plurality of nuclear magnetic resonance (NMR) echo trains associated with a material comprising a first fluid and a second fluid, force a subset of the signature data associated with the first fluid... Agent: Schwegman, Lundberg & Woessner, P.A.
20110043204 - Magnetic resonance system and method for computerized rule-based control thereof: In a magnetic resonance system according to a measurement protocol defined in advance and comprising multiple acquisition parameters, wherein given a non-compliance with at least one limit value (which is automatically established before the beginning of a subject-specific measurement data acquisition)—in particular a SAR limit value and/or a magneto-stimulation limit... Agent: Schiff Hardin, LLP Patent Department
20110043205 - Real-time local and global sar estimation for patient safety and improved scanning performance: In a method and apparatus to enable increased RF duty cycle in high field MR scans, a specific energy absorption rate (SAR) calculation processor (36) calculates the local and global SAR or even a spatial SAR map. The efficient implementation by using pre-averaged data (based on E-fields) makes a fast... Agent: Philips Intellectual Property & Standards
20110043203 - Side-band suppression method and side-band suppression device: In a method and device for side-band suppression, a positive eddy current correction factor and negative eddy current correction factor are determined and scanning N/2 times by a positive gradient takes place, and the positive gradient scanning signal is collected during each scan. Scanning N/2 times by a negative gradient... Agent: Schiff Hardin, LLP Patent Department
20110043206 - Magnetic resonance imaging apparatus and rf coil unit: According to one embodiment, a magnetic resonance imaging apparatus includes a correction data acquisition unit configured to perform diffusion weighted imaging to a phantom having a known apparent diffusion coefficient and measure an apparent diffusion coefficient of the phantom to acquire correction data from a measured apparent diffusion coefficient and... Agent: Nixon & Vanderhye, PC
20110043208 - Double layer multi element rf strip coil array for sar reduced high field mr: When performing high or ultra-high field magnetic resonance imaging, a double-layered transmit-receive coil array (10) improves receive SNR and reduces transmit SAR. A transmit element (14) is placed in close proximity to a radio frequency shield (12) to reduce SAR, and a receive element (16) is placed further away from... Agent: Philips Intellectual Property & Standards
20110043207 - Whole-body coil arrangement for an open magnetic resonance scanner for use with a second diagnostic and/or therapeutic modality: A whole-body coil arrangement for an open magnetic resonance scanner for use with a second diagnostic and/or therapeutic modality is proposed. The whole-body coil arrangement includes at least one coil conductor and a radio-frequency shield. The whole-body coil arrangement is embodied at least in part as essentially transparent to the... Agent: Siemens Corporation Intellectual Property Department
20110043209 - Coil decoupling for an rf coil array: An MRI phase RF coil array includes a plurality of separate RF coil elements where each coil element has a pre-amplifier circuit with a conditioning circuit in advance of the transistor including an inductor and capacitors connected across the input of preamplifier. Each of the coil elements has a preamplifier... Agent: Ade & Company Inc.
20110043210 - Mri-safe implant electronics: A power supply arrangement for an implantable electronic system is described. An MRI power supply arrangement cooperates with an implantable power supply circuit to provide a high output impedance for implanted circuitry during magnetic resonance imaging (MRI).... Agent: Sunstein Kann Murphy & Timbers LLP
20110043211 - Single and multi-trace omnidirectional sonde and line locators and transmitter used therewith: At least one antenna array including three mutually orthogonal antennas each sharing a common center point senses an electromagnetic signal emitted by a buried object such as a utility line, pipe or sonde. A circuit at least partially mounted in a housing is connected to the array and determines a... Agent: Michael H Jester
20110043212 - Method of estimation of the state of charge of a battery: The method includes the simultaneous measurement of the current I, of the positive plate potential V+, and of the temperature T at the positive terminal of the battery, the determination of a temperature compensated value Vc+ of the positive plate potential and the use of the temperature compensated value Vc+... Agent: Oliff & Berridge, PLC
20110043213 - Fet-based sensor for detecting ionic material, ionic material detecting device using the fet-based sensor, and method of detecting ionic material using the fet-based sensor: Provided are a FET-based sensor for detecting an ionic material, an ionic material detecting device including the FET-based sensor, and a method of detecting an ionic material using the FET-based sensor. The FET-based sensor includes: a sensing chamber including a reference electrode and a plurality of sensing FETs; and a... Agent: Cantor Colburn LLP
20110043214 - Method and apparatus for locating a parallel arc fault: Methods to determine the location of an arc fault include a first method utilizing the inherent resistance per unit length of the wire. A second and a third method utilize an inherent inductance per unit length of the wire. The second method derives the inherent inductance from the output voltage... Agent: Wiggin And Dana LLP Attention: Patent Docketing
20110043218 - Analysis method and analysis system: The invention discloses an analysis method and an analysis system for analyzing an integrated circuit comprising a plurality of electronic components. The analysis method comprises steps of: performing a measurement or a simulation on an integrated circuit to obtain a time-domain waveform of an output signal of the integrated circuit;... Agent: Patterson & Sheridan, LLP - - - Iptec
20110043216 - Circuit structure free from test effect and testing method thereof: A circuit structure free from test effect is provided. The circuit structure includes a first test terminal and a second test terminal. A symmetric circuit unit is coupled between the first test terminal and the second test terminal. The symmetric circuit unit includes a plurality of transistors, wherein the transistors... Agent: Jianq Chyun Intellectual Property Office
20110043217 - Electrode fault detection: A method for detecting an electrode fault in a cochlear prosthesis. A voltage between the implanted electrode and a reference node is measured. It is then determined whether the voltage measured has been affected by an electrical leakage path between the electrode and a power supply node.... Agent: John S. Pratt, Esq. (cochlear) Kilpatrick Stockton LLP
20110043215 - Single level of metal test structure for differential timing and variability measurements of integrated circuits: A test structure for an integrated circuit device includes one or more experiments selectively configured to receive one or more high-speed input signals as inputs thereto and to output at least one high-speed output signal therefrom, the one or more experiments each comprising two or more logic gates configured to... Agent: Cantor Colburn LLP-ibm Yorktown
20110043219 - System for detecting faults in electrical wiring, and manufacturing method thereof: A diagnostic system for detecting faults in electrical wiring, and manufacturing method thereof is provided. The diagnostic system includes a diagnostic sensor coupled to a data acquisition system. The diagnostic sensor includes a sensor housing with a flexible coil sensor disposed inside. The sensor housing includes a base portion, lid... Agent: General Electric Company Global Research
20110043220 - Method and apparatus for power sequence timing to mitigate supply resonance in power distribution network: The transient load current of a circuit powered by a power distribution network is increased in a plurality of steps, with the step transition times being adjusted based on the transient noise of the power distribution network. This reduces the resonance noise that would otherwise occur in the supply current... Agent: Rambus / Fenwick
20110043221 - Method and device for dynamic adjustment of network operating voltage: The present invention is to provide a method and device of dynamically adjusting the operating voltage of a network integrated circuit including the steps of detecting and ranking the signal-to-noise ratio of N ports to single out a port for arbitration, dynamically controlling the operating voltage according to the signal-to-noise... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP
20110043222 - Dual deformable reverberation chamber: e
20110043223 - Non invasive method for monitoring the curing process of a thermoset plastic material through the use of microwaves and microwave device for the application thereof: In another aspect, the invention proposes a method for the determination of the unloaded resonance frequency and the unloaded quality factor of a very strongly coupled microwave resonator and a method for determining the complex permittivity of a material undergoing changes in density, such as those produced during the curing... Agent: Wenderoth, Lind & Ponack, L.L.P.
20110043224 - Capacitive oil quality monitoring sensor with fluorinated barrier coating: Methods and devices for evaluating the quality of oils are disclosed. The methods and devices can provide an indication of the oil quality based on the Total Polar Content of the oil. The methods rely on a reusable capacitive sensing element that comprises a fluorinated barrier coating, as disclosed herein.... Agent: 3m Innovative Properties Company
20110043225 - Non-contact biopotential sensor: A capacitive sensor system including a sensing plate, an amplifier, and a switching circuit is described. The sensing plate is capacitively coupled to a body surface. A change in the electric potential on the body surface generates an electric field that induces change in the electric potential of the sensing... Agent: Procopio, Cory, Hargreaves & Savitch LLP
20110043226 - Capacitive sensor: Method and apparatus are provided for a capacitive sensor. In an example, a capacitive sensor can include a first sensing element, a sensing channel operable to generate a first signal indicative of first capacitance between the sensing element and a system ground, and a processor responsive to a change in... Agent: Schwegman, Lundberg & Woessner / Atmel
20110043227 - Methods and apparatus for capacitive sensing: The present disclosure addresses methods and apparatus facilitating capacitive sensing using a conductive surface, and facilitating the sensing of proximity to the conductive surface. The sensed proximity will often be that of a user, but can be another source of a reference voltage potential. In some examples, the described systems... Agent: Schwegman, Lundberg & Woessner/apple
20110043228 - Method and apparatus for measuring wafer bias potential: A device for use in a wafer processing chamber having a plasma forming volume and a hot edge ring. The hot edge ring has a first surface and a second surface. The first surface is in contact with the plasma forming volume. The second surface is not in contact with... Agent: Thomas D. Robbins
20110043229 - Quantum tunnelling sensor device and method: A sensor device, method of fabricating the same, and a method of sensing a physical quantity. The sensor device comprises a substrate; a flexure member, one end of the flexure member being attached to the substrate, and a free end of the flexure member having an edge surface; a counter... Agent: Foley And Lardner LLP Suite 500
20110043230 - Moisture monitoring device and method: A moisture monitoring device that measures the dielectric constant of a material to provide an indication of the moisture content of a material. The moisture monitoring device can provide an instantaneous indication of the moisture content of a material (e.g., soil). The moisture monitoring device can include a number of... Agent: Fraser D. Roy Workman Nydegger
20110043231 - System for post-processing of electronic components: A method of post-processing a plurality of electronic components in a post-processing machine after fabrication of the electronic components including providing a carrier with align fixtures, which align fixtures have a clamping mechanism, actuating the clamping mechanism to enlarge a size of receptacles, each of the receptacles is assigned to... Agent: Christie, Parker & Hale, LLP
20110043232 - Contact structure for inspection: A plurality of metal plates and an insulating plate having a polished surface are laminated in a probe supporting plate. Through-holes into which probes are to be inserted are respectively formed in the metal plates and the insulating plate. Diameters of the through-holes are greater than diameters of the through-holes,... Agent: Cantor Colburn LLP
20110043233 - Wafer level contactor: A probe card assembly can include a plurality of probes disposed on a substrate and arranged to contact terminals of a semiconductor wafer. Switches can be disposed on the probe card assembly and provide for selective connection and disconnection of the probes from electrical interconnections on the probe card assembly.... Agent: N. Kenneth Burraston Kirton & Mcconkie
20110043234 - Socket connector for connection lead of semiconductor device under test with tester: A socket connector for electrically connecting a lead of a semiconductor device under test (DUT) with a tester includes a container having a chamber, a conductive end or plug that seals the chamber at one end, and a conductive membrane that seals the chamber at another end. A liquid conductive... Agent: Freescale Semiconductor, Inc. Law Department
20110043235 - Semiconductor device having a plurality of pads: A semiconductor device includes a plurality of sensor pads configured to receive a probe signal from a testing apparatus, and a plurality of normal pads configured to receive a driving signal to drive the semiconductor device. In the plurality of sensor pads and the plurality of normal pads, a length... Agent: Lee & Morse, P.C.
20110043236 - Compression connector module for use with storage devices and a test carrier incorporating same: A compression connector module (10) for use with storage devices comprising a connector housing (12); at least one connector pin (16) mounted on the connector housing (12); and a flex clamp (14) positioned such that a clamping portion (32) of the flex clamp (14) overlays at least one of the... Agent: Cohen, Pontani, Lieberman & Pavane LLP
20110043240 - Method and apparatus for providing active compliance in a probe card assembly: A probe card assembly can comprise a first source of compliance and a second source of compliance. The probe card assembly can further comprise a controller, which can be configured to apportion a total compliance demand placed on the probe card assembly between the first source of compliance and the... Agent: N. Kenneth Burraston Kirton & Mcconkie
20110043238 - Method of manufacturing needle for probe card using fine processing technology, needle manufactured by the method and probe card comprising the needle: Disclosed are probe card needles manufactured using microfabrication technology, a method for manufacturing the probe card needles, and a probe card having the probe card needles. The probe needles are manufactured by forming, on a ceramic board, probe needle bases made of conductive metal, and a polymeric elastomer layer, by... Agent: Dickstein Shapiro LLP
20110043239 - Probe card: An object of the present invention is to provide a probe card which has good stability of the connection between testing electrodes and test electrodes even after exposure to high temperatures in the burn-in test, and is less susceptible to displacements in the positions of contact between the testing electrodes... Agent: Sughrue Mion, PLLC
20110043237 - Wafer tray and test apparatus: In order to shorten testing time of a plurality of devices under test formed on a semiconductor wafer, a wafer tray used by a test apparatus performing the test is provided. The wafer tray includes a first flow passage for fixing the semiconductor wafer to the wafer tray using vacuum... Agent: Masao Yoshimura
20110043241 - Light emitting bio-mimicry device: A system and method are provided for mimicking a bioluminescent signal from an animal or an insect, such as a firefly. A first version includes a controller, an electrical energy battery, a solar energy collector and a light emitting device. The solar energy collector receives sunlight and converts the sunlight... Agent: Patrick Reilly
20110043242 - Acquisition of silicon-on-insulator switching history effects statistics: A test structure for gathering switching history effect statistics includes a waveform generator circuit that selectively generates a first test waveform representative of a 1SW transistor switching event, and a second test waveform representative of a 2SW transistor switching event; and a history element circuit coupled to the waveform generator... Agent: Cantor Colburn LLP-ibm Yorktown
20110043243 - Measurement of partially depleted silicon-on-insulator cmos circuit leakage current under different steady state switching conditions: A test system for determining leakage of an integrated circuit (IC) under test includes a test circuit formed on a same chip as the IC, the test circuit further having pulse generator configured to generate a high-speed input signal to the IC at a plurality of selectively programmable duty cycles... Agent: Cantor Colburn LLP-ibm Yorktown
20110043244 - On-line time domain reflectometer system: A number of TDR systems and testing methods are provided that improve the quality and accuracy of information collected when propagating a signal along a length of cable in order to pinpoint specific anomalies. One or more of the TDR systems includes, for example, a computing device, a pulse generator,... Agent: Christensen, O'connor, Johnson, Kindness, PLLC02/17/2011 > patent applications in patent subcategories. patent applications/inventions, industry category
20110037452 - Detection of ground-laid wire using ultraviolet c-band radiation: A system for tracing wire includes an electrical exciter adapted to apply a voltage to a ground-laid wire to generate a corona at an outer surface of the ground laid wire, at least a portion of the corona including ultraviolet c-band radiation, and an ultraviolet c-band detector to detect the... Agent: Raytheon Company C/o Daly, Crowley, Mofford & Durkee, LLP
20110037453 - Detector device: A high-frequency detector device (1) including a detector circuit in which the input gate of the branch line coupler, from which the fundamental wavelength of an input signal is extinguished, is used for decoupling a bias voltage VDC of two Schottky-diodes (4, 5) and by a HF-technique, is closed by... Agent: Volpe And Koenig, P.C.
20110037454 - Cdse quantum dots doped optical fiber and a current sensor using the same: Disclosed is an optical fiber for a current sensor, the optical fiber comprising a core doped with CdSe quantum dots and a current sensor using the same.... Agent: Christopher P. Maiorana, P.C.
20110037455 - System for measuring electrical power: The claimed subject matter discloses a system for measuring power consumption of an electrical appliance. The system comprises a sensing module for sensing physical phenomenon, located externally to the electrical appliance. The system further comprises a transmitter for transmitting information representing the physical phenomenon sensed by the sensing module and... Agent: Soroker-agmon Advocate And Patent Attorneys
20110037456 - Measuring transducer for process instrumentation, and method for monitoring the condition of the sensor thereof: A measuring transducer for process instrumentation that comprises a sensor for sensing a physical or chemical variable, wherein the sensor includes at least one electrical element embedded in a substrate comprising semiconducting material and is electrically separated therefrom by a blocked PN junction during normal operation. In order to monitor... Agent: Cohen, Pontani, Lieberman & Pavane LLP
20110037457 - Readout apparatus for current type touch panel: A readout apparatus for a current type touch panel is provided. The readout apparatus includes a current-to-voltage converter, a voltage gain unit and an analog-to-digital converter (ADC). The current-to-voltage converter converts a sensing current of the current type touch panel to a sensing voltage. An input end of the voltage... Agent: J C Patents
20110037458 - Open loop magneto-resistive magnetic field sensor: An apparatus and a general method to measure a magnetic field using magneto-resistive sensors in an open-loop configuration are disclosed. A key feature is the regular in-situ normalization of the sensors to compensate for the effects of sensor aging.... Agent: Saile Ackerman LLC
20110037459 - Rotation-angle-detecting apparatus: A rotation-angle-detecting apparatus comprising a magnet rotor, a magnetic sensor detecting the direction of magnetic flux from the magnet rotor, a correction circuit, and an angle-calculating circuit, the magnetic sensor having bridge circuits X and Y each comprising four connected magnetoresistive devices, each magnetoresistive device comprising a spin-valve, giant-magnetoresistive film,... Agent: Sughrue Mion, PLLC
20110037460 - Multiple receiver coil dual mode electromagnetic detector: An electromagnetic detection system comprising: a transmitter loop for generating a primary magnetic field, and a first pair of spaced apart receiver coils and second pair of spaced apart receiver coils for measuring a secondary magnetic field generated in response to the primary magnetic field. The transmitter loop drives the... Agent: Fay Sharpe LLP
20110037461 - Method and device for detecting near-surface defects by means of magnetic leakage flux measurement: In a method for detecting near-surface defects in a test sample consisting at least partly of a ferromagnetic material, a test volume of the test sample is magnetized and scanned for the detection of magnetic leakage fields caused by defects. The test volume is magnetized by means of a magnetic... Agent: Ip Group Of Dla Piper LLP (us)
20110037462 - Multiple receiver coil dual mode electromagnetic detector: An electromagnetic detection system comprising: a transmitter loop for generating a primary magnetic field, and spaced apart receiver coils for measuring a secondary magnetic field generated in response to the primary magnetic field.... Agent: Fay Sharpe LLP
20110037463 - Spintronic magnetic nanoparticle sensors with an active area located on a magnetic domain wall: A sensor is described for detecting the presence of a magnetic nanoparticle (N). The sensor is arranged on a support (1), on which a plurality of non-magnetic contacts (Iin, GND, V1, V2) electrically conductively connected to the sensor is disposed. The contacts are adapted to be connected to means for... Agent: Sherr & Vaughn, PLLC
20110037464 - Tunable graphene magnetic field sensor: A magnetic field sensor employing a graphene sense layer, wherein the Lorentz force acting on charge carriers traveling through the sense layer causes a change in path of charge carriers traveling through the graphene layer. This change in path can be detected indicating the presence of a magnetic field. The... Agent: Zilka-kotab, PC- Hit
20110037465 - Composite pulse design method for large-tip-angle excitation in high field magnetic resonance imaging: A magnetic resonance imaging apparatus having a static magnetic field source, a plurality of radio frequency magnetic field sources and a plurality of gradient magnetic field sources for generating a gradient magnetic field is provided. The static magnetic field source generates a static magnetic field for aligning a spin vector... Agent: General Electric Company Global Research
20110037467 - Magnetic resonance imaging apparatus: A magnetic resonance imaging apparatus includes: a pair of static magnetic field generators separately disposed at the top and bottom of an imaging space in which a subject is placed; a shim magnetic material, disposed on the imaging-space side of each of the pair of static magnetic field generators, for... Agent: Cooper & Dunham, LLP
20110037466 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: A magnetic resonance imaging apparatus includes an imaging unit which applies a labeling pulse to invert a spin included in a labeling region within part of a imaging region and then collects a echo signal from a time point when an inversion time has passed from the application of the... Agent: Nixon & Vanderhye, PC
20110037468 - Optimized mri strip array detectors and apparatus, systems and methods related thereto: Featured is a device for NMR or MRI signals from excited nuclei as well as related apparatus, systems and methods. The device includes a strip array antenna including one or more conductor and N reactive tuning components, where N is an integer≧1 at least one of the N reactive components... Agent: Edwards Angell Palmer & Dodge LLP
20110037469 - Electromagnet device and magnetic resonance imaging device: An electromagnet device which generates magnetic field in the direction perpendicular to the inserting direction of an inspection subject is reduced in size and weight by removing unnecessary arrangement as much as possible. A magnetic resonance imaging device is also provided. The electromagnet device comprises a first coil (31) through... Agent: Antonelli, Terry, Stout & Kraus, LLP
20110037470 - Magnetic resonance surface coil: A plug block module for a surface coil for a magnetic resonance tomography apparatus has a plug block body with contacts for connection lines that can be connected with a magnetic resonance tomography apparatus, an adapter plug that can be inserted into an adapter plug of the surface coil, a... Agent: Schiff Hardin, LLP Patent Department
20110037471 - Magnetic resonance imaging apparatus: In a magnetic resonance imaging apparatus according to an embodiment, a transmitting coil applies a radio-frequency magnetic field to a subject placed in a static magnetic field. A receiving coil receives a magnetic resonance signal emitted from the subject owing to an application of the radio-frequency magnetic field. A balun... Agent: Nixon & Vanderhye, PC
20110037472 - Omnidirectional sonde and line locator: At least one antenna array including three mutually orthogonal antennas each sharing a common center point senses an electromagnetic signal emitted by a buried object such as a utility line, pipe or sonde. A circuit at least partially mounted in a housing is connected to the array and determines a... Agent: Michael H Jester
20110037473 - Data acquisition method with a three dimensional small bin electromagnetic consecutive array: Disclosed herein is a three dimensional small bin electromagnetic consecutive array data acquisition method used in oil exploration comprising the steps of recording data using small bin lattices on execution of arrangement electrodes, each acquisition station (Ex, Ey) records the natural electromagnetic field time series data with the same acquisition... Agent: Nold Intellectual Property Law
20110037474 - Method and system for measuring resistivity anisotropy of layered rock samples: A method and apparatus for measuring the resistivity anisotropy of cylindrical rock samples is disclosed. The measurement setup includes two pairs of electrodes that contact the sample surface. The ring electrodes of the first pair are disposed on the cylindrical surface of the sample. The cap electrodes of the second... Agent: Cantor Colburn LLP- Baker Hughes Incorporated
20110037475 - Battery capacity estimation by dcir: A method of battery capacity measurement is actualized by battery internal resistance. This method establishes a controlled discharge path inside the battery module. The battery discharge current is a constant value despite of the variation of system loading current. The internal resistance measured by establishing this constant battery current can... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP
20110037477 - Test structure for highly accelerated electromigration tests for thick metallization systems of solid integrated circuits: A test structure and a process for the electromigration test of integrated circuits is suggested, in which metallization planes consisting of strip conductors of a usual thickness (11) are connected with metallization planes consisting of substantially thicker strip conductors (12) as they are required for the connection of components of... Agent: Stevens & Showalter LLP
20110037478 - Field device: Disclosed is a field device which determines whether or not an abnormality which was detected is the type of abnormality which may not allow the output of a burn-out H signal, and sets a signal output for the abnormality to a burn-out L signal when the type of abnormality was... Agent: Mcdermott Will & Emery LLP
20110037479 - Method for fault monitoring at a lighting output of a motor vehicle: A method for fault monitoring at a lighting output of a motor vehicle. Reference current values are first measured and calculated at various reference voltages. During operation of the lighting output, operating current values and operating voltages are measured. If the operating current value at the measured operating voltage deviates... Agent: Cohen, Pontani, Lieberman & Pavane LLP
20110037480 - Method for fault location in uncompensated power lines with two-end unsynchronized measurement: A method is provided for fault location in uncompensated power lines with two-end unsynchronized measurement, finding an application in the power industry and for overhead and overhead-cable transmission or distribution lines. The method according to the invention includes measuring the voltage and currents at both ends (A) and (B) of... Agent: Abb Inc. Legal Department-4u6
20110037481 - Method of testing substrate: Disclosed herein is a method of testing a substrate. In the method, a first test terminal is connected to a first external circuit layer coupled to a first connection pad of a first active element included in a substrate, and a second test terminal is connected to a second external... Agent: Blakely Sokoloff Taylor & Zafman LLP
20110037482 - Nondestructive inspection method of insulator using frequency resonance function: A nondestructive inspection method of testing insulators using frequency resonance function that can inspect an anomaly of an insulator by vibrating the insulator with a force having the characteristic of white noise, measuring the change in motion of the insulator according to the vibration and calculating the frequency resonance function... Agent: Edwards Angell Palmer & Dodge LLP
20110037483 - Mess-sensor: The invention relates to a sensor having a conductor arrangement and an intervening dielectric to detect local sensor impedances in response to external forces. The conductor arrangement comprises elongate conductor strips between which the intervening dielectric is arranged as a compressible insulating medium.... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.
20110037484 - System and method for augmented impedance sensing: An impedance monitoring circuit for an electrosurgical generator is disclosed. The monitoring circuit includes an isolation transformer coupled to at least one of an active terminal and a return terminal of an electrosurgical generator, wherein the isolation transformer includes a primary winding coupled to a reference resistor and a secondary... Agent: Tyco Healthcare Group Lp Attn:IPLegal
20110037485 - Covering and sealing film for a pack and a method for determining the opening state of a pack: The invention concerns a covering and/or sealing film for a pack, in particular a blister pack, configured to seal at least one filling product chamber and allow opening access to the filling product chamber by separation and/or tearing, wherein the film, in particular in the area of the filling product... Agent: Ratnerprestia
20110037486 - Nucleotide capacitance measurement for low cost dna sequencing: High frequency capacitance measurement on a single strand of deoxyribonucleic acid (DNA) or a ribonucleic acid (RNA) is employed to provide identification of the nucleotides in the strand. Effect of variations in the capacitance of nucleotides can be minimized by employing statistical quantities generated from multiple measurement values on a... Agent: Scully Scott Murphy & Presser PC
20110037487 - Method for detecting pressure on touch sensing element and electronic device using the same: A method for detecting pressure on a touch sensing element includes the steps of: providing a first potential difference to two electrodes of a first film; charging a capacitor with a division voltage of the first potential difference; sampling a charged voltage of the capacitor to obtain a plurality of... Agent: Lowe Hauptman Ham & Berner, LLP
20110037488 - Flexural mechanism for passive angle alignment and locking: A passive alignment structure is provided that includes at least one rigid post being coupled to a top surface and a bottom surface. At least one in-plane clamp is associated with a respective at least one rigid post. The at least one in-plane clamp receives a clamping force to lock... Agent: Gauthier & Connors, LLP
20110037489 - Silicon chicklet pedestal: A silicon chicklet pedestal for use in a wafer-level test probe of a wafer is provided and includes a main body, first and second opposing faces, and an array of vias formed through the main body to extend between the first and second faces, through which pairs of leads, respectively... Agent: Cantor Colburn LLP-ibm Yorktown
20110037491 - Circuit board having bypass pad: An electronic device having a printed circuit board is provided. In one embodiment, the printed circuit board includes a plurality of external pads to be coupled with an external device and a plurality of bypass pads for testing an electric circuit. The external pads are exposed and at least one... Agent: Muir Patent Consulting, PLLC
20110037490 - Dielectric film and layer testing: A system for testing and a method for making a semiconductor device is disclosed. A preferred embodiment includes a conductor overlying a dielectric layer. The conductor is coupled to a first test pad via a first conducting line and to a second test pad via a second conducting line.... Agent: Slater & Matsil, L.L.P.
20110037492 - Wafer probe test and inspection system: An apparatus for electrically testing a semiconductor device is herein disclosed. The apparatus includes carriers for a semiconductor device and a probe card (52) that are adapted for complementary registration with one another. The coupled carriers may be stacked or used in another high-density arrangement during electrical test or burn-in... Agent: Dicke Billig & Czaja, PLLC Attn: Christopher Mclaughlin
20110037493 - Probe-able voltage contrast test structures: Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end portion of each floating tine, and... Agent: Cantor Colburn LLP - IBM Fishkill
20110037494 - Method for wafer-level testing of integrated circuits: A method for wafer level testing is provided which includes providing a wafer having an integrated circuit formed thereon, applying a signal to energize the integrated circuit, the signal including increasing steps or decreasing steps that range between a first level and a second level, and determining whether the integrated... Agent: Haynes And Boone, LLPIPSection
20110037495 - Method for fault detection in controlling a rotary field motor: The invention specifies a method for fault identification when driving a polyphase motor by means of a frequency converter, wherein, in a rest state, the frequency converter controls the phase voltages of the polyphase motor and the phase currents of the polyphase motor are measured. In this case, provision is... Agent: Lerner Greenberg Stemer LLP02/10/2011 > patent applications in patent subcategories. patent applications/inventions, industry category
20110031958 - Power conversion efficiency measurement system and method: A system measures power conversion efficiency of a voltage regulator. A measurement setting module presets a maximum output current and a total measurement number, and calculates each target output current of the voltage regulator. A load adjustment module adjusts an impedance of the electronic load to equal current passing through... Agent: Altis Law Group, Inc. Attn: Steven Reiss
20110031959 - Acceleration sensor: An acceleration sensor includes a substrate, first and second torsion beams, first and second detection frames, first and second detection electrodes, first and second link beams, and an inertial mass body. The first and second torsion beams are distorted around the first and second torsion axes. The first and second... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.
20110031960 - Calibratable multidimensional magnetic point sensor: A calibratable magnetic field sensor for sensing a first and a second spatial component of a magnetic field in a reference point, wherein the magnetic field includes a first and a second measurement field component and/or a first and a second calibration field component. The magnetic filed sensor includes a... Agent: Glenn Patent Group
20110031962 - Magnetic pole position detecting device and method: A magnetic pole position detecting device that can correctly acquire a magnetic pole position even if two magnetic sensors are arranged at an arbitrary interval receives sensor outputs “a” and “b” of two magnetic sensors arranged at a predetermined interval L along a magnetic pole arraying direction motor and a... Agent: Sughrue Mion, PLLC
20110031963 - Inductive sensor for speed, rotational direction and position measurements in the high temperature range: An inductive sensor with coils arranged substantially in layers on a flat circuit-carrier. The edges of the flat circuit-carrier are metallized obliquely so that an upper side, a lower side, an intermediate layer and/or a plurality of intermediate layers of the flat circuit-carrier are interconnected with one another via the... Agent: Davis & Bujold, P.l.l.c.
20110031961 - Endotracheal tube sensor: Various devices and methods for locating an object using magnetic fields are provided. In one embodiment, a device is provided having a housing with an array of sensors that can measure a magnetic field of an object and calculate a three dimensional location of the object based upon the measured... Agent: Nutter Mcclennen & Fish LLP
20110031965 - Magnetic sensor: A magnetic sensor includes a first detection unit and a second detection unit. The first detection unit calculates a first detection angle which is a detected value of a first angle that a direction of an external magnetic field in a first position forms with respect to a first direction.... Agent: Oliff & Berridge, PLC
20110031964 - Magnetic sensor for an elevating motor: A magnetic sensor for an elevating motor, and more particularly to a magnetic sensor whose magnetic induction elements are sealed within a magnetically non-permeable minor sleeve. Meanwhile, a signal transmission line is extended therefrom. In addition, the minor sleeve and the magnetic induction elements are disposed within a gear box... Agent: Rosenberg, Klein & Lee
20110031966 - Non-contact type transducer having multi-loop coil for plate member: A non-contact type transducer having a multi-loop coil that is used to perform a modal test or a nondestructive inspection on a plate member without contacting the plate member is disclosed. The transducer includes a multi-loop coil having two or more closed loop portions and disposed above and separate from... Agent: Jae Y. Park
20110031967 - Nondestructive inspection apparatus using squid magnetic sensor: The nondestructive inspection apparatus using the SQUID magnetic sensor comprises: a magnet for horizontal magnetization 4, the magnet applying a magnetic field to a specimen in the longitudinal direction of the specimen 3′; an inspection unit on which a specimen 3 is set, the specimen 3 being horizontally magnetized in... Agent: Bacon & Thomas, PLLC
20110031968 - Three axis field monitor: The gauss meter devices of the present invention are small, low power 3 axis field monitor board which detects DC to slow varying magnetic fields. The unit is designed to be embedded into a system which may be sensitive to magnetic fields and needs to continuously measure the magnitude of... Agent: Kelley Drye & Warren LLP
20110031969 - Atomic magnetometer and method of sensing magnetic fields: A magnetometer and method of use is presently disclosed. The magnetometer has at least one sensor void of extraneous metallic components, electrical contacts and electrically conducting pathways. The sensor contains an active material vapor, such as an alkali vapor, that alters at least one measurable parameter of light passing therethrough,... Agent: Steve Witters, PLLC
20110031971 - Contrast agent-free mr angiography with ssfp sequences: In a method to generate an MR angiography image of an examination region of a subject without the use of contrast agent, a first MR image of the examination region is acquired with a first imaging sequence in which a gradient-induced phase development for unmoved and moved spins is essentially... Agent: Schiff Hardin, LLP Patent Department
20110031970 - Magnetic resonance imaging apparatus: The present invention provides a vertical magnetic field MRI apparatus which is capable of speeding up imaging for taking an image of any cross section of a wide area such as a total body, while suppressing increase of the number of channels and maintaining high sensitivity in a deep portion... Agent: Antonelli, Terry, Stout & Kraus, LLP
20110031972 - Method and system of determining an electrical property of a formation fluid: Determining an electrical property of a formation fluid. At least some of the illustrative embodiments are methods comprising drawing formation fluids into a tool within a borehole, applying a swept frequency electric field to the formation fluids by way of a first winding, inducing a current flow in a second... Agent: Conley Rose, P.C. David A. Rose
20110031973 - Geophysical measurement device for natural soil resource exploration in aquatic environment: A geophysical measurement device is provided for exploration of natural resources of the floor in an aquatic domain. The device includes a frame designed to rest in a stable manner on the floor of the aquatic environment, at least one buoyancy caisson resting on the frame, measurement instruments. The measurement... Agent: Westman Champlin & Kelly, P.A.
20110031974 - Method and system to measure series-connected cell voltages using a flying capacitor: A method and system for measuring voltage of individual cells connected in series includes a pair of busses connectable to the cells and a flying capacitor connectable to the busses. The capacitor stores the charge of one of the cells such that an analog-to-digital converter (ADC) connected to the capacitor... Agent: Ice Miller LLP
20110031975 - Battery-driven power tool and battery pack therefor: A battery pack includes a chargeable battery, a battery voltage detecting section, and a determining section. The battery voltage detecting section is configured to detect a battery voltage output from the rechargeable battery. The determining section is configured to determine a voltage level status of the rechargeable battery based on... Agent: Townsend And Townsend And Crew, LLP
20110031976 - Voltage measuring apparatus for assembled battery: A voltage measuring apparatus measures an output voltage of an assembled battery in which a plurality of unit cells are connected in series and are divided into a plurality of blocks. The apparatus includes: a block voltage detection section which detects a voltage of at least one of the plurality... Agent: Sughrue-265550
20110031977 - System and method for locating line faults in a medium voltage network: This invention relates to a method and system for locating line faults in a medium voltage network (3). Heretofore, the known methods and systems provided relatively limited resolution of fault location. Typically, the fault location information was limited to a distance from the substation (5). In complex medium voltage networks... Agent: Holland & Knight LLP
20110031978 - Apparatus and method for recognizing an error in a power bridge circuit: An apparatus and a method for recognizing an error in a power bridge circuit containing a load, a high-side branch and a low-side branch. Accordingly, a first switched current source is connected to the load and to a diagnosis connection for a high-potential of a diagnosis voltage, a second switched... Agent: Lerner Greenberg Stemer LLP
20110031979 - Ignition system open secondary detection: This document discusses, among other things, a system and method for detecting an open secondary condition in a secondary coil of an ignition coil using a control signal received from a control input of a switch configured to control the flow of current to a primary coil of the ignition... Agent: Schwegman, Lundberg & Woessner, P.A.
20110031980 - System for monitoring a transformer: This invention concerns a system for monitoring a transformer which comprises multiple terminals. The system includes multiple measuring devices and a transformer monitoring device. Each measuring device is arranged adjacently to a terminal of the transformer. Each measuring device includes a housing, a processing unit, a terminal to connect the... Agent: Workman Nydegger 1000 Eagle Gate Tower
20110031981 - Valuation method of dielectric breakdown lifetime of gate insulating film, valuation device of dielectric breakdown lifetime of gate insulating film and program for evaluating dielectric breakdown lifetime of gate insulating film: A valuation method of a dielectric breakdown lifetime of a gate insulating film for evaluating the dielectric breakdown lifetime of the gate insulating film of a MOS type element includes the steps of: deciding a Weibull slope of lifetime distribution until reaching a soft breakdown of the gate insulating film... Agent: Snr Denton US LLP
20110031982 - Tamper-resistant electronic circuit and module incorporating electrically conductive nano-structures: In a further embodiment, one or more electrically conductive nano-structures are used to interconnect and reroute one or more electrical connections between one or more ICs (or dummy leads and vias) to create an “invisible” set of electrical connections on the chip or stack to obfuscate an attempt to reverse... Agent: W. Eric Boyd, Esq. Irvine Sensors Corp.
20110031983 - Organic chemical sensor comprising plasma-deposited microporous layer, and method of making and using: Applicant discloses a sensing element for sensing an organic chemical analyte, comprising a first electrode and a second electrode, and a microporous, hydrophobic, analyte-responsive dielectric material disposed at least in proximity to the first and second electrodes. The analyte-responsive dielectric material may be an amorphous random covalent network comprising a... Agent: 3m Innovative Properties Company
20110031984 - Test apparatus: Provided is a test apparatus that tests a device under test, comprising a power supply that generates power supplied to the device under test; a transmission path that transmits the power generated by the power supply to the device under test; a current measuring section that measures a digital waveform... Agent: Masao Yoshimura
20110031985 - Mechanisms for detecting tampering of an electronic device: An electronic device has a chassis, and a printed wiring board (PWB) having a hole. A fastener is installed in the hole thereby securing the PWB to the chassis. A pair of conductive traces is formed in the PWB. A cap, being an amount of conductive glue, covers a part... Agent: Apple Inc./bstz Blakely Sokoloff Taylor & Zafman LLP
20110031986 - Sub-threshold capfet sensor for sensing analyte, a method and system thereof: The present invention relates to high sensitivity chemical sensors, more particularly relates to high sensitivity chemical sensors which are capacitively coupled, FET based analyte sensors. A sub-threshold capacitively coupled Field Effect Transistor (CapFET) sensor for sensing an analyte comprises fixed dielectric placed on substrate of the CapFET and second dielectric... Agent: Dla Piper LLP (us)
20110031987 - System resistance simulating apparatus: A system resistance simulating apparatus includes a case and a resistance adjusting element arranged in the case. The resistance adjusting element includes a number of blocking strips. The blocking strips can be selectively poisoned in the case for simulating system resistance of an electronic device at different power platforms.... Agent: Altis Law Group, Inc. Attn: Steven Reiss
20110031988 - Reducing signal distortions: The invention relates to reducing signal distortions occurring when a potential is applied to an electrochemical cell. Electrochemical measurements are obtained in the presence of a specific chemical entity which is an aminoglycoside, an organic polyamine and/or a substance capable of raising the ionic strength of the sample.... Agent: Roche Diagnostics Operations Inc.
20110031989 - Control method for an induction apparatus, and induction apparatus: A method for controlling an induction apparatus having an induction coil. In one implementation the induction apparatus includes a capacitor that is connected in parallel with the induction coil to form a parallel resonant circuit, and also includes a switch connected in series with the parallel resonant circuit, between the... Agent: Berenbaum Weinshienk PC
20110031990 - Socketless integrated circuit contact connector: A socketless integrated circuit (IC) contact connector is provided with an electrically conductive support post. An electrically conductive spring has a first end connected to the post, and a second end. An electrically conductive first wire has a first end connected to the spring second end, and a second end.... Agent: Law Office Of Gerald Maliszewski
20110031991 - Probe block: A probe block mounted on a probe card is provided for achieving fine pitch probes. A probe block for a probe card of a semiconductor test device according to the present invention includes a guide member and a probe. A guide member includes pairs of upper and lower holes and... Agent: The Nath Law Group
20110031992 - Tester and semiconductor device test apparatus having the same: Provided are a tester and a semiconductor device test apparatus having the tester. The tester includes a tested head configured to transfer electronic signals to a probe card. The tester also includes a leveling unit is provided on the tester head. The leveling unit is configured to apply a load... Agent: Harness, Dickey & Pierce, P.L.C
20110031993 - Curve tracer signal conversion for integrated circuit testing: A curve tracer signal conversion device is provided. The signal conversion device has an input connected to the curve tracer base port to accept a repeating sequence of stepped base signals. The conversion device has a signal input connected to either the curve tracer collector or emitter port, typically the... Agent: Law Office Of Gerald Maliszewski02/03/2011 > patent applications in patent subcategories. patent applications/inventions, industry category
20110025293 - Structural stud finder device and method: A device for locating structural stud members beneath a surface such as a shingled roof. The device includes a support block for receiving a probe member, the probe member extending from the support block at a selected arc of curvature terminating at a point spaced apart from the support block.... Agent: Bay Area Technology Law Group PC
20110025294 - Method for analyzing electrolytic copper plating solution: Effective fillability and the uniformity electrodeposition of a copper electroplating solution is judged by determining the time-dependent potential change thereof at a cathode current density of 0.1-20 A/dm2. The potential change is determined at a working electrode rotation of 100-7500 rpm, and the fillability with the solution is judged from... Agent: Squire, Sanders & Dempsey L.L.P.
20110025295 - System and method for calibration of measurements of interacted em signals in real time: A method of calibrating a measurement of electromagnetic (EM) signals. The method comprises separating at least one reference signal component from an EM signal, delaying at least one of the EM signal and the at least one reference signal component, extracting the EM signal after an interaction with a target... Agent: Martin D. Moynihan D/b/a Prtsi, Inc.
20110025296 - High frequency circuit analyser: An analyser for measuring the response of an electronic device (DUT 206) to an RF input signal from a signal generator 240a is described. An active load pull circuit 201 is connected to the DUT 206, which receives an output signal from the DUT 206 and then feeds a modified... Agent: Mr. Christopher John Rourk Jackson Walker LLP
20110025297 - Parameter calculating apparatus and simulation apparatus: A parameter calculating apparatus includes a signal generator that generates at least two input signals which each contain different frequency components; a signal inputting unit that inputs the input signals generated by the signal generator to respective ports of a test object at the same time; a frequency component deconstructing... Agent: Squire, Sanders & Dempsey L.L.P.
20110025298 - Determining degraded insulating ability in insulation provided between two objects of an inductively operating element: A method, device and computer program product for determining the change in insulating ability of the insulation provided between two objects of an inductively operating element, where at least one of the objects is a winding. The device includes an analyzing unit, which obtains a first frequency spectrum associated with... Agent: St. Onge Steward Johnston & Reens, LLC
20110025299 - Dual-range measurement of electrical current: An electrical current measurement system. A sense impedance and a composite amplifier are in electrical communication and together define a trans-impedance circuit that presents a frequency-compensated impedance lower than the sense impedance to an input electrical current to be measured. A sense amplifier in electrical communication with the sense impedance... Agent: Agilent Technologies, Inc. In Care Of: Cpa Global
20110025300 - Electrical power quality test circuitry and method: Electrical power quality test circuitry for testing response of an electrical device to input power disturbances is provided. The test circuitry includes a power structure having a rectifier configured to convert incoming AC voltage to DC voltage on a DC bus, and a power inverter configured to convert DC voltage... Agent: Susan M. Donahue Rockwell Automation, Inc./fy
20110025301 - Detection of a load state of a half-bridge: Disclosed is a method for diagnosing a half-bridge having a first and a second switching element. The method includes providing a half-bridge that has a first and a second switching element connected in series with each other. The first and the second switching element are driven on and off cyclically,... Agent: Dicke, Billig & Czaja
20110025302 - System and method for performing power spectral density and power level measurements: A system and method for performing power spectral density (PSD) and power level measurements for measuring PSD required by 10GBaseT applications, using a single test and measurement instrument, such as a real time oscilloscope is described. That is, an oscilloscope includes processing circuitry which receives an input signal and converts... Agent: Thomas F. Lenihan Tektronix, Inc.
20110025303 - Phasor estimation during current transformer saturation: A method, device and computer program product for determining at least one property of a current (Ip) running through the primary winding of a transformer operating in saturation using an unreliable detected current (Is) running through the secondary winding of the transformer. According to the invention a first reliable extreme... Agent: St. Onge Steward Johnston & Reens, LLC
20110025304 - Current sensing devices and methods: A low-cost and high-precision current sensing device and methods for use and manufacturing. In one embodiment, the current sensing apparatus comprises a Rogowski-type coil which is manufactured in segments so as to facilitate the manufacturing process. In an exemplary embodiment, the current sensing apparatus segments comprise a number of bobbin... Agent: Gazdzinski & Associates, PC
20110025305 - Current sensing devices and methods: A low-cost and high-precision current sensing device and methods for use and manufacturing. In one embodiment, the current sensing apparatus comprises a Rogowski-type coil which is manufactured in segments so as to facilitate the manufacturing process. In an exemplary embodiment, the current sensing apparatus segments comprise a number of bobbin... Agent: Gazdzinski & Associates, PC
20110025306 - Method and apparatus for the purification and analytical evaluation of highly purified liquids: A method and apparatus for removing soluble and insoluble contaminants from highly purified and ultra-pure liquids having a bulk resistivity in excess of one megohm-centimeter by establishing laminar flow of the liquid in a cylindrical chamber through an electromagnetic field transverse to the direction of flow, to induce mobility of... Agent: Polster, Lieder, Woodruff & Lucchesi, L.c.
20110025308 - Range detection device: In a range detection device, a movable member has a magnetized portion and can move with a manual valve of a control device. A supporting member includes a plate portion having a surface opposed to the magnetized portion and a recess formed in an opposite surface of the plate portion,... Agent: Nixon & Vanderhye, PC
20110025307 - Directional speed sensing systems and methods: A directional speed sensor comprises first and second Hall-effect modules. The first Hall-effect module outputs a first current pulse for a first predetermined period when a tooth of a toothed wheel that rotates with a shaft of the vehicle passes the first Hall-effect module in a first rotation direction and... Agent: Harness Dickey & Pierce, P.L.C
20110025309 - Angle-of-rotation sensor apparatus: The angle-of-rotation sensor apparatus of the invention comprises a shaft supported rotatably about an axial center, a permanent magnet fixed to one end face of the shaft, and a magnetic field sensor device located in opposition to the permanent magnet at a constant spacing. The permanent magnet used is in... Agent: Oliff & Berridge, PLC
20110025310 - Position feedback for self bearing motor: A sensing mechanism includes a magnetic source, a magnetic flux sensor, a sensor backing on which the magnetic source and flux sensor are mounted, and a ferromagnetic target, where the magnetic source, magnetic flux sensor, and ferromagnetic target are positioned to form a magnetic circuit from the magnetic source to... Agent: Perman & Green, LLP
20110025314 - Angle detector: An angle detector includes a rotating member, a housing, a detector and an urging member. The rotating member is rotatable with a shaft inserted therethrough. The housing rotatably supports the rotating member. The detector detects a rotating angle of the rotating member with respect to the housing. The urging member... Agent: Sughrue-265550
20110025312 - Magnetic encoder and method of detecting absolute rotational position: A magnetic encoder includes a multi-pole magnetic detecting unit having a multi-pole magnet. In the multi-pole magnetic detecting unit, first and second magnetic detecting elements that output sinusoidal signals having a 90° phase difference are arranged apart from third and fourth magnetic detecting elements at a mechanical angle of 180°.... Agent: Buchanan, Ingersoll & Rooney PC
20110025311 - Magnetic rotary system for input devices: Embodiments of the present invention include a roller for an input device, where the roller's absolute angular position is measured by a magnetic encoder. A magnet is attached to the roller, possibly inside the roller so as to make the embodiment more compact. In one embodiment, the magnetization is simple... Agent: The Law Office Of Deepti Panchawagh - Jain
20110025313 - Measurement method, sensor arrangement and measurement system: In a measurement method, an array of magnetic field sensors (MS0-MS15) is provided, each emitting a sensor signal as a function of magnetic field intensity. A rotational value of a sector-wise magnetized magnetic source that is arranged movably with respect to the array is ascertained as a function of the... Agent: Cohen, Pontani, Lieberman & Pavane LLP
20110025315 - Detecting method and dielectric particles containing magnetic material employed in the detecting method: A magnetic binding substance, which is a first binding substance that specifically binds with a target substance, having magnet enveloping dielectric particles, which have magnetic particles enveloped therein and surfaces modified with functional groups that exhibit polarity within a liquid sample, attached thereto, and a labeling binding substance, which is... Agent: Sughrue Mion, PLLC
20110025316 - Eddy current probe assembly adjustable for inspecting test objects of different sizes: An eddy current probe assembly suitable for inspecting a test object with longitudinal shape, being passed through the assembly in the object's axial direction during an inspection session, the probe assembly comprising multiple probe modules being disposed in a radial plane and with the modules partially overlaying on each other... Agent: Ostrolenk Faber Gerb & Soffen
20110025317 - Mss probe for guided-wave inspection of fuel rods: The present application discloses a magnetostrictive sensor (MsS) probe for guided-wave inspection of the entire length of a fuel rod. The probe includes a waveguide adapted to be clamped to a fuel rod, and an MsS adapted to generate guided waves into the waveguide such that the guided waves propagate... Agent: Trego, Hines & Ladenheim, PLLC
20110025320 - Magnetic sensor: A magnetoresistive element includes magnetoresistive films each having an upper surface and a lower surface, and conductors combining the magnetoresistive films in series and including top electrodes and bottom electrodes. Each one of the top electrodes and corresponding one of the bottom electrodes oppose each other to sandwich corresponding one... Agent: Oliff & Berridge, PLC
20110025321 - Magnetic sensor: A magnetic sensor includes first to fourth MR elements. The first and second MR elements are connected at respective ends thereof through a first connecting portion in a central region. The third and fourth MR elements are connected at respective ends thereof through a second connecting portion that crosses the... Agent: Oliff & Berridge, PLC
20110025319 - Magnetic sensor including a bridge circuit: A magnetic sensor includes a bridge circuit with a first, a second, a third, and a fourth resistor annularly and electrically connected together in this order, and a compensation resistor. The compensation resistor is connected to a first point between the fourth resistor and the first resistor. The first to... Agent: Oliff & Berridge, PLC
20110025318 - Magnetic sensor with bridge circuit including magnetoresistance effect elements: A magnetic sensor for detecting a direction of an external magnetic field comprises: a bridge circuit configured to provide an output that changes in accordance with the direction of the external magnetic field, the bridge circuit including four resistance element sections, each of which comprises at least one magnetoresistance effect... Agent: Oliff & Berridge, PLC
20110025322 - Magneto-resistance effect element and sensor: A magneto-resistance effect element for a sensor to sense a variation in externally applied magnetism includes a pinned layer having a fixed magnetization direction, a free layer having a magnetization direction which varies in response to an external magnetic field, and an intermediate layer provided between the pinned layer and... Agent: Oliff & Berridge, PLC
20110025323 - Optical atomic magnetometer: An optical atomic magnetometers is provided operating on the principles of nonlinear magneto-optical rotation. An atomic vapor is optically pumped using linearly polarized modulated light. The vapor is then probed using a non-modulated linearly polarized light beam. The resulting modulation in polarization angle of the probe light is detected and... Agent: Knobbe Martens Olson & Bear LLP
20110025325 - Apparatus and method for acquisition and reconstruction of non-cpmg propeller sequences: An apparatus and method of MR imaging is disclosed. The apparatus and method comprises segmenting acquisition of an echo train into separate odd and even acquisition blades in k-space, wherein the odd and even acquisition blades extend orthogonally through a common reference point in a central region of k-space. A... Agent: Ziolkowski Patent Solutions Group, Sc (gems)
20110025326 - Dual-use nmr probe: An NMR probe comprising an RF resonator 48 serves in a first mode for conventional sensitivity optimized studies of abundant samples at frequency ω0, and in a second mode for independent sensitivity optimized studies of micro sample quantities at frequency ω0 through use of a removably insertable self-resonant micro-coil 50... Agent: Agilent Technologies, Inc. In Care Of: Cpa Global
20110025324 - Simultaneous relaxation time inversion: In some embodiments, apparatus and systems, as well as methods, may operate to acquire fluid signature data representing a plurality of nuclear magnetic resonance echo trains associated with fluids in a material, to simultaneously invert a plurality of relaxation time models to provide inverted results, and to determine fluid properties... Agent: Schwegman, Lundberg & Woessner, P.A.
20110025327 - Method for radiofrequency mapping in magnetic resonance imaging: A method of mapping a radio frequency magnetic field transmitted to a magnetic resonance imaging specimen. The method comprises the steps of: applying a first radio frequency pulse having a first excitation angle to the specimen and at a first time period after applying the first pulse applying one or... Agent: Patterson Thuente Christensen Pedersen, P.A.
20110025328 - Method of and apparatus for analysis of the composition of a sample by electron spin resonance (esr) spectrometry employing carrier suppression: Described is an electron spin resonance (ESR) spectrometer comprising a miniaturized radio-frequency (RF) microwave cavity resonator. The miniaturized RF microwave cavity resonator receives a carrier signal from a circulator, modulates the signal path signal, and reflects the carrier signal back to the circulator to amplify the carrier signal prior to... Agent: Cary Tope-mckay Tope-mckay & Associates
20110025331 - Body coil assembly and method for generating radio-frequency field using the body coil assembly: A body coil assembly for a magnetic resonance apparatus has a first coil and a second coil for generating a radio-frequency field in space, and a power control apparatus connected to the first coil and the second coil for controlling the transmitting power of the first coil and the second... Agent: Schiff Hardin, LLP Patent Department
20110025332 - Mri apparatus: b
20110025330 - Nuclear magnetic resonance gyroscope mechanization: One embodiment of the invention includes a nuclear magnetic resonance (NMR) gyroscope system. The system includes a gyro cell that is sealed to enclose an alkali metal vapor, a first gyromagnetic isotope, a second gyromagnetic isotope, and a third gyromagnetic isotope. The system also includes a magnetic field generator configured... Agent: Tarolli, Sundheim, Covell & Tummino L.L.P.
20110025333 - Shear mode pressure-activated driver for magnetic resonance elastography: A magnetic resonance elastography (“MRE”) driver that can produce shear waves in a subject without relying on mode conversion of longitudinal waves is disclosed. More specifically, the MRE driver includes a pneumatic driver located remotely from a magnetic resonance imaging (“MRI”) system which is operable in response to an applied... Agent: Quarles & Brady LLP
20110025329 - System and method for thermo-electric cooling of rf coils in an mr imaging system: A cooling system for reducing the thermal energy transfer from the heated spots of an RF coil assembly to a patient bore of an MRI system is disclosed. The MRI system includes a plurality of gradient coils positioned about a bore of a magnet, an RF shield formed about an... Agent: General Electric Company Global Research
20110025334 - Locating arrangement and method using boring tool and cable locating signals: An arrangement and an associated method are described in which a boring tool is moved through the ground within a given region along a path in which region a cable is buried. The boring tool and the cable transmit a boring tool locating signal and a cable locating signal, respectively.... Agent: Pritzkau Patent Group, LLC
20110025335 - Method and apparatus for galvanic multi-frequency formation resistivity imaging: A formation measurement and processing technique which reduces the effects of standoff between a resistivity tool and a borehole wall where the resistivity tool utilizes capacitive coupling between the tool and the formation to obtain resistivity data useful to generate a resistivity image of the formation. Reduction of standoff effects... Agent: Mossman, Kumar And Tyler, PC
20110025336 - Method and apparatus for well logging resistivity image tomography: A method and apparatus for evaluating an earth formation penetrated by a borehole comprises taking resistivity measurements using a plurality of resistivity arrays or pads positioned within the borehole proximal the borehole wall. In one embodiment, pads are spaced apart azimuthally around the perimeter of a tool body, each pad... Agent: Cantor Colburn LLP- Baker Hughes Incorporated
20110025337 - System and method of testing high brightness led (hbled): A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided. In one embodiment, the system includes a programmable constant power source for providing a constant power to a... Agent: Dorsey & Whitney LLP Intellectual Property Department
20110025338 - Monitoring of electroplating additives: The working electrode in the flow channel of a flow-through electrolytic detection cell is preconditioned by flowing a preconditioning electroplating solution with preconditioner species through the flow channel while applying a negative potential. Flow of liquid through the flow channel is rapidly switched from preconditioning solution to a target solution... Agent: Weaver Austin Villeneuve & Sampson LLP - Novl Attn.: Novellus Systems, Inc.
20110025339 - Magnetoresistive elelctrostatic discharge (esd) detector: A magnetoresistive electrostatic discharge (ESD) event detector includes at least one magnetoresistive device. The at least one magnetoresistive device detects an ESD event in an ESD sensitive device based on magnetoresistive properties of the at least one magnetoresistive device. The at least one magnetoresistive device comprises an ESD failure level... Agent: Hitachi C/o Wagner Blecher LLP
20110025340 - Semiconductor device analyzer and semiconductor device analysis method: A semiconductor device analyzer comprises a function of radiating a charged particle beam on a sample and displaying a detected secondary electron image according to detected secondary electron intensity. A charged particle beam is radiated according to a first radiation pattern onto a semiconductor device that is to be analyzed,... Agent: Foley And Lardner LLP Suite 500
20110025341 - Ground fault detection: A ground fault detection system detects an earth fault or ground fault in a network device. The network device may be used in a fire alarm network. The ground fault detection system includes a power device that electrically isolates the ground fault detection system. A controller sequences a series of... Agent: Gerald M. Bluhm Tyco Safety Products
20110025342 - Remote test point for electrical connector: A voltage indicating assembly for medium and high voltage systems includes a semiconductive cap configured for mounting on a test point, the test point including a test point terminal element configured to capacitively receive a voltage associated with a electrical component, where the electrical component is mounted in a first... Agent: Snyder, Clark, Lesch And Chung, LLP
20110025343 - Line testing: Embodiments related to line testing are described and depicted.... Agent: Spryip, LLC Lan
20110025344 - Holding member for use in test and method for manufacturing same: A holding member for use in a test includes a base made of silicon or glass and chips in which devices are formed is mountable thereon. Positioning members made of resist sheets are formed on the top surface of the base. A resist film is formed on the bottom surface... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.
20110025345 - Electrode system for proximity detection and hand-held device with electrode system: An electrical hand-held device is provided with improved proximity detection, which can be placed on a surface and has at least one transmission electrode, at least one reception electrode and at least one compensation electrode arranged between transmission electrode and reception electrode. The transmission electrode and the compensation electrode can... Agent: Kf Ross PC
20110025346 - Power supply noise measuring circuit and power supply noise measuring method: A power-supply noise measuring circuit includes a voltage fluctuation detecting circuit, a unit time generating circuit: a current measuring circuit, and a sampling circuit. The voltage fluctuation detecting circuit generates a detection current in accordance with a voltage fluctuation of a power supply. The unit time generating circuit generates a... Agent: Mr. Jackson Chen
20110025347 - Guided wave cutoff spectroscopy using a cylindrical measurement cell: A cylindrical waveguide (1) used for analyzing a flowing stream of corn masa (18) using a guided microwave spectroscopy (GMS) process. The waveguide (1) includes opposed spaced apart plates (2, 5) that each define a plane within the waveguide housing (3) that is parallel to the direction (47) of corn... Agent: David George Johnson
20110025348 - Impedance determination: Apparatus for use in performing impedance measurements on a subject. The apparatus includes a processing system for causing a first signal to be applied to the subject, determining an indication of a second signal measured across the subject, using the indication of the second signal to determine any imbalance and... Agent: Knobbe Martens Olson & Bear LLP
20110025349 - Inductive position detector: An inductive detector arranged to measure position along a axis comprising: a transmit winding; a receive winding; a passive circuit comprising a winding in electrical series with a capacitor; wherein: the mutual inductance between the transmit winding and the receive winding is a function of the relative displacement of the... Agent: Thorpe North & Western, LLP.
20110025350 - Method of measuring micro- and nano-scale properties: This invention is a novel methodology for precision metrology, sensing, and actuation at the micro- and nano-scale. It is well-suited for tiny technology because it leverages off the electromechanical benefits of the scale. The invention makes use of electrical measurands of micro- or nano-scale devices to measure and characterize themselves,... Agent: Jason V. Clark
20110025351 - Combined electrical and optical sensor for fluids: The present invention relates to a sensor for the detection of an analyte, comprising a fluid holder (8), an optical detection system (3, 9) for carrying out an optical detection at the fluid holder (8) and an electrical detection system (4) for measuring electric conductivity or resistance inside the fluid... Agent: Renner Otto Boisselle & Sklar, LLP
20110025352 - Touch device and control method: A touch device includes a first conductive film, a plurality of first electrodes, a first auxiliary electrode, a plurality of second electrodes, a second auxiliary electrode, and a second conductive film. The first conductive film has a first side, a second side, a first area, and a second area. The... Agent: Altis Law Group, Inc. Attn: Steven Reiss
20110025353 - Method for increasing the availability of displacement/position measuring systems on the basis of potentiometers with a slider tap: The disclosure relates to a method for increasing the availability of displacement/position measuring systems on the basis of potentiometers with a slider tap in a closed control loop, the controller of which is formed by a microcontroller which is supplied with the position of the slider via an analog/digital converter.... Agent: Buchanan, Ingersoll & Rooney PC
20110025354 - Inspection apparatus for photovoltaic devices: The present invention provides an inspection apparatus for photovoltaic devices which electrifies the photovoltaic devices in a forward direction thereof to make the photovoltaic devices emit electro-luminescence light and which has a simple-structured and cheap darkroom. The inspecting apparatus of the present invention includes a darkroom (110) provided with a... Agent: Joseph P. Farrar
20110025355 - Apparatus for adjusting differential probe: An apparatus for adjusting a differential probe includes a regulator arranged therein capable of adjusting a distance between two tips of the probe. The probe is supported on the apparatus. The apparatus includes a rotatable shaft and a rotatable disk. The rotatable shaft engages with the regulator of the probe.... Agent: Altis Law Group, Inc. Attn: Steven Reiss
20110025357 - Ic test substrate for testing various signals: The present invention provides on IC test substrate for testing various signals, a combined flexible and rigid PCB included in the structure is applicable to perform a mission including for example: stabilizing power input/output, signal transfer by a connector; general, power, and high frequency signal transmission in preserved integrity state.... Agent: Hdls Ipr Services
20110025356 - Method for making electrical test probe contacts: A method of testing an electrical component includes coupling the electrical component to at least a first probe, a second probe, and a third probe. The probes are in communication with a test control module. Furthermore, the method includes confirming that the probes are in sufficient electrical connection with the... Agent: Medtronic, Inc.
20110025358 - Probe unit: A probe unit includes: large diameter probes; a small diameter probes; a large-diameter probe holder having large hole portions which individually hold the large diameter probes, and hole portions which have diameters smaller than those of the large hole portions, communicate with the large hole portions, and receive end portions... Agent: Edwards Angell Palmer & Dodge LLP
20110025359 - Bond and probe pad distribution: An integrated circuit (IC) that includes a plurality of bond pads disposed on a surface of the IC and a plurality of probe pads disposed on the surface of the IC is provided. Each of the plurality of probe pads is in electrical communication with corresponding bond pads. The plurality... Agent: Martine Penilla & Gencarella, LLP
20110025360 - Semiconductor integrated circuit test device: A semiconductor IC test device includes: an IC tester providing first and second control signals (CS1/CS2) based on a condition for qualifying a prescaler of a sorted semiconductor IC; and a probe card connected to the IC tester and the semiconductor IC. The probe card includes: a VCO (Voltage Controlled... Agent: Young & Thompson
20110025361 - High performance probe system: A probe system for providing signal paths between an integrated circuit (IC) tester and input/output, power and ground pads on the surfaces of ICs to be tested includes a probe board assembly, a flex cable and a set of probes arranged to contact the IC's I/O pads. The probe board... Agent: N. Kenneth Burraston Kirton & Mcconkie
20110025362 - Apparatus and method for measuring phase noise/jitter in devices under test: A system for testing integrated circuit products and other devices under test (DUT) includes a DUT tester, which stimulates the devices under test and analyzes signals from the devices under test. A device interface board transports signals between the DUT tester and the devices under test. A test board is... Agent: Munck Carter/nsc
20110025363 - Method and device for detecting foreign particle in liquid crystal display panel: A method for detecting a foreign particle trapped between substrates of a liquid crystal display panel, by which a potential short caused by the particle can be made into a short with reliability, and thus it is possible to make a display defect manifest itself that is caused by the... Agent: Birch Stewart Kolasch & Birch
20110025365 - Circuit arrangement and method for testing a reset circuit: A circuit arrangement (10) for testing a reset circuit (11) comprises the reset circuit (11) and a changeover switch (14). The reset circuit comprises a voltage input (12) for feeding an input voltage (VDD) and an output (13) for providing a reset signal (POR) as a function of the input... Agent: Cohen, Pontani, Lieberman & Pavane LLP
20110025366 - Test device for testing transistor characteristics in semiconductor integrated circuit: A test device of a semiconductor integrated circuit includes: an oscillation unit including a plurality of oscillation circuits and configured to activate the respective oscillation circuits in response to a test mode signal and output a plurality of oscillation signals; a switching unit configured to extract only an activated signal... Agent: William Park & Associates Ltd.
20110025364 - Test mode signal generating device: Various embodiments of a test mode signal generating device are disclosed. The device includes first and second test mode signal generating units. The first test mode signal generating unit is configured to receive test address signals to generate a first test mode signal when a first mode conversion signal is... Agent: Echelon Law Group, PC
20110025367 - Energy feedback device for the warm-up test of a power supply: This invention relates to an energy feedback device for the warm-up test of a power supply, which includes a power supply, a current limiter, a transformer and a selector. Moreover, the power supply is a target load tested by a warm-up procedure; external input power enters the selector, and the... Agent: Rabin & Berdo, PC
20110025368 - Power source device and image forming apparatus having the same: A power source device includes a main power source for outputting a direct current voltage with a specific value; a monitoring unit connected to the main power source for comparing the direct current voltage with a reference voltage to monitor whether a malfunction occurs in the main power source; and... Agent: Kubotera & Associates, LLC
20110025369 - Method and system for testing electric automotive drive systems: Various methods and systems for testing electric automotive drive systems are provided. The methods may be implemented with components with components that are used during normal operation of the automobile, such an inverter, an electric motor, and an electronic control system. One such method includes adjusting the frequency of a... Agent: Ingrassia Fisher & Lorenz, P.C. (gm)
20110025370 - Method and system for testing yawing system for wind turbine: A system and method is provided for ground testing of a yaw system of a nacelle (3) prior to erection of a wind turbine (1). A portable transformer box (10) is provided which will allow the nacelle preparation team to operate the yaw and hydraulic systems while the nacelle is... Agent: Siemens Corporation Intellectual Property Department
20110025371 - Method for detecting a fault in an induction machine: The invention concerns a method for detecting a fault in a rotating field machine, in which current components are analysed in a flux-based, particularly rotor-flux-based, coordinate system a flux-forming current component being subjected to a frequency analysis in the flux-based, particularly rotor-flux-based, coordinate system. It is endeavoured to provide a... Agent: Mccormick, Paulding & Huber LLPPrevious industry: Electricity: power supply or regulation systems
Next industry: Electronic digital logic circuitry
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