Electricity: measuring and testing patents - Monitor Patents
FreshPatents.com Logo    FreshPatents.com icons
Monitor Keywords Patent Organizer File a Provisional Patent Browse Inventors Browse Industry Browse Agents

USPTO Class 324  |  Browse by Industry: Previous - Next | All     monitor keywords
05/2010 | Recent  |  14: Jul | Jun | May | Apr | Mar | Feb | Jan | 13: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | 12: Dec | Nov | Oct | Sep | Aug | July | June | May | April | Mar | Feb | Jan | 11: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | 10: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan |  | 09: Dec | Nov | Oct | Sep | Aug | Jl | Jn | May | Apr | Mar | Fb | Jn |  | 2008 | 2007 |

Electricity: measuring and testing May archived by USPTO category 05/10

Below are recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application.
05/27/2010 > patent applications in patent subcategories. archived by USPTO category

20100127691 - Two pole circuit breaker voltage monitoring integration: An apparatus for monitoring line voltage in a circuit breaker includes a controller, a neutral input for receiving a neutral voltage, a first input for receiving a first alternating current (AC) line voltage that periodically changes polarity with respect to the neutral voltage, and a second input for receiving a... Agent: Schneider Electric / Square D Company Legal Dept. - I.p. Group (np)

20100127692 - Mems based kelvin probe for material state characterization: A device and method for monitoring the material health of a structure, providing a miniaturized MEMS Kelvin probe within a housing, wherein the Kelvin probe comprises a conductive plate formed of a stable metal and positioned substantially parallel to the structure; a piezoelectric vibrator for vibrating the conductive plate; and... Agent: Hayes Soloway P.C.

20100127695 - Inductive sensors: An inductive sensor is operable for detecting a relative position of, or movement between, a member and at least one inductor. An electrical parameter associated with the inductor is caused to change as a result of a change of inductive coupling in response to a change in relative position of... Agent: Gottlieb Rackman & Reisman PC

20100127694 - System and method for sensing the periodic position of an object: A system and method for sensing the periodic position of one or more objects, such as rotating blades of a turbine. The system includes a passive eddy current sensing unit having one or more magnets and first and second cores around which first and second coils are wound, respectively, which... Agent: Hartman And Hartman, P.C.

20100127693 - Transmission shift rail position sensor: The invention relates to a shift rail position sensing system. There is a need for a rapid and accurate shift rail position sensing system. In a transmission shift mechanism shifts are performed by axially moving a shift rail which is slidable in a rail bore in a housing. A rail... Agent: Deere & Company

20100127696 - Magnetoresistance sensors for position and orientation determination: A magnetoresistance sensor for use in a position and orientation tracking system includes an insulating substrate, a pattern of a metal material and/or a semiconductor material deposited on a surface of the insulating substrate, and a bias magnet material deposited over the alternating pattern of a metal material and a... Agent: Peter Vogel Ge Healthcare

20100127697 - Linear position sensor with anti-rotation device: An anti-rotation device or assembly for preventing the rotation of a magnet in a linear position sensor and eliminating the risk of undesired magnetic field measurements and incorrect sensor signal outputs. In one embodiment, the anti-rotation device is an anti-rotation plate which is fixed to the housing of the linear... Agent: Daniel J. Deneufbourg, Esq. Cts Corporation

20100127698 - Magnetostrictive stress sensor: A magnetostrictive stress sensor (11, 12, 13, 14, 15, 16) includes: a magnetic member {20, (107, 108, 109, 110, 111, 112)} having a magnetostriction; a permanent magnet (30, 35, 113) adjacent to the magnetic member; a magnetic sensor (40, 104A, 104B) for detecting a leak magnetic flux on a side... Agent: Foley And Lardner LLP Suite 500

20100127699 - System and method for inspection of parts with complex geometries: An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured... Agent: General Electric Company Global Research

20100127700 - Magnetic sensor circuit: A magnetic sensor circuit includes: a Hall element; a comparator circuit for comparing a Hall voltage corresponding to a magnetic flux passing through the Hall element with a threshold voltage; an output logic determination circuit for determining output logic of the magnetic sensor circuit based on an output signal from... Agent: Brinks Hofer Gilson & Lione/seiko Instruments Inc.

20100127701 - Method and system for fluid characterization of a reservoir: A method for determining fluids in a formation. The method includes obtaining open hole measurements for a borehole in the formation; identifying points in the borehole from which to obtain pressure measurements using the open hole measurements; obtaining pressure measurements at the identified points in the borehole; applying an excess... Agent: Schlumberger Information Solutions

20100127704 - Method of visualizing segmented mr images: A segmented MR image is provided by measuring a number of Magnetic Resonance Imaging parameters on an absolute scale. For example T1 relaxation, T2 relaxation and Proton Density PD can be measured on an absolute scale. The absolute values are then compared with known values for at least one type... Agent: Potomac Patent Group PLLC

20100127702 - System for adjusting a magnetic field for mr and other use: An MR magnetic field inhomogeneity compensation system acquires multiple MR data sets representing luminance intensity values of individual image elements comprising corresponding multiple different image versions of at least a portion of a first imaging slice of patient anatomy including fat and water components. The compensation system employs the multiple... Agent: Siemens Corporation Intellectual Property Department

20100127703 - Tailored radiofrequency pulses for uniform saturation in magnetic resonance imaging: Embodiments of the present disclosure are directed to systems and methods for providing tailored RF pulse trains, based on estimated B0 and B1 profiles, for uniform saturation for MRI techniques. The tailored pulse trains are optimized to minimize residual longitudinal magnetization in target tissue. The B0 and B1 profiles can... Agent: Mcdermott Will & Emery LLP

20100127705 - Method and apparatus for magnetic induction tomography: A method and an apparatus for magnetic induction tomography, in which an object with inhomogeneous passive electrical properties is exposed to an alternating magnetic field by excitation coils located at different positions, from which receiver coils located at different positions pick up AC signals which contain information concerning the electrical... Agent: Ratnerprestia

20100127706 - Substrate for organic electroluminescent element, and organic electroluminescent element: To attain the object, the invention provides a substrate for an organic electroluminescent element comprising a base material, an electrode layer formed in a pattern on the base material, and a photocatalyst containing layer formed to cover the electrode layer and contains a photocatalyst and a binder so as to... Agent: Ladas & Parry LLP

20100127707 - Wearable magnetic resonator for mri resolution improvement, and application device including the same: Magnetic resonance imaging (MRI) devices detect a magnetic field having a particular frequency induced by hydrogen nuclei included in a human body and convert the detected magnetic field into two- or three-dimensional images, thereby visualizing the internal structure of the human body without causing any harm to the human body.... Agent: Ampacc Law Group

20100127708 - Resistivity logging with reduced dip artifacts: Systems and methods are disclosed for reducing boundary-related artifacts in logs taken from resistivity logging tools. Such tools often exhibit “horns” at boundaries between formation beds having different resistivities. A boundary indicator signal serves to identify the location of these boundaries. When derived from an azimuthally-sensitive resistivity tool, the bed... Agent: Krueger Iselin LLP (1391)

20100127709 - Method for electrical investigation of a borehole: A method used in electrical investigation of geological formations surrounding a borehole comprising: determining S1 a grid of iso-parameter lines GR in a two-dimensional plane, the parameter being an electrical parameter characterizing the geological formation, injecting in a localized manner a survey current is into a selected zone SZ of... Agent: Schlumberger Oilfield Services

20100127710 - Fuel cell system: A fuel cell system is configured to have: a voltage superimposing unit that superimposes a predetermined AC signal on an output voltage of a fuel cell; a unit that detects an output voltage value of a battery device, the output voltage value varying as the fuel cell output voltage value... Agent: Kenyon & Kenyon LLP

20100127711 - Testing apparatus for testing electronic system with 4-wires resistive touch panel and the method therefor: The invention relates to a testing apparatus for 4-wires resistive touch panel of an electronic system. The testing apparatus comprises a voltage control unit, a signal control unit, a first electronic unit, a second electronic unit, a connecting unit and a determining unit. The determining unit is used for determined... Agent: Bacon & Thomas, PLLC

20100127712 - Electronic component tester: The electronic component tester includes: a socket configured to supply power to connection terminals for operating an electronic component; an electronic component mount member on which the electronic component is to be mounted; and a temperature adjusting member which is configured to come into contact with the electronic component mount... Agent: Mcdermott Will & Emery LLP

20100127713 - Testing apparatus for testing electronic system with 5-wire resistive touch panel and the method therefor: The invention relates to a testing apparatus for testing a 5-wire resistive touch panel of an electronic system. The testing apparatus comprises a voltage control unit, a signal control unit, an electronic unit and a determining unit. The electronic unit is used for generating at least one output signal corresponding... Agent: Bacon & Thomas, PLLC

20100127714 - Test system for flicker noise: A flicker noise test system includes a guarded signal path and an unguarded signal path selectively connectable to respective terminals of a device under test. The selected signal path is connectable a terminal without disconnecting cables or changing probes.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel, LLP

20100127715 - Semiconductor physical quantity sensor and control device using the same: A highly reliable semiconductor physical quantity sensor whose performance does not change much over time is provided. In the semiconductor physical quantity sensor, movable electrodes which can be displaced by applying a physical quantity are initially displaced using an electrostatic force, and the movable electrodes are used to detect the... Agent: Miles & Stockbridge PC

20100127716 - Radio-frequency ion channel probe: A patch-clamp system employs a high-frequency characterization of cell wall membranes. Changes in the frequency response of a tank circuit incorporating the cell wall membrane impedance provides highly sensitive and highly time-resolved measurements of ion channel activity.... Agent: Wisconsin Alumni Research Foundation

20100127717 - System and method for determining touch positions based on passively-induced position-dependent electrical charges: Systems and methods determine the position of a touch on a surface of a device, such as a touch-sensitive device, by using passively-induced position-dependent electrical charges. In such a method, the position of a touching implement is determined on the sensing surface of a device. The method includes charging the... Agent: 3m Innovative Properties Company

20100127718 - Electro-mechanical fluid sensor: A sensor system includes a sensor and a control module. The sensor includes an electrically actuated moving member. The sensor is in fluid communication with a reservoir of a separator that separates a first fluid from a fuel. The control module selectively causes current to be supplied to the sensor... Agent: Harness Dickey & Pierce, P.L.C

20100127720 - Current measuring circuit: A first resistor, a second resistor, a transistor, and a third resistor connected in series between a ground potential and an output terminal of a power circuit are provided. In addition, a current-detecting resistor is inserted in series between a high-voltage site and an output terminal of a power circuit... Agent: Mr. Jackson Chen

20100127719 - Electromigration testing and evaluation apparatus and methods: The present invention relates to electromigration testing and evaluation methods and apparatus for a device under test with an interconnect structure. The method comprises forcing the occurrence of a step resistance-increase of the interconnect structure due to electromigration in the first layer and subsequently subjecting the interconnect structure to at... Agent: Nxp, B.v. Nxp Intellectual Property & Licensing

20100127722 - Cis circuit test probe card: A CIS test probe card with an optic assembly is disclosed. At least one embodiment relates to the optic assembly being located close to the CIS test probe card to collimate a light before it is projected through the CIS test probe card to the wafer. At least one embodiment... Agent: Stout, Uxa, Buyan & Mullins LLP

20100127721 - Test probe structure: The present disclosure provides a method for testing an integrated circuit having a load impedance. The method includes generating a first test signal having a first frequency and a second test signal having a second frequency, wherein the second frequency is greater than the first frequency, transmitting the first test... Agent: Haynes And Boone, LLPIPSection

20100127724 - Anisotropic conductive connector, probe member and wafer inspection system: Provided is an anisotropic conductive connector and a prove member, each of which ensures that all of the conductive parts exhibit uniform conductivity when a pressing force is applied, even when the inspection target wafer has a large area and total number of inspection target electrodes of integrated circuits is... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.

20100127726 - Fixing apparatus for a probe card: A fixing apparatus for fixing a probe card to a holder includes a screw fixed to the holder and binding the probe card onto the holder in a vertical direction, a first bearing member intervening between a head of the screw and the probe card and allowing expansion and contraction... Agent: Greenblum & Bernstein, P.L.C

20100127723 - Probe point: A system and method for reliably probing an internal node from the backside of an integrated circuit are disclosed herein. In accordance with at least some embodiments, an integrated circuit includes a device that outputs a signal, and a probe structure. The probe structure includes a transistor having each terminal... Agent: Texas Instruments Incorporated

20100127725 - Replaceable coupon for a probing apparatus: The contacts of a probing apparatus are elastically supported on a replaceable coupon and electrically interconnected with conductors on a membrane or a space transformer.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel, LLP

20100127728 - Cantilever-type micro contact probe with hinge structure: According to the present invention, allowable displacement can be increased from an excellent stress relaxation effect achieved by applying a hinge structure while adopting advantages of a dual beam cantilever-type probe that can reduce scrub. Since the hinge structure is a structure that does not receive a moment, an effect... Agent: LexyoumeIPGroup, LLC

20100127727 - Protection layers for media protection during fabrication of probe memory device: A micro-electro-mechanical system (MEMS) seek-scan probe (SSP) memory device utilizes a protective layer over the delicate media layer to protect the media during harsh processing steps that may otherwise damage the media layer. The protective layer may comprise a layer of germanium and a layer of silicon dioxide.... Agent: Intel Corporation C/o Cpa Global

20100127729 - Ic testing methods and apparatus: An integrated circuit comprises a device under test and embedded test circuitry. The embedded test circuitry comprises a plurality of process monitoring sensors (14), a threshold circuit (22) for comparing the sensor signals with a threshold window having an upper and a lower limit and a digital interface (17) for... Agent: Nxp, B.v. Nxp Intellectual Property & Licensing

05/20/2010 > patent applications in patent subcategories. archived by USPTO category

20100123453 - Advance manufacturing monitoring and diagnostic tool: The current invention relates to a monitoring and analysis device and a method for monitoring and analysis that utilizes the unintended electromagnetic emissions of electrically powered systems. The present invention monitors electrical devices by taking detailed measurements of the electromagnetic fields emitted by any component or system utilizing electricity. The... Agent: James Ray & Associates

20100123454 - Revolvable clamp meter: The clamp meter contains a revolving member configured between the meter's body member and jaw member. The revolving member is composed of a first base and a second base located on the interfacing sides of the body member and the jaw member, respectively. The first base and the second base... Agent: Leong C Lei

20100123455 - High voltage connector and method having integrated voltage measurement probe points: An electrical connector adapted for staged disassembly to test for high voltage includes a plug having an enclosed electrical terminal with a first opening exposing the terminal and a socket having another enclosed electrical terminal with an opening exposing the other terminal. The socket opening is substantially complementary to the... Agent: Quinn Law Group, PLLC

20100123456 - Method for influencing and/or detecting magnetic particles in a region of action, magnetic particles and the use of magnetic particles: A method for influencing and/or detecting magnetic particles in a region of action, magnetic particles and the use of magnetic particles is disclosed, which method comprises the steps of: —introducing magnetic particles into a region of action, —generating a magnetic selection field having a pattern in space of its magnetic... Agent: Philips Intellectual Property & Standards

20100123457 - Microparticle analysis device, micro-fluidic chip for microparticle analysis, and microparticle analysis method: A microparticle analysis device is provided and includes: a micro-fluidic chip configured to have a region into which a sample liquid containing a magnetic microparticle and a non-magnetic microparticle is introduced, and a microfluidic channel communicating with the region on a downstream side in a liquid sending direction; a magnetic... Agent: K&l Gates LLP

20100123458 - Twin vertical hall sensor: A Hall sensor comprises two separate wells and each having respective contacts provided thereover. An oppositely directed bias current is supplied via contacts. Accordingly, a differential signal can be obtained from the two output contacts. As in each well the middle contact can be precisely centred between the two outer... Agent: Townsend And Townsend And Crew, LLP

20100123459 - Small optics cell for miniature nuclear magnetic resonance gyroscope: A beamsplitter is arranged to split an incident laser beam into a pump beam and a detection beam. The pump beam passes through the beam splitter and then reflects from a pair of mirrors to a quarter waveplate into an NMR cell. After passing through the NMR cell, the pump... Agent: John H. Lynn

20100123460 - Magnetic resonance tomography method and apparatus with separation of fat and water images according to the two-point dixon method dependent on t*2 decay: In a magnetic resonance tomography method and apparatus for separation of fat and water images according to the two-point Dixon method dependent on the T*2 decay, the following steps are implemented: (S1) acquire three fat-water images, respectively corresponding to the echo times TE1, TE2, TE3 after the RF excitation pulse,... Agent: Schiff Hardin, LLP Patent Department

20100123461 - Oscillator sensor for determining a property of an earth formation: An apparatus for evaluating an earth formation, the apparatus including: a logging tool configured to be conveyed through a borehole penetrating the earth formation; a coil inductively coupled to the earth formation, the coil being disposed at the logging instrument; and a circuit coupled to the coil wherein the circuit... Agent: Cantor Colburn LLP- Baker Hughes Incorporated

20100123462 - Electromagnetic wave resistivity tool having a tilted antenna for geosteering within a desired payzone: This invention is directed to a downhole method and apparatus for simultaneously determining the horizontal resistivity, vertical resistivity, and relative dip angle for anisotropic earth formations. The present invention accomplishes this objective by using an antenna configuration in which a transmitter antenna and a receiver antenna are oriented in non-parallel... Agent: Krueger Iselin LLP (1391)

20100123463 - Battery end-point voltage detection method and battery end-point voltage detection system: Battery driven display device includes a battery, first and second comparators, non-volatile memory, controller driven by the voltage of the battery, and display device. Non-volatile memory stores the first and second reference voltages of the first and second comparators measured by using stabilized power supply. Controller detects when the first... Agent: Texas Instruments Incorporated

20100123464 - Ultra-high frequency partial discharge array sensor apparatus for high-voltage power apparatus: The ultra-high frequency partial discharge array sensor apparatus for a high-voltage power apparatus includes: a sensing unit which detects an electromagnetic wave partial discharge signal generated due to an internal defect of a high-voltage power apparatus and includes a plurality of sensors installed to detect information related to the position... Agent: The Nath Law Group

20100123465 - Automotive battery circuit fault detection: In a vehicle having an electrical system including a ground circuit that provides an operative connection from the electrical system to an electrical ground and an electric power generator driven by an engine of the vehicle, the generator arranged to selectively provide electric power to an electrical load of the... Agent: Rankin, Hill & Clark LLP

20100123466 - System and method for corner frequency compensation: A system and method for corner frequency compensation in a wireless receiver. A method comprises computing a corner frequency of a filter, and determining if the computed corner frequency is different from a desired corner frequency by less than a threshold. The method further comprises if the computed corner frequency... Agent: Texas Instruments Incorporated

20100123467 - System and method for measuring thickness of a refractory wall of a gasifier using electromagnetic energy: A system and method for measuring a thickness of a refractory wall of a gasifier using electromagnetic energy is disclosed. The system includes a waveguide with a bistatic or monostatic phased array antenna at one end. The waveguide is operably connected to a Network Analyzer that generates a pulse of... Agent: General Electric Company Global Research

20100123468 - Method and apparatus for optimizing wheatstone bridge robust in change in temperature: An apparatus for optimizing a Wheatstone bridge robust in a temperature change, the apparatus including; a voltage difference measuring unit which measures a voltage difference between a current input end and a current output end of the Wheatstone bridge, wherein the Wheatstone bridge comprises a first resistor, a second resistor,... Agent: Cantor Colburn, LLP

20100123469 - System and method for protecting circuit boards: A system and method for protecting electrical contact points on a circuit board from tampering and probing. The system includes a protective cover preventing access to electrical contact points on the circuit board. The protective cover includes: at least one nonconductive material layer, a plurality of electrical contacts coupled to... Agent: Warren A. Sklar (soer) Renner, Otto, Boisselle & Sklar, LLP

20100123473 - A test point structure for rf calibration and test of printed circuit board and method thereof: A point structure for RF calibration and testing of a PCB is provided. The point structure includes a test pad, an antenna connection pad, and a device mounting pad. The test pad is connected to a circuit unit of the PCB, and a ground pad is connected with a ground... Agent: JeffersonIPLaw, LLP

20100123471 - Digital communications test system for multiple input, multiple output (mimo) systems: A digital communications test system and method for testing a plurality of devices under test (DUTs) in which multiple sets of a single vector signal analyzer (VSA) and single vector signal generator (VSG) can be used together to perform error vector magnitude (EVM) measurements for one or more DUTs in... Agent: Vedder Price P.C.

20100123474 - Inspection apparatus and method: There are provided an inspection apparatus and method that can locally perform sample temperature regulation, so that the sample drift can be suppressed. There are included a sample stage 109 that holds a semiconductor sample 118, multiple probes 106 used to measure electrical characteristics of a semiconductor device on the... Agent: Mcdermott Will & Emery LLP

20100123472 - Probe card and test method using the same: A test method of a semiconductor device using a probe card includes the steps of performing a self-test and performing a normal-mode test. In the self-test, a quality of the semiconductor device is examined while connecting the first probe needle to the first signal terminal of the semiconductor device, and... Agent: Rabin & Berdo, PC

20100123470 - Probe with bidirectional electrostatic actuation: A probe system that has a probe body comprising at least three arms extending from a central region and a probe tip centrally located on the probe body in the central region. A substrate is proximate the probe body opposite the probe tip. A first electrode is positioned to provide... Agent: Campbell Nelson Whipps, LLC

20100123475 - Rf chip test method: An RF chip test method is disclosed. The RF chip test method includes disposing an RF chip within a chip socket, with the RF chip having at least one RF pin and at least one non-RF pin, the chip socket having conductive elements, and the conductive elements contacting the RF... Agent: Stout, Uxa, Buyan & Mullins LLP

20100123476 - Conductive contact: A conductive contact includes a first plunger 11 which is formed approximately in a needle-shape and is formed of conductive material and of which tip portion has an axisymmetric shape; a second plunger 12 which is formed approximately in a needle-shaped and is formed of conductive material, of which tip... Agent: Edwards Angell Palmer & Dodge LLP

05/13/2010 > patent applications in patent subcategories. archived by USPTO category

20100117622 - Method and apparatus for estimating the condition of a coating on an underground pipeline: Methods are provided for reducing interference from stray currents in buried pipelines/metal structures during MEIS testing or other current-sensing applications in the pipeline. Methods are also provided for measuring bulk complex electrical impedance between a buried pipe and the soil, thereby rendering an indication of the quality of the anti-corrosive... Agent: Abelman, Frayne & Schwab

20100117623 - System and method of determining maximum power point tracking for a solar power inverter: A system and method for operating a photovoltaic element at or near a maximum power point. A maximum power point tracker changes a voltage or current set point of a photovoltaic element in sequential discrete steps, measuring an output power at each step after a predetermined settling time. A slope... Agent: Perkins Coie LLP Patent-sea

20100117624 - Network-distributed oscilloscope and method of operation thereof: A system and method for achieving oscilloscope functionality over a network. In one embodiment, the system includes: (1) a core having a local memory and configured to gather samples of an external signal based on a schedule at a specified sampling rate, write the samples into the local memory and... Agent: Hitt Gaines, PC Alcatel-lucent

20100117625 - Energy usage monitor for a household appliance: An energy usage monitor for a household appliance, and a method of monitoring energy usage of a household appliance, are provided. The system and method include a system and an energy usage monitor that monitors energy usage information of the system of the household appliance. The system and method may... Agent: Bsh Home Appliances Corporation Intellectual Property Department

20100117626 - Analog and digital indicating meter: An analog and digital indicating electronic meter provides a digital readout of a measured value, and a pointer indication of the measured value on a selectable analog scale configured to match the measured value.... Agent: Mccormick, Paulding & Huber LLP

20100117627 - Measuring linear velocity: An apparatus for measuring linear velocity of a movable element relative to a stationary element includes a magnetic element fixed in relation to the stationary element. A soft-magnetic yoke is fixed in relation to the movable element to move with the movable element and is in non-contact relation with the... Agent: Fish & Richardson P.C.

20100117628 - Sensor for the determination of low (zero revolution) and fast revolutions as well as for the simultaneous determination of direction of rotation: A measurement of a lower and a higher speed of rotation is taking place via the inductive sensor. A sensor unit, which comprises a pulse generator, a transmitter side and a receiver side, is used for determining the speed of rotation, whereby the transmitter side comprises a transmitter inductor connected... Agent: Davis & Bujold, P.l.l.c.

20100117630 - Displacement sensing device: A compact sensing device capable of sensing a rotational angle and a rotational velocity, or a rectilinear moving distance and a moving velocity. A displacement sensing device that senses a rotational angle of a moving member rotation and a distance of a linear movement of the moving member, or senses... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.

20100117629 - Detecting three different open ranges in a flip device: A magnetic field sensor, such as a Hall effect sensor, and a corresponding magnetic field producing unit, such as a magnet, can be both positioned near a hinge of a hinged device, such that the magnet, in one part of the device, rotates around the Hall effect sensor, in another... Agent: The Watson Intellectual Property Group, PLC

20100117631 - Resolver: A resolver comprises an excitation coil for receiving an excitation signal and a detection coil for outputting a detection signal. The detection sine wave is changeable according to an amount of displacement of a movable element provided in the excitation coil or the detection coil. The resolver detects the amount... Agent: Oliff & Berridge, PLC

20100117633 - Angular position sensor for assembly on a rotating shaft: The angular position sensor is for assembly on a rotating shaft rotationally guided in a support structure, and includes an annular member having an inner surface socketed on the rotating shaft without relative rotation therebetween, and a housing in which a permanent magnet is inserted. A support is provided having... Agent: Ratnerprestia

20100117632 - Resolver: A resolver includes a disc-shaped rotor provided with a detection coil pattern formed in flat shape and a stator formed in flat plate shape placed to concentrically fact the rotor in an axial direction and configured such that a planar first excitation coil pattern to which a cosine wave is... Agent: Oliff & Berridge, PLC

20100117635 - Spiral magnetic field apparatus and method for pipeline inspection: A system and method are disclosed for inspecting the wall of a pipeline while traveling therethrough. The system may comprise a portion of pipe comprising a pipe wall forming a cylindrical tube defining a circumferential direction and an axial direction. The system may further include an in-line inspection tool positioned... Agent: Warren M Pate Warren M. Pate, LLC

20100117634 - Wide field id-od discriminator: A Wide Field ID-OD Discriminator for inspection of ferromagnetic pipe from the interior of the pipe. The embodiment concentrates the flux field from the full field of coverage to the sensors.... Agent: Warren M Pate Warren M. Pate, LLC

20100117636 - Method and apparatus for analyzing weld strength of friction stir spot welds: On a friction stir spot welded workpiece having a first side including a friction stir spot weld hole and an opposing smooth second side, an eddy current probe is passed over the spot weld hole from the second side, and an eddy current signal representative of a material thickness of... Agent: Cantor Colburn LLP-general Motors

20100117637 - Sensor circuit: Provided is a sensor circuit that is small in circuit scale, but is capable of temperature compensation. A reference voltage circuit (BL1) which compensates a temperature includes only a voltage divider circuit, and hence the sensor circuit is small in circuit scale. The sensor circuit is also capable of temperature... Agent: Brinks Hofer Gilson & Lione/seiko Instruments Inc.

20100117638 - Magnetic sensor and sensitivity measuring method thereof: The present invention relates to a magnetic sensor with a sensitivity measuring function and a method thereof. Magnetic sensitivity surfaces detect flux density, and a switching unit extracts magnetic field intensity information of each axis, and inputs it to a sensitivity calculating unit. The sensitivity calculating unit calculates the sensitivity... Agent: Morgan Lewis & Bockius LLP

20100117639 - Endurance testing system and method: An endurance testing system is configured to test endurance of a first detecting apparatus. The endurance testing system includes a second detecting apparatus, a movement module, a processor, and a storage module. The movement module includes a first inductive object and a second inductive object. The processor is connected to... Agent: PCe Industry, Inc. Att. Steven Reiss

20100117640 - Magnetic sensor circuit: A magnetic sensor circuit is provided in which an offset of the magnetic sensor circuit can be eliminated to detect a weak magnetic field with high precision. A reference voltage source is provided to charge an input capacitor of a comparator included in the magnetic sensor circuit to a predetermined... Agent: Brinks Hofer Gilson & Lione/seiko Instruments Inc.

20100117641 - Detection of magnetic beads using a magnetoresistive device together with ferromagnetic resonance: A method and apparatus for detecting the presence of magnetic beads is disclosed. By providing both a static magnetic field and a magnetic field that alternates in the MHz range, or beyond, the bead can be excited into FMR (ferromagnetic resonance). The appearance of the latter is then detected by... Agent: Saile Ackerman LLC

20100117642 - Sinusoidally resonant radio frequency volume coils for high field magnetic resonance applications: A radio frequency coil assembly includes an annular conductor (20, 22, 120) configured to support a sinusoidal electrical current distribution at a magnetic resonance frequency, and a radio frequency shield (30, 32, 34, 52, 60, 61, 130) shielding the annular conductor in at least one direction, the radio frequency shield... Agent: Philips Intellectual Property & Standards

20100117643 - Upconversion stage: An upconversion stage for a wireless magnetic resonance imaging system local coil array has a number of upconversion circuits. Each upconversion circuit includes a parametric amplifier, an antenna and a delay line between the amplifier and the antenna. The path length of the delay line in one upconversion circuit differs... Agent: Schiff Hardin, LLP Patent Department

20100117646 - Magnetic resonance scanner with wireless transmission of signals: A wireless magnetic resonance imaging scanner has one or more local coils, a microwave antenna array, and a local oscillator, and an upconverter. The local oscillator signal from the local oscillator is transmitted from the microwave antenna array to illuminate the local coils. The local coils generate magnetic resonance signals... Agent: Schiff Hardin, LLP Patent Department

20100117644 - Method and apparatus for acquiring magnetic resonance imaging data for dynamic studies: A method for acquiring magnetic resonance (MR) data for a three-dimensional (3D) dynamic study includes partitioning a ky-kz plane with a plurality of views into an inner region and a plurality of outer regions. The inner region includes a set of views in a central region of the ky-kz plane... Agent: Peter Vogel Ge Healthcare

20100117645 - Propeller mri with phase correction: The invention relates to a device for MRI of a body (7) placed in an examination volume. The device (1) comprises means (2) for establishing a substantially homogeneous main magnetic field in the examination volume, means (3, 4, 5) for generating switched magnetic field gradients superimposed upon the main magnetic... Agent: Philips Intellectual Property & Standards

20100117647 - Accelerated dynamic magnetic resonance imaging in the presence of motion and other time-related disruptions: Embodiments of the present invention relate to accelerated dynamic magnetic resonance imaging (MRI) and, more particularly, to imaging situations where the temporal-encoding strategy is disrupted by time-related events, such as breathing motion.... Agent: Quarles & Brady LLP

20100117648 - Magnetic resonance device comprising an asymmetrical cylindrical gradient coil and at least one asymmetrical shim-coil: A magnetic resonance apparatus has a cylindrical gradient coil with an x-gradient coil and a y-gradient coil that are asymmetrical relative to the z-direction of a coordinate system, the z-direction extending along a longitudinal direction of a patient receptacle. Shim coils are provided that generate magnetic fields to homogenize the... Agent: Schiff Hardin, LLP Patent Department

20100117649 - Magnetic resonance imaging apparatus: An apparatus including a probe unit and a control/imaging unit, the probe unit including a converter converting a sampled magnetic-resonance signal into a digital signal, a first transmitter converting the digital signal into a first-radio signal, a first receiver receiving a second-radio signal, and performing detection on the second-radio signal... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.

20100117650 - Amplifier: A two port parametric amplifier has a first port that receives an input signal to be amplified and upconverted and a second port that receives a local oscillator signal. The amplified upconverted input signal is emitted as an output at upper and lower sideband frequencies. The amplifier further has a... Agent: Schiff Hardin, LLP Patent Department

20100117652 - Bore tube assembly: A wireless magnetic resonance imaging (MRI) scanner bore tube assembly has a radio frequency (RF) antenna, a microwave antenna array and an electrical screen. The RF antenna is formed of a series of RF antenna elements, each comprising a rung. The rungs are spaced at intervals of substantially half of... Agent: Schiff Hardin, LLP Patent Department

20100117653 - Diplex filter and method to filter signals: A diplex filter is formed by two impedance-transforming filters with separate transmission frequency ranges and with separate cut-off frequency ranges and a connection node at which two series elements of the two filters are connected. These two series elements are each fashioned as a parallel oscillating circuit, each parallel oscillating... Agent: Schiff Hardin, LLP Patent Department

20100117651 - Receiver: A receiver for a wireless magnetic resonance imaging system comprises a pair of substantially identical notch filters (22, 23) each having an input and output and first and second 90 degree hybrid couplers (21, 24). The notch filters are coupled together at each input and output by the first and... Agent: Schiff Hardin, LLP Patent Department

20100117654 - Methods and apparatus for displaying an electronic rendering of a locate and/or marking operation using display layers: Locate information, marking information, and/or landmark information relating to a locate operation and/or a marking operation to detect and/or mark a presence or an absence of at least one underground facility is categorized into a plurality of display layers for electronic rendering. At least some of the display layers may... Agent: Wolf Greenfield & Sacks, P.C.

20100117655 - Tool for azimuthal resistivity measurement and bed boundary detection: Systems and methods for performing bed boundary detection and azimuthal resistivity logging with a single tool are disclosed. Some method embodiments include logging a borehole with an azimuthally-sensitive resistivity logging tool; deriving both a resistivity log and a boundary detection signal from measurements provided by said tool; and displaying at... Agent: Krueger Iselin LLP (1391)

20100117656 - Led outage detection circuit: In order to detect a defective light source, such as a LED coupled to a DC-DC converter circuit for receiving a power signal, an outage detection circuit comprises a top voltage detector coupled to the LED for detecting a voltage across the LED. The top voltage detector has an top... Agent: Philips Intellectual Property & Standards

20100117657 - Method for determining battery capacity: An electrical device is powered by a battery. The device includes transition phase determining circuitry operatively connected to the battery to determine that the battery has entered a transition phase based on the occurrence of a change in direction of current flowing through the battery. Battery capacity determining circuitry is... Agent: Jones Day (rim) - 2n

20100117658 - Testable integrated circuit and test data generation method: An integrated circuit (IC) is disclosed that comprises a circuit portion (100) having a plurality of inputs (102) and a plurality of outputs (106), the plurality of inputs being arranged to receive a test pattern in a test mode of the integrated circuit, the test pattern comprising a plurality of... Agent: Nxp, B.v. Nxp Intellectual Property & Licensing

20100117659 - Calibration and compensation for errors in position measurement: Methods and systems method for sensing a position of an object in a body include positioning a probe in the body, making measurements of mapping electrical currents passing between at least a first electrode on the probe and a plurality of second electrodes on a surface of the body, calibrating... Agent: Philip S. Johnson Johnson & Johnson

20100117660 - Cable for a capacitive proximity sensor: A capacitive proximity sensor assembly comprises: (i) a capacitive proximity sensor (1) for mounting to a body for sensing external objects, the sensor comprising a dielectric substrate (2) having front and rear major surfaces which, in use of the sensor, face respectively outward from and towards the body; a sensor... Agent: 3m Innovative Properties Company

20100117661 - Grid touch position determination: A capacitive sensing circuit which has a uniformly resistive sense plate, a charge transfer measurement circuit connected to one side of the sense plate and a dummy load which is only connected to another side of the sense plate during some measurement cycles.... Agent: Jones, Tullar & Cooper, P.C.

20100117662 - Method and device for processing a measured signal for recording a property of a toner mark: In a method or system for processing a measurement signal to detect a property of a toner mark, the toner mark is generated with aid of an image generation device. The toner mark is detected with aid of a measurement unit in that sample values determined by the measurement unit... Agent: Schiff Hardin, LLP Patent Department

20100117663 - Method of controlling a shape memory alloy actuator utilizing resistance change: A method of controlling a shape memory alloy actuator utilizing the change in resistance exhibited by the actuator over an actuation cycle, and more preferably, a derivative thereof, to identify at least one event, and generating a response based upon the event.... Agent: Slj, LLC

20100117664 - Grid sensor: A grid sensor significantly reduces the complexity of a production process. The cost for installing and running the grid sensor are significantly reduced and the service life, pressure and heat resistance of the grid sensor can be significantly increased over previous grid sensors. Channels, which are wider than the diameter... Agent: Lerner Greenberg Stemer LLP

20100117665 - Process for monitoring the curing reaction of a polymeric matrix of a composite material: g

20100117666 - Method and system for internal standardization of assays: Internal standard concentration is normalized as an independent parameter through measuring a buffer conductance in a system with characterized reagents and in a defined assay device. The conductivity of a fresh internal standard solution is measured whether in isolation or as part of a system that is subject to a... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20100117667 - Method and means for optical detection of internal-node signals in an integrated circuit device: A continuous-wave laser beam is chopped to form pulses synchronized to the activity of a device under testing and/or to acquisition electronics. Chopping the laser beam to reduce the duty-cycle of the beam allows the power delivered to the device during the actual probing time interval to be increased while... Agent: David Lewis

20100117668 - Test board and test system: The test board includes at least one first interface configured to electrically connect the test board with a test controller, at least one second interface configured to electrically connect the test board with at least one electrical device to be tested, respectively. The test board further includes at least one... Agent: Eschweiler & Associates LLC

20100117670 - Connecting unit to test semiconductor chips and apparatus to test semiconductor chips having the same: A connecting unit to test a semiconductor chip and an apparatus to test the semiconductor chip having the same include a plurality of connectors, on which a semiconductor chip having a certain pattern of electrical connection terminals, having a plurality of holes, cables configured to electrically connect the electrical connection... Agent: Stanzione & Kim, LLP

20100117669 - Probe card actuator: A probe card test interface is described. The probe card test interface includes a first frame configured to support a probe card circuit card assembly (CCA). The probe card CCA is configured to contact a semiconductor wafer with one or more test probes. The first frame is also configured to... Agent: Qualcomm Incorporated

20100117672 - Probe tip to device pad alignment in obscured view probing applications: A method of performing alignment of an array of probe tips of a probe card to corresponding contact pads for wafer probing applications by performing the steps of: obtaining a backside image of the wafer; overlaying a mapping of the contact pads over the backside image; selecting contact pads as... Agent: Nixon Peabody, LLP

20100117671 - Simulated mounting structure for testing electrical devices: A testing apparatus or test jig is configured to accept a electrical device for testing prior to final assembly. In one example, a pair of conductive conveying belts compliantly engage a partially assembled photovoltaic (PV) module by its sides, and electrodes engage orthogonal sides of the module. The test apparatus... Agent: The Nath Law Group

20100117673 - Interface structure of wafer test equipment: A wafer test equipment system includes a performance board connected to a tester head of a tester. A universal block printed circuit board is positioned on the performance board, directly connecting a plurality of normal signal lines to a probe card and dividing each of a plurality of power signal... Agent: Mills & Onello LLP

20100117674 - Systems and methods for charged device model electrostatic discharge testing: Systems and methods for testing an integrated circuit device using transmission path and charged device model electrostatic discharge testing. The method includes measuring a electrostatic discharge signal from a charged transmission path of the system, measuring a electrostatic discharge signal from the charged transmission path of the system and a... Agent: Wood, Herron & Evans, LLP

20100117675 - Liquid crystal display device and analysis device including the same: In order to provide a liquid crystal display device which can detect a defective indication due to short circuit which occurs between a common electrode and a counter electrode by a conductive impurity enters into a liquid crystal display panel, and an analysis device including the same, a blood glucose... Agent: GlobalIPCounselors, LLP

20100117676 - Method and system for non-destructive determination of dielectric breakdown voltage in a semiconductor wafer: According to one exemplary embodiment, a non-destructive method for determining a breakdown voltage of a dielectric layer on a semiconductor substrate includes injecting a test current in increasing ramp steps into the dielectric layer. The method further includes measuring a test voltage across the dielectric layer at each increasing ramp... Agent: Farjami & Farjami LLP

20100117677 - Method to synchronize two different pulse generators: This invention generates two pulses for semiconductor testing that have leading edges coordinated in time by synchronizing the pulses from two different styles of pulse generators (pulsers). One pulser uses spark discharge pulse generation and the other pulser is a typical solid state pulser. The spark discharge pulser has high... Agent: Evan Grund

20100117678 - Semiconductor device and method of testing the same: A semiconductor device is formed on a semiconductor wafer. The semiconductor device has: an output buffer configured to externally output an output signal received from an internal circuit; an input buffer configured to output an input signal externally received to the internal circuit; a switch configured to control electrical connection... Agent: Mcginn Intellectual Property Law Group, PLLC

20100117679 - Test apparatus, system, and method having a magnetic feature: A test apparatus involving a rotor coupled to a drive shaft, wherein the drive shaft is mechanically coupled to a drive system; a stator coupled to a brush holder; a brush held by the brush holder, wherein the brush is held in contact with the rotor; a housing for supporting... Agent: Fitch Even Tabin & Flannery

05/06/2010 > patent applications in patent subcategories. archived by USPTO category

20100109635 - Measurement method for determining moisture content: In a method for capacitive determination of the moisture content in a gas to be measured, it is provided that a capacitive element (2) brought into contact with a gas to be measured is operated in the manner of an RC oscillator (5) in charge-discharge cycles (27, 28), with the... Agent: Hoffmann & Baron, LLP

20100109636 - Measuring apparatus and method for detecting moisture at a measurement voltage input of the measuring apparatus: A measuring apparatus having a measurement voltage input with at least one input contact for an input voltage of a measuring element and a method for detecting moisture on the measurement voltage input of such a measuring apparatus are provided, wherein the measuring apparatus includes a supplemental voltage source, which... Agent: Bacon & Thomas, PLLC

20100109637 - Sensor system and method: A sensor system for detecting the presence of one or more target substances reacting with one or more target recognition element types for producing an electrical charge detectable by a differential pair of field effect transistors that provide increased sensitivity by minimizing common mode effects on the differential pair. The... Agent: Morrison & Foerster LLP

20100109638 - System and method for providing amplitude spectroscopy of a multilevel quantum system: A system and method for providing amplitude spectroscopy is provided. Generally, the system contains a generator for providing a waveform for analysis of a multilevel quantum system, wherein the generator has the capability of changing amplitude of the waveform provided and driving the multilevel quantum system at a fixed frequency... Agent: Sheehan Phinney Bass & Green, PA C/o Peter Nieves

20100109639 - Frequency spectrum analysis system and method: A frequency spectrum analysis system includes a control platform, a driver, and a controlled system. The control platform includes a first transmission device. The driver includes a second transmission device, a signal source, and a data logger. The first transmission device is connected to the second transmission device. The second... Agent: PCe Industry, Inc. Att. Steven Reiss

20100109640 - Charge sampling device and method: The invention relates to the sampling of temporally changing amounts of charge (102) by receiving varying amounts of charge (102) varying as a function of time, transforming the varying amounts of charge received into a linear distribution pattern, sampling the linear distribution pattern at a plurality of discretely spaced sampling... Agent: Morriss Obryant Compagni, P.C.

20100109641 - Semiconductor device, internal circuit control signal measurement circuit, and delay time measurement method: In a semiconductor device manufactured in a semiconductor chip, an internal circuit generates first and second internal circuit control signals which are produced as a delay time measurement start signal and a delay time measurement stop signal, respectively, which are sent to a delay time measurement circuit. The delay time... Agent: Mcginn Intellectual Property Law Group, PLLC

20100109642 - Optical voltage transformer: An optical voltage transformer is connected with an external electric device and includes a primary electrode to which a measured voltage is applied by the external electric device, a first secondary electrode provided oppositely to the primary electrode, an insulation layer provided between the primary and first secondary electrodes and... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.

20100109643 - Current sensor: The present invention is a current sensor architecture using a planar coils in close proximity to a current conductor to detect the rate of change of current in the conductor (and hence, by using an integrator, to recover the AC current). The current sensor is optimised to reject uniform external... Agent: Sean Liam Kelleher KelleherIPPLLC

20100109644 - Medical treatment device with tool recognition: A medical treatment device, such as a dental treatment device, is described, the device including a drive unit for driving multiple different tools that are detachably connectable to the treatment device and a tool recognition device for recognizing whether a tool is connected to the treatment device and/or which of... Agent: Klarquist Sparkman, LLP

20100109646 - Method and apparatus for amplifying a signal and test device using same: An amplifier circuit is used in a multimeter to amplify signals applied between a pair of test terminals. A voltage applied to one of the test terminals is amplified by a first operational amplifier configured as a voltage follower. An output of the first operational amplifier is applied to an... Agent: Dorsey & Whitney LLP Intellectual Property Department

20100109645 - Nanostructure sensors: Embodiments feature a sensor including a nanostructure and methods for manufacturing the same. In some embodiments, a sensor includes a substrate, a first electrode disposed on the substrate, and a second electrode disposed on the substrate. The second electrode is spaced apart from the first electrode and surrounding the first... Agent: Fish & Richardson P.C.

20100109647 - Physical quantity sensing apparatus having an internal circuit, a filter circuit having resistors, power supply, grounding, and output pads, with the length and width of wiring between the output or power supply pad and the internal circuit set so that th: In a semiconductor device, in particular a physical quantity sensing apparatus, the length and the width of the wiring connecting a sensor internal circuit and an output or power supply pad are adjusted so that the total parasitic resistance components R1 parasitic on the wiring and the sum Rf of... Agent: Rossi, Kimms & Mcdowell LLP.

20100109649 - Apparatus for determining and/or monitoring a process variable: An apparatus for determining and/or monitoring at least one process variable. The apparatus includes: at least one energy input, via which the apparatus receives energy for operation of the apparatus. The invention includes features that: at least one measuring unit is provided, which measures energy applied to the energy input;... Agent: Bacon & Thomas, PLLC

20100109648 - Current sensing inductor and a circuit thereof: An inductor design having a detection winding which is magnetically coupled to the existing winding and its induction voltage is used to cancel that of the existing winding. Having the induction voltage cancelled, the voltage across the existing winding represents a resistive voltage drop of the existing winding current. The... Agent: Rosenberg, Klein & Lee

20100109650 - Apparatus for electronically measuring or distributing electrical energy: An integral electronic revenue meter system diagnostics package including a microprocessor, storage memory, preselect series of system diagnostic tests, and recording any results which exceed predefined programmable thresholds, and display means for displaying error and/or diagnostic messages identifying selected diagnostic data and/or errors discovered in the meter tests during a... Agent: Dority & Manning, P.A.

20100109651 - Device for conductivity measurement in a controlled environment and method thereof: The invention provides a device for measuring the conductivity in a controlled environment and method thereof. The device comprises (i) a sample comprising a first material such as protonic conductor, (ii) an environmental medium comprising a controlled level of a second material such as water vapor, and (iii) a separator... Agent: Fay Sharpe LLP

20100109652 - Apparatus for correcting position of a user tray and a test handler: The present invention relates to an apparatus for correcting position of a user tray including at least one first position member and at least one second position member that determine position of a user tray, a plate where the user tray is received, a first correcting unit that moves the... Agent: Ked & Associates, LLP

20100109653 - Sensor device for and a method of sensing particles: A sensor device (50) for sensing particles (15) of a sample, the sensor device (50) comprising a sensing unit (11, 20) adapted for sensing a detection signal indicative of the presence of the particles (15), a viscosity measurement unit (11, 17, 20) adapted for measuring the viscosity of the sample,... Agent: Philips Intellectual Property & Standards

20100109654 - Method for manufacturing a mounting element with an angle sensor: The method is used for manufacturing a mounting element with an angle sensor for an actuator in an internal combustion engine. The mounting element has electrical connections (20) and contains an angle sensor (24, 26, 30). To simplify manufacture, electronic components (24, 26, 30) are electrically connected directly to a... Agent: Cohen, Pontani, Lieberman & Pavane LLP

20100109655 - Rotation angle detector: A rotation angle detector for detecting rotation angle of a rotator to be measured is provided. The detector includes a magnet which is fixed to the rotator to be measured and is rotated with the rotator to be measured and plural magnetic detection means respectively arranged at a prescribed angle,... Agent: Turocy & Watson, LLP

20100109656 - Magnetic tunnel junction and memristor apparatus: A magnetic memory device includes a magnetic tunnel junction having a free magnetic layer having a magnetization orientation that is switchable between a high resistance state magnetization orientation and a low resistance state magnetization orientation and a memristor solid state element electrically coupled to the magnetic tunnel junction. The memristor... Agent: Campbell Nelson Whipps, LLC

20100109657 - Gmr biosensor with aligned magnetic field: A planar array of GMR or TMR sensor elements with planar free and pinned layers is used as the basis of a sensor for detecting the presence of small magnetized particles. In particular, the sensor is used for detecting the presence of magnetized particles bonded to biological molecules that are... Agent: Stephen B. Ackerman

20100109658 - Device with separate emission/reception functions for making eddy current tests on an electrically conducting part: A device with separate emission/reception functions for making eddy current tests on an electrically conducting part comprising several emission rows (1-4) composed of emission windings (55), and several reception columns (a-h) each composed of reception windings (56) connected in series in at least one series, in which the emission windings... Agent: Nixon Peabody LLP

20100109659 - Surface flaw detection and verification on metal bars: An inspection system for detecting flaws on a moving metal (e.g., steel) bar coordinates the operation of an eddy current testing (ECT)-based flaw detection apparatus and an imaging-based flaw detection apparatus. The ECT-based flaw detection apparatus and the imaging-based flaw detection apparatus are disposed along a movement path in a... Agent: Dykema Gossett PLLC

20100109660 - Tunable random bit generator with magnetic tunnel junction: A random number generator device that utilizes a magnetic tunnel junction. An AC current source is in electrical connection to the magnetic tunnel junction to provide an AC current having an amplitude and a frequency through the free layer of the magnetic tunnel junction, the AC current configured to switch... Agent: Campbell Nelson Whipps, LLC

20100109661 - Hall-effect switch circuit allowing low voltage operation: A hall-effect switching system comprises a hall-effect switch, a voltage comparison module, and a resistance bypass module. The voltage comparison module compares a supply voltage and a reference voltage. The resistance bypass module selectively adjusts a voltage output to the hall-effect switch based on the comparison.... Agent: Harness Dickey & Pierce, P.L.C

20100109662 - Arrangement and method for influencing and/or detecting magnetic particles in a region of action: An arrangement and a method for influencing and/or detecting magnetic particles in a region of action is disclosed, which arrangement comprises: selection means for generating a magnetic selection field having a pattern in space of its magnetic field strength such that a first sub-zone having a low magnetic field strength... Agent: Philips Intellectual Property & Standards

20100109663 - Magnetic device: A magnetic device comprises a magnetic element, a first magnetic field applying means, and a second magnetic field applying means. The first and second magnetic field applying means are disposed on mutually opposite sides of the magnetic element. The magnetic element is, for example, an element in which a soft... Agent: Sughrue Mion, PLLC

20100109664 - Method for estimating the formation productivity from nuclear magnetic resonance measurements: A method for estimating fluid productivity of a subsurface rock formation from within a wellbore drilled therethrough includes measuring a nuclear magnetic resonance property of the formation at a plurality of lateral depths therein. The measured nuclear magnetic resonance property is used to estimate the fluid productivity.... Agent: Schlumberger Oilfield Services

20100109665 - Fast velocity measurements using balanced ssfp magnetic resonance imaging: Referenceless techniques for flow imaging are described that exploit a refocusing property of balanced steady state free precession (“SSFP”) magnetic resonance imaging (“MRI”), and achieve up to approximately a 50% reduction in total scan time. With the echo time set to one half of the sequence repetition time (TE=TR/2), non-flow-related... Agent: Mcdermott Will & Emery LLP

20100109669 - Low field squid mri devices, components and methods: Low field SQUID MRI devices, components and methods are disclosed. They include a portable low field (SQUID)-based MRI instrument and a portable low field SQUID-based MRI system to be operated under a bed where a subject is adapted to be located. Also disclosed is a method of distributing wires on... Agent: Steinfl & Bruno

20100109668 - Medical examination or treatment facility, in particular a magnetic resonance facility: A medical examination or treatment facility is proposed. The medical examination or treatment facility, which is a magnetic resonance facility in particular, comprises a main unit and a support structure that can be fastened to the main unit, the support structure being a profile frame structure. Because of their particular... Agent: Siemens Corporation Intellectual Property Department

20100109666 - Nmr-mas probehead with integral transport conduit for an mas-rotor: A nuclear magnetic resonance (NMR) magic angle spinning (MAS) probe head (1; 61) for measuring a measuring substance in an MAS rotor (21a-21c), comprises a bottom box (3) and a tube (2) mounted to the bottom box (3) and projecting from the bottom box, wherein, in the area of the... Agent: Kohler Schmid Moebus

20100109667 - Transverse electromagnetic radio-frequency coil: A transverse-electromagnetic (TEM) radio-frequency(RF) coil array (100) for examining a subject in a magnetic resonance system is disclosed, wherein the TEM RF coil array comprises two or more parallel loop elements (101a, 102a) configured to transmit RF signals independently to the subject (103). The two or more parallel loop elements... Agent: Philips Intellectual Property & Standards

20100109670 - Detection system suitable for identifying and tracking buried pipes or other bodies buried in the ground or embedded in civil engineering works: The invention relates to a detection system suitable for identifying and tracking buried pipes or other bodies buried the ground or embedded in civil engineering works, which comprises: a coding device affixed to or integrated into the objects (1), taking the form of a succession of thin coding elements (3),... Agent: Cantor Colburn, LLP

20100109671 - Method for acquiring controlled source electromagnetic survey data to assist in attenuating correlated noise: A method for acquiring transient electromagnetic survey signals includes applying a transient electric current to an electromagnetic transmitter disposed above a portion of the Earth's subsurface to be surveyed. Electromagnetic signals are detected at spaced apart locations above the portion of the subsurface in response to an electromagnetic field induced... Agent: E. Eugene Thigpen

20100109672 - Transient em for geosteering and lwd/wireline formation evaluation: A transmitter on an instrument is used to induce currents in an earth formation when it is turned on or off. A Fourier transform is applied to transient measurements made in the receivers. A multifrequency focusing of the transformed data is used for applications like determination of a distance to... Agent: Madan & Sriram, P.C.

20100109673 - Heat-resistant lens kit: A heat-resistant lens kit configured within the pogo tower of the wafer tester is disclosed. The heat-resistant lens kit has two parallel lenses and a main body with a through hole. The main body and two parallel lenses enclose a vacuum room within the through hole.... Agent: Sinorica, LLC

20100109676 - Analog circuit testing and test pattern generation: Test vectors for structural testing of an analog circuit are selected by first selecting an initial set of test input vectors for the analog circuit. A set of faults is selected, comprising faults that each correspond to a respective node in the analog circuit and corresponding fault voltage value for... Agent: Nxp, B.v. Nxp Intellectual Property & Licensing

20100109674 - Device, test apparatus and test method: Provided is a test apparatus that tests a device under test. The device under test includes: a circuit under test; and a switching section that that connects an internal terminal being tested, from among one or more internal terminals of the circuit under test, to external terminals connected to the... Agent: Jianq Chyun Intellectual Property Office

20100109675 - Method to digitize analog signals in a system utilizing dynamic analog test multiplexer for diagnostics: An integrated circuit capable of monitoring analog voltages inside an analog block is presented. The integrated circuit has an analog test multiplexer (mux) whose inputs are connected to analog voltages of interest inside an analog block. The analog test multiplexer directs a selected analog voltage from an analog block to... Agent: Martine Penilla & Gencarella, LLP

20100109677 - Circuit arrangement comprising a fuse and a method for determining a condition of a fuse: A circuit arrangement including a fuse comprises a fuse path (SP) which is coupled to a control input (SE) and comprises the fuse (RS) and a first charge reservoir (C1) serially connected thereto for providing a first charge state (L1), a reference path (RP) which is coupled to the control... Agent: Cohen, Pontani, Lieberman & Pavane LLP

20100109678 - Controlling two jtag tap controllers with one set of jtag pins: Various apparatuses, methods and systems for dual JTAG controllers with shared pins disclosed herein. For example, some embodiments provide a boundary scan apparatus having a first boundary scan circuit with a first plurality of control inputs, a second boundary scan circuit with a second plurality of control inputs, and a... Agent: Texas Instruments Incorporated

20100109679 - Method for determining the current return path integrity in an electric device connected or connectable to a further device: A method for determining current return path integrity in an electric device with a plurality of signal lines and supply lines. A library with at least one reference signal pattern of a near end crosstalk signal on a defined signal line arising from an input signal on another defined signal... Agent: Heslin Rothenberg Farley & Mesiti P.C.

20100109680 - Electromagnetic scanning imager: In one aspect, the present invention provides an imager, preferably portable, that includes a source of electromagnetic radiation capable of generating radiation with one or more frequencies in a range of about 1 GHz to about 2000 GHz. An optical system that is optically coupled to the source focuses radiation... Agent: Nutter Mcclennen & Fish LLP

20100109681 - Plasma insensitive height sensing: A method for determining a distance between a first piece and a second piece includes measuring, at the first or second piece, an AC signal, and determining the distance based on the measured AC signal. A system for determining a distance between a first piece and a second piece includes... Agent: Proskauer Rose LLP

20100109682 - Substrate characterization device and method for characterizing a substrate: A substrate characterization device is provided which includes a sensor module and a processor. The sensor module has at least one contact surface configured to contact the substrate, the sensor module configured to measure a variance of capacitance in at least two dimensions of the substrate, the sensor module further... Agent: Xerox Corporation (cdfs)

20100109683 - Semiconductor device: A semiconductor device has an antifuse element and a measurement unit. The antifuse element stores information according to whether the antifuse element is in the broken or unbroken state. The measurement unit determines a resistance value related to the resistance value of the broken antifuse element.... Agent: Morrison & Foerster LLP

20100109684 - Fluid detecting mattress cover and monitoring system: Apparatus, systems, and methods are described for detecting moisture on a mattress cover. Conductive leads affixed to the mattress cover are configured in loop patterns, and adjacent conductive loops are positioned equidistant to one another to provide equal sensitivity to moisture at any location on the mattress cover. A quick-release... Agent: Hope Baldauff Hartman, LLC Michael J. Baldauff, Jr.

20100109685 - Wireless moisture monitoring device and method: A wireless moisture monitoring device that measures the dielectric constant of a material to provide an indication of the water or moisture content of a material. The wireless moisture monitoring device can monitor the moisture level of a material constantly, periodically, or the device can be configured to provide an... Agent: Workman Nydegger 1000 Eagle Gate Tower

20100109686 - Metal wear detection apparatus and method employing microfluidic electronic device: An apparatus and a method for detection of wear particles in a lubricant are disclosed. The apparatus includes a microfluidic device including a microchannel sized for a lubricant containing wear particles to pass therethrough and first and second electrodes extending into the microchannel. A detection system is coupled with the... Agent: Fay Sharpe LLP

20100109687 - Impedance measurement system and method: The impedance of ionic solutions may be determined using a bridge circuit where the ionic solution comprises a leg of the bridge circuit and a reference impedance characterized by a reference time constant comprises a second leg of the bridge circuit. The bridge is driven by a switched DC voltage... Agent: Bose Corporation C/o Donna Griffiths

20100109692 - Apparatus, system and method for testing electronic elements: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower... Agent: Mayer & Williams PC

20100109691 - Low profile probe having improved mechanical scrub and reduced contact inductance: A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is... Agent: Peacock Myers, P.C.

20100109688 - Printing of redistribution traces on electronic component: A probe substrate for use in testing semiconductor devices can include a base substrate that can have first electrical terminals at a first pitch. One or more redistribution layers on the base substrate can include droplets of a conductive material that form redistribution traces extending from the first terminals to... Agent: N. Kenneth Burraston Kirton & Mcconkie

20100109689 - Probe card assembly and test probes therein: Discloses are a probe card assembly and test probes used therein. The probe card assembly includes a main body, a probe base disposed in a central portion of the main body and a plurality of test probes connected between the probe base and the main body. Each of the test... Agent: Sinorica, LLC

20100109690 - Tcp-type semiconductor device and method of testing thereof: A TCP-type semiconductor device has: a base film; a semiconductor chip mounted on the base film; and a plurality of leads formed on the base film. Each lead has: a first terminal portion including a first end that is one end of the each lead and connected to the semiconductor... Agent: Mcginn Intellectual Property Law Group, PLLC

20100109693 - Auto probe device and method of testing liquid crystal panel using the same: The auto probe device includes a printed circuit board having a shorting bar, a flexible printed circuit board having a plurality of connection patterns electrically connected to the shorting bar of the printed circuit board, and a plurality of contact pins contacting the plurality of pads formed in a non-display... Agent: Mckenna Long & Aldridge LLP

20100109694 - Universal current leakage testing adapter: In one embodiment, a universal current leakage measurement device is disclosed. A universal current leakage testing adapter has the ability to couple with at least two differently sized or shaped probe connectors. The universal current leakage testing adapter is configured to couple with differently sized or shaped probe connectors by... Agent: Stoel Rives LLP - Slc

20100109695 - Chuck for holding a device under test: A chuck for a probe station.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel, LLP

20100109696 - Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is... Agent: Sonnenschein Nath & Rosenthal LLP

20100109697 - Probe card, needles of probe card, and method of manufacturing the needles of probe card: A probe card for use in the test of the semiconductor devices, a needle of the probe card, and a method of manufacturing the needle are disclosed. This invention is to strengthen the beam portion of the needle, to reduce the contact area between a probing portion and a pad... Agent: JeffersonIPLaw, LLP

20100109698 - Probe assembly arrangement: A probe array is assembled on a probe card platform. Each of the probes in the probe array has a probe base that includes a gripping handle. The probe bases have two or more different shapes. The probe bases of different shapes are interleaved such that any two adjacent probes... Agent: Blakely Sokoloff Taylor & Zafman LLP

20100109699 - Methods, apparatus and articles of manufacture for testing a plurality of singulated die: In one embodiment, a method for testing a plurality of singulated semiconductor die involves 1) placing each of the singulated semiconductor die on a surface of a die carrier, 2) mating an array of electrical contactors with the plurality of singulated semiconductor die, and then 3) performing electrical tests on... Agent: Gregory W. Osterloth Holland & Hart, LLP

20100109700 - On-chip detection of power supply vulnerabilities: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative... Agent: Heslin Rothenberg Farley & Mesiti P.C.

Previous industry: Electricity: power supply or regulation systems
Next industry: Electronic digital logic circuitry


RSS FEED for 20140710: xml
Integrate FreshPatents.com into your RSS reader/aggregator or website to track weekly updates.
For more info, read this article.


Thank you for viewing Electricity: measuring and testing patents on the FreshPatents.com website. These are patent applications which have been filed in the United States. There are a variety ways to browse Electricity: measuring and testing patent applications on our website including browsing by date, agent, inventor, and industry. If you are interested in receiving occasional emails regarding Electricity: measuring and testing patents we recommend signing up for free keyword monitoring by email.

Results in 0.94775 seconds