|Electricity: measuring and testing patents - Monitor Patents|
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Electricity: measuring and testing February patent applications/inventions, industry category 02/10Below are recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application. 02/25/2010 > patent applications in patent subcategories. patent applications/inventions, industry category
20100045259 - Method for measuring a current, in particular by means of a grounding apparatus: The subject matter of the invention is a method of measuring a grounding current of a photovoltaic power system incorporating a photovoltaic inverter, a measurement current being led through two shunts (Rs1, Rs2) disposed at different points, the measurement current being a current that may flow alternatively at two different... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c
20100045260 - Method and device for digital triggering of a measurement signal having a superimposed noise signal: A method for digital triggering of a digital recording of a digitized measurement signal having a superimposed noise signal. The method includes generating from the digitized measurement signal a digital triggering signal for the digital triggering of the digital recording of the measurement signal, and performing band-limitation of the noise... Agent: Ditthavong Mori & Steiner, P.C.
20100045261 - Design for testability technique for phase detectors used in digital feedback delay locked loops: A circuit for testing phase detectors in a delay locked loop is provided. The circuit uses a second phase detector arranged to receive the signals entering a first phase detector. Particularly, the circuit is routed such that a signal entering the D input of the first phase detector is inputted... Agent: Cool Patent, P.C. C/o Cpa Global
20100045262 - Apparatus and method of zeroing a test instrument: An apparatus and method for shorting together a plurality of electrical leads. The apparatus includes an electrical conductor that extends between first and second ends and a first surface and a second surface facing away from the first surface. The electrical conductor includes a central bight that is disposed between... Agent: Perkins Coie LLP Patent-sea
20100045263 - Current measurement device with electrical isolation, electronic trip unit, and circuit breaker comprising one such device: The current measurement device with electrical isolation comprises an input signal connected to an electrical shunt, an output of an output signal, and signal transfer means with electrical isolation receiving the input signal and supplying said output signal. The transfer means comprise at least one signal transformer having at least... Agent: Steptoe & Johnson LLP
20100045266 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center
20100045265 - Method and device for forming a temporary electrical contact to a solar cell: In a method and devices for forming a temporary electrical contact to a solar cell for testing purposes, probes form a contact to the electrode terminals of a solar cell held by a sample holder. The probes are held by a probe holder and exhibit an elastic, electrically conductive contact... Agent: Heslin Rothenberg Farley & Mesiti PC
20100045264 - Probe for temporarily electrically contacting a solar cell: A probe for temporarily electrically contacting a solar cell for testing purposes, has at least one elastic, electrically conductive contact element for producing the electrical contact, at least one reference sensor for indicating a distance of the contact element to an external reference surface using an electrical signal of the... Agent: Heslin Rothenberg Farley & Mesiti PC
20100045267 - Magnetic and/or electric label assisted detection system and method: A detection system (100) is described for detecting analytes in a fluid sample. The detection system (100) comprises a transporting means (6) for transporting magnetic and/or electric labels (5) after interaction between the sample fluid and the reagents towards a detection receptacle (1). The detection receptacle (1) is initially substantially... Agent: Philips Intellectual Property & Standards
20100045270 - High-resolution magnetic encoder: A high-resolution magnetic encoder system includes a magnetic resistive sensor, a fixed suspension, and a mechanism. The magnetic resistive sensor is mounted to the fixed suspension above a magnetic medium having at least one magnetic track. The fixed suspension is attached to the mechanism, such as a housing, a substrate,... Agent: Law Offices Of Michael Dryja (san Jose)
20100045269 - Methods and apparatus to detect location and orientation in an inductive system: A base station (e.g., a central device including a transducer assembly of one or more orthogonal transducers) transmits a magnetic field at a known power level and direction. The magnetic field signal includes data information transmitted from the base station to a movable remote station. The remote station includes a... Agent: JeffersonIPLaw, LLP
20100045272 - Position detector: A position detector includes a magnet which moves in cooperation with movement of a detection subject. A magnetic sensor detects magnetic flux generated from the magnet and outputs first and second detection signals from two output terminals. A signal processing circuit differentially amplifies the detection signals to generate an analog... Agent: Patterson, Thuente, Skaar & Christensen, P.A.
20100045271 - Rotation angle detector: To provide a rotation angle detector, which is characterized in that the rotation angle detector is for detecting a rotation angle of a measurable rotation body, by which it becomes able to measure the rotation angle of the measurable rotation body with an accuracy as higher even in a case... Agent: Turocy & Watson, LLP
20100045273 - Measuring vibrations of a turbo-machine rotor blade with the help of an induction sensor in high temperature: A method is disclosed of measuring vibrations on turbo-machine rotary turbine blades utilizing an induction sensor at high temperatures. A set of magnets produces a magnetic field which results in a measurement signal generated in the sensor's coil which then can be interpreted to measure the vibrations.... Agent: Westman Champlin & Kelly, P.A.
20100045268 - Comparator circuit having latching behavior and digital output sensors therefrom: A digital output sensor (110) includes a sensing structure (105) including at least one sensing element. The sensing structure (105) outputs a differential sensing signal (106, 107). An integrated circuit (100) includes a substrate (101) including signal conditioning circuitry for conditioning the sensing signal (106, 107). The signal conditioning circuitry... Agent: Honeywell International Inc. Patent Services
20100045274 - Silicon mems resonator devices and methods: Embodiments of the invention are related to MEMS devices and methods. In one embodiment, a MEMS device includes a resonator element comprising a magnetic portion having a fixed magnetization, and at least one sensor element comprising a magnetoresistive portion, wherein a magnetization and a resistivity of the magnetoresistive portion vary... Agent: Patterson, Thuente, Skaar & Christensen, P.A.
20100045275 - Rotary or linear position sensor having avariable magnet profile: The invention relates to a magnetic angular or linear sensor including at least one permanent magnet defined in a cylindrical (r, Q & z) or Cartesian (x, y & z) coordinate system and at least two magneto-sensitive elements, in which the magnet can move in relation to said two magneto-sensitive... Agent: Arent Fox LLP
20100045276 - Eddy current inspection system: An innovative method is provided for assessing structural integrity of a sample. The method comprises: capturing a signal indicative of magnetic flux density caused by an Eddy current flowing in the sample; extracting an envelope of the captured signal using a demodulation scheme; sampling the envelope at a frequency that... Agent: Harness, Dickey & Pierce, P.L.C
20100045277 - Magnetic field characterization of stresses and properties in materials: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors... Agent: Hamilton, Brook, Smith & Reynolds, P.C.
20100045278 - Probe for analysis of a collection of rods or tubes: The invention concerns a probe for analysis of a collection of rods or tubes comprising an elongated casing which bears, at a first end, at least one first magnetometer and, at a position sufficiently remote from the magnetometer, a permanent magnet, the north-south axis of which is perpendicular to the... Agent: Schwegman, Lundberg & Woessner, P.A.
20100045280 - Arrangement and method for influencing and/or detecting magnetic particles in a region of action, coil arrangement: An arrangement and a method for influencing and/or detecting magnetic particles in a region of action is disclosed, which arrangement comprises: selection means for generating a magnetic selection field having a pattern in space of its magnetic field strength such that a first sub-zone having a low magnetic field strength... Agent: Philips Intellectual Property & Standards
20100045279 - Device and method for detecting an anomaly in an assembly of a first and a second object: A method for detecting an anomaly in an assembly of a first and a second object of electrically conductive material forming an intermediate space between them, comprising providing a device (5) comprising a transmitter/receiver arrangement (7) for generating an electromagnetic field, and for measuring a signal indicative of an eddy... Agent: Shell Oil Company
20100045281 - Arrangement and method for detecting and/or locating a magnetic material in a region of action, use of an arrangement in the examination of buildings: An arrangement and a method for detecting and/or locating magnetic material, and the use of an arrangement in the examination of buildings is disclosed, which arrangement comprises: selection means for generating a magnetic selection field having a pattern in space of its magnetic field strength such that a first sub-zone... Agent: Philips Intellectual Property & Standards
20100045282 - Thin film lamination, thin film magnetic sensor using the thin film lamination and method for manufacturing the thin film lamination: Relating to a thin film lamination and a thin film magnetic sensor using the thin film lamination and a method for manufacturing the thin film lamination that realizes a thin film conducting layer having high electron mobility and sheet resistance as an InAsSb operating layer. A thin film lamination is... Agent: Birch Stewart Kolasch & Birch
20100045283 - Magnetic sensor and magnetic sensor device: A magnetic sensor arranged on a second line forming an angle of 45° at a switched position for switching a state being set up on a first line that projects displacement of center of magnetic field generating means generating a magnetic field.... Agent: Roberts Mlotkowski Safran & Cole, P.C. Intellectual Property Department
20100045284 - Carbon nanotube actuator: An actuator capable of flagellar motion is disclosed. The actuator comprises a carbon nanotube (CNT) rope and at least one metal/CNT composite part formed on the CNT rope.... Agent: Knobbe Martens Olson & Bear LLP
20100045286 - Current detection apparatus: The invention concerns a current detection apparatus for detection of a current flowing through a conductor (1) by detection of a magnetic field surrounding the conductor. The current detection apparatus includes at least one sensor element (3) provided on a carrier portion (4) for detection of the magnetic field, and... Agent: Ware Fressola Van Der Sluys & Adolphson, LLP
20100045285 - Magnetic sensor element and manufacturing method thereof: A magnetic sensor element has a hard magnetic film 2 formed on a nonmagnetic substrate 1, an insulating layer 3 covering the top of the hard magnetic film 2, and a soft magnetic film 4 formed on the insulating layer 3. The magnetization direction of the hard magnetic film 2... Agent: Sughrue Mion, PLLC
20100045287 - Sensor: The invention relates to a sensor arrangement (1) comprising a magnet (2), a magnetic field sensor (3) and a twistable or rotatable rod (4), characterized in that the magnet (2) is arranged below the magnetic field sensor (3) and the twistable or rotatable rod (4) is arranged above the magnetic... Agent: Nxp, B.v. Nxp Intellectual Property & Licensing
20100045288 - Magnetic resonance method and apparatus for generating different weighted images from the same magnetic resonance echo signal evolution: In a method and an apparatus for acquiring magnetic resonance data, a region of a subject is exposed to a spin echo magnetic resonance pulse sequence that includes a refocusing radio-frequency pulse flip angle evolution that causes magnetic resonance signals to be emitted from the region with a signal evolution... Agent: Schiff Hardin, LLP Patent Department
20100045289 - System and method for intracorporeal elastography: A system and method for intracorporeal elastography include an intra-luminal vibratory member configured to be positioned within a lumen of an imaging subject and configured to impart mechanical energy into tissue of the lumen. In a preferred embodiment, an external piezoelectric energy source is included and coupled to the vibratory... Agent: Ziolkowski Patent Solutions Group, Sc (zps)
20100045292 - Magnetic resonance angiography method and apparatus: In a magnetic resonance apparatus and method for generation of a magnetic resonance angiogram of a subphrenic vessel structure, a subject containing the subphrenic vessel structure is positioned in an imaging volume of a magnetic resonance apparatus, and MR measurement data are acquired using a radial k-space scanning scheme. An... Agent: Schiff Hardin, LLP Patent Department
20100045291 - Magnetic resonance apparatus and method to acquire and display calibration images: In a method and magnetic resonance apparatus to acquire and present calibration images of a periodically moving organ with the use of magnetic resonance technology, calibration images are acquired by acquiring measurement data for multiple calibration images during one continuous period of the organ movement, the multiple calibration images differing... Agent: Schiff Hardin, LLP Patent Department
20100045290 - Magnetic resonance imaging apparatus and method for controlling the same: A magnetic resonance imaging apparatus includes a coil control device that controls a transmission coil and a gradient coil such that (A) a longitudinal magnetization adjustment pulse sequence for setting a longitudinal magnetization component positive in value of a first body fluid smaller than a longitudinal magnetization component positive in... Agent: Patrick W. Rasche (20459) Armstrong Teasdale LLP
20100045293 - Superconductive magnetic device, magnetic resonance imaging apparatus and magnetic field inhomogeneity compensation method: The magnetic field homogeneity adjusting device (20) is characterized by comprising a magnetic field distribution measuring unit (21) for measuring the magnetic field distribution in the magnetic field space, a temperature variation calculating unit (22) for calculating the temperature variation of the ferromagnetic bodies needed to improve the homogeneity of... Agent: Cooper & Dunham, LLP
20100045294 - Locating arrangement and method using boring tool and cable locating signals: An arrangement and an associated method are described in which a boring tool is moved through the ground within a given region along a path in which region a cable is buried. The boring tool and the cable transmit a boring tool locating signal and a cable locating signal, respectively.... Agent: Pritzkau Patent Group, LLC
20100045295 - Method and apparatus for determining the nature of submarine reservoirs: A method of producing a survey report on the presence and nature of a subterranean strata: includes simultaneously towing an EM field transmitter and a seismic source behind a vessel, towing at least one streamer behind the vessel, said streamer or streamers having EM field receivers for measuring an electric... Agent: Patterson, Thuente, Skaar & Christensen, P.A.
20100045296 - Cable system for marine data acquisition: Systems and methods for marine surveying of strata beneath a seafloor are disclosed, including, in certain aspects, systems employing one or more cables with a plurality of opto-electrical detector electrodes and an electrical wire with a fixed reference potential imposed thereon along the cable length. In a multi-cable system, the... Agent: E. Eugene Thigpen Petroleum Geo-services, Inc.
20100045297 - Device for measuring the current of a discharge lamp: A device for measuring the current of a discharge lamp, includes a first current measuring device, which converts the current flowing through the lamp into a signal; a second current measuring device, through which a current flows which has the same amplitude response and phase response as the displacement current... Agent: Viering, Jentschura & Partner - Osr
20100045298 - Method and apparatus for determining deterioration of secondary battery, and power supply system therewith: A method for detecting SOC and SOH of a storage battery includes: calculating an SOC value of the storage battery with use of an SOC calculation unit based on a measured voltage value or a measured current value of the storage battery and calculating an SOH value of the storage... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.
20100045299 - Battery voltage monitoring system: A battery voltage monitoring system monitors voltage of an arrangement of more than two batteries (U1, U2, U3, U4, U5) in series. The system comprises a voltage divider comprises a first (R1, R2, R3, R4) and second resistive element (R5, R6, R7, R8) arranged parallel to at least a part... Agent: Philips Intellectual Property & Standards
20100045301 - Apparatus and method for monitoring high voltage capacitors: State of a high voltage capacitor is monitored to detect partial discharge within the capacitor and approaching end-of-life of the capacitor. Partial discharge may be detected through an increased capacitance of the capacitor, and the resulting increase in the alternating current through the capacitor. Partial discharge may also be detected... Agent: Maxwell Technologies, Inc. (oplf)
20100045302 - Power over ethernet system having hazard detection circuitry to detect potentially hazardous cable conditions: An apparatus includes power circuitry and hazard detection circuitry connectible to a multi-conductor cable. The power circuitry transfers electrical power from a power-sourcing equipment (PSE) to a powered device (PD) over the multi-conductor cable. The hazard detection circuitry senses an electrical characteristic of the multi-conductor cable and generates a detection... Agent: Bainwood Huang & Associates LLC
20100045303 - Loop resistance tester control system: A method is present for remotely controlling, monitoring, and analyzing loop resistance in a vehicle. A loop resistance test unit is positioned in the vehicle. A set of commands is sent from a monitoring unit to the loop resistance test unit over a wireless communications interface. Measurements are generated with... Agent: Duke W. Yee
20100045305 - Method and system for partial discharge testing of an insulation component: The disclosure relates to a method for partial discharge testing of an insulation component, wherein at least one X-ray pulse is applied to the insulation component, an AC voltage is applied to the insulation component and the partial discharge induced by the at least one X-ray pulse is measured, wherein... Agent: Buchanan, Ingersoll & Rooney PC
20100045304 - Method of testing insulation property of wafer-level chip scale package and teg pattern used in the method: A test element group (TEG) pattern formed of two wiring patterns alternately disposed in a swirl configuration is used for testing an insulation property of a wafer-level chip scale package (WL-CSP) having a micro wiring such as an inductor element. The insulation property of the WL-CSP can be monitored with... Agent: Kazunao Kubotera Kubotera & Associates, LLC
20100045306 - Microwave resonator and microwave microscope including the same: Provided is a microwave resonator of a both-end-opened type including: a first end and a second end; a conductor line; a ground conductor; and a measurement unit for measuring an amount associated with a complex dielectric constant of a sample while the measurement unit is brought close to the sample,... Agent: Bruce L. Adams, Esq
20100045307 - Method for testing h-bridge: A method for measuring an on resistance in an H-bridge including first and second transistors connected to a first output terminal, third and fourth transistors connected to a second output terminal, and a measurement switch connected to the first and second output terminals. The first and third transistors are connected... Agent: Freescale Semiconductor, Inc. Law Department
20100045308 - Method for the early detection of damage to a capacitive sensor, and capacitive sensor featuring a diagnostic function: A system for the early detection of damage to and/or soiling of a capacitive sensor includes determining a degree by which the sensor is damaged and/or soiled by measuring a physical property of an electrode, e.g. the resistance of the electrode, or optically by means of the coefficient of reflection... Agent: Muirhead And Saturnelli, LLC
20100045309 - Method and apparatus for measuring fluid properties, including ph: A fluid sensor for use within the gastro-intestinal tract of a human being is disclosed. The sensor includes a sensing coil which is immersible in the sample fluid of the gastro-intestinal tract; a signal generator in electrical with the sensing coil for applying an electrical current pulse to the sensing... Agent: Philips Intellectual Property & Standards
20100045310 - System and method for measuring a capacitance and selectively activating an indicating transducer: Systems and methods for sensing capacitances that are applicable to proximity sensor devices are provided. The systems and methods provide decreased implementation costs by reducing the number of output terminals required. Specifically, the systems and methods for sensing capacitances provide the ability to selectively activate indicating transducers, such as LEDs,... Agent: Ingrassia Fisher & Lorenz, P.C. (syna)
20100045311 - Dual electrical current sourcing-piezoresistive material self-sensing (dec-pmss) system: In the two-probe case, a detector circuit to detect stress or damage in an object may include a first electrode to be positioned on the object, a second electrode to be positioned on the object, a current circuit to measure the current to the first electrode, a voltage circuit to... Agent: Wilson Daniel Swayze, Jr.
20100045312 - Shaped-seal, sealing arrangement and process sensor having such a sealing arrangement: A shaped-seal for sealing an annular gap between an outer peripheral wall and an inner peripheral wall against a medium, including: an elastic, radially clampable, annular sealing element having an annular, radially outer, sealing surface for contacting the outer peripheral wall, an annular, radially inner, sealing surface for contacting the... Agent: Bacon & Thomas, PLLC
20100045315 - Diagnostic probe assembly for printhead integrated circuitry: The invention provides for a diagnostic probe assembly for a tester which is used to diagnose printhead integrated circuits. The probe assembly includes a support assembly and a controller board mounted on the support assembly and having a processor configured to generate test signals for testing a printhead integrated circuit.... Agent: Silverbrook Research Pty Ltd
20100045317 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center
20100045318 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center
20100045316 - Method for inspecting electrostatic chucks with kelvin probe analysis: A method of inspecting an electrostatic chuck (ESC) is provided. The ESC has a dielectric support surface for a semiconductor wafer. The dielectric support surface is scanned with a Kelvin probe to obtain a surface potential map. The surface potential map is compared with a reference Kelvin probe surface potential... Agent: Buchanan, Ingersoll & Rooney PC
20100045313 - Method for testing integrated circuits mounted on a carrier: A method for testing integrated circuits mounted on a carrier includes the step of securing the carrier. The carrier is displaced into an operative position in which the integrated circuits are in physical and electrical communication with a diagnostic probe. Test signals are generated in test circuitry in electrical communication... Agent: Silverbrook Research Pty Ltd
20100045314 - Test stage for a carrier having printhead integrated circuitry thereon: This invention provides for a test stage for a printhead integrated circuit tester for testing operation of printhead integrated circuits mounted on a carrier. The test stage includes a support structure. A fixture is arranged on the support structure and is configured to receive and locate the carrier. A clamping... Agent: Silverbrook Research Pty Ltd
20100045319 - Wafer and test method thereof: A wafer and a test method thereof are provided. The invention utilizes a first group of probes to perform a high voltage stress (HVS) test on a first chip, and utilizes a second group of probes to perform a function test on a second chip, where a period of the... Agent: J C Patents
20100045320 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center
20100045321 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center
20100045324 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center
20100045322 - Probe head apparatus for testing semiconductors: One embodiment is a probe head for contacting microelectronic devices substantially lying in a test plane, the probe head including: (a) one or more substrate tiles having one or more probe tips disposed on a top surface thereof; and (b) a registration-alignment apparatus that holds the one or more substrate... Agent: Michael B. Einschlag, Esq.
20100045323 - Test head positioning system and method: An apparatus for supporting a device, comprising a base assembly, a plurality of carrier columns extending from the base unit, and a plurality of vertical support plates, each vertically movable along a respective carrier column and including a pivotal device mounting bracket. A pneumatic unit including a piston rod is... Agent: Ratnerprestia
20100045325 - Test pad design for reducing the effect of contact resistances: An integrated circuit structure includes a semiconductor wafer; integrated circuit devices in the semiconductor wafer; and a plurality of test pads on a top surface of the semiconductor wafer and connected to the integrated circuit devices. Test pads are grouped in pairs, with the test pads in a same pair... Agent: Slater & Matsil, L.L.P.
20100045328 - Circuit for detecting bonding defect in multi-bonding wire: An integrated circuit for detecting a bonding defect in a multi-bonding wire. The integrated circuit includes a plurality of pads each connectable by a bonding wire to a lead terminal. Voltage supplied to the lead terminal is applied in common to the plurality of pads. A detection circuit is operably... Agent: Freescale Semiconductor, Inc. Law Department
20100045329 - Probeless dc testing of cmos i/o circuits: A method and implementation is described by which I/O input and output circuitry of a CMOS chip are measured without the need to probe the chip. Output driver transistors are used to provide marginal voltages to test input circuits, and the output driver transistors are segmented into portions where a... Agent: Saile Ackerman LLC
20100045327 - Test circuit and test method for power switch: For on-chip testing an on-chip power switch coupled to a core logic and to a decoupling capacitance, after the power switch enters a test mode, the decoupling capacitance is pre-charged or discharged; the power switch is turned ON or OFF according to test patterns; and a voltage level at the... Agent: J C Patents
20100045326 - Thermal monitoring and management of integrated circuits: The invention, in one aspect, provides a semiconductor device (100), including transistors (105), dielectric layers (115, 120) located over the transistors (105), interconnects (122) formed within the dielectric layers (115, 120), and a test structure (130) located adjacent a hot-spot (125) of the semiconductor device (100) and configured to monitor... Agent: Hitt Gaines, PC Lsi Corporation
20100045330 - Apparatus for testing integrated circuitry: A testing apparatus for testing integrated circuits mounted in a carrier includes a support assembly. A controller is mounted in the support assembly. The controller is programmed to process test signals from the integrated circuits. A retaining assembly is arranged on the support assembly and is configured to receive and... Agent: Silverbrook Research Pty Ltd
20100045333 - Generating test benches for pre-silicon validation of retimed complex ic designs against a reference design: This invention (900) describes a method that generates and uses a test bench for verifying an electrical design module in semiconductor manufacturing against an electrical reference model containing a sub-circuit that matches the electrical design module. The invention includes providing (902) a description of an electrical design module that includes... Agent: Matthew J. Booth & Associates, PLLC C/o Cpa Global
20100045331 - Method of locating failure site on semiconductor device under test: In an analysis of a semiconductor device under test (DUT) using a Thermal Induced Voltage Alteration (TIVA) tool, the TIVA is connected to an output of the DUT and the DC component on the output is decoupled from the TIVA. The remaining AC component from the output is analyzed by... Agent: Vollrath & Associates
20100045332 - Test circuit, method, and semiconductor device: It is possible to provide a circuit and method for carrying out a parallel test using BOST (Built Out Self Test). The circuit includes first transfer circuits (11-1, 11-2, . . . ) that extract a data pattern supplied to a complete operating article chip (10) in a BOST (3)... Agent: Mr. Jackson Chen
20100045334 - Direct detect sensor for flat panel displays: Each sensor of a linear array of sensors includes, in part, a sensing electrode and an associated feedback circuit. The sensing electrodes are adapted to be brought in proximity to a flat panel having formed thereon a multitude of pixel electrodes in order to capacitively measure the voltage of the... Agent: Townsend And Townsend And Crew, LLP
20100045335 - Methods and systems for evaluating permanent magnet motors: A method for evaluating a permanent magnet motor, which includes a rotor with a plurality of magnets mounted thereon, and a stator with a plurality of windings in proximity to the rotor and coupled to an inverter, includes spinning the motor such that a voltage is induced in the windings... Agent: Ingrassia Fisher & Lorenz, P.C. (gm)02/18/2010 > patent applications in patent subcategories. patent applications/inventions, industry category
20100039094 - Physical quantity sensor: A physical quantity sensor 1 comprises a driving circuit 4 that drives a sensor element based on a reference signal; the sensor element 3 that is driven by the driving circuit 4 to convert an externally applied physical quantity to an electrical signal; and an amplifier circuit 5 that amplifies... Agent: Westerman, Hattori, Daniels & Adrian, LLP
20100039095 - Method of measuring flash memory cell current: In the present method of measuring the current of a first current source, the current thereof may be combined with either the current of a second current source, or the current of a third current source. Based on a combination of the current of the first current source and either... Agent: Spansion LLC C/o Murabito , Hao & Barnes LLP
20100039097 - Methods and apparatus for voltage sensing and reporting: Semiconductor devices comprising at least one voltage sensor for sensing an operating voltage associated with an operational circuit of the semiconductor device. The at least one voltage sensor is configured to generate a signal indicative of a state of the operating voltage. Methods of monitoring a voltage in a semiconductor... Agent: Trask Britt, P.C./ Micron Technology
20100039096 - Transmissivity monitoring of an energy transmission element: A method for monitoring transmissivity of an energy transmission element for a protective earth conductor and an electrical machine with such transmissivity monitoring are provided. For a cost-effective solution for transmissivity monitoring, the protective earth conductor of a first circuit is connected on a first side of the energy transmission... Agent: Siemens Corporation Intellectual Property Department
20100039098 - System for extraction and analysis of significant radioelectric signals: Embodiments of the invention relate to a system for extracting and analyzing radioelectric signals of interest. It includes an integer number N of channels. Each channel Vi includes a receiver linked to an analog signals digital acquisition device delivering a digital signal SNi. Each channel Vi includes a bank of... Agent: Darby & Darby P.C.
20100039099 - Power noise detecting device and power noise control device using the same: A power noise detecting device includes a plurality of power lines, and a power noise detecting part configured to detect power noise by rectifying voltages of the plurality of power lines and converting the rectified voltages into effective voltages.... Agent: Baker & Mckenzie LLP Patent Department
20100039100 - Nonlinear degree measuring apparatus and method for a power amplifier, predistortion compensation apparatus: This invention relates to a nonlinear degree measuring apparatus and method for a power amplifier, and a predistortion compensation apparatus. The nonlinear degree measuring apparatus comprises a delayer (304), for delaying inputted pilot frequency data; a subtracter (305), for subtracting, from the pilot frequency data delayed by the delayer, subsequently... Agent: Hanify & King Professional Corporation
20100039101 - Electrical testing device: An electrical testing device used for testing an electronic device under test. The electrical testing device includes a cable configured for receiving a test signal and transmitting the received test signal therethrough, and a testing unit connected to the cable and configured for analyzing the test signal. The cable includes... Agent: PCe Industry, Inc. Att. Steven Reiss
20100039102 - Device and process for nondestructive and noncontact detection of faults in a test piece: A device for nondestructive and noncontact detection of faults in a test piece, with a stationary measurement device (16) for taking an eddy current or a magnetic stray flux measurements on a test piece (10) continuously advanced relative to the measurement device; and a device (12) for positioning the test... Agent: Roberts Mlotkowski Safran & Cole, P.C. Intellectual Property Department
20100039103 - System for determining the position of a movable member: A first magnet is secured to the movable member at a first axial position and is associated with a first magnetic field. A secondary magnet is secured to the movable member at a secondary axial position and is associated with a secondary magnetic field. A sensor assembly comprises magnetic sensors... Agent: Deere & Company
20100039104 - Wing flap sensor unit: A wing flap sensor unit (2) having a position sensor (18) for detection of a rotation position of a shaft for operation of wing flaps and having a housing (4) which surrounds the position sensor (18), having an attachment component (20, 22) for attachment in an aircraft wing and having... Agent: Scully Scott Murphy & Presser, PC
20100039105 - Magnetic oscillator based biosensor: A biosensor is described. The biosensor includes a fixed multilayer stack providing a magnetization oscillation, a voltage source electrically coupled to the fixed multilayer stack, and a binding molecule covalently bonded to the biosensor. The voltage source provides a direct current through the fixed multilayer stack to generate the magnetization... Agent: Campbell Nelson Whipps, LLC
20100039106 - Mems device with tandem flux concentrators and method of modulating flux: A microelectromechanical modulating magnetic sensor comprising a base; a magnetic transducer associated with the base that provides an output in response to a magnetic field; a pair of movable flux concentrators positioned to move relative to the magnetic transducer; the pair of movable flux concentrators having a region of high... Agent: U S Army Research Laboratory Attn: Rdrl-loc-i
20100039107 - Magnetic carrier manipulation and detection using a nanometer scale transformer: A nanometer scale transformer configured to manipulate and detect a magnetic carrier is provided.... Agent: Knobbe Martens Olson & Bear LLP
20100039108 - Measuring arrangement: A measuring arrangement is provided with a magnetic field-sensitive sensor (2), which includes a body (10) formed of a magnetic material. The body has a continuous recess (12) and a wall (26) defining same. The sensor (2) has at least one electric conductor (5), which extends between the ends and... Agent: Mcglew & Tuttle, PC
20100039109 - Methods for determining in situ the viscosity of heavy oil using nuclear magnetic resonance relaxation time measurements: where T is the temperature of the heavy oil, T2LM is the logarithmic mean of the T2 distribution of the sample obtainable from nuclear magnetic resonance (NMR) measurements, c′=1.0±0.05, c″=1.0±0.04, ηg is the glass transition temperature viscosity of the heavy oil and a function of T2LM, and C1 is a... Agent: Schlumberger Canada Limited
20100039110 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: An MRI apparatus capable of performing a high-speed operation for removing aliasing from the data measured by non-Cartesian imaging in a real space with a small amount of operation is provided. Non-Cartesian data sampling is performed by thinning the number of data by using multiple receiver coils having different sensitivity... Agent: Cooper & Dunham, LLP
20100039112 - Circulator: A circulator suitable for use in an external field, particularly of a magnetic resonance apparatus, has a planar ferrite structure. Instead of a permanent magnet, a field conducting device is provided that is designed to strengthen or weaken an external field, and/or at least one electromagnet is provided for generating... Agent: Schiff Hardin, LLP Patent Department
20100039111 - Rf coil for use in an mr imaging system: An RF coil is proposed for use as an RF antenna for a MR imaging system, for transmitting RF excitation signals and for receiving MR relaxation signals, The RF coil of the invention includes an array of patches (1) which are capacitively coupled with each other. The array of patches... Agent: Philips Intellectual Property & Standards
20100039113 - Detuning circuit and detuning method for an mri system: The present invention relates to a magnetic resonance imaging system and a corresponding method having a transmit phase and a receive phase. Further, the present invention relates to a detuning circuit and a corresponding detuning method for detuning an RF receive coil during the transmit phase in such a magnetic... Agent: Philips Intellectual Property & Standards
20100039114 - Method for electroseismic survey design: A method for designing a controlled-source electromagnetic survey that will discriminate between a defined deep marginal-interest reservoir (2) and specified false positive resistivity structures of concern (3, 4, 5). A reservoir model and a false positive model are constructed for each false positive scenario. The resistivity of the false positive... Agent: Exxon Mobil Upstream Research Company
20100039115 - System and method for measuring resistivity of an earth formation with correction for mud electrical properties: A method for measuring a resistivity parameter of an earth formation is provided. The method includes: conveying a measurement current from at least one measurement electrode into the formation, the at least one measurement electrode having a potential; receiving the measurement current by at least one return electrode; and estimating... Agent: Cantor Colburn LLP- Baker Hughes Incorporated
20100039116 - State of health recognistion of secondary batteries: An invention is provided for determining a state of health of a battery. The invention includes applying a predefined load profile to a battery, and obtaining a plurality of battery response voltage data corresponding to points along the predefined load profile. The battery electrical double layer capacity data is calculated... Agent: Patent Venture Group
20100039117 - Temperature control system for a device under test: A temperature control system for an optical microscope for inspecting an integrated circuit device under test (DUT) that includes a first fluid circulation system coupled to and supplying fluid to fluid injectors that spray fluid on the DUT and a second fluid circulation system for exchanging energy between fluids in... Agent: Nixon Peabody, LLP
20100039118 - Current measurement circuit and method of diagnosing faults in same: A current measurement circuit includes first and second input nodes which receive the respective voltages at either side of a resistive element through which electrical current can flow, a differential amplifier means which produces an output signal indicative of the difference in voltage between its input terminals, electrical path forming... Agent: Macmillan, Sobanski & Todd, LLC
20100039119 - Multiple testing bars for testing liquid crystal display and method thereof: A plurality of gate lines are formed on an insulating substrate in the horizontal direction, a gate shorting bar connected to the data lines is formed in the vertical direction and a gate insulating film is formed thereon. A plurality of data lines intersecting the gate lines are formed on... Agent: Innovation Counsel LLP
20100039120 - Hardware in the loop motor simulation: A simulator system is connected to simulate the connection of a mechanically loaded motor to a motor controller/driver. The simulator system includes a current transformer circuit for monitoring AC output currents provided by the motor controller/driver. A simulation controller calculates, based on the monitored AC output currents, dynamic load voltages... Agent: Kinney & Lange, P.A.
20100039121 - Low cost fingerprint sensor system: Low cost fingerprint system having a single chip solution includes a circuit board, a fingerprint sensor array fabricated onto a first surface of the circuit board, and an integrated circuit die for processing information received from the fingerprint sensor array is mounted directly to a second surface of the circuit... Agent: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
20100039122 - Capacitive sensing and method: A capacitive vehicle sensor includes a sensing electrode configured to generate an electric field, a shield electrode configured to reduce the electromagnetic influence of electric fields generated by objects outside of the electric field, a circuit coupled to the sensing electrode and shield electrode that allows a plurality of impedances... Agent: Foley And Lardner LLP Suite 500
20100039123 - Capacitive sensing system and method: A capacitive sensing system includes a conductive sensing element and a circuit configured to provide measurements related to a sensing current sent to the sensing element. The circuit is located remote from the sensing element. The system also includes a switch configured to selectively couple the sensing element to the... Agent: Foley And Lardner LLP Suite 500
20100039124 - Molecularly imprinted polymer sensor systems and related methods: A molecularly imprinted polymer (MIP) sensor including a substrate, two or more electrodes, a conductive layer applied to the substrate and a molecularly imprinted polymer layer applied to the conductive layer is disclosed herein The MIP sensor may form part of an MIP sensor system that can be used to... Agent: Lathrop & Gage LLP
20100039126 - Nanochannel-based sensor system for use in detecting chemical or biological species: A sensor system for detecting a chemical or biological species includes a sensing element and a bias and measurement circuit. The sensing element includes nanochannels, each having an outer surface functionalized to chemically interact with the species to create a corresponding surface potential, and each having a sufficiently small cross... Agent: Bainwood Huang & Associates LLC
20100039127 - System for assessing pipeline condition: A method and system for assessment of a pipe (110) is provided. The system can include a probe (100) having first (120) and second (130) electrodes and a processor (200) in communication with the probe (100). The probe (100) can be in a medium (140) proximate to a section of... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP
20100039130 - Inspecting method, inspecting apparatus and computer readable storage medium having program stored therein: A probe card of an inspecting apparatus is provided with a flitting circuit to cause a flitting by applying voltages to a pair of probes being in contact with an electrode of a substrate to electrically conduct the probes to the substrate, and a switching circuit to electrically connect the... Agent: Ditthavong Mori & Steiner, P.C.
20100039128 - Method and apparatus for detecting a crack in a semiconductor wafer, and a wafer chuck: A method for detecting a crack in a semiconductor wafer, which includes an electrical device and a connecting pad electrically coupled with the electrical device, is described. The crack is detected by an acoustic detector being acoustically coupled to the semiconductor wafer during contacting the contacting pad with a probe.... Agent: Slater & Matsil LLP
20100039129 - Probe card: Provided is a probe card. The probe card includes a ceramic substrate including a signal line, and a plurality of probe pins formed on the ceramic substrate, and including probe bodies having one end connected to the signal line and probe tips formed at other end of the probe body.... Agent: Mcdermott Will & Emery LLP
20100039132 - Probing apparatus: A probe for probing an electrical device under test is provided. The probe comprises a camera positioned adjacent a probing tip of the probe. Visual information captured by the camera is displayed on a display device. The camera may be mounted in multiple locations as desired by a user and... Agent: Lecroy Corporation
20100039131 - System and method for modulation mapping: An apparatus for providing modulation mapping is disclosed. The apparatus includes a laser source, a motion mechanism providing relative motion between the laser beam and the DUT, signal collection mechanism, which include a photodetector and appropriate electronics for collecting modulated laser light reflected from the DUT, and a display mechanism... Agent: Nixon Peabody, LLP
20100039133 - Probe head controlling mechanism for probe card assemblies: A probe card assembly includes a first probe head having contact elements disposed on a respective surface for forming electrical contacts with corresponding terminals of corresponding electronic devices, a second probe head having contact elements disposed on a respective surface for forming electrical contacts with corresponding terminals of corresponding electronic... Agent: Formfactor, Inc. Legal Department
20100039134 - High-power optical burn-in: Semiconductor lasers are aged to identify weak or flawed devices, resulting in improved reliability of the remaining devices. The lasers can be aged using a high-power optical burn-in that includes providing a high drive current to the lasers for a period of time, and maintaining the ambient temperature of the... Agent: Workman Nydegger 1000 Eagle Gate Tower02/11/2010 > patent applications in patent subcategories. patent applications/inventions, industry category
20100033158 - Measuring agglutination parameters: A method and system are described for measuring agglutination in a target-induced agglutination assay with one or more magnetic particles performed in a reaction chamber. After the magnetic particles (3, 15), which are capable of binding to a target (5) are provided in the assay, an agglutination process resulting in... Agent: Philips Intellectual Property & Standards
20100033159 - Physical properties detection device and physical properties detection method: A physical properties detection device comprising a probe to be placed near or touching a surface of a ferroelectric; an oscillation loop including the probe and capacitance within the ferroelectric; and detection means for detecting a physical properties of the ferroelectric on the basis of a frequency variation of a... Agent: Sughrue Mion, PLLC
20100033160 - Measurements of redox potential and concentration of redox active substances: A method to measure redox potentials and concentrations of redox active substances in an aqueous solution is described. The method is based on measurements of transmembrane electric potential through an electroconductive polymer membrane, for example, through a d,l-camphor sulfonic acid (CSA) doped polyaniline (PANI) membrane. Transmembrane electric potential demonstrates good... Agent: Kocherginsky Nikolai M.
20100033163 - Device for sensing a fault current in a field bus system: The invention relates to an electric switching circuit for operating a bus of a field bus system comprising means for sensing a fault current. Said means comprise first means for determining a first current of a first bus line, second means for determining a second current of a second bus... Agent: Kramer Levin Naftalis & Frankel LLP Intellectual Property Department
20100033162 - Low-power direct current detector: Provided is a low-power direct current detector. The low-power direct current detector includes a main current source circuit generating an ultra-low current, a limitation circuit limiting the current generated by the main current source circuit to lower than a preset current, and a voltage detection circuit biased by the ultra-low... Agent: Lowe Hauptman Ham & Berner, LLP
20100033161 - Voltage detecting circuit and voltage detecting method: Voltage detecting circuit for detecting a voltage state of a voltage source includes a first route, a second route and a comparator. First route is between a voltage source and a ground voltage, having a first current source and a first MOS resistor, connected in series at a first node... Agent: Jianq Chyun Intellectual Property Office
20100033164 - Transient noise detection circuit: A transient noise detection circuit for detecting a level of a transient noise voltage is disclosed. The transient noise detection circuit comprises a triggering circuit, a rectifying circuit, and a controller. The triggering circuit is coupled between a power rail and a ground node. When the triggering circuit receives a... Agent: Morris Manning Martin LLP
20100033165 - Measuring induced currents on a can bus: A device for measuring currents induced in a CAN bus harness. In some embodiments, the device includes a first termination node, a second termination node, a current separator, a detection circuit, and a power source circuit. The current separator circuit has an RF transformer connected to the first termination node... Agent: Michael Best & Friedrich LLP
20100033166 - Method for estimating the magnetization level of one or more permanent magnets established in one or more permanent magnet rotors of a wind turbine generator and wind turbine: A method for estimating the magnetization level of one or more permanent magnets established in one or more permanent magnet rotors of a wind turbine generator includes the steps of: establishing one or more magnetization sensors at the stator of the generator, connecting the one or more magnetization sensors to... Agent: St. Onge Steward Johnston & Reens, LLC
20100033168 - Hand and press-button dual-way manual pulse generator with built-in indicator lamps: The present invention discloses a hand and press-button dual-way manual pulse generator with built-in indicator lamps, which comprises a rotation pulse input unit and a CPU. The CPU is connected with a forward rotation indicator lamp and an inverse rotation indicator lamp. The rotation signal input unit and/or the press-button... Agent: Squire, Sanders & Dempsey L.L.P.
20100033167 - Magnetic position sensor: The invention relates to a magnetic position sensor (1) consisting of a non-electroconductive, non-magnetic carrier (2) on which a resistive layer (3) is arranged, in addition to a pick-off layer (4) which is located at a distance from the resistive layer and at least partially overlaps the same. The distance... Agent: K.f. Ross P.C.
20100033169 - Position detector: A position detector can correct a position for detecting a moving object without changing a physical location of a moving mechanism, a Hall element and/or the like. Either a permanent magnet 19 or Hall elements 16a, 17a, 17b, 17c is mounted on a moving object 3 moving along a fixed... Agent: Cozen O''connor
20100033170 - Rotary position encoder: A rotary position encoder is described that includes a hub configured to mount on an end of a rotatable shaft of a machine tool and rotate concurrently with the rotatable shaft. The hub includes a cup formed in a first end to receive the rotatable shaft, the cup having equally... Agent: Mcdermott Will & Emery LLP
20100033172 - Arrangement and method for influencing and/or detecting and/or locating magnetic particles in a region of action: An arrangement and a method for influencing and/or detecting and/or locating magnetic particles in a region of action is disclosed, which arrangement comprises: —drive means for generating a magnetic drive field so that the magnetization of the magnetic particles changes, wherein the magnetic particles comprise at least a first and... Agent: Philips Intellectual Property & Standards
20100033171 - Arrangement and method for influencing and/or detecting magnetic particles in a region of action: An arrangement and a method for influencing and/or detecting magnetic particles in a region of action is disclosed, which arrangement comprises:—selection means for generating a magnetic selection field having a pattern in space of its magnetic field strength such that a first sub-zone having a low magnetic field strength and... Agent: Philips Intellectual Property & Standards
20100033174 - Arrangement and method for influencing and/or detecting magnetic particles in a region of action: An arrangement for influencing and/or detecting magnetic particles, a method for calibrating such an arrangement and a method for influencing and/or detecting magnetic particles in a region of action is disclosed, which arrangement comprises selection means for generating a magnetic selection field having a pattern in space of its magnetic... Agent: Philips Intellectual Property & Standards
20100033173 - Arrangement for influencing and/or detecting magnetic particles in a region of action and method of producing a disk shaped coil: An arrangement for influencing and/or detecting magnetic particles in a region of action and a method of producing a disk shaped coil is disclosed, which arrangement comprises: selection means for generating a magnetic selection field having a pattern in space of its magnetic field strength such that a first sub-zone... Agent: Philips Intellectual Property & Standards
20100033175 - Magneto-resistive sensor: A high-performance, integrated AMR sensor has compensation and flipping coils for signal conditioning of the sensor output. At least one of the coils is formed in the laminate that connects the AMR sensor with its IC within a single package. As a result, the dimensions of the die area of... Agent: Nxp, B.v. Nxp Intellectual Property & Licensing
20100033176 - Methods for determining in situ the viscosity of heavy oil: where T is the temperature of the heavy oil sample, η is the viscosity, T2LM is the logarithmic mean of the T2 distribution spectrum of the sample, and a, b, and c are non-zero constants. Typically, constant b has a value between 5 and 7 and constant c has a... Agent: Schlumberger Canada Limited
20100033177 - Inspection apparatus using magnetic resonance and nuclear magnetic resonance signal receiver coil: An MRI apparatus capable of selecting an optional direction as a phase encoding direction and achieving a preferable S/N, when an imaging time shortening technique is applied. A receiver coil, used as a receiver coil of a vertical magnetic field MRI apparatus, is a combination of a first coil (solenoid... Agent: Antonelli, Terry, Stout & Kraus, LLP
20100033178 - Method and apparatus for detecting or transmitting magnetic field using detachable magnetic resonator: An apparatus for detecting a magnetic field includes a coil type magnetic resonator having a resonant frequency with respect to a magnetic field varying at a particular frequency and a loop antenna inductively coupled to the coil type magnetic resonator.... Agent: Rabin & Berdo, PC
20100033179 - Distortion-free magnetic resonance imaging near metallic implants: A method for 3D magnetic resonance imaging (MRI) with slice-direction distortion correction is provided. One or more selective cross-sections with a thickness along a first axis is excited using a RF pulse with a bandwidth, wherein a selective cross-section is either a selective slice or selective slab. A refocusing pulse... Agent: Beyer Law Group LLP
20100033181 - Levitating mems resonator for magnetic resonance force microscopy: A self-stabilized, levitating MEMS (Micro Electro-Mechanical Systems) resonator is provided for detection of magnetic resonance spectra of electrons and nuclei in magnetic resonance force microscopy (MRFM) measurements. The present MRFM system includes a levitating micro-disk having electrically-controlled force sensitivity. To achieve imaging on the scale of a single nuclear spin,... Agent: Flaster/greenberg P.C. Four Penn Center
20100033182 - Magnetic resonance specimen evaluation using multiple pulsed field gradient sequences: Using pulsed-field-gradient (PFG) sequences, the sizes of the pores in ordered porous media can be estimated from the “diffraction” pattern that the signal attenuation curves exhibit. A different diffraction pattern is observed when the experiment is extended to a larger number (N) of diffusion gradient pulse pairs. Differences in the... Agent: Klarquist Sparkman, LLP
20100033180 - Method for calibration of a magnetic resonance acquisition channel, calibration data determination device and magnetic resonance system: In a method for calibration of a magnetic resonance acquisition channel having a magnetic resonance acquisition antenna in a magnetic resonance system, in a test signal is emitted by the transmission antenna in the magnetic resonance system and is received by the acquisition antenna. Acquisition channel calibration data for the... Agent: Schiff Hardin, LLP Patent Department
20100033183 - Magnetic resonance imaging apparatus and rf coil for magnetic resonance imaging apparatus: This invention provides a receiving coil that allows a high-quality image of high depth sensitivity to be obtained during vertical magnetic field MRI without limiting selection of a cross section to be imaged and of a phase-encoding axis. A subject's field of view is broadened without deterioration of the coil... Agent: Antonelli, Terry, Stout & Kraus, LLP
20100033184 - Nmr spiral rf probe coil pair with low external electric field: RF electric fields produced by electric potential differences in NMR probe coil windings may penetrate the NMR sample and sample tube causing sensitivity loss and noise in NMR spectroscopy. Counter-wound spiral coils placed on the opposite surfaces of a planar substrate or on two adjacent planar substrates produce electric potentials... Agent: Varian Inc. Legal Department
20100033185 - Rf coil and apparatus to reduce acoustic noise in an mri system: A radio frequency (RF) coil for a magnetic resonance imaging (MRI) system includes a first end ring section containing a plurality of openings and a second end ring section containing a plurality of openings. A plurality of rungs is disposed between the first end ring section and the second end... Agent: Peter Vogel Ge Healthcare
20100033186 - Split gradient coil and pet/mti hybrid system using the same: A generally cylindrical set of coil windings (10, 30, 80) includes primary coil windings (12, 32, 82) and shield coil windings (14, 34, 84) at a larger radial position than the primary coil windings, and an arcuate or annular central gap (16, 36, 86) that is free of coil windings,... Agent: Philips Intellectual Property & Standards
20100033187 - Method for eliminating borehole eccentricity effect in transversal induction sensor: An instrument for measuring a property of a subsurface material, the instrument including: a magnetic material surrounding a volume in at least two dimensions; and a receiver adapted for receiving energy related to the property of the subsurface material; wherein the receiver is disposed at an exterior surface of the... Agent: Cantor Colburn LLP- Baker Hughes Incorporated
20100033188 - Apparatus, method and system for determining a physiological condition within a mammal: A system, method and apparatus for determining a physiological condition within a mammal based on pH and/or temperature measurements. In one aspect, the invention is directed to an apparatus for measuring a physiological condition within a mammal comprising: an elongated housing extending along a longitudinal axis from a proximal end... Agent: The Belles Group, P.C.
20100033190 - Electrical test device: An electrical test device including at least one transducer to detect a status of a circuit under test, and at least one indicator located remotely from the at least one transducer to display the status of the circuit under test.... Agent: Harness, Dickey & Pierce, P.L.C
20100033189 - Semiconductor integrated circuit and test method using the same: A semiconductor integrated circuit includes a pulse control register configured to hold an assigned code with a smaller number of bits than that of a pulse control pattern used to control an oscillation output of an oscillator, a code conversion unit configured to convert the assigned code held by the... Agent: SprinkleIPLaw Group
20100033191 - Inspection jig for display panel, inspection system using the same, and method for inspecting the display panel using the same: An inspection jig for a display panel, used in an inspection system for the display panel and in a method for inspecting the display panel, includes a plate, a ground plate and at least one side holder. The ground plate is disposed on the plate and receives the display panel.... Agent: Cantor Colburn, LLP
20100033192 - Method for testing the functionality of a field device for an industrial process and field device for an industrial process: In a method for testing functionality of a field device or a field device for sending a control signal to a final controlling device of an industrial processing plant, the final controlling device is operated by a secondary power. With the method, a current/secondary power converter is provided for generating... Agent: Schiff Hardin, LLP Patent Department
20100033193 - Operating device and method for generating output signals therefrom: The invention relates to an operating device (1) with an adjustable lever (2) and a sensor mechanism (8), comprising a transmitter coil (5), which may be energised with an alternating current by means of an alternating current supply (7) and a receiver coil arrangement (9). According to the invention, such... Agent: K.f. Ross P.C.
20100033194 - Plasma system and measurement method: A plasma system (1) has a circuit including a DC source (6), a power supply line (9), an electrodes (2, 3), and a return line (18). A perturbation signal source (8) delivers a perturbation signal into the circuit in addition to DC voltage from the DC source (6). Acquisition (10)... Agent: Jacobson Holman PLLC
20100033195 - Passive capacitively-coupled electrostatic (cce) probe arrangement for detecting plasma instabilities in a plasma processing chamber: An arrangement for detecting plasma instability within a processing chamber of a plasma processing system during substrate processing is provided. The arrangement includes a probe arrangement, wherein the probe arrangement is disposed on a surface of the processing chamber and is configured to measure at least one plasma processing parameter.... Agent: Ipsg, P.C.
20100033196 - Capacitive sensor: A capacitive sensor includes a dielectric layer made of an elastomer and a pair of electrodes arranged via the dielectric layer, and detects deformation on the basis of electrostatic capacity variation between the pair of electrodes. The pair of electrodes contain an elastomer and conductive fillers filled into the elastomer,... Agent: Oliff & Berridge, PLC
20100033197 - Proximity sensor: A proximity sensor includes an L-C resonator, an oscillator for oscillating the L-C resonator, an oscillation detector, an output circuit, and a burnout detecting means. The L-C resonator has a detection coil for detecting an object, and a resonant capacitor connected across the detection coil. The oscillation detector detects an... Agent: Cheng Law Group, PLLC
20100033198 - Electrical detection and/or quantification of organophosphorus compounds: A device for detecting and/or quantifying organophosphorus compounds, comprising an electrical device comprising a source electrode and a drain electrode separated by a semiconductive material, characterized in that at least one receptor molecule, comprising a group R and a primary alcohol in spatial proximity to a tertiary amine, with which... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.
20100033199 - Holding member for inspection, inspection device and inspecting method: Installed in a probe device is a holding member for inspection which can be mounted on a chuck. The holding member for inspection includes a support plate capable of mounting thereon a chip in which the power device is formed; pins for positioning the chip mounted on the support plate;... Agent: Pearne & Gordon LLP
20100033200 - Probing method and probing program: Disclosed is a probing method including, when the probes are configured to make contact with a chip row including four chips continuously arranged in an oblique direction so that the probe card test four chips at a time, finding a first reference oblique chip row extending in the oblique direction... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.
20100033201 - Mems probe fabrication on a reusable substrate for probe card application: A Micro-Electro-Mechanical-Systems (MEMS) probe is fabricated on a substrate for use in a probe card. The probe has a bonding surface to be attached to an application platform of the probe card. The bonding surface is formed on a plane perpendicular to a surface of the substrate. An undercut is... Agent: Blakely Sokoloff Taylor & Zafman LLP
20100033202 - Cantilever microprobes for contacting electronic components and methods for making such probes: Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to various designs of two-part probe elements, socket-able probes and their mounts. Some embodiments are directed to methods for fabricating such probes and mounts.... Agent: Microfabrica Inc. Att: Dennis R. Smalley
20100033203 - Methods and apparatus for translated wafer stand-in tester: A translated wafer stand-in tester, being a hybrid apparatus capable of emulating the form factor and some or all behaviors of a translated wafer under test, which is operable to store, quantify, encode and convey, either directly or remotely, data from a testing system, including but not limited to pad... Agent: Raymond J. Werner
20100033204 - Semiconductor inspection apparatus and semiconductor integrated circuit: In a wafer-level burn-in test, a sufficient power supply current must be supplied to operate semiconductor integrated circuits on a wafer, but the power supply current sometimes exceeds an allowable current level due to such as variations in transistor characteristics of the semiconductor integrated circuits. An operation power supply current... Agent: Wenderoth, Lind & Ponack L.L.P.
20100033205 - Apparatus and method for performing an ion concentration analysis in liquid crystal panel: The present invention provides an apparatus and method for performing an ion concentration analysis in an LCD panel. The method comprises: adjusting common voltage of an LCD panel to be tested and a standard LCD panel, respectively, and obtaining a first common voltage of the LCD panel to be tested... Agent: Ladas & Parry LLP02/04/2010 > patent applications in patent subcategories. patent applications/inventions, industry category
20100026276 - Method and apparatus for fast fault detection: A method and apparatus are provided for detecting a fault condition on a power system. By rectifying power system phase voltages to produce a rectified waveform, and filtering the rectified waveform or a representation of the rectified waveform through a finite gain synchronous band pass filter to generate a synchronous... Agent: Alston & Bird LLP
20100026277 - Waveform observing apparatus: There is provided a waveform observing apparatus with a reduced depth in such a manner that the waveform observing apparatus is one including a terminal board, connecting wiring extending from external equipment, a memory for receiving measured data through the terminal board, to store the measured data, and a display... Agent: Kilyk & Bowersox, P.l.l.c.
20100026278 - Apparatus for monitoring discharge processes in a conductor of a medium-voltage or high-voltage system: An apparatus monitors discharge processes in a conductor of a medium-voltage system or a high-voltage system. The apparatus contains at least one transformer which is suitable for detecting a current flowing in the conductor. The at least one transformer is connected to a device for monitoring the discharge process. In... Agent: Lerner Greenberg Stemer LLP
20100026279 - Apparatus and method for providing an output signal indicative of a speed of rotation and a direction of rotation as a ferromagnetic object: An apparatus and a method provide an output signal indicative of a speed of rotation and a direction of rotation of a ferromagnetic object capable of rotating. A variety of signal formats of the output signal are described.... Agent: Daly, Crowley, Mofford & Durkee, LLP
20100026280 - Extra bucking coils as an alternative way to balance induction arrays: An electromagnetic logging tool is disclosed that includes a support; and at least one four-coil array disposed on the support, wherein the at least one four-coil array comprises: a transmitter, a bucking coil, a receiver, and a trim coil. A method for balancing an induction array is disclosed that includes... Agent: Schlumberger Oilfield Services
20100026281 - Magnetic sensor circuit and electronic apparatus using same: A magnetic sensor circuit of the present invention includes: a Hall device 10; selection switch circuit 20 switching a detection state of the Hall device 10 to either a first switch state or a second switch state; a comparator unit 60 performing comparison using a detection voltage of a magnetoelectric... Agent: Fish & Richardson P.C.
20100026282 - Angle detecting apparatus and angle detecting method: An angle detecting apparatus includes a rotor fixed to a rotating shaft, a pair of magnetic sensors arranged close to the outer periphery of the rotor so as to have a difference in angle (π/2) with respect to the center of rotation of the rotor, a differential operational circuit performing... Agent: Oliff & Berridge, PLC
20100026283 - Position detecting device, and seat position detecting device of vehicle: In a position detecting device including a movable member provided in a displaceable manner on a base member, and a proximity sensor which detects the position of the movable member, the proximity sensor includes a magnetic field generating portion, a detecting portion which detects a change in magnetic field according... Agent: Carrier Blackman And Associates
20100026284 - Element for generating a magnetic field: An element for generating a magnetic field, having an annular frame for receiving an annular magnet which rotates with a turboshaft. The magnet is mounted in the frame such that the frame stabilizes and guides the magnet mechanically. In order to specify an element for generating a magnetic field which... Agent: Cohen, Pontani, Lieberman & Pavane LLP
20100026285 - Material condition assessment with eddy current sensors: Eddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit... Agent: Hamilton, Brook, Smith & Reynolds, P.C.
20100026286 - Sensor system and method: A sensing system includes a conductor with a current flow path therethrough. A first location of the conductor defines a first cross-sectional area and a second location defines a second cross-sectional area, wherein a current flowing through the conductor establishes magnetic field lines having strengths that vary according the conductor... Agent: Dicke, Billig & Czaja
20100026287 - Method and device for measuring an angle at which a magnetic field is aligned in a plane relative to a reference axis: A device for measuring an angle at which a magnetic field is aligned in a plane relative to a reference axis has at least two magnetic field sensors, which are aligned with their measurement axes in and/or parallel to the plane and oriented at right angles to each other. The... Agent: The Webb Law Firm, P.C.
20100026288 - Electronic circuit and method for resetting a magnetoresistance element: An electronic circuit includes a primary magnetoresistance element for providing a first output signal proportional to a magnetic field. The primary magnetoresistance element has a primary maximum response axis. The primary magnetoresistance element also has a hysteresis characteristic. The electronic circuit also includes a reset conductor disposed proximate to the... Agent: Daly, Crowley, Mofford & Durkee, LLP
20100026289 - Electronic circuit configured to reset a magnetoresistance element: An electronic circuit includes a magnetoresistance element for providing an output signal proportional to a magnetic field. The magnetoresistance element also has a hysteresis characteristic. The electronic circuit also includes at least one of a reset conductor or a bias conductor disposed proximate to the magnetoresistance element. For embodiments having... Agent: Daly, Crowley, Mofford & Durkee, LLP
20100026290 - Microelectromechanical magnetometer with integrated electronics: A method of manufacturing an apparatus 200 comprising forming an integrated magnetometer package 202. Forming an integrated magnetometer package 202 includes forming a movable part 215 from a MEM magnetometer substrate 210, and attaching an integrated circuit 910 to one side 212 of the MEM magnetometer substrate. A spacer structure... Agent: Hitt Gaines, PC Alcatel-lucent
20100026291 - Method and device for measuring the pole orientation angle of a magnetic levitation vehicle on a magnetic levitation track: A method for measuring the pole position of a magnetic levitation vehicle on a magnetic levitation track. The pole orientation angle between the stator magnetic field of a track side stator and the magnetic reference axis of the magnetic levitation vehicle is determined by way of measured values from magnetic... Agent: Lerner Greenberg Stemer LLP
20100026292 - Method and apparatus for measuring magnetic anisotropy of a conductive wire or tape: A method and apparatus for measuring the magnetic field anisotropy of critical currents in conductive wires and conductive tapes having lengths of at least one meter. In one embodiment, the method and apparatus are adapted to measure the magnetic field anisotropy of critical currents in superconducting wires and tapes. The... Agent: Los Alamos National Security, LLC
20100026293 - Method for estimating formation skin damage from nuclear magnetic resonance measurements: A method for determining skin factor of a subsurface rock formation from within a wellbore drilled therethrough includes measuring a nuclear magnetic resonance property of the formation at a plurality of lateral depths therein. The measured nuclear magnetic resonance property is used to estimate the skin factor.... Agent: Schlumberger Oilfield Services
20100026294 - Blip design for random sampling compressed sensing of flyback 3d-mrsi: A method of providing a magnetic resonance spectral image (MRSI) is provided. A magnetic resonance imaging excitation is applied. Data is acquired, comprising applying an oscillating gradient in a first dimension and applying blips in at least a second dimension in a pseudo-random order to acquire pseudo-random temporally undersampled spectral... Agent: Beyer Law Group LLP
20100026295 - Magnetic resonance imaging apparatus and method: A magnetic resonance imaging apparatus includes a movement unit which moves a subject placed in a static magnetic field, a collector which collects data corresponding to a magnetic resonance signal emitted from the subject, a detector which detects a position of a particular section of the subject in the static... Agent: Nixon & Vanderhye, PC
20100026296 - Magnetic resonance imaging apparatus: When a pulse sequence for suppressing water signals, and an MRS pulse sequence or MRSI pulse sequence are sequentially executed to carry out MRS or MRSI measurement using repetitive measurement for signal integration or repetitive measurement for phase encoding, signal Sig0 from water is measured with the pulse sequence for... Agent: Antonelli, Terry, Stout & Kraus, LLP
20100026298 - Method for imaging acoustically induced rotary saturation with a magnetic resonance imaging system: A method for producing a magnetic resonance image indicative of mechanical waves applied to a subject is provided. Mechanical waves are applied to the subject at a selected frequency to induce oscillatory motion in tissues within the subject at the same frequency. A spin-lock radiofrequency pulse, having a resonance frequency... Agent: Quarles & Brady LLP
20100026299 - Method for radio-frequency nuclear magnetic resonance imaging: Accumulated spin magnetization phase within a RF MRI procedure can be used for providing an orderly k-space traversal. By operating a transmit array adapted to produce two B1 fields in alternation, where the B1 fields are substantially uniform in amplitude over a sample volume of the MRI setup, and the... Agent: National Research Council Of Canada 1200 Montreal Road
20100026297 - Method for relaxation-compensated fast multi-slice chemical exchange saturation transfer mri: A volumetric APT imaging sequence is provided that acquires multi-slice images immediately after a single long continuous wave (CW) RF irradiation, wherein the relaxation-induced loss of CEST contrast is compensated for during post-processing. Thus, a fast volumetric pH-weighted APT imaging technique is provided.... Agent: Quarles & Brady LLP
20100026300 - Method for identifying a sample in a container, e.g. when conducting a traveler survey in the check-in area, by determining the resonance frequency and the quality of a dielectric resonator to which the container is arranged: A method and apparatus for identifying a sample in a container, provide for the container with the sample being disposed relative to a resonator, a high-frequency signal being coupled into the resonator for exciting a resonant mode of the resonator, the resonant electric field of the resonator penetrating part of... Agent: Jordan And Hamburg LLP
20100026302 - nmr cryomas probe for high-field wide-bore magnets: All critical circuit components, including the sample coils, are located along with the spinner assembly in a region that may be evacuated to high vacuum for thermal insulation and high-voltage operation. A hermetically sealed spinner assembly simultaneously satisfies the requirements of hermeticity, low total emissivity, rf compatibility, spinning performance, magnetic... Agent: Oppedahl Patent Law Firm LLC
20100026301 - Detector arrangement: A detector arrangement with a plurality of detector units is disclosed, to each of which a data processing unit is assigned. An embodiment of the detector arrangement includes a cooling system with cooling units which are thermoconductively connected to the detector units and data processing units for cooling. The cooling... Agent: Harness, Dickey & Pierce, P.L.C
20100026303 - Doubly resonant high field radio frequency surface coils for magnetic resonance: A radio frequency coil comprises an annular conductor or parallel annular conductors (22, 22c, 22d) configured to support: (i) a uniform electrical current distribution generating a first B1 field (B1,uniform) at a first magnetic resonance frequency directed out of a plane of the annular conductor or conductors; and (ii) a... Agent: Philips Intellectual Property & Standards
20100026304 - Method and apparatus for analysing geological features: a processor (28) for filtering unwanted signal components which are substantially synchronous with the periodic transmitted electromagnetic signal from the scalar amplitude of the received signal or the scalar amplitude derived from the received signal, such that target geological features are able to be analysed using the filtered scalar amplitude.... Agent: Sunstein Kann Murphy & Timbers LLP
20100026305 - Method and apparatus for imaging boreholes: A method and apparatus for imaging wellbores is provided that in one aspect may include inducing an electrical signal into a formation, receiving a current signal responsive to the induced electrical signal by at least one measure electrode placed in a pad disposed in the wellbore, generating an impedance signal... Agent: Madan & Sriram, P.C.
20100026306 - Method and apparatus for telematics-based vehicle no-start prognosis: A system and method for determining the status of a vehicle battery to determine whether the battery may not have enough charge to start the vehicle. The method includes collecting data relating to the battery on the vehicle and collecting data relating to the battery at a remote back-office. Both... Agent: MillerIPGroup, PLC General Motors Corporation
20100026307 - Methods for predicting the future performance of fuel cell stacks and individual fuel cells: Method embodiments for analyzing the future performance of a fuel cell stack comprise the steps of: a) generating a first polarization curve data by experimentally measuring the voltage of a fuel cell stack across a current range at a first interval; b) dividing the current range into a plurality of... Agent: Dinsmore & Shohl LLP
20100026308 - Circuit for measuring battery voltage and method for battery voltage measurement using the same: The present invention relates to circuit for measuring battery voltage and method for battery voltage measurement using the same. In the circuit for measuring battery voltage and method for battery voltage measurement using the same, three or more capacitors, which form a closed loop and are sequentially connected, are provided,... Agent: Dickstein Shapiro LLP
20100026309 - Modular electrical system and method for its operation: A modular electrical system including a first current-emitting source module and a first current-consuming sink module which is connected to the first current-emitting source module is provided. The first sink module has a first sink identification means to identify maximum power requirement of the first sink module. The object of... Agent: Siemens Corporation Intellectual Property Department
20100026310 - Communication system fault location using signal ingress detection: Detecting ingress of a transmitted signal into a cable communication system due to a radio frequency signal transmitted from a moving vehicle and interrogation of transmitter location over a separate wireless link provides monitoring of shielding integrity or flaws there in a cable communication system. The location of a shielding... Agent: Whitham, Curtis & Christofferson & Cook, P.C.
20100026311 - Boosting system failure diagnosis device, boosting circuit controller and vehicle: A boosting converter and a boosting control unit are mounted on a vehicle. A failure diagnosis unit makes a failure diagnosis of an atmospheric pressure sensor based on a detection result of the atmospheric pressure sensor and on a detection result of an intake pressure sensor detecting engine intake pressure... Agent: Oliff & Berridge, PLC
20100026312 - System and method for power system component testing: A method of testing a power system component is disclosed. The method comprises coupling a test set to the power system component and displaying a test form on a display integral with the test set. The method also comprises inputting at least a first test control parameter into the test... Agent: Conley Rose, P.C.
20100026313 - Capacitance structures for defeating microchip tampering: Apparatus, method and program product may detect an attempt to tamper with a microchip by detecting an unacceptable alteration in a measured capacitance associated with capacitance structures proximate the backside of a microchip. The capacitance structures typically comprise metallic shapes and may connect using through-silicon vias to active sensing circuitry... Agent: Ibm-rochester C/o Toler Law Group
20100026314 - System and method for on-chip jitter injection: High Speed I/O interfaces (600) such as DVI, S-ATA or PCI-Express require expensive test equipment. Loop-back tests are widely used as one alternative, but lack coverage of timing-related defects. A system and method for on-chip jitter injection using a variable delay (203) with controllable amplitude (501) and high accuracy is... Agent: Nxp, B.v. Nxp Intellectual Property & Licensing
20100026315 - Signal measurement systems and methods: Signal measuring systems, and measurement methods are disclosed.... Agent: Law Offices Of Larry K. Roberts, Inc.
20100026316 - Electronic apparatus noise measurement method: Second and third ports of a network analyzer are individually connected via cables to predetermined connection points on a differential transmission circuit on an object to be measured. A differential cable is connected to the differential transmission circuit. An antenna for receiving an electromagnetic wave radiated from the differential cable... Agent: Dickstein Shapiro LLP
20100026317 - Impedance-based arc fault determination device (iadd) and method: Embodiments according to the present invention provide an Impedance-based Arc-Fault Determination Device (IADD) and method that, when attached to an electrical node on the power system and through observations on voltage, current and phase shift with a step load change, determine the effective Thevenin equivalent circuit or Norton equivalent circuit... Agent: Ballard Spahr LLP
20100026318 - Coupling loop: A coupling loop or antenna is provided that can be used with a system that determines the resonant frequency of a sensor by adjusting the phase and frequency of an energizing signal until the frequency of the energizing signal matches the resonant frequency of the sensor. In one embodiment multiple... Agent: John S. Pratt, Esq Kilpatrick Stockton, LLP
20100026319 - Sensor device, and portable communication terminal and electronic device using the sensor device: A sensor device for detecting a positional relationship between a first member and a second member, includes a first electrode provided on a surface of the first member and supplied with an alternating signal of a first frequency, a second electrode provided on a surface of the second member and... Agent: Ohlandt, Greeley, Ruggiero & Perle, LLP
20100026320 - Sensing device for measuring a position of nanoscale motion apparatus: A nanoscale motion apparatus comprises a fixed base, a movable platform, and means for moving the movable platform connected between the fixed base and the movable platform. A sensing device comprises a holder, at least two nanosensors, and a measurement plate. The holder is mounted on the fixed base. The... Agent: Bacon & Thomas, PLLC
20100026321 - Circuit system for a micromechanical sensor element having a capacitor array: A circuit system for a micromechanical sensor element having a capacitor array and a downstream amplifier for the useful signal of the capacitor array is described. Using this circuit system, setpoint deviations of the base capacitance of the capacitor array can easily be compensated. For this purpose, the circuit system... Agent: Kenyon & Kenyon LLP
20100026322 - Method for ascertaining burden resistance for a measurement transmitter: In a method for ascertaining burden resistance for a measurement transmitter, which is supplied with voltage via a first line-pair and which transmits a variable electrical-current signal via an electrical-current loop to a control system via a second line-pair, a test-voltage signal is capacitively coupled into the electrical-current loop and... Agent: Bacon & Thomas, PLLC
20100026323 - Waveguide grating structure and optical measurement arrangement: The present invention describes (bio)chemo-functional waveguide grating structures consisting of at least one (bio)chemo-functional waveguide grating structure unit or at least one (bio)chemo-functional sensor location with beam guidance permitting light beam separation, as well as detection methods for parallel analysis which are marking-free or based on marking.... Agent: Rankin, Hill & Clark LLP
20100026324 - Soil moisture sensor with long battery life: The alarm device can be an LED and the moisture sensing element is of resistive type. The sensor circuitry drives the moisture sensing element with AC voltages to measure soil moisture while avoiding electrolysis and corrosion at the moisture sensing element. As the measured soil moisture approaches a threshold the... Agent: Chein-hwa S. Tsao
20100026325 - Method and device for detecting structural abnormalities in a spherical particle, particularly in a nuclear fuel particle for high temperature or very high temperature reactors: The method for detecting at least one structural defect in a spherical particle (33) comprises at least the following steps of passing the particle (33) into at least one induction coil (15); exciting the induction coil (15) in order to induce Foucault currents in the particle (33); acquiring an output... Agent: Connolly Bove Lodge & Hutz LLP
20100026326 - Resistance sensing for defeating microchip exploitation: A method, program product and apparatus include resistance structures positioned proximate security sensitive microchip circuitry. Alteration in the position, makeup or arrangement of the resistance structures may be detected and initiate an action for defending against a reverse engineering or other exploitation effort. The resistance structures may be automatically and... Agent: Ibm-rochester C/o Toler Law Group
20100026327 - Electrical signal connector: An electrical signal connector which may be used for testing narrow-pitched chips or multi-chips, and causes no faulty connections between probes and pads or between probes and a circuit board even in a high temperature environment such as in a burn-in test is provided. The electrical signal connector has a... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw
20100026328 - Inspecting method and program for object to be inspected: An inspecting method for an object to be inspected is provided to bring probes of a probe card into electrical contact with a predetermined number of devices of target devices of the object at a time to inspect electrical characteristics of the target devices by moving a mounting table for... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.
20100026329 - Test apparatus and electronic device: Provided is a test apparatus that tests a device under test including an external interface circuit that transfers signals between an internal circuit inside a device and the outside of the device, the test apparatus comprising a pattern generating section that inputs, to the external interface circuit, a test pattern... Agent: Masao Yoshimura
20100026330 - Testboard with zif connectors, method of assembling, integrated circuit test system and test method introduced by the same: A testboard with ZIF connectors is disclosed. The testboard comprises a test substrate, a plurality of ZIF connectors and a plurality of detachably adjustable fastening means. Each ZIF connector has a plurality of second through-holes, and pairs of electric terminals are deposed on the bottom of each ZIF connector where... Agent: Sinorica, LLC
20100026331 - Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies: Enhanced microfabricated spring contact structures and associated methods, e.g. such as for electrical contactors and interposers, comprise improvements to spring structures that extend from the substrate surface, and/or improvements to structures on or within the support substrate. Improved spring structures and processes comprise embodiments having selectively formed and etched, coated... Agent: Glenn Patent Group
20100026332 - Device and method for sensing a position of a probe: A device for sensing a position of a probe relative to a reference medium, the probe comprising a heater element with a temperature dependent electrical resistance and being adapted to determine probe position by measuring a parameter associated to a thermal relaxation time of the heater element.... Agent: Anne Vachon Dougherty
20100026333 - Test apparatus and probe card: Provided is a test apparatus including a test head main body 130 that communicates a signal with the device under test 200, a prober 110 on which the device under test 200 is mounted, and a probe card 300 positioned between the test head main body 130 and the prober... Agent: Masao Yoshimura
20100026335 - Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing method: A leak current detection circuit that improves the accuracy for detecting a leak current in a MOS transistor without enlarging the circuit scale. The leak current detection circuit includes at least one P-channel MOS transistor which is coupled to a high potential power supply and which is normally inactivated and... Agent: Arent Fox LLP
20100026334 - Testing embedded circuits with the aid of test islands: Embodiments of the present disclosure relate to a system and method for testing an embedded circuit in a semiconductor arrangement as part of an overall circuit that is located on a semiconductor wafer, the system and method comprising an arrangement comprising an overall circuit with at least one input and... Agent: Hunton & Williams LLP Intellectual Property DepartmentPrevious industry: Electricity: power supply or regulation systems
Next industry: Electronic digital logic circuitry
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