|Electricity: measuring and testing patents - Monitor Patents|
USPTO Class 324 | Browse by Industry: Previous - Next | All
01/2010 | Recent | 15: May | Apr | Mar | Feb | Jan | 14: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | 13: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | 12: Dec | Nov | Oct | Sep | Aug | July | June | May | April | Mar | Feb | Jan | 11: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | 10: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | | 09: Dec | Nov | Oct | Sep | Aug | Jl | Jn | May | Apr | Mar | Fb | Jn | | 2008 | 2007 |
Electricity: measuring and testing January recently filed with US Patent Office 01/10Below are recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application. 01/28/2010 > patent applications in patent subcategories.
20100019755 - Cable tracing system and method for cable management: Embodiments of the present invention provide a system, method and testing apparatus for providing, managing and tracing connective cables in electrical and information management systems. In an embodiment of the invention, a selectable tracer cable system can be provided. The selectable tracer cable system can include a cable having a... Agent: Carey, Rodriguez, Greenberg & Paul, LLP Steven M. Greenberg
20100019756 - Device for measuring cellular potential, substrate used for the same and method of manufacturing substrate for device for measuring cellular potential: A device for measuring cellular potential includes a substrate, a first electrode tank, a first electrode, a second electrode tank and a second electrode. The first electrode tank and the second electrode tank are disposed on the upper side and lower side of the substrate, respectively. The first electrode is... Agent: Ratnerprestia
20100019757 - System and method for on-chip duty cycle measurement: An apparatus and method for measuring the duty cycle of a clock signal, the apparatus having a first multi-tap delay module, a second multi-tap delay module, and a multi-element detecting module, the input terminal of the first multi-tap delay module and the input terminal of the second multi-tap delay module... Agent: Seed Intellectual Property Law Group PLLC
20100019758 - Ac electric quantity measuring device: In the present invention, a measured realtime accurate frequency is used to determine estimated instantaneous voltage/current time-series data for each phase component in accordance with the least-squares method. The estimated instantaneous voltage/current time-series data are used to determine effective voltage, effective current, instantaneous active electric power, instantaneous reactive electric power,... Agent: Buchanan, Ingersoll & Rooney PC
20100019759 - Object state detection apparatus and method: There is provided an apparatus and method for identifying and measuring the electric field strength which occurs from each of RFID tags arranged in a detection target space by a receiver to grasp the state of an object. The apparatus is provided with m (m>=1) electromagnetic field generation means provided... Agent: Wolf Greenfield & Sacks, P.C.
20100019760 - Velocity-detecting device: A velocity-detecting device is mainly based on detection of charge, including a circuit board provided thereon with at least two capacitance sensors with potential difference. The two capacitance sensors are provided at different locations for detecting the time difference when a living thing moves and has its charge respectively reaching... Agent: Bacon & Thomas, PLLC
20100019761 - Rotation detection device and bearing having rotation detection device: To provide a rotation detecting system of a type having a high detecting resolution, in which the rotational position can be detected accurately, in which a sufficient gap can be secured between the sensor and the rotating body and which is effective to simplify assemblage and processing to thereby reduce... Agent: Staas & Halsey LLP
20100019762 - Wire rope flaw detector: A wire rope flaw detector includes a magnetizer having a pair of exciting magnets disposed on a back yoke such that polarities thereof are opposite to each other, and forming a main magnetic path in a predetermined segment in an axial direction of a wire rope; and a leakage magnetic... Agent: Buchanan, Ingersoll & Rooney PC
20100019763 - Method and device for measurement of the pole orientation angle of a magnetic levitation vehicle of a magnetic levitation railroad: A method for measuring the pole position of a magnetic levitation vehicle in a magnetic levitation railway, wherein a supporting magnetic field is generated on the maglev vehicle as a result of a supporting magnetic current on the vehicle side being fed to at least one supporting magnet. The voltage... Agent: Lerner Greenberg Stemer LLP
20100019765 - Method and apparatus for acquiring a magnetic resonance image of tissue containing iron oxide: In a method and apparatus for acquisition of a magnetic resonance (MR) image of tissue containing iron oxide particles frequency-selective inversion of the longitudinal magnetization in the tissue is done before acquisition of the MR image, and acquisition of the MR image is done at a zero crossing of the... Agent: Schiff Hardin, LLP Patent Department
20100019764 - Uniform magnetic field spherical coil for mri: The present invention relates to a spherical design for a magnetic resonance imaging (MRI) coil to provide a compact and light-weight highly uniform magnetic field for a variety of medical imaging applications. A preferred embodiment of the invention provides a transportable MRI system in which the spherical electromagnet can be... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP
20100019766 - System for dynamically compensating for inhomogeneity in an mr imaging device magnetic field: A system automatically dynamically compensates for inhomogeneity in an MR imaging device magnetic field. An MR imaging compensation system applies swept frequency magnetic field variation in determining an estimate of proton spin frequency at multiple individual locations associated with individual image elements in an anatomical volume of interest and substantially... Agent: Siemens Corporation Intellectual Property Department
20100019767 - Rf coil assembly for a magnetic resonance imaging system: An RF (radio frequency) coil assembly of a magnetic resonance imaging (MRI) system, which has a spiral-shaped coil and a plurality of sections. In one embodiment, an RF coil of a magnetic resonance imaging (MRI) system has a plurality of ring-shaped end-rings arranged vertically and a plurality of rods. Each... Agent: Patterson, Thuente, Skaar & Christensen, P.A.
20100019768 - Apparatus and method for metal detecting: A metal detecting apparatus includes a sensor, a current signal outputting circuit, a transforming circuit, and a micro processing unit (MPU). The sensor is configured to sense metal objects in close proximity. The current signal outputting circuit is configured to generate alternative current signals. The alternative current signals are converted... Agent: PCe Industry, Inc. Att. Steven Reiss
20100019769 - Metal detector having constant reactive transmit voltage applied to a transmit coil: An electronic metal detector having, a transmit coil arranged and adapted to transmit an alternating magnetic field associated with a reactive transmit coil voltage, the transmit coil being connected to transmit electronics arranged and adapted to generate a transmit signal, the transmit electronics having at least two power sources, a... Agent: Beyer Law Group LLP
20100019770 - Electromagnetic geological metrology system:
20100019772 - Concentric buttons of different sizes for imaging and standoff correction: A method of estimating standoff in a borehole through an earth formation, includes: disposing a sensor including a plurality of return electrodes and at least one transmitter electrode disposed in a concentric arrangement into the borehole; injecting current, I, into the formation by applying at least two frequencies of alternating... Agent: Cantor Colburn LLP- Baker Hughes Incorporated
20100019771 - Multi-resolution borehole resistivity imaging: An apparatus, method and computer-readable medium for obtaining a resistivity image of an earth formation. The apparatus includes a downhole assembly configured to be conveyed in a borehole penetrating the earth formation; a plurality of sensor electrodes on the downhole assembly, each of the plurality of sensor electrodes having a... Agent: Madan & Sriram, P.C.
20100019773 - Battery monitoring device: A battery monitoring device includes a probe for insertion into a valve of a lead acid battery. The probe includes an electrolyte monitoring probe connected to an electrolyte level sensor, and a temperature probe connected to a temperature sensor. The battery monitoring device also includes a display for communicating the... Agent: Lrk Patent Firm
20100019774 - Isolation cell with test mode: An isolation cell having a test mode, connected between a first block and a second block, wherein the first block can operate in either a power-up mode or a power-down mode, comprises: an input terminal for receiving an input signal that is derived from the first block; an output terminal... Agent: Wpat, PC Intellectual Property Attorneys
20100019775 - Short-circuit detecting circuit: A short-circuit detecting circuit which can accurately detect an output short-circuit of a class-D amplifier by a simple circuit construction. Two comparison pulse signals are formed on the basis of predetermined generating threshold values and a signal level of each of two output stage input pulse signals which are formed... Agent: Volentine & Whitt PLLC
20100019776 - Method for analyzing superconducting wire: The present disclosure relates to a system and method for analyzing a superconducting wire. A method in accordance with at least one embodiment described herein may include performing a voltage/current (VI) test for each of a plurality of portions of superconducting wire. The VI test may include determining a plurality... Agent: Holland & Knight LLP
20100019777 - Sensor system and method for operating a sensor system: A sensor system includes a first sensor, a second sensor, and an analyzer circuit, the first sensor including a first seismic mass having a first resonance frequency and the second sensor including a second seismic mass having a second resonance frequency, and the analyzer circuit being provided for analyzing a... Agent: Kenyon & Kenyon LLP
20100019778 - Physical property sensor with active electronic circuit and wireless power and data transmission: Wireless sensors configured to record and transmit data as well as sense and, optionally, actuate to monitor physical properties of an environment and, optionally, effect changes within that environment. In one aspect, the wireless sensor can have a power harvesting unit; a voltage regulation unit, a transducing oscillator unit, and... Agent: Ballard Spahr LLP
20100019779 - Potential measurement apparatus and image forming apparatus: A potential measurement apparatus for measuring a surface potential of an object of measurement detects a change in electric charge induced at a detection electrode due to electrostatic induction by changing a distance between the detection electrode and the object of measurement in accordance with a predetermined period, using a... Agent: Fitzpatrick Cella Harper & Scinto
20100019780 - Multi-axis capacitive sensor: Methods for determining the position of multiple objects concurrently disposed within a capacitive sensing region are described. In one embodiment, indicia are received from a first plurality of capacitive sensor electrodes oriented along a first axis. Indicia are received from a second plurality of capacitive sensor electrodes oriented along a... Agent: Synaptics C/o Wagner Blecher LLP
20100019781 - Electrical load detection apparatus: A load detection technique for a load comprising multiple frequency-dependant sub-loads comprises measuring a representation of the impedance characteristic of the load; providing stored representations of a multiplicity of impedance characteristics of the load; each one of the stored representations represents the impedance of the load when at least a... Agent: O''shea Getz P.C.
20100019782 - Cellular potential measurement container: The present invention provides a cellular potential measurement container that can measure a cellular potential with high accuracy while suppressing noise even when the number of the cells to be subjected to the measurement is increased. The cellular potential measurement container includes a first solution reservoir 14, a second solution... Agent: Hamre, Schumann, Mueller & Larson P.C.
20100019784 - Analyte sensor with insertion monitor, and methods: A sensor, and methods of making, for determining the concentration of an analyte, such as glucose or lactate, in a biological fluid such as blood or serum, using techniques such as coulometry, amperometry, and potentiometry. The sensor includes a working electrode and a counter electrode, and can include an insertion... Agent: Abbott Diabetes Care Inc. Bozicevic, Field & Francis LLP
20100019783 - Method, detector and system for measuring a sample concentration: A method for measuring a concentration of a sample in a sample mixture, the method comprising bringing the sample mixture in contact with an organic semiconductor transistor, applying measurement signals to electrodes of the transistor for enabling measuring a drain current through the transistor, applying a refreshment signal to the... Agent: Philips Intellectual Property & Standards
20100019785 - Method and apparatus for inspecting adhesive quality: A method and apparatus inspect a quality of an adhesive material used for joining a pair of work surfaces during a weld-bonding process. A pair of work pieces are at least partially bonded by a layer of the adhesive material, and the dynamic displacement of one or both electrodes is... Agent: Quinn Law Group, PLLC
20100019787 - Configuration of shared tester channels to avoid electrical connections across die area boundary on a wafer: A process or apparatus for testing a plurality of semiconductor dies on a semiconductor wafer utilizing a tester configured to test the dies in groups can include controlling as a logical whole provision of first test signals through a plurality of first communications channels to first probes organized into a... Agent: N. Kenneth Burraston Kirton & Mcconkie
20100019788 - Electrical testing apparatus for testing an electrical test sample and electrical testing method: An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate (12) which is electrically connected via a contact spacing converter (7) to a test head (2). The conductor substrate is mechanically connected to a first stiffening device (26) and is thereby stiffened. At least... Agent: Sughrue Mion, PLLC
20100019786 - Method and apparatus for nano probing a semiconductor chip: Various methods and apparatus for electrically probe testing a semiconductor chip with circuit perturbation are disclosed. In one aspect, a method of testing is provided that includes contacting a first nano probe to a conductor structure on a first side of a semiconductor chip. The semiconductor chip has plural circuit... Agent: Timothy M Honeycutt Attorney At Law
20100019789 - System for multiple layer printed circuit board misregistration testing: A test apparatus for determining layer-to-layer misregistration of a multiple layer printed circuit board having an electrical test pattern formed on an inner layer and an electrical test reference formed on an outer layer with the reference electrically connected to the pattern. The apparatus includes a holder for the board,... Agent: Faegre & Benson LLP Patent Docketing - Intellectual Property (32469)
20100019790 - Test handler having size-changeable test site: A test handler (122) of the present invention includes a main body, a window (142) formed on a surface of the main body and having a size corresponding to a Hi-Fix board of M×N array (where M and N represent an integer greater than a value of =), a cover... Agent: David A. Einhorn, Esq. Baker & Hostetler LLP
20100019791 - Electronic component pressing device and electronic component test apparatus: An electronic component pressing device includes a first pressing member for pressing a predetermined first region of the electronic component to be tested; a second pressing member for pressing a predetermined second region other than the first region of the electronic component to be tested; a gimbal mechanism for adhering... Agent: Osha Liang L.L.P.
20100019793 - Circuit board testing device with self aligning plates: A circuit board tester and method that precisely aligns the probe plate and circuit board is disclosed. With a circuit board and probe plate mounting within a housing having a top and bottom, hinged together, at closure there may be slight misalignments of the two. By making one of the... Agent: Altera Law Group, LLC
20100019792 - Testing module: A testing module is provided including a driving assembly, a positioning assembly and a testing head mechanism. The positioning assembly positions the driving assembly and the testing head mechanism therein. The positioning assembly includes a positioning member. The positioning member includes a base seat. The base seat defines a receiving... Agent: PCe Industry, Inc. Att. Steven Reiss
20100019794 - Integrated circuit and a method for testing a multi-tap integrated circuit: An integrated circuit that includes a controller for defining a test path that comprises at least one test access port out of multiple test access ports characterized by further comprising at least one multi-bit bypass logic for bypassing at least one of the multiple test access ports and for affecting... Agent: Freescale Semiconductor, Inc. Law Department
20100019796 - Method for evaluating silicon wafer: The present invention is a method for evaluating a silicon wafer by measuring, after fabricating a MOS capacitor by forming an insulator film and one or more electrodes sequentially on a silicon wafer, a dielectric breakdown characteristic of the insulator film by applying an electric field from the electrodes thus... Agent: Oliff & Berridge, PLC
20100019795 - Variable delay circuit, timing generator and semiconductor testing apparatus: A variable delay 50 which comprises a DA converter 51 which supplies current 51 based on delay setting data; a delay element 53 which imparts a delay amount Tpd to a prescribed signal and outputs the signal; and a bias circuit 52 which is connected such that the amount of... Agent: Muramatsu & Associates01/21/2010 > patent applications in patent subcategories.
20100013455 - Rf circuit analysis: An analysis circuit for analysing the RF response of an RF circuit, comprises a voltage controlled oscillator (12), wherein a signal derived from voltage controlled oscillator output is applied as input to the RF circuit (10). A first mixer (18) mixes the RF circuit output with a first mixer signal... Agent: Nxp, B.v. Nxp Intellectual Property & Licensing
20100013456 - Arrangement for detecting resonance frequency shifts: The present invention relates to an arrangement (1) for detection of a first resonance frequency (F1), related to a mass (1b′) loaded carrier means (1b), and to compare said first resonance frequency (F1) with a second, as a reference used, resonance frequency (F2), related to said carrier means (1b), by... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
20100013457 - Power line takeoff clamp assembly: In a power line takeoff clamp assembly and method of use thereof an electrical power distribution line is clamped to a body of the clamp assembly. A power takeoff supported by the body clamped to the power line generates direct current from alternating current flowing in the power line. One... Agent: The Webb Law Firm, P.C.
20100013458 - Semiconductor device for measuring ultra small electrical currents and small voltages: A semiconductor device for measuring ultra low currents down to the level of single electrons or low voltages comprises a first and a second voltage supply terminal, an input terminal for receiving an electrical current or being supplied with a voltage to be measured, a bipolar transistor having a base,... Agent: Nixon Peabody LLP
20100013459 - Circuits and methods for high-efficiency on-chip power detection: Power detector integrally formed within a printed transmission line to capacitively couple a portion of signal power propagating on the printed transmission line and a power detector circuit that receives coupled power output from the power detector to detect a power level of the signal power. The power detector is... Agent: F. Chau & Associates, LLC
20100013460 - Rogowski sensor and method for measuring a current: A Rogowski sensor is provided for measuring a current of an electrical conductor. The sensor has a Rogowski coil, which has an electrical winding resistor, and an integration device which is connected to the Rogowski coil and is intended to generate an output signal which is proportional to the electrical... Agent: Lerner Greenberg Stemer LLP
20100013461 - Magnetic body detector: R
20100013465 - Force measuring device and method for signal evaluation: A force measuring device is provided, which comprises a transducer device that has a plurality of magnets and generates a magnetic field, and a sensor device that is sensitive to a magnetic field and is arranged in a space in front of the transducer device, the transducer device and the... Agent: Leydig Voit & Mayer, Ltd
20100013464 - Inductive proximity sensor for embedded mounting and method of design: The invention relates to an inductive proximity sensor for embedding in a mild steel mounting plate, comprising an enclosure with a front wall of synthetic material forming a sensing face at a front end of the enclosure, an oscillator comprising a sensor coil with a core made of a material... Agent: Ostrolenk Faber Gerb & Soffen
20100013462 - Instrument for automation with single-handed operation: In a measuring device for automation technology with single-hand servicing, a housing closable with a lid is provided. Arranged at an edge of the lid is a movable ring element, which is mounted to be slightly shiftable parallel to the longitudinal axis of the lid and to be rotatable about... Agent: Bacon & Thomas, PLLC
20100013463 - Rotation sensor: A rotation detecting sensor (A) is fixed to a sensor fixing member (7), through which it is fitted to a wheel support bearing assembly for detecting the rotation of a rotatable ring of the wheel support bearing assembly. A sensor unit (B) is made up of a sensor element (1)... Agent: Staas & Halsey LLP
20100013466 - Magnetic angle sensor: In order to be able to measure over more than 360° with a magnetic angle sensor, it is proposed not to adjust the distance between the encoder magnet and the sensor element in addition to the rotation, e.g. by means of a thread, like in the prior art, but to... Agent: Head, Johnson & Kachigian
20100013467 - Rotation sensor: A rotation sensor includes a detecting portion, a rotational state determining portion and a pulse generating portion. The detecting portion detects a rotation of a rotational member and outputs a detection signal. The rotational state determining portion determines a rotational state of the rotational member on the basis of the... Agent: Sughrue Mion, PLLC
20100013468 - Method and device for eddy current imaging for the detection and the characterisation of defects hidden in complex structures: processing (90) the images. The generating step (74, 82) involves generating a set of at least two exciting magnetic field waveforms; the measuring step (76, 86) involves measuring a set of configurations of the resultant magnetic field in the form of images; the step (90) of treating the images by... Agent: Young & Thompson
20100013469 - Method and device for simultaneous measurement of magnetostriction and magnetization: Since a measurement of a magnetostriction is accompanied by a measurement of a magnetization of a sample to be measured, the magnetostriction and the magnetization are measured by separately prepared devices, with efforts for observing the coextensive volumes of the sample. Measurements of the magnetostriction and the magnetization are difficult... Agent: Oliff & Berridge, PLC
20100013470 - Residual magnetic flux determining apparatus: A residual magnetic flux measurement apparatus measures residual magnetic fluxes by using a transformer-voltage measurement means for measuring transformer voltages; a voltage delay means for delaying the measured signals; a DC-voltage-component calculation means for calculating DC voltage components from the latest transformer-voltage signals for a predetermined time period based on... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.
20100013471 - Mr magnetometer with combined flip coil and compensation coil: Compensation coil functionality and flip coil functionality are combined into a single combination coil that is placed under an angle α with respect to the length direction of a magneto-resistive sensor element. The angle α substantially deviates from 0° and 90°. This configuration enables to reduce the width of the... Agent: Nxp, B.v. Nxp Intellectual Property & Licensing
20100013473 - Magnet arrangement and method for providing a magnetic field in a sensitive volume: A magnet arrangement includes (a) a first and a second head ring magnet each having a substantially circular geometry with respect to a centre axis and (b) a central ring magnet having a substantially circular geometry with respect to a centre axis. The central ring magnet is disposed between the... Agent: Bainwood Huang & Associates LLC
20100013475 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: A magnetic resonance imaging apparatus includes a data acquisition unit and an image data generating unit. The data acquisition unit acquires plural pieces of magnetic resonance data for generating plural species of image data of which contrasts are mutually different from a same object with mutually different data amounts by... Agent: Nixon & Vanderhye, PC
20100013472 - Method and apparatus for coil array compression: A method of processing magnetic resonance imaging signals from a plurality of receiver coils of a magnetic resonance imaging system, comprises the steps of receiving from said plurality of receiver coils a corresponding plurality of original signals in the time-domain forming an n-dimensional signal vector νk wherein n is the... Agent: Mccormick, Paulding & Huber LLP
20100013474 - Method and apparatus for providing a sensitive volume for single-sided nmr: An apparatus for providing a sensitive volume for single-sided NMR includes: (i) at least one first permanent magnet for providing a first magnetic field at the sensitive volume; and (ii) at least one of the following means for superimposing at least one second magnetic field for homogenizing the first magnetic... Agent: Bainwood Huang & Associates LLC
20100013476 - Method and system for comparing micro-electronic devices using magnetic resonance imaging: A method of comparing micro-electronic devices. The method includes: placing a first micro-electronic device in a sample chamber of a magnetic resonance imaging machine, subjecting the first micro-electronic device to a magnetic field and a radio frequency pulse, turning off or adjusting the magnetic field and detecting a first returned... Agent: Schmeiser, Olsen & Watts
20100013478 - Magnetic resonance imaging device: A magnetic resonance imaging device includes magnetic field generating means and control means for controlling receiving means according to a predetermined pulse sequence, the predetermined pulse sequence including an unnecessary material suppressing sequence unit for canceling a signal from an unnecessary material which is not a measurement target and a... Agent: Cooper & Dunham, LLP
20100013479 - Method and magnetic resonance system to excite nuclear spins in a subject: In a method and system to generate an excitation in an examination subject to acquire magnetic resonance signals from a region of the examination subject, basic magnetic field is generated, an adiabatic half-passage (AHP) pulse is radiated to generate a transverse magnetization in the subject, and at least one first... Agent: Schiff Hardin, LLP Patent Department
20100013480 - Nuclear magnetic resonance imaging device, and imaging system and imaging method using the same: A nuclear magnetic resonance imaging device 1A is configured by a substrate, a magnetic field applying electrode group 20 provided being integrated on a measurement surface of the substrate, for setting a local measurement position in a measurement region 12 of nuclear magnetic resonance by applying a magnetic field to... Agent: Patterson & Sheridan, L.L.P.
20100013477 - Slice selective mri excitation with reduced power deposition using multiple transmit channels: Described are embodiments for slice-selective excitation for MRI that utilize multiple RF transmit coils, each of which are driven with a separate independent current waveform. These embodiments allow slice-selective excitation with slice profile and excitation time similar to other single-channel excitation, but with reduction in SAR caused by the transverse... Agent: Mcdermott Will & Emery LLP
20100013482 - Magnetic resonance phantom systems and methods: According to one aspect, a magnetic resonance (NMR or MRI) phantom includes a spherical or quasi-spherical casing enclosing an internal chamber, and an internal phantom structure situated within the internal chamber. The casing includes alignment features allowing the sequential alignment/orientation of the phantom along three orthogonal axes. In some embodiments,... Agent: Varian Inc. Legal Department
20100013484 - Transmission line for use in magnetic resonance system: An electrically conductive transmission cable for supplying a DC signal safely to an electrical device in the presence of radio-frequency (RF) fields in a magnetic resonance (MR) is disclosed herein. The transmission cable comprises a transmission line (STL) comprising at least a first segment (S1) and a second segment (S2),... Agent: Philips Intellectual Property & Standards
20100013483 - Tunable radio-frequency coil: A radio frequency (RF) coil comprising a plurality of electrically uninterrupted conductive legs, each leg having a first end and a second end, and at least one continuous conductor electrically connected to the first ends of the legs. Frequency tuning of the coil is achieved by translating, along the legs,... Agent: Sunstein Kann Murphy & Timbers LLP
20100013486 - Method for attenuating air wave response in marine electromagnetic surveying: A method for measuring the electromagnetic response of formations below the bottom of a body of water includes positioning at least one electromagnetic transmitter and at least one electromagnetic receiver in the body of water each at a selected depth below the water surface. A transient electric current is passed... Agent: E. Eugene Thigpen Petroleum Geo-services, Inc
20100013485 - Surveying using vertical electromagnetic sources that are towed along with survey receivers: A system to perform a marine subterranean survey includes at least one vertical electromagnetic (EM) source and at least one EM receiver to measure a response of a subterranean structure that is responsive to EM signals produced by the vertical EM source. At least one tow cable is used to... Agent: Westerngeco L.L.C. Kevin Mcenaney
20100013487 - Tool for electrical investigation of a borehole: s
20100013488 - Measuring head and measuring method: A measuring head for use in electrical measurements conducted in holes drilled in the ground comprises an elongated body, adaptable in the hole and comprising an electrode, electrically connecting the measuring head with its surroundings, for transmitting an electrical signal between the measuring head and its surroundings. In accordance with... Agent: Merchant & Gould PC
20100013489 - Electronic battery tester: m
20100013490 - Fuel cell system: When the operation point of a DC/DC converter, which steps up/down the output voltage of a fuel cell stack, is in a range of reduction in response capability and further there is issued a request of determining an AC impedance, a controller switches numbers of the drive phases of the... Agent: Kenyon & Kenyon LLP
20100013491 - Device, system and method for automatic self-test for a ground fault interrupter: A self-test circuit is provided that includes a signal circuit adapted to periodically output a circuit inhibitor signal to inhibit a breaking signal from a ground fault detector. The signal circuit is also adapted to periodically output a test signal simulating a ground fault. The self-test circuit also includes an... Agent: Siemens Corporation Intellectual Property Department
20100013492 - Storage battery inspecting system: A storage battery inspecting system includes a power supply unit and an inspecting unit. The inspecting unit includes two inspecting terminals to be connected to a battery soldering spot so as to detect response of the soldering spot to application of a test power signal by the power supply unit,... Agent: Ladas & Parry
20100013493 - Test prepared integrated circuit with an internal power supply domain: The integrated circuit (10) has an internal power supply domain with a power supply voltage adaptation circuit (14) to adapt the power supply voltage in the power supply domain. Typically, a plurality of such domains is provided wherein the power supply voltage can be adapted independently. During testing an internal... Agent: Nxp, B.v. Nxp Intellectual Property & Licensing
20100013494 - Electrical partial discharge pulse market discrimination: A marker pulse discriminator monitor that enables filtering of partial discharge pulses for monitoring the condition of a generator in a power plant system. The monitor detects partial discharge pulses emanating from the generator and includes a plurality of first modules connected to respective isophase buses adjacent to the generator.... Agent: Siemens Corporation Intellectual Property Department
20100013496 - Branch circuit black box: A branch circuit black box for use in a building electrical system having service entrance, current protection switches (circuit breakers or fuses), and a power distribution system includes a plurality of sensors positioned adjacent to the distribution wires, wherein the sensor data is collected, analyzed and stored by a robust... Agent: Jay R. Goetz
20100013495 - Testing card for peripheral component interconnect interfaces: A testing card for peripheral component interconnection (PCI) interface includes a body, a plurality of PCI pins, a PCI interface chip, and a plurality of PCI testing pins. The PCI pins are mounted to the body. The PCI interface chip is mounted to the body and connected to the PCI... Agent: PCe Industry, Inc. Att. Steven Reiss
20100013497 - Remote sensor system for monitoring the condition of earthen structure and method of its use: A system and associated method permit remote monitoring of subsurface structure for purposes of early detection and location of hidden anomalies, e.g., water seepage in levees. Anomalies may be due to sand boils or displacement of underlying soil. Representative systems provide continuous monitoring via two complementary means: parallel pairs of... Agent: Humphreys Engineer Center Support Activity Attn: Cehec-oc (kingman Building)
20100013498 - System and method to determine the impedance of a disconnected electrical facility: A signal injection unit injects a test signal at a main frequency between a reference point of an electric circuit and ground, where the electric circuit is connected with the facility and injects another test signal at a second main frequency between a reference point of the electric circuit and... Agent: St. Onge Steward Johnston & Reens, LLC
20100013499 - In-molded capacitive sensors: In a method for forming an in-molded capacitive sensing device a plastic film is provided, the plastic film comprising a first side and a second side. A capacitive sensor pattern is disposed on at least a portion of the second side, the capacitive sensor pattern including a region for facilitating... Agent: Synaptics C/o Wagner Blecher LLP
20100013500 - Production line detection apparatus and method: The present invention relates to the field of detection apparatus and/or methods. One aspect relates to an apparatus and/or detection methods for sensing material and/or detection of a predetermined characteristic within a detection zone. Another aspect relates to a method for improving the accuracy of an inspection device by capturing... Agent: Sughrue Mion, PLLC
20100013501 - Capacitive mems sensor device: The present invention relates to a capacitive MEMS sensor device for sensing a mechanical quantity. To provide such a capacitive MEMS sensor device which enables fast recovery from (near) sticking after a mechanical overload situation it is proposed that the sensor device comprises:—a first bias voltage unit (V1) for supplying... Agent: Nxp, B.v. Nxp Intellectual Property & Licensing
20100013502 - Evaluation circuit for capacitance and method thereof: In an evaluation method, voltages at ends of a to-be-measured capacitor and a capacitance-adjustable circuit are switched in response to a first set of clock signals so as to adjust an integrated voltage to be a sum of the integrated voltage and a first difference voltage. Next, whether a first... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP
20100013503 - Dc test resource sharing for electronic device testing: A test system can include contact elements for making electrical connections with test points of a DUT. The test system can also include a DC test resource and a signal router, which can be configured to switch a DC channel from the DC test resource between individual contact elements in... Agent: N. Kenneth Burraston Kirton & Mcconkie
20100013504 - Probe apparatus, a process of forming a probe head, and a process of forming an electronic device: A probing apparatus includes a set of conductors configured to contact a surface of a workpiece simultaneously. A processor activates subsets of the conductors to determine a four-point-probe parameter, wherein the subset is less than the set of conductors. Another subset determines another four-point-probe parameter. The set of conductors remain... Agent: Larson Newman & Abel, LLP
20100013505 - Probe card for inspecting solid state imaging device: The present invention is provided to quickly and efficiently inspect a plurality of CCD sensors. In the present invention, a plurality of openings is formed in a circuit board of a probe card. A plurality of vertical-type probe pins is connected to a lower surface of the circuit board. A... Agent: Pearne & Gordon LLP
20100013506 - Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device: In an embodiment, a semiconductor device is tested using a probe pad that includes a probing region with which a probe needle makes contact, and a sensing region bordering an edge of the probing region. Electrical signals are applied, and measured results indicate the probe needle's location relative to a... Agent: Marger Johnson & Mccollom, P.C.
20100013507 - Panel circuit structure: A panel circuit structure for transmitting electrical signals to an active area is provided. The panel circuit structure includes a first transmission pad, a first test pad, a second transmission pad, a second test pad, and a third transmission pad, which are connected to a driving element. The first transmission... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP
20100013508 - Probe card cassette and probe card: A holding section (2) holds a probe card (1). Transport mechanisms (3a to 3d) have the function of transporting the probe card (1) from the holding section (2). A lock mechanism (4) is provided for the transport mechanism (3d). When the probe card cassette is placed in prober equipment, the... Agent: Mcdermott Will & Emery LLP
20100013509 - Prober and semiconductor wafer testing method using the same: A prober for a semiconductor wafer test includes a stage, a probe card, and an adjuster The stage has a first region and a second region other than the first region The first region is covered by a wafer on which a plurality of electrode pads is provided. The probe... Agent: Young & Thompson
20100013510 - Systems and methods for defect testing of externally accessible integrated circuit interconnects: Apparatus and methods provide built-in testing enhancements in integrated circuits. These testing enhancements permit, for example, continuity testing to pads and/or leakage current testing for more than one pad. The disclosed techniques may permit more thorough testing of integrated circuits at the die level, thereby reducing the number of defective... Agent: Knobbe Martens Olson & Bear LLP
20100013511 - Intelligent multi-meter with automatic function selection: Intelligent Multi-meter with Automatic function selection A measuring device with the function of automatically determining the type of device under test (DUT) and selecting measuring function, comprising: a controller for sequentially providing a plurality of checking phases; a protection circuit connecting to input end and protecting the measuring device; a... Agent: Sinorica, LLC
20100013512 - Apparatus and methods for through substrate via test: A stack of vertically-connected, horizontally-oriented integrated circuits (ICs) may have electrical connections from the front side of one IC to the back side of another IC. Electrical signals may be transferred from the back side of one IC to the front side of the same IC by means of through... Agent: Schwegman, Lundberg & Woessner/micron
20100013515 - Electrostatic discharge protection device, method of manufacturing the same, method of testing the same: An electrostatic discharge protection device, a method of manufacturing the same, and a method of testing the same. The electrostatic protection device includes a plurality of device isolation regions formed in a semiconductor substrate at a predetermined width and a predetermined depth that each sequentially increase from a circuit device... Agent: Sherr & Vaughn, PLLC
20100013513 - Test device and semiconductor integrated circuit device: Test devices and integrated circuits with improved productivity are provided. In accordance with example embodiments, a test device may include a first test region with a first test element and a second test region with a second test element defined on a semiconductor substrate. The first test element may include... Agent: Harness, Dickey & Pierce, P.L.C
20100013514 - Test device and semiconductor integrated circuit device: A test device and a semiconductor integrated circuit are provided. The test device may include a first test region and a second test region defined on a semiconductor substrate. The first test region may include a first test element and the second region may include a second test element. The... Agent: Harness, Dickey & Pierce, P.L.C01/14/2010 > patent applications in patent subcategories.
20100007325 - Hose with fault detection capability: A hose fault detection system includes a hose assembly and a fault detector. The hose assembly includes a first conductive layer, second conductive layer, and an intermediate layer that is disposed between the first and second conductive layers. Each of the first and second conductive layers has an electrical characteristic.... Agent: Quinn Law Group, PLLC
20100007326 - Material detector: [Solving Means] A charge detection field effect transistor and a control circuit therefor are provided in each cell, and the control circuit controls the charge detection field effect transistor so that the drain-source voltage and the drain current of the charge detection field effect transistor are always maintained constant. The... Agent: Mcginn Intellectual Property Law Group, PLLC
20100007327 - Measurement apparatus, test apparatus and measurement method: Provided is a measurement apparatus that measures a current flowing through a load, including a power supply section that outputs a current supplied to the load; a current measuring section that measures a load current flowing between the load and the power supply section; a switch that is connected in... Agent: Jianq Chyun Intellectual Property Office
20100007328 - Power switch with an overcurrent protection device: A power circuit comprises a power transistor for feeding a load current to a load, a measuring transistor for coupling out a measurement current dependent on the load current, at least two coupling transistors for dividing the measurement current into an internal measurement current and into an external measurement current,... Agent: Patterson, Thuente, Skaar & Christensen, P.A.
20100007329 - Device and method for the analysis of a measured signal transmitted via a multi-channel system: A device, in particular, a multi-channel oscilloscope, for the analysis of at least one measured signal transmitted via a multi-channel system, with several measurement channels. The device includes in each case a sampling device, a baseband mixing device, and a filter device, and an analysis device. The measured signal is... Agent: Ditthavong Mori & Steiner, P.C.
20100007330 - Hand-held phase-shift detector for sensor applications: The invention is directed to a novel phase-shift detector capable of interfacing with an array of sensors. The detector is light-weight, portable and capable of fitting within the palm of a hand. The detector may be used in conjunction with a variety of diagnostic, biosensor and chemical sensor applications.... Agent: Knoble, Yoshida & Dunleavy
20100007332 - Method and apparatus for evaluating rapid changes in current: In order to detect and evaluate changes in current as a result of electric arcs, a sensor signal, differentiated on the basis of time, is produced with a sensor-dependent frequency bandwidth whose upper cutoff frequency is 40 MHz and whose lower cutoff frequency is 100 kHz. The sensor signal is... Agent: Lerner Greenberg Stemer LLP
20100007331 - Self-balancing frequency determining bridge: A self-balancing Wheatstone bridge that provides frequency and power information. The frequency information obtained can be applied to correct the power measurement to provide excellent match, excellent frequency insensitivity, good dynamic range, good frequency range, and adequate frequency accuracy. The system is highly responsive, simple, and cost effective.... Agent: Stainbrook & Stainbrook, LLP
20100007333 - Wide area protection control measurement system and method: The present invention provides a wide area protection control measurement system and method which excels in economy, reliability and expandability, in which applied arithmetic operation functions for protection, control and measurement can be freely added and changed, without adding or changing power monitoring terminals to be installed in the electric-supply... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
20100007335 - Measuring apparatus: A measuring apparatus, in particular for measuring current, is provided. In at least one embodiment, the measuring apparatus includes a sensor and an evaluation device which is coupled or can be coupled thereto, in which the coupling is effected contactlessly, in particular by way of a transponder interface. As such,... Agent: Harness, Dickey & Pierce, P.L.C
20100007334 - Power sourcing equipment device and method of providing a power supply to a powered device: In a particular embodiment, a power sourcing equipment (PSE) device includes a plurality of network ports adapted to communicate data and to selectively provide power to one or more powered devices via a plurality of channels. The PSE device further includes a plurality of sense elements, where each sense element... Agent: Schwegman, Lundberg & Woessner, P.A.
20100007336 - System for accurately detecting electricity theft: There is disclosed a method of monitoring an electrical network of the type having a feeder line connected to a plurality of distribution transformers, each distribution transformer being in turn coupled to a load which may be provided with a customer meter. The method includes the steps of recording an... Agent: Elias Borges Suite 406
20100007337 - Plasma-facing probe arrangement including vacuum gap for use in a plasma processing chamber: An arrangement for measuring process parameters within a processing chamber is provided. The arrangement includes a probe arrangement disposed in an opening of an upper electrode. Probe arrangement includes a probe head, which includes a head portion and a flange portion. The arrangement also includes an o-ring disposed between the... Agent: Ipsg, P.C.
20100007338 - Apparatus and method for in-field magnetic measurements: A magnetic field verifier apparatus includes a magnetic field detection element configured to produce a voltage signal in response to an applied magnetic field wherein the voltage signal corresponds to the strength of the applied magnetic field. A current source coupled to the magnetic field detection element provides a stimulating... Agent: Fitch Even Tabin & Flannery
20100007339 - Integrated sensor and magnetic field concentrator devices: Embodiments of the invention are related to integrated sensor and magnetic concentrator devices and methods. In one embodiment, an integrated circuit comprises a sensor device and a magnetic field concentrator. The sensor device comprises a first sensor element, a second sensor element, and a third sensor element, the first sensor... Agent: Patterson, Thuente, Skaar & Christensen, P.A.
20100007340 - Angle detecting apparatus and angle detecting method: An angle detecting apparatus includes a rotor fixed to a rotating shaft, a pair of magnetic sensors arranged opposite each other so as to output a first detection signal and a second detection signal, respectively, each of which contains information on the angle of rotation of the rotor, a differential... Agent: Oliff & Berridge, PLC
20100007341 - Rotation angle detection device: A rotation angle detection device for detecting rotation angle of a rotator to be measured includes magnetic detection elements which are fixed to the circumference of the rotating body to be measured and detect magnetic flux density of magnet which is rotated with said rotating body to be measured. The... Agent: Turocy & Watson, LLP
20100007342 - High resolution and flexible eddy current array probe: Disclosed is a method and an NDT/NDI probe deploying a slit or a flexible joint of probe bending region, preferably between two rows of probe elements to allow free bending between rows of probe elements and along the direction of the rows of elements and to allow two adjacent rows... Agent: Ostrolenk Faber Gerb & Soffen
20100007343 - Thin film magnetic field sensor: A magnetic field effect sensor system having giant magneto-impedance elements. The elements may be elongated strips, and in proximity to and parallel with one another, and connected in series with connections or electrodes. The elements may have a regular shape without turns. They may have a single- or multi-layer structure.... Agent: Honeywell International Inc. Patent Services
20100007344 - Mtj based magnetic field sensor with esd shunt trace: Presented herein is a shunted MTJ sensor formed of a plurality of electrically connected MTJ cells for measuring magnetic fields and currents and its method of fabrication. To provide stable single domain magnetic moments of the MTJ cells and to ensure that the magnetic moments return to a fixed bias... Agent: Saile Ackerman LLC
20100007345 - Polarization analyzer orientation: An apparatus in one example comprises a polarization filter and a polarization analyzer. The polarization filter comprises a first polarization axis. The polarization analyzer comprises a second polarization axis. The polarization filter is configured to polarize detection light for a nuclear magnetic resonance (NMR) cell along the first polarization axis.... Agent: Carmen Patti Law Group , LLC
20100007346 - Method for determining attenuation values of an object: A method for determining attenuation values of an object is disclosed. In at least one embodiment, the method includes stationary positioning of the object, irradiation of the object via a radiation source, measurement of the object's transmission data via a detection system, determination of at least one geometric property of... Agent: Harness, Dickey & Pierce, P.L.C
20100007347 - Split gradient coil for mri: An MR system comprising an improved gradient coil that does not compromise patient comfort is disclosed herein. The MR system is either a bore-type or a gap-type system and comprises a main magnet (102, 502) arranged to generate a main magnetic field; an examination region (118, 518) having a central... Agent: Philips Intellectual Property & Standards
20100007348 - Anisotropy orientation image from resistivity measurements for geosteering and formation evaluation: A method for providing an image of a formation surrounding a wellbore, includes: obtaining an apparent conductivity curve from main components of resistivity measurements of the formation; performing fitting for cross-components of the resistivity measurements; calculating scaling factors from the cross-component data; scaling apparent conductivity data by the calculated scaling... Agent: Cantor Colburn LLP- Baker Hughes Incorporated
20100007349 - Method and apparatus for focusing in resistivity measurement tools using independent electrical sources: A system for measuring a resistivity parameter of an earth formation includes: at least one measurement electrode electrically connected to a first electrical source; at least one guard electrode; a shielding electrode interposed between the at least one guard electrode and the at least one measurement electrode, the shielding electrode... Agent: Cantor Colburn LLP- Baker Hughes Incorporated
20100007350 - Over voltage transient controller: An over voltage transient controller to protect a rechargeable battery from an over voltage transient condition. The over voltage transient controller may comprise a comparator to compare a first signal with a second signal representative of a reference voltage level and to provide an output signal representative of an over... Agent: O2m/gtpp
20100007351 - Assembled-battery voltage measuring device and assembled-battery voltage system using it: A voltage measuring device includes a sample-and-hold circuit which alternates between (a) a sample mode in which a signal input from a cell to be measured is sampled so that a voltage across a first capacitor becomes equal to a voltage across the cell to be measured, and a voltage... Agent: Charles N.j. Ruggiero, Esq. Ohlandt, Greeley, Ruggiero & Perle, L.L.P.
20100007352 - Fiber optic fault detection system and method for underground power lines: Embodiments of the present invention are directed to a method and fault detection system for detecting and identifying the location of faults in underground power lines that can effectively and quickly identify faults in underground power lines. Embodiments can provide a method and fault detection system that quickly identify faults... Agent: Saliwanchik Lloyd & Saliwanchik A Professional Association
20100007353 - Group of circuits and testing method thereof and testing machine thereof: A Group of circuits and a testing method thereof and a testing machine thereof are provided. In the testing method, a first voltage of a first circuit is adjusted to be a second voltage according to a first adjusting signal, wherein the second voltage is closer to a standard voltage... Agent: J C Patents
20100007354 - System and method for predicting a fault in a power line: A system and method for detecting an arc of a medium voltage power line, such as an underground power line cable, is provided. In one embodiment the method comprises receiving voltage measurement data of the alternating voltage of the medium voltage power line, receiving current measurement data of the current... Agent: Capital Legal Group, LLC
20100007355 - Method for testing radio frequency (rf) receiver to provide power correction data: A method for testing a radio frequency (RF) receiver as a device under test (DUT) with one or more test instruments to provide a plurality of relative power correction factors, a plurality of received signal strength indication (RSSI) calibration factors, or both.... Agent: Vedder Price P.C.
20100007356 - Electromagnetic shielding defect monitoring system and method for using the same: An embodiment disclosed herein is directed to a method of monitoring an electromagnetic shield effectiveness comprising transmitting a first electromagnetic field toward a first surface of an electromagnetic shield, detecting a second electromagnetic field transmitted from a second surface of the electromagnetic shield, generating a first signal corresponding to the... Agent: Fitch Even Tabin & Flannery
20100007357 - Electrical impedance tomography method and device: Electrical impedance tomography method comprising: an electrical measurement step during which pre-determined electrical conditions are imposed on the surface of a medium to be imaged, while generating a mechanical disturbance at predefined points of the medium by locally modifying the impedance of the medium and an electrical parameter is measured... Agent: Miller, Matthias & Hull
20100007358 - Sensor for high voltage environment: Sensor for measuring electrical parameters in a high voltage environment comprising a high voltage side (4) for connection to high voltage conductors, a low voltage side (6) for connection to low voltage power supply and measurement signal control circuitry, a measurement signal circuit (16), and a power supply circuit (14),... Agent: Baker & Daniels LLP
20100007359 - Passive capacitively-coupled electrostatic (cce) probe arrangement for detecting in-situ arcing events in a plasma processing chamber: An arrangement for detecting in-situ arcing events within a processing chamber of a plasma processing system during substrate processing is provided. The arrangement includes a probe arrangement, which is disposed on a surface of the processing chamber and is configured to measure at least one plasma processing parameter. The probe... Agent: Ipsg, P.C.
20100007360 - Fluid sensor device: The invention provides a fluid sensor device (1; 1′; 1′; 1″) for detecting a dielectricity constant of a fluid (30) present in a fluid line (20), comprising a housing (5; 5′; 5′; 5″); a plate capacitor device provided on the inside of the housing (5; 5′; 5′; 5″), the plate... Agent: Michael J. Striker
20100007361 - Power supply device and sequencer system: A smoothing unit includes a first and a second smoothing capacitors, a first and a second discharge resistors connected in parallel to both ends of the first and the second smoothing capacitors, respectively. During a normal operation, both the first and the second smoothing capacitors are connected electrically to a... Agent: Sughrue Mion, PLLC
20100007362 - Rf-biased capacitively-coupled electrostatic (rfb-cce) probe arrangement for characterizing a film in a plasma processing chamber: A method for characterizing deposited film on a substrate within a processing chamber during processing is provided. The method includes determining voltage-current characteristic for a probe head when measuring capacitor is set at a first capacitance value. The method also includes applying RF train to the probe head when measuring... Agent: Ipsg, P.C.
20100007363 - System and method for determining in-line interfacial oxide contact resistance: The present invention relates generally to semiconductor wafer fabrication and more particularly but not exclusively to advanced process control methodologies for measuring in-line contact resistance in relation to oxide formations. The present invention, in one or more implementations, include an in-line method of determining contact resistance across a semiconductor wafer... Agent: Sawyer Law Group PC
20100007364 - Hot testing of semiconductor devices: A testing apparatus for testing of integrated circuit devices at elevated temperatures comprises hot belt 111 is operable to transport integrated circuits from a main production line into a hot chamber 121 and thence onto a test area 122 within the hot chamber 121 and a cold belt 112 operable... Agent: Townsend And Townsend And Crew, LLP
20100007365 - Socket for double ended probe, double ended probe, and probe unit: A socket for a double ended probe with a first probe and a second probe includes a hollow pipe member housing the first probe and the second probe, the first probe and the second probe are arranged in an axial direction of the socket, and the socket includes an abutment... Agent: Westerman, Hattori, Daniels & Adrian, LLP
20100007366 - Test equipment and semiconductor device: An interface circuit is connected to an ATE via a test control bus BUS3 that differs from main buses, receives a control signal output from the ATE, and controls multiple BIST circuits according to the control signal. Furthermore, a DUT is configured such that a test result signal specified by... Agent: Martine Penilla & Gencarella, LLP
20100007367 - Packaged die heater: A heater for heating packaged die for burn-in and heat testing is described. The heater may be a ceramic-type heater with a metal filament. The heater may be incorporated into the integrated circuit package as an additional ceramic layer of the package, or may be an external heater placed in... Agent: Honeywell/s&s Patent Services
20100007368 - Semiconductor integrated circuit and method of testing the same: Provided is a semiconductor integrated circuit including: a first path that includes a first logic circuit; a second path that includes a second logic circuit; and a subsequent-stage circuit that is connected to an output of the first path and is connected to an output of the second path, in... Agent: Mcginn Intellectual Property Law Group, PLLC
20100007369 - Display substrate and apparatus and method for testing display panel having the same: A display substrate includes a gate pad part, a source pad part, a first static dissipative part, and a first test part. A gate pad part is formed on one terminal of each of a plurality of gate lines and transfers signals to the gate lines. A source pad part... Agent: Cantor Colburn, LLP
20100007370 - Apparatus, system, and method for error detection in a stand alone power supply: An apparatus for error checking in a power supply includes a power module that determines that the power supply is in a self-test condition. The self-test condition involves the power supply being connected to an input power source while it is disconnected from the electronic load that it normally services.... Agent: Kunzler & Mckenzie01/07/2010 > patent applications in patent subcategories.
20100001714 - Detector for calculating the depth of a buried conductor: A detector for calculating a depth of a buried conductor comprises a plurality of antennas B, M T for detecting an electromagnetic field radiated by the conductor and means for calculating the depth of said conductor based on the field detected by the antennas B, M, T. The calculated depth... Agent: Baker & Hostetler LLP
20100001712 - System for and method of detecting a buried conductor: A system for detecting a buried conductor comprises a transmitter for producing an alternating test current in the buried conductor and a receiver for detecting an electromagnetic field produced by the test current in the buried conductor. A communication link is provided between the receiver and the transmitter. The receiver... Agent: Baker & Hostetler LLP
20100001713 - System for and method of detecting a buried conductor: A system for detecting a buried conductor comprises a transmitter for producing an alternating test current in the buried conductor and a receiver for detecting an electromagnetic field produced by the test current in the buried conductor. A communication link is provided between the receiver and the transmitter. The test... Agent: Baker & Hostetler LLP
20100001715 - Folding current sensor: The invention provides a current sensor that may be folded over a conductor without the need to sever the conductor or thread the conductor through the current sensor. In one embodiment, the current sensor includes an outer body having a first folding portion and a second folding portion coupled to... Agent: Daly, Crowley, Mofford & Durkee, LLP
20100001716 - Direct current measuring device with wide measuring range, electro-technical unit comprising one such measuring device and switchgear unit having one such electro-technical unit: A direct current measuring device comprising at least one first magnetic sensor and at least one second magnetic sensor sensitive to a magnetic field generated by an electric current flowing in a conductor. The measuring device comprises a processing unit connected to the magnetic sensors and designed to generate an... Agent: Steptoe & Johnson LLP
20100001717 - Annular magnetic encoder: Magnetization pattern by the specific pole portion (2b) and the different pole portions (2c) is characterized by being formed line symmetrical relative to the central traverse line of the unequal pitch region (20), and the area of the specific pole portion (2b) is formed so as to occupy 40 to... Agent: Bacon & Thomas, PLLC
20100001718 - Inductive position sensor: A detector to measure the displacement of relatively moveable bodies along an axis comprising: a resonant electrical intermediate device further comprising an inductor, whose width varies along the displacement axis, and a capacitor in electrical series which co-operates with an antenna comprising transmit and receive windings whose mutual inductance varies... Agent: Renner Otto Boisselle & Sklar, LLP
20100001719 - Sensor magnet holder for use in motor and its manufacturing process: A sensor magnet holder is mounted on a motor shaft, and a sensor magnet is provided relative to a magnetic induction sensor on the non-moving side for obtaining a signal indicative of a rotational position of the motor shaft. The sensor magnet holder integrally forms a cylindrical portion, a flange... Agent: Knoble, Yoshida & Dunleavy
20100001721 - Rotation angle sensor: A rotation angle sensor providing excellent output characteristics is provided. The rotation angle sensor has a structure in which a ring-shaped permanent magnet provided so as to be rotatable integrally with a rotor connected to a member to be detected; magnetic flux gathering yokes surrounding the outer circumferential surface of... Agent: Rader Fishman & Grauer PLLC
20100001720 - Rotation sensor-equipped bearing device for wheel: A rotation sensor equipped wheel support bearing assembly detects rotational speed and rotational direction, in which a high resolution rotation signal is utilized in various vehicle controls with a suppressed size. The bearing assembly includes a plurality of rows of rolling elements between rolling surfaces in outer and inner members.... Agent: Staas & Halsey LLP
20100001722 - Magnetic sensor device with suppression of spurious signal components: The invention relates to a magnetic sensor device for the determination of magnetized particles (3) which comprises a magnetic field generator (1, 1′)(e.g. a conductor wire) that is driven with an excitation current (I1) of a first frequency (f1), and a magnetic sensor element (2) (e.g. a GMR resistance), that... Agent: Philips Intellectual Property & Standards
20100001723 - Bridge type sensor with tunable characteristic: A bridge type magnetic sensor is disclosed having four resistive elements in a bridge arrangement, two of the resistive elements on opposing sides of the bridge having a magnetoresistive characteristic such that their resistance increases with increasing positive magnetic field and with increasing negative magnetic field. A frequency doubling is... Agent: Philips Intellectual Property & Standards
20100001724 - Ic microfluidic platform with integrated magnetic resonance probe: An integrated hybrid microfluidic-IC platform for single cell manipulation and microscopy and method for making the platform. In particular, the integrated platform can incorporate a planar microcoil embedded in a silicon substrate that is subsequently used to fabricate a CMOS IC for the platform. The CMOS IC circuitry provides a... Agent: Saliwanchik Lloyd & Saliwanchik A Professional Association
20100001725 - Mri system with direct digital receiver using resampling: The present invention relates to magnetic resonance imaging system and to a direct digital receiver (18) for an RF coil (D1, D2), in particular of a magnetic resonance imaging system. To obtain that the sampling frequency of an analog-to-digital converter (33) of the digital receiver can be chosen independently of... Agent: Philips Intellectual Property & Standards
20100001726 - Magnetic resonance imaging apparatus and receiving-path switching method: In a magnetic resonance imaging apparatus, an event generating substrate included in a sequence control unit generates an event code to make an instruction for switching a receiving path during a scan based on scanning conditions that are set in advance of the scan. When the event code is generated,... Agent: Nixon & Vanderhye, PC
20100001727 - Method and apparatus for acquiring high resolution spectral data or high definition images in inhomogeneous environments: A method and apparatus for treating a sample for acquiring high-definition magnetic resonance images (MRI images) or high resolution nuclear magnetic resonance (NMR) spectra even in the presence of magnetic field distortions within one or multiple scans. The spatial nature and temporal dependence of the field inhomogeneities are determined a... Agent: Fleit Gibbons Gutman Bongini & Bianco Pl
20100001728 - Probe and system for electron spin resonance imaging: ESR imaging probe, system, and method are described. The probe is an ex-situ probe, the system comprises the probe and configured for operating the probe, and the method comprises detecting ESR from outside a resonator of the probe. An exemplary embodiment of a probe according to the invention comprises a... Agent: Martin D. Moynihan D/b/a Prtsi, Inc.
20100001729 - Open yoke magnet assembly: An open yoke MRI apparatus has a set of permanent magnets arranged at the inner surfaces of the yoke and spaced apart from one another. A set of annular permanent magnets is included in each magnet arrangement, including a set with trapezoidal cross-sections to provide a more uniform field and... Agent: Law Offices Of Jerry A. Schulman
20100001730 - Enhanced fill-factor nmr coils and associated methods: An NMR probe which includes a probe matrix (24) having a void sample (28) volume therein. A conductive coil (16, 26) can be at least partially embedded in the probe matrix (24). By embedding the conductive coil (16, 26) in the probe matrix (24), the fill-factor can be significantly increased.... Agent: Thorpe North & Western, LLP.
20100001732 - Detector for calculating a depth of a buried conductor: A detector for calculating a depth of a buried conductor comprises three parallel antennas B, M, T. The second antenna M is spaced a distance s from the first antenna B and the third antenna T is a distance 2s from the first antenna B and a distance s from... Agent: Baker & Hostetler LLP
20100001731 - Transmitter of a system for detecting a buried conductor: A system for detecting a buried conductor comprises a transmitter for generating a test signal in the buried conductor and a detector for detecting an electromagnetic signal resulting from the test signal flowing in the buried conductor. The transmitter comprises a waveform generator for generating a drive waveform signal, a... Agent: Baker & Hostetler LLP
20100001733 - Sensor cable for electromagnetic surveying: A sensor cable for surveying. The sensor cable has a housing, which includes one of more electrodes and a conductive gel surrounding the one or more electrodes. The conductive gel is configured to conduct electrical current to the one or more electrodes and keep the one or more electrodes moist.... Agent: Westerngeco L.L.C. Jeffrey E. Griffin
20100001734 - Circumferentially spaced magnetic field generating devices: A downhole induction resistivity assembly that comprises a downhole tool string component. The tool string component comprises an induction transmitter. The transmitter is adapted to induce an induction field in the surrounding formation. A first induction receiver is spaced apart from the transmitter and is adapted to measure the induction... Agent: Tyson J. Wilde Novatek International, Inc.
20100001735 - Surveying a subterranean structure using electromagnetic measurements and microorganism content data: A survey apparatus for surveying a subterranean structure includes an electromagnetic (EM) sensing element to measure an EM field received from the subterranean structure, and a sample collector activatable to collect a sample of soil.... Agent: Westerngeco L.L.C. Jeffrey E. Griffin
20100001736 - Flow tracking in block caving mining: The invention provides a method and system for monitoring the flow of ore in block cave mining operations by inserting an active magnetic beacon 1 into the ore body 12 and generating an alternating magnetic signal with the beacon 1. The ore is monitored with a magnetometer (14, 15, 16,... Agent: Merchant & Gould PC
20100001737 - Battery system: A battery system includes a battery module that is constituted with a plurality of serially connected battery cells, a plurality of integrated circuits that group the battery cells by a plurality thereof so as to perform processing on battery cells in each group, a first transmission path through which a... Agent: Crowell & Moring LLP Intellectual Property Group
20100001738 - System and method for conducting accelerated soft error rate testing: An apparatus for a user to conduct an accelerated soft error test (ASER) on a semiconductor sample is provided. The apparatus comprises a first component for holding the radiation source, where the radiation source may be either an alpha-particle or neutron-particle source. The apparatus comprises a second component for holding... Agent: Townsend And Townsend And Crew, LLP
20100001739 - Test tray for test handler: A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the... Agent: JeffersonIPLaw, LLP
20100001740 - Method and device for measuring impedance: The invention relates to a method and system and microchip for determining impedance of a variable impedance component. The method comprises tuning a tunable oscillator over a predefined tuning range, the tunable oscillator having the variable impedance component coupled as a load thereof. The frequency response of the tunable oscillator... Agent: Birch Stewart Kolasch & Birch
20100001741 - Method for locating pipe leaks: A method for identifying leaks in pipes employs an electrical conductor extending longitudinally along a pipe between first and second measuring points. A measurement signal in the form of a temporally variable voltage is applied to the electrical conductor, and the impedance behavior of the conductor is used to determine... Agent: Edell, Shapiro & Finnan, LLC
20100001742 - Calibration technique: The tolerance of Short-Open-Load (SOL) and Short-Open-Load-Reflect (SOLR) VNA calibration for variability in probe position is improved by using load and short calibration structures having impedance elements with a length at least two times the probe contact pitch and a width at least two times the sum of the combined... Agent: Chernoff, Vilhauer, Mcclung & Stenzel, LLP
20100001743 - Calibration technique: The present invention exploits extreme sensitivity to initial conditions in ray-chaotic enclosures to create a method to distinguish nominally identical objects through their unique “wave fingerprints.” The fingerprint can be measured through transmission of a pulsed microwave signal as a function of carrier frequency and time. When internal components are... Agent: Whiteford, Taylor & Preston, LLP Attn: Gregory M Stone
20100001744 - Standing wave measuring unit and standing wave measuring method in waveguide, electromagnetic wave utilization apparatus, plasma processing apparatus and plasma processing method: [Means for Solving] A distribution of temperatures is detected in a conductive member forming at least a part of pipe walls of a waveguide with respect to a longitudinal direction of a waveguide which propagates an electromagnetic wave, and a standing wave generated in the waveguide is measured based on... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.
20100001745 - Resonance tag with temperature sensor: A temperature-history sensor includes a resonance circuit composed of at least a capacitor and a coil. The temperature-history sensor has a display for indicating a predetermined set temperature of the temperature-history sensor. The capacitor has at least a thermofusion material between electrodes of the capacitor, and the melting point of... Agent: Fitzpatrick Cella Harper & Scinto
20100001746 - Method for selecting an item of equipment and control unit enabling this method to be implemented: A group of home automation equipment (111-114) to be controlled is selected from among several predefined groups of equipment, via sensitive zones (Z1, Z2, Z3, Z4) of a control unit (102), each of these sensitive zones being associated with a capacitive sensor and being disposed next to one another on... Agent: Dowell & Dowell P.C.
20100001747 - Method and a device for measuring dielectric characteristics of material bodies: The inventive method for measuring dielectric characteristics of material bodies consists in generating a microwave signal, in dividing said signal into reference and sounding signals, in irradiating a body with the microwave signal when a waveguide probe contacts a tested material, in receiving the reflected, reference and total signals and... Agent: Houston Eliseeva
20100001749 - Method and apparatus for multi-planar edge-extended wafer translator: An apparatus, suitable for coupling a pads of integrated circuits on wafer to the pogo pins of a pogo tower in a test system without the need of a probe card, includes a body having a first surface and a second surface, the body having a substantially circular central portion,... Agent: Raymond J. Werner
20100001748 - Probe card: A probe card includes a flat wiring board having a wiring pattern corresponding to a circuit structure for generating a signal for a test, an interposer that is stacked on the wiring board and relays wirings of the wiring board, a space transformer that is stacked on the interposer and... Agent: Edwards Angell Palmer & Dodge LLP
20100001750 - Methods and apparatus for single-sided extension of electrical conductors beyond the edges of a substrate: An apparatus for providing electrical pathways between one or more unsingulated integrated circuits and one or more test circuits external to the integrated circuits, includes a flexible substrate having a first major surface and a second major surface, a plurality of first contact structures disposed in a central portion of... Agent: Raymond J. Werner
20100001751 - Transfer mechanism for target object to be inspected: A transfer mechanism for a target object includes at least two insulating wire materials disposed spaced from each other to transverse a mounting table, at least two pairs of supporting bodies horizontally disposed at outsides of the mounting table, for stretching said at least two wire materials in parallel with... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, L.L.P.
20100001752 - Parallelism adjusting mechanism of probe card: A parallelism adjusting mechanism of a probe card is provided. The parallelism adjusting mechanism can bring probes held by a probe card into uniform contact with a wafer even if a parallelism between a mounting reference surface for the probe card and the wafer as a test object is lost.... Agent: Edwards Angell Palmer & Dodge LLP
20100001755 - Method for testing noise immunity of an integrated circuit and a device having noise immunity testing capabilities: A method for testing a noise immunity of an integrated circuit; the method includes: determining a value of a power supply noise regardless of a relationship between the power supply noise value and a phase sensitive signal edge position resulting from an introduction of the power supply noise; receiving, by... Agent: Freescale Semiconductor, Inc. Law Department
20100001753 - Position changing apparatus for test handler and power transferring apparatus: A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby... Agent: Roylance, Abrams, Berdo & Goodman, L.L.P.
20100001754 - Semiconductor test device: It is possible to provide a semiconductor test device capable improving the test efficiency. The semiconductor test device includes: a driver (14) which generates a driver signal outputted to a device under test; a variable delay circuit (12) provided at the preceding stage of the driver (14); a register (16)... Agent: Patenttm.us
20100001756 - Array substrate having increased inspection efficincy and display apparatus having the same: In an array substrate and a display apparatus, a pixel part has a plurality of gate lines, a plurality of data lines, and a plurality of pixels electrically connected to the gate and data lines. A driving circuit drives the pixel part electrically connected to a first end of the... Agent: Cantor Colburn, LLPPrevious industry: Electricity: power supply or regulation systems
Next industry: Electronic digital logic circuitry
RSS FEED for 20150611:
Integrate FreshPatents.com into your RSS reader/aggregator or website to track weekly updates.
For more info, read this article.
Thank you for viewing Electricity: measuring and testing patents on the FreshPatents.com website. These are patent applications which have been filed in the United States. There are a variety ways to browse Electricity: measuring and testing patent applications on our website including browsing by date, agent, inventor, and industry. If you are interested in receiving occasional emails regarding Electricity: measuring and testing patents we recommend signing up for free keyword monitoring by email.
Advertise on FreshPatents.com - Rates & Info
FreshPatents.com Support - Terms & Conditions
Results in 0.32789 seconds