Electricity: measuring and testing inventions 10/09

20090243583 - Compact line illuminator for locating buried pipes and cables: A compact line illuminator for applying an oscillating signal to buried or otherwise inaccessible pipes, cables and conductors so that their location can be traced by detecting an electromagnetic signal emitted by these buried objects. The illuminator includes a circuit for generating a signal suitable for tracing a buried conductor... Agent: Michael H Jester

20090243584 - Fabrication of microstructures integrated with nanopillars along with their applications as electrodes in sensors: This invention presents microstructures enhanced with nanopillars. The invention also provides a novel way for manufacturing nanopillar-enhanced microstructures, using conventional microfabrication techniques. In some embodiments, the invention also provides methods of use for the nanopillar-enhanced microstructures.... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20090243585 - Systems for inspection of shrouds: A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.... Agent: General Electric Company Global Research

20090243586 - Apparatus for testing a protective meausring or metering device as a constituent part of a high or medium voltage installation, more specifically of a utility protective relay, of a generator protective device, of a current meter, and so on, in a high or: The subject matter of the invention is an apparatus for testing a protective, measuring or metering device as a constituent part of a high or medium voltage installation, more specifically of a utility protective relay, of a generator protective device, of a current meter and so on in a high... Agent: Pyle & Piontek, LLC

20090243587 - Method and apparatus for measuring ac voltages: A method and apparatus for providing AC voltage measurements. The apparatus comprises an AC voltage monitor for determining at least a first and a second voltage representing an AC voltage of an AC circuit, generating a serial data stream frame comprising data representing the at least a first and a... Agent: Raymond R. Moser Jr., Esq. MoserIPLaw Group

20090243588 - Semiconductor device: A device includes a measurement target circuit including a first circuit, a switch provided to a measurement node of the first circuit and a second circuit connected to the measurement node of the first circuit through the switch; and a current measuring circuit including a reference current source group connected... Agent: Arent Fox LLP

20090243589 - Surface-plasmon detector based on a field-effect transistor: According to one embodiment, a surface-plasmon (SP) beam generated by an SP source and directed via an SP waveguide is applied to a gate node of a field-effect transistor (FET). The FET also has a source node and a drain node. In a representative configuration, the gate, source, and drain... Agent: Mendelsohn, Drucker, & Associates, P.C.

20090243590 - System and method for monitoring current in a conductor: The present disclosure describes a system for measuring current amplitude in a conductor, comprising at least one Rogowski coil, an integration circuit directly connected to the at least one Rogowski coil, a microprocessor circuit in communication with the integration circuit and configured to receive output from the integration circuit and... Agent: General Electric Company Ge Global Patent Operation

20090243591 - Power meter having complex quadrature output current and voltage filters: A power meter having complex quadrature output current and voltage filters provides power measurements in high amplitude and frequency variation and/or high jitter environments without requiring high computational overhead. A pair of filters, one for voltage and one for current each have a response determined by complex non-conjugate poles. The... Agent: Mitch Harris, LLC - Cirrus

20090243592 - Measuring device with negative-feedback dc voltage amplifier: A measuring device having a detector with at least one detector element and, connected downstream of the detector, a DC voltage amplifier with at least one input (and at least one output. The DC voltage amplifier provides at least one negative-feedback path, which extends from its at least one output... Agent: Ditthavong Mori & Steiner, P.C.

20090243593 - Electrical metering device: An electrical metering device (1) include a housing (2) with a back face (20), a front face (21) and lateral faces forming a closed box, and heat generating parts (5) internal to said housing (2) in close proximity to said back face. The electrical metering device (1) is adapted to... Agent: Sofer & Haroun LLP.

20090243594 - Method and device for characterization of a magnetic field applied to a magnetic sensor: The present invention provides a magnetic sensor device comprising a plurality of magnetic sensor elements having a sensitive direction. At least one of the magnetic sensor elements (43) is provided with a flux-guide (44) for concentrating onto the sensor element in its sensitive direction a magnetic field applied to the... Agent: Philips Intellectual Property & Standards

20090243595 - Sensor module with mold encapsulation for applying a bias magnetic field: A method of manufacturing a sensor module includes providing a substrate comprising a magnetically sensitive sensor element. The sensor element and the substrate are encapsulated with at least one mold material that is configured to apply a bias magnetic field to the sensor element.... Agent: Dicke, Billig & Czaja

20090243596 - Position-measuring device and method for its operation: A position-measuring device includes a measuring standard, on which at least one graduation track is applied, and a support member. Disposed on the support member is at least one exciter winding through which an excitation current is able to be conducted in order to generate an electromagnetic field, as well... Agent: Kenyon & Kenyon LLP

20090243597 - Methods and apparatus for security device portal sensing: A security device, according to various aspects of the present invention, secures an area accessible through a portal (e.g., doorway, window opening, hatch, vent) against unreported ingress or egress (e.g., access). A security device monitors a portal or a portal cover (e.g., door, window, screen, flap) to provide reports of... Agent: Letham Law Firm, LLC

20090243598 - Position measurement using magnetic fields: A position sensing system includes a member movable along a path, the member having an elongated magnet extending along the path, the magnetic field orientation of the elongated magnet being at an angle with respect to the path. A sensor determines a position of the member along the path based... Agent: Fish & Richardson PC

20090243599 - Multiple-rotation absolute encoder: A multiple-rotation absolute encoder attached to an actuator provided with a motor and a reduction gear comprises a multiple-rotation value counter for counting a multiple-rotation value representing a number of rotations of a rotating shaft of the motor from a predetermined origin; a memory part for storing a reduction ratio... Agent: Buchanan, Ingersoll & Rooney PC

20090243600 - Rotation sensor unit: A rotation sensor unit includes an encoder, a holder radially positioning the encoder, and a rolling bearing having an inner race. The rolling bearing is fitted around the shaft so that one end of the inner diameter surface of the inner race protrudes from the end of the outer diameter... Agent: Wenderoth, Lind & Ponack, L.L.P.

20090243601 - Inductive proximity switch: Embodiments of the invention relate to a proximity switch device, a system, and methods for operating and manufacturing a proximity switch device. According to an aspect, an inductive proximity switch device includes a plurality of inductive elements.... Agent: Slater & Matsil LLP

20090243602 - Method and apparatus for testing characteristic of magnetic head: The method for testing a characteristic of a magnetic head is performed in the form of a wafer, especially in a heating state and a cooling state. The method for testing a characteristic of a magnetic head, in which a wafer including a dummy read-element having a size equal to... Agent: Greer, Burns & Crain

20090243603 - Device for measuring magnetic particles and corresponding method: The invention concerns a device for the qualitative or quantitative measurement of a magnetically labelled analyte. The device includes a coil arrangement for measuring the analyte from a sample absorbed in a test base. The coil arrangement includes at least one measuring coil and a reference coil arranged in connection... Agent: Fildes & Outland, P.C.

20090243604 - Measurement of pipe wall thickness using magnetic flux leakage signals: An apparatus comprising a processor configured to implement a method comprising obtaining a pipe profile comprising a diameter, a nominal thickness, and a material, receiving a magnetic flux leakage (MFL) indication for a pipe associated with the pipe profile, and determining a wall thickness for the pipe using the pipe... Agent: Conley Rose, P.C.

20090243605 - Intelligent eddy current array probe with embedded firing sequence memory: An intelligent eddy current array probe comprising a plurality of coil elements and an embedded non-volatile memory element is disclosed. Prior to coupling the intelligent eddy current array probe to an NDI system, a data table describing a desired firing sequence for the array probe within a given inspection operation... Agent: Ostrolenk Faber Gerb & Soffen

20090243606 - Sensor arrangement, integrated chip component with the sensor arrangement, and measurement method: A sensor arrangement has a sensor array (SA) with a first, a second, and a third sensor focus (SSP1, SSP2, SSP3), which are located along a main linear direction (L) and in which the third sensor focus (SSP3) is located in the middle between the first and second sensor foci... Agent: Cohen, Pontani, Lieberman & Pavane LLP

20090243607 - Magnetic sensor design for suppression of barkhausen noise: A semiconductor process and apparatus provide a high-performance magnetic field sensor from two differential sensor configurations (201, 211) which require only two distinct pinning axes (206, 216), where each differential sensor (e.g., 201) is formed from a Wheatstone bridge structure with four unshielded MTJ sensors (202-205), each of which includes... Agent: Ingrassia Fisher & Lorenz, P.C.

20090243608 - Magnetic field measurement method and magnetic sensor: The magnetic field measurement method has: a step of preparing a magnetic sensor which includes: a magneto-resistive effect element having a magnetization-free layer and a magnetization fixed layer, and having a longitudinal direction; and magnetic field application means, wherein the magnetization direction of the magnetization fixed layer is fixed in... Agent: Oliff & Berridge, PLC

20090243609 - Magnetic sensor element and magnetic sensor using the same: The present invention provides a fluxgate magnetic sensor element which includes: a substrate; an exciting pattern which is disposed on the substrate to generate a magnetic field; a magnetic thin film pattern for detection which is disposed adjacent to the exciting pattern; and a detection coil pattern which is disposed... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20090243610 - Atomic magnetometer and magnetic force measuring method: An atomic magnetometer includes a cell containing an atomic group, a pump light source, a probe light source, a mirror, and a detector. The cell is disposed between the pump light source and the mirror and between the probe light source and the detector. A pump beam emitted from the... Agent: Fitzpatrick Cella Harper & Scinto

20090243611 - Radio frequency coil with transmission line end-rings: A radio frequency coil for transmitting or receiving signals at a magnetic resonance frequency includes an arrangement of substantially parallel rungs (70, 70′, 70″) and one or more generally annular strip-type end-rings (78, 78′, 78″, 80) disposed generally transverse to the parallel rungs and connected with the rungs. Each generally... Agent: Philips Intellectual Property & Standards

20090243612 - volume coil for mri system: A volume coil for a magnetic resonance imaging system is composed of a number of coil units. In the coil, there are overlapped parts between two adjacent ones of the coil units for eliminating coupling between these two adjacent coil units. Two next-adjacent ones of the coil units, which are... Agent: Schiff Hardin, LLP Patent Department

20090243613 - Method and apparatus for utilizing time division multiple waveform transmitting: A method and apparatus of constructing a signal for a controlled source electromagnetic survey is described. In one embodiment, a method is described that includes determining a first waveform and a second waveform, the first waveform and second waveform related to a combined frequency spectrum and bandwidth associated with a... Agent: Exxon Mobil Upstream Research Company

20090243614 - Signal generator for electromagnetic surveying that produces a signal having an analog continuous waveform: To perform an electromagnetic (EM) surveying of a subterranean structure, a signal generator produces a signal having an analog continuous waveform without steps in the waveform. An antenna is responsive to the signal having the analog continuous waveform to emit an EM field to produce the EM surveying of the... Agent: Westerngeco L.L.C. Jeffrey E. Griffin

20090243615 - Inductive proximity switch and method for its operation: The invention relates to an inductive proximity switch which has a resonant circuit (Ls, C) comprising a resonant circuit transmission coil (Ls) and a capacitance (C), wherein the resonant circuit transmission coil (Ls) generates an alternating magnetic field which induces a mutual induction voltage in at least one receiving coil... Agent: Hoffman Warnick LLC

20090243616 - Multi-component marine electromagnetic signal acquisition method: A method for determining a component of electric field response of the Earth's subsurface to a time-varying electromagnetic field induced in the Earth's subsurface is provided. The method includes measuring electric field response along a nonlinear pattern on at least one of the Earth's surface and the bottom of a... Agent: Dewipat Incorporated

20090243617 - Method for electromagnetic geophysical surveying of subsea rock formations: A method for electromagnetic geophysical surveying of rock formations (1) under a sea-floor (3) comprising the following steps: * —towing first and second alternating field (E1, E2) emitting sources (s1, S2) in first and second depths below the sea surface, said first field (E1) having a first phase (Φ1); —said... Agent: Wenderoth, Lind & Ponack, L.L.P.

20090243618 - Method for compensating drill pipe and near-borehole effect on and electronic noise in transient resistivity measurements: Transient measurements made at two spaced apart receivers responsive to separate activation of two transmitters symmetrically disposed about the two receivers. The transmitters and receivers are on an instrument having a conductive body induces currents in the earth formation. The effect of the conductive body is removed by using deconvolving... Agent: Madan & Sriram, P.C.

20090243619 - Four-terminal electric imager for resistive muds with localized current control: An apparatus for imaging a subsurface material traversed by a borehole, the apparatus including an imaging pad deployed by a logging instrument, the pad including a plurality of measuring sets, each measuring set including a first current injector electrode, a second current injector electrode, a pair of sensor electrodes disposed... Agent: Cantor Colburn LLP- Baker Atlas

20090243620 - Method for testing circuit breakers: A method for testing low voltage power circuit breakers having an electronic trip unit which includes a display and a microprocessor for controlling various protective functions and storing settings for such functions which can be selected and performed. Entering into the test mode disables functions not necessary for the testing... Agent: Pepe & Hazard, LLP

20090243621 - Assembled battery total voltage detection circuit: An assembled battery total voltage detection circuit includes a main control circuit, a divider resistor connected between a plus terminal and a minus terminal of an assembled battery insulated from the main control circuit, and a differential amplifier circuit that amplifies voltage divided by the divider resistor. A constant electric... Agent: Crowell & Moring LLP Intellectual Property Group

20090243622 - Battery sensor unit: A battery sensor unit including a pole terminal, the terminal being electrically conductively connected to a plate-shaped carrier element and a planar measuring shunt, the shunt including a resistor element and adjoining resistor connections on both sides thereof. The carrier element is connected in an electrically conducting manner to the... Agent: Cohen, Pontani, Lieberman & Pavane LLP

20090243623 - System and method for determining a position of a single phase fault to ground in a feeder line: A system and a method for determining a position of a single phase fault to ground in a feeder line are provided. The feeder line is electrically connected to an electrical substation via a substation bus. The system includes first and second sensors electrically coupled to a transformer in the... Agent: Cantor Colburn, LLP

20090243624 - Signal measuring device: Small-scale measuring circuits (111-1qum) are arranged in m columns×q rows. The small-scale measuring circuits of each row (111-11m, 121-12m, 1q1-1qm) are connected in series. The respective rows are connected in parallel. Supplying reference signals B having different parameter values to the small-scale measuring circuits (111-11m, . . . ) connected... Agent: Sughrue Mion, PLLC

20090243626 - Amplification apparatus and amplifier failure detecting method: An amplification apparatus including a plurality of amplifiers includes a carrier amplifier, a peak amplifier including a gate bias circuit including a resistor for supplying a gate bias voltage, a comparator for outputting a resultant signal determined by comparison of a predetermined threshold voltage with a voltage across the resistor... Agent: Katten Muchin Rosenman LLP

20090243627 - Semiconductor device and operation monitoring method for semiconductor device: A semiconductor device includes a monitor including a first element coupled between a first power supply line and a second power supply line, and a load for increasing a load value between the first element and the first power supply line or the second power supply line, and a determination... Agent: Arent Fox LLP

20090243625 - Test structure to monitor the release step in a micromachining process: Electrical and visual test structures monitor the degree of removal of conductive sacrificial layers used in micromachining processes that fabricate micro-electromechanical systems (MEMS).... Agent: Brosemer, Kolefas & Associates, LLC (alu)

20090243628 - Systems and methods for online phase calibration: A system for online relative phase calibration is provided. The system includes at least one excitation source configured to generate multiple excitation signals. The system also includes at least two sensors coupled to respective ones of the at least one excitation source via a transmission line, wherein the two sensors... Agent: General Electric Company Global Research

20090243629 - Method and apparatus for mini module emi shielding evaluation: A method for mini module EMI shielding effectiveness evaluation comprises providing a test vehicle including at least one test platform. The test platform includes at least one mini emitter, a mini receiver with a reference shield, and a mini receiver with a shield under test. EMI shielding effectiveness transmission signals... Agent: Freescale Semiconductor, Inc. Law Department

20090243630 - Method to quickly estimate inductance for timing models: A method of estimating an inductance delay includes determining a resistance-capacitance (RC) delay with resistances and capacitances of a network and estimating an inductance delay of the network by determining a propagation delay of an electromagnetic (EM) field across wires of the network. Additionally, the method includes determining if the... Agent: Greenblum & Bernstein, P.L.C

20090243631 - Circuit for capacitance measurement and method therefor: A measurement method for capacitance includes the following steps. First, a voltage on at least one end of a to-be-measured capacitor is switched in response to a first set of clock signals such that a level of an integrated voltage is adjusted from a start voltage level to an end... Agent: Bacon & Thomas, PLLC

20090243632 - Capacitive sensing device and method: In a capacitive sensing device for detecting a change in capacitance of an electrode which is caused by contact with a human body, the improvement of determination speed may be enabled. M (m is an integer satisfying n≧m≧2) electrodes are selected from n (n is an integer equal to or... Agent: Mcginn Intellectual Property Law Group, PLLC

20090243633 - Capacitance sensor: A capacitance sensor, having at least one electrode is disclosed. A frequency spread signal generation circuit is coupled to the at least one electrode to apply a frequency spread signal based on a spread sequence. A periodic signal with a frequency is coupled to the at least one electrode. A... Agent: Slater & Matsil LLP

20090243634 - Capacitive sensing in an automotive mirror: An automotive mirror assembly includes a mirror and transparent substrate adjacent to the mirror. The patterned coating is attached to transparent substrate and defines at least part of capacitive element. A capacitance sensor is in communication with the patterned coating thereby allowing capacitance changes induced in the patterned coating to... Agent: Brooks Kushman P.C. / Lear Corporation

20090243635 - Analysis of thin liquid films: A novel microfluidic device has been developed to measure stability of thin liquid films of water in oil emulsions using electrochemical perturbation of interfaces. This new device can be utilized in rapid classification of de-emulsifiers used in petroleum industries. Although water/crude oil emulsions have been the primary focus of this... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20090243636 - Programmable gain trans-impedance amplifier overload recovery circuit: Embodiments of an apparatus for measuring the leakage current of capacitive components is taught. One embodiment includes a first stage amplifier configured to receive an input from a serially-connected capacitive component at an inverting input and a feedback resistor in a feedback path of the first stage amplifier. A resistance... Agent: Young Basile

20090243637 - Measuring apparatus having nanotube probe: In order to solve the above-mentioned problem, there is provided a conduction characteristics evaluation apparatus having a nanotube probe made of a nanotube coated by tiny fragments of graphene sheets to improve the wettability with respect to metal materials and then coated by a metal layer, or a conduction characteristics... Agent: Miles & Stockbridge PC

20090243638 - Receiver for recovering and retiming electromagnetically coupled data: In one embodiment, the present invention includes a system having an electromagnetic coupler probe to electromagnetically sample signals from a device under test or a link under test and a receiver, e.g., configured as an integrated circuit that is to receive the sampled electromagnetic signals from the probe and output... Agent: Trop, Pruner & Hu, P.C.

20090243639 - Circuit for multi-pads test: The present invention relates to a circuit for multi-pads test, which is used for testing a plurality of pads. The circuit comprises one or more testing circuits, a plurality of testing switches, and a plurality of pad switches. The plurality of testing switches is coupled between the testing circuits and... Agent: Sinorica, LLC

20090243640 - Conductive contact pin and semiconductor testing equipment: In a conductive contact pin brought into contact with the external electrode of a semiconductor device to conduct a test on the electrical characteristics of the semiconductor device, an upper plunger 13 which is a contact pin coming in and out of a cylindrical body is made up of a... Agent: Steptoe & Johnson LLP

20090243641 - Display device: An array substrate is provided with thereon a display area in which plural pixels are arranged in a matrix shape. Output-side mounting terminals for a source driving circuit chip, which is COG-mounted on a frame area on the outside of the display area, have a plural-row zigzag arrangement. Inspection terminals... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20090243642 - Electronic device testing system and method: The invention provides a testing system and method suitable for determining whether the pins of the socket are properly connected to a printed circuit board. The testing system includes a testing signal source, a socket, a signal sensing unit, a fixing element, and an analysis unit. The signal sensing unit... Agent: Baker & Mckenzie LLP

20090243643 - Testing system module: A testing system module for testing printed circuit board (PCB) includes at least one robot having a pogo pin for moving to a testing point of the PCB; a pressure detecting unit for detecting a current pressure value on the printed circuit board; and a control system for keeping the... Agent: Nixon Peabody LLP

20090243644 - socket, test device and test method for testing electronic element packages with leads: The present invention relates to a socket, test device and test method for testing electronic element packages with leads, and particularly relates to a socket, test device and test method for testing image sensors with leads. The test device comprises a socket, a plurality of test probes and a test... Agent: Stout, Uxa, Buyan & Mullins LLP

20090243645 - Manufacturing method of a semiconductor device, a semiconductor wafer, and a test method: The present invention aims to increase the number of test elements of a TEG without increasing the area of each of slice areas. Test electrode pads are disposed in alignment in one row in each of areas separated from semiconductor chips provided over a semiconductor wafer. Test elements are formed... Agent: Miles & Stockbridge PC

20090243646 - Detecting circuit: A detecting circuit for detecting a battery having a first and second electrode, includes a contacting portion electrically connecting to the first electrode of the battery, a seesaw electrically connected to the second electrode of the battery, and an actuator electrically connecting to the second electrode of the battery. One... Agent: PCe Industry, Inc. Att. Steven Reiss

20090243647 - Non-invasive monitoring and diagnosis of electric machines by measuring external flux density: System and methods for monitoring electric machines are provided. A magnetic field associated with the electric machine is measured at one or more points external to the electric machine, wherein a respective magnetic field value is associated with each of the one or more points. The one or more measured... Agent: Sutherland Asbill & Brennan LLP