|Electricity: measuring and testing patents - Monitor Patents|
USPTO Class 324 | Browse by Industry: Previous - Next | All
09/2009 | Recent | 15: May | Apr | Mar | Feb | Jan | 14: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | 13: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | 12: Dec | Nov | Oct | Sep | Aug | July | June | May | April | Mar | Feb | Jan | 11: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | 10: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | | 09: Dec | Nov | Oct | Sep | Aug | Jl | Jn | May | Apr | Mar | Fb | Jn | | 2008 | 2007 |
Electricity: measuring and testing September class, title,number 09/09Below are recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application. 09/24/2009 > patent applications in patent subcategories. class, title,number
20090237067 - Detect and identify virus by the microwave absorption spectroscopy: The present invention discloses microwave resonant absorption (MRA) of viruses through dipolar coupling to viral confined acoustic modes. The unique geometrical and mechanical properties of viruses can be reflected by the MRA frequencies, MRA linewidth, and the absorption selection rules of high-order acoustic modes. Combined these spectral characteristics with the... Agent: Wpat, PC Intellectual Property Attorneys
20090237068 - Wideband cmos rms power detection scheme: A system includes a first circuit and a second circuit. The first circuit includes a first MOS transistor having a gate and a drain. The first circuit is configured to receive a radio frequency (RF) signal at the gate of the first MOS transistor. The drain of the first MOS... Agent: Entropic Communications, Inc.
20090237069 - Method and apparatus for determining a response of a dut to a desired large signal, and for determining input tones required to produce a desired output: A method for determining input tones required to produce a desired output includes the step of extracting a linearization of a spectral map representing a device under test (DUT) that i) is under drive of a large signal having one or more fundamental frequencies with associated amplitudes and phases, and... Agent: Agilent Technologies Inc.
20090237070 - Method of instantaneously determining or estimating the frequency or amplitude of an input signal: A method of instantaneously determining or estimating the frequency of an input signal includes mixing a digitally sampled and quantized input signal (12) by a time shifted replica of the input signal (12), where the time shift equals an integer multiple of a sampling period of the input signal (12),... Agent: Straub & Pokotylo
20090237071 - Method for determining the type of connection of at least two electrical devices and system comprising several electric devices: The invention relates to a method for determining the type of connection of at least two electric devices (5) whereby each device comprises a similar connector arrangement. The aim of the invention is to increase the reliability during the starting up process and during the operation of a system which... Agent: Mccormick, Paulding & Huber LLP
20090237072 - Sequential equivalent-time sampling with an asynchronous reference clock: A sequential equivalent-time sampling oscilloscope simultaneously acquires samples of a signal-under-test and a reference clock that is asynchronous with the signal-under-test. The oscilloscope converts the samples of the reference clock into timestamps and uses the timestamps to compensate for the jitter of the oscilloscope and to indicate the absolute jitter... Agent: William K. Bucher Tektronix, Inc.
20090237073 - Position detecting system: A position detecting system includes a magnetic field generator, a detecting body, a magnetic field detector, a position/direction calculating unit, and a control unit. The magnetic field generator generates a magnetic field in a three-dimensional space. The detecting body is put into the three-dimensional space, and includes a resonance circuit... Agent: Scully Scott Murphy & Presser, PC
20090237074 - Magnetic sensor and mobile information terminal apparatus: A disclosed magnetic sensor includes a substrate having a plane surface and multiple sloping surfaces; multiple soft magnetic films each disposed on a different one of the sloping surfaces and magnetized according to strength of a magnetic field; and multiple detecting devices each disposed on the plane surface, including a... Agent: Cooper & Dunham, LLP
20090237075 - Magnetic sensor device and method: A magnetoresistance sensor has a first magnetic layer that changes polarity in response to an external magnetic field and a second magnetic layer having a fixed magnetic polarity oriented in a reference direction. A varying voltage is applied to establish a varying magnetic bias field in the reference direction. An... Agent: Dicke, Billig & Czaja
20090237076 - Magnetic resonance imaging apparatus, a method and a computer program for compensation of a field drift of the main magnet: In accordance with the technical measure of the invention in order to counteract the positive feedback between the superconducting magnet and the shim iron a pair of superconducting shunts (37, 38) is provided with a region of overlap (38a-37b) substantially matching the position of the shim iron (20) within the... Agent: Philips Intellectual Property & Standards
20090237077 - Rf coil for imaging systems and methods of operation: An RF coil system for magnetic resonance applications includes a multi-channel RF coil transceiver and a multi-channel RF coil. The RF coil system is structured for reconfiguration between a plurality of operational modes.... Agent: Crompton, Seager & Tufte, LLC
20090237078 - Methods of evaluating peptide mixtures: The presently disclosed subject matter provides methods for evaluating and characterizing peptides, peptide mixtures, and polypeptide mixtures. More particularly, the presently disclosed subject matter provides methods for evaluating or characterizing complex peptide or polypeptide mixtures comprising glutamic acid, alanine, tyrosine, and lysine, e.g., Copolymer-1 or glatiramer acetate, including, but not... Agent: Fish & Richardson PC
20090237079 - Magnetic resonance device and method: The invention relates to a device (1) for magnetic resonance imaging of a body (7), comprising a main magnet (2) for generation of a stationary and substantially homogeneous main magnetic field within the examination zone, a plurality of wireless receiving units (10a, 10b) placed in or near the examination zone,... Agent: Philips Intellectual Property & Standards
20090237080 - Magnetic field generator and nuclear magnetic resonance device provided with the magnetic field generator: A magnetic field generator includes a magnetic circuit of an open magnetic path in which a uniform magnetic field can be generated with a simpler structure. A nuclear magnetic resonance device equipped with this magnetic filed generator is also provided. The magnetic field generator of an open magnetic path type... Agent: Oliff & Berridge, PLC
20090237081 - Arrangement to detune a reception antenna in a local coil: An arrangement to detune a reception antenna in a local coil of a magnetic resonance system, with at least one reception antenna that is fashioned as a loop antenna and that has at least one first capacitance. Radio-frequency signals of a magnetic resonance examination are received via the reception antenna.... Agent: Schiff Hardin, LLP Patent Department
20090237082 - Methods of logging geological formations:
20090237083 - Method for imaging subterranean formations: A method for using a tool in a wellbore in a formation to predict an anomaly in the formation ahead of the device, the tool comprising a transmitter for transmitting electromagnetic signals through the formation and a receiver for detecting response signals. the method comprises a) bringing the tool to... Agent: Shell Oil Company
20090237084 - Electromagnetic and magnetostatic shield to perform measurements ahead of the drill bit: A transmitter on a bottomhole assembly (BHA) is used for generating a transient electromagnetic signal in an earth formation. A pair of receivers on the BHA receive signals that are indicative of formation resistivity and distances to bed boundaries. A time dependent calibration factor or a time-independent calibration factor may... Agent: Madan & Sriram, P.C.
20090237085 - Voltage detection circuit: A voltage detection circuit 1A comprises a coil 5 connected between positive and negative terminals of a battery 3 through input terminals T1 and T2, and an MR device RM magnetically coupled to the coil 5. Employing such a structure makes it possible to detect the voltage of the battery... Agent: Oliff & Berridge, PLC
20090237086 - Modular heavy load battery test system: A modular heavy load battery test system is provided. The system includes a heavy load module and a battery tester. The heavy load module includes a housing, first and second lengths of high-resistivity, large-gauge wire arranged on respective upper and lower surfaces of a heat-resistant support plate, a switch and... Agent: Baker & Hostetler LLP
20090237087 - Power source health assessment methods and systems thereof: A method and system for assessing health of a power source includes measuring voltage and current of a power source in a system using a device in the system as the load. An internal resistance of the power source is determined based on the measured voltage and current. A health... Agent: Nixon Peabody LLP - Patent Group
20090237088 - Method for inspecting insulation property of capacitor: A method for inspecting insulation property of a capacitor, comprises the steps of: applying a DC voltage V1 higher than a voltage V0 to a capacitor to be inspected, in which the voltage V0 is predetermined for inspection of insulation property of the capacitor, to generate an electric current in... Agent: Nixon Peabody, LLP
20090237089 - Apparatus for transferring packaged chips, test handler and method for manufacturing packaged chips: An apparatus for transferring packaged chips, a test handler, and a method for manufacturing packaged chips are provided. The apparatus for transferring packaged chips may include a main frame having a coupling member coupled to a base plate and a supporting member coupled to the coupling member, a plurality of... Agent: Ked & Associates, LLP
20090237091 - Electrical tester setup and calibration device: An electronic testing machine includes a plurality of test modules. Each test module has a plurality of contact pairs for testing electronic components. An apparatus and process for electrical test setup and calibration of the electronic testing machine includes a plate having at least one contact per track movable between... Agent: Young Basile Hanlon Macfarlane & Helmholdt, P.C.
20090237090 - Method and system for adjusting characteristics of integrated relative humidity sensor: A method and system for adjusting characteristics of a relative humidity sensor in order to achieve a desired value of accuracy is presented. A relative humidity sensor, charge balance circuit include a series of sensing capacitors Cx1, Cx2 comprising of thin porous platinum top plate, a humidity sensitive polyimide dielectric,... Agent: Honeywell International Inc. Patent Services
20090237092 - Microwave and millimeter wave imaging system: A sensor array having a plurality of modulated slots for microwave and/or millimeter wave imaging. The locations of the slots in the array define a spatial domain away from an object for detecting an electric field from the object. Each of the slots outputs a signal representative of the measured... Agent: Senniger Powers LLP
20090237093 - Microwave rectenna based sensor array for monitoring planarity of structures: A microwave rectenna based sensor array is disclosed, which can remotely detect and monitor the planarity and curvature change of the surface of a structure, irrespective of the size or shape of the structure, by using a microwave signal.... Agent: Turocy & Watson, LLP
20090237095 - Method and device for measuring powder properties: An object of the present invention is to provide a method for measuring information relating to the impedance characteristics of a powder with high accuracy. To achieve such an object, the method for measuring powder properties according to the present invention includes a step in which the impedance characteristics of... Agent: Mcdermott Will & Emery LLP
20090237094 - Method for evaluating magnetoresistive element: A method for evaluating a magnetoresistive element includes polarizing the magnetoresistive element in a first direction of a core width, and stepwise increasing a maximum magnetic field applied in a measurement and measuring a maximum value of resistance of the magnetoresistive element at each step. Measuring the maximum value includes... Agent: Greer, Burns & Crain
20090237096 - Compensation tool for calibrating an electronic component testing machine to a standardized value: A compensation tool and process is provided for calibrating each test position located at a plurality of test modules of an electronic testing machine to a standardized value. Each test module is located on an angularly spaced radial line extending from an associated central axis and has a plurality of... Agent: Young Basile Hanlon Macfarlane & Helmholdt, P.C.
20090237100 - Electronic device test apparatus and method of mounting of performance board in electronic device test apparatus: An electronic device test apparatus comprising: a test apparatus body for testing IC devices formed on a wafer for electrical characteristics; a probe card for electrically connecting the IC devices and the test apparatus body; a prober for pushing the wafer against the probe card so as to electrically connect... Agent: Greenblum & Bernstein, P.L.C
20090237099 - Probe card substrate with bonded via: The present invention is directed to a probe head having a probe contactor substrate with at least one slot that passes through the probe contactor substrate, at least one probe contactor adapted to test a device under test, with the probe contactor being coupled to the a top side of... Agent: Pillsbury Winthrop Shaw Pittman LLP
20090237097 - Test interconnect: According to an example embodiment, a contact cell includes a first element that is flexible and electrically conductive, and that is structured to have at least one bend along an entire length of the first element. The contact cell further includes a second element that is flexible and electrically conductive,... Agent: Pepper Hamilton LLP
20090237098 - Wafer testing system integrated with rfid techniques and thesting method thereof: This invention provides a wafer testing system and testing method thereof. The wafer testing system comprises a wafer storage section, a prober, a tester, an RFID middleware unit, an EDA system and an MES system. The wafer storage section stores a multiplicity of carriers, each of which is provided with... Agent: Sinorica, LLC
20090237101 - Method for correcting displacement of multi card and method for testing circuit element: A method for correcting displacement of a multi card with respect to a product wafer, includes displacing a predetermined wafer on a stage of a probing device and forming a contact trace of a probe needle on a surface of the wafer by bringing the probe needle into contact with... Agent: Harness, Dickey & Pierce, P.L.C
20090237102 - Heating apparatus for semiconductor devices: A heating apparatus for semiconductor devices comprises an oven including a front wall having a plurality of front openings and a back wall having a plurality of back openings each with isolating self-closing doors, a carrier module configured to load semiconductor devices into the oven through the front opening in... Agent: Connolly Bove Lodge & Hutz LLP
20090237103 - Image sensor monitor structure in scribe area: A semiconductor die including a semiconductor chip and a test structure, located in a scribe area, is designed and manufactured. The test structure includes an array of complementary metal oxide semiconductor (CMOS) image sensors that are of the same type as CMOS image sensors employed in another array in the... Agent: Scully, Scott, Murphy & Presser, P.C.
20090237105 - Semiconductor arrangement and method for the measurement of a resistance: A semiconductor arrangement has a semiconductor body (CP), comprising a semiconductor layer (HL) with a first (AB11, AB12) and at least one second (AB21, AB22) conducting terminal areas, respectively made in two parts, and with a first (TAB1) and a second (TAB2) test terminals; a first (KI1, KU1) and at... Agent: Cohen, Pontani, Lieberman & Pavane LLP
20090237104 - Testing method of semiconductor integrated circuit and information recording medium: A testing method of semiconductor integrated circuit wherein the quality of diffusion for semiconductor chips can be tested before the semiconductor chips become packaged semiconductor integrated circuits is provided. Input data is set, and circuit current values I(L) and I(H) obtained for each of a plurality of circuit areas are... Agent: Steptoe & Johnson LLP09/17/2009 > patent applications in patent subcategories. class, title,number
20090230945 - Device and method allowing the detection and display of objects located behind an obscuring surface: A handheld device providing an internal view through an obscuring wall or other obscuring surfaces of hidden structural or facilities elements (such as wooden studs, electrical, plumbing, or HVAC), or the absence thereof. A continuous and homogeneous luminescent gas or other visual display material whose optical characteristics change as a... Agent: Fulwider Patton LLP
20090230947 - Semiconductor integrated circuit: A semiconductor integrated circuit is provided with a voltage level detector which detects a voltage level of a signal wire, and a transition time detector which detects a time length of a transition period during which the signal wire changes from an inactive voltage state to an active voltage state... Agent: Mcdermott Will & Emery LLP
20090230946 - Timing generator and semiconductor test apparatus: A timing generator reduces operation-dependent power consumption (AC component) and noises generated from a clock distribution circuit itself in distributing a clock, and further reduces a skew attributed to the clock distribution. A clock distribution circuit 20 for distributing the clock to timing generating sections 10-l to 10-n has a... Agent: Muramatsu & Associates
20090230948 - Rogowski coil assembly and methods: A Rogowski coil assembly includes a first Rogowski coil that surrounds a conductor and generates a first voltage output signal. A second Rogowski coil also surrounds the conductor. The second Rogowski coil generates a second voltage output signal. A relay device communicates with the first and second Rogowski coils and... Agent: King & Spalding, LLP
20090230949 - State detection device for decting operation state of high-frequency heating apparatus: An anode current detected by the anode current detection resistor 40 of a magnetron is inputted into the A/D converter terminal of a microcomputer 27 on a control panel circuit board side. The current is subjected to an analog-to-digital conversion to thereby obtain an anode voltage IaDC value. The microcomputer... Agent: Pearne & Gordon LLP
20090230950 - Plug-in amp/watt power meter: A power meter has a measuring circuit composed entirely of analog components that measures the instantaneous current draw of one or more electrical devices, such as home appliances. The power meter may be in the form of a hand-held device that includes elongated connections that allow a homeowner to measure... Agent: Boyle Fredrickson S.c.
20090230951 - Signal processing method and unit for a dimension-gauging system: A dimension-gauging system to determine at least one dimension of a non-ferrous, electrically conducting object produces a magnetic field inside the object and changes the excitation of the magnetic field. A signal processing unit measures the reaction of the magnetic field to the change in excitation, obtains an actual field... Agent: St. Onge Steward Johnston & Reens, LLC
20090230952 - Eddy current testing device: An eddy current testing device which confirms that a change in characteristics of a target object is detected regardless of the magnitude of the change and specifying the position of a portion from which the change is detected. The device uses an eddy current probe to inspect a bent portion... Agent: Mattingly & Malur, P.C.
20090230953 - Magnetoelastic torque sensor with ambient field rejection: The present invention involves a method and apparatus for canceling the effects of magnetic field noise in a torque sensor by placing three sets of magnetic field sensors around a shaft, the first set of field sensors being placed in the central region of the shaft and the second and... Agent: Blank Rome LLP
20090230954 - Ferromagnetic semiconductor, method for the production thereof, components incorporating the same, and corresponding uses of said semiconductor: The inventive ferromagnetic semiconductor comprises at least one magnetic element selected from the group consisting of Mn, Fe, Co, Ni and Cr, and has a Curie temperature which is equal to or higher than 350 K, and advantageously 400 K or higher. The semiconductor has a matrix which is depleted... Agent: Alston & Bird LLP
20090230955 - Orthogonal fluxgate magnetic field sensor: Orthogonal fluxgate sensor for measuring an external magnetic field Hext, comprising a conductor for carrying an excitation current lexc, a ferromagnetic material adapted to saturate in the presence of a magnetic field generated by the excitation current, and at least one pick-up coil adapted to detect variations in the magnetic... Agent: Baker & Daniels LLP
20090230957 - Method and magnetic resonance system to determine the phase position of a magnetization: In a method to determine a phase position of a magnetization that is caused by radiation of an adiabatic RF pulse for the acquisition of magnetic resonance signals from a slice of an examination subject, an RF pulse of a first type is radiated and a first magnetic resonance signal... Agent: Schiff Hardin, LLP Patent Department
20090230956 - Switchable manual/motor-driven nmr tuning systems and methods: According to some embodiments, motor-tuned nuclear magnetic resonance (NMR) probes may be tuned manually without overcoming the tuning motor holding force. An NMR probe includes a switchable manual-mode/motor-driven mode capacitance-adjustment assembly for adjusting the capacitance of a variable capacitor connected to an NMR RF coil. The capacitance-adjustment assembly includes a... Agent: Varian Inc. Legal Department
20090230960 - Method and magnetic resonance system to generate a fat-reduced, spatially resolved magnetic resonance spectrum: In a method and apparatus for generating a fat-reduced, spatially resolved magnetic resonance spectrum of an examination subject, first measurement data are acquired to generate a spatially resolved spectroscopy measurement, second spatially resolved measurement data are generated that essentially have only fat signal contributions, and the second measurement data are... Agent: Schiff Hardin, LLP Patent Department
20090230959 - Methods of using combined forward and backward sampling of nuclear magnetic resonance time domain for measurement of secondary phase shifts, detection of absorption mode signals devoid of dispersive components, and/or optimization of nuclear magnetic reso: The present invention relates to a method of conducting an N-dimensional nuclear magnetic resonance (NMR) experiment in a phase-sensitive manner by the use of forward and backward sampling of time domain shifted by a primary phase shift under conditions effective to measure time domain amplitudes and secondary phase shifts. The... Agent: Nixon Peabody LLP - Patent Group
20090230961 - Signal acquisition and processing method and apparatus for magnetic resonance imaging: A method and apparatus are disclosed for Magnetic Resonance Imaging using specialized signal acquisition and processing techniques for image reconstruction with a generally inhomogeneous static magnetic field. New signal processing methods for image reconstruction and for minimizing dephasing effects are disclosed. Imaging systems with smaller static magnetic field strengths and... Agent: Russ Weinzimmer
20090230958 - Slice-selective tunable-flip adiabatic low peak power excitation: A manifestation of the invention provides a method for slice selective excitation for magnetic resonance imaging (MRI). A B0 field is applied. A STABLE pulse comprising of a BIR-4 envelope sampled by a plurality of subpulses with a duration is applied, where amplitude and frequency modulation functions of the BIR-4... Agent: Beyer Law Group LLP
20090230962 - Signal acquisition and processing method and apparatus for magnetic resonance imaging: An instrument and method using electron spin resonance spectrometry for measuring the concentration of airborne soot particles, and the like, that includes continuously passing a sample of exhaust gas through a resonating RF microwave cavity resonator during the application therethrough of a uniform slowly varying uniform magnetic field that is... Agent: Cary Tope-mckay Tope-mckay & Associates
20090230964 - Arrangement to correct eddy currents in a gradient coil: In an arrangement to correct eddy currents in a gradient coil of a magnetic resonance apparatus, the gradient coil having a primary gradient sub-coil and a secondary gradient sub-coil connected in series with the primary gradient sub-coil, the secondary gradient sub-coil is coupled with the primary gradient sub-coil such that... Agent: Schiff Hardin, LLP Patent Department
20090230963 - Magnetic resonance resonator assembly: A resonator assembly for executing measurements on a sample within a constant magnetic field B0 by means of magnetic resonance is disclosed. It comprises a resonator portion defining a longitudinal axis and an axial direction. The resonator portion has, along the axial direction, a hollow cavity for exciting electron resonance... Agent: Law Offices Of Paul E. Kudirka
20090230965 - Coil decoupling in magnetic resonance imaging: A radio frequency coil array (50) includes at least first (501) and second (502) receive coils. A flux pipe (52) includes electrically connected first (2521) and second (2522) loop coils. The first (2521) and second (2522) loop coils are coupled to the respective first and second receive coils. The flux... Agent: Driggs, Hogg, Daugherty & Del Zoppo Co., L.p.a.
20090230966 - Methods and apparatuses for connecting receive coils in magnetic resonance imaging scanners: A coils array (40, 40′) including a plurality of coils (71, 72, 73) receives magnetic resonance signals from an examination region of a magnetic resonance imaging scanner (10). Each coil has mixing circuitry (74, 75, 76, 80, 81, 82) that frequency-shifts the received magnetic resonance signal to a selected transmission... Agent: Philips Intellectual Property & Standards
20090230968 - Antenna coupling component measurement tool having rotating antenna configuration: Disclosed herein are electromagnetic resistivity logging systems and methods that employ an antenna configuration having at most two transmitter or receiver antenna orientations that rotate relative to the borehole. The measurements made by this reduced-complexity antenna configuration enable the determination of at least seven components of a coupling matrix, which... Agent: Krueger Iselin LLP (1391)
20090230967 - Downhole spread spectrum induction instruments: A plurality of transmitters on a logging tool are activated simultaneously at substantially the same frequency. When the transmitter outputs are phase-modulated using a mutually orthogonal set of modulating functions, it is possible to recover, from the signal at each receiver, a response corresponding to each of the transmitters.... Agent: Madan & Sriram, P.C.
20090230969 - Downhole acoustic receiver with canceling element: A downhole tool string assembly comprising at least one transmitter. The transmitter may be a sonic transmitter, a seismic transmitter, or an ultrasonic transmitter. The transmitter may transmit an acoustic wave into an earthen formation. The speed of the wave as it travels through the formation or as it reflects... Agent: Tyson J. Wilde Novatek International, Inc.
20090230970 - Optimisation of mtem parameters: A method of optimising electromagnetic surveying comprising applying current to a current source, receiving a signal at one or more voltage receivers and recording the signals received, characterised by varying one or more acquisition parameters as a function of the source-receiver separation.... Agent: Mr Eugene Thigpen Petroleum Feo-services Inc
20090230971 - Switching unit adapted for communicating with a processing unit: An intelligent switching unit to be connected with a processing unit is disclosed, the intelligent switching unit comprising a switching unit to be actuated by a user, a detection module connected to the switching unit, the detection module detecting a signal outputted by the switching unit and providing a detected... Agent: Fasken Martineau Dumoulin, LLP
20090230972 - Capacity detector for detecting capacity of an energy storage unit: A capacity detector for detecting capacity of an energy storage unit includes a first and a second buffers and a voltage divider. The first buffer is used for generating a first threshold reference according to a first adjustable reference which is predetermined based upon chemistry of the energy storage unit.... Agent: O2micro Inc C/o Murabito, Hao & Barnes LLP
20090230973 - Planar type frequency shift probe for measuring plasma electron densities and method and apparatus for measuring plasma electron densities: A planar type frequency shift probe that utilizes resonance of electromagnetic waves and includes a main body with a conductor plate and a coaxial cable. The main body includes a long narrow space, which has predetermined width and length and has an opening on the periphery of the main body,... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090230974 - Traveling wave based relay protection: An apparatus includes at least one Rogowski coil and a processor. The at least one Rogowski coil is positioned within an electrical power distribution network to detect a first traveling wave current caused by a fault on an electrical power transmission line of the network, generate a first signal indicative... Agent: Fish & Richardson P.C.
20090230975 - Anisotropic conductive connector and inspection equipment of circuit device: Disclosed are an anisotropically conductive connector device, by which a good electrically connected state can be surely achieved even when the pitch of electrodes to be inspected is extremely small, and the good electrically connected state is stably retained even when used under a high-temperature environment, and an inspection apparatus... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090230976 - Apparatus and method for testing electrical interconnects: A test system including a package with interconnect paths. The package may have electrical paths that are electrically connected by the interconnect paths. The electrically connected electrical paths may yield increased data without significantly increasing the required testing hardware.... Agent: Dorsey & Whitney LLP On Behalf Of Sun Microsystems, Inc.
20090230977 - Apparatus and method for testing electrical interconnects with switches: A test system including a package with switchable paths. The package may have conductive paths that are selected by switches. The electrically switchable conductive paths may yield increased data without significantly increasing the required testing hardware.... Agent: Dorsey & Whitney LLP On Behalf Of Sun Microsystems, Inc.
20090230978 - Switch circuit, filter circuit and test apparatus: There is provided a switch circuit for switching whether to output an input signal, including: a transmission path that transmits the input signal from an input end to an output end of the switch circuit; a first semiconductor switch that is provided on the transmission path and switches whether to... Agent: Jianq Chyun Intellectual Property Office
20090230979 - Fullerene or nanotube, and method for producing fullerene or nanotube: Fullerenes are a novel material that has been expected to serve as a promising material in the construction of organic devices. However, the electric conductivity of fullerenes, which has been, reported heretofore spreads over a wide range including values corresponding to insulators as well as those corresponding to semiconductors. The... Agent: Young & Thompson
20090230980 - Method for measuring d-q impedance of polyphase power grid components: A method is provided for measuring D-Q impedance of a component of a polyphase power grid connected to a grid node, and evaluating the margin of stability at a node using Nyquist diagrams generated from the measured D-Q impedance data. A generator, coupled to the polyphase power grid, is controlled... Agent: Taylor & Aust, P.C.
20090230982 - Contact for electrical test, electrical connecting apparatus using it, and method of producing the contact: A contact comprises a contact body at least provided with an arm region extending in the right-left direction, and a tip region extending downward from the front end portion of the arm region. The tip region is provided with a pedestal portion integrally continuous to the lower edge portion on... Agent: Ingrassia Fisher & Lorenz, P.C.
20090230981 - Increasing thermal isolation of a probe card assembly: A probe card assembly can include an electrical interface to a test system for testing electronic devices such as semiconductor dies. The probe card assembly can also include probes located at a first side of the probe card assembly. The probes, which can be electrically connected to the electrical interface,... Agent: N. Kenneth Burraston Kirton & Mcconkie
20090230984 - Defective product inspection apparatus, probe positioning method and probe moving method: For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional... Agent: Mcdermott Will & Emery LLP
20090230983 - Socket for inspection: A support block is provided with a plurality of through holes for supporting probes. The probes for signals, for power supply and for grounding are secured in the through holes of the support block and electrically interconnect electrode terminals of a device to be inspected, which is provided on one... Agent: Morgan Lewis & Bockius LLP
20090230985 - Burn-in system with measurement block accomodated in cooling block: A burn-in system enabling the temperatures of a large number of electronic devices differing in amount of self generated heat to be simultaneously reliably adjusted to a predetermined temperature, that is, a burn-in system bringing heater blocks having heaters, cooling blocks formed with channels able to carry a coolant, and... Agent: Birch Stewart Kolasch & Birch
20090230987 - Semiconductor device: An exemplary aspect of an embodiment of the present invention is a semiconductor device including a plurality of test elements formed in an array on a semiconductor substrate, an address signal generating portion that generates an address signal corresponding to each of the test elements, and a digital-to-analog converter that... Agent: Mcginn Intellectual Property Law Group, PLLC
20090230986 - Semiconductor integrated circuit, fuse circuit for semiconductor integrated circuit and control method of the same: A fuse circuit for a semiconductor integrated circuit includes a control unit configured to activate a fuse set control signal in response to an external command signal, and a plurality of fuse sets, each configured so that power is supplied to internal fuses in response to the activation of the... Agent: Baker & Mckenzie LLP Patent Department09/10/2009 > patent applications in patent subcategories. class, title,number
20090224747 - Ratiometric ac wire tracer: An implementation of an apparatus and method for sensing electrical wiring, for example, hidden behind a surface such as a wall is provided. The apparatus and method use multiple sensor signals, which may measure electric fields or changes in a dielectric. Pairs of signals are combined and compared to a... Agent: Silicon Valley Patent Group LLP
20090224748 - System and method of sensing actuation and release voltages of an interferometric modulator: A method for sensing the actuation and/or release voltages of a electromechanical system or a microelectromechanical device include applying a varying voltage to the device and sensing its state and different voltage levels. In one embodiment, the device is part of a system comprising an array of interferometric modulators suitable... Agent: Knobbe Martens Olson & Bear LLP
20090224749 - Method for measuring electric potential on sample, and charged particle beam system: A charged particle beam system for measuring a sample such as a photomask is provided. The system is capable of adjusting its condition with high accuracy to measure the sample even when a back surface of the sample is charged. The charged particle beam system measures an electric potential distribution... Agent: Mcdermott Will & Emery LLP
20090224750 - Multiple dimension position sensor: An apparatus including a controller, a workpiece transport in communication with the controller having a movable portion and a transport path, and a multi-dimensional position measurement device including at least one field generating platen attached to the movable portion and at least one sensor group positioned along the transport path... Agent: Perman & Green
20090224751 - Inductive position sensor: An inductive position sensor, which in particular is a rotational angle sensor, is provided with two first transmitter units for the generation of two site-dependent first alternating fields having the same carrier frequency, and at least one oscillating circuit arranged in or on an element which may be moved within... Agent: Renner Otto Boisselle & Sklar, LLP
20090224752 - Reactance sensors of radial position for magnetic bearings and bearingless drives: A radial position sensor includes a rotating element configured to rotate about an axis of rotation, which subject to displacement. The displacement from a first position to a second position can be represented by polar coordinates, e.g., (ρ, φ), where ρ is a distance and φ is an angle. The... Agent: Townsend And Townsend And Crew, LLP
20090224753 - Electric field/magnetic field sensors and methods of fabricating the same: An electric field sensor is obtained by directly forming an electrooptical film of Fabry-Perot resonator structure on a polished surface at a tip of an optical fiber by an aerosol deposition method.... Agent: Young & Thompson
20090224754 - Two-terminal linear sensor: A magnetic field sensor includes a linear magnetic field sensor to produce a voltage proportional to a sensed magnetic field and an interface having only two terminals for external connections. The two terminals of the interface include a power supply terminal and a ground terminal. The interface includes a voltage-controlled... Agent: Daly, Crowley, Mofford & Durkee, LLP
20090224755 - Means and method for sensing a magnetic stray field in biosensors: A magnetic sensor (MS) comprising a magneto-resistive element (GMR) for sensing a magnetic stray field (SF) generated by a magnetizable object (SPB) when magnetized and for generating an electrical object signal (UOB) which depends on the sensed magnetic stray field (SF), the sensor (MS) comprising a magnetic field generator (WR1,... Agent: Philips Intellectual Property & Standards
20090224756 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: A magnetic resonance imaging apparatus includes a sensitivity map data generating unit and a sensitivity corrected image data generating unit. The sensitivity map data generating unit generates reference image data based on data for generating sensitivity map data of a phased array coil and generates the sensitivity map data by... Agent: Knoble, Yoshida & Dunleavy
20090224757 - Method and apparatus for acquiring mri data for pulse sequences with multiple phase encode directions and periodic signal modulation: A method for acquiring magnetic resonance (MR) data for a pulse sequence with periodic signal modulation and a set of views having at least two phase encode directions includes selecting a direction of modulation. Each view in the set of views is assigned a readout number based on a position... Agent: Peter Vogel Ge Healthcare
20090224758 - Nmr probe: A probe for NMR comprises a coil for irradiating an RF magnetic field and a coil for receiving an NMR signal, wherein the coil for irradiating the RF magnetic field comprises one wire or one sheet of foil, and the coil for receiving the NMR signal is formed of part... Agent: Antonelli, Terry, Stout & Kraus, LLP
20090224759 - Systems and methods for reconstruction of sensitivity encoded mri data: Methods and systems in a parallel magnetic resonance imaging (MRI) system utilize sensitivity-encoded MRI data acquired from multiple receiver coils together with spatially dependent receiver coil sensitivities to generate MRI images. The acquired MRI data forms a reduced MRI data set that is undersampled in at least a phase-encoding direction... Agent: Mcdermott Will & Emery LLP
20090224760 - Complete structure elucidation of molecules utilizing single nmr experiment: The complete structure of a molecule of interest is determined from a single NMR experiment utilizing a single NMR pulse sequence. The experiment utilizes the same pulse sequence for acquiring various one-dimensional and multi-dimensional spectra, with independent receivers tuned to individual resonance frequencies.... Agent: Varian Inc. Legal Department
20090224761 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: A magnetic resonance imaging apparatus includes a spectrum acquisition unit and a determining unit. The spectrum acquisition unit acquires a frequency spectrum of magnetic resonance signals from a metabolic product in a target region in an object. The determining unit determines one of the numbers of integrations and phase encodes... Agent: Nixon & Vanderhye, PC
20090224762 - Electronic nmr reference signal systems and methods: According to some embodiments, a synthetic nuclear magnetic resonance (NMR) reference signal is injected into the receive path of an NMR spectrometer, after the NMR probe and before the receive amplifier. The synthetic signal is generated using a transmit path for the same channel or for a different channel than... Agent: Varian Inc. Legal Department
20090224763 - Method and apparatus for lossless or low loss coupling for many channel rf coil arrays: Embodiments of the invention relate to methods and apparatus for lossless, or low loss, coupling for many channel RF coil arrays. Non-invertible noise can be converted to invertible noise. Specific embodiments pertain to methods and apparatus for magnetic resonance imaging (MRI) with many channel RF coil arrays. Specific embodiments pertain... Agent: Saliwanchik Lloyd & Saliwanchik A Professional Association
20090224764 - Electromagnetic wave resistivity tool having a tilted antenna for determining the horizontal and vertical resistivities and relative dip angle in anisotropic earth formations: This invention is directed to a downhole method and apparatus for simultaneously determining the horizontal resistivity, vertical resistivity, and relative dip angle for anisotropic earth formations. The present invention accomplishes this objective by using an antenna configuration in which a transmitter antenna and a receiver antenna are oriented in non-parallel... Agent: Krueger Iselin LLP (1391)
20090224765 - Bottom system for geophysical survey (variants): A bottom system related to equipment deployed for seabed geo-electrical survey is proposed, in preferred embodiments comprising a basic module, including registration and power supply means, or a combination of the basic module with at least one additional module: a magnetic characteristics measuring module or/and a seismic characteristics measuring module.... Agent: Aleksandr Smushkovich
20090224766 - Correction of sensor non-equipotentiality in a resistivity imaging device: A method for correcting data from a sensor electrode in a sensor includes determining a potential difference (V) between the sensor electrode and another sensor electrode; from the potential difference (V), determining a by-pass current (Ic) between the sensor electrode and the another sensor electrode; and from the by-pass current... Agent: Cantor Colburn LLP- Baker Atlas
20090224767 - Test method and apparatus for spark plug ceramic insulator: A test method for a spark plug ceramic insulator includes placing a first electrode in an inner hole of the ceramic insulator and placing a second electrode on an outer peripheral side of the ceramic insulator, developing a defect in the ceramic insulator by the application of a first voltage... Agent: Sughrue Mion, PLLC
20090224769 - Multi-series battery control system: A multi-series battery control system comprises a plurality of unit battery cell of which unit consists of multiple battery cells connected in series; a plurality of control IC comprising a control circuit for controlling the unit battery cell, a main controller that sends and receives signal to/from the control ICs... Agent: Antonelli, Terry, Stout & Kraus, LLP
20090224768 - Shunt resistor with measurement circuit: A shunt resistor with a measurement circuit, retained on the shunt resistor, on a printed circuit board is proposed, in which separate spacers, by way of which the measurement circuit can be put in electrical and mechanical contact with the shunt resistor, are disposed between the printed circuit board of... Agent: Ronald E. Greigg Greigg & Greigg P.l.l.c.
20090224770 - Screening of electrolytic capacitors: A method for screening electrolytic capacitors places a capacitor in series with a resistor in series with a resistor, applying a test voltage and following the charge curve for the capacitor. A high voltage drop indicates high reliability and a low voltage drop is used to reject the piece. The... Agent: Nexsen Pruet, LLC
20090224771 - System and method for measuring battery internal resistance: In one aspect the present disclosure relates to a system for measuring an internal resistance of a battery. The system may involve: a processor; a load module responsive to the processor for applying a load across the battery; a current sense subsystem for sensing the current flowing to the load... Agent: Harness, Dickey & Pierce, P.L.C
20090224772 - System and method for de-embedding a device under test employing a parametrized netlist: S-parameter data is measured on an embedded device test structure, an open dummy, and a short dummy. A 4-port network of the pad set parasitics of the embedded device test structure is modeled by a parameterized netlist containing a lumped element network having at least one parameterized lumped element. The... Agent: Scully, Scott, Murphy & Presser, P.C.
20090224773 - Communicating with an implanted wireless sensor: The present invention determines the resonant frequency of a sensor by adjusting the phase and frequency of an energizing signal until the frequency of the energizing signal matches the resonant frequency of the sensor. The system energizes the sensor with a low duty cycle, gated burst of RF energy having... Agent: John S. Pratt, Esq Kilpatrick Stockton, LLP
20090224774 - High voltage sensor circuit: A microprocessor-controlled high voltage sensor circuit controls resonant operation of an induction coil—capacitor circuit. The sensor circuit includes an input that receives a high voltage signal from the induction coil—capacitor circuit, an attenuator coupled to the input, wherein the attenuator reduces the high voltage signal to a low voltage signal,... Agent: Andrews Kurth LLP Intellectual Property Department
20090224775 - Capacitance sensor: A capacitance sensor includes a first charging voltage detector configured to detect a change in a voltage loaded into a first capacitor between an electrode and a ground terminal a second charging voltage detector configured to detect a change in a voltage loaded into a second capacitor among a plurality... Agent: Fujitsu Patent Center C/o Cpa Global
20090224776 - System and method for measuring a capacitance by transferring charge from a fixed source: A touch sensor device and method is provided that determines measurable capacitances for object detection. The systems and methods measure capacitance by controllably transferring charge from a storage capacitor, and determining the measurable capacitance by measuring the residual voltage remaining on the storage capacitor after the transfer. The systems and... Agent: Ingrassia Fisher & Lorenz, P.C. (syna)
20090224777 - System for testing a flat panel display device and method thereof: A system for testing a flat panel display having a flat display panel assembly includes a testing stage for arranging tie flat display panel assembly, a measuring apparatus being disposed on the testing stage and for measuring a spectrum of a transmitted light passing through a measuring region of the... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c
20090224778 - Test apparatus, test method, and manufacturing method: An apparatus includes: a strip line cell 100 having a first conductor board that has the width larger than the width of RFID tag T1 that receives a predetermined radio wave signal and reacts, to which first conductor board an electric signal that corresponds to the radio wave signal is... Agent: Westerman, Hattori, Daniels & Adrian, LLP
20090224779 - Chip test apparatus and probe card circuit: A circuit in probe card, which includes a signal line, a detection probe and a plurality of switch modules. A plurality of test response signals form a plurality of chips to be tested are transmitted on the signal line. The detection probe is coupled to the signal line for receiving... Agent: Jianq Chyun Intellectual Property Office
20090224781 - Contact prove and method of making the same: It includes a first printed wiring board 3 having a signal electrode 10a and a ground electrode 10b used as a contact part with respect to a measuring object, in which the signal electrode 10a and ground electrode 10b are formed of a metal wiring pattern on a substrate, and... Agent: Westerman, Hattori, Daniels & Adrian, LLP
20090224783 - Membrane probing system with local contact scrub: A membrane probing assembly includes a support element having an incompressible forward support tiltably coupled to a rearward base and a membrane assembly, formed of polyimide layers, with its central region interconnected to the support by an elastomeric layer. Flexible traces form data/signal lines to contacts on the central region.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel, LLP
20090224782 - Test socket for testing semiconductor package: A test socket, adapted for connecting the semiconductor package and a printed circuit board comprises a base and a plurality of contacts received in the base. The base has a retaining board defining a plurality of first receiving holes and a positioning board defining a plurality of second receiving holes.... Agent: Wei Te Chung Foxconn International, Inc.
20090224784 - Testing integrated circuits using few test probes: A method of testing integrated circuits, including: establishing at least a first physical communication channel between a test equipment and an integrated circuit under test by having at least a first probe of the test equipment contacting a corresponding physical contact terminal of the integrated circuit under test; having the... Agent: Stmicroelectronics Inc. C/o Wolf, Greenfield & Sacks, P.C.
20090224780 - Wafer level test probe card: A probe card for wafer level testing of a plurality of semiconductor devices simultaneously. The probe card may include a circuit board including wafer level testing circuitry, a partially flexible silicon substrate, a plurality of test probes disposed at least partially in the substrate for engaging a plurality of corresponding... Agent: Duane Morris LLP (tsmc)IPDepartment
20090224785 - Providing an electrically conductive wall structure adjacent a contact structure of an electronic device: Devices and methods for providing, making, and/or using an electronic apparatus having a wall structure adjacent a resilient contact structure on a substrate. The electronic apparatus can include a substrate and a plurality of electrically conductive resilient contact structures, which can extend from the substrate. A first of the contact... Agent: N. Kenneth Burraston Kirton & Mcconkie
20090224786 - Radio frequency testing system and testing circuit utilized thereby: A radio frequency (RF) testing system (100) includes a RF signal source (10) generating RF signals, an antenna (50), a RF testing circuit (40) disposed on a printed circuit board (PCB) (41), a testing probe (20) for receiving the RF signal from the RF testing circuit, and a testing apparatus... Agent: PCe Industry, Inc. Att. Steven Reiss
20090224788 - Apparatus for detecting defect: The present invention provides an apparatus for detecting defect capable of measuring temperature characteristics of a semiconductor sample without restrictions in the movement range of a sample stage and a probe device by a temperature control device. A heater 55 heats a sample stage, and the sample stage is cooled... Agent: Mcdermott Will & Emery LLP
20090224789 - Automated contact alignment tool: A method for determining the alignment of a plurality of contacts in an electronic testing machine is disclosed. The contacts are swept over an electronic component taking a plurality of electrical readings. These electrical readings are charted against a desired orientation to determine alignment. Alignment can be corrected as necessary... Agent: Young Basile Hanlon Macfarlane & Helmholdt, P.C.
20090224787 - Probing apparatus for measuring electrical properties of integrated circuit devices on semiconductor wafer: A probing apparatus comprises a wafer chuck configured to receive a semiconductor wafer having a plurality of integrated circuit devices and test keys configured to monitor the fabrication quality of the integrated circuit devices, a carrier configured to receive a probe card having a plurality of probe needles configured to... Agent: Wpat, PC Intellectual Property Attorneys
20090224790 - Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes: Disclosed is a probe assembly for use in electrical testing of a test object. The probe assembly has a probe supporter body elongated in a first direction. The probe supporter has a first side surface, a second side surface, a first facing surface and a second facing surface. The first... Agent: Knobbe Martens Olson & Bear LLP
20090224791 - De-embedding method for on-wafer devices: A method and system for de-embedding an on-wafer device is disclosed. The method comprises representing the intrinsic characteristics of a test structure using a set of ABCD matrix components; determining the intrinsic characteristics arising from the test structure; and using the determined intrinsic characteristics of the test structure to produce... Agent: Haynes And Boone, LLPIPSection
20090224793 - Method and apparatus for designing a custom test system: Methods, apparatus, and computer readable media for designing a custom test system are described. Examples of the invention can relate to a method of generating test system software for a semiconductor test system. In some examples, a method can include obtaining a configuration of the semiconductor test system, the configuration... Agent: MoserIPLaw Group / Formfactor, Inc.
20090224792 - Method to reduce test probe damage from excessive device leakage currents: A method is provided for predicting leakage current in a semiconductor die with a plurality of devices. A limited leakage macro is incorporated on the semiconductor die. The limited leakage macro is initially tested to measure a leakage current before testing devices outside the limited leakage macro. The measured leakage... Agent: Wood, Herron & Evans, LLP (ibm-bur)
20090224794 - Semiconductor integrated circuit and method for inspecting same: An internal connection output pad (14A) connected to a CMOS output circuit (15A, 16A) on a first chip (11A) is electrically connected via a chip-to-chip bonding wire (17) to an internal connection input pad (14B) connected to a CMOS input circuit (15B, 16B) on a second chip (11B). In order... Agent: Mcdermott Will & Emery LLP
20090224795 - Current-voltage-based method for evaluating thin dielectrics based on interface traps: A method for evaluating gate dielectrics (100) includes providing a test structure (101). The test structure includes a gate stack that includes a gate electrode on a gate dielectric on a substrate, and at least one diffusion region diffused in the substrate including a portion below the gate stack and... Agent: Texas Instruments Incorporated09/03/2009 > patent applications in patent subcategories. class, title,number
20090219007 - Measurement apparatus, test apparatus, and measurement method: Provided is a transformer, comprising a first winding and a second winding that interlink with a main magnetic flux; and a third winding that interlinks with a magnetic flux leakage interlinking with only one of the first winding and the second winding.... Agent: Masao Yoshimura
20090219008 - Phase detector utilizing analog-to-digital converter components: Methods and systems are provided for an improved phase detector utilizing analog-to-digital converter (ADC) components. In an embodiment, the method includes from an ADC having a sampling clock signal that determines sampling instants, obtaining a first comparison value between an analog signal and a first threshold voltage at a first... Agent: Workman Nydegger 1000 Eagle Gate Tower
20090219009 - Current measurement device: A current measurement device is disclosed that is configured to measure electrical current, both AC and DC, in a primary conductor that is electrically insulated from the current measuring device. Unlike known current measuring devices, the current measuring device in accordance with the present invention does not utilize a Hall... Agent: Katten Muchin Rosenman LLP (c/o Patent Administrator)
20090219010 - Calibrating signals by time adjustment: A signal processing device having an adjustment unit for adjusting a time duration of each of a plurality of signals individually in accordance with an amplitude of the respective signal to thereby generate calibrated signals, and a combining unit for combining the calibrated signals.... Agent: Gregory W. Osterloth Holland & Hart, LLP
20090219011 - Correcting offset in magneto-resistive devices: Method and apparatus improve sensing accuracy and reduce bias shift in anisotropic magneto-resistive sensors using paired integrators and sampling switches for processing outputs of the sensor on applied set and reset signals with high immunity to temperature variations.... Agent: Fenwick & West LLP
20090219012 - Microelectronic sensor device for concentration measurements: The invention relates to a method and a magnetic sensor device for the determination of the concentration of target particles (2) in a sample fluid, wherein the amount of the target particles (2) in a sensitive region (14) is observed by sampling measurement signals with associated sensor units (10a-10d). The... Agent: Philips Intellectual Property & Standards
20090219013 - Method and device for secure monitoring of a distance: The invention relates to a method for securely monitoring a distance between a metallic part and an inductive proximity sensor, in particular for monitoring a closed position of a guard door in an automated system, said method having the steps of: providing an oscillating circuit, providing a metallic part made... Agent: Harness, Dickey & Pierce, P.L.C
20090219014 - Rotation sensor: e
20090219015 - Apparatus for measuring kinetic parameters of punch: An exemplary apparatus and method for measuring kinetic parameters of a machining tool within a press molding machine includes two magnets and two electrical conductors attached to a machining tool. The two magnets are fixed for producing two magnetic fields that are at an angle to each other. The two... Agent: PCe Industry, Inc. Att. Steven Reiss
20090219016 - System for detecting an absolute angular position by differential comparison, rolling bearing and rotary machine: System for detecting angular position of a rotating element with respect to a non-rotating element, comprising an annular coder provided with a number P of poles greater than or equal to 2 intended to be fixed to one of the rotating or non-rotating elements and a number N of sensors,... Agent: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
20090219017 - Tone wheel and method for manufacturing the same: A tone wheel constituting a rotation detection magnetic encoder in combination with a magnetic sensor fixed onto a stationary side member, the tone wheel comprising a metal reinforcing ring fitted in a rotary side member and a circular multipolar magnet fixed to the metal reinforcing ring. the circular multipolar magnet... Agent: Bacon & Thomas, PLLC
20090219018 - Method for inspecting magnetic characteristics of a plurality of thin magnetic heads by means of local application of magnetic field: A method for inspecting magnetic characteristics of a thin film magnetic head that is arranged in a row bar includes: a step of preparing a row bar having sliders including a thin film magnetic head formed therein and lapping guides having magnetoresistance effect; a step of preparing a magnetic field... Agent: Knobbe Martens Olson & Bear LLP
20090219019 - Downhole micro magnetic resonance analyzer: A downhole micro MR analyzer for use in a wellbore, having a micro sample tube, a micro RF coil in close proximity to the micro sample tube, and one or more magnets disposed about the micro sample tube is disclosed. The micro MR analyzer can be used for nuclear magnetic... Agent: Schlumberger Oilfield Services
20090219020 - Magnetic resonance imaging apparatus: When a magnetic resonance signal is received more than once, while a table (transfer unit) is moved, a gradient magnetic field is applied in the table moving direction, and an application amount (intensity and application time) of the gradient magnetic field in the table moving direction is changed every acquisition... Agent: Antonelli, Terry, Stout & Kraus, LLP
20090219021 - Method and apparatus for removing artifacts during magnetic resonance imaging: In a method and apparatus for removing artifacts during magnetic resonance imaging, a number of sets of 3D are generated data by scanning, with each set of 3D data containing a number of sets of 2D data. A weighted sum of all the 2D data corresponding to the same overlapped... Agent: Schiff Hardin, LLP Patent Department
20090219022 - Methods of in-vitro analysis using time-domain nmr spectroscopy: An in vitro method of determining an analyte concentration of a sample includes placing the sample into a low-field, bench-top time-domain nuclear magnetic resonance (TD-NMR) spectrometer. The NMR spectrometer is tuned to measure a selected type of atom. A magnetic field is applied to the sample using a fixed, permanent... Agent: Nixon Peabody LLP
20090219023 - Method of and software application for quantifying objects in magnetic resonance images via multiple complex summations: A method comprises digitally representing a volume of space as a plurality of voxels and assigning real and imaginary values derived from magnetic resonance imaging data of the space to each of the voxels. Furthermore, the method comprises a steps of calculating a first complex summation of the real and... Agent: Thompson Coburn LLP
20090219024 - Magnetic resonance system having a superconducting whole-body receiving arrangement: A data acquisition unit of a magnetic resonance system has an examination region therein, relative to which an examination subject is conveyed by a patient bed. The data acquisition unit has a built-in radio-frequency transmission arrangement, that radiates radio-frequency energy into the examination subject, and a built-in reception arrangement that... Agent: Schiff Hardin, LLP Patent Department
20090219025 - Coil and mri system: A coil includes a coil element to receive MR signals with a first frequency from a subject. The coil element includes a main current path section in which an MR current arising due to electromagnetic induction of the MR signals with said first frequency flows, and a current blocking section... Agent: Patrick W. Rasche (20459) Armstrong Teasdale LLP
20090219026 - Multi-channel birdcage body coil for magnetic resonance imaging: A birdcage multi-channel body coil has a number of coil units that form a cylindrical shape, and they are connected in succession in the circumferential direction along the side face of the cylinder. The coil units are provided with capacitors with selected capacitance values that eliminate coupling between the coil... Agent: Schiff Hardin, LLP Patent Department
20090219027 - Multi-sensor system for the detection and characterization of unexploded ordnance: To fully characterize the inductive response of an isolated conductive object, such as buried unexploded ordinance, one needs to measure its response to stimulation by primary magnetic fields in three linearly independent (e.g., approximately orthogonal) directions. In one embodiment this is achieved by measuring the response to magnetic fields of... Agent: Lawrence Berkeley National Laboratory
20090219028 - Methods for controlling ion beam and target voltage in a neutron generator for improved performance: A method for operating a pulsed neutron generator includes adjusting a target current of the neutron generator to a preselected value. A parameter related to a neutron output of the neutron generator is measured. A target voltage of the neutron generator is adjusted to maintain the measured parameter within a... Agent: Schlumberger Oilfield Services
20090219029 - Method for hydrocarbon reservoir mapping and apparatus for use when performing the method: A method is proposed for a marine electromagnetic survey based on the TM mode, for the purpose of prospecting for and detecting subsurface hydrocarbon reservoirs. The method includes an electromagnetic field source (1113) that, in a submerged, essentially vertical transmitter antenna, generates and injects electric current pulses (81,82) with a... Agent: Gable & Gotwals
20090219030 - Methods and systems for detecting rotor field ground faults in rotating machinery: Embodiments of the invention can include methods and systems for detecting rotor field ground faults in rotating machinery. In one embodiment, a system can include a rotor of the rotating machine comprising a plurality of field windings substantially disposed therein and a stator of the rotating machine comprising a plurality... Agent: Sutherland Asbill & Brennan LLP
20090219031 - Method for checking the current flow through individual wires of a braided wire, and apparatus for carrying out the method: In order to make it possible to detect a fault location, safely, reliably and with a high response sensitivity, in a braided wire which has a plurality of individual wires, an electric current is passed through the braided wire and the magnetic field which is formed as a result of... Agent: Lerner Greenberg Stemer LLP
20090219032 - System and method for determining circuit functionality under varying external operating conditions: A system and method for determining circuit functionality under varying external operating conditions. One embodiment provides a circuit for a given input signal. Internal signals are generated at internal nodes for the given input signal and the next set of external operating conditions. The internal signals are compared with internal... Agent: Dicke, Billig & Czaja
20090219033 - Device for triggering an electromagnetic actuator and method for testing a first inductor of an electromagenetic actuator: In a device for triggering an electromagnetic actuator and a method for testing an inductor of an electromagnetic actuator, the inductor is connected to a test circuit in such a way that a resonant circuit is created, and an evaluation circuit is provided that evaluates at least one electrical parameter... Agent: Kenyon & Kenyon LLP
20090219034 - Diagnostic circuit and method of testing a circuit: A diagnostic circuit is configured for connecting to a unit under test that has a load and a sinusoidal source. The diagnostic circuit includes a voltage sensing device that has an input for sensing a signal, a first terminal for connecting to the load, a second terminal for connecting to... Agent: Lerner Greenberg Stemer LLP
20090219035 - Method and system for improved testing of transistor arrays: An electronic test system to evaluate the pixel and array properties of active-matrix displays that use charge or current sensitive circuits attached to the array data lines is described. Leakage-current, charging time, and other metrics can be measured for all pixels in the array without electrical or optical connection to... Agent: Fay Sharpe / Xerox - Parc
20090219036 - Micromechanical microwave power meter: A micromechanical sensor for measuring millimetric wave or microwave power, which sensor comprises a wave line for conducting the millimetric or microwave power and a part arranged to move and a fixed electrode, in such a way that the capacitance (C) between the part that is arranged to move and... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP
20090219037 - Sensor for measuring moisture and salinity: A sensor for measuring the moisture and salinity of a material is disclosed herein. The sensor preferably includes a soil moisture circuit, a soil salinity circuit and a probe structure. The soil moisture circuit includes a high frequency oscillator, a voltage meter and a reference capacitor. The soil salinity circuit... Agent: Clause Eight Intellectual Property Services
20090219038 - Pulse circuit using a transmission line: A circuit is provided wherein a test pulse is provided to a device under test. A module allows the test pulse to pass through to the device under test. The module blocks a reflected pulse from passing through to the device under test when the reflected pulse has an opposite... Agent: Freescale Semiconductor, Inc. Law Department
20090219039 - Method and circuit for detecting the presence, position and/or approach of an object in relative to at least one electrode: A circuit for detecting the presence, position or the approach of an object in an observation area, the circuit has a sensor electrode assembly with an electrode that forms part of a capacitor system whose capacitance relative to a reference potential (e.g. ground) is dependent on the presence, position or... Agent: K.f. Ross P.C.
20090219040 - Sensor for quantifying widening reduction wear on a surface: A wear sensor (30, 50, 60) installed on a surface area (24) of a component (20, 21) subject to wear from an opposing surface (74, 75). The sensor has a proximal portion (32A, 52A, 62A) and a distal portion (32C, 52C, 62C) relative to a wear starting position (26). An... Agent: Siemens Corporation Intellectual Property Department
20090219041 - Water content detection sensor system: A water content detection sensor includes a circuit member in which low resistance conductors 1,2 disposed in parallel to each other and a high resistance conductor 3 connecting end portions of the respective low resistance conductors, a carrier body 4 having a water-proof property and an insulating property, and a... Agent: Butzel LongIPDocketing Dept
20090219044 - Calibration technique for measuring gate resistance of power mos gate device at wafer level: This invention discloses a method for calibrating a gate resistance measurement of a semiconductor power device that includes a step of forming a RC network on a test area on a semiconductor wafer adjacent to a plurality of semiconductor power chips and measuring a resistance and a capacitance of the... Agent: Bo-in Lin
20090219042 - Probe card: A probe card includes a plurality of probes that contacts a plurality of electrodes provided in the semiconductor wafer and that inputs or outputs an electrical signal in or from the electrodes, a probe head that holds the probes, a substrate having a wiring which is provided near the surface... Agent: Edwards Angell Palmer & Dodge LLP
20090219043 - Probe card: A probe card includes probes that are made of a conductive material and come into contact with a semiconductor wafer to receive or output an electric signal; a probe head that holds the probes; a substrate that has a wiring pattern corresponding to a circuit structure for generating a signal... Agent: Edwards Angell Palmer & Dodge LLP
20090219046 - Probe card inclination adjusting method, inclination detecting method and storage medium storing a program for performing the inclination detecting method: An inclination adjusting method adjusts an inclination of a probe card installed at a probe apparatus to make the probe card be in parallel with a mounting surface of a movable mounting table for mounting thereon an object to be inspected. The method includes: detecting an average tip height of... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090219045 - Testbed for testing electronic circuits and components: There is disclosed an electronic testbed, an electronic testbed board, and a method for positioning receptacles for nails in the electronic testbed board. In an embodiment, the electronic testbed board includes a mounting through-hole for mounting a receptacle for a nail. The mounting through-hole is drilled to a suitably precise... Agent: Fasken Martineau Dumoulin LLP
20090219047 - probe for testing electrical properties of a test sample: A probe for testing electrical properties of test samples includes a body having a probe arm defining proximal and distal ends, the probe arm extending from the body at the proximal end of the probe arm, whereby a first axis is defined by the proximal and the distal ends. The... Agent: Klein, O'neill & Singh, LLP
20090219048 - Image display device and testing method of the same: It is the primary object of the present invention to provide a simple and accurate testing circuit and a testing method while occupying as small space as possible in an image display device. The testing circuit including a NAND circuit connected in series is mounted on the image display device.... Agent: Cook Alex Ltd
20090219049 - Method and apparatus for testing and protecting digital output circuits: A method and system for testing and protecting the operability of an output module. An output channel includes a transistor having a gate, a source, and a drain. The output channel drives a load with a load voltage and a load current in dependence upon a gate drive signal applied... Agent: Rockwell Automation, Inc./bf
20090219050 - Method for detecting a malfunction in an electromagnetic retarder: A method for detecting a malfunction in an electromagnetic retarder. More specifically, the method relates to a retarder comprising: stator primary coils (8); a control unit (19) for injecting a current into the primary coils (8), the current having an intensity corresponding to an intensity set value (Ci); a sensor... Agent: Berenato, White & Stavish, LLCPrevious industry: Electricity: power supply or regulation systems
Next industry: Electronic digital logic circuitry
RSS FEED for 20150611:
Integrate FreshPatents.com into your RSS reader/aggregator or website to track weekly updates.
For more info, read this article.
Thank you for viewing Electricity: measuring and testing patents on the FreshPatents.com website. These are patent applications which have been filed in the United States. There are a variety ways to browse Electricity: measuring and testing patent applications on our website including browsing by date, agent, inventor, and industry. If you are interested in receiving occasional emails regarding Electricity: measuring and testing patents we recommend signing up for free keyword monitoring by email.
Advertise on FreshPatents.com - Rates & Info
FreshPatents.com Support - Terms & Conditions
Results in 0.25276 seconds