|Electricity: measuring and testing patents - Monitor Patents|
USPTO Class 324 | Browse by Industry: Previous - Next | All
06/2009 | Recent | 15: Apr | Mar | Feb | Jan | 14: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | 13: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | 12: Dec | Nov | Oct | Sep | Aug | July | June | May | April | Mar | Feb | Jan | 11: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | 10: Dec | Nov | Oct | Sep | Aug | Jul | Jun | May | Apr | Mar | Feb | Jan | | 09: Dec | Nov | Oct | Sep | Aug | Jl | Jn | May | Apr | Mar | Fb | Jn | | 2008 | 2007 |
Electricity: measuring and testing June invention type 06/09Below are recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application. 06/25/2009 > patent applications in patent subcategories. invention type
20090160425 - Multi-test circuit interrupter tester: A testing system includes a hand-held transmitter that plugs into a receptacle electrically coupled to a selected branch circuit. The transmitter includes a circuit effective to test an arc fault circuit interrupter electrically coupled to the branch circuit by creating a first pulse on the branch circuit that is effective... Agent: Loeb & Loeb, LLP
20090160426 - Electronic elongation-sensing rope: A fibrous tension member includes a plurality of structural threads and two or more indicator threads. The two or more indicator threads are located with respect to the plurality of structural threads such that a differential elongation between the two or more indicator threads indicates a curvature. The differential elongation... Agent: Van Pelt, Yi & James LLP
20090160427 - Shore power cord ground wire current detector: A current detector and indicator unit are coupled to a shore power cord for monitoring for corrosion-causing galvanic current on the ground wire of the power cord. A current transducer coupled to the ground wire senses current and provides a signal corresponding to the magnitude of the sensed current to... Agent: Quarles & Brady LLP
20090160428 - Overcurrent detection device: The present invention discloses an overcurrent detection device, which uses a first NOT gate and a second NOT gate to reverse the logic states of a first digital signal and a second digital signal which are digitalized audio signals in a class D power amplifier. Next, a CMOS transistor receives... Agent: Sinorica, LLC
20090160429 - Frequency component measuring device: It is possible to provide a frequency component measuring device capable of narrowing the range of transmission frequency of a local oscillator, preventing degradation of the level measurement accuracy, and measuring the level of a modulation wave. The device includes: a local oscillator (24) capable of performing sweep in a... Agent: Patenttm.us
20090160430 - Hand-held microwave spectrum analyzer with operation range from 9 khz to over 20 ghz: A spectrum analyzer is provided that includes components to achieve from below 9 kHz to above 20 GHz operation range while remaining hand-held. Components of the spectrum analyzer include an integrated precision stand-alone step attenuator that does not rely on printed circuit board (PCB) mounted circuit elements within the signal... Agent: Fliesler Meyer LLP
20090160431 - Measuring method, arrangement and software product: The invention presents a method for determining the copper concentration of the substrate using the photoconductivity method in a new manner, the method comprising steps in which the photoconductivity property of the substrate is measured for a first time by an arrangement, the surface of the substrate is illuminated by... Agent: Birch Stewart Kolasch & Birch
20090160432 - Probe card assembly with an interchangeable probe insert: A probe card assembly can include an insert holder configured to hold a probe insert, which can include probes disposed in a particular configuration for probing a device to be tested. The probe card assembly can provide an electrical interface to a tester that can control testing of the device,... Agent: N. Kenneth Burraston Kirton & Mcconkie
20090160433 - Arrangement for detecting the movement of a body and a method for the operation of such an arrangement: An arrangement for detecting a movement of a body, in which the body (20′) is mounted in such a way that it can move in at least one direction and in which a magnet (200) is incorporated. Its poles are aligned substantially parallel to a primary plane. A detector system... Agent: Cohen, Pontani, Lieberman & Pavane LLP
20090160434 - Incremental displacement transducer and method for determining a displacement of a first object relative to a second object: The present invention relates to an incremental displacement transducer for determining a displacement of a first object relative to a second object having a scanning unit linked or to be linked with the first object for scanning a spacing or division track linked or to be linked with the second... Agent: Hoffman Warnick LLC
20090160435 - Linear sensor having angular redirection and cable displacement: a longitudinal element 40 cooperating at one end 400 with said part 2, any translation of said part 2 in said axial path causing a corresponding displacement of its other end 401; and a magnetic field source 41 integral with the end 401, said fixed part 5 comprising a receiving... Agent: Michael Best & Friedrich LLP
20090160436 - Reference signal generation circuit, angle converter, and angle detection apparatus: A reference signal generation circuit generates a reference signal used in synchronous detection for removing an excitation signal component in an angle calculation section that converts a detection angle θ obtained from two-phase resolver detection signals output from a resolver, to a digital output angle φ. The reference signal generation... Agent: Gallagher & Lathrop, A Professional Corporation
20090160437 - Eddy current probe and method of manufacture thereof: Disclosed is an eddy current probe that includes a plurality of kidney-shaped coils disposed in end-to-end relation about an axis of an elongated body. An inner radius of each kidney-shaped coil faces the axis. An outer radius of each kidney-shaped coil faces away from the axis. A plurality of wires... Agent: The Webb Law Firm, P.C.
20090160438 - System for measuring an electromagnetic field, a control system using the measuring system, and an electronic circuit designed for the measuring system: This system for measuring an electromagnetic field radiated by an electrical component of an electronic circuit, the electrical component being fixed to a dielectric substrate of the electronic circuit, is wherein a transducer (90 to 95) is etched on the substrate of the electronic circuit.... Agent: Sughrue Mion, PLLC
20090160440 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: A magnetic resonance imaging apparatus includes an input unit, a data acquisition unit and an image generating unit. The input unit inputs information indicating a matter of which resonance frequency is a center frequency of an excitation pulse. The data acquisition unit acquires magnetic resonance data with obtaining a steady... Agent: Nixon & Vanderhye, PC
20090160439 - Susceptibility-matched multi-well sample holders for high-throughput screening by magnetic analysis: A method of performing high throughput magnetic sensing of one or more samples. The method comprises selecting a first sample having a first bulk magnetic susceptibility, selecting an assay plate having a second bulk magnetic susceptibility matched to the first bulk magnetic susceptibility, the assay plate including multiple wells, introducing... Agent: National Institutes Of Health C/o Venable LLP
20090160441 - Magnetic resonance imaging apparatus: A vertical magnetic field type MRI apparatus is capable of high-speed-imaging a large cross section such as a whole human body while suppressing an increase in the number of channels and maintaining sensitivity to a deep portion of a subject to be high. A receiving coil is composed of a... Agent: Antonelli, Terry, Stout & Kraus, LLP
20090160442 - Double resonant transmit receive solenoid coil for mri: A magnetic resonance system (8) comprises a radio frequency coil (36) which can resonate at least at first and second predetermined resonance frequencies. A tuning resonant circuit (110, 132) is serially coupled to the radio frequency coil (36). The tuning resonant circuit (110, 132) includes tuning components (Cp, Lp; Cp,... Agent: Philips Intellectual Property & Standards
20090160443 - Electronic device for a magnetic resonance apparatus: An electronics device for a magnetic resonance apparatus has a housing in which one or more electronic components to be cooled are accommodated, with a flat cold distributor provided in the housing that can be supplied with an externally fed coolant, and that is associated with a blower to circulate... Agent: Schiff Hardin, LLP Patent Department
20090160444 - Low temperature squid transient electromagnetic receiver system: A receiver system (18) for an electromagnetic prospecting system is disclosed. The electromagnetic prospecting system comprises a transmitter for transmitting a primary electromagnetic field so as to generate a secondary electromagnetic field from a terrain that is being prospected, the secondary electromagnetic field having a transient, decaying time domain profile.... Agent: Lahive & Cockfield, LLP Floor 30, Suite 3000
20090160447 - Independently excitable resistivity units: A downhole induction resistivity assembly that comprises a downhole tool string component. The tool string component comprises an induction transmitter. The transmitter is adapted to induce an induction field in the surrounding formation. A first induction receiver is spaced apart from the transmitter and is adapted to measure the induction... Agent: Tyson J. Wilde Novatek International, Inc.
20090160448 - Induction resistivity cover: A downhole induction resistivity assembly that comprises a downhole tool string component. The tool string component comprises an induction transmitter. The transmitter is adapted to induce an induction field in the surrounding formation. A first induction receiver is spaced apart from the transmitter and is adapted to measure the induction... Agent: Tyson J. Wilde Novatek International, Inc.
20090160446 - Resistivity receiver spacing: A downhole induction resistivity assembly that comprises a downhole tool string component. The tool string component comprises an induction transmitter. The transmitter is adapted to induce an induction field in the surrounding formation. A first induction receiver is spaced apart from the transmitter and is adapted to measure the induction... Agent: Tyson J. Wilde Novatek International, Inc.
20090160445 - Resistivity reference receiver: A downhole induction resistivity assembly that comprises a downhole tool string component. The tool string component comprises an induction transmitter. The transmitter is adapted to induce an induction field in the surrounding formation. A first induction receiver is spaced apart from the transmitter and is adapted to measure the induction... Agent: Tyson J. Wilde Novatek International, Inc.
20090160449 - Antennas for deep induction array tools with increased sensitivities: Improved receiver antennas are disclosed for long offset tensor induction army logging tools. The disclosed antennas include a bobbin which accommodates a ferromagnetic core. The outer surface of the bobbin is wrapped around a binding so that winding is thicker or includes more turns towards a center of the bobbin... Agent: Schlumberger Oilfield Services
20090160450 - Method and device for providing diagnostics for an internal combustion engine ignition coil: A method providing diagnostics of operation of an internal combustion engine ignition coil further including at least one electric cable connecting the ignition coil to at least one spark plug installed in a cylinder head of the engine. The method temporarily introduces a voltage-controlled switch into the ignition circuit, causing... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090160451 - Scan tool for electronic battery tester: A cable for connecting to an electronic battery tester, includes a first end configured to couple to a databus of a vehicle and a second end configured to couple to the electronic battery tester. An electrical connection extends between the first end and the second end and is configured to... Agent: Judson K. Champlin Westman, Champlin & Kelly
20090160452 - Method and system for determining battery cell voltage: Embodiments of the invention relate to a method and system of determining over-voltage and under-voltage conditions for cells in a battery pack. The method includes combining the cells in a battery pack into groups, detecting each cell group's voltage, and calculating ratios of cell group voltages to determine over-voltage and... Agent: Michael, Best & Friedrich LLP
20090160454 - Ground fault detection: The present invention relates to a ground fault detection arrangement for a synchronous three-phase electrical machine, and an electrical system comprising a ground fault detection arrangement and a synchronous three-phase electrical machine. The ground fault detection arrangement injects an off-nominal frequency voltage between a neutral point of the synchronous three-phase... Agent: St. Onge Steward Johnston & Reens, LLC
20090160453 - Method and apparatus for detecting ground fault: Method and apparatus for detecting a ground fault, the apparatus comprising means arranged to monitor a sum current of output phases of a frequency converter, means arranged to detect a ground fault, if the sum current exceeds a predetermined threshold value, and means for performing the initial setting of the... Agent: Buchanan, Ingersoll & Rooney PC
20090160455 - Device for detecting faulty position and separating fasteners and spacers as well as method: A device for detecting the faulty position of and separating fasteners, more particularly blind rivets in a continuously operating conveyor apparatus, by means of which the fasteners are supplied to an automated joining machine, wherein each fastener is followed in the normal case by a spacer. According to the disclosed... Agent: Perman & Green
20090160457 - Circuit for the detection of solder-joint failures in a digital electronic package: The solder-joint integrity of digital electronic packages, such as FPGAs or microcontrollers that have internally connected input/output buffers, is evaluated by applying a time-varying voltage through one or more solder-joint networks to charge a charge-storage component. Each network includes an I/O buffer on the die in the package and a... Agent: Eric A. Gifford
20090160456 - Device for inspecting soldering spots in a storage battery: A device for inspecting a soldering spot in a storage battery includes a power supply unit and an inspecting unit. The power supply unit outputs a test power signal to be applied to the soldering spot. The inspecting unit includes first and second inspecting terminals, and a control module. The... Agent: Ladas & Parry
20090160458 - Network analyzer calibrator having electrical and electrooptical components: A calibration kit (100) for calibrating a connectable network analyzer (102), including a converter (104, 106) adapted for performing a conversion between an electrical signal and an optical signal, a calibration standard (108, 110) for calibrating the network analyzer (102), and a switch array (112) adapted for switching the converter... Agent: Agilent Technologies Inc.
20090160459 - System for diagnosing impedances having accurate current source and accurate voltage level-shift: The present invention relates to a system for measuring a capacitor (C). A current source (12) is connected in parallel to the capacitor (C) between a supply plane (Vc) and ground (VGND) for providing a current to the capacitor (C). A voltage level-shift is connected between the supply plane (Vc)... Agent: Nxp, B.v. Nxp Intellectual Property Department
20090160460 - Analysis of a material with capacitive technology: Several apparatuses and a method for enabling of analysis of a material based on capacitive technology are disclosed. In an embodiment, the apparatus includes a first conductive surface. A second conductive surface is located substantially parallel to the first conductive surface. A measurement module measures a change in capacitance produced... Agent: Intellevate
20090160461 - Capacitive sensor and measurement system: A system includes a capacitive sensor including a first electrode and a second electrode. The system includes a measurement system configured to sense a capacitance between the first electrode and the second electrode and apply a first offset to the sensed capacitance to provide an offset compensated capacitance.... Agent: Dicke, Billig & Czaja
20090160463 - Characterization circuit for fast determination of device capacitance variation: A test circuit for fast determination of device capacitance variation statistics provides a mechanism for determining process variation and parameter statistics using low computing power and readily available test equipment. A test array having individually selectable devices is stimulated under computer control to select each of the devices sequentially. A... Agent: Ibm Corporation (mh) C/o Mitch Harris, Attorney At Law, L.L.C.
20090160462 - Microelectromechanical capacitor based device: A system and methods of a microelectromechanical capacitor based device are disclosed. In one embodiment, a system of a microelectromechanical capacitive device includes a housing formed when a nonconductive material is deposited on a substrate, and a conductive plate mechanically coupled to the housing. The system further includes an additional... Agent: Intellevate
20090160464 - Method and apparatus for making a determination relating to resistance of probes: According to some embodiments, a method of determining a resistance of probes on a contactor device is disclosed. The contactor device can include a plurality of probes disposed to contact an electronic device to be tested. The method can include electrically connecting a pair of the probes to each other,... Agent: N. Kenneth Burraston Kirton & Mcconkie
20090160465 - Determination of equivalent series resistance: A determination of an equivalent series resistance (ESR) effect for high frequency filtering performance of a filtered feed-through assembly is described. A low frequency signal is introduced to a filtered feed-through assembly. ESR limit of the filtered feed-through is determined based on the low frequency signal.... Agent: Medtronic, Inc.
20090160467 - Connection unit, a board for mounting a device under test, a probe card and a device interfacing part: A connection unit for electrically connecting a DUT mounting board, on which an IC socket is mounted, with a testing apparatus for testing an electronic device inserted into the IC socket, the connection unit has a holding substrate provided to face the DUT mounting board and a connection-unit-side connector, which... Agent: Yasuo Muramatsu Muramatsu & Associates
20090160466 - Self-isolating mixed design-rule integrated yeild monitor: Assessing open circuit and short circuit defect levels in circuits implemented in state of the art ICs is difficult when using conventional test circuits, which are designed to assess continuity and isolation performance of simple structures based on individual design rules. Including circuit blocks from ICs in test circuits provides... Agent: Texas Instruments Incorporated
20090160469 - Electric connecting apparatus: In an electrical connecting apparatus, a thermal deformation restriction member, a reinforcing plate, and an auxiliary member are made of materials having smaller thermal expansion coefficients in this order, and a wiring board supporting a probe assembly is coupled with the reinforcing plate. The auxiliary member has a void inside... Agent: Ingrassia Fisher & Lorenz, P.C.
20090160468 - System for testing an integrated circuit of a device and its method of use: A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on... Agent: Sonnenschein Nath & Rosenthal LLP
20090160471 - Contact alignment verification/adjustment fixture: In an electronic testing machine including at least one test module having a plurality of contacts for testing electronic components, the improvement of a contact alignment tool for aligning the contacts including a body to be positioned relative to the testing machine such that the body can be radially indexed... Agent: Young Basile Hanlon Macfarlane & Helmholdt, P.C.
20090160470 - Semiconductor and method: A semiconductor and method is disclosed. One embodiment includes a detector arrangement to detect the position of a connection element. A probe tip, the detector arrangement including first connection pads are arranged on a substrate surface. A first circuit is connected to the first connection pads.... Agent: Dicke, Billig & Czaja
20090160472 - Wafer-level burn-in method and wafer-level burn-in apparatus: Temperature control in wafer-level burn-in is performed such that a set temperature used for the temperature control is corrected using a correction value calculated from the generated heat density of a wafer (101). Thus it is possible to eliminate a difference between the temperature of the wafer heated when an... Agent: Steptoe & Johnson LLP
20090160473 - Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor: An electrical test contactor comprises a contactor main body including a plate-shaped attachment portion extending in the up-down direction, a plate-shaped arm portion extending from the lower end portion of the attachment portion at least to one side in the right-left direction, and a plate-shaped pedestal portion projecting downward from... Agent: Graybeal Jackson LLP
20090160474 - Printed circuit board and impedance guarantee method of printed circuit board: According to one embodiment, a printed circuit board includes a coupon portion having, for each of a plurality of signal layers, an impedance guarantee coupon as a reference for the layer, and a product portion having, in at least one of the plurality of signal layers, a transmission line requiring... Agent: Blakely Sokoloff Taylor & Zafman LLP
20090160476 - Failure detection device for power circuit including switching element: A failure detection device detects the voltage across the main electrodes of an IGBT via a diode. The failure detection device determines occurrence of short-circuit failure in the IGBT when the anode voltage of the diode is lower than a first predetermined reference voltage. Determination can be made, excluding the... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090160475 - Test pin reduction using package center ball grid array: An apparatus and method for reducing the number of package pins in a chip package which must be budgeted for test purposes. In one embodiment, the invention achieves this by housing test balls in the depopulated center of a package ball array. The test balls are used to test a... Agent: Lsi Corporation C/o Suiter Swantz PC Llo
20090160477 - Method and test system for fast determination of parameter variation statistics: A method and test system for fast determination of parameter variation statistics provides a mechanism for determining process variation and parameter statistics using low computing power and readily available test equipment. A test array having individually selectable devices is stimulated under computer control to select each of the devices sequentially.... Agent: Ibm Corporation (mh) C/o Mitch Harris, Attorney At Law, L.L.C.
20090160478 - Testing device for performing a test on a liquid crystal display and a method of driving the testing device: A testing device for performing a high-voltage test on a liquid crystal display is provided. The testing device includes a voltage converting unit, an input connector, and a power supplier. The voltage converting unit includes a plurality of resistors between an output terminal and a ground terminal. The input connector... Agent: Frank Chau, Esq. F. Chau & Associates, LLC06/18/2009 > patent applications in patent subcategories. invention type
20090153129 - Method and system for determining a network structure or layout of at least a part of an electricity transport network: A method for determining a network structure or layout of at least a part of an electricity transport network, for instance a low voltage part of this network extending in a city, includes providing a test signal to the network at at least first network location; and verifying whether the... Agent: Pillsbury Winthrop Shaw Pittman, LLP
20090153130 - Field effect transistor-based biosensor with inorganic film, method of manufacturing the biosensor, and method of detecting biomolecule using the biosensor: Provided is a Field-Effect Transistor (FET)-based biosensor including: a substrate; a source and a drain, disposed on the substrate, having opposite polarity to the substrate; a gate, disposed on the substrate, contacting the source and the drain; and an inorganic film capable of binding with a biomolecule, disposed on a... Agent: Cantor Colburn, LLP
20090153131 - Current detecting circuit: Indirect detection of current using a current mirror circuit is performed with good accuracy, with a small sized circuit. In a current detection circuit, a current detection current mirror circuit includes an output current transistor which supplies an output current, and a current detection transistor which supplies a detection current... Agent: Cantor Colburn, LLP
20090153132 - Methods and apparatus for computing and using a spectral map for performing nonlinear calibration of a signal path: In one embodiment, a spectral map for performing nonlinear calibration of a signal path is developed by 1) identifying a set of frequency locations for a set of particular output signal spurs that result from applying one-tone and two-tone input signals covering a bandwidth of interest to the signal path;... Agent: Agilent Technologies Inc.
20090153133 - Methods and apparatus for collecting characteristics of a power line a bpl system: An apparatus for collecting characteristics of a power line in a broadband over power line system that comprises a power line characteristic measuring device for measuring power line characteristics and a collector unit for collecting data from the power line characteristic measuring device and sending the data over the broadband... Agent: Dickstein Shapiro LLP
20090153179 - Circuit arrangement for balancing a resistance circuit: A circuit arrangement is provided for balancing a resistance circuit, which has a field-effect transistor as a controllable resistor and a control circuit, by which the field-effect transistor can be controlled with a gate-source voltage so that there is a resistance between a drain electrode and a source electrode of... Agent: Muncy, Geissler, Olds & Lowe, PLLC
20090153134 - Position detection device and optical apparatus: A position detection device includes a magnetic generation unit that has: a first magnetism generating section that is provided on one end side along a predetermined direction and generates magnetism; a second magnetism generating section that is provided on another end side along the predetermined direction and generates magnetism of... Agent: Ditthavong Mori & Steiner, P.C.
20090153135 - Magnetostrictive displacement transducer with phase shifted bias burst: An assembly includes a magnetostrictive transducer that provides a transducer output. Amplifier circuitry receives the transducer output and generates a transducer output burst and a bias output burst. The transducer output burst and bias output burst overlap in time and differ by a phase difference. A burst processor receives the... Agent: Westman Champlin & Kelly, P.A.
20090153137 - Methods and apparatus for vibration detection: Apparatus for detecting vibration of an object adapted to rotate includes one or more vibration processors selected from: a direction-change processor adapted to detect changes in a direction of rotation of the object, a direction-agreement processor adapted to identify a direction of rotation of the object in at least two... Agent: Daly, Crowley, Mofford & Durkee, LLP
20090153136 - Pulsar ring for rotary encoder: A pulsar ring for a rotary encoder has a mounting ring (1) made of a non-magnetic material, with one end being fixed to an inner ring (202) at the rotation side and the other end being positioned in proximity to an outer ring (201) at the stationary side via labyrinth-shaped... Agent: Harness, Dickey & Pierce, P.L.C
20090153138 - Sensor module and method for manufacturing a sensor module: A method of manufacturing a sensor module includes providing a substrate comprising an array of magnetically sensitive elements on a first main face of the substrate. An array of conducting lines is applied over the first main face of the substrate. An array of electrical interconnects is applied over the... Agent: Dicke, Billig & Czaja
20090153139 - Methods and apparatus for compensating field inhomogeneities in magnetic resonance studies: One aspect of the present disclosure relates to a method or determining location(s) at which at least one magnetic article is to be positioned during a magnetic resonance imaging procedure of at least one subject. A magnetic field Bo is applied to a region that includes the at least one... Agent: Wolf Greenfield & Sacks, P.C.
20090153140 - Nmr solenoidal coil for rf field homogeneity: An NMR signal acquisition device that can increase the magnetic field homogeneity in a high frequency magnetic field by one of the following. (a) Current paths each having a different inductance are provided to adjust the diversion ratio of the current, (b) A current path branch point is provided in... Agent: Antonelli, Terry, Stout & Kraus, LLP
20090153141 - Flux orientation locating in a drilling system: An above ground locator includes an apparatus for determining the strength of the locating signal at a selected point relative to the boring tool. The apparatus includes an antenna arrangement configured for measuring the strength of the locating signal at the selected point along first and second orthogonally opposed receiving... Agent: Pritzkau Patent Group, LLC
20090153142 - Method for measuring an ionization current of a spark plug of the type with resonant structure and corresponding device: A device for measuring an ionization current of a spark plug of a type with a resonant structure, including a motor vehicle ignition system, the spark plug being coupled to a generator including a regulating capacitor. The generator includes a polarizer that polarizes the spark plug, connected between the generator... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090153143 - Sensor array for detecting the state of a battery: A sensor array for detecting the state of a battery which is situated in the proximity of the pole terminals of the battery for detecting the electrical state variables of the battery. In addition to a measuring path, an electronic circuit is also integrated into the sensor array whose supply... Agent: Kenyon & Kenyon LLP
20090153144 - Fault detection apparatuses and methods for fault detection of semiconductor processing tools: Fault detection apparatuses and methods for detecting a processing or hardware performance fault of a semiconductor production tool have been provided. In an exemplary embodiment, a method for detecting a fault of a semiconductor production tool comprises sensing a signal associated with a test component of the production tool during... Agent: Ingrassia Fisher & Lorenz, P.C. (nvls)
20090153146 - Apparatus for inspecting circuit board and method of inspecting circuit board: An apparatus and method for inspecting a circuit board is described which can well absorb a variation in a height of an electrode to be inspected and can maintain an insulating property between adjacent inspection electrodes even if the electrode to be inspected is arranged at a fine pitch.... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090153145 - Method and device for checking current converters by means of high-current pulses: In order to check the functionality of a conventional current converter at low cost, a device for checking a current converter is provided. The current converter includes a test current conductor and a test pulse circuit. The latter has an energy storage device, a charging device for charging the energy... Agent: Lerner Greenberg Stemer LLP
20090153147 - Intrusion detection system: An intrusion detection system includes an intrusion detection device, and a pair of leaky transmission paths including a leaky transmission path of a sending side which is connected to the intrusion detection device and outputs a leaky electric wave on the basis of an output from the intrusion detection device... Agent: Buchanan, Ingersoll & Rooney PC
20090153148 - Sensor and method for detecting a substance: A sensor for detecting a substance in a physical space, having an RF energy emitter fed by a signal source on one side of the space and an RF energy receiving element coupled to a detector at an opposite side of the channel, spaced apart by a distance (r) selected... Agent: Brown & Michaels, PC 400 M & T Bank Building
20090153150 - Measuring device and method for local measurement of at least one electrical property of the content of a container: Measuring device for local measurement of an electrical property of the content of a container, comprising at least three electrodes disposed adjacently of each other in height direction and electrically insulated from each other, wherein each of the electrodes can be connected to an electrical measuring circuit for measuring, via... Agent: Demont & Breyer, LLC
20090153149 - Obstructionless inline flex fuel sensor: A sensing apparatus for determining a property of a fuel such as a gasoline and ethanol blend known as flex fuel includes an acetal plastic tube with an inlet, an outlet and a fuel passage in between. One property is a dielectric constant. A pair of semi-circular shaped sensing plates... Agent: Delphi Technologies, Inc.
20090153151 - Obstacle detection system and obstacle detection method thereof: An obstacle detection system includes a static capacitance detection module including a sensor strip for detecting a static capacitance, an RF oscillator connected to the sensor strip, a phase lock loop section for maintaining the oscillation frequency of the RF oscillator to a selected value and a first MCU for... Agent: Banner & Witcoff, Ltd.
20090153152 - Compensation circuit for a tx-rx capacitive sensor: A capacitive sensor may include a transmit electrode and a receive electrode capacitively coupled with the transmit electrode. A capacitance sensing circuit senses a capacitance between the transmit and receive electrodes by applying a signal to the transmit electrode and rectifying a current waveform induced at the receive electrode. A... Agent: Cypress Semiconductor Corporation
20090153153 - Multiaperture sample positioning and analysis system: Systems for positioning and/or analyzing samples such as cells, vesicles, cellular organelles, and fragments, derivatives, and mixtures thereof, for electrical and/or optical analysis, especially relating to the presence and/or activity of ion channels.... Agent: Morgan Lewis & Bockius LLP One Market
20090153155 - Device for measuring the quality and/or degradation of fluid, particularly a food oil: The invention relates to a device for measuring the quality and/or degradation of a fluid, especially an oil, comprising a sensor consisting of at least one pair of electrodes which are distanced from each other. Said sensor is immersed in the fluid which is to be measured. The electrodes and... Agent: Sughrue Mion, PLLC
20090153154 - Fuel sensor: A sensing apparatus for determining a property of a fuel such as a gasoline and ethanol blend known as flex fuel includes an acetal plastic tube with an inlet, an outlet and a fuel passage in between. One property of the fuel is a dielectric constant. A pair of sensing... Agent: Delphi Technologies, Inc.
20090153156 - Insulation resistance detecting apparatus: There is provided an insulation resistance detecting apparatus that accurately calculates an insulation resistance value in real time. The insulation resistance detecting apparatus includes: pulse generator 10, comparator 11 to which reference voltage VREF is supplied as one input and an output from pulse generator 10 is supplied as the... Agent: Dickstein Shapiro LLP
20090153157 - Resistance measurements of a helical coil: Test methods and components are disclosed for testing resistances of helical coils formed in magnetic recording heads. Helical coils in magnetic recording heads include a bottom coil structure, a top coil structure, and connecting structures that electrically connect the top and bottom coil structures. A test component is fabricated on... Agent: Duft Bornsen & Fishman, LLP
20090153158 - Rf integrated circuit test methodology and system: Over the air or radiated testing of an RF microelectronic or integrated circuit device under test (DUT) that has an integrated millimeter wave (mmw) antenna structure, is described. The antenna structure may have multiple elements in an array design that may be driven and/or sensed by integrated RF transmitter and/or... Agent: Blakely Sokoloff Taylor & Zafman LLP
20090153166 - Apparatus and method for terminating probe apparatus of semiconductor wafer: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric... Agent: Dorsey & Whitney LLP Intellectual Property Department
20090153167 - Chuck for holding a device under test: A chuck includes a conductive element that contacts a device under test in a location on the chuck.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel
20090153163 - Circuit board having bypass pad: An electronic device having a printed circuit board is provided. In one embodiment, the printed circuit board includes a plurality of external pads to be coupled with an external device and a plurality of bypass pads for testing an electric circuit. The external pads are exposed and at least one... Agent: Marger Johnson & Mccollom, P.C.
20090153160 - Circuit board test clamp: A circuit board test clamp is configured to test a circuit board via a tester having a probe. The circuit board test clamp includes a clamping element configured to clamp on the circuit board and a testing element mounted on the clamping element. The testing element includes a first test... Agent: PCe Industry, Inc. Att. Steven Reiss
20090153164 - Contactor assembly for integrated circuit testing: The present invention provides a contactor assembly (100,200,300) for testing of semiconductor devices (DUT). The contactor assembly (100,200,300) includes a plurality of probes (20,22,24), a contactor holder (150,350) and a cover (180,280) shaped and dimensioned to fit on the contactor holder (150,350). The contactor holder (150,350) is a stack of... Agent: Lawrence Y.d. Ho & Associates Pte Ltd
20090153165 - High density interconnect system having rapid fabrication cycle: An improved interconnection system and method is described, such as for connectors, socket assemblies and/or probe card systems. An exemplary system comprises a probe card interface assembly (PCIA) for establishing electrical connections to a semiconductor wafer mounted in a prober. The PCIA comprises a motherboard parallel to the semiconductor wafer... Agent: Glenn Patent Group
20090153161 - Probe holder and probe unit: A probe holder is for containing a plurality of probes for inputting and outputting an electrical signal to and from a circuitry when the probes come in contact with the circuitry. The probe holder includes a distal end for holding the probes; a proximal end that supports the distal end;... Agent: Edwards Angell Palmer & Dodge LLP
20090153159 - Probing adapter for a signal acquisition probe: A probing adapter has a support member receiving a probing tip assembly having probing arms. The probing tip assembly is mounted to the support member via a rotational joint having elastomeric member disposed in the probing arms with each of the probing arms having a pivot point disposed away from... Agent: William K. Bucher Tektronix, Inc.
20090153162 - Sharing conversion board for testing chips: The invention relates to a device interface board for testing chips, which is cooperatively installed with one of a plurality of probe cards. Each of the plurality of probe cards is provided with a specified wiring area and a first public signal area, the specified wiring area being electrically connected... Agent: Bacon & Thomas, PLLC
20090153168 - Hi-fix board, test tray, test handler, and method for manufacturing packaged chips: A hi-fix board, a test tray, a test handler, and a packaged chip manufacturing method are provided. The hi-fix board includes: test sockets to which packaged chips to be tested are connected; and a main frame in which the test sockets are disposed in at least one first area to... Agent: Ked & Associates, LLP
20090153170 - Inspection apparatus: An inspection apparatus includes a movable mounting table having a temperature control device, an elevation drive unit for vertically moving the mounting table, a controller for controlling the elevation drive unit and a probe card having probes arranged above the mounting table. The elevation drive unit includes first and second... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090153169 - Probe having a field-replaceable tip: A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to... Agent: Samtec Incorporated C/o Keating & Bennett, LLP
20090153171 - Apparatus for testing objects under controlled conditions: An apparatus for testing objects includes a test board having electrical connection areas to connect to the objects, a chamber fixture located on the test board to form test chambers that are configured to individually receive the objects, a thermoelectric element provided to each test chamber to adjust the temperature... Agent: Lee & Morse, P.C.
20090153173 - Semiconductor device: An object of the invention is to manage variation of electrical characteristics of an element in a semiconductor device due to a vapor deposition process by measuring electrical characteristics of a TEG. A substrate 100 of an active matrix EL panel includes a vapor deposition region 101 having a film... Agent: Cook Alex Ltd
20090153172 - Structure for indicating status of an on-chip power supply system: A design structure embodied in a machine readable medium used in a design process includes a system for indicating status of an on-chip power supply system with multiple power supplies, having a power system status register for receiving digital compliance signals, each compliance signal associated with one of the multiple... Agent: Cantor Colburn LLP-ibm Burlington
20090153175 - Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus: An electronic device test apparatus comprises: a contact arm making an IC device move and pushing it against a socket 301; a control device controlling the contact arm; an instructing unit instructing the control device on a pushing torque of the contact arm; an acquiring unit acquiring from the tester... Agent: Greenblum & Bernstein, P.L.C
20090153178 - Method for transferring test trays in a side-docking type test handler: The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free... Agent: Bainwood Huang & Associates LLC
20090153176 - Semiconductor device: Disclosed is a semiconductor device including chips having output terminals connected in common to an external terminal. Each of the chips includes a data input and output section that provides a difference during testing between a first driving capability setting the output terminal to a first power supply potential side... Agent: Mcginn Intellectual Property Law Group, PLLC
20090153177 - Separate testing of continuity between an internal terminal in each chip and an external terminal in a stacked semiconductor device: A stacked semiconductor device is disclosed which is capable of conducting a test to determine whether or not there is continuity between an external terminal and a corresponding internal terminal in each chip, on an internal terminal-in each chip basis. The semiconductor device includes continuity test dedicated terminals for each... Agent: Young & Thompson
20090153174 - Simple and effective method to detect poly residues in locos process: A test structure which can be used to detect residual conductive material such as polysilicon which can result from an under etch comprises a PMOS transistor and an OTP EPROM floating gate device. By testing the devices using different testing parameters, it can be determined whether residual conductive material remains... Agent: Texas Instruments Incorporated06/11/2009 > patent applications in patent subcategories. invention type
20090146639 - Detector: Provided is a detector having a transistor or resistor structure. When an electrode is exposed to a detected solution, such as blood, a variation in current flowing through the detected solution may be greater than a variation in the electrical characteristics of the detector caused by a variation in the... Agent: Rabin & Berdo, PC
20090146640 - Phase difference measuring device and phase comparison circuit adjusting method: A phase difference measuring device according to this invention has an object of shortening the measuring time, and includes a plurality of phase difference measuring circuits (104, 105, 106) formed in a row, and phase difference conversion circuits (101, 102, 103) each connected between adjacent phase difference measuring circuits. The... Agent: Sughrue Mion, PLLC
20090146641 - Electronic tamper detection circuit for an electricity meter: An electronic meter tamper detection system and method for sensing the removal of an electricity meter from a meter socket and generating a tamper signal when such removal is detected. The tamper detection circuit includes a control unit having an energy storage device that is charged during normal operation of... Agent: Andrus, Sceales, Starke & Sawall, LLP
20090146642 - Instrumentation device and interface combining multiple elements: An instrumentation device having multiple elements includes at least one power supply module, a plurality of test and measurement instruments operatively coupled to the at least one power supply module and a user interface configured to select the at least one power supply module and to select at least one... Agent: Agilent Technologies Inc.
20090146643 - Methods and apparatus for current sensing: Methods and apparatus for current sensing according to various aspects of the present invention sense the current in a circuit, such as an inductor circuit. The current sensing systems may comprise an RC element connected such that the RC time constant matches the L/R time constant of the inductor. The... Agent: The Noblitt Group, PLLC
20090146644 - Electric meter having a detachable measuring bar: An electric meter having a detachable measuring bar includes a main body, a first measuring bar and a second measuring bar assembly. One end of the main body is formed with a supporting portion. The first measuring bar has a connecting portion and a probe formed at the other end... Agent: Hdls Patent & Trademark Services
20090146645 - Position sensor: In order to be able to perform a measurement of the run time of an electrical impulse in a position sensor through a single slow timed timing generator, while still capable to achieve a high precision of the measurement result, the entire run time is determined, so that the number... Agent: Head, Johnson & Kachigian
20090146646 - Position sensor, evaluation circuit, and electric motor: The invention relates to a position sensor (PS) that is in position to deliver data for evaluating positioning data of an axle (OS) over a specified number of turns, where two transmissions (G1, G2) are affixed to the axle (OS) for being in position to transmit each the position of... Agent: Patti , Hewitt & Arezina LLC
20090146647 - System including sensing elements at different distances from vertical magnetic field lines: A system including a magnet, a first magneto-resistive sensing element, and a second magneto-resistive sensing element. The magnet is configured to provide a magnetic field. The first magneto-resistive sensing element is situated in the magnetic field and the second magneto-resistive sensing element is situated in the magnetic field. The second... Agent: Dicke, Billig & Czaja
20090146649 - Non-contact rotational angle detecting sensor: There is provided a non-contact rotational detecting sensor comprising a ring-shaped permanent magnet which rotates integrally with a detection object of a rotational angle and of which a magnetic pole changes along the circumferential direction, a ring-shaped inside magnetic flux collecting yoke for surrounding an outer peripheral surface of the... Agent: Rader Fishman & Grauer PLLC
20090146651 - Rotation angle sensor: A pair of cylindrical magnets with cut away portions has been arranged on both sides of a magnetic sensing element in symmetry of rotation, and a yoke surrounds the magnetic sensing element in contact with outer peripheral surfaces of the pair of the cylindrical magnets with cut away portions. The... Agent: Nixon & Vanderhye, PC
20090146650 - Rotation angle sensor and scissors gear suitable therefor: A driving gear, which is a scissors gear, fixed to a rotating body, engages with a driven gear, and the driven gear engages with a fixed screw receiver. A first gear and a second gear of the driving gear elastically bias the tooth of the driven gear by a coil... Agent: Nixon & Vanderhye, PC
20090146648 - Rotation detector: A rotation detector that can be assembled into a hub of a wheel without breakage of an object to be detected. The rotation detector has a housing (1) having an insertion section (1a) in which an axle (S) is inserted and that is placed between a hub (10a) of a... Agent: Mcdermott Will & Emery LLP
20090146652 - Slider tester: A slider tester includes a driving unit that rotates a test medium, a set plate that detachably supports a slider as a single body, and an investigating apparatus that is electrically connected to the slider supported by the set plate and investigates the characteristics of the slider. A movable support... Agent: Kratz, Quintos & Hanson, LLP
20090146653 - Slider tester: A slider tester includes a driving unit that rotates a test medium, a set plate that detachably supports a slider as a single body, and an investigating apparatus that is electrically connected to the slider supported by the set plate and investigates the characteristics of the slider. A movable support... Agent: Kratz, Quintos & Hanson, LLP
20090146654 - Object detecting device for detecting object using electromagnetic induction: Provided is an object detecting device, which can detect the shape of or the distance from an object made of an electrically conductive or magnetic material, and which can detect the position indicated by an object made of an electrically-non-conductive/non-magnetic material, such as a finger. The object detecting device detects... Agent: Wells St. John P.s.
20090146655 - Eddy current inspection device and method of assembly: A method for assembling an eddy current inspection device includes at least partially positioning a first tip assembly within a cavity defined by a proximity probe case. The first tip assembly defines a bore therethrough. The first tip assembly is sealingly coupling to the proximity probe case. A second tip... Agent: John S. Beulick (17851) Armstrong Teasdale LLP
20090146656 - Elongated magnetic sensor: A magnetoresistive device disposed in an elongated magnetic sensor, for example, has two parallel arrays of magnetosensitive elements arranged at regular intervals in the longitudinal direction. The magnetosensitive elements are connected in series through connection conductors, in a meandering pattern. The magnetoresistive device is disposed between two other magnetoresistive devices.... Agent: Murata Manufacturing Company, Ltd. C/o Keating & Bennett, LLP
20090146657 - Method for processing a distortion-corrected 2d or 3d reconstruction image recorded by a magnetic resonance device: In one embodiment of the present invention, a method for processing a 2D or 3D reconstruction image is disclosed which is recorded by a magnetic resonance device, including a gradient coil that generates a gradient field, and is distortion—corrected with regard to a given non-linearity—leading to an image distortion—of the... Agent: Harness, Dickey & Pierce, P.L.C
20090146659 - Method and device for automatic determination of slice positions in an mr examination: Two method and device embodiments allow automatic determination of slice positions in an MR examination in an MR system. In the first embodiment, a volume to be measured by the MR examination is predetermined. The MR examination is subsequently planned in that at least one of the parameters slice direction,... Agent: Schiff Hardin, LLP Patent Department
20090146658 - Microcoil magnetic resonance detectors: The present invention provides microcoil magnetic resonance based modules, detection devices, and methods for their use.... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP
20090146660 - Magnetic resonance system with power loss-optimized operation: A magnetic resonance system has multiple individual transmission antennas each charged with a transmission current to emit an individual excitation field in an examination volume to excite magnetic resonances in a subject in the examination volume, with a total excitation field being a superimposition of the individual excitation fields. A... Agent: Schiff Hardin, LLP Patent Department
20090146661 - Apparatus of nuclear magnetic resonance measurement by using circulation flow for sample condition control: An apparatus for nuclear magnetic resonance measurement includes a measurement portion having a magnet for applying a magnetic field to a sample, a bore within the magnet, a nuclear magnetic resonance probe disposed in the bore, and a container for retaining the sample therein; a mixing filter portion for mixing... Agent: Antonelli, Terry, Stout & Kraus, LLP
20090146662 - Multi-channel measuring apparatus for connection to a fuel cell stack: A number and a combination of N-pole connectors and (N+1)-pole connectors are determined such that a number of fuel cells included in the fuel cell stack and a number of all of poles included in the plurality of terminal-side connectors are equal to each other. Further, when the number of... Agent: Kenyon & Kenyon LLP
20090146663 - Battery testing device and battery testing method: The present invention provides a battery testing device and a battery testing method which can appropriately verify the behavior of a battery when damage occurs. Appropriately verification of battery behavior in a case of battery damage has not been achieved since a completely crushed state of a battery almost never... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090146664 - Battery state of health monitoring system and method: A state-of-health monitoring and prognosis method and system for a battery includes a signal preprocessing module for monitoring battery terminal voltage and current and extracting a portion of the battery terminal voltage and current corresponding to an engine cranking event. Battery voltage loss that occurs during said engine cranking event... Agent: Cichosz & Cichosz, PLLC
20090146665 - Method and apparatus for shielding feedthrough pin insulators in an ionization gauge operating in harsh environments: Shields for feedthrough pin insulators of a hot cathode ionization gauge are provided to increase the operational lifetime of the ionization gauge in harmful process environments. Various shield materials, designs, and configurations may be employed depending on the gauge design and other factors. In one embodiment, the shields may include... Agent: Hamilton, Brook, Smith & Reynolds, P.C.
20090146666 - Partial discharge charge quantity measuring method and device: The present invention comprises an antenna adapted to measure an electromagnetic wave radiated from a device to be measured stemming from partial discharge and having sensitivity at least in the UHF band; a filter for extracting a TEM mode component from a measured time waveform; and a measurement device body... Agent: Mcglew & Tuttle, PC
20090146667 - Testing of a photovoltaic panel: A method for testing a photovoltaic panel connected to an electronic module. The electronic module has at least one input attached to the photovoltaic panel and at least one power output. The method of testing the photovoltaic panel begins with activating a bypass of the electronic module. The bypass is... Agent: Empk & Shiloh, LLP C/o Landon Ip, Inc.
20090146668 - Anti-pinch sensor and evaluation circuit: An anti-pinch sensor is provided for detecting an obstacle in the path of a regulating element of a motor vehicle, the sensor can include a sensor body, a first measuring electrode that can be arranged in the sensor body and can be used to produce a first outer electrical field... Agent: Muncy, Geissler, Olds & Lowe, PLLC
20090146669 - Capacitive fingerprint sensor and the panel thereof: A capacitive fingerprint sensor comprises a fingerprint capacitor, a reference capacitor, a first transistor, a second transistor, a third transistor and a fourth transistor. The fingerprint capacitor CF has a capacitance that is either a valley capacitance CFV or a ridge capacitance CFR. The reference capacitor CS has a capacitance... Agent: Wpat, PC Intellectual Property Attorneys
20090146670 - Measuring device, and conductivity measuring device, for determining flow capacities of electroconductive liquids, measuring element, and method.: A measuring device for determining flow capacities d(V(z)) of electroconductive liquids having a conductivity LF through a container in the event of vertically (z direction) variable levels. The inventive measuring device is a conductivity measuring device comprising, inter alia, at least two electrodes extending in the z direction. The container... Agent: Hudak, Shunk & Farine, Co., L.p.a.
20090146671 - Current sensing on a mosfet: A device having a switch with a voltage applied across the switch. A current sensing circuit is connected to one terminal of the switch. The current sensing circuit receives power independently of the voltage applied across the switch. The power supply shares the other terminal of the switch with the... Agent: Empk & Shiloh, LLP C/o Landon Ip, Inc.
20090146672 - Double ended contact probe: It is an object of the present invention to provide a double-ended contact probe that can be improved in productivity to ensure that the contact members are stably movable with respect to each other, and electrically connected to each other. The double-ended contact probe comprises first and second conductive members... Agent: Venable LLP
20090146674 - Inspection apparatus: An inspection apparatus includes an electrical connection member which is configured to remove flux attached to a part to be inspected of an object to be inspected, a base member which is provided with the electrical connection member, a driving member which is configured to move the base member relative... Agent: Cooper & Dunham, LLP
20090146673 - Manufacturing method of probe card and the probe card: A manufacturing method for probe card according to the present invention includes following processes. A film is formed on the surface of a circuit board. A connecting terminal and joint member are formed by etching the film, and the surface of the joint member is polished. An inspection contacting structure... Agent: Masuvalley & Partners
20090146675 - Planarizing probe card: A novel planarizing probe card for testing a semiconductor device is presented. The probe card is adapted to come into contact with a probe card mount that is in adjustable contact with the prober. The probe card includes a printed circuit board affixed to a stiffener and a probe head... Agent: Manuel F. De La Cerra
20090146676 - Measuring module for rapid measurement of electrical, electronic and mechanical components at cryogenic temperatures and measuring device having such a module: Measuring module for the measurement of an object (6), having a measuring chamber (4), with a contact element (5a, 5b), wherein the object to be measured (6) is thermally connected to a first contact surface (9a) of the contact element (5a, 5b), and having a cold head (1b, 2b, 2c)... Agent: Kohler Schmid Moebus
20090146677 - Test apparatus and pin electronics card: There is provided a test apparatus including a driver that outputs a test signal to a device under test, a first switch that switches whether to connect the driver to the device under test, a comparator that receives an output signal from the device under test via the first switch,... Agent: Jianq Chyun Intellectual Property Office
20090146678 - Substrate testing circuit: The present invention relates to a substrate testing circuit comprising a testing bus and a testing signal terminal connected to the testing bus, a signal line to be tested in the substrate being connected to the testing bus via a signal connecting terminal, wherein a plurality of signal access terminals... Agent: Ladas & Parry LLP
20090146679 - Method for testing liquid crystal display: An LCD test method and apparatus for reducing the number of channels of a probe unit is provided. An apparatus for testing a liquid crystal display including: a stage on which a liquid crystal panel is placed; a plurality of vertically divided blocks, wherein each of the vertically divided blocks... Agent: Mckenna Long & Aldridge LLP
20090146680 - Self-guiding instrument carrier for in-situ operation in a generator: Removal of the rotor of a large electrical machine is costly and time consuming, and in particular the outage time of a power plant, which is needed for the removal of a generator rotor, is very expensive and should be minimized. To avoid opening of the generator for inspection and... Agent: Cermak Kenealy Vaidya & Nakajima LLP06/04/2009 > patent applications in patent subcategories. invention type
20090140717 - Structures and methods for measuring beam angle in an ion implanter: The present invention involves an ion beam angular measurement apparatus for providing feedback for a predetermined set ion beam angle comprising an arrangement of composite pillars formed on an insulating material and wherein the composite pillars selectively allow ion beams to penetrate a first layer of a pillar, wherein resistivity... Agent: Thomas G. Eschweiler Eschweiler & Associates, LLC
20090140718 - Wavelength meter and associated method: A wavelength meter, an associated method, and system are generally described. In one example, an apparatus includes a photodiode to receive an optical signal and to generate a photocurrent upon receiving the optical signal, the photodiode having an absorption edge that is substantially aligned with a band of wavelengths, wherein... Agent: Cool Patent, P.C. C/o Cpa Global
20090140719 - Smart sensors for solar panels: A solar panel smart sensor system is disclosed. The sensor system permits solar power system owners and operators to monitor the voltage of individual panels in a solar array. The system uses a low wire-count bus in which the order of sensors on the bus is automatically determined. A novel... Agent: Morrison Ulman Nupat, LLC
20090140720 - Method for identifying electronic circuits and identification device: An identification device for electronic circuits comprises at least two electronic components having different electronic characteristics, a detection unit configured to detect at least one electrical parameter determining the electronic characteristics of the electronic components and an evaluation unit configured to evaluate a mismatch exhibited by the at least two... Agent: Dickstein Shapiro LLP
20090140721 - Digital multimeter having improved recording functionality: A digital multimeter automatically records measurements of electrical or physical parameters. The multimeter may record the measurements based on events such as the passage of time, fluctuations or deviations in the measurements, or user inputs. In some examples, the digital multimeter operates at a reduced power setting during automatic recording... Agent: Perkins Coie LLP Patent-sea
20090140722 - Measurement signal processing: In order to determine amplitudes of measurement signals originating from an AC power supply and to determine the phase shift (ø) between measurement signals more simply, the measurement signals are processed in measurement signal operation devices to form auxiliary signals each having a constant AC amplitude and to obtain first... Agent: Fish & Richardson PC
20090140724 - Magnetic field sensor assembly: A magnetic field sensor assembly has at least one magnetic field sensor integrated into a semiconductor chip and has at least one magnetic field source. The semiconductor chip and the at least one magnetic field source are arranged in an encapsulation material in a predetermined position relative to each other... Agent: The Webb Law Firm, P.C.
20090140723 - Method and apparatus for reducing induction noise in measurements made with a towed electromagnetic survey system: A method for reducing motion induced voltage in marine electromagnetic measurements includes measuring an electromagnetic field parameter at least one position along a sensor cable towed through a body of water. Motion of the sensor cable is measured at least one position along the cable; Voltage induced in the cable... Agent: E. Eugene Thigpen Petroleum Geo-services, Inc.
20090140726 - Measurement device for measuring a magnetic field: A measuring device to measure a magnetic field having at least one measuring coil and at least one sensor to measure low-frequency magnetic fields, which measuring coil and which sensor have their planes of extension each positioned or positionable transverse to the flux direction of the magnetic field. The measuring... Agent: The Webb Law Firm, P.C.
20090140727 - Apparatus and methods for proximity sensing circuitry: An inductive proximity sensor is disclosed. The proximity sensor includes a source circuit with an inductive element configured to deliver energy to a resonator when a source current is changed. In various embodiments, the source current is provided a step current source. In various embodiment, the source current is provided... Agent: Rockwell Automation, Inc. Atten: Susan M. Donahue
20090140728 - Apparatus and methods for proximity sensing circuitry: An inductive proximity sensor is disclosed. The proximity sensor includes a resonator with a bifurcated inductance coupled to a plurality of transimpedance amplifiers. A portion of the resonator is configured to generate eddy currents in a target containing metal. In various embodiments, the transimpedance amplifiers provide signals associated with eddy... Agent: Rockwell Automation, Inc. Attention: Susan M. Donahue
20090140729 - Inductive non-contact measurement of a relative movement or relative positioning of a first object relative to a second object: A non-contact measurement method for a relative displacement or relative positioning of a first object relative to a second object, in which: at least one transmitting coil, placed on the first object, is excited by an alternating excitation signal, at least one alternating electronic output signal, generated by mutual inductance... Agent: Greer, Burns & Crain
20090140725 - Integrated circuit including sensor having injection molded magnetic material: An integrated circuit includes a magnetic field sensor and an injection molded magnetic material enclosing at least a portion of the magnetic field sensor.... Agent: Dicke, Billig & Czaja
20090140730 - Linear position sensor: A sensor used to sense the position of an attached movable object. The sensor can be mounted to a pneumatic actuator. The sensor includes a housing that has a pair of cavities or pockets separated by a wall. A magnet carrier is positioned within one of the cavities and a... Agent: Daniel J. Deneufbourg Cts Corporation
20090140731 - Multiple-rotation absolute-value encoder of geared motor: A multiple-rotation absolute-value encoder of a geared motor, wherein the geared motor (10) reduces the rotational speed of a motor shaft (12) and takes it out from a gear shaft (14) to drive a machine device (15) in an operating range corresponding to the two rotations of the gear shaft... Agent: Flynn Thiel Boutell & Tanis, P.C.
20090140732 - Low cost simplified spectrum analyzer for magnetic head/media tester: An electronic component tester characterizes electronic components such as magnetic head/media components measure performance parameters such as signal-to-noise ratio and overwrite evaluation. The electronic component tester has a tester process controller and a spectrum analyzer. The tester process controller generates calibration and control signals for the electronic component tester. The... Agent: Saile Ackerman LLC
20090140733 - Magnetic device and frequency detector: A magnetic device includes: a magnetoresistive effect element having a magnetization fixed layer, a magnetization free layer, and a nonmagnetic layer sandwiched between the magnetization fixed layer and the magnetization free layer; an input terminal for feeding an AC signal to the magnetoresistive effect element in its stacking direction; and... Agent: Oliff & Berridge, PLC
20090140734 - Readout ordering in collection of radial magnetic resonance imaging data: In a magnetic resonance imaging apparatus, a sensor (120, 122, 124, 126, 130) measures a displacement of a feature of interest. A magnetic resonance imaging scanner (10) acquires radial readout lines of magnetic resonance imaging data. A reconstruction processor (58) reconstructs the acquired readout lines into reconstructed image data A... Agent: Philips Intellectual Property & Standards
20090140735 - Temperature-controlled magnetic resonance imaging method and apparatus: A method for improving the imaging quality of magnetic resonance imaging (MRI) equipment and MRI equipment, include obtaining a corresponding relationship between a deterioration factor of imaging quality and the cumulative energy of gradient pulses applied by successive scanning MRI sequences, then determining a predicted value of a current deterioration... Agent: Schiff Hardin, LLP Patent Department
20090140736 - Method and instrument of locally measuring protic solvent content in samples: Excitation-use high frequency RF generated by an RF oscillator 102 is modulated by a modulator 104 based on control by a pulse control unit 108, to give a pulse form. The generated RF pulse is then amplified by an RF amplifier 106, and set to a small-sized RF coil 114.... Agent: Amin, Turocy & Calvin, LLP
20090140737 - Nmr machine comprising solenoid gradient coils: The nuclear magnetic resonance machine comprises a device (101) for creating an intense main magnetic field B0 in a useable interior space (109) in the form of a tunnel with axis Z, a device for radio-frequency excitation and processing of radio-frequency signals emitted in response by a body (150) placed... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP
20090140738 - Method for adjusting an excitation and detection circuit for nuclear magnetic resonance, and circuit adapted for carrying out said method: A method of adjusting an excitation and detection circuit for nuclear magnetic resonance, the circuit comprising a probe (S) of the type comprising a single coil (L) for transmitting pulses to excite the nuclear spins of a sample immersed in a magnetic field and for detecting a resonance signal from... Agent: Alston & Bird LLP
20090140740 - Receiver coil array for magnetic resonance imaging: A receiver coil array for a magnetic resonance imaging system has an inductive coupling coil incorporated in the middle coil unit of the receiver coil array as its secondary coil, which serves to regulate the frequency and impedance of the middle coil unit. The secondary coil has an output regulation... Agent: Schiff Hardin, LLP Patent Department
20090140739 - Ultra wide band wireless radio transmission in mri systems involving channel estimation: At least one radio frequency coil (28, 30) is disposed within an examination region (14), the radio frequency coil (28, 30) wirelessly receives a spread spectrum calibration signal from and transmits multiple channels of data in spread spectrum data signals to an associated wireless transceiver (60, 64; 62, 66). A... Agent: Philips Intellectual Property & Standards
20090140741 - Receiver streamer system and method for marine electromagnetic surveying: A receiver streamer system for marine electromagnetic surveying includes a first streamer, and a second streamer disposed substantially parallel to and spaced apart from the first streamer. A first pair of electrodes is associated with the first streamer and a second pair of electrodes is associated with the second streamer.... Agent: E. Eugene Thigpen Petroleum Geo-services, Inc.
20090140743 - Cell voltage detecting apparatus: The present invention provides an easy to produce cell voltage detecting apparatus using a semiconductor having low voltage endurance. In the cell voltage detecting apparatus, cell modules B1-B10 are serially connected, a switch SW1 is located at a middle point, and a contact point of the switch SW1 on a... Agent: Arent Fox LLP
20090140742 - Method and system for determining a state of charge of a battery: Methods and systems are provided for determining a state of charge of a battery. The battery is subjected to a predetermined magnetic field such that the battery and the predetermined magnetic field jointly create a resultant magnetic field. The resultant magnetic field is sensed. The state of charge of the... Agent: Ingrassia Fisher & Lorenz, P.C. (gm)
20090140744 - Method and device for determining state of health of the battery, and battery power supply system: A method and the device are provided for determining state of health of the battery, in addition to the power supply system using the device, to reduce operational and processing load by expanding the data sampled at the time when the battery is caused to discharge square wave pulses into... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090140745 - Power converter current sensor testing method: A method of testing power converter current sensors is disclosed. The method may include receiving a current sensor test request and receiving measured currents from current measurements from the at least one current sensor, based on the test request. The method may further include comparing the measured current of the... Agent: Caterpillar/finnegan, Henderson, L.L.P.
20090140747 - Detection of faults in an injector arrangement: A method and apparatus for detecting faults in an injector arrangement is described. The injector arrangement comprises a plurality of piezoelectric injectors that are located in parallel branches of an injector bank circuit of an injector drive circuit. Each branch of the injector bank circuit comprises a high side isolation... Agent: Delphi Technologies, Inc.
20090140746 - Testing circuit board: A testing circuit board used in a testing system with a tester and a handler is disclosed. The testing circuit board is used for transmitting a plurality of testing signals provided by the tester to test at least two devices under test located on the handler. The testing circuit board... Agent: Muncy, Geissler, Olds & Lowe, PLLC
20090140748 - High voltage harness testing system: A wire harness testing system is disclosed. The wire harness testing system may include a voltage sensor configured to measure a voltage at a location associated with an electric load, wherein the electric load is connected with at least one wire harness. The wire harness testing system may also include... Agent: Caterpillar/finnegan, Henderson, L.L.P.
20090140749 - Device for measuring a load current: A device for measuring a load current in a load circuit that has a switch that switches the load current. The switch has a control variable as a first switch variable and an output variable, which is dependent on the control variable, as a second switch variable. A setting unit... Agent: Lerner Greenberg Stemer LLP
20090140750 - Interference exclusion capability testing apparatus: An interference exclusion capability testing apparatus is provided for use in testing interference exclusion capability of a specimen by radiating an electromagnetic wave toward the specimen from a radiating antenna. The radiating antenna includes an electromagnetic horn, and a waveguide plate that guides an electromagnetic wave radiated from the electromagnetic... Agent: Kinney & Lange, P.A.
20090140751 - Microwave paint thickness sensor: A microwave paint thickness sensor includes a single cylindrical cavity, a microwave source, and a signal detector. The cylindrical cavity is open at one end, the open end having a choke joint for interfacing with a painted surface. The cylindrical cavity is designed so that the electronic field is normal... Agent: Hayes Soloway P.C.
20090140752 - Use of a nanoparticle film having metal ions incorporated: The present invention relates to the use of a nanoparticle film having metal ions incorporated wherein and to a method of detecting a gaseous or volatile or liquid analyte in a medium.... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090140753 - Test strip reader system and method: A system and method is disclosed which relates to the back biasing a photodiode and charging a capacitor to generate a pulse. The length of the pulse is proportional to the light intensity incident on the photodiode.... Agent: Duckor Spradling Metzger & Wynne A Law Corporation
20090140754 - Method for determining a property of a fluid for a household device: Method for determining a property of a fluid for a household device, comprising the following steps: measurement of a physical variable of the fluid associated with the property of the fluid, in each case when a first parameter influencing the physical variable has one of at least two predetermined values,... Agent: Mesmer & Deleault, PLLC
20090140755 - Circuit board testing system: System including backplane, and first and second circuit boards. First circuit board is attached to backplane and has first optical signal transmitter. Second circuit board is attached to backplane and has first optical signal receiver. First optical signal transmitter and first optical signal receiver are mutually configured and mutually aligned... Agent: Jay M. Brown
20090140757 - Microdisplay assemblies and methods of packaging microdisplays: Microdisplay assemblies, methods of packaging microdisplays, and methods of testing microdisplays are disclosed. In accordance with one embodiment, a microdisplay assembly includes a support and a microdisplay disposed on the support. The microdisplay includes a semiconductor workpiece mounted to the support and an optical device region disposed over the semiconductor... Agent: Texas Instruments Incorporated
20090140756 - Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment: The probe member of the invention has a sheet-like probe, which is composed of a frame plate made of a metal, in which a plurality of openings have been formed, and a plurality of contact films arranged on and supported by a front surface of the frame plate so as... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090140759 - Ic socket having contact devices with low impedance: A contact device (5) for interconnecting two electronic devices comprises: an upper contact pin (51) having a contacting portion (511) extending upward for connecting one electronic device, and a mating portion (513) of a substantial plate-type structure extending downward and defining a planar mating surface (5132); an lower contact pin... Agent: Wei Te Chung Foxconn International, Inc.
20090140758 - Test carrier: A test carrier includes an insert body, a first latch assembly including one or more first latches pivotally attached to the insert body, and a second latch assembly including one or more second latches pivotally attached to the insert body. The second latch assembly is configured to engage with an... Agent: Marger Johnson & Mccollom, P.C.
20090140760 - Probe card: The probe card includes a plurality of probes arranged on one surface side of a board. These probes belonging to any one of a first probe group including a plurality of probes contacting respective electrodes in a first electrode row of an electronic device, a second probe group including a... Agent: Ingrassia Fisher & Lorenz, P.C.
20090140762 - Layout for dut arrays used in semiconductor wafer testing: A layout for devices under test formed on a semiconductor wafer for use in wafer testing includes a first array of devices under test and a first pad set formed adjacent to the first array. The first pad set includes a gate force pad, a source pad, and a drain... Agent: Morrison & Foerster LLP
20090140761 - Method of testing semiconductor device: A method of testing a semiconductor device, which can reduce a period of time for testing a packaged semiconductor chip. First, semiconductor chips to be tested are classified in a lot unit. The semiconductor chips are fist tested in units of lots. The defective semiconductor chips among the semiconductor chips... Agent: Marger Johnson & Mccollom, P.C.
20090140763 - Method of measuring on-resistance in backside drain wafer: A method of measuring on-resistance in a backside drain wafer includes providing a wafer having a first MOS transistor and a second MOS transistor each having a source and also sharing a drain provided at a backside of the wafer, and then forming a current flow path passing through the... Agent: Sherr & Vaughn, PLLCPrevious industry: Electricity: power supply or regulation systems
Next industry: Electronic digital logic circuitry
RSS FEED for 20150514:
Integrate FreshPatents.com into your RSS reader/aggregator or website to track weekly updates.
For more info, read this article.
Thank you for viewing Electricity: measuring and testing patents on the FreshPatents.com website. These are patent applications which have been filed in the United States. There are a variety ways to browse Electricity: measuring and testing patent applications on our website including browsing by date, agent, inventor, and industry. If you are interested in receiving occasional emails regarding Electricity: measuring and testing patents we recommend signing up for free keyword monitoring by email.
Results in 1.34018 seconds