|Electricity: measuring and testing patents - Monitor Patents|
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Electricity: measuring and testing March listing by industry category 03/09Below are recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application. 03/26/2009 > patent applications in patent subcategories.
20090079414 - Using floating gate field effect transistors for chemical and/or biological sensing: Specific ionic interactions with a sensing material that is electrically coupled with the floating gate of a floating gate-based ion sensitive field effect transistor (FGISFET) may be used to sense a target material. For example, an FGISFET can use (e.g., previously demonstrated) ionic interaction-based sensing techniques with the floating gate... Agent: Straub & Pokotylo
20090079415 - Current detection crcuit and current detection method: A multi-source MOS transistor includes a sense MOS transistor and a load MOS transistor, and is connected to a load. A current detection portion has a negative input offset voltage characteristic, and detects a first sense current in a state where it is connected to the power supply and the... Agent: Mcginn Intellectual Property Law Group, PLLC
20090079416 - Electricity energy monitor: An electric energy monitor or meter for efficient measuring and recording electrical energy usage data relating to a particular appliance or circuit. One embodiment comprises a thin-profile monitoring device through which an electrical conductor, for example the normal line cord plug of an appliance or the output wire from a... Agent: Dimock Stratton LLP
20090079417 - Inductively powered power bus apparatus: An apparatus for a power bus includes an inductive power harvesting unit structured to provide a first power output arising from current flowing in the power bus, an energy storage unit structured to store energy from the first power output and to provide a second power output, and a selector... Agent: Eaton Electrical, Inc. Technology & Quality Center
20090079418 - Systems and methods for monitoring voltage: Methods and systems for monitoring voltage are disclosed, including: a plurality of circuit points, a first bus configured to electrically couple to a voltage measurement device, a first set of switches configured to selectively electrically couple a first subset of the circuit points to the first bus, at least one... Agent: Giorgos A. Georgakis Chowdhury & Georgakis, PC
20090079419 - Apparatus and methods of integrated-circuit device testing: A motherboard device (MB) interface board (DIB) configured as universal interface to a family of integrated circuit (IC) devices provides the electrical connectivity to automated test equipment (ATE) and physical mating commonality with an IC device handler for reduced time to market and enhanced economy for design validation and production... Agent: Qualcomm Incorporated
20090079422 - Inductive position sensor: A position sensor having a transmitter coil with both an outer loop portion and an inner loop portion. A receiver coil is disposed in close proximity to the transmitter coil and the receiver coil includes a first loop and an oppositely wound second loop. The receiver coil generates an electrical... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c
20090079420 - Integrated electronic circuit: Disclosed is an integrated electronic circuit comprising a core circuit that generates a useful signal as well as a buffer for storing the useful signal. The buffer stores the last read value of the useful signal for a predetermined period of time when the power supply is interrupted, and the... Agent: O''shea Getz P.C.
20090079421 - Measurement-only topological quantum computation: Measurement-only topological quantum computation using both projective and interferometrical measurement of topological charge is described. Various issues that would arise when realizing it in fractional quantum Hall systems are discussed.... Agent: Woodcock Washburn LLP (microsoft Corporation)
20090079423 - Angle sensor: The invention relates to an angle sensor which is only protected by an encasement body without having a surrounding protective housing.... Agent: Head, Johnson & Kachigian
20090079424 - Electromagnetic resonance frequency inspection systems and methods: A method of inspecting a test part is provided. The method includes positioning a coil on a surface of the test part and exciting the coil at a resonance frequency. The method also includes determining at least one of a resonance frequency shift and a quality factor of the coil... Agent: General Electric Company Global Research
20090079425 - Magnetic sensitivity measurement system: A system and method for determining the magnetic sensitivity of a Hall-effect switch through the use of a variable powered DC electromagnet having a permanent magnet attached to it. In use the electromagnet is placed in contact with a Hall-effect switch component and the DC voltage varied until a detector... Agent: Integral Intellectual Property Inc.
20090079426 - Electromagnetic tracking employing scalar-magnetometer: Provided is an electromagnetic tracking system, including at least one electromagnetic field receiver having at least one scalar-magnetometer, at least one electromagnetic field transmitter, and tracker electronics. Also provided is a method for electromagnetic tracking, including generating at least one magnetic field, sensing the at least one magnetic field with... Agent: Ge Healthcare C/o Fletcher Yoder, PC
20090079427 - Multiply phase-cycled steady state free precession sequence and magnetic resonance apparatus for implementation thereof: A multiply phase-cycled steady state free precession sequence has at least two sub-sequences with alternating radio-frequency excitation pulses. An intermediate image data set is generated from raw data that are acquired with each sub-sequence. A resulting image data set is formed from the intermediate image data sets. Radio-frequency excitation pulses... Agent: Schiff Hardin, LLP Patent Department
20090079428 - Magnetic resonance rf transmission system and mr system and method using same: A radio-frequency transmission system for a magnetic resonance system has a radio-frequency amplifier and a signal splitter with two inputs and two outputs. The signal splitter is fashioned so that the power of a radio-frequency signal provided at one of the two inputs is divided between the two outputs. A... Agent: Schiff Hardin, LLP Patent Department
20090079429 - Method for determining the absolute number of electron spins in a sample of extended size: In a method for determining an absolute number of electron spins in an extended sample (3) with the assistance of an apparatus for measuring magnetic resonance, the extended sample (3) is disposed within a measurement volume (2) of a radiofrequency RF resonator (1) of the apparatus during an electron spin... Agent: Kohler Schmid Moebus
20090079431 - External mri imaging coil assemblies and mri-guided interventional systems utilizing same: An MRI imaging coil assembly includes a primary external MRI imaging coil and a secondary external MRI imaging coil positioned proximate to the primary MRI imaging coil. The primary imaging coil has a plurality of spaced-apart RF coils and is configured to surround at least a portion of a patient.... Agent: Myers Bigel Sibley & Sajovec
20090079430 - Magnetic resonance apparatus gantry and magnetic resonance apparatus: A magnetic resonance apparatus gantry includes a cylindrical static magnet housing which accommodates a static field magnet and in which an opening portion is formed, a cylindrical gradient magnet housing which accommodates a gradient coil, is placed in the opening portion, and is shorter in length in an axial direction... Agent: Nixon & Vanderhye, PC
20090079432 - Transceive surface coil array for magnetic resonance imaging and spectroscopy: A surface coil array comprises a surface coil support and an arrangement of non-overlapping magnetically decoupled surface coils mounted on the support. The surface coils encompass a volume into which a target to be imaged is placed. Magnetic decoupling circuits act between adjacent surface coils. Impedance matching circuitry couples the... Agent: Baker & Daniels LLP 111 E. Wayne Street
20090079433 - Ground control unit for cable locating: A system and method for selectively grounding each of a plurality of short-haul buried utility conveyances coupled to a common long-haul buried utility conveyance to enable a conveyance locating signal transmitted through the long-haul conveyance to travel from the long-haul utility conveyance to a selected short-haul utility conveyance. The system... Agent: At&t Corp.
20090079434 - Car power source apparatus: The car power source apparatus is provided with a leakage detection circuit 3 having a battery 1 with a plurality of battery units 2 connected in series, a first series circuit 11 made up of first leakage detection resistors 12 and a first leakage detection switch 13 to connect the... Agent: Wenderoth, Lind & Ponack, L.L.P.
20090079435 - Load drive circuit: According to the present invention, the operation of a diagnostic circuit within a load drive circuit, which has been built into an electronic control device, is checked without modifying the electronic control device or the like. The load drive circuit, which drives a load such as a solenoid using a... Agent: Crowell & Moring LLP Intellectual Property Group
20090079436 - Method and apparatus for generalized ac and dc arc fault detection and protection: According to the features discussed herein, through a single generalized arc-fault detection algorithm, various types of series and/or parallel arc faults can be detected without any nuisance trip for either AC or DC Electric Power Systems. Running Discrete Fourier Series (RDFS) formulation for nuisance-free operation and cost-effective implementation is developed.... Agent: Honeywell International Inc.
20090079437 - System for isolating faults between electrical equipment: A system is disclosed that can be inserted between cable runs of electrical equipment so as to provide access to signal/data lines associated with the electrical equipment. The system includes a microprocessor and a matrix switch and preferably display equipment and measurement instrumentation. The microprocessor controls the matrix switch so... Agent: Naval Air Warfare Center Aircraft Division Office Of Counsel Bldg 435
20090079438 - System and method for testing electrical connection: An electrical connection testing system for testing existence of an electrical connection between a first electronic device and a second electronic device. An electrostatic discharge (ESD) protection circuit is provided between the first and second electronic devices. The testing system includes a comparator having a first input connected to a... Agent: Harrington & Smith, PC
20090079439 - Efuse system and testing method thereof: An eFuse system and a method for testing the eFuse system are provided. The eFuse system includes an eFuse, a sensing circuit, and an offset resistor. The sensing circuit has a trigger point resistance and is coupled to a first end of the eFuse for sensing the resistance of the... Agent: J C Patents, Inc.
20090079440 - Method and tester for verifying the electrical connection integrity of a component to a substrate: A method for verifying the integrity of the electrical connection between at least one signal path of a substrate and at least one respective contact of a component mounted on the substrate is disclosed. The method includes generating a step signal on one of the at least one signal path... Agent: Agilent Technologies Inc.
20090079441 - Electronic circuit comprising a device to measure phase noise of an oscillating and/or resonant device: An electronic circuit includes several (at least two) oscillating and/or resonant devices. The circuit uses a measuring device to measure the phase noise of one of the two oscillating/resonant devices. This measuring device is integrated on a chip on which said oscillating/resonant device to be measured is also integrated. The... Agent: Gardere Wynne Sewell LLP Intellectual Property Section
20090079442 - Piezo-acoustic thin film resonator having a crystalline zinc oxide layer: A capacitor structure includes a lower electrode layer disposed on a substrate, an upper electrode layer and a crystalline zinc oxide-containing dielectric layer interposed between the electrode layers. The amorphous dielectric intermediate layer is interposed between the lower electrode layer and the crystalline zinc oxide-containing dielectric layer. A method for... Agent: Young & Thompson
20090079443 - Sensor device and display apparatus: A sensor device according to an embodiment of the present invention includes an electrode array having plural electrodes arranged in an array manner, a signal generator configured to generate a first signal having a first frequency, and apply the first signal to the plural electrodes, and a detection unit configured... Agent: Amin, Turocy & Calvin, LLP
20090079444 - Apparatus and method of capacitively sensing operator presence for a stump cutter: An operator detection and presence device includes a conductive sensor and a guard electrode. The sensor and electrode are physically located and electrically connected in a manner which helps the detection circuit measure if an operator's hand is on the handle or if the change in capacitance is due to... Agent: Merchant & Gould PC
20090079445 - Isolated fuel sensor: A fuel sensor includes a cylindrical, one-piece plastic body that has an inlet, an outlet and a fuel passage in between. The body further includes three sensing, thin-walled plate holders that extend from the cylindrical body into and across the fuel passage. Three parallel sensing plates are disposed in the... Agent: Delphi Technologies, Inc.
20090079446 - Method to accurately estimate the source and drain resistance of a mosfet: Measurements of parameters of MOS transistors, also known as MOSFETs, such as threshold potentials, require accurate estimates of source and drain series resistance. In cases where connections to the MOSFET include significant external series resistance, as occurs in probing transistors that are partially fabricated or deprocessed, accurate estimates of external... Agent: Texas Instruments Incorporated
20090079447 - Testing system for a radio frequency module: A testing system for a RF module includes a metal casing formed a testing space therein, a RF testing socket disposed inside the testing module, and a pressing manipulator penetrating through the metal casing. A shielding material layer is disposed on the internal surface of the metal casing so that... Agent: Rosenberg, Klein & Lee
20090079451 - High frequency probe: A high frequency probe has contact tips located within the periphery of a terminal section of a coaxial cable and shielded by a ground conductor of the coaxial cable.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel
20090079448 - Method and apparatus for testing devices using serially controlled resources: Methods and apparatus for testing devices using serially controlled resources have been described. Examples of the invention can relate to an apparatus for testing a device under test (DUT). In some examples, an apparatus can include an integrated circuit (IC) having a serialized input coupled to test circuits, the test... Agent: MoserIPLaw Group / Formfactor, Inc.
20090079450 - Semiconductor test device: A semiconductor test device. In one embodiment, the test device includes a drill bit. The test device is configured to rotate the drill bit, at least after contacting the semiconductor device, for penetrating into the semiconductor device.... Agent: Dicke, Billig & Czaja
20090079449 - Test structures, systems, and methods for semiconductor devices: Test structures, systems, and methods for semiconductor devices are disclosed. In one embodiment, a test structure for a semiconductor device includes a winding disposed in at least one conductive material layer of the semiconductor device. At least a portion of the winding extends proximate a perimeter of the semiconductor device.... Agent: Slater & Matsil LLP
20090079452 - Component assembly and alignment: A method or an apparatus for aligning a plurality of structures can include applying a first force in a first plane to a first structure. The method can also include constraining in the first plane the first structure with respect to a second structure such that the first structure is... Agent: N. Kenneth Burraston Kirton & Mcconkie
20090079453 - Automated test equipment with dib mounted three dimensional tester electronics bricks: Automated test equipment is provided which includes a test head having a tester electronics bricks mounted to a device interface board. In some embodiments, support circuitry is positioned adjacent the tester electronics bricks opposite the DIB. The support circuitry may include power circuitry and/or data bus circuitry, which may be... Agent: Balzan Intellectual Property Law, PC
20090079454 - Method of testing using a temporary chip attach carrier: A method of testing integrated circuit chips. The method includes: attaching integrated circuit chips to an interposer of a temporary carrier, the carrier comprising: a substrate, a first interconnects on a bottom surface and a second array of interconnects on a top surface of the substrate, corresponding first and second... Agent: Schmeiser, Olsen & Watts
20090079455 - Reduced scrub contact element: Embodiments of resilient contact elements and methods for fabricating and using same are provided herein. In one embodiment, a resilient contact element includes a lithographically formed resilient beam having a plurality of openings disposed laterally therethrough; and a tip disposed proximate a first end of the beam, the tip and... Agent: MoserIPLaw Group / Formfactor, Inc.
20090079456 - Apparatus, system, and method for integrated component testing: An apparatus, system, and method are disclosed for integrating component testing. A voltage module modifies a reference voltage integral to an electronic device to a plurality of reference voltage values. A test module tests a component of the electronic device at each of the plurality of reference voltage values. In... Agent: Kunzler & Associates
20090079457 - Connection testing apparatus and method and chip using the same: A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time... Agent: J C Patents, Inc.
20090079459 - Evaluation pattern suitable for evaluation of lateral hillock formation: An evaluation pattern for evaluation of lateral hillock formation is provided with a lattice pattern; and an isolated metallization. The lattice pattern includes: a loop interconnection; and lattice interconnections laterally and vertically arranged to intersect with one another so that a region surrounded by the loop interconnection is divided into... Agent: Mcginn Intellectual Property Law Group, PLLC
20090079458 - Small pitch ball grid array of a package assembly for use with conventional burn-in sockets: A package assembly (18) that is selectively coupled to a burn-in apparatus (228P) during a burn-in process includes a pin-out (20) having an array of contacts (22) including a set of first contacts (222F) and a set of second contacts (222S). The first contacts (222F) are required for the burn-in... Agent: Roeder & Broder LLP
20090079460 - Systems and method for measuring negative bias thermal instability with a ring oscillator: An integrated circuit, in accordance with one embodiment of the present invention, includes a first device under test (DUT), a first ring oscillator, a second DUT and a second ring oscillator. The first DUT is biased such that interface traps are generated during a first mode. The generated interface traps... Agent: Transmeta C/o Murabito, Hao & Barnes LLP
20090079463 - Local defect memories on semiconductor substrates in a stack computer: A reconfigurable high performance computer includes a stack of semiconductor substrate assemblies (SSAs). Some SSAs involve FPGA dice that are surface mounted, as bare dice, to a semiconductor substrate. Other SSAs involve memory dice that are surface mounted to a semiconductor substrate. Elastomeric connectors are sandwiched between, and interconnect, adjacent... Agent: Imperium Patent Works
20090079462 - Semiconductor device testing apparatus: A semiconductor device testing apparatus includes a test head Hifix, a tester coupled to the test head Hifix, two or more device-under-tests (DUTs), and one or more processor devices disposed on the test head Hifix and coupled to the DUTs for transmitting and receiving test signals between the tester and... Agent: Charles E. Baxley, Esquire
20090079461 - Test socket and test board for wafer level semiconductor testing: A test board for wafer level semiconductor testing is disclosed. The test board comprises a plurality of wires and microelectronic devices; and a plurality of test sockets on an upper surface of the test board. Each test socket comprises: a base member configured for attachment to the test board with... Agent: Joe Mckinney Muncy
20090079464 - Electro-optical device and electronic apparatus: An electro-optical device includes a peripheral circuit that is provided in a peripheral area, a terminal that is provided in the peripheral area; and an electric wiring pattern that provides an electric connection between the terminal and the peripheral circuit, the electric wiring pattern having a low resistance portion and... Agent: Workman Nydegger 1000 Eagle Gate Tower03/19/2009 > patent applications in patent subcategories.
20090072809 - Method for detection of the presence of a load and drive circuit: Methods and apparatuses for detection of a presence of a load. A method may include, for example, applying and subsequently removing a supply voltage across the pair of nodes, comparing an electrical potential at one of the pair of nodes at a time after the supply voltage is removed with... Agent: Banner & Witcoff, Ltd. Attorneys For Client 007052
20090072810 - Voltage-drop measuring circuit, semiconductor device and system having the same, and associated methods: A voltage-drop measuring circuit is capable of measuring a voltage-drop of a power supply voltage caused by a resistance component of a power line. The voltage-drop measuring circuit includes a sensing circuit and a voltage-drop detecting circuit. The sensing circuit includes a sensor configured to generate a sensing voltage received... Agent: Lee & Morse, P.C.
20090072811 - Pulse measurement apparatus and method: An embodiment of the invention is directed to a pulse measuring system that measures a characteristic of an input pulse under test, particularly the pulse shape of a single-shot, nano-second duration, high shape-contrast optical or electrical pulse. An exemplary system includes a multi-stage, passive pulse replicator, wherein each successive stage... Agent: Bond, Schoeneck & King, PLLC
20090072812 - Event-driven time-interval measurement: An apparatus including a circuit configured to measure timing between features in a first signal only referring to timing information contained in the signal itself.... Agent: Banner & Witcoff, Ltd. Attorneys For Client 007052
20090072813 - Intelligent electronic device having circuitry for reducing the burden on current transformers: An intelligent electronic device (IED), e.g., an electrical power meter, having circuitry for reducing the burden placed on at least one current sensor of the device resulting in a highly accurate measurement by the at least one current sensor is provided. The circuitry of the present disclosure reduces the burden... Agent: Electro Industries/ Gaugetech C/o Casella & Hespos, LLP
20090072814 - Wireless system and method for collecting rotating system data: A wireless system for collecting data indicative of a tire's characteristics uses at least one open-circuit electrical conductor in a tire. The conductor is shaped such that it can store electrical and magnetic energy. In the presence of a time-varying magnetic field, the conductor resonates to generate a harmonic response... Agent: National Aeronautics And Space Administration Langley Research Center
20090072815 - Calibration of a magnetic sensor device: The invention relates to the calibration of the magnetic sensor device comprising magnetic excitation wires (11, 13) and a magnetic sensor element, for example a GMR sensor (12), for measuring reaction fields (B2) generated by magnetic particles (2) in reaction to an excitation field (B1) generated by the excitation wires.... Agent: Philips Intellectual Property & Standards
20090072817 - Automatic determination of the position of an object: The invention relates to a method for analysis of magnetic fields or signals used for the determination of the position of an object, wherein two temporally to each other shifted magnetic signals or fields are generated by two conductors arranged at least in part or completely separated from each other.... Agent: Glenn Patent Group
20090072816 - Rotary magnetic encoder assembly, chip and method: A rotary magnetic encoder assembly that has a freewheeling rotatable exciter magnet onboard that excites a magnetic field sensor region of an encoder chip when magnetic interaction between the exciter magnet and rotating encoder shaft causes the exciter magnet to rotate. In one embodiment, a drive magnet carried by the... Agent: Boyle Fredrickson S.c.
20090072818 - Position sensor, optical head device, head moving mechanism, information recordng/reproducing device and position control system: As imaging devices are miniaturized, and optical devices are miniaturized, lens moving mechanisms are also miniaturized. Thus, position sensors for them are required to be miniaturized and have high accuracy at low cost. A magnet 2 of a pillar shape and a yoke 3 which move in X axis direction... Agent: Wenderoth, Lind & Ponack L.L.P.
20090072819 - Rotation angle detector and bearing with rotation angle detector: To provide a rotation angle detecting device, in which undesirable noises from an angle calculating circuit can be reduced to increase a detection accuracy, outputs of four linear magnetic sensor arrays arranged on a non-rotatable member confronting a magnetic generating element and arranged in a plane perpendicular to the axis... Agent: Staas & Halsey LLP
20090072820 - Method and system for determining the distance between a profiled surface from a functional surface moving in relation thereto by using two exploring coils: A method and a system are disclosed for determining the distance between a conducting surface which is profiled in the direction of distance determination and a functional surface moving in relation to the surface by using a measuring system. Two exploring coils are applied to an oscillator system and are... Agent: Harness, Dickey & Pierce, P.L.C
20090072821 - Control gate: A control gate includes an exciting coil and a detecting coil. The exciting coil forms an alternating magnetic field in a passageway at an entrance to or an exit from an area where taking out or bringing in of an object is controlled. The detecting coil detects a change of... Agent: Oliff & Berridge, PLC
20090072822 - System and method for inspection of parts: An inspection system for detecting a flaw in a part is provided. The inspection system includes a generally C-shaped core having an opening for receiving the part. The system also includes a driver coil wrapped around the core for creating a magnetic field in the opening. The system further includes... Agent: General Electric Company (pcpi) C/o Fletcher Yoder
20090072823 - 3d integrated compass package: A 3-axis sensor package with on-board sensor support chip on a single chip. In one aspect of the invention, a sensor package includes an X-axis sensor circuit component, a Y-axis sensor circuit component, or alternatively a combined X/Y-axis sensor circuit component, and a Z-axis sensor circuit component, each mounted to... Agent: Honeywell International Inc. Patent Services Ab-2b
20090072824 - Nuclear magnetic resonance evaluation using independent component analysis (ica)-based blind source separation: Disclosed is a non-lineal statistical independent component (ICA) analysis methodology for calculating T2 or T1 distributions of nuclear magnetic resonance logs. In one aspect, the invention employs a classical blind source separation (BSS) approach with the input data (T2 or T1 distributions) being considered not only horizontally (in relaxation time... Agent: Arnold & Knobloch, L.L.P.
20090072825 - Systems and methods for deep-looking nmr logging: An NMR logging tool for conducting NMR measurements in a plurality of sensitive volumes ranging up to a meter from the tool. The tool comprises a magnetic assembly using one or more permanent magnets and at least one pole piece for extending a magnet pole and shaping the magnetic field... Agent: Jones Day
20090072827 - Independent phase modulation for efficient dual-band 3d imaging: A method for magnetic resonance imaging (MRI) a first volume and a second volume spaced apart from the first volume is provided. The first volume is excited with a first linearly varying phase with respect to k-space. The second volume is excited with a second linearly varying phase with respect... Agent: Beyer Law Group LLP
20090072826 - Magnetic resonance imaging with bipolar multi-echo sequences: A method for magnetic resonance imaging (MRI) is provided. A magnetic resonance excitation is provided. A plurality of k-space echoes is acquired bi-directionally wherein at least one echo is an even echo acquired in a first direction and at least one echo is an odd echo acquired in a second... Agent: Beyer Law Group LLP
20090072828 - Low field squid mri devices, components and methods: Low field SQUID MRI devices, components and methods are disclosed. They include a portable low field (SQUID)-based MRI instrument and a portable low field SQUID-based MRI system to be operated under a bed where a subject is adapted to be located. Also disclosed is a method of distributing wires on... Agent: Steinfl & Bruno
20090072829 - Nmr sample tube size adapter: An adapter of the invention for fitting an NMR sample tube having an outside diameter into an NMR spectrometer sample tube holder designed for a larger outside diameter sample tube includes a one-piece elongate cylinder having an upper portion and a lower portion. The lower portion has an outside diameter... Agent: Diehl Servilla LLC
20090072830 - Sample exchange device having a sample receptacle guided through a meandering path, in particular for an nmr spectrometer: A sample exchange device (1), in particular, for an NMR spectrometer, comprising a circumferential chain (22), sample receptacles (7) which are disposed on the chain (22) at equal distances and are connected to each other via webs (23), and a measuring or transfer position (9), wherein each sample receptacle (7)... Agent: Kohler Schmid Moebus
20090072831 - Source monitoring for electromagnetic surveying: Method for real time monitoring of the waveform transmitted by an electromagnetic survey source, using a near-source monitoring receiver to measure electromagnetic field and transmitting the measured signal in real time to a control location.... Agent: Exxon Mobil Upstream Research Company
20090072832 - Transducer assemblies for subsurface use: Transducer apparatus for subsurface use. A tubular configured for subsurface disposal is equipped with a cylindrical transducer module formed of a non-conductive material. The module is mounted to surround a section of the tubular and includes a transducer element disposed thereon such that only a surface of the element is... Agent: Schlumberger Oilfield Services
20090072833 - Resistivity imaging using phase sensitive detection with a floating reference signal: A device, method and system for measuring characteristics of a geologic formation using a floating reference signal having a mud chamber, an electrode disposed within the mud chamber, and an electrically conductive plate disposed within the mud chamber, the plate separated from the electrode. An alternating current source is provided... Agent: Arnold & Knobloch, L.L.P.
20090072834 - Method and apparatus for conducting electromagnetic exploration: The invention is concerned with electromagnetic exploration of the earth's surface. In a method proposed by the invention, a primary coil is powered to generate a primary field and the primary field is applied to the earth and a receiver, used to detect a secondary field generated by the earth... Agent: Lahive & Cockfield, LLP Floor 30, Suite 3000
20090072835 - Sensor device for conductivity measurement and method for its operation: A sensor device for insertion into a water channel in a washing machine is provided with two electrodes as sensors on a sensor carrier. These electrodes are in direct contact with the water through apertures. The electrodes are connected to a transformer on the sensor carrier directly and without any... Agent: Alston & Bird LLP
20090072836 - Pressure sensor using field emission of carbon nano-tube: Disclosed is an ion gage using a carbon nano-tube, more specifically a pressure sensor using a field emission of the carbon nano-tube. An array of carbon nano-tubes is formed on a metallic layer. A first grid is disposed on the array of the carbon nano-tubes. A second grid is disposed... Agent: Patterson, Thuente, Skaar & Christensen, P.A.
20090072837 - Method of testing durability of cis based thin-film solar cell module: The property of CIS based thin-film solar cell modules that the modules recover their conversion efficiency, etc. upon irradiation with a weak light is correctly evaluated. A CIS based thin-film solar cell module is subjected to a conventional damp heat test with a constant-light solar simulator (solar simulator) 1D in... Agent: Sughrue-265550
20090072838 - Multi-port switching apparatus, device testing system and method of testing therefor: A multi-port switching apparatus (104) comprises a first port (204) and a second port (210) for coupling respectively to a device under test (300). The apparatus (104) also comprises an analyser port (108) for coupling to a signal analyser (102) and a switching unit (200) coupled to the first port... Agent: Agilent Technologies Inc.
20090072839 - Apparatus and method to detect failure of smoothing electrolytic capacitor: An apparatus and method to detect failure of an electrolytic capacitor that smoothes a DC voltage in an inverter circuit. The apparatus detects failure of a smoothing electrolytic capacitor in a motor drive inverter circuit that rectifies and smoothes an AC voltage through a rectifier and the smoothing electrolytic capacitor... Agent: Staas & Halsey LLP
20090072840 - Cancelling low frequency errors in mems systems: Systems and methods are described below for cancelling low frequency errors in electronic systems including MEMS systems. The systems include a first circuit coupled to one or more switches. One or more bond wires are coupled to the switches and a second circuit. Control signals are coupled to the switches,... Agent: Courtney Staniford & Gregory LLP
20090072841 - Extruded capacitive sensor assembly and detection method: An extruded capacitive sensor assembly includes multiple sense conductors of unequal length disposed in an upper section of a non-conductive jacket, and a ground conductor disposed in a lower section of the jacket adjacent a panel or carrier to which the strip is affixed. A sensor strip with three sense... Agent: Delphi Technologies, Inc.
20090072842 - Electrical resistance measuring device for tires, and method thereof: An electrical resistance measuring device for tires 10 comprises first and second probes 2, 3 for measuring an electrical resistance value of a tire 5, wherein the first probes 2 abut on a plurality of portions in an outer peripheral surface of a tread part 6 and the second probe... Agent: Sughrue Mion, PLLC
20090072843 - Method and apparatus for interrogating an electronic component: A method and apparatus for interrogating an electronic component (20), includes a body (18 or 102) having an interface (10, 24, 108 or 154) for an interrogating device (48/50 or 106) to use as a conduit in reliably performing multiple discrete interrogations of the electronic component (20) without the interrogating... Agent: Christensen, O'connor, Johnson, Kindness, PLLC
20090072847 - Apparatus for testing a semiconductor device and a method of fabricating and using the same: Example embodiments provide for an apparatus for testing various kinds of semiconductor devices having different distances between probes. Example embodiments also provide for a method of fabricating and using said apparatus. In accordance with example embodiments, an apparatus for testing a semiconductor device may include at least one cable penetrating... Agent: Harness, Dickey & Pierce, P.L.C
20090072848 - Electrical contactor, especially wafer level contactor, using fluid pressure: An electrical interconnect assembly and methods for making an electrical interconnect assembly. In one embodiment, an interconnect assembly includes a flexible wiring layer having a plurality of first contact elements and a fluid containing structure which is coupled to the flexible wiring layer. The fluid, when contained in the fluid... Agent: N. Kenneth Burraston Kirton & Mcconkie
20090072846 - High frequency differential test probe for automated printed wiring board test systems: A differential test probe for a printed wiring board test system includes a probe body having a proximal end and a distal end. Each of a plurality of coaxial cables extending from the proximal end to the distal end. The plurality of coaxial cables each includes a center conductor having... Agent: Faegre & Benson Attn: Patent Docketing
20090072845 - Link analysis compliance and calibration verification for automated printed wiring board test systems: A transmission line on a printed wiring board is tested and printed wiring board manufacturing variability is assessed. A response of the transmission line to a signal test pattern is measured. A network including a plurality of components connected by the transmission line is then simulated. The simulated network is... Agent: Faegre & Benson Attn: Patent Docketing
20090072844 - Wafer inspecting sheet-like probe and application thereof: The sheet-like probe for wafer inspection of the invention has an insulating sheet, in which a plurality of through-holes each extending in a thickness-wise direction of the insulating sheet have been formed in accordance with a pattern corresponding to a pattern of electrodes to be inspected in all or part... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090072849 - Flexible test fixture: A system for testing an electronic circuit board (ECB) having a plurality of test points in a pre-defined arrangement on a measurement device having a plurality of resources includes an interface fixture having a plurality of contact pads arranged in an array on a first surface. The contact pads can... Agent: Jabil Circuit, Inc. C/o Darby & Darby P.C.
20090072850 - Forked probe for testing semiconductor devices: A novel forked probe design for use in a novel probe card is presented that comprises a forked bending element that more efficiently stores displacement energy. Specifically, the novel probe card comprising a substrate and a forked probe connected to the substrate. The forked probe includes a base that is... Agent: Manuel F. De La Cerra
20090072851 - Multi-pivot probe card for testing semiconductor devices: A novel probe design is presented that comprises a plurality of pivots. These pivots allow the probe to store the displacement energy more efficiently. The novel probe comprises a substrate, and a probe connected to the substrate. The probe further comprises a base that is connected to the substrate, a... Agent: Manuel F. De La Cerra
20090072853 - Method for pre-treating epitaxial layer, method for evaluating epitaxial layer, and apparatus for evaluating epitaxial layer: An apparatus for evaluating an epitaxial layer of an epitaxial wafer, the apparatus including a pretreatment unit for pre-treating an epitaxial wafer having a semiconductor wafer and an epitaxial layer formed on the semiconductor wafer, a metal-electrode which can be made contact with or vapor-deposited on the surface of the... Agent: Kolisch Hartwell, P.C.
20090072852 - System that detects damage in adjacent dice: A system including a tester configured to measure a first current from a first die of neighboring dice and a second current from a second die of the neighboring dice. The tester is configured to compare the first current to the second current to detect damage in the neighboring dice.... Agent: Dicke, Billig & Czaja
20090072854 - Liquid crystal display panel and testing and manufacturing methods thereof: A liquid crystal display (LCD) panel simplifying its testing and manufacturing. The LCD panel includes (formed on a substrate) gate lines, data lines, and pixels including pixel transistors. The LCD panel further includes a plurality test transistors (e.g., data test transistors for driving the odd and even data lines) formed... Agent: F. Chau & Associates, LLC03/12/2009 > patent applications in patent subcategories.
20090066315 - Dynamic modulation for multiplexation of microfluidic and nanofluidic based biosensors: The present invention generally relates to a method for rapidly counting micron and/or submicron particles by passing such particles through any of a plurality of microfluidic channels simultaneously with an ion current and measuring the signal generated thereby. The present invention also generally relates to a device for practicing the... Agent: Roetzel And Andress
20090066316 - Electrokinetic method for determining the electrostatic charge state of a porous membrane during filtering and the use thereof: The invention relates to an electrokinetic method for determining the electrostatic charge state of a porous membrane during filtering by measuring trans-membrane variations of a flow potential. The use of the inventive method for controlling and characterising the filtering membrane cleaning efficiency is also disclosed.... Agent: Coats & Bennett, PLLC
20090066317 - Transformer meter and system for using same: The present invention is a meter for recording voltage and current on a transformer. The device has a housing with a body portion and a lever portion, the lever portion being movable between a closed position wherein the lever portion abuts the body portion and an open position wherein the... Agent: Elias Borges
20090066318 - Sensor device with alternating excitation fields: The invention relates to a magnetic sensor device comprising excitation wires (11, 13) for generating a magnetic excitation field and a magnetic sensor element, particularly a GMR sensor (12), for sensing magnetic fields generated by labeling particles in reaction to the excitation field. The magnetic excitation fields are generated with... Agent: Philips Intellectual Property & Standards
20090066320 - Deadbolt sensor for security systems: The current invention provides an improved security system sensor assembly. The sensor assembly of the current invention reduces installation costs when adding a security system. to an existing structure by eliminating the need to install magnets on existing doors. The sensor assembly of the current invention allows the security system... Agent: Mcafee & Taft Tenth Floor, Two Leadership Square
20090066319 - Magnetic encoder with separation of sensor from the environment: A magnetic encoder for detecting for example movement of a continuous pipe, wire line, pipe joints, rod, etc. into a well includes a wheel in the contaminated environment of the well with a permanent magnet mounted on the wheel such that the magnet moves past a sensing location each time... Agent: Ade & Company Inc.
20090066322 - Linear displacement detection apparatus: A linear displacement detection apparatus is configured to convert a linear displacement of a shaft into a rotary displacement of a sensor rotor of a rotary displacement sensor so as to detect the linear displacement. A sensor lever is fixed to the sensor rotor and rotatable about an axis of... Agent: Nixon & Vanderhye, PC
20090066321 - Locating stationary magnetic objects: A technique for locating stationary magnetic objects comprises placing magnetic sensors on a movable platform; for each sensor, measuring a total magnetic field signal in an area of detection; using the sensors to identify a line upon which a target stationary magnetic object is located; and fixing a location of... Agent: U S Army Research Laboratory Attn Amsrl Cs Cc Ip
20090066324 - Angular position detector and rotary electric device drive unit including the same: The invention provides an angular position detector that can be configured at low cost and that accurately detects the angular position of a rotor in a rotary electric device and permits reliable control thereof even when the rotary electric device runs at a high speed. The angular position detector includes... Agent: Kenyon & Kenyon LLP
20090066323 - Antenna orientation sensor and method for determining orientation: An antenna orientation sensor, having a base, a pivoting support coupled to the base. An actuator operable to move the pivoting support through a calibration movement with respect to the base. A, for example, three axis magnetic sensor on the pivoting support and a position sensor operable to sense the... Agent: Babcock Ip, PLLC
20090066325 - Rotation angle detection device: A rotation angle detection device includes a rotary body rotating in linked motion with a steering wheel; a detector rotating in linked motion with the rotary body; a magnetic detection element placed on a wiring board and detecting magnetism of a magnet placed at the detector; a control part for... Agent: Ratnerprestia
20090066326 - Magnetic device: A magnetic device comprises a magnetic element, a first magnetic field applying means, and a second magnetic field applying means. The first and second magnetic field applying means are disposed on mutually opposite sides of the magnetic element. The magnetic element is, for example, an element in which a soft... Agent: Sughrue Mion, PLLC
20090066327 - Method and computer program product for estimating true intrinsic relaxation time and internal gradient from multigradient nmr logging: A method and a computer program product for estimating the true intrinsic relaxation time T2 and the internal gradient Gint for a multi-frequency nuclear magnetic resonance imaging tool for well logging includes providing at least two frequencies in a plurality of echo trains, evaluating the signal decay in each echo... Agent: Cantor Colburn LLP- Baker Atlas
20090066329 - Magnetic resonance imaging apparatus and navigator data analyzing method: A magnetic resonance imaging apparatus executes scans for executing a navigator sequence for acquiring as navigator data a magnetic resonance signal from a navigator area containing tissues body-moved in a subject and executing an imaging sequence for acquiring a magnetic resonance signal from an imaging area as imaging data at... Agent: Patrick W. Rasche (20459) Armstrong Teasdale LLP
20090066328 - Nuclear magnetic resonance imaging apparatus and method: A control means controls an imaging means for taking an image of a test object by a magnetic resonance, the test object being placed in an imaging space, and a transfer means that moves the test object, and on the basis of a difference (moving distance) between a position of... Agent: Cooper & Dunham, LLP
20090066330 - Nmr measurement of wax appearance in fluids: A method for determining a wax appearance temperature of a fluid includes obtaining nuclear magnetic resonance (NMR) measurements of the fluid at a plurality of temperatures; deriving a NMR parameter from each of the NMR measurements; and determining the wax appearance temperature by analyzing the NMR parameter as a function... Agent: Schlumberger Canada Limited
20090066332 - Magnetic resonance imaging apparatus and gradient magnetic field coil: An MRI apparatus excellent in magnetic field generation efficiency is provided. According to this invention, a main coil (52) of a gradient magnetic field coil (13) is partially recessed to reduce the total thickness of a radio-frequency coil (11) and a gradient magnetic field coil (13). That is, the main... Agent: Cooper & Dunham, LLP
20090066331 - Probe, system and method suitable for unilateral nuclear magnetic resonance: A probe suitable for use in unilateral nuclear magnetic resonance imaging and adapted to be embedded in a sample to be analysed, the probe comprising; a static magnetic field generator; a radiofrequency magnetic field generator adjacent to the static magnetic field generator; a circuit controlling the frequency response of the... Agent: Stikeman Elliott LLP
20090066333 - Nmr sample tube: An NMR sample tube for NMR measurement is provided. It includes a plug on both sides or one side of a sample to be measured, in an axial direction of the sample tube. The plug is adjusted to have magnetic susceptibility equal to or substantially equal to that of the... Agent: Antonelli, Terry, Stout & Kraus, LLP
20090066335 - Method for fast measurement of the saturation and the resistivity of a porous medium: A method for measuring the conducting fluid saturation and the resistivity of a porous medium have application to development of underground geological formations. A solid sample is extracted from the medium and placed in a centrifugation cell, beside a second sample for limiting the capillary in the first sample. The... Agent: Antonelli, Terry, Stout & Kraus, LLP
20090066334 - Short normal electrical measurement using an em-transmitter: A method and apparatus for determination of a formation resistivity property in which an impedance of a downhole antenna that includes an upper gap sub insulated from a lower sub is used as an estimate of the formation resistivity property.... Agent: Madan, Mossman & Sriram, P.C.
20090066336 - Apparatus and method for electrically investigating a borehole: m
20090066337 - Method for determining valve degradation: A method for determining degraded valve operation. According to the method, valve degradation can be determined from the duration of a spark event. This method allows for the determination of both intake and exhaust valve degradation.... Agent: Alleman Hall Mccoy Russell & Tuttle, LLP
20090066338 - Battery voltage detecting circuit: A battery voltage detecting circuit includes: a first capacitor having one end connected to one input terminal of an operational amplifier; a second capacitor having one end connected to an output terminal of the operational amplifier and the other end connected to the one input terminal of the operational amplifier;... Agent: SocalIPLaw Group LLP
20090066339 - Assay cartridges and methods of using the same: Assay modules, preferably assay cartridges, are described as are reader apparatuses which may be used to control aspects of module operation. The modules preferably comprise a detection chamber with integrated electrodes that may be used for carrying out electrode induced luminescence measurements. Methods are described for immobilizing assay reagents in... Agent: Scully Scott Murphy & Presser, PC
20090066341 - Medical device and test method for medical device: A medical device of the present invention is a medical device having a plurality of wiring boards disposed in a housing, each of which has a board terminal for testing the wiring board, comprising: one or more external terminals provided on the outer surface of the housing and connected to... Agent: Scully Scott Murphy & Presser, PC
20090066340 - Test apparatus and connecting apparatus: Provided is a test apparatus that tests a device under test, including a test head that generates a test signal for testing the device under test; a socket board onto which is mounted the device under test, that transmits signals between the test head and the device under test; a... Agent: Jianq Chyun Intellectual Property Office
20090066342 - Method and apparatus for a voltage/current probe test arrangements: A diagnostic tool for performing electrical measurements to calibrate a plasma processing chamber probe is provided. The diagnostic tool includes an RF generator. The diagnostic tool also includes a first impedance circuit. The first impedance circuit is a voltage-load network, configured to deliver RF voltage outputs from the RF generator... Agent: Ipsg, P.C.
20090066343 - System and method for computer noteboook electromagnetic compatibility analysis: A system and method for antenna analysis and electromagnetic compatibility testing in a wireless device utilizes a “parent” device that undergoes rigorous conventional testing. A “child” device having similar components may thereafter undergo abbreviated testing. Because the Total Isotropic Sensitivity of the parent device is known, testing may be performed... Agent: Davis Wright Tremaine, LLP/seattle
20090066344 - Apparatuses and methods for nondestructive microwave measurement of dry and wet film thickness: Wet and dry film thickness can be measured non-invasively on structures, such as surfaces associated with vessels, aircraft and buildings, using calibrated microwave sensors. The film is measured by directing microwave energy toward the film. The microwave energy passes through the film and is reflected by a reflective or semi-reflective... Agent: Michael O. Scheinberg
20090066345 - Sensor having organic field effect transistors: A force sensor based on an organic field effect transistor applied on a substrate is disclosed. In one embodiment, a mechanical force acting on the transistor causes a change in its source-drain voltage or its source-drain current which corresponds to said force and which can in each case be detected... Agent: Dicke, Billig & Czaja
20090066346 - Detection circuit device and method for detecting the presence of an object in the vicinity of a motor vehicle: The invention relates to a circuit device and a method for detecting the presence of an object in the vicinity of a motor vehicle. The aim of the invention is to provide solutions which allow monitoring the vicinity of a motor vehicle with regard to the presence of an object.... Agent: K.f. Ross P.C.
20090066347 - Biosensor and a method of measuring a concentration of an analyte within a medium: A biosensor for measuring a concentration of an analyte within a medium includes an electrical charge storage and a resistive layer including an electrical resistance which changes upon contact with the analyte. The electrical charge storage includes a sensor electrode, and the resistive layer may be contacted with the medium... Agent: Schoppe, Zimmermann , Stockeler & Zinkler C/o Keating & Bennett, LLP
20090066348 - Apparatus and method for quantitative determination of target molecules: A nanoelectronic device for detecting target molecules is described. The device has an array of nanoscale wires serving as sensors of target molecules and electrical contacts, electrically contacting the nanowires at end regions of the nanoscale wires. The end regions are covered with an insulating material. The insulating material also... Agent: Steinfl & Bruno
20090066351 - Electrochemically fabricated microprobes: Multilayer test probe structures are electrochemically fabricated via depositions of one or more materials in a plurality of overlaying and adhered layers. In some embodiments each probe structure may include a plurality of contact arms or contact tips that are used for contacting a specific pad or plurality of pads... Agent: Microfabrica Inc. Att: Dennis R. Smalley
20090066349 - Probe system: A probe system including a body, a testing apparatus, a probe card, and a strengthening mechanism is provided. The testing apparatus is disposed above the body. The probe card is disposed between the testing apparatus and the body. The strengthening mechanism is disposed between the probe card and the testing... Agent: Jianq Chyun Intellectual Property Office
20090066350 - Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same: A wireless interface probe card includes a substrate member and a transmission member. The substrate member has a plurality of probe terminals arranged at a constant pitch. The probe terminals may directly contact a plurality of pads arranged at a constant pitch on each of a plurality of semiconductor chips... Agent: Marger Johnson & Mccollom, P.C.
20090066352 - Making and using carbon nanotube probes: Columns comprising a plurality of vertically aligned carbon nanotubes can be configured as electromechanical contact structures or probes. The columns can be grown on a sacrificial substrate and transferred to a product substrate, or the columns can be grown on the product substrate. The columns can be treated to enhance... Agent: N. Kenneth Burraston Kirton & Mcconkie
20090066353 - Probe assemblies and methods for housing and providing electrical contact to planar or chip-type sensors and heaters: A probe assembly for planar or chip-type sensors and heaters, which includes a probe housing having a tip end and a feed-through end, and a sensor or heater element within the housing which includes electrode pads and has a bottom surface that is in thermal contact with the probe tip.... Agent: Koppel, Patrick & Heybl
20090066355 - Circuit arrangement with switchable functionality and electronic component: A circuit with switchable functionality has a first integrated circuit, which has, in a first operating mode, full functionality and which has, in at least one other operating mode, a functionality which is reduced in comparison with the full functionality. The circuit further has an output terminal to which a... Agent: Lerner Greenberg Stemer LLP
20090066354 - Electrostatic discharge test system and electrostatic discharge test method: A method of conducting an electrostatic discharge test on an integrated circuit is described. The method comprises configuring a test board assembly to emulate characteristics of a system in which the integrated circuit is to be used, coupling the integrated circuit to the test board assembly, and applying an electrostatic... Agent: Banner & Witcoff, Ltd. Attorneys For Client 007052
20090066357 - Method and apparatus for detecting impairment of a solar array: An apparatus for detecting an impairment of a solar array. The apparatus comprises an impairment detection module for performing a comparison of a power production profile and at least one reference profile, wherein the power production profile and the at least one reference profile are for at least one of... Agent: Raymond R. Moser Jr., Esq. MoserIPLaw Group
20090066356 - Method and apparatus for interrogating an electronic component: A method and apparatus for interrogating an electronic component, includes a body having an interface for an interrogating device to use as a conduit in reliably performing multiple discrete interrogations of the electronic component without the interrogating device physically touching the electronic component.... Agent: Christensen, O'connor, Johnson, Kindness, PLLC
20090066358 - Methods and apparatus for detecting defects in interconnect structures: In some aspects, a method is provided for detecting a void in a test structure that comprises (a) measuring a resistance of the test structure; (b) applying a stress to the test structure at increasing levels until at least one of: (i) the measured resistance of the test structure exceeds... Agent: Dugan & Dugan, PC
20090066359 - Semiconductor device test system having reduced current leakage: A test circuit tests a device under test (DUT) uses a first switching device and a second switching device. The device under test (DUT) has a terminal for receiving a test signal. The first switching device has an output terminal for use in coupling the test signal to the terminal... Agent: Freescale Semiconductor, Inc. Law Department
20090066360 - Method for determining an inductance of a motor: The intention is to simplify the measurement of an inductance characteristic curve of a motor. To this end, provision is made for a current (i) having a non-periodic current offset component and a periodic current component to be injected into the motor's winding so that the motor accelerates. A corresponding... Agent: Henry M Feiereisen, LLC Henry M Feiereisen03/05/2009 > patent applications in patent subcategories.
20090058395 - Method for determining anisotropy of 1-d conductor or semiconductor synthesis: A method is provided for determining the anisotropy of alignment of a random array of 1-D conductive elements (e.g., carbon nanotube or silicon nanowire) formed on a substrate. A pattern of a plurality of electrodes are arranged on the substrate containing the 1-D conductive elements and a plurality of electrical... Agent: Greenberg Traurig LLP (la)
20090058396 - Electrode configuration for limca: The present invention provides a method and apparatus for reducing electromagnetic noise pick up in a Liquid Metal Cleanliness Analyzer (LiMCA), used to detect and measure particles in molten metal. An first electrode inserted in the molten metal is electrically insulated from second and third electrodes, also inserted in the... Agent: Christopher C. Dunham C/o Cooper & Dunham LLP
20090058397 - Apparatus for verifying a low noise block output voltage: The present invention relates to system diagnostic circuitry for antenna systems with active antenna components. More specifically, the present invention discloses an apparatus comprising a connection between an antenna and a power supply conducting a first DC voltage, a source of a pulse width modulated signal, a lowpass filter for... Agent: Joseph J. Laks Thomson Licensing LLC
20090058398 - Current/voltage detection printed board and current/voltage detector: A printed board, includes: a first shield portion, configured to reduce an influence of an electric field in combination with a casing accommodating the printed board, at least a part of the first shield portion being formed with a plurality of through holes; and a second shield portion, configured to... Agent: Greenblum & Bernstein, P.L.C
20090058399 - Clamp jaw assembly: A method of manufacturing a clamp jaw assembly for a clamp meter is provided. The method includes providing a clamp jaw core and a shield having a channel. The method further includes positioning the clamp jaw core within the channel of the shield such that the shield surrounds a portion... Agent: Christensen, O'connor, Johnson, Kindness, PLLC
20090058401 - Machine with a position-sensing system: A machine includes a component. The machine may also include a position-sensing system with a plurality of sensor elements that each generate a signal related to proximity of the sensor element to the component by generating the signal based at least in part on the magnetic permeability of the space... Agent: Caterpillar/finnegan, Henderson, L.L.P.
20090058400 - Device for detecting absolute angel of multiple rotation and angle detection method: A multiple rotation absolute angle detecting device includes a reduction gear mechanism having an eccentric ring fitted to a rotatable member, an internally threaded member in a stationary member, an externally threaded member engageable with the internally threaded member, and a speed reducing member to which rotation is transmitted from... Agent: Staas & Halsey LLP
20090058402 - Integrated circuit including magneto-resistive structures: An integrated circuit includes two first adjacent magneto-resistive effect (xMR) structures. Each first xMR structure is configured to sense a first magnetic field direction. The integrated circuit includes two second adjacent xMR structures at a distance from the two first xMR structures. Each second xMR structure is configured to sense... Agent: Dicke, Billig & Czaja
20090058403 - Magnetic encoder: The encoder is characterized by a projecting portion which is provided at a surface of the circular multipolar magnet facing to the metal reinforcing ring, so as to form an adhesive space to secure uniform adhesive layer between metal reinforcing ring and the circular multipolar magnet, thereby preventing from being... Agent: Bacon & Thomas, PLLC
20090058405 - Rotation angle sensor: A rotation angle sensor is provided with a shaft portion having a torsion bar, a rotation angle sensing portion for detecting rotation angle of the shaft portion, and a torque sensing portion for detecting angle of torsion of the torsion bar. The rotation angle sensing portion and the torque sensing... Agent: Wenderoth, Lind & Ponack L.L.P.
20090058404 - Rotation detection sensor: A rotation detection sensor for detecting both rotational position and direction of a rotating body with a gear includes a magnet, multiple magnetic sensors, a rotational position detection circuit, and a rotational direction detection circuit. The magnet produces a magnetic field directed to a gear tooth of the rotating body.... Agent: Posz Law Group, PLC
20090058406 - Nondestructive inspection method and device: The present invention nondestructively analyzes the position or corrosion state of a magnetic material present in the interior of a non-magnetic material structure. The magnetic material is magnetized from the outside of the structure, and magnetic flux density of the thus-magnetized magnetic material is measured at the outside of the... Agent: Mcglew & Tuttle, PC
20090058407 - Physical quantity conversion sensor and motor control system using the same: A first sensor element outputs a first output signal in correspondence to a direction of the magnetic flux lines acting from the outside. A second sensor element outputs a second output signal associated with the first output signal in correspondence to a direction of the magnetic flux lines acting from... Agent: Crowell & Moring LLP Intellectual Property Group
20090058408 - method and a device for electromagnetic measurement of thickness and electrical conductivity: A method for non-contact determination of sought properties of an object to be measured by using electromagnetic induction. An electromagnetic field is generated in a transmitter coil placed on one side of the object to be measured. The magnetic field penetrates through the object to be measured and is detected... Agent: Venable LLP
20090058409 - Method and device for forecasting polishing end point: To achieve the above object, the present invention provides a method for forecasting a polishing end time, wherein an inductor 36 in an inductor type sensor is placed adjacent to the predetermined conductor film 28, and by the magnetic flux formed by the inductor 36, a change of magnetic flux... Agent: Paul A. Fattibene Fattibene & Fattibene
20090058410 - Reed relay for magnetic field measurement: An apparatus for measuring a strength of a magnetic field, including a switch including contacts configured to change position when a switching threshold is reached, wherein the switching threshold is reached by modifying an external magnetic field around the switch, and a coil wound around the switch, wherein the coil... Agent: Osha Liang L.L.P.
20090058411 - Magnetic sensor, hall element, hall ic, magnetoresistive effect element, method of fabricating hall element, and method of fabricating magnetoresistive effect element: An aspect of the present invention provides a magnetic sensor which is operated better at a high temperature range not lower than 300° C. compared with a conventional magnetic sensor. A operating layer having a heterojunction interface is formed by laminating a first layer made of GaN whose electron concentration... Agent: Burr & Brown
20090058412 - Integrated current sensor: An integrated current sensor includes a current conductor, a magnetic field transducer, and an electromagnetic shield. The magnetic field transducer includes a sensor die. The electromagnetic shield is disposed proximate to the sensor die. The electromagnetic shield has at least one feature selected to reduce an eddy current in the... Agent: Daly, Crowley, Mofford & Durkee, LLP
20090058413 - Magnetoresistive sensor device and method of fabricating such magnetoresistive sensor device: In order to further develop a magnetoresistive sensor device (100; 100′; 100″) comprising at least one substrate or wafer (10), in particular at least one silicon wafer, and at least one sensing element (30), in particular at least one A[nisotropic]M[agneto]R[esistive] sensing element and/or—at least one G[iant]M[agneto]R[esistive] sensing element, for example... Agent: Nxp, B.v. Nxp Intellectual Property Department
20090058414 - Measuring electric and magnetic field: A field detection device such as a micro-strip portion of a transmission line may detect an electric field and a magnetic field induced by current steps injected into the chassis coupled to a ground plane. The shield portions of the transmission line may be coupled to a first and a... Agent: Intel/bstz Blakely Sokoloff Taylor & Zafman LLP
20090058416 - Method and apparatus for nmr saturation: Saturation pulse sequences are designed to ensure complete saturation of nuclear spins for dual wait time measurements and saturation recovery measurements in the case of axial motion of a downhole NMR logging tool. Frequency and/ or phase modulation may be used. An auxiliary saturation coil may be used.... Agent: Madan, Mossman & Sriram, P.C.
20090058415 - Method and apparatus of using crossed magnetic fields for measuring conductivity, permeability and porosity: When a static magnetic field and a crossed oscillating field are applied, the deformation rate at a boundary between a fluid and a porous medium depends on the amplitudes of the applied magnetic fields (to be exact, on their product), electric conductivity, porosity, and permeability. Knowing two of the three... Agent: Madan, Mossman & Sriram, P.C.
20090058417 - Test object for use with diffusion mri and system and method of synthesizing complex diffusive geometries using novel gradient directions: A test object for use with diffusion MRI and a system and methods of synthesizing complex diffusive geometries. The test object, which includes anisotropic structures, can be used to monitor DTI measures by providing a baseline measurement. Using measurements of the phantom, data characteristic of more complicated diffusive behavior can... Agent: Gardner Groff Greenwald & Villanueva. PC
20090058418 - Double half rf pulses for reduced sensitivity to eddy currents in ute imaging: A method for creating a magnetic resonance image of an object with at least a first species and a second species, wherein the first species has a first T2 time and the second species has a second T2 time longer than the first T2 time is provided. An excitation with... Agent: Beyer Law Group LLP
20090058419 - Magnetic resonance imaging apparatus and magnetic resonance image displaying method: A magnetic resonance imaging apparatus includes a scan section which executes a diffusion weighted imaging pulse sequence on an imaging area of a subject within a static magnetic field space thereby to acquire magnetic resonance signals, an image generating part which generates an image with respect to the imaging area,... Agent: Patrick W. Rasche (20459) Armstrong Teasdale LLP
20090058420 - Magnetic resonance apparatus and control method for the same: A magnetic resonance apparatus includes a coil which receives a magnetic resonance signal from a subject, a transmitting unit which transmits the magnetic resonance signal received by the coil with a radio signal of a frequency band different from that of the magnetic resonance signal, an unit which extracts the... Agent: Nixon & Vanderhye, PC
20090058421 - Service tee marker fixture: A service tee marker fixture comprises a disk marker and a cylindrical attachment sleeve fastened concentrically to the disk marker and constructed of a flexible material which provides a releasable friction fit with a service tee cap. For certain sleeve materials a stiffener plate is used to secure an end... Agent: Law Office Of Jack V. Musgrove
20090058422 - Fiber optic system for electromagnetic surveying: An electromagnetic survey sensing device includes at least two electrodes disposed at spaced apart locations. An electrical to optical converter is electrically coupled to the at least two electrodes. The converter is configured to change a property of light from a source in response to voltage imparted across the at... Agent: E. Eugene Thigpen Petroleum Geo-services, Inc.
20090058423 - Electronic apparatus and controlling method for the same: An electronic apparatus which is capable of correctly displaying the remaining usable time even if a discharged current of a battery pack is changed by an unexpected load due to an external apparatus connected. The electronic apparatus has a battery pack with a secondary battery mounted therein. A first remaining... Agent: Rossi, Kimms & Mcdowell LLP.
20090058424 - Plasma monitoring method and plasma monitoring system: A plasma monitoring method using a sensor, the sensor having a substrate; a first electrode, the first electrode being a conductive electrode and formed on the substrate while being isolated from the substrate; an insulating film formed on the first electrode; a contact hole formed in the insulating film and... Agent: Rabin & Berdo, PC
20090058425 - Method and apparatus to test electrical continuity and reduce loading parasitics on high-speed signals: An apparatus for testing electrical continuity of a surface mounted (SMT) electrical board includes: a printed wiring board having a first surface and an opposite second surface; a conductive signal line disposed on each of the first and second surfaces of the printed wiring board; an electrical component disposed on... Agent: Cantor Colburn LLP - IBM Rochester Division
20090058426 - Electromagnetic shielding defect monitoring system and method for using the same: An embodiment disclosed herein is directed to a method of monitoring an electromagnetic shield effectiveness comprising transmitting a first electromagnetic field toward a first surface of an electromagnetic shield, detecting a second electromagnetic field transmitted from a second surface of the electromagnetic shield, generating a first signal corresponding to the... Agent: Fitch Even Tabin And Flannery
20090058427 - Passive wireless corrosion sensor: A passive wireless corrosion sensor is disclosed. A circuit is configured to provide a signal response when energized. An antenna is configured to wirelessly receive energy for energizing the circuit and to receive the signal response from the circuit and transmit the signal response. A corrosion sensitive connector interposes the... Agent: Fellers Snider Blankenship Bailey & Tippens
20090058428 - Method and device for monitoring and controlling fluid locomotion: A device for monitoring dripping of a fluid from a fluid channel, the device comprises a capacitor, being formed on or integrated with the fluid channel, and electrical contacts, connecting the capacitor to a capacitance measuring device, the capacitor is designed and constructed so that a change in a capacitance... Agent: Martin D. Moynihan D/b/a Prtsi, Inc.
20090058429 - Detecting closure of an electronic device using capacitive sensors: System and method for determining closure of an electronic device. The electronic device may include a top portion and a bottom portion, and may be connecting via a hinge or other closing mechanism. The top portion and/or the bottom portion may include one or more capacitive sensors which provide signals... Agent: Jeffrey C. Hood Meyertons Hood Kivlin Kowert & Goetzel PC
20090058430 - Systems and methods for sensing positions of components: Systems and methods for sensing positions of components are provided. In this regard, a representative method includes: capacitively coupling the component to a resistive member without electrically connecting the component and the resistive member; moving the component relative to the resistive member while the component is capacitively coupled thereto; and... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP
20090058431 - Etch resistant gas sensor: A gas sensor for sensing noxious chemical gases utilizes metal nitrides, metal oxynitrides, metal carbides or metal oxycarbides as the sensing material, which changes its conductivity when exposed to the analyte gas. The change in conductivity is measured for the sensor output.... Agent: Fish & Richardson P.C.
20090058432 - Ultraviolet light monitoring system: An ultraviolet light monitoring system includes first and second electrodes, an evaluation subject film and a power source. The first and second electrodes are opposingly disposed and attract holes which are generated in accordance with irradiation of ultraviolet light. The evaluation subject film is formed in a vicinity of the... Agent: Rabin & Berdo, PC
20090058433 - Method of testing ground resistance by making use of existing telephone lines: A fall of potential method of determining earth ground resistance which utilizes an earth ground tester and eliminates the need for utilizing removable ground stakes. Rather than utilizing a “far stake” the method provides connection of the earth ground tester to the telephone wires. Rather than utilizing a “near stake”... Agent: Trexler, Bushnell, Giangiorgi, Blackstone & Marr, Ltd.
20090058435 - High-sensitive resistance measuring device and monitoring method of solder bump: According to an aspect of an embodiment, a high-sensitive resistance measuring device of solder bumps comprises a resistance variation detection unit which detects a differential voltage (□V=V1−V2), which is obtained by subtracting a second voltage (V2) generated in a reference bump connection unit by a constant current (I) from a... Agent: Staas & Halsey LLP
20090058434 - Method for measuring a property of interconnections and structure for the same: A method for measuring a property of interconnections is provided. The method includes the following steps. A plurality of interconnection test patterns are provided. A pad to which the plurality of interconnection test patterns are parallelly connected is formed. At least one resistor is formed between at least one of... Agent: Snell & Wilmer L.L.P. (main)
20090058436 - System and method for measuring a cable resistance in a power over ethernet application: A system and method for measuring a cable resistance in a power over Ethernet (PoE) application. A short circuit module in a powered device is designed to produce a short circuit effect upon receipt of a cable resistance detection voltage. The cable resistance detection voltage can be designed to be... Agent: Law Office Of Duane S. Kobayashi
20090058437 - Method and apparatus for reviewing defects by detecting images having voltage contrast: A method and apparatus for detecting defects includes irradiating and scanning an electron beam focused on an area of a sample, detecting charged particles generated from the sample by the irradiating and scanning of the electron beam with a first detector which detects charged particles having relatively low energy to... Agent: Antonelli, Terry, Stout & Kraus, LLP
20090058441 - Electrical test probe: A probe for electrical test comprises a plate-shaped main portion having a base end to be attached to a support board and a tip end opposite the base end, and a probe tip portion arranged at the tip end of the main portion and having a probe tip to contact... Agent: Ingrassia Fisher & Lorenz, P.C.
20090058439 - Electronic device test system: When the number of DUTs carried on a loader buffer and scheduled to be held by contact arms at the next test is less than N, a DUT at a contact arm corresponding to a missing position at the loader buffer among the N number of DUTs being held for... Agent: Greenblum & Bernstein, P.L.C
20090058440 - Probe assembly, method of producing it and electrical connecting apparatus: A probe assembly for use in electrical measurement of a device under test. The probe assembly comprises a plate-like probe base plate with bending deformation produced in a free state without load, and a plurality of probes formed on one face of the probe base plate to project from the... Agent: Ingrassia Fisher & Lorenz, P.C.
20090058442 - Prober for testing components: A prober for testing components comprises a lower frame, over which a probe holder plate is disposed at a distance therefrom for receiving test probes that make contact with the components to be tested and to which a displacement device is connected. A substrate carrier is disposed in the space... Agent: Heslin Rothenberg Farley & Mesiti PC
20090058443 - Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device, and probe card used for burn-in stress and d/s tests: According to one embodiment of the invention, a semiconductor chip includes: a test target circuit to which a given burn-in stress is applied; and a burn-in counter that is configured: to acquire a first parameter indicating a test voltage applied to the test target circuit and a second parameter indicating... Agent: Amin, Turocy & Calvin, LLP
20090058438 - Wafer, test system thereof, test method thereof and test device thereof: A wafer, a test system thereof, a test method thereof and a test device thereof are provided. The present invention utilizes a first group of probes to perform a high voltage stress (HVS) test on a first chip, and utilizes a second group of probes to perform a function test... Agent: J C Patents, Inc.
20090058444 - Method and apparatus for relative testing of integrated circuit devices: A method includes loading a plurality of integrated circuit devices into a tester. At least one parameter is determined for each of the integrated circuit devices using the tester. At least one relative acceptance criterion associated with the parameter is determined based on the determined parameters for the plurality of... Agent: Williams, Morgan & Amerson
20090058445 - Circuit board testing using a probe: A test point of a circuit board is probed using an edge probe provided in a fixed orientation when the edge of the probe contacts a solder mound of the test point. The solder mound has an elongated shape. A length of the edge is substantially perpendicular to a length... Agent: Hewlett Packard Company
20090058446 - Inspection apparatus and inspection method: An inspection apparatus for inspecting electric characteristics of a plurality of devices formed on a target object includes a vertical drive mechanism for lifting and lowering a movable mounting table and a control unit for controlling the vertical drive mechanism. The vertical drive mechanism includes an elevation shaft connected to... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.
20090058447 - Fault analyzer: The objective of the invention is to provide a type of fault analyzer and a method therefore that can easily specify fault locations in semiconductor devices. Fault analyzer 100 has the following parts: supporting member 110 for supporting sample S, a pair of upper probe pins 120 arranged above supporting... Agent: Texas Instruments Incorporated
20090058448 - Parallel scan distributors and collectors and process of testing integrated circuits: An integrated circuit (70) having parallel scan paths (824-842, 924-942) includes a pair or pairs of scan distributor (800,900) and scan collector (844,944) circuits. The scan paths apply stimulus test data to functional circuits (702) on the integrated circuit and receive response test data from the functional circuits. A scan... Agent: Texas Instruments Incorporated
20090058449 - Method and apparatus for employing previous test insertion results for testing a device: A method includes determining at least a first characteristic of a device during a first test insertion and storing the first characteristic. The device is identified during a second test insertion. The first characteristic is retrieved responsive to the identification of the device. A test program for the second insertion... Agent: Williams, Morgan & Amerson
20090058451 - Adaptive test time reduction for wafer-level testing: A method is provided for dynamically increasing or decreasing the amount of test data that is applied to die locations on a wafer under test. As on-wafer locations are traversed and tested, the amount of test stimuli applied to subsequent locations is adjusted. This adjustment is based upon the results... Agent: Stallman & Pollock LLP
20090058454 - Device power supply extension circuit, test system including the same and method of testing semiconductor devices: A test system includes a controller, a power supply circuit and a device power supply (DPS) extension circuit. The controller controls a test operation for a plurality of devices under test (DUTs). The power supply circuit generates a common power voltage in response to a voltage control signal from the... Agent: F. Chau & Associates, LLC
20090058450 - Method of and system for functionally testing multiple devices in parallel in a burn-in-environment: A method of and a system for testing semiconductor devices heat a plurality of devices to a burn-in temperature, and perform functional tests in parallel on the plurality of devices at the burn-in temperature. Systems include a burn-in oven and a test multiplexer. The burn-in oven is adapted to receive... Agent: Dillon & Yudell LLP
20090058453 - Semiconductor device: A semiconductor device with technology for externally deciding if the stress test was performed or not. A semiconductor device includes a stress test circuit and a stress test decision circuit. The stress test circuit outputs control signals for executing the stress test to the stress test decision circuit and the... Agent: Young & Thompson
20090058452 - Test apparatus and test method: Provided is a test apparatus that tests fluctuation of a power supply voltage supplied to a device under test, including an oscillator that outputs a clock signal having a frequency that corresponds to the power supply voltage supplied to the power supply input terminal of the device under test, and... Agent: Jianq Chyun Intellectual Property Office
20090058455 - Test structure and test method: The present invention discloses a wafer level test structure and a test method; in which, a heating plate is formed on the wafer for heating a structure to be tested positioned above or adjacent to the heating plate. The heating plate produces heat by electrically connecting to a current. Thus,... Agent: North America Intellectual Property Corporation
20090058456 - Manufacturing system, manufacturing method, managing apparatus, managing method and computer readable medium: There is provided a manufacturing system for manufacturing an electronic device through a plurality of manufacturing stages. The manufacturing system includes a plurality of manufacturing apparatuses performing processes corresponding to the plurality of manufacturing stages. The manufacturing system includes a manufacturing line that manufactures the electronic device, a manufacturing control... Agent: Jianq Chyun Intellectual Property OfficePrevious industry: Electricity: power supply or regulation systems
Next industry: Electronic digital logic circuitry
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