Electricity: measuring and testing inventions October

Electricity: measuring and testing patents - Monitor Patents

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Electricity: measuring and testing October patent listing 10/08

Below are recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application. 10/23/2008 > patent applications in patent subcategories. patent listing

20080258704 - Method and apparatus for identifying broken pins in a test socket: A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the test socket is identified based on the comparison. A test system includes... Agent: Williams, Morgan & Amerson

20080258705 - Method for evaluating the effect of an electric discharge on a composite material: The present invention relates to a method for evaluating the effect of an electric discharge on an aircraft structure through the evaluation of the damage caused by the effect of the thermal heating generated by the mentioned discharge on the structure, comprising the steps of: applying an electric discharge on... Agent: Ladas & Parry LLP

20080258706 - Wide-bandwidth spectrum analysis of transient signals using a real-time spectrum analyzer: A system and method for performing wide-band spectral analysis of transient signals using a real-time spectrum analyzer (RTSA). A frequency window is selected for RTSA acquisition, the frequency window being narrower in bandwidth than the frequency spectrum of interest. An RTSA is successively tuned to a plurality of different frequencies... Agent: Matthew D. Rabdau Tektronix, Inc.

20080258707 - Test method for frequency converters with embedded local oscillators: A method is presented where the phase trace is offset for each sweep such that the first point is always at zero degrees. The resulting traces are then averaged. The average reduces the noise in the phase trace and results in a less noisy group delay trace.... Agent: Agilent Technologies Inc.

20080258708 - Control meter with safety deactivation: Control meter for controlling the supply of services, in particular the supply of electric energy, having a support base, anchored with which is a main power supply line, and a metering group detachable from the support base and with a measurement apparatus interposed between the main power supply line and... Agent: Nixon & Vanderhye, PC

20080258709 - System and method for detecting the presence of an unsafe line condition in a disconnected power meter: A method of detecting the presence of an unsafe line condition at a power metering device is disclosed. The method comprises the steps of determining if a disconnect switch is in the open position, and measuring a first voltage at a first load contact. The method measures a second voltage... Agent: Bryan A. Shang, Esq. Shang & Associates LLC.

20080258710 - Analysis of liquid chromatography eluates: When analysing saccharides by HPAEC, the eluate from the column is typically analysed using a amperometric detector. According to the invention, amperometric detection is coupled with ultraviolet detection, with both methods being applied to the eluate. Thus the invention provides a method for analysing the eluate from a liquid chromatography... Agent: Novartis Vaccines And Diagnostics Inc.

20080258711 - Power gauge for accurate measurement of load current: According to one exemplary embodiment, a power gauge for accurately measuring current consumed by a load coupled to a power source includes a current sense resistor having a first terminal coupled to the power source and a second terminal coupled to the load. The power gauge further includes a first... Agent: Farjami & Farjami LLP

20080258714 - Delay circuit and test apparatus: There is provided a delay circuit that delays an input signal to output the delayed signal. The delay circuit includes a first delay element operable to receive the input signal and delay the input signal to output the delayed signal, a buffer operable to receive the delay signal output from... Agent: Osha Liang L.L.P.

20080258712 - Modular interface: An apparatus for interfacing a test head to a peripheral system is provided. The apparatus includes a first unit having a first connection member for providing electrical communication with the peripheral system, a second unit having a second connection member for providing electrical communication with the test system, and pivot... Agent: Ratnerprestia

20080258713 - Modular interface: An apparatus for interfacing a test head to a peripheral system is provided. The apparatus includes a first unit having a first connection member for providing electrical communication with the peripheral system, a second unit having a second connection member for providing electrical communication with the test system, and pivot... Agent: Ratnerprestia

20080258715 - Sensor system for detecting a differential angle: The invention relates to a sensor arrangement for detecting a difference angle, comprising at least one magnet field-sensitive sensor element (12), with which the magnetic field information of a magnetic circuit, consisting of a magnetic pole wheel (10) and of ferromagnetic flux rings (14, 16) with teeth (18, 20), can... Agent: Michael J. Striker

20080258716 - Magneto-resistive sensor with test mode activation: In particular in automotive applications, sensor systems comprising geometrical leak shift sensor elements must fulfill properties and requirements with respect to quality, accuracy and safety. For this, sensors have to be tested and trimmed. According to an exemplary embodiment of the present invention, a magneto-resistive sensor is provided, allowing for... Agent: Nxp, B.v. Nxp Intellectual Property Department

20080258717 - Magnetic induction tomography system and method: The present invention relates to a magnetic induction tomography system and method for studying the electromagnetic properties of an object. In order to provide a high resolution MIT technique without the need of increasing the number of coils, a magnetic induction tomography system (1) for studying the electromagnetic properties of... Agent: Philips Intellectual Property & Standards

20080258718 - Pressure sensing device for rotatably moving parts and pressure detection method therefor: A magnetic pressure sensing device for rotatably moving parts, of the type including at least one magnetic field source element associated to said rotatably moving part and a magnetic field sensing element associated to a fixed part to measure parameters of a magnetic field determined by said magnetic field source... Agent: Sughrue Mion, PLLC

20080258719 - Apparatus and methods for ferromagnetic wall inspection of tubulars: Apparatus and methods for magnetic wall inspecting materials such as cylindrical and tubular members are disclosed. One apparatus includes a main magnetic coil producing lines of magnetic flux able to traverse a section of a tubular member in a direction generally parallel to a longitudinal axis of the tubular member;... Agent: The Wendt Firm, P.C.

20080258720 - Hybrid wound/etched winding constructs for scanning and monitoring: Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20080258721 - Mtj sensor including domain stable free layer: By subdividing the free layer of a GMR/TMR device into multiple sub-elements that share common top and bottom electrodes, a magnetic detector is produced that is domain stable in the presence of large stray fields, thereby eliminating the need for longitudinal bias magnets. Said detector may be used to measure... Agent: Stephen B. Ackerman

20080258722 - Sensor arrangement: Consistent with an example embodiment, devices comprise sensor arrangements with field detectors for detecting components of magnetic fields in planes of the field detectors. The sensor arrangements further include movable objects for, in response to tilting movements, changing at least parts of the components of the magnetic fields in the... Agent: Nxp, B.v. Nxp Intellectual Property Department

20080258723 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: Generation of an artifact in an image under a transition state up to a steady state is suppressed and image quality is improved by executing the following pulse sequence. In the coherent SSFP method, a gradient magnetic field is applied so that an integrated value of time of a gradient... Agent: Birch Stewart Kolasch & Birch

20080258724 - Magnetic resonance imaging visualization method and system: The present technique provides a system and method for processing an image. Particularly the method comprises acquiring image data in frequency space (k-space) of an imaged volume and obtaining a three-dimensional (3-D) k-space volume representative of the imaged volume based on the acquired k-space data. The method further comprises selecting... Agent: General Electric Company (pcpi) C/o Fletcher Yoder

20080258725 - Non iterative shimming in magnetic resonance imaging in the presence of high lipid levels: For the brain, a variety of automated non-iterative shimming methods using phase evolution derived B0 maps have been reported. These methods assume that there is only a single chemical species contributing to the image. Although true in the brain, lipid contributions from skin, bone marrow and structural fat, may approach... Agent: Amster, Rothstein & Ebenstein LLP

20080258726 - Distinguishing bound and unbound contrast agents using magnetic resonance: Magnetic resonance monitoring of a target (30) uses the detected magnetic resonance to determine movement such as diffusion of contrast agent relative to the object, and uses the movement to discriminate (50, 60) a part of the contrast agent which is bound to the target, from the rest of the... Agent: Philips Intellectual Property & Standards

20080258727 - Method for producing a magnetic resonance image using an ultra-short echo time: A method for producing a magnetic resonance image using an ultra-short echo time. The method includes applying a pulse sequence to an object, detecting a spirally encoded and phase encoded magnetic resonance signal associated with the object, and reconstructing the magnetic resonance image based on the spirally encoded and phase... Agent: Reed Smith LLP

20080258728 - Active decoupling of transmitters in mri: A magnetic resonance imaging system includes a coupling compensation processor (70) for compensating induced magnetic coupling between n individual coil segments (38) of a coil arrangement (36). An adjusted signal determining device (74) determines an adjusted input signal for each of the n individual coil segments of the coil arrangement... Agent: Philips Intellectual Property & Standards

20080258729 - Shim for imaging magnets: An arrangement for producing an imaging region of increased maximum radial diameter in a magnetic resonance imaging (MRI) system, comprising a solenoidal magnet arrangement (30) comprising primary magnet coils (32) arranged symmetrically about an axis (A-A) and a shim coil set.... Agent: Crowell & Moring LLP Intellectual Property Group

20080258731 - High impedance differential input preamplifier and antenna for mri: Antenna assemblies for magnetic resonance signals comprise a non-resonant loop antenna and a high impedance differential amplifier. The amplifier can include first and second high electron mobility transistors that have gates coupled to an antenna loop that is defined on a rigid substrate. The non-resonant loop has an effective length... Agent: Klarquist Sparkman, LLP

20080258732 - Mri apparatus and rf pulse generating circuit: An MRI apparatus includes: an RF coil to which analog RF pulse signals are applied; an RF pulse generating circuit which generates said analog RF pulse signals; and a magnetic resonance signal receiving circuit which receives analog magnetic resonance signals and converts these signals into baseband digital magnetic resonance signals,... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20080258730 - Nuclear magnetic resonance (nmr) probe: There is provided a nuclear magnetic resonance probe in which the loss caused by a high frequency cable between a probe coil and a preamplifier is reduced and the sensitivity of an NMR signal is improved. A changeover switch for NMR probe is divided into a switch part including switch... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080258733 - Electromagnetic wave resistivity tool having a tilted antenna for geosteering within a desired payzone: This invention is directed to a downhole method and apparatus for simultaneously determining the horizontal resistivity, vertical resistivity, and relative dip angle for anisotropic earth formations. The present invention accomplishes this objective by using an antenna configuration in which a transmitter antenna and a receiver antenna are oriented in non-parallel... Agent: Krueger Iselin LLP (1391)

20080258734 - Method for determining the internal resistance of a battery: A method for determining the internal resistance of a battery, in particular a lead-acid vehicle battery, and an associated device for performing the method are described, in which differential values are calculated from the measured values for the voltage and the current, and these differential values are processed with the... Agent: Kenyon & Kenyon LLP

20080258735 - Non-metallic flow-through electrodeless conductivity sensor and leak detector: A non metallic flow through electrodeless conductivity sensor is provided with a conduit having primary and secondary process fluid flowpaths to form a fluid loop. At least one drive and one sense toroid surround the conduit on the fluid loop. Voltage supplied to the drive toroid induces a current in... Agent: Richard L. Sampson Sampson & Associates, P.c

20080258736 - Magnetic flowmeter output verification: A magnetic flowmeter transmitter includes a flowtube and measurement circuitry which provides an output related to flow through the flowtube. Output circuitry, such as analog and pulse output circuitry, provides transmitter output(s) related to flow through the flowtube. Output verification circuitry of the transmitter is coupled to the output circuitry... Agent: Westman Champlin & Kelly, P.A.

20080258737 - Insulation inspection apparatus: An insulation inspection apparatus includes a chamber in which a stator with a winding can be stored, an electrode movable along the outer circumference of a coil end of the stator winding, a voltage application unit applying voltage between the coil end and electrode, a sensor unit sensing leakage current... Agent: Oliff & Berridge, PLC

20080258738 - Characterizing test fixtures: Provided herein are techniques for characterizing a test fixture that is used for connecting a device under test (DUT) to a vector network analyzer (VNA), e.g., to thereby enable de-embedding of the test fixture from measurements of the DUT connected to the test fixture. In an embodiment, the test fixture... Agent: Fliesler Meyer LLP

20080258739 - Position sensor: A compact position sensor with high operational reliability is provided. This sensor has a tubular detection coil, a magnetic core movable in the detection coil, a drive circuit for the detection coil, a signal processing circuit for converting a change in impedance of the detection coil into an electric signal,... Agent: Greenblum & Bernstein, P.L.C

20080258740 - Self-calibrating driver: A self-calibration system includes a variable current source to generate a default source current for charging a capacitive load, and a load charge calibrator to detect a voltage associated with the capacitive load when charged by the default source current, and to generate a current control feedback according to the... Agent: Stolowitz Ford Cowger, LLP/cypress

20080258741 - Parallel ac measurement method: A method for making electrical measurements of a first and a second DUT, the DUTs being in sufficient proximity to exhibit crosstalk therebetween, the method comprising: applying a first signal to the first DUT; applying a second signal to the second DUT, the first signal and the second signal being... Agent: Pearne & Gordon LLP

20080258742 - Conductivity measurement device, its manufacture and use: m

20080258743 - Condensation sensor: A sensor arrangement is provided for attachment to an inside of a windshield in a motor vehicle, including at least a sensor element that determines the relative humidity and a printed circuit board that electrically contacts the sensor element, wherein the sensor element is attached to the printed circuit board... Agent: Muncy, Geissler, Olds & Lowe, PLLC

20080258744 - Electronic circuit testing apparatus: The present invention has an object to provide an electronic circuit testing apparatus that is preferable for testing an electronic circuit which carries out communications between substrates based on inductive coupling and is capable of testing the electronic circuit without using test pads, wherein a probe 15 is caused to... Agent: Edwards Angell Palmer & Dodge LLP

20080258745 - Probe guard: A probe card of the present invention includes a contactor, a printed wiring board, an interposer provided between the contactor and the printed wiring board to have the both in elastic and electrical contact with each other, a coupling member integrating these, and a reinforcing member reinforcing the printed wiring... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080258746 - Probes for a wafer test apparatus: A probe configured for use in the testing of integrated circuits includes a first end portion terminating in a foot (42), the foot defining a substantially flat surface configured to be connected to a substrate (400), a second end portion terminating in a tip (50), the tip being configured to... Agent: Hickman Palermo Truong & Becker, LLP

20080258747 - Test equipment for automated quality control of thin film solar modules: Provided is a method and test system for identifying a defective region of a photovoltaic cell from among a plurality of photovoltaic cells collectively forming a thin film solar module. A probe includes a plurality of test fingers arranged to be substantially simultaneously placed adjacent to an electric contact provided... Agent: Pearne & Gordon LLP

20080258748 - Method for fabricating a probing pad of an integrated circuit chip: A method for fabricating a probing pad is disclosed. A substrate having thereon a dielectric layer is provided. An inlaid metal wiring is formed in the dielectric layer. The inlaid metal wiring and the dielectric layer are covered with a passivation dielectric film. A portion of the passivation dielectric film... Agent: North America Intellectual Property Corporation

20080258750 - Method for determining threshold voltage variation using a device array: A method of measuring threshold voltage variation using a device array provides accurate threshold voltage distribution values for process verification and improvement. The characterization array imposes a fixed drain-source voltage and a constant channel current at individual devices within the array. Another circuit senses the source voltage of the individual... Agent: Ibm Corporation (mh) C/o Mitch Harris, Attorney At Law, L.L.C.

20080258751 - On-chip power supply noise detector: Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of... Agent: Ryan, Mason & Lewis, LLP

20080258749 - Test apparatus, and electronic device: A test apparatus that tests a device under test is provided. The test apparatus includes: a main memory that stores a test data row for testing the device under test; a cache memory that caches the test data row read from the main memory; a pattern generation control section that... Agent: Jianq Chyun Intellectual Property Office

20080258752 - Method and apparatus for measuring device mismatches: A test structure for statistical characterization of local device mismatches contains densely populated SRAM devices arranged in a row/column addressable array that enables resource sharing of many devices. The test structure includes a built-in sensing mechanism to calibrate or null out sources of error, and current steering to avoid negative... Agent: Ibm Corporation (jvm)

10/23/2008 > patent applications in patent subcategories. patent listing

20080258742 - Conductivity measurement device, its manufacture and use: m

10/16/2008 > patent applications in patent subcategories. patent listing

20080252283 - Meter electronics and methods for determining a phase difference between a first sensor signal and a second sensor signal of a flow meter: Meter electronics (20) for processing sensor signals in a flow meter is provided according to an embodiment of the invention. The meter electronics (20) includes an interface (201) for receiving a first sensor signal and a second sensor signal and a processing system (203) in communication with the interface (201)... Agent: The Ollila Law Group LLC

20080252284 - Measuring a current supplied by a rotating electric machine such as an alternator: The invention relates to an electric machine comprising a stator (10), a rotor (11) and a device for measuring a current in said rotating electric machine feeding electric loads (14, 15). Said device is arranged between the stator (10) and the electric loads (14, 15) in such a way that... Agent: Berenato, White & Stavish, LLC

20080252285 - Machine with a rotary position-sensing system: A machine includes a first component and a second component between which relative rotation can occur about a rotation axis. The machine may also include a rotary position-sensing system, which may include a plurality of magnets mounted to the first component. The plurality of magnets mounted to the first component... Agent: Caterpillar/finnegan, Henderson, L.L.P.

20080252286 - Multiple track sense magnet assembly: A sense magnet assembly including a generally circular hub portion defining a central axis. The hub portion includes a generally disk-shaped base portion and an outer wall extending axially from an outer edge of the base portion. An elastic magnet material is provided including a plurality of annular portions positioned... Agent: Stevens & Showalter LLP

20080252287 - Method and arrangement for the contactless inspection of moving electrically conductive substances: The invention relates to a method and arrangement for the contactless determination of conductivity-influencing properties and their spatial distribution over the entire cross section of an electrically conductive substance moving in a primary magnetic field (B). The substance may be a liquid or a solid. A simultaneous measurement of a... Agent: Mayer & Williams PC

20080252288 - Magnetic sensor device with filtering means: The invention relates to a magnetic sensor device (10) comprising wires (11, 13) for the generation of a magnetic field with a first frequency f1s a GMR sensor (12) operated with an input current of a second frequency f2, and an amplifier (26) for amplifying the output of the GMR... Agent: Philips Intellectual Property & Standards

20080252289 - Current and magnetic field sensors, control method and magnetic core for said sensors: The invention relates to a magnetic field sensor comprising at least one magnetic core (10) in which the magnetic cycle of the magnetic core is characterised in that the absolute value of the third derivative of the magnetic flux density in relation to the magnetic field is maximum for a... Agent: Young & Thompson

20080252290 - Rapid mri dynamic imaging using mach: An MRI includes at least a singular imaging channel which uses a smoothly varying sampling pattern to sparsely sample k-space as a series of parallel lines over time to acquire data of an object. The MRI includes a computer in communication with the imaging channel that performs a signal processing... Agent: Ansel M. Schwartz Suite 304

20080252291 - High angular resolution diffusion weighted mri: A magnetic resonance imaging method involves acquisition of magnetic resonance signals with application of diffusion weighting at a plurality of diffusion weighting strengths diffusion directions. An object dataset is reconstructed from the magnetic resonance signals in which apparent diffusion coefficients are assigned. The occurrence of one single or several diffusion... Agent: Philips Intellectual Property & Standards

20080252292 - Magnetic resonance diagnosing apparatus and medical image display apparatus: A magnetic resonance diagnosing apparatus includes an imaging unit which images each slice image of a subject in relation to a plurality of different imaging slices, a measurement unit which measures a magnetic resonance spectrum of the subject in relation to a measurement slice, a selection unit which selects slice... Agent: Nixon & Vanderhye, PC

20080252293 - Detection of resonant tags by ultra-wideband (uwb) radar: A detection system having a receiver for detecting a material having a magnetic resonance response to illumination by pulses of ultra-wideband (UWB) electromagnetic radiation is disclosed. The receiver comprises a detector for detecting the pulses after they have interacted with the material, and a discriminator arranged to identify in the... Agent: Knobbe Martens Olson & Bear LLP

20080252294 - Nuclear magnetic resonance spectrometer: It is an object of the invention to provide, in a nuclear magnetic resonance spectrometer wherein the direction of the static magnetic field is the horizontal direction, a nuclear magnetic resonance probe coil having a highly uniform magnetic field, which can measure at high sensitivity. The present invention, by selecting... Agent: Stanley P. Fisher Reed Smith LLP

20080252295 - Detection of borehole effects due to eccentricity on induction instruments with tilted transducers: A transverse antenna of an electromagnetic induction measurement is provided with an additional pair of split antennas. The difference in the outputs of this split antennas is indicative of a borehole effect such as eccentering of the tool.... Agent: Madan, Mossman & Sriram, P.C.

20080252296 - Multiple frequency based leakage correction for imaging in oil based muds: Oil-based mud imaging systems and methods having leakage current compensation. In some embodiments, disclosed logging systems include a logging tool in communication with surface computing facilities. The logging tool is provided with a sensor array having at least two voltage electrodes positioned between at least two current electrodes that create... Agent: Krueger Iselin LLP (1391)

20080252297 - Apparatus and electronic system for a bicycle and related methods: In order to allow the cyclist to keep the state of the batteries under control during use of a bicycle equipped with an on-board electronic apparatus or during the recharging of the batteries, data is displayed to the cyclist relative to the batteries on the display device of the on-board... Agent: Volpe And Koenig, P.C.

20080252298 - Broadband micro-machined thermal power sensor: A power sensor comprises a substrate, an insulating membrane associated with the substrate, and an electro-thermal transducer partially supported by the insulating membrane. The electro-thermal transducer includes an impedance matched load spaced from the substrate by the insulating membrane, and a thermopile partially spaced from the substrate by the insulating... Agent: Fliesler Meyer LLP

20080252299 - Cell or stack for evaluating performance of fuel cell and method of evaluating performance of fuel cell using the same: According to the present invention, the temperatures of an anode and a cathode of the fuel cell can be precisely changed or maintained. Further, the performance of the fuel cell can also be measured in sub-zero temperature conditions without requiring a separate environmental chamber. A rate of temperature decrease, at... Agent: Arent Fox LLP

20080252300 - Detecting device: A detecting device for detecting the electrical connection between several first pads and second pads of a package substrate is provided. The first and the second pads are disposed on two opposite sides of the package substrate. The detecting device includes a socket unit, several first detecting components and several... Agent: Bacon & Thomas, PLLC

20080252301 - Calibration device and calibration method for adjusting a directional-coupler measuring system: A calibration device for adjusting the forward power and reflected power measured via a single measuring directional coupler which is connected to a high-frequency transmitter, the forward power that is attenuated with ak+x and decoupled being used as a reference value. The calibration device comprises a changeover switch that is... Agent: Marshall, Gerstein & Borun LLP

20080252302 - Device for analyzing the composition of the contents of a container comprising means for obtaining at least one additional physical datum relating to the container: c

20080252303 - Capacitance detecting apparatus: A capacitance detecting apparatus includes: a first on/off switch; a first reference capacitor; a second on/off switch; a third on/off switch; a first sensor electrode; a fourth on/off switch; a second reference capacitance; a fifth on/off switch; a sixth on/off switch; a second sensor electrode; a comparator; switch controlling means... Agent: Buchanan, Ingersoll & Rooney PC

20080252304 - System for electrical impedance tomography and method thereof: A system for electrical impedance tomography and method thereof are disclosed, by which electrical characteristics within a measurement target can be precisely detected. The present invention includes the steps of injection a current to a measurement target via at least one electrode pair selected form a plurality of electrodes (250)... Agent: Workman Nydegger

20080252305 - Device for analysing the composition of the contents of a receptacle including an analysis receptacle: s

20080252306 - Displacement detection pattern for detecting displacement between wiring and via plug, displacement detection method, and semiconductor device: A displacement detection pattern, usable for detection of a relative displacement between a wiring and a via plug, includes a wiring provided between via plugs and a conductor. The conductor is provided in the same layer level as a level at which the wiring is provided and is provided at... Agent: Mcginn Intellectual Property Law Group, PLLC

20080252308 - Power grid structure to optimize performance of a multiple core processor: A reduced number of voltage regulator modules provides a reduced number of supply voltages to the package. The package includes a voltage plane for each of the voltage regulator modules. Each core or other component on the die is tied to a switch on the package, and each switch is... Agent: Ibm Corp. (wip) C/o Walder Intellectual Property Law, P.C.

20080252307 - Techniques for measuring network channel resistive loss between a power-sourcing apparatus and a powered device: A method and apparatus are provided for determining resistive power loss through a channel between Power Sourcing Equipment (PSE) and a Powered Device (PD). The method includes (1) receiving indication that a PSE signal measurement is available from the PSE or a PD signal measurement is available from the PD,... Agent: Bainwood Huang & Associates LLC

20080252309 - Method and apparatus for generating an emi fingerprint for a computer system: A system that generates an electromagnetic interference (EMI) fingerprint for a computer system is presented. During operation, the system executes a load script on the computer system, wherein the load script includes a specified sequence of operations. Next, the system receives EMI signals generated by the computer system while executing... Agent: Pvf -- Sun Microsystems Inc. C/o Park, Vaughan & Fleming LLP

20080252312 - Apparatus for testing system-in-package devices: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus of the illustrative embodiment comprises a test hive comprising: a plurality of test circuits corresponding... Agent: Donald J Lenkszus

20080252314 - Apparatus for testing system-in-package devices: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test... Agent: Donald J Lenkszus

20080252315 - Electrical component handler having self-cleaning lower contact: An electrical component handler that tests electrical circuit components and includes a self-cleaning lower contact offers reduced yield loss and mean time between assists. A preferred embodiment of the electrical component handler includes multiple sets of upper and lower contacts, each set of which is spatially aligned to electrically contact... Agent: Electro Scientific Industries/stoel Rives, LLP

20080252310 - Hybrid probe for testing semiconductor devices: A novel hybrid probe design is presented that comprises a torsion element and a bending element. These elements allow the probe to store the displacement energy as torsion or as bending. The novel hybrid probe comprises a probe base, a torsion element, a bending element, and a probe tip. The... Agent: Manuel F. De La Cerra

20080252316 - Membrane probing system: A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal conductor located between a pair... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080252313 - Method for testing system-in-package devices: A method for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The method and apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time.... Agent: Donald J Lenkszus

20080252311 - Verifying an assembly manufacturing process: Apparatus and method for performing a verification buy-off operation during an assembly manufacturing process, such as during printed circuit board (PCB) manufacturing. A processing device is configured to establish contact between a probe assembly and a first component of an assembly having a plurality of components loaded in predetermined positions... Agent: Fellers, Snider, Blankenship, Bailey & Tippens

20080252317 - Apparatus for testing system-in-package devices: Apparatus for testing System-In-Package (SIP) devices is described. The apparatus utilizes industry standard JEDEC trays and transports the trays into a tester.... Agent: Donald J Lenkszus

20080252320 - Apparatus for testing micro sd devices: Apparatus for testing micro SD devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at... Agent: Donald J Lenkszus

20080252321 - Apparatus for testing micro sd devices: Apparatus for testing micro SD devices each having a plurality of electrical leads is described. The and apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.... Agent: Donald J Lenkszus

20080252319 - Apparatus for testing system-in-package devices: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of the devices in such trays at the same time.... Agent: Donald J. Lenkszus

20080252323 - Method for testing micro sd devices: A method and apparatus for testing micro SD devices each having a plurality of electrical leads is described. The method and apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.... Agent: Donald J Lenkszus

20080252318 - Method for testing micro sd devices using each test circuits: A method for testing micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests at least a predetermined portion of the devices in such trays at the same time. The method of the illustrative embodiment include the steps of:... Agent: Donald J. Lenkszus

20080252322 - Method for testing system-in-package devices: A method for testing System-In-Package (SIP) devices such as micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.... Agent: Donald J Lenkszus

20080252324 - Active thermal control unit for maintaining the set point temperature of a dut: A thermal control unit (TCU) for maintaining the set point temperature of an IC device under test (DUT) has a thermoelectric module (a Peltier device), a fluid circulation block, a lower pedestal assembly containing a thermal sensor, and an upper cover housing arranged in a stacked relationship along the z-axis... Agent: Beeson Skinner Beverly, LLP

20080252326 - Probe: A conductive plunger 3 is received inside a cylindrical conductive barrel 2 so as to be capable of moving backward and forward, an urging coil spring 4 for pushing a rear end 3b of the plunger 3 is received inside the barrel 2, and a front end 3a of the... Agent: Donn K. Harms Patent & Trademark Law Center

20080252327 - Substrate test probing equipment having forcing part for test head and force-receiving pattern for probe card and methods of using the same: Substrate test probing equipment having a force-receiving pattern for a probe card and a forcing part for a test head, and methods of using the same, in which with the force-receiving pattern for the probe card and the forcing part for the test head, thermal expansion and contraction of the... Agent: F. Chau & Associates, LLC

20080252325 - Vertical probe array arranged to provide space transformation: Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an array having two or more rows parallel to the contact line. With this arrangement of... Agent: Lumen Patent Firm, Inc.

20080252328 - Probe for testing semiconductor devices: A novel probe design is presented that increases a probe tolerance to stress fractures. Specifically, what is disclosed are three features increase stress tolerance. These features include a various union angle interface edge shapes, pivot cutouts and buffers.... Agent: Manuel F. De La Cerra

20080252329 - On-chip frequency degradation compensation: Embodiments of the invention include a trio of reliability oscillators. In one embodiment, an on-chip frequency compensation circuit includes a selectively enabled reliability oscillator to generate a reference oscillating signal, a clocked reliability oscillator to generate an AC degraded oscillating signal, and a static reliability oscillator to generate a DC... Agent: Intel/bstz Blakely Sokoloff Taylor & Zafman LLP

20080252330 - Method and apparatus for singulated die testing: In accordance with one embodiment of the invention, a method of singulated die testing can be implemented. This can be implemented by obtaining a wafer and singulating the dies into individual die pieces. The singulated dies can be arranged in a separated testing arrangement and can even combine dies from... Agent: Townsend And Townsend And Crew, LLP

10/09/2008 > patent applications in patent subcategories. patent listing

20080246460 - Method and apparatus for measuring the output current of a switching regulator: One embodiment of the present invention provides an apparatus that measures the average-output-current produced by a switching regulator within an electronic device. The apparatus includes current-sensing-circuitry coupled to a switching field-effect-transistor (FET) within the switching regulator, wherein the current-sensing-circuitry is configured to bypass a small sense current from the conducting... Agent: Pvf -- Apple Inc. C/o Park, Vaughan & Fleming LLP

20080246461 - Methods and apparatus for testing delay locked loops and clock skew: According to the methods of the invention, a further delayed DLL signal is compared to the reference clock and a delayed reference clock signal is compared to a DLL signal. These two comparisons are performed on the 360° signal and on the 180° signal. The delay introduced by the methods... Agent: Gordon & Jacobson, P.C.

20080246462 - Device for measuring electrical current, voltage and temperature on an electrical conductor made of rigid material: A device for measuring electrical current, voltage and temperature in a conductor made of rigid material is disclosed. The conductor is formed from two conductor sections, between which an electrical resistor element is provided that is made of a material having greater resistance than the material of the conductor sections.... Agent: Buchanan, Ingersoll & Rooney PC

20080246463 - Measurement of current-voltage characteristic curves of solar cells and solar modules: A solar cell or solar module is measured during a short pulse of light in such a way that the resulting data for current and voltage at each light intensity is the same as would be measured under steady-state illumination conditions and therefore predictive of the actual performance of the... Agent: Beyer Weaver LLP

20080246464 - Pusher block: An electronic device testing apparatus for conducting a test by pressing input/output terminals of an IC to be tested against sockets (50), comprising a pusher (30) provided at least with a pusher base (34) provided to be able to approach and separate with respect to said sockets (50), a lead... Agent: Birch Stewart Kolasch & Birch

20080246465 - Magnetoresistive speed sensor: In order to create a magnetoresistive speed sensor (100) with a permanent magnet (10) and with a sensor (A, B) for a magnetic field for detecting the speed of an object rotating about an x-axis, wherein the magnetoresistive speed sensor (100) is equipped with a measuring direction (ME), in which... Agent: Nxp, B.v. Nxp Intellectual Property Department

20080246466 - Sensor device: The invention relates to a sensor device (1) for measuring a magnetic field in the region of a primary part (5) of a permanently excited electrical machine or a corresponding primary part. Said primary part (5) comprises teeth (9). The inventive sensor device (1) comprises a means (13) for conducting... Agent: Henry M Feiereisen, LLC Henry M Feiereisen

20080246467 - Device for counting the rotations of an object in a referential, and method for controlling one such device: A device for counting rotations of an object in a referential, in which a magnetic sensor linked to the object measures a field associated with the referential in order to generate measuring signals at the rotational frequency of the object. The sensor also functions as an antenna for receiving an... Agent: Brinks Hofer Gilson & Lione

20080246468 - Method and algorithms for inspection of longitudinal defects in an eddy current inspection system: A collection of data processing algorithms which, used in concert, are suitable for use in place of a high pass filter stage in an eddy current inspection system and provide for a system optimized to inspect test pieces for elongated defects running parallel to the scan axis. The algorithms use... Agent: Ostrolenk Faber Gerb & Soffen, LLP (olympus Ndt)

20080246469 - Portable electronic device: A portable electronic device includes a body, a flippable unit, a pivoting shaft, a first magnetizable element, a second magnetizable element, a magnetic induction sensor IC, and a magnet. The pivot shaft connects the body and the flippable unit. A display is disposed in the flippable unit for showing an... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20080246471 - Magnetic sensor device with different internal operating frequencies: The invention relates to a magnetic sensor device (10) comprising wires (11, 13) for the generation of a magnetic field with a first frequency f1 a GMR sensor (12) operated with an input current of a second frequency f2, and a demodulator (26) operated at a third frequency f3. In... Agent: Philips Intellectual Property & Standards

20080246470 - Magnetic sensor device with field compensation: The invention relates to a magnetic sensor device (10) comprising an excitation wire (11) for the generation of a first magnetic field (B1), a GMR sensor (12) for sensing stray fields (B′) generated by magnetized beads (2), and a compensation wire (13) for the generation of a second magnetic field... Agent: Philips Intellectual Property & Standards

20080246472 - System and method for inductively measuring the bio-impedance of a conductive tissue: The present invention relates to a system (100) and method of inductively measuring the bio-impedance of a conductive tissue (106). Furthermore the invention relates to a computer program (115) for operating such a system (100). In order to provide a fast, simple and reliable adjustment technique for an inductively bio-impedance... Agent: Philips Intellectual Property & Standards

20080246473 - Frequency doubler device: A frequency doubler circuit includes first and second arrangements of switches connected to the positive and negative inputs of a comparator, respectively, and arranged in such a way that first and third voltages during the first phase of a reference clock signal and second and fourth voltages during a second... Agent: Brinks Hofer Gilson & Lione

20080246474 - Mri apparatus and control method therefor: An MRI apparatus which performs MR imaging in an SSFP pulse sequence in which RF excitation is accomplished by a phase cycling method is caused; to collect data regarding all the frequency regions in a k-space in an SSFP pulse sequence in a first phase series out of a plurality... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20080246475 - Mri apparatus and mri method: An MRI apparatus includes an application unit that applies a readout gradient magnetic field in which magnetic field strength thereof varies with time and RF pulses to a subject placed in a static magnetic field in accordance with a predetermined pulse sequence; a receiving unit that receives an MR signal... Agent: Nixon & Vanderhye, PC

20080246476 - Self-fastening cage surrouding a magnetic resonance device and methods thereof: The present invention discloses a novel self-fastening cage of a magnetic resonance device (MRD) (100) for providing a homogeneous, stable and uniform magnetic field therein, characterized by an outside shell comprising at least three flexi-jointed superimposed walls (1). In a technology of self-fastening cage, the invention teaches an effective multi-streamed... Agent: Gottlieb Rackman & Reisman PC

20080246477 - Magnetic resonance imaging apparatus, rf coil system, and magnetic resonance imaging method: A magnetic resonance imaging apparatus has at least one RF coil and a data processing control unit. The RF coil that generates unique information, receives a nuclear magnetic resonance signal, and wirelessly transmits the received nuclear magnetic resonance signal and the unique information. The data processing control unit receives the... Agent: Nixon & Vanderhye, PC

20080246480 - Magnetic resonance imaging apparatus, shield coil, manufacturing method of shield coil, and driving method of magnetic resonance imaging apparatus: A passive type shield coil, disposed to a magnetic resonance imaging apparatus, for shielding of a magnetic flux of a gradient magnetic field at an inner circumference side generated by a gradient coil for generating the gradient magnetic field, and set at an outer circumference side of the gradient coil,... Agent: Nixon & Vanderhye, PC

20080246479 - Magnetic resonance local coil, patient bed, and imaging apparatus, with vibration damping: A local coil arrangement for magnetic resonance imaging has a number of supporting connection devices for placement of the local coil arrangement on a patient bed, with each supporting connection device embodying a vibration damping device.... Agent: Schiff Hardin, LLP Patent Department

20080246478 - Mri apparatus and an mri bed apparatus: The test body is placed on the top board. The support section has a support post, a hinge section and a receiving member. The hinge section is linked to the edge of the shorter direction of said top board at one edge of the support post and performs a hinge... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080246482 - Distinguishing false signals in cable locating: Discriminating between a cable locating signal and a false cable locating signal is described. A reference signal, which contains a locating signal frequency impressed on it, is transmitted in a way which provides for detection of a phase shift between the locating signal and the false locating signal. Based on... Agent: Pritzkau Patent Group, LLC

20080246481 - Locating arrangement and method using boring tool and cable locating signals: An arrangement and an associated method are described in which a boring tool is moved through the ground within a given region along a path in which region a cable is buried. The boring tool and the cable transmit a boring tool locating signal and a cable locating signal, respectively.... Agent: Pritzkau Patent Group, LLC

20080246483 - Tracking the positional relationship between a boring tool and one or more buried lines using a composite magnetic signal: A boring tool is moved through the ground in a region which includes at least one electrically conductive in-ground line and which is subject to static magnetic fields including the magnetic field of the earth. Tracking a positional relationship between the boring tool and the line, as well as a... Agent: Pritzkau Patent Group, LLC

20080246484 - Airborne electromagnetic (em) survey system: An airborne electromagnetic survey system for conducting geological mapping is disclosed. A transmitter closed loop structure is used in the system and is designed for connection to a towing airborne vehicle. The transmitter loop structure comprises a plurality of interconnected loop segments, and transmitting means are fitted to at least... Agent: Chalker Flores, LLP

20080246485 - Compact underwater electromagnetic measurement system: An underwater EM measurement system, which is substantially smaller, much simpler to use, and more robust than prior systems, is formed as a sensor package integrated into a single pressure vessel includes two magnetic sensors including induction coils disposed substantially horizontally so as to measure fields in orthogonal directions. The... Agent: Diederiks & Whitelaw, PLC

20080246486 - Mutual shielding of collocated induction coils in multi-component induction logging instruments: In a multicomponent logging tool, a coil is electrically isolated by open circuiting another, substantially orthogonal coil.... Agent: Madan, Mossman & Sriram, P.C.

20080246487 - Electric switching device: The patent describes an electric switchgear (10) with a pole of the switchgear filled with insulating gas, and it is provided with a monitoring device (14) for the insulating gas in the switchgear pole and with a test connection (28) for a testing device to test the monitoring device (14).... Agent: Pearne & Gordon LLP

20080246488 - Method and configuration for monitoring a vehicle battery: A method for monitoring a battery includes the steps of activating a power conservation mode of an electrical system of a motor vehicle, measuring a duration of activation of the power conservation mode of the electrical system, and measuring a quiescent voltage of a vehicle battery of the motor vehicle.... Agent: Manfred Beck, P.A.

20080246489 - Measuring device for impedance spectroscopy and associated measuring method: The invention relates to a measuring device and a measuring method for investigating particles which are suspended in a carrier liquid, including several measuring electrodes for carrying out electrical measuring of the particles. It is proposed that during electrical measuring, the particles be fixed in a field cage (4).... Agent: Caesar, Rivise, Bernstein, Cohen & Pokotilow, Ltd.

20080246490 - Methods and apparatus for an in-flight precipitation static sensor: A precipitation static sensor includes a bottom flexible dielectric layer (e.g., a layer of urethane tape) configured to be attached to a wing or other external surface of an aircraft, a flexible conductive layer (e.g., a layer of aluminum tape) formed over a portion of the first flexible dielectric layer,... Agent: Duke W. Yee

20080246491 - Scalable method for identifying cracks and fractures under wired or ball bonded bond pads: In a method and system for testing a presence of a crack (240) in a device under test (DUT) (190), a test system includes a bridge circuit (BC) (120) coupled to an electrical signal source (ESS) (110) capable of generating an electrical signal (102). The BC (120) includes four impedances... Agent: Texas Instruments Incorporated

20080246492 - Processing tantalum capacitors on assembled pwas to yield low failure rate: A method of conditioning tantalum capacitors on printed wire assemblies is disclosed. According to the method, each of the capacitors on an assembly is subjected to the same conditioning level during testing. To condition the tantalum capacitors, surge currents are induced in the capacitors in a controlled manner as a... Agent: Nixon & Vanderhye P.C.

20080246494 - Capacitive proximity switch and household appliance equipped therewith: A capacitive proximity switch has an electrically conductive sensor surface, which is covered by an electrically non-conductive covering plate and which serves as a part of a capacitor with a capacitance that varies with proximity. The proximity switch includes a reference sensor surface for generating a reference signal for determining... Agent: Lerner Greenberg Stemer LLP

20080246493 - Semiconductor processing system with integrated showerhead distance measuring device: A system for determining a distance between a showerhead of a semiconductor processing system and a substrate-supporting pedestal is provided. The system includes a showerhead having a showerhead surface from which reactive gas is expelled and a pedestal having a pedestal surface that faces the showerhead surface. A first capacitive... Agent: Christopher R. Christenson Westman, Champlin & Kelly, P.A.

20080246495 - Detection apparatus for a capacitive proximity sensor: A switched capacitance detection circuit is responsive to changes in the fringing capacitance of a capacitive proximity sensor having at least one capacitive sensor element. In cases where the sensor has a single sensor element, the switching frequency of the detection circuit is controlled to maintain measurement accuracy in the... Agent: Delphi Technologies, Inc.

20080246496 - Two-dimensional position sensor: A two-dimensional position sensor is formed by drive electrodes (52) and sense electrodes (62, 64, 66) both extending in the x-direction and interleaved in the y-direction. The sense electrodes comprise several groups, two of which co-extend in the x-direction over each different portions of extent in the x-direction. The drive... Agent: David Kiewit

20080246497 - Semiconductor wafer inspection apparatus: Efficiency of a charging processing of an insulator sample is improved. And, an electron optical system is adjusted according to a contact resistance value of the insulator sample. Breakdown of a sample is performed before the charging processing, and then, the charging processing is performed. A control parameter of the... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080246498 - Test structure and probe for differential signals: A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080246499 - System and method for the electrical contacting of semiconductor devices: A device and a method for the electrical contacting of semiconductor devices. One embodiment provides for testing semiconductor devices by using a contacting device for the electrical contacting of a number of semiconductor devices to be tested and for the electrical connection with a test system. The contacting device includes... Agent: Dicke, Billig & Czaja

20080246500 - High density interconnect system having rapid fabrication cycle: An improved interconnection system and method is described, such as for connectors, socket assemblies and/or probe card systems. An exemplary system comprises a probe card interface assembly (PCIA) for establishing electrical connections to a semiconductor wafer mounted in a prober. The PCIA comprises a motherboard parallel to the semiconductor wafer... Agent: Glenn Patent Group

20080246501 - Probe card with stacked substrate: A probe card is provided including a first substrate, a second substrate, and a plurality of conductive wires extending between the first substrate and the second substrate. The conductive wires are fixed (a) at a first end to a contact of the first substrate, and (b) at a second end... Agent: Hickman Palermo Truong & Becker, LLP

20080246503 - Method of testing a semiconductor integrated circuit: A method of testing a semiconductor integrated circuit is disclosed. Specifically, a method of testing a semiconductor integrated circuit comprising a plurality of flip-flops is provided. The disclosed method includes connecting the plurality of flip-flops in series so that the plurality of flip-flops forms a scan-chain; inputting data to the... Agent: Oliff & Berridge, PLC

20080246502 - Semiconductor device for testing semiconductor process and method thereof: A semiconductor device for testing a semiconductor process applied to manufacturing the semiconductor device is disclosed. The semiconductor device includes at least a testing group. The testing group includes a first testing block and a second testing. The first testing block includes: a first input node; a first output node;... Agent: North America Intellectual Property Corporation

20080246504 - Apparatus and method to manage external voltage for semiconductor memory testing with serial interface: A serial-interface flash memory device includes a data/address I/O pin and a clock input pin. A bidirectional buffer is coupled to the data/address I/O pin. A serial interface logic block including data direction control is coupled to the clock pin, the bidirectional buffer, to internal control logic, and to read-voltage... Agent: Schwegman, Lundberg & Woessner / Atmel

20080246505 - Semiconductor device test system and method: A semiconductor device test method and system. One embodiment provides a method for testing semiconductor devices forming a group of semiconductor devices to be tested. For addressing or selection of one of the semiconductor devices of the group, at least two different signals are supplied to the respective semiconductor device... Agent: Dicke, Billig & Czaja

20080246506 - Apparatus and method for measuring effective channel: An apparatus and a method for measuring an effective channel. The apparatus includes an automatic measurement system including a testing terminal for a substrate, a switching matrix disposed at one side of the automatic measurement system, a leakage current measuring device and a capacitance measuring device electrically connected to the... Agent: Sherr & Vaughn, PLLC

20080246507 - Body capacitance electric field powered device for high voltage lines: Devices that couple to high voltage transmission lines obtain power themselves using the body capacitance of an element of the devices. The devices generate a comparatively lower voltage from the current flowing between the high voltage line and the element of the device that generates the body capacitance. The devices... Agent: Workman Nydegger / Power Measurement

20080246508 - Method to determine an operating characteristic of a vehicle power converter: Measured or otherwise known operating characteristics of a DC/DC power converter are used to determine, without measuring, an operating characteristic of the DC/DC power converter.... Agent: Brooks Kushman P.C./fgtl

10/02/2008 > patent applications in patent subcategories. patent listing

20080238403 - Stud sensor: A sensing device having a sensing surface for placing against a wall for detecting objects behind a wall lining has first and second sensors, each sensor including at least first and second capacitor plates and associated resistors forming RC circuits having time constants dependent on the adjacent wall material. Detection... Agent: Leydig Voit & Mayer, Ltd

20080238404 - Method and apparatus for monitoring a load: Applicants have created an improved method and apparatus for remotely monitoring an electrical load and assessing key attributes of power-related anomalies and line disturbances caused or created by the electrical load and qualifying their conformity to certain expected steady state conditions. The apparatus includes an intelligent power distribution module that... Agent: Locke Lord Bissell & Liddell LLP Attn:IPDocketing

20080238405 - Rf measurement system incorporating a ream assembly and method of using the same: A radio-frequency (RF) measurement system for measuring a reflection coefficient an RF device under test (DUT) incorporates a reflection mode electro-absorption modulator (REAM) assembly coupled to the RF DUT. Also included in the measurement system, is a first optical fiber coupled to the REAM assembly, the first optical fiber configured... Agent: Agilent Technologies Inc.

20080238406 - Intelligent electronic device having improved analog output resolution: A method and apparatus provides improved resolution in an analog signal, relative to the resolution of a digital-to-analog converter producing the signal. In one embodiment, a digital electrical power and energy meter varies a digital input to a digital-to-analog converter such that an average of the output of the digital-to-analog... Agent: Electro Industries/ Gaugetech C/o Casella & Hespos, LLP

20080238408 - Micro probe assembly: Embodiments of the present invention improve probes and probe assemblies. In one embodiment, the present invention includes a probe test head comprising a plurality of novel probes inserted in an array of holes in upper and lower dies of the assembly. The novel assembly includes a novel alignment layer for... Agent: Chad R. Walsh Fountainhead Law Group

20080238407 - Package level voltage sensing of a power gated die: A system and method for voltage sensing at active power gated cores of a multi core CPU wherein a Controlled Collapse Chip Carrier bump in a gating region for an associated core is isolatable from an ungated power region by a power gate to allow voltage sensing at a designated... Agent: Grossman, Tucker, Perreault & Pfleger, PLLC C/o Intellevate, LLC

20080238409 - Probe with a changing device: The invention concerns a probe with at least two test prods, which are provided on a changing device connected to the probe and which can be alternately connected to an electric waveguide running inside the probe.... Agent: Marshall, Gerstein & Borun LLP

20080238410 - Auto-calibration of magnetic sensor: The present invention provides a method to compensate for the sensitivity drift of a magnetic field sensor for sensing a magnetic field. The magnetic field sensor comprises at least four electrodes. The method comprises a first step where a first set of two electrodes is used to bias the sensor... Agent: Workman Nydegger

20080238411 - Magneto-resistive nano-particle sensor: A magnetic sensor device is suggested. The magnetic sensor device comprises at least one magnetic field generator, a magnetic sensor element (8), means (17) for supplying a frequency modulated sense current to the magnetic sensor element (8). A rejection means (18) is arranged in the signal path between the magnetic... Agent: Philips Intellectual Property & Standards

20080238413 - Electromagnetic tracking method and system: Provided is an electromagnetic tracking system, comprising a coil arrangement comprising a first coil configured to generate a first magnetic field and a second coil configured to generate a second magnetic field and a drive unit configured to provide a first drive current to the first coil and to provide... Agent: Ge Healthcare C/o Fletcher Yoder, PC

20080238412 - Position sensor system: A position sensor system for detecting an absolute angular position of a rotor axle of an electric motor at a predetermined angular resolution W. The position sensor system include, a first Hall sensor device having a first sensor magnet set-up, set up on the rotor axle, and two first Hall... Agent: Kenyon & Kenyon LLP

20080238414 - Motor function measuring sensor, motor function measuring apparatus, and motor function analyzing apparatus: A motion sensor for measuring motion information of a subject comprises a coil substrate having transmitting or receiving coils piled one on top of another and a holder in which the coil substrate is mounted. Formed on the holder are curved surfaces to which an adhesive sheet is stuck and... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080238415 - Measuring system for contactless detection of a rotary angle, with a magnetic-field-sensitive element disposed in a recess of the magnet: The invention relates to a measuring system for contactless detection of a rotational angle, having a first body on which at least one magnet is disposed and having at least one magnetic-field-sensitive element, supported by a second body, for generating a measurement signal, the first body and the second body... Agent: Ronald E. Greigg Greigg & Greigg P.l.l.c.

20080238416 - Rotation angle detector: A rotation angle detector includes a rotator, first and second detecting bodies, an auxiliary detecting body, first and second detectors, an auxiliary detector, and a controller. The first detecting body rotates in association with the rotator, and the first detector detects rotation of the first detecting body. The second detecting... Agent: Wenderoth, Lind & Ponack L.L.P.

20080238417 - Magnetic substance detection sensor and magnetic substance detecting apparatus: The present invention aims at providing a magnetic substance detection sensor: which permits a high sensitivity magnetic field detection element to be effectively operative even in the vicinity of a magnet; which permits quantitative detection without depending upon the magnetic characteristic of a medium, e.g., soft magnetic material, etc.; which... Agent: Fitzpatrick Cella Harper & Scinto

20080238418 - Method for handling a cast iron component based on estimating hardness by magnetic barkhausen noise: A method for handling a cast iron component adapted for use in a vehicle or engine, the method comprising measuring at least one magnetic Barkhausen noise parameter on at least one surface of the cast iron component, estimating the hardness of the material in the cast iron component based on... Agent: Ostrolenk Faber Gerb & Soffen

20080238419 - Magnetic field measuring apparatus capable of measuring at high spatial resolution: A condenser lens is incorporated into the end portion of a magnetic field measuring apparatus including a magneto-optical crystal. Alternatively, the end portion of the magnetic field measuring device includes an optical fiber having a core diameter smaller than that of a normal single-mode optical fiber.... Agent: Sughrue Mion, PLLC

20080238420 - Magnetic sensor: The magnetic sensor comprises a spin-valve GMR including a free layer having an elongated form as seen in a laminating direction and a permanent magnet layer having an elongated form as seen in the laminating direction. The permanent magnet layer is arranged in parallel with the free layer.... Agent: Oliff & Berridge, PLC

20080238421 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: A magnetic resonance imaging apparatus includes an imaging condition setting unit and an image data acquisition unit. The imaging condition setting unit sets an imaging condition with applying first and second suppression pulses of which at least ones of types, center frequencies and frequency bands are different from each other.... Agent: Nixon & Vanderhye, PC

20080238422 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: A magnetic resonance imaging apparatus includes a data acquisition unit and an image data generating unit. The data acquisition unit acquires data according to a sequence derived by adding a coherent control pulse on a Steady-State Free Precession pulse sequence for repeating plural radio frequency excitations with a constant interval.... Agent: Nixon & Vanderhye, PC

20080238423 - Method and apparatus for accelerating magnetic resonance temperature imaging: In a method and apparatus for accelerating MR temperature imaging used in MR-monitored high intensity focused ultrasound (HIFU) therapy, temperature changes are determined at the focus of the ultrasound during MR temperature imaging; determining the ideal acceleration rate needed for data sampling according to the temperature changes at said focus... Agent: Schiff Hardin, LLP Patent Department

20080238424 - Compact and flexible radio frequency coil arrays: A radio frequency coils array includes a plurality of conductive RF loops (62a, 62b, 62c, 62d, 162a, 162b, 262a, 262b, 362a, 362b, 362c, 462a, 462b, 462c, 562a, 562b) configured to excite or receive magnetic resonance signals, and a plurality of electronics modules (64a, 64b, 64c, 64d, 164a, 164b, 264a, 264b,... Agent: Philips Intellectual Property & Standards

20080238426 - Method and apparatus for reducing aliasing artifacts in the imaging for mr-monitored hifu therapy: In a method and magnetic resonance (MR apparatus for reducing aliasing artifacts in the imaging for MR-monitored high intensity focused ultrasound HIFU therapy, a primary coil is used to receive the MR signals, and an additional coil is provided to receive interfering MR signals that form aliasing artifacts in the... Agent: Schiff Hardin, LLP Patent Department

20080238425 - System and method for designing improved rf pulse profiles: A system and method are provided for designing RF pulses which have improved magnetization profiles. By utilizing an optimal control approach as an alternative to, or in combination with, non-iterative approximations, RF pulses generated by the system and method described herein will exhibit less deviation from that of “ideal” Bloch... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20080238427 - Lightweight, low cost structure for formation conductivity measuring instrument: A well logging instruments includes an electrically conductive sonde mandrel. At least one electrical sensor is affixed to an exterior of the mandrel. The sensor is configured to be attached to the mandrel by sliding along an exterior surface thereof. A pressure-sealing electrical feedthrough bulkhead makes electrical connection from the... Agent: Schlumberger Oilfield Services

20080238428 - Methods of electromagnetic logging using a current focusing receiver: A method for determining a formation electrical property under a sea floor includes obtaining measurement data using a receiver having an impedance lower than an impedance of seawater at a measurement site; correcting the measurement data to obtain corrected data corresponding to data that would have been acquired using a... Agent: Westerngeco L.L.C. Jeffrey E. Griffin

20080238429 - Receivers and methods for electromagnetic measurements: A receiver for electromagnetic measurements includes a polyhedron structure having m faces, where m≧4 and m≠6: n electrodes each disposed on one face of the polyhedron structure, wherein 3≦n≦m; and at least one circuitry connected to the n electrodes for signal measurement. A method for electromagnetic measurements includes obtaining a... Agent: Westerngeco L.L.C. Jeffrey E. Griffin

20080238430 - Method of testing an electrochemical device: Methods and associated apparatus for testing an electrochemical device, such as a fuel cell. A first method involves charging the fuel cell during a charge period; discharging the fuel cell during a discharge period; and monitoring the response of the fuel cell during at least part of the discharge period... Agent: Myers Bigel Sibley & Sajovec

20080238431 - Apparatus for detecting an electrical variable of a rechargeable battery, and method for producing said apparatus: An apparatus for detecting an electrical variable of a rechargeable battery and a method for producing said apparatus, has: a measuring element (1), a printed circuit board (4) and a contact element (5) having a first end (6) and a second end (7), wherein the first end (6) of the... Agent: Baker Botts L.L.P. Patent Department

20080238432 - Methods and apparatus for battery monitoring: A battery monitoring system is provided to monitor a battery stack having multiple cells connected in series. The monitoring system includes monitor modules to monitor respective subsets of the cells of the battery stack, each monitor module, in response to one or more control signals, measuring cell voltages of the... Agent: Wolf Greenfield & Sacks, P.C.

20080238433 - Sensor product for electric field sensing: A sensor product for electric field sensing. The sensor includes a substrate, at least one electrically conductive area on the surface of the substrate, an output, and at least one conductor between the at least one electrically conductive area and the output. Also a sensor product web.... Agent: Venable LLP

20080238434 - Surface voltmeter: In a surface voltmeter (1), a surface voltage on a measurement area on a semiconductor substrate (9) on which an insulating film is formed is measured while applying light to the measurement area. With this operation, a voltage induced on a main body of the substrate (9) by charge which... Agent: Mcdermott Will & Emery LLP

20080238435 - Integrated circuit testing with laser stimulation and emission analysis: A diagnostic tool for testing an integrated circuit device directs a beam of laser energy to stimulate at least a portion of the device. In one mode, electromagnetic waves from said device may be detected at the same time in response to the stimulation. A processor collects image data and... Agent: Konrad Raynes & Victor, LLP. Attn: Int77

20080238436 - Method and system to identify grounding concerns in an electric power system: A method and system to detect and evaluate improper grounding/grounded bonds in an electrical power system is disclosed. An example method is detecting improper grounding in an electrical power system having a plurality of monitoring devices coupled to a grounded conductor and a grounding conductor. Data of the voltage between... Agent: Schneider Electric / Square D Company Legal Dept. - I.p. Group (np)

20080238437 - Test circuit arrangement: A test circuit arrangement for testing latch units is provided which includes a) a voltage generator configured to adjust a voltage potential difference between a first ground line and a second ground line of the latch units and/or to adjust a voltage potential difference between a first supply voltage line... Agent: Dickstein Shapiro LLP

20080238438 - Wireless portable automated harness scanner system and method therefor: The present document describes a system for offline testing of an installed wiring harness, comprising: at least a first and a second testing module, having: a communication module for receiving test specifications and for sending test measurements; testing equipment for generating the test measurements from the test specifications; each of... Agent: Benoit & Co.

20080238439 - Methods of testing fuse elements for memory devices: A method of testing a fuse element for a memory device is provided. A first test probe is electrically connected to a program terminal of the memory device. A second test probe is electrically connected to a ground terminal. The fuse element is on an electrical circuit path between the... Agent: Slater & Matsil, L.L.P.

20080238440 - Measuring system: A measuring system measuring an impedance of an object to be measured, including an impedance measuring instrument; a casing formed of a grounded conductor and capable of locating the object to be measured therein; and a radially-shaped electrode connected to the impedance measuring instrument and capable of being connected to... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080238441 - Vector network analyzer-noise figure measurement: A noise receiver is included in a network analyzer block diagram such that noise power and S-parameters measurements can be made almost simultaneously without mechanical switching in the test set. Additionally, a variable mismatch device tuner that is used by the network analyzer for S-parameter calibrations, is further used during... Agent: Agilent Technologies Inc.

20080238442 - Differential signaling system and flat panel display with the same: A differential signaling system, wherein a first wiring and a second wiring are coupled between a sending end and a receiving end as a differential signal line. A termination resistor is coupled between the first wiring and the second wiring in the receiving end side. A test circuit is coupled... Agent: Stein, Mcewen & Bui, LLP

20080238443 - Differential signaling system and flat panel display with the same: A differential signaling system, wherein a first wiring and a second wiring are coupled between a sending end and a receiving end as a differential signal line. A termination resistor is coupled between the first wiring and the second wiring in the receiving end side. A test circuit is coupled... Agent: Stein, Mcewen & Bui, LLP

20080238444 - Capacitive proximity switch and domestic appliance equipped therewith: A capacitive proximity switch has an electrically conductive sensor surface, which is covered by an electrically non-conductive covering plate and which serves as a part of a capacitor having a capacitance that varies with proximity. The sensor surface is connected to a control input of a semiconductor switch that has... Agent: Lerner Greenberg Stemer LLP

20080238446 - High temperature microelectromechanical (mem) devices: A microelectromechanical (MEM) device per the present invention comprises a semiconductor wafer—typically an SOI wafer, a substrate, and a high temperature bond which bonds the wafer to the substrate to form a composite structure. Portions of the composite structure are patterned and etched to define stationary and movable MEM elements,... Agent: Koppel, Patrick & Heybl

20080238445 - Measuring device for measuring the state of oils or fats: A measuring device is used to measure the state of oils or fats. Said measuring device comprises a housing, a hollow connecting element which is secured therein and a carrier which is applied to the opposite end of the connecting element, said carrier being used to receive a sensor which... Agent: Muirhead And Saturnelli, LLC

20080238447 - Isolated capacitive signature detection for powered devices: In one embodiment, a method for determining capacitive signature validity of a powered device (PD) attached to power sourcing equipment (PSE) having (i) an isolated side with a primary coil and (ii) a line side with a secondary coil connected to the PD. The method includes determining, on the isolated... Agent: Mendelsohn & Associates, P.C.

20080238448 - Capacitance sensing for percussion instruments and methods therefor: A percussion instrument data generating system can include a plurality of capacitance sensors coupled to the at least a first surface. A controller section can includes a plurality of switches for selectively connecting each capacitance sensor to a sense node. A capacitance sense circuit can be coupled to the common... Agent: Haverstock & Owens- Cypress

20080238449 - Fluid sensor and impedance sensor: A fluid sensor detects property of fluid by dipping the sensor in the fluid. The sensor includes: a semiconductor substrate; and a comb-teeth electrode made of a first diffusion layer and disposed on a first surface of the substrate. Although the comb-teeth electrode is capable of directly contacting the fluid... Agent: Posz Law Group, PLC

20080238450 - Method for inspecting quality of core material for electrophotographic ferrite carrier: An object of the present invention is to provide a quality inspection method for obtaining a specifying factor which can more reliably indicate powder characteristics of a core material for an electrophotographic ferrite carrier. To achieve the object, a method for inspecting the quality of a core material for an... Agent: Greenblum & Bernstein, P.L.C

20080238451 - Automatic multiplexing system for automated wafer testing: A parametric test system is for testing devices in dice in a semiconductor wafer, each die having a plurality of pads for electrically connecting to the device in the die. A tester of the system has a plurality of input/output lines for providing and receiving electrical signals during a device... Agent: Beyer Law Group LLP

20080238453 - High accuracy and universal on-chip switch matrix testline: A testline structure made for integrated circuit tests is presented. The structure includes an array of testline pads formed in the scribe line area or integrated circuit die area on a semiconductor substrate, a plurality of test devices formed under the pads area, and a select circuit selectively connecting one... Agent: Slater & Matsil, L.L.P.

20080238458 - Method of designing a probe card apparatus with desired compliance characteristics: A probe card apparatus is configured to have a desired overall amount of compliance. The compliance of the probes of the probe card apparatus is determined, and an additional, predetermined amount of compliance is designed into the probe card apparatus so that the sum of the additional compliance and the... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080238457 - Nanoscale fault isolation and measurement system: Disclosed is a fault isolation and measurement system that provides multiple near-field scanning isolation techniques on a common platform. The system incorporates the use of a specialized holder to supply electrical bias to internal circuit structures located within an area of a device or material. The system further uses a... Agent: Frederick W. Gibb, Iii Gibb & Rahman, LLC

20080238455 - Probing method, probe apparatus and storage medium: A probing method measures electrical characteristics of an object to be inspected by bringing a probe needle to make a contact with an electrode pad of the object, the probe needle formed to be vertically pointing the object. The method includes the steps of: mounting the object on a mounting... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080238456 - Semiconductor inspection apparatus: A semiconductor inspection apparatus includes a force probe applying voltage to a semiconductor device, and a sense probe detecting voltage of the semiconductor device, in which the force probe is contacted with an electrode pad of the semiconductor device and the force probe and the sense probe are contacted with... Agent: Young & Thompson

20080238454 - Tester and structure of probe thereof: A split-type probe is used to contact with an object under test to detect an electrical characteristic thereof. The probe provided by the present invention has a contact head used to contact with the object under test, and a first needle body and a second needle body. The first needle... Agent: Jianq Chyun Intellectual Property Office

20080238452 - Vertical micro probes: Embodiments of the present invention improve probes and probe assemblies. In one embodiment the present invention includes a micro probe comprising a lower contact end including a lower tip, an upper contact end, and a curved intermediate region between the upper contact end and lower contact end. An angle stop... Agent: Chad R. Walsh Fountainhead Law Group

20080238459 - Testing apparatus and method: A testing apparatus includes a circuit board and a first probe. The circuit board has a first testing point and a second testing point. The first testing point is electrically connected to an integrated circuit, and the second testing point is electrically connected to the first testing point. The first... Agent: Rabin & Berdo, PC

20080238460 - Accurate alignment of semiconductor devices and sockets: Methods and apparatus to provide accurate alignment for semiconductor sockets are described. In one embodiment, a carrier is utilized to align a device under test with a test socket. In some embodiments, alignment features on a carrier, a device under test, and/or a test socket are used to align the... Agent: Caven & Aghevli C/o Intellevate, LLC

20080238461 - Multi-type test interface system and method: Efficient automated testing systems and methods are presented. In one embodiment, an automated testing system includes a plurality of bucket modules, and a device under test transition interface. The plurality of bucket modules have similar external connection form factors for a variety of instruments. The interface is for transitioning connections... Agent: Murabito Hao & Barnes LLP

20080238463 - Probe apparatus, probing method and storage medium: A probe apparatus for sequentially testing electrical characteristics of chips includes an imaging unit for capturing images of the electrode pads of the inspection substrate, and a unit for calculating contact positions at which the probes are expected to contact with the electrode pads. The probe apparatus further includes a... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080238464 - System and method of mitigating effects of component deflection in a probe card analyzer: A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed electrical planarity measurements with fast optical planarity measurements to produce “effectively loaded” planarity measurements.... Agent: Pillsbury Winthrop Shaw Pittman LLP

20080238462 - Test device for semiconductor devices: A test device for semiconductor devices is disclosed. One embodiment provides a probe card, having at least one contact test body for contacting a semiconductor device. The probe card includes self-alignment devices and/or a penetration restriction device, or parts thereof. A semiconductor device is provided having at least one contact... Agent: Dicke, Billig & Czaja

20080238465 - Burn-in system with heating blocks accomodated in cooling blocks: A burn-in system enabling the temperatures of a large number of electronic devices differing in amount of self generated heat to be simultaneously reliably adjusted to a predetermined temperature, that is, a burn-in system bringing heater blocks having heaters, cooling blocks formed with channels able to carry a coolant, and... Agent: Birch Stewart Kolasch & Birch

20080238466 - Temperature sensing and prediction in ic sockets: An apparatus is provided which preferably combines temperature sensing and prediction for more accurate temperature control of integrated circuits. An IC temperature sensing and prediction device includes a current sensing device that measures current passing through an IC, and a temperature control apparatus that measures a surface temperature of the... Agent: Marger Johnson & Mccollom, P.C.

20080238467 - Reinforced contact elements: Embodiments of reinforced resilient elements and methods for fabricating same are provided herein. In one embodiment, a reinforced resilient element includes a resilient element configured to electrically probe an unpackaged semiconductor device to be tested, the resilient element having a first end and an opposing second end; and a reinforcement... Agent: MoserIPLaw Group / Formfactor, Inc.

20080238468 - Integrated circuit chip and method for testing an integrated circuit chip: In a method or apparatus such as an integrated circuit (IC) chip including a plurality of circuits for executing a plurality of testmodes, a testmode entry code specifying one of the plurality of testmodes and one of an unrestricted private testmode category and a restricted public testmode category is received.... Agent: Posz Law Group, PLC

20080238469 - Semiconductor device and semiconductor device module: To provide a semiconductor module and a semiconductor device enabling more accurate testing of the connection state of the internal wiring between the semiconductor devices. The semiconductor device has switches SW11 through SW13 that connect a test terminal TT to one end side of wires to be tested, and transistors... Agent: Arent Fox LLP

20080238471 - Electrical inspection method and method of fabricating semiconductor display devices: Power source lines which are used as passages for supplying the power source voltage are used as passages for reading the electric charge. Namely, the power source lines that can be connected to the signal lines are used as passages for inputting an inspection signal to the holding capacitors in... Agent: Nixon Peabody, LLP

20080238470 - Operating method of test handler: Operation methods of test handler are disclosed. The pick-and-place apparatus picks up semiconductor devices from first loading compartments arrayed in a matrix on a first loading element, moves, and places onto second loading compartments arrayed in a matrix on a second loading element. Pickers of the pick-and-place apparatus pick up... Agent: JeffersonIPLaw, LLP

Previous industry: Electricity: power supply or regulation systems
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