Electricity: measuring and testing inventions 07/08

20080180084 - Digital media drive failure prediction system and method: A digital media drive failure prediction system comprises a prediction module configured to analyze a current draw associated with a digital media drive measured at least two different operating times of the digital media drive to automatically determine whether a different between the measured current draws indicates an impending failure... Agent: Hewlett Packard Company

20080180085 - Magnetic device and frequency analyzer: A magnetic device and a frequency analyzer are provided as those industrially utilizing a resonance phenomenon of a direction of magnetization of a magnetoresistive element. Since polarities of an alternating current i vary with time, the direction of magnetization oscillates as affected by the magnitude and frequency of the alternating... Agent: Oliff & Berridge, PLC

20080180086 - Built-in system and method for testing integrated circuit timing parameters: A built-in self-test system for a dynamic random access memory device using a data output register of the memory device to apply test signals to data bus terminals and a data strobe terminal of the memory device responsive to respective clock signals. The clock signal are generated by a test... Agent: Edward W. Bulchis, Esq. Dorsey & Whitney LLP

20080180087 - Detection of an ac input phase-loss on a multi-phase ac servo drive: Systems and methods that detect a phase loss condition in a three-phase electrical power source are presented. The system includes a detection component that measures and/or monitors a magnitude and frequency of a voltage of a power source, and a controller component that compares measured and/or monitored voltage characteristics to... Agent: Rockwell Automation, Inc./(at)

20080180088 - Electronic tamper detection circuit for an electricity meter: An electronic meter tamper detection system and method for sensing the removal of an electricity meter from a meter socket and generating a tamper signal when such removal is detected. The tamper detection circuit includes a control unit having an energy storage device that is charged during normal operation of... Agent: Andrus, Sceales, Starke & Sawall, LLP

20080180089 - Magnetic speed, direction, and/or movement extent sensor: A first magnetic sensor produces a first output signal in response to movement of a target such as a multi-pole ring magnet, and a second magnetic sensor produces a second output signal in response to movement of the target. The first and second magnetic sensors may be corresponding magnetoresistor sensors,... Agent: Honeywell International Inc.

20080180090 - Magnetic speed, direction, and/or movement extent sensor: A first magnetic sensor is formed on a semiconductor substrate, and the first magnetic sensor produces a first output signal in response to movement of a multi-pole magnet. A second magnetic sensor is formed on the semiconductor substrate so as to be intertwined with the first magnetic sensor and so... Agent: Honeywell International Inc.

20080180091 - Electromagnetic impedance sensor and passenger protection system: An electromagnetic impedance sensor detects an object made of conducting material or soft magnetic material with contact-free. The sensor includes: a detection coil; and a detection circuit for supplying electricity to the coil and for measuring electromagnetic impedance change in the coil. The detection coil includes multiple coil portions provided... Agent: Harness, Dickey & Pierce, P.L.C

20080180092 - Position indicator: A position indicator for use with a digitizer is provided. The position indicator generates a response to an alternating field received from the digitizer. The position indicator includes a core formed of a composition including a soft magnetic metal powder mixed with a resin binder, and at least one coil... Agent: Berenato, White & Stavish, LLC

20080180093 - Measuring element with a track for determining a position and corresponding measuring method: A measuring element and a measuring method for determining a position are disclosed which use a track with a material measure that is scanned by at least two sensors. The material measure is embodied in such a way that the sensors generate a modulated sinusoidal trace signal as an output... Agent: Henry M Feiereisen, LLC Henry M Feiereisen

20080180094 - Slide operation device: A slide operation device is comprised of a movement guide of a rod-shape, and a moving block that slides on the movement guide for setting an electric parameter as a measurement value in accordance with a movement amount or position of the moving block in a slide direction along the... Agent: Morrison & Foerster, LLP

20080180095 - Method and related device for estimating the currents flowing in windings of a poly-phase electrical load at a certain instant: There is a method of estimating values of winding currents, at an instant of a period, in a winding of a load, controlled in space vector modulation mode through symmetrical control phases. The winding is cyclically coupled between two supply lines through respective switches. A measuring device is alternately coupled... Agent: Allen, Dyer, Doppelt, Milbrath & Gilchrist P.A.

20080180096 - Apparatus for measuring an electric current flowing through an electrical conductor: An apparatus for measuring an electric current flowing through an electrical conductor (1), comprising a measuring device which detects a magnetic field formed by the electrical conductor in three orthogonal spatial directions and supplies measurement signals associated with the respective spatial directions.... Agent: Crowell & Moring LLP Intellectual Property Group

20080180097 - Mri apparatus: An MRI apparatus includes: an image display device for displaying diffusion emphatic images of respective axes corresponding to one slice; a designation operating device for allowing an operator to designate each diffusion emphatic image targeted for rephotograph from the displayed diffusion emphatic images of axes; a diffusion emphasis imaging device... Agent: Patrick W. Rasche (20459) Armstrong Teasdale LLP

20080180098 - Magnetic resonance imaging apparatus, magnetic resonance imaging method and program therefor: A magnetic resonance imaging method includes the steps of performing a scan for collecting magnetic resonance signals from a subject in an imaging space where a magnetostatic field is formed, so as to match the PROPELLER method, wherein in executing the scan by the PROPELLER method, a reversed pulse is... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20080180099 - Three-dimensional slice-selective multi-slice excitation method in mrt imaging: In a method and apparatus for MRT imaging, data sets acquired from magnetic resonance signals of at least two limited spatial regions of a subject to be examined, (the spatial regions being displaced relative to one another along one spatial direction and overlapping in the respective edge region. Phase coding... Agent: Schiff Hardin, LLP Patent Department

20080180102 - Arrangement for radiation of a radio-frequency field: An arrangement for radiation of a radio-frequency field into an examination subject has a local coil unit with a housing. An insulating dielectric material is embodied at least at one part of the housing in order to passively compensate an inhomogeneity of the B1 field that occurs in the examination... Agent: Schiff Hardin, LLP Patent Department

20080180104 - Magnetic resonance imaging apparatus and method of setting slice area: An observation-point arranging unit arranges an observation point indicating a portion to be included in a slice area on a positioning image displayed on a display device. A scanning-condition receiving unit receives a specification of a scanning condition including number of movements of a couch on which an object is... Agent: Nixon & Vanderhye, PC

20080180103 - Mobile positioning device for mri inductively coupled coil: A mobile positioning device for an MRI inductively coupled coil, has at least one pair of coupled coils which are coupled with each other for transmitting signals, wherein one of the at least one pair of coupled coils is deployed on a surface of a patient's bed. A moveable platform... Agent: Schiff Hardin, LLP Patent Department

20080180101 - Multi-channel magnetic resonance coil: This document discusses, among other things, a system and method for a coil having a plurality of resonant elements capable of radiofrequency transmission, reception, or both transmission and reception. One example includes a receive-only coil disposed within a transmit-only coil. Adjacent resonant elements are decoupled from one another by both... Agent: Intellectual Property Group Fredrikson & Byron, P.A.

20080180100 - Superconducting magnet with refrigerator and magnetic resonance imaging apparatus using the same: A superconducting magnet includes: a superconducting coil for generating a static magnetic field; a refrigerant container for containing the superconducting coil and a refrigerant; a vacuum container for holding the refrigerant container in a vacuum state; a radiation shield between the refrigerant container and the vacuum container; a refrigerator for... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080180105 - Current lead of superconducting magnet of magnetic resonance system: A current lead for the superconducting magnet of a magnetic resonance system, the superconducting magnet being refrigerated by a cold head, has a positive current lead and a negative current lead electrically connected to the superconducting magnet for magnetization thereof. The cold head is electrically connected to the superconducting magnet... Agent: Schiff Hardin, LLP Patent Department

20080180106 - Battery montoring apparatus and daisy chain interface suitable for use in a battery monitoring apparatus: A battery monitor for monitoring the performance of at least one battery within an array of batteries, comprising: a data acquisition device for measuring at least one parameter of the at least one battery associated with the battery monitor, a first data interface operable to exchange data with a first... Agent: Wolf Greenfield & Sacks, P.C.

20080180107 - Cable tester for stage lighting environment: A cable testing assembly includes a plurality of different connectors thereon. The different connectors can be automatically used to automatically test a wire by coupling the cable between two different connectors. The testing then switches power to different pins in the connectors and automatically detests continuity and short-circuit among those... Agent: Law Office Of Scott C Harris

20080180108 - Fault detection circuit: Power supplies are disclosed herein. One embodiment of a power supply comprises a first input and a second input, wherein the first input and the second input are connectable to a pulse width modulation controller and wherein a pulse width modulation signal is outputable from the pulse width modulation controller.... Agent: Hewlett Packard Company

20080180109 - Method and apparatus for implementing ic device testing with improved spql, reliability and yield performance: A method for testing an integrated circuit device includes subjecting the integrated circuit device to an applied magnetic field during the application of one or more test signals, the applied magnetic field inducing magnetostriction effects in one or more materials comprising the integrated circuit device; and determining the existence of... Agent: Cantor Colburn LLP-ibm Burlington

20080180110 - Target tester interface: An electronics testing assembly includes a housing, a tester assembly, and an activation assembly. The housing is sized to retain the activation assembly and at least one electronics testing device. The tester enclosure is configured to house a plurality of tester connector interfaces that are mounted to a first connector... Agent: Merchant & Gould PC

20080180111 - Methods and apparatus for the non-destructive detection of variations in a sample: Non-invasive THz spectroscopic apparatus and methods are provided for detecting and/or identifying constituents such as variations in a structural entity where chemical or biological entities can reside. Position dependent scattering of THz radiation is employed to image voids and defects in the internal structure of samples, enabling the determination of... Agent: Kaplan Gilman Gibson & Dernier L.L.P.

20080180113 - Centralized hirf detection system: The present invention is a detection device, system and method for detecting an external electromagnetic event such as lightning or a high intensity radiated field. In an exemplary embodiment, the detection device includes a free space capacitive sensor and a protected amplifier circuit coupled with the free space capacitive sensor.... Agent: Rockwell Collins, Inc. Intellectual Property Department

20080180112 - Numerical full well capacity extension for photo sensors with an integration capacitor in the readout circuit using two and four phase charge subtraction: A detector circuit having an integration capacitor coupled to an amplifier via a switch matrix and a comparator coupled to the amplifier, the integration capacitor operable in two or more phases, the switch matrix is configured to phase switch the integration capacitor, the comparator triggers the phase switch when the... Agent: Ketan S. Vakil, Esq. Snell & Wilmer L.L.P.

20080180114 - Foreign object detection sensor: A foreign object detection sensor applied to an electric sliding door apparatus is provided. The sensor includes a contact detecting section, a change detecting section, and a determination section. The contact detection section has a pressure sensitive portion which is capable of elastically changing in form through contact with a... Agent: Fulwider Patton LLP

20080180115 - Electrical resistance measurement method and component inspection process: An electrical resistance measurement method and a component inspection process to which the electrical resistance measurement method is applied. In the first step, a measuring object, for example, one pair of zinc-plated steel plates on which surfaces films are formed is prepared. Then, an elastic electroconductive material is sandwiched by... Agent: Staas & Halsey LLP

20080180117 - Adjustable force electrical contactor: An apparatus for testing electric components supported on a test plate for transport along a travel path through a test station includes an electrical contactor at the station for contacting the plate surface and at least one electronic component transported to the station by the plate for testing. An adjustable... Agent: Young & Basile, P.C.

20080180119 - Method for testing electronic components and test apparatus for carrying out the method: A method and an apparatus are provided which make it possible, when testing chips arranged on a wafer, to be able to test optionally both additional components arranged on horizontal boundary lines and on vertical boundary lines. The additional components arranged on horizontal boundary lines are tested in a first... Agent: Heslin Rothenberg Farley & Mesiti PC

20080180120 - Probe card: A probe card to connect a semiconductor device to test equipment includes a Printed Circuit Board (PCB) in which an electrical wiring pattern is formed, a first connector fixed on an upper surface of the PCB to connect the test equipment to the PCB, probe needles connected to electrode pads... Agent: Stanzione & Kim, LLP

20080180121 - Probe card assembly and kit: In a probe card assembly, a series of probe elements can be arrayed on a silicon space transformer. The silicon space transformer can be fabricated with an array of primary contacts in a very tight pitch, comparable to the pitch of a semiconductor device. One preferred primary contact is a... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080180118 - Substrate for probe card assembly, method of manufacturing substrate for probe card assembly and method of inspecting semiconductor wafer: A method of manufacturing a substrate for a probe card assembly comprises preparing an interconnection layer, preparing a resin layer and preparing a base layer. The method comprises attaching the resin layer to the interconnection layer by a first thermal process at a first temperature. The method comprises attaching the... Agent: Ditthavong Mori & Steiner, P.C.

20080180116 - Systems and methods for defect testing of externally accessible integrated circuit interconnects: Apparatus and methods provide built-in testing enhancements in integrated circuits. These testing enhancements permit, for example, continuity testing to pads and/or leakage current testing for more than one pad. The disclosed techniques may permit more thorough testing of integrated circuits at the die level, thereby reducing the number of defective... Agent: Knobbe Martens Olson & Bear LLP

20080180122 - Probe having a field-replaceable tip: A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to... Agent: Samtec Incorporated C/o Keating & Bennett, LLP

20080180123 - Ultra-fine pitch probe card structure: A system and a method of testing a semiconductor die is provided. An embodiment comprises a plurality of tips that each comprise a substrate with a conductive via, a first dielectric layer with vias connected to the conductive via, a second dielectric layer with vias over the first dielectric layer,... Agent: Slater & Matsil, L.L.P.

20080180124 - Cooling apparatus for semiconductor device: Provided is a cooling apparatus for a semiconductor device. The apparatus includes: a main body capable of moving vertically to face the semiconductor device that is mounted on a test unit in order to perform an electrical test; a heat exchange unit combined with the main body and contacting a... Agent: Jason Y. Pahng And Associates, LLC

20080180125 - Contact probe and socket for testing semiconductor chips: A contact probe and a socket for testing semiconductor chips are provided with a simple structure, so that they can be easily manufactured, and can reduce a signal path not only to improve test reliability but also remarkably reduce the dimensions of test equipment. The contact probe comprises: a nonconductive... Agent: Hyun Jong Park

20080180126 - Device identifying method, device manufacturing method and electronic device: There is provided a device identifying method for identifying an electronic device including therein an actual operation circuit and a test circuit having a plurality of test elements provided therein, where the actual operation circuit operates during an actual operation of the electronic device and the test circuit operates during... Agent: Jianq Chyun Intellectual Property Office

20080180127 - On-chip self test circuit and self test method for signal distortion: There is provided an on-chip test circuit that is capable of measuring validity of an output signal within a chip without any external measuring device. The on-chip self test circuit implemented on the same chip as a test semiconductor device includes: a test load block for receiving a test target... Agent: Lowe Hauptman Ham & Berner, LLP

20080180128 - Self-centering nest for electronics testing: The shortcomings of the prior art are overcome and additional advantages are provided through the provision of a self-centering nest for testing of microprocessor chip modules. The self-centering nest includes two slideable jaws disposed on a base diagonally opposite each other. Each jaw includes a jaw pin that is receptive... Agent: Cantor Colburn LLP - IBM Fishkill

20080174296 - Magnetic indexer for high accuracy hole drilling: A magnetic indexer for locating a device producing a magnetic field in a blind or inaccessible position of a work piece. A magnet is initially placed on a first side of the work piece such that a magnetic field produced by the magnet extends through the work piece and substantially... Agent: Harness Dickey & Pierce, Plc

20080174297 - Circuit and method of testing a fail in a memory device: A circuit for testing a fail in a memory device is disclosed. The memory device includes a memory cell array, a page buffer section, a current controller, and a current measuring section. The memory cell array has memory cells coupled to pairs of bit lines and word lines. The page... Agent: Townsend And Townsend And Crew, LLP

20080174298 - Determining a state of a receiver on a transmission line: According to one aspect, a method is provided for determining a state of a receiver on a transmission line. The method may comprise, for example, evaluating a first voltage arising at a circuit point between an impedance and a transmission line coupled to the impedance, wherein the impedance is coupled... Agent: Banner & Witcoff, Ltd. Attorneys For Client 007052

20080174299 - Test tray and handler using the test tray: A semiconductor chip test handler includes a first chamber in which packaged chips contained in a test tray are heated to high temperature or cooled to low temperature, a second chamber in which the packaged chips contained in the test tray are tested, and a third chamber in which the... Agent: Ked & Associates, LLP

20080174302 - Inductive position sensor using reference signal: An apparatus providing a signal related to a position of a coupler element comprises an exciter coil and a receiver coil, the apparatus being operable to provide a signal correlated with the position of the coupler element using a receiver signal generated when the exciter coil is energized due to... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c

20080174303 - Anti-distortion electromagnetic sensor method and system: A source for inducing an electromagnetic magnetic field, comprising: a substrate, a conductive layer coupled to the substrate, and a planar coil coupled to the substrate, wherein the planar coil comprises non-concentric rings, and wherein the non-concentric rings are configured such that a drive current applied across the non-concentric rings... Agent: Ge Healthcare C/o Fletcher Yoder, Pc

20080174304 - Coil arrangement for electromagnetic tracker method and system: An electromagnetic coil arrangement comprising a plurality of electromagnetic sensors located about the periphery of a region and at least one center electromagnetic sensor located at or near the center of the region, wherein the plurality of electromagnetic sensors and the at least one center electromagnetic sensor are located in... Agent: Ge Healthcare C/o Fletcher Yoder, Pc

20080174301 - Dual axis magnetic field detector: A dual axis magnetic field detector is able to detect the presence of a magnetic field in two axes, such as a rotary axis and a linear axis. The detector includes a magnet for generating a magnetic field and two magnetic field sensors for detecting the strength and angle of... Agent: Bell, Boyd & Lloyd, LLP

20080174300 - Hall-effect pressure switch: A switch includes housing and a magnet that is mounted inside the housing. The magnet generates a magnetic field having magnetic flux. The switch further includes a flux concentration device that is located inside the housing and that selectively moves between first and second positions. An actuator assembly is located... Agent: General Motors Corporation Legal Staff

20080174305 - Combined sensor and bearing assembly and method of magnetizing element of rotation sensor: A combined sensor and bearing assembly (1) of the present invention includes a rolling bearing unit (22) and a rotation sensor unit (23). The rolling bearing unit (22) includes a rotatable raceway member (2), a stationary raceway member (3) mounted around the rotatable raceway member (2) with an annular bearing... Agent: Staas & Halsey LLP

20080174306 - Method and apparatus for detecting inconsistencies in fiber reinforced resin parts using eddy curents: Inconsistencies in a reinforced resin matrix part are detected using an inductive coupling probe connected with or part of a tuned resonant circuit. An alternating magnetic field produced by the probe is coupled to the part and produces eddy currents in the part. Inconsistencies in the part result in changes... Agent: Tung & Associates / Randy W. Tung, Esq.

20080174307 - Apparatus and method for second-layer through-bushing inspection of aircraft wing attachment fittings using electric current perturbation: A device and methods for using the device, that permit the rapid and accurate inspection of aircraft wing attachment fittings, including those wing to fuselage attachments modified according to a Structural Life Extension Program (SLEP). Such aircraft life extension programs often result in the placement of fitting stack-up components that... Agent: Kammer Browning Pllc

20080174308 - Magnetic amplification device comprising a magnetic sensor with longitudinal sensitivity: The invention relates to a magnetic amplification device comprising a magnetic sensor with longitudinal sensitivity, having a first piece of magnetic material and a second piece of magnetic material, each of the pieces having a longitudinal slot at its center, the pieces being separated by a distance called the gap,... Agent: Lowe Hauptman & Berner, LLP

20080174309 - Magnetic resonance based apparatus and method to analyze and to measure the bi-directional flow regime in a transport or a production conduit of complex fluids, in real time and real flow-rate: An apparatus and a method is provided based on the Magnetic Resonance techniques to analyze and measure a uni- and/or a bi-directional flow regime of multiphase fluids in a transport and production conduct, in real time and flow-rates, based on a magnetic resonance analytical module, two magnetic prepolarization modules of... Agent: Volpe And Koenig, P.c.

20080174310 - Method for operating a hybrid medical imaging unit comprising a first imaging device of high spatial resolution and a second nuclear medicine imaging device of high sensitivity: A method is disclosed for operating a hybrid medical imaging unit including a first imaging device of relatively high spatial resolution and a second nuclear medicine imaging device of relatively high sensitivity that respectively acquire imaging measurement signals from a common examination volume. In an embodiment of the method, during... Agent: Harness, Dickey & Pierce, P.L.C

20080174312 - Apparatus of nuclear magnetic resonance measurement by using circulation flow for sample condition control: The present invention makes it possible to measure a plurality of samples under a certain concentration condition of the small molecule by the circulation transfer of a small molecule solution through a small molecule concentration control portion for injecting, discharging or feeding the small molecule solution, a mixing filter portion... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080174311 - System and method for fast texture-based tensor field visualization for dt-mri: A method for visualizing diffusion-tensor magnetic resonance images, including the steps of providing a diffusion-tensor magnetic resonance image (DT-MRI) volume, positioning and orienting a virtual camera for rendering the volume, the camera having an image plane, the camera's orientation being defined by its look, right and up vectors, associating a... Agent: Siemens Corporation Intellectual Property Department

20080174313 - Flow measurement using nmr: A nuclear magnetic resonance (NMR) method is used to determine a velocity distribution or velocity image of a flowing fluid in a downhole environment. The method comprises applying a radio frequency pulse sequence; applying a magnetic field gradient magnetic field and a gradient pulse duration; measuring a NMR signal; determining... Agent: Schlumberger Oilfield Services

20080174314 - Multi-channel coil for magnetic resonance imaging: This document discusses, among other things, a system and method for a coil having a plurality of resonant elements capable of radiofrequency transmission, reception, or both transmission and reception. One example includes a multi-channel receive-only coil comprised of overlapping planar loops. Adjacent resonant elements are decoupled from one another by... Agent: Intellectual Property Group Fredrikson & Byron, P.a.

20080174315 - Methods of performing electrostatic discharge testing on a payment card: Methods of performing electrostatic discharge testing on a transaction card are disclosed. A transaction card may be placed on an insulated surface. A grounding probe may be placed at a first location on the transaction card. A discharge probe may be charged to a known voltage level. The discharge probe... Agent: Mayer Brown LLP

20080174317 - Semiconductor device: A semiconductor device includes: a plurality of pins for receiving a plurality of external mount test signals; and a signal generating unit for generating a plurality of internal test mode signals in response the external mount test signals, wherein the semiconductor device enters into a mount test mode in response... Agent: Mcdermott Will & Emery LLP

20080174316 - System and method for determining location of phase-to-earth fault: A method, system and apparatus for determining a distance of a phase-to-earth fault on a three-phase electric line (30), the apparatus (40) being configured to determine a first estimate value for a distance between the measuring point (40) and a point of fault (F) on the basis of a first... Agent: Buchanan, Ingersoll & Rooney Pc

20080174319 - Load board based test circuits: A load board based test circuit includes a control module which receives user input over a user interface; a testing interface which makes a connection said load board based test circuit and a device under test; a memory which holds calibration values, test parameters, or test results; and a means... Agent: Steven L. Nichols Rader, Fishman & Graver Pllc

20080174318 - Test apparatus: There is provided a test apparatus that tests an electronic device. The test apparatus includes a socket board in which a socket for mounting thereon the electronic device is provided, and a test head that detachably holds the socket board and transmits source power to the electronic device via the... Agent: Jianq Chyun Intellectual Property Office

20080174320 - Partial discharge sensor and partial discharge monitoring system utilizing current sensors: A partial discharge sensor includes a first current transformer having an opening. A conductive shield is disposed within the opening of and proximate to the first current sensor. The conductive shield has an opening. The concentric openings of the first current sensor and the conductive shield are structured to receive... Agent: Martin J. Moran Eaton Electrical, Inc.

20080174321 - Capacitive sensor for sensing tactile and proximity, and a sensing system using the same: Disclosed is a capacitive proximity sensor in dual implementation. The sensor comprises an upper electrode layer having a plurality of electrodes disposed in line with each other, a lower electrode layer having a plurality of electrodes disposed in line with each other and an insulating layer disposed between the upper... Agent: Charles N.j. Ruggiero Ohlandt, Greeley, Ruggiero & Perle, L.l.p.

20080174322 - Thin film resistance measurement method and tunnel magnetoresistive element fabrication method: A method of measuring resistance of a tunnel magnetoresistive element having a first conductive layer, a resistive layer and a second conductive layer stacked on a substrate in this order. This magnetoresistive element has a pinned layer on one of the first and second low resistance layers, and a free... Agent: Greer, Burns & Crain

20080174323 - Corrosion sensor to monitor and control the acidity of the lube oil and hydraulic oil: A corrosion sensor having a corrodible element that is corrodible in a lubricant or hydraulic oil, wherein the corrosion sensor is adapted to monitor degradation of the lubricant or hydraulic oil is disclosed.... Agent: Darby & Darby P.c.

20080174324 - Method and apparatus for inspecting process performance for use in a plasma processing apparatus: A method inspects a process performance of a capacitively coupled plasma processing apparatus which generates a plasma for a plasma processing by applying a radio frequency power between a first electrode and a second electrode disposed in a processing vessel to face the first electrode in parallel. The method includes... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.c.

20080174327 - Electric signal connecting device and probe assembly and probing device using the same: The present invention is for enabling to carry out probing tests en bloc at the same time on electronic devices and semiconductor chips having high-density terminals. For this purpose, the electric signal connecting device includes vertical probes for getting into contact with terminals for electric connection created on electric functional... Agent: Haynes And Boone, LLP

20080174325 - Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object: At least one pair of electrode formed on a mounting surface of a stage is in contact with a conductive layer formed on a first surface of an inspection object, and an electrical path is formed between the both by using a fritting phenomenon.... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080174326 - Probe, probe assembly and probe card for electrical testing: A probe card for transmitting electric signals between a test head and an inspection object includes a printed circuit board provided with a plurality of electrode pads, a supporter attached to the printed circuit board and a plurality of probes attached to the support in a removable manner. The supporter... Agent: Knobbe Martens Olson & Bear LLP

20080174328 - Probing structure with fine pitch probes: A microelectronic resilient structure can comprise a support member and a platform attached to the support member. The platform can comprise a non-conductive, resilient beam that extends away from the support member, and a plurality of conductive members can be disposed on the beams. The conductive members can extend along... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080174332 - Electrochemically fabricated microprobes: Multilayer test probe structures are electrochemically fabricated via depositions of one or more materials in a plurality of overlaying and adhered layers. In some embodiments each probe structure may include a plurality of contact arms or contact tips that are used for contacting a specific pad or plurality of pads... Agent: Microfabrica Inc. Att: Dennis R. Smalley

20080174329 - Method and device for determining an operational lifetime of an integrated circuit device: An integrated circuit device includes a degradable test structure, a first external interface pin and a second external interface pin, a first conductive path coupling a first node of the degradable test structure and the first external interface pin, and a second conductive path coupling a second node of the... Agent: Larson Newman Abel Polansky & White, LLP

20080174334 - Method for prediction of premature dielectric breakdown in a semiconductor: The invention predicts premature dielectric breakdown in a semiconductor. At least one dielectric breakdown mode is calculated for the semiconductor wafer. If a one mode is calculated, premature dielectric breakdown will be associated with any semiconductor with a breakdown voltage less than a predetermined standard deviation of a plurality of... Agent: International Business Machines Corporation Dept. 18g

20080174330 - Rotational positioner and methods for semiconductor wafer test systems: A semiconductor wafer prober is configured to rotate a semiconductor wafer into relative alignment with a wafer-interface probe adapted to simultaneously probe a number of integrated circuits within a sector of the semiconductor wafer. The wafer can include integrated circuits having different orientations, such that all of the integrated circuits... Agent: Teradyne, Inc. C/o Foley & Larder, LLP

20080174331 - Structure of test area for a semiconductor tester: Devices and methods for DC and SLT (system level test) integration are disclosed. The DC circuit and the SLT circuit are integrated into the same device. Therefore, the DUT (device under testing) can precede the SLT before the FT (final test) when the DUT passes the DC.... Agent: Sinorica, Llc

20080174333 - Test sockets having peltier elements, test equipment including the same and methods of testing semiconductor packages using the same: A test socket includes a socket body in which a semiconductor package is located, a socket head combined with the socket body, a Peltier element in the socket head, and power terminals connected to the Peltier element. A test equipment includes the test socket and a method of testing the... Agent: F. Chau & Associates, Llc

20080174336 - Circuit and method for detecting skew of transistor in semiconductor device: A circuit and method for easily detecting skew of a transistor within a semiconductor device are provided. The circuit for detecting the skew of the transistor includes a linear voltage generating unit for outputting a linear voltage by using a first supply voltage, a first attenuation unit for reducing variation... Agent: Lowe Hauptman Ham & Berner, LLP

20080174335 - Test apparatus for determining performance degradation: Provided is a testing apparatus that accurately tests changes in threshold value of a transistor. The output of an operational amplifier is connected to the gate of a transistor to be tested, and the source of the transistor to be tested is negatively fed back to the negative input terminal... Agent: Frank Pincelli Patent Legal Staff

20080169799 - Method for biosensor analysis: In a method for biosensor analysis, a sample is tested in multiple stages using a biosensor and a test chip thereof to enable easy and convenient handling of the biosensor and accurate analyte measurement with the biosensor. The test chip of the biosensor has specially designed biochemical reaction zone, in... Agent: Rosenberg, Klein & Lee

20080169800 - Signal readout circuit for amperometric sensor: A signal readout circuit for amperometric sensor for reading a readout signal of a sensor includes an amplifier, a first transistor, a second transistor, and a first resistor. A negative input end of the amplifier receives an input voltage, and a positive input end of the amplifier is connected to... Agent: Rabin & Berdo, PC

20080169801 - Sinusoidal modulated signal rectification tool using various oscillator systems: A sinusoidal modulated signal and noise are applied to a system consisting of two oscillators of the so-called General Type, which can be, but are not limited to, the Van der Pol type, Rotator type, Tracking Force type, Linear type, or any other type of oscillator. The two oscillators in... Agent: Nixon & Vanderhye, PC

20080169802 - Method and circuit for detecting input voltage of power converter: The present invention provides a method and circuit for detecting an input voltage of a power converter. It includes a current sense circuit for generating a current signal in response to a switching current of an inductive device. A detection circuit is coupled to sense the current signal for generating... Agent: Rosenberg, Klein & Lee

20080169803 - Device transfer system: The invention provides a device transfer system capable of lessening swaying of a movable body (handler), and simplifying the indexing mechanism. The device transfer system comprises a transfer means for transferring a device under test, held by a contact head, a test site for testing electrical characteristics of the device... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080169804 - Semiconductor device and electronics device: A plurality of switch circuits are disposed so as to correspond to a plurality of circuit blocks, respectively. Each of the plurality of switch circuits is connected between a power supply terminal of a corresponding circuit block and a power supply line. A setting circuit is disposed to set each... Agent: Arent Fox LLP

20080169805 - Permeability measurement apparatus: A permeability measurement apparatus includes a magnetic field generation means applying an alternating magnetic field having a predetermined frequency to a magnetic substance to be measured; a probe needle placed in proximity or in contact to a microscopic area of the magnetic substance to be measured to which the alternating... Agent: Greer, Burns & Crain

20080169806 - Hall sensor for linear motor: A Hall sensor for a coreless linear motor comprises a housing composed of a package segment and a foundation mutually integrated wherein a magnetic sensor and a signal conditioning circuit are packaged and embedded in the package segment by means of infusing resin wherein the signal conditioning circuit has an... Agent: Charles E. Baxley, Esq.

20080169807 - Magnetic sensor and manufacturing method therefor: There is provided a small-size magnetic sensor for detecting the intensity of a magnetic field in three axial directions, in which a plurality of giant magnetoresistive elements are formed on a single semiconductor substrate. A thick film is formed on the semiconductor substrate; giant magnetoresistive elements forming an X-axis sensor... Agent: Dickstein Shapiro LLP

20080169808 - Magnetic resonance imaging apparatus: Provided is a magnetic resonance imaging apparatus capable of highly precisely detecting and compensating body motions within a short processing time during radial scanning. The magnetic resonance imaging apparatus includes a control unit that applies radiofrequency magnetic fields and magnetic field gradients to a subject lying down in a static... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080169810 - Mr multi-slice steady state free precession imaging: In a coherent magnetic resonance imaging method, a plurality of slices (70, 72; 170, 172) are each prepared (74, 76) in a steady spin state. Time domain multiplexed readouts (80, 82) are performed. Each readout acquires magnetic resonance data corresponding to one of the steady spin state slices. Radio frequency... Agent: Philips Intellectual Property & Standards

20080169809 - System and method for metabolic mr imaging of a hyperpolarized agent: A system and method for metabolic MR imaging of a hyperpolarized agent includes exciting a single metabolic species of a hyperpolarized agent injected into a subject of interest. MR signals are acquired from the excited single metabolic species and an image is reconstructed from the acquired MR signals.... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20080169811 - Method and apparatus for high-gain magnetic resonance imaging: An apparatus is disclosed for Magnetic Resonance Imaging with specialized imaging coils possessing high Signal-to-Noise-Ratios (SNR). Radio Frequency transmitting and/or Radio Frequency receiving elements include carbon nanotube material, a ballistic electrical conductor having a resistance that does not increase significantly with length. The shapes of the receiving and transmitting elements... Agent: Russ Weinzimmer

20080169812 - Tomographic measuring system and method for conducting measurements: A tomographic measuring system is disclosed with at least two tomographic measuring devices, of which at least a first can interfere with a second in a manner disadvantageous for conducting measurements. In at least one embodiment, the system includes a switching-off mechanism at least in the first measuring device; and... Agent: Harness, Dickey & Pierce, P.L.C

20080169813 - Gradient magnetic field coil unit, gantry for mri apparatus, and mri apparatus: Provided is a gradient magnetic field coil unit includes a main coil layer that has a main coil for generating a gradient magnetic field and is formed in a substantially cylindrical shape, a shield coil layer that is attached to the outside of the main coil layer and has a... Agent: Nixon & Vanderhye, PC

20080169814 - High-throughput systems for magic-angle spinning nuclear magnetic resonance: A solid-state nuclear magnetic resonance probe for use in a magnetic field having a plurality of isolated magic angle spinning modules positioned within the housing is disclosed. The housing is configured so that the plurality of magic angle spinning modules are located in a stationary position within a homogenous region... Agent: Stinson Morrison Hecker LLP Attn: Patent Group

20080169816 - Device and method for optical transmission of magnetic resonance signals in magnetic resonance systems: In a transmission device for use in magnetic resonance systems for transmitting magnetic resonance signals from a number of local coils to an evaluation device, the signals are transmitted as optical signals in an optical conductor between a first transmitter-side transducer that transduces electrical signals into optical signals and a... Agent: Schiff Hardin, LLP Patent Department

20080169815 - Method and apparatus for high-gain magnetic resonance imaging: A method and apparatus for Magnetic Resonance Imaging with specialized imaging coils possessing high Signal-to-Noise-Ratio (SNR). Imaging and/or Radio Frequency receiving coils include a ballistic electrical conductor such as carbon nanotubes, the ballistic electrical conductor having a resistance that does not increase significantly with length. Due to their enhanced SNR... Agent: Russ Weinzimmer

20080169817 - Determining an electric field based on measurement from a magnetic field sensor for surveying a subterranean structure: To perform a survey of a subterranean structure behind a subsea surface, at least one sensor module is provided in a subsea environment, where the at least one sensor module comprises at least one magnetic field sensor. Measurement data is received from the magnetic field sensor, and an electric field... Agent: Schlumberger Oilfield Services

20080169818 - Systems and methods for monitoring and storing performance and maintenance data related to an electrical component: The present invention provides systems and methods for testing and storage of information related to a component. A data collection device having a memory is fixedly connected to the component. A test device communicates with the data collection device to store test data concerning the component in the data collection... Agent: Alston & Bird LLP

20080169819 - Internal impedance detecting apparatus, internal impedance detecting method, degradation degree detecting apparatus, and degradation degree detecting method: An internal impedance detecting apparatus for detecting the internal impedance of a secondary battery with high accuracy is provided. Processor 106 divides the variation of each voltage detected by voltage change detector 103 by the variation of the current detected by current change detector 105 for the same detecting time... Agent: Sughrue Mion, PLLC

20080169820 - Battery voltage measuring system: A battery voltage measuring system includes an analog/digital converter configured to receive a higher reference voltage and a lower reference voltage which is lower than the higher reference voltage and to outputs a digital output value based on an input voltage which is lower than the high voltage reference voltage... Agent: Foley And Lardner LLP Suite 500

20080169821 - Inspection methods for defects in electrophoretic display and related devices: The present invention relates to methods for inspection of defects in an electrophoretic display and related devices. The method may be carried out with one or more testing electrodes. The method comprises applying a voltage difference to two testing electrodes which are in contact with the display panel, or applying... Agent: Howrey LLP

20080169822 - Substrate testing device and method thereof: Exemplary embodiments relate to a substrate testing device having a comparator adapted to compare a power supply voltage supplied by a power supply voltage line with a dropped power supply voltage detected by a power supply voltage detection line and to output a voltage difference, and a level shifter circuit... Agent: Lee & Morse, P.C.

20080169823 - Apparatus and method for high-speed sas link protocol testing: An apparatus for changing a connection between two serial components on the same circuit board. The apparatus comprises at least one column, and each column includes first, second, third and fourth pads. The first pad communicates with a first breakout connector disposed on the circuit board. The second pad communicates... Agent: Larson Newman Abel Polansky & White, LLP

20080169824 - Arc fault and ground fault circuit interrupter tester apparatus and method: A circuit tester comprising an AFCI (FIGS. 1 and 2) having two pairs of leads connected to the opposite end of each circuit tester in series for connecting an AFCI with ground fault circuit technology capabilities between an electrical circuit load and a power source to indicate electrical circuit and/or... Agent: Baker & Daniels LLP 111 E. Wayne Street

20080169825 - Solid electrolytic capacitor inspection device and inspection method: A capacitor inspection device includes a substrate made of an insulating material, a first conductor unit and a second conductor unit arranged on the substrate, a signal input unit and a signal output unit attached to the substrate, a network analyzer and a pressurizing unit. The network analyzer has an... Agent: Mcdermott Will & Emery LLP

20080169826 - Measuring a long time period or generating a time delayed event: A time period of an event is determined by charging a known value capacitor from a constant current source during the event. The resultant voltage on the capacitor is proportional to the event time period and may be calculated from the resultant voltage and known capacitance value. Capacitance is measured... Agent: Attn: Paul N. Katz Baker Botts L.L.P.

20080169827 - Sensor element for a capacitive touch switch and operating device: A sensor element for a capacitive touch switch has a sensor element body, which at its first end has a first front face and at a second, other end a second front face and is made from a homogenous elastic material. The shape of the sensor element body diverges from... Agent: Alston & Bird LLP

20080169828 - Method and apparatus for detecting inconsistencies in cured resin structures: Inconsistencies in a resin-based part are detected using a capacitive coupling probe having a tuned circuit and an impedance matching element. An alternating electric field produced by the probe penetrates the part. Inconsistencies in the resin part result in changes in the resonance of the circuit which are detected by... Agent: Tung & Associates / Randy W. Tung, Esq.

20080169829 - Method and system for determining the thickness of a layer of lacquer: The invention relates to electrophoretic immersion lacquering of objects, e.g. the bodies of automotive vehicles (28), wherein the object which is to be lacquered (28) is immersed into lacquer immersion basin (12) containing a lacquer fluid (14). An electric field is produced by the object (28) in its capacity as... Agent: Factor & Lake, Ltd

20080169830 - Probe card for test and manufacturing method thereof: A probe card includes a plurality of probe modules, a multi-layer ceramic substrate provided below the probe module, and a solder ball for connecting the probe module and the multi-layer ceramic substrate, and the height of the solder ball is controlled depending on location of the multi-layer ceramic substrate. Therefore,... Agent: LexyoumeIPGroup, LLC

20080169831 - Batch-test system with a chip tray: A chip test system including a probe card, a chip tray and a cover plate fastened on the chip tray. The chip tray comprises a socket, a chip contact area, an extension contact area, and an alignment contact point. The socket loads the testing chip and is customized for the... Agent: Joe Mckinney Muncy

20080169832 - Automated loading/unloading of devices for burn-in testing: The automatic loading and unloading of devices for burn-in testing is facilitated by loading burn-in boards in a magazine with the stacked boards in the magazine moved into and out of a burn-in oven by means of a trolley. The trolley can include an elevator whereby a plurality of magazines... Agent: Spansion LLC C/o Murabito , Hao & Barnes LLP

20080164860 - Particle counter: A particle counter for measuring the number of floating particles contained in a sample to determine the particle concentration therein includes: a memory section for storing a relational expression between the direct current level output from a photoelectric converter when no particles exist and the frequency of occurrence of false... Agent: Carrier Blackman And Associates

20080164861 - Measuring device, in particular, a vectorial network analyzer with phase regulation: A method for operating a measuring device, in particular, a vectorial network analyzer, which can be connected via at least two ports to a device under test, with excitation units assigned to each port, wherein each excitation unit provides a signal generator, with which the assigned port can be supplied... Agent: Marshall, Gerstein & Borun LLP

20080164862 - Method and device for determination of the phases in a multi-phase electrical system: To identify a phase in a multi-phase electrical system, the following method is proposed: transmission, on a defined phase (L1, L2, L3) of a line of the system, of a message with a known synchronization with respect to the phase voltage (V1, V2, V3); reception of the message on an... Agent: Waddey & Patterson, P.C.

20080164864 - Compensation of simple fibre optic faraday effect sensors: An electric current measurement device includes a housing defining first and second open ends sealed by first and second sealing means, respectively: a first optical fibre received in an aperture in the first sealing means and in optical communication with a first optical lens in the housing; a first polarisation... Agent: Klein, O'neill & Singh, LLP

20080164863 - Sampling of optical signals: A method and device for sampling ultra-fast optical signals by generating a sampling signal comprising a train of short pulses and coupling the sampling signal together with an optical data signal to be sampled into a highly non-linear optical fibre. Four-wave mixing (FWM) occurs between the two signals resulting in... Agent: Coats & Bennett, PLLC

20080164865 - Display system for an automotive vehicle: A display system for an automotive vehicle indicates a state of the vehicle by the position of an indicator bar. The indicator bar moves as the state of the vehicle changes.... Agent: Brooks Kushman P.C./fgtl

20080164868 - Use of magneto-impedance on a contactless position sensor and corresponding sensor: The invention relates to the use of magneto-impedance on a contactless position sensor and to the corresponding sensor. According to the invention, an electrical conductor (1) is produced which has a magnetically-sensitive surface (10) that is subjected to the magnetic force of a permanent magnet (11), said surface varying depending... Agent: Young & Thompson

20080164870 - Arrangement for measuring the position of a magnet relative to a magnetic core: An arrangement for measuring the position of a magnet relative to a ferromagnetic magnetic core, has a magnetic core, a conductor, which is guided in such a way through the toroidal core that the conductor and the toroidal core form an inductive arrangement, and an evaluation circuit for evaluating the... Agent: Baker Botts L.L.P. Patent Department

20080164869 - Inductive angular-position sensor: Inductive angular-position sensor, including a partially metallized disk that moves in rotation around its axis of revolution; and a stator that includes a primary coil and several secondary coils, whereby the secondary coils are arranged essentially symmetrically in pairs relative to the axis of revolution, so as to form one... Agent: Young & Thompson

20080164866 - Angle sensor: In order to provide an angle sensor in an embodiment, which is axially short in particular and on the other hand radially wider, with a functionality that is as good as possible, on the one hand certain shielding measures against interfering magnetic fields are proposed, and on the other hand... Agent: Head, Johnson & Kachigian

20080164867 - Angle sensor: In order to be able to provide magnetic angle sensors thin and slender, while still minimizing magnetic interference fields, the angle sensor, comprised of a longitudinally extending main circuit board and a sensor element, transversally disposed in front of the end of the main circuit board, is housed in a... Agent: Head, Johnson & Kachigian

20080164871 - Methods and apparatus for vibration detection: Apparatus for detecting vibration of an object adapted to rotate includes one or more vibration processors selected from: a direction-change processor adapted to detect changes in a direction of rotation of the object, a direction-agreement processor adapted to identify a direction of rotation of the object in at least two... Agent: Daly, Crowley, Mofford & Durkee, LLP

20080164872 - Methods and apparatus for characterizing magnetic tunnel junctions having two dielectric layers: A method of electrically characterizing a magnetic tunnel junction film stack having three metal layers separated by two dielectric layers comprises three steps. In a first step, four or more probes are electrically coupled to a surface of the magnetic tunnel junction film stack. In a second step, electrical resistance... Agent: Michael L. Wise Ryan, Mason & Lewis, LLP

20080164873 - Signal acquisition and processing method and apparatus for magnetic resonance imaging: A method and apparatus are disclosed for Magnetic Resonance Imaging using specialized signal acquisition and processing techniques for image reconstruction with a generally inhomogeneous static magnetic field. New signal processing methods for image reconstruction and for minimizing dephasing effects are disclosed. Imaging systems with smaller static magnetic field strengths and... Agent: Russ Weinzimmer

20080164874 - Method of and apparatus for in-situ measurement of changes in fluid composition by electron spin resonance (esr) spectrometry: A miniaturized instrument and method of using electron spin resonance spectrometry for measuring the degradation of lubricating fluids, and the like, that includes continuously passing a sample of such fluid through a resonating RF microwave cavity resonator during the application therethrough of a uniform slowly varying uniform magnetic field that... Agent: Rines & Rines Attorneys At Law

20080164875 - Exclusion of compromised pet data during simultaneous pet-mr acquisition: A system and method for simultaneously acquiring PET and MR data from a subject of interest with a hybrid PET-MR scanner includes monitoring transmission times of RF and gradient coils of the MR equipment and blanking segments of the PET data stream accordingly. By excluding PET data acquired during active... Agent: Ziolkowski Patent Solutions Group, Sc (zps)

20080164876 - Magnetic resonance imaging apparatus: A magnetic resonance imaging apparatus includes a static magnetic field magnet which generates a static magnetic field, a gradient coil unit which generates a gradient magnetic field for overlapping with the static magnetic field, a shim unit which is disposed between the static magnetic field magnet and the gradient coil... Agent: Nixon & Vanderhye, PC

20080164877 - Method and apparatus for actively controlling quench protection of a superconducting magnet: A method and apparatus for actively controlling quench protection of a superconducting magnet includes a magnetic resonance imaging (MRI) system and a computer readable storage medium having stored thereon a computer program comprising instructions which when executed by a computer cause the computer to detect a quench condition of the... Agent: General Electric Company Global Research

20080164878 - Minimum energy shim coils for magnetic resonance: In a magnetic resonance imaging system (10), a main magnet (20) generates a substantially uniform main magnetic field (B0) through an examination region (14). An imaging subject (16) generates inhomogeneities in the main magnetic field (B0). One or more shim coils are positioned adjacent a gradient coil (26). The gradient... Agent: Philips Intellectual Property & Standards

20080164879 - Arrangement for signal conversion: In an arrangement for conversion of an analog acquisition signal of an acquisition coil of a magnetic resonance apparatus into a digital signal, the output of the acquisition coil is connected with a low-noise amplifier such that the analog acquisition signal from the acquisition coil arrives at the amplifier. The... Agent: Schiff Hardin, LLP Patent Department

20080164880 - Method and system to measure series-connected cell voltages using a flying capacitor: A method and system for measuring voltage of individual cells connected in series includes a pair of busses connectable to the cells and a flying capacitor connectable to the busses. The capacitor stores the charge of one of the cells such that an analog-to-digital converter (ADC) connected to the capacitor... Agent: Howard & Howard Attorneys, P.C.

20080164881 - Battery voltage monitoring apparatus: A battery voltage monitoring apparatus monitoring an assembled battery voltage, the assembled battery including a plurality of battery cells, includes a voltage sensor detecting potential of the plurality of battery cells; an output logic circuit outputting a potential detect signal based on an output of the voltage sensor, the potential... Agent: Mcginn Intellectual Property Law Group, PLLC

20080164882 - System and method to measure series-connected cell voltages and verify measurement accuracy: A system and method for measuring voltage of individual cells connected in series includes a single flying capacitor. The capacitor stores the charge of one of the cells such that a primary analog-to-digital converter (ADC) connected to the capacitor may process a representation of the voltage of the cell being... Agent: Howard & Howard Attorneys, P.C.

20080164883 - Power cycle test method for testing an electronic equipment: A power cycle test method for testing an electronic equipment (30) includes: configuring a total test count and a current test count; updating the current test count by incrementing the current test count by a value; utilizing a corresponding AC control signal, a corresponding DC control signal, and a reboot... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20080164884 - Powered device power classification with increased current limit: A system and method of classifying a high powered device (PD) with an increased current limit includes: connecting a voltage to the PD, measuring current through a classification resistor connected to the PD, and determining a PD classification signature based on the current according to classification steps such that a... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20080164885 - Non-destructive test structure for printed circuit board characterization and method for same: A non-destructive test structure for printed circuit board characterization and method of testing the same are disclosed. In one form, a method for testing a printed circuit board can include applying a test signal to a first test location of a first test structure associated with a first inner bus... Agent: Larson Newman Abel Polansky & White, LLP

20080164886 - Inductive sensor device having a conical coil core: The invention provides that the coil core (6) has a section (10) that tapers, starting from a section (12) of a constant cross-section adjoining on one side, viewed in the longitudinal direction of the coil core, step-by-step or continuously, to a section (14) of a constant cross-section adjoining on the... Agent: Crowell & Moring LLP Intellectual Property Group

20080164887 - Measuring apparatus and method for determining a dielectric property, in particular moisture and/or density, in a product: The application concerns a measuring apparatus for determining a dielectric property, in particular the moisture and/or density, of a product, in particular tobacco, Cotton or some other fibrous product, having a measuring capacitor, a device for generating a high-frequency field in the measuring capacitor, which is influenced by a product... Agent: Venable LLP

20080164888 - Electrostatic capacity sensor: An electrostatic capacity sensor includes a sensor die including a bias electrode and a signal electrode, which are positioned opposite to each other with a very small distance therebetween, and a shield member including a potential stabilizing conductive film whose external shape encompasses the vertically projected area of the signal... Agent: Pillsbury Winthrop Shaw Pittman LLP

20080164889 - Detecting apparatus and detecting board thereof: A detecting apparatus for checking shape, size and/or position of a hole of a workpiece, includes a platform for supporting the workpiece, a detecting board, which includes a detecting unit, movably set above the platform, an electrical source, a processor, and an indicator. The source, the unit, and the workpiece... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang

20080164890 - Determination of effective resistance between a power sourcing equipment and a powered device: A method of determining an effective resistance between a power sourcing equipment and a powered device, the powered device exhibiting an interface and an operational circuitry, the method comprising: prior to connecting power to the operational circuitry of the powered device, impressing two disparate current flow levels (I1, I2) between... Agent: Microsemi Corp - Amsg Ltd.

20080164895 - Device for probe card power bus noise reduction: Noise reduction for application of structural test patterns to a Device Under Test (DUT) is accomplished with a capacitor “booster” bypass network on the probe card in which the capacitors are charged to a much higher voltage Vboost than the DUT power supply voltage VDD. Charging the capacitors to a... Agent: Whitham, Curtis & Christofferson, P.C.

20080164892 - Probe and probe card: An object of the present invention is to make it possible that a probe for testing electrical characteristics of an object to be tested is easily attached to a support member such as a contactor. A through hole is formed in the contactor. In the probe, a fitting/locking portion which... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080164893 - Probe card for testing wafer: Provided is a probe card for testing a wafer. The probe card includes: a main card having a flat plate in which a hole is formed; an auxiliary card vertically mounted on the main card through the hole; and a plurality of probe needles attached to the auxiliary card. Costs... Agent: Mills & Onello LLP

20080164896 - Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof: The present invention is directed to structures having a plurality of discrete insulated elongated electrical conductors projecting from a support surface which are useful as probes for testing of electrical interconnections to electronic devices, such as integrated circuit devices and other electronic components and particularly for testing of integrated circuit... Agent: Ibm Corporation, T.j. Watson Research Center

20080164894 - System and method for testing semiconductor integrated circuit in parallel: A system and method for testing a semiconductor integrated circuit (IC) in parallel includes a probe chuck, a test head, and a test controller. The probe chuck loads a plurality of different types of semiconductor DUTs. The test head provides a plurality of circuit sites to independently and simultaneously test... Agent: Mills & Onello LLP

20080164891 - Universal grid composite circuit board testing tool: The present invention discloses a universal grid composite circuit board testing tool having a probe station, a clamp base and a conducting wire base. The probe station and clamp base separately have a plurality of conducting probes and long needles. Both ends of the long needle are electrically contacted with... Agent: Bacon & Thomas, PLLC

20080164897 - Method for testing semiconductor memory device using probe and semiconductor memory device using the same: Example embodiments relate to a semiconductor memory device including a first pad having a probe region and a sensing region, the first pad may be adapted to come in contact with a primary probe, a sensing unit adapted to sense a weak contact of the first pad and the primary... Agent: Lee & Morse, P.C.

20080164898 - Probe card for test of semiconductor chips and method for test of semiconductor chips using the same: There are provided a probe card for test of semiconductor chips and a method for testing semiconductor chips using the probe card. In implementing the probe card for electrically testing semiconductor chips, the probe blocks corresponding to multiple selected ones of the semiconductor chips on the wafer can be selected... Agent: Mills & Onello LLP

20080164899 - Temperature control device and temparature control method: Pressing an electronic device (2) to be tested to contact terminals (132a and 132b) while bringing a heater (112) having equal or close temperature change characteristics to those of the electronic device to be tested by a test pattern, transmitting a test pattern to the electronic device to be tested... Agent: Birch Stewart Kolasch & Birch

20080164900 - Probe for high frequency signal transmission and probe card using the same: A probe for high frequency signal transmission includes a metal pin, and a metal line spacedly arranged on and electrically insulated from the metal pin and electrically connected to grounding potential so as to maintain the characteristic impedance of the probe upon transmitting high frequency signal. The maximum diameter of... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20080164901 - Multilayer type test board assembly for high-precision inspection: There is provided a multilayer type test board assembly for high-precision inspection. The multilayer test board assembly comprises: a plurality of test boards separated from each other according to their functions, having input/output signal terminals, and including at least one test board each having a first section where first mounting... Agent: Mills & Onello LLP

20080164902 - Inspection device for inspecting tft: Provided is an inspection device which inspects a thin film transistor (TFT) for supplying a current to a light emitting element. The inspection device includes: a first current supply circuit which supplies a drain current between a drain and a source of the TFT; a gate voltage adjustment circuit which... Agent: Frederick W. Gibb, Iii Mcginn & Gibb, PLLC

20080157749 - Method and receiver for estimating dc offset: A method for estimating a DC offset in a received signal, the method comprising: detecting a plurality of zero crossings of the signal (220); determining a variable time window (235) based upon a predetermined number of said detected zero crossings (230); estimating the DC offset (240) of the signal in... Agent: Motorola, Inc.

20080157750 - Method and apparatus for measuring terahertz time-domain spectroscopy: Disclosed are a method and an apparatus for measuring terahertz time-domain spectrum, which relate to the field of terahertz time-domain spectrum. The method comprises the steps of: generating a first pulse laser beam from a first femtosecond laser device at a preset repetition frequency to generate THz pulses; generating a... Agent: Westman Champlin & Kelly, P.a.

20080157751 - Current sensing apparatus: Disclosed is a current sensing apparatus which includes a first current transformer that, when energized, has a first input current and a first output current, the first output current being less than the first input current, the first current transformer stepping down the current. The current sensing apparatus includes a... Agent: Cantor Colburn, LLP

20080157752 - Current sensor and method for motor control: The present invention provides an improved motor current sensor and methods thereof. A first embodiment of the present invention provides a circuit having a signal transfer unit for receiving first and second input signals from opposing terminals of a shunt resistor and a signal conditioner unit for conditioning output signals... Agent: Patent Department Larkin, Hoffman, Daly & Lindgren, Ltd.

20080157753 - System and method for determining the performance of an on-chip interconnection network: This system for determining the performance of an interconnection network of functional blocks of a specialized integrated circuit, comprises a set of probing modules disposed on the network and comprising means for detecting an event on at least one communication link of the network and means for determining a characteristic... Agent: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.c.

20080157755 - Correction of measured values for a magnetic localization device: The invention relates to a device and a method for correction of the position (x) of a field sensor (4) measured by means of a magnetic localization device. External field distortions, such as caused for example by the rotating components (1a, 1b) of a computer tomograph (1), are then determined... Agent: Philips Intellectual Property & Standards

20080157756 - Inductive position measuring device or goniometer: The invention relates to an inductive position measuring device or goniometer having two to no more than five digital oscillators, each of which contains measuring coils or reference coils. Particularly favorable for one application as a transmission sensor is a coil array for three or four oscillators that includes two... Agent: Jordan And Hamburg LLP

20080157757 - Magnetic path monitor: A motion sensor which has a coil that surrounds a ferromagnetic core and at least one magnet that is longitudinally movable along the coil. The magnet causes a magnetic saturation of the ferromagnetic core in an associated zone that covers a portion of the length of the coil. An evaluation... Agent: Townsend And Townsend And Crew, LLP

20080157754 - Swivel portable terminal: Provided is a swivel portable terminal. The swivel portable terminal is configured to allow first and second magnet detecting units installed at one body of a main body and a swivel body at a predetermined interval therebetween to detect first and second magnets installed at the other body and corresponding... Agent: The Farrell Law Firm, P.c.

20080157758 - Magnetic error proofing of sensors: A magnet's N and S polarity can be alternately assembled within a MR sensor housing to determine the type of sensor that is assembled. In an MR sensor package including a housing having a sensing face and adapted for containing a sensing transducer and magnet, it can be determined if... Agent: Attorney, Intellectual Property Honeywell International Inc.

20080157759 - Combined sensor and bearing assembly: A combined sensor and bearing assembly including a rolling bearing unit and a rotation sensor unit. The rolling bearing unit is made up of a rotatable raceway member, a stationary raceway member and at least one row of rolling elements. The rotation sensor unit includes a to-be-detected member having a... Agent: Staas & Halsey LLP

20080157760 - System and method for hard drive component testing: Embodiments of the present invention include a method and System for Hard Drive component testing, particularly for magnetic recording head testing. The method of testing magnetic recording heads includes: performing a magnetic write width test (on a plurality of disk drive heads), sorting the plurality of heads into a first... Agent: Hitachi C/o Wagner Blecher LLP

20080157761 - Method and apparatus for calibrating a gradiometer: A magnetic screening system uses directional gradiometers with high resolution and accuracy to measure magnetic field signatures of target objects (e.g., gun, knife, cell phone, keys) in a volume of interest. The measured signatures can be compared to signatures of known objects stored in a local database. Various mathematical processes... Agent: Hamilton, Brook, Smith & Reynolds, P.c.

20080157762 - Optical decoupling, tuning and shimming of magnetic resonance coils: A magnetic resonance imaging system (10) includes a transmit coil (22) and one or more receive coils (32). The transmit coil includes one or more circuit segments (44, 44, 80, 90) including a light-sensitive metal-insulator-semiconductor capacitor (50) which is connected by an optic fiber to one of a plurality of... Agent: Philips Intellectual Property & Standards

20080157763 - Mr data acquisition method, mr image construction method, and mri system: An MR data acquisition method for acquiring data D_φfat according to a steady-state pulse sequence specifying that a phase of an RF pulse is varied in order of 0, 1×φfat, 2×φfat, etc., wherein φfat=(2−TR/T_out+2×m)×π is established on an assumption that m denotes an integer equal to or larger than 0... Agent: Partick W. Rasche Armstrong Teasdale LLP

20080157766 - Magnetic resonance imaging apparatus and magnetic resonance image data processing method: A magnetic resonance imaging apparatus 20 includes a phase difference calculation unit 44 configured to perform a one-dimensional Fourier transform on complex data not phase-encoded extracted from complex data of a nuclear resonant signal collected by dynamic scanning, and determining a phase difference in time of data obtained by performing... Agent: Nixon & Vanderhye, Pc

20080157764 - Magnetic resonance imaging apparatus, magnetic resonance imaging method, and diffusion tensor color map image generating apparatus: A magnetic resonance imaging apparatus for generating an image related to a radiographing area of a subject on the basis of a magnetic resonance signal produced in the radiographing area within a static magnetic field space, the magnetic resonance imaging apparatus includes: a fiber tracking device for tracking a running... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20080157765 - Method and device for monitoring radio-frequency exposure in a magnetic resonance measurement: In a method and device for monitoring the physiologically effective radio-frequency exposure in at least one specific volume region of an examination subject in a magnetic resonance data acquisition scan in a magnetic resonance system, the magnetic resonance system having a radio-frequency antenna structure with a number of individually controllable... Agent: Schiff Hardin, LLP Patent Department

20080157767 - Mri data acquisition using propeller k-space data acquisition: Disclosed is a new propeller EPI pulse sequence with reduced sensitivity to field inhomogeneities is proposed. Image artifacts such as blurring due to Nyquist ghosting and susceptibility gradients are investigated and compared with those obtained in previous propeller EPI studies. The proposed propeller EPI sequence uses a readout that is... Agent: Beyer Weaver LLP

20080157770 - Dual-tuned tem/birdcage hybrid volume coil for human brain and spectroscopy: A dual-tuned hybrid resonator coil for high field multinuclear MRI/MRS combines both the TEM and the BC designs, such that the mode splitting is significantly increased. The coil includes TEM elements and BC coil windows, where the TEM elements are positioned in each of the windows and oriented orthogonally thereto.... Agent: Bond, Schoeneck & King, Pllc

20080157768 - Open coil for magnetic resonance imaging: This document discusses, among other things, a system and method for a coil having a plurality of resonant elements with one or more openings between elements. In some instances, resonant elements are spaced such that an opening is defined between each pair of adjacent resonant elements. An impedance is coupled... Agent: Intellectual Property Group Fredrikson & Byron, P.a.

20080157769 - Whole-body antenna with microwave elements, and magnetic resonance system embodying same: A whole-body antenna for a magnetic resonance system has an antenna structure including at least one antenna rod extending in a longitudinal direction. The antenna rod can be charged with a transmission current to cause an excitation signal to be emitted that causes magnetic resonance signals to be excited in... Agent: Schiff Hardin, LLP Patent Department

20080157771 - Superconducting magnet configuration with reduced heat input in the low temperature regions: The invention concerns a magnet configuration comprising a superconducting magnet coil (1) within which a gradient system is to be switched. All low temperature oscillation systems (R1) with a temperature T1<10K within the magnet coil (1) are produced from a material having good electrical conducting properties, and at least one... Agent: Kohler Schmid Moebus

20080157772 - Radio frequency coil assembly and magnetic resonance imaging apparatus: A radio frequency coil assembly is provided. The radio frequency coil assembly includes: a first radio frequency coil for receiving a magnetic resonance signal from a tested body; a second radio frequency coil for receiving a magnetic resonance signal from the tested body; and a third radio frequency coil for... Agent: Nixon & Vanderhye, Pc

20080157773 - Method and apparatus for use of the real component of a magnetic field of multicomponent resistivity measurements: Multi-component induction measurements are made using a resistivity logging tool in an anistropic earth formation. A subset of the multi-component measurements are inverted to first determine horizontal resistivities. Using the determined horizontal resistivities and another subset of the multi-component measurements, the vertical resistivities are obtained. Results of using the in-phase... Agent: Madan, Mossman & Sriram, P.c.

20080157774 - Method for testing an electronic circuit for driving a dc-motor: The present invention relates to a method for testing an electronic circuit comprising a plurality of switching elements arranged in a H-bridge configuration, the electronic circuit being adapted to drive an associated DC-motor operatively connected to the H-bridge, the DC-motor being adapted to move an associated piston rod in an... Agent: Novo Nordisk, Inc. Intellectual Property Department

20080157775 - Relay device and corresponding method: The invention consists of a relay device including: at least one mode change device for changing the relay device from a normal mode to a test mode; an interface for receiving test script from a source; a waveform generator for running the test script received from the source and outputting... Agent: General Electric Co. Global Patent Operation

20080157776 - Measurement of analog coil voltage and coil current: A monitor circuit is provided which detects various incipient failure modes of a circuit breaker. The monitor circuit includes a processor and a primary circuit connected in circuit with the processor. The primary circuit may be configured for preventing transients and high currents associated with the operation of the circuit... Agent: General Electric Co. Global Patent Operation

20080157777 - Electromotive force computing device and state of charge estimating device: Error in an electromotive force Ve of a secondary battery calculated on the basis of a polarized voltage Vp is reduced. A polarized voltage computing section acquires multiple data pairs of a current I flowing to the secondary battery and a terminal voltage V of the secondary battery with respect... Agent: Christensen, O'connor, Johnson, Kindness, Pllc

20080157778 - Estmation method, device, and electronic system utilizing the same: An estimation method for estimating a remaining capacity of a battery utilized by an electronic system is disclosed. The voltage of the battery is detected or is determined by a first reference value. When the duration of a specific state arrives at a preset time, a specific action is executed.... Agent: Birch Stewart Kolasch & Birch

20080157779 - Prismatic battery short circuit inspection method, prismatic battery manufacturing method and current collector shape adjusting device: An object of the present invention is to easily detect a short circuit failure in a current collector of a prismatic battery and prevent a short circuit caused by an existence of a burr generated while cutting or a spatter generated while welding the current collector to an electrode plate.... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.c.

20080157780 - Location of high resistance ground faults on buried power-cables: The location of high resistance ground faults within buried co-axial power cables can be detected by transmitting a combined signal along the cable at a primary frequency of 0.718 Hz and a primary amplitude in the order of 4,500 volts peak to peak, This combined signal also has an interlocked... Agent: Ade & Company Inc.

20080157781 - Methods and systems for detecting series arcs in electrical systems: A method of detecting a series arc in an alternating current electrical system is provided. The method is a pattern-recognition based approach and includes passing raw current signals from a conductor in the electrical system through one or more filters to provide a filtered signal; extracting one or more features... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.l.p.

20080157782 - Analog boundary scanning based on stray capacitance: Embodiments of the present invention are directed to performing boundary scanning without using a pin which is exclusively dedicated for that purpose. The boundary scan can be performed by an integrated circuit by utilizing a pin which has an alternative use during ordinary operation of the integrated circuit and the... Agent: Apple C/o Morrison And Foerster ,llp Los Angeles

20080157783 - Apparatus and method for monitoring high voltage capacitors: State of a high voltage capacitor is monitored to detect partial discharge within the capacitor and approaching end-of-life of the capacitor. Partial discharge may be detected through an increased capacitance of the capacitor, and the resulting increase in the alternating current through the capacitor. Partial discharge may also be detected... Agent: Anatoly S. Weiser

20080157784 - Detection of the supply state of a load supplied by a variable voltage: A method and a circuit for detecting the state of supply of a load by a variable voltage, including measuring the difference between values representative of the variable supply voltage and of a voltage across the load.... Agent: Stmicroelectronics Inc. C/o Wolf, Greenfield & Sacks, P.c.

20080157785 - Method for determining the state of a spatially extended body: The invention relates to a long body, for example a gas-insulated electric line (1), the condition of which is tested by an electronic signal that is supplied to the body and then received by a receiver unit. The electronic signal has a predefined duration and form. The receiver unit receives... Agent: Lerner Greenberg Stemer LLP

20080157786 - Quality control methods for the manufacture of polymer arrays: Described are quality control methods and devices for the reproducible manufacturing and integrity monitoring of polymers on electrochemical synthesis and detection chips. The devices and methods allow for simultaneous manufacturing and synthesis of polymers.... Agent: Client 21058 C/o Darby & Darby P.c.

20080157787 - Sensitivity capacitive sensor: A method of creating an improved sensitivity capacitive fingerprint sensor involves forming vias from a first side of a sensor chip having an array of capacitive sensors, making the vias electrically conductive, and attaching a cover plate over the first side of the sensor chip spaced from the sensor chip... Agent: Morgan & Finnegan, L.l.p.

20080157788 - System and method for testing voltage endurance: A method for testing voltage endurance of a electronic component, includes: generating an oscillating signal; amplifying the oscillating signal; transforming the amplified oscillating signal to generate a transformed signal; blocking a negative voltage of the transformed signal to generate a test signal to be transmitted to the electronic component; and... Agent: Pce Industry, Inc. Att. Cheng-ju Chiang

20080157792 - Probe card and method of manufacturing the same: A probe card includes a first micro probe head (MPH), a second MPH, and needles. The first MPH includes first conductive traces into which a test signal for testing an object having outer terminals is inputted. The second MPH includes second conductive traces electrically connected to the first conductive traces,... Agent: Daly, Crowley, Mofford & Durkee, LLP

20080157795 - Probe head having a membrane suspended probe: A probe head with membrane suspended probes.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080157794 - Probe unit substrate: A ceramic substrate has, on its surface, a multilayer wiring division, on which micro cantilever type probes are fixed. The multilayer wiring division has the first conductor layer, which includes through-hole junction pads, flatness improvement rings surrounding the through-hole junction pads and a grounding region further surrounding the flatness improvement... Agent: Frishauf, Holtz, Goodman & Chick, Pc

20080157789 - Rotating contact element and methods of fabrication: Rotating contact elements and methods of fabrication are provided herein. In one embodiment, a rotating contact element includes a tip having a first side configured to contact a device to be tested and an opposing second side; and a plurality of deformed members extending from the second side of the... Agent: Moser Ip Law Group / Formfactor, Inc.

20080157790 - Stiffener assembly for use with testing devices: A stiffener assembly for use with testing devices is provided herein. In some embodiments, a stiffener for use with testing devices includes an inner member; an outer member disposed in a predominantly spaced apart relation to the inner member; and a plurality of alignment mechanisms for orienting the inner and... Agent: Moser Ip Law Group / Formfactor, Inc.

20080157791 - Stiffener assembly for use with testing devices: A stiffener assembly for use with testing devices is provided herein. In some embodiments, a stiffener assembly for use with testing devices can be part of a probe card assembly that can include a stiffener assembly comprising an upper stiffener coupled to a plurality of lower stiffeners; and a substrate... Agent: Moser Ip Law Group / Formfactor, Inc.

20080157793 - Vertical microprobes for contacting electronic components and method for making such probes: Multilayer probe structures for testing or otherwise making electrical contact with semiconductor die or other electronic components are electrochemically fabricated via depositions of one or more materials in a plurality of overlaying and adhered layers. In some embodiments the structures may include configurations intended to enhance functionality, buildability, or both.... Agent: Microfabrica Inc. Att: Dennis R. Smalley

20080157796 - Chuck with integrated wafer support: An improved chuck with lift pins within a probe station.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080157797 - Probe, probe card, and testing device: An object is to provide a probe, a probe card, and a testing device which can precisely perform a test for conductive state of a conductive wiring in, for example, a through hole or a contact hole provided in a circuit board. Provided is a probe (10) for performing a... Agent: Kratz, Quintos & Hanson, LLP

20080157798 - On-die heating circuit and control loop for rapid heating of the die: An integrated circuit includes a heating circuit configured to heat the integrated circuit under the control of a controller. A transfer function with adjustable pole, zero and overall gain is implemented in the controller such that a temperature response of the integrated circuit can be changed by adjusting one or... Agent: Brinks Hofer Gilson & Lione/marvell

20080157799 - Resilient contact element and methods of fabrication: Embodiments of resilient contact elements and methods for fabricating same are provided herein. In one embodiment, a resilient contact element for use in a probe card includes a lithographically formed resilient beam having a first end and an opposing second end; and a tip disposed proximate the first end of... Agent: Moser Ip Law Group / Formfactor, Inc.

20080157804 - Carrier module for adapting non-standard instrument cards to test systems: A carrier module that is able to adapt non-standard instrument cards to the architecture of a test system is disclosed. Instrument cards based on non-standard architectures may be combined on a single carrier module. The carrier module is then plugged into the test head of the test system. The carrier... Agent: Morrison & Foerster, LLP

20080157805 - Carrier module for adapting non-standard instrument cards to test systems: A carrier module that is able to adapt non-standard instrument cards to the architecture of a test system is disclosed. Instrument cards based on non-standard architectures may be combined on a single carrier module. The carrier module is then plugged into the test head of the test system. The carrier... Agent: Morrison & Foerster, LLP

20080157801 - Characterization of micromirror devices using reset drivers: An array of individually addressable micromirrors is characterized by sending a driving signal to a pixel group having a fewer number of micromirrors. A response of the micromirrors in the group is measured; and the micromirror array is characterized based upon at least the measured response.... Agent: Texas Instruments Incorporated

20080157803 - Die testing using top surface test pads: Timely testing of die on wafer reduces the cost to manufacture ICs. This disclosure describes a die test structure and process to reduce test time by adding test pads on the top surface of the die. The added test pads allow a tester to probe and test more circuits within... Agent: Texas Instruments Incorporated

20080157802 - Direct detect sensor for flat panel displays: Each sensor of a linear array of sensors includes, in part, a sensing electrode and an associated feedback circuit. The sensing electrodes are adapted to be brought in proximity to a flat panel having formed thereon a multitude of pixel electrodes in order to capacitively measure the voltage of the... Agent: Townsend And Townsend And Crew, LLP

20080157800 - Teg pattern and method for testing semiconductor device using the same: A TEG pattern comprises: a plurality of device isolation layer patterns having a predetermined gap; an active area pattern between adjacent device isolation layer patterns; and metal 1 contact patterns in the active region pattern.... Agent: The Law Offices Of Andrew D. Fortney, Ph.d., P.c.

20080157807 - Picker for use in a handler and method for enabling the picker to place packaged chips: Provided is a picker for use in a handler, including at least one picker base, a row of nozzles provided to each of the picker base, and a detecting unit, provided to one side of each of the nozzle, for detecting if a packaged chip exists in a carrying hole... Agent: Ked & Associates, LLP

20080157806 - Test socket for semiconductor: The present invention relates to a test socket for a semiconductor device, which may correspond to a narrow pitch of terminal interval and high speed test in a simplified structure, thereby reducing manufacturing cost thereof. The test socket for a semiconductor device includes conductive substrates having contact point parts exposed... Agent: Porter, Wright, Morris & Arthur LLP Attn: Intellectual Property Department

20080157808 - Wafer-level burn-in and test: Techniques for performing wafer-level burn-in and test of semiconductor devices include a test substrate having active electronic components such as ASICs mounted to an interconnection substrate or incorporated therein, metallic spring contact elements effecting interconnections between the ASICs and a plurality of devices-under-test (DUTs) on a wafer-under-test (WUT), all disposed... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080157809 - Display panel and short circuit detection device thereof: A pixel unit including a pixel electrode, a scan electrode, a common voltage electrode, a data electrode and at least one redundancy electrode is provided. During the fabricating process of the pixel unit, if a particle is simultaneously located between any two of the pixel electrode, the scan electrode and... Agent: Jianq Chyun Intellectual Property Office

20080157810 - Method for testing liquid crystal display panels: A method for testing a liquid crystal display panel is provided. The gate drivers are integrated onto the panel. The method includes simultaneously inputting a clock signal, an inverted clock signal, and a pull down signal into clock signal, inverted clock signal, and pull down signal input ends of the... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP