Electricity: measuring and testing inventions 04/08

20080094051 - Demultiplexed nanowire sensor array for detection of chemical and biological species: A demultiplexed nanowire sensor array for detecting different chemical and biological species are provided, comprising a sensor array and a demultiplexer array. Methods of detecting at least two chemical and/or biological species are also provided, using the demultiplexed nanowire sensor array.... Agent: Hewlett Packard Company

20080094053 - Test circuits having ring oscillators and test methods thereof: In a test circuit, an oscillation signal is generated based on a design rule pattern of a chip formed on a wafer. The oscillation signal is counted using a counter, and an N-bit signal is generated from the counting of the oscillation signal. The N-bit signal is serialized and output.... Agent: Harness, Dickey & Pierce, P.L.C

20080094052 - Voltage detector circuit: A voltage detection circuit for accurately detecting a voltage that is unaffected by fluctuation due to variations in transistor characteristics and threshold voltage. The voltage detection circuit includes a reference current generating section and a detecting section. The reference current generating section includes a voltage-controlled current source that includes a... Agent: Murabito, Hao & Barnes LLP

20080094054 - Fuel cell state monitor apparatus and method: An object of the present invention is to provide a fuel cell state monitor apparatus and method wherein detection errors can be reduced in a stable manner even when the ambient temperature fluctuates. The present invention includes temperature detection means for detecting the ambient temperature of fuel cells, state value... Agent: Kenyon & Kenyon LLP

20080094055 - Chopped hall effect sensor: A chopped Hall effect sensor topology includes a switched Hall plate, an amplifier responsive to an output of the switched Hall plate and a filter stage responsive to the output of the amplifier and including an anti-aliasing filter and a selective filter that is tuned to the modulation frequency. The... Agent: Daly, Crowley, Mofford & Durkee, LLP

20080094056 - Device and method for detecting battery voltage level: A device and an associated method for detecting a voltage level of a battery are disclosed. The device employs an analog-to-digital converter or digital-to-analog converter to accurately detecting the voltage level. In one embodiment, the device includes a digital-to-analog converter, a comparison circuit, and a microprocessor. The digital-to-analog circuit outputs... Agent: Troxell Law Office PLLC Suite 1404

20080094057 - Position measurement system employing total transmitted flux quantization: A device for measuring the position (location and orientation) in the six degrees of freedom of a receiving antenna with respect to a transmitting antenna utilizing transmitter charge quantization. The transmitting component consists of a transmitting antenna of known location. The transmitting antenna is driven by a pulsed excitation. The... Agent: H. Jay Spiegel - H. Jay Spiegel & Associates

20080094058 - Magnetic rotor and rotational angle sensing apparatus having the same: In a magnetic rotor, a rotatable shaft is received through a holder. A positioner is made of a magnetic material and is fitted into at least one of an outer peripheral wall of the rotatable shaft and an inner peripheral wall of the holder to position the holder relative to... Agent: Nixon & Vanderhye, PC

20080094059 - Magnetic film sensor and method of manufacturing the same: A magnetic film sensor comprises a magnetic film for generating a magnetostriction, and a magnetostrictive structure for generating a magnetostriction in the magnetic film. The magnetostrictive structure is constructed so as to generate a magnetostriction by curving the magnetic film, for example. The magnetostrictive structure is obtained, for example, by... Agent: Oliff & Berridge, PLC

20080094060 - Electric current detector: An electric current detector has a bus bar with a current direction changing section for changing a direction of electric current through the bus bar, and a magnetic detector disposed in the current direction changing section of the bus bar. The current direction changing section of the bus bar has... Agent: Scully Scott Murphy & Presser, PC

20080094062 - Active-passive electromagnetic shielding to reduce mri acoustic noise: The present invention provides an apparatus for reducing acoustic noise in a magnetic resonance imaging device including passive shielding located outside the actively shielded gradient winding elements in order to reduce the magnitude of fields that spread outside the gradient coil assembly in unwanted directions and interact with the magnet... Agent: Hoffman Warnick & D'alessandro, LLC

20080094063 - Birdcage resonator with coupling rings in addition to the ferrules: A birdcage resonator for magnetic resonance applications has two ferrules disposed in spaced-apart parallel ferrule planes. A line connecting the ferrule centers defines the antenna axis of the birdcage resonator, which orthogonally intersects the ferrule planes. The birdcage resonator has a number of antenna rods regularly distributed around the antenna... Agent: Schiff Hardin, LLP Patent Department

20080094061 - Use of multiple sensors in a nuclear quadropole resonance detection system to improve measurement speed: The use of multiple sensors improves the measurement speed of a nuclear quadrupole resonance detection system when the nuclear quadrupole resonance frequency is known only within a range of frequencies.... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center

20080094064 - Magnetic resonance system with circular gradient system and non-circular whole-body coil: A magnetic resonance system has a basic field magnet system that annularly surrounds an examination volume, a gradient system arranged radially within the basic magnetic system, a radio-frequency shield arranged radially within the gradient system and a whole-body coil arranged radially within the radio-frequency shield. The gradient system is essentially... Agent: Schiff Hardin, LLP Patent Department

20080094065 - Metal detector: A real time electronic metal detector including a magnetic transmitter (1) and a receiver (3), wherein the receiver includes approximate sine-wave weighted synchronous demodulation and a switched voltage signal is applied to the magnetic transmitter and the said receiver approximate sine-wave weighted synchronous demodulation is selected to receive synchronously with... Agent: Brooks Kushman P.C.

20080094066 - Methods and apparatus for subsurface geophysical exploration using joint inversion of steady-state and transient data: Methods and apparatus are provided for controlled source electromagnetic surveying. In particular, a time-varying electromagnetic signal is transmitted at a first location, and an electromagnetic signal responsive to the transmitted signal is received at a second location, wherein the received signal includes a transient response component and a steady-state component.... Agent: Law Office Of James Trosino

20080094067 - Three-axis marine electric field sensor for seafloor electrical resistivity measurement: A sensor for electric field measurement at the floor of a body of water has at least one pair of square or rectangular electrodes (139, 140) with a known area positioned in parallel separated by a distance and connected by a resistor (120) having a value that matches the resistance... Agent: Procopio, Cory, Hargreaves & Savitch LLP

20080094068 - Kelvin connector including temperature sensor: The electrical measuring apparatus (17) and temperature sensing apparatus minimises the number of connections required for each contact (30, 31) of a battery (18). The present invention measures the core temperature of the battery (18) which is useful in monitoring the health of the battery (18). The apparatus comprises first... Agent: Baker & Daniels LLP

20080094069 - Method and apparatus for monitoring the condition of a battery by measuring its internal resistance: A method for evaluating the condition of a battery comprises coupling a first power transistor as or as part of a first external load in series with the battery, coupling a second power transistor as or as part of a second external load in series with the battery, and conducting... Agent: Michael De Angeli Michael M. De Angeli, P.C.

20080094070 - Linear analog sensor for in line measurement of the conductivity of beer and similar liquids: A fluid conductivity test device for testing the conductivity of a fluid in a container. The device includes a fitting that may mate either directly to or indirectly to a tap on, for example, a keg, to allow the fluid in the container to come into contact with the sensor... Agent: St. Onge Steward Johnston & Reens, LLC

20080094071 - Semiconductor device and test system which output fuse cut information sequentially: A semiconductor device includes a plurality of fuses, and a plurality of latch circuits respectively electrically connected to the plurality of fuses. The plurality of latch circuits are configured to store respective fuse-cut information from the plurality of fuses, and to then sequentially transmit the fuse-cut information through the latch... Agent: Volentine & Whitt PLLC

20080094072 - Apparatus for extending the bandwidth of vector network analyzer receivers: A system for measuring a frequency response of an electrical network, comprises a signal source, a signal source path, a reflectometer receiver interactively associated with the signal source path by a directional coupler, and one or more additional reflectometer receivers arranged in series along the signal source path and associated... Agent: Fliesler Meyer LLP

20080094073 - Method and device for measuring width direction end position of stripe body, and method and device for measuring width direction center position of stripe body: A microwave sending antenna 3R and a microwave receiving antenna 4R are provided to a right-side furnace wall 1R, and the system is devised so that the microwaves emitted from the microwave sending antenna 3R are reflected by the right-side edge of a cold-rolled steel plate 2, and the reflected... Agent: Frishauf, Holtz, Goodman & Chick, PC

20080094074 - Transistor with floating gate and electret: A sensor includes a field effect transistor having a source, drain, a control gate and floating gate, wherein the floating gate has an extended portion extending away from the control gate. A sensing gate is capacitively coupled to the extended portion of the floating gate. A polymer electret sensing coating... Agent: Schwegman, Lundberg & Woessner, P.A.

20080094075 - Micromachined capacitive sensor and linkage: In accordance with the invention, a surface capacitive sensor is mechanically coupled to a conventional macrostructure actuator to measure the displacement of the actuator along a measurement axis with high accuracy.... Agent: Agilent Technologies Inc.

20080094077 - Capacitive position sensor: A capacitive touch sensor is provided having sensing path for setting a parameter to a desired value within a range. The sensor has a first mode of operation in which a parameter can be set approximately to a desired value and a second mode in which the value can be... Agent: David Kiewit

20080094076 - Method and apparatus for sensing a time varying current passing through an ion channel: A capacitive sensing system (2, 2′, 2″) is used to measure a timevarying ion current through a channel (50), such as an ion channel or protein pore. Such a capacitive system (2, 2′, 2″) does not suffer problems of electrode corrosion and, when used with methods to control a build... Agent: Diederiks & Whitelaw, PLC

20080094078 - Carbon nanotube biosensors with aptamers as molecular recognition elements and method for sensing target material using the same: The present invention relates to a carbon nanotube transistor biosensor with aptamers and a method for detecting a target material using the same, more particularly to a carbon nanotube transistor biosensor recognizing the target material, i.e., a specific molecule (such as a protein, a peptide, an amino acid, and an... Agent: Frommer Lawrence & Haug

20080094079 - Gas concentration detection apparatus having function for detecting sensor element activation status: A gas concentration detection apparatus includes a series-connected combination of a sensor element and a resistor, with an AC voltage being applied to one of the outer terminals of that combination and with the other outer terminal being held at a fixed potential. A DC voltage signal at a level... Agent: Nixon & Vanderhye, PC

20080094080 - Method for evaluating a potentiometer and circuit arrangement having a potentiometer: A potentiometer (PT1, PT2) has a first terminal (A1), a second terminal (A2) and an intermediate tap (ZA), a resistor being between the first terminal (A1) and the second terminal (A2) irrespective of the position of the potentiometer (PT1, PT2). In an evaluation method, a first drive voltage (GND) and... Agent: Alston & Bird LLP

20080094081 - Continuous linear scanning of large flat panel media: A system performs continuous full linear scan of a flat media. The system includes, in part, a chuck, and at least first, second and third gantries. The chuck is adapted to support the flat media during the test. The first gantry includes at least one linear array of non-contacting sensors... Agent: Townsend And Townsend And Crew, LLP

20080094082 - Die infrared transceiver bus: A semiconductor wafer adapted to wirelessly transfer data to a testing system. The wafer comprises a plurality of dies, each die adjacent another die and each die comprising an infrared transceiver. A first infrared transceiver transfers data to a second infrared transceiver by emitting a pattern of infrared light pulses... Agent: Texas Instruments Incorporated

20080094084 - Multi-layer electric probe and fabricating method thereof: A multi-layer electric probe, suitable for testing a to-be-tested device, includes a first strip layer and a second strip layer. The first strip layer has a first conductivity and a first mechanical strength. The second strip layer has a second conductivity and a second mechanical strength. The first strip layer... Agent: Jianq Chyun Intellectual Property Office

20080094083 - Versatile materials probe: Disclosed is an electrical measurement probe including two probe blocks, each probe block having a connection face and a measurement face. Each probe block also includes a plurality of spring loaded pogo pins. Each pogo pin has a first end that extends to the connection face and a second end... Agent: Cantor Colburn LLP - IBM Rochester Division

20080094085 - Metalized elastomeric probe structure: A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously... Agent: Wayne L. Ellenbogen Ryan, Mason & Lewis, LLP

20080094086 - Stack-type semiconductor package sockets and stack-type semiconductor package test systems: A stack-type semiconductor package socket may include: a first package connection portion for connection with leads of a lowermost package of a stack-type semiconductor package; a second package connection portion for connection between pads of an odd-numbered package and leads of an even-numbered package, wherein the odd-numbered package and the... Agent: Harness, Dickey & Pierce, P.L.C

20080094087 - Device for detecting chip location and method of detecting chip location using the device: In a device for detecting a chip location and a method of detecting a chip location using the device, the device includes a chuck to which a wafer to be inspected is fixable, an infrared irradiation unit capable of irradiating infrared light to a target semiconductor chip of the wafer... Agent: Mills & Onello LLP

20080094088 - Method and system for compensating thermally induced motion of probe cards: The present invention discloses a method and system compensating for thermally induced motion of probe cards used in testing die on a wafer. A probe card incorporating temperature control devices to maintain a uniform temperature throughout the thickness of the probe card is disclosed. A probe card incorporating bi-material stiffening... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080094090 - Probe: A probe available for a narrow pitch pad without the need of cleaning is realized by providing a z deformed portion that is elastically deformed in a vertical direction, and a zθ deformed portion that is serially connected to the z deformed portion to rotate while being elastically deformed at... Agent: Haynes And Boone, LLP

20080094089 - Semiconductor probe having embossed resistive tip and method of fabricating the same: A semiconductor probe having an embossed resistive tip and a method of fabricating the semiconductor probe are provided. The semiconductor probe includes a protrusion portion protruded to a predetermined height on a cantilever in a first direction crossing a length direction of the cantilever, an embossed resistive tip formed on... Agent: Sughrue Mion, PLLC

20080094091 - Dynamic burn-in systems and apparatuses: A burn-in apparatus with a radio frequency signal generator is provided. One embodiment includes a printed circuit board to carry a plurality of semiconductor devices for a burn-in process and a radio frequency signal generator mounted on the printed circuit board to provide a plurality of radio frequency signals to... Agent: Ivy Y. Mei

20080094092 - Mechanism for detection and compensation of nbti induced threshold degradation: The embodiments of the invention provide an apparatus and method for detection and compensation of negative bias temperature instability (NBTI) induced threshold degradation. A semiconductor device is provided comprising at least one stress device having a voltage applied to its gate node and at least one reference device having a... Agent: Frederick W. Gibb, Iii Gibb & Rahman, LLC

20080094096 - Semiconductor testing equipment and semiconductor testing method: In testing a large number of semiconductor devices, semiconductor testing equipment of the present invention is provided with combination determining unit 105 that determines the combination of semiconductor devices to be simultaneously tested among semiconductor devices to be tested, on the basis of one of determination results or measured values... Agent: Steptoe & Johnson LLP

20080094093 - Universal array type probe card design for semiconductor device testing: A universal system for testing different semiconductor devices provides a probe head with a probe pattern that may be used to test different test patterns formed on different semiconductor devices. Each of a plurality of bumps or pads of the test pattern contacts a corresponding probe of the probe head... Agent: Duane Morris LLPIPDepartment (tsmc)

20080094095 - Apparatus and method for linked slot-level burn-in: A Burn-In Board (BIB) transfer module that links a Burn-In Board (BIB) Loader/Unloader (BLU) to a burn-in chamber rack. The BIB transfer module is capable of transferring a BIB between the BLU and the burn-in chamber rack by moving the BIB in at least two perpendicular directions while minimizing the... Agent: Marger Johnson & Mccollom, P.C. - Intel

20080094094 - Apparatus for testing a semiconductor device: An apparatus for testing a semiconductor device that has opposing first and second sides is provided. The semiconductor device includes at least one functional unit on the first side and a plurality of terminals on the second side. The apparatus may include, but is not limited to, a mounting structure,... Agent: Dickstein Shapiro LLP

20080094098 - Device under test power supply: A power supply includes a first amplifier, a first current stage, and a second current stage. The first amplifier is configured to set an output voltage equal to a fixed input voltage for supplying to a device. The first current stage is configured to source and sink a first range... Agent: Dicke, Billig & Czaja

20080094097 - Method of testing a power supply controller and structure therefor: A power supply controller (20) is configured to operate in a test mode that facilitates measuring the value of an output signal of an error amplifier (36) of the power supply controller (20).... Agent: Semiconductor Components Industries, LLC Intellectual Property Dept. - A700

20080088295 - Miniature modified faraday cup for micro electron beams: A micro beam Faraday cup assembly includes a refractory metal layer with an odd number of thin, radially positioned traces in this refractory metal layer. Some of the radially positioned traces are located at the edge of the micro modified Faraday cup body and some of the radially positioned traces... Agent: Eddie E. Scott Assistant Laboratory Counsel

20080088296 - Load side voltage sensing for ami metrology: Disclosed are apparatus and methodology subject matters for providing improved functionality of a meter in a 2-way communications arrangement, such as an Advanced Metering System (AMS) or Infrastructure (AMI). More particularly, the present technology relates to methodologies and apparatus for providing load side voltage sensing for utility meters which preferably... Agent: Dority & Manning, P.A.

20080088297 - Load side voltage sensing for ami metrology: Disclosed are apparatus and methodologies for providing improved functionality of a meter in a 2-way communications arrangement, such as an Advanced Metering System (AMS) or Infrastructure (AMI). More particularly, the present technology relates to methodologies and apparatus for providing load side voltage sensing for utility meters which preferably are operable... Agent: Dority & Manning, P.A.

20080088298 - Hall sensor temperature drift control: Disclosed are apparatus and methodology for providing approaches to remove or reduce thermal drift of the magnetic sensitivity of Hall sensor devices, to improve the stability of resulting signals of interest. Samples of a particular signal or signals of interest having improved stability make for advantageous use in conjunction with... Agent: Dority & Manning, P.A.

20080088299 - Attachment device and method for fastening electrical cable monitoring instruments to electrical cables: The present invention is an attachment device and a method for fastening and removing an electrical cable monitoring instrument to an electrical cable. The attachment device comprises monitoring instrument sensor with opening for positioning electrical cable such that said electrical cable can be positioned to pass through the sensitive volume... Agent: Intellectual Property Strategists, LLC

20080088300 - Device for determining electrical variables: A device for determining electrical variables, having a housing and an electrical main conductor, which is provided for conducting a load current, and which has a measuring section, having an electrical evaluation unit which is connected to the electrical main conductor in an electrically conductive manner, the measuring section being... Agent: Kenyon & Kenyon LLP

20080088301 - Testing device handler: A semiconductor testing handler includes a chamber, at least one chuck attached within the chamber, and a plurality of heating elements disposed to place heat into the chamber. The semiconductor testing handler also includes an air handler disposed to move air through the chamber, and at least one temperature sensor... Agent: Schwegman, Lundberg & Woessner, P.A.

20080088302 - Bipolar interrogation for magnetostrictive transducers: A magnetostrictive-based sensor is disclosed which obtains higher return signals through the use of multiple consecutive input pulses... Agent: Westman Champlin & Kelly, P.A.

20080088303 - Concept for detecting a contact with a game device: A method of detecting a contact between a player and a ball in a ball game, comprising a step of generating a magnetic field which may be associated with the player, the magnetic field being generated with a code sequence or a frequency which differ from a code sequence or... Agent: Glenn Patent Group

20080088304 - Method and apparatus for measuring magnetic anisotropy of a conductive wire or tape: A method and apparatus for measuring the magnetic field anisotropy of critical currents in conductive wires and conductive tapes having lengths of at least one meter. In one embodiment, the method and apparatus are adapted to measure the magnetic field anisotropy of critical currents in superconducting wires and tapes. The... Agent: Los Alamos National Security, LLC

20080088306 - Method for adjustment of a shim device of a magnetic resonance apparatus: In a method for adjustment of a shim device of a magnetic resonance apparatus before an image acquisition in a body region that has a volume of interest, a field distribution is measured in a region encompassing the volume of interest produced with a shim device set according to a... Agent: Schiff Hardin, LLP Patent Department

20080088307 - Method for determination and evaluation of a shim parameter set for controlling a shim device in a magnetic resonance apparatus: In a method for determination and evaluation of a shim parameter set for controlling a shim device in a magnetic resonance (MR) apparatus, the shim device is set using a first shim parameter set, a first field distribution is measured in a body region encompassing a target volume from which... Agent: Schiff Hardin, LLP Patent Department

20080088305 - Radio frequency field localization: Technology for controlling non-uniformity in the B1 field includes selecting the phase, magnitude, frequency, time, or spatial relationship among various elements of a multi-channel excitation coil in order to control the radio frequency (RF) power emanating from the coil antenna elements. Non-uniformity can be used to steer a constructively interfering... Agent: Glenn M. Seager Crompton Seager Tufte LLC

20080088308 - Methods of in vitro analysis using time-domain nmr spectroscopy: An in vitro method of determining an analyte concentration of a sample includes placing the sample into a low-field, bench-top time-domain nuclear magnetic resonance (TD-NMR) spectrometer. The NMR spectrometer is tuned to measure a selected type of atom. A magnetic field is applied to the sample using a fixed, permanent... Agent: Nixon Peabody LLP

20080088309 - Field generating unit of a combined mr/pet system: An RF antenna arrangement of a combined MR/PET system is disclosed. In at least one embodiment, the RF antenna arrangement includes a first part installed in the examination tunnel in a fashion fixed to the system such that it is arranged underneath the couch board when the latter is introduced,... Agent: Harness, Dickey & Pierce, P.L.C

20080088310 - Magnetic field generating apparatus and mri apparatus: To achieve a good balance among the magnetic field intensity, region of homogeneous magnetic field intensity and cost, a magnetic field generating apparatus for generating a magnetic field in a vertical direction comprises: a pair of magnets having respective magnetic poles with mutually opposite polarities disposed to face each other... Agent: Patrick W. Rasche (20459) Armstrong Teasdale LLP

20080088311 - Magnetic resonance apparatus: A magnetic resonance apparatus in which magnetic metal pieces are accommodated in an accommodation section so as to correct uniformity in a main magnetic field, includes an acquisition unit which acquires temperature information related to at least one of a temperature of the magnetic metal pieces accommodated in the accommodation... Agent: Nixon & Vanderhye, PC

20080088312 - Completely automatic mas-nmr apparatus: A MAS (magic angle spinning) NMR (nuclear magnetic resonance) apparatus, with automatic sample supply by a supply unit (45), is characterized in that an automatic preparation station (44) for samples is provided, with a rotor storage (49) having several rotors (1) for receiving sample material (53) soaked with NMR solution... Agent: Kohler Schmid Moebus

20080088313 - Method and apparatus for combined induction and imaging well logging: An induction logging device is provided with additional electrodes. One set of electrodes provides voltages that are indicative of the current distribution in the borehole. The output of the first set of electrodes may be used for estimating formation resistivity. A second set of electrodes may be used to provide... Agent: Madan, Mossman & Sriram, P.C.

20080088316 - Latent-image measuring device and latent-image carrier: A latent-image measuring device that measures the state of a photoconductor. The latent-image measuring device emits a charged-particle beam to the photoconductor to detects a charged-particle signal obtained through the emission of the charged-particle beam. The latent-image measuring device then exposes the photoconductor a plurality of times to form electrostatic... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080088314 - Methods and apparatus for analyzing partial discharge in electrical machinery: Methods and apparatus for analyzing electrical insulation of an electrical machine are provided. The method includes receiving a first signal that includes a plurality of partial discharge pulses from the electrical machine and a plurality of noise pulses, receiving other signals that includes information relative to at least one process... Agent: John S. Beulick (17851)

20080088315 - Device and system for the measurement of an external electrostatic field, and system and method for the detection of storms: The invention relates to a device for measuring an external electrostatic field, for example, for the detection of storms. The inventive device consists of a first conductor element (1); an amplifier (2) in charge configuration; an electronic control device (3) comprising an input (3a) which can be connected to the... Agent: Katten Muchin Rosenman LLP

20080088317 - Detection circuit for measurement of test lead and using the same: A low error, plugged test lead detecting circuit for providing accurate current measurement and the method using the same. When a test lead of the plugged detecting circuit is plugged into a split contact jack of the plugged detecting circuit, the circuit stops oscillating during operations for a test lead... Agent: Birch Stewart Kolasch & Birch

20080088318 - Method to test transparent-to-test capacitors: An inexpensive process for verifying that a capacitor, which would be difficult to detect using in-circuit testing techniques if the capacitor were a conventional two-terminal capacitor, has been properly installed on a circuit board involves incorporating into the circuit a feedthrough capacitor having at least two internally electrically connected terminals,... Agent: Delphi Technologies, Inc.

20080088319 - Calibration apparatus, calibration method, and testing apparatus: There is provided a calibration apparatus that calibrates a jitter measuring circuit. The jitter measuring circuit includes a jitter signal generating section that generates a jitter signal of which duration of at least one of High logic or Low logic changes according to a jitter in an input signal, and... Agent: Osha Liang L.L.P.

20080088320 - Network measuring and apparatus for magnitude and phase portion independently: Reference demodulated signals are applied to the device under test, or reference modulated signals are generated from the output signals of the device under test; each component of the output signals is generated from the output signals of the device under test; each component of the reference modulated signals is... Agent: Agilent Technologies Inc.

20080088321 - Ice measurement: A method and apparatus are provided for directly measuring the ice fraction in an ice slurry. Spaced electrodes measure the electrical property of the slurry, such as capacitance across the electrodes, or alternatively conductance or other electrical characteristics. That signal is then translated into an ice fraction by a microprocessor... Agent: Pyle & Piontek LLC

20080088322 - Semiconductor device fabrication method and semiconductor device: A semiconductor device having sufficient sensitivity, strength, and the like and a method for fabricating such a semiconductor device. In a method for fabricating a semiconductor device which detects the shape of a skin surface by detecting capacitance formed between the skin surface and a conductive film between which a... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080088323 - Control and method for a capacitive sensor system: A control and method for an e-field sensor touch switch system includes an output having a first output voltage based on a static capacitance sensed by an e-field sensor and a gain module that generates a final output voltage based on amplifying a difference between an offset voltage and the... Agent: Harness, Dickey & Pierce, P.L.C

20080088324 - Method and installation for analyzing an integrated circuit: The invention concerns a method for analyzing an integrated circuit. The method includes, for a plurality of surface points of the integrated circuit, following steps: applying (102) a laser radiation, in one point of the surface of the integrated circuit; exciting (106) the circuit; collecting (108) the response of the... Agent: Young & Thompson

20080088328 - Grounding scheme for high speed probing with reduced loop area: A grounding scheme for improved high speed probing of a system-under-test (“SUT”) using a ground rail positioned on the SUT near each side of a package attached to the SUT having signal access points, whereby each of the ground rails are electrically connected to a ground access point of the... Agent: Mcandrews Held & Malloy, Ltd

20080088325 - Method and system for performing embedded diagnostic application at subassembly and component level: A method for performing a diagnostic test on a piece of equipment comprises performing a component level diagnostic test on the piece of equipment, the component level diagnostic test employing a component-level model of the piece of equipment; using the results of the component-level diagnostic test to determine whether a... Agent: Agilent Technologies Inc.

20080088327 - Probe cards employing probes having retaining portions for potting in a potting region: Method and apparatus using a retention arrangement for probes used for electrical testing of a device under test (DUT). The apparatus has a number of probes each of which has a connect end for applying a test signal, a retaining portion, at least one arm portion and a contact tip... Agent: Lumen Patent Firm, Inc.

20080088326 - Wafer test head architecture and method of use: A wafer test head and ATE for testing semiconductor wafers. The wafer test head having a plurality of sides that can each be used to test a different semiconductor wafer. The architecture of the wafer test head enables electrical connections to probe card located on two different sides of the... Agent: Verigy

20080088329 - Systems configured for utilizing two or more multiple different semiconductor components configurations, methods of providing semicondutor components within sockets, and methods of retaining semiconductor component configurations within sockets: The invention includes methods of utilizing removable mechanical precising mechanisms and/or optical-based precising mechanisms to align chips within sockets. The sockets can be configured so that compression of the sockets opens a clamping mechanism. A chip can be placed within a socket with a manipulator and aligned during compression of... Agent: David G. Latwesen, Ph.d. Wells St. John P.s.

20080088330 - Nonconductive substrate with imbedded conductive pin(s) for contacting probe(s): A device for contacting and testing selected probes of an array of probes is described herein. The device includes a nonconductive substrate and a conductive pin imbedded in the nonconductive substrate.... Agent: Schwabe, Williamson & Wyatt, P.C.

20080088331 - Socket for test: A socket for test includes: a support block, having a first face and a second face different from the first face, and formed with through holes; probes, provided in the through holes, and electrically connected to terminals of a device to be tested provided on a side of the first... Agent: Morgan Lewis & Bockius LLP

20080088332 - High density cantilevered probe for electronic devices: Probes for electronic devices are described. The probe is formed by ball bonding a plurality of wires to contact locations on a fan out substrate surface. The wires are cut off leaving stubs. A patterned polymer sheet having electrical conductor patterns therein is disposed over the stubs which extend through... Agent: Daniel P. Morris IBM Corporation,

20080088333 - Semiconductor device and test method thereof: A semiconductor device includes: a command control circuit for decoding a command signal to output a test signal and a normal control signal; a normal circuit for performing a predetermined operation in response to the normal control signal; and a test circuit for testing electrical characteristics of unit elements provided... Agent: Mcdermott Will & Emery LLP

20080088334 - Semiconductor device with multipurpose pad: It is provided a semiconductor device with an ability to receive various test signals and check test results in spite of a limited number of pads. The semiconductor device includes a signal transferring unit for transferring a power signal input through a multipurpose pad into a core area or delivering... Agent: Mcdermott Will & Emery LLP

20080088335 - Packaging reliability superchips: A test chip module for testing the integrity of the nip chip solder ball interconnections between chip and substrate. The interconnection, are thermally stressed through an array of individual heaters formed in a layer of chip metallurgy to provide a uniform and ubiquitous source of heat. Current is passed through... Agent: John A. Jordan, Esq.

20080088337 - Apparatus for inspecting a display device and method for inspecting the display device: An apparatus for inspecting a display device includes an inspection substrate and a power supply part. The inspection substrate is electrically connected to a flexible circuit film that is connected to a display panel of the display device. The inspection substrate outputs inspection signals inspecting a connection between the display... Agent: Frank Chau, Esq. F. Chau & Associates, LLC

20080088336 - System and method for testing the electromagnetic susceptibility of an electronic display unit: A system and method for testing the electromagnetic (EM) susceptibility of an electronic display unit monitors the light emitted from the electronic display unit as EM noise is applied at a particular testing location of the electronic display unit. An error in the electronic display unit caused by the EM... Agent: Wilson & Ham Pmb: 348

20080084199 - Method for eliminating the need to zero and calibrate a power meter before use: An improved power sensor having an input connector connected to an input port having a center pin and a ground side; an amplifier; first and second detectors; and a thermal stabilization system, including a thermal mass disposed between the ground side of the input connection and the detectors, a ground... Agent: Stainbrook & Stainbrook, LLP

20080084200 - Method and apparatus for dc integrated current sensor: Integrated current sensors are used in DC electric power systems. An integrated current sensor (200B) according to one embodiment comprises: a DC inductor (111B) including a resistive component and an inductive component, wherein a DC current passes through the DC inductor (111B); an integrator circuit (161), the integrator circuit (161)... Agent: Oral Caglar Honeywell International Inc.

20080084201 - Method and apparatus for ac integrated current sensor: Integrated current sensors are used in AC electric power systems. An integrated current sensor according to one embodiment comprises: an inductor (101), wherein an AC current passes through the inductor (101); an integrator circuit (103), the integrator circuit (103) receiving a voltage associated with the AC current; a gain control... Agent: Oral Caglar Honeywell International Inc.

20080084202 - Vehicular rotation speed sensing apparatus: A vehicular rotation speed sensing apparatus contains a base, a spindle pivoted inside the base, whose one end is mounted to a magnetic force device axially. The vehicular rotation speed sensing apparatus further includes a magnetic force sensor mounted along the axial direction of the spindle and fastened on the... Agent: Alston & Bird LLP

20080084203 - Pulsed coil drive circuit for a sampled inductive transducer: The pulsed coil drive for a sampled inductive transducer has at least one of its drive coils forming a series circuit with a capacitor whose free terminal is connected to the negative terminal of a voltage source. This series circuit is normally open, i.e. has no current during the intervals... Agent: Leydig Voit & Mayer, Ltd

20080084204 - Biomagnetic field measurement apparatus: A biomagnetic field measurement apparatus capable of easily bringing the sensor planes close to the head surface of the subject and capable of detecting cerebral magnetic fields of the left brain and the right brain simultaneously with a higher sensitivity is provided by disposing two independent cryostats holding SQUID fluxmeters... Agent: Stanley P. Fisher Reed Smith Hazel & Thomas LLP

20080084205 - Concept for detecting a change of a physical quantity by means of a conductor structure: An apparatus for detecting a change of a physical quantity by means of a conductor structure having a processor for applying a defined supply signal to the conductor structure so as to effect a current flow through the conductor structure, the current flow being changeable by the physical quantity, and... Agent: Slater & Matsil LLP

20080084206 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: With the objective of easily drawing a flow such as a bloodstream in a subject at low luminance, there is provided a magnetic resonance imaging apparatus including a static magnetic field forming unit, a transmission unit which transmits a plurality of inversion RF pulses to a subject lying in a... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20080084207 - Method for testing a superconductor under increased current load in a series-produced and actively shielded superconducting nmr magnet: A method for testing a new superconducting wire involves charging an actively shielded magnet coil configuration which comprises a first partial region which can be superconductingly short-circuited using an additional switch. A superconductor to be tested under increased current load is used in this first partial region, thereby preventing superconductor... Agent: Kohler Schmid Moebus

20080084208 - Magnetic resonance imaging apparatus, magnetic resonance imaging method, scan apparatus, program and storage medium: With the objective of reducing the number of times that RF pulses are idle-shot during an idling time upon executing an SSFP pulse sequence by a phase cycling method and thereby performing imaging efficiently, the angle of the phase of each RF pulse is changed during the idling time so... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20080084209 - Gradient coil apparatus and method of fabricating a gradient coil to reduce artifacts in mri images: A gradient coil or other element of a magnetic resonance imaging system includes at least one layer comprised of copper having a first surface and a second surface. A first semiconductor layer is applied to the first surface of the copper and an insulation layer applied to the first semiconductor... Agent: Peter Vogel Ge Healthcare

20080084211 - Vacuum container for cooled magnetic resonance probe head: A magnetic resonance probe head (40) comprises a vacuum container (43) in which several RF resonator coils (31, 32; 51-54, 61-64) are disposed that can be cryogenically cooled and which are each designed as planar coils disposed parallel to a z direction. All of the RF resonator coils (31, 32;... Agent: Kohler Schmid Moebus

20080084210 - Multi-current elements for magnetic resonance radio frequency coils: A current unit having two or more current paths allows control of magnitude, phase, time, frequency and position of each of element in a radio frequency coil. For each current element, the current can be adjusted as to a phase angle, frequency and magnitude. Multiple current paths of a current... Agent: Crompton, Seager & Tufte, Llc

20080084212 - Sensor for locating metallic objects, and measuring device with such a sensor: The invention relates to a sensor for locating metallic objects, especially an inductive metal sensor (110) for construction materials, said sensor comprising at least one emission coil (20) and at least one receiving conductor looping system (26) which are inductively coupled to each other. According to the invention, the at... Agent: Michael J. Striker

20080084213 - Device and method for testing an electrical power branch circuit: A device and method for testing an electrical power branch circuit that includes hot, neutral and protective ground conductors and that carries alternating current. The device includes circuitry for determining the total available short-circuit current that can be carried by the neutral conductor, circuitry for determining the total available ground-fault... Agent: Mirick, O'connell, Demallie & Lougee, LLP

20080084214 - Battery charger: A device (100) such as a battery charger includes a body (102), a movable member (104, 402), and a plurality of battery bays (108). Moving the member (104, 402) toward a first position increases a distance between respective first (132) and second (114) battery contacts so that a battery may... Agent: Michael C. Pophal Eveready Battery Company Inc

20080084215 - Circuit arrangement and method for insulation monitoring for inverter applications: An inverter application comprises at least one apparatus fed by an inverter (10). The determining of insulation defects is effected by way of a differential voltage of part voltages (U, U′) of an intermediate circuit (7) or the ratio of one of these part voltages (U, U′) to the total... Agent: Oppedahl Patent Law Firm Llc - Frei

20080084216 - Method, apparatus, and system for detecting hot socket deterioration in an electrical meter connection: A system for detecting, at a remote location, a deterioration in an electrical connection, such as an electrical meter socket connection, includes at least one deterioration sensing device that includes an apparatus for detecting, at a remote location, a deterioration in an electrical connection; at least one fixed or portable... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.c.

20080084217 - System and method to measure series-connected cell voltages using a flying capacitor: A system and method for measuring voltage of individual cells connected in series includes a single flying capacitor. The capacitor stores the charge of one of the cells such that an analog-to-digital converter (ADC) connected to the capacitor may process an accurate representation of the voltage of the cell being... Agent: Howard & Howard Attorneys, P.c.

20080084218 - System and method for information handling system peripheral emc test: Electromagnetic compatibility of an information handling system and peripheral for achieving defined electromagnetic interference constraints is tested through a test adapter that interfaces with an external cable connecting the information handling system and peripheral. Signals from the external cable are passed through an isolation resistor and parallel capacitance to compensate... Agent: Hamilton & Terrile, LLP

20080084219 - Impedance measurement using line-to-line current injection: An unbalanced line-to-line current is injected at an injected frequency in a three-phase ac circuit. A first set of voltages and currents are obtained. A first set of transformed voltages and transformed currents are produced. The circuit is injected with a second unbalanced line-to-line current at a frequency linearly independent... Agent: J. Michael Martinez De Andino, Esq. Hunton & Williams LLP

20080084220 - Measuring apparatus and method for recognizing foreign bodies in a product, particularly tobacco, cotton or another fibrous product: The invention concerns a measuring apparatus for the detection of foreign bodies in a product, in particular in tobacco, cotton or some other fibrous product, having a measuring device, a device for generating an alternating electromagnetic field in the measuring device, which is influenced by a product which is arranged... Agent: Venable LLP

20080084221 - Insulation barrier for unshielded wire: A sensor assembly has a plurality of sensing elements configured to be positioned within a seat of a vehicle. Each of the sensing elements include an output signal indicating the presence or absence of an occupant. The sensor assembly includes a cable with a plurality of conductors that are in... Agent: 3m Innovative Properties Company

20080084222 - Light source current sensing circuit and driving circuit in a display device: A current sensing circuit for sensing a current flowing through a LED bank and a driver circuit for driving the LED bank are provided. The current sensing circuit comprises: a matched transistor group, having a first current path coupled to the load device for sensing the load current and a... Agent: J C Patents, Inc.

20080084223 - Test pattern and method of monitoring defects using the same: A test pattern includes a normal pattern, an abnormal pattern having predetermined defects, and a conductive line electrically connected to the normal pattern and electrically isolated from the abnormal pattern. Thus, a non-contact test process and a contact test process may be compatible with the single test pattern.... Agent: F. Chau & Associates, Llc

20080084224 - Photoionization probe with injection of ionizing vapor: A photoionization probe includes two electrodes and provides ionizable vapor in a carrier gas via a channel between the electrodes. The ionizable vapor is thereby concentrated in an aperture of the probe where it is photoionized by, for example, an ultraviolet (UV) lamp.... Agent: Agilent Technologies Inc.

20080084225 - Methods and apparatuses for testing circuit boards: In one aspect of the invention, a test method includes applying test probes to test pads located on at least one side plane of a circuit board. The test method further includes testing components of the circuit board by applying electrical signals to the test pads that are each coupled... Agent: Ropes & Gray LLP Patent Docketing 39/361

20080084226 - Operation voltage supply apparatus and operation voltage supply method for semiconductor device: The voltage application probe (54) and the voltage measurement probe (56) are connected to the voltage application pad (74) and the voltage measurement pad (76) of the semiconductor device (70). The voltage application pad (74) and the voltage measurement pad (76) are connected by the conductor (78), measuring the voltage... Agent: Yusuke Takeuchi Takeuchi & Takeuchi

20080084227 - Die design with integrated assembly aid: An upper die portion of a die head for aligning probe pins in first array of first micro-holes formed in lower die portion of the die head, which generally includes a spacer portion and is adapted to contact lower die portion is typically positioned between second surface and support frame... Agent: Wiggin And Dana LLP Attention: Patent Docketing

20080084228 - Body bias compensation for aged transistors: Embodiments of the invention include on-chip transistor degradation detection and compensation. In one embodiment of the invention, an integrated circuit is provided including a circuit with a body bias terminal coupled to a body of one or more transistors to receive a body bias voltage; a programmable degradation monitor to... Agent: Intel/blakely

20080084229 - System and method for look ahead detection of electrical problems at a motor of a vehicle: A system for sensing short circuits and open circuits prior to operation of a motor (i.e., while the motor is in a static state), thereby sparing the electrical system from destructive effects of these electrical problems. In addition, the system may detect a short circuit during operation of the motor... Agent: Patton Boggs LLP

20080079415 - Device and method for determining the intensity of current: A device allows current flowing in each branch of a multi-channel circuit to be evaluated. The device includes secondary branches in parallel with each other and which each receive a resistive component. The device also includes a main branch with a resistive component, the main branch being connected in series... Agent: Carlson, Gaskey & Olds, P.C.

20080079416 - Voltage detecting apparatus: A voltage detecting apparatus with a capacitor having a switch for detecting a voltage of a direct-current power source, which can detect a malfunction of the switch without additional parts and effects to a measurement time in a normal condition, is provided. When a microcomputer measures a voltage between both... Agent: Edwards Angell Palmer & Dodge LLP

20080079417 - Method in connection with frequency converter: A method of determining a rotational state of a three-phase alternating voltage supply which is connected to a converter and rotating in an uncontrolled manner, wherein the converter is connected to an intermediate voltage circuit and comprises phase-specific upper and lower controllable switches, which are connected in series between the... Agent: Buchanan, Ingersoll & Rooney PC

20080079418 - High-precision rogowski current transformer: A high-precision Rogowski current transformer, the Rogowski coil is realized in a single printed circuit board while maintaining both the outside field rejection of a traditional Rogowski coil, and the increased output voltage similar to the multiple printed circuit board Rogowski coil arrangements.... Agent: General Motors Corporation Legal Staff

20080079419 - Current regulator for loop powered time of flight and level measurement systems: A protection circuit for a current loop powered level measurement or time of flight ranging apparatus. The protection circuit includes one or more Zener diodes, a leakage current detector circuit and a compensating current circuit. The leakage current detector circuit detects the leakage currents flowing from the Zener diodes and... Agent: Workman Nydegger

20080079420 - Contactless eddy current sensor and process for detecting test objects: The invention relates to a contactlessly working eddy current sensor, particularly for detecting essentially flat test objects, comprising at least one sensor coil, eddy currents being able to be induced in the test object. The invention is characterized in that the coil, when passing by the test object, is aligned... Agent: Alston & Bird LLP

20080079421 - Multi-sensor distortion mapping method and system: In one aspect of the present technique, an array of electromagnetic sensors is positioned within a volume of interest. In the presence of an electromagnetic field, the array of electromagnetic sensors is sampled to acquire signals representative of the location of the electromagnetic sensors in the array. The electromagnetic field... Agent: Ge Healthcare C/o Fletcher Yoder, PC

20080079422 - Rotary transducer and method for operating a rotary transducer: A rotary transducer includes a shaft, and a carrier body, on which an excitation winding and a detector system are arranged. To generate an electromagnetic field, it is possible to conduct an excitation current through the excitation winding, and the detector system is suitable for scanning the electromagnetic field influenced... Agent: Kenyon & Kenyon LLP

20080079423 - Position sensor: A position sensor including a rotatable shaft, a first threaded member, a second threaded member, at least one magnet, and at least one magnetic flux detection device. The first threaded member is connected to the rotatable shaft. The second threaded member is threadably engaged with the first threaded member. The... Agent: Max W. Garwood

20080079424 - Measuring method for electromagnetic field intensity and apparatus therefor, measuring method for electromagnetic field intensity distribution and apparatus therefor, measuring method for current and voltage distributions and apparatus therefor: A measuring method for electromagnetic field intensity capable of easily and accurately measuring, with a compact and simple facility, each of the electric field component and the magnetic field component of an electromagnetic field formed in space is to be provided. By simultaneously measuring output currents O1 and O2 from... Agent: Lowe Hauptman Ham & Berner, LLP

20080079425 - Method for determining the thickness of a coating on a composite material: The invention relates to a method for determining the thickness of a coating on a composite material by applying induced currents characterized in that the composite material together with its coating is placed on a conducting material, in which circulating electric currents induced by an alternating magnetic field are created,... Agent: Ladas & Parry

20080079426 - Eddy current testing apparatus and eddy current testing method: The eddy current testing apparatus includes a probe having an eddy current testing sensor including a pair of eddy current testing coils. The apparatus also includes an eddy current testing flaw detector inputting detection signals from the eddy current testing sensor. The diameter of a magnetic core used in each... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080079427 - Test device for tubular specimens: A test device for testing of tubular specimens has a plurality of individual, radially movable, finger-shaped test probes which are placed from all sides on the outside of the specimen to be tested. In this way, the test specimen is surrounded by test probes and can be pushed under them.... Agent: Roberts, Mlotkowski & Hobbes

20080079428 - High temperature superconducting current leads for superconducting magnets: An electrical current lead assembly for ramping a superconducting magnet includes a vacuum vessel wall that has a first side exposed to an atmospheric pressure and a second side exposed to a vacuum pressure. A pool wall extends from the first side of the vacuum vessel wall and forms a... Agent: General Electric Company Global Research

20080079429 - Magnetic resonance imaging interference immune device: A medical apparatus includes a medical assist device to process signals to relating biological functions. A first lead is operatively connected to the medical assist device, the first lead having a distal end and a proximal end. A second lead is operatively connected to the medical assist device, the second... Agent: Basch & Nickerson LLP

20080079430 - Radio-frequency transmission arrangement for a magnetic resonance system: A radio-frequency transmission arrangement for an MR system for generation of a total B1 field which has a first antenna device that generates a first portion of the total B1 field and at least one antenna insert that generates a second portion of the total B1 field, such that the... Agent: Schiff Hardin, LLP Patent Department

20080079431 - Increasing the resolution of electromagnetic tools for resistivity evaluations in near borehole zones: A tool for performing electromagnetic measurements within a borehole includes a transmitter including a coil having N-turns wound coaxially around a long metallic mandrel and a receiver including a coil having a one-turn receiving loop wound coaxially around the mandrel; wherein the transmitter is adapted for providing a current I... Agent: Cantor Colburn LLP- Baker Atlas

20080079432 - Broadband resistivity interpretation: Resistivity measurements are made at a plurality of frequencies. An asymptotic high-frequency limit is determined and the electrical efficiency is estimated as a ratio of the high frequency resistivity limit to the low frequency resistivity. From the electrical efficiency, petrophysical parameters of a rock such as porosity and water saturation... Agent: Madan, Mossman & Sriram, P.C.

20080079433 - Broadband resistivity interpretation: Resistivity measurements are made at a plurality of frequencies. An asymptotic high-frequency limit is determined and the electrical efficiency is estimated as a ratio of the high frequency resistivity limit to the low frequency resistivity. From the electrical efficiency, petrophysical parameters of a rock such as porosity and water saturation... Agent: Madan, Mossman & Sriram, P.C.

20080079434 - Car power source apparatus: The car power source apparatus is provided with a driving battery 1 that supplies power to the car's electric motor, a voltage detection circuit 3 that measures the voltage of batteries 2 in the driving battery 1, a plurality of voltage detection lines 8 connected in parallel between the input-side... Agent: Wenderoth, Lind & Ponack, L.L.P.

20080079435 - Electrostatic voltmeter with spacing-independent speed of response: A non-contacting electrostatic voltmeter (ESVM) technique and apparatus having a spacing-independent dynamic response characteristic. Using the disclosed technique, an ESVM apparatus is capable of detecting and measuring electrostatic voltages and/or fields over wide variations of sensing probe to measured surface spacing with little or no variation in the dynamic response... Agent: Hodgson Russ LLP The Guaranty Building

20080079436 - System and method for monitoring a motor control center: A system, in one embodiment, includes a power distribution center having an enclosure with an access door configured to move between a closed position and an open position. The power distribution center includes a non-contact sensor disposed inside the enclosure, wherein the non-contact sensor comprises a non-contact voltage sensor, or... Agent: Rockwell Automation, Inc./(fy)

20080079437 - Current sensing module and assembly method thereof: A current sensing module for disposal proximate a conductor is disclosed. The current sensing module includes a housing having a first section and a second section that together define an opening for receiving the conductor therethrough. The second section is in operable connection with the first section. The current sensing... Agent: Cantor Colburn, LLP

20080079438 - Storage device, and writing unit diagnosing method: The present invention provides a storage device and a writing unit diagnosing method, which can determine a defect in a writing unit at an early stage. There is provided a storage device, which includes writing units that write data to a storage medium, current application units that apply a current... Agent: Patrick G. Burns Greer, Burns & Crain, Ltd.

20080079439 - Development environment and basic tenets for enabling robust embedded diagnostics in rf systems: For a communication system that employs interconnected communication components and defines a communication pathway running through the communication components and through interconnections therebetween, the communication pathway having test points, an apparatus for performing diagnostic tests on the communication system comprises testing agents residing on-board the communication components, and a test... Agent: Agilent Technologies Inc.

20080079440 - Inverter circuit and backlight assembly having the same: An inverter circuit includes plural pairs of third coils, in which adjacent third coils are serially connected to each other so as to offset AC voltage generated from the paired third coils, one end of the paired third coils being connected to ground. Input terminals of plural diodes are connected... Agent: Macpherson Kwok Chen & Heid LLP

20080079441 - Calibration circuit for resistance component: A calibration circuit including a plurality of first resistance components, a plurality of second resistance components, and a first feedback system is provided. The first feedback system selects M1 first resistance components and NJ second resistance components so that a first combination of the M1 first resistance components and the... Agent: The Law Offices Of Andrew D. Fortney, Ph.d., P.C.

20080079442 - Quantum tunneling biometric identification methods and apparatuses: Methods, apparatuses, and systems to identify biometric characteristics of people and things are disclosed. Embodiments generally comprise sensors that contain arrays of pads or electrodes. In various embodiments, current or voltage sources generate quantum tunneling currents from the arrays of pads to biometric components using select elements as ground return... Agent: Schubert, Osterrieder & Nickelson, PLLC C/o Intellevate

20080079443 - Electromagnetic field intensity calculating method and apparatus: There is provided an electromagnetic field intensity calculator for calculating the intensity of electromagnetic field radiated from an electric circuit device based on a moment method. A conductor pattern obtained from CAD data is divided into a square mesh pattern. In the mesh pattern of the outline part, the entire... Agent: Staas & Halsey LLP

20080079444 - Capacitive interface circuit for low power sensor system: This disclosure describes a capacitive interface circuit for a low power system. The capacitive interface circuit is configured to achieve very low noise sensing of capacitance-based transducers, such as a micro-electro-mechanical system (MEMS)-based sensor, with high resolution and low power. The capacitive interface circuit uses a differential amplifier and correlated... Agent: Shumaker & Sieffert, P. A.

20080079445 - System for clearance measurement and method of operating the same: A clearance sensing system is disclosed. The system includes a probe separated from a test object by a variable distance d. The system also includes an alternating current (AC) source for supplying a current through the probe, wherein the AC source and the probe are configured to generate a controlled... Agent: General Electric Company Global Research

20080079446 - Apparatus, system and method for identification with temperature dependent resistive device: An apparatus, system, and method provide device identification and temperature sensing of a device with a temperature sensing circuit (TSC) within the device. The TSC includes a temperature sensing element (TSE) connected in parallel with a voltage clamping network (VCN) that limits the voltage across the TSE to an identification... Agent: Kyocera Wireless Corp.

20080079447 - Semiconductor device test method and semiconductor device tester: A defective position of a sample to be tested is detected by irradiating the test sample and another test sample with electron beam while scanning the test samples, storing values of current generated in the test samples correspondingly to election beam irradiation positions as current waveforms and comparing the current... Agent: Buchanan, Ingersoll & Rooney PC

20080079448 - Enhanced signal observability for circuit analysis: Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of interest and apply a voltage across the beacon to enhance photon emissions... Agent: Ibm Corporation (jss) C/o Schubert Osterrieder & Nickelson PLLC

20080079449 - Method and apparatus for indirect planarization: Methods and apparatus for indirect planarization of a substrate are provided herein. In one embodiment, an apparatus for indirectly planarizing a probe card assembly includes an adjustment portion for controlling a force applied to a probe substrate of the probe card assembly; a force application portion configured to apply the... Agent: MoserIPLaw Group / Formfactor, Inc.

20080079450 - Intelligent probe chips/heads: An intelligent probe chip or probe head can include design-for-test (DFT) circuitry that would otherwise be required in a device being tested and/or implement testing functions so that less-expensive automated test equipment (ATE) can test the device. Further, the probe chip or probe head can generate high frequency signals, avoiding... Agent: Patent Law Offices Of David Millers

20080079451 - Apparatus for testing electronic devices: The invention provides an apparatus for testing an integrated circuits on devices including a plurality of electrical subassemblies including a plurality of pattern generator, driver, and power boards divided into physical zones with each physical zone including one pattern generator board, at least one driver board, and at least one... Agent: Stephen M. De Klerk Blakely, Sokoloff, Taylor & Zafman LLP

20080079452 - Probe card: A probe card includes a probe, a circuit board, a first reinforcing plate and a second reinforcing plate. The probe makes contact with an object. The circuit board is electrically connected to the probe. The first reinforcing plate has a first tap and a second tap for providing an adjustable... Agent: Daly, Crowley, Mofford & Durkee, LLP

20080079453 - Manufacture method of vertical-type electric contactor vertical-type electric contactor thereof: A method for fabricating a vertical-type electric contactor includes forming a first passivation pattern on a sacrificial substrate for forming at least one tip; performing an etch process, using the first passivation pattern as an etch mask, to form a trench in the sacrificial substrate; removing the first passivation pattern... Agent: Jenkins, Wilson, Taylor & Hunt, P. A.

20080079454 - Apparatus for testing integrated circuit: An apparatus for testing integrated circuits is disclosed. The apparatus for testing integrated circuits comprises an integrated circuit and a tester. The integrated circuit undergoing testing receives an input signal, and outputs an output signal from a first output terminal or a second output terminal according to a first pulse... Agent: Birch Stewart Kolasch & Birch

20080079455 - Ic chip package, test equipment and interface for performing a functional test of a chip contained within said chip package: An interface between a test access port of an integrated circuit chip and a test equipment, which is designed to perform a functional test of the chip, is provided. The interface includes electric pads on either sides of the chip and the test equipment. The pads are arranged to interact... Agent: Slater & Matsil, L.L.P.

20080079456 - Test handler for testing semiconductor device and method of testing semiconductor device using the same: Provided is a test handler for testing a semiconductor device mounted in a test tray with a test head disposed separately below the test tray under predetermined testing condition at high or low temperature. The test handler includes a thermal isolator to maintain constant the predetermined testing condition at high... Agent: Volentine & Whitt PLLC