Electricity: measuring and testing inventions 03/08

20080074097 - Device for automatic detection of battery polarity: The present invention provides a device for automatic detection of battery polarity, wherein a detector circuit is structured from detector terminals, detector units, positive voltage electrical connecting units and negative voltage electrical connecting units. Operational procedure involves first connecting battery electrical conducting units with the detector terminals of the detector... Agent: Troxell Law Office PLLC

20080074098 - Device, system and method for a sensing electrical circuit: The invention relates to a driven ground electrical circuit. A driven ground is a current-measuring ground termination to an electrical circuit with the current measured as a vector with amplification. The driven ground module may include an electric potential source VS driving an electric current through an impedance (load Z)... Agent: Nasa Goddard Space Flight Center

20080074099 - Eddy current detection of wheel speed with voltage threshold shifting: A wheel speed detection system including a rotator, a sensor head, a detector, a pulse converter, a speed calculator and a threshold shifter. Plural concave and convex portions are formed on a periphery of the rotator rotating together with a wheel. The sensor head includes a coil to generate an... Agent: Sughrue Mion, PLLC

20080074100 - Transmission input shaft speed measuring assembly: A device for sensing the input shaft speed of an automotive automatic transmission that is driven by the engine through the fluid coupling of a torque converter. The speed sensor device includes circumferentially spaced markings about the transmission input shaft and a speed sensor that is placed at close proximity... Agent: The Webb Law Firm, P.C.

20080074103 - Method for determining the angular position of the rotor in a rotating electric machine: the difference is derived from the cosine angle function of the first stator flux signal (ψ1) and the cosine angle function of the second stator flux signal (ψ2). If the difference lies outside an adjustable tolerance range, a correction phase angle (ψK) is added to the partial rotor position angle... Agent: Buchanan, Ingersoll & Rooney PC

20080074102 - Rotation angle detecting device: A rotation angle detecting device includes a magnetic field forming member, magneto-sensing IC circuit including first and second sensing sections in a magnetic field to have a first preset angle between them, and a selecting circuit. One of the first and second sensing section includes plural magneto-sensing elements whose sensing... Agent: Nixon & Vanderhye, PC

20080074101 - Flat displacement or position sensor: The invention relates to a sensor (1) for detecting a linear or rotative displacement of an object. According to the invention, a sensor element (2) can be fastened to the object or forms part of the object, said element interacting with at least one detection element (3). The sensor is... Agent: K.f. Ross P.C.

20080074104 - Displaceable component including a position-defining element made of a magnetized elastomer: A displaceable component includes a body having an axis and arranged for movement in at least one of an axial direction or a rotary direction about the axis. A position-defining element is fixed to the body and substantially comprising a magnetised elastomer. The position-defining element is arranged to be sensed... Agent: Venable LLP

20080074105 - Pulsar ring and bearing device: A pulsar ring includes an annular support member having a large diameter part which is provided with a flange part for positioning a plurality of gear plates formed of silicon steel, at a left end part thereof. A concave groove in an axial direction is formed on an outer periphery... Agent: Mcginn Intellectual Property Law Group, PLLC

20080074106 - Semiconductor device, magnetic sensor, and physical quantity sensor: A semiconductor device includes: a detection Hall element for detecting a magnetic field; a temperature monitor Hall element; and a calculation circuit. The detection Hall element has a characteristic, which is almost a same as the temperature monitor Hall element. The detection Hall element is disposed near the temperature monitor... Agent: Posz Law Group, PLC

20080074107 - System for testing hard disks: A system for testing hard disks includes a hard disk testing device and a computer. The computer has a mainboard and a key-press controller. The hard disk testing device connects with the mainboard and includes: a hard disk interface configured for connecting one or more hard disks to be tested... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20080074108 - Magnetic field sensor apparatus: A magnetic field sensor apparatus includes a first magnetic field sensor and a second magnetic field sensor, arranged on a substrate in a spaced manner from each other, a first temperature sensor with an output for a first temperature sensor signal, a second temperature sensor with an output for a... Agent: Slater & Matsil LLP

20080074109 - Magnetic detecting device and material identifying device: The present invention discloses a magnetic detecting device comprising an apply coil 1 for generating an alternate magnetic field of variable frequency and a power source 2 for the apply coil; a magnetic sensor 5 for detecting a change in the magnetic field induced by a test object 9 placed... Agent: Oliff & Berridge, PLC

20080074110 - Magnetic characteristics measuring method and system: A magnetic characteristics measurement system includes a superconducting quantum interference device which detects a magnetization of a sample located in the vicinity of a superconducting pickup coil and outputs an electrical signal representing the magnetization. A coil is disposed to surround the superconducting pickup coil and is connected to an... Agent: Mcglew & Tuttle, PC

20080074111 - Method and apparatus for layer short detection of electric rotating machine: There is provided a detector for detecting a layer short of a field winding in operation by measuring, with a field detector, a magnetic field generated from a field winding of an electric rotating machine. In the present invention, a field detector is installed outside an electric rotating machine to... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080074112 - Gradient coil and magnetic resonance imaging apparatus using the same: The gradient coil for a magnetic resonance imaging apparatus is adapted to encode information on a spatial position of a subject to be inspected into a nuclear magnetic resonance signal. The gradient coil includes a primary gradient coil and a shielded gradient coil. The primary gradient coil generates a gradient... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20080074113 - Squid detected nmr and mri at ultralow fields: Nuclear magnetic resonance (NMR) signals are detected in microtesla fields. Prepolarization in millitesla fields is followed by detection with an untuned dc superconducting quantum interference device (SQUID) magnetometer. Because the sensitivity of the SQUID is frequency independent, both signal-to-noise ratio (SNR) and spectral resolution are enhanced by detecting the NMR... Agent: Lawrence Berkeley National Laboratory

20080074114 - Multi-frequency metal detector having constant reactive transmit voltage applied to a transmit coil: An electronic metal detector having a transmit coil (1) adapted to transmit an alternating magnetic field associated with a reactive transmit voltage, wherein the transmit voltage signal is selected such that the reactive transmit voltage is approximately constant for at least a time period during which a magnetic field signal... Agent: Osha Liang L.L.P.

20080074115 - Correction of misalignment of antennas in a logging tool: Misalignment of the transmitter and receiver antennas of an induction logging tool is determined by positioning the logging tool with a conducting loop magnetically coupled to the transmitter antenna and/or the receiver antenna, and activating the transmitter at a plurality of rotational angles. It is emphasized that this abstract is... Agent: Madan, Mossman & Sriram, P.C.

20080074116 - Advanced air bearing and detection method for media glide testing at ultra-low flying height: A glide head assembly that can be used to certify disks of hard disk drives. The assembly includes a glide head that is coupled to a suspension arm. The assembly further has a contact sensor coupled to the head. The contact sensor includes a center plate and four beams. The... Agent: Irell & Manella LLP

20080074117 - Sensing circuit and method for diagnosing open and short circuit conditions of a sensor: A sensing circuit for detecting open and short circuit conditions in sensors is provided. The sensing circuit includes switching circuitry, a voltage supply, a test capacitor, and an operational amplifier. The switching circuitry is electrically coupled to the voltage supply, test capacitor, operational amplifier, and a sensor. The sensing circuit... Agent: Delphi Technologies, Inc.

20080074118 - Pick-and-place mechanism of electronic device, electronic device handling apparatus and suction method of electronic device: A translatory type actuator 503 for moving a support member 502 supporting the suction head 501 up and down between an upper stroke end and a lower stroke end; and a servo actuator 504 for lowering the support member 502 and the suction head 501 together with the translatory type... Agent: Posz Law Group, PLC

20080074119 - Manufacturing method and controlling method of electronic device: A manufacturing method of an electronic device includes applying a direct voltage having a first polarity to a capacitor that has an insulating layer including nitrogen and silicon as a capacitor dielectric layer, testing the capacitor to which the direct voltage having the first polarity is applied and determining a... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080074120 - Pushing block and and a handler with the pushing block: Provided is a pushing block for use in a handle and a handler equipped with the pushing block. The pushing block includes pushing pins, provided under the test tray, each pushing the latch upwards from under the test tray to enable the latch to release the packaged chip, a first... Agent: Ked & Associates, LLP

20080074121 - Apparatus for probing multiple integrated circuit devices: A probing apparatus comprises a platform with a rectangular opening, two vertical rails positioned at two sides of the rectangular opening, two vertical sliding modules each including a vertical sliding base positioned on the vertical rail, a bearing member and a pivot connecting the vertical sliding base and the bearing... Agent: Oliff & Berridge, PLC

20080074122 - Line analyzer with automatic pair combination sequencing: A line analyzer for detecting line anomalies that may be indicative of electronic tape or other surveillance related electronics coupled to a wire pair in a multiple conductor cable utilizes a switching matrix to identify possible pairings of the conductors and instruct the analyzer to selectively couple to each of... Agent: Hornkohl Law Firm

20080074123 - Electromagnetic shielding defect monitoring system and method for using the same: An embodiment disclosed herein is directed to an electromagnetic shielding defect monitoring system that includes a transmit system adapted to transmit a first electromagnetic field toward a first surface of an electromagnetically shielded enclosure, thereby generating a first current on the first surface, a stationary receive system adapted to detect... Agent: Fitch Even Tabin And Flannery

20080074124 - Method and arrangement for the detection of a coil: The present technology concerns a method and an arrangement for the detection of a coil in an electronic circuit, which is operated with a direct voltage lying within a prescribed voltage range, and in which the coil together with a condenser forms an electrical oscillating circuit.... Agent: Mcandrews Held & Malloy, Ltd

20080074128 - Electrical test probe and electrical test probe assembly: An electrical test probe comprises a probe tip portion and a probe main body portion having a pedestal portion on which the probe tip portion is formed to be protruded. The probe main body portion is made of a conductive material that is greater in toughness than the probe tip... Agent: Ingrassia Fisher & Lorenz, P.C.

20080074125 - Handheld electronic test probe assembly: A test probe assembly includes a probe-supporting component and a test probe on it. According to one aspect of the invention, the probe-supporting component takes the form of a probe-supporting housing in which the test probe is partially disposed so that two test probe legs extend out of the housing... Agent: Mr. Loyal M. Hanson Hanson Law Corporation

20080074126 - Probe based patterning of microelectronic and micromechanical devices: Patterning of microelectronic and micromechanical devices is described using probes. In one example, a plurality of probe tips are driven into a processing layer of a substrate. The probe tips are carried by movable sleds. The sleds are moved to write patterns into the processing layer using the probes, and... Agent: Intel/blakely

20080074127 - Probe substrate for test and manufacturing method thereof: A probe substrate includes a probe having a plurality of beams and a contactor formed at one end of the beam, and a support substrate for supporting the probe and having a bending space in which the probe moves upwards and downwards. The beam and the contactor are made of... Agent: LexyoumeIPGroup, LLC

20080074129 - Probe for combined signals: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080074130 - Apparatus and method for testing conductive bumps: An apparatus and method for testing conductive bumps are provided. An exemplary embodiment of a bump testing unit comprises a support substrate with two probes protruding one surface thereof. A digital detecting device is embedded in the support substrate, comprising a first and second input terminals and an output terminal,... Agent: Birch, Stewart, Kolasch & Birch, LLP

20080074131 - Attachment of an electrical element to an electronic device using a conductive material: An electrical element can be attached and electrically connected to a substrate by a conductive adhesive material. The conductive adhesive material can electrically connect the electrical element to a terminal or other electrical conductor on the substrate. The conductive adhesive material can be cured by directing a flow of heated... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080074132 - Single support structure probe group with staggered mounting pattern: A probe group can include multiple probes for testing devices having contact pads. The probes can comprise beams, contact tip structures, and mounting portions. The beams can provide for controlled deflection of the probes. The contact tip structures can be connected to the beams and can include contact portions for... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080074133 - Voltage generating apparatus, current generating apparatus, and test apparatus: There is provided a voltage generating apparatus that outputs a power source voltage from a voltage outputting terminal. The apparatus includes a voltage outputting section that outputs the power source voltage according to a current or voltage to be input, a first differential amplification section that compares the power source... Agent: Osha Liang L.L.P.

20080074134 - System for automatic mounting of workpieces: A system includes a mounting device (200), a detecting device (100), and a circuit (300). The mounting device includes a base (210), and a mounting head (220) opposite to the base. The detecting device is fixed on the base, and includes a shell (110) comprising a cavity (112) therein, a... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20080074135 - Methods and apparatus for full-wafer test and burn-in mechanism: Assemblies include a substrate, such as a printed circuit board, with a first array of contact pads disposed thereon; a guide ring structure disposed on the substrate and at least partially surrounding the first array of contact pads; a translator socket disposed on the first array of contact pads, the... Agent: Raymond J. Werner

20080074137 - Display substrate and method of manufacturing a motherboard for the same: A display substrate includes a signal line, a test switch, a test pad, and a first electrostatic dispersion line. The signal line is formed in the display area of a base substrate. The test switch is formed in a peripheral area of the base substrate surrounding the display area. The... Agent: F. Chau & Associates, LLC

20080068002 - Specific phase position detection: The specific phase position detection circuit detects first and second temporal positions which have respective desired phase offsets from an upper peak position and an lower peak position of an analog signal having periodicity. The specific phase position detection circuit then outputs phase signals indicating the detected first and second... Agent: Harness, Dickey & Pierce, P.L.C

20080067999 - Real-time monitoring of particles in semiconductor vacuum environment: An apparatus includes semiconductor processing equipment. A particle detecting integrated circuit is positioned in a vacuum environment, the particle detecting integrated circuit containing a device having a pair of conductive lines exposed to the vacuum environment. The pair of conductive lines is spaced at a critical pitch corresponding to diameters... Agent: Fish & Richardson, PC

20080068000 - Thermoelastic self-actuation in piezoresistive resonators: Systems and methods for thermally actuating piezoresistive cantilevers are described. One embodiment includes a nanoelectromechanical resonator connected in at least one location to a substrate, an electrically conductive path formed on the resonator and a signal source connected to the electrically conductive path and configured to provide an oscillating actuation... Agent: Kauth , Pomeroy , Peck & Bailey ,llp

20080068001 - Method for eliminating interference in measuring signals: The present invention concerns a method for eliminating interference in measuring signals (SM) which are corrupted by pulsed interference signals (SST) having a known or determinable interference pulse interval (TSt), whereby the detection period (ΔtE) of an individual measured value (E) is shorter than an interference pulse period (ΔtSt), and... Agent: Striker, Striker & Stenby

20080068003 - Random seed stability with fuses: A circuit for stabilizing soft bits in a bit stream, the circuit having a first register to receive an initial read of the bit stream, a second register to receive a subsequent read of the bit stream, a comparator to compare the initial read of the bit stream to the... Agent: Lsi Corporation

20080068004 - Electronic revenue meter with automatic service sensing: An integral electronic revenue meter system diagnostics package including a microprocessor, storage memory, preselect series of system diagnostic tests, and recording any results which exceed predefined programmable thresholds, and display means for displaying error and/or diagnostic messages identifying selected diagnostic data and/or errors discovered in the meter tests during a... Agent: Dority & Manning, P.A.

20080068005 - Electronic revenue meter with automatic service sensing: An integral electronic revenue meter system diagnostics package including a microprocessor, storage memory, preselect series of system diagnostic tests, and recording any results which exceed predefined programmable thresholds, and display means for displaying error and/or diagnostic messages identifying selected diagnostic data and/or errors discovered in the meter tests during a... Agent: Dority & Manning, P.A.

20080068006 - Electronic revenue meter with automatic service sensing: An integral electronic revenue meter system diagnostics package including a microprocessor, storage memory, preselect series of system diagnostic tests, and recording any results which exceed predefined programmable thresholds, and display means for displaying error and/or diagnostic messages identifying selected diagnostic data and/or errors discovered in the meter tests during a... Agent: Dority & Manning, P.A.

20080068007 - Magnetic encoder apparatus: To provide a magnetic encoder having high resolution and a high output, and a magnetoresistive sensor for an encoder. A fine sensor having a reduced demagnetization field is produced by: forming a free layer consists of a laminated soft magnetic film in which two soft magnetic layers are coupled in... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080068008 - Magnetic crash sensor: A magnetic field generated by at least one coil operatively associated with a first portion of a vehicle responsive to a first signal from a signal source causes an eddy current in at least one conductive element operatively associated with or at least a part of a second portion of... Agent: Raggio & Dinnin, P.C.

20080068009 - Method for testing magnetic field distribution and apparatus therefor: The invention proposes a method and an apparatus for testing a magnetic field of a coil. The method comprises applying an alternating current to the coil to generate an alternating magnetic field; measuring simultaneously the induced electromotive potential at a plurality of positions in the alternating magnetic field; and collecting... Agent: Siemens Corporation Intellectual Property Department

20080068010 - Fluxgate: A fluxgate including at least two ferromagnetic or ferrimagnetic, flexible cores, and at least two sets of a plurality of windings of an electrically conductive material. At least one set of windings is wound around each of the cores. The fluxgate further includes an electrically conductive, flexible shield enclosing the... Agent: Thompson Hine L.L.P. Intellectual Property Group

20080068011 - Method of operation for a magnetic resonance imaging suite: A method of operation for a magnetic resonance imaging suite. A power supply of magnetic resonance injector system receives electrical power from an AC power outlet, both of which are located outside of a shielded room of the magnetic resonance imaging suite. Electrical power from the power supply of the... Agent: Wood, Herron & Evans, LLP

20080068013 - Method and apparatus for high-gain magnetic resonance imaging: A method and apparatus for Magnetic Resonance Imaging with specialized imaging coils possessing high Signal-to-Noise-Ratio (SNR). Imaging and/or Radio Frequency receiving coils include a ballistic electrical conductor such as carbon nanotubes, the ballistic electrical conductor having a resistance that does not increase significantly with length. Due to their enhanced SNR... Agent: Russ Weinzimmer

20080068012 - Method for transforming a distortion-corrected magnetic resonance image, method for carrying out magnetic resonance measurements, and image transformation unit: A method for carrying out magnetic resonance measurements on an examination object in a magnetic resonance system is described. In at least one embodiment, a magnetic resonance image of the examination object previously acquired via the magnetic resonance system is used to determine spatial coordinates in order to control the... Agent: Harness, Dickey & Pierce, P.L.C

20080068015 - Magnetic resonance imaging method and apparatus: A magnetic resonance imaging method comprising a step for applying one or more gradient magnetic field pulses continuously, a step for calculating a residual magnetic field being generated from a magnet by an gradient magnetic field pulse based on a residual magnetic field response function representing the relation between the... Agent: Cooper & Dunham, LLP

20080068014 - Magnetic resonance imaging with adjustment for magnetic resonance decay: In a magnetic resonance imaging method, a plurality of at least partially overlapping k-space datasets are acquired. Each of at least partially overlapping k-space datasets includes k-space samples acquired at different measuring times including common locations in k-space that are sampled at different measuring times in the acquired k-space datasets.... Agent: Philips Intellectual Property & Standards

20080068016 - System and method of accelerated mr propeller imaging: A system and method of MR imaging enables PROPELLER imaging to be feasibly carried out independently of slice orientation or anatomy of interest. The invention is directed to accelerated acquisition of blades of MR data that are rotated about a central region of k-space and reconstructing an image of arbitrary... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20080068017 - Detection unit for arrangement inside a cylindrical patient receptacle of a magnetic resonance apparatus: Detection unit is disclosed for arrangement inside a cylindrical patient receptacle of a magnetic resonance apparatus. In at least one embodiment, the detection unit includes an annular PET detector arrangement with PET detector blocks, and a radiofrequency coil arrangement, arranged coaxially inside the PET detector arrangement and including longitudinal conductors,... Agent: Harness, Dickey & Pierce, P.L.C

20080068018 - Nmr probe component with a gradient chip with a slot for insertion of a sample chip: A nuclear magnetic resonance (NMR) probe component, comprising a microfabricated planar gradient chip (1), with a substrate thickness dgc≦3 mm, carrying three micromachined planar partial gradient coils (10a-10f) on each of its two outer surfaces (12a, 13a), wherein the partial gradient coils (10a-10f) of the gradient chip (1) form a... Agent: Kohler Schmid Moebus

20080068019 - Flux orientation locating in a drilling system: An above ground locator includes an apparatus for determining the strength of the locating signal at a selected point relative to the boring tool. The apparatus includes an antenna arrangement configured for measuring the strength of the locating signal at the selected point along first and second orthogonally opposed receiving... Agent: Pritzkau Patent Group, LLC

20080068020 - Electromagnetic surveying for hydrocarbon reservoirs: A method of analyzing results from an underwater controlled source electromagnetic (CSEM) survey of an area that is thought or known to contain a subterranean hydrocarbon reservoir is described. The method is based on a wavefield extrapolation of narrow-band electromagnetic field data obtained from pairs of source and receiver locations.... Agent: Don W. Bulson, Esq. Renner, Otto, Boisselle & Sklar, P.l.l.

20080068021 - System and method for electromagnetic wavefield resolution: A method processing an electromagnetic wavefield response in a seabed logging operation. The wavefield is resolved into upgoing- and downgoing components. The downgoing component represents reflections from the sea surface while the upgoing component represents reflections and refractions from subterranean strata. The upgoing component is then subjected to analysis.... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20080068023 - Resistivity tools with load-bearing azimuthally sensitive antennas and methods of using same: The disclosure provides apparatus and method for estimating an electrical property downhole. The apparatus, in one aspect, includes an antenna that comprises a unitary metallic member that has a longitudinal axis and a radial axis, at least one slot made in the metallic member and an electrical conductor over the... Agent: Madan, Mossman & Sriram, P.C.

20080068022 - Resistivity tools with segmented azimuthally sensitive antennas and methods of making same: The disclosure provides apparatus and method for estimating one or more electrical properties downhole. The apparatus includes a metallic member that has a longitudinal axis and a radial axis, at least two groups of slots formed in the metallic member, each group of slots having at lest two rows of... Agent: Madan, Mossman & Sriram, P.C.

20080068024 - Method and apparatus for resistivity imaging in boreholes filled with low conductivity fluids: A mixed mode tool uses an inductive source and detects galvanic currents and/or potentials at electrodes in proximity to a borehole wall to produce a resistivity image of the earth formation. Alternative, the magnetic field produced by a galvanic current is detected by an antenna coil and used to produce... Agent: Madan, Mossman & Sriram, P.C.

20080068025 - Method and apparatus for resistivity imaging in boreholes filled with low conductivity fluids: A mixed mode tool uses an inductive source and detects galvanic currents and/or potentials at electrodes in proximity to a borehole wall to produce a resistivity image of the earth formation.... Agent: Madan, Mossman & Sriram, P.C.

20080068026 - Method of and a monitoring arrangement for monitoring the mercury condensation in an arc tube: The invention describes a method of monitoring the mercury condensation in a gas filled arc tube (2) of a mercury vapour discharge lamp (1), wherein a lamp voltage and a lamp current are determined and analysed to give an indication of the state of mercury saturation of the gas in... Agent: Philips Intellectual Property & Standards

20080068027 - Power line surge arrestor monitoring system: A monitoring system in accordance with one embodiment comprising a plurality of surge arrestors; a plurality of probes coupled, each one of the plurality of probes coupled to one of the plurality of surge arrestors; the plurality of probes comprising at least one current probe and at least one voltage... Agent: Fitch Even Tabin And Flannery

20080068028 - Arrangement for determining the distance, capacitive distance sensor and method for automatically focussing a microscope: An arrangement and method are provided for determining the distance between an objective of a microscope and a sample examined with the microscope. Fitted on the objective or in the immediate vicinity of the objective is a capacitive sensor in whose measuring range the sample and/or a microscope slide supporting... Agent: Crowell & Moring LLP Intellectual Property Group

20080068029 - Capacitance measuring apparatus and capacitance measuring method: A capacitance measuring apparatus which comprises: a voltage source for applying voltage fluctuation to a device under test; a current source for absorbing the current flowing through the resistance component of the device under test; and an ammeter for measuring the leakage current flowing through the device under test before... Agent: Paul D. Greeley, Esq. Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20080068030 - Successive approximate capacitance measurement circuit: A capacitance measurement circuit includes a current source, a switch, and a comparator. The current source is coupled to drive a current through a circuit node. The switch is coupled to the circuit node to switch the current into a device under test (“DUT”) capacitor. The comparator includes first and... Agent: Blakely Sokoloff Taylor & Zafman

20080068031 - Micromechanical microwave power meter: A micromechanical sensor for measuring millimetric wave or microwave power, which sensor comprises a wave line for conducting the millimetric or microwave power and a part arranged to move and a fixed electrode, in such a way that the capacitance (C) between the part that is arranged to move and... Agent: Birch Stewart Kolasch & Birch

20080068032 - Electrical junction box: An electrical junction box is adapted to be set in a conductivity inspection device. The conductivity inspection device includes a sensing pin assembly and guide pins, the guide pins extending beyond the sensing pin assembly. The electrical junction box includes a casing including a containing section and at least two... Agent: Oliff & Berridge, PLC

20080068033 - Method for re-registering an object to be aligned and storage medium storing a program for executing the method: A method for re-registering at least one set of image information of an object to be aligned to align the object by an imaging unit, the image information including photographing conditions and position data of the object which have been previously registered by capturing an image of the object with... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080068035 - Knee probe having reduced thickness section for control of scrub motion: An improved knee probe for probing electrical devices and circuits is provided. The improved knee probe has a reduced thickness section to alter the mechanical behavior of the probe when contact is made. The reduced thickness section of the probe makes it easier to deflect the probe vertically when contact... Agent: Lumen Patent Firm, Inc.

20080068034 - Probe array wafer: A probe array wafer includes a substrate upon which a plurality of compliant probes are mounted. Pairs of axially aligned probes may be electrically connected together to provide a pass through power connection from the test equipment to the device under test. Likewise, pairs of axially aligned probes may be... Agent: Pepper Hamilton LLP

20080068037 - Semiconductor device, method for measuring characteristics of element to be measured, and characteristic management system of semiconductor device: A plurality of series circuits each consisting of a current-carrying element and an element to be measured are provided between a power supply potential VDD and a ground potential VSS. The current-carrying elements are supplied with a test signal commonly, and corresponding selection signals, respectively. After a mode is set... Agent: Young & Thompson

20080068036 - Semiconductor test system capable of virtual test and semiconductor test method thereof: A semiconductor test system capable of performing a virtual test and a semiconductor test method thereof. The semiconductor test system includes a tester providing a test signal and an emulator providing a virtual test result to the tester in response to the test signal. The emulator includes virtual prober software... Agent: F. Chau & Associates, LLC

20080068038 - Systems and methods for controlling of electro-migration: Systems and methods for controlling electro-migration, and reducing the deleterious effects thereof, are disclosed. Embodiments provide for reversal of an applied voltage to an integrated circuit when a measurement indicative of an extent of electro-migration indicates that a healing cycle of operation is warranted. During the healing cycle, circuits of... Agent: Ibm Coporation (rtp) C/o Schubert Osterrieder & Nickelson PLLC

20080061762 - Remote continuity and cable identifier and polarity checker system and method: An electrical continuity test system with a tester and a remote probe. The tester includes circuitry for creating a pulsed current, an output for connection to a local end of a first test conductive element, to inject the pulses into the first test conductive element, an input for connection to... Agent: Mirick, O'connell, Demallie & Lougee, LLP

20080061764 - Battery management system and driving method thereof: A battery management system and a driving method thereof. The battery management system manages a plurality of battery cells, and a plurality of cell relays respectively coupled to the plurality of cells. The battery management system includes a voltage detecting unit and an MCU. The voltage detecting unit receives a... Agent: Stein, Mcewen & Bui, LLP

20080061763 - Substance identification and location method and system: This invention relates to a method and system for remote detection of a targeted substance by the appropriate application of a probing signal that induces molecular resonance in the target substance to create an identifiable signature or response. In the preferred embodiment, signals transmitted are an Infrared laser beam, amplitude... Agent: Dean A. Craine Suite 140

20080061765 - Multi-channel digital oscilloscope: The invention relates to a multi-channel digital oscilloscope having a plurality of analog inputs, circuits for the analog processing of input signals, sampling and digitizing circuits, means for triggering and synchronizing different channels and electrical isolation means. The invention is characterized in that, for N channels, where N is greater... Agent: Blank Rome LLP

20080061766 - System and method for testing integrated circuit timing margins: An integrated circuit load board includes a substrate on which a plurality of integrated circuit sockets and an integrated test circuit are mounted. The integrated test circuit includes circuitry for testing the timing margins of memory devices by determining the relative timing between read data and data strobe signals applied... Agent: Edward W. Bulchis, Esq. Dorsey & Whitney LLP

20080061767 - Magnetic pulse generator, especially for measuring wheel revolutions on bicycles or the like: Described is magnetic pulse generator, in particular for measuring wheel revolutions of bicycles and the like, comprising a magnet (1) and an attachment device (2) for attaching the magnet (1) to a movable component, in particular to a spoke (3) of a wheel. Damage to the component to which attachment... Agent: Birch Stewart Kolasch & Birch

20080061768 - Magnetic sensor device having components mounted on magnet: A magnetic sensor device is used for detecting, e.g., a rotational speed of a rotor made of a magnetic material by sensing changes in a magnetic field. The magnetic sensor device is composed of a magnet, electronic components including a sensor chip and wiring for electrically connecting the electronic components.... Agent: Posz Law Group, PLC

20080061769 - Apparatus to determine the position of an actuator: Apparatus to determine the position of a movable member of an actuator operating a valve assembly are disclosed. The movable member of the actuator displaces an actuation arm of a position sensor such that relative displacement occurs between a magnetic flux source and a magnetic flux sensor of the position... Agent: Hanley, Flight & Zimmerman, LLC

20080061770 - Detection of the instantaneous position of a linearly reciprocating member using high frequency injection: A piston position sensing circuit for sensing the instantaneous position of a piston of a free piston Stirling machine or a compressor mechanically connected to a reciprocating member of a linear electric motor or alternator. A source of a high frequency, alternating, electrical signal applies a high frequency signal to... Agent: Kremblas, Foster, Phillips & Pollick

20080061771 - Magnetic encoder: An annular magnetic encoder in which a plurality of S poles and N poles, the S poles and the N poles being magnetic poles, are alternately arranged, the magnetic encoder has a structure in which a change in width of the magnetic poles in a rotational direction according to a... Agent: Harness, Dickey & Pierce, P.L.C

20080061772 - Magnetostrictive transmitter with improved piezoelectric sensor: A magnetostrictive level sensing instrument is used for sensing level in a process vessel and comprises an elongate tube having a near end and a distal end. A magnet is selectively positionable proximate the tube responsive to level of the processed material. A magnetostrictive wire in the tube has first... Agent: Wood, Phillips, Katz, Clark & Mortimer

20080061773 - Method of evaluating a magnetoresistance effect read head: A method of evaluating can evaluate the bias magnetic field strength of hard films that construct a magnetoresistance effect read head, the magnetic coercivity of the hard films, and variations in the magnetic domain of shield films from measurement results for the resistance-parallel magnetic field strength characteristics. A magnetizing magnetic... Agent: Greer, Burns & Crain

20080061774 - Inspection of electrical conductivity in composite materials: Systems and methods for inspecting electrical conductivity in composite materials having conductive structures are disclosed. In one embodiment, a method for inspecting a conductive structure in a composite bonding region comprises positioning an apparatus operable to induce a current on the conductive structure. The apparatus is positioned on the conductive... Agent: Lee & Hayes, PLLC

20080061775 - Magnetic detection device including circuit capable of switching over output mode of n pole and s pole between non-separated one output and separated two outputs: A magnetic detection device includes a mode switching section capable of switching over a 1-output mode in which a (+) magnetic-field detected signal and a (−) magnetic-field detected signal are both outputted from a first external output terminal, and a 2-output mode in which the (+) magnetic-field detected signal and... Agent: Brinks Hofer Gilson & Lione

20080061777 - Magnetic detection device including resistance adjusting unit: In a magnetic detection device for obtaining an output from between a variable resistance element using the magnetoresistance effect and a reference resistance element, a balance between resistance values in the device can be easily adjusted in a wide range. A voltage is applied to a resistance adjusting unit, a... Agent: Brinks Hofer Gilson & Lione

20080061776 - Method and apparatus for loading a read/write head to a spinstand: Apparatus for loading a read/write head to a spinstand has a load area for receiving at least one head to be tested. The apparatus further has a first station having a coarse precisor arranged to provide a coarse positioning of the head. A first automation device is arranged to pick... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080061778 - Antenna coil for nmr probe and wire rod for same and nmr system: An antenna coil is formed by a wire rod obtained by combining and integrating two or more kinds of materials having different magnetisms. The wire rod has a circular or polygonal cross sectional shape. The two or more kinds of materials having different magnetisms are combined so that the magnetisms... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080061779 - Magnetic resonance imaging data acquisition sequence and apparatus:

20080061780 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: A magnetic resonance imaging apparatus includes an imaging unit which applies a labeling pulse to invert a spin included in a labeling region within part of a imaging region and then collects a echo signal from a time point when an inversion time has passed from the application of the... Agent: Nixon & Vanderhye, PC

20080061781 - Multidimensional nmr spectroscopy of a hyperpolarized sample: The present invention relates to methods of performing Nuclear Magnetic Resonance (NMR) spectroscopy adapted for a hyperpolarized sample. The methods comprise the steps of hyperpolarizing a sample using DNP, wherein at least a portion of the NMR active nuclei receives hyperpolarization; performing NMR spectroscopy on the sample with the use... Agent: Ge Healthcare, Inc.

20080061782 - Apparatus for electron spin resonance ct: A permanent magnet system for magnetic space is introduced, the system comprising: pole pieces having a predetermined area which are opposed to each other through a space; yokes combined with the pole pieces; and a permanent magnet inserted in series in a closed magnetic circuit formed by the pole pieces,... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080061784 - Floating probe for ultrasonic transducers: The present invention relates to a device with an ultrasonic-based probe for drilling and coring. The invention uses ultrasonic and subsonic vibrations produced by a frequency compensation coupler or free mass to produce the hammering action of a partially disengaged probe, with a relatively low axial force required. The invention... Agent: The Bilicki Law Firm, P.C. Furniture Mart Building,

20080061783 - Passively damped magnetic resonance (mr) detection configuration: A magnetic resonance (MR) detection configuration comprising at least one RF resonant circuit (1) with an inductance (L), a preamplifier module (2) and an RF receiver (7), wherein a reactive transformation circuit is connected between a high-impedance point (M) of the inductance (L) and a low-impedance connecting point (A) of... Agent: Kohler Schmid Moebus

20080061785 - Rf coil and mri system: In an MRI apparatus, an RF coil is provided which can generate or detect a circularly-polarized magnetic field with one feeding port, and which can radiate highly efficient, highly homogeneous electromagnetic waves and detect a highly sensitive, highly homogeneous magnetic resonance signal. For this purpose, the coil has a cylindrical... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080061787 - Magnetic resonance imaging apparatus: A magnetic resonance imaging apparatus including: static magnetic field generation means arranged around an imaging space where an examinee is to be located and generating a static magnetic field in the imaging space; gradient magnetic field generation means arranged in the imaging space side of the static magnetic field generation... Agent: Cooper & Dunham, LLP

20080061786 - Probe for nmr apparatus and nmr apparatus using the same: A probe for a nuclear magnetic resonance apparatus comprises: a transmission coil for irradiating a sample with a high-frequency electromagnetic wave; and a receiving coil for detecting a nuclear magnetic resonance signal emitted by the sample, wherein a selector switch is disposed to the transmission coil to reduce the deterioration... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080061788 - Resonator with adjustable capacitor for medical device: An apparatus, system and method of a resonator device with an adjustable capacitor for allowing the resonance frequency (F) of the resonator device to continue to be matched to the Larmor frequency of the MRI system. The resonator device includes an inductor coil, a conductive member, a sleeve having first... Agent: Brooks & Cameron, PLLC

20080061789 - Telemetry apparatus and method for monitoring a borehole: A system, method and device may be used to monitor conditions in a borehole. Energy is transmitted to a pulse generator located proximate a position to be interrogated with a sensor. The pulse generator stores the energy, then releases it in a pulse of electromagnetic energy, providing the energy to... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20080061790 - Method for combined transient and frequency domain electromagnetic measurements: A method for interpreting transient electromagnetic survey data includes imparting an electromagnetic field in the Earth's subsurface by passing electric current through a transmitter antenna. The electric current includes switched direct current at a selected switching frequency. Voltages induced in a receiver corresponding to electromagnetic effects induced in the Earth's... Agent: Richard A. Fagin

20080061791 - Procedure for testing the function of a lamp circuit: m

20080061792 - Multi-functional ph meter and fabrication thereof: A multi-functional PH meter and the fabrication thereof are disclosed. The multi-functional pH meter comprises a sensor unit, an analog signal processing unit, a microprocessor unit, a liquid crystal display unit, a compact flash card unit and a data transmission unit. The sensor unit includes an electrode, a substrate, an... Agent: Wpat, PC

20080061793 - Detection and suppression of electrical arcing: Method and apparatus for detecting or suppressing electrical arcing or other abnormal change in the electrical impedance of a load connected to a power source. Preferably the load is a plasma chamber used for manufacturing electronic components such as semiconductors and flat panel displays. Arcing is detected by monitoring one... Agent: Robert J. Stern

20080061794 - System and method for managing power supplied to a plasma chamber: A system and method for managing power delivered to a processing chamber is described. In one embodiment power is delivered to the processing chamber with a power cable, the power cable storing energy and including a first and second conductors, the first conductor having a first voltage polarity relative to... Agent: Neugeboren Law Firm PC

20080061795 - Wiring connected state inspecting instrument: An instrument comprises an odd multiplexer (11o) for sequentially selecting terminals connected to odd wires one by one, an even multiplexer (11e) for sequentially selecting terminals connected to even wires on by one, odd relay switches (13o-1, 13o-2) for switching connection of the odd multiplexer (11o) to a ground terminal,... Agent: Connolly Bove Lodge & Hutz LLP

20080061796 - Signal detecting apparatus and signal detecting system: A signal detecting apparatus includes a component extractor extracting a voltage component whose absolute value is not less than a predetermined value from an electronic signal generated by a tester for testing an electric property of a device under test; a rate-of-change calculator calculating a time rate-of-change of a level... Agent: Sughrue Mion, PLLC

20080061797 - System for testing power supply performance: A system for testing power supply performance is provided. The system includes a power supply having a plurality of outputs for outputting voltages, a plurality of display units corresponding to the plurality of outputs, for reflecting performance of the power supply, a plurality of resistance-matching selectors corresponding to the plurality... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20080061798 - Microcoaxial probes made from strained semiconductor bilayers: The present invention provides microcoaxial probes fabricated from semiconductor heterostructures that include strained semiconductor bilayers. The microcoaxial probes are well suited for use as scanning probes in scanning probe microscopy, including scanning tunneling microscopy (STM), atomic force microscopy (AFM), scanning microwave microscopy, or a combination thereof.... Agent: Foley & Lardner LLP

20080061799 - Capacitive pressure sensor and method for fabricating the same: A capacitive pressure sensor and a method for fabricating a capacitive pressure sensor are provided. The method includes etching the front surface of a silicon substrate to a designated depth; depositing an etching stopper on the surface of the silicon substrate, to stop the etching of the rear surface of... Agent: Gwips Peter T. Kwon

20080061800 - Methods and systems for sigma delta capacitance measuring using shared component: Methods, systems and devices are described for detecting a measurable capacitance using sigma-delta charge transfer techniques that can be implemented with many standard microcontrollers, and can share components to reduce device complexity and improve performance. In the various implementations of this embodiment, the passive network used to accumulate charge can... Agent: Ingrassia Fisher & Lorenz, P.C. (syna)

20080061801 - Measuring chip-to-chip capacitance differentials by demodulating signals over a capacitance bridge: These signals are received on second terminals of the first capacitor and the second capacitor and demodulated using a periodic signal to produce demodulated signals. This periodic signal has the same fundamental frequency as the first time-varying signal and the second time-varying signal. A DC component in the demodulated signals... Agent: Sun Microsystems Inc. C/o Park, Vaughan & Fleming LLP

20080061802 - Method and apparatus for controlling the sensitivity and value of a capacitive humidity sensor: A humidity sensor apparatus and method of forming the same. A substrate can be provided upon which a plurality of humidity sensing components are disposed to form a humidity sensor thereof. Each humidity sensing component generally includes an associated particular parasitic capacitance. This parasitic capacitance is utilized to reduce and/or... Agent: Intellectual Property Honeywell International Inc.

20080061803 - Method and apparatus for making a determination relating to resistance of probes: According to some embodiments, a method of determining a resistance of probes on a contactor device is disclosed. The contactor device can include a plurality of probes disposed to contact an electronic device to be tested. The method can include electrically connecting a pair of the probes to each other,... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080061804 - High-conductivity contacting-type conductivity measurement: An improved contacting-type conductivity measurement system and method are provided. A first conductivity measurement is obtained by driving a contacting-type conductivity sensor with an excitation voltage at a first frequency, a second conductivity is obtained by driving the contacting-type conductivity sensor with the excitation voltage at a second frequency. The... Agent: Westman, Champlin & Kelly, P.A.

20080061805 - Voltage contrast monitor for integrated circuit defects: A semiconductor chip is provided which includes active and inactive IP cores. The spaces on the metal layer associated with the inactive IP cores includes voltage contrast inspection structures. The voltage contrast inspection structures serve to provide improved planarization of the metal layer and provided improved inspection capabilities.... Agent: Lsi Corporation

20080061806 - Probe substrate for test and manufacturing method thereof: A probe substrate includes a plurality of beams, a probe having a contactor formed at one end of the beam, and a support substrate supporting the probe and having a bending space in which the probe can be bent upwards and downwards, and a trench oxide layer is formed on... Agent: LexyoumeIPGroup, LLC

20080061807 - Configurable prober for tft lcd array test: A method of testing electronic devices on substrates is described. The method includes placing a configurable prober over a first substrate, testing the first substrate, re-configuring the configurable prober, placing the configurable prober over a second substrate, and testing the second substrate.... Agent: Patterson & Sheridan, LLP

20080061808 - Compliance partitioning in testing of integrated circuits: Probecard architectures partition the spring compliance required for IC testing between several different components. Such architectures can provide shorter springs, better impedance control, improved power/ground distribution and more direct paths to tester electronics. The probecards can also use thinner interconnector substrates to conform to the planarity of a DUT and... Agent: Patent Law Offices Of David Millers

20080061809 - Pogo pins and contact-type of test device having pogo pins for testing semiconductor device: A pogo pin of a contact-type of semiconductor test device will not be oxidized and will not damage of a solder ball of a semiconductor package when the pogo pin is brought into contact with the solder ball. The pogo pin includes an electrical contact of a conductive rubber material,... Agent: Volentine & Whitt PLLC

20080061810 - Electrical test method of an integrated circuit: A method for testing an integrated circuit is provided comprising steps of providing at least one first conductive path stretching along an element of the integrated circuit, applying a voltage at a point of the first conductive path, performing a first measurement of the voltage at a point of the... Agent: Seed Intellectual Property Law Group PLLC

20080061811 - Electronic device having an interface supported testing mode: A system is provided for testing a logic device and an integrated circuit disposed within a semiconductor device package. The logic device may be configured to operate in at least a normal mode and a test mode. A terminal external to the semiconductor device package may be electronically coupled to... Agent: Carr & Ferrell LLP

20080061812 - Component-attach test vehicle: Apparatus, systems, and methods are provided for testing the integrity of electrical interconnections in electronic systems. Apparatus may be constructed by modifying a substrate designed for deployment in an end-use product by shorting together multiple contacts on one side of it. Such vehicles may be used to test the characteristics... Agent: Sun Microsystems, Inc. C/o Dorsey & Whitney, LLP

20080061814 - Electronic component test system: A system for testing a die (or chip) of a semiconductor wafer is disclosed. It features measuring the temperature of the die according to a light beam originating from the die. The temperature so measured functions as part of test record and/or the basis for controlling the temperature of the... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080061813 - Semiconductor integrated circuit tester with interchangeable tester module: A test head for an integrated circuit tester includes a main chassis defining a chamber that is open at the top. Tester modules are installed in the chamber, each tester module being removable as a unit from the chamber and including a tester module chassis, multiple pin electronics cards, and... Agent: Smith-hill And Bedell, P.C.

20080061815 - System and method for display test: The system for display test includes a driving circuit having integrated circuit (IC) pads on the substrate and the IC pads are electrically connected to the signal lines, respectively. And the first switches are between the first test pads and the IC pads, wherein the number of the first test... Agent: Squire, Sanders & Dempsey L.L.P.

20080054875 - Biometric sensor and sensor panel: A biometric sensor panel includes (a) a first flexible substrate, (b) a plurality of first electrodes formed on the first flexible substrate, the first electrodes being arranged in a first direction, (c) a semiconductor layer formed on the first electrodes, (d) a second flexible substrate, (e) a plurality of second... Agent: Townsend And Townsend And Crew, LLP

20080054877 - Circuit for measuring current in a nand flash memory: A circuit measures current passing through a memory cell in a NAND flash memory. The circuit includes a decoder and an analog mixer. The decoder is configured to select at least one data line coupled to page buffers and column decoders in accordance with a controlling signal. The analog mixer... Agent: Townsend And Townsend And Crew, LLP

20080054878 - Image forming apparatus with plural ac sources: An image forming apparatus includes two AC power input cords to be connected to an AC power source. The image forming apparatus can detect if at least one of the two AC power input cords is not connected to the AC power source. An input voltage detector or a zero-cross... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080054880 - Measurement device, method, program, and recording medium: The level of an output signal output from a device under test is easily adjusted in order to restrain an adverse effect on a result of measuring characteristics of the device under test. A measuring device includes a characteristic measuring unit for measuring characteristics of a device under test based... Agent: Greenblum & Bernstein, P.L.C

20080054876 - Superconducting power cable capable of quench detection and quench detection system using the same: Disclosed is a superconducting power cable capable of quench detection, and a quench detection system using the superconducting power cable. The superconducting power cable capable of quench detection includes a former; a superconducting conductor layer composed of a superconducting wire and surrounding the former; a conductor layer quench detection coil... Agent: Jones Day

20080054879 - Components and methods for use in electro-optic displays: A front plane laminate useful in the manufacture of electro-optic displays comprises, in order, a light-transmissive electrically-conductive layer, a layer of an electro-optic medium in electrical contact with the electrically-conductive layer, an adhesive layer and a release sheet. This front plane laminate can be prepared as a continuous web, cut... Agent: David J Cole E Ink Corporation

20080054881 - Dc current sensor: Disclosed is a DC current sensor including: a magnetic core symmetrically divided into two parts and having a center space through which a conductive wire carrying DC current to be measured passes; a detection coil wound around one of the magnetic core parts for measuring electromotive force; an operating member... Agent: Ipla P.A.

20080054882 - Self-test probe design & method for non-contact voltage detectors: A non-contact voltage detector having a self-test feature is provided. The non-contact voltage detector may include an antenna, a detection circuit and a self-test circuit. The self-test circuit may be configured to send a test signal through a portion of the antenna and to the detection circuit. Alternatively, the self-test... Agent: Pillsbury Winthrop Shaw Pittman LLP

20080054883 - Chuck for holding a device under test: A chuck for a probe station.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080054884 - Chuck for holding a device under test: A chuck for a probe station.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080054885 - Chuck for holding a device under test: A chuck for a probe station.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080054887 - Inductive position sensor: An inductive position sensor for position sensing includes a transmitter coil and a receiver coil, the receiver coil generating a receiver signal when the transmitter coil is excited by an alternating current source. A moveable coupler element modifies the inductive coupling between the transmitter coil and the receiver coil so... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c

20080054886 - Magnetic encoder unit: The magnetic encoder unit includes a permanent magnet 2 magnetized in a direction perpendicular to a rotation axis of a rotating member 1 and fixed to the rotating member 1, a magnetic field detecting element 4 fixed to a fixed member 3 so as to be opposite to the permanent... Agent: Sughrue Mion, PLLC

20080054890 - Magnetic detection device connecting element and detection circuit and method of manufacturing the same by using step portion alleviating resist: A magnetic detection device has stable characteristics having an area of a resist layer covering an insulating passivation layer, forming the magnetic detection element and a connection layer on a small stepped surface with high-precision, and preventing the resist layer from peeling, thereby providing a method of manufacturing the magnetic... Agent: Brinks Hofer Gilson & Lione

20080054888 - Magnetic detection device having bridge circuit provided with resistance adjustment portion and method of manufacturing the same: In a magnetic detection device using a magnetic resistance element, the resistance of a layer having a multi-layer structure can be easily adjusted without causing damages to the layer. A magneto-resistance layer is connected in series to a reference resistance layer, and a magneto-resistance layer is connected in series to... Agent: Brinks Hofer Gilson & Lione

20080054889 - Magnetic detection device including circuit switching and processing input of two bridge circuits: A magnetic detection device of a NS detection type is provided. A magnetic detection device comprising a first series circuit, a second series circuit, and a third series circuit. At least one of a plurality of resistance elements forming the first series circuit includes a first magneto-resistance element using a... Agent: Brinks Hofer Gilson & Lione

20080054891 - Proximity probe transmitter: A digital based two wire proximity transmitter system and a method for calibrating the system, wherein the transmitter includes a customized linearization table uniquely generated during calibration to take into account the unique impedance properties of a particular probe/coaxial cable configuration. During calibration, the probe is positioned adjacent a calibration... Agent: Mark A. Tidwell Jackson Walker L.L.P.

20080054892 - Detector for locating metallic objects: d

20080054893 - Metal object detecting apparatus: A metal object detecting apparatus comprising, a transmitter for generating a primary magnetic field having a resultant magnetic field direction which varies along any substantially linear path through a surveillance volume such that at three locations along said path the resultant magnetic field points in three mutually substantially orthogonal directions;... Agent: Nixon & Vanderhye, PC

20080054894 - Magnetic detection device having element provided with multi-layered protection layer and a method of manufacturing the same: The invention provides a magnetic detection device having excellent thermal resistance and water resistance by changing a configuration of layers of an insulating protection layer covering a magnetic detection element. A magnetic detection element is covered with an insulating protection layer, and the insulating protection layer has an alumina layer... Agent: Brinks Hofer Gilson & Lione

20080054895 - Magnetic detection device having second bridge circuit including fixed resistance element with high resistance: A magnetic detection device capable of reducing current consumption includes a second series circuit connected in parallel to a first series circuit. The first series circuit includes a first magneto-resistance element, and a third series circuit 30 includes a second magneto-resistance element. The second series circuit includes fixed resistance elements.... Agent: Brinks Hofer Gilson & Lione

20080054897 - Magnetic sensor with offset magnetic field: A method, a magnetic field sensor, and an electronic device measure and determine the magnitude and/or the direction of a magnetic field. The magnetic sensor is based on at least a first magnetoresistive-layered structure having an electric resistance depending on the magnitude of the magnetic field. The magnetic sensor generates... Agent: Law Offices Of Michael Dryja

20080054896 - Magnetic sensor with parallel magnetic sensor strips: The present provides a magnetic sensor device comprising at least one magnetic sensor element with N parallel magnetic sensor strips, N being at least 2, and wherein a constant voltage is applied across the N parallel magnetic sensor strips. The sensor device may advantageous be applied in applications where a... Agent: Philips Intellectual Property & Standards

20080054898 - Device and method for measuring a current flowing in an electrical conductor: A device for measuring a current flowing in an electrical conductor that has a magnetic circuit coupled to an electrical conductor. The magnetic circuit has an air gap and a magnetic field sensitive component disposed in the air gap to measure a magnetic field generated by the electrical conductor. At... Agent: Wolf Greenfield & Sacks, P.C.

20080054899 - Motion corrected magnetic resonance imaging: A method of correcting for motion in magnetic resonance images of an object detected by a plurality of signal receiver coils comprising the steps of acquiring a plurality of image signals with the plurality of receiver coils, determining motion between sequential image signals relative to a reference, applying rotation and... Agent: Beyer Weaver LLP

20080054900 - Method and system of enhanced phase suppression for phase-contrast mr imaging: An automated image processing technique is disclosed that evaluates pixels of a phase-difference image to determine those pixels corresponding to inflowing phase data and background phase data. Phase-difference images are generated from a first acquisition and a second acquisition. Non-zero spatially varying background phase from the phase-difference images that are... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20080054901 - Dividing wall separating the rf antenna from the patient chamber in an mr scanner: A dividing wall made from at least one first wall material for delimitation of a patient positioning region from an antenna structure of a magnetic resonance tomography apparatus has at least one region at which a specific sub-structure of the antenna structure is located on the side of the dividing... Agent: Schiff Hardin, LLP Patent Department

20080054902 - Passive shimming for mr spectroscopy at high magnetic fields: A method of providing shim sheets for adjusting a magnetic field in a magnetic resonance device by passive shimming, comprises the steps of field mapping of a region of interest in the MR device for obtaining an uncorrected magnetic field distribution including field inhomogeneities, decomposing the field inhomogeneities into first... Agent: Caesar, Rivise, Bernstein, Cohen & Pokotilow, Ltd.

20080054904 - Radiofrequency magnetic field resonator and a method of designing the same: A radiofrequency (RF) resonator for magnetic resonance analysis, the RF resonator comprising: (a) at least two conductive elements, each having a first curvature along a direction perpendicular to a longitudinal axis, the at least two conductive elements being spaced along the longitudinal axis, so that when an RF current flows... Agent: Martin D. Moynihan Prtsi, Inc.

20080054903 - System of electric coils for transmitting and receiving radio-frequency magnetic fileds in a magnetic-resonance imaging apparatus, and magnetic-resonance imaging apparatus provided with such a system of electric coils: The invention relates to a magnetic resonance imaging (MRI) apparatus comprising an electrical coil system (17) for transmitting and receiving a radio-frequent (RF) magnetic field from an examination volume (3) of the MRI apparatus. The electrical coil system (17) comprises at least one surface coil (35) which substantially extends in... Agent: Philips Intellectual Property & Standards

20080054905 - Metal detection methods and apparatus: Metal detectors include a sense coil coupled to an analog to digital converter that produces a numeric representation of an electrical signal associated with a conductive object situated in an active region of a sense coil. The numeric representation is processed to obtain a noise contribution associated with random noise,... Agent: Klarquist Sparkman, LLP

20080054906 - Correction of misalignment of antennas in a downhole logging tool: Misalignment of the transmitter and receiver coils of an induction logging tool is determined by positioning the logging tool with a coil axially encompassing the transmitter coil and/or the receiver coil, and activating the transmitter at a plurality of rotational angles. It is emphasized that this abstract is provided to... Agent: Madan, Mossman & Sriram, P.C.

20080054907 - Assembled battery total voltage detection and leak detection apparatus: The present invention provides an assembled battery total voltage detection and leak detection apparatus which is reduced in size and is reduced in manufacturing costs. Detection of a total voltage is performed at a measurement time of a total voltage of an assembled battery 1 by connecting an output of... Agent: Jason H. Vick Sheridan Ross, PC

20080054908 - Battery pack and method of calculating deterioration level thereof: A battery pack is disclosed. The battery pack includes at least one battery, a switch section, a measurement section, and a deterioration level calculation section. The switch section turns on and off charging to the battery. The measurement section measures an open circuit voltage of the battery. The deterioration level... Agent: Bell, Boyd & Lloyd, LLP

20080054909 - Battery control device, battery control method, power source control device and electronic apparatus: A battery control device 1 has an electric circuit control unit 6 controlling a power supply; a voltage measuring unit 7 measuring a voltage; a current measuring unit 8 measuring an electric current; and a power source control unit 9, wherein the power source control unit 9 measures a first... Agent: Staas & Halsey LLP

20080054910 - Test apparatus for testing operation of a printed circuit board: A test apparatus includes lower and upper spacer discs for sandwiching and securing a printed circuit board therebetween, lower and upper plates, and a two-step driving mechanism. The lower and upper spacer discs are spaced apart from the lower and upper plates. Activation of the test apparatus in a first... Agent: Birch Stewart Kolasch & Birch

20080054911 - Electromagnetic apparatus for measuring angular position: An apparatus is disclosed for measuring the angular position of a movable part. The method and apparatus comprise at least two resonators formed by coupled slow-wave structures, e.g. coupled spirals, and a movable target. The angular position of the target is representative of the angular position of the movable part.... Agent: David S. Nyce

20080054912 - Filter rod measuring station as well as method for measuring the mass of a softener, the moisture and/or the dry filter material in a filter rod: A filter rod measuring station is equipped with measuring devices which measure at least the mass (M) of a filter rod and the draw resistance (PD) of the filter rod, and a microwave measuring device is provided for measuring the mass of the softener and/or the moisture content and/or the... Agent: Kinney & Lange, P.A.

20080054913 - Impedance systems, devices, and methods for evaluating iontophoretic properties of compounds: Systems, devices, and methods for evaluating iontophoretic properties of compounds. An impedance spectrometer is operable to determine an impedance of a compound and a processor is configured to compare the determined impedance of the compound to a database of stored values.... Agent: Seed Intellectual Property Law Group PLLC

20080054914 - Electrochemical impedance measurement system and method for use thereof: Disclosed is a method and apparatus for an electrochemical impedance measurement, and in particular circuitry and components employed for such measurements. The system employs an injected broadband AC signal to produce an associated response signal. The subsequent analysis of injected and response signals, considering both magnitude and phase, gives broadband... Agent: Basch & Nickerson LLP

20080054915 - Semiconductor device and method for measuring analog channel resistance thereof: A semiconductor device and a method for measuring an analog channel resistance thereof are provided. The semiconductor device-includes-a substrate, a gate insulating layer and a gate formed on the substrate, a source and a drain formed in the substrate and at both sides of the gate, a source sense connected... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080054917 - Method and appartus for switching tester resources: A contactor device comprising a plurality of probes disposed to contact ones of the electronic devices can be electrically connected to a source of test signals. A switch can be activated electrically connecting a connection to the source of test signals to a selected one of a first group of... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080054916 - Probe: It is an object of the present invention to provide a probe which can provide stable electrical conduction to an electrode of an object to be measured even when it is miniaturized. A probe 100 comprises a columnar contact part 110 which can come in contact with an electrode 10... Agent: Kratz, Quintos & Hanson, LLP

20080054919 - Vertical probe device: A vertical probe device includes two guide members arranged in a stack manner and defining therebetween an accommodation chamber, a probe holder plate disposed between the guide members, and a plurality of probes inserted through the guide plates and the probe holder plate in such a manner that the probes... Agent: Bacon & Thomas, PLLC

20080054918 - Vertical type high frequency probe card: A vertical-type probe card includes a circuit board, which has signal circuits and grounding circuits arranged in such a manner that each signal circuit is disposed in parallel and adjacent to one grounding circuit and kept a predetermined distance from the grounding circuit, and a probe assembly, which is arranged... Agent: Bacon & Thomas, PLLC

20080054921 - Inspection equipment of circuit board and inspection method of circuit board: An intermediate holding plate 36 is provided in a relay pin unit 31, and a first abutment support position 38A of a first support pin 33 disposed between a first insulating plate 34 and the intermediate holding plate 36 with respect to the intermediate holding plate and a second abutment... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080054920 - Method for evaluating soi wafer: The present invention is a method for evaluating an SOI wafer by using a mercury probe, comprising at least steps of, subjecting the SOI wafer to a hydrofluoric acid cleaning treatment and thereby to remove a native oxide film formed in a surface of the SOI wafer, next subjecting the... Agent: Oliff & Berridge, PLC

20080054923 - Probe for testing a device under test: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080054922 - Probe station with low noise characteristics: A cable includes an inner conductor, an inner dielectric, and a guard conductor, where the inner dielectric is between the inner conductor and the guard conductor. The cable also includes an outer dielectric, and a shield conductor, where the outer dielectric is between the guard conductor and the shield conductor.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080054924 - Contact for interconnect system: The present invention generally relates to testing of IC devices, more specifically to a contact (11) for a test socket (1) for interfacing leads (21) of the IC devices (2) with a printed circuit board (3) of a tester. The contact (11) comprises a contact body (12), a first arm... Agent: Donn K. Harms Patent & Trademark Law Center

20080054925 - Test chip socket: A test chip socket comprises a contact block fixed to a tester substrate, a tray mounted to the contact block, the tray having a convex part for positioning test target chips to a plurality of mount positions, and a plurality of probes each of which is held by the contact... Agent: Dickstein Shapiro LLP

20080054926 - Burn-in testing apparatus and method: An integrated circuit (IC) package testing apparatus integrates a temperature sensor, heater (or cooler), and controller within a single modular unit. The controller is a microprocessor embedded within the modular unit and in communication with the sensor and heater. The controller allows a selected testing temperature to be input by... Agent: Marger Johnson & Mccollom, P.C.

20080054928 - Electric potential difference detection method and scanning probe microscope: An electric potential difference detection method detecting an electric potential difference occurring between a surface of a sample and a probe of a cantilever of a scanning probe microscope includes: applying an AC voltage of a frequency of ½ of a resonance frequency of the cantilever, between the sample and... Agent: Bruce L. Adams, Esq.

20080054927 - Probe assembly: The probe assembly has a plurality of probes, a probe base provided with the probes, and a plurality of guard members provided on the probe base. Each probe has an arm portion supported on the probe base at its one end and extending from a mounting surface of the probe... Agent: Ingrassia Fisher & Lorenz, P.C.

20080054929 - Probe for testing a device under test: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080054932 - Method and apparatus for measuring leakage current: A method and apparatus for measuring a leakage current of a semiconductor device having a first end and a second end are disclosed. The apparatus for measuring a leakage current includes a capacitor having one end coupled with the first end of the semiconductor device; and a MOSFET transistor having... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080054931 - Method and system for detecting or reviewing open contacts on a semiconductor device: A method and system for detecting or reviewing defective contacts on a semiconductor device are disclosed. In a first embodiment, the method and system comprise providing a positive charge sufficient enough to turn on a gate of an associated MOS device and scanning an area of interest within the MOS... Agent: Sawyer Law Group LLP

20080054930 - Multi-channel pulse tester: A method for testing a plurality of DUTs using a plurality of DC instruments and a pulsed instrument includes contemporaneously applying DC signals to the DUTs with respective DC instruments and sequentially performing pulsed measurements on the DUTs with the pulsed instrument.... Agent: Pearne & Gordon LLP