Electricity: measuring and testing inventions 02/08

20080048639 - Probing high-frequency signals: Apparatus and associated systems and methods may relate to a wide bandwidth cable assembly that may include an active amplification stage to receive high frequency signals (e.g., 1 GHz or above) through a transmission line extending distally to a passive, high density signal probe stage. In an illustrative example, the... Agent: Fish & Richardson P.C.

20080048635 - Method and apparatus for locating non-visible objects: Non-visible objects which differ in their physical properties from their surroundings by association with a variable strength magnetic field may be detected by a suitable array of sensors which can be moved relative to the object in question. By analyzing the signals from the plurality of the sensors in the... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20080048636 - Method and apparatus for silicon-on-insulator material characterization: A method and apparatus for thickness measurement of an active layer of a silicon-on-insulator material comprising a layered structure of silicon film, a buried oxide layer and a silicon substrate. In one embodiment, the method comprises the steps of directing a low intensity light of an energy greater than the... Agent: Kirkpatrick & Lockhart Preston Gates Ellis LLP (formerly Kirkpatrick & Lockhart Nicholson Graham)

20080048637 - Measuring device for measuring the output current of a clocked half-bridge circuit: The invention relates to a method for measuring the output current of a clocked half-bridge circuit (1) in which semiconductor switches (5a, 5b) located in half-bridge sections (2a, 2b) are alternatingly opened or closed in push-pull operation and thereby cause an alternating current in an output current circuit. The current... Agent: The Webb Law Firm, P.C.

20080048638 - Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuit: An integrated circuit device having at least one fuse capable of being blown in order to provide measurements of fuse current-voltage characteristics is provided. The integrated circuit device also provides at least one pulse generation circuit associated with the fuse and capable of generating a pulse to blow the fuse... Agent: Ryan, Mason & Lewis, LLP

20080048640 - Methods for detecting and classifying loads on ac lines: Methods for detecting and classifying loads on alternating current (AC) lines are provided. One such method includes the steps of placing an AC field sensor in AC electric and magnetic fields generated by an AC line, generating an electric field signal representative of the AC electric field received by the... Agent: U S Army Research Laboratory Attn Amsrl Cs Cc Ip

20080048641 - Peak voltage detector circuit and binarizing circuit including the same circuit: A peak voltage detector circuit detects a peak voltage of an input voltage. The input voltage is input into a first input terminal of a comparator. A counter circuit counts up a counter value in synchronization with a first clock signal, when a signal output from the comparator is in... Agent: Posz Law Group, PLC

20080048642 - Current sensor: A current sensor for measuring an electric current flowing through a conductor includes a ring shaped magnetic core, a bare semiconductor chip, and a case. The magnetic core has a gap and surrounds the conductor. The bare semiconductor chip has a front surface and a vertical Hall effect element formed... Agent: Posz Law Group, PLC

20080048643 - Current sensor with alternating magnetic excitation: wherein the sensor is equipped with windings forming a transformer of which at least one primary winding opposite the magnetic circuit through which a current I to be measured is designed to enter, and at least one secondary winding opposite the magnetic circuit capable of producing a counter reaction magnetic... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080048644 - Current mode analog-to-digital converter: A current measuring system has an electrical component configured to provide an electrical current representative of a parameter of interest at an output node; and an analog to digital converter having a current input node in electrical communication with the output node of the electrical component.... Agent: Steven L. Nichols Rader, Fishman & Graver PLLC

20080048645 - Measuring device for measuring an electrical current: A measuring device for measuring an electrical current has an alternating-current converter (6) that possesses a primary inductance and an ohmic secondary resistance (RS) and whose output is connected across a measured-value signal conditioning device to a measurement output for a current measuring signal. The output of the alternating-current converter... Agent: The Webb Law Firm, P.C.

20080048646 - Precision, temperature-compensated, shielded current measurement device: A current measurement device using a Rogowski coil having a generally toroidal-shaped core with a first winding in one direction and a second winding forming a return loop. The coil is positioned within a two-piece electrostatic shield. A first piece of the electrostatic shield is a partially donut-shaped member having... Agent: Jensen + Puntigam, P.s.

20080048647 - Chuck for holding a device under test: A chuck for a probe station.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080048648 - Chuck for holding a device under test: A chuck for a probe station.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080048652 - Position detecting device and method of adjusting position: A position detecting device has a movable unit, and a hold unit that movably holds the movable unit. One of the movable unit and hold unit has a magnetic field generator having an engaged portion and a guide opening. A magnetic field sensor is provided on the other unit of... Agent: Greenblum & Bernstein, P.L.C

20080048651 - Rotation angle detecting device: A rotation angle detecting device includes a magnetic member for providing a magnetic field, a magnetic sensor for sensing a change in the magnetic field when the magnetic member rotates relative to the magnetic sensor about a rotation axis. The magnetic sensor is disposed at a single position and includes... Agent: Nixon & Vanderhye, PC

20080048649 - Thin input device and mobile terminal equipped with the same: Disclosed herein is a thin input device. The thin input device includes a manipulation means, a displacement detection means, and a housing. The manipulation means is capable of being displaced in any direction. The displacement detection means is electrically connected to an external device and detects the displacement of the... Agent: Staas & Halsey LLP

20080048650 - Position sensor and assembly: Disclosed herein, in an exemplary embodiment, is a position sensor assembly including a circular-shaped or rhombus-shaped magnet and at least one magnetic flux density sensor, such as a Hall effect sensor, wherein rotation of the magnet is detected by the at least one sensor. The magnet may be positioned coaxially... Agent: Delphi Technologies, Inc.

20080048654 - Magnetic rotation-angle sensor and angle-information processing device: A simple circuit configuration without increasing the number of magnetic poles of a magnet can be performed and angular resolution can be improved. The polarities is determined and the absolute values are compared in accordance with the rotation angle of a magnet (1) based on sensor output signals a and... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080048653 - Multi-turn shaft encoder: The present invention provides an absolute shaft encoder to measure both the angular position of a shaft from a given radial axis and simultaneously or in sequence to record the number of completed rotations of the shaft passing through a given radial datum axis, the encoder consisting of a first... Agent: Bradley N Ruben

20080048655 - Device and method for measuring a current flowing in an electrical conductor: A device for measuring a current flowing in an electrical conductor. The device comprises a magnetic circuit coupled to an electrical conductor. The magnetic circuit has an air gap and a magnetic field sensitive component disposed in the air gap to measure a magnetic field generated by the electrical conductor.... Agent: Wolf Greenfield & Sacks, P.C.

20080048656 - Thermal controlling method, magnetic field generator and mri apparatus: With a view toward implementing a thermal controlling method for making reversible a temperature characteristic of a magnetic field generator using permanent magnets small in Hcj, a magnetic field generator whose temperature characteristic is reversible, using permanent magnets small in Hcj, and an MRI apparatus provided with such a magnetic... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20080048658 - Automatic noise cancellation for unshielded mr systems: A signal processing system for active, environmental, electronic noise suppression is proposed. The system employs a noise sense coil outside the imaging volume to detect the environmental electronic noise, it subtracts the correlated noise in the environmental signal from the imaging signal. The noise suppression eliminates the need for the... Agent: Ade & Company Inc.

20080048657 - Method for aligning multiple mr images acquired with alternating readout gradient: A water and fat image are acquired using a pulse sequence in which NMR signals for one image data set are acquired with a readout gradient of one polarity and NMR signals for the other image data set are acquired with a readout gradient of the opposite polarity. A misalignment... Agent: Quarles & Brady LLP

20080048659 - Generalized method for mri chemical species separation using arbitrary k-space trajectories: A method for producing images of a subject containing M spin species using a magnetic resonance imaging (MRI) system includes obtaining N k-space data matrices from N k-space data sets acquired with the MRI system using a pulse sequence with an individual associated echo time. The k-space data matrices each... Agent: Quarles & Brady LLP

20080048660 - Wireless rf coil power supply: A system wirelessly supplies electrical power to an RF coil and an analog-to-digital converter (ADC) for an MRI system. The system supplies power to at least operate the RF coil and ADC without the use of a battery and without use of a wired connection external to the bore of... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20080048661 - Rectangular-wave transmitting metal detector: This invention relates to an electronic metal detector having transmit electronics comprising switching electronics arranged and adapted to generate a transmit signal, the transmit electronics comprising at least two power sources, a first power source and a second power source, the transmit electronics being connected to a transmit coil arranged... Agent: Osha Liang L.L.P.

20080048662 - Battery monitoring system: A system for the monitoring of the state of a battery used in a vehicle and to which electrical elements comprising at least one electrical consumer and/or at least one electrical generator are connected comprises means for the detection of the battery voltage, means for the extraction of voltage frequency... Agent: Delphi Technologies, Inc.

20080048663 - Apparatus for and method of measuring composition and pressure of the discharged gas from ion gauge using residual gas analyzer: Disclosed herein are an apparatus for and method of measuring the composition and the pressure of the discharged gas from an ion gauge by using a residual gas analyzer. In this regard, there are provided a vacuum container 200 divided into a pressure container 210 and a discharge container 220... Agent: Demont & Breyer, LLC

20080048664 - Specimen pretreating device and probe used therefor: [MEANS FOR SOLVING PROBLEMS] This specimen pretreating device comprises a micro scale or nano scale high-performance liquid chromatograph having a capillary column (2), a probe (1) integrally formed at the tip of the capillary column (2), and an additive feeding flow passage (16). The probe (1) is formed in a... Agent: Kratz, Quintos & Hanson, LLP

20080048665 - Generation of system power-good signal in hot-swap power controllers: A power controller system is described herein, which may consist of one or more power controller ICs and other components. Each power controller selectively couples power supply voltages to a plurality of electrical devices, such as cards that have been inserted into expansion slots in a server. To simplify processing... Agent: Patent Law Group LLP

20080048666 - Apparatus and method for detecting a brush liftoff in a synchronous generator rotor circuit: An apparatus and method detects an open condition of a grounding path provided by a rotor grounding brush electrically connecting a rotor body of a rotor to electrical ground. The rotor includes an insulated field winding wrapped around the rotor body and is configured to generate a magnetic field upon... Agent: Cook, Alex, Mcfarron, Manzo, Cummings & Mehler Ltd

20080048667 - Input detecting circuit used for electric-leakage protection devices with self-diagnostic fucntion: An input detecting circuit for an electric-leakage protection device with self-diagnostic function includes an analog electric-leakage unit, a magnetic electric-leakage induction ring, an operational amplifier, and an inverse feedback circuit. The inverse feedback circuit includes a first resistance and a second circuit unit shunted with the first resistance. The second... Agent: Lowe Hauptman Ham & Berner, LLP

20080048668 - Diagnostic methods for electrical cables utilizing axial tomography: Cable diagnostic test methods, systems and apparatus are disclosed that utilize “standing wave” principles to facilitate identification and location of insulation defect(s) along a power cable. The methods/systems measure dissipation factors and dielectric constants associated with the power cable insulation and the impedance of the power cable conductor at any... Agent: Mccarter & English , LLP Stamford Office

20080048669 - Topological mapping using a conductive infrastructure: Described are methods and apparatus, including computer program products, for topological mapping using a conductive infrastructure. A conductive infrastructure of a structure is excited with an excitation signal. The radiated signal is received, the radiated signal being based on the excitation signal and an impedance discontinuity within the conductive infrastructure.... Agent: Proskauer Rose LLP

20080048670 - Method for contact-free testing of antennas applied to a material web: A method for contact-free testing of antennas applied to a material web, wherein the material web having the antennas is passed to a measurement device. The antennas are passed past an assigned measurement antenna arrangement of the measurement device in the region of the measurement device and the measurement antenna... Agent: William Collard Collard & Roe, P.C.

20080048672 - Semiconductor integrated circuit and test method thereof: A semiconductor integrated circuit is provided which includes a laser fuse circuit made to store a first trimming code by a laser radiation, an electric fuse circuit made to store a second trimming code by a voltage application, and an adjusting circuit adjusting an electric potential level or a timing... Agent: Arent Fox LLP

20080048671 - Test signal generating apparatus semiconductor integrated circuit and method for generating the test signal: A test signal generating apparatus for a semiconductor integrated circuit includes a fuse control unit that generates a plurality of fuse enable signals in response to a clock and a power-up signal, and a plurality of test mode fuses that individually output test mode fuse signals so as to generate... Agent: Venable LLP

20080048673 - Signal analysis system and calibration method for multiple signal probes: A method and apparatus adapted to calibrate signal path of a signal analysis system such that loading effects of additional probes are substantially removed from the measurement. A signal under test from a device under test is coupled to a test probe and used with selectable impedance loads in the... Agent: William K. Bucher Tektronix, Inc.

20080048674 - Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the... Agent: William K. Bucher Tektronix, Inc.

20080048675 - A method of accurately computing amplitude and phase noise of oscillators and generating a general purpose noise model of oscillators, mixers, and amplifiers in frequency domain analysis of analog electronic circuits and using same: A method of accurately computing amplitude and phase noise of oscillators and generating a general purpose noise model of oscillators, mixers, and amplifiers in frequency domain analysis of analog electronic circuits and using same. A method for computing amplitude jitter, frequency jitter, sideband noise, and plain phase noise for oscillators,... Agent: Agilent Technologies Inc.

20080048676 - Impedance monitoring system and method: A system (10) for monitoring PLC impedance of a phase conductor 12.1 of a high voltage overhead power transmission line (OHTL) 12 comprises a hybrid 40 comprising a first port (40), a second port (40.2) and a third port (40.3). The hybrid is configured to divide power received at the... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080048677 - Signal analysis system and calibration method for measuring the impedance of a device under test: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the signal path to characterize transfer... Agent: William K. Bucher Tektronix, Inc.

20080048678 - Inspection apparatus using electromagnetic waves: An inspection apparatus for acquiring information on a measurement object using electromagnetic waves, comprising a substrate; a transmission line that is formed on the substrate; an electromagnetic wave generating unit for supplying an electromagnetic wave to the transmission line; an electromagnetic wave detecting unit for detecting the electromagnetic wave that... Agent: Fitzpatrick Cella Harper & Scinto

20080048679 - Methods and systems for detecting a capacitance using sigma-delta measurement techniques: Methods, systems and devices are described for detecting a measurable capacitance using sigma-delta measurement techniques. According to various embodiments, a voltage is applied to the measurable capacitance using a first switch. The measurable capacitance is allowed to share charge with a passive network. If the charge on the passive network... Agent: Ingrassia Fisher & Lorenz, P.C. (syna)

20080048680 - Methods and systems for detecting a capacitance using sigma-delta measurement techniques: Methods, systems and devices are described for detecting a measurable capacitance using sigma-delta measurement techniques. According to various embodiments, a voltage is applied to the measurable capacitance using a first switch. The measurable capacitance is allowed to share charge with a passive network. If the charge on the passive network... Agent: Ingrassia Fisher & Lorenz, P.C. (syna)

20080048681 - Device for determining the state of a soot particle filter: A device determined the state of a soot particle filter of an internal combustion engine. An electrical measuring arrangement is embodied as a soot sensor for measuring a soot deposit and comprises an electrical component with a conductor structure for exciting an electrical or magnetic field which can be influenced... Agent: Crowell & Moring LLP Intellectual Property Group

20080048682 - In-pipe coating integrity monitor for very long pipes: Embodiments of the present invention provide systems, methods and program products related to a tether free pigable inspection tool capable of detecting holidays and able to read and store non-conductive internal coating thickness values in very long conductive pipes, along with distance values for further off-line analysis. The inspection tool... Agent: Bracewell & Giuliani LLP

20080048683 - Method and apparatus for detection and prevention of bulk cmos latchup: A method and apparatus are provided for detection and prevention of bulk complementary metal oxide semiconductor (CMOS) latchup. A separate power distribution is provided for coupling a positive voltage supply rail to the N well and a ground voltage supply rail to the P well of the CMOS circuit. At... Agent: Ibm Corporation RochesterIPLaw Dept 917

20080048684 - Circuit module testing apparatus and method: A circuit module testing apparatus and method are provided. According to various embodiments, a circuit module testing apparatus includes a printed circuit board, a socket receptacle adapted to be connected to the printed circuit board, a socket having pins on a first side, the pins adapted to be removably inserted... Agent: Schwegman, Lundberg & Woessner, P.A.

20080048685 - Probe card having vertical probes: A probe card includes a first probe plate having a first plurality of tapered apertures formed therein. Each of the tapered apertures has a first opening that is smaller than a second opening. The first openings and the second openings are on opposite surfaces of the first probe plate. The... Agent: Townsend And Townsend And Crew, LLP

20080048687 - Probe, method of manufacturing the probe and probe card having the probe: A probe, a method of manufacturing the probe and a probe card having the probe are disclosed. The probe includes a first connecting member, a body and a tip. Specially, the body integrally includes a bump and a beam. The body is fixed to an electric component by the first... Agent: Daly, Crowley, Mofford & Durkee, LLP

20080048689 - Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same: Example embodiments may provide a wafer type probe card, a method of fabricating a wafer type probe card, and/or a semiconductor test apparatus having the wafer type probe card. The wafer type probe card may include a semiconductor and a plurality of probing chips. The semiconductor substrate may include a... Agent: Harness, Dickey & Pierce, P.L.C

20080048690 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080048691 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080048688 - Methods for planarizing a semiconductor contactor: A planarizer for a probe card assembly. A planarizer includes a first control member extending from a substrate in a probe card assembly. The first control member extends through at least one substrate in the probe card assembly and is accessible from an exposed side of an exterior substrate in... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080048692 - Probe for testing a device under test: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080048693 - Probe station having multiple enclosures: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080048686 - Sheet-like probe, method of producing the probe, and application of the probe: Disclosed herein are a sheet-like probe that permits forming a front-surface electrode part small in diameter and surely achieving a stable electrically connected state even to a circuit device, on which electrodes have been formed at a small pitch, and prevents the electrode structures from falling off from an insulating... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080048695 - Circuit substrate, method for inspecting electric circuit, and method for manufacturing circuit substrate: According to an embodiment of a circuit substrate of the present invention, in a circuit substrate provided with a plurality of circuit blocks formed on a single substrate, at least one of the metal patterns connecting the circuit blocks is separated into two sections at some midpoint of wiring, and... Agent: Nixon & Vanderhye, PC

20080048696 - Methods and apparatus for single-sided extension of electrical conductors beyond the edges of a substrate: An apparatus for providing electrical pathways between one or more unsingulated integrated circuits and one or more test circuits external to the integrated circuits, includes a flexible substrate having a first major surface and a second major surface, a plurality of first contact structures disposed in a central portion of... Agent: Raymond J. Werner

20080048694 - Systems and methods for testing packaged microelectronic devices: Systems and methods for testing packaged microelectronic devices are disclosed herein. One such system for testing a packaged microelectronic device includes a test socket configured to receive the device for testing and a tester interface including a plurality of test contacts aligned with external contacts of the device when the... Agent: Perkins Coie LLP Patent-sea

20080048697 - High density integrated circuit apparatus, test probe and methods of use thereof: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an... Agent: Ibm Corporation, T.j. Watson Research Center

20080048699 - Defective product inspection apparatus, probe positioning method and probe moving method: For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional... Agent: Mcdermott Will & Emery LLP

20080048698 - Probe card: It is an object of the present invention to conduct highly reliable inspection by adjusting a contactor of a probe card and an inspection object in a prober to a parallel state even if the contactor and the inspection object become not parallel to each other. The present invention is... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080048700 - Integrated circuit probing apparatus having a temperature-adjusting mechanism: A probing apparatus for integrated circuit devices comprises a probe card, a probe holder for holding the probe card, a test head and a temperature-adjusting mechanism. The probe card comprises at least one probe capable of forming an electrical connection with the integrated circuit device facing a first surface of... Agent: Connolly Bove Lodge & Hutz LLP

20080048701 - Probe with contact ring: A spring probe having a barrel, plunger, spring and contact ring is provided in which the contact ring provides electrical contact between the plunger and the barrel. Two or more contact rings may be provided to improve the pointing accuracy of the probe.... Agent: Pepper Hamilton LLP

20080048702 - Contact probe: A contact probe includes a plurality of probes, each of the probes including: an conductive tube; an conductive plunger, contained in at least one end side of the tube, and having a distal end part protruding outward from the tube in an axial direction of the tube; and a coil... Agent: Morgan Lewis & Bockius LLP

20080048703 - Semiconductor integrated circuit and testing method of same: A program circuit activates a pass signal when a first program unit is programmed. The first program unit is programmed when a test of an internal circuit is passed. A mode setting circuit switches an operation mode to a normal operation mode or a test mode by external control. A... Agent: Arent Fox LLP

20080048704 - Apparatus and methods for testing microelectronic devices: Microelectronic devices, methods for testing microelectronic devices, and detachable electrical components. One embodiment of an apparatus for testing microelectronic devices in accordance with the invention comprises a board having a primary side, a secondary side, a plurality of test sites at the primary side, and electrical lines electrically coupled to... Agent: Perkins Coie LLP Patent-sea

20080048706 - Semiconductor device, semiconductor integrated circuit and bump resistance measurement method: The present invention provides a semiconductor device, including: a first semiconductor chip, and a second semiconductor chip connected to the first semiconductor chip through a plurality of bumps having not only a number of main bumps necessary for operation between the chips but also a predetermined number of measurement and... Agent: Robert J. Depke Lewis T. Steadman

20080048705 - Threshold voltage control apparatus, test apparatus, and circuit device: There is provided a threshold voltage control apparatus that controls a threshold voltage for a level comparing section that detects a logic pattern of an input signal by comparing a level of the input signal with the threshold voltage. The apparatus includes: a plurality of timing generators that generate periodic... Agent: Osha Liang L.L.P.

20080048707 - Characteristic evaluation apparatus for insulated gate type transistors: The accuracy of effective channel width extraction in drain current method is improved. There are prepared a transistor with a wide channel width serving as a reference, and a transistor with a narrow channel width that becomes a candidate for extraction (step ST1.1). From the characteristic curve of a plane... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080048708 - Method of testing liquid crystal display: A method of testing a liquid crystal display includes the steps of forming a plurality of chip positioning areas with a plurality of data connecting ends on a glass substrate, forming a plurality of data wires between two adjacent chip positioning areas which are linked to the plurality of data... Agent: Madson & Austin

20080048709 - Module and method for detecting defect of thin film transistor substrate: The present invention relates to a module and method for detecting a defect of a thin film transistor (TFT) substrate, which can detect disconnection of a gate line of the TFT substrate having gate drivers provided with a dual structure in which the gate drivers are provided at both sides... Agent: Macpherson Kwok Chen & Heid LLP

20080048710 - Detection and monitoring of partial discharge of a power line: There is provided a method that includes (a) determining a characteristic of a fundamental spectral component of a spectrum of a power spectrum of noise on a power line, and (b) determining a condition of the power line based on the characteristic.... Agent: Charles N.j. Ruggiero, Esq. Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20080042636 - System and method for current sensing: A current sensing system for estimating current in substantially parallel planar conductors. The system includes a magnetostrictive optical sensor including an optical sensing element coupled to a magnetostrictive element and disposed between substantially parallel planar conductors, wherein the magnetostrictive element is configured to cause a strain in the optical sensing... Agent: General Electric Company Global Research

20080042637 - Magnetic toroid self resonant current sensor: A current sensor includes a transformer comprising a primary and a secondary, wherein the current sensor is operable to measure current in the primary. A sensing circuit is operable to detect an impedance of the secondary, where the impedance of the secondary changes with an amount of current in the... Agent: Honeywell International Inc.

20080042638 - Connector with ac/dc test leds: A connector with AC/DC test LEDs is formed of a pair of different colored LEDs connected in parallel to each other in a test and alarm circuit which is connected to a power source. One LED is forward-biased, while the other reverse-biased. If the power source to which the connector... Agent: Pai Patent & Trademark Law Firm

20080042639 - Safe input circuit with one-channel peripheral connection for the input of a bus participant: The invention proposes an input circuit for an input component, particularly a bus input component, for the safe reading of input signals applied to the input component, particularly according to the standards Category 4 DIN EN 954 and SIL 3 IEC 61508, which is characterized by at least one signal... Agent: Demont & Breyer, LLC

20080042641 - Capacitance measurement device: An apparatus includes a measurement device for measuring two capacitances. The apparatus also includes a display module that simultaneously displays at least two numerical values based on the measured capacitances.... Agent: Fish & Richardson PC

20080042640 - Electric power cord with digital multimeter: An electric power cord includes a first plug adapted for connecting to a power source, a second plug adapted for connecting to an electric device, an electric cable, at least one sensor arranged on the electric cable, an meter chip arranged on the electric cable, and a display module arranged... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20080042642 - Chuck for holding a device under test: A chuck for a probe station.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080042643 - Method for detecting operating parameters of a power tool comprising an internal combustion engine: In a method for detecting an operating parameter of a power tool having an internal combustion engine with a cylinder, a piston delimiting a combustion chamber in the cylinder and driving a crankshaft supported rotatably in a crankcase, an intake supplying combustion air to the combustion chamber, an exhaust removing... Agent: Gudrun E. Huckett Draudt

20080042644 - Electronic shift lever assembly: Provided is an electronic shift lever assembly which can select a gear position by sensing the movement of a shift lever in forward, backward, right and left directions. The electronic shift lever assembly includes: a shift lever movable to select a gear position; a first sensor unit comprising a plurality... Agent: Edwards Angell Palmer & Dodge LLP

20080042645 - Method and device for testing pipes in a non-destructive manner: The present invention pertains to a method for the nondestructive testing of pipes made of ferromagnetic steel by means of a stray flux, in which the pipe, which is moving in the longitudinal direction and alternatively additionally rotating, is magnetized by a constant field, and the generated magnetic flux is... Agent: Duane Morris, LLPIPDepartment

20080042646 - Pipeline inspection using variable-diameter remote-field eddy current technology: The present disclosure relates to a device and method for pipeline inspection, The inspection device may include an exciter coil capable of providing an alternating current magnetic field and producing eddy currents. A plurality of sensors may then be provided which are capable of sensing a magnetic field produced by... Agent: Grossman, Tucker, Perreault & Pfleger, PLLC

20080042647 - Magnetic resonance imaging method and magnetic resonance imaging apparatus: This magnetic resonance imaging apparatus comprises a phase encoding coil (2x) and a frequency encoding coil (2y) for applying radio frequency magnetic field gradient pulses to a sample, placed in a static magnetic field, respectively, in two axial directions which do not include a static magnetic field direction among three... Agent: Townsend & Banta C/o Portfolio Ip

20080042649 - Efficiently cryo-pumped nmr cryogenic probe: The vacuum properties of a cryogenic NMR probe maintained at a desired operating temperature by a cold head heat exchanger are improved by a separate heat exchanger operating below the temperature of the cold head heat exchanger for maintaining cryo-pumping surfaces at a temperature below said selected operating temperature.... Agent: Varian Inc. Legal Department

20080042651 - Hifu-compatible reception coil for mri rf signals and signal receiving method: A HIFU compatible receiving coil for MRI radio-frequency signals has an antenna and an amplifier connected to each other, each for receiving and amplifying MRI radio-frequency signals, and a filter positioned in front of the amplifier for filtering the HIFU low frequency signals received by the antenna at the same... Agent: Schiff Hardin, LLP Patent Department

20080042648 - Stacked coil array for magnetic resonance experiments: An array coil for sensing signals in magnetic resonance experiments incorporates the traditional loop-butterfly array elements at spaced positions along an axis of the sample with additional stacked twisted loops and/or twisted butterfly elements. The twisted loop and twisted butterfly elements are centred along between the standard loop-butterfly array elements.... Agent: Ade & Company Inc.

20080042650 - Tuning low-inductance coils at low frequencies: A method and apparatus for tuning and matching extremely small sample coils with very low inductance for use in magnetic resonance experiments conducted at low frequencies. A circuit is disclosed that is appropriate for performing measurements in fields where magnetic resonance is beneficially utilized. The circuit has a microcoil, an... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20080042652 - Flux plane locating in an underground drilling system: A portable locator and method for establishing the location of the cable line in a region which includes at least one generally straight electrically conductive cable line extending across the region from which cable line a locating signal includes a first arrangement for measuring a local flux intensity of the... Agent: Pritzkau Patent Group, LLC

20080042653 - Remotely reconfigurable system for mapping subsurface geological anomalies: Methods and apparatus are provided for receiving, detecting and transmitting geophysical data from a plurality of electrodes inserted through a structure's pavement foundation in a non-destructive manner and into the soil utilizing a dynamically reconfigurable wireless control unit located on each electrode. Data from the control units is transmitted by... Agent: George R. Schultz Schultz & Associates, PC.

20080042654 - Fuel cell diagnostic apparatus and diagnostic method: A fuel cell diagnostic apparatus that diagnoses a fuel cell in which a plurality of power generating cells are stacked together includes a voltage applying device that applies voltage from outside of the fuel cell; a magnetic field measuring device that measures a magnetic field in or around the fuel... Agent: Kenyon & Kenyon LLP

20080042655 - Systems and methods for detecting impurities in reactor systems: The present invention is directed to various methods and systems for detecting at least one impurity in a bulk fluid. In certain embodiments, the methods are performed in conjunction with a polymerization reactor system such as a gas-phase reactor system.... Agent: Univation Technologies LLC

20080042656 - Trailer light circuit testing device: A trailer light testing device designed to test a plurality of lights on a conventional recreational vehicle trailer independent of the recreational vehicle being coupled to a tow vehicle's power supply. The trailer light testing device includes a housing with a terminal assembly disposed on one end of the housing.... Agent: Galasso & Associates, Lp

20080042657 - Multi-scanner device having a detachable outlet tester: A multi-scanner device having a detection unit and an outlet tester that can be selectively connected together for convenient use and easy storage. Preferably, a plug on the outlet tester is inserted into a non-functional socket located on the detection unit to form a multi-scanner device with a detachable outlet... Agent: Quarles & Brady LLP

20080042658 - Manufacturing-side calibration of a measuring device for capacitive fill level measurement, and corresponding measuring device: A method for manufacturing-side calibration of a measuring device for capacitive fill level measurement of a medium, wherein at least one probe unit of the measuring device is activated with an electrical, alternating voltage of a predeterminable frequency. As a function of the frequency of the activating signal, a conductivity... Agent: Bacon & Thomas, PLLC

20080042659 - Printed circuit board, and backplane data transmission method: In a receiving-side printed circuit board, a reflected-waveform analyzing unit analyzes a reflected wave generated in a transmission line on a backplane along with transmission of a signal from a transmitting-side printed circuit board, and acquires waveform data that indicates a waveform of the reflected wave. An input signal identifying... Agent: Katten Muchin Rosenman LLP

20080042660 - Methods and systems for detecting a capacitance using switched charge transfer techniques: Methods, systems and devices are described for detecting a measurable capacitance using charge transfer techniques. According to various embodiments, a charge transfer process is performed for two or more times. During the charge transfer process, a pre-determined voltage is applied to the measurable capacitance, and the measurable capacitance is then... Agent: Ingrassia Fisher & Lorenz, P.C. (syna)

20080042661 - Methods and systems for guarding a charge transfer capacitance sensor for proximity detection: Methods, systems and devices are described for determining a measurable capacitance for proximity detection in a sensor having a plurality of sensing electrodes and at least one guarding electrode. A charge transfer process is executed for at least two executions. The charge transfer process includes applying a pre-determined voltage to... Agent: Ingrassia Fisher & Lorenz, P.C. (syna)

20080042662 - Method for detecting stent coating defects: A coated medical device is connected to one pole of a detection device and is immersed in an electrolytic solution coupled to an oppositely charged pole of the detection device. An alert can be generated when a defect in the coating completes an electric circuit between the two poles of... Agent: Squire, Sanders & Dempsey LLP

20080042663 - System and method for detecting the dielectric constant of condutive material: An improved system and method for providing a dielectric monitor which allows the measurement of the dielectric constant of a conductive material. The capability to accurately and efficiently measure the dielectric constant in soil allows the moisture content of the soil to be accurately determined. The preferred embodiment teaches a... Agent: Technology Law Group, LLC

20080042664 - System and method for resistance measurement: A method for improved cable resistance measuring is provided comprising coupling a measurement test device comprising a master unit and a remote unit, via at least one connector, to at least one network cable and determining a terminating impedance using field calibration. The method additionally comprises transmitting an AC signal... Agent: Conley Rose, P.C.

20080042665 - Impedance measurement of a ph electrode: A method of measuring impedance of a pH electrode is provided. A test current is applied to the pH electrode for a time duration that is less than 50 percent of a time constant that is associated with electrical characteristics of the pH electrode. A voltage response of the pH... Agent: Christopher R. Christenson Westman, Champlin & Kelly, P.A.

20080042666 - Multiple probe acquisition system: A multiple probe acquisition system, such as for use with a value instrument, uses probes where each probe includes an acquisition circuit for acquiring from a circuit under test an electrical signal as digital data at a high rate, and then transferring the digital data from the probe to the... Agent: Thomas F. Lenihan Tektronix, Inc.

20080042668 - Apparatus and method for managing thermally induced motion of a probe card assembly: A probe card assembly can include a probe head assembly having probes for contacting an electronic device to be tested. The probe head assembly can be electrically connected to a wiring substrate and mechanically attached to a stiffener plate. The wiring substrate can provide electrical connections to a testing apparatus,... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080042674 - Chuck for holding a device under test: A chuck for a probe station.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080042667 - Electronic device test apparatus and method of configuring electronic device test apparatus: A handler is configured by, separably and connectably, a plurality of types of handling modules of different throughputs and a plurality of types of test modules of different numbers of simultaneous measurements and/or test temperatures. Based on the maximum number of measurable pins of the tester outputting a test pattern... Agent: Greenblum & Bernstein, P.L.C

20080042673 - Probe for combined signals: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over... Agent: Chernoff, Vilhauer, Mcclung & Stenzel, LLP

20080042671 - Probe for testing a device under test: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080042672 - Probe for testing a device under test: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080042669 - Probe station: A probe station for testing a wafer.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080042670 - Probe station: A probe station for testing a wafer.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080042675 - Probe station: A probe station.                ... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080042676 - Jig for kelvin test: A jig for Kelvin Test, includes: a pair of probes, including a first probe and a second probe which are arranged in parallel in a socket comprised of insulating material, each probe including: an conductive tube; an conductive plunger, contained in at least one end side of the tube, and... Agent: Morgan Lewis & Bockius LLP

20080042677 - Wafer probe: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080042678 - Wafer probe: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080042679 - Method and apparatus for controlling the temperature of electronic components: In a method and an apparatus for measuring temperature-controlled electronic components in a test station, a component to be measured is held and positioned using a chuck, has a temperature-controlled and directed fluid flow applied to it and is electrically contact-connected using probes and is measured. The setting of the... Agent: Heslin Rothenberg Farley & Mesiti PC

20080042680 - Probe station thermal chuck with shielding for capacitive current: To reduce noise in measurements obtained by probing a device supported on surface of a thermal chuck in a probe station, a conductive member is arranged to intercept current coupling the thermal unit of the chuck to the surface supporting the device. The conductive member is capacitively coupled to the... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080042681 - Integrated circuit device with current measurement: An integrated circuit device includes a plurality of transistors having gate dielectrics forming logic for the integrated circuit device, a voltage supply line connected to the transistors, and a current measurement device determining when the current in the voltage supply line exceeds a threshold.... Agent: Davidson, Davidson & Kappel, LLC

20080042682 - Method for detecting malfunction in clamping and machine tool: The method for detecting any clamping malfunction of the work within the machine tool which clamps both ends of the work with clamping mechanisms 23, 24 of a pair of headstocks 19, 29, and processes the work by spinning the work through synchronous rotation of main spindles 21, 22 of... Agent: Sughrue-265550

20080042683 - Methods and system for detecting winding faults in a generator with parallel windings: A method for detecting stator ground faults in a generator is described. The method includes receiving a neutral voltage signal from a neutral point of a stator, receiving a plurality of terminal voltage and current signals from the stator, deriving a magnitude of a harmonic component from the neutral voltage... Agent: Patrick W. Rasche (12552)

20080036444 - Sensor arrangement and method for detecting a sensor event: A sensor arrangement including a control circuit is disclosed. In at least one embodiment, at least one sensor electrode can be charged and/or discharged therewith and a comparator unit for the comparison of a provided voltage for the at least one electrode with a reference voltage. A duration necessary for... Agent: Harness, Dickey & Pierce, P.L.C

20080036445 - Method for setting a reference potential of a current sensor and arrangement for determining the reference potential of a power semiconductor device: A method for setting a reference potential of a current sensor in a power semiconductor device is disclosed. On the basis of a specific geometry and a typical two-dimensional potential distribution of the power semiconductor device, a plurality of tapping points is predetermined on an area of the power semiconductor... Agent: Slater & Matsil LLP

20080036446 - Electrical phase checking apparatus and method of metering: An electrical phase checking apparatus includes a first voltage sensor, a first current sensor, a first binary indicator corresponding to the first voltage and current sensors, a second voltage sensor, a second current sensor, and a second binary indicator corresponding to the second voltage and current sensors. The first binary... Agent: Andrew F. Knight

20080036447 - Utility meter using temperature compensation: A utility meter having a temperature compensation function provides advantages such as improved time keeping accuracy. According to an exemplary embodiment, a utility meter includes at least one sensor for detecting an ambient temperature at a location corresponding to a component such as a crystal oscillator that enables a time... Agent: Harold C. Moore Maginot, Addison & Moore

20080036448 - Method and system for measurement of current flows in fastener arrays: A method and apparatus for simultaneously measuring current flows through individual structures in a multi-structure composite joint is provided. The method comprising inserting a printed circuit board, etched with Rogowski coil sensory circuits, inside the joint between at least two structures with the at least two structures extending through the... Agent: Klein, O'neill & Singh, LLP

20080036449 - Coordinate transforming apparatus for electrical signal connection: Vertical contactors regularly arrayed over a film is brought into vertical contact with the end faces of wiring terminals formed at one end of a flexible flat cable, and signal lines from a narrowed-pitch contactor array are connected to a printed circuit board. For this purpose, there is to be... Agent: Haynes And Boone, LLP

20080036450 - Method for calibrating a transfer function of a magnetic sensor: A method for calibrating a transfer function of a magnetic sensor (MS) on a substrate (SBSTR) in which sensor (MS) the presence of magnetizable objects (SPB) can be detected by magnetizing the objects (SPB) by a magnetic field (H) delivered by a magnetic field generator (WR1, WR2) and in which... Agent: Philips Intellectual Property & Standards

20080036452 - Portable terminal device and position detection method used therein: A portable terminal device is disclosed that includes a movable part having a display part; an arm part supporting the movable part so that the movable part is rotatable at least ±90° with reference to a rotation center position around a rotation center; and a position detection part detecting the... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080036451 - Position sensor system with magnetically anisotropic flux guide: A position sensor system including a magnet, a magnetic flux sensor positioned a distance away from the magnet, the magnetic flux sensor and the magnet defining a flux path therebetween, and a flux guide positioned in the flux path to guide magnetic flux to the magnetic flux sensor.... Agent: Delphi Technologies, Inc. Legal Staff - M/c 480-410-202

20080036453 - Vehicle having a sensor with capacitor on chip: A vehicle includes a magnetic sensor comprising a plurality of layers including a substrate having circuitry, at least one conductive layer to interconnect the circuitry, and an insulator layer to electrically insulate the at least one conductive layer. First and second conductive layers are generally parallel to the substrate with... Agent: Daly, Crowley, Mofford & Durkee, LLP

20080036454 - Multi-revolution absolute high-resolution rotation measurement system and bearing equipped with such a system: A rotation measurement system comprises a rotatable annular magnetic encoder 16 carrying a series of encoding elements 23 arranged around the circumference of the encoder according to a periodic pattern, characterized in that it comprises a primary sensor assembly 38 comprising at least a primary magnetic sensor 38 disposed facing... Agent: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.

20080036455 - Determination of magnetic read head properties: A method, computer-readable medium, and apparatus for measuring properties of a magnetic read head are provided. In one embodiment, the method includes providing a first and a second magnetic read head. A first dimension of the first magnetic read head is different from a corresponding first dimension of the second... Agent: Patterson & Sheridan, L.L.P.

20080036456 - Detecting device and detecting method: A detecting device includes a viscoelastic magnet obtained by kneading and molding a magnet material and a viscoelastic material and a magnetic-flux detecting unit that detects a change in a magnetic flux density vector due to deformation of the viscoelastic magnet.... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080036457 - Nmr echo train compression: NMR spin echo signals are acquired downhole. A partial least squares method is used to determine parameters of a parametric model of the T2 distribution whose output matches the measurements. The model parameters are telemetered to the surface where the properties of the formation are reconstructed. It is emphasized that... Agent: Madan, Mossman & Sriram, P.C.

20080036458 - Magnetic resonance diagnosing apparatus and its operating method: A magnetic resonance diagnosing apparatus includes a generating unit which generates a plurality of slice images of a object for an imaging region, a determining unit which determines a plurality of slice regions for spectroscopy within the imaging region, and a measurement unit which measures a magnetic resonance spectrum of... Agent: Nixon & Vanderhye, PC

20080036459 - Device for calibrating a magnetic resonance apparatus having a pet function: A device is disclosed for calibrating a magnetic resonance apparatus having a PET function. In at least one embodiment, the device includes at least one marker that is visible through magnetic resonance imaging and fixed with reference to the device; at least one holder, fixed with reference to the marker,... Agent: Harness, Dickey & Pierce, P.L.C

20080036460 - Method and apparatus for phase calibration of an mri pulse: The present invention concerns a method and an apparatus for phase-calibrating an MRI pulse sequence which is used to calculate a linear phase and a constant phase to perform phase calibration on the scanned data, wherein a corresponding pre-scan without a phase encoding gradient is performed before a diagnostic scan.... Agent: Schiff Hardin, LLP Patent Department

20080036461 - Method for improving the precision of time domain low field h-nmr analysis: A method for improving the precision of time domain low field H-NMR analysis, the method comprising rotating a sample within a RF coil and acquiring multiple time domain signals for the sample at multiple orientations within the RF coil.... Agent: Shell Oil Company

20080036462 - Quadrupole resonance using narrowband probes and continuous wave excitation: The use of a superconducting resonator with continuous-wave (CW) excitation allows low-noise quadrupole resonance (QR) detection without the need for a lock-in amplifier. This allows detection times to be greatly reduced. Hence, for the first time, a CW QR spectrometer using a superconducting resonator can be used in a portable... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c

20080036463 - Ferromagnetic frame magnet with superconducting coils: A magnetic resonance imaging magnet includes a ferromagnetic frame. A pair of generally toroidal superconducting coil units overlie interfaces of side walls incorporated in the frame. Each coil unit may include a vessel having hollow support extensions extending into recesses in the side walls. The coil units may further include... Agent: Lerner, David, Littenberg, Krumholz & Mentlik

20080036464 - Probes and methods for semiconductor wafer analysis: A probe adapted for characterization of a semiconductor wafer having a surface. In one embodiment, the probe includes a source of modulated light; an optical fiber in optical communication with the source of modulated light, the optical fiber having a face and comprises a fiber core; and a transparent conductive... Agent: Kirkpatrick & Lockhart Preston Gates Ellis LLP (formerly Kirkpatrick & Lockhart Nicholson Graham)

20080036465 - Electric circuit for triggering a piezoelectric element, in particular of a fuel injection system of a motor vehicle: An electric circuit for triggering a piezoelectric element, a fuel injection system of a motor vehicle in particular, is described. A first measuring shunt connected in series to the piezoelectric element is provided. Provided are two transistors connected in series whose shared connecting point is connected to the piezoelectric element.... Agent: Kenyon & Kenyon LLP

20080036466 - Method for detecting electrical ground faults: A method of testing live AC circuits for neutral-ground, neutral-isolated ground, and isolated ground-ground faults, involves measuring impedances of circuit portions, including hot-neutral, neutral-ground, neutral-ground and isolated ground loops. In general either a test current generating a driving voltage is used, or in the case of hot-neutral, a load current... Agent: Robert W.b. Bailey

20080036467 - Appliance fault monitor: An appliance fault monitor for protecting electrical appliances against fault currents flowing. The alternating current to an appliance load controlled by a phase angle conduction controlled switching device is monitored. The intended non-conduction angle is determined and any current flowing in that angle is indicative of a fault. Repeated indications... Agent: Trexler, Bushnell, Giangiorgi, Blackstone & Marr, Ltd.

20080036468 - Apparatus to facilitate functional shock and vibration testing of device connections and related method: An apparatus and associated method are disclosed for facilitating the testing of device connections, including functional shock and vibration testing of peripheral card slots or any other desired connector interface. In part, a power supply located on the peripheral device, or some other external power source, is used to power... Agent: O'keefe, Egan, Peterman & Enders LLP

20080036469 - Lrl vector calibration to the end of the probe needles for non-standard probe cards for ate rf testers: A method and apparatus for radio frequency vector calibration of s-parameter measurements to the tips of the wafer probe needles of an automatic test equipment production tester. The method involves a modified Line-Reflect-Line (LRL) calibration routine that uses a Thru-Reflect-Line to LRL shift to eliminate the need for a precisely... Agent: Sughrue Mion, PLLC

20080036470 - Inverse characteristic measuring apparatus, distortion compensation apparatus, method, program, and recording medium: A nonlinear distortion is compensated based upon a characteristic relating to a characteristic of a device under test. An inverse characteristic measuring device measures an output signal output from the device under test as a result of supplying the device under test with an input signal generated by a signal... Agent: Greenblum & Bernstein, P.L.C

20080036471 - Method for direct electrical detection of molecules and molecule-molecule interactions: A method for direct electrical detection of proteins, peptides and the like, and their interactions includes an electrode arrangement, a current/voltage provider, and a circuit analyzer. The electrode arrangement has an interdigitated electrode pair including a first electrode and a second electrode. Coupled to the electrode arrangement is a signal... Agent: Marger Johnson & Mccollom, P.C.

20080036472 - Impedance-based arc fault determination device (iadd) and method: Embodiments according to the present invention provide an Impedance-based Arc-Fault Determination Device (IADD) and method that, when attached to an electrical node on the power system and through observations on voltage, current and phase shift with a step load change, determine the effective Thevenin equivalent circuit or Norton equivalent circuit... Agent: Needle & Rosenberg, P.C.

20080036473 - Dual-slope charging relaxation oscillator for measuring capacitance: An apparatus and method for measuring a capacitance on the sensor element using two charge rates. The two charge rates may be two charging rates, or alternatively, two discharging rates for discharging the sensor element. Alternatively, both the two charging and discharging rates may be used to measure the capacitance.... Agent: Blakely Sokoloff Taylor & Zafman

20080036474 - Capacitive transmitter electrode: A transmitter electrode for a capacitive sensing device comprises a conductive sheet material, said conductive sheet material comprising a first connecting point for connecting the electrode to an electronic sensing unit. According to the invention the conductive sheet material comprises at least one second connecting point for connecting the electrode... Agent: Cantor Colburn, LLP

20080036475 - Bioelectric impedance measuring circuit: A bioelectric impedance measuring circuit for applying a current to an organism and measuring a bioelectric impedance of the organism is disclosed that includes a pseudo-sine wave generating circuit for generating a pseudo-sine wave based on an input square wave, a voltage/current converting circuit for outputting current to the organism... Agent: Ladas & Parry LLP

20080036476 - Method and a system of diagnosing corrosion risk of a pipe or a pipeline in soil: A method of diagnosing corrosion risk of a buried pipe due to DC stray currents and/or AC voltages induced in soil employs a metal probe including a first, exposed part having a first specific resistivity, and a second, sealed reference part having a second specific resistivity. The probe is buried... Agent: Klein, O'neill & Singh, LLP

20080036477 - On-chip power supply noise detector: Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of... Agent: Ryan, Mason & Lewis, LLP

20080036478 - Bistable micromechanical devices: A micromechanical device may include one or more piezoresistive elements whose electrical resistance changes in response to externally or internally induced strain. The present invention leverages the piezoresistive properties of such devices to sense the positional state of the device. A sensing circuit may be integrated into the device that... Agent: Utah Valley Patent Services, LLC

20080036480 - Adjustment mechanism: A probe card assembly can comprise a support structure to which a plurality of probes can be directly or indirectly attached. The probes can be disposed to contact an electronic device to be tested. The probe card assembly can further comprise actuators, which can be configured to change selectively an... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080036481 - Air trapped circuit board test pad via: A circuit board with vias that are suitable for use as test pads can be made according to a method whereby a first end of a via is blocked prior to heating solder paste that covers the opposite end of the via. As a result, air is trapped in the... Agent: Woodcock Washburn LLP (microsoft Corporation)

20080036479 - Probe and method of manufacturing probe: In accordance with an increase in speed, a wiring structure has rapidly become more microscopic and thinner and a wiring layer has become extremely thin, and therefore, giving a contact load to a probe for the inspection as has been conventionally done causes damage to a wiring layer and an... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080036482 - Carrier tray for use with prober: A carrier tray for use with a prober is arranged to allow the prober to measure or test not only semiconductor wafers but also semiconductor packages and accurately position each of different-shaped semiconductor packages. A carrier tray 1 includes a lowermost tray 10 and an uppermost tray 20 interposing therebetween... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080036483 - Probe card for flip chip testing: A probe card for testing a flip chip device is provided. In one embodiment, the probe card comprises a printed circuit board having a first surface and a second surface, the first surface configured to face the flip chip device; a frame for securing the printed circuit board in place;... Agent: Birch, Stewart, Kolasch & Birch, LLP

20080036484 - Test probe and manufacturing method thereof: Disclosed herein are a test probe and a method of manufacturing the test probe. The invention has a simple structure, thus affording ease of manufacture, and eliminates contact resistance during a test, thus enhancing the reliability of the test. The test probe includes a probe part which is provided on... Agent: Hyun Jong Park

20080036487 - Integrated circuit wearout detection: An integrated circuit is provided with latency detecting circuitry for detecting signal generation latency within one or more functional circuits and in response thereto to generate a wearout response. The wearout response can take a variety of different forms such as reducing the operating frequency, increasing the operating voltage, operating... Agent: Nixon & Vanderhye, PC

20080036485 - Semiconductor wafer and method of testing the same: The present invention provides a semiconductor wafer characterized by including: a silicon substrate which includes chip regions and scribe regions; multiple-layered films formed on the silicon substrate; and a reference mark formed in at least one film constituting the multiple-layered films. In addition, the semiconductor wafer is also characterized in... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080036486 - Integrated circuit testing methods using well bias modification: Methods for testing a semiconductor circuit (10) including testing the circuit and modifying a well bias (14, 18) of the circuit during testing. The methods improve the resolution of voltage-based and IDDQ testing and diagnosis by modifying well bias during testing. In addition, the methods provide more efficient stresses during... Agent: Hoffman, Warnick & D'alessandro LLC

20080030186 - Method and system for measuring maximum operating frequency and corresponding duty cycle for an i/o cell: A circuit for measuring maximum operating frequency and its corresponding duty cycle for an input I/O cell implementation under test (IUT) includes a condition checking module, a central control module and a duty cycle measurement module. The condition checking module checks an upper threshold voltage and a lower threshold voltage.... Agent: Hogan & Hartson LLP

20080030187 - Method and device for estimating the speed of an electric motor: The invention relates to a device and a method for estimating the rotational speed ω of an electric motor when freewheeling, the method being carried out in a variable speed drive for controlling the motor by generating reference alternating voltages Va, Vb. The method comprises a step for measuring the... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20080030188 - Non-contact position sensor: A position sensor is provided for determining the position of a movable member. The position sensor includes a sensor providing an analog output voltage in response to a sensed magnetic field, a magnet located adjacent and in spaced relation to the sensor, and a magnetic field varying member attached to... Agent: Stevens & Showalter LLP

20080030189 - Method and apparatus for locating underground cast iron pipe joints: An apparatus for locating underground cast iron pipe joints having an electrically driven resonant coil generating an alternating magnetic field and two resonant sensor coils disposed within the alternating magnetic field, each of the resonant sensor coils having an independent magnetic reluctance circuit. A device is provided for comparing electrical... Agent: Mark E. Fejer Gas Technology Institute

20080030190 - Current sensing device: A magnetic core is shaped in a ring having a gap and disposed to surround a conductive wire. When an electric current flows in the conductive wire, a magnetic field is generated in the gap. A sensor package includes a Hall element and a lead frame, which are embedded in... Agent: Posz Law Group, PLC

20080030191 - Magnetic sensor circuit, semiconductor device, and magnetic sensor device: A magnetic sensor circuit has Hall devices 10X and 10Y, selection switch circuits 20X and 20Y, amplifier units 30X ad 30Y, a comparison unit 60, capacitors 41X, 42X, 41Y, and 42Y, and switch circuits 51 and 52. The Hall voltages obtained from the Hall devices 10X and 10Y are outputted... Agent: Fish & Richardson P.C.

20080030192 - Tomographic system: The tomographic system of the present invention comprises a means for taking tomographic images at plural tomographic positions in the axial direction of the body of the subject simultaneously, a display means for displaying the obtained plural tomographic imagers, a relative distance between tomographic images computing unit, and a control... Agent: Cooper & Dunham, LLP

20080030193 - Superconducting magnet and mri apparatus using the same: A superconducting magnet of the present invention includes a switching element that closes its output side (operation side) when the voltage on its input side is smaller than a predetermined value and opens the output side when the voltage on the input side is larger than the predetermined value, wherein... Agent: Buchanan, Ingersoll & Rooney PC

20080030194 - Gradient coil system and mr imaging system embodying same: A gradient coil system for a magnetic resonance tomography apparatus has a layer structure including a gradient coil layer and a cooling layer. The cooling layer is fashioned as a plate heat exchanger, composed of plates, for cooling the gradient coil layer. In this way, a highly efficient cooling of... Agent: Schiff Hardin, LLP Patent Department

20080030195 - Connection device for connecting electronics of a head coil arranged on a patient support to a connector location provided on the patient support: A connection device is provided for connecting electronics of a head coil arranged on a patient support to a connector location provided on the patient support, the head coil being insertable into a PET detector arranged in a magnetic resonance instrument so that simultaneous magnetic resonance and PET recording is... Agent: Harness, Dickey & Pierce, P.L.C

20080030196 - Correction of multi-component measurements for tool eccentricity in deviated wells: Measurements made by a multi-component induction logging tool are corrected for tool eccentricity in a deviated borehole. The eccentricity angle is determined from single frequency skin-effect corrected data and is then used to correct multifrequency data. Multifrequency focusing is then applied to the corrected multifrequency data. An inversion is then... Agent: Madan, Mossman & Sriram, P.C.

20080030197 - Ion current detecting apparatus for internal combustion engine: An ion current detecting apparatus includes a capacitor C that is charged as a spark plug 3 discharges, a Zener diode ZD that limits a maximum voltage of the capacitor C while charging, a detection resistor R2 through which a discharge current of the capacitor C flows, and a comparator... Agent: Birch Stewart Kolasch & Birch

20080030198 - Battery monitoring device and batteries: A communication means (105) of a battery monitoring device (101) receives setting information (measuring parameters) about the type or structure of a storage battery (102) to be monitored from a host system (106). A setting means (107) acquires the measuring parameters and performs setting for a measuring means (103) and... Agent: Antonelli, Terry, Stout & Kraus, LLP

20080030199 - Systems and methods for detecting high-impedance faults in a multi-grounded power distribution system: The apparatus and methods calculate a plurality of sum of differences for a power distribution system quantity with a sum of difference filter, provide a set of predetermined blocking conditions, provide a trending and memory with an output, generate a set threshold with an adaptive tuning algorithm; establish a reference... Agent: Cook, Alex, Mcfarron, Manzo, Cummings & Mehler Ltd

20080030200 - Image defect inspection apparatus: An image defect inspection apparatus 1 which performs a defect detection for detecting a defect on a surface of a sample 100 by comparing corresponding portions in an image captured of the surface of the sample 100 that are supposed to be identical to each other, and a reexamination for... Agent: Christie, Parker & Hale, LLP

20080030201 - Method of operating a shielded connection, and communication network: To provide a method of operating a shielded connection where signals are exchanged between two nodes (1) on a communications network over a connecting line (5a, 5b) and the connecting line (5a, 5b) has a shield (3), by which method can be established that the shield (3) is in a... Agent: Nxp, B.v. Nxp Intellectual Property Department

20080030202 - Method and apparatus for measuring data rates: A method and apparatus for measuring data rates is disclosed. An apparatus that incorporates teachings of the present disclosure may include, for example, a diagnostic system having a Time Domain Reflectometer (TDR) element that submits a signal over a cable and determines from its reflection in the cable a length... Agent: Akerman Senterfitt

2008003