Electricity: measuring and testing inventions 12/07

20070296395 - Semiconductor device, semiconductor device testing method, and probe card: A test signal to be supplied to a driver section when the driver section is subjected to an operation test is generated by a test circuit. In the test circuit, the test signal can be generated by a burn-in control circuit in accordance with a clock signal TESTCK supplied from... Agent: Harness, Dickey & Pierce, P.L.C

20070296397 - Directional coupler for accurate power detection: A power detection system implemented using a pair of directional couplers and a transmission line (or equivalent) disposed between the directional couplers, wherein the transmission line (or equivalent) provides a 90° phase shift between the directional couplers. Accurate power detection is provided by combining the powers detected at each of... Agent: Gauthier & Connors, LLP

20070296396 - Phase difference measurement circuit: The phase difference measurement circuit is provided with a waveform control circuit (103) which outputs one (102) of two input signals for each predetermined period, a comparison pulse generation circuit (104) which converts a phase difference between the input signal (101) and the input signal (102) that is outputted for... Agent: Steptoe & Johnson LLP

20070296399 - Electrical system: A system for sensing current in one or more first electrical conductors includes a frame and a retainer configured to receive the one or more first electrical conductors and constrain relative movement between the one or more first electrical conductors and the frame. The system may also include a first... Agent: Caterpillar/finnegan, Henderson, L.L.P.

20070296398 - Housing for movement sensor with protective cover for components: The invention relates to a device for detecting the movement of a movable component, the device having an inner part 1 and the inner part 1 having a housing in which are mounted conductors 3 that carry electrical components 4 and a sensor element. One end of each conductor 3... Agent: Cohen, Pontani, Lieberman & Pavane

20070296400 - Voltage generating apparatus, current generating apparatus, and test apparatus: There is provided a voltage generating apparatus that outputs a power source voltage from a voltage outputting terminal. The apparatus includes a voltage outputting section that outputs the power source voltage according to a current or voltage to be input, a first differential amplification section that compares the power source... Agent: Osha Liang L.L.P.

20070296402 - Adapter for positioning of contact tips: An adapter for positioning of contact tips has a location surface for locating a contact tip and a base element with a base for setting the adapter on a mounting surface. A positioning element is in mechanical contact with and mobile relative to the base element. The location surface can... Agent: Jeff Rothenberg, Esq.

20070296401 - Interleaved differential multiplexer: An N-wire interleaved differential multiplexer. The N-wire interleaved differential multiplexer may be formed by interleaving the channels and corresponding switches of N one-wire multiplexers. Each of the switches of the interleaved differential multiplexer may be controlled independent from the other switches to provide a signal path between a DUT stack... Agent: Jeffrey C. Hood Meyertons Hood Kivlin Kowert & Goetzel PC

20070296403 - Semiconductor device, unique id of semiconductor device and method for verifying unique id: The present invention relates to a semiconductor device, a unique ID of the semiconductor device and a method for verifying the unique ID. Thus, original data (bit string) having 127-bit length [126:0] is inputted at step S1. Then, it is determined whether the number of bits of “1” in the... Agent: Buchanan, Ingersoll & Rooney PC

20070296404 - Distance measuring device: A distance measuring device, in particular a magnetostrictive distance measuring device wherein a distance measuring element extends in longitudinal direction of the device along the measurable measuring distance, relative to which a signal generating signal generator can be moved in longitudinal direction, with a longitudinal housing shaped as a circumferentially... Agent: Head, Johnson & Kachigian

20070296405 - Plotting an image on a thin material having variations in thickness: System and corresponding method for plotting an image on a thin material having variations in thickness. System (40) includes: a plotter unit (46), for plotting the image on a surface (48) of thin material (42); a control unit (50), for controlling plotter unit (46), for effecting the plotting; and a... Agent: Sughrue Mion, PLLC

20070296406 - Current induced magnetoresistance device: The present invention provides for a current induced switching magnetoresistance device comprising a magnetic multilayer composed of a first ferromagnetic layer, a nonferromagnetic layer, and a second ferromagnetic layer, wherein the first ferromagnetic layer has an upper electrode, the second ferromagnetic layer pinned by an antiferromagnet, wherein the antiferromagnet contains... Agent: Darby & Darby P.C.

20070296407 - Method of testing magnetic head: The method of testing a magnetic head is capable of purely evaluating characteristics of the magnetic head without influences caused by external factors. The method of testing a magnetic head comprises the steps of: detecting amount of noises, which are included in output signals of a reading element of the... Agent: Kratz, Quintos & Hanson, LLP

20070296408 - Method and system of temperature-control for electronic component: A method and a system of temperature-control for an electronic component are provided, in which a plurality of temperature sensors is disposed in each area of the electronic component. The temperature-control method includes obtaining a plurality of sensed temperature values; looking up a temperature-control table recording the relationship between a... Agent: Workman Nydegger

20070296409 - Reference-current optimizing apparatus of double relaxation oscillation squid: The present invention relates to a reference-current optimizing apparatus of a double relaxation oscillation SQUID. According to the present invention, the optimizing apparatus is connected to a RJ-DROS in order to vary a reference current. Accordingly, the DROS can have a high response level and can operate stably, by controlling... Agent: The Webb Law Firm, P.C.

20070296410 - Tuning fork magnetometer: Apparatus comprises a tuning fork having first and second tines, a first magnet disposed on the first tine, and a second magnet disposed on the second tine. In one embodiment the magnets comprise permanent magnets; in another they comprise electromagnets. In a preferred embodiment the magnets have magnetic moments oriented... Agent: Michael J. Urbano

20070296411 - Methods and apparatus for an analog rotational sensor: A sensor includes a signal generation module including a magnetic sensor to provide position information for generating first and second waveforms corresponding to the position information. An analog signal processing module provides an algebraic manipulation of a subset of the first waveform, the second waveform, a first inverted waveform, and... Agent: Daly, Crowley, Mofford & Durkee, LLP

20070296412 - Method for molecule examination by nmr spectroscopy: The invention relates to a method and a device for examining molecules by means of NMR spectroscopy. It is the object of the invention to be able to characterize a sample with a high resolution and comprehensively. The object is solved by a method and an associated device for examining... Agent: Rankin, Hill, Porter & Clark, LLP

20070296413 - Portable nmr device and method for making and using the same: An embodiment of the invention relates to a portable or handheld device for performing NMR analysis. The device comprises a console and a strip which can be placed into the console through a slot or other means. The strip comprises a sample holding place and a microcoil for generating an... Agent: Darby & Darby P.C.

20070296414 - Method and apparatus for locally shielding mr superconducting magnet coil: A method and apparatus for local grading shielding includes a gradient shield loop having a plurality of arcs positioned adjacent to a superconducting magnet coil. The plurality of arcs magnetically couple with a gradient magnetic field generated by a magnetic field gradient to locally shield the superconducting magnet coil.... Agent: General Electric Company Global Research

20070296415 - Method and apparatus for metal detection employing digital signal processing: This invention relates to a metal detector using multiple frequency signals generated and processed digitally. The detector transmits sinusoidal signals using a multiple frequency resonator or square waves, with optional modulation. The operation of the transmitter is continuously monitored to allow for tuning, detection of abnormal conditions and correction of... Agent: Brooks Kushman P.C.

20070296416 - Circuit for detecting end of life of fluorescent lamp: A circuit for detecting the end of life of a fluorescent lamp is provided. In this circuit, a rectifier rectifies a voltage signal detected from a ballast. A phase detector detects the phase of the voltage signal and outputs at least one phase detection signal. A signal separator separates the... Agent: Sidley Austin LLP

20070296417 - Electron capture detector and nonradiative electron capture: It is intended to realize measuring of trace organic components and to render qualitative procedure efficient through imparting of selectivity. Penning gas and dopant gas are ionized in a space isolated from discharge part with the use of metastable helium obtained by direct-current glow discharge, and with the use of... Agent: Crowell & Moring LLP Intellectual Property Group

20070296418 - Flexible continuity and circuit tester: A flexible circuit and continuity testing device may include a flexible printed circuit substrate. A battery having a positive and negative terminal may be attached to the substrate. An illumination source, e.g., an LED, may be attached to the substrate. The testing device may include a flexible electrical contact array,... Agent: Timothy M. Barlow

20070296419 - Insert and pusher of electronic device handling apparatus, socket guide for test head, and electronic device handling apparatus: Two electronic device holding portions 19 are formed on an insert to be attached to a test tray TST of an electronic device handling apparatus 1, and the two electronic device holding portions 19 are arranged at positions sandwiching a standard hole 20a used as a positional standard when aligning.... Agent: Posz Law Group, PLC

20070296420 - Device for testing connectivity of a connector including spring contact pins: A device for testing connectivity is provided. The device includes a first connector including a contact pin and a spacer for biasing the contact pin away from a spring contact pin of a second connector, when the first connector is inserted into the second connector. The device also includes an... Agent: Haynes And Boone, LLP

20070296421 - Voltage drop measurement circuit: A voltage drop measurement circuit includes a voltage drop circuit to generate an output voltage and fluctuate the output voltage according to a fluctuation in a power supply voltage, where the output voltage being the power supply voltage dropped by a predetermined amount and a flip-flop to retain a flag... Agent: Young & Thompson

20070296430 - Control method and control program for prober: To provide a control method and a control program of a prober that are capable of enhancing throughput. Chips are tested in step S2. In step S3, when the counted number Y of conforming chips has reached a predetermined number of conforming chips X which constitutes conditions for testing, the... Agent: Staas & Halsey LLP

20070296424 - Method and apparatus for a paddle board probe card: A paddle board probe card for connecting a device under test with an ATE tester by means of ZIF connectors is presented. The paddle board probe card may include more than one printed circuit board mounted on a probe card in such a manner that the more than one printed... Agent: Verigy

20070296427 - Method for detecting tips of probes, alignment method and storage medium storing the methods, and probe apparatus: There is provided a method for detecting a height of a tip of a probe before detecting a horizontal position of the probe tips of the probe, by using an alignment device having a first imaging unit and a second imaging unit provided at the mounting table. In the method,... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20070296422 - Method of expanding tester drive and measurement capability: A probe card assembly can comprise an interface, which can be configured to receive from a tester test signals for testing an electronic device. The probe card assembly can further comprise probes for contacting the electronic device and electronic driver circuits for driving the test signals to ones of the... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070296425 - Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making same: In one embodiment, a probe for probing test points on a target board includes a printed circuit board, a frame, and a plurality of spring pins. The printed circuit board (PCB) has a first side with a plurality of solder pads thereon, and a plurality of signal routes that are... Agent: Agilent Technologies Inc.

20070296428 - Semiconductor device having supply voltage monitoring function: A semiconductor device with the function of monitoring the rise time of the supply voltage at power on is provided. The semiconductor device includes an electrode pad, an internal circuit and a monitoring unit. An input power source supplies the internal supply voltage to the internal circuit via the electrode... Agent: Sughrue Mion, PLLC

20070296423 - Double-sided wafer probe: A wafer support assembly has a first wafer support plate having a first grid pattern allowing first probe access through the first grid pattern to a first side of a wafer in the wafer support assembly and a second wafer support plate having a second grid pattern allowing second probe... Agent: Agilent Technologies Inc.

20070296431 - Membrane probing system with local contact scrub: A membrane probing assembly includes a support element having an incompressible forward support tiltably coupled to a rearward base and a membrane assembly, formed of polyimide layers, with its central region interconnected to the support by an elastomeric layer. Flexible traces form data/signal lines to contacts on the central region.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070296429 - Probe contacting electrode and electronic device: A probe contacting electrode that is formed on a surface of a package of an electronic device and to which a probe of a probe device is contacted, including a lower layer part and an upper layer part made of a softer conductive material than a conductive material that forms... Agent: Oliff & Berridge, PLC

20070296426 - Prober for electronic device testing on large area substrates: An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays on the large area substrate. The apparatus includes a prober assembly that is movable relative to the large area substrate and/or the contact... Agent: Patterson & Sheridan, LLP

20070296432 - Measurement board for electronic device test apparatus: A performance board able to secure low loss, low reflection, stable transmission characteristics even when using a high frequency signal to test an electronic device and able to suppress signal leakage to the outside and entry of noise, provided with a base board having a signal pattern electrically connected with... Agent: Greenblum & Bernstein, P.L.C

20070296433 - Contactor having a global spring structure and methods of making and using the contactor: In some embodiments of the invention, a probing apparatus can comprise a substrate, a spring structure attached to the substrate, and a plurality of resilient probes attached to the spring structure. Each probe can comprise a contact portion disposed to contact a device. The spring structure can provide a first... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070296434 - Temperature control method and apparatus and test method and apparatus of semiconductor devices: An electric power is supplied to a semiconductor device while thermally insulating the semiconductor device by bringing a thermal insulating material into contact with the semiconductor device. An internal temperature of the semiconductor device is raised by internal-heating of the semiconductor device. The thermal insulating material is separated from the... Agent: Staas & Halsey LLP

20070296435 - Ac coupled parameteric test probe: A probe for contacting and testing ICs on a semiconductor device includes a dielectric insulating material tip. The dielectric tip does not contaminate the surface being probed unlike metal probe tips. A contact scrub is further not required with signals being capacitively or inductively coupled from the probe tip to... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070296436 - Electrical test probes with a contact element, methods of making and using the same: Disclosed herein are electrical test probes and methods for making the same. In one embodiment, an electrical test probe comprises: a barrel, a plunger, a contact element, and a spring. The barrel comprises a contact area defined by a stop engagement and an opening at a first end of the... Agent: Cantor Colburn, LLP

20070296437 - Mini-prober for tft-lcd testing: An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus includes a prober assembly that is movable relative to the large area substrate and may be configured to test various patterns... Agent: Patterson & Sheridan, LLP

20070296438 - Method for optimizing probe card design: A method is presented of designing semiconductor probe cards to have the optimum number and placement of die probe sites for function testing integrated circuit (IC) die at semiconductor wafer test, while minimizing the number of times the probe card must be moved (number of “touchdowns”) to test all the... Agent: Schwegman, Lundberg & Woessner, P.A.

20070296439 - Test structure for monitoring leakage currents in a metallization layer: By providing a plurality of resistors and a plurality of test patterns within a leakage current test structure, the number of probe pads required for estimating the plurality of test patterns may be significantly reduced, wherein, in some illustrative embodiments, several test patterns may be simultaneously assessed on the basis... Agent: Williams, Morgan & Amerson

20070296441 - Method and apparatus for die testing on wafer: An integrated circuit includes switching means for selectively connecting the bond pads to functional core logic and isolating the bond pads from second conductors, and the switch means for selectively connecting the bond pads to the second conductors to provide bi-directional connections between the bond pads on opposite sides of... Agent: Texas Instruments Incorporated

20070296440 - Semiconductor integrated circuit apparatus, measurement result management system, and management server: A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which... Agent: Sughrue Mion, PLLC

20070296448 - Burn-in sorter and sorting method using the same: Provided is an apparatus for sorting burn-in tested packaged chips, including a DC test unit performing a DC test on packaged chips, a DC failure/loading head moving in a first direction to load packaged chips onto the DC test unit, and an inserting head moving in a second direction perpendicular... Agent: Ked & Associates, LLP

20070296443 - Exhaustive diagnosis of bridging defects in an integrated circuit: A method, system and computer program product for diagnosing a bridging defect in an integrated circuit including multiple nodes are disclosed. Quiescent power supply current (IDDQ) of the integrated circuit (IC) is measured under multiple test vectors. Logic states of the nodes on the IC are also obtained under the... Agent: Hoffman, Warnick & D'alessandro LLC

20070296442 - Method and apparatus for measuring device mismatches: A test structure for statistical characterization of local device mismatches contains densely populated SRAM devices arranged in a row/column addressable array that enables resource sharing of many devices. The test structure includes a built-in sensing mechanism to calibrate or null out sources of error, and current steering to avoid negative... Agent: Ibm Corporation (jvm)

20070296449 - Methods and apparatus for multi-modal wafer testing: Access to integrated circuits of a wafer for concurrently performing two or more types of testing, is provided by bringing a wafer and an edge-extended wafer translator into an attached state. The edge-extended wafer translator having wafer-side contact terminals and inquiry-side contact terminals disposed thereon, a first set of wafer-side... Agent: Raymond J. Werner

20070296447 - Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect: A monitoring pattern for detecting a defect in a semiconductor device allows a voltage contrast inspection which may be verified by an electrical test where no special test pattern is required for the electrical test. The monitoring pattern includes a test pattern with line shapes arranged in parallel and spaced... Agent: Lee & Morse, P.C.

20070296445 - Semiconductor chip flipping assembly and apparatus for bonding semiconductor chip using the same: A semiconductor chip flipping assembly and an apparatus for bonding a semiconductor chip using the same are disclosed. In accordance with the semiconductor chip flipping assembly and the apparatus for bonding a semiconductor chip using the same, a front surface of a wafer is mounted in a wafer holder to... Agent: Sughrue Mion, PLLC

20070296444 - Test structure for measuring electrical and dimensional characteristics: A test structure includes first and second combs, at least a first pair of base nodes, and a second pair of finger nodes. The first comb includes a first base and a first plurality of fingers extending from the first base. The second comb includes a second base and a... Agent: Williams, Morgan & Amerson

20070296446 - Operation monitor system, semiconductor apparatus, and information collection apparatus: An operation monitor system externally outputs a sufficient amount of condition information that indicates an internal operation condition, without using a dedicated terminal, that is to say, without a significant increase in cost. An output control unit of a semiconductor apparatus specifies an IF unit that is not currently performing... Agent: Wenderoth, Lind & Ponack L.L.P.

20070296453 - Display element: An inspection circuit is constructed by first inspection TFTs provided to one end sides of signal lines, and second inspection TFTs provided to the other end sides of the signal lines. By using both the first inspection TFTs and the second inspection TFTs, the driving capability can be secured while... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070296451 - Lcd test device and test process thereof: An LCD test device and a test process thereof are disclosed, in which a defect of an LCD panel is exactly identified through exact electrical connection between an LCD panel and a probe unit. The LCD test device includes a work table on which an LCD panel is mounted, a... Agent: Mckenna Long & Aldridge LLP Song K. Jung

20070296450 - Testing device: A testing device for performing a white balance test on a display device of an electronic equipment is disclosed. The testing device includes a supporting body, a testing member, a position-adjusting member and a clipping member. The testing member is disposed on the supporting body and used to mask the... Agent: Ishimaru & Zahrt LLP

20070296452 - Flexible display testing and inspection: The present invention provides methods and systems for testing and inspection of a display panel. The methods involve the application of voltages to rollers or testing conductive films. By applying a potential difference to the appropriate rollers or testing conductive films, different optical states of a display panel can be... Agent: Howrey LLP

20070296454 - Power supply assembly and semiconductor testing system using same: A power supply assembly that can be miniaturized even though an applied voltage to a load is rendered variable, and a semiconductor testing system using the same are put into practice. With an improvement of the power supply assembly for finding an error against a set voltage by feeding back... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070290672 - Detector for detecting a buried current carrying conductor: A detector 1 for detecting a buried current carrying conductor comprises a digital signal processor 16 and a power supply unit 25. The power supply unit 25 is a switched mode power supply which incorporates a proportional integral differential controller feedback algorithm 33 and which is managed by the digital... Agent: Baker & Hostetler LLP

20070290671 - Locating device: A locating device, in particular a hand-held locating device, for detecting objects enclosed in a medium, including an output unit for displaying at least one output variable correlated with a measuring signal of at least one sensor of the locating device, the output unit having a first dynamic range for... Agent: Kenyon & Kenyon LLP

20070290673 - Portable electric testing equipment: A portable electric testing equipment comprising: a probe; ground contact means for contacting a ground terminal of a measured object; a voltage input unit for receiving a voltage applied from the probe; a controller for applying a test voltage of a prescribed level to the voltage input unit, and outputting... Agent: Knobbe Martens Olson & Bear LLP

20070290674 - Device and method for measuring individual cell voltages in a cell stack of an energy accumulator: A device and method enable measuring individual cell voltages of cells in a cell stack of an energy accumulator. To this end, a series circuit formed of two diodes is connected in parallel to each cell, the nodes between these diodes are connected to a changeover switch via a respective... Agent: Lerner Greenberg Stemer LLP

20070290675 - Circuit for supplying electrical energy to measuring instrument: An electric measuring device is supplied with electric energy at a high-voltage potential by a circuit that includes at least one first transformer on the ground potential side. The first transformer has a primary side, to which a generator is attached to generate a feed signal that supplies energy, and... Agent: Staas & Halsey LLP

20070290676 - Bi-directional buffer for interfacing test system channel: An emitter follower or source follower transistor is provided in the channel of a wafer test system between a DUT and a test system controller to enable a low power DUT to drive a test system channel. A bypass resistor is included between the base and emitter of the emitter... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070290677 - Displacement measurement device: An displacement measurement device and associated method where displacement measurements of a movable member are obtained by an electromagnetic field sensor that need not move relative to the magnet or other electromagnetic field source. The electromagnetic field sensor senses disruptions in the electromagnetic field caused by movement of the movable... Agent: Don W. Bulson (parker Hannifin) Renner, Otto, Boisselle & Sklar, LLP

20070290678 - Magnetic sensor system: A magnetic sensor system (1) is provided that contains sensor elements (5, 6) that are sensitive to magnetic fields, the electrical properties of said sensor elements being modifiable according to a magnetic field that can be influenced by a mobile, passive transmitter element (8). The magnetic sensor system (1) includes... Agent: Striker Striker Stenby

20070290681 - Electrical device and manufacture method for the same: An electrical device includes a terminal connected with an electronic component, a pliant member which contacts a part of the terminal in a longitudinal direction of the terminal and covers a whole circumference of the part, and a casing for holding the electronic component and the terminal and the pliant... Agent: Nixon & Vanderhye, PC

20070290680 - Resin-molded products and methods of manufacturing the same: The present invention includes a resin-molded product including at least one magnet having opposite faces extending in directions intersecting with a magnetizing direction of the at least one magnet. The present invention also includes a resin portion molded with the at least one magnet by an insertion molding process, wherein... Agent: Dennison, Schultz & Macdonald

20070290679 - Rotation detection device: A rotation detection device includes a cover member having an opening end, and a sensor body member which has a mounting portion protruding from a mounting-portion protrusion surface and a joint portion positioned around the mounting-portion protrusion surface. The opening end of the cover member is joined to the joint... Agent: Posz Law Group, PLC

20070290682 - Magnetic sensor and method for detecting magnetic field: A magnetic sensor includes: a substrate; a semiconductor region; a magnetic field detection portion; a pair of first electrodes; and two pairs of second electrodes. One pair of second electrodes includes first and second terminals, and the other pair includes third and fourth terminals. The first and third terminals are... Agent: Posz Law Group, PLC

20070290683 - Magnetic sensor: The invention is to provide a magnetic sensor capable of detecting magnetic particles over a wide range of number and of suppressing an increase in a detection area. The magnetic sensor includes a detection part, a selecting device connected electrically to an end of the detecting part, and a sensing... Agent: Fitzpatrick Cella Harper & Scinto

20070290684 - Multiple echo train inversion: A method for inversion of multiple echo trains with different wait times uses a cutoff times for each of the echo trains for full polarization. Simultaneous inversion is carried out for T2 bins where full polarization exists. It is emphasized that this abstract is provided to comply with the rules... Agent: Madan, Mossman & Sriram, P.C.

20070290685 - Temperature control method for a permanent magnet arrangement of a magnetic resonance system: In a temperature control method for magnetic field components of a permanent magnet arrangement of a magnetic resonance system, temperature stability of the magnetic field components is achieved by maintaining the temperature of the two sides of the magnetic field components constant, with a difference being maintained between the temperatures... Agent: Schiff Hardin, LLP Patent Department

20070290687 - Magnetic resonance imaging apparatus and method of conveying the magnetic resonance imaging apparatus: With a view to shortening the cable laying time there is provided a magnetic resonance imaging apparatus for generating an image of a subject in accordance with a magnetic resonance signal received after application of a high-frequency magnetic field to the subject under a static magnetic field and a gradient... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070290686 - Rf body coil with acoustic isolation of conductors: A system for isolating vibration and reducing acoustic noise in the RF coil of an MR imaging apparatus is presented. The system positions an RF conductor in its operative position proximate to an RF support form. The RF conductor is sandwiched between a vibration decoupling layer and a mass loading... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20070290688 - Rf coil for imaging system: An RF coil suitable for use in imaging systems is provided which coil has a dielectric filled cavity formed by a surrounding conducting enclosure, the conducting enclosure preferably being patterned to form continuous electrical paths around the cavity, each of which paths may be tuned to a selected resonant frequency.... Agent: Crompton, Seager & Tufte, LLC

20070290689 - Logging tool sonde sleeve: A logging tool for use in a wellbore having a sensor portion for making measurements. The tool has a sleeve enclosing the sensor portion and made of a material that is transparent to the measurements being made. One or more structural elements having physical characteristics different from the material comprising... Agent: Schlumberger Oilfield Services

20070290690 - Generator regulator having a diagnostic function for semiconductor components: A method for detecting a fault in semiconductor components in electrical machines, e.g., three-phase generators, used in the automotive field is described. The electrical machine is equipped with multiple windings, each having a phase terminal U, V, W. The electrical machine is checked by determining the voltage in one of... Agent: Kenyon & Kenyon LLP

20070290691 - Characterization of electric circuit of electric device: A method of characterizing an electric circuit of an electric device, a system, an electric device and a test device are provided. The system includes: a signal generator for generating a test signal having a radio frequency band spanning at least a portion of a frequency response range of the... Agent: Hoffmann & Baron, LLP

20070290692 - High accuracy in-situ resistance measurements methods: Methods to determine an instantaneous resistance value of an electric circuit and a measurement system to determine an instantaneous resistance value of an electric circuit are disclosed. Exemplary embodiments of the method measure an in-situ instantaneous voltage of the circuit and an in-situ instantaneous current of the circuit and calculate... Agent: Drinker Biddle & Reath (dc)

20070290693 - Network device detection using frequency domain reflectometer: A system for identifying elements in a cable network utilizing frequency domain reflectometry includes initial filtering stages to remove noise, second and third harmonics and side lobes, and subsequent identification stages to identify and display various elements, e.g. splitters, barrels and opens, in the cable network and their relative positions.... Agent: Allen, Dyer, Doppelt, Milbrath & Gilchrist P.A.

20070290694 - System and apparatus for electrically testing lead-to-lead shorting during magnetoresistive sensor fabrication: Built-in electrical test structures are measured for lead-to-lead shorting during the fabrication of MR elements on a wafer. The test structures are fabricated in the same fashion as the MR elements, however, the active sensor region or track width is omitted from the test structures. Thus, the left and right... Agent: Bracewell & Giuliani LLP

20070290695 - Method and apparatus for measuring current: Current testing/measuring apparatus 10 comprises a flexible member 12 having a first end 14 and a second end 16. In use, the flexible member 12 is arranged to locate around a conductor 11 carrying a current to be measured. In particular, the current measuring apparatus 10 comprises a Rogowski coil.... Agent: Barnes & Thornburg LLP

20070290696 - Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program: A failure analysis apparatus 10 is composed of an inspection information acquirer 11 for acquiring a failure observed image P2 of a semiconductor device, a layout information acquirer 12 for acquiring layout information, and a failure analyzer 13 for analyzing a failure of the semiconductor device. The failure analyzer 13... Agent: Drinker Biddle & Reath (dc)

20070290697 - Microstructured pattern inspection method: The edges of the reticle are detected with respect to the microstructured patterns exposed by the stepper, and the shapes of the microstructured patterns at the surface and at the bottom of the photoresist are detected. The microstructured patterns are evaluated by calculating, and displaying on the screen, the dislocation... Agent: Kenyon & Kenyon LLP

20070290698 - Probe card: The present invention provides a probe card that can examine an object with small electrode spacing. A probe supporting plate is provided to a lower face side of a printed wiring board of a probe card. A plurality of probes are supported by the probe supporting plate. The probes comprise... Agent: Masuvalley & Partners

20070290699 - Probe card: The present invention provides a probe card that can examine an object with small electrode spacing. A probe supporting plate is provided to a lower face side of a printed wiring board of a probe card. A plurality of probes are supported by the probe supporting plate. The probes comprise... Agent: Masuvalley & Partners

20070290700 - Wafer probe station having a skirting component: A probe station includes a fully guarded chuck assembly and connector mechanism for increasing sensitivity to low-level currents while reducing settling times. The chuck assembly includes a wafer-supporting first chuck element surrounded by a second chuck element having a lower component, skirting component and upper component each with a surface... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070290701 - Low-power battery pack with hall-effect sensor: Some embodiments of a method and apparatus to facilitate battery management using a hall-effect sensor. The apparatus includes a hall-effect sensor and a battery management unit. The hall-effect sensor is disposed near the electrical transmission line to detect an amount of current flowing through the electrical transmission line. The current... Agent: Blakely Sokoloff Taylor & Zafman

20070290702 - System and method for thermal management and gradient reduction: A micro-spray cooling system beneficial for use in testers of electrically stimulated integrated circuit chips is disclosed. The system includes micro-spray heads disposed about a probe head, which provide a coolant flow onto the IC. A flow inducing injector is provided that directs a fluid jet onto zones where stagnation... Agent: Sughrue Mion, PLLC

20070290703 - High resolution analytical probe station: A method and system for probing with electrical test signals on an integrated circuit specimen using a high resolution microscope positioned for observing a surface of the specimen exposing electrically conductive terminals thereon. A housing is provided with a carrier therein for supporting the specimen in relation to the microscope... Agent: Fitch Even Tabin And Flannery

20070290704 - Method and circuit for adjusting characteristics of packaged device without requiring dedicated pads/pins: A method and circuit for adjusting packaged device output characteristics without dedicated pads or pins are disclosed. As opposed to multiple bit selection for the purpose of trimming, the method utilizes an iterative and dynamic means to trim the bits of a built-in trimming network such as an impedance network... Agent: Bo-in Lin

20070290708 - Inspection system and inspection circuit thereof, semiconductor device, display device, and method of inspecting semiconductor device: The present invention provides an inspection system with small increase in circuit area and capable of controlling increase in cost to be small. An inspection circuit intervenes between a first circuit and a second circuit. Further, the inspection circuit includes a signaling control portion and an inspection output portion. The... Agent: Dickstein Shapiro LLP

20070290706 - Integrated circuit and method for writing information: An integrated circuit is provided. The integrated circuit includes an RFID tag configured to store various administrative information after testing at a wafer level in response to a radio frequency signal, and an interface unit configured to perform the function of an interface between the integrated circuit and the RFID... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070290705 - Sawing tile corners on probe card substrates: A composite substrate for testing semiconductor devices is formed by selecting a plurality of substantially identical individual substrates, cutting a corner from at least some of the individual substrates in accordance with their position in a final array configuration, and then assembling the individual substrates into the final array configuration.... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070290709 - Semiconductor device: Patterns for detecting displacement at probing occupying a small area are provided and are capable of detecting the direction of the displacement when a needle is displaced in probing. The patterns for detecting displacement at probing are arranged in pairs in a scribe region adjacent to IC chips, the pattern... Agent: Bruce L. Adams, Esq.

20070290707 - Test system of semiconductor device having a handler remote control and method of operating the same: A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test... Agent: Marger Johnson & Mccollom, P.C.

20070290710 - Liquid crystal display capable of hiding defective pixels and hiding method thereof: A liquid crystal display (LCD) capable of hiding a defective pixel and a hiding method thereof applicable for a display mode of a liquid crystal display screen are provided. The method comprises firstly providing a substrate, detecting and recording the address data of all defective pixel dots of the substrate,... Agent: Birch Stewart Kolasch & Birch

20070285078 - Probe microscope and measuring method using probe microscope: Provided is a probe microscope for measuring a surface potential of a sample, including a contact electrification mechanism (circuit (C)) for bringing an electroconductive probe device into contact with a surface of the sample and applying a voltage in the contact state to induce electrification on the surface of the... Agent: Fitzpatrick Cella Harper & Scinto

20070285081 - Method and system for statistical measurement and processing of a repetitive signal: A method and system acquires a set of samples of a periodic signal at a constant sample rate in a primary memory, calculates a variance between the set of samples and an ideal set of samples to create a variance data set, stores the variance set into a secondary memory,... Agent: Agilent Technologies Inc.

20070285079 - Systems and methods for performing automatic real-time harmonics analyses for use in real-time power analytics of an electrical power distribution system: A system for conducting performing real-time harmonics analysis of an electrical power distribution and transmission system is disclosed. The system includes a data acquisition component, a power analytics server and a client terminal. The data acquisition component is communicatively connected to a sensor configured to acquire real-time data output from... Agent: Baker & Mckenzie LLP Patent Department

20070285080 - Methods and apparatus for testing delay locked loops and clock skew: According to the methods of the invention, a further delayed DLL signal is compared to the reference clock and a delayed reference clock signal is compared to a DLL signal. These two comparisons are performed on the 360° signal and on the 180° signal. The delay introduced by the methods... Agent: Gordon & Jacobson, P.C.

20070285082 - Lock detecting circuit, lock detecting method: A lock detecting circuit is disclosed that detects whether a PLL circuit is in a locked state based on a phase difference signal supplied from a phase comparator of the PLL circuit, the lock detecting circuit comprising a first circuit that outputs a control signal having one level when the... Agent: SocalIPLaw Group LLP

20070285083 - Battery voltage measurement circuit, battery voltage measurement method, and battery electric control unit: A voltage between both terminals of each unit battery is amplified by a differential amplifier and is then converted by a converter into a predetermined physical quantity that corresponds to the voltage between both terminals of the unit battery. The converted physical quantity is then level-shifted by a detection circuit... Agent: Kratz, Quintos & Hanson, LLP

20070285084 - Circuit component tester: A circuit component tester includes a portable casing and a circuit provided within the casing. A plurality of leads are provided to electrically connect the circuit to a gate and two terminals of a circuit component under test. A test switch provided on the casing initiates application of test voltage... Agent: Greenblum & Bernstein, P.L.C

20070285085 - Differential signal probing system: A probe measurement system comprises a probe with a linear array of probe tips enabling a single probe to be used when probing a test structure with a differential signal.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070285086 - Magnetic detector: A magnetic detector, wherein the magnetic/electric conversion element is constituted by at least six segments symmetrically arranged in a direction in which the magnetic moving body rotates maintaining a predetermined pitch with respect to the center line of the magnet, first and second bridge circuits are constituted so as to... Agent: Sughrue Mion, PLLC

20070285087 - Sensor element for a revolution counter: A sensor element for a revolution counter includes a laminated structure suitable to cause a change in magnetisation in the sensor element without a power supply, simply by the displacement of a magnetic field past the sensor element. Moreover, the laminated structure is suitable for storing a plurality of such... Agent: Harness, Dickey & Pierce, P.L.C

20070285088 - Method and system for the detection of surface defects on a metal product as it is being continuously cast: The invention relates to a method of detecting surface defects on a continuously-cast crude metallic product, such as a steel slab (4). According to the invention, a sensor (10) is used to detect surface defects by means of eddy currents, said sensor consisting of a matrix comprising at least two... Agent: Sughrue Mion, PLLC

20070285089 - Current detection printed board, voltage detection printed board, current/voltage detection printed board, current/voltage detector, current detector and voltage detector: A current detection printed board includes: a board having a penetration hole that penetrates the board; and at least one wire that is formed in a coiled shape having both ends by penetrating the board along the periphery of the penetration hole and alternately connecting a front surface layer and... Agent: Greenblum & Bernstein, P.L.C

20070285090 - Phase cycling method and magnetic resonance imaging apparatus: The present invention provides a phase cycling method capable of obtaining images based on the phase cycling method in the same time as when no phase cycling method is used, and a magnetic resonance imaging apparatus therefor. In the phase cycling method, the amount of increment/decrement in the phase of... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070285093 - Head coil arrangement with an adjustable neck-engaging portion for use in a magnetic resonance apparatus: Head coil arrangement for a magnetic resonance apparatus has a housing with a number of coil elements arranged in or on the housing, and the housing has at least one movable and/or moldable housing part (2a) for adjustment to different neck shapes in the region designated for the neck of... Agent: Schiff Hardin, LLP Patent Department

20070285092 - Method for generating a magnetic resonance image: In a method for image generation by magnetic resonance, a first MR raw data set is acquired with a first resolution in k-space, at least one further raw data set is acquired with a resolution in k-space that is reduced relative to that of the first raw data set, the... Agent: Schiff Hardin, LLP Patent Department

20070285091 - Regularized species separation: A method for generating a magnetic resonance images is provided. A magnetic resonance imaging excitation is applied. A plurality of magnetic resonance image signals is acquired. The plurality of image signals is combined iteratively by using a regularized decomposition algorithm. An image created from combining the plurality of image signals... Agent: Beyer Weaver LLP

20070285094 - Mri methods for combining separate species and quantifying a species: A method for generating a magnetic resonance images is provided. A first species signal for a first species is generated from magnetic resonance data. A second signal is generated from the magnetic resonance data. The first species signal is combined with the second signal to provide a recombined image. The... Agent: Beyer Weaver LLP

20070285096 - Double-tuned rf coil: An RF coil has at least one conductor loop and a parallel circuit provided with a first branch and a second branch is installed. The first branch has a first capacitor and the second branch has a third capacitor and a first parallel resonance circuit configured by a second capacitor... Agent: Stanley P. Fisher Reed Smith Hazel & Thomas LLP

20070285095 - Magnetic resonance device: There is described a magnetic resonance device incorporating at least one first component part, which when the magnetic resonance device is operating oscillates, attached by at least one local load-bearing joint to at least one second oscillation-sensitive component part of the magnetic resonance device, where the joint has at least... Agent: Siemens Corporation Intellectual Property Department

20070285097 - Method and apparatus for predicting change in an operating state of an electric energy storage device: A method for predicting change in an operating state, e.g. state of life, for an electrical energy storage device includes establishing a plurality of values for an operating parameter, e.g. current, of the electrical energy storage device and, for each respective value, determining a corresponding change in the operating state... Agent: General Motors Corporation Legal Staff

20070285098 - Method and system for ascertaining operating parameters of an electrochemical storage battery: A method for ascertaining operating parameters of an electrochemical storage battery, taking into account electrolyte stratification. The method including a) determining a first functional relationship between no-load voltage and state of charge as a value for the withdrawable charge in relation to nominal capacity of the storage battery, which is... Agent: Kenyon & Kenyon LLP

20070285099 - Electrochemical sensor: In an electrochemical sensor, the potential difference applied to the electrochemical cell is raised to a measuring value at a rate determined to reduce the transient current.... Agent: Quarles & Brady LLP

20070285100 - Trailer mate circuit tester: A method for testing lighting systems in tractors and trailers. To use the tester to check small trailers; connect male cord from trailer to female connection on tester. Connect 12V power supply cord to power supply, connect power supply to tester to check lighting system. To use tester to check... Agent: Johnny M. Hart

20070285101 - Equipment monitoring devices: An equipment monitoring device for monitoring a heating, ventilation, and air conditioning (HVAC) system configured to control an internal environment of a structure may include a current transformer configured to sense current being supplied from a power source to a first component of the HVAC system and a gauge configured... Agent: Jay A. Stelacone, Esq. Law Office Of Thomas M. Isaacson

20070285102 - Measuring array: The invention relates to a measuring array with an earth connection point (5) for determining the insulation resistance (Riso) of an energized electrical apparatus or of an installation with a supply voltage UB with a positive pole (6) and a negative pole (7), two switches (S1, S2) or a corresponding... Agent: Pyle & Piontek Attn: Thomas R. Vigil

20070285103 - Electronic package and method for testing the same: An integrated circuit package includes at least two electronic circuits. A first of the at least two electronic circuits includes a digital input and a digital output and a test mode control line for setting the first integrated circuit chip into a determined test mode. The digital input includes at... Agent: Edell, Shapiro & Finnan, LLC

20070285104 - Semiconductor device testing: An apparatus and method to test components in a semiconductor test structure. On a semiconductor wafer, a test module implemented in one or more scribe lines between a plurality of semiconductor dies is used to test components in the semiconductor test structure. The test module may, for example, test electrical... Agent: Robert D. Marshall, Jr. Texas Instruments Incorporated

20070285105 - Methods and apparatuses for trimming circuits: The inventions relate to methods for trimming integrated circuits. Various embodiments include providing a method to trim an integrated circuit wherein trim data is stored in an on-board memory and then sent off of the circuit to be operated on by an external device. Corresponding trim data is then sent... Agent: Lexmark International, Inc. Intellectual Property Law Department

20070285106 - Adjustable test socket: An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.... Agent: Chase Law Firm L.c

20070285107 - Calibration structures for differential signal probing: A plurality of calibration structures facilitate calibration of a probing system that includes a differential signal probe having a linear array of probe tips.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070285108 - Network analyzer, transmission tracking error measuring method, network analyzing method, program, and recording medium: There is reduced labor to directly connect two ports selected from ports of a network analyzer in order to measure transmission tracking errors. A network analyzer, to which a test set which branches four ports to nine ports (main port group: three ports, and sub port groups: three ports×2) is... Agent: Greenblum & Bernstein, P.L.C

20070285109 - Method and device for characterizing the linear properties of an electrical component: A method and device for determining the linear response of an electrical multi-port component has an “estimation procedure” in which an estimated admittance matrix is determined by applying voltages to the ports of the component and measuring the response of the component. The estimation procedure can e.g. consist of a... Agent: Buchanan, Ingersoll & Rooney PC

20070285110 - Methods and systems for monitoring the displacement of turbine blades: A system for monitoring the displacement of turbine blades that includes a turbine blade with a cutting tooth and one or more sensor wires, each sensor wire including a severable portion, that become severed by the cutting tooth as turbine blade displacement occurs. The sensor wires may be embedded in... Agent: Sutherland Asbill & Brennan LLP

20070285112 - On-wafer test structures: A test structure for characterizing integrated circuits on a wafer includes a differential cell outputting a differential mode signal in response to a differential mode input signal. The probe pads of the test structure are arrayed linearly enabling placement of the test structure in a saw street between dies.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070285111 - Test structure and probe for differential signals: A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070285113 - Fault tolerant selection of die on wafer: In a functional mode, the functional core logic of a die is connected to the input and output pads and the die performs its intended function. In a bypass mode, the input and output buffers of the functional core logic are disabled and pad sites of corresponding position between a... Agent: Texas Instruments Incorporated

20070285114 - Socket for making with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component: Products and assemblies are provided for socketably receiving elongate interconnection elements, such as spring contact elements, extending from electronic components, such as semiconductor devices. Socket substrates are provided with capture pads for receiving ends of elongate interconnection elements extending from electronic components. Various capture pad configurations are disclosed. Connections to... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070285115 - Universal wafer carrier for wafer level die burn-in: A reusable burn-in/test fixture for testing unsingulated dice on a semiconductor wafer consists of two halves. The first half of the test fixture is a wafer cavity plate for receiving the wafer, and the second half establishes electrical communication between the wafer and electrical testing equipment. A rigid substrate has... Agent: Trask Britt, P.C./ Micron Technology

20070285116 - Apparatus for temporary thermal coupling of an electronic device to a heat sink during test: A method, system and apparatus for testing an integrated circuit chip. The system including: means for forming a liquid polyalphaolefine layer on a bottom surface of the integrated circuit chip, a top surface of the integrated circuit chip having and a bottom surface not having signal and power pads; means... Agent: Schmeiser, Olsen & Watts

20070285117 - Current abnormality detection system and method for shunt motors: A current abnormality detection system and method for shunt motors having a battery as a power source and an armature coil and a field coil controlled by an armature drive circuit and a field drive circuit formed in a controller, each drive circuit having a respective current sensor, An abnormal... Agent: Ernest A. Beutler, Attorney At Law

20070279036 - Electrostatic discharge device testing system and method: There is disclosed an electrostatic discharge (ESD) device tester and a method of operating the tester. In an embodiment, the method comprises operating the tester by uniquely identifying an ESD device to be tested using identification means provided on the tester; taking at least one test measurement of the uniquely... Agent: Fasken Martineau Dumoulin LLP

20070279039 - Rotation phase angle measuring device, and control-protecting devices of electric power system using the same: The rotation phase angle measuring device measures a voltage instantaneous value of an electric power system in a period of 1 4N-th (N is a positive integer) of one period of a reference wave when the voltage instantaneous value of the electric power system is expressed by a voltage rotation... Agent: Buchanan, Ingersoll & Rooney PC

20070279037 - Spectrometry diagnostic electronic circuit and associated counting system: The invention relates to a spectrometry diagnostic electronic circuit comprising digital data detection means corresponding to detected pulses and amplitude measurement means to associate a measured amplitude with a detected pulse (24) , wherein pulse rejection means (25) are used to detect digital data and reject every pulse with a... Agent: Robert E Krebs Thelen Reid & Priest

20070279038 - Signal detecting apparatus and signal detecting system: A signal detecting apparatus includes a component extractor extracting a voltage component whose absolute value is not less than a predetermined value from an electronic signal generated by a tester for testing an electric property of a device under test; a rate-of-change calculator calculating a time rate-of-change of a level... Agent: Sughrue Mion, PLLC

20070279040 - On-chip current sensing methods and systems: A switch regulator module includes a switch and a current sensing module. The switch has an input port and an output port. The current sensing module senses a first voltage at the input port of the switch and a second voltage at the output port of the switch. The current... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20070279041 - Energy metering system: An energy consumption meter arrangement is specified which has two inputs (1, 2), to which signals are fed which are dependent on an electrical voltage (V) and an electrical current (I). These signals are digitized in analog-to-digital converters (3, 4) and combined with one another. In order to correct phase... Agent: Fish & Richardson PC

20070279042 - Integration methods for energy metering systems using a rogowski coil: Devices and methods for accurately realizing the integration functions, in particular for energy metering systems using a Rogowski coil, are disclosed. In this regard, exemplary embodiments of the present invention may be constructed as two stable filters for the current (I) and voltage (U) channel. In the analog realization form,... Agent: Scully Scott Murphy & Presser, PC

20070279043 - Probe, manufacturing method of the probe, recording apparatus, and reproducing apparatus: A probe (100) is provided with: a support member having a through-hole in at least one portion thereof a projection standing on the support member with its tip facing a medium; and a conductive film formed to cover at least a partial surface of the support member including a side... Agent: Nixon & Vanderhye, PC

20070279045 - Piston and a fluid operated setting device connected therewith: A piston for a setting device operated by fluid power is suggested. The piston includes a support body having an annular recess with an axis coinciding with the longitudinal axis of the piston, such recess having at least one annular permanent magnet arrangement therein. The permanent magnet arrangement is segmented... Agent: Charles R. Hoffmann Hoffmann & Baron

20070279046 - Piezo-based encoder with magnetic brake for powered window closing: The device (1) comprises a frame (42) comprising a static magnetic pole (48), a movable member (44) relatively to the frame (42), the movable member (44) comprising a moving magnetic pole (46), the static magnetic pole (48) and the moving magnetic pole (46) being magnetically coupled in some position of... Agent: Ronald R. Santucci Frommer Lawrence & Haug

20070279047 - Systems and methods for detecting solenoid armature movement: A method for detecting actuation of an armature associated with a solenoid includes providing a voltage potential to a solenoid coil associated with the solenoid. The method also includes measuring a current flowing through the solenoid coil. The method further includes switching the voltage potential off when the measured current... Agent: Caterpillar/finnegan, Henderson, L.L.P.

20070279044 - Magnetic field sensor and method for the operation thereof: A magnetic field sensor comprising a sensor arrangement (H), which is supplied by a supply device (IH) and generates a sensor signal. An evaluation device (ADC, R) to which the sensor signal is fed and which outputs a first output signal (AI). A feedback device (RV) to which the first... Agent: Cohen, Pontani, Lieberman & Pavane

20070279048 - Safety position sensor for cylinders, cylinders with such a position sensor: A sensor is disclosed for monitoring a part which can move translationally relative to a sensor with reference to its position on the axis of motion. This part is for example a piston in a cylinder which is equipped with a sensor. The sensor can be actuated by means of... Agent: Buchanan, Ingersoll & Rooney PC

20070279049 - Magnetic rotational position sensor: A magnetic rotational position sensor including first and second magnets spaced apart to define an air gap and cooperating with one another to generate a magnetic field within the air gap extending along an axis of rotation. At least one magnetic flux sensor is positioned within the magnetic field and... Agent: Krieg Devault LLP

20070279050 - Method and apparatus for measuring hydrogen concentration in zirconium alloy components in the fuel pool of a nuclear power plant: The present invention provides a method for measuring hydrogen concentration in an electrically conductive material, such as a nuclear fuel rod, comprising calibrating an eddy current probe at a plurality of hydrogen concentrations; measuring eddy currents at a plurality of positions along an electrically conductive material; and calculating a hydrogen... Agent: Electric Power Research Instiute

20070279051 - Fuel cell current distribution measuring equipment and fuel cell current distribution measuring method: A fuel cell current distribution measuring apparatus measures electromotive force distribution on an electrode surface of a fuel cell which includes: an electrolyte; and a pair of a fuel electrode and an air electrode between which the electrolyte is provided. The fuel cell current distribution measuring apparatus includes: a plurality... Agent: Harness, Dickey & Pierce, P.L.C

20070279052 - Electrical system: An electrical system includes a first monolithic circuit. The first monolithic circuit may include a first magnetoresistive sensor operable to sense magnetic flux and produce an output signal relating to the sensed magnetic flux. The first magnetoresistive sensor may be positioned to sense first control flux generated by control current... Agent: Caterpillar/finnegan, Henderson, L.L.P.

20070279053 - Integrated current sensor: An integrated current sensor includes a current conductor, a magnetic field transducer, and an electromagnetic shield. The magnetic field transducer includes a sensor die. The electromagnetic shield is disposed proximate to the sensor die. The electromagnetic shield has at least one feature selected to reduce an eddy current in the... Agent: Daly, Crowley, Mofford & Durkee, LLP

20070279054 - Dielectric element, and magnetic resonance imaging method using same: A dielectric element for positioning on an examination subject for locally influencing the B1 field distribution during magnetic resonance data acquisition contains a relaxation agent bound to mutually separated particles. The relaxation agent incorporates a paramagnetic substance. In a corresponding method for acquiring magnetic resonance data from an examination subject,... Agent: Schiff Hardin, LLP Patent Department

20070279055 - Method and apparatus of echo planar imaging with real-time determination of phase correction coefficients: The present invention provides an apparatus and method of phase correction whereby changes in phase characteristics are measured during data acquisition and, accordingly, phase correction parameters that are applied during image reconstruction are updated in real-time. This adaptive and dynamic phase correction reduces variability in image fidelity during the course... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20070279056 - Method and apparatus of slice selective magnetization preparation for moving table mri: The present invention is directed to slice selective magnetization preparation for moving table MRI. The present invention includes a method of magnetization preparation that takes into account patient movement or translation during the imaging process. The present invention adjusts or modifies the frequency at which magnetization preparation pulses are applied... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20070279058 - Magnetic resonance imaging system with a class-e radio frequency amplifier: A Class-E amplifier has bee adapted for use in the radio frequency section of a magnetic resonance imaging (MRI) system. A drive signal is produces by modulating the envelope of a radio frequency carrier signal and then applied to a switch in the Class-E amplifier. The switch is connected in... Agent: Quarles & Brady LLP

20070279057 - Method and apparatus for improving the detection of nuclear quadrupole resonance signals in coherent noise: A method for exciting an NQR signal in a substance within a material that may include the substance and detecting the NQR signal in the presence of coherent noise. The method comprises irradiating the material with multiple RF pulses in the form of a complex pulse sequence containing a plurality... Agent: Pillsbury Winthrop Shaw Pittman, LLP Eric S. Cherry - Docketing Supervisor

20070279059 - Nmr analyzer: A first room-temperature space is formed penetrating through a cryostat along a center axis of a split-type multi-layer cylindrical superconducting coil system which has a ratio of the maximum empirical magnetic field to the central magnetic filed of not larger than 1.3 and is horizontally arranged such that the center... Agent: Dickstein Shapiro LLP

20070279060 - Dynamic shimset calibration for bo offset: A magnetic resonance imaging scanner includes a main magnet (20) generating a main B0 magnetic field, one or more shim coils (60) selectively shimming the main B0 magnetic field at selected shim currents, and a processor (70) executing a process including determining a magnitude shift of the main B0 magnetic... Agent: Philips Intellectual Property & Standards

20070279062 - Double resonance coil arrangement for a magnetic resonance device: A double resonance coil arrangement for a magnetic resonance device has at least two coils, each having a coil conductor, in which at least one first capacitor, as well as at least one inductor forming an oscillating circuit with a second capacitor, are connected. The inductors of two adjacently arranged... Agent: Schiff Hardin, LLP Patent Department

20070279061 - Rf coil assembly for magnetic resonance imaging and spectroscopy systems: An RF coil assembly for an MRI system includes a resonator formed by a cylindrical shield and pairs of opposing conductive legs disposed symmetrically around a central axis and extending the axial length of the shield. Drive circuitry for each pair of opposing conductive legs includes a current balun that... Agent: Quarles & Brady LLP

20070279063 - Oil-based mud resistivity imaging using resonant circuits: A resistivity imaging tool determines formation resistivity by evaluating the resonant frequency and the quality factor of a resonant circuit associated with a current electrode. A planar coil electrode may be used to provide the necessary inductance and capacitance for the resonant circuit.... Agent: Madan, Mossman & Sriram, P.C.

20070279064 - Contact resistance test structure and methods of using same: The present invention is directed to a contact resistance test structure and methods of using same. In one illustrative embodiment, the method includes forming a test structure comprised of two gate electrode structures, forming a plurality of conductive contacts to a doped region between the two gate electrode structures, forcing... Agent: Williams, Morgan & Amerson

20070279065 - Industrial truck with a battery and method for operating an industrial truck with a battery: The invention relates to an industrial truck with at least one drive battery and at least one apparatus (A) for determining the state of charge of the battery and to a method for operating such an industrial truck. The apparatus (A) for determining the state of charge of the battery... Agent: The Webb Law Firm, P.C.

20070279066 - Miniaturized battery tester: A miniaturized battery tester that fits comfortably inside a shirt pocket. In one non-limiting embodiment, the invention comprises: first and second battery-test probes, wherein the first battery-test probe is a retractable battery-test probe; a finger grip member for holding the first battery-test probe; a circuit board, wherein the circuit board... Agent: Wood And Eisenberg, PLLC

20070279067 - Stray voltage detecting: A stray voltage detector has a portable housing carrying a pair of electrostatic charge sensors spaced apart along an axis, and a pair of field intensity indicators, each indicator connected to an associated one of the charge sensors and constructed to indicate a relative electric field intensity at its associated... Agent: Fish & Richardson PC

20070279068 - Power diagnostic system and method: A power diagnostic system and method for detecting faults is provided. The system includes a processor coupled to a plurality of sampling blocks; wherein the plurality of sampling blocks simultaneously perform current measurements and voltage measurements at a plurality of loads, based on a reference signal generated by a clock... Agent: Klein, O'neill & Singh, LLP

20070279069 - System and method for reducing current in a device during testing: A method for testing an electronic assembly (10) is provided. A portion (22) of the electronic assembly is electrically isolated from a remainder (24) of the electronic assembly. Power is provided to the electronic assembly such that a reduced amount of current flows only through the portion of the electronic... Agent: Ingrassia Fisher & Lorenz, P.C. (fs)

20070279070 - Thermal protection of a switch: A method and a circuit for detecting an overheating of an electronic switch of power supply of a load by an A.C. voltage, in which a voltage representative of the temperature in the vicinity of the switch is compared with a threshold, the result of this comparison being sampled at... Agent: Stmicroelectronics Inc. C/o Wolf, Greenfield & Sacks, P.C.

20070279071 - Method and system for diagnosing degradation in vehicle wiring: The invention provides a system for diagnosing degradation of a plurality of wires in an electrical system having plurality of loads connected by the plurality of wires to a direct current power source, the plurality of wires arranged into a bundle near the power source. The system comprises a current... Agent: Oyen, Wiggs, Green & Mutala LLP 480 - The Station

20070279072 - Automatically folding cable: A cable includes a sheath extending a length of the cable. The cable further includes a flexible wire disposed within the sheath that runs a substantial portion of the length of the cable. The wire acts to fold the cable in a pre-defined configuration. In some implementations, the cable also... Agent: Harrity Snyder, L.L.P.

20070279073 - Method and apparatus for measuring the composition and water salinity of a multiphase mixture containing water: A method for determining the composition and water salinity of a multi-component mixture of a gas and at least one liquid, including water, in a pipe (1), the method comprising the following steps: a. electromagnetic phase measurements are performed between two receiving antennas (4) located at different distances from a... Agent: Nields & Lemack

20070279075 - Apparatus and method for terminating probe apparatus of semiconductor wafer: A method and apparatus for terminating a probe that probes a semiconductor device with a signal cable from a tester is provided to connect layers of the probe to layers of the signal cable side by side. The probe and signal cable can be a co-axial or tri-axial probe and... Agent: Dorsey & Whitney LLP Intellectual Property Department

20070279076 - Probe card assembly and method of attaching probes to the probe card assembly: A probe card assembly is provided. The probe card assembly includes a substrate layer defining a plurality of apertures and a plurality of probes. Each of the probes has a base and a tip. The base of each probe is configured to be at least partially inserted within one of... Agent: Hickman Palermo Truong & Becker, LLP

20070279074 - Probe cassette, semiconductor inspection apparatus and manufacturing method of semiconductor device: A full wafer inspection apparatus and a manufacturing method of a semiconductor device capable of collectively and precisely inspecting semiconductor elements formed on a wafer, while securing the positional accuracy of tip portions of contact terminals are provided. A probe cassette used in a semiconductor inspection apparatus includes: a probe... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070279077 - Stacked contact bump: A novel method for providing bump structures that can be formed by conventional stud bump bonding techniques is disclosed. The bumps can be arranged in a buttressed configuration that allows for substantial lateral and vertical contact loads, and substantial heights. A side-by-side configuration may be used to build a stacked... Agent: Manuel F. De La Cerra

20070279078 - Kelvin contact measurement device and kelvin contact measurement method: Stable Kelvin contact is made upon positional deviation of object. Force pins 12a and sense pins 12b contact with each ball terminal 51 of object 50 for measuring electric property. Force pins 12a and sense pins 12b are extendable and contractable and urged to ball terminal 51 by elastic member... Agent: Young & Thompson

20070279079 - Multiple chip package test program and programming architecture: A two-layer multi-chip package (MCP) test program architecture, test program, and programming method for testing an MCP. A program implemented according to the architecture includes a global layer defining global resources and global test functions, and respective local layers associated with each of a plurality of dies in the MCP... Agent: Agilent Technologies Inc.

20070279080 - Method for evaluating semiconductor wafer and apparatus for evaluating semiconductor wafer: The present invention is a method for evaluating a semiconductor wafer by measuring an electric characteristic of the semiconductor wafer by using a mercury electrode, wherein when the semiconductor wafer is held on a wafer chuck that the mercury electrode is formed in a holding surface of so that a... Agent: Oliff & Berridge, PLC

20070279081 - Measurement apparatus for fet characteristics: A measurement apparatus for FET characteristics comprises a divider connected to a pulse generator for dividing pulses from the pulse generator into first and second pulses; a first SMU; a first switch for selecting pulses from the divider or voltage from the first SMU; a terminal resistor for applying signals... Agent: Paul D. Greeley, Esq. Ohlandt, Greeley, Ruggiero & Perle, L.L.P.