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Electricity: measuring and testing inventions 11/07

Recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing format for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application.   11/29/2007 > patent applications in patent subcategories.

20070273356 - Method for electrically detecting motion of nonpolar composite molecule by utilizing nonuniform electric field: The conventional dielectric measurement method utilizes an interaction between a uniform electric field and a dipole moment, and hence a motion of nonpolar molecules without the dipole moments cannot be detected. It is an object of the present invention to provide a method for electrically detecting the motion of the... Agent: Darby & Darby P.C.

20070273355 - Method for quantitatively determining the width of a soft zone area of a partially hardened workpiece: Disclosed is a method for quantitatively determining the width of a soft zone area of a partially hardened metallic workpiece, which has at least one hardened and one unhardened area, by means of at least one multifrequency eddy current sensor. A single workpiece being individually is moved relative to the... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070273357 - Optical waveform measurement device and measurement method thereof, complex refractive index measurement device and measurement method thereof, and computer program recording medium containing the program.: The present invention relates to a light-waveform measuring device and its measuring method, a complex-refractive-index measuring device and its measuring method, and a computer-program recording medium having programs for the same stored therein. It is an object of the present invention to measure an electric field of an electromagnetic wave... Agent: Sampson & Associates, P.C.

20070273358 - Method for reducing temperature-dependent error in photocurrent sensor, and photocurrent sensor device: [Means for Resolution] In a prior-art optical sensor fiber of reflection type, reduction in the temperature dependence of a sensor is coped with by, e.g., duplexing a signal processing circuit and a receiving optical system, so as to execute the mean processing of modulation signals, whereas in this invention, the... Agent: Rossi, Kimms & Mcdowell LLP.

20070273359 - Modularized servo control system: A modular current sensing system for a servo control system that includes a magnetic core with an open center portion and a connection plate that includes at least three wire connectors, wherein the wire connectors are capable of connecting at least two wires electrically in series. The system also includes... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20070273360 - Cap at resistors of electrical test probe: A lossy dielectric device dissipates, absorbs, and/or dampens electric fields. The lossy dielectric device may be used with any transmission path, such as a transmission line or resistor in a probe head. The lossy dielectric device preferably includes a lossy dielectric material contained within a container. The container is positionable... Agent: Law Office Of Karen Dana Oster, LLC

20070273361 - Input by-pass circuit for a current probe: An input by-pass circuit for a current probe has first and second switches coupled between current probe inputs and current sensing circuit inputs. A switch control is coupled to the switching circuit for selectively coupling and decoupling the current probe inputs to the current sensing circuit such that the current... Agent: William K. Bucher Tektronix, Inc.

20070273362 - Magnetic encoder and wheel support bearing assembly using the same: A magnetic encoder (10) includes a multipolar magnet (14), having magnetic poles formed therein so as to alternate with each other in a direction circumferentially thereof, and a core metal (11) supporting the multipolar magnet (14). The multipolar magnet (14) is prepared from a sintered element formed by sintering a... Agent: Staas & Halsey LLP

20070273363 - Ripple detecting device: A ripple detecting device for detecting a ripple from an armature current outputted from a motor by overlapping a low band noise having a frequency of one/n (wherein “n” is a natural number more than 1) includes an initial ripple detecting device for detecting a cycle of the ripple in... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20070273366 - Distance measuring device: Distance measuring device comprising an emitter and a receiver, said emitter being arranged to produce a magnetic field by means of a resonant circuit having a resonant frequency, said receiver being arranged to pick up at said resonant frequency the magnetic field emitted by the emitter and convert the strength... Agent: Jacobson Holman PLLC

20070273365 - Hall sensor arrangement and use of a hall sensor arrangement in a belt lock: Hall sensor arrangement is disclosed for detection of the change in the position of two components which can move relative to one another into two end positions, with a Hall sensor with at least one Hall measurement field (H; H1, H2) and a field magnet. An actuator is provided for... Agent: Buchanan, Ingersoll & Rooney PC

20070273364 - Lens position detector, lens barrel and imaging device: A lens position detecting device 200 has a position detecting magnet 202, a magnetic force detecting sensor 204, a positional information generating means 206, etc. The position detecting magnet 202 is mounted on a rear surface of a lens holder frame 1460. The magnetic force detecting sensor 204 serves to... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070273367 - Joining element: A joining element is proposed which, for force measurement, senses a relative motion between a magnet system and a magnet sensor apparatus. The magnet system is disposed with respect to the magnet sensor apparatus in such a way that a component of the magnetic field perpendicular to the relative motion... Agent: Kenyon & Kenyon LLP

20070273369 - Magnetic rotating device: The invention relates to a magnetic rotating device. The magnetic rotating device comprises: a base, a spindle, a rotating plate, a shell body, an elastic element, a passive magnetic element, an adjusting device and a driving device. The passive magnetic element and the driving device have the same magnetic pole... Agent: Volentine & Whitt PLLC

20070273368 - Device for determining the angular position and rotation speed of a rotary member: A device for determining the angular position and rotation speed of a rotary member. The inventive device includes a sensor having a fixed part and a rotary part which is linked to the rotary member. The rotary part bears a magnetic flux generator, while the fixed part includes: a first... Agent: Young & Thompson

20070273370 - Method of testing and testing apparatus for a magnetoresistive effect head: When testing the quality of shield films of magnetoresistive effect heads, a method of testing and a testing apparatus can detect heads where the shield magnetic domain is susceptible to changing that could not be completely detected by conventional methods of testing that use normal magnetization. The method of testing... Agent: Kratz, Quintos & Hanson, LLP

20070273371 - Method and device for measuring the thickness and the electrical conductivity of an object of measurement: A method for non-contact measurement of a dimension and/or an electrical property in an electrically conducting object to be measured by using electromagnetic induction. An electromagnetic field is brought to penetrate through the object to be measured. A transmitter coil is place on one side of the object to be... Agent: Venable LLP

20070273372 - Method of determining angles: In order to provide a method of determining an angle a of an external magnetic field relative to a magnetoresistive angle sensor with two full bridges which respectively supply an output signal U1=U0 sin(2α) U2=U0 cos(2α) wherein the angle determination can be carried out using simple electronic components, it is... Agent: Nxp, B.v. Nxp Intellectual Property Department

20070273373 - Inter-subject coherence in dt-mri: A method for estimating a value of a diffusion tensor includes obtaining, from a plurality of test subjects, DT-MRI data from which an initial estimate of the tensor can be derived. Values indicative of intra-subject variation and inter-subject variation in the data are then determined. These values are used to... Agent: Fish & Richardson PC

20070273374 - Method and apparatus for magnetic resonance spectroscopy: In the method disclosed here for magnetic resonance spectroscopy, the main magnetic field in the sample measurement region is generated in the form of a pulse, and the excitation and detection of the magnetic resonance is performed close to the pulse maximum within a defined time window in which the... Agent: Dennison, Schultz & Macdonald

20070273375 - Method for generating a homogeneous magnetization in a spatial examination volume of a magnetic resonance installation: In a method and magnetic resonance apparatus wherein a homogenous magnetization is generated in a spatial examination volume of the apparatus during examination of a subject, individual resonator segments of a body coil, that are electromagnetically decoupled from each other, are separately activated by a control and evaluation device according... Agent: Schiff Hardin, LLP Patent Department

20070273379 - Nuclear magnetic resonance probe coil: Provided is a nuclear magnetic resonance probe coil that is included in a nuclear magnetic resonance apparatus in which the direction of a static magnetic field is horizontal and that can highly sensitively measure multiple nuclear species. A nuclear magnetic resonance apparatus includes a unit that horizontally applies a static... Agent: Stanley P. Fisher Reed Smith LLP

20070273377 - Active decoupling of mri rf transmit coils: An MRI RF transmit system uses a plurality of RF transmit coils, each being driven with separately controllable RF magnitude and phase. The magnitude and phase of each coil drive are separately and independently controlled so that the RF transmit coils act as if they are decoupled from each other.... Agent: Nixon & Vanderhye, PC

20070273376 - Magnetic resonance imaging scanner with booster iron: A magnetic resonance imaging scanner includes a magnet (20) generating a temporally constant magnetic field, magnetic field gradient-generating structures (30) superimposing selected magnetic field gradients on the temporally constant magnetic field, and a radio frequency coil (32) producing a radio frequency field. A magnetic field-modifying structure (60) disposed inside a... Agent: Philips Intellectual Property & Standards

20070273378 - Nuclear magnetic resonance apparatus: A magnet for a Magnetic Resonance Imaging apparatus, said magnet having at last two, preferably three open sides, and delimiting the patient receiving area, said magnet being composed of three yoke elements, i.e. two parallel magnetically permeable elements and one transverse yoke element for connection of said two parallel elements,... Agent: Buchanan, Ingersoll & Rooney PC

20070273380 - Single-sided magnetic resonance magnet assembly: Magnetic resonance apparatus is provided comprising a magnet having a plurality of pairs of coils arranged in respective substantially parallel planes. The coils in each pair are operable in a counter-running manner when in use so as to generate a region of magnetic field spaced apart from said planes, having... Agent: Vern Maine & Associates

20070273381 - Apparatus and method for circulated flow nuclear magnetic resonance measurement: A sample solution containing small molecules and large molecules is circularly transferred between a vessel equipped with a nuclear magnetic resonance probe and a control section in which injection and filtration of small molecules are performed. By transferring the sample solution between them, the NMR measurement can be performed while... Agent: Stanley P. Fisher Reed Smith LLP

20070273382 - Ignition coil tester apparatus and method: A simple “go or no go” ignition coil tester identifies coils that have failed or that are about to fail by driving a coil with sufficient voltage and amperage to operate at its peak output. Coils that have failed or that are close to failure cannot operate at peak output... Agent: Roberts, Mardula & Wertheim, LLC

20070273383 - Tune-stabilized, non-scaling, fixed-field, alternating gradient accelerator: A FFAG is a particle accelerator having turning magnets with a linear field gradient for confinement and a large edge angle to compensate for acceleration. FODO cells contain focus magnets and defocus magnets that are specified by a number of parameters. A set of seven equations, called the FFAG equations... Agent: Richard Krukar Ortiz & Lopez, PLLC

20070273384 - Gas detection and identification apparatus and method: Gas detection and identification apparatus that receives a flow of a mixture of a carrier gas and an analyte gas and detects and identifies the components of the flowing gas mixture by Penning Ionization Electron Spectroscopy (PIES).... Agent: Andrew L. Ney

20070273385 - Mass spectrometry method and apparatus: A mass spectrometer 10 comprises an ion source 12 which generates nebulized ions which enter an ion cooler 20 via an ion source block 16. Ions within a window of m/z of interest are extracted via a quadrupole mass filter 24 and passed to a linear trap 30. Ions are... Agent: Thermo Finnigan LLC

20070273386 - Tuning a test trace configured for capacitive coupling to signal traces: A method of tuning a test trace that is capacitively coupled to a number of signal traces. A method for determining a configuration of a device comprising signal traces and a capacitively coupled test trace may include selecting a test frequency of a test signal to be driven on selected... Agent: Mhkkg/sun

20070273387 - Optical testing device: A chuck adapted to test electrical and/or optical components on a device-under-test (DUT).... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070273388 - Load detection system (lds): A load detection circuit for determining when (1) a loudspeaker load is properly connected at a set of loudspeaker terminals, (2) a loudspeaker load is improperly connected at the loudspeaker terminals, and (3) no loudspeaker load is connected at the loudspeaker terminals.... Agent: Pandiscio & Pandiscio, P.C.

20070273389 - Apparatus and method for processing a signal under test using a trigger signal synchronous with the signal under test for arbitrary impedance loads: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under... Agent: Thomas F. Lenihan Tektronix, Inc.

20070273390 - Characterizing substances with multistatic probes: The disclosed technology can be used in the development and operation of multistatic probes that can characterize substances and relationships between substances. A multistatic probe can include transmitting and receiving conductive elements that are electrically distinct and which are capable of conveying electromagnetic energy to/from a substance of interest. The... Agent: Foley Hoag, LLP Patent Group, World Trade Center West

20070273391 - Loop resistance tester: There is disclosed a method and apparatus for measuring loop resistance by injecting into the loop through an inductive injection probe a sinusoidal drive signal at a given frequency, preferably of the order of 1 kHz, to produce a predetermined current in the loop, measuring, by a test probe also... Agent: Mcdermott, Will & Emery LLP

20070273392 - Implant for intracorporal, telemetric measurement: An implant for an intracorporal, telemetric measurement with a sensor device (1) and an inductive coil (2), which is connected to the sensor device (1) via electrical connection lines (4) being arranged on a longitudinal carrier (3), and a covering (5) by means of which the sensor device (1), the... Agent: Philip S. Johnson Johnson & Johnson

20070273393 - Capacitive sensor: A capacitive sensor includes an error compensating unit that, in an arrangement that a part of a fixed electrode as an edge portion and a part of a movable electrode as an edge portion are opposed to each other keeping a gap in a direction of shift of a detecting... Agent: Greenblum & Bernstein, P.L.C

20070273394 - Environmental sensor: Multi functional sensors are described. A silicon based sensor utilizes metal layers arranged as resistors around a central pair if resistors separated by a humidity sensitive polymer with one of the central resistors being a heater. This enables temperature humidity wind speed and direction to be measured. In another embodiment... Agent: Connolly Bove Lodge & Hutz LLP

20070273395 - Sensor arrangement with a plurality of potentiometric sensors: l

20070273396 - Semiconductor integrated circuit device with power lines improved: A semiconductor integrated circuit device includes an internal circuit. A plurality of power supply nodes are connected with the internal circuit, and a plurality of pads are respectively connected with the plurality of power supply nodes. A switch section is configured to connect the plurality of power supply nodes one... Agent: Mcginn Intellectual Property Law Group, PLLC

20070273397 - Apparatus for evaluating semiconductor wafer: The present invention is an apparatus for evaluating a semiconductor wafer in order to evaluate an electric characteristic thereof, comprising, at least, a wafer cassette section on which a wafer cassette for storing the semiconductor wafer that is an object to be evaluated is placed, a wafer pretreatment section for... Agent: Oliff & Berridge, PLC

20070273398 - Mounting apparatus: One embodiment of the present invention is a mounting apparatus that includes: (a) a first ring having a first surface and a second surface; (b) a second ring having a first surface and a second surface, which second ring is movable with respect to the first ring; (c) a first... Agent: Michael B. Einschlag, Esq.

20070273399 - Probe for testing a device under test: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070273400 - Apparatus and method for electrical characterization of semiconductors: The present disclosure provides methods and apparatus that enable characterization of an electrical property of a semiconductor specimen, e.g., dopant concentration of a near-surface region of the specimen. In exemplary method, a target depth for measurement is selected. This thickness may, for example, correspond to a nominal production thickness of... Agent: Perkins Coie LLP Patent-sea

  
11/22/2007 > patent applications in patent subcategories.

20070268011 - Radio mode selectivity block for a detector for detecting a buried current carrying coductor: A radio mode selectivity block 41 for a detector 1 for detecting a buried current carrying conductor comprises a plurality of beat frequency oscillators 53 to centre the bandwidth of detection of the detector 1 on target very low frequency (VLF) frequency bands. The frequencies of the beat frequency oscillators... Agent: Baker & Hostetler LLP

20070268012 - Waveform input circuit, waveform observation unit and semiconductor test apparatus: A waveform input circuit 10 comprises a high input impedance terminating resistance which receives an input signal from a transmission line 11, selection means (relay) 12 which selects any one of this terminating resistance and other terminating resistances, and an input buffer 13 which is connected when the high input... Agent: Muramatsu & Associates

20070268013 - Bearing assembly with rotation sensor: A bearing assembly with a rotation sensor, comprising an outer member (1), an inner member (2), a plurality of rolling elements (3) interposed between the opposed raceway surfaces, and a rotation sensor (4). The rotation sensor (4) includes an annular magnetic encoder (15) and an annular magnetic sensor (16) fitted... Agent: Staas & Halsey LLP

20070268014 - Motion detecting apparatus: A turbine wheel of a turbocharger has a turbine blade. The turbine blade has a fin shape of which width in the rotation direction of the turbocharger is narrow, and is projected from the base portion of the turbine wheel. An inclined part of the turbine blade is inclined with... Agent: Nixon & Vanderhye, PC

20070268015 - Rotation angle detection apparatus enabling measurement of degree of rotation of a shaft that exceeds 360°: A rotation angle of a shaft is detected based on changes in levels of magnetic flux from a single magnet that is mounted on the shaft and is moved axially in accordance with rotation of the shaft. Respective detected variations in level of X-direction and Y-direction magnetic flux components (each... Agent: Nixon & Vanderhye, PC

20070268016 - Apparatus for detecting magnetic signals and signals of electric tunneling: A scanning probe microscope comprises a magnetic sensor and a sensor of electric tunneling current. The miscroscope integrates both the advantages of scanning SQUID microscope (SSM), and scanning tunneling microscope (STM), into a single instrument by applying a high-permeability metallic tip such as a permalloy tip, a pick-up coil and... Agent: Lowe Hauptman Ham & Berner, LLP

20070268017 - High-resolution magnetic encoder: A high-resolution magnetic encoder system includes a magnetic resistive sensor, a fixed suspension, and a mechanism. The magnetic resistive sensor is mounted to the fixed suspension above a magnetic medium having at least one magnetic track. The fixed suspension is attached to the mechanism, such as a housing, a substrate,... Agent: Law Offices Of Michael Dryja

20070268018 - Circuit arrangement for detuning a resonant circuit of an mr apparatus: The invention relates to a circuit arrangement for an MR apparatus, having a resonant circuit, which is formed by an MR receiving coil (L1) and a capacitor (C1), and having an electronic control circuit (S) for switching the resonant circuit between two or more operating modes. The invention proposes that... Agent: Philips Intellectual Property & Standards

20070268019 - Imaging procedure and magnetic-resonance imaging system for the acquistion of the longitudinal spin-lattice relaxation time: An imaging process is disclosed, as well as a nuclear spin tomograph for generating mainly T1-weighted images with high signal-to-noise ratio and high spatial resolution. According to the invention, the imaging process is characterised in that it comprises at least one data acquisition module including at least one layer-selective α... Agent: K.f. Ross P.C.

20070268020 - Signal acquisition and processing method and apparatus for magnetic resonance imaging: A method and apparatus are disclosed for Magnetic Resonance Imaging using specialized signal acquisition and processing techniques for image reconstruction with a generally inhomogeneous static magnetic field. New signal processing methods for image reconstruction and for minimizing dephasing effects are disclosed. Imaging systems with smaller static magnetic field strengths and... Agent: Russ Weinzimmer

20070268021 - Gradient magnetic coil, method of manufacturing the same, and magnetic resonance imaging apparatus having the gradient magnetic coil: There is provided a magnetic resonance imaging apparatus, including a gantry which has a gradient magnetic coil generating a gradient magnetic field to be applied to a subject in a magnetostatic field, a bed which allows a top board, on which the subject is placed, to slide in a longitudinal... Agent: Nixon & Vanderhye, PC

20070268022 - Measurement circuit and test apparatus: There is provided a measurement circuit including a main amplifier that generates a direct voltage in accordance with an input voltage and applies the generated voltage to a device under test, a feedback element that feeds back the direct voltage to the main amplifier and controls the direct voltage generated... Agent: Jianq Chyun Intellectual Property Office

20070268023 - System and method for monitoring temperature inside electric machines: The electric machine comprises at least one winding made of a material having a temperature dependent resistance. The temperature of the winding is monitored using the resistance therein. Temperatures or resistances indicative of a fault can be sensed, and corrective action taken, without the need for dedicated temperature sensors.... Agent: Ogilvy Renault LLP (pwc)

20070268024 - Method for microwave measurement, measuring device and oscillator: An object to be measured is measured using microwave radiation. Oscillation energy is generated by means of a feedback coupled active unit. The solution involves generating resonance into at least one oscillator, each oscillator comprising at least one open resonator, each resonator being coupled to at least one active unit,... Agent: Hoffmann & Baron, LLP

20070268025 - Damage detection system: A damage detection system includes a processor and a transmitter communicatively connected to the processor. The transmitter sends a signal to the processor and the processor is programmed to assign a spatial coordinate to the transmitter. The processor is further programmed to identify a transmitter location as damaged when the... Agent: Wildman Harrold Allen & Dixon LLP And The Boeing Company

20070268026 - Methods and systems for guarding a charge transfer capacitance sensor for proximity detection: Methods, systems and devices are described for determining a measurable capacitance for proximity detection in a sensor having a plurality of sensing electrodes and at least one guarding electrode. A charge transfer process is executed for at least two executions. The charge transfer process includes applying a pre-determined voltage to... Agent: Ingrassia Fisher & Lorenz, P.C. (syna)

20070268027 - Methods and devices for measuring volume resistivity: A device for measuring the volume resistivity of materials and method of measuring are disclosed. The device for measuring has a receptacle of a known volume in which fluid materials, for example powdered or granular materials which may assume the shape of the receptacle, may be placed. The receptacle may... Agent: Traskbritt, P.C./ Alliant Tech Systems

20070268028 - Current fault detection for light emitters: A device includes a light emitter, a current sensing resistance, a current generator, and detection circuitry. The current generator is connected to the light emitter and to the current sensing resistance. During a normal operating mode of the device, the current generator regulates current flow through the light emitter. In... Agent: Avago Technologies, Ltd.

20070268035 - Probe card: The board of a probe card of the present invention comprises a first substrate having a first inclined surface at the side surfaces and a second substrate having a second inclined surface. The first substrate and the second substrate are disposed such that the first inclined surface and the second... Agent: Foley And Lardner LLP Suite 500

20070268033 - Prober and probe contact method: A prober that has improved positional precision of probing without reducing throughput is disclosed. The prober comprises a probe card having a probe, a wafer stage, a stage temperature adjustment mechanism, a wafer stage movement mechanism, a movement control section, and an alignment mechanism that detects the relative position between... Agent: Christie, Parker & Hale, LLP

20070268031 - Wafer probe interconnect system: A wafer probe interconnect apparatus for use in testing a plurality of uncut chips in a semiconductor wafer. The apparatus includes a support block and a dielectric substrate coupled to the support block and supported on a patterned array of posts to inhibit displacement of the dielectric substrate under load.... Agent: Townsend And Townsend And Crew, LLP

20070268034 - Method and apparatus for setting of appliance-specific evaluation parameters: A method and apparatus for setting appliance-specific evaluation parameters in an instrument is disclosed. In one embodiment, a structure is measured using a reference measurement apparatus or a measurement apparatus, and the recorded measurement data is transmitted to the respective other of the two appliances. The measurement data is contained... Agent: Dicke, Billig & Czaja

20070268029 - Probe card and temperature stabilizer for testing semiconductor devices: One aspect of the invention provides an apparatus that includes a probe card having probe needles associated therewith. A temperature stabilizer element is couplable to the probe card. The temperature stabilizer is configured to either raise or lower a temperature of the probe needles to reduce movement of the probe... Agent: Texas Instruments Incorporated

20070268032 - Probe member for wafer inspection, probe card for wafer inspection and wafer inspection apparatus: Provided are a probe member, a probe card and a wafer inspection apparatus, by which a good electrically connected state can be surely achieved, positional deviation by temperature change can be prevented, and the good electrically connected state can be stably retained even when a wafer has a diameter of... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20070268030 - Spatial transformer for rf and low current interconnect: A spatial transformer includes an insulating substrate; a plurality of test terminal assemblies on the substrate; and a plurality of contact surfaces on the transformer, each providing an interconnection point for electrical connection between a respective test terminal assembly and a device under test. Each test terminal assembly has a... Agent: Pearne & Gordon LLP

20070268036 - Integrated systems testing: A hard disk drive system comprises an interface that receives test configuration data, that transmits test result data, and that transmits and receives application data. A system on chip (SOC) includes integrated system test (IST) modules. A memory module communicates with the SOC and includes memory and an IST module.... Agent: Harness, Dickey & Pierce P.L.C

20070268037 - Circuit testing apparatus: The present invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a signal transformation module, a meter, and a logic tester. The signal transformation module is coupled to the device under test and transforms an analog output signal generated by the device... Agent: North America Intellectual Property Corporation

20070268038 - Method for analyzing the reliability of optoelectronic elements rapidly: A method for analyzing the reliability of optoelectronic elements rapidly is described, which has a spectrum analyzer to test and measure NEP and peak of noise power spectrum of the optoelectronic elements at the low frequency. The optoelectronic elements are imposed with the appropriate forward bias and reverse bias to... Agent: Birch Stewart Kolasch & Birch

  
11/15/2007 > patent applications in patent subcategories.

20070262767 - Probing a device: An electronic device is moved into a first position such that terminals of the electronic device are adjacent probes for making electrical contact with the terminals. The electronic device is then moved horizontally or diagonally such that the terminals contact the probes. Test data are then communicated to and from... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070262768 - Fractional sampling of electrical energy: A novel method and device for measuring electrical parameters in an energy meter in an electrical system is described. The novel method samples an electrical energy signal and determines a relevant portion of the sampled electrical energy signal. The relevant portion of the electrical energy signal is then separately multiplied... Agent: Woodcock Washburn LLP

20070262769 - Handler for sorting packaged chips: A handler for sorting semiconductor chips after they have been tested includes a loading unit for loading chips to be tested and an unloading unit for unloading chips that have been already tested. Chips arrive in trays at the loading unit, and a loading picker removes the chips from the... Agent: Ked & Associates, LLP

20070262770 - System and method of magnetically sensing position of a moving component: A position-sensing system magnetically senses the position of a first component moving with respect to a second component. A magnetically hard layer on the first component provides a recording medium. Information is magnetically recorded in regions of the magnetically hard layer. These regions provide a relative encoding scheme for determining... Agent: Guerin & Rodriguez, LLP

20070262771 - Method and system for perpendicular magnetic media metrology: A metrology system for measuring the magnetic properties of a magnetic recording medium layer on a device used for perpendicular recording.... Agent: Caven & Aghevli LLC

20070262772 - Method and apparatus for correcting magnetic flux sensor signals: Apparatus for detecting defects in an oilfield string at a well site as the string is pulled from the well include a plurality of magnetic flux sensors 12 circumferentially spaced about the string, and a plurality of stand-off sensors 14 circumferentially spaced about the string for determining changes in stand-off... Agent: Loren G. Helmreich Browning Bushman P.C.

20070262773 - Integrated set/reset driver and magneto-resistive sensor: A magnetic-sensing apparatus and methods of making and using thereof are disclosed. The sensing apparatus may have one or more magneto-resistive-sensing elements, one or more reorientation elements for adjusting the magneto-resistive-sensing elements, and semiconductor circuitry having driver circuitry for controlling the reorientation elements. The magneto-resistive-sensing elements, reorientation elements and/or semiconductor... Agent: Honeywell International Inc.

20070262774 - Test object for nuclear spin tomographs: A phantom for examination in nuclear spin tomographs comprises at least one test body for abstract imitation of a human or animal body part, and also means for supplying the test body with a liquid during the examination by nuclear spin tomography. Another phantom for examination in nuclear spin tomographs... Agent: Daffer Mcdaniel LLP

20070262775 - Magnetic resonance imaging rf coil decoupling circuit: A RF transmit coil decoupling circuit in a parallel drive configuration comprises a power amplifier and an output matching network to shim the B1 field in response to inhomogeneities therein. The separate coil segments in a transmit array are effectively decoupled from each other despite inherent mutual inductance between coil... Agent: Quarles & Brady LLP

20070262776 - Magnetic resonance imaging magnet assembly system with improved homogeneity: Described herein is a magnet system for use in imaging a volume that includes a main magnet and at least one magnet coil assembly positioned between the main magnet and the imaging volume. A gradient coil assembly including an inner primary gradient coil alone or with the addition of an... Agent: Buckingham, Doolittle & Burroughs, LLP

20070262777 - Magnetic resonance receive coils with compact inductive components: A low profile radio frequency coil (32, 44, 441, 442, 443) for use in a magnetic resonance imaging system includes a low profile antenna (34, 102, 202, 302) that is configured to resonate at about a magnetic resonance frequency of the magnetic resonance imaging system. A generally planar inductor (110,... Agent: Philips Intellectual Property & Standards

20070262778 - Dc test apparatus: An object of the present invention is to provide a DC test apparatus capable of reducing wasteful standby power consumption. The DC test apparatus has a power amplifier circuit 130 for supplying a current to a DUT during a test. The power amplifier circuit 130 is provided with transistors 18... Agent: Patenttm.us

20070262779 - Detection of unbalanced power feed conditions: This invention relates to a method and apparatus for detecting and alarming unbalanced power feed conditions. A Hall effect device is clamped around a pair of power feed conductors. If the currents in the two power feeder conductors are unequal, i.e., unbalanced, this indicates a trouble condition and is alarmed.... Agent: Werner Ulrich

20070262780 - Arc fault detector: An arc fault detector, as a stand alone device or in combination with a circuit interrupting device such as a ground fault interrupter (GFCI), protects from potentially dangerous arc fault conditions. The device utilizes a line side or load side series connected inductance having an air or magnetic core to... Agent: William Collard Collard & Roe, P.C.

20070262781 - Apparatus and method to detect moisture in power generator stator bars: An apparatus for measuring moisture in a solid employs position feedback for an operator adjusted surface probe. This probe position feedback in the form of visual or audio signals allows an operator to more precisely position a surface probe when making such measurements. The visual or audio feedback will allow... Agent: Schmeiser, Olsen & Watts

20070262784 - Arcuate blade probe: An arcuate blade probe is disclosed. The arcuate blade probe includes a shaft with a pair of faces that converge towards each other along a probe axis and terminate at a single edge that includes an arcuate profile. The arcuate profile provides a surface that makes an electrical connection between... Agent: Hewlett Packard Company

20070262782 - Method for compensation for a position change of a probe card: A method for compensation for a position change of a probe card is disclosed. In one embodiment, during the course of a functional test of an integrated circuit which is arranged on a semiconductor wafer includes determination of a temperature of the probe card and matching of the position of... Agent: Dicke, Billig & Czaja

20070262783 - Probing apparatus and probing method: There is provided a probing apparatus capable of modifying an existing probing apparatus having a single loading port to one having dual loading ports while saving the space without increasing a foot print thereof and also capable of increasing an inspection efficiency by cooperating with an automatic transfer line for... Agent: Oblon, Spivak, Mcclelland Maier & Neustadt, P.C.

20070262785 - Semiconductor apparatus and test execution method for semiconductor apparatus: A semiconductor apparatus includes a reset terminal to input a reset control signal to reset an internal circuit, a reset detector to generate a reset clear signal to clear a reset of the internal circuit according to the input reset control signal and a mode capture unit to retain a... Agent: Mcginn Intellectual Property Law Group, PLLC

  
11/08/2007 > patent applications in patent subcategories.

20070257659 - Temperature detection function-incorporating current sensor: A temperature detection function-incorporating current sensor includes a Hall IC, connector terminals for respectively outputting signals, detected by the Hall IC, to the exterior. The Hall IC includes a magnetism detection portion for detecting a magnitude of a magnetic field, a temperature detection portion for detecting an ambient temperature, and... Agent: Sughrue-265550

20070257657 - Current probing system: A current probing system has a current probe and a detachable adapter. The current probe has a probe body with electrically conductive contacts that mate with electrically conductive contacts on the adapter. Leads extend from the adapter for coupling to a current carrying conductor. The leads can connect to a... Agent: William K. Bucher Tektronix, Inc.

20070257658 - Terminator circuit, test apparatus, test head, and communication device: The present invention provides a terminator circuit including a potential variation detecting section that detects a variation in a potential at an end point to which an input signal is supplied, and a first current generating section that reduces an overshoot at the end point which is caused by the... Agent: Osha Liang L.L.P.

20070257660 - Swept-frequency measurements with improved speed using synthetic instruments: A synthetic test system for swept-frequency measurements that has a clock synchronization device to enable test boxes and devices that form the synthetic test system to have a common sense of time when conducting swept-frequency tests.... Agent: Agilent Technologies Inc.

20070257662 - Current probe: A current probe for acquiring a current signal from a current carrying conductor via a current diverting element has a probe body and first and second electrically conductive contacts extending from one end of the probe body for connecting to current diverting element. A current sensing circuit is coupled to... Agent: William K. Bucher Tektronix, Inc.

20070257661 - Current probing system: A current probing system for acquiring a current signal from a current carrying conductor has a current diverting element mounted on the conductor for serially coupling the current signal to a current probe. The current probe has a probe body and first and second electrically conductive contacts extending from one... Agent: William K. Bucher Tektronix, Inc.

20070257663 - Current sensing circuit for use in a current measurement probe: A current sensing circuit has a transformer where a current to be measured induces a magnetic flux into a magnetic core. The magnetic core has a magneto-electric converter for sensing DC to low frequency current signals and a secondary winding for sensing higher frequency current signals. The magneto-electric converter generates... Agent: William K. Bucher Tektronix, Inc.

20070257664 - Wheel end vented through sensor cable: A speed sensor for a wheel end that has an interior that is substantially isolated from an atmosphere around the wheel end. The speed sensor is carried by a housing of the wheel end for monitoring the rotation of the wheel end and indicating the angular velocity of the wheel... Agent: Polster, Lieder, Woodruff & Lucchesi

20070257665 - Rotor for rotation sensor: A rotor for a rotation sensor may be mounted on a bearing that supports a wheel on an automotive vehicle so that it can detect the number of revolutions for the wheel. The rotor for a rotation sensor 1 includes a reinforcing ring 2 formed like an L-shape in cross... Agent: Wenderoth, Lind & Ponack, L.L.P.

20070257666 - Method and device for the detection of the separation of an electronic module from a vehicle to which it is mounted: A method of detecting the separation of an electronic module (1) from a vehicle on which the module is mounted. According to this method, the module (1) has associated with it an inductance (17) inseparable from the module, the inductance (17) and the associated module (1) are connected to an... Agent: Young & Thompson

20070257667 - Position sensors and arrays utilizing back emf: A non-contact position sensor comprises a first reactive element for accepting radio frequency (RF) energy from an oscillator and radiating said RF energy to generate an excitation flux. A second reactive element intercepts the excitation flux and an RF voltage is induced therein. An RF voltage detector, operatively coupled to... Agent: Delphi Technologies, Inc.

20070257668 - Pulsar ring for magnetic rotary encoder: A magnetized layer (12) is integrally bonded to an annular holder (11) installed to a rotating body, the magnetized layer is made of a material obtained by mixing a magnetic fine particle to a rubber elastic material or a synthetic resin material and magnetized in a multipolar manner at a... Agent: Jacobson Holman PLLC

20070257669 - Micromagnetometer of the fluxgate type with improved excitation coil: The invention relates to a fluxgate micromagnetometer implemented in thin layers, fitted with at least one excitation coil with an arrangement and a structure that bring improvements particularly in terms of the magnetometer footprint, reduction in the “offsets” of measurements taken by the magnetometer, common mode rejection.... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070257670 - Multi-channel low loss mri coil: A coil array for use in magnetic resonance imaging (MRI) is provided and comprises a plurality of low loss coil elements and at least one non-conducting substrate containing adapted to position the plurality of low loss coil elements in a fixed position thereon. Further, a coil array assembly for use... Agent: General Electric Company Global Research

20070257671 - Ssfp mri with increased signal bandwidth: Disclosed is a wideband SSFP, wherein a standard balanced SSFP MRI sequence is played with repetition times of alternating lengths, TR and TRS, where TRS<TR. The result is significantly improved tradeoff between signal bandwidth and available acquisition interval lengths. This is particularly important as it enables the combination of balanced... Agent: Beyer Weaver LLP

20070257672 - Method and apparatus for generation of magnetization transfer contrast in steady state free precession magnetic resonance imaging: Apparatus and methods of generating magnetization transfer contrast images in which signal to noise ratios are improved and/or in which image acquisition times are reduced. In certain embodiments, apparatus and methods which utilize sensitivity and/or non-sensitivity to magnetization transfer effects to improve the contrast of images which are generated. In... Agent: Joyce Von Natzmer Pequignot + Myers LLC

20070257673 - Nmr probe for high-temperature measurements: An NMR probe for high-temperature NMR measurements includes tubular heating means mounted respectively immediately below and immediately above an area to be measured. A sample tube is inserted inside the tube formed by the two heating means. A sample placed in the sample tube is heated. Heat from the two... Agent: The Webb Law Firm, P.C.

20070257675 - Cooled nmr probe head which can be coupled: A magnetic resonance (MR) probe head comprises a detecting device (3) with at least one antenna system which is cryogenically cooled by a cooling device, a cooled preamplifier (16) in a preamplifier housing (15a, 15b) which is spatially separated from the detecting device (3), and a thermally insulating connecting means... Agent: Kohler Schmid Moebus

20070257676 - Cooled nmr probe head with flexible cooled connecting conduit: A magnetic resonance (MR) probe head comprises a detecting device (3) with at least one antenna system which is cryogenically cooled by a cooling device, and a cooled preamplifier (16) in a preamplifier housing (15a) which is spatially separated from the detecting device (3), and a thermally insulating connecting means... Agent: Kohler Schmid Moebus

20070257674 - Magnetic resonance coil system: A magnetic resonance coil system 18 allows for the use of modular components and which in one embodiment is particularly well-suited for use with small animals and includes an animal receiving apparatus 202, a transmit coil module 204, and a receive coil module 206. The receive coil module 206 includes... Agent: John F. Fry Driggs, Hogg & Fry Co., L.p.a.

20070257677 - Apparatus and method for measuring micro-resistivity anisotropy: A method for measuring anisotropy in thin-bed formations calls for placing a logging tool into a borehole in the formation and applying current to at least one set of injection electrodes and at least one set of return electrodes to measure resistivity in the formation. Resistivity measurements are used to... Agent: Cantor Colburn LLP- Baker Atlas

20070257679 - method and apparatus for a multi-component induction instrument measuring system for geosteering and formation resistivity data interpretation in horizontal, vertical and deviated wells: An improved induction tool for formation resistivity evaluations. The tool provides electromagnetic transmitters and sensors suitable for transmitting and receiving magnetic fields in radial directions that are orthogonal to the tool's longitudinal axis with minimal susceptibility to errors associated with parasitic eddy currents induced in the metal components surrounding the... Agent: Madan, Mossman & Sriram, P.C.

20070257678 - Method and apparatus for tensorial micro-resistivity imaging in oil-based muds: An unfocused resistivity imaging device horizontal and vertical currents conveyed into the borehole. Pad mounted electrodes are used to make voltage measurements in orthogonal directions. The voltage measurements are then rotated to give principal resistivity measurements in an anisotropic formation with dipping beds.... Agent: Madan, Mossman & Sriram, P.C.

20070257680 - Relay testing system and method: A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored... Agent: Conley Rose, P.C.

20070257681 - Method and apparatus for in-situ characterization of energy storage and energy conversion devices: Disclosed are methods and apparatuses for determining an impedance of an energy-output device using a random noise stimulus applied to the energy-output device. A random noise signal is generated and converted to a random noise stimulus as a current source correlated to the random noise signal. A bias-reduced response of... Agent: Battelle Energy Alliance, LLC

20070257682 - Potential sensor: A potential sensor including first and second detection electrodes opposed to an object of which a potential is to be measured, and a movable shutter so positioned between the detection electrodes and the potential-measured object with gaps thereto; wherein the movable shutter can assume a first state and a second... Agent: Fitzpatrick Cella Harper & Scinto

20070257683 - Protection circuit for semiconductor device and semiconductor device including the same: A protection circuit comprises: at least one shielded line arranged to cover an area to be protected over a semiconductor device, the at least one shielded line having only one route from a start point to an end point; a signal generator for applying a signal to the start point... Agent: Mcdermott Will & Emery LLP

20070257684 - Monitor for evaluating changes in water quality: Included is a device for monitoring a test material. The device can include a probe configured for introduction to the test material. The probe can include a first electrode and a second electrode, where the first electrode can be positioned a predetermined distance from the second electrode. The device can... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20070257685 - Probe and probe card: The objective of present invention is to obtain high positioning accuracy while securing moving space for a probe positioned by insertion into a through-hole. For this reason, a probe having a perpendicular portion where a lower face contacts an electrode, and a beam formed in a horizontal direction from a... Agent: Masuvalley & Partners

20070257686 - Integrated circuit probe card analyzer: Methods and apparatus for use in analyzing probe cards are provided. For some embodiments, chucks with particular materials selected to achieve desired properties, such as improved conductivity, robust viewing windows, and the like, are provided. For other embodiments, useful features, such as force measurements for probe pins may be provided.... Agent: Patterson & Sheridan, L.L.P.

20070257687 - Methods of using a blade probe for probing a node of a circuit: A method of using a blade probe for probing a node of a circuit where the node includes a pad surface surrounding a node hole is disclosed. A probe having a longitudinal probe axis, a shaft, and a probe blade is provided. The shaft is generally concentric to the longitudinal... Agent: Hewlett Packard Company

20070257689 - High density thermally matched contacting probe assembly and method for producing same: A method to fabricate a high density, minimal pitch, thermally matched contactor assembly to maintain electrical contact with contact regions on fully processed semiconductors, preferably while still in wafer form, and throughout a range of temperatures. A guide plate and a contactor assembly for such use, comprising a substrate formed... Agent: David Aker

20070257688 - Systems configured for utilizing two or more of multiple different semiconductor component configurations, methods of providing semiconductor components within sockets, and methods of retaining semiconductor component configurations within sockets: The invention includes methods of utilizing removable mechanical precising mechanisms and/or optical-based precising mechanisms to align chips within sockets. The sockets can be configured so that compression of the sockets opens a clamping mechanism. A chip can be placed within a socket with a manipulator and aligned during compression of... Agent: Wells St. John P.s.

20070257691 - Electrical connector assembly: An electrical connector assembly includes a socket (10), spring contacts on the socket, a supporting circuit plate (12), a plurality of capacitor components (13) on the supporting circuit plate, and an integrated circuit package (2) having power delivery lands. The spring contacts includes certain power delivery spring contacts (11) for... Agent: Wei Te Chung Foxconn International, Inc.

20070257690 - Low profile electronic assembly test fixtures and methods: Low profile printed circuit board assembly test fixtures and methods are disclosed, the fixtures mountable at a tester having a plurality of conductive interface contacts. The fixture includes a low profile mount defined by a frame having an interface bed at one end and a dynamic plate movably positioned at... Agent: The Law Firm Of Harris & Burdick Harold Burdick And Robert Harris

20070257692 - Probe: A probe, wherein a beam 3 is cantilevered by a supporter 2 with a predetermined space from a probe substrate 1, and a contact 4 extending in a direction away from the probe substrate 1 is attached to the beam 3. A projection 5 extending toward the probe substrate 1... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070257695 - Defect inspection device: An inspecting method comprises the following steps. A plurality of defect inspection devices is formed on a wafer. Each defect inspection device comprises an insulating layer and a conductive layer stacked over the insulating layer. A defect inspection parameter is set and the wafer is scanned with an electron beam... Agent: Jianq Chyun Intellectual Property Office

20070257693 - Interface test circuit: An integrated circuit is described. The integrated circuit includes an interface circuit that includes a transmitter and a receiver. A generator in the integrated circuit is selectively coupled to the transmitter. The generator is to provide a test sequence that is output by the transmitter during a test mode of... Agent: Morgan Lewis & Bockius LLP/rambus Inc.

20070257694 - Parallel scan distributors and collectors and process of testing integrated circuits: An integrated circuit (70) having parallel scan paths (824-842, 924-942) includes a pair or pairs of scan distributor (800,900) and scan collector (844,944) circuits. The scan paths apply stimulus test data to functional circuits (702) on the integrated circuit and receive response test data from the functional circuits. A scan... Agent: Texas Instruments Incorporated

20070257697 - On-chip frequency degradation compensation: Embodiments of the invention include a trio of reliability oscillators. In one embodiment, an on-chip frequency compensation circuit includes a selectively enabled reliability oscillator to generate a reference oscillating signal, a clocked reliability oscillator to generate an AC degraded oscillating signal, and a static reliability oscillator to generate a DC... Agent: Intel/blakely

20070257696 - Predictive, adaptive power supply for an integrated circuit under test: A main power source supplies current through path impedance to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal temporarily increases following edges of a clock signal applied to the DUT during a test as transistors within the... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070257698 - Angle adjusting device and display module testing apparatus using the same: An exemplary device (27) for adjusting angle of a base plate (2710) includes: two side walls (21) being parallel to and spaced apart from each other, each of the side walls including a pivot hole (217); a base plate disposed between the two side walls and pivotally attached to the... Agent: Wei Te Chung Foxconn International, Inc.

  
11/01/2007 > patent applications in patent subcategories.

20070252575 - Accumulated current counter and method thereof: An accumulated current counter (11) includes a sense resistor (30) configured for being coupled in series between an electronic circuit (13) and a power source (12). The sense resistor is further for use in sensing a voltage (VIN(i)) across the sense resistor as a function of a current (Ibatt) provided... Agent: Freescale Semiconductor, Inc. Law Department

20070252576 - Methods and apparatus for testing power generators: A method for testing a generator including a plurality of phase groups is provided. The method includes electrically isolating a first phase group from remaining phase groups by substantially encapsulating at least a portion of a plurality of stator bars electrically coupled together within the first phase group with an... Agent: John S. Beulick Armstrong Teasdale LLP

20070252577 - Current sensor: A current sensor comprises a magnetic module, whereby a primary conductor, a compensating winding and a magnetic field probe are magnetically coupled to each other. The primary conductor carries a current to be measured, with a driving circuit, for producing a triangular current, injected into the compensating winding. An evaluation... Agent: Baker Botts L.L.P. Patent Department

20070252578 - Electrical measuring instrument having detachable current clamp: A current clamp meter having a current meter body and a detachable current clamp. The current meter body and the current clamp are configured so that the current clamp is detachable from the current meter body and the meter is operable with the current clamp either attached to the current... Agent: Dorsey & Whitney LLP Intellectual Property Department

20070252579 - Electrical measuring instrument having detachable current clamp: A current clamp meter having a current meter body and a detachable current clamp. The current meter body and the current clamp are configured so that the current clamp is detachable from the current meter body and the meter is operable with the current clamp either attached to the current... Agent: Kimton N. Eng, Esq. Dorsey & Whitney LLP

20070252580 - Probe for measuring characteristics of an excitation current of a plasma, and associated plasma reactor: A probe for measuring electrical characteristics of an excitation current of a plasma is provided. The probe is mounted on a conductive line that includes an inner conductor and an outer conductor. The probe includes a current sensor and a voltage sensor. The current sensor includes a grove formed in... Agent: Pauley Petersen & Erickson

20070252583 - Semiconductor integrated circuit device, measurement method therefore and measurement system for measuring ac characteristics thereof: Disclosed is an AC characteristics measurement system that includes a flip-flop arranged in a loop of a ring oscillator; a clock generating circuit that receives a signal propagated in said loop of said ring oscillator and generates a clock signal to be supplied to said flip-flop; a delay adjustment circuit... Agent: Mcginn Intellectual Property Law Group, PLLC

20070252584 - Electric power controller for vehicle mounting: In an electric power controller for vehicle mounting, an input voltage supplied through a harness and a threshold value are compared, and the input voltage applied to load is interrupted when the input voltage is smaller than the threshold value. The electric power controller for vehicle mounting includes a voltage... Agent: Osha Liang L.L.P.

20070252581 - Method and apparatus for testing power switches using a logic gate tree: A method for testing power switches using a logic gate tree, the method comprises providing a logic gate tree electrically connected to a plurality of power switches, each output node of the plurality of power switches being electrically connected to a corresponding input node of a logic gate of the... Agent: North America Intellectual Property Corporation

20070252582 - Test probe having modular components: A test probe. The test probe includes an interconnect module configured to connect to a modular, replaceable wireless module, a connect module configured to communicate with a communication network and the wireless module, an identification module configured to receive and transmit an identification of the test probe, an audio module... Agent: Agilent Technologies Inc.

20070252586 - Instrument and method for measuring three-dimensional motion: An instrument (10) for measuring three-dimensional motion in a living body comprises a plurality of magnetism generators (12i) fixed to one of at least two objects (44, 46) moving relatively in the living body, a plurality of magnetic field sensors (14j) fixed to the other object in order to perform... Agent: Sughrue Mion, PLLC

20070252587 - Method for determining the rotor position of a synchronous machine: To enhance the measuring accuracy of the method, the invention provides that prior to the first test pulse Imeas1, a bias pulse Ibias whose polarity is inverted in relation to the first pulse Imeas1 is generated, with the switch-on times t1 of the associated voltage pulses Ubias and −Umeas1 being... Agent: Continental Teves, Inc.

20070252585 - Rotary position sensor with rectangular magnet and hall sensors placed within the surface of the magnet: A rotary position sensor apparatus includes a magnet having a surface and a plurality of Hall components placed within the surface of the magnet. The Hall components are located on a neutral axis of the magnet thereby forming a rotary position sensor apparatus having an enhanced linearity, a reduced calibration... Agent: Bryan Anderson Honeywell International Inc.

20070252588 - Gmr magnetic sensing element having an antiferromagnetic layer extending beyond the track width and method for making the same: A magnetic sensing element with improved magnetic detection output and a method for making the same are provided. In the magnetic sensing element, the length of an upper pinned magnetic layer an upper antiferromagnetic layer in a track width direction is larger than the length of a free magnetic layer... Agent: Brinks Hofer Gilson & Lione

20070252589 - Apparatus detecting relative body movement: The invention relates to a measuring device for detecting a body moving in relation to an, in particular, tubular container. Said device comprises at least one magnet unit which generates a magnetic field, measures this magnetic field and which is assigned to the container and/or to the magnetic body. The... Agent: Conley Rose, P.C. David A. Rose

20070252590 - Rotational angle detector: A rotational angle detector for detecting the absolute value of a rotational angle of a rotor. The rotational angle detector includes a drive gear integrally rotatable with the rotor and first and second driven gears mated with the drive gear. First and second magnetic sensors detect the rotational angles of... Agent: Crompton, Seager & Tufte, LLC

20070252591 - Through the hole rotary position sensor: A through the hole rotary position sensor which incorporates a single ring magnet with a central aperture is disclosed. The rotating shaft whose angular position is to be sensed is adapted to be received in the central aperture. The through the hole rotary position sensor in accordance with the present... Agent: Siemens Corporation Intellectual Property Department

20070252592 - System and method to measure parameters distribution in sheet-like objects: A measuring device and method are disclosed for parameter distribution measurement over the entire surface of sheet-like objects. The parameters of primary interest are thickness and permeability profiles. The device includes a parameter measuring unit a coordinate measuring unit and a synchronization unit to control operation of the parameter measuring... Agent: Nadejda Reingand

20070252593 - Ultrasensitive magnetoelectric thin film magnetometer and method of fabrication: An ultrasensitive room temperature magnetoelectric thin film magnetometer is fabricated on a cantilever beam and includes an active magnetoelectric multilayer structure having a plurality of thin films formed at a region defined on the cantilever beam. Upon application of a magnetic field, the active magnetoelectric structure generates a corresponding response... Agent: Rosenberg, Klein & Lee

20070252594 - Magnetic sensor with needle-shaped detecting part: A magnetic sensor has a needle-shaped detecting part. The needle-shaped detecting part includes a substrate cut to have a needle shape, at least one MR element formed on the substrate, at least two lead conductors formed on the substrate, one end of the conductor being electrically connected to at least... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070252596 - Method and apparatus for analyzing sample utilizing nuclear magnetic resonance under terahertz-wave irradiation: The nuclear magnetic resonance spectrum of a sample, which is a target material analyzed, and changes in relaxation times of nuclear magnetic resonance signals are measured while the sample is irradiated with terahertz waves containing frequency components corresponding to peak portions of absorption or reflectance spectrum of the sample. On... Agent: Fitzpatrick Cella Harper & Scinto

20070252595 - Direct imaging of neural currents using ultra-low field magnetic resonance techniques: Using resonant interactions to directly and tomographically image neural activity in the human brain using magnetic resonance imaging (MRI) techniques at ultra-low field (ULF), the present inventors have established an approach that is sensitive to magnetic field distributions local to the spin population in cortex at the Larmor frequency of... Agent: Ortiz & Lopez, PLLC

20070252597 - Magnetic resonance spectroscopy with sparse spectral sampling and interleaved dynamic shimming: The present invention relates to a magnetic resonance spectroscopic imaging (MRSI) method, specifically to a magnetic resonance spectroscopic imaging method with up to three spatial dimensions and one spectral dimension. Interleaving dynamically switched magnetic field gradients into the spectroscopic encoding scheme enables multi-region shimming in a single shot to compensate... Agent: Stefan Posse

20070252598 - Methods and apparatus for mri shim elements: A MRI shim element includes a plurality of thin wires extending substantially parallel to each other wherein each wire has cross sectional dimensions less than δsk, wherein δsk is the wire's skin depth.... Agent: Fisher Patent Group, LLC

20070252599 - Circuit interrupter including manual selector selecting different point-on-wave switching characteristics: A circuit breaker includes a plurality of independent poles. Each of the independent poles includes separable contacts, sensors structured to sense a current and a voltage operatively associated with the separable contacts, and a magnetically actuated actuator structured to open and close the separable contacts. A manual selector, such as... Agent: Martin J. Moran, Esq. Eaton Electrical, Inc.

20070252600 - Diagnosis method for state-of-health of batteries: A diagnosis method for SOH of batteries includes the steps of: providing data of discharge voltages and currents of a battery unit; setting an acceptable value of a predetermined period of time and an acceptable range of variation rate of discharge current for the battery unit; calculating variation rates of... Agent: Bacon & Thomas, PLLC

20070252601 - Method for determining deterioration of accumulator battery, method for measuring internal impedance of secondary battery, equipment for measuring internal impedance of secondary battery, equipment for determining deterioration of secondary battery, and p: A method for determining the deterioration of an accumulator battery, hooked up with loads in a system, based on the result of measuring internal resistances of an accumulator battery, the method including predetermining a temperature at which the deterioration of the accumulator battery is determined, calculating temperature correction coefficients, predetermining... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070252602 - Test circuit and test method: The test circuit according to the present invention includes: a plurality of light-receiving elements; a plurality of amplifiers, each of which converts, into a voltage, a photoelectric current supplied from one of the light-receiving elements; and an electric current supplying unit which supplies an electric current to each of the... Agent: Greenblum & Bernstein, P.L.C

20070252603 - Systems, devices, and methods for arc fault detection: Certain exemplary embodiments can comprise an arc fault detection circuit. The arc fault detection circuit can comprise a zero crossing analysis sub-system comprising a counter configured to determine, for a first waveform, a count of dips that occur between a pair of predetermined zero crossings of a second waveform. The... Agent: Siemens Corporation Intellectual Property Department

20070252604 - Inspection apparatus and inspection method: An inspection apparatus including a transmission line for propagating an electromagnetic wave; an electromagnetic wave supply unit for supplying a terahertz wave to the transmission line; an electromagnetic wave detection unit for detecting the terahertz wave from the transmission line; a conductive region; an inspection object supply unit; and a... Agent: Fitzpatrick Cella Harper & Scinto

20070252607 - Method of manufacturing circuit module, collective board for circuit module, and circuit module manufactured by the method: A method of manufacturing a circuit module having a low price and good productivity, a collective board for the circuit module, and a circuit module manufactured by the method are provided. In the method of manufacturing the circuit module of the invention, when performing a burn-in test, a collective board... Agent: Beyer Weaver LLP

20070252608 - Contactor and test method using contactor: A contact terminal formed of an electrically conductive material is arranged in each of a plurality of holed of a contactor substrate. An electrically conductive part is formed on an inner surface of each hole. The contact terminal has a first contact part that contacts a terminal of an electronic... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070252605 - Interface for detection and control of multiple test probes: An interface module. The interface module includes a probe identification module configured for connection to an identification bus, a probe detect module configured for connection to a detect-control bus, a power control module configured for connection to the detect-control bus, a control and data module configured for connection to a... Agent: Agilent Technologies Inc.

20070252606 - Shielded probe apparatus for probing semiconductor wafer: A shielded probe apparatus is provided with a shielded probe and a tri-axial cable that are electrically connected within a shielded chassis. The shielded probe apparatus is capable of electrically testing a semiconductor device at a sub 100 fA operating current and an operating temperature up to 300° C.... Agent: Dorsey & Whitney LLP Intellectual Property Department

20070252609 - Bga package holder device and method for testing of bga packages: An apparatus for supporting BGA packages for one or more testing processes is disclosed. The apparatus includes a substrate member. The substrate member has a plurality of contact pads, with each of the contact pads being spatially disposed around a peripheral region of the substrate. The apparatus further includes a... Agent: Townsend And Townsend And Crew, LLP

20070252610 - Containment of a wafer-chuck thermal interface fluid: A method comprises circulating a heat transferring fluid in a substantially closed system including an interstice between a wafer and a chuck at a first pressure. The method further comprises pumping the fluid out of the interstice and increasing the pressure of the fluid to a second pressure. The method... Agent: Greenblum & Bernstein, P.L.C

20070252611 - Semiconductor wafer having a dielectric reliability test structure, integrated circuit product and test method: A semiconductor wafer includes a dielectric test structure including a voltage line, a control line, and a plurality of test devices connected in parallel to the voltage line and the control line. Each test device includes a voltage-controlled resistor connected to the control line and a dielectric device, the dielectric... Agent: Davidson, Davidson & Kappel, LLC

20070252612 - Ball grid array connection monitoring system and method: A system for monitoring the connection on an integrated circuit ball grid array (BGA) comprises a connection indicator circuit coupled to at least one monitor pin of the BGA and configured to detect a pin connection failure of the BGA based on a signal change associated with the at least... Agent: Hewlett Packard Company

20070252613 - Universal cmos device leakage characterization system: The invention provides a universal leakage monitoring system (ULMS) to measure a plurality of leakage macros during the development of a manufacturing process or a normal operation period. The ULMS characterizes the leakage of both n-type and p-type CMOS devices on the gate dielectric leakage, the sub-threshold leakage, and the... Agent: International Business Machines Corporation Dept. 18g

20070252614 - Display device and method of testing sensing unit thereof: A display device includes first and second display signal lines, pixels, first and second sensing signal lines, first through fourth test lines for transmitting first through fourth test signals, a first switching element connected to the first and second test lines, and the first sensing signal line, second switching elements... Agent: Cantor Colburn, LLP

Previous industry: Electricity: power supply or regulation systems
Next industry: Electronic digital logic circuitry


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