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Electricity: measuring and testing September archived patents by title, number, class 09/07

20070222427 - State grasp device, and switching control device of power switching apparatus employing the state grasp device: A state grasp device that needs no optical adjustment, and can be downsized. An exciting current waveform of an opening electromagnetic coil of an electromagnetic operating set functioning to drive a moving contact of a switching device includes an inflection point appearing subsequently to a maximum value, the inflection point... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070222428 - High performance miniature rf sensor for use in microelectronics plasma processing tools: A high-performance miniature RF sensor that maintains gain, directivity, and isolation in a miniature package. The miniature RF sensor includes stacked current and voltage pickups disposed in a PCB construction, the sensor further including quarter wave transforming filter, triaxial shielding, and skin-effect filtering.... Agent: Marjama & Bilinski LLP

20070222430 - Digital trigger: An improved digital trigger circuit has a plurality of data samples extracted from an input electrical signal for each sample clock cycle. The plurality of data samples are compared in parallel with a high threshold level and a low threshold level which provides hysteresis for noise rejection. Also the plurality... Agent: Thomas F. Lenihan Tektronix, Inc.

20070222429 - No dead time data acquisition: A “no dead time” data acquisition system for a measurement instrument receives a digitized signal representing an electrical signal being monitored and generates from the digitized signal a trigger signal using a fast digital trigger circuit, the trigger signal including all trigger events within the digitized signal. The digitized signal... Agent: Thomas F. Lenihan Tektronix, Inc.

20070222431 - Spectrum analyzer having a resolution filter that can be adjusted via phase-variation parameter: A spectrum analyzer is described which comprises a mixer for mixing the conjugate complex input signal v*(t) into a base band signal x(t), and a resolution filter for narrow-band filtering the base band signal. The resolution filter has a complex, discrete impulse response using a variation parameter k0 set to... Agent: Ditthavong & Mori

20070222432 - Appliance terminal: An appliance terminal for connecting external lines to an electrical appliance is disclosed. A current transformer module comprising a current transformer is integrated into the appliance terminal, wherein inputs of the current transformer are connected to customer-side terminal connections of the electrical appliance and outputs of the current transformer may... Agent: Barley Snyder, LLC

20070222433 - Sensor array for nuclear magnetic resonance imaging systems and method: The present invention generally provides improved devices, systems, and methods for measuring materials with NMR and/or MRI. Exemplary embodiments provide a sensor array for NMR mapping of the material. For example tissue can be measured with the sensor array mounted on a probe body having a distal portion which can... Agent: Townsend And Townsend And Crew, LLP

20070222434 - Determining the position of the rotor in an electric motor: Device for determining the position of the rotor in an electric motor comprises a detector, which is mounted on the electric motor and which is sensitive to the passage of the rotor through a reference position, and comprises a phase-locking loop, which can be synchronized with the output signal of... Agent: Bsh Home Appliances Corporation Intellectual Property Department

20070222436 - Method and apparatus inspecting pipelines using magnetic flux sensors: The method for detecting stress corrosion cracking (SCC) of pipelines, comprising the steps of: identifying pipeline locations and pipeline conditions that are amenable to inspection by a magnetic flux inline tool and by a TFI tool; performing two inspections on the pipeline, one inspection performed using the magnetic flux inline... Agent: Nixon & Vanderhye P.C.

20070222437 - Device for locating metallic objects and methods for adjusting such a device: The present invention also relates to a method for operating a device of this type, in particular a method with which the adjustment of a voltage U induced in a receive coil (112, 114; 212, 214) takes place by connecting an adjustment turn system (113, 115; 213′, 215′) to the... Agent: Michael J. Striker

20070222438 - Electromagnetic flaw detection apparatus for inspection of a tubular: An electromagnetic flaw detection apparatus for inspection of a tubular has a frame, a first electromagnetic field generator connected to the frame, a second electromagnetic field generator connected to the frame on an opposite side of the tubular from the first electromagnetic field generator, first and second sensors positioned with... Agent: Egbert Law Offices

20070222439 - Eddy current array probes with enhanced drive fields: Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating... Agent: General Electric Company Global Research

20070222440 - Induced magnetic field detecting apparatus and an induced magnetic field detecting method: The induced magnetic field detecting apparatus of the present invention is configured so as to irradiate laser light onto an inspection target from the same side as the side on which a pickup coil for magnetic field detection is disposed and be able to perform irradiation of the laser light... Agent: Ratnerprestia

20070222441 - Magnetic sensor element and electronic directional measureing device: A magnetic sensor element of a flux gate type comprising a magnetism sensitive part (8a) formed by winding a coil (3) around a magnetic core layer (8), and magnetism collective part (8b) for guiding magnetic fluxes to the magnetism sensitive part (8a). Respective central parts of the magnetism collective part... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070222442 - Continuous moving-table mri involving contrast manipulation and/or updat of scanning parameters: A continuous table motion magnetic resonance imaging system includes a processor (70) for determining values of scan parameters including at least a subject velocity, a field of view length in the direction of the table velocity, and a preparation sequence time. The acquisition includes performing one or more preparatory operations... Agent: Philips Intellectual Property & Standards

20070222443 - Correction of nmr artifacts due to axial motion and spin-lattice relaxation: NMR spin echo signals are corrected for axial motion of the borehole logging tool. The correction is applied to an averaged echo train using an average velocity determined from surface measurements over the duration of averaging of the echo trains. An additional correction may be applied to correct for excess... Agent: Madan, Mossman & Sriram, P.C.

20070222444 - Method and apparatus for high signal-to-noise ratio nmr well logging: A method for measuring nuclear magnetic properties (NMR) properties of a formation, the method including applying a magnetic field to nuclei of the formation during a polarizing interval, the magnetic field having a polarizing intensity; changing the magnetic field to a measurement intensity, the measurement intensity applied to the nuclei... Agent: Cantor Colburn LLP- Baker Atlas

20070222445 - Magnetic resonance imaging using adaptive phase encoding gradient: Through modification of the phase-encoding gradient, a method and apparatus increases the effectiveness of a Magnetic Resonance Imaging (MRI) device by decreasing scan time without noticeably decreasing the signal-to-noise ratio. In an MRI device, a patient is subjected to a constant magnetic field, and then radio frequency (RF) pulses are... Agent: Nixon Peabody, LLP

20070222446 - Characterization of receiver demodulation for correcting off-axis mr imaging degradation: A calibration procedure is performed prior to an off-axis MR scan to measure the MRI system timing errors in applying a frequency modulation waveform to the system receiver. Phase errors which otherwise occur when performing non-Cartesian scans are either prospectively reduced by offsetting the timing error or retrospectively offset by... Agent: Quarles & Brady LLP

20070222448 - Parametric nuclear quadrupole resonance spectroscopy system and method: A system and method for probing a specimen to determine one or more components by utilizing a first signal to excite the specimen at a nuclear quadrupole resonant frequency and observing changes in a specimen property. One exemplary property may be dielectric constant. Another exemplary property may be magnetic permeability.... Agent: James Richards

20070222447 - System and method for magnetic resonance imaging: The invention relates to a system and method for magnetic resonance (MR) imaging. In order to provide a magnetic resonance imaging system and method which allows an optimal timing of the imaging sequence at minimal procedure cost, a magnetic resonance imaging system and method is proposed, wherein a first MR... Agent: Philips Intellectual Property & Standards

20070222449 - Method of effecting nuclear magnetic resonance experiments using cartesian feedback: In nuclear magnetic resonance experiments, Cartesian electronic feedback is used to reduce substantially in transmission and/or reception the deleterious effects of sample-mediated and direct interactions between coils in an array of transmitting and/or receiving coils. The feedback is also used with single or multiple coils to maintain at essentially constant... Agent: Ade & Company

20070222450 - System for magnetic resonance imaging assisted surgery: A system and method for magnetic resonance imaging assisted surgery. The system includes an antenna support assembly and an antenna that are used to acquire real time images of the surgical site that may be used by a surgeon to more accurately perform the surgical procedure. The method comprises acquiring... Agent: Lerner, David, Littenberg, Krumholz & Mentlik

20070222451 - Method and apparatus for shimming a magnetic field: An apparatus for shimming the magnetic field generated by a magnet arrangement of a magnetic resonance imaging (MRI) system, has a number of shim devices of substantially similar cross-sectional dimensions, at least some of the shim devices exhibiting differing ferromagnetic characteristics. A structure body has an elongate, tubular channel cross-sectionally... Agent: Schiff Hardin, LLP Patent Department

20070222452 - Game information system and game information device: The present invention provides a game information device or a system which allows even users having mobile phones of different types from each other to receive a uniform service respectively. A game information device which is configured to include a plurality of communication devices which respectively correspond to various types... Agent: Snider & Associates

20070222453 - Magnetic head for conductivity imaging for use in boreholes: A sensor for performing micro-conductivity measurements during well logging measurements in a borehole includes a magnetic core having a conductive insert wherein windings are driven with alternating current. Some embodiments include a sensor further having a conductive case. Various aspects of the sensor, such as dimensions and conductive properties of... Agent: Cantor Colburn LLP- Baker Atlas

20070222454 - Method and device for the operation of an exhaust gas analyzing sensor cell: The invention relates to a method and a device for operating a sensor cell (1) that is used for analyzing exhaust gas. The aim of the invention is to create a method and a corresponding device which supply reliable test results in each mode of operation of a sensor, also... Agent: Cohen, Pontani, Lieberman & Pavane

20070222455 - Fixture characteristic measuring device, method, program, recording medium, network analyzer, and semiconductor test device: There are measured characteristics of a jig (fixture) used to calculate and measure circuit parameters of a device under test. There is provided a jig characteristic measuring device which measures the jig characteristics of a jig 3 which includes signal lines 3a, 3b, 3c, and 3d used to connect a... Agent: Greenblum & Bernstein, P.L.C

20070222456 - Nanoscale fault isolation and measurement system: Disclosed is a fault isolation and measurement system that provides multiple near-field scanning isolation techniques on a common platform. The system incorporates the use of a specialized holder to supply electrical bias to internal circuit structures located within an area of a device or material. The system further uses a... Agent: Frederick W. Gibb, Iii Gibb & Rahman, LLC

20070222457 - Method and system for non-destructive evaluation of conducting structures: Method and system for non-destructive evaluation for a conducting structure by measuring the electrical impulse response thereof including applying a PRBS test input signal to the conducting structure, detecting an output signal from the conducting structure and processing the data to assess the condition of the conducting structure via changes... Agent: Epstein & Gerken

20070222458 - Method and measurement apparatus for determining the transition impedance between two parts of a subdivided neutral electrode: A method and a measurement apparatus are provided for determining the transition impedance between two electrode parts of a subdivided neutral electrode used in high-frequency surgery. These makes it possible for the purely capacitive component of the transition impedance to be measured. For this purpose a resonant-frequency shift is measured,... Agent: Akin Gump Strauss Hauer & Feld L.L.P.

20070222459 - Clearance measurement systems and methods of operation: A method is provided and includes exciting a sensor with an incident signal and generating a reflected signal by reflecting the incident signal from the sensor. The incident signal and the reflected signal interfere to form a standing wave. The method also includes processing the signals to determine a sensed... Agent: General Electric Company Global Research

20070222460 - Mobile apparatus capable of surface measurements: The present invention relates to a mobile apparatus and/or system that measures the thickness at one or more locations of a surface on at least a part of a substrate and methods of using said apparatus and/or system. The mobile apparatus and/or system in one embodiment includes an apparatus and/or... Agent: Kilpatrick Stockton LLP

20070222461 - Circuit configuration for inductive displacement measurement: A circuit configuration for inductive displacement measurement using a sensor whose inductance changes as a function of the displacement to be measured, and having an evaluation circuit to which the sensor is connected. The sensor is connected between a first operational amplifier and a series connection of a second operational... Agent: Kenyon & Kenyon LLP

20070222462 - Capacitive distance sensing in semiconductor processing tools: A wireless sensor includes at least one capacitive plate for sensing a distance relative to an object of interest within a semiconductor-processing environment. The sensor includes an internal power source and wireless communication such that distance and/or parallelism measurements effected using the capacitive plate(s) can be provided wirelessly to an... Agent: Christopher R. Christenson Westman, Champlin & Kelly, P.A.

20070222463 - Power conversion efficiency management: Some embodiments of the invention may operate to measure a feedback error signal change as an indication of efficiency associated with a power stage, and to select a determined power stage parameter value to increase the efficiency responsive to the feedback error signal change.... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.

20070222464 - Method and apparatus for reviewing defects by detecting images having voltage contrast: In a traditional method for automatically obtaining high-magnification images of defects by using an electron microscope for defect-reviewing of a semiconductor wafer, high-magnification images of a voltage contrast changing part are obtained in the case of defects generating voltage contrast change, this made difficult to observe defects themselves generating voltage... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070222466 - Approach for fabricating probe elements for probe card assemblies using a reusable substrate: An approach is provided for fabricating probe elements for probe card assemblies. Embodiments of the invention include using a reusable substrate, a reusable substrate with layered probe elements and a reusable substrate with a passive layer made of a material that does not adhere well to probe elements formed thereon.... Agent: Hickman Palermo Truong & Becker, LLP

20070222465 - Probe head with vertical probes, method for manufacturing the probe head and probe card using the probe head: A vertical probe head primarily comprise a substrate, a trace layer, and a plurality of vertical probes where the substrate has a first surface, a second surface, and a plurality of device holes penetrating through the first surface and the second surface. The trace layer is formed on the first... Agent: Troxell Law Office PLLC

20070222467 - Dermal phase meter with improved replaceable probe tips: A probe for a dermal phase meter includes a handle with an extension that terminates with a displaceable center conductor. A replaceable tip attaches to the distal end of the extension and includes a center conductor that engages the center conductor in the extension and an outer conductor that establishes... Agent: George A. Herbster

20070222468 - High bandwidth probe system: A probing system for use with a measurement device has a probe head substrate shaped to form dual cantilever members, a resistive element disposed on each cantilever member and connected to respective signal contact elements. Each resistive element is electrically connected to center conductors of respective probe cables, which are... Agent: Agilent Technologies Inc.

20070222469 - Circuit board assembly and inverter utilizing the same: An inverter includes a first circuit board (100) including a plurality of first conductor trace lines (102) for providing electronic connections among a plurality of electronic components disposed thereon, and a second circuit board (200) including a plurality of second conductor trace lines (202) for providing electronic connections among a... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070222473 - Multilayer printed wiring board and method of measuring characteristic impedance: A multilayer printed wiring board having a compact test coupon formed on each of the signal wiring layers is provided, and accurate and efficient method of characteristic impedance measurement for each signal wiring layer is realized. The test coupon is constituted by a plurality of linear parts extending parallel to... Agent: Young & Thompson

20070222470 - Buried short location determination using voltage contrast inspection: Structure and methods of determining the complete location of a buried short using voltage contrast inspection are disclosed. In one embodiment, a method includes providing a test structure having a PN junction thereunder; and using the PN junction to determine the location of the buried short using voltage contrast (VC)... Agent: Hoffman, Warnick & D'alessandro LLC

20070222472 - Carbon nanotube-based stress sensor: An embodiment of the present invention is a technique to form stress sensors on a package in situ. A first array of carbon nanotubes (CNTs) aligned in a first orientation is deposited at a first location on a substrate or a die in a wafer. The first array is intercalated... Agent: Blakely Sokoloff Taylor & Zafman

20070222471 - Front and back side dynamically-biased photon emission microscopy: An apparatus for testing emissions from a packaged integrated circuit is described. The apparatus comprises an ATE for generating input stimulus to said integrated circuit, a universal PEM board. The apparatus further has an electrical connector between said ATE and said universal PEM board and means for wiring the connections... Agent: Harness, Dickey, & Pierce, P.l.c

20070222474 - Device for detecting a fixed image on a liquid crystal display screen: A device for detecting a frozen image on a liquid crystal display screen comprises at least one photoelectric cell capable of delivering a luminance signal l(t) to means (8) for processing this signal. The cell is placed facing a display area (A) of the screen. In this display area, a... Agent: Lowe Hauptman & Berner, LLP

20070216393 - Current-to-voltage detection circuit: A current-to-voltage detection circuit includes a detection circuit, a reference voltage component, a resistor component, a load, a detection part, and an amplifier, wherein the detection circuit uses the reference voltage component to produce a fixed reference voltage which come up with a reference potential at a point B. When... Agent: Troxell Law Office PLLC

20070216394 - Measure the mutual phase relationship of a set of spectral components generated by a signal generator: A novel method is described that enables the measurement of the phase of the spectral components generated by an harmonic phase reference generator without using a calibrated sampling oscilloscope. First one uses a vector network analyzer to measure the output reflection coefficient of an harmonic phase transfer standard and of... Agent: Jan Verspecht B.v.b.a.

20070216395 - Method and circuit arrangement for the self-testing of a reference voltage in electronic components: To provide a method for the self-testing of a reference voltage in electronic components, by means of which method there is specified a circuit arrangement for a self-test of the reference voltage that can be implemented in the form of an on-chip test, i.e. for which no external reference voltage... Agent: Nxp, B.v. Nxp Intellectual Property Department

20070216396 - Switch mode power supply sensing systems: A current sensing system for sensing an output current of a Switch Mode Power Supply (SMPS), the SMPS including a magnetic energy storage device for transferring power from an input side to an output side of the SMPS, the current sensing system comprising: a flux model system to generate a... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.

20070216397 - Method of testing power-on reset circuit and receiving circuit resetting capability: A method of testing power-on reset circuitry in an integrated circuit comprises establishing the a first state of the integrated circuit that is different from a normal reset state of the circuit, lowering the VCC power supply voltage from a normal high operating level VH to a specified lower level... Agent: Schneck & Schneck

20070216398 - Speed indication for pump condition monitoring: A method and apparatus are provided for obtaining the rotational speed of a pump system or other suitable rotating equipment having a self-contained pump electrical equipment power supply. The method features, before being rectified, directing one phase of AC power through a zero crossing circuit that identifies an instant of... Agent: Ware Fressola Van Der Sluys & Adolphson, LLP

20070216399 - Position measuring device with monitoring device: A position measuring device has an incremental dimensional standard, an associated scanning unit that emits at least two analog, phase-shifted, periodic output signals, and a monitoring device, and the value of the output signals codes a state of the monitoring device.... Agent: Striker, Striker & Stenby

20070216400 - Magnetic encoder with cover welded to reinforcing ring: A magnetic encoder which is used in a wheel bearing, that forms a pulse train by virtue of a magnetic force, and generates a code, comprises a magnetic ring, a reinforcing ring, and a protecting cover. The magnetic ring is fixed to the reinforcing ring and circumferentially magnetized with alternate... Agent: Wenderoth, Lind & Ponack, L.L.P.

20070216401 - Magnetic sensor: A magnetic sensor for determining positions of an activation magnet along a monitored distance with at least two sensor elements. Both sensor elements are subjected to at least one component of a magnetic field of the activation magnet. An evaluation unit coupled to the sensor element generates at least one... Agent: Townsend And Townsend And Crew, LLP

20070216402 - Sensor arrangement and shift arrangement: A sensor arrangement for sensing at least one position of a movably mounted element in a sensing direction is disclosed. The sensor arrangement includes a magnetic arrangement which has a magnetic field distribution in the sensing direction, and includes a magnetic field sensor. The magnetic arrangement and the magnetic field... Agent: Knobbe Martens Olson & Bear LLP

20070216403 - Rotational position sensor, compound rotational position sensor and motor operated power steering device: It is an object to provide a new rotational position sensor, compound rotational position sensor and motor operated power steering device capable of detecting the rotational position of a rotation detection shaft of which a steering shaft is representative. According to a compound rotational position sensor of the present invention,... Agent: Darby & Darby P.C.

20070216404 - Tool for measuring magnetic properties at high temperatures: The present invention relates to a measuring tool for measuring magnetic properties of a magnetic sample in a closed loop, comprising an electromagnet (1) in a closed loop arrangement with two pole pieces (3) connected to a yoke (2), said pole pieces (3) forming a gap (4) for the placement... Agent: Venable LLP

20070216405 - Commodity inspection system and inspectable textile product: A commodity inspection system attaches a ferromagnetic body to a genuine commodity in advance and detects the magnetic characteristic of the ferromagnetic body so as to judge whether the inspection object is a genuine commodity. The system includes: an magnetization coil for applying a magnetic field changing at a predetermined... Agent: Fish & Richardson P.C.

20070216406 - Single chip mr sensor integrated with an rf transceiver: At least one magnetic field sensing device and an RF transceiver are integrated in a discrete, single-chip package. Rather than requiring at least two separate chips to wirelessly transmit the device output, an integrated, single chip solution can be used. The single chip integration of the at least one magnetic... Agent: Honeywell International Inc.

20070216407 - Vehicle battery monitor apparatus and method: A battery monitor apparatus and method for an automotive battery system including a battery for supplying power to in-vehicle electrical equipment and sensors for detecting battery voltage, the charge/discharge current and the battery temperature are disclosed. The capacitance and the internal actual resistance of the battery are calculated at the... Agent: Oliff & Berridge, PLC

20070216408 - Magnetic field sensor: Two coil forming elements (12, 14) formed of conductor layers and a contact means (19), which is formed in an interlayer dielectric film (13) interposed between the conductor layers and brings the upper and lower coil forming elements into contact with each other through a via hole form a stacked... Agent: Hayes Soloway P.C.

20070216409 - Magnetic resonance imaging system with iron-assisted magnetic field gradient system: A magnetic resonance imaging apparatus includes a main magnet (20) that surrounds an examination region (18) and generates a main magnetic field in the examination region. A magnetic field gradient system (30) is disposed outside of the main magnet. The magnetic field gradient system includes a ferromagnetic yoke (32), and... Agent: Philips Intellectual Property & Standards

20070216410 - Magnetic resonance imaging system, a method of magnetic resonance imaging and a computer program: The magnetic resonance imaging system 1 according to the invention comprises a data acquisition system 11 with a main magnet 12 with an imaging volume (not shown) therein. Gradient system (G) arranged for generating field gradients Gx indicated as 14, Gy indicated as 16 and Gz indicated as 17 is... Agent: Philips Intellectual Property & Standards

20070216411 - Gradient coil system and method for the production thereof: In a method for manufacturing a gradient coil system for a magnetic resonance apparatus, the conductor arrangement of the gradient coil system is produced by successively applying respective layers of metal powder sinter material on a workpiece platform, and successively sintering the respective layers by the application of radiation, such... Agent: Schiff Hardin, LLP Patent Department

20070216412 - Magnetic resonance force microscope: A magnetic resonance force microscope (MRFM) generator for producing an RF magnetic field uniformly over the whole of a sample. A cantilever with magnetic probe tip is self-excited. Under this condition, spins in the sample are controlled to produce a magnetic resonance force. A frequency demodulator measures the resonant frequency... Agent: The Webb Law Firm, P.C.

20070216413 - Methods and apparatus for mri shims: A method includes heating a MRI shim with a heater to reduce a temperature rise per unit of time during a gradient operation of a MRI system.... Agent: Fisher Patent Group, LLC

20070216414 - Nuclear magnetic resonance spectrometer for liquid-solution: In a nuclear magnetic resonance spectrometer, the shape of a detection coil is changed from a conventional cage type to a solenoid type of higher sensitivity. Accordingly, differing from the conventional superconductive magnet of multilayer air core solenoids, a superconductive magnet is right and left divided to split magnets for... Agent: Mcdermott, Will & Emery

20070216415 - Retrievable formation resistivity tool: Systems and methods for downhole communication and measurement utilizing an improved metallic tubular having an elongated body with tubular walls and a central bore adapted to receive a run-in tool. The tubular including slotted stations to provide through-tubular signal transmission and/or reception. Hydraulic isolation between the interior and exterior of... Agent: Schlumberger Oilfield Services

20070216416 - Electromagnetic and magnetostatic shield to perform measurements ahead of the drill bit: A transmitter on a bottomhole assembly (BHA) is used for generating a transient electromagnetic signal in an earth formation. A receiver on the BHA receives signals that are indicative of formation resistivity and distances to bed boundaries. A combination of electromagnetic shielding and magnetostatic shielding enables determination of distance to... Agent: Madan, Mossman & Sriram, P.C.

20070216417 - Apparatus and method for resistivity measurements during rotational drilling: A resistivity sub including a resistivity sensor forms part of a bottom hole drilling assembly. The sensor is maintained at a substantially fixed offset from the wall of a borehole during drilling operations by, for example, a stabilizer. In WBM, galvanic sensors may be used, with or without commonly used... Agent: Madan, Mossman & Sriram, P.C.

20070216418 - Surface voltmeter and surface voltage measurement method: A surface voltmeter comprises a stage having a conductive surface, a vibrating electrode, a vibration part, and an elevation mechanism. While vibrating the vibrating electrode, displacement current from the conductive surface is acquired. A control part controls electrode voltage so that the displacement current becomes a value specified by a... Agent: Mcdermott Will & Emery LLP

20070216419 - Apparatuses and methods for repairing defects in a circuit: Methods and apparatuses to repair defects in a circuit, such as during or subsequent to the manufacture of the circuit. Defects may be detected through, for example, optical processing of an acquired image of the circuit or by measuring the strength of a signal emitted across a pair of conductor... Agent: Lexmark International, Inc. Intellectual Property Law Department

20070216420 - Method and system for eliminating vswr errors in magnitude measurements: A method and system to eliminate the VSWR effect in measurements results are provided. Multiple measurements of the signal under test are taken to cancel out the VSWR effects and leave only the actual magnitude of the signal under test. Multiple measurements may be taken with the phase of the... Agent: Venable LLP

20070216421 - Method of generating high voltages at low frequencies using small transformers: A method of providing an operating signal to an electrical device such as a telephone or FAX machine at a prescribed voltage and frequency, e.g., 100 volts at 25 Hz. Electrical power is generated as DC and converted to AC at a voltage substantially below the prescribed voltage. This signal... Agent: Bond, Schoeneck & King, PLLC

20070216422 - Probe and near-field microscope: A probe includes a tubular conductor having an aperture at one end thereof. An electromagnetic wave transmitting unit for transmitting an electromagnetic wave, via the tubular conductor, to a position distant from the aperture is disposed at one of the inside and the outside of the tubular conductor, and an... Agent: Fitzpatrick Cella Harper & Scinto

20070216423 - Electronic interface circuit for a capacitive sensor for measuring a physical parameter, and method for activating the electronic circuit: The electronic interface circuit (1) of a capacitive sensor (2) is used for measuring a physical parameter, such as an acceleration. The sensor includes two differential mounted capacitors (C1, C2) whose common electrode (Cm) can move relative to each other fixed electrode in order to alter the capacitive value of... Agent: Griffin & Szipl, PC

20070216424 - Electrical field sensors: The present disclosure provides several systems. In general, it provides E-field sensor systems that utilize at least one electrode 100 adapted for creating an E-field in an area 210 within a detection volume where fluid presence 400 or presence of a solid body 300 is to be detected. The electrical... Agent: Ingrassia Fisher & Lorenz, P.C. (fs)

20070216425 - Capacitor apparatus: A capacitor apparatus according to the present invention is configured to charge electric charge in capacitors C1 and C2 and discharge electric charge from the capacitors C1 and C2 at normal operation time. The capacitor apparatus includes an internal resistance detection means 2 for detecting the internal resistance value of... Agent: Rader Fishman & Grauer PLLC

20070216426 - Method and structures for detecting moisture in electroluminescence display devices: A method for detecting moisture in a display device having at least one display element includes incorporating at least one moisture detector in a predetermined location of the display device, the moisture detector including a material layer comprising metal formed between a first electrode and a second electrode. One or... Agent: Mark J. Marcelli Duane Morris LLP

20070216427 - Method and apparatus for predicting the reliability of electronic systems: An apparatus for predicting the reliability of an electronic system is provided. The apparatus includes at least one component, a stress sensor operable to measure stress of the at least one component, a resistance sensor operable to measure an electrical resistance of the at least one component, and an electronic... Agent: Baker Botts LLP

20070216428 - Method to reduce cross talk in a multi column e-beam test system: A method and apparatus for reducing or eliminating crosstalk between a plurality of electron beams is described. The plurality of electron beams may produce test areas on a large area substrate that are adjacent wherein secondary electrons from one test area may be detected in an adjacent test area. In... Agent: Patterson & Sheridan, LLP

20070216430 - Probe card: The objective of the present invention is to provide a type of probe assembly with a long lifetime and low cost, as well as a type of probe card using same. Probe assembly 100 attached on the probe card has probe holder 200 that holds plural probes Q at prescribed... Agent: Texas Instruments Incorporated

20070216429 - Probe card, method of designing the probe card, and method of testing semiconductor chips using the probe card: A probe card has a plurality of probe needle groups arranged in a predetermined pattern. The predetermined pattern is obtained by assuming a plurality of unit regions 11-14 arranged adjacent to each other to form a chip group region. The number of unit regions is equal in number to indexes.... Agent: Sughrue Mion, PLLC

20070216431 - Automated probe card planarization and alignment methods and tools: A method and apparatus for performing automated alignment of probes of a probe card is provided. The desired horizontal location for a probe is compared with the actual horizontal position for the probe to determine a horizontal correction distance and a horizontal correction direction to correct a horizontal alignment for... Agent: Hickman Palermo Truong & Becker, LLP

20070216432 - Space transformers employing wire bonds for interconnections with fine pitch contacts: Method and apparatus for electrical testing of a device under test (DUT) that employs a connection board with signal contacts for applying test signals and a space transformer that has low pitch contacts arranged on one or more circumferential shelves that define an enclosure in the space transformer. The apparatus... Agent: Lumen Intellectual Property Services, Inc.

20070216433 - Probe for electric test: A probe comprises a first and a second arm portions extending in the rightward and leftward direction at a vertical interval, a first and a second connecting portions connecting the first and second arm portions respectively at their front end portion and base end portion, and a needle point portion... Agent: Sheldon Mak Rose & Anderson PC

20070216435 - Apparatus of measuring characteristics of semiconductor devices: An apparatus of measuring characteristics of a plurality of semiconductor devices with a plurality of measurement units is disclosed. The apparatus includes a parallel measurement executability determination section and a plurality of measurement function sections. The parallel measurement executability determination section identifies sets of a semiconductor device and a measurement... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20070216434 - Method for validating and monitoring automatic test equipment contactor: A method and apparatus is provided for characterizing a contactor for automated semiconductor device testing, the method first comprising placing the contactor on a contactor test board positioned within an automated test apparatus. A first probe of the automated test apparatus is contacted to a conductive layer of the contactor... Agent: Texas Instruments Incorporated

20070216437 - Pusher assemblies for use in microfeature device testing, systems with pusher assemblies, and methods for using such pusher assemblies: Pusher assemblies for use in microelectronic device testing systems and methods for using such pusher assemblies are disclosed herein. One particular embodiment of such a pusher assembly comprises a plate having a first side and a second side opposite the first side. An engagement assembly is removably coupled to the... Agent: Perkins Coie LLP Patent-sea

20070216436 - Structure and fabricating method of conductive trace: The present invention provides a structure and fabricating method of forming conductive traces on a printed circuit board. The method comprises the steps of (a) providing an insulating substrate; (b) forming grooves on the insulating substrate; and (c) filling a first colloid which has a bridging effect with the insulating... Agent: Birch Stewart Kolasch & Birch

20070216438 - Ultra low pin count interface for die testing: An apparatus, a method and a system to test a device. An input/output (I/O) block communicates with an external tester to receive test data and to send test result using first and second communication modes. A logic block parses the test data. A memory stores microcode from the parsed test... Agent: Blakely Sokoloff Taylor & Zafman

20070216439 - Mos transistor characteristic detection apparatus and cmos circuit characteristic automatic adjustment apparatus: A CMOS circuit characteristic automatic adjustment apparatus includes a replica signal generation circuit for generating a replica signal capable of minimizing a drain voltage of an MOS transistor in a target circuit, a replica circuit for receiving the replica signal, voltage buffers for receiving respective drain voltages of MOS transistors... Agent: Mcdermott Will & Emery LLP

20070216440 - Sensor unit and image display apparatus: A sensor unit for measuring a response characteristic of a polarization rotation liquid crystal cell, includes a measurement light source which emits measurement light, a first polarization plate which has a first polarization direction and receives the measurement light from the measurement light source to output measurement light having the... Agent: Volpe And Koenig, P.C.

20070210785 - Stud sensing device: A multiple sensitivity stud sensing device for determining a location of objects behind a wall lining has a housing with a surface for moving over the wall lining. Within the housing are a capacitive sensor with first and second capacitances provided adjacent the surface and control circuitry. The control circuitry... Agent: Leydig Voit & Mayer, Ltd

20070210786 - Communicating with an implanted wireless sensor: The present invention determines the resonant frequency of a sensor by adjusting the phase and frequency of an energizing signal until the frequency of the energizing signal matches the resonant frequency of the sensor. The system energizes the sensor with a low duty cycle, gated burst of RF energy having... Agent: John S. Pratt, Esq Kilpatrick Stockton, LLP

20070210787 - Current measurement apparatus: The current measurement apparatus comprises a Rogowski coil 20 comprising a wire or conductor which forms a coil 22 and returns through the coil 22 as a central conductor. The coil 22 and the central conductor are formed from a single conductor or wire and, therefore, no electrical join (for... Agent: Barnes & Thornburg LLP

20070210788 - Magnetic sensor, method of manufacturing the same, and electronic device: A magnetic sensor have a magnetic field sensing portion having an alloy metal thin film including Ni, Fe and Co as main components and having a magneto-resistance effect, and detects two or more magnetic fields, at least one of which magnetic fields to be detected is 2.5 mT or more,... Agent: Foley And Lardner LLP Suite 500

20070210789 - Automated disk clamping method for spinstand for testing magnetic heads and disks: A mechanism for placing and removing a vacuum clamping device for a magnetic disk on a spinstand, comprised of automated vertical and horizontal movement arranged such that a vacuum disk chuck, comprised of a base (9) and cap (6), can be used without operator interaction. Linear actuators provide the horizontal... Agent: Mark G. Lappin Foley & Lardner LLP

20070210790 - System and method for characterizing a sample by low-frequency spectra: A method and apparatus for interrogating a sample that exhibits molecular rotation are disclosed. In practicing the method, the sample is placed in a container having both magnetic and electromagnetic shielding, and Gaussian noise is injected into the sample. An electromagnetic time-domain signal composed of sample source radiation superimposed on... Agent: Perkins Coie LLP Patent-sea

20070210791 - Bridge circuited magnetic sensor having magneto-resistive element and fixed resistor with the same layer configuration: The application provides a magnetic sensor which can suppress an irregularity of a central potential due to a change in a temperature, decrease size of the sensor, and lower the manufacturing cost of the sensor. A magneto-resistive element and fixed resister are provided on an element base and have the... Agent: Brinks Hofer Gilson & Lione

20070210792 - Magnetic sensor and manufacturing method therefor: A magnetic sensor comprises a substrate, magnetoresistive element of a spin-valve type, a bias magnetic layer (or a permanent magnet film), and a protective film, wherein the bias magnetic layer is connected with both ends of the magnetoresistive element and the upper surface thereof is entirely covered with the lower... Agent: Smith Patent Office

20070210793 - Method and multi-reception coil mr apparatus for generating an mr image using data from selected coils: In a method for generation of magnetic resonance exposures of an examination subject using a magnetic resonance system with multiple coil elements for acquisition of imaging magnetic resonance signals, magnetic resonance signals for the magnetic resonance exposures to be generated are initially measured with at least one group of the... Agent: Schiff Hardin, LLP Patent Department

20070210794 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: With the object of enhancing image quality, a transmission sensitivity distribution calculating part calculates a transmission sensitivity distribution by a double flip angle method. Next, a threshold processing part threshold-processes the calculated transmission sensitivity distribution. Further, an image correcting unit corrects an actual scan image using the transmission sensitivity distribution... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070210795 - Magnetic resonance imaging apparatus: The present invention relates to a magnetic resonance imaging apparatus, which includes a floor surface, a static magnetic field generator, two pieces of which are placed opposite each other vertically across an image pickup space, and a plurality of support legs for supporting a weight of the resonance imaging apparatus,... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20070210797 - Magnetic resonance unit: The invention relates to a magnetic resonance unit, with a magnet generating a static magnetic field, in the hollow space of which an essentially tubular inner lining is disposed, into which a patient support device can be introduced, and with control elements disposed on a front lining to control the... Agent: Siemens Corporation Intellectual Property Department

20070210796 - Phantom for evaluating magnetic resonance spectroscopy performance: A phantom for evaluating a magnetic resonance spectroscopy (MRS) performance is provided. Specifically, a phantom for evaluating an MRS performance capable of quantitatively evaluating a resolution of a spectrum obtained when a chemical shift imaging MRS measurement process is performed is provided. The phantom evaluates MRS performance using a magnetic... Agent: The Rafferty Patent Law Firm

20070210798 - Compact and portable low-field pulsed nmr dispersion analyzer: A compact and integrated portable device is provided for the analysis of dispersions by low-field pulsed NMR including: an NMR probe module, a means for generating radio frequency and magnetic field gradient pulses, a signal processor, and a master controller. Also provided are methods for using the device to measure... Agent: Kathleen A. Tyrrell Licata & Tyrrell P.C.

20070210799 - Geosteering in earth formations using multicomponent induction measurements: A multicomponent induction logging tool is used on a MWD bottomhole assembly. Multifrequency focusing that accounts for the finite, nonzero, conductivity of the mandrel is applied. Using separation of modes, the principal components and relative dip angles in an earth formation are determined. The results are used for reservoir navigation... Agent: Madan, Mossman & Sriram, P.C.

20070210800 - Apparatus and method for remote battery tester/charger control: A remote-controlled battery charging/testing system includes an execution unit capable of performing at least one battery-related function and a control panel remotely connected to and in operable communication with the execution unit. Communication may be wired or wireless. The control panel is installed in an ergonomically-suitable position such that the... Agent: Baker & Hostetler LLP

20070210801 - Battery testing and/or charging system with integrated receptacle for booster pack and method of using same: A battery testing/charging system includes an execution unit, such as a battery tester/charger, a receptacle configured to receive an external booster pack, and an outlet configured to power the booster pack when the booster pack is connected to the outlet. The receptacle removably receives the booster pack, such that the... Agent: Baker & Hostetler LLP

20070210802 - Electronic device, testing apparatus, and testing method: There is provided an electronic device having an operation circuit for outputting an output signal to be tested or evaluated and a demodulator that receives the output signal from the operation circuit to output a demodulation signal in which a phase-modulated or frequency-modulated component of the output signal is demodulated.... Agent: Smith, Gambrell & Russell

20070210804 - Load abnormality detecting system and method: A load abnormality detecting system and method for detecting the burnout and short circuit of a load are provided. A voltage generator (10) generates a specified voltage Vs in accordance with a load current IL. A judging device (4) compares a signal corresponding to this voltage (Vs) with a specified... Agent: Casella & Hespos

20070210803 - Circuit with an arrangement for the detection of an interrupted connecting line: A circuit arrangement is disclosed herein comprising a first and a second supply terminal for application of a supply voltage and an output terminal for providing an output signal. The circuit arrangement additionally comprises at least one programmable switch arrangement comprising a normally off MOS transistor, which has a load... Agent: Maginot, Moore & Beck

20070210805 - Insulation detecting method and insulation detecting device: An alternating signal from a signal generator is applied to a direct current source via a detecting resistor and a coupling capacitor. A detecting member detects a voltage amplitude change appeared at a contact between the detecting resistor and the coupling capacitor. Based on the voltage amplitude change, a correction... Agent: Kratz, Quintos & Hanson, LLP

20070210806 - Fuel cell electric power sensing methodology and the applications thereof: The present invention provides a fuel cell electric power sensing methodology and the applications thereof. A fuel cell electric power sensing methodology comprises the following steps: electrically connecting a fuel cell to a main control circuit, which is a circuit having a voltage/current judgment means and a storage means; computing... Agent: G. Link Co. Ltd

20070210807 - Capacitive humidity sensor: A capacitive humidity sensor includes a detecting portion and a reference portion. The detecting portion includes a first sensor element, and a capacitance of the first sensor element varies in accordance with humidity. The reference portion includes a second sensor element and a capacitor. The second sensor element is connected... Agent: Posz Law Group, PLC

20070210808 - Real-time multi-point ground resistance monitoring device: A real-time multi-point ground resistance monitoring device is provided herein to simultaneously monitor ground resistances of different work stations. The present invention mainly contains a number of monitoring ports connected to multiple test ground points in parallel via conductive wires respectively. Each monitoring port is configured with a safety range... Agent: Birch Stewart Kolasch & Birch

20070210809 - Joint fault detection: A method and apparatus for detecting a fault in a joint connecting sections of an electrical transmission line together are disclosed. Previously known methods for detecting joint faults require a visual inspection of the joint or testing the transmission line using sophisticated, expensive equipment. This manual testing is expensive and... Agent: Nixon & Vanderhye, PC

20070210810 - V/i source and test system incorporating the same: A voltage/current (V/I) source includes circuitry having first, second, third and fourth nodes, a first current source electrically connected to the first node, a second current source electrically connected to the second node, where the third and fourth nodes are between the first and second nodes, and an operational amplifier... Agent: Fish & Richardson P.C.

20070210814 - Apparatus and method for measurement of hardenable material characteristics: A probe for measuring the hardness of concrete includes a body adapted to receive a retainer such that the combined body and retainer can be held in an aperture extending through a wall of a mould for the hardenable material, with the body extending from the inside of the wall.... Agent: Hogan & Hartson LLP

20070210811 - Apparatus and method for testing semiconductor devices: An apparatus for testing semiconductor devices includes a table having receptacles for trays holding semiconductor devices to be tested. An interface is positioned between the receptacles and at least one test device. The interface is customized to electrically connect the semiconductor devices to the at least one test device. The... Agent: Morgan, Lewis & Bockius, LLP.

20070210812 - High-density probe array: A probe array may be fabricated by forming probes arranged on a sacrificial substrate, forming a probe substrate above the probes, and removing the sacrificial substrate. In one embodiment, first probes may be two-dimensionally formed in row and column directions on a sacrificial substrate. Second probes may be formed between... Agent: Marger Johnson & Mccollom, P.C.

20070210813 - Probe for electrical test and probe assembly: A probe for electrical test comprises a probe body having a base end attached to a support base plate through a solder and a front end continuous with said base end and a surface layer showing a conductivity higher than that of the probe body and a solder wettability higher... Agent: Ingrassia Fisher & Lorenz, P.C.

20070210815 - Blade probe and blade probe card: A blade probe card includes a plurality of blades that each includes a first end connected to a printed circuit board and a second end. A probe member is attached to the second end of each blade and extends outward to make contact with a device under test. A ground... Agent: Hickman Palermo Truong & Becker, LLP

20070210816 - Mp3 micro probe: Described are methods of using probes, for making electrical contact to high-density chips or similar electronic devices. Two groups of probes are covered. The first group includes probes that are moved laterally, parallel to the surface of the contact pads of the device under test, after the initial contact has... Agent: Gabe Cherian

20070210817 - Partitioned multi-die wafer-sort probe card and methods of using same: A partitioned multi-die wafer-sort probe card includes an arcuate unit pattern. The arcuate unit pattern is repeated, either in complete or truncated form across the footprint of the multi-die wafer-sort probe card. Wafer testing is carried out by first testing at a first touchdown (TD), stepping the multi-die wafer-sort probe... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.

20070210819 - Functional and stress testing of lga devices: Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads... Agent: Ibm Corporation (jss) C/o Schubert Osterrieder & Nickelson PLLC

20070210818 - Temperature monitoring and control apparatus and method: Apparatus and methods for monitoring temperature which employ certain characteristics of diodes in an effective way to monitor the temperature of a heat generating device and enable use of a signal derived from the monitored temperature to control the heat generating device or accessories if so desired.... Agent: Ibm Corporation

20070210821 - Display filter and display apparatus including the same: A display filter and a display apparatus including the display filter, which can increase a contrast ratio, increase brightness, and have a great electromagnetic (EM) radiation-shielding effect, are provided. The display filter includes: a filter base; and an external light-shielding layer formed on a surface of the filter base, wherein... Agent: Mcdermott Will & Emery LLP

20070210820 - Method and apparatus for dissipating heat from an integrated circuit: An apparatus (100) is provided for dispersing heat from an integrated circuit (202) to a heat sink (404). The apparatus (100) is formed on a nonconductive body (102) having at least two conductive surfaces (110, 112) disposed thereon. One of the conductive surfaces (110) is reflowed to a heat generating... Agent: Motorola, Inc Intellectual Property Section

20070210822 - Wireless test system: One or more testers wirelessly communicate with one or more test stations. The wireless communication may include transmission of test commands and/or test vectors to a test station, resulting in testing of one or more electronic devices at the test station. The wireless communication may also include transmission of test... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070210823 - Measurement apparatus and measurement method: A measurement apparatus is provided for measuring at least one of the switching times of the output signals output from a device under test. The measurement apparatus comprises: a first light-emitting unit having a function whereby light emission starts in a case that the voltage of the output signal becomes... Agent: Osha Liang L.L.P.

20070210824 - Method of inspecting quiescent power supply current in semiconductor integrated circuit and device for executing the method: A method of inspecting a quiescent power supply current in a semiconductor integrated circuit, includes an ID information acquisition process for acquiring ID information of the semiconductor integrated circuit, a quiescent power supply current measuring process for measuring the value of the quiescent power supply current in the semiconductor integrated... Agent: Mcdermott Will & Emery LLP

20070205747 - Device and method for measuring fine particle concentration: Disclosed is a device for measuring the concentration of the particles contained in a fluid. The device comprises a control volume body having a predetermined effective volume. An inlet path is formed at an end of the control volume body to feed the fluid into the control volume body therethrough.... Agent: Graybeal, Jackson, Haley LLP

20070205748 - Signal transmission device: The invention provides a signal transmission device that transmits a signal applied to a pair of input terminals to a pair of output terminals insulated electrically from the pair of input terminals while reducing the influence of an external noise magnetic field. The signal transmission device has a pair of... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070205749 - Temperature compensated and self-calibrated current sensor using reference current: A method is described to provide temperature compensation and self-calibration of a current sensor based on a plurality of magnetic field sensors positioned around a current carrying conductor. A reference electrical current carried by a conductor positioned within the sensing window of the current sensor is used to correct variations... Agent: Fieldmetries, Inc.

20070205750 - Temperature compensated current sensor using reference magnetic field: A method is described to provide temperature compensation and self-calibration of a current sensor based on a plurality of magnetic field sensors positioned around a current carrying conductor. A reference magnetic field generated within the current sensor housing is detected by a separate but identical magnetic field sensor and is... Agent: Fieldmetries, Inc.

20070205751 - Device inspection device, device inspection system using the same, and mobile telephone holding device: [Solution] The device inspection apparatus comprises an adapter unit 2 on which a cellular phone 1 is mounted; a camera 4 for picking up the image of an LCD panel 3, which serves as a display section for the cellular phone 1; a plunger unit 7, which has a plurality... Agent: Kubovcik & Kubovcik

20070205756 - Functional and stress testing of lga devices: Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads... Agent: Ibm Corporation (jss) C/o Schubert Osterrieder & Nickelson PLLC

20070205757 - Functional and stress testing of lga devices: Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads... Agent: Ibm Corporation (jss) C/o Schubert Osterrieder & Nickelson PLLC

20070205758 - Functional and stress testing of lga devices: Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads... Agent: Ibm Corporation (jss) C/o Schubert Osterrieder & Nickelson PLLC

20070205754 - Inspecting circuit layout for lcd panel and fabricating method for lcd panel: An inspecting circuit layout according to the present invention is provided. The inspecting circuit layout is adapted for inspecting panel units group by group, each of the panel units having a plurality of first and second signal lines. The inspecting circuit layout includes a multiplexer (MUX) and an inspecting pad.... Agent: J.c. Patents, Inc.

20070205752 - Portable electronics testing device: A portable electronics testing device for use in testing automotive electronics. There is a housing, including: a shell; a handle; and a wheel. There is an electronics module coupled to the housing, configured to test an electronic device, and including: a speaker module configured to produce audio; a speaker connection... Agent: Advantia Law Group

20070205755 - Semiconductor device and electronics device: A plurality of switch circuits are disposed so as to correspond to a plurality of circuit blocks, respectively. Each of the plurality of switch circuits is connected between a power supply terminal of a corresponding circuit block and a power supply line. A setting circuit is disposed to set each... Agent: Arent Fox PLLC

20070205753 - Test handler automatic contactor cleaner methods and surrogate cleaning device: Methods and devices are disclosed for cleaning contactors equipped with contact pins such as pogo pins include steps which may be performed in concert with common semiconductor device testing processes using automatic test equipment and associated handlers. The preferred embodiments of the invention include method steps for mounting a surrogate... Agent: Texas Instruments Incorporated

20070205759 - Bearing with integrated rotation sensor: To provide a bearing with integrated rotation sensor capable of detecting the rotational speed and the origin position without being affected by an external magnetic field, the bearing includes a rotating ring, a magnetic encoder 7 mounted on the rotating ring, and a stationary ring. The magnetic encoder 7 includes... Agent: Staas & Halsey LLP

20070205760 - Device to mechanically secure a magnetic linear position sensor:

20070205761 - Method of arranging a resolver: A method of arranging a resolver comprises the steps of: a, setting stator magnetic poles number of the resolver Ns as a number being in integral multiples (t) of a phase number q; b, figuring out rotor magnetic pole number Nr based on a formula; c, arranging the stator and... Agent: Charles E. Baxley, Esq.

20070205762 - Rotational angle detector and method for initializing rotational angle detector: A method for initializing a rotational angle detector detecting rotational angles of two driven gears mated with a drive gear, rotated integrally with a detection subject, and obtaining rotational angle of the detection subject from the detected rotational angles. The method includes obtaining a first error and second error in... Agent: Synnestvedt & Lechner, LLP

20070205763 - Head assembly drive mechanism, head holder, magnetic head tester and magnetic disk tester: A head holder includes a first and second blocks connected each other with a predetermined gap between the blocks by a flexible coupling portion. The second block supports the first block swingably by increasing a width of either one of spaces of the predetermined gap on opposite sides of the... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20070205764 - Eddy current probe and method of manufacture thereof: An eddy current probe includes a plurality of deformable substrates each having a pair of coils wound coaxially thereabout in spaced relation and a housing supporting said plurality of substrates adjacent to each other with each substrate compressed in a direction laterally to the axis of the pair of coils... Agent: The Webb Law Firm, P.C.

20070205765 - Methods and apparatus for determining the thickness of a conductive layer on a substrate: “A method of determining the thickness of a conductive film is disclosed. The method employs measured voltage and current responses that have been temperature-compensated to determine the thickness of the conductive film. The temperature compensation uses a temperature compensation factor obtained from a calibration substrate different from the target substrate... Agent: Ipsg, P.C.

20070205766 - Magnetoresistance effect element, substrate therefor and manufacturing method thereof: A magnetoresistance effect element which is used in a magnetic sensor is disclosed. The magnetoresistance effect element includes a soft layer whose magnetization easy direction is changed by a direction of an external magnetic field, and a magnetization fixing layer whose magnetization direction is fixed by having a magnetic layer... Agent: Dickstein Shapiro LLP

20070205767 - Atomic magnetic gradiometer for room temperature high sensitivity magnetic field detection: A laser-based atomic magnetometer (LBAM) apparatus measures magnetic fields, comprising: a plurality of polarization detector cells to detect magnetic fields; a laser source optically coupled to the polarization detector cells; and a signal detector that measures the laser source after being coupled to the polarization detector cells, which may be... Agent: Lawrence Berkeley National Laboratory

20070205768 - Probe unit for nuclear magnetic resonance: Disclosed is a probe unit for nuclear magnetic resonance. The probe unit includes a cylindrical outer conductor, a cylindrical central conductor concentrically disposed in the outer conductor, and fluid paths guiding the flow of fluid in the space between the central and outer conductors. By applying a RF current between... Agent: Keusey, Tutunjian & Bitetto, P.C.

20070205769 - Magnetic resonance imaging apparatus and magnetic resonance imaging method: An MRI apparatus includes an imaging signal acquisition unit, a motion signal acquisition unit, a motion amount determination unit, a motion correction unit and an image reconstruction unit. The imaging signal acquisition unit acquires MR signals as imaging signals. The motion signal acquisition unit repetitively acquires MR signals having PE... Agent: Nixon & Vanderhye, PC

20070205770 - Method and apparatus for internal calibration in induction logging instruments: The present invention improves measurement of the formation induction response in the presence of the primary magnetic field generated by a logging tool's transmitter. A structure is provided having a new combination of electrical and mechanical design features which provide logging tool for internal calibration and checking of antenna performance... Agent: Madan, Mossman & Sriram, P.C.

20070205771 - Relay controller: A relay controller for connecting a power source includes at least one relay having at least two contacts. The relay controller includes a processing device operable to selectively switch the relay contacts, and a feedback circuit adapted to identify an actual state of the relay contacts. The processing device is... Agent: Kevin M. Pumm

20070205772 - Circuit arrangement and method for monitoring the function of a vibration level switch and/or a fill level measuring apparautus: The invention relates to a circuit arrangement for monitoring the function of a fill level measuring apparatus, and particularly of a vibration level switch, comprising a first piezo-electric vibration device (SP) as a transmitting device, a second piezo-electric vibration device (EP) as a receiving device, an oscillator circuit (O), the... Agent: Nath & Associates

20070205773 - Functional and stress testing of lga devices: Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads... Agent: Ibm Corporation (jss) C/o Schubert Osterrieder & Nickelson PLLC

20070205774 - Electrical connectors: A connector may include lead frame assemblies that each includes contacts arranged in a column. Differential signal pairs may be formed from contacts of adjacent lead frame assemblies. A contact of such differential signal pairs may be staggered along the lead frame assembly with respect to the other contact of... Agent: Woodcock Washburn, LLP

20070205776 - Cylindrical capacitive force sensing device and method: Cylindrical capacitance force sensing device/method is disclosed. In one embodiment, an apparatus includes a capacitor having two parallel conductive surfaces, a cylindrical housing with a cover plate to encompass the capacitor, and a sensor in the cylindrical housing to generate a measurement based on a change in a distance between... Agent: Raj Abhyanker, LLP C/o Portfolioip

20070205775 - Device , sensor arrangement and method for the capacitive position finding of a target object: The present invention relates to a device for capacitive position finding of an object, with a plurality of capacitive probes distributed over an area in which a position of the object is to be established. According to the invention the device is characterized in that the probes are in each... Agent: Hoffman Warnick & D'alessandro, LLC

20070205777 - Electronic pressure switch: An electronic pressure switch has only two terminals, a resistance measuring bridge pickup, an amplifier unit downstream of the resistance measuring bridge, a comparator connected to the amplifier unit and a switching stage downstream of the comparator achieves a lower residual current in the blocked state and a lower voltage... Agent: Roberts, Mlotkowski & Hobbes

20070205778 - Current sensing circuit: A circuit arrangement for detecting a load current through a load includes a main transistor, a sensing transistor through which a load current flows that is a measure of the load current flowing through the main transistor, a means of resistance which is connected in series with the load path... Agent: Eschweiler & Associates, LLC National City Bank Building

20070205782 - Excess overdrive detector for probe cards: A novel structure for a probe card that comprises a deformable metal or other deformable material for detecting excess overdrive and a method for using the same are disclosed. This detection structure may be positioned on the substrate along the bending path of the probe, such that should the probe... Agent: Manuel F. De La Cerra

20070205781 - Coaxial connector in radar level gauge: A guided wave radar level gauge for determining a process variable of a product in a tank, comprising a feed through fitting, a probe extending into the tank, transceiver circuitry mounted on a circuit board, a housing having a body portion for accommodating said circuit board, and a neck portion... Agent: Westman Champlin & Kelly, P.A.

20070205785 - Robot for ultrasonic examination: A robot for medical ultrasonic examination has an articulated robot arm with a plurality of arm units (14-16), mounted one on the other to be pivotable, and a computerized system for controlling the movements of the arm, the outermost arm unit being arranged to carry a probe. The outermost arm... Agent: Mark P. Stone

20070205783 - Sheet-like probe, method of producing the probe, and application of the probe: A sheet-like probe and a method of producing the probe. In the probe electrode structure bodies do not come out from an insulation film and achieve high durability, and in a burn-in test for a wafer having a large area and for a circuit device having to-be-inspected electrodes with small... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070205780 - Stacked guard structures: Systems and methods for providing a stack with a guard plane embedded in the stack are disclosed. An electrical apparatus can be made by forming a stack comprising an electrically conductive signal structure, an electrical guard structure, and an electrically insulating structure disposed between the signal structure and the guard... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070205784 - Switched suspended conductor and connection: A probe assembly having a switch that selectively electrically connects, for example, either a Kelvin connection or a suspended guard element with the probe assembly.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070205779 - System and method for checking mechanical pieces, with wireless signal transmission: A system for detecting the position and/or the dimensions of mechanical pieces (3) includes a checking probe (1) with detection devices (2) and a remote transmitter (4), a receiver (7) being remotely placed from the probe to wirelessly receive, from the remote transmitter, pulse signals (5) indicative of the state... Agent: Dickstein Shapiro LLP

20070205786 - Functional and stress testing of lga devices: Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads... Agent: Ibm Corporation (jss) C/o Schubert Osterrieder & Nickelson PLLC

20070205787 - Wafer holder, and heater unit and wafer prober provided therewith: A wafer holder with which probing can be performed with little or virtually no noise due to the wafer being shielded from electromagnetic waves; and a wafer prober on which the wafer holder is mounted. The wafer holder of the present invention includes a chuck top for mounting a wafer,... Agent: GlobalIPCounselors, LLP

20070205788 - Wafer holder, and wafer prober provided therewith: A wafer holder is provided having high rigidity and an enhanced heat-insulating effect that allow positional accuracy and heating uniformity to be improved, a chip to be rapidly heated and cooled, and the manufacturing cost to be reduced, and a wafer prober apparatus on which the wafer holder is mounted.... Agent: GlobalIPCounselors, LLP

20070205789 - Device for final inspection: A device is provided for subjecting a plurality of singulated semiconductor components to functional verification, which includes contact pins that are integrated in a test socket and establish a mechanical and electrical contact between the test socket and the integrated semiconductor circuits, a holding fixture (DUT board) connected to the... Agent: Mcgrath, Geissler, Olds & Richardson, PLLC

20070205794 - Semiconductor device: A power supply potential and a ground potential are supplied to a test-use power supply pad and a test-use ground pad, respectively. The power supply potential supplied to the test-use power supply pad is transferred to power supply lines and then to each circuit block via a test-use power supply... Agent: Mcdermott Will & Emery LLP

20070205795 - Bi-convex solid immersion lens: A bi-convex solid immersion lens is disclosed, having a top and bottom convex surfaces. The radius of curvature of the bottom surface is larger than that of the top surface. A conical sloped side-wall connects the top and bottom surface.... Agent: Sughrue Mion, PLLC

20070205796 - Functional and stress testing of lga devices: Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads... Agent: Ibm Corporation (jss) C/o Schubert Osterrieder & Nickelson PLLC

20070205797 - Functional and stress testing of lga devices: Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads... Agent: Ibm Corporation (jss) C/o Schubert Osterrieder & Nickelson PLLC

20070205793 - Method and apparatus for silent current detection: The present invention discloses a method and an apparatus for silent current detection. By measuring voltage of a control output of a driver control circuit for driving an application device, leakage current of the driver control circuit can be detected. If the application device has an energy bandgap, short or... Agent: Crockett & Crockett

20070205791 - Method and apparatus for strain monitoring of printed circuit board assemblies: A technique of monitoring strain on a printed circuit board assembly involves the use of a strain detector mounted on a printed circuit board. The strain detector is formed of a non-ductile material. The strain detector has a narrowed portion forming a weak link that has a characteristic of breaking... Agent: David E. Huang, Esq. Bainwood Huang & Associates LLC

20070205790 - Semiconductor device testing apparatus and device interface board: A interface board is provided with a first and second contact instruments each comprising a first and second contact terminal groups to which a first to third type semiconductor devices having different numbers of external terminals used can be connected. The first contact terminal group of the first contact instrument... Agent: Gallagher & Lathrop, A Professional Corporation

20070205792 - Semiconductor packages, methods of forming semiconductor packages, and methods of cooling semiconductor dies: The invention includes semiconductor packages having grooves within a semiconductor die backside; and includes semiconductor packages utilizing carbon nanostructures (such as, for example, carbon nanotubes) as thermally conductive interface materials. The invention also includes methods of cooling a semiconductor die in which coolant is forced through grooves in a backside... Agent: Wells St. John P.s.

20070205798 - Three phase motor diagnostics and phase voltage feedback utilizing a single a/d input: A motor system utilizes a single feedback output to determine various fault states for a 3-phase motor in a non-operational condition. The same single feedback output may be used to determine the applied phase voltage for a 3-phase motor in an operational condition.... Agent: Delphi Technologies Inc.