Electricity: measuring and testing inventions 08/07

20070200547 - Object detector: An object of the present invention is to provide an object detector which can intuitively show detection information and facilitate the observation of a detected surface covered by a display screen. The detector includes a housing, a detecting circuit for detecting a hidden object behind a surface, which is arranged... Agent: Mcdermott, Will & Emery LLP

20070200548 - Pulse height analyser: The present invention relates to a pulse height analyser for determination of the pulse height distribution of electronic pulses comprising a set of comparators with a common input for analogue to digital conversion of the electronic pulses, a set of latches wherein the inputs of the latches are connected to... Agent: Volentine & Whitt PLLC

20070200549 - Micro-electromechanical system (mems) based current and magnetic field sensor: A micro-electromechanical system (MEMS) current and magnetic field sensor for sensing a magnetic field produced by a conductor includes a magneto-MEMS component for sensing the magnetic field and an interference-MEMS component for sensing an interference, wherein the magneto-MEMS component and the interference MEMS component are used to provide an indication... Agent: General Electric Company Global Research

20070200550 - Trigger architecture, measurement system and method of use: A trigger architecture for generating a trigger; a measurement system including a trigger architecture; and a method of processing measurement data are described.... Agent: Agilent Technologies, Inc. Legal Department, Dl429

20070200551 - Current sensor: A current sensor for detecting current flowing through a conductive bus bar. A fitting groove is formed in the bus bar. A package is fitted into the fitting groove including a magnetic detection element that detects current flowing through the bus bar. A lead frame is connected to the magnetic... Agent: Crompton, Seager & Tufte, LLC

20070200553 - Electrical profile monitoring system for detection of atypical consumption: Methods of detecting atypical patterns of usage of electricity, determined by monitoring consumption at the primary line, permit detection of grow-ops and unusual line losses due to defective service lines. A meter having a high resolution is connected to the primary line and the data collected is compared to known... Agent: Sean W. Goodwin

20070200552 - Energy meter device and calibration method: It relates to an energy meter device with two inputs (1,2), whereto signals are fed in, which depend on electrical voltage (V) and an electrical current (I). These are digitized in analog/digital transformers (3,4) and linked to one another. A phase evaluation block (9) is coupled with outputs of the... Agent: Fish & Richardson PC

20070200555 - Contact pusher, contact arm, and electronic device test apparatus: A contact pusher (220a) attached to the front end of a contact arm (210) bringing an IC device (10) into contact with a contact part of a test head and pushing the IC device (10) is provided with a suction pad (240) for picking up and holding an IC device... Agent: Greenblum & Bernstein, P.L.C

20070200556 - Dynamic line rating system with real-time tracking of conductor creep to establish the maximum allowable conductor loading as limited by clearance: Maximum transmission line or conductor loading of an overhead transmission line or conductor spanning two transmission line towers is determined by using a sensing device clamped to the overhead transmission line. The sensing device acquires real-time information that is used in an iterative process to determine sag, limiting temperature, maximum... Agent: William S. Frommer, Esq. Frommer Lawrence & Haug LLP

20070200557 - Grid system selection supporting device, grid system selection supporting method and storage medium: There is disclosed a grid system selection supporting device comprising: a storage unit that stores use histories for a plurality of grid systems; and an extraction unit that extracts at least one of the plurality of grid systems, based on the use histories.... Agent: Harness, Dickey & Pierce, P.L.C

20070200554 - Solid or three-dimensional circuit board: A molding pin for a metal die is prevented from breaking, solder is surely deposited, and thus, a circuit pitch can be reduced to the limit. On the front plane of a circuit board, prescribed circuit patterns made of a conductive material are formed, and on the rear plane, prescribed... Agent: Jordan And Hamburg LLP

20070200558 - Device and method for detecting the position and the velocity of a test object: A device and method for detecting the position and velocity of a test object relative to a sensor, the sensor and the test object being arranged such that they can be displaced relative to one another. In one embodiment, the sensor has a measuring coil with one or more voltage... Agent: Alston & Bird LLP

20070200559 - Position sensing assembly with synchronizing capability: A linear variable transformer, or LVDT, for use with the transducer, which has a non-ferromagnetic core that can eliminate Barkhausen noise. By eliminating the Barkhausen noise, the sensitivity of the resulting measurements can be improved. The LVDT is formed of multiple coil assemblies which are moved relative to one another,... Agent: Fish & Richardson, PC

20070200560 - Module to control a rotating output shaft and a module to change a driving condition of vehicle: A sensor and a control circuit are provided externally of a gear cover. This enhances reliability of a shift controller operated by an electric actuator and a motor driven control module similar thereto, and constitute them compact. Further, this provides a rotating position detection sensor suitably used for a switching... Agent: Crowell & Moring LLP Intellectual Property Group

20070200561 - Magnetic sensor: The magnetic sensor in the invention is arranged to detect a change of magnetic field caused by a movement of the magnetic movable by a magnetic sensor element arranged with a gap to the magnetic movable, to convert the detected change of magnetic field by first and second bridge circuits... Agent: Sughrue Mion, PLLC

20070200562 - Eddy current type sensor for detecting conductor: An eddy current type sensor for detecting a conductor includes a LC circuit and an oscillator. The LC circuit has a coil and a capacitor connected in parallel with the coil. The oscillator supplies an alternating current of a predetermined oscillation frequency to the LC circuit. A signal voltage outputted... Agent: Nixon & Vanderhye, PC

20070200563 - Device for detecting defects which are deep and close to the surface in electrically conductive materials in a nondestructive manner: The invention relates to a device for detecting defects which are deep in electrically conductive materials in a non-destructive manner, comprising an excitation device provided with induction coils which are used to produce low frequency eddy currents in the material, and a receiving device for the magnetic field of the... Agent: Siemens Corporation Intellectual Property Department

20070200564 - Magnetic field sensor, sensor comprising same and method for manufacturing same: A magnetic field sensor has a first sensor with an output for a first signal indicating a magnetic field acting in a plane, and a second sensor having an output for a second signal indicating a component of the magnetic field perpendicular to the plane. The first sensor and the... Agent: Baker Botts, L.L.P.

20070200565 - Semiconductor device and magneto-resistive sensor integration: A magnetic-sensing apparatus and method of making and using thereof is provided. The sensing apparatus may be fabricated from semiconductor circuitry and a magneto-resistive sensor. A dielectric may be disposed between the semiconductor circuitry and the magneto-resistive sensor. In one embodiment, the semiconductor circuitry and magneto-resistive sensor are formed into... Agent: Honeywell International Inc.

20070200566 - High performance security inspection system with physically isolated detection sensors: An inspection system includes a housing having a cavity which defines an inspection zone, and a positioning device within the inspection zone which provides positioning of a specimen within the inspection zone. The inspection system includes a sensor system for inspecting the specimen, and an entrance aperture formed in the... Agent: Cantor Colburn, LLP

20070200567 - Apparatus for calculating quantity indicating charged state of on-vehicle battery: An apparatus is provided to calculate a quantity indicating a charged state of an on-vehicle battery. The battery powers a starter starting up an on-vehicle engine. In the apparatus, a plurality of pairs of data consisting of current and voltage of the battery are acquired at predetermined sampling intervals during... Agent: Oliff & Berridge, PLC

20070200568 - Detecting apparatus for detecting moisture content of media stack: A detecting apparatus for detecting information of at least a portion of a stack of sheet media includes an illuminating unit and a detecting unit. The illuminating unit illuminates a side of the stack of sheet media, or a portion thereof with electromagnetic waves. The detecting unit detects electromagnetic waves... Agent: Fitzpatrick Cella Harper & Scinto

20070200569 - Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus: Provided is a sample observing method allowing for a detailed observation of a sample by using one and the same electron beam apparatus. The method uses an electron beam apparatus 1 comprising a primary optical system 10 serving for irradiating the electron beam onto the sample surface and a secondary... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070200573 - Auto-measuring universal meter: An auto-measuring universal meter is disclosed. The auto-measuring universal meter includes a main unit having a display and a single button. A pair of test probes is electrically connected to the main unit in a removable manner to detect a first input signal; an inductive clamp is formed on and... Agent: Troxell Law Office PLLC

20070200575 - Circuit and method for error test, recordation, and repair: A contactor card assembly for use with a semiconductor substrate. An upper keeper plate and a lower keeper plate each include a number of conductive pins extending therethrough, situated in vias filled with an elastomeric material and extending beyond the keeper plates to contact a substrate for testing. An intermediate... Agent: Trask Britt, P.C./ Micron Technology

20070200579 - Integrated circuit load board and method having on-board test circuit: An integrated circuit load board includes a substrate on which a plurality of integrated circuit sockets and an integrated test circuit are mounted. The integrated test circuit generates test signals that are applied to the integrated circuit sockets. The integrated test circuit also receives response signals from the integrated circuit... Agent: Edward W. Bulchis, Esq. Dorsey & Whitney LLP

20070200576 - Multi-layered probes: A probe for a probe card assembly is provided. The probe has a post structure supported by a substrate, a plurality of stacked beam elements disposed on the post structure, and a tip attached to a surface of a top beam element, of the plurality of stacked beam elements, that... Agent: Hickman Palermo Truong & Becker, LLP

20070200578 - Probe assembly: A probe assembly for performing circuit inspection of semiconductor chips according to which a resin film with copper foil attached thereto is used to form a conductive portion including a vertical probe on the resin film by etching the copper foil, plural sheets of the resin film with the vertical... Agent: Haynes And Boone, LLP

20070200577 - Probe repair methods: A method and apparatus for repairing a probe on a probe card is provided. A plurality of beams is formed on a beam panel. The plurality of beams includes a replacement beam. After identifying a damaged beam on the probe card, the damaged beam is removed from the probe card.... Agent: Hickman Palermo Truong & Becker, LLP

20070200574 - Sheet-like probe, method of producing the probe, and application of the probe: A sheet-like probe has a porous film. In the sheet-like probe, a contact film is penetratingly supported at each position of through-holes formed in the porous film, and a peripheral edge of the contact film and the porous film are integrated such that a flexible resin insulation layer is included... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070200572 - Structure for coupling probes of probe device to corresponding electrical contacts on product substrate: An apparatus for testing integrated circuit devices includes a probe device having a plurality of probes, a first substrate comprising a product substrate having a first surface and an array of electrical contacts disposed on the first surface thereof, and a second substrate disposed between the probes and the first... Agent: F. Chau & Associates, LLC

20070200570 - Test fixture for holding signal terminals and related method for assembling the test fixture: A test fixture has a socket, a plurality of signal terminals, and a fixing module. A plurality of holes are formed in the socket for installing the signal terminals. The fixing module is installed on the socket to fix the signal terminals in the holes. The number of the signal... Agent: North America Intellectual Property Corporation

20070200571 - Verifying individual probe contact using shared tester channels: Verifying good electrical contact between pads of multiple circuit dies and a probe card or test device, where the driver channels of the test device or probe card device are connected in parallel to corresponding contacts on the circuit dies. Each of a plurality of test device or probe card... Agent: Edell, Shapiro & Finnan, LLC

20070200580 - Wafer probe: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070200581 - Automated characterization system for laser chip on a submount: A temperature-controlled system for testing a laser die mounted on a submount is disclosed. The testing system comprises a base having a motor-driven translation platform. The translation platform includes a first testing site having a two-stage temperature control system mounted on a base portion. The temperature control system includes a... Agent: Workman Nydegger (f/k/a Workman Nydegger & Seeley)

20070200584 - High frequency cantilever-type probe card: A cantilever-type probe card includes a circuit board having a first surface on which a plurality of signal contact pads and grounding contact pads are formed, a locating ring mounted on the first surface of the circuit board, and a plurality of probe pins, each of which is partially supported... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20070200583 - Plunger and chip-testing module applying the same: A plunger is suitable for a chip-testing module having a probe card, which has a circuit board and a membrane. The membrane has a circuit layer disposed on a first membrane surface of the membrane, conductive through-vias penetrating the membrane, and bumps disposed on a second membrane surface opposite to... Agent: J.c. Patents, Inc. Suite 250

20070200582 - Probe and method of manufacturing a probe: A probe 10 to be used when inspecting characteristics of an object of inspection includes: a bar-shaped base member 3 forming a main body; a nickel plating layer 4 constituting a ground layer and a gold plating layer 5 constituting an outermost layer formed on a surface of the base... Agent: Armstrong, Kratz, Quintos, Hanson & Brooks, LLP Kratz, Quintos & Hanson, LLP

20070200585 - Semiconductor wafer, semiconductor chip, semiconductor device, and wafer testing method: A semiconductor wafer of the present invention includes switch circuits each connecting a corresponding internal circuit formed in the semiconductor chip and the test pad. The semiconductor wafer also includes switch control pads which are provided in the scribing region or the semiconductor chips. Voltages of the switch control pads... Agent: Birch Stewart Kolasch & Birch

20070200587 - Versatile semiconductor test structure array: This invention discloses a semiconductor test structure array comprising a plurality of unit cells for containing devices under test (DUTs) arranged in an addressable array, and an access-control circuitry within each unit cell for controlling accesses to one or more DUTs, wherein the access-control circuitry comprises at least four identical... Agent: L. Howard Chen, Esq. Kirkpatrick & Lockhart Preston Gates Ellis LLP

20070200588 - Fiducial markings for quality verification of high density circuit board connectors: Methods for qualifying the accuracy of a circuit board may include providing a printing mask pattern for first and second sides of the circuit board with a first sequence of spaced indicia parallel to a first edge of the printed circuit board, and a second sequence of spaced indicia parallel... Agent: Emcore Corporation

20070200586 - Method of testing for power and ground continuity of a semiconductor device: A method of testing for power and ground continuity of a semiconductor device having Input and Output (IO) pins and at least a pair of power and ground pins includes identifying the power and ground pins of the device. A victim pin is selected from the IO pins of the... Agent: Freescale Semiconductor, Inc. Law Department

20070200589 - Test apparatus and test method for liquid crystal display device: A test apparatus for a Liquid Crystal Display (LCD) device receives a mode input signal representing whether the LCD device is driven in a normal voltage driving mode or a high voltage driving mode. The test apparatus transmits a voltage to the LCD device and transmits a control signal to... Agent: H.c. Park & Associates, PLC

20070200590 - Saturation detection circuits: This invention generally relates to saturation detection circuits, in embodiments for substantially lossless detection of saturation of power switches in power integrated circuits. We describe a saturation detection circuit for detecting saturation of a power semiconductor device, the circuit including a said power semiconductor device having an input terminal and... Agent: Knobbe Martens Olson & Bear LLP

20070194772 - Assessing soundness of motor-driven devices: A method of assessing soundness of a motor-driven device, i.e., a fuel pump. The method includes sampling power input while providing substantially constant power to the motor. A frequency spectrum of the sampled input is used to determine an efficiency of the motor. The determined efficiency is related to soundness... Agent: Harness Dickey & Pierce, PLC

20070194774 - Anode assembly for cathodic protection: The deterioration of reinforced concrete structures by galvanic corrosion is a well understood problem, particularly as it affects roads, bridges, parking garages and buildings that use reinforcing steel in their construction. Galvanic cathodic protection is typically provided for such reinforced concrete structures using embedded sacrificial anodes, such as zinc, aluminum,... Agent: James A. Lucas

20070194773 - Method and device for detecting contaminants on turbine components: To detect contaminants on turbine components of a turbine, at least one current oscillation characteristic value of at least one turbine component is determined. Said value is preferably compared to an oscillation reference value. This permits contaminants to be detected, as the weight of the latter modifies the oscillation characteristic... Agent: Siemens Corporation Intellectual Property Department

20070194775 - Apparatus for measuring numbers of particles and method thereof: The present invention discloses apparatus and method for rapidly and easily measuring the numbers and size distribution of low concentration particles which exist in a clean space such as a clean room. The apparatus and method according to the present invention measures the numbers of particles by charging particles to... Agent: Lowe Hauptman Berner, LLP

20070194776 - Real-time device characterization and analysis: A measurement system for determining at least one characteristic of a device under test (DUT) at at least one frequency is described. The measurement system comprises a network analyzer being in connection at least with a first source via a first connector and a second source via a second connector.... Agent: Knobbe Martens Olson & Bear LLP

20070194777 - Power monitoring system: A power monitoring system with multiple current sensors.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070194778 - Guarded tub enclosure: A probe station with an improved guarding structure.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070194779 - Method of assembling and testing an electronics module: An electronics module is assembled by demountably attaching integrated circuits to a module substrate. The module is then tested at a particular operating speed. If the module fails to operate correctly at the tested speed, the integrated circuit or circuits that caused the failure are removed and replaced with new... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070194780 - Generator of a.c. signals, such as reference signals, and aircraft equipped with such a generator: A second circuit (B2) is capable of generating alternations of a second a.c. signal (S2), phase-shifted relative to the first signal (S1), between the first potential (V+) formed by the first voltage source and the second potential (V−). Such a generator can be used, for example, in a flight control... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070194782 - Inductive position sensor with common mode corrective winding and simplified signal conditioning: An inductive position sensor for rotary motion includes a transmitter coil and a receiver coil, the receiver coil generating a receiver signal when the transmitter coil is excited by an alternating current source. A moveable coupler element modifies the inductive coupling between the transmitter coil and the receiver coil so... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c

20070194781 - Position sensor: A position encoder is provided for indicating the relative position between first and second relatively move members. One of the members carries a magnetic field generator which generates a magnetic field whose magnitude and direction vary with position. In a preferred embodiment, the other member carries an excitation winding, one... Agent: Alston & Bird LLP

20070194783 - Low power lvdt orthogonal magnetic signal conditioner: A linear variable differential transformer (LVDT) system is disclosed. The system has an LVDT. A signal conditioner circuit is coupled to the LVDT. The signal conditioner circuit uses an inductance of the LVDT primary as a micro-power excitation carrier frequency to lower a drive power of the system. The signal... Agent: Weiss & Moy PC

20070194784 - Non-contacting magnetic position sensor, and method of determining the position between two relatively-movable members: A non-contacting position sensor (20) for sensing and determining the position between two relatively-movable members (23, 31) includes a pair of flux-conductive converging polepieces (21, 22) mounted on one of the members (23); a magnetic sensor (29) mounted on the one member and positioned proximate the convergent polepiece ends, this... Agent: Phillips Lytle LLP Intellectual Property Group

20070194785 - Rotary input apparatus: A rotary input apparatus is disclosed. The rotary input apparatus comprising a rotatable wheel, a multi-pole ring-type magnet secured to the bottom of the wheel to rotate together with the wheel, a printed circuit board on which one or more detection elements are mounted that are capable of detecting the... Agent: Staas & Halsey LLP

20070194786 - Rotation angle detecting device: A rotation angle detecting device is rotated by a rotating object via a gear mechanism to detect a rotation angle of the rotating object. The rotation angle detecting device includes a housing, a magnet rotor unit having a permanent magnet and a central hole, a magnetic sensor unit including a... Agent: Nixon & Vanderhye, PC

20070194787 - Magnetic sensor, production method thereof, rotation detection device, and position detection device: A one-chip type magnetic sensor is provided in which thin-film anisotropic magnetoresistance elements are formed on an IC substrate. Applied magnetic fields can be detected in the magnetic sensor in vertical and horizontal directions, and detection sensitivity can be adjusted with respect to direction. The influence on a magnetic-sensitive property... Agent: Young & Thompson

20070194788 - Nuclear magnetic resonance detection in inhomogeneous magnetic fields: Methods and systems for compensating for static magnetic field inhomogeneities during nuclear magnetic resonance detection are disclosed. Application of radio frequency pulses and/or magnetic field gradients may be used to correct for spin dephasing caused by the inhomogeneities. The methods and system may be used to improve signal-to-noise ratios in... Agent: Knobbe Martens Olson & Bear LLP

20070194789 - Nmr measurement method: There is disclosed an NMR measurement method and NMR apparatus in which the temperature of the NMR detection coil or the RF irradiation coil hardly varies if pulsed RF power is applied to the coil during NMR measurements. The apparatus includes the detection coil or the RF irradiation coil, a... Agent: The Webb Law Firm, P.C.

20070194790 - Method and magnetic resonance apparatus for monitoring apparatus interaction with magnetically-attracted objects: A magnetic resonance apparatus has a magnetic field generation device for generating a strong magnetic field, and at least one detection device for automatic detection of an object attracted onto or into the magnetic resonance apparatus due to interaction with the magnetic field.... Agent: Schiff Hardin, LLP Patent Department

20070194791 - Method and apparatus for monitoring the condition of a battery by measuring its internal resistance: A method comprises coupling a first power transistor as a first external load in series with the battery, coupling a second power transistor as a second external load in series with the battery, conducting each power transistor to supply a transient large current to the battery for sampling a group... Agent: Troxell Law Office PLLC

20070194792 - Non-metallic flow-through electrodeless conductivity sensor with leak and temperature detection: A non metallic flow through electrodeless conductivity sensor is provided with a conduit having primary and secondary process fluid flow paths to form a fluid loop. At least one drive and one sense toroid surround the conduit on the fluid loop. Voltage supplied to the drive toroid induces a current... Agent: Richard L. Sampson Sampson & Associates, P.C.

20070194793 - Method and apparatus for measuring a parameter of a vehicle electrical system: An apparatus for measuring electrical parameters for an electrical system measures a first and second parameters of the electrical system between connections to the electrical system. A processor determines a third electrical parameter of the electrical system as a function of the first parameter and the second parameter.... Agent: Judson K. Champlin Westman, Champlin & Kelly

20070194794 - Test apparatus and test method: Change in power supply voltage supplied to a device under test is controlled. There is provided a test apparatus for testing a device under test, the test apparatus including: a reference voltage supply section for supplying a reference voltage; a field effect transistor provided between a positive side terminal and... Agent: Osha Liang L.L.P.

20070194795 - Test apparatus and test method: A test apparatus to test a device under test (DUT) to which a reference voltage of a predetermined high voltage is supplied is provided. The test apparatus includes a reference voltage applying section that applies the reference voltage to the DUT, wherein the reference voltage defines a voltage level that... Agent: Osha Liang L.L.P.

20070194796 - Reflectometry test system using a sliding pseudo-noise reference: A technique for reflectometry testing of a signal path is disclosed. The technique includes injecting a test signal based on a probe pseudo-noise sequence into the signal path and obtaining a response signal. A sliding reference pseudo-noise sequence is correlated against the response signal. Both the probe sequence and the... Agent: Thorpe North & Western, LLP.

20070194797 - Current detection printed board, voltage detection printed board, and current/voltage detector using same, and current detector and voltage detector: A current detection printed board includes: a board having a penetration hole that penetrates the board; and at least one wire that is formed in a coiled shape having both ends by penetrating the board along the periphery of the penetration hole and alternately connecting a front surface layer and... Agent: Greenblum & Bernstein, P.L.C

20070194798 - Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit: To decrease the circuit scale necessary for the calibration of the output circuit and to decrease the time required for the calibration operation. The invention includes a first output buffer and a second output buffer that are connected to a data pin, and a calibration circuit that is connected to... Agent: Mcdermott Will & Emery LLP

20070194799 - Method to determine the contents level of a first fluid in a container and to determine a presence of a second fluid below the first fluid and level measurement apparatus to execute said method: A level measurement device to measure the fill level of a fluid in a container, and a method to determine the contents level of a first fluid in a container and a presence of a second fluid below the first fluid. Microwave signals generated in the level measurement device are... Agent: Bacon & Thomas, PLLC

20070194800 - Micropower voltage-independent capacitance measuring method and circuit: A circuit for measuring an unknown capacitance includes a reference capacitor having a known capacitance, an oscillator timing circuit, a variable frequency oscillator and a microcontroller. The oscillator timing circuit includes switches which selectively couple the unknown capacitance and the reference capacitor to the oscillator timing circuit. The variable frequency... Agent: Bodner & O'rourke, LLP

20070194801 - Oil monitoring system: An embodiment of the present invention provides for a sensing element comprising a non-conductive housing with three chambers for detecting oil conductivity, additive depletion and oxidation, and water contamination, respectively. Through the monitoring of an array of oil sensors, an early warning of oil degradation due to oxidation is provided.... Agent: Carr & Ferrell LLP

20070194802 - Method of testing circuit elements on a semiconductor wafer: A semiconductor device test apparatus according to the present invention includes a circuit board 103 and a film 105. A plurality of electrodes 103c are formed at the circuit board 103 at positions that face opposite a plurality of electrodes 201a at a device to be measured 201, whereas bumps... Agent: Rabin & Berdo, PC

20070194803 - Probe holder for testing of a test device: A system for low-current testing of a test device includes a probing device for probing a probing site on the test device. The probing device includes a dielectric substrate having first and second sides, an elongate conductive path on the first side of the substrate, an elongate probing element connected... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070188158 - Locating device: A locating device, in particular a hand-held locating device, for detecting objects enclosed in a medium, having a housing and at least one sensor system provided in a housing, as well as an opening penetrating the device. The opening in the measuring device and penetrating the device is illuminable by... Agent: Kenyon & Kenyon LLP

20070188159 - Latch circuit and semiconductor integrated circuit device that has it: A semiconductor integrated circuit comprises: a latch circuit constituted with a drive inverter and a feedback inverter so as to be connected in a cyclic form, wherein at least one of the drive inverter and the feedback inverter comprises a MOS transistor; and a current source connected to at least... Agent: Mcdermott Will & Emery LLP

20070188160 - Detection seat for ic detection device: A detection seat for an IC detection device includes a frame and an integrated circuit coupling seat. The frame is mounted on a detection board of an integrated circuit detection device. The IC coupling seat includes an outer perimeter releasably engaged with the frame. The IC coupling seat includes a... Agent: Rosenberg, Klein & Lee

20070188162 - Full waveguide: The invention concerns position sensors, in particular their detector unit. The role of the existing invention is to simplify a position sensor of this construction principal so that function is guaranteed with sufficient accuracy, despite clearly lower production costs. It was determined that when using an electrically conductive waveguide, which... Agent: Head, Johnson & Kachigian

20070188161 - Magnetic material detection device and mobile object detection system: The purpose is to achieve size reduction, weight reduction and thickness reduction of a magnetic material detecting device (1). The device comprises a liearly displaceable magnet (12) and a Hall IC (14) for detecting the displacement of the magnet (12). When an iron piece (28) is positioned within a predetermined... Agent: Glenn Patent Group

20070188163 - Sensor device: A sensor device is suggested, comprising a sensor module with a housing, with at least one sensor element which is arranged in the housing, at least one active sensor face and a sensor module connection device and a holding module for holding the sensor module, a holding module connection device... Agent: Lipsitz & Mcallister, LLC

20070188164 - Continuously detecting the position of a moving element in a transmission ratio changer system: A device for detecting the linear and angular positions of a moving element such as a gearchange finger in a motor vehicle gearbox, the moving element carrying at least one permanent magnet that is movable past a printed circuit card mounted on a stationary support and carrying magnetoresistance cells. The... Agent: Alston & Bird LLP

20070188165 - Rotational angle detector: Conductive wires run parallel to each other and connect a Hall element and an ECU. The conductive wire includes an extracting part and a wiring part. The extracting part runs along a surface of a base, on which the Hall element is positioned, and in a direction of a sensitivity... Agent: Nixon & Vanderhye, PC

20070188166 - Magnetic head testing apparatus and method of testing a magnetic head: A magnetic head testing apparatus and a method of testing a magnetic head cause electromagnetic waves to act upon a magnetic head and therefore can test the characteristics of a magnetic head more precisely and improve the quality of magnetic heads. The magnetic head testing apparatus includes: a magnetic field... Agent: Armstrong, Kratz, Quintos, Hanson & Brooks, LLP

20070188167 - Testing and manufacturing method of magnetic heads: A magnetic head suffers mechanical stresses by striking against a magnetic disc surface and dust, so that there are problems such as the reduction of reproduction output due to the mechanical stresses and the reversal of output polarity due to the mechanical stresses. Embodiments in accordance with the present invention... Agent: Townsend And Townsend And Crew LLP

20070188168 - Magnetic sensor: A coil is operatively associated with a magnetic circuit of a vehicle body, and is adapted to cooperate with a time-varying magnetic flux therein responsive to a condition of the vehicle body sensed by the magnetic sensor. A capacitance in series with the coil provides for reducing the reactance of... Agent: Raggio & Dinnin, P.C.

20070188169 - Method and device for determining the thickness of material using high frequency: c

20070188170 - Fluxgate and fluxgate magnetometers: A flexible fluxgate including: at least two ferromagnetic or ferrimagnetic, flexible cores; at least two sets of a plurality of windings of an electrically conductive material, at least one set of windings being wound around each of the cores; and an electrically conductive, flexible shield enclosing the cores and the... Agent: Thompson Hine L.L.P. Intellectual Property Group

20070188171 - Frequency swept excitation for magnetic resonance: A method of magnetic resonance is provided that uses a frequency swept excitation wherein the acquired signal is a time domain signal is provided. In one embodiment, the sweeping frequency excitation has a duration and is configured to sequentially excite isochromats having different resonant frequencies. Acquisition of the time domain... Agent: Dorsey & Whitney LLP Intellectual Property Department

20070188172 - Frequency swept excitation for magnetic resonance: A method of magnetic resonance is provided that uses a frequency swept excitation wherein the acquired signal is a time domain signal is provided. In one embodiment, the method comprises, applying a sweeping frequency excitation and acquiring a time domain signal. The sweeping frequency excitation has a duration and is... Agent: Dorsey & Whitney LLP Intellectual Property Department

20070188174 - Nmr solenoidal coil for rf field homogeneity: An NMR signal acquisition device that can increase the magnetic field homogeneity in a high frequency magnetic field by one of the following. (a) Current paths each having a different inductance are provided to adjust the diversion ratio of the current, (b) A current path branch point is provided in... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070188173 - Asymmetric ultra-short gradient coil for magnetic resonance imaging system: A magnetic field gradient coil includes upper and lower sections (40, 42) that define a coil bore (44) therebetween. The upper section (40) has an arcuate curvature (Cupper)transverse to a longitudinal direction and a length (Lupper)in the longitudinal direction that is smaller than a longitudinal length (Llower) of the lower... Agent: Philips Intellectual Property & Standards

20070188175 - Self-shielded packaging for circuitry integrated with receiver coils in an imaging system: An improved magnetic resonance (MR) imaging system (10) is provided. A plurality of receiver coils (12) may be configured to supply respective coil output signals based on a plurality of magnetic resonance response signals sensed by the receiver coils. Each receiver coil defines an enclosure constituting a Faraday cage. At... Agent: General Electric Company Global Research

20070188176 - Measuring device:

20070188177 - Pavement material microwave density measurement methods and apparatuses: A method of obtaining a material property of a pavement material from a microwave field generally includes generating a microwave frequency electromagnetic field of a first mode about the pavement material. The frequency response of the pavement material in the electromagnetic field can be measured, such as by a network... Agent: Jenkins, Wilson, Taylor & Hunt, P. A.

20070188178 - Apparatus and method for sensing objects proximate to fluid flows: An apparatus senses an object proximate to a laminar fluid flow by using the fluid as part of the sensing system. For more distant objects, an electrical system detects the capacitance between the proximate object and the flowing fluid via an impedance measurement. For objects touching the flow, an optical... Agent: Mitsubishi Electric Research Laboratories, Inc.

20070188179 - Printed capacitive sensor: The invention relates to a flexible, resilient capacitive sensor suitable for large-scale manufacturing. The sensor comprises a dielectric, an electrically conductive detector and trace layer on the first side of the dielectric layer comprising a detector and trace, an electrically conductive reference layer on a second side of the dielectric... Agent: Cheryl J. Brickey Milliken & Company

20070188180 - Printed capacitive sensor: The invention relates to a flexible, resilient capacitive sensor suitable for large-scale manufacturing. The sensor comprises a dielectric, an electrically conductive detector and trace layer on the first side of the dielectric layer comprising a detector and trace, an electrically conductive reference layer on a second side of the dielectric... Agent: Cheryl J. Brickey Milliken & Company

20070188181 - Circuit configuration for recognizing the occupancy of a seat and seatbelt warning in a motor vehicle: A circuit configuration recognizes the occupancy of a seat and triggers a seatbelt warning in a motor vehicle. Resistance elements are disposed in a separated and flat manner on a motor vehicle seat, in particular on a sensor seating mat, which alters the resistance values when a force is exerted... Agent: Lerner Greenberg Stemer LLP

20070188182 - Probe tips and method of making same: A probe includes a substrate and a tetragonal structure disposed on the substrate that has four end points. Three of the end points are disposed adjacent to the substrate. A fourth of the end points extends outwardly and substantially normal to the substrate. In a method of making a probe... Agent: Bryan W. Bockhop, Esq.

20070188183 - Secure memory card with life cycle phases: A secure memory card with encryption capabilities comprises various life cycle states that allow for testing of the hardware and software of the card in certain of the states. The testing mechanisms are disabled in certain other of the states thus closing potential back doors to secure data and cryptographic... Agent: Davis Wright Tremaine LLP

20070188184 - Method and apparatus for measuring die-level integrated circuit power variations: A system that determines power consumption on an IC chip. The system includes a test structure located within the IC chip variations which includes one or more gates which receives power from a power source, wherein each gate has a different drive strength, and wherein the output of each gate... Agent: Apple Computer, Inc. C/o Park, Vaughan & Fleming LLP

20070188185 - Method of inspecgin a leakage current characteristic of a dielectric layer: A method of inspecting a leakage current of a dielectric layer on a substrate including a cell array region having a plurality of cell blocks including a patterned structure, the dielectric layer formed on the patterned structure, and a peripheral circuit region includes depositing a corona ion charge on a... Agent: Lee & Morse, P.C.

20070182401 - Three- or four-pole low-voltage power switch with rogowski coils operating as current sensors: A three or four pole low-voltage power switch is disclosed wherein the switch is partly provided with a device for detecting ground faults. For this purpose, the current vectorial sum must be produced in the three or four conductors of a monitored network. For the switches of this type, output... Agent: Harness, Dickey & Pierce, P.L.C

20070182402 - Skew adjusting method, skew adjusting apparatus, and test apparatus: There is provided a skew adjusting apparatus for adjusting a skew between a positive-side differential signal and a negative-side differential signal in differential signals inputted from an outside device via outside transmission lines, having a positive-side transmission line for propagating the positive-side differential signal inputted to an input end, a... Agent: Osha Liang L.L.P.

20070182403 - Device for monitoring the position and displacement of a brake pedal: Disclosed is a device for monitoring the position and movement of a brake pedal, including a master cylinder 1; 102 with an integrated position generator for monitoring the position of a piston 2; 105 within a housing 6; 103 for use in a controlled brake system for motor vehicles, in... Agent: Continental Teves, Inc.

20070182405 - Magnetic sensor: The magnetic sensor in the invention includes a detecting section that detects a change of magnetic flux due to a movement of the magnetic movable, comparator circuits constituting a converting section that converts a change of magnetic flux detected by the detecting section into an electric amount, and a D-FF... Agent: Sughrue Mion, PLLC

20070182406 - Encoder: To easily manufacture an encoder (1), in which N-poles (5) and S-poles (6) of magnets are arranged alternately in a circumferential direction and in which an unequal pitch portion (8) is provided in a part on a circumference, without using a magnetizing head of a special shape having an unequal... Agent: Jacobson Holman PLLC

20070182404 - Flexible sensor input assembly: A sensor assembly for determining rotational angular displacement of a first moving component in a machine relative to a second component in the machine includes a base, a magnet housing, and a flexible member. The base is configured to be rigidly secured to the first moving component for movement therewith.... Agent: Michael Best & Friedrich, LLP

20070182407 - Magnetic sensor and method of producing the same: On a single chip are formed a plurality of magnetoresistance effect elements provided with pinned layers having fixed magnetization axes in the directions that cross each other. On a substrate 10 are formed magnetic layers that will become two magnetic tunnel effect elements 11, 21 as magnetoresistance effect elements. Magnetic-field-applying... Agent: Dickstein Shapiro LLP

20070182408 - Downhole high resolution nmr spectroscopy with polarization enhancement: An apparatus and method is discussed for characterizing a fluid sample downhole of aliphatic hydrocarbon compounds, aromatic hydrocarbon compound, or connate mud filtrates containing carbon-13 isotopes using an enhanced nuclear magnetic resonance (NMR) signal on a measurement-while-drilling device. To enhance the carbon-13 NMR signal these nuclei are being hyperpolarized. Either... Agent: Madan, Mossman & Sriram, P.C.

20070182409 - Wireless mr receiving coil system: A magnetic resonance imaging system includes a local coil assembly (30) which is disposed in an examination region (14) electrically isolated from the scanner. The coil assembly includes a plurality of coils (34) each with an electronics module. The received resonance signals that are digitized by an analog to digital... Agent: Philips Intellectual Property & Standards

20070182410 - Coil sensitivity estimation for parallel imaging: In a parallel or SENSE imaging technique in an MRI system (40), a calibration scan is conducted to generate a calibration image (86) indicative of sensitivity profiles of parallel imaging coils (76a, . . . , 76n) also in the regions where the magnetic field is distorted. This is accomplished... Agent: Philips Intellectual Property & Standards

20070182411 - Generalized mri reconstruction with correction for multiple image distortion: Disclosed is an effective algorithm to correct motion-induced phase error using an iterative reconstruction. Using a conjugate-gradient (CG) algorithm, the phase error is treated as an image encoding function. Given the complex perturbation terms, diffusion-weighted images can be reconstructed using an augmented sensitivity map. The mathematical formulation and image reconstruction... Agent: Beyer Weaver LLP

20070182412 - Regularized variable density sense: A magnetic resonance imaging apparatus includes a plurality of radio frequency coils (34) that acquire variable density sensitivity encoded data that is undersampled at least away from the center of k-space. A reconstruction processor (52) for each coil reconstructs: a regularization image reconstructed from a higher density portion of the... Agent: Philips Intellectual Property & Standards

20070182415 - Mounting device for monitoring a local gradient coil unit in a gradient coil system: A mounting device for a local gradient coil unit for mounting same in the examination area of a magnetic resonance unit has one or more guide rails, which are able to be arranged in the examination area, supporting the gradient coil unit, with a locator structure for positioning the gradient... Agent: Schiff Hardin, LLP Patent Department

20070182414 - Short element tem coil for ultra-high field mr: A transverse electromagnetic (TEM) coil is provided. The TEM coil includes an electrically conductive shell and an end plate disposed at a first end of the shell. The TEM coil also includes a plurality of TEM elements disposed within the shell, the plurality of TEM elements being shorter than the... Agent: Philips Intellectual Property & Standards

20070182413 - Single-sided nmr sensor with microscopic depth resolution: A low-cost single-sided NMR sensor to produce depth profiles with microscopic spatial resolution is presented. The open geometry of the NMR sensor provides a non-invasive and non-destructive testing method to characterize the depth structure of objects of arbitrary size. The permanent magnet geometry generates one plane of constant magnetic field... Agent: William Collard Collard & Roe, P.C.

20070182416 - Methods and apparatus for detecting leaks in fluorescent lamps: Methods and apparatus are provided for identifying the presence of leaks in a fluorescent bulb or other lamp suitable for use as a backlight in an avionics or other liquid crystal display (LCD). The lamp is first placed in a bath of helium or another vaporous substance having relatively small... Agent: Honeywell International Inc.

20070182417 - Electrical measurement of cell invasion: The electrical measurement of invasive cell movement is provided. A gel layer is added to a well including a substrate having an electrode thereon. A medium is added over the gel layer. One of the medium and the gel layer can include cells and the other of the medium and... Agent: Hoffman Warnick & D'alessandro, LLC

20070182418 - Electrochemical thermodynamic measurement system: The present invention provides systems and methods for accurately characterizing thermodynamic and materials properties of electrodes and electrochemical energy storage and conversion systems. Systems and methods of the present invention are capable of simultaneously collecting a suite of measurements characterizing a plurality of interconnected electrochemical and thermodynamic parameters relating to... Agent: Greenlee Winner And Sullivan P C

20070182419 - Oscillating device, electric potential measuring device, light deflecting device, and image forming apparatus: Oscillating device including a movable member that is vibratable, a fixed section that is provided opposite to the movable member, a driving unit configured to drive the movable member, and at least two electrodes configured to generate a first signal corresponding to a drive state of the movable member. At... Agent: Fitzpatrick Cella Harper & Scinto

20070182421 - Apparatus for detecting an attack on an electric circuit: An apparatus for detecting an attack on an electric circuit, wherein the electric circuit includes a current consumption threshold value discriminator to determine whether current consumption of the electric circuit exceeds a predetermined threshold value or not, and to generate a binary current limitation signal depending therefrom. The apparatus includes... Agent: Dickstein Shapiro LLP

20070182420 - Method and system for estimating driving point voltage: A method and system for estimating a driving point voltage of a resistance weld system. The method includes periodically sampling a supplied voltage and a supplied current of a system to obtain a plurality of sets of a sampled voltage value and a sampled current value. The sampled values are... Agent: Richard C. Himelhoch Wallenstein & Wagner, Ltd.

20070182422 - Probe for electrical measurement methods, especially eddy current measurements: Disclosed is a probe which is configured in a flexible manner by means of a flexible substrate so as to be adjustable to different radii of curvature of a test piece. The lining is also embodied in an elastic manner.... Agent: Siemens Corporation Intellectual Property Department

20070182423 - Delay line calibration circuit comprising asynchronous arbiter element: A delay line calibration circuit is disclosed herein. The calibration circuit has an arbiter circuit having a unit for determining which of two signals that arrive first; a first and a second synchronous element each having an input for receiving a clock signal, and one of them having a unit... Agent: Maginot, Moore & Beck

20070182424 - High frequency circuit analyser: An analyzer for measuring the response of an electronic device (DUT 206) to an RF input signal from a signal generator (240a) is described. An active load pull circuit (201) is connected to the DUT 206, which receives an output signal from the DUT 206 and then feeds a modified... Agent: Mr. Christopher John Rourk Jackson Walker LLP

20070182425 - Safety mechanism for holiday detector: The present invention relates to a safety mechanism for holiday detectors. When a user properly holds a holiday detector, a safety button is engaged which allows the holiday detector to be turned on. If the safety button is not engaged, the holiday detector cannot be turned on. The holiday detector... Agent: David A. Schnider

20070182426 - Pulsed methods and systems for measuring the resistance of polarizing materials: A system and method for measuring resistance of a polarizing material are disclosed. The system includes a voltage divider circuit having a first resistive element of known resistance and the polarizing material of unknown resistance and a processing unit. The processing unit is electrically-coupled to the voltage divider circuit and... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP

20070182427 - Cantilever microprobes for contacting electronic components and methods for making such probes: Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to various designs of cantilever-like probe structures. Some embodiments are directed to methods for fabricating such cantilever structures. In some embodiments, for example, cantilever... Agent: Microfabrica Inc. Att: Dennis R. Smalley

20070182431 - Probe card and probe device: The probe card is configured such that the outline of the probe card is formed almost round shape and a plurality of connectors for being electrically connected with a tester are provided on the upper surface thereof along the outline. A substrate with many probes arranged thereon is provided on... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070182430 - Probe head with machine mounting pads and method of forming same: A probe head for testing semiconductor wafers has a probe contactor substrate have a first side and a second side. A plurality of probe contactor tips are coupled to the first side and the plurality of tips lie in a first plane. A plurality of mounting structures are coupled to... Agent: Pillsbury Winthrop Shaw Pittman LLP

20070182428 - Electrical characteristics measurement method and electrical characteristics measurement device: The electrical characteristics of a measurement object 8 are measured using an electrical characteristics measurement device in which a probe 1 comprising a signal terminal 2, a ground terminal 3, and a variable resistance element 4 is connected via a coaxial cable 5 to a measuring instrument 6. The calibration... Agent: Hayes Soloway P.C.

20070182429 - Triaxial interconnect system: A connection system for connecting test equipment to a device under test (DUT) includes a first pair of equal-length triaxial cables, each having a desired characteristic impedance between a center conductor and an outer conductor, the outer conductor of each first cable being connected to each other at respective proximal... Agent: Pearne & Gordon LLP

20070182432 - Insert with support for semiconductor package: An insert for loading a semiconductor package having external connection terminals may have a support plate. The support plate may have an upper surface with first contact pads and a lower surface with second contact pads. The first contact pads may be electrically connected to the external connection terminals of... Agent: Harness, Dickey & Pierce, P.L.C

20070182433 - Wafer holder, and wafer prober and semiconductor manufacturing apparatus provided therewith: A wafer holder that includes a cooling module for rapid cooling, that can further improve the heating uniformity of a wafer, and that can be appropriately used with a wafer prober, a coater/developer, or the like. The wafer holder includes a mounting stage arranged to mount a wafer on a... Agent: GlobalIPCounselors, LLP

20070182434 - Contact assembly for a chip card: A chip-card holder for connecting contact pads of a chip card with connections of device circuitry. The holder has a dielectric holder body engageable between the chip card and the device connections, a plurality of contact elements on the body each having a contact part engageable with a respective one... Agent: K.f. Ross P.C.

20070182435 - Configurations and method for carrying out wafer level unclamped inductive switching (uis) tests: This invention discloses a circuit for performing an unclamped inductive test on a metal oxide semiconductor field effect transistor (MOSFET) device driven by a gate driver. The circuit includes a current sense circuit for measuring an unclamped inductive testing (UIS) current that increases with an increase of a pulse width... Agent: Bo-in Lin

20070182436 - Technique for offsetting signal lines from the glass weave of resin/glass materials: A technique for offsetting an orientation of signal lines in a printed circuit board involves rotating the printed circuit board prior to or as the signal lines are fabricated in the printed circuit board. Such offsetting results in a printed circuit board in which the signal lines are not orthogonal... Agent: Osha Liang L.L.P./sun

20070182437 - Test handler and operation method thereof: A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby... Agent: Roylance, Abrams, Berdo & Goodman, L.L.P.

20070182438 - Wireless test cassette: A base controller disposed in a test cassette receives test data for testing a plurality of electronic devices. The base controller wirelessly transmits the test data to a plurality of wireless test control chips, which write the test data to each of the electronic devices. The wireless test control chips... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070182439 - Method for measuring fet characteristics: A coefficient indicating the relationship between a measurement voltage of voltage measuring unit and a voltage drop in a drain bias voltage due to drain current is determined based on at least an S parameter of a measuring system and an input impedance of the measuring unit. A voltage drop... Agent: Paul D. Greeley, Esq. Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20070182443 - Display apparatus: A display apparatus, equipped with a common input terminal inputting different video signals, can discriminate the type of an input video signal entered from the common input terminal. The display apparatus includes an input terminal inputting different video signals. A synchronizing signal separation unit separates a synchronizing signal from a... Agent: Canon U.s.a. Inc. Intellectual Property Division

20070182442 - Display device and electronic apparatus having the display device: To provide a display device having a test circuit with high accuracy for testing in the step after a counter substrate is attached and before shipping, and to provide a display device having a correction circuit inside the display device, for the case where a defect occurs. A pixel circuit... Agent: Fish & Richardson P.C.

20070182440 - Driving chip package, display device including the same, and method of testing driving chip package: A driving chip package, a display device including the same, and a method of testing the driving chip package are disclosed. Any contact failure between the driving chip package and the display substrate can be easily detected, thus reducing the quality management cost and preventing additional failures and increasing the... Agent: F. Chau & Associates, LLC

20070182441 - Picture quality controlling system: A picture quality control system can determine a location of a display panel defect. The system can calculate data used to compensate for the display defect and modulate the compensation data on a video signal to compensate for the defect. The defect may be associated with a pixel or with... Agent: Brinks Hofer Gilson & Lione

20070176592 - Portable information terminal apparatus, voltage measurement apparatus, voltage measurement method and program thereof: The measurement unit measures a voltage by converting it from analog to digital and outputs a measurement value. The changeover unit, being connected to a battery and a reference voltage source generating a highly accurate fixed voltage, selects one of them and applies it to the measurement unit. The voltage... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070176593 - Transmission sensor with overmolding and method of manufacturing the same: A sensor including a bobbin including a first region adapted to receive windings and a second region defining a cavity formed in the bobbin. A first electrical terminal is coupled to the bobbin and disposed in the cavity and a second electrical terminal is coupled to the bobbin and disposed... Agent: Krieg Devault LLP

20070176594 - Transmission sensor with overmolding and method of manufacturing the same: A sensor including a bobbin including a first region adapted to receive windings and a second region defining a cavity formed in the bobbin. A first electrical terminal is coupled to the bobbin and disposed in the cavity and a second electrical terminal is coupled to the bobbin and disposed... Agent: Krieg Devault LLP

20070176595 - Transmission sensor with overmolding and method of manufacturing the same: A sensor including a sensor core is disclosed. The sensor core includes a magnet, a pole piece, a bobbin, at least two terminals coupled to the bobbin, and a conductor wound about the bobbin and coupled to the terminals. At least a portion of the windings are disposed about at... Agent: Krieg Devault LLP

20070176596 - Simulation of magnetic field induced vibrations in implantable medical devices: A mechanical response of an implantable medical device (IMD) to a first static magnetic field and a first gradient magnetic field slew rate is simulated by exposing the IMD to a second static magnetic field having a magnitude greater than the first static magnetic field and generating a second gradient... Agent: Medtronic, Inc.

20070176597 - Position detection apparatus and vehicle mirror angle detection apparatus: To provide a position detection apparatus with an expanded range of good linearity in a magnetic sensor's output characteristic with respect to position of a movable body as well as to provide a vehicle mirror angle detection apparatus using the position detection apparatus. Two permanent magnets 42 and 44 and... Agent: Hedman & Costigan P.C.

20070176598 - Fuel level sensor using rotating angel sensor attached to float on totating arm: A fuel level sensor having a magnetic position sensor connected to an arm for attachment to a float, wherein the magnetic position sensor comprises a stator and a movable part, the stator having two soft magnetic pieces defining an air gab, which contains a magnetoresistive probe for measuring the variation... Agent: Renner Otto Boisselle & Sklar, LLP

20070176599 - Magnetic field measurement method and magnetic field measurement system: To measure a magnetic field strength at each scan spacing s which is smaller than a loop size by scanning a magnetic field sensor (loop antenna) of the loop size. A magnetic field strength distribution is determined with spatial resolution of the spacing s along a scan direction, by performing... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070176600 - Use of two or more sensors in a nuclear quadrupole resonance detection system to improve signal-to-noise ratio: The use of two or more sensors tuned to the same nuclear quadrupole resonance frequency and detecting the nuclear quadrupole resonance signal results in improved signal-to-noise ratio and therefore improved nuclear quadrupole resonance detection system performance.... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center

20070176601 - Magnetic resonance imaging apparatus, coil system for a magnetic resonance imaging apparatus and magnetic resonance imaging method: A magnetic resonance imaging apparatus includes a receiver coil, at least one transmitter antenna, receiver antennas, a signal selection unit and a processing unit. The receiver coil receives a nuclear magnetic resonance signal from an object as a reception signal. The transmitter antenna transmits the reception signal by radio. The... Agent: Nixon & Vanderhye, PC

20070176602 - Main magnet perforated eddy current shield for a magnetic resonance imaging device: The present invention relates to a magnetic resonance imaging (MRI) device. The basic components of an MRI device are the main magnet system (2), the gradient system (3), the RF system and the signal processing system. According to the present invention, the magnetic resonance imaging (MRI) device has an eddy... Agent: Philips Intellectual Property & Standards

20070176603 - Boring tool tracking/guiding system and method with unconstrained target location geometry: Tracking a boring tool is performed within an underground region using a locating signal. The boring tool is moved through the ground during a series of distance movements such that potential movement of the boring tool during any one of the distance movements is less than a maximum movement value.... Agent: Pritzkau Patent Group, LLC

20070176604 - Ground-fault resistance measurement circuit and ground-fault detection circuit: There is a ground-fault resistance measurement circuit which measures a ground-fault resistance between a conductive frame body of electrical equipment and a charge section insulated from the frame body. This ground-fault resistance measurement circuit includes: a capacity which is connected between the charge section and the frame body; a switch... Agent: Mcdermott Will & Emery LLP

20070176605 - System and method for guided tdr/tdt computerized tomography: A system for detecting a defect or discontinuity in media or at an interface of the media includes a signal generator; a transmission path coupled to the signal generator, wherein the transmission path is arranged along or through the media; a detection circuit for detecting a transmitted and a detected... Agent: Ratnerprestia

20070176606 - Failed roll condom removal apparatus: An automatic failed roll condom detection and removal apparatus wherein failed roll condoms are rapidly removed from a testing mandrel such that shut down of the testing and handling equipment is not required. Detection means detect the presence of a failed roll condom on a testing mandrel as it returns... Agent: Rogers Towers, P.A.

20070176607 - System and method for testing information handling system chassis shielding effectiveness: Information handling system chassis RF shielding is accurately characterized in a repeatable and rapid manner with a stirring device disposed within the chassis. An RF signal from an RF signal source disposed in the chassis emits a more homogeneous and uniform field due to movement of reflective surfaces of the... Agent: Hamilton & Terrile, LLP

20070176608 - Capacitive sensing apparatus designs: One type of capacitive sensing apparatus has a sensing element that includes a first portion and a second portion adjacent opposite edges of a sensing region. Signals from the first and second portions are combined. Another type of apparatus includes: a first sensing element including first and second portions; a... Agent: Wagner Murabito & Hao LLP

20070176609 - Methods and systems for detecting a capacitance using switched charge transfer techniques: Methods, systems and devices are described for detecting a measurable capacitance using charge transfer techniques. According to various embodiments, a charge transfer process is performed for two or more times. During the charge transfer process, a pre-determined voltage is applied to the measurable capacitance, and the measurable capacitance is then... Agent: Ingrassia, Fisher & Lorenz, P.C.

20070176610 - Current-mode semiconductor integrated circuit device operating in voltage mode during test mode: Provided is a current-mode semiconductor integrated circuit device that operates in a voltage mode during a test mode. The current-mode semiconductor integrated circuit device includes a first transmitting converter, a first receiving converter, a second transmitting converter, and a second receiving converter. During the test mode, one of a first... Agent: Harness, Dickey & Pierce, P.L.C

20070176614 - Probe card: A probe card mainly includes a circuit board, a probe assembly, an elastic support assembly, a plurality of level maintaining assemblies and a turning secure assembly. The circuit board has pads and spring bores. The probe assembly has a electrical signal transform board and probes on it. The elastic support... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20070176612 - Method and apparatus for pad aligned multiprobe wafer testing: A control unit of a wafer prober for implementing wafer examination, using a probe card including a multiple number of probes, executes a multiple number of measuring operations by bringing the probes of the probe card into contact with bonding pads formed on a wafer and by measuring the electric... Agent: Whitham, Curtis & Christofferson & Cook, P.C.

20070176611 - Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a vlsi ic package to a substrate or socket: A probe for an array of interconnecting leads between a PCA and an IC has one or more contacts extending laterally from or plated upon one or more arms formed of a flexible printed circuit, and connected by traces along the arm(s) to a header that itself affords connection to... Agent: Agilent Technologies Inc.

20070176613 - Printed circuit board assembly and method of manufacturing the same: A printed circuit board assembly has plural printed circuit boards that are mechanically and electrically connected to each other with them being stacked, and a connection layer that connects the adjacent two printed circuit boards to each other is provided. The connection layer includes an insulation portion and an electric... Agent: Bell, Boyd & Lloyd, LLP

20070176616 - Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same: A semiconductor probe and a method of fabricating the same are provided. The semiconductor probe includes a cantilever doped with first impurities, a resistive tip which protrudes from an end of the cantilever and doped lightly with second impurities, doping control layers formed on both sides of a protruding portion... Agent: Sughrue Mion, PLLC

20070176615 - Active probe contact array management: Methods and apparatus are described for controlling orientation of a probe contact array relative to a wafer contact array on a wafer. The probe contact array is configured on a probe card having first kinematic reference features associated therewith. The wafer is positioned in a wafer prober having an interface... Agent: Beyer Weaver LLP

20070176617 - Temperature compensation circuit and testing apparatus: A temperature compensation circuit for effectively compensating the difference of a switching timing due to temperature change of a switching element included in a logic circuit is provided. The temperature compensation circuit includes a temperature detecting section for detecting a value corresponding to the temperature of the switching element, and... Agent: Osha Liang L.L.P.

20070176618 - Universal contactor for use with multiple handlers and method therefor: A universal contact element for use on multiple handlers has a contactor body. A cavity is formed in a central area of the contactor body for holding semiconductor devices of a predetermined size. A first plurality of channels is formed in the cavity and extends through the contactor body. A... Agent: Weiss & Moy PC

20070176619 - Probe for semiconductor devices: An interconnection contact structure assembly including an electronic component having a surface and a conductive contact carried by the electronic component and accessible at the surface. The contact structure includes an internal flexible elongate member having first and second ends and with the first end forming a first intimate bond... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070176621 - Semiconductor wafer testing apparatus and method of testing semiconductor wafer: In a method of testing a semiconductor wafer, semiconductor chips of a predetermined number are selected from among a plurality of semiconductor chips formed on a semiconductor wafer, and a first test is performed on I/O pins of each of the selected semiconductor chips. Then, a second test is performed... Agent: Young & Thompson

20070176620 - Test handler and loading method thereof: When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the... Agent: Stimson, Shin & Associates, LLP

20070176623 - Method and apparatus for testing a tft array for a liquid crystal panel: A method for testing a liquid crystal display panel wherein there are, disposed in matrix form, pixels comprising liquid crystal elements in which a liquid crystal material is sealed between opposing electrodes, this method for testing a liquid crystal display panel being characterized in that it comprises a first charging... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20070176622 - Id chip and ic card: The present invention provides an ID chip or an IC card in which the mechanical strength of an integrated circuit can be enhanced without suppressing a circuit scale. An ID chip or an IC card of the present invention has an integrated circuit in which a TFT (a thin film... Agent: Eric Robinson

20070176624 - Load measurement for a thermal microwave power sensor: A meter connects to the input of a thermocouple-based RF signal power detector. The apparatus can sense its own load resistor DC impedance, so it can detect both aging in and damage sustained through overload to the RF dissipation element.... Agent: Agilent Technologies Inc.

20070176626 - Method and apparatus for current and temperature measurement in an electronic power circuit: A current/temperature measurement method using parasitic components in an electronic power circuit is disclosed. The measured values derived from these parasitic components with inadequate precision are first of all compensated for, in terms of their current/temperature or voltage dependence, during the production process. The evaluation which takes place during operation... Agent: Dicke, Billig & Czaja

20070176625 - Methods and apparatus for managing defective processors through power gating: Methods and apparatus provide for: selectively supplying a first source of power to a plurality of circuit blocks of a system using a plurality of gate circuits responsive to respective control signals provided by at least one control circuit; and providing a second source of power to operate the control... Agent: Kaplan Gilman Gibson & Dernier L.L.P.