Electricity: measuring and testing July cataloged USPTO category listing 07/07

20070170908 - Distinguishing false signals in cable locating: Discriminating between a cable locating signal and a false cable locating signal is described. A reference signal, which contains a locating signal frequency impressed on it, is transmitted in a way which provides for detection of a phase shift between the locating signal and the false locating signal. Based on... Agent: Pritzkau Patent Group, LLC

20070170909 - Power over ethernet controller integrated circuit architecture: Power over Ethernet (PoE) communication systems provide power and data communications over the same communications link, where a power source device (PSE) provides DC power (for example, 48 volts DC) to a powered device (PD). The DC power is transmitted simultaneously over the same communications medium with the high speed... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20070170911 - Wired-circuit-board assembly sheet: A wired-circuit-board assembly sheet is provided having removable portions that are easily removable without any generation of metal powder. The wired-circuit-board assembly sheet comprises a plurality of suspension boards with circuits, distinguishing marks for distinguishing defectiveness of the suspension boards with circuits, and a supporting sheet for supporting the suspension... Agent: Akerman Senterfitt

20070170910 - Spectral resistor, spectral capacitor, order-infinity resonant tank, em wave absorbing material, and applications thereof: A spectral resistor based on the constitute law of “elasticity of electricity” derived from the Riemann-Lebesgue lemma is provided to build a substantial order-∞ resonant tank. The substantial order-∞ resonant tank according to embodiments of the present invention can function as many different roles such as an electric filter, a... Agent: Ladas & Parry

20070170912 - Rotation sensor, and method for outputting signals from rotation sensor: A rotation sensor for outputting a pulse signal, which has a frequency corresponding to a rotation speed of a rotor, to a wire. The rotation sensor includes a modulation unit and an output unit. The modulation unit modulates an information signal representing information other than the rotation speed into a... Agent: Sughrue Mion, PLLC

20070170914 - Well tool having magnetically coupled position sensor: A well tool having a magnetically coupled position sensor. In operation of a well tool, relative displacement is produced between members of the well tool. A magnetically coupled position sensor includes one magnet assembly attached to a member for displacement therewith and another magnet assembly movably attached to the other... Agent: SmithIPServices, P.C.

20070170913 - Magnetic detection apparatus: A magnetic detection apparatus can reduce the cost of production to a substantially extent. The magnetic detection apparatus includes a magnetic movable element (1) having a first groove (1a) and a second groove (1b) that are different in diametral depth from each other, a magnetoresistive segment (3a) that is arranged... Agent: Sughrue Mion, PLLC

20070170915 - Well tool having magnetically coupled position sensor: A well tool having a magnetically coupled position sensor. In operation of a well tool, relative displacement is produced between members of the well tool. A magnetically coupled position sensor includes one magnet assembly attached to a member for displacement therewith and another magnet assembly movably attached to the other... Agent: SmithIPServices, P.C.

20070170916 - Pulsed excitation and sampled detection fluxgate type magnetometer: The invention concerns a magnetic field measuring device equipped with a fluxgate magnetometer, the device comprising: a magnetic sensor or magnetic sensor (110,210) capable of delivering at least one output signal (S2), and equipped with at least one magnetic core, means of exciting said magnetic core, comprising generating means (120,220,420)... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070170917 - Magnetic resonance imaging with real-time magnetic filed mapping: A magnetic resonance imaging scanner (10) performs magnetic resonance imaging. The scanner (10) includes a main magnet (20) generating a main magnetic field, magnetic field gradient coils (30), and at least one radio frequency antenna (32, 34). At least one magnetic field sensor (32, 34, 64, 66, 68, 70, 72)... Agent: Philips Intellectual Property & Standards

20070170920 - Magnetic resonance imaging apparatus: A magnetic resonance imaging apparatus which applies RF pulses to a subject placed on a top board which is moving in an imaging field in which a static magnetic field and gradient magnetic fields are formed, acquiring magnetic resonance signals emitted from the subject as a result of application of... Agent: Nixon & Vanderhye, PC

20070170919 - Planar rf resonator for open mri systems: An MRI apparatus that includes an open magnet system with pole pieces (14, 16) for generating a steady B0 magnetic field in an examination zone (13). Gradient coil systems (18, 20) are disposed above and below the examination zone (13) and adjacent the pole pieces. First and second resonators (22,... Agent: Philips Intellectual Property & Standards

20070170918 - Shielded treatment room and device suitable for recording images on the basis of magnetic resonance: The invention relates to a treatment room (7) suitable for recording images of a human or animal body on the basis of a magnetic resonance (MR) imaging technique, the walls (7a), the ceiling (7b) and the floor (7c) of the treatment room forming an electromagnetic shield for a magnetic resonance... Agent: Philips Intellectual Property & Standards

20070170921 - Electromagnet apparatus: The electromagnet apparatuses generate a homogeneous magnetic field in a homogeneous magnetic field region by a pair of superconductive main coils for facing to each other; a pair of superconductive shielding coils for facing to each other and passing a current in a direction reverse to that of the main... Agent: Shrinath Malur Mattingly, Stanger, Malur & Brundidge

20070170922 - High temperature superconducting (hts) tape coil with enhanced protection and method for making same: The invention provides an improved method of manufacturing an HTS tape coil for an MRI device with enhanced protection, the method comprising attaching high-Q capacitors at each end of an HTS wire, removing substantially all electrically conductive sheathing material on an inner side of the HTS wire, while retaining substantially... Agent: Cooper & Dunham, LLP

20070170923 - Borehole conductivity simulator verification and transverse coil balancing: Calibration of the arrays of a multicomponent induction logging tool is achieved by positioning the tool horizontally above ground. The upper and lower housings of the tool are connected by a borehole conductivity simulator which as a resistance comparable to that of a borehole. Axial and radial positioning of the... Agent: Madan, Mossman & Sriram, P.C.

20070170924 - While-drilling apparatus for measuring streaming potentials and determining earth formation characteristics and other useful information: Logging-while-drilling apparatus and methodologies for measuring streaming potential in an earth formation are provided. The apparatus and methodologies can be utilized to find information relevant to the drilling operations. In particular, since the streaming potential measurement relates directly to fluid flow, the streaming potential measurements can be used to track... Agent: Schlumberger-doll Research Attn: Intellectual Property Law Department

20070170925 - Electric potential measuring apparatus and image forming apparatus: An electric potential measuring apparatus comprises a movable portion having a detecting electrode and a magnetic force receiving means, a magnetic force generation means, an electric field shielding means, and a detection means for detecting an amount of an electric charge which is electrostatically induced on the detecting electrode, the... Agent: Fitzpatrick Cella Harper & Scinto

20070170926 - Method and device for measuring ultrahigh vacuum: A method and a device for measuring ultrahigh vacuum are disclosed. The method includes providing a vacuum cold cathode pressure gauge and varying a voltage on an anode of the pressure cell with pressure in such a way that an ion current flow is maintained substantially at its maximum value... Agent: Smith Moore LLP

20070170927 - Semiconductor testing system and testing method: According to an embodiment of the invention, a semiconductor testing system for testing a semiconductor device including an output buffer switching between a first mode for outputting data based on an input test signal and a second mode for setting an output terminal to a high impedance state, includes: a... Agent: Young & Thompson

20070170928 - Apparatus and method for measuring physiological characteristics of an intact trachea in vitro: Apparatus and methods for measuring smooth muscles responses (relaxation and contraction), transepithelial potential difference, and/or transepithelial impedance of an intact trachea in vitro. In particular embodiments, the apparatus includes a perfusion device on which an extracted, intact trachea is mounted. The perfusion device and the trachea are immersed in an... Agent: Klarquist Sparkman, LLP

20070170929 - Control apparatus, semiconductor integrated circuit apparatus, and source voltage supply control system: An excluding unit is controlled by a control signal received from a control unit, and based on the control signal a determination is made for each of circuit blocks as to whether either a voltage signal at a position of its corresponding circuit block or a signal indicating a voltage... Agent: Arent Fox PLLC

20070170930 - Novel microwave measurement system for piston displacement: A microwave measurement system is utilized for the determination of displacement of a piston in a fluid filled cylindrical structure. The piston plus cylindrical encasement of the hydraulic system is modeled as a uniform cylindrical waveguide terminated in a metal plate. A novel shaped probe antenna to measure the slope... Agent: Sofer & Haroun LLP.

20070170931 - Successive approximate capacitance measurement circuit: A capacitance measurement circuit includes a current source, a switch, and a comparator. The current source is coupled to drive a current through a circuit node. The switch is coupled to the circuit node to switch the current into a device under test (“DUT”) capacitor. The comparator includes first and... Agent: Blakely Sokoloff Taylor & Zafman

20070170932 - Power supply with current measurement circuit for transformer with high frequency output: A power supply is modified with a current measurement circuit to measure the output of the power supply having a transformer exhibiting a parasitic capacitance. The current measurement circuit includes a simulation capacitor having a capacitance proportional to a parasitic capacitance of a transformer in a power supply, the simulation... Agent: Maginot, Moore & Beck, LLP Chase Tower

20070170933 - Method and apparatus for nondestructively evaluating light-emitting materials: An evaluation apparatus is taught to nondestructively characterize the electroluminescence behavior of the semiconductor-based or organic small-molecule or polymer-based light-emitting material as the finished light-emitting device functions through electroluminescence. An electrode probe is used to temporarily form a light-emitting device through forming an intimate electrical contact to the surface of... Agent: Xianyun Ma

20070170939 - Apparatus for testing semiconductor test system and method thereof: A test system includes a tester configured to perform a test operation on a semiconductor wafer; an interface unit configured to interface between the tester and the semiconductor wafer; and a conductive plate configured to provide the interface unit with a current path when the interface unit is determined to... Agent: Mills & Onello LLP

20070170938 - Test fixture and method for testing a semi-finished chip package: A test fixture has a base, a positioning board, multiple probes, a cushion board, multiple springs and multiple inner bolts. The base has a recess defined in the base. The positioning board is mounted in the recess. The probe is mounted on the positioning board and each probe has a... Agent: Patenttm.us

20070170935 - Test module for wafer: A test module for wafer including a test load board, a spring pin socket, a substrate, and a plurality of probes is provided. The test load board has a plurality of first contacts. The spring pin socket in which a plurality of pogo pins is arranged is disposed on the... Agent: Jianq Chyun Intellectual Property Office

20070170940 - Cantilever microprobes for contacting electronic components and methods for making such probes: Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to various designs of cantilever-like probe structures. Some embodiments are directed to methods for fabricating such cantilever structures. In some embodiments, for example, cantilever... Agent: Microfabrica Inc. Att: Dennis R. Smalley

20070170941 - Composite motion probing: An electronic device is moved into a first position with respect to probes for making electrical contact with the device. The electronic device is then moved into a second position in which the electronic device is pressed against the probes, compressing the probes. The movement into the second position includes... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070170937 - Evaluation method of probe mark of probe needle of probe card: An evaluation method of a probe mark of a probe needle of a probe card, includes the steps of: forming the probe mark of the probe needle on a probe mark evaluation wafer; recognizing the probe mark with imaging; and overlapping an imaginary electrode pad with the probe mark recognized... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070170934 - Method and apparatus for nondestructive evaluation of semiconductor wafers: An evaluation apparatus is taught to nondestructively characterize the material that can be any type of any semiconductor or dielectric materials, or a coating or film deposit on the semiconductor wafer. An electrode probe is used to temporarily form a Schottky or metal oxide semiconductor (MOS) device through forming an... Agent: Xianyun Ma

20070170936 - Regenerator probe: A probe apparatus has first and second access ports and a measurement port. The first and second access ports are adapted to be interposed in a test circuit. A voltage amplifier and a voltage splitter are adapted to present the second access port and the measurement port each with a... Agent: Agilent Technologies Inc.

20070170942 - Methods for fabricating fences on interposer substrates: A method for modifying or fabricating one or more interposers includes fabricating a fence on a substrate that includes the one or more interposers. The fence may be fabricated on a single surface of the interposer substrate. Alternatively, a fence and associated features may be fabricated on both opposite surfaces... Agent: Trask Britt, P.C./ Micron Technology

20070170943 - Cantilever microprobes for contacting electronic components and methods for making such probes: Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to various designs of cantilever-like probe structures. Some embodiments are directed to methods for fabricating such cantilever structures. In some embodiments, for example, cantilever... Agent: Microfabrica Inc. Att: Dennis R. Smalley

20070170944 - Boundary-scan system architecture for remote environmental testing: A system including a chassis operable to receive a plurality of physical application modules and a test port via which an external test device is communicatively coupled to the system. Each physical application module includes a module bridge interface and boundary-scan test functionality. The test port is communicatively coupled to... Agent: Honeywell International Inc.

20070170945 - Printed circuit board and method of use thereof: A printed circuit board (PCB) is provided. The PCB has at least a first surface and a second surface. One or more pre-defined areas defined on the first surface have connection to or comprise a PCB plane for the location of one or more electrical components thereon in use. One... Agent: Head, Johnson & Kachigian

20070170947 - Method and an apparatus for measuring fet properties: An apparatus for measuring the properties of FET by generating a pulse to be applied to gate G of FET and measuring the voltage dependent on the drain current flowing to FET in response to the pulse, comprising a pulse generator for generating a pulse; a directional element disposed behind... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20070170946 - Pilot signal detection circuit and semiconductor integrated circuit equipping the circuit: The purpose of the present invention is to improve a detection accuracy of a pilot signal detection circuit. A pilot detection signal voltage is input to a differential amplifier circuit 16 and a reference voltage generated by a reference signal generation circuit 17 is input to a differential amplifier circuit... Agent: Woodcock Washburn LLP

20070170949 - Display device, liquid crystal display panel assembly, and testing method of display device: A display device having a sensing unit includes a first substrate having a plurality of test spacers, and a second substrate having a plurality of sensing unit test lines facing the test spacers, respectively. The surface heights of the sensing unit test lines are different from each other. The heights... Agent: Cantor Colburn, LLP

20070170950 - Plasma display panel and manufacturing method of plasma display panel: A plasma display panel comprises a barrier rib, a substrate on which a scan electrode and a sustain electrode are displaced, a dielectric layer covering the scan electrode and the sustain electrode, a first protective layer covering the dielectric layer and a second protective layer covering the first protective layer,... Agent: Birch Stewart Kolasch & Birch

20070170948 - Active device array substrate, liquid crystal display panel and examining methods thereof: Pixel units are disposed in a display region of a substrate, and scan lines and data lines are used to control the pixel units. Inner short ring includes a first segment, a second segment and a connecting segment connecting both segments. The gates and sources of the first and second... Agent: Jianq Chyun Intellectual Property Office

20070170951 - Control system and method of semiconductor inspection system: A control system and method of a semiconductor inspection system are disclosed, wherein the inspection can be conducted without reducing the reliability of measurement even in the case where the supply voltage drops. The control system has a controller, a power supply for a power on-off circuit constituting a switching... Agent: Mcdermott Will & Emery LLP

20070164723 - Variable capacitance circuit, voltage measuring apparatus, and power measuring apparatus: A variable capacitance circuit includes a capacitance changing structure constructed by connecting a first construction unit, a second construction unit, a third construction unit, and a fourth construction unit, which each include a first electric element that hinders transmission of a direct current (DC) signal and has a capacitance that... Agent: Greenblum & Bernstein, P.L.C

20070164724 - Current sensor with reduced sensitivity to parasitic magnetic fields: A current sensor includes: several magnetic-field-sensitive components which are disposed on a support such as to be distributed around a conductor through which a current to be measured flows, and a processing circuit which receives an output signal from the components, each component having at least one first terminal which... Agent: Young & Thompson

20070164725 - Vacuum housing for a magnestic resonance apparatus: Disclosed is a vacuum housing for a magnetic resonance apparatus having a recess for leading through lead wires to elements located inside the vacuum housing, and a first lead-through bushing module. The first lead-through bushing module is provided with a first closing plate which is configured so as to vacuum-tightly... Agent: Siemens Corporation Intellectual Property Department

20070164726 - Bias of queries for multi-passenger multi-route travel planning: Determining multiple routes for multiple passenger groups, includes sending to a scheduler, multiple individual queries with a bias to produce individual solutions that meet joint travel requirements, merging results from the multiple individual queries to produce joint solutions for the passenger groups and returning the joint solutions.... Agent: Fish & Richardson PC

20070164727 - Device for measuring current: A device for measuring current comprises a magnetic field sensor (2) for measuring the magnetic field produced by a current I flowing through a current conductor (1) and a yoke (3) of a magnetic material with a relative permeability of at least 100. The magnetic field sensor (2) preferably comprises... Agent: Mccormick, Paulding & Huber LLP

20070164728 - Systems and methods for measuring signal propagation delay between circuits: Embodiments include systems and methods for measurement of signal propagation delay between Input/Output (IO) Loopback (IOLB) circuits. Embodiments include measurement of an output delay time of a first IOLB circuit and measurement of an input delay time of a second IOLB circuit. Embodiments also include measurement of a total delay... Agent: Schubert, Osterrieder & Nickelson, PLLC C/o Intellevate

20070164729 - Verification of performance attributes of packaged integrated circuits: Packaged integrated circuits (ICs) of some types, such as processors, are graded and sold according to a performance scale, such as maximum specified clock speed, set by the manufacturer as a result of testing. As a record of this grading some part of the package, usually the upper surface, is... Agent: Mcdonnell Boehnen Hulbert & Berghoff LLP

20070164730 - Wide bandwidth attenuator input circuit for a measurement probe: A wide bandwidth attenuator input circuit for a measurement probe has a Z0 attenuator circuit coupled in series with a compensated RC attenuator circuit. The series attenuator elements of the Z0 and the compensated RC attenuator circuits are coupled via a controlled impedance transmission line to the shunt attenuator elements... Agent: William K. Bucher Tektronix, Inc.

20070164731 - Wide bandwidth attenuator input circuit for a measurement probe: A wide bandwidth attenuator input circuit for a measurement probe has a Z0 attenuator circuit coupled in series with a compensated RC attenuator circuit. The series attenuator elements of the Z0 and the compensated RC attenuator circuits are coupled via a controlled impedance transmission line to the shunt attenuator elements... Agent: William K. Bucher Tektronix, Inc.

20070164732 - Methods and apparatus for magnetic article detection: Apparatus and methods for detecting passing magnetic articles using a first, True Power On State (TPOS) detector during a first time interval and transitioning to a second, running mode detector after the first time interval, when the output of the second detector is accurate. A phase comparator is responsive to... Agent: Daly, Crowley, Mofford & Durkee, LLP

20070164734 - Gmr angle sensor for vehicles: A GMR angle sensor for vehicles includes a GMR element in which the element resistance is changed in response to an external magnetic field, lead conductors connected to either end of the GMR element, and a protective layer that seals the GMR element and the lead conductors, wherein the protective... Agent: Beyer Weaver LLP

20070164733 - Magnetic encoder device and actuator: The magnetic encoder device includes a ring-shaped rotating body 11, a ring-shaped permanent magnet 12 which is inscribed in and fixed to an inner circumferential side of the ring-shaped rotating body 11 and magnetized in a direction perpendicular to a center axis of the rotating body 11, and a fixed... Agent: Sughrue Mion, PLLC

20070164735 - Methods and systems for controlling the temperature stability of an inductor: Methods and systems a method of assembling a proximity probe are provided. The method includes determining a coil wire dimension and coil geometry for the probe such that a resistance versus temperature profile of the coil is approximately constant when the coil is excited with an excitation frequency of approximately... Agent: John S. Beulick (17851)

20070164736 - Magnetometer with open magnetic circuit and production method thereof: The invention relates to an improved micro-fluxgate magnetometer capable of reducing noise phenomena that can occur when measuring a magnetic field, in a simple manner, and a method for manufacturing such a magnetometer in thin layers.... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070164737 - Apparatus and method for real time and real flow-rates measurements of oil and water cuts from oil production: A inventive flow-meter uses a measuring method which is based on the passage time of fluid molecules in a single sensor, without using any magnetic field gradient for the measurement of said fluid mean velocity. This method consists of the ultrafast irradiation of hydrogen nuclei from fluid molecules through pulses... Agent: Volpe And Koenig, P.C.

20070164740 - Method of reconstructing parallel magnetic resonance image using radial k-space trajectory, apparatus thereof, and computer readable recording medium recorded with program for executing the method: The present invention relates to a method of acquiring a parallel magnetic resonance image and a method thereof, and more particularly, to a method of acquiring a magnetic resonance image using a radial k-space trajectory, and an apparatus thereof. A method of reconstructing a parallel magnetic resonance image using a... Agent: Foley And Lardner LLP Suite 500

20070164738 - Magnetic resonance imaging at several rf frequencies: A magnetic resonance imaging system comprises a receiver system to acquire magnetic resonance signals. A control system controls the receiver system to reform an acquisition sequence to acquire the magnetic resonance signals in several acquisition segments. Respective groups of acquisition segments involve acquisition of magnetic resonance signals in different RF-receiver... Agent: Philips Intellectual Property & Standards

20070164739 - Methods and apparatus for measuring magnetic field homogeneity: In one embodiment, the present invention includes a method for obtaining magnetic resonance (MR) data of a phantom located in a magnetic resonance imaging (MRI) system with multiple bandwidths. The data may then be processed to determine magnetic field homogeneity of the MRI system.... Agent: Trop Pruner & Hu, PC

20070164741 - Storage space for elements which are used ina medical activity: The invention relates to storage space (3) for elements (2) which are used in a medical activity, comprising a plurality of partitions (4) which are each dedicated to receiving a certain type of element (2) assigned to a predetermined medical activity, a user interface (6) for selecting a preferred medical... Agent: Philips Intellectual Property & Standards

20070164743 - Magnetic resonance imaging apparatus: A magnetic resonance imaging apparatus includes a gantry with a gradient coil which applies a gradient magnetic field to a subject in a static magnetic field, a bed which slides a top board in a longitudinal direction of the top board with the subject placed thereon, a high-frequency coil which... Agent: Nixon & Vanderhye, PC

20070164742 - Magnetic resonance system and method: The invention provides a magnetic resonance system and method of measuring continuous regions at high speed without decreasing SN. As a receive system, multiple RF coil sets a, b comprising multiple RF coils a1, a2, b1, b2 are disposed in positions where there is no spatial interference with at least... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070164744 - Magnetic resonance imaging apparatus and static magnetic field correction method: A magnetic resonance imaging apparatus includes a collector which collects magnetic resonance signals emitted from a region of interest of a subject, and a correction magnetic field generator which generates a correction magnetic field to correct the nonuniformity of a static magnetic field on the basis of magnetic resonance signals... Agent: Nixon & Vanderhye, PC

20070164745 - Nmr system and probe positioning method: In an NMR apparatus provided with a split type magnet, in order to position a probe at a high precision in a narrow homogeneous magnetic field space, a positioning of a center of a probe coil is first located to a proper position by inserting an NMR probe from a... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070164746 - Optical interface for local mri coils: An implementation of an optical transmission path for NMR signals from local coils in magnetic resonance imaging employs a photomodulator that may be incorporated into a connecting optical cable to be shared among multiple local coils and to provide for connection and disconnection at an electrical interface eliminating the need... Agent: Boyle Fredrickson Newholm Stein & Gratz, S.c.

20070164747 - Method and apparatus for simulating electrostatic discharge events in manufacturing and calibrating monitoring equipment: In some embodiments, a method and apparatus for simulating electrostatic discharge events in manufacturing and calibrating monitoring equipment are presented. In this regard, a device is introduced to simulate an ESD event by discharging a stored charge and measuring in situ the quantity of charge discharged. Other embodiments are also... Agent: Intel Corporation C/o Intellevate, LLC

20070164748 - Electronic device and method of controlling same: An electronic device includes a main body, a drive mechanism configured to move the main body, a detector having a plurality of sensors mounted in the main body for detecting distances to an object which is present in a space around the main body, a calculator configured to calculate a... Agent: Lerner, David, Littenberg, Krumholz & Mentlik

20070164750 - Intelligent life testing methods and apparatus for leakage current protection: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit. In one embodiment, the apparatus a trip mechanism state generator, a fault alarm generator, a ground fault simulation unit. In operation, the ground fault simulation unit generates a simulated ground fault signal... Agent: Morris Manning Martin LLP

20070164751 - Water level measurement system: The present invention relates to an apparatus to measure water level in a water reservoir by measuring electrical conductivity between electrodes, including a reference electrode, at least one measuring electrode projecting into the water reservoir, and at least one electronic detection circuit to detect a presence of water based on... Agent: Whirlpool Patents Company - Md 0750

20070164752 - Biometric information transmitter: To reduce power consumption in transmitting biometric information signal by wireless. A heart beat detecting circuit amplifies a heart beat signal from an electrode and outputs a biometric detecting signal A having a predetermined time width in synchronism with heart beat of the heart. A voltage comparator, a pulse counting... Agent: Bruce L. Adams, Esq.

20070164754 - On-chip high frequency power supply noise sensor: The lower power on-chip power supply noise sensor detects high frequency overshoots and undershoots of the power supply voltage. The sensor has two resistor chains that span the full power rail, with a reactive element to form a low pass filter as part of one of the resistor chains. By... Agent: Lynn L. Augspurger IBM Corporation

20070164753 - Power supply history monitor: A power supply history monitor. The monitor receives a short duration anomalous signal, e.g., from a power supply, and produces a digitized signal representing the anomalous signal as an output. The monitor receives a signal from a signal input, and includes an analog delay element in series with the signal... Agent: International Business Machines Corporation

20070164755 - Rf test chamber: A system for testing radio frequency (RF) communications of a device capable of such communications is provided. The system includes a chamber for isolating the device from RF interference, an antenna that is suitable for RF communications with the device wherein the antenna is capable of communications over a range... Agent: Pearne & Gordon LLP

20070164756 - Linear capacitance measurement and touchless switch: Capacitance measurement apparatus that enhances the sensitivity and accuracy of capacitive transducers, proximity sensors, and touchless switches. Each of two capacitors (C1, C2) under measurement has one end connected to ground and is kept at substantially the same voltage potential by operational amplifier (A1) or amplifiers (A0, A1) using negative... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP

20070164757 - Method and device for measuring the degree of fiber concentration: A method for measuring the degree of fiber concentration in a pulp in a machine, in particular a refiner for the manufacture of paper pulp, which machine includes a stator and an opposing rotor, which form a grinding gap for the pulp. The stator is provided with at least one... Agent: Buchanan, Ingersoll & Rooney PC

20070164758 - Method of measuring flat-band status capacitance of a gate oxide in a mos transistor device: A method of measuring flat-band status capacitance of a gate oxide in a MOS transistor device, comprises: mounting a measurement object wafer in a probe station connected to a capacitance measuring unit; measuring accumulation capacitance (Cox) of a gate oxide of the wafer using the capacitance measuring unit; measuring capacitance... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070164759 - Method and apparatus for measurement of electrical resistance: An electronic circuit and method to determine a resistance value of a resistive element. The circuit includes a current source coupled in series with the resistive element. The current source is configured to force a predetermined value of current through the resistive element and includes a transconducting device coupled to... Agent: Schneck & Schneck

20070164761 - Dual tip probe: A locking mechanism and method for selectively fixing and allowing movement of a tip portion of a probe relative to a rigid portion of the probe are provided. The mechanism comprises a locking ball joint for selectively locking and allowing relative movement between the tip portion and the rigid portion... Agent: Frommer Lawrence & Haug

20070164760 - Methods and apparatuses for improved stabilization in a probing system: Improved methods and apparatuses for automatically and accurately maintaining the alignment of a wafer prober to the bonding pads of a semiconductor device in the presence of motion disturbances are provided. In one embodiment of one aspect of the invention, a feedback control system incorporating information from a number of... Agent: Blakely Sokoloff Taylor & Zafman

20070164763 - Method for detecting abnormality of probe card: There is provided a system and method for detecting abnormalities in a probe card. A reference image value of a normal contacting pad is set, an image value of a pad is extracted when an error occurs, and the extracted image value is compared to the reference image value. An... Agent: Mills & Onello LLP

20070164762 - Methods and apparatuses for improved positioning in a probing system: An improved method and apparatus for automatically and accurately aligning a wafer prober to the bonding pads of a semiconductor device are provided. In one embodiment of one aspect of the invention, a multi-loop feedback control system incorporating information from a number of sensors is used to maintain the desired... Agent: Blakely Sokoloff Taylor & Zafman

20070164764 - Method of kelvin current sense in a semiconductor package: Regulating a direct current-to-direct current (DC-DC) converter, a semiconductor switch having an improved current sensing technique is used to switch a DC voltage input at a predefined frequency. The switch includes a control pin to receive a control signal for controlling a current flowing between an input pin and an... Agent: Haynes And Boone, LLP

20070164765 - Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals, and inspection method for the same: The invention provides a semiconductor device that can inspect the connection states of power source terminals and grounding terminals of a test LSI at a low cost and in a short time, and an inspection method for the same. Switches SW1 to SW3 are provided between a plurality of power... Agent: Hamre, Schumann, Mueller & Larson P.C.

20070164766 - Circuit device: A circuit device having superior mechanical strength at the interface between a circuit board and heat sink and superior efficiency for radiating heat from a circuit element to the heat sink through the circuit board. The circuit device includes the metal-based insulation board for installing the circuit element, and the... Agent: Mcdermott Will & Emery LLP

20070164771 - Apparatus for testing a chip and methods of making and using the same: An apparatus and method for testing an integrated circuit in a target electronic application, wherein the apparatus comprises a socket for receiving the integrated circuit, a modified commercial electronic product which models the target electronic application, and an electrical connection between the socket and the modified commercial electronic product. The... Agent: The Law Offices Of Andrew D. Fortney, Ph.d., P.C.

20070164772 - Micro-array inertia sensing system based single chip device: The proposed single chip device includes a plurality of sense units arranged in a matrix form and each including a metal layer swingable in plural degrees of freedom, a metal post running vertically through a center point of the sense units and connected with the metal layer, an electrode structure... Agent: Michael W. Taylor

20070164773 - Surface electron emission device array and thin film transistor inspection system using the same: A surface electron emission device array and a TFT inspection system for inspecting a TFT array using a surface electron emission device array may be provided. The TFT inspection system may include a surface electron emission device array, which may have a first electrode disposed to face the TFT array... Agent: Harness, Dickey & Pierce, P.L.C

20070164769 - Active cancellation matrix for process parameter measurements: An active cancellation matrix for process parameter measurements provides feedback paths for each test location wherein each feedback path is used to sense the applied voltage and the sensed voltage is used to adjust the source voltage for any variations along the input path. The devices under test are arranged... Agent: Ibm Corporation (jvm)

20070164770 - Methods and apparatuses for dynamic probe adjustment: An improved method and apparatus for automatically aligning probe pins to the test or bond pads of semiconductor devices under changing conditions. In at least one embodiment, a dynamic model is used to predict an impact of changing conditions to wafer probing process. This reduces the need for frequent measurements... Agent: Blakely Sokoloff Taylor & Zafman

20070164768 - On-chip electromigration monitoring system: A packaged semiconductor chip is provided which includes a semiconductor chip and a package element. The semiconductor chip includes a plurality of semiconductor devices and a plurality of conductive features disposed at an exterior face of the semiconductor chip. The package element has a plurality of external features conductively connected... Agent: International Business Machines Corporation Dept. 18g

20070164767 - Optoelectronic sensor and device for 3d distance measurement: The optoelectronic sensor has at least two collecting zones (20, 22) introduced in a semiconductor region (10), which collecting zones are for example diffused into the semiconductor region and doped inversely with respect to the semiconductor region (10). The collecting zones (20, 22) serve for collecting and tapping off minority... Agent: Ryan Mason & Lewis

20070164775 - Method of kelvin current sense in a semiconductor package: Sensing current flowing through a semiconductor device includes providing an input pin to receive an input, providing an output pin coupled to a predefined voltage source, providing a control pin to receive a control signal for controlling a flow of current between the output pin and the input pin, and... Agent: Haynes And Boone, LLP

20070164774 - Method and apparatus for detection and prevention of bulk cmos latchup: A method and apparatus are provided for detection and prevention of bulk complementary metal oxide semiconductor (CMOS) latchup. A separate power distribution is provided for coupling a positive voltage supply rail to the N well and a ground voltage supply rail to the P well of the CMOS circuit. At... Agent: Ibm Corporation RochesterIPLaw Dept 917

20070164776 - Device and method for measuring gray to gray transition response time: A device for measuring gray-to-gray response times in a display utilizes light detectors to measure the response time of gray images of the display rapidly. The device is used in a measuring system having a temporal signal integrator and a light scope. The temporal signal integrator provides a plurality of... Agent: North America Intellectual Property Corporation

20070159157 - Decentralized solution of microscopic particles and circuit formation device: P

20070159156 - Coulter counter having a plurality of channels: The present invention generally relates to a method for rapidly counting micron and/or submicron particles by passing such particles through any of a plurality of orifices simultaneously with an ion current and measuring the signal generated thereby. The present invention also generally relates to a device for practicing the method... Agent: Roetzel And Andress

20070159158 - Multimeter: A multimeter has a housing with at least three input connections, configured as female connectors, for connecting to two measurement lines. When a measurement variable is changed, it is possible to connect at least one of the measurement lines to another input connection. The multimeter has a measurement-range switch which... Agent: Lerner Greenberg Stemer LLP

20070159159 - Current sensor and mounting method thereof: A current sensor that can reduce a measurement error due to isotropic elongation or strain owing to temperature and the like. A first half bridge circuit is placed in a first region divided by a center line of a mounting substrate, and a second half bridge circuit is placed in... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070159161 - Wireless position feedback device and system: A wireless position feedback device incorporated in a monitored device. The position feedback device measures a position of a moving element of the monitored device, generates a local power supply based upon local environmental characteristics and conditions. The wireless feedback device stores the local power supply for use in transmitting... Agent: Honeywell Law Department Patent Services

20070159162 - Method and apparatus for self-calibration in a mobile transceiver: Disclosed is a method and an apparatus for self-calibrating a Direct Current (DC) offset and an imbalance between orthogonal signals, which may occur in a mobile transceiver. In the apparatus, a transmitter of a mobile terminal functions as a signal generator, and a receiver of the mobile terminal functions as... Agent: The Farrell Law Firm, P.C.

20070159160 - Visual inspector for inspecting flat panel display device and visual inspecting method using the same: A visual inspector for inspecting a flat panel display device and a visual inspecting method using the same are disclosed. The visual inspector includes an inspection unit including a base frame and a loading stage rotatably coupled to the base frame to load a display panel on a front side... Agent: Mckenna Long & Aldridge LLP Song K. Jung

20070159163 - Sample device with turntable: The invention refers to a sample device to be inserted inside an external tube, having a substantially circular cross-section, and carrying a substantially circular plate as part of a turntable to be rotated within the external tube around two substantially orthogonal axes. Two substantially coaxial tubes, with the turntable being... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20070159164 - Magnetoresistive sensor, comprising a ferromagnetic/antiferromagnetic sensitive element: The invention concerns a magnetoresistive magnetic field sensor comprising a stack (1) of a reference element (2), a separation element (3) and an element (4) sensitive to the magnetic field, in which the reference element (2) and the sensitive element (4) have respectively a first and a second magnetic anisotropy... Agent: Arent Fox PLLC

20070159165 - Device for determination of the angular position of a rotating body: A device (1) comprising a generator (6) of magnetic flux (32) connected to the rotating body and a magnetoresistive sensor (8) connected to the support (4). The magnetic flux generator (6) takes the form of a ring or a portion of a ring and comprises alternating poles (10, 12) making... Agent: Young & Thompson

20070159166 - Rotating head for nondestructive tests: A rotating head for a device for the nondestructive testing of metallic test specimens has probe carriers, stray flux or eddy current sensors, a coupling ring and elastic coupling elements. In this way, tandem-like, roughly forced coupling of the pivoting motions of the probe carriers is produced.... Agent: Roberts, Mlotkowski & Hobbes

20070159167 - Integrated sensor system for measuring electric and/or magnetic field vector components: A compact sensor system integrates electric and/or magnetic field sensors to accurately measure, with a high level of sensitivity, one or more electric and magnetic vector components of fields. The electric and magnetic field data can be utilized separately or combined. The sensor system is self-contained so as to include... Agent: Diederiks & Whitelaw, PLC

20070159168 - Automatic digital preemphasis for dynamic nmr-magnetic fields by means of a digital iir filter: c

20070159172 - Magnetic resonance imaging apparatus and method: A magnetic resonance imaging apparatus includes a movement unit which moves a subject placed in a static magnetic field, a collector which collects data corresponding to a magnetic resonance signal emitted from the subject, a detector which detects a position of a particular section of the subject in the static... Agent: Nixon & Vanderhye, PC

20070159170 - Electrically symmetric nmr coils with a plurality of windings connected in series: A nuclear magnetic resonance probe head comprising at least two coil/resonator configurations A1 and A2, wherein at least one of the coil/resonator configurations A1 has two saddle-shaped coils S1 and S2 (1, 2; 21; 41, 42; 53), wherein each coil (1, 2; 21; 41, 42; 53) has a window (9)... Agent: Kohler Schmid Moebus

20070159173 - Magnetic resonance device comprising a cylindrical vacuum housing containing a magnet together with a cooling device: Magnetic resonance device comprising a preferably essentially cylindrical vacuum housing containing a magnet together with a cooling device, said vacuum housing having an inner wall, an outer wall and two end walls, the inner wall and/or one or each end wall being fashioned as a composite component consisting of one... Agent: Siemens Corporation Intellectual Property Department

20070159174 - Magnetic resonance imaging system: A magnetic resonance imaging system includes a high-frequency magnetic field generating unit for generating and applying a high-frequency magnetic field to a subject placed in a static magnetic field, a gradient magnetic field generating unit for generating a gradient magnetic field to be superimposed on the static magnetic field, and... Agent: Baker & Hostetler LLP

20070159169 - Methods and systems for reducing acoustic noise in a magnetic resonance imaging (mri) system: A method for reducing acoustic noise in a medical imaging system is described. The method includes attaching a material to an area affected by an acoustic noise generated by the imaging system. The material is configured to bend upon receiving an electrical signal.... Agent: The Small Patent Law Group LLP

20070159171 - Mri apparatus with high-resistance magnet: Eddy current generated around a magnetic circuit in an MRI apparatus is one of the causes of deviation from an ideal magnetic field gradient waveform and causes image distortion, loss of strength, ghost generation, loss of signal, and spectral distortion. An object of the present invention is to suppress the... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070159176 - Coil array for magnetic resonance imaging with reduced coupling between adjacent coils: A coil array for an imaging apparatus using nuclear magnetic resonance (NMR) for the transmission or reception, or both, of the Lamor frequency signals, assembled in fields, or arrays, includes individual coils made from a conductor track that defines an area. An electrical conductor is applied, at least in the... Agent: Edwin D. Schindler

20070159175 - Method and device for on-chip magnetic resonance spectroscopy: A method and a device for on-chip magnetic resonance spectroscopy (FMR, SPR, EPR, ESR, NMR) is proposed. On-chip magnetic resonance spectroscopy may be applied to non-magnetic as well as magnetic materials and to solids, liquids and gases. The method of the present invention is suitable for miniaturised materials analysis such... Agent: Philips Electronics North America Corporation Intellectual Property & Standards

20070159177 - Automotive vehicle electrical system diagnostic device: An automotive vehicle electrical system diagnostic apparatus includes first and second electrical connections configured to electrically couple to an electrical system of an automotive vehicle which includes a battery. Digital samples are obtained during operation of the vehicle which are related to the system. The digital samples are stored in... Agent: Westman Champlin & Kelly, P.A.

20070159178 - Automotive systems: An occupant detection system comprises a weight sensor and an electric field sensor, each operatively coupled to a seat. The electric field sensor generates an electric field from at least one electrode in the seat bottom of the seat, provides for generating a response to an influence of the occupant... Agent: Foley And Lardner LLP Suite 500

20070159179 - Test system and test method using virtual review: Disclosed are a test system and a test method using a virtual review, capable of driving a test device and reduce the number of operators by allowing an operator to perform review and determination based on a captured image of a defect on a substrate. The test system using a... Agent: Brinks Hofer Gilson & Lione

20070159180 - Arrangement for testing a power output stage: The invention concerns a device for controlling a final power-output stage, the latter comprising three half-bridges consisting respectively of a series circuit including an upper semiconductor switch and a lower semiconductor switch and subjected to a service voltage, the connection points of the semiconductor switches of the half-bridges forming outputs... Agent: Cohen, Pontani, Lieberman & Pavane

20070159181 - Voltage detection systems and voltage detection circuits thereof: A voltage detection system comprising a first circuit board, a second circuit board, and a voltage detection circuit. The voltage detection circuit comprises a first connection unit, a second connection unit, a resistor, and a voltage detection unit. Dummy lines of the first and second connection units are coupled in... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20070159182 - Circuits to increase vna measurement bandwidth: Embodiments of the present invention relate to circuits to be inserted in a signal path between a signal generator and a test port of a vector network analyzer (VNA), where the circuits enable the VNA to make scattering parameter measurements for a load (RL) connected to the test port when... Agent: Fliesler Meyer LLP

20070159183 - Capacitive physical quantity sensor: A capacitive physical quantity sensor includes a sensor element and a detecting element. The sensor element includes first and second fixed electrodes facing a movable electrode. A first voltage is applied to the first fixed electrode and a second voltage is applied to the second fixed electrode. The detecting circuit... Agent: Posz Law Group, PLC

20070159184 - Half-bridge for capacitive sensing: Methods and apparatus are provided for measuring a ratio of capacitances. The apparatus include a comparator including a comparator input, a comparator output, and a reference voltage; a first capacitive element including a first capacitance, a first electrode coupled to the comparator input, and a second electrode; a first biasing... Agent: Ingrassia, Fisher & Lorenz, P.C.

20070159185 - Security scanners with capacitance and magnetic sensor arrays: Security scanning devices based on electrical tomography, including tomography systems based on the measurement of capacitance (ECT) and electromagnetic tomography (EMT), in combination with knowledge-based image analysis and understanding. Each device comprises a sensing head or transducer, sensing electronics, image reconstruction and image analysis microprocessor (either microcontroller, DSP, laptop or... Agent: Crutsinger & Booth

20070159186 - Transmission line pulse measurement system for measuring the response of a device under test: A Transmission Line Pulse (“TLP”) measurement system for testing devices such as integrated circuits (“ICs”), and especially for testing the electrostatic discharge (“ESD”) protection structures connected to terminals on such ICs. The TLP measurement system measures the pulsed voltage and/or current of a device under test (“DUT”) by recording voltage... Agent: Nixon Peabody, LLP

20070159187 - Corrosion detection apparatus and method: A corrosion detection apparatus is provided. The corrosion detection apparatus is capable of detecting corrosion on a surface of a pipe or a vessel where the surface contacts a fluid that is corrosive to the surface. The corrosion detection apparatus includes a corrodible element having a contact surface; at least... Agent: General Electric Company Global Research

20070159188 - Method for testing electronic modules using board with test contactors having beam contacts: A pass through test system for testing an electronic module includes an interface board, and test contactors movably mounted to the interface board for electrically engaging terminal contacts on the module with a zero insertion force on the modules. The interface board is configured for mounting to an automated or... Agent: Stephen A Gratton The Law Office Of Steve Gratton

20070159189 - Apparatus and method for evaluating driving characteristics of scanner: An apparatus and method for evaluating driving characteristics of a scanner by precisely measuring the driving angle of a scanning mirror rotating within a large angle range of about ±12 degrees. The apparatus includes: a light source emitting a beam; an object lens disposed between the scanning mirror and the... Agent: Sughrue Mion, PLLC

20070159190 - Image sensor testing method and apparatus: Disclosed are an optical test apparatus, related test method and method of operation, and related probe card adapted to optically test an image sensor. An illumination source of the optical test apparatus provides an optical test signal to the image sensor through the probe card. The optical test signal has... Agent: Volentine Francos, & Whitt PLLC

20070159192 - Probing apparatus: A probing apparatus comprising: an inspection stage for receiving a flat plate-like device under test with a plurality of electrodes and moving the device under test on the inspection stage in at least three directions, that is, an X direction and a Y direction intersecting each other within a parallel... Agent: Black Lowe & Graham, PLLC

20070159195 - Differential measurement probe having a ground clip system for the probing tips: A differential measurement probe has a ground clip system for electrically coupling outer shielding conductors of differential probing tips together. In one embodiment, the probing tips independently move vertically relative to each other with the ground clip system secured to each of the outer shielding conductors of the probing tips.... Agent: William K. Bucher Tektronix, Inc.

20070159193 - Method of reproducing information using semiconductor probe and device adopting the semiconductor probe: An information reproducing apparatus and a method using a semiconductor probe are provided. The information reproducing apparatus includes a semiconductor probe including a semiconductor tip including a channel varying with an electric field generated by an information recording medium; a modulator applying a high frequency modulation signal to the semiconductor... Agent: Sughrue Mion, PLLC

20070159191 - Probe accessories, and methods for probing test point using same: Probe accessories, and methods for routing signals between a target and a test instrument using the probe accessories, are disclosed. Some of the probe accessories include a flexible circuit and first and second pairs of contacts. Flexible circuit design varies, but one embodiment has first and second regions, a first... Agent: Agilent Technologies Inc.

20070159196 - Probe for combined signals: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070159194 - Probing apparatus: A probing apparatus comprising: an inspection stage for receiving a flat plate-like device under test with a plurality of electrodes and moving the device under test on the inspection stage in at least three directions, that is, an X direction and a Y direction intersecting each other within a parallel... Agent: Black Lowe & Graham, PLLC

20070159197 - Apparatus, method and system for testing electronic components: A testing apparatus is described with a housing, a power source, a carrier assembly, and a backbone connecting the carrier assembly to the power source. A resource board is disposed on the carrier assembly and is connected thereto, thereby receiving power from the power source through the carrier assembly. The... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20070159198 - Automated loading/unloading of devices for burn-in testing: The automatic loading and unloading of devices for burn-in testing is facilitated by loading burn-in boards in a magazine with the stacked boards in the magazine moved into and out of a burn-in oven by means of a trolley. The trolley can include an elevator whereby a plurality of magazines... Agent: Beyer Weaver LLP

20070159199 - Testing voice-based office equipment for immunity to interference from wireless devices: According to some embodiments, a method includes placing a device under test (DUT) in a test chamber and applying a pulse-modulated RF wireless test signal to the DUT in the test chamber. The method further includes detecting an acoustic output of the DUT. In addition or as an alternative to... Agent: Buckley, Maschoff & Talwalkar LLC

20070159203 - Semiconductor device: A semiconductor device is provided with test-subject circuit 1, test-irrelevant circuit 2, first pads used for the test-subject circuit, and second pads used for the test-irrelevant circuit. The first pads include a plurality of divided pad portions while each of the second pads is provided with a single pad portion.... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070159204 - Semiconductor device and electronic component module using the same: A semiconductor device includes a circuit board having an element mounting area, connecting pads positioned in the same surface side as the element mounting area and external connectors to be connected with the connecting pads, respectively; and a semiconductor element mounted on the element mounting area of the circuit board... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070159200 - Adapter for circuit board examination and device for circuit board examination: An adaptor for inspection of circuit boards includes a wiring board for connection, on a front surface of which a plurality of connecting electrodes are formed correspondingly to electrodes to be inspected, and an anisotropically conductive elastomer sheet detachably arranged on the front surface of the wiring board for connection.... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070159201 - Built-in self test for system in package: A SIP (system in package) with a chip and a memory mode, capable of performing integration test on the memory module even if the memory module does not include any scan chain is provided. The chip has a built-in self-test (BIST) circuit, which generates test pattern signals to test the... Agent: Jianq Chyun Intellectual Property Office

20070159205 - Circuit for minimizing or eliminating pulse anomalies in human body model electrostatic discharge tests: A new circuit for producing simulated electrostatic discharges (ESD) based on the Human Body Model (HBM) is disclosed for testing integrated circuits. HBM ESD test systems provide stress pulses defined by industry standards. The pulses produced by prior art have small imperfections or anomalies. These anomalies can cause incorrect testing... Agent: Nixon Peabody, LLP

20070159206 - Method and testing apparatus for testing integrated circuits: A method for testing integrated circuits comprises: generation of a change in an input signal of the integrated circuit, detection of a change in the output signal of the integrated circuit, the change triggered by the change in the input signal when a predetermined condition is satisfied, and a comparison... Agent: Mcgrath, Geissler, Olds & Richardson, PLLC

20070159202 - Methods of testing electronic devices: A method and system of testing an electronic device can be performed by estimating the die temperature using correlation data previously collected for other electronic devices. In one embodiment, correlation data can include (1) die temperatures measured and (2) currents drawn by the electronic devices, testing voltages for the electronic... Agent: Larson Newman Abel Polansky & White, LLP

20070159207 - Device and method for analyzing a sample plate: A device and a method are provided for the analysis of a sample plate on which at least two material samples are situated. In the method, one impedance spectrum is measured for each of the material samples. As a function of the respectively measured impedance spectrum, a configuration of a... Agent: Kenyon & Kenyon LLP

20070159209 - Method of measuring capacitance characteristics of a gate oxide in a mos transistor device: A method for measuring capacitance characteristics of a gate oxide in MOS transistor device. Capacitance characteristics of a gate oxide may be accurately, rapidly, and effectively obtain (e.g. in the form of a capacitance characteristics curve). A method may measure capacitance characteristics of a gate oxide using a characteristics measuring... Agent: Sherr & Nourse, PLLC

20070159208 - Apparatus for detecting a current and temperature for an integrated circuit: The present invention discloses an apparatus for detecting a current flowing from a first node to a second node. One or more MOS devices are serially coupled between the first and second nodes. Each of the MOS devices has its body connected to its source and its gate connected to... Agent: L. Howard Chen, Esq. Kirkpatrick & Lockhart Preston Gates Ellis LLP

20070152650 - Digital sensing circuit: A digital sensing circuit capable of sensing bit information stored in a bit cell of an organic memory is provided. The digital sensing circuit comprises a current-to-voltage converter, a reset block circuit, and a sensing block circuit. The current-to-voltage converter converts a conduction current into a voltage signal. The sensing... Agent: Jianq Chyun Intellectual Property Office

20070152651 - Alternating current detection coil: The alternating current detection coil is a toroidal coil, and comprises plural radial-line conductors which are formed on a front face and a rear face of a substrate, conductive connection parts and conductive through-holes which connect electrically each end of radial-line conductors, wherein plural winding turns are consecutively formed by... Agent: Greenblum & Bernstein, P.L.C

20070152652 - Use of a preselection filter bank and switched local oscillator counter in an instrumentation receiver: An instrumentation receiver architecture for processing an RF signal has a dual-IF channel architecture, a low-band IF channel and a high-band IF channel, and a tunable oscillator, such as a yttrium-iron-garnet (YIG) tunable oscillator (YTO), a voltage controlled oscillator (VCO), a bank of VCOs and the like, providing a different... Agent: Matthew D. Rabdau Tektronix, Inc.

20070152653 - System and method for reducing common-mode interference in differential or single-ended signals: The invention includes input terminals receiving electrical signals from a driver, output terminals delivering the electrical signals to a receiver, and a set of conductors connected between the input and output terminals. Also included are a coupler, its input electrically isolated from its output which includes a first segment of... Agent: Ira M. Siegel Law Offices Of Ira M. Siegel

20070152655 - Handler for testing semiconductor devices: A handler for testing semiconductor devices is disclosed which is capable of simplifying the process carried out in an exchanging station, namely, the process of loading/unloading semiconductor devices in/from test trays, and greatly increasing the number of simultaneously testable semiconductor devices. The handler includes a loading station, an unloading station,... Agent: Ked & Associates, LLP

20070152654 - Integrated circuit (ic) transporting device for ic probe apparatus: An IC transporting device for IC probe apparatus includes a vertical unit, a horizontal unit and a suck-and-hold unit, and capable of being set, change by means of a computer program and controlling to-and-fro moving distance of individual motor so as to accurately position the transporting device, wherein the vertical... Agent: Leong C Lei

20070152656 - Sensing an operating parameter of a target concealed from a sensor by an interposed component: An assembly that includes a target component mounted for rotation about an axis, a sensor mounted adjacent the inner member and directed toward the inner member to measure the rotational speed of the target component and an outer component interposed between the sensor and the target component. Low magnetic permeability... Agent: Macmillan, Sobanski & Todd, LLC

20070152657 - Magnetic encoder and bearing: A magnet portion 27 of a magnetic encoder 26 includes a magnetic member and a resin, and a highly reliable magnetic encoder 26 having a high magnetic property and enabling to detect a rotational number with high accuracy, and a hub unit bearing 2a are provided. Further, the resin is... Agent: Sughrue Mion, PLLC

20070152658 - Magnetically passive position sensor: Disclosed is a passive magnetic position sensor comprising contacting spring elements (5, 6) that can be moved against a resistance device (4) with the aid of a magnet (2) and are provided with two tongues (10,11) by means of which the contacting spring elements (5, 6) face a contact (7).... Agent: Mayer, Brown, Rowe & Maw LLP

20070152659 - Sensor array for detecting the movement of a positioning element moved back and forth using an actuator: The invention relates to a sensor array for detecting travel of a movable member, especially a positioning element that is movable using an actuator. Said sensor array comprises a stationary coil arrangement (18) that is provided with an active coil (18.1) and at least one passive coil (26.1, 26.2) located... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c

20070152660 - Device for sensing the direction of rotation of a hand tool comprising an electric motor: A device for sensing a direction of rotation of a hand tool having an electric motor, has a rotatably supported brush plate provided in the electric motor and located in different positions depending on a direction of rotation of the electric motor; and at least one sensor which senses the... Agent: Striker, Striker & Stenby

20070152661 - Magnetic type angle sensor: A magnetic type angle sensor includes a rotary body having a first sensed part provided on a circumferential surface thereof with projecting parts and recessed parts at equal intervals in a circumferential direction thereof and a second sensed part provided on a circumferential surface thereof with a projecting parts at... Agent: Drinker Biddle & Reath (dc)

20070152662 - Rotation angle-detecting device: The rotation angle-detecting device has a main rotator and two detecting rotators that rotate as the main rotator rotates. Each of the two detecting rotators has a magnet and a magnetic detector. As the detecting rotator rotates, a change occurs in magnetic lines of force from the magnet. From the... Agent: Steptoe & Johnson LLP

20070152663 - Device for environment detection: A device for environment detection having a first magnetic alternating field is situated in a vehicle. The device detects the at least one object in the environment of the vehicle by a second magnetic alternating field which is produced in the object as a function of the first magnetic alternating... Agent: Kenyon & Kenyon LLP

20070152664 - Inspection method and apparatus using scanning laser squid microscope: A non-destructive method of narrowing down the location of a failure in a sample includes a first step of acquiring first and second images of magnetic-field distributions obtained by scanning a laser beam irradiating first and second samples, respectively, and if there is a difference between the first and second... Agent: Sughrue Mion, PLLC

20070152665 - Non-contact sensor system: A non-contact sensor system according to one embodiment includes a substrate having a substantially planar surface with at least one sensor element mounted to the substrate, the at least one sensor element being directed by a guiding element towards at least one data track on a substantially planar medium positioned... Agent: Zilka-kotab, PC

20070152666 - Method for determination of the transverse relaxation time t2* in mr data: In a method for determination of the transverse relaxation time T2* in MR data, the T2* relaxation is detected in a measurement volume and the transverse relaxation time is determined from the time curve of the magnetization in the measurement volume. In order to be able to more reliably determine... Agent: Schiff Hardin, LLP Patent Department

20070152668 - Slab-selective rf coil for mr system: An RF coil includes two coil portions that are spaced apart to define a slab therebetween. Each coil portion is a microstrip transmission line formed as a loop wherein the microstrip includes a conductive strip disposed on one side of a dielectric material and a ground plane disposed on the... Agent: Quarles & Brady LLP

20070152667 - Wrist coil for magnetic resonance imaging: Two halves of a separable wrist coil provide a coil volume closely conforming to a patient's hand yet separable for insertion and removal of the hand. The halves are hinged allowing easy one-handed operation of the coil in which an operator may stabilize the patient's hand within a propositioned coil... Agent: Boyle Fredrickson Newholm Stein & Gratz, S.c.

20070152669 - Integrated on-chip nmr and esr device and method for making and using the same: An embodiment of the invention relates to an integrated on-chip NMR or ESR device for performing chemical analysis and medical diagnostics. Specifically, the device contains, on a single substrate, a sample holding space, a magnet for generating a static magnetic field across the sample holding space and a microcoil for... Agent: Morrison & Foerster LLP

20070152670 - Portable nmr device and method for making and using the same: An embodiment of the invention relates to a portable or handheld device for performing NMR analysis. The device comprises a console and a strip which can be placed into the console through a slot or other means. The strip comprises a sample holding place and a microcoil for generating an... Agent: Morrison & Foerster LLP

20070152671 - Two-axial pad formation resistivity imager: A resistivity imaging device injects currents in two orthogonal directions using two pairs of return electrodes and performing impedance measurements of the buttons placed between the returns.... Agent: Madan, Mossman & Sriram, P.C.

20070152672 - Organic electroluminescent display panel testing apparatus and method thereof: An apparatus for testing an organic electroluminescent display panel having a plurality of data and scan lines comprises a detecting control circuit, a gate de-multiplexer and a source de-multiplexer. The detecting control circuit generates a gate test signal and a source test signal respectively to the gate de-multiplexer and the... Agent: J.c. Patents, Inc.

20070152673 - Method and device of measuring interface trap density in semiconductor device: A method is provided for measuring interface trap density in a semiconductor device. In the method, measurement parameters are input to a host computer. A pulse condition is set at a pulse generator using the measurement parameters. A pulse of a predetermined frequency generated by the pulse generator is applied... Agent: The Law Offices Of Andrew D. Fortney, Ph.d., P.C.

20070152674 - Thermal energy management of electronic devices: The present invention utilizes solid-state components'/devices' electrically-conductive elements as means for transport of thermal-energy via the application of the Thomson Effect through affecting a change in temperature, such as in the electrical power supply leads. Application may be at electrical current characteristics below that required to energize said solid-state components/devices... Agent: Mary Hubbell

20070152676 - Apparatus and method for detecting phase currents of inverter: The present invention previously sets a threshold voltage, compares the set threshold voltage with a reference voltage, and judges whether a minimal pulse width of a PWM signal is obtained. When a pulse width of one PWM signal is equal to or greater than the minimal pulse width, but each... Agent: Greenblum & Bernstein, P.L.C

20070152675 - Diagnostic method for monitoring a plug-in connection: A diagnostic method for monitoring at least one plug-in connection (4) to an antenna (1), a diagnostic signal is supplied via the antenna signal path toward the antenna (1). The diagnosis signal bypasses an active circuit (31) in the antenna signal path. In the event of a defective plug-in connection... Agent: Kenyon & Kenyon LLP

20070152677 - Surveillance device detection utilizing non-linear junction detection and reflectometry: A method and apparatus for detecting concealed surveillance devices coupled to a transmission line uses either a time domain or frequency domain reflectometry operation to locate any impedance anomalies on the transmission line and a non-linear junction detection operation to classify the located impedance anomalies as semiconductor or non-semiconductor based... Agent: The Hornkohl Law Firm

20070152678 - Plasma processing system: A high-frequency measurement unit includes a signal detector for detecting a high-frequency signal, and a calibration coefficient storage for storing calibration coefficients Cmin and Cmax used to calibrate a value Amin detected at the lowest limit frequency fmin and a value Amax detected at the uppermost limit frequency fmax to... Agent: Hamre, Schumann, Mueller & Larson, P.C.

20070152679 - Apparatus and methods for linearizing piezoresistive wheatstone bridges: A pressure sensing apparatus including: at least one deflectable diaphragm having a center, wherein each diaphragm supports: at least one positive piezoresistive gauge and at least one negative piezoresistive gauge coupled in series across a voltage differential in a half-Wheatstone bridge configuration having an output between the positive and negative... Agent: Plevy & Howard & Darcy P.C.

20070152680 - Duty detection circuit, dll circuit and semiconductor device having same: Accurate duty detection is enabled by performing duty detection once every two cycles while delaying detection of one clock logic level by a half cycle, and presetting the potential of a common contact to an initial set value during the delay time. A DLL circuit employing a divide-by-two scheme is... Agent: Sughrue Mion, PLLC

20070152681 - Modeling and calibrating a three-port time-domain reflectometry system: A three-port TDR front end comprises numerous components. An exemplary three-port TDR front end is a DSL modem. Information-bearing TDR signals are distorted as they pass through these components. With a perfect model of the response of its front-end, a TDR system usually can compensate for the effects of its... Agent: Sheridan Ross P C

20070152682 - Device and method for reading a capacitive sensor, in particular of a micro-electromechanical type: A read device of a capacitive sensor includes: a signal source supplying an electrical read signal for driving the capacitive sensor; and a discrete-time sense circuit for generating an electrical output signal, correlated to variations of capacitance of the capacitive sensor, in response to variations of the electrical read signal.... Agent: Seed Intellectual Property Law Group PLLC

20070152683 - Electronic device for analysis of a body fluid: An electronic device for analysis of a body fluid comprises a housing defining an opening therein, a measuring facility and at least one electrical circuit arranged inside the housing, and a multi-wire connector carried by the housing. The measuring facility is configured to receive a test element therein via the... Agent: Barnes & Thornburg LLP

20070152684 - Apparatus and method for analyzing photo-emission: A photo-emission analysis apparatus may include a plate, a socket board on the plate, and configured to receive semiconductor chip package. The apparatus may further include a housing on the plate, the housing having an inlet configured to introduce air into the housing, and a photon detector configured external to... Agent: Harness, Dickey & Pierce, P.L.C

20070152687 - Mems probe card with elastic multi-layer structure: An MEMS probe card with elastic multi-layer structure mainly includes a substrate and a plurality of MEMS probe assemblies. The MEMS probe assemblies are disposed on a plurality of testing pads of the substrate, and each of the MEMS probe assemblies includes a plurality of first layer bridge elements, a... Agent: Lowe Hauptman Berner, LLP

20070152688 - Probe card capable of multi-probing: A probe card capable of multi-probing includes a print circuit board having a plurality of contact portions and a test module having a plurality of test boards. Each of the test boards includes at least one probing portion on which a plurality of needles are arrayed. The test module selects... Agent: Mills & Onello LLP

20070152685 - A probe array structure and a method of making a probe array structure: Probe array structures and methods of making probe array structures are disclosed. A plurality of electrically conductive elongate contact structures disposed on a first substrate can be provided. The contact structures can then be partially encased in a securing material such that ends of the contact structures extend from a... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070152686 - Knee probe having increased scrub motion: Improved probing is provided using a knee probe where the knee curves away from the probe axis and then curves back to connect to the probe tip, crossing the probe axis on the way to the tip. The resulting lateral offset between the probe tip and the probe axis is... Agent: Lumen Intellectual Property Services, Inc.

20070152690 - Wafer stage and related method: A wafer stage and related methods are disclosed. The wafer stage comprises a wafer chuck adapted to hold a wafer; lift pins adapted to pass through the wafer chuck, move vertically, and support the wafer; and an air expulsion unit adapted to expel air towards an edge of the wafer.... Agent: Volentine Francos, & Whitt PLLC

20070152689 - Modular probe card: A modular probe card comprises a printed circuit board, an interposer, and a probe head where the printed circuit board has a plurality of first contact pads, the probe head has a plurality of second contact pads. The interposer is disposed between the printed circuit board and the probe head... Agent: Troxell Law Office PLLC

20070152691 - Wafer chuck: A wafer chuck is provided with a plurality of pins which protrude and retreat in a plurality of through holes formed in a vertical direction on a mounting table, and an ascending/descending mechanism for ascending and descending the pins. The wafer chuck receives a wafer by protruding the pins from... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070152692 - Connection verification technique: Embodiments of the present invention are generally directed to testing connections of a memory device to a circuit board or other device. In one embodiment, a memory device that is configured to facilitate continuity testing between the device and a printed circuit board or other device is disclosed. The memory... Agent: Michael G. Fletcher Fletcher Yoder

20070152693 - Method and system of trace pull test: The present invention provides an efficient test method and system for testing the IC package, such as BGA types of packages. With the present invention, manufacturer can have an easier way in testing various types of packages, including newer types. Manufacturer also can get the testing outcome which is more... Agent: Kusner & Jaffe Highland Place Suite 310

20070152698 - Strip test method: A strip test method includes the following steps. First, an assembly strip is provided, wherein the assembly strip includes a plurality of semiconductor devices, each having a plurality of leads. A test socket and a base are provided, wherein the test socket has a plurality of probe sets. The assembly... Agent: Lowe Hauptman Berner, LLP

20070152695 - Test equipment positional control manipulator: An apparatus and method are provided for the automatic operation of a manipulator to move a test head or peripheral into position for proper alignment and docking of the test head with the peripheral. Examples of peripherals include a handler and a prober. Sensors are provided to obtain relative positional... Agent: Teradyne, Inc. C/o Foley & Larder, LLP

20070152697 - Engaging device of circuit board: An engaging device of a circuit board is disclosed. The engaging device is for engaging a circuit board having a positioning hole to a housing of an electronic device. The engaging device includes a conductive hook fixed to the housing, the conductive hook including a hook portion for being hooked... Agent: Edwards Angell Palmer & Dodge LLP

20070152694 - Motherboard test machine: A test machine for testing a printed circuit board (PCB) (50) includes a base box (10), a top test device (70), a raising board (41), and a control system. The top test device is pivotably secured to the base box, for testing the PCB. The raising board carries the PCB... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070152699 - System and method for automatically measuring carrier density distribution by using capacitance-voltage characteristics of a mos transistor device: Disclosed is a system and method for automatically measuring carrier density distribution by using capacitance-voltage characteristics of a MOS transistor device. System comprises an automatic probe station for measurement of an object wafer, the automatic probe station being electrically connected to the wafer; a capacitor measuring unit having a high... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070152700 - System and method for testing one or more dies on a semiconductor wafer: A testing system or method compares read data from one or more dies in a semiconductor wafer with the original data written onto the one or more dies The testing system includes one or more write registers connected to one or more dies on the semiconductor wafer. One or more... Agent: Brinks Hofer Gilson & Lione Infineon

20070152696 - Water bond-out: A method for forming an improved electrical connection to a die or wafer which does not utilize micro-probes, is physically compatible with ultra-high NA objectives used for low photon emission observation, forms more secure electrical connections, is practical for contacting a die at any position on a full wafer. The... Agent: Deborah Wenocur C/o Shelly Garrett

20070152701 - Apparatus for examining flat panel display device and examining method thereof: An apparatus for examining a flat panel display device and a method thereof is provided. The tact time for examining a glass substrate is reduced as much as possible, manufacturing costs are reduced by simplifying a product, and a foot print is reduced. The apparatus includes a base frame, a... Agent: Brinks Hofer Gilson & Lione

20070152702 - Starter zero current test apparatus and method: An alternator and starter tester system having a starter current zero test. The current is measured before and after a solenoid of a starter motor is energized and deenergized to determine if the starter motor should be failed. This allows the operator to quickly determine if the starter motor is... Agent: Baker & Hostetler LLP