Electricity: measuring and testing inventions 06/07

20070145966 - Cascaded mosfet embedded multi-input microcantilever: A sensor for detecting mechanical perturbations represented by a change in an electrical signal includes a structure such as a cantilever, membrane, etc. and a field effect transistor such as a MOSFET embedded in the structure. The drain current of the embedded transistor changes with mechanical perturbations in the structure... Agent: Mcandrews Held & Malloy, Ltd

20070145967 - Recording medium detecting system: A recording medium detecting system includes a magnetic field-generating unit that generates an alternating magnetic field in a predetermined particular region, a detecting unit provided close to the particular region, that detects a change in magnetic flux density not smaller than a predetermined magnetic-flux-density difference B2, and a recording medium,... Agent: Morgan Lewis & Bockius LLP

20070145968 - Detector circuit to be used for measuring current: A detector circuit is to be used for measuring current by means of substantially identically wound ring core transformers, in which magnetomotive forces are induced by a main current. The magnetomotive forces are counteracted by magnetomotive forces induced by a compensating current. Two of the ring core transformers (2, 3)... Agent: Birch Stewart Kolasch & Birch

20070145969 - Long stroke hall position sensor having a shaped pole: An apparatus having a position sensor for determining a position of a moveable component is provided. The apparatus comprises a housing, a positioning member, a shaped magnetic pole, a magnet, and a hall effect sensor. The positioning member, the shaped magnetic pole, the magnet, and the hall effect sensor are... Agent: Reinhart Boerner Van Deuren P.C.

20070145970 - Magnetic line-type position-angle detecting device: To provide a magnetic line-type position-angle detecting device capable of detecting an absolute position on a non-contact basis and with high resolution and inexpensive construction, the magnetic line-type position-angle detecting device includes a magnetic line sensor 1 having a plurality of magnetic sensor elements 1a arranged in line, and a... Agent: Staas & Halsey LLP

20070145971 - Magnetic head and disk x-y test assembly with optimized arrangement for skew angle: A magnetic head and disk tester comprises a base, a spindle for rotationally supporting a magnetic disk, a carriage for supporting a magnetic head support which carries a magnetic head with a magnetic read/write element, and a dual-stage positioning system that moves the carriage in two perpendicular directions X and... Agent: Foley & Lardner LLP

20070145972 - Integrated magnetic sensor component: A sensor component used to measure a magnetic field strength is disclosed. In one embodiment, the sensor component contains a plurality of leads and a sensor semiconductor chip, which measures the magnetic field strength. The sensor semiconductor chip has pads on its active upper side. These pads are connected electrically... Agent: Dicke, Billig & Czaja, P.l.l.c.

20070145973 - Methods and systems for active non-intrusive inspection and verification of cargo and goods: Systems and methods are disclosed herein for the non-intrusive inspection and/or verification of cargo. In an exemplary embodiment, an elemental signature is determined at a first point in a supply chain and transmitted to a second point in the supply chain. When the goods arrive at the second point, the... Agent: Foley Hoag, LLP Patent Group, World Trade Center West

20070145975 - Method and magnetic resonance system for adjustment of the field strength of rf pulses: In a method for adjustment of the field strength of radio-frequency pulses as well as a magnetic resonance measurement system, radio-frequency pulses are emitted by a radio-frequency antenna of a magnetic resonance measurement system in a magnetic resonance measurement A test volume slice is initially excited by emission of radio-frequency... Agent: Schiff Hardin, LLP Patent Department

20070145974 - Rf pulse applying method and mri apparatus: The present invention is directed to perform T2 weighting and suppression of a signal from a specific component in short preparation pulse application time. A first 90° pulse in DE pulses is a pulse which is selectively valid for water and makes the longitudinal magnetization of water turn by 90°... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070145976 - Rf pulse applying method and mri apparatus: The present invention aims to receive a signal of tissue long in T2 at a relatively high level and suppress artifacts. When a magnetic resonance frequency of a component intended for measurement is assumed to be Ω and the frequency corresponding to a repetition time TR is assumed to be... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070145977 - Fast continuous moving bed magnetic resonance imaging with multiple stationary receive coils for sense reconstruction: A plurality of global receive coils (24a, 24b, 24c) are stationarily positioned around a fixed field of view (FOV) of a magnetic resonance diagnostic imaging device (10). Each global receive coil receives undersampled phase and frequency encoded data from the stationary field of view. A subject is imaged as it... Agent: Thomas E Kocovsky Jr Fay Sharpe Fagan Minnich & Mckee

20070145978 - Magnetic resonance imaging involving movement of patient's couch: A magnetic resonance imaging system performing various types of imaging that involves movement of a patient's couch. The system has a patient's couch having a tabletop movable in a predetermined direction passing through a static magnetic field as well as reception multiple RF coils consisting of for example a plurality... Agent: Nixon & Vanderhye, PC

20070145979 - Magnetic resonance device with a patient support table and a main field magnet: Magnetic resonance device comprises a patient support table and a main field magnet. The main field magnet is supported so that it can be rotated around at least one axis. The patient support table is able to be rotated around an axis essentially perpendicular in respect of its table surface.... Agent: Siemens Corporation Intellectual Property Department

20070145980 - Multi-component field sources for subsea exploration: A multi-component field source for surveying subsea formations includes at least two electrodes having a direction of motion, wherein the at least two electrodes are configured to produce an electric dipole in an orientation that is not parallel to both the direction of motion of the electrodes and the seafloor.... Agent: Schlumberger Oilfield Services

20070145981 - Semiconductor leakage current detector and leakage current measurement method, semiconductor leakage current detector with voltage trimming function and reference voltage trimming method, and semiconductor intergrated circuit thereof: A semiconductor leakage current detector of the present invention includes a first analog switch which causes a current to be measured to flow or to be cut off, a second analog switch which causes a reference current to flow or to be cut off, an integral capacitance element which is... Agent: Greenblum & Bernstein, P.L.C

20070145983 - Method and system for device characterization with array and decoder: A system and method for testing devices. The system includes a plurality of pads and a decoder coupled to a plurality of devices. The decoder is configured to receive a plurality of selection signals from the plurality of pads and select a device from the plurality of devices based on... Agent: Townsend And Townsend And Crew, LLP

20070145982 - System and method for detecting rail break or vehicle: A rail break or vehicle detection system includes a plurality of voltage sources, each coupled to one of the plurality of zones. A plurality of resistors are provided, each coupled in series with one of the plurality of voltage sources. A plurality of current sensors are provided, each coupled to... Agent: Patrick S. Yoder Fletcher Yoder

20070145984 - Soil moisture sensor systems and methods: r

20070145985 - Sensors and associated methods, including surface condition sensors: The present invention is generally directed toward sensors and associated methods, including surface condition sensors. For example, in certain embodiments sensor can be configured to sense the surface conditions on a road surface and/or an airport surface. One aspect of the invention is directed wet/dry sensors. Other aspects of the... Agent: Perkins Coie LLP Patent-sea

20070145986 - Method and system for powering an integrated circuit: The method is for powering an integrated circuit, said integrated circuit comprising a chip within a package assembly, said chip comprising a plurality of logic circuits each having at least one power input which should not receive a power voltage exceeding a predetermined maximum operating voltage. The method comprises the... Agent: Philips Electronics North America Corporation Intellectual Property & Standards

20070145987 - Test probe for high-frequency measurement: A test probe for executing high-frequency measurements comprises: a coaxial high-frequency wave guide containing an inner conductor and an outer conductor for delivering a primary electrical potential and a secondary electrical potential, respectively, a supporting structure conductively connected to at least the outer conductor and to at least two contact... Agent: Heslin Rothenberg Farley & Mesiti PC

20070145990 - Inspection unit: An insulative block has a first face adapted to oppose a board on which an inspection circuit is arranged and a second face adapted to oppose a device to be inspected. The insulative block is formed with first through holes each of which communicates the first face and the second... Agent: Morgan Lewis & Bockius LLP

20070145991 - Inspection unit: An insulative block has a first face adapted to oppose a board on which an inspection circuit is arranged and a second face adapted to oppose a device to be inspected. The insulative block is formed with through holes each of which communicates the first face and the second face.... Agent: Morgan Lewis & Bockius LLP

20070145988 - Probe card assembly: A probe card assembly has a probe contractor substrate having a plurality of probe contractor tips thereon and a probe card wiring board with an interposer disposed between the two. Support posts contacting the probe contractor substrate are vertically adjustable until secured by a locking mechanism which is coupled to... Agent: Pillsbury Winthrop Shaw Pittman LLP

20070145989 - Probe card with improved transient power delivery: In high current integrated circuit wafer test applications, a high capacitance density capacitor may be formed in association with a probe card at a position closer to a wafer under test. This reduces the power path impedance, improving transient power delivery of a probe card. That is because now the... Agent: Trop Pruner & Hu, PC

20070145992 - Semiconductor device testing system and semiconductor device testing method: When a convex jig pushes up a bottom face of an adhesive sheet where a target semiconductor device is located, a non-target semiconductor device located near the target semiconductor device is lower in position than the target semiconductor device. Thus, the non-target semiconductor device is prevented from coming into contact... Agent: Steptoe & Johnson LLP

20070145993 - Chip burning system: A chip burning system includes a burning device (10) with a plurality of burning files stored therein, a transforming circuit (30) for connecting to chips via serial interfaces, a control unit (20) interconnecting the burning device and the transforming circuit via parallel interfaces, and two chips (40,50) for burning. The... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070145994 - Socket and test apparatus: A socket electrically coupled to a BGA unit includes a plurality of ball contacts including a housing wherein a through-hole having a larger diameter than that of the ball contact is formed in a surface of the housing, which faces the BGA unit, in order to the through-hole corresponds the... Agent: Osha Liang L.L.P.

20070145996 - Circuit board damping assembly: A circuit board damping assembly provides a damping node for a circuit board coupled in spaced relationship to another circuit board or chassis. The circuit board damping assembly includes a chassis or circuit board forming a base member; a circuit board coupled in spaced relationship to the base member; a... Agent: Honeywell International Inc.

20070145998 - Method and apparatus for characterizing features formed on a substrate: A method and apparatus for testing and characterizing features formed on a substrate. In one embodiment, a test structure is provided that includes a test element having a first side and an opposing second side. A first set of one or more structures defining a first region having a first... Agent: Patterson & Sheridan, LLP

20070146001 - On-chip substrate regulator test mode: An on-chip circuit for defect testing with the ability to maintain a substrate voltage at a level more positive or more negative than a normal negative operating voltage level of the substrate. This is accomplished with a chain of MOSFETs that are configured to operate as a chain of resistive... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.

20070145995 - Optic probe for semiconductor characterization: Described herein is an optical probe (120) for use in characterizing surface defects in wafers, such as semiconductor wafers. The optical probe (120) detects laser light reflected from the surface (124) of the wafer (106) within various ranges of angles. Characteristics of defects in the surface (124) of the wafer... Agent: Paul J. White Nrel

20070145999 - Semiconductor device testing: An apparatus and method to test components in a semiconductor test structure. On a semiconductor wafer, a test module implemented in one or more scribe lines between a plurality of semiconductor dies is used to test components in the semiconductor test structure. The test module may, for example, test electrical... Agent: Texas Instruments Incorporated

20070146000 - Semiconductor test apparatus: Output data of a device under test (DUT) is obtained at timing of both rising and falling edges of a clock output from the DUT, and output data of a DDR type device is fetched in synchronization with the clock. A semiconductor test apparatus comprises a clock side time interpolator... Agent: Yasuo Muramatsu Muramatsu & Associates

20070145997 - Wafer scale testing using a 2 signal jtag interface: Testing of die on wafer is achieved by; (1) providing a tester with the capability of externally communicating JTAG test signals using simultaneously bidirectional transceiver circuitry, (2) providing die on wafer with the capability of externally communicating JTAG test signals using simultaneously bidirectional transceiver circuitry, and (3) providing a connectivity... Agent: Texas Instruments Incorporated

20070146003 - Display apparatus and method of inspecting the same: Provided are a detection element Em used for controlling a value of a drive voltage for each light emitting element constituting a display pixel, and a leakage detection circuit 4 which separates the detection element Em from a current source I1 when this detection element Em is in a leakage... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070146002 - Display device and pixel testing method thereof: A display device has a display panel, which includes a plurality of IC pads, a plurality of data lines, a selector, a plurality of switches and a test pad. The IC pads are connected to the data lines through the selector. The data lines are electrically connected to a corresponding... Agent: Bacon & Thomas, PLLC

20070139031 - Method for simulating resistor characteristics at high electric fields: A method for characterizing the current as a function of applied electric field for a resistor exposed to a high electric fields is described. The method uses current versus voltage measurements at low electric fields, where the resistor is not damaged and the current does not saturate. An example illustrating... Agent: Lsi Logic Corporation

20070139032 - Integrated current sensor: A current sensor includes coupled inductors that generate an output current responsive to a detected current. The coupled inductor is implemented in an integrated circuited. An integrator circuit generates a sensed voltage responsive to the output current.... Agent: Zagorin O'brien Graham LLP

20070139033 - Active energy meter replaces wallplate used to seal single or multiple gang toggle device switch or duplex device receptacle: The use of centralized electric meters to record energy consumption prevents the energy consumer from interacting with the process of energy savings. The inability of a centralized electric meter to quickly feedback energy usage, prohibits their use in interactive energy saving. The monitoring of energy consumption using a sub-metering or... Agent: Alex Pogostin

20070139034 - Semiconductor device and testing method thereof, and resistance measurement apparatus: According to the present invention, there is provided a semiconductor device having: a switching element serially connected to a resistive element to be measured; a plurality of transistors respectively connected in parallel to a series circuit consisting of the resistive element to be measured and the switching element, which will... Agent: Banner & Witcoff, Ltd. Attorneys For Client No. 000449, 001701

20070139035 - Magnetized pulsar ring: A magnetized body (12) is constituted by a resin bonded magnet, and is fixed to a support member (11) in accordance with an integral injection molding, in such a manner that a come-off preventing portion (15) engaging with an outer peripheral portion of a flange portion (14) is formed in... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070139036 - Signal processing circuit of rotation detecting device: A rotation detecting device includes a rotation detecting unit for providing first and second rotation signals in response to rotation of a rotating object and a signal processing circuit for processing the signals to provide rotation data such as the rotation direction, rotation speed and rotation position. The signal processing... Agent: Posz Law Group, PLC

20070139037 - Device for testing magnetic speed and proximity sensors used with rotating machinery: A testing device for testing Hall-Effect type speed and proximity sensors and their associated pulse detection systems is provided by the present invention. The device includes a housing containing an internal battery, an LED display, an input connector, an output cable, a power switch, a test function switch, and a... Agent: Waddey & Patterson, P.C.

20070139039 - Stick position sensor and replacement process: Position sensors in stick design for installation. e.g. in hydraulic cylinders, can be maintained and replaced without leakage, with the sensor head housing having a attachable and detachable dome- and cap shaped sensor head cover, which can be opened without removing the remaining housing out of the piston cylinder unit,... Agent: Head, Johnson & Kachigian

20070139040 - Sensing apparatus and method: There is described a sensor comprising an excitation winding, a signal generator operable to generate an excitation signal and arranged to apply the generated excitation signal to the excitation winding, a sensor winding electromagnetically coupled to the excitation winding and a signal processor operable to process a periodic electric signal... Agent: Fogg & Powers LLC

20070139038 - Vane actuated magnetic drive mode sensor: A vane actuated drive mode sensor is generally composed of two primary components, including a drive mode sensor array and an actuator. The sensor array can be provided as a housing composed of a plurality of Hall Effect (HE) sensors, magnets and the electronics associated with the sensors. The actuator,... Agent: Intellectual Property Honeywell International Inc.

20070139041 - Stick position sensor and replacement process: Position sensors in stick design for installation in hydraulic cylinders, can be maintained and replaced without leakage, with the sensor head housing having a attachable and detachable sensor head cover, which can be opened without removing the remaining housing out of the piston cylinder unit, opening the access to the... Agent: Head, Johnson & Kachigian

20070139042 - Magnetic position sensor with optimized detection: The invention concerns a position sensor in which the irregular pole includes resources for correcting the value of its magnetic field so as to stabilize the differential signal in such a way that the part of the differential signal taken at the passage through zero, and located between the parts... Agent: Dennison, Schultz & Macdonald

20070139043 - Eddy current system for in-situ profile measurement: An eddy current monitoring system may include an elongated core. One or more coils may be coupled with the elongated core for producing an oscillating magnetic field that may couple with one or more conductive regions on a wafer. The core may be translated relative to the wafer to provide... Agent: Fish & Richardson P.C.

20070139044 - Thermoplastic overmolding for small package turbocharger speed sensor: A sensor package apparatus includes a lead frame substrate that supports one or more electrical components, which are connected to and located on the lead frame substrate. A plurality of wire bonds are also provided, which electrically connect the electrical components to the lead frame substrate, wherein the lead frame... Agent: Attorney, Intellectual Property Honeywell International Inc.

20070139045 - Magnetic resonance imaging apparatus and high-frequency coil unit used in the same: A magnetic resonance imaging apparatus imaging a subject on the basis of a magnetic resonance signal radiated from the subject in a static magnetic field, includes a radio frequency coil which receives the magnetic resonance signal and has a direction dependency on a flux direction of the static magnetic field,... Agent: Nixon & Vanderhye, PC

20070139046 - Nmr probe head with heated housing: An NMR probe head for investigating a temperature-sensitive test object in a volume under investigation with at least one RF receiver coil which is cooled to cryogenic temperatures during operation, and is surrounded by a housing, wherein at least one heatable separating wall is provided between the RF receiver coil... Agent: Kohler Schmid Moebus

20070139047 - Method of controlling the operation of a solenoid:

20070139048 - Diagnosis method, power supply control device, electronic apparatus, battery pack and computer-readable storage medium: A diagnosis method diagnoses an electronic apparatus that is operable with a battery pack having a memory which stores information. The diagnosis method reads information from the battery pack, and sets the electronic apparatus to a diagnosis mode when the read information indicates the diagnosis mode.... Agent: Staas & Halsey LLP

20070139049 - Object sensing: An object sensing system (50), and method, employing electric field sensing, also known as quasi-electrostatic sensing and which may be termed cross capacitive sensing, is described. The system (50) comprises at least one electrode arrangement (30), each electrode arrangement (30) comprising one electric field sensing reception electrode (32) and two... Agent: Philips Electronics North America Corporation Intellectual Property & Standards

20070139050 - Electrostatic discharge transient and frequency spectrum measurement of gap discharge: An electrostatic discharge testing system comprises a measurement chamber to hold a discharge electrode and a target electrode in separation from each other, a first conductive path to supply an ESD pulse to the discharge electrode, and a second conductive path to receive a discharge pulse from the target electrode.... Agent: Haynes And Boone, LLP

20070139052 - Slant detection device: A slant detection device is used for detecting whether the to-be-tested pin of a connector is slanted. The connector has a socket. The to-be-tested pin is disposed in the socket. The detection device includes a detector and a sensor. The detector includes a body, a first protrusion and a second... Agent: Rabin & Berdo, PC

20070139051 - Circuit arrangement comprising a multi-wire line for supplying current and emitting signals: The invention relates to a circuit arrangement comprising a multi-wire line for supplying current to a sensor and for emitting a signal that corresponds to a measured value to an evaluation module via a signal line. To eliminate measuring errors caused by short-circuits, a first and second resistor (7, 8),... Agent: Wood, Phillips, Katz, Clark & Mortimer

20070139053 - Method and apparatus for testing magnetic head with tmr element: A magnetic head testing apparatus having the function of evaluating pin holes in a tunnel barrier layer of a TMR element by a non destructive inspection is disclosed. The testing apparatus comprises a temperature control unit which sets a circumferential temperature of a TMR element, a bias electric current control... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20070139054 - Stimulation-response measurement system and method using a chaotic lock-in amplifier: A measurement system, a chaotic lock-in amplifier, and methods use chaotic lock-in amplification to measure a stimulus response from one or more of a device under test, a sample under test and a system under test. The measurement system includes a chaotic reference source, a chaotic excitation source and a... Agent: Agilent Technologies Inc.

20070139055 - Electric circuit tracing system: A testing system for a plurality of electric circuits, such as those, for example, powered by circuit breakers or fuses in a building structure, is disclosed. A receiver module includes a battery-powered microprocessor that includes a radio receiver interconnected with an antenna, as well as a plurality of indicator LEDs.... Agent: Quickpatents, Inc.

20070139056 - Partial discharge detection apparatus and detection method of electrical rotating machine: A partial discharge detection apparatus of an electrical rotating machine includes a metal frame connected to a stator frame of the electrical rotating machine, a power line connected to one of a stator winding corresponding to one phase of three phases in the metal frame and a neutral point lead... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070139057 - System and method for radio frequency identification tag direct connection test: Methods, systems, and apparatuses for testing radio frequency identification (RFID) tags are described. The tags are tested using a direct connection scheme, where a testing apparatus makes direct contact with a portion of a tag in order to perform a test on the tag. For example, the testing apparatus may... Agent: Sterne, Kessler, Goldstein & Fox P.l.l.c.

20070139058 - System and method for analyzing length differences in differential signal paths: A method for analyzing length differences in differential signal paths includes: loading a design file of the differential signal paths from a storage device (9); simulating the differential signal paths based on the design file; dividing simulated differential signal paths into a plurality of segments by impedance division positions that... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070139060 - Method and system for compensating thermally induced motion of probe cards: The present invention discloses a method and system compensating for thermally induced motion of probe cards used in testing die on a wafer. A probe card incorporating temperature control devices to maintain a uniform temperature throughout the thickness of the probe card is disclosed. A probe card incorporating bi-material stiffening... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070139059 - Optical measuring system for detecting geometric data of surfaces: An optical measuring system for detecting geometric data of surfaces of at least one object is described, comprising a beam delivery section, a probe system which is connected to the latter and has a plurality of probe outputs for output of a particular measuring beam to an assigned particular surface... Agent: Kenyon & Kenyon LLP

20070139061 - Probing apparatus with guarded signal traces: A probing apparatus can comprise a substrate, conductive signal traces, probes, and electromagnetic shielding. The substrate can have a first surface and a second surface opposite the first surface, and the electrically conductive first signal traces can be disposed on the first surface of the first substrate. The probes can... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070139062 - Test probe for semiconductor package: An embodiment may comprise a test probe to measure electrical properties of a semiconductor package having ball-shaped terminals. The probe may include a signal tip and a ground tip. The signal tip may have a spherical lower surface allowing good contact with a ball-shaped signal terminal. The ground tip may... Agent: Marger Johnson & Mccollom, P.C.

20070139063 - Apparatus and method for impedance matching in a backplane signal channel: An apparatus comprising a printed circuit board having a front side and a back side, and having therein a plurality of conductive layers, each conductive layer including one or more signal channels; a stub extending from the front side to the back side, the stub being electrically coupled to at... Agent: Blakely Sokoloff Taylor & Zafman

20070139067 - Device for testing thin elements: A device for testing thin elements, such as wafers or individual substrates, while at the same time offering a facility for inspecting the reverse side of the thin elements is provided in which any deflection of the substrate as a consequence of high contact power of the probe card is... Agent: Heslin Rothenberg Farley & Mesiti PC

20070139066 - Integrated current sensor package: An integrated current sensor package includes an integrated circuit having a coil in a metal layer of the circuit. A wire is placed close enough to the coil such that the coil and the wire are inductively coupled with each other.... Agent: Zagorin O'brien Graham LLP

20070139064 - Method for determining temperature profile in semiconductor manufacturing test: A method is provided for testing semiconductor devices. In accordance with the method, a first usage temperature T1 is obtained which represents the maximum or minimum temperature to which a semiconductor device will be exposed during its first use by a customer. The semiconductor device is then tested for defects... Agent: Fortkort & Houston P.C.

20070139065 - Testing high frequency signals on a trace: A system, apparatus and method for testing and measuring high frequency signals on a trace is described. In one embodiment of the invention, a footprint is manufactured on a trace to allow the testing of a signal while reducing the amount of distortion caused by prior art structures and methods.... Agent: Lsi Logic Corporation

20070139068 - Wafer-level flipchip package with ic circuit isolation: Forming a wafer level chip scale flip chip package includes determining isolation requirements of an integrated circuit formed in a semi conductive substrate from package signal connections of the wafer level chip scale flip chip package. Operation may further include, based upon the integrated circuit characteristics, selecting a thickness of... Agent: Garlick Harrison & Markison

20070139069 - Method and apparatus for testing a liquid crystal cell: A test method for a liquid crystal display panel in which the pixels providing liquid crystal elements having sealed in liquid crystal material are arranged in a matrix between opposing electrodes is comprised of a charging process for supplying charge to the above-mentioned liquid crystal element of a pixel under... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20070132442 - Filter tuning: Calibrating a filter includes configuring a connection network coupled to input and output ports of first and second processing components into a first state in which the first and second processing components are connected to form at least part of an oscillator, and reconfiguring the connection network into a second... Agent: Fish & Richardson PC

20070132444 - Fixture for circuit board: A fixture for clamping and fixing a circuit board is provided. The fixture includes a base and a moving element. The base includes a first supporting board and a second supporting board disposed on the first supporting board. At least one positioning bump is disposed on the second supporting board,... Agent: Fulbright And Jaworski LLP

20070132445 - Proximity sensitive defect monitor: The invention relates to a method for determining processing image induced defects in the manufacture of semiconductor products such as wafers by analyzing the circuit design of the product mask and modifying a conventional test defect structure to mimic the product mask to incorporate one or more isolated or other... Agent: Law Office Of Delio & Peterson, LLC.

20070132443 - System and method for testing integrated circuit timing margins: An integrated circuit load board includes a substrate on which a plurality of integrated circuit sockets and an integrated test circuit are mounted. The integrated test circuit includes circuitry for testing the timing margins of memory devices by determining the relative timing between read data and data strobe signals applied... Agent: Edward W. Bulchis, Esq. Dorsey & Whitney LLP

20070132446 - Feedforward parameter estimation for electric machines: A method and system for estimating a parameter of an electric machine, including a controller and a switching device, the controller responsive to at least one of: a current sensor, and a temperature sensor. Where the controller executes a parameter estimation process, which is responsive to at least one of:... Agent: Delphi Technologies, Inc.

20070132447 - Position and torque sensor: A sensor having a first array of N magnetic pole pairs, where N is a positive number, and a second array of M magnetic pole pairs, arranged substantially in parallel to the first array, where M is a positive number different from N, such as N−1 or N+1. A first... Agent: Michael Best & Friedrich, LLP

20070132448 - Brushless resolver and its constructing method: A brushless resolver (10) comprises exciting signal transmitting means for transmitting a resolver exciting signal from the stator (3) side to the rotor (4) side in a noncontact way and a resolver part (7) for modulating the resolver exciting signal according to the angle of rotation to be detected. The... Agent: Fay Sharpe LLP

20070132449 - Multi-turn non-contact angular position sensor: A multi-turn angular position sensor for generating a pulse width modulated (PWM) output corresponding to greater than a 360 degree turn of a shaft. The angular position sensor includes main, first and second gears and first and second angular position sensor assemblies. The main gear can be mounted on the... Agent: Christie, Parker & Hale, LLP

20070132450 - Proximity detector: A proximity detector includes a fine DAC and a coarse DAC, outputs of which are summed to provide a tracking signal for tracking a magnetic field signal. The proximity detector provides two mode of operation. In a first mode of operation the coarse and fine DACs operate in combination as... Agent: Daly, Crowley, Mofford & Durkee, LLP

20070132451 - Permeability determinations from nuclear magnetic resonance measurements: Permeability determinations are made from NMR measurements of a logging tool. The NMR measurements are used to find an observed critical spin-spin relaxation time which is used in conjunction with an in situ determination of surface relaxivity of a rock in order to generate permeability determinations.... Agent: Schlumberger-doll Research Attn: Intellectual Property Law Department

20070132452 - Arterial spin labeling with pulsed radio frequency sequences: In one aspect, a method for imaging fluid flow and/or perfusion using spin labeling is provided. The method comprises applying a first magnetic gradient sequence at least to a labeling region, applying a first pulsed radio frequency (RF) sequence to the labeling region to label the fluid, the first pulsed... Agent: Wolf Greenfield & Sacks, P.C.

20070132454 - Cavity resonator for mr systems: A magnetic resonance apparatus in embodiments of the invention may include one or more of the following features: (a) a coil having at least two sections, (b) the at least two sections having a resonant circuit, (c) the at least two sections being wirelessly coupled or decoupled, (d) the at... Agent: Intellectual Property Group Fredrikson & Byron, P.A.

20070132453 - Rf shielding method, mri apparatus, and transmtiting/receiving surface coil: In order to reduce the cost for isolation between a surface coil and a body coil installed on a magnet assembly side, an RF shield for a surface coil is disposed between a body coil installed on a magnet assembly side of an MRI apparatus and a surface coil body... Agent: Patrick W. Rasche (20459) Armstrong Teasdale LLP

20070132455 - Shimming with mri gradient: A method of correcting active shimming element of a magnetic resonance device, including providing a set of correction values for each shimming element for a given N sub volumes, wherein N is an integer number greater than or equal to 1, detecting irregularities in the magnetic field of the sample... Agent: Daniel J Swirsky

20070132456 - Method and article of manufacture for monitoring an electrical energy storage device: There is provided a method and article of manufacture for monitoring an electrical energy storage device for a system. The method comprises stabilizing the electrical energy storage device. Once the device is stabilized, a discrete electrical load is cyclically applied to the electrical energy storage device and state variables of... Agent: General Motors Corporation Legal Staff

20070132457 - Voltage detector and insulator interface: The present invention is to provide a voltage detector having a common communication line for reducing a manufacturing cost. A low voltage line CPU transmits a detection instruction including an assignment of one address among a plurality of blocks. The detection instruction is branched by a transmitting bus line for... Agent: Armstrong, Kratz, Quintos, Hanson & Brooks, LLP

20070132458 - Voltage indicator test mechanism: An electrical safety monitor includes line inputs for an L1, an L2, an L3, and a GND three-phase connections, a line monitoring circuit having a plurality of light indicators and configured to produce light if voltage exists between any two of the line inputs to thereby indicate presence of voltage... Agent: Mckee, Voorhees & Sease, P.L.C

20070132459 - State detecting method and insulation resistance detector: A control circuit 52 makes the pulse oscillation circuit 51 output pulse signals of frequency 2.5 Hz and 4.5 Hz. The control circuit 52 calculates a difference between outputs of a low pass filter 53 at 2.5 Hz and at 4.5 Hz. The control circuit 52 detects a state of... Agent: Armstrong, Kratz, Quintos, Hanson & Brooks, LLP

20070132460 - Microwave spectroscopy probe: A microwave spectroscopy probe has a center conductor between a first ground plane and a second ground plane. A dielectric member has fluid channel between the center conductor and the first ground plane.... Agent: Agilent Technologies Inc.

20070132461 - System to measure time of arrival and thickness of rotor blades via microwave energy: A rotor blade measurement system includes a microwave source and a probe. A directional coupler is attached to the source and the probe. A detector is attached to the directional coupler. The probe directs a microwave signal toward a rotor such that during rotation the rotor blade will pass through... Agent: Carlson, Gaskey & Olds, P.C.

20070132462 - Pade' approximant based compensation for integrated sensor modules and the like: Methods and systems using Pade' Approximant expansion ratios provide mappings between nonlinear sensors and a more linearized output domain. In one embodiment (a) a variable gain amplifier receives a supplied input signal, the amplifier has at least a first input terminal, an output terminal, and a gain control terminal; (b)... Agent: Macpherson Kwok Chen & Heid LLP

20070132463 - System and method for detecting rail break/vehicle: A system for detecting a rail break or train occupancy includes a current source adapted to deliver a current to an isolated block of a rail track. A voltage sensor is coupled to the isolated block and configured to detect voltage across the isolated block. A shunt device is coupled... Agent: Patrick S. Yoder Fletcher Yoder

20070132464 - Magnetic-field-measuring probe: A magnetic-field-measuring probe includes at least one magnetoresistive or magnetoinductive sensor which is sensitive to the magnetic field along a privileged measurement axis. The probe includes: at least two magnetoresistive or magnetoinductive sensors (14, 16) which are rigidly connected to one another in a position such that the privileged measurement... Agent: Young & Thompson

20070132467 - Probe card for tests on photosensitive chips and corresponding illumination device: A probe card and its corresponding illumination device are provided for performing electrical operating tests, preferably done in parallel, with respect to a plurality of chips provided with connection pads, under illumination conditions given by a lighting source, the probe card being a printed circuit board (PCB) including electrical connections... Agent: Jenkens & Gilchrist, PC

20070132466 - Probe cards employing probes having retaining portions for potting in a retention arrangement: Method and apparatus using a retention arrangement with a potting enclosure for holding a plurality of probes by their retention portions, the probes being of the type having contacting tips for establishing electrical contact with pads or bumps of a device under test (DUT) to perform an electrical test. The... Agent: Lumen Intellectual Property Services, Inc.

20070132465 - Probe station comprising a bellows with emi shielding capabilities: A probe station allows for effective EMI shielding of the passage of the probe through the wall of the housing of such probe station. The probe is freely movable in the X, Y and Z directions. The probe station comprises a housing having at least one aperture through which a... Agent: Heslin Rothenberg Farley & Mesiti PC

20070132468 - Probe test apparatus: The present invention provides a probe test apparatus capable of easily correcting a probe needle of a probe card. A pad image by which the position of an electrode pad P can be specified is captured from a semiconductor wafer, and the captured pad image is stored. While capturing a... Agent: Young & Thompson

20070132469 - Inspection device and method: A second temperature control mechanism is configured by providing a gas circulator circulating a gas, in this case air, with an expected temperature, a pair of temperature sensors installed on upper and lower side surfaces of a mounted probe card respectively, and a gas temperature controller adjusting and controlling the... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070132470 - Temperature characteristic inspection device: Optoelectronic properties of optical communication LEDs, LDs and PDs should be examined in a wide range of temperatures between −40° C. and +85° C. Low temperature photocharacteristics of as-chip devices are tested by preparing an inspection stage cooled at a low temperature encapsulated in a shield casing with a front... Agent: Fish & Richardson P.C.

20070132471 - Method and apparatus for testing integrated circuits over a range of temperatures: A method, system and device for testing an integrated circuit or device under test over a range of temperatures with a plunger, clamp or lid over the integrated circuit or device under test is disclosed.... Agent: Agilent Technologies Inc.

20070132472 - Semiconductor integrated circuit and method for testing the same: Devices to be tested using the measuring terminal of a semiconductor testing apparatus are increased in number. The devices can be formed by executing a step at which a plurality of integrated circuits are provided on a wafer, a photomask for use in forming the integrated circuits is provided with... Agent: Stevens, Davis, Miller & Mosher, LLP

20070132474 - Automated platform for electronic apparatus environmental testing & method of use: An automated platform for electronic apparatus environmental testing and the methods of its operation holds and positions electronic devices during environmental testing. The automated platform may be a multi-legged table and includes a surface for providing vertical support. A plurality of bracket mechanisms, each hold in position an electronic device.... Agent: HulseyIPIntellectual Property Lawyers, P.C.

20070132476 - Method of forming circuit pattern on printed circuit board: Disclosed is a method of forming a circuit pattern on a printed circuit board. More particularly, this invention relates to a method of forming a circuit pattern on a printed circuit board, including filling a grooved plate having grooves corresponding to a desired circuit pattern in the surface thereof with... Agent: Staas & Halsey LLP

20070132473 - Methods and apparatus for inline variability measurement of integrated circuit components: A method of measuring variability of integrated circuit components is provided. A specified parameter of at least one first array configuration comprising a plurality of the integrated circuit components without specified internal connections between the integrated circuit components is measured. The specified parameter of at least one second array configuration... Agent: Ryan, Mason & Lewis, LLP

20070132475 - Semiconductor device test method and device: A semiconductor device test method for testing a semiconductor device is disclosed. In one embodiment, for transmitting control information to a device that is connected between a test device and the semiconductor device, a non-standard-compliant signal is sent to the device. Furthermore, the invention relates to a semiconductor device test... Agent: Dicke, Billig & Czaja, P.l.l.c.

20070132478 - Semiconductor fuse covering: A method and system for sealing or covering exposed fuses on a semiconductor device are disclosed. A semiconductor device prober incorporating a spray device for applying a sealing compound to individual fuses on a semiconductor device subsequent to testing the semiconductor device is disclosed. A method and system for sealing... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070132477 - System and methods for test time outlier detection and correction in integrated circuit testing: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20070132479 - Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments: A method and apparatus for a thermal stratification test providing cyclical and steady-state stratified environments. In order to test an electronic device, for example one having one or more levels of ball-grid-array interconnections, e.g., connecting a chip to a flip-chip substrate and connecting the flip-chip substrate to a printed circuit... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.

20070132480 - Power supply noise resistance testing circuit and power supply noise resistance testing method: Provided is a power supply noise resistance testing circuit, in which a test pattern is applied to a data input portion of a functional block formed on a semiconductor chip and a voltage on which a power supply noise is superimposed is supplied to a power supply portion of the... Agent: Foley And Lardner LLP Suite 500

20070126412 - Waveform measuring apparatus and method thereof: A waveform measuring apparatus includes: a digital filter for removing a large-amplitude changing component from an input signal and for outputting a resultant output signal with a small-amplitude noise component left therein; a window generating section for receiving a differential signal between this input signal and the resultant output signal... Agent: International Business Machines Corporation Dept. 18g

20070126413 - Communication pad mounting structure of refrigerator: There is a problem in that it is inconvenient to use a conventional communication pad (17) since a user cannot diversely adjust a direction of the communication pad. The present invention relates to a communication pad mounting structure of a refrigerator. In the present invention, a front of a door... Agent: Ked & Associates, LLP

20070126414 - Jitter generation: The present invention relates to a method for generating jitter in a digital data signal, the digital data signal having a predetermined data pattern being stored in a memory, the method comprising the steps of reading out the digital data signal from the memory using a clock signal provided by... Agent: Paul D. Greeley, Esq. Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20070126415 - Mechanical quantity detecting element and mechanical quantity detecting device: A mechanical quantity detecting element includes a main frame displaceably supported with respect to a substrate in an X axis direction parallel to a surface of the substrate, a transducer displaceably supported with respect to the main frame in a Y axis direction perpendicular to the X axis direction and... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070126416 - Displacement sensor systems and methods: Various embodiments of displacement systems and methods are disclosed. One method embodiment, among others, includes providing a pulsed excitation signal to a single location of a resistive member with reference to another location of the resistive member of a displacement sensor, and responsive to the excitation signal, measuring a voltage... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20070126417 - Magnetic encoder: A magnetic encoder having a magnetic sensor composed of SVGMR elements, in which a signal output with a cycle equal to or less than a third of a cycle of magnetic patterns on a magnetic medium. The magnetic encoder comprises the magnetic medium, on which first magnetic regions and second... Agent: Sughrue Mion, PLLC

20070126418 - Device to correct interference errors between magnetic sensors for measuring the position of mobile elements: A device to correct interference errors in a measuring installation (A) that includes at least two magnetic sensors (11, 12) for measuring the position of mobile elements (21, 22) that are moving along adjacent trajectories, with each magnetic measuring sensor delivering a measurement signal that is representative of the position... Agent: Dennison, Schultz & Macdonald

20070126419 - Rotation angle detecting device having function of temperature characteristic correction: A method of correcting temperature characteristic of a rotation angle detecting device that includes a permanent magnet, a magnetic core, a Hall element that rotates relative to the permanent magnet when a rotating object rotates to provide an output signal. The method includes a step of setting temperature correction values... Agent: Nixon & Vanderhye, PC

20070126420 - Method and device for distinguishing parts influencing an electromagnetic alternating field: A device for detecting parts in a material flow which influence an electromagnetic alternating field comprises an oscillator (1) and at least one transmitting coil (2) for generating an electromagnetic alternating field extending across the width of a conveying distance of the material flow. At least one detector coil (4)... Agent: Lowe Hauptman Berner, LLP

20070126421 - Surveying of buried pipelines: A method of surveying a pipeline is provided. The pipeline comprises a tubular member with a protective wrapping. The method comprises the steps of applying signal to the pipeline from a first location, which first location is remote from the pipeline, and measuring the signal from a second and third... Agent: Woodard, Emhardt, Moriarty, Mcnett & Henry LLP

20070126422 - Conformable eddy current array: A system for mapping a surface defect in an electrically-conducting material by measuring a change in the resonance of the material includes a flexible printed circuit board and a two dimensional array of transducers printed on the flexible circuit board, wherein each element of the array includes two transducer coils... Agent: Wright Brown & Close

20070126423 - Device for punctual measurement of a radiofrequency magnetic field with constant amplitude and frequency: The invention concerns a device for measuring a radiofrequency magnetic field, characterised in that it comprises on a common support: a coil forming a primary reception antenna; a voltage-controlled oscillator, monitored so that its output frequency depends on the amplitude of the magnetic field received on the coil forming primary... Agent: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.

20070126424 - System for monitoring a quench tube of a superconducting magnet in an mrt apparatus: A system for monitoring a quench tube of a superconducting magnet in an MRT apparatus has an illumination unit and at least one image acquisition unit arranged inside the quench tube. Images acquired by the image acquisition unit are supplied to a monitoring location for viewing.... Agent: Schiff Hardin, LLP Patent Department

20070126425 - Mri apparatus: An MRI apparatus in which a magnetic field is applied to a subject, a receiver coil attached to the subject receives a magnetic resonance signal generated in the subject, and a magnetic resonance image of the subject is generated from the magnetic resonance signal, the apparatus comprising a gantry which... Agent: Nixon & Vanderhye, PC

20070126426 - Method and apparatus for locating well casings from an adjacent wellbore: A wellbore tool for locating a target wellbore containing a conductive member from a second wellbore and directing the trajectory of the second wellbore relative to the target wellbore includes an electric current driver having an insulated gap; a three-axis magnetometer positioned within a non-magnetic housing that is disposed within... Agent: Schlumberger Oilfield Services

20070126427 - Method for measuring electromagnetic radiation pattern and gain of radiator using tem waveguide: A method for measuring electromagnetic radiation pattern and gain of radiator using TEM waveguide is disclosed. The method includes the steps of: a) measuring powers of output port of a transverse electric and magnetic (TEM) waveguide by changing arrangements of the radiator located within the TEM waveguide; and b) estimating... Agent: Mayer, Brown, Rowe & Maw LLP

20070126428 - Anti-islanding protection systems for synchronous machine based distributed generators: A system for providing anti-islanding protection of a synchronous machine based distributed generator includes a frequency sensor configured to generate a generator frequency signal, a bandpass filter configured for filtering the generator frequency signal, a governor controller configured for using the filtered frequency signal to generate a power feedback signal,... Agent: General Electric Company Global Research

20070126429 - Semiconductor intergrated circuit device: It is provided a semiconductor integrated circuit device capable of easily designing a large scale circuit, particularly a circuit of a system LSI designed by combining circuits using plural intellectual properties and the like. The semiconductor integrated circuit includes a driving unit which is connected to a driven circuit via... Agent: Greenblum & Bernstein, P.L.C

20070126430 - System and method for testing power durability of saw filter: A system for testing a power durability of a SAW filter includes: a signal generator for generating a continuous wave of an oscillator; a high power amplifier for amplifying a signal applied from the signal generator into a target power level; a power durability tester (PDT) for receiving the amplified... Agent: Blakely Sokoloff Taylor & Zafman

20070126431 - Dynamically switched line and fault detection for differential signaling systems: A differential signaling system is provided. The differential signaling system comprises one or more cable pairs for carrying signals, one or more differential drivers for providing signals to the one or more cable pairs, and one or more differential receivers, the one or more differential receivers being coupled to the... Agent: Honeywell International Inc.

20070126432 - Capacitive physical quantity sensor and method of diagnosing the same: A capacitive sensor for detecting a physical quantity includes a movable electrode and a fixed electrode, and a controlling unit for applying a signal between the movable electrode and the fixed electrode. The controlling unit includes an input terminal, an output terminal, and a time measuring means for measuring a... Agent: Posz Law Group, PLC

20070126433 - Permeable moisture sensor for concrete, and other moisture sensors, moisture sensing methods and construction methods: Non-invasive moisture-sensing within concrete (such as concrete buildings, bridges, etc.) or a polymeric material may be accomplished by a capacitor structure comprising a porous material built inside the concrete or polymeric material. The capacitance measurements change based on the amount of moisture in the porous material. Moisture-sensing can be monitored... Agent: Whitham, Curtis & Christofferson & Cook, P.C.

20070126434 - System for on-line assessment of the condition of a thermal coating on a turbine vane: Aspects of the invention relate to a system for assessing the condition of a thermal barrier coating on a turbine vane during engine operation. According to embodiments of the invention, one or more wires can be passed along the airfoil portion of the vane. The wires can extend over, within,... Agent: Siemens Corporation Intellectual Property Department

20070126435 - Apparatus and method for adjusting an orientation of probes: Probes of a probe card assembly can be adjusted with respect to an element of the probe card assembly, which can be an element of the probe card assembly that facilitates mounting of the probe card assembly to a test apparatus. The probe card assembly can then be mounted in... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070126443 - Method of manufacturing a probe card: A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data regarding a newly designed semiconductor device is received along with data describing the tester and testing algorithms to be used... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070126439 - Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment: Methods and apparatus are described for aligning a probe card with a wafer probe interface by bringing first kinematic features into contact with second kinematic features, thereby restraining relative motion between the probe card and the wafer probe interface when the probe card and the wafer probe interface are docked.... Agent: Beyer Weaver LLP

20070126436 - Molecular quantum memory: Apparatus, systems and methods for implementing molecular quantum memory are disclosed. In one implementation, a source of polarized electrons and a source of oppositely polarized electrons may be selectively coupled to at least one probe tip of a probe assembly. The at least one probe tip may, in turn, be... Agent: Intel Corporation C/o Intellevate, LLC

20070126437 - Printed circuit board and inspected unit: A printed circuit board includes a substrate and an inspection piece part having a solder part provided on a surface of the substrate to be inspected by an inspecting apparatus. Thus, the printed circuit board and an inspected unit can efficiently be inspected without being disassembled and damaged.... Agent: Stanzione & Kim, LLP

20070126440 - Probe card assembly with a mechanically decoupled wiring substrate: A probe card assembly can comprise a probe head assembly and a wiring substrate. The probe head assembly can comprise a plurality of probes disposed to contact an electronic device disposed on a holder in a test housing. The wiring substrate can include an electrical interface to a test controller... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070126441 - Probe card transfer assist apparatus and inspection equipment using same: A probe card transfer assist apparatus for assisting an operation of transferring a probe card employed in an electrical inspection apparatus includes a holding unit for holding a pair of grips of the probe card wherein the grips are supported by being placed onto or suspended by the holding unit;... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070126442 - Probe chip and probe card: The present invention provides a probe chip and a probe card in which when troubles such as breakage etc. occur in a probe of a contact portion of a probe card, the contact portion can be easily replaced with another one. In the probe card having a guide frame, a... Agent: Staas & Halsey LLP

20070126444 - Probe with trapezoidal contactor and device based on application thereof, and method of producing them: A probe is disclosed, comprising a beam 4B, which has a front end 4b1, an intermediate portion 4b2 and a base end 4b3, the front end being a portion for contacting a test subject through a contactor, the base end being a portion for fixing the probe; and a substantially... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070126438 - Probing apparatus, probing circuit board and probing system for high-voltage matrix probing: A probing apparatus, probing circuit board and probing system for high-voltage matrix probing are provided. Switching circuits of the probing apparatus capable of probing a plurality of probing points for high-voltage matrix probing are manufactured with using a mixed high-voltage IC process. The probing circuit board comprises a plurality of... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20070126445 - Integrated circuit package testing devices and methods of making and using same: Integrated circuit package testing devices having a substrate with a cavity, and a device connecting a latch to said substrate, wherein said latch provides an unobstructed path to a center of the cavity, and the method for making and using the devices.... Agent: Dickstein Shapiro LLP

20070126446 - Ground-signal-ground (gsg) test structure: A ground-signal-ground (GSG) test structure for production measurement of RF device performance in integrated circuits comprises one pair of signal pads (S1, S2) and two pairs of ground pads (G1a, G1b; G2a, G2b). All the six pads (G1a, G2a, S1, S2, G1b, G2b) are arranged linearly, whereby the width of... Agent: Philips Intellectual Property & Standards

20070126450 - Sensor differentiated fault isolation: Disclosed is an apparatus and method for diagnostically testing circuitry within a device. The apparatus and method incorporate the use of energy (e.g., light, heat, magnetic, electric, etc.) applied directly to any location on the device that can affect the electrical activity within the circuitry being tested in order to... Agent: Frederick W. Gibb, Iii Gibb & Rahman, LLC

20070126449 - System and method for measuring performance of a voltage regulator module attached to a microprocessor: A system and method for measuring performance of a voltage regulator module (VRM) (61) attached to a microprocessor (62) is disclosed. The system includes: a voltage transient tester (VTT) fixture (5) for setting different working voltage levels of the VRM; an oscillograph (2) for measuring transient voltage levels of the... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070126448 - System-on-a-chip pipeline tester and method: A pipeline tester is disclosed that is capable of testing systems-on-a-chip (SOCs) or Devices Under Test (DUTs) in pipeline fashion. The tester provides faster, more economical testing of such SOCs and DUTs, which are loaded sequentially into the tester. A plurality of underlying test stations are disposed in the tester.... Agent: Agilent Technologies Inc.

20070126447 - Testing apparatus and method: An improved apparatus and method for testing experiment is disclosed. The apparatus includes a motherboard and a stress module. The motherboard includes a component under test. A stress module connects the component and contacts the component directly. The stress module can provide the component with various rages of temperature and... Agent: Squire, Sanders & Dempsey L.l.p

20070126452 - Apparatus and method for a wire wrapping process: A mounting apparatus includes a base and at least one pair of shoe plates. The shoe plates are formed on a top surface of the base. Each of the shoe plates comprises a plurality of grooves respectively on top surfaces thereof for holding at least one connector. It is simple... Agent: Morris Manning Martin LLP

20070126454 - Apparatus and method of detecting defective substrate: An apparatus and method of detecting a functionally defective substrate includes a detection unit to detect a trend in change in a voltage of a power source when a substrate is heated by the power source given by discharging of a capacitor and a test unit to compare the detected... Agent: Stanzione & Kim, LLP

20070126453 - Apparatus for testing a semiconductor device: Disclosed herein is an apparatus for testing a semiconductor device in a cost-saving manner. The apparatus may include a first substrate having a plurality of drive circuits for supplying various test signals, and a second substrate detachably connected to the first substrate. One side of the second substrate may be... Agent: Sherr & Nourse, PLLC

20070126459 - Method for testing semiconductor components using bonded electrical connections: A method for testing a semiconductor component includes the steps of bonding an interconnect to the component to form bonded electrical connections, applying test signals through the bonded electrical connections, and then separating the interconnect from the component. The bonding step can be performed using metallurgical bonding, and the separating... Agent: Stephen A Gratton The Law Office Of Steve Gratton

20070126451 - Method for testing the quality of light-permeable thin film: An exemplary method for testing the quality of light-permeable thin films includes the steps of: providing a testing pattern; obtaining an image of the testing pattern as a reference image with an image sensor through a reference light-permeable thin film; determining resolution of the reference image by a modulation transfer... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070126458 - Methods and systems for determining one or more properties of a specimen: Various methods and systems for determining one or more properties of a specimen are provided. One system for determining a property of a specimen is configured to illuminate a specimen with different wavelengths of light substantially simultaneously. The different wavelengths of light are modulated at substantially the same frequency. The... Agent: Baker & Mckenzie LLP

20070126455 - Semiconductor test apparatus and performance board: A performance board 10 of a semiconductor test apparatus (image sensor tester) 1a comprises buffers 11-1 to 11-n for driving cables, and switches 12-1 to 12-n for switching between the input of a measurement signal output from a device under measurement and the input of a reference signal output from... Agent: Muramatsu & Associates

20070126456 - Test socket: There is provided a test socket for an integrated circuit. The test socket comprises a first plurality of test points for making electrical contact with contacts of a laminate package and a second plurality of test points for making electrical contact with contacts of a lead frame package. The test... Agent: Slater & Matsil LLP

20070126457 - Wafer holder, and heating unit and wafer prober provided with the wafer holder: A wafer holder is provided with a mounting stage having a mounting surface for mounting a wafer, and a holding member for holding the mounting stage, wherein relationships are established such that K1>K2 and Y1<Y2, where K1 is the thermal conductivity of the mounting stage, Y1 is the Young's modulus... Agent: GlobalIPCounselors, LLP

20070126460 - Flat panel display, fabricating method thereof, fabricating apparatus thereof, picture quality controlling method thereof, picture quality controlling apparatus: A flat panel display, a fabricating method thereof, a fabricating apparatus thereof, a picture quality controlling method thereof and a picture quality controlling apparatus for reducing a recognizing degree of a defective pixel and electrically compensating a charging characteristics of the defective pixel are provided. In the flat panel display,... Agent: Brinks Hofer Gilson & Lione