Electricity: measuring and testing inventions 05/07

20070120551 - Apparatus for detecting temperature using transistors: An apparatus for detecting a temperature using transistors includes a plurality of temperature detecting units that become selectively active according to predetermined temperature intervals; and a detection signal output unit that generates detection signals according to the signals transmitted by the plurality of temperature detecting units, and outputs the detection... Agent: Venable LLP

20070120552 - Hall ic type current sensor of vehicle-mounted power converter: In a Hall IC type current sensor of a vehicle-mounted power converter which includes a bus bar which supplies electricity to a vehicle-mounted power converter, a Hall IC which detects a current supplied to the bus bar, and a control board on which a control circuit which controls the vehicle-mounted... Agent: Sughrue Mion, PLLC

20070120553 - Method and system for calibrating a micro-electromechanical system (mems) based sensor using tunneling current sensing: A system and method for controlling a tunneling current between a first element and a second element of a micro-electro-mechanical system (MEMS) sensor. The system includes a tunneling current excitation source for providing a tunneling current between the elements and a tunneling current monitor for monitoring a change in the... Agent: General Electric Company Global Research

20070120554 - Detecting method and detecting apparatus for detecting internal of rechargeable battery, rechargeable battery pack having said detecting apparatus therein, apparatus having said detecting apparatus therein, program in which said detecting method is incorp: A detecting method for detecting internal resistance of an inspective rechargeable battery when said inspective rechargeable battery is charged by the constant current-constant voltage charging regime, said detecting method comprising at least a step (a) wherein an accumulated, charged electricity quantity of said inspective rechargeable battery in the constant voltage... Agent: Fitzpatrick Cella Harper & Scinto

20070120555 - Magnetic sensor: A magnetic sensor includes a sensing chip having a magnetoresistive element for sensing a magnetic vector and a magnet for biasing the magnetic vector sensed by the magnetoresistive element. The sensing chip senses change in the magnetic vector for detecting a behavior of a magnetic body based on a variation... Agent: Posz Law Group, PLC

20070120556 - Magnetic position sensor for a mobile object with limited linear travel: A magnetic sensor including a first resource (3) for the creation of a magnetic field, oriented along a first axis in the direction of the axis of movement, and a second resource (6) for the creation of a magnetic field, oriented along a second axis in the direction of the... Agent: Dennison, Schultz & Macdonald

20070120557 - Signal processing circuit for encoder: In an encoder which is equipped with two detectors arranged on both sides of a rotating shaft in order to eliminate an eccentricity error, the mounting of the detectors is facilitated by making provisions so as to not cause a problem in the calculating of an average even if the... Agent: Lowe Hauptman Berner, LLP

20070120558 - Probe card method: A probe card method, wherein a base supports a probe pin and an electromagnet. When the probe pin contacts a magnetic-sensor terminal on a chip on a wafer, magnetic force is applied to a magnetic-field sensing section in the chip.... Agent: Staas & Halsey LLP

20070120559 - Pulsed eddy current pipeline inspection system and method: A pulsed eddy current pipeline inspection device is provided. The pulsed eddy current pipeline inspection device comprises a plurality of stages longitudinally spaced apart from each other and adapted to move between a contracted position and an expanded position, and a plurality of sensors disposed around at least a portion... Agent: Patrick S. Yoder Fletcher Yoder

20070120560 - Eddy current inspection device with arrays of magnetoresistive sensors: There is provided an inspection device for the detection of flaws in a component. The inspection device comprises a magnetic field generator, a first array of magnetoresistive sensors and a second array of magnetoresistive sensors, in which the second array is substantially orthogonal to the first array. The signals generated... Agent: Alston & Bird LLP

20070120561 - Method for material property monitoring with perforated, surface mounted sensors: Material condition monitoring may be performed by electromagnetic sensors and sensor arrays mounted to the material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20070120562 - Portable system for rapid characterization of electrical properties of a material: A material properties detection system (100). The system can include an antenna (120) that is tuned for operation within a frequency band over which the antenna transmits. The system also can include a transmitter (210) that generates electromagnetic energy across the frequency band and forwards the electromagnetic energy to the... Agent: Cuenot & Forsythe, L.L.C.

20070120563 - Magnetic field measurement system and optical pumping magnetometer: Provided is a highly accurate optical pumping magnetometer, in which a static magnetic field and an oscillating field to be applied to a vapor cell are stabilized. To this end, the optical pumping magnetometer includes: Helmholtz coils for applying a constant static magnetic field to a vapor cell serving as... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070120564 - Cold mass with discrete path substantially conductive coupler for superconducting magnet and crygenic cooling circuit: A cold mass for a superconducting magnet system in one example comprises a superconducting magnet, a cryogenic cooling circuit, and a magnet and cooling circuit support. The magnet and cooling circuit support comprises a substantially conductive coupler in a discrete path that serves to couple the superconducting magnet and the... Agent: General Electric Company Global Research

20070120565 - Magnetic resonance imaging apparatus: The present invention provides an MRI apparatus which prevents from developing body move artifacts on the image to improve the image quality. In the navigator sequence a scan unit emits first RF pulse so as to excite first slice plane area which is out of the imaging area and is... Agent: Patrick W. Rasche (20459) Armstrong Teasdale LLP

20070120566 - Data processing system, data processing method, diagnostic imaging apparatus, and magnetic resonance imaging apparatus: A data processing system to have in a diagnostic imaging apparatus and so on is comprised of a signal-power estimating unit for estimating signal power by using reference data containing data different from processing-target data and a data processing unit for processing the processing-target data by using a WF based... Agent: Nixon & Vanderhye, PC

20070120567 - Monitoring system for high-voltage switches: A method and an apparatus are disclosed for measuring contact erosion in an electrical switching device by a dynamic resistance measurement (DRM). To determine an overlap time and a contact erosion in an exemplary switching device, a change in current across the switching device can be measured indirectly by a... Agent: Buchanan, Ingersoll & Rooney PC

20070120568 - Shield arrangement for a vacuum cell: A shield arrangement for a vacuum measuring cell has a tubular shield housing encompassing a shield and an exit port for connection to a vacuum measuring cell and a connection opening for the object space to be measured. The shield is between the two openings and is implemented as a... Agent: Notaro & Michalos P.C.

20070120569 - Communication semiconductor chip, calibration method, and program: A communication semiconductor chip performs wireless communication with another communication semiconductor chip. The semiconductor chip includes a communication module and a control unit. The communication module performs the wireless communication with another communication semiconductor chip and has a receiving circuit for receiving data. The control unit supplies a reference voltage... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070120570 - Trailer illumination system test device and method of use: A trailer illumination system test device and method of use are disclosed. In one form, a device for testing the functionality of a trailer lighting system is disclosed. The device includes an in-series connection port operable to receive a trailer lighting system plug and a series of trailer light switches... Agent: Raymond M. Galasso Simon, Galasso & Frantz PLC

20070120571 - Method for determining information about the internal workings of a chip based on electro-magnetic emissions therefrom: A novel a method for determining the internal operation of an integrated circuit (IC) includes measuring electromagnetic (EM) emissions from the integrated circuit chip and analyzing the EM emissions. In a particular method, the EM emissions from the IC are measured using an RF close end probe. In a particular... Agent: Henneman & Associates, PLC

20070120572 - Smart coupon for realtime corrosion detection: The invention relates generally to corrosion sensors having one or more linear reactive impedance corrosion element capable of detecting both general and local corrosions, and to methods for detection same.... Agent: William E. Powell, Iii, Esq. General Electric Corporation

20070120573 - Semiconductor switch circuit: First, second, and third semiconductor switches are connected in series terminal between input and output terminals and first and second voltage application means are connected in parallel to the first and third semiconductor switches, whereby providing semiconductor switch circuit. Each voltage application means is composed of a series-connected circuit of... Agent: Gallagher & Lathrop, A Professional Corporation

20070114987 - Intelligent electronic device for providing broadband internet access: An intelligent electronic device for monitoring and determining an amount of electrical power usage by a consumer, or end user, and for providing broadband Internet access to the consumer. The intelligent electronic device includes at least one sensor coupled to an electric circuit configured for measuring at least one power... Agent: Casella & Hespos

20070114989 - Apparatus and methods for magnetic through-skin sensing: Apparatus and methods for magnetic through-skin sensing are disclosed. In one embodiment, a sensing system includes a first portion including a magnet having, and a second portion including a magnetic field sensor. The magnet has a magnetic field emanating therefrom. A field-directing member provides a zone of approximately spherically-shaped magnetic... Agent: Lee & Hayes, PLLC

20070114988 - Sensor, in particular a magnetic field sensor, with interference compensation and method for interference compensation of a sensor: A sensor, in particular a Hall sensor, comprising a sensor element (1; 10) which outputs a sensor signal (SS) containing an interference signal (STS). An evaluation device (6; 20) is connected to the sensor element and contains a subtractor (2; 21) which subtracts the interference signal from the sensor signal.... Agent: Cohen, Pontani, Lieberman & Pavane LLP

20070114990 - Position sensor utilizing a linear hall-effect sensor: Disclosed are a magnetic field assembly and method of configuring the same for use in position sensors of the type, which include a magnetic field sensor. First and second magnets in the field assembly are positioned on a surface of a magnetic plate (return path) and separated from one another... Agent: Dla Piper US LLP

20070114991 - Magnetic detection device: A magnetic detection device includes a magnetic moving unit, a magnet that is arranged to face the magnetic moving unit and that applies a magnetic field to the magnetic moving unit, and a magnetoelectric conversion element that is arranged to face the magnetic moving unit and includes at least one... Agent: Sughrue Mion, PLLC

20070114992 - Closed-loop magnetic sensor system: A closed loop magnetic sensor system for measuring an input magnetic field from a magnetic field source has a compensation circuit, which can be for example a printed wire board, and a magnetic sensor, such as a Magnetoresistive (MR) sensor, for measuring an input magnetic field. Preferably, the magnetic sensor... Agent: Kris T. Fredrick Honeywell International Inc.

20070114993 - Magnetic field characterization of stresses and properties in materials: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20070114994 - Magnetic flux measuring apparatus by hysteresis characteristic type digital fll using counter system for squid: In a SQUID magnetometer, high resolution, a high slew rate, and a high dynamic range are achieved without using expensive circuit components having a large number of processing bits and enabling a high speed processing operation. A digital FLL circuit using a double counter system is provided. This circuit utilizes... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070114995 - Magentometer circuit: A fluxgate magnetometer drive circuit includes a fluxgate inductor that is driven through magnetic saturation by altering voltage pulses. Following each drive pulse, the spurred magnetic energy in the fluxgate is allowed to dissipate by connecting a fluxgate across a fixed reverse voltage. The time for the fluxgate current to... Agent: Siemens Corporation Intellectual Property Department

20070114996 - Apparatus and method for measuring cased hole fluid flow with nmr: A method and apparatus useful to determine characteristics of fluid flow, such as fluid holdup and flow velocity. The apparatus comprises a flow tube, a permanent magnet, a first set of coils, and a second set of coils. The first set of coils creates a radio frequency magnetic field within... Agent: Gilbreth Roebuck Bynum Derrington Schmidt Walker & Tran, LLP

20070114999 - Method and apparatus to generate a circular polarized rf field independent of subject asymmetry: An RF coil assembly is presented that incorporates balun networks to eliminate standing waves from cables used to apply a voltage to multiple drive ports of the coil. Each drive port is driven by an applied voltage that is shifted 90 degrees in the tangential direction. Further, all drive ports... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20070114998 - Rf coil and magnetic resonance imaging apparatus: An RF coil which can restrain coupling while enhancing the freedom of design and arrangement of coils is to be provided. The RF coil unit of a magnetic resonance imaging apparatus is provided with a central coil surrounding a subject around its body axis, an auxiliary coil disposed toward one... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070114997 - Systems, methods and apparatus for a partially elongated field of view in a magnetic resonance imaging system: Systems, methods and apparatus are provided through which a partially elongated field-of-view in a magnetic resonance imaging system is generated either by an asymmetric primary coil or a conventional symmetrical primary coil with a supplementary high odd-order shim that elongates the field-of-view towards one end of the bore. For significantly... Agent: Ramirez & Smith

20070115000 - Calibration of xx, yy and zz induction tool measurements: Measurements made with a multicomponent logging system oriented in a horizontal position above the surface of the earth must satisfy certain relationships. These relationships are used to establish calibration errors in the system.... Agent: Madan, Mossman & Sriram, P.C.

20070115001 - System for driving a plurality of lamps and fault detecting circuit thereof: A system for driving a plurality of lamps includes an inverter circuit (20) and a fault detecting circuit (30). The inverter circuit includes a plurality of outputs divided into a first output part and a second output part. The fault detecting circuit is used for detecting whether one or more... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070115002 - Electrostatic detection apparatus and method, and coordinate detection program: A shielding member is provided as an electrostatic protection device in extension lines that extend from a sensing area to switching devices via extension areas correspondingly. As a result, even if a body to be detected such as a finger contacts the extension area, it is possible to reduce the... Agent: Brinks Hofer Gilson & Lione

20070115003 - Non-destructive testing apparatus and non-destructive testing method: A non-destructive testing method of improved efficiency. Two one-dimensional images are obtained by scanning an optical line over an object to be tested in an X- and Y-directions each for one scan in lieu of conducting a prior art method of two-dimensionally scanning a optical spot on the object to... Agent: Young & Thompson

20070115004 - Method and apparatus for interconnect diagnosis: A system configured to detect faults in signal lines. A system includes a first component configured to communicate with a second component via a signal path including one or more signal traces. Sense signal lines are manufactured such that at some point they are in close proximity to a signal... Agent: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.

20070115005 - Sensor detection apparatus and sensor: Provided are two monitor circuits for monitoring two input signals of an input stage differential amplifier, respectively, and two monitor circuit for monitoring two output signals of the input stage differential amplifier, respectively. When failure occurs at the bridge circuit of a sensor element or at the input stage differential... Agent: Arent Fox PLLC

20070115006 - Capacitor screening: Systems and methods for screening capacitors are disclosed. An exemplary method may comprise charging at least one capacitor for time t1 and then implementing the following operations. After charging time t1, comparing a charge state of the at least one capacitor to thresholds th1-low and th1-high for a capacitance screening... Agent: Hensley Kim & Edgington, LLC

20070115007 - Power-on detecting circuit: A circuit for detecting a power-on voltage of power supply encompasses a voltage divider connected between a first power supply and a second power supply, the potential of the second power supply is lower than the potential of the first power supply, and a detecting circuit connected between the first... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070115008 - Pulse current sensor: A sensor measures the current in high frequency pulses (e.g., pulses having fast rise times) that are transported on coaxial transmission lines. The sensor includes an entrance coaxial conductor and an exit coaxial conductor that are interconnected by a continuous inner conductor. The outer conductors of the two coaxial conductors... Agent: Kenehan & Lambertsen, Ltd John C Lambert

20070115009 - Circuit arrangement of the temperature compensation of a measuring resistor structure: An electrical circuit is disclosed herein for the temperature compensation of at least one measuring resistor structure integrated in a semiconductor body. The electrical circuit comprises at least one further resistor structure which is likewise concomitantly integrated into the semiconductor body and is thermally coupled to the measuring resistor structure.... Agent: Maginot, Moore & Beck Chase Tower

20070115010 - Connection accessory for micro-probing: A probing system has a probing accessory for electrically connecting to a complementary probe accessory connected to a test point where the probing accessory captures and releases the complementary probe accessory by application of only tensile forces.... Agent: Agilent Technologies Inc.

20070115011 - Probe apparatus: A probe apparatus and a probe system are provided. The probe apparatus uses a larger printed circuit board to dispose a plurality of testers. The layout of each of the testers on the circuit board is modified accordingly, such that more number of the testers can be disposed on the... Agent: Jianq Chyun Intellectual Property Office

20070115012 - Reinforced guide panel for vertical probe card: A guide panel for a vertical probe card is disclosed to have a via area and a reinforcing area. The via area has a plurality of feed through vias. The reinforcing area is bonded to the via area. The reinforcing area has a plurality of through holes in communication with... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20070115013 - Chuck with integrated wafer support: An improved chuck with lift pins within a probe station.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070115014 - Incorporation of isolation resistor(s) into probes using probe tip spring pins: An isolation resistor is incorporated into the plunger of a probe tip spring pin by, for example, doping a ceramic that is used to form the plunger, or forming the plunger of first and second electrically coupled materials, at least a first of which has a resistivity sufficient to serve... Agent: Agilent Technologies, Inc. Legal Department, Dl429

20070115015 - Method of automatically carrying ic-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester: A method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester uses a set of laser distance sensors to align the vacuum nozzles with the target. Alignment occurs when certain combinations of distance and distance changes are sensed.... Agent: Foley And Lardner LLP Suite 500

20070115016 - Radio frequency identification tag with embedded memory testing scheme and the method of testing the same: A radio frequency identification (RFID) tag with embedded memory testing scheme and the method of testing the same is disclosed, in which the RFID tag is comprised of an analog block, a digital block and a memory block. Operationally, as the analog block receives and demodulates a memory self-test signal... Agent: Bruce H. Troxell

20070115017 - Thin module system and method: A flexible circuit has contacts for mounting in a socket or card edge connector. The flexible circuit includes integrated circuit devices mounted on both sides of the edge connector contacts. Preferably, the flexible circuit is wrapped about an edge of a rigid substrate and presents contacts on both sides of... Agent: Fish & Richardson P.C.

20070115020 - Functionality test method: A functionality test method for a technical system having at least one technical component to be regularly tested. The method including the steps of defining a test interval by setting a minimum time interval and a maximum time interval between two successive tests of the technical component, defining a test... Agent: Patrick W. Rasche (22402)

20070115019 - Method and apparatus for storing circuit calibration information: A method for altering circuit characteristics to make them independent of processing parameters of devices within an integrated circuit is disclosed. A process parameter is measured by a kerf or on-chip built-in test on a selective set of chip on a wafer, and the results are stored on a storage... Agent: Dillon & Yudell LLP

20070115018 - Structure and method for monitoring stress-induced degradation of conductive interconnects: A microelectronic element such as a chip or microelectronic wiring substrate is provided which includes a plurality of conductive interconnects for improved resistance to thermal stress. At least some of the conductive interconnects include a metallic plate, a metallic connecting line and an upper metallic via. The metallic connecting line... Agent: International Business Machines Corporation Dept. 18g

20070115021 - Testing method for array substrate: A testing method for an array substrate is disclosed which includes a first measuring step of operating a line electrode driver circuit 15 and a row electrode driver circuit 16 like in a normal display mode while implementing writing in/reading out of a test video signal to and from supplemental... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070115022 - Power supply having voltage blocking clamp: A power supply comprises a rectifier, a transformer, a switching member, a controller and a voltage blocking clamp. A power supply can receive an alternating current (AC) input voltage having any magnitude within a wide range of AC input voltage magnitudes and can produce from any such AC input voltage... Agent: Woodcock Washburn LLP

20070115023 - Variable-structure diagnostics approach achieving optimized low-frequency data sampling for ema motoring subsystem: The present invention provides a diagnostics methodology and embedded electronic system that allows optimized low-frequency data sampling for EMA motoring subsystems in an operating vehicle. Each of the EMA motoring subsystems includes: an EMA; at least one motor for driving the EMA; and power controls for operating the motor, wherein... Agent: Ingrassia Fisher & Lorenz, P.C.

20070108960 - Fuel cell voltage measurement device: A fuel cell voltage measurement device includes a main beam provided at two sides with a transverse slot each for slidably receiving a plurality of slides therein, and a plurality of retractable probe assemblies separately mounted on the slides to move along with the slides. Therefore, the retractable probe assemblies... Agent: Birch Stewart Kolasch & Birch

20070108961 - Method and apparatus for tiling memories in integrated circuit layout: A process and apparatus are provided for tiling objects, such as design memories, in one or more respective object locations in a layout pattern. For each object, the following steps are performed recursively based on a comparison of at least one of a capacity and a width of the object... Agent: Lsi Logic Corporation Timothy R. Croll

20070108962 - Method and device for using a multi-channel measurement signal in determining the current distribution of an object: A method for interpreting the current distribution of an object being measured using basis vector components calculated from the measured signals. The components in question have been so selected that they describe the features, as independent as possible, of the current distribution being examined, which enhances the computation and makes... Agent: Nixon Peabody, LLP

20070108963 - Electrical distribution system and modular high power board contactor therefor: An electrical distribution system provides a Line Replaceable Modules (LRM) with a printed wire board (PWB) which is of a relatively thick construction. The PWB is manufactured of a relatively thick construction to provide structural support for a multitude of electrical components as well as a board mounted contactor. Each... Agent: Carlson, Gaskey & Olds, P.C.

20070108965 - Planarity diagnostic system, e.g., for microelectronic component test systems: Maintaining proper planarity of elements of a microelectronic component test system helps ensure reliable operation of the test system. Aspects of the invention provide test systems and methods for verifying planarity of, for example, a head and a support surface of a microelectronic component test system. In one exemplary method,... Agent: Perkins Coie LLP Patent-sea

20070108964 - Utilizing clock shield as defect monitor: Disclosed is a shielded clock tree that has one or more clock signal buffers and clock signal splitters, with clock signal wiring connecting the clock signal buffers to the clock signal splitters. Shielding is adjacent the clock signal wiring, where ground wiring connects the shielding to ground. The shielding comprises... Agent: Frederick W. Gibb, Iii Gibb & Rahman, LLC

20070108966 - Electronic device to acquire encoder speed information and a method thereof: An electronic device for acquiring encoder speed information and a method for implementing the same are provided, wherein the electronic device includes an encoder for electrically outputting an encoder signal corresponding to a driving speed, a processor unit for outputting a preset interval count value based on the resolution of... Agent: Roylance, Abrams, Berdo & Goodman, L.L.P.

20070108967 - Rotation angle detection device: A rotation angle detection device includes a housing including a magnetic sensor, a rotation member rotatable relative to the housing and including a magnet facing the magnetic sensor, and a shaft member operated so as to rotate with an operated member. A rotation angle of the operated member is detected... Agent: Reed Smith LLP

20070108970 - Magnetic impedance device, sensor apparatus using the same and method for manufacturing the same: A magnetic sensor apparatus includes a semiconductor substrate and a magnetic impedance device for detecting a magnetic field. The magnetic impedance device is disposed on the substrate. The magnetic sensor apparatus has minimum size and is made with low manufacturing cost. Here, the magnetic impedance device detects a magnetic field... Agent: Posz Law Group, PLC

20070108968 - Rotation angle detection device: Yoke plates (3a, 3b) of magnetic material adapted for rotation in synchronism with a rotary shaft (2) are installed. An axially magnetized magnet (5) is disposed through the yoke plates (3a, 3b) and an air gap (G1). The outer diameter (R1) of the yoke plates (3a, 3b) is larger than... Agent: Wenderoth, Lind & Ponack, L.L.P.

20070108969 - Rotational state detecting apparatus: A rotational state detecting apparatus for detecting a rotational state of a direct current motor using a detection pulse outputted corresponding to rotation of the direct current motor includes a period measuring apparatus for measuring a period of the detection pulse, a period judging apparatus for judging whether the detection... Agent: Sughrue Mion, PLLC

20070108971 - Eddy current inspection of materials: Methods and apparatus for eddy current inspection are provided. Eddy current inspection is used in a variety of industries to find defects and make measurements and inspections of various materials. Providing superwaves as the excitation current and/or voltage signal for eddy current inspection may produce higher intensity and lower signal-to-noise... Agent: Fish & NeaveIPGroup Ropes & Gray LLP

20070108972 - Sheet conductance/resistance measurement system: An apparatus for testing of electrical or physical properties of a material include a single coil sensor mounted adjacent to a sample of the material. Sheet conductance of a wide variety of materials may be measured using the single coil to determine if the material conforms to generally accepted standards... Agent: Duane Morris, LLPIPDepartment

20070108973 - Systems & methods for flaw detection and monitoring at elevated temperatures with wireless communication using surface embedded, monolithically integrated, thin-film, magnetically actuated sensors, and methods for fabricating the sensors: Systems and methods for flaw detection and monitoring at elevated temperatures with wireless communication using surface embedded, monolithically integrated, thin-film, magnetically actuated sensors, and methods for fabricating the sensors. The sensor is a monolithically integrated, multi-layered (nano-composite), thin-film sensor structure that incorporates a thin-film, multi-layer magnetostrictive element, a thin-film electrically... Agent: Kammer Browning PLLC

20070108974 - Continuous observation apparatus and method of magnetic flux distribution: A continuous observation apparatus of magnetic flux distribution in which a long sample containing a superconducting material or magnetic material is transferred to an observation position and magnetic flux is observed sequentially at each of certain areas along a longitudinal direction of the sample is provided. A method of continuously... Agent: Sughrue Mion, PLLC

20070108975 - Magnetic-field-measuring probe: The invention relates to a magnetic-field-measuring probe comprising at least one magnetoresistive sensor (102, 104, 106) which is sensitive to the magnetic field along a determined privileged measurement axis. The inventive probe comprises: at least two magnetoresistive sensors (102, 104, 106) which are rigidly connected to one another in a... Agent: Young & Thompson

20070108976 - B1 field control in magnetic resonance imaging: Multi-slice magnetic resonance imaging of a region of interest of an imaging subject (16) is performed using a radio frequency coil (40) arranged to generate a B1 magnetic field in the region of interest. One or more processors (44, 82, 88, 110) determine a B1 field value for each slice... Agent: Philips Intellectual Property & Standards

20070108978 - Apparatus and method for patient movement tracking: The present invention relates, in general, to the field of motion tracking, and in particular to join a target in an MRI application. In particular the invention teaches an apparatus and method to track the movement of a target during medical imaging scanning using optical technology. Optical systems record the... Agent: George R. Schultz Schultz & Associates, P.C.

20070108979 - Magnetic resonance imaging system with reduced cooling needs: A Magnetic Resonance Imaging (MRI) system having a vacuum vessel positioned about an imaging volume, one or more high temperature superconducting coils positioned within the vacuum vessel, and a cryocooler coupled to the vacuum vessel to operate the superconducting coil at a temperature above 10 K. At least one gradient... Agent: General Electric Company Global Research

20070108977 - Method and apparatus for improving the quality of kinematic mr images: A method and apparatus for magnetic resonance (MR) imaging of a moving object, and in particular MR imaging by retrospectively selecting and sorting the MR data acquired with the known prior positions of an orthopedic joint. A mechanical apparatus limits the motion of the joint while an optical or electronic... Agent: Siemens Corporation Intellectual Property Department

20070108980 - Spatially reconfigurable magnetic resonance coil: This document discusses, among other things, a system and method for a coil having a plurality of resonant elements and an adjustable frame. A position of at least one resonant element can be adjusted relative to at least one other resonant element. A variable impedance is coupled to adjacent resonant... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.

20070108981 - Method and system for determining an electromagnetic response from an earth formation and method of drilling a borehole: An electromagnetic response from a region in an earth formation is determined by lowering an electromagnetic measurement tool into a borehole in the earth formation. The tool comprises a transmitter antenna, a receiver antenna, and an electrically conductive support structure. The transmitter antenna is energized, resulting in receiver signal in... Agent: Shell Oil Company

20070108982 - Method and device for determining petrophysical parameters: A method for determining one or more parameters of a rock sample, the method involving measuring the magnetic susceptibility of the sample, and determining a value of the parameter using that measured susceptibility. For example, the measured susceptibility can be used to determine the fractional content of one or two... Agent: Young & Basile, P.C.

20070108983 - Commutator for power supply testing: A commutator for power supply testing includes a printed circuit board (PCB), a plurality of connectors soldered on the PCB and coupling a power supply with an electronic load, a plurality of indicator light showing whether the power supply coupled to the commutator is working, and a switch circuit. The... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070108984 - Ionization test for electrical verification: A method and apparatus for the non-contact electrical test of both opens and shorts in electronic substrates. Top surface electrical test features are exposed to an ionization source under ambient conditions and the subsequent charge build up is measured as a drain current by probes contacting corresponding bottom surface features.... Agent: International Business Machines Corporation Dept. 18g

20070108985 - Apparatus and method for diagnosing failure of fuel level sensors: A method of diagnosing failure of fuel level sensors includes a first measuring step of measuring voltages from first and second failure detection terminals; if the voltage is higher than a reference, diagnosing the voltage as “high,” and if the voltage is lower than a reference, diagnosing the voltage as... Agent: Morgan, Lewis & Bockius LLP (sf)

20070108987 - Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses: A coaxial cable is disclosed that includes a signal line, an insulating layer for coating the signal line, a first shield having a tape-like conductor wound around the insulating layer and a second shield composed of a conductor provided around the outer periphery of the first shield. The coaxial cable... Agent: Osha Liang L.L.P.

20070108986 - Systems and methods for performing differential measurements in an electrical system: In accordance with the teachings described herein, systems and methods are provided for performing differential measurements in an electrical system. A first meter may be used that has a first time reference. A second meter may be used that has a second time reference, wherein the second time reference is... Agent: Jones Day

20070108988 - Electronic judging apparatus for working state of the equipment: The invention provides the electronic judging apparatus to detect the working state of the other electric equipment without modifying it inside. The common mode noise around the electric power supplying wires of the other equipment is measured by using the special magnetic core detector attached around the power supplying wire,... Agent: Akira Konno

20070108989 - Method and apparatus for time domain reflection test of transmission line: The present invention relates to a method and an apparatus for TDR (time domain reflection) test of a transmission line. In the method, first, a test signal meeting the test requirement of self-correlation and mutual-correlation is determined and transmitted in the transmission line, in which the test signal may be... Agent: Dallas Office Of Fulbright & Jaworski L.L.P.

20070108990 - Arc monitoring system: An arc monitor system locates an arc based on optimal frames from a frame obtained before an arc discharge to a frame obtained immediately after the arc discharge. The arc monitor system, used to locate an occurred place of an arc discharge that occurred in an electric facility, includes multiple... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070108991 - Diagnostic circuit and method therefor: In one embodiment, a diagnostic circuit is used to test the on-resistance of a transistor.... Agent: Semiconductor Components Industries, LLC Bradley J. Botsch

20070108992 - Voltage measuring apparatus and power measuring apparatus: A voltage measuring apparatus measures the voltage of a measured object and includes a detection electrode capable of being disposed facing the measured object, a variable capacitance circuit that is connected between the detection electrode and a reference potential and whose electrostatic capacitance can be changed, a voltage generating circuits... Agent: Greenblum & Bernstein, P.L.C

20070108993 - Virtual feel capaciflectors: A capacitive proximity sensing device that uses Capaciflector electrodes to simulate human feel. A single contact surface of arbitrary shape functions as a single Capaciflector electrode, which can sense proximal or near contact with another surface at any point on the Capaciflector electrode surface. Sensing closer or further proximity between... Agent: Nasa Goddard Space Flight Center

20070108994 - Touch sensing apparatus: A touch sensing apparatus is provided. The apparatus includes: a flip-flop, a sensor, an AC signal and a detector. The AC signal supplies AC signals to the flip-flop. The flip-flop outputs a first type output signal at the output thereof when the sensor is not touched. The sensor receives electricity... Agent: North America Intellectual Property Corporation

20070108995 - Current transformer test device and method: A current transformer test method implemented using a test device, is useful to verify proper CT installation and operation, and does not rely on the generator (or other system) to be in a state of relatively high assembly. The test device allows a current transformer to be tested by supplying... Agent: Honeywell International Inc.

20070108997 - Fabrication method of semiconductor integrated circuit device and probe card: To provide a technique of firmly bringing a stylus and a test pad into contact with each other in carrying out a probe testing summarizingly for plural chips by using a prober having the stylus formed by a technique of manufacturing a semiconductor integrated circuit device, plane patterns of respective... Agent: Miles & Stockbridge PC

20070109000 - Inspection device and inspection method: A first conductive contact connecting a first electrode of an inspection circuit board and one external electrode of a semiconductor integrated circuit is arranged in a fixed member. A second conductive contact connecting a second electrode of a wiring board and the other external electrode of the semiconductor integrated circuit... Agent: Steptoe & Johnson LLP

20070108996 - Probing apparatus and method for adjusting probing apparatus: The present invention stably maintains contact between probe pins and a wafer. Screws are provided at a plurality of positions in an outer circumferential portion of a printed circuit board. On a lower surface side of the outer circumferential portion of the printed circuit board, a retainer plate is provided,... Agent: Masuvalley & Partners

20070108998 - Semiconductor integrated circuit having multiple semiconductor chips with signal terminals: A semiconductor integrated circuit includes: a package; semiconductor chips in the package including a signal terminal; and a wiring connecting signal terminals. One semiconductor chip is a test object chip including a probe terminal and a test object terminal. The probe terminal connects to an external terminal for testing the... Agent: Posz Law Group, PLC

20070109001 - System for evaluating probing networks: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070108999 - Thin film probe card: A thin film probe card includes a plate and a plurality of wires on the plate, each of which is electrically connected with at least a thin film probe. A plurality of elastic members are provided between the probes, which absorbs the force of the probes in the test to... Agent: Bacon & Thomas, PLLC

20070109002 - System and method for testing a link control card: A system and method for testing a Link Control Card (LCC) of a storage device includes a host, a middle plane (MP), a switch, and a testing device array. The host is connected to the testing device array for sending out command sets and receiving results. The MP is connected... Agent: Morris Manning Martin LLP

20070109003 - Test pads, methods and systems for measuring properties of a wafer: Test pads, methods, and systems for measuring properties of a wafer are provided. One test pad formed on a wafer includes a test structure configured such that one or more electrical properties of the test structure can be measured. The test pad also includes a conductive layer formed between the... Agent: Baker & Mckenzie LLP

20070109004 - Pin-type probes for contacting electronic circuits and methods for making such probes: Pin probes and pin probe arrays are provided that allow electric contact to be made with selected electronic circuit components. Some embodiments include one or more compliant pin elements located within a sheath. Some embodiments include pin probes that include locking or latching elements that may be used to fix... Agent: Microfabrica Inc. Att: Dennis R. Smalley

20070109006 - Digital leakage detector: In one embodiment, an integrated circuit comprises at least one digital leakage detector that comprises digital circuitry configured to detect an approximation of a magnitude of the leakage current in transistors of the integrated circuit and configured to generate a digital output representing the approximated magnitude. In another embodiment, a... Agent: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.

20070109007 - Elastic metal gate mos transistor for surface mobility measurement in semiconductor materials: A semiconductor wafer or sample having a substrate of semiconducting material is tested by compressing a dielectric between three electrically conductive contacts and a top surface of the semiconductor wafer or sample substrate. The dielectric has a thickness that permits tunneling current to flow therethrough without damaging the dielectric. A... Agent: The Webb Law Firm, P.C.

20070109010 - Electronic component testing apparatus and method for electronic component testing: The present invention discloses an electronic testing apparatus and a continuous test method for electronic component, which includes multiple test areas, each area possesses respective pick and place module. The apparatus includes multiple shuttles located between the test area and input/output trays. Moreover, a further pick and place module is... Agent: Birch Stewart Kolasch & Birch

20070109005 - Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failure: Reliability testing circuitry is built into the wafer or IC package in the form of one or more individual testers that use small-area transistors as DUTs. Stress can be applied to the DUTs in parallel and information about breakdown, wearout or failure can be obtained from the individual testers. Only... Agent: Gardner Groff Santos & Greenwald, P.C.

20070109009 - Method and apparatus for die testing on wafer: An integrated circuit includes switching means for selectively connecting the bond pads to functional core logic and isolating the bond pads from second conductors, and the switch means for selectively connecting the bond pads to the second conductors to provide bi-directional connections between the bond pads on opposite sides of... Agent: Texas Instruments Incorporated

20070109008 - Novel test structure for speeding a stress-induced voiding test and method of using the same: A test structure, comprising a first member having a first roughly rectangular shape, wherein the roughly rectangular shape of the first member has a first width dimension, and a first length dimension that is greater than the first width dimension; and a second member having a roughly rectangular shape, wherein... Agent: Thomas, Kayden, Hostemeyer & Risley LLP

20070109011 - Array test using the shorting bar and high frequency clock signal for the inspection of tft-lcd with integrated driver ic: In accordance with the present invention, a first shorting bar drives the data lines of a TFT array having integrated gate driver circuitry. Another set of shorting bars drive the corresponding terminals of the gate driver circuitry. The pixel voltages are measured after all the pixels are charged by the... Agent: Townsend And Townsend And Crew, LLP

20070103140 - Time arbitrary signal power statistics measurement device and method: A measurement instrument is provided with an FFT module providing a frequency domain output; and a power calculator connected to the frequency domain output to measure power statistics for a test signal of arbitrary length. In some embodiments, a spectrum integration module is provided to calculate the power contained within... Agent: Matthew D. Rabdau Tektronix, Inc.

20070103141 - Duty cycle measurment circuit for measuring and maintaining balanced clock duty cycle: A circuit and method for measuring duty cycle uncertainty in an on-chip global clock. A global clock is provided to a delay line at a local clock buffer. Delay line taps (inverter outputs) are inputs to a register that is clocked by the local clock buffer. The register captures clock... Agent: Law Office Of Charles W. Peterson, Jr. Yorktown

20070103142 - Assembled capacitor polarity automatic inspecting method and system: An assembled capacitor polarity automatic inspecting method and system is proposed, which is designed for use to perform an automatic inspecting procedure to check whether an array of polarized capacitor are mounted correctly in polarity on a circuit board; and which is characterized by the use of computerized technology to... Agent: Edwards & Angell, LLP

20070103143 - Battery protection method and battery protection circuit: A battery protection method is disclosed for protecting a battery from an over-discharge state by switching off a switching element provided between the battery and a load in accordance with the voltage of the battery. The method includes the steps of detecting application of a charging voltage and arranging a... Agent: Richard P. Berg, Esq. C/o Ladas & Parry

20070103144 - Calibration pattern and calibration jig: In a high frequency circuit property measurement method, prior to property measurements of a high frequency circuit with RF measurement probe heads, RF measurement probe head are calibrated using a calibration pattern comprising a signal line having a characteristic impedance and extending on a dielectric substrate, a first GND pad... Agent: Leydig Voit & Mayer, Ltd

20070103145 - Electronic circuit configuration for optionally connecting rotary speed sensors, especially in commercial vehicles: An electronic circuit configuration for optionally connecting an active rotary speed sensor or a passive rotary speed sensor to an electronic control unit of a commercial vehicle.... Agent: Kenyon & Kenyon LLP

20070103146 - Absolute angular position sensor on 360 of a rotating element: It relates to a sensor that comprises a rotating part (14) which creates a variable magnetic flux, a fixed part (16) for supporting two probes (22, 26) each having an output current, the first (22) of the probes having an output current having discontinuities when the magnetic flux passes through... Agent: Young & Thompson

20070103148 - Accelerated pedal with half-effect movement sensor: A pedal is described for the control of vehicles, including a movable lever rotatably coupled to a fixed base, and a device for detecting the movement of said movable lever with respect to said fixed base. Said device comprises a magnet capable of interacting with a Hall-effect sensor, and a... Agent: R. Ruschena Patent Agent, LLC

20070103149 - Rotation angle detection device: A rotation angle detection device for detecting a rotation angle of an object has a substantially cylinder-shaped yoke, a magnetism generation unit which is fixed to an inner surface of the yoke, a magnetism detection member which is arranged substantially in a center axis of the yoke, at least one... Agent: Nixon & Vanderhye, PC

20070103147 - Rotational angle detector: A rotational angle detector for detecting the rotational angle of the rotor in a wide range without requiring dark current. A first detection gear including an m number of teeth and a second detection gear including an L number of teeth are each engaged with a main gear rotated integrally... Agent: Crompton, Seager & Tufte, LLC

20070103150 - Eddy current sensor: An eddy current sensor (10) has a sensor coil (100) disposed near a conductive film (6) formed on a semiconductor wafer (W) and a signal source (124) configured to supply an AC signal to the sensor coil (100) to produce an eddy current in the conductive film (6). The eddy... Agent: Wenderoth, Lind & Ponack, L.L.P.

20070103151 - Inspection method and device for semiconductor equipment: To improve spatial resolution of scanning microscopes including: a detector 130 that irradiates laser light modulated in its intensity with a modulation signal synchronized with a reference signal on an IC chip 110, receives magnetic field signals from a fluxmeter 120 and extracts signals with the same frequency components as... Agent: Young & Thompson

20070103152 - Digital fluxgate magnetometer: A circuit for a fluxgate magnetometer includes a plurality of digital function blocks that are programmed as functions within a microcontroller. The microcontroller includes and implements the functions of an analog circuit to lower the cost and complexity of a digital fluxgate magnetometer circuit.... Agent: Siemens Corporation Intellectual Property Department

20070103153 - Volume coil for a magnetic resonance tomography apparatus: A volume coil for a magnetic resonance (MR) tomography apparatus has a number of array coils or coil parts arranged on at least one coil carrier. The coil carrier annularly encloses or the coil carriers annularly encloses or enclose a cross-sectional area that can be varied by modifying the position... Agent: Schiff Hardin, LLP Patent Department

20070103155 - Method and apparatus for magnetic resonance imaging using directional selective k-space acquisition: A method of selecting a portion of k-space data for acquisition in a magnetic resonance imaging (MRI) scan of a body, the body having a target therein. The method includes defining the target in real space, translating the defined target into a k-space representation thereof and selecting the region corresponding... Agent: Thompson Coburn, LLP

20070103154 - Method for localized excitation for accurate center frequency measurements with mri: Disclosed herein is a method for defining a localized excitation volume within a localizer image, comprising: choosing a region of interest within the localizer image, prescribing at least one imaging slab, and defining a localized excitation volume contained within the region of interest and encompasses a portion of the at... Agent: Cantor Colburn, LLP

20070103156 - Mr imaging with sensitivity encoding in the readout direction: A magnetic resonance imaging system acquires a final image of a selected field of view with a selected spatial resolution. A magnetic resonance imaging scanner (10) encodes and receives magnetic resonance samples in phase encode and readout directions using a plurality of receive coils (14). The encoding and receiving undersamples... Agent: Philips Intellectual Property & Standards

20070103157 - Method and control device for determination of the position of a local coil in a magnetic resonance apparatus: In a method for determination of a position of a local coil on a bed in at least one spatial direction within a magnetic resonance scanner, a signal intensity value is initially, extracted from magnetic resonance measurements implemented with the appertaining local coil for acquisition of magnetic resonance images of... Agent: Schiff Hardin, LLP Patent Department

20070103158 - Flux plane locating in an underground drilling system: A portable locator and method for establishing the location of the cable line in a region which includes at least one generally straight electrically conductive cable line extending across the region from which cable line a locating signal includes a first arrangement for measuring a local flux intensity of the... Agent: Pritzkau Patent Group, LLC

20070103159 - Method for compensating dielectric attenuation in downhole galvanic measurements: A logging tool used in a borehole having non-conductive mud. The tool includes a known inductance in series with an electrode. The quality factor of a circuit that includes the electrode, the inductance and the earth formation is indicative of the resistivity of the formation. The quality factor may be... Agent: Madan, Mossman & Sriram, P.C.

20070103160 - Cross-component alignment measurement and calibration: A multicomponent induction logging tool is positioned within an alignment loop and the transmitter is activated at a number of rotation angles of the tool. Misalignment between the transmitter and receiver coils can be determined from the induced signals in the receiver coil.... Agent: Madan, Mossman & Sriram, P.C.

20070103161 - Standoff compensation for imaging in oil-based muds: Oil-based mud imaging systems and methods having standoff compensation. In some embodiments, disclosed logging systems include a logging tool in communication with surface computing facilities. The logging tool is provided with a sensor array having at least two voltage electrodes positioned between two current electrodes energized by an excitation source... Agent: Conley Rose, P.C.

20070103162 - Oil based mud imaging tool with common mode voltage compensation: An apparatus and method for minimizing the effects of a common mode voltage signal in downhole logging tools utilized to determine the resistivity of an adjacent portion of a borehole wall. Two current electrodes are energized by an excitation source to create an oscillatory electric field in a borehole wall.... Agent: Conley Rose, P.C.

20070103163 - Inverter system: An inverter system which converts DC input into AC output and supplies the AC output to a load such as an FL tube detects change in a circuit current due to anomaly such as discharge without contacting with a current route. Relating to an inverter which converts DC input into... Agent: Staas & Halsey LLP

20070103164 - Voltage verification unit: A voltage verification unit and method for determining the absence of potentially dangerous potentials within a power supply enclosure without Mode 2 work is disclosed. With this device and method, a qualified worker, following a relatively simple protocol that involves a function test (hot, cold, hot) of the voltage verification... Agent: Auzville Jackson, Jr.

20070103165 - Ground testing method and apparatus: The present invention is directed to a ground-current isolating circuit for providing a low voltage barrier between a service neutral conductor and an associated grounding system. The voltage barrier circuit comprises a first current unidirectional element and a second current unidirectional element connected in antiparallel. The unidirectional elements are preferably... Agent: Mcnees, Wallace & Nurick LLC

20070103166 - Electronic circuit: An electronic circuit for terminating a plurality of conductors at a node of a network, comprising means to detect current flowing through one of the conductors and means to switch between a continuing circuit, whereby continuity of the network is maintained, on detecting current above a first predetermined threshold, and... Agent: Synnestvedt & Lechner, LLP

20070103167 - Device and method for isolating a short-circuited integrated circuit (ic) from other ics on a semiconductor wafer: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short... Agent: Trask Britt, P.C./ Micron Technology

20070103168 - Loop impedance meter: A loop impedance meter is provided for testing an A.C. electrical mains supply. The meter comprises an electronic control circuit for connecting a load resistance intermittently between the A.C. mains supply terminal and the earth terminal to measure the potential difference between those terminals and to provide an indication of... Agent: Stetina Brunda Garred & Brucker

20070103169 - Process and apparatus for evaluating the degree of vacuum in closed bodies with transparent walls: The invention is based on feeding the closed bodies to be evaluated to a station for the application of high voltage for the formation of the arc across the inner space of the body and capturing the arc formed by means of a CCD camera which will compare, adjustably, the... Agent: Darby & Darby P.C.

20070103170 - System and method for detecting the dielectric constant of conductive material: An improved system and method for providing a dielectric monitor which allows the measurement of the dielectric constant of a conductive material. The capability to accurately and efficiently measure the dielectric constant in soil allows the moisture content of the soil to be accurately determined. The preferred embodiment teaches a... Agent: Robert A. Huntsman

20070103171 - Capacitance sensor type measuring apparatus: Measuring apparatuses each of which measures the distance between a probe and a target are disclosed. One of the disclosed measuring apparatuses includes a ground member which opposes the target in a non-contact manner and substantially grounds the target, and an output unit which is connected to the probe and... Agent: Fitzpatrick Cella Harper & Scinto

20070103172 - Sensor and apparatus for measuring the flow electric potential: The present invention provides a sensor and apparatus for measuring flow electric potential for evaluation of a degree of electrodeposition of paint applied to the body or chassis of a vehicle. The sensor includes a base plate part, a dielectric polymer member, a positive (+) electrode terminal and a negative... Agent: Edwards & Angell, LLP

20070103173 - Systems and methods for controlling of electro-migration: Systems and methods for controlling electro-migration, and reducing the deleterious effects thereof, are disclosed. Embodiments provide for reversal of an applied voltage to an integrated circuit when a measurement indicative of an extent of electro-migration indicates that a healing cycle of operation is warranted. During the healing cycle, circuits of... Agent: Ibm Coporation (rtp) C/o Schubert Osterrieder & Nickelson PLLC

20070103174 - Direct current test apparatus: There is provided a DC test apparatus for performing a test by applying a DC voltage and a DC current to an electronic device. The DC test apparatus includes a power supply generating section that generates the DC voltage and the DC current, a current detecting resistance provided in series... Agent: Osha Liang L.L.P.

20070103178 - Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device: In a prove card comprising: a probe sheet having a contact terminal contacting with an electrode provided on a wafer, a wiring led from the contact terminal, and an electrode electrically connected to the wiring; and a multilayered wiring substrate having an electrode electrically connected to the electrode of the... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070103177 - Probes of probe card and the method of making the same: The present invention provides probes of a probe card and the method of making the same, which is easier to control the size and hardness of each probe and provides the probes with well strength, hardness and electric property. The probe has a main member with a suspended arm, at... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20070103176 - Semi-automatic multiplexing system for automated semiconductor wafer testing: A semi-automatic multiplexing system for automated semiconductor wafer testing employs a jumper block for each device type in the semiconductor wafer to be tested, each jumper block having inputs for receiving a test input/output line, a plurality of block contacts corresponding to pads of a device to be tested, and... Agent: Beyer Weaver LLP

20070103175 - Static instrumentation macros for fast declaration free dynamic probes: Embodiments of the present invention provide a dynamic instrumentation system that uses statically defined probes. The probes may be defined using macro definitions. One or more libraries of macro definitions that are linked to static probes are provided in the computer system. Each probe is uniquely identified by a name... Agent: Mh2 Technology Law Group

20070103179 - Socket base adaptable to a load board for testing ic: A socket base adaptable to a load board for testing semiconductor devices is disclosed. The socket base includes a first fixing element having coupling plates, a probe element, and a second fixing element, which are detachable and combinable. Accordingly, the procedure for replacing the probe element is simplified, time is... Agent: Squire, Sanders & Dempsey L.l.p

20070103180 - Universal wafer carrier for wafer level die burn-in: A reusable burn-in/test fixture for testing unsingulated dice on a semiconductor wafer consisting of two halves. The first half of the test fixture is a wafer cavity plate for receiving the wafer, and the second half establishes electrical communication between the wafer and electrical testing equipment. A rigid substrate has... Agent: Trask Britt, P.C./ Micron Technology

20070103181 - System and method of mitigating effects of component deflection in a probe card analyzer: A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed electrical planarity measurements with fast optical planarity measurements to produce “effectively loaded” planarity measurements.... Agent: Pillsbury Winthrop Shaw Pittman LLP

20070103182 - Circuit board, electronic device including a circuit board, and method of manufacturing a circuit board: A circuit board includes a board, a first conductive pad provided on the board, a second conductive pad provided with a first distance from the first conductive pad. A mask extends over the board and has an opening that extends over at least a part of the first conductive pad,... Agent: Hogan & Hartson L.L.P.

20070103183 - Isolation buffers with controlled equal time delays: A system is provided for controlling the delay in an isolation buffer. Multiple such isolation buffers are used to connect a single signal channel to multiple lines and controlled to provide an equal delay. Isolation buffer delay is controlled to be uniform by varying either power supply voltage or current.... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070103184 - Tddb test pattern and method for testing tddb of mos capacitor dielectric: A Time Dependent Dielectric Breakdown (TDDB) test pattern circuit, which can reduce testing time and statistically improve a precision of measurement as well as a method for testing the test pattern circuit are discussed. Typically, a test pattern circuit includes in plurality of unit test patterns. Each unit test pattern... Agent: Birch Stewart Kolasch & Birch

20070096714 - Electricians phase tester: My invention described is an electronic phase tester used to identify unmarked large feeder conductors to color code for phase orientation. This new process eliminates the manual labor required to ohm meter test each conductor to opposite conductor one at a time, a continuity test. To save labor and time... Agent: Philip Joseph Catalano

20070096715 - Communicating with an implanted wireless sensor: The present invention determines the resonant frequency of a sensor by adjusting the phase and frequency of an energizing signal until the frequency of the energizing signal matches the resonant frequency of the sensor. The system energizes the sensor with a low duty cycle, gated burst of RF energy having... Agent: John S. Pratt, Esq Kilpatrick Stockton, LLP

20070096716 - Current sensor: A current sensor includes a conductor line, and a magnetic sensor in which resistance value changes according to a current magnetic field produced by a current to be detected flowing through the conductor line. The conductor line includes: a pair of parallel portions each having a same and uniform cross-sectional... Agent: Oliff & Berridge, PLC

20070096717 - Current sensor and method of manufacturing the same: A current sensor includes a semiconductor substrate, a ring shaped magnetic core having a center opening and a gap and provided to a surface of the substrate, and a Hall element provided to the surface and placed in the gap of the magnetic core such that a control current for... Agent: Posz Law Group, PLC

20070096718 - Voltage sensing device and associated method: A transformer circuit is disclosed that minimizes the temperature dependence of an output voltage. A first embodiment of the present invention includes a primary winding coupled to received a voltage to be sensed and a center-tapped secondary winding coupled at a center point to first voltage output terminal. The center-tapped... Agent: Kelley Drye & Warren LLP

20070096719 - Voltage detecting circuit: A power supply voltage detecting circuit includes a voltage regulating circuit, a comparative circuit, a timer circuit, and a display circuit. The voltage regulating circuit provides a stable reference voltage to the comparative circuit. The comparative circuit compares the reference voltage with the voltage from the power supply. The comparative... Agent: Morris Manning Martin LLP

20070096721 - Apparatus for verifying a mobile communication system and method thereof: An apparatus for verifying a mobile communication system and a method thereof are provided. The mobile communication system includes boards that provide functions for constituting the mobile communication system, and a testing and verifying apparatus for transmitting a test mode change request signal to a board to be verified among... Agent: Dilworth & Barrese, LLP

20070096720 - Impedance calibration for source series terminated serial link transmitter: Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST) serial link transmitter, in which two branches of parallel transistors each provide an impedance value when particular transistors of the parallel branch are... Agent: Dillon & Yudell LLP

20070096722 - Device for the detection of movements and/or positions of an object: The invention relates to a device for detecting movements and/or positions of an object with the aid of voltage pulses induced by the field of adjacent magnets (6, 7) in a coil (4). In order to generate a sufficiently strong signal also at small relative speeds between the magnets (6,... Agent: Mark P Stone

20070096723 - Method and system for linear positioning: Systems and methods for determining linear position are disclosed. An example system includes a magnet with first and second magnetic poles. The first and second magnetic poles define an axis of the magnet. The system also includes a magnetoresistive sensor comprising a magnetoresistive sensor structure. The magnetoresistive sensor structure defines... Agent: Honeywell International Inc.

20070096724 - Robust detection of strain with temperature correction: An apparatus (10) is set forth for measuring a return signal of a magnetostrictive sensor (20) that detects a force, torque, or pressure. The return signal includes noise, a DC resistance (44), an AC resistance and an inductance and the inductance is shifted ninety degrees from the AC resistance. The... Agent: Delphi Technologies, Inc.

20070096725 - Measurement method and measurement apparatus for measuring recording magnetic field strength distribution of magnetic head, and manufacturing method for manufacturing the magnetic head: A method for measuring a recording magnetic field strength distribution of a magnetic head is disclosed. The method includes: a first step of setting the magnetic head to a predetermined skew angle, and magnetically forming a track on a measurement magnetic recording medium using the magnetic head in a state... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070096726 - Method for the contactless determination of a thickness: With a method for the contactless determination of a thickness of a layer (20) made of electrically-conductive material of a component (17), a sensor composed of a coil form (13) and a coil (14) is positioned in the vicinity of the component (17) to be measured. The method is based... Agent: Striker Striker & Stenby

20070096727 - Flexible hand held mr scanning array for cracks/flaws: A non-destructive testing device has an excitation coil with a plurality of conductor ribbons attached to a flexible membrane. A frame supports the membrane and incorporates wheels for translation across a surface to be inspected and resilient suspension for maintaining the membrane with the excitation coil and wheels in intimate... Agent: The Boeing Company C/o Felix L. Fischer, Attorney At Law

20070096728 - Eddy current inspection apparatus and methods: Methods and apparatus for performing an inspection using an eddy current coil are described. In one embodiment, the method is for inspecting an embossment of a wheel for a gas turbine using an inspection assembly. The inspection assembly includes a fixture and an eddy current coil. The fixture includes a... Agent: John S. Beulick (17851)

20070096729 - Combined magnetic field gradient and magnetic field strength sensor: A magnetic field sensor device (2) is described that comprises an oscillatory member (8) and current control means (6). The current control means (6) is arranged to pass an alternating current (AC) along at least first (10) and second (12) current paths provided through the oscillatory member (8) and is... Agent: Nixon & Vanderhye, PC

20070096730 - Squid arrangement: The invention relates to a SQUID arrangement for measuring a change in a magnetic field, the change in the magnetic field being caused by a specimen that is arranged in a magnetization field and the SQUID arrangement including a direct current SQUID. In order to provide a simple design in... Agent: Jordan And Hamburg LLP

20070096731 - Open-shape noise-resilient multi-frequency sensors: A series of open-shape nuclear quadrupole resonance (NQR) sensors having environmental noise resilience and a capability for simultaneous independent multi-frequency operation is disclosed. The sensors are multimodal birdcage or TEM-type structures made from single-turn or multi-turn interconnected windows or magnetically coupled elements having uniform distributions of the amplitudes of the... Agent: Bond, Schoeneck & King, PLLC

20070096732 - Parallel magnetic resonance imaging method using a radial acquisition trajectory: A fast and efficient method for reconstructing an image from undersampled, parallel MRI data sets acquired with non-Cartesian trajectories includes the calculation of unsampled k-space data from the acquired k-space data and sets of calculated reconstruction coefficients. To reduce the computation time, only a few reference reconstruction coefficients are calculated... Agent: Quarles & Brady LLP

20070096733 - Parallel magnetic resonance imaging method using a radial acquisition trajectory: A method for reconstructing an image from undersampled, parallel MRI data sets acquired with a pulse sequence that samples k-space along radial trajectories includes the synthesis of training k-space data from the acquired data. The training k-space data is produced by reconstructing training images from the fully sampled, central k-space... Agent: Quarles & Brady LLP

20070096734 - Anticipative temperature regulation of cryogenic nmr probes: In some embodiments, a nuclear magnetic resonance (NMR) method comprises generating an indicator of an anticipated time-averaged power for a radio-frequency (RF) pulse set, and anticipatively adjusting a cooling supplied by a cryogenic cooling fluid to an RF coil according to the indicator of the anticipated time-averaged power. The cryogenic... Agent: Varian Inc. Legal Department

20070096739 - Magnetic resonance imaging apparatus: A magnetic resonance imaging apparatus includes a top plate on which an patient to be imaged is disposed, a plurality of positioning units that determines setting positions of RF coils detachable from the top plate in a plurality of different positions, and a detecting unit that detects the setting positions... Agent: Nixon & Vanderhye, PC

20070096736 - Mri rf surface coil with reduced sensitivity in proximity of conductors: The invention relates to a radio-frequent (RF) coil system (17, 17′) for use in a magnetic resonance imaging (MRI) system. The RF coil system comprises at least one main coil (35) for transmitting an RF magnetic field (B1) into and/or receiving an RF magnetic field (B1′) from an examination volume... Agent: Philips Intellectual Property & Standards

20070096738 - Rf coil assembly: The present invention aims to provide an RF coil assembly capable of eliminating the need for connecting and disconnecting an electric path at decoupling portions and is an RF coil assembly including: a plurality of coil loops that are adjacent to each other in sequence and construct a phased array;... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070096737 - Self-fastening cage surrouding a magnetic resonance device and methods thereof: The present invention discloses a novel self-fastening cage of a magnetic resonance device (MRD) (100) for providing a homogeneous, stable and uniform magnetic field therein, characterized by an outside shell comprising at least three flexi-jointed superimposed walls (1). In a technology of self-fastening cage, the invention teaches an effective multi-streamed... Agent: Gottlieb Rackman & Reisman PC

20070096735 - Specific energy absorption rate model: An MRI apparatus is provided. The apparatus includes a main magnet for generating a main magnetic field in an examination region, a plurality of gradient coils for generating gradient fields within the main field, an RF transmit coil for transmitting RF signals into the examination region and exciting magnetic resonance... Agent: Philips Intellectual Property & Standards

20070096740 - Low temperature probe for nmr and nmr device: The invention provides a low temperature probe having a high sensitivity by reducing a heat intrusion into a receive coil. A heat making an intrusion into a coil is suppressed by inserting a heat radiation shield in which a temperature is controlled at about 100 K to a portion between... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070096741 - Nmr probe for nmr apparatus: A NMR probe which causes only a minimum disturbance to magnetic-field uniformity, and which acquires a high resonant Q value. A detection coil 1 for detecting a nuclear magnetic resonance signal emitted from a sample 3 measured, and a compensation coil 4 composed of a superconducting material for compensating for... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070096742 - Benchtop test system for testing spark plug durability: A method and system for evaluating the durability of spark plugs. A test system simulates the pressure, temperature, and exhaust flow of an internal combustion engine, and has a test chamber in which these simulated conditions exist. A number of spark plugs are installed in the test chamber and are... Agent: Baker Botts L.L.P. Patent Department

20070096743 - Method and apparatus for judging deterioration of battery: A method and apparatus for judging deterioration of a battery are provided, thereby a correct judgement for the deterioration of the battery can be timely carried out so as to replace the battery with another if it is necessary. The apparatus for judging deterioration of a battery that supplies electric... Agent: Armstrong, Kratz, Quintos, Hanson & Brooks, LLP

20070096744 - Immobilisation device: The invention provides a device for use in partially or fully immobilising animals such as cattle, sheep and the like. The device includes a probe for insertion in the anal canal of the animal the probe comprising a pair of spaced electrodes connected by way of electrical conductors to a... Agent: Banner & Witcoff, Ltd.

20070096745 - Filling level and/or limit level measuring device with flexible connecting piece: e

20070096746 - Monitoring device for an array of electrical units: an evaluation unit (3) connected in parallel with the array (4) of electrical units, said evaluation unit (3) being adapted to determine a total voltage (UT) of the array (4) of electrical units and to output a control signal (CS) indicative of a function status of the array (4) of... Agent: Sughrue Mion, PLLC

20070096747 - Non-linear observers in electric power networks: In order to make accurate predictions on whether or not a power grid is stable, it is desirable to know the frequency and phase of at least each “control area” in the power grid. Each control area will ideally have power generation matched with its load. Rather than measure thousands... Agent: Lumen Intellectual Property Services, Inc.

20070096748 - Current sensing circuit: A current sensing circuit for sensing the current through a main switch, such as the PMOS or NMOS switches of a switching regulator, is disclosed. The circuit comprises a mirror switch, said mirror switch being substantially similar to said main switch but with a smaller aspect ratio, a difference amplifier... Agent: Pearl Cohen Zedek Latzer, LLP

20070096749 - Electrical connecting apparatus and contact: An electrical connecting apparatus comprises: a base plate provided with a first and a second mounting portion groups respectively having a plurality of first and second mounting portions arranged so as to be alternately positioned in a first direction; and a first and a second contact groups respectively having a... Agent: Black Lowe & Graham PLLC Jeffrey J. King, Esq.

20070096750 - Longitudinal balance measuring bridge circuit: A longitudinal balance measuring bridge circuit includes a common mode signal injection circuit in the form of a center tapped, 4:1 balanced matching transformer. The signal injection circuit is coupleable to an item under test (IUT) and to a source of common mode signal, and provides the common mode signal... Agent: Bodner & O'rourke, LLP

20070096751 - Systems and methods for inspecting electrical conductivity in composite materials: Systems and methods for inspecting electrical conductivity in composite materials having conductive structures are disclosed. In one embodiment, a system of inspecting electrical conductivity in an electrical bonding region includes a coil coupled to an alternating current source that is configured to induce a current in a conductive structure within... Agent: Lee & Hayes, PLLC

20070096752 - System and method for measuring electric current in a pipeline: A system for measuring a voltage differential in a current-carrying pipe using a propulsion vehicle for conveying the system inside the pipe, the system comprising a first contact for maintaining electrical contact with the pipe as the vehicle moves through the pipe, a second contact positioned in a spaced apart... Agent: Shell Oil Company

20070096753 - Electronically resettable current protection for die testing: Electronically resettable test apparatus. The test apparatus includes an electronically operable current breaker connected to a test jig for testing semiconductor die. The electronically operable current breaker is connected through an interface that converts signals to signals appropriate for use on a computer bus to a computer system. The test... Agent: Workman Nydegger (f/k/a Workman Nydegger & Seeley)

20070096754 - Method and system for analyzing single event upset in semiconductor devices: A simulation model is used to predict a semiconductor device's response to a single event upset. The simulation model is connected to a model of the semiconductor device to be tested. The simulation model switches in an impedance path between a node to be tested in the semiconductor device model... Agent: Honeywell International Inc.

20070096756 - Automatic testing equipment instrument card and probe cabling system and apparatus: A device for interfacing a test head and a prober is disclosed using wires or cables to provide the connection from a probe card interface boards to the probe card. The use of wires or cables, in place of the traditional pogo pin arrangement allows for more reliable and efficient... Agent: Foley & Lardner LLP

20070096755 - Method and apparatus for automatic test equipment: The traditional device interface board is replaced by a number of smaller strips containing one or more electrical components for interfacing the device under test and the test head. The device interface modules may mount to a stiffening member having a back bone and multiple ribs running through the stiffening... Agent: Foley & Lardner LLP

20070096757 - Resource matrix, system, and method for operating same: In one embodiment, a resource matrix is provided with a first set of pins, a second set of pins, and at least one programmable switching circuit. The first set of pins electrically couples the resource matrix with a tester resource. The second set of pins electrically couples the resource matrix... Agent: Agilent Technologies Inc.

20070096759 - Analog built-in self-test module: An analog BIST (Built-in Self-Test) module for a load board in a test system for testing Integrated Chips (IC) and other devices-under-test (DUTs). Components of the test module perform test setup, transmission of analog test signals to a DUT, capture of analog and digital test data from the DUT, and... Agent: Texas Instruments Incorporated

20070096758 - Method and apparatus for eliminating automated testing equipment index time: The present invention eliminates the indexing time of an SOC tester, or at least reduces it to the time delay for an electronic switch to toggle or a mechanical shift to occur between two banks of DUTs to be tested on a DUT load board mounted on a test head.... Agent: Agilent Technologies Inc.

20070096765 - Bluetooth-enable intelligent electronic device: An intelligent electronic device (IED), e.g., an electrical power meter, having wireless communication capabilities, e.g., Bluetooth connectivity, for transmitting and receiving data without a hardwire connection is provided. A system and method for retrieving revenue metering data from at least one IED, e.g., a revenue meter, are also provided. The... Agent: Casella & Hespos

20070096764 - Immersion exposure apparatus and method of manufacturing semiconductor device: An immersion exposure apparatus includes a substrate holding unit which holds a substrate to be exposed, a projection lens provided above the substrate holding unit to supply exposure light to the substrate held on the substrate holding unit, a liquid supply unit which supplies a liquid to an area between... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070096762 - Measuring apparatus, measuring method, and test apparatus: There is provided a measuring apparatus that generates a first strobe signal and a second strobe signal in synchronization with an output signal, sequentially changes phases of the strobe signals whenever the electronic device outputs the output signal multiple times, acquires a signal level of the output signal at each... Agent: Osha Liang L.L.P.

20070096760 - Method and apparatus for testing a semiconductor structure having top-side and bottom-side connections: A method for testing a semiconductor structure having a set of top-side connections and having a set of bottom-side connections is provided. The method may include providing a device socket for connecting the set of top-side connections and the set of bottom-side connections to a tester. The method may further... Agent: Freescale Semiconductor, Inc. Law Department

20070096763 - Methods and apparatus for utilizing an optical reference: A laser processing system implements a method for aligning a probe element (e.g., a probe pin) with a device interface element (e.g., a contact pad of a circuit substrate). First, the laser processing system generates an optical reference beam at one or more predetermined positions to calibrate a reference field.... Agent: David E. Huang, Esq. Bainwood Huang & Associates LLC

20070096761 - Semiconductor apparatus testing arrangement and semiconductor apparatus testing method: A semiconductor apparatus testing arrangement for testing a plurality of semiconductor devices produced on a semiconductor substrate, has a substrate on which a plurality of testing units are arranged, each unit comprising a probe needles corresponding to electrode terminals of the semiconductor device and electric conductor parts connected with the... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070096766 - Chopper type comparator: In some examples, a chopper type comparator for comparing an analog voltage to be measured and a reference voltage by sampling and outputting an “H” level signal or an “L” level signal depending on the comparison result includes a capacitor configured to store a potential difference between the analog voltage... Agent: Watchstone P + D

20070096767 - Method of preventing display panel from burn-in defect: A method of preventing display panel from burn-in defect is provided, suitable for regulating an image on the display area, and the display panel includes a plurality of pixels. The method includes the following steps. First, a first shifting signal is outputted to make the image on the display area... Agent: Jianq Chyun Intellectual Property Office

20070096768 - Method of repairing gate line on tft array substrate: An exemplary method of repairing gate lines (201) of TFT array substrate, wherein the TFT array substrate includes a plurality of gate lines (201, 202), a plurality of data lines (211, 212, 213) crossing with the gate lines, a plurality of pixel electrode (221, 231), and a plurality of thin... Agent: Wei Te Chung Foxconn International, Inc.

20070096769 - Electronic meter supporting added functionality: An electronic meter for measuring electricity consumption is provided that includes extra functionality without significantly increasing cost or complexity of the meter. The meter includes a capacitor for storing energy during normal operation of the meter. The output voltage of the capacitor is used as the input to an auxiliary... Agent: Woodcock Washburn LLP