Electricity: measuring and testing inventions 04/07

20070090824 - Multi-channel radiometer imaging system: A radiometer system includes a housing and an RF board contained within the housing. Balanced radiometer channels receive an unknown signal and known reference. Each balanced radiometer channel includes at least one quadrature hybrid and amplifier circuit to provide distributed gain and an amplified output signal. A detection circuit receives... Agent: Richard K. Warther Allen, Dyer,doppelt,milbrath & Gilchrist P.A.

20070090825 - Current sensor: The present invention provides a current sensor of smaller and simpler configuration, capable of measuring a current to be detected with high precision and stability. A current sensor has a V-shaped conductor line and a pair of magnetoresistive elements disposed along with the conductor line so that a resistance value... Agent: Oliff & Berridge, PLC

20070090826 - Current sensor: A current sensor includes a first magnetic core that surrounds a portion of a conductor as a current path and has gaps therein, each of which is defined by adjacent ends spaced from each other by a first distance, a magnetic sensing element placed in at least one of the... Agent: Posz Law Group, PLC

20070090827 - Non-contacting position sensor using a rotating magnetic vector: A sensor for sensing the position of an object includes a magnet and a magnetic flux sensor. The magnet has dimensions that include a length, a width and a height. The magnet is adapted to generate a flux field. The flux field has a magnitude of flux and a flux... Agent: Cts Corporation

20070090828 - Method and a sensor device for measuring the distance between a stator and an opposing rotor: A sensor device for measuring distance between a stator and a rotor in a machine is of the magnetic type and is intended to be mounted in the stator in order to interact with an opposing surface on the rotor. A sensor body (10) can be moved axially in a... Agent: Young & Thompson

20070090832 - Liquid level detecting device and method of manufacturing same: A liquid level detecting device for detecting liquid level contained in a tank includes a float and an arm that moves in a prescribed manner when liquid level changes, a permanent magnet for forming a magnetic field, a hall IC for generating an electric signal in response to the motion... Agent: Nixon & Vanderhye, PC

20070090829 - Rotation angle detecting apparatus: A rotation angle detecting apparatus includes: a first permanent magnet; a second permanent magnet disposed so as to face the first permanent magnet, the second permanent magnet rotating together with a shaft; an arc-shaped first magnetic member and second magnetic member fixed to the first permanent magnet and the second... Agent: Sughrue Mion, PLLC

20070090831 - Rotation angle detecting device having function of detecting abnormality: A rotation angle detecting device includes magnetic field forming members such as a permanent magnet and a yoke, a plurality of magnetic sensors disposed in the magnetic field to rotate relative to the magnetic field forming members to provide output signals that are 90 degrees in phase different from each... Agent: Nixon & Vanderhye, PC

20070090830 - Rotational angle detector: A rotational angle detector has a rotary body, a first detecting unit rotating in cooperation with the rotary body, a second detecting unit rotating in cooperation with the first detecting unit, and an auxiliary detecting unit rotating in cooperation with the rotary body and the second detecting unit. The rotational... Agent: Ratnerprestia

20070090833 - Method for the contactless determination of a layer thickness via resistance and inductance measurement of a sensor oil: With a method for the contactless determination of a thickness of a layer (20) made of electrically-conductive material of a component (17), a sensor composed of a coil form (13) and a coil (14) is positioned in the vicinity of the component (17) to be measured. The method is based... Agent: Striker Striker & Stenby

20070090834 - Wire rope flaw detector for elevator: A flaw detection apparatus for a wire rope of an elevator according to the present invention, which is intended for a wire rope having a nominal diameter of 4 mm to 8 mm, includes a plurality of unit probes 9. Each of the unit probes 9 has a first and... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070090835 - Nanostructured magnetoresistive network and corresponding method for detection of magnetic field: Described herein is a magnetoresistive network responsive to a magnetic field of the type comprising a plurality of magnetoresistive elements. According to the invention, the one or more magnetoresistive elements comprise at least one magnetoresistive element in the form of nanoconstriction, said nanoconstriction comprising at least two pads made of... Agent: Nixon & Vanderhye, PC

20070090836 - Detection with evanescent wave probe: Methods and systems for spatially resolved spin resonance detection in a sample of material are disclosed. Also disclosed are methods and systems for spatially resolved impedance measurements in a sample of material. The disclosed methods and samples can be used in screening of plurality of biological, chemical and material samples.... Agent: Buchanan, Ingersoll & Rooney PC

20070090838 - Apparatus and method for nmr tomography acquisition with local magnetic field gradients in connection with local receiver coils: A magnetic resonance tomography apparatus, comprising a gradient system that can generate at least one spatially varying and optionally time-varying magnetic field for at least one-dimensional local encoding of measuring signals in an area of a test sample to be imaged, is characterized in that the gradient system contains at... Agent: Walter A. Hackler

20070090837 - System, method, software arrangement and computer-accessible medium for providing real-time motion correction by utilizing clover leaf navigators: A system, method, software arrangement and computer-accessible medium for correcting for a motion of an object are provided. In this system, method, software arrangement and computer-accessible medium, the navigator data and map data can be obtained for the object. Then, the navigator data is compared with the map to generate... Agent: Dorsey & Whitney LLP Intellectual Property Department

20070090839 - Method of magnetic resonance imaging: exciting magnetic resonant (MR) active nuclei in a region of interest; creating magnetic field gradients in a phase-encode direction for spatially encoding the excited MR active nuclei; the number of phase-encode gradients producing a field of view corresponding to the region of interest; receiving radio frequency data from the region... Agent: Buchanan, Ingersoll & Rooney PC

20070090840 - Connection system for split-top rf coils: A split-top RF coil is provided. The split-top RF coil includes a first housing (80) having a first RF coil portion (41) disposed therein and a second housing (84) having a second RF coil portion (42) disposed therein. A plurality of slides (100) are disposed on at least one of... Agent: Philips Intellectual Property & Standards

20070090841 - Split-shield gradient coil with improved fringe-field: An imaging system 2 is provided comprising a primary gradient coil assembly 52 and a shield coil assembly 42. The shield coil assembly 42 is connected in series to the primary gradient coil assembly 52. The shield coil assembly 42 comprises a first gradient shield coil 82 and a second... Agent: Artz & Artz, P.C.

20070090842 - Apparatus and method for guiding energy in a subsurface electromagnetic measuring system: A device for guiding energy in a subsurface electromagnetic measuring system is provided, the device including a transmitting member for transmitting an electromagnetic signal into a subsurface medium, an energy-guiding member disposed in magnetic communication with the electromagnetic signal, and a receiving member for receiving a return signal induced from... Agent: Arnold & Ferrera, L.L.P.

20070090844 - Battery monitoring system: A battery monitoring system (BMS), which utilizes a minimum amount of input data (time, voltage, current, temperature and conductance, for example) to periodically determine a vehicle battery status or condition is provided. The BMS combines electronic hardware and software to give logical and critical data to assess and control a... Agent: Westman Champlin & Kelly, P.A.

20070090843 - Method and device for determining the charge of a battery: A method and device for determining the charge of a battery, characterized in that a gain crossover frequency (f±) for an impedance of the battery excited by an alternating current signal is established, and the gain crossover frequency (f±) is assigned to the charge of the battery, whereby the gain... Agent: Marshall, Gerstein & Borun LLP

20070090845 - Method and apparatus for battery testing using a single microprocessor port: A system for recharging and testing a rechargeable battery having first and second terminals which includes a microprocessor having at least a first port; a charger coupled to the first port and a connector for attachment to one of the terminals of the associated battery; and a comparator coupled to... Agent: Honeywell International Inc.

20070090846 - Method and device for complex permittivity measurements as a function of frequency: An apparatus for use in a system that includes a network analyzer for determining a property, such as dielectric permittivity of a sample material as a function of frequency, the apparatus including: a cylindrical chamber for receiving the sample; a coaxial connector having a first relatively small diameter end coupleable... Agent: Schlumberger-doll Research Attn: Intellectual Property Law Department

20070090847 - Stepped pcb for probe card, probe card having the same and method for clamping the probe card: A stepped printed circuit board for a probe card and for clamping by a testing machine is disclosed. The stepped printed circuit board includes a main body and a protruding body. The main body has a conductive circuit pattern arranged therein and a border area for the clamping of the... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20070090848 - Design-for-test circuit for low pin count devices: A design-for-test (DFT) circuit for an integrated circuit (IC) for enabling accurate quiescent current testing. The IC includes a voltage supply pin, a ground pin and an internal voltage regulator coupled between the voltage supply and ground pins for providing an internal output voltage. The DFT circuit includes a voltage... Agent: The Law Offices Of Gary R. Stanford

20070090849 - Method and apparatus for a dut contactor: A DUT contactor integrated into a DUT or probe board is presented. The DUT contactor integrated into a DUT/probe board may comprise a raised metallization contact layer on one surface of a multi-layer printed circuit board.... Agent: Agilent Technologies Inc.

20070090851 - Probe sensing pads and methods of detecting positions of probe needles relative to probe sensing pads: A probe sensing pad used to detect a position of a probe needle includes a probe area, at least two sensing regions contacting peripheral portions of the probe area, sensing elements of different electrical characteristics connected to corresponding sensing regions, and at least one isolation region for electrically insulting the... Agent: Marger Johnson & Mccollom, P.C.

20070090850 - Semiconductor integrated circuit tester with interchangeable tester module: A test head for an integrated circuit tester includes a main chassis defining a chamber that is open at the top. Tester modules are installed in the chamber, each tester module being removable as a unit from the chamber and including a tester module chassis, multiple pin electronics cards, and... Agent: Smith-hill And Bedell, P.C.

20070090855 - Method and apparatus for testing bumped die: An apparatus for testing unpackaged semiconductor dice having raised ball contact locations is disclosed. The apparatus uses a temporary interconnect wafer that is adapted to establish an electrical connection with the raised ball contact locations on the die without damage to the ball contact locations. The interconnect is fabricated on... Agent: Trask Britt, P.C./ Micron Technology

20070090853 - Method and arrangement for predicting thermally-induced deformation of substrate, and a semiconductor device: The invention provides a method for correcting thermally-induced field deformations of a lithographically exposed substrate. First, a model is provided to predict thermally-induced field deformation information of a plurality of fields of the substrate. The pre-specified exposure information used to configure an exposure of the fields is then modified based... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20070090852 - Process for checking the quality of the metallization of a printed circuit: The invention relates to a process for checking the quality of the metallization of a printed circuit, and also includes the printed circuits produced. According to the invention, the checking process consists in providing a checking circuit (1) comprising n through openings (7-1 . . . 7-6, 8-1 . .... Agent: Young & Thompson

20070090854 - Semiconductor device and method for manufacturing the same: A method for manufacturing a semiconductor device, includes: preparing a semiconductor module including: a semiconductor substrate having an electrode; a test pad electrically connected to the electrode; a land electrically connected to the test pad; and an external terminal provided on the land; and testing an electrical characteristic by bringing... Agent: Harness, Dickey & Pierce, P.L.C

20070090856 - Non-contact detecting device for a panel: A non-contact inspecting device for a panel, which has a plurality of signal inputting sensors, a plurality of signal detecting sensors and a control circuit. The signal inputting sensors are configured in a first detecting bar, and the signal detecting sensors are configured in a second detecting bar. When the... Agent: Bacon & Thomas, PLLC

20070085524 - Method and apparatus which enable high resolution particle beam profile measurement: The PSF for a metrology array for high resolution particle beam profile measurement has been improved by improving five major elements of the metrology array. While improvement in each of the five elements provides and improved PSF, a combination of all five of the elements provides an unexpected synergistic effect.... Agent: Patent Counsel Applied Materials, Inc.

20070085525 - Detection of lightning: A lightning detector for lightning detection and a lightning detection method, wherein the lightning detector uses at least two separate channels or frequency bands for lightning detection, and wherein the lightning detector is a mobile RF device provided with radio interfaces for at least two communication channels or frequency bands,... Agent: Harrington & Smith, PC

20070085526 - Unbalanced current detection: An unbalanced current detection circuit determines when a multi-phase, normally-balanced load is unbalanced. The detection circuit of the present invention includes a plurality of current-squaring circuits, each squaring a sensed current of one of the phases. A summing circuit produces a sum of the squares of the currents. If the... Agent: Carlson, Gaskey & Olds, P.C.

20070085527 - Fan operating status monitoring system: A fan operating status monitoring system is proposed and implemented by employing a detecting module to detect pulsation currents generated by the rotation of a fun, and further convert the detected pulsation currents to voltage signals, thereby allowing a differential magnifying module, a first processing module, and a control module... Agent: M. John Carson Fulbright & Jaworski L.L.P.

20070085528 - Metal immunity in a reverse magnetic system: A method for tracking an object includes fixing to the object a transmitter for transmitting a position-indicative magnetic field and providing a map of distortion of the position-indicative magnetic field caused by the object. A distorted magnetic field transmitted from the object is sensed. The distorted magnetic field includes the... Agent: Philip S. Johnson Johnson & Johnson

20070085529 - System and method for a high dynamic range sensitive sensor element or array: A high dynamic range sensitive sensor element or array is provided which uses phase domain integration techniques to accurately capture high and low intensity images. The sensor element of the present invention is not limited by dynamic range characteristics exhibited by prior art solid-state pixel structures and is thus capable... Agent: Mcguinness & Manaras LLP

20070085530 - Inductive transducer measurement system: An inductive transducer measurement system is provided. A measuring circuit simultaneously drives a plurality of transducer windings and measures their inductance by using a load impedance in an inductance measurement circuit configuration. The system may be designed such that a circuit characteristic that includes a measurement period value, a winding... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20070085532 - Fuel level gauge for use in automobile: A fuel level gauge is advantageously used in a fuel tank of an automobile. The fuel level gauge installed in a fuel tank includes a float floating on the fuel surface, a rotatable member supported by a stationary member and a detector such as a Hall element. The float is... Agent: Nixon & Vanderhye, PC

20070085531 - Variable reluctance type angle detector: The variable reluctance type angle detector has a stator and a rotor. The rotor is provided rotatably with respect to the stator. The stator has a plurality of tooth members disposed in a circle. An excitation wire and an output wire are wound around the tooth members. The rotor has... Agent: Jordan And Hamburg LLP

20070085533 - Microelectromechanical magnetometer: An apparatus comprising a substrate and a MEM device. The MEM includes a comb capacitor and a magnetic element physically connected to one electrode of the comb capacitor. The magnetic element is capable of moving the one electrode in a manner that alters a capacitance of the comb capacitor. The... Agent: Hitt Gaines, PC Lucent Technologies Inc.

20070085534 - Magnetic detection coil and apparatus for measurement of magnetic field: A magnetic detection coil is provided, which includes a plurality of differential coils. Each differential coil is made of one of superconductors and metallic materials. The differential coils having mutually different loop directions are arranged in parallel at a spatially predetermined distance apart and mutually electrically connected in series. Each... Agent: Reed Smith LLP

20070085535 - Fluxgate sensor having conbzr magnetic core and fabrication method thereof: A fluxgate sensor includes a magnetic core including CoNbZr, an excitation coil, and a magnetic field sensing coil. The fluxgate sensor can use CoNbZr. A low coercivity and high magnetic permeability can be obtained.... Agent: Sughrue Mion, PLLC

20070085536 - Magnetic resonance imaging system and operating method therefor: In the operation of a magnetic resonance system, an RF excitation coil emits an excitation pulse such that nuclei in an examination subject are excited to emit of magnetic resonance signals. A number of local coils acquire the magnetic resonance signals emitted from the examination subject, with the magnetic resonance... Agent: Schiff Hardin, LLP Patent Department

20070085537 - Method and magnetic resonance system for determining the flip angle distribution in a volume of an examination subject: In a method for determination of flip angle distributions for various antenna transmission configurations in a magnetic resonance system, magnetic resonance measurements are implemented with the various transmission configurations, with the reception configuration being identical for all implemented magnetic resonance measurements, and all magnetic resonance measurements for the various transmission... Agent: Schiff Hardin, LLP Patent Department

20070085538 - Method and apparatus of echo planar imaging with real-time determination of phase correction coefficients: The present invention provides an apparatus and method of phase correction whereby changes in phase characteristics are measured during data acquisition and, accordingly, phase correction parameters that are applied during image reconstruction are updated in real-time. This adaptive and dynamic phase correction reduces variability in image fidelity during the course... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20070085539 - Method and system of determining in-plane motion in propeller data: The present invention is directed to a method of MR imaging whereby a k-space blade extending through a center of k-space from a subject in motion is acquired. A high-pass convolution of the k-space blade with a reference k-space blade is then determined and converted to a δ function. In-plane... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20070085540 - Method for developing a transmit coil of a magnetic resonance system: In a method for decoupling an RF transmit coil in a magnetic resonance imaging system, the RF transmit coil has more than one antenna unit and stimulus signals are inputted to said antenna units via connecting cables. A capacitor is connected in series before each of the cables and the... Agent: Schiff Hardin, LLP Patent Department

20070085541 - Detection with evanescent wave probe: Methods and systems for spatially resolved spin resonance detection in a sample of material are disclosed. Also disclosed are methods and systems for spatially resolved impedance measurements in a sample of material. The disclosed methods and samples can be used in screening of plurality of biological, chemical and material samples.... Agent: Buchanan, Ingersoll & Rooney PC

20070085543 - Cavity resonator for mr systems: A magnetic resonance apparatus in embodiments of the invention may include one or more of the following features: (a) a coil having at least two sections, (b) the at least two sections having a resonant circuit, (c) the at least two sections being wirelessly coupled or decoupled, (d) the at... Agent: Intellectual Property Group Fredrikson & Byron, P.A.

20070085544 - Method and apparatus for high-gain magnetic resonance imaging: A method and apparatus for Magnetic Resonance Imaging with specialized imaging coils possessing high Signal-to-Noise-Ratio (SNR). Imaging and/or Radio Frequency receiving coils include a ballistic electrical conductor such as carbon nanotubes, the ballistic electrical conductor having a resistance that does not increase significantly with length. Due to their enhanced SNR... Agent: Russ Weinzimmer

20070085542 - Mri system having reduced accoustic noise: A magnetic resonance imaging (MRI) system including a gradient coil system. The gradient coil system comprises an inner coil configuration (1,2,3) and an outer coil configuration (4,5,6) positioned substantially coaxially with said inner coil configuration (1,2,3). Both coil configurations are attached to a tubular body (7) located between said two... Agent: Philips Intellectual Property & Standards

20070085545 - Armored seabed laid seismic cable and method and apparatus for manufacturing same: A method for wrapping continuous strands of steel wire about a seismic cable including interconnected sensor sections and conductor sections where a cross sectional diameter of the sensor section is at least four times that of the conductor section. Two layers of armoring are provided with a first layer wrapped... Agent: Andrews & Kurth, L.L.P.

20070085546 - Method and arrangement for measuring inverter output currents: A method and arrangement for measuring output phase currents of a voltage source inverter when the inverter is connected to a load, the method comprising, during commissioning of a drive, the steps of forming consecutive voltage pulses to the load by using the inverter, measuring current of a DC bus... Agent: Buchanan, Ingersoll & Rooney PC

20070085547 - Method for generating a simulated sensor signal pattern for a marking gap in a signal-generating disk: A method for generating a simulated sensor signal pattern for a marking gap of a signal-generating disk which is coupled with a crankshaft of an internal combustion engine, the signal-generating disk having a marking by the alternating positioning of teeth and tooth interstices, and the marking gap being formed by... Agent: Kenyon & Kenyon LLP

20070085548 - Insulation degradation diagnostic device: An insulation degradation diagnostic device (1a) comprises a current transformer (7a), a first amplifier (15), a first high-pass filter (17), a low-pass filter (19), a second amplifier (20), a second high-pass filter (21), and a discharge judgment section (30). The current transformer (7a) has a filtering function with an amount... Agent: Sughrue Mion, PLLC

20070085549 - Apparatus and method for determining a faulted phase of a three-phase ungrounded power system: Provided is an apparatus and method for determining a faulted phase resulting from a fault in a three-phase ungrounded power system. The method includes comparing a phase angle of an operating phasor to a phase angle of a fixed reference phasor. The operating phasor is derived from a digitized signal... Agent: Cook, Alex, Mcfarron, Manzo, Cummings & Mehler Ltd

20070085550 - Non-contact reflectometry system and method: Non-contact reflectometry for testing a signal path is described. The technique includes using capacitive coupling to inject a test signal into the signal path and extract a response signal from the signal path. Reflectometry techniques are used to determine characteristics of the signal path from the response signal. The technique... Agent: Thorpe North & Western, LLP.

20070085551 - Calibration jig and calibration apparatus having the same: A calibration jig for adjusting timing and an apparatus equipped with such a calibration jig, including calibration block, at least one calibration board attached to the calibration block to form a securing platform for at least one test component, and a plurality of calibration terminals integral to the calibration board... Agent: Lee & Morse, P.C.

20070085552 - Method of measuring relative dielectric constant of dielectric substance of powders, cavity resonator used in the same, and application apparatus: A relative dielectric constant of a mixed substance consisting of powders and a liquid medium is calculated, and then the relative dielectric constant of the mixed substance or a relative dielectric constant of the liquid medium is calculated as a relative dielectric constant of the powders when the relative dielectric... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070085553 - Method for using touch signals and a touch unit: A method for evaluating touch signals on a touch unit which has two resistance foils (1, 2). The current (IX, IY) resulting from applying a given measurement voltage (UX, UY) to at least one of the resistance foils (1, 2) is measured and stored as a desired current value (IXS,... Agent: Townsend And Townsend And Crew, LLP

20070085555 - Dual arcuate blade probe: Provided is a dual arcuate blade probe tip for probing a node, such as a node hole, on a circuit. The probe has a shaft made from an electrically conductive material, concentric to a longitudinal probe axis, and two separate arcuate edges coupled to the shaft and positioned transverse to... Agent: Hewlett Packard Company

20070085554 - Replaceable modular probe head: A replaceable modular probe head is composed of a plurality of in-parallel probing modules. Each probing module has a plurality of in-series probing regions. In the present embodiment, each probing module has mechanical connection parts on its both ends to attach to a printed circuit board (PCB) to be a... Agent: Troxell Law Office PLLC

20070085556 - Planar voltage contrast test structure: An integrated circuit and e-beam testing method are disclosed. The integrated circuit includes a test structure with a ground grid, a metal pad having a space therein and positioned within the ground grid, and a metal line connected to the ground grid and positioned in the space. Structures for detecting... Agent: Ishimaru & Zahrt LLP

20070085557 - Method and apparatus for burn-in optimization: The present invention provides a method and apparatus for optimizing the burn-in of integrated circuits. One embodiment of the method comprises: performing a first portion of the burn-in process of the integrated circuit; monitoring a power dissipation of the integrated circuit during the first portion of the burn-in process; increasing... Agent: Hoffman, Warnick & D'alessandro LLC

20070085558 - On-chip voltage regulator using feedback on process/product parameters: The present invention optimizes the performance of integrated circuits by adjusting the circuit operating voltage using feedback on process/product parameters. To determine a desired value for the operating voltage of an integrated circuit, a preferred embodiment provides for on-wafer probing of one or more reference circuit structures to measure at... Agent: Morgan, Lewis & Bockius LLP

20070085559 - Test device: A test device that can improve test reliability is provided. In the test device, an error detecting unit detects an error of inputted test signals to generate an error flag, a normal test unit performs a test operation according to the test signals when the error flag is deactivated, and... Agent: Mcdermott Will & Emery LLP

20070080676 - Assembly group for current measurement: An assembly group for current measurement comprises a conductor plate with three cuts and a measuring element placed on the conductor plate that has a difference sensor formed from two magnetic field sensors. By means of the three cuts a first and a second conductor section are formed in the... Agent: Mccormick, Paulding & Huber LLP

20070080677 - Shield for tester load board: The invention provides tester load board shields for attachment to tester load boards. The shields of the invention protect from physical damage and electromagnetic interference. A preferred embodiment of a tester load board shield of the invention is disclosed in which a disc and outer rim of conductive metal such... Agent: Texas Instruments Incorporated

20070080678 - Magnetic taggant system: An apparatus and a method for monitoring a ratio of at least two components being mixed use sensors detecting ferrous taggant particles in the component(s) and the mixture. The sensors include an annular drive coil positioned between inner and outer annular sense coils all surrounding a passage for material being... Agent: Butzel Long

20070080679 - Rotary sensor: A rotary position sensing including a first and second magnet spaced from one another. A first and second triangular magnetic flux director are arranged in a generally diamond shaped configured with an air gap between the two magnetic flux directors. A magnetic field sensor system is positioned in the air... Agent: Grossman, Tucker, Perreault & Pfleger, PLLC

20070080680 - Apparatus, sensor, and method for measuring an amount of strain: An apparatus, sensor, and a method for measuring an applied strain are provided. The apparatus includes a strain sensor comprising an electrically conductive member composed of a magnetostrictive material. The apparatus further includes a signal generator electrically coupled to the electrically conductive member. The signal generator is configured to generate... Agent: Delphi Technologies, Inc.

20070080681 - Method and device for the non-destructive and contactless detection of flaws in a test piece moved relative to a probe: Method for nondestructive and contact-free detection of faults in a test specimen which is moved relative to a probe that detects a periodic electrical signal having a carrier oscillation whose amplitude and/or phase is/are modulated by any fault in the test specimen. The probe signal is filtered and sampled by... Agent: Roberts, Mlotkowski & Hobbes

20070080682 - Magnetic sensor assembly: A sensor assembly includes a first magneto-resistive field sensor in a first surface-mountable package, which measures first and second components of a magnetic field projected onto respective different first and second axes with respect to a spatial orientation of the sensor and to produce first position signals indicative of the... Agent: Philip S. Johnson Johnson & Johnson

20070080683 - Magnetoresistive sensor for determining an angle or a position: Magnetoresistive sensors which use the AMR or the GMR effect and indicate the direction of the homogeneous magnetic field of a rotatable permanent magnet in the angle measurement or the position of the sensor with respect to a scale, which is magnetized periodically in an alternating direction, for the position... Agent: Henry M Feiereisen, LLC

20070080684 - Method for the hyperpolarisation of atomic nuclei and device for carrying out said method: The invention relates to a method for the hyperpolarisation of atomic nuclei by means of optical pumps in a sample cell. Polarisation of an electron spin of an optically pumpable species, which is produced by means of laser light, is transferred to the nucleus spin of an atom which is... Agent: The Firm Of Karl F Ross

20070080685 - Magnetic resonance imaging with ultra short echo times: Systems and techniques for imagining samples including components with small values of T2. Optionally, the systems and techniques may provide (for example) suppression of unwanted signals, enhanced contrast, and artifact control in imaging samples with small values of T2.... Agent: Fish & Richardson, PC

20070080687 - Method and control device for obtaining magnetic resonance data for imaging: is optimized in accordance with a selected criterion K ({Sij}), where n with 1≦n≦N is the running index of the measurement signals detected within a respective block, Sn((ΦQ,Pi) or Sn(ΦQ,Pj) is the value of the transversal magnetization of the voxels, which contain the substance i or j, in the condition... Agent: Dennison, Schultz & Macdonald

20070080686 - Method for simultaneous phase contrast angiography and invasive device tracking: A method for simultaneously tracking an invasive device disposed within a patient and acquiring an imaging signal of the patient with a magnetic resonance imaging (MRI) system during a single echo acquisition time period (46) of the MRI system. The method includes applying a radio frequency excitation pulse (26) to... Agent: General Electric Company Global Research

20070080688 - Apparatus and associated method that integrate the modalities of diagnosis and therapy to treat, in principle, pathologies generically identified as cancer and hiv/aids: The invention relates to an apparatus and method which are designed to be used for diagnosis and therapy based on non-ionising radiations. The operation thereof is based on the principle of nuclear magnetic resonance. A quantitative diagnosis can be made using the following devices: a manually-controlled digital filter/selector (18), a... Agent: James C Wray

20070080690 - Magnetic resonance imaging apparatus: For the purpose of preventing development of motion artifacts and improving image quality, a first displacement N1 of the diaphragm before a scanning section 2 performs an imaging sequence and a second displacement N2 of the diaphragm after the scanning section 2 has performed the imaging sequence are detected by... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070080689 - Mri apparatus with means for noise reduction: The invention relates to a magnetic resonance imaging (MRI) system comprising a main magnet system for generating a main magnetic field in an examination volume, a gradient coil system (1) which is substantially arranged between the main magnet system and the examination volume and which comprises sub-gradient coils (4,5,6) embedded... Agent: Philips Intellectual Property & Standards

20070080692 - Method and apparatus for performing automated power plant battery backup capacity measurement: A method and apparatus for automatically performing a measurement of a power plant's battery backup capacity. The process comprises reducing an output voltage of a rectifier and identifying a time when said output voltage has been so reduced, measuring the voltage (e.g., at the output of the battery) to determine... Agent: Lucent Technologies Inc. Docket Administrator - Room 3j-219

20070080691 - Testing and comparing two batteries connected in parallel method and apparatus: In accordance with some embodiments of the present invention, a battery testing apparatus and method include a processor, a first clamp coupled to the processor, a second clamp coupled to the processor, and a third clamp coupled to the processor wherein the processor is configured to collect data on a... Agent: Baker & Hostetler LLP

20070080693 - Contactless system and method for detecting defective points on a chargeable surface: A method for detecting charge defect spots (CDSs) on a chargeable surface is provided, including charging the chargeable surface to receive and hold a first voltage charge, spacing a surface of a scanner probe a distance from the chargeable surface, the scanner probe having a diameter, and biasing the scanner... Agent: Carter, Deluca, Farrell & Schmidt, LLP

20070080694 - Apparatus and method for fuel cell resistance test: The present invention relates to a system applied for the measurement of the total ohmic internal resistance of fuel cells and stack of fuel cells. The apparatus comprises an electronic load system which comprises: an input unit generating an input pulse, a driver for the control of the input pulse,... Agent: Stetina Brunda Garred & Brucker

20070080695 - Testing system and method for a mems sensor: A test system and method for a MEMS sensor has an electrical input signal that drives a capacitor of the MEMS sensor. The capacitor has a movable plate. A mechanical actuator provides a mechanical stimulus to the MEMS sensor. A detection system detects an output signal of the capacitor. The... Agent: Law Office Of Dale B. Halling, LLC

20070080696 - Integrated circuit package resistance measurement: For one embodiment, an integrated circuit includes a node to couple one or more components to the integrated circuit to carry current through a package for the integrated circuit. The integrated circuit also includes a monitor to measure a resistance of the package based at least in part on a... Agent: Blakely Sokoloff Taylor & Zafman

20070080697 - Semiconductor device tester pin contact resistance measurement: A contact resistance measuring circuit is configured to determine the contact resistance of a testing device. The measuring circuit is coupled to a processing circuit and the testing device. The measuring circuit includes a pair of input/output units coupled together via a pass device. Each of the input/output units includes... Agent: Jonathan O. Owens Haverstock & Owens LLP

20070080698 - Contact system for wafer level testing: Disclosed herein are exemplary embodiments of a contact system (referred to as a “Z-block”) for interfacing a semiconductor wafer to an electrical tester, and methods for making the same. In a preferred embodiment, the Z-block comprises three stacked pieces or layers: an upper and lower piece which are similar in... Agent: Wong, Cabello, Lutsch, Rutherford & Brucculeri, L.L.P.

20070080699 - System and method for pulsed signal device characterization utilizing an adaptive matched filterbank: A test system and method which employs a filter bank to select different spectral components of a pulsed measurement signal. The filter bank utilizes filter nulls to suppress non-selected spectral components. After filtering the selected spectral components, the spectral components are combined to provide for a measurement signal which is... Agent: Agilent Technologies Inc.

20070080701 - Apparatus for measuring on-chip characteristics in semiconductor circuits and related methods: An apparatus for measuring on-chip characteristics in a semiconductor circuit is provided. The apparatus for measuring the on-chip characteristics includes an oscillation unit, a timing test unit, and a selection unit. The oscillation unit is configured to selectively output a first oscillation signal responsive to a first control signal. The... Agent: Myers Bigel Sibley & Sajovec

20070080703 - Camera based pin grid array (pga) inspection system with pin base mask and low angle lighting: An inspection system, for inspecting pin grid arrays on integrated circuit devices includes a pin base mask configured to receive a device having a pin grid array. A dark-field, low-angle lighting system emits light onto the pin grid array. The pin base mask and low-angle lighting system provide for a... Agent: Foley And Lardner LLP Suite 500

20070080700 - Carousel device, system and method for electronic circuit tester: A rotatable or translatable carousel configured to facilitate electrical or electronic testing of Devices Under Test (DUTs) in combination with an insertion handler and a test head is disclosed. The carousel is configured to be placed on a test head of a tester in a first position with a first... Agent: Agilent Technologies Inc.

20070080704 - Semi-conductor chip package capable of detecting open and short: A semiconductor chip package capable of detecting an open and a short is disclosed, comprising: a first pad group comprising a plurality of first substrate pad sub groups, formed on a substrate, each composed of first substrate pads electrically connected, and insulated from each other, and a plurality of first... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20070080705 - System and method for the probing of a wafer: According to one embodiment of the invention, a method for resuming the probing of a wafer includes identifying a data set associated with a wafer. The data set identifies at least one unprobed die supported on the surface of the wafer. The method also includes determining that the data set... Agent: Texas Instruments Incorporated

20070080702 - Temperature control in an integrated circuit: One example of a test board includes first and second communication ports configured for communication with a master device and a DUT, respectively. A bit error rate tester of the test board is arranged for communication with the master device and with the DUT by way of the first and... Agent: Workman Nydegger (f/k/a Workman Nydegger & Seeley)

20070080706 - Logic circuit for board power-supply evaluation and board power-supply evaluating method: A logic circuit for board power-supply evaluation to be incorporated into a logic device loaded on a product board includes a circuit that simulates an operation of the logic device so that utilization rate is variable at an arbitrary frequency by use of a predetermined circuit in all available logic... Agent: Buchanan, Ingersoll & Rooney PC

20070075701 - Supply voltage characteristic measurement: For one disclosed embodiment, a delay is to receive signals and to delay received signals for an amount of time at least partially dependent on a supply voltage to generate delayed signals. Logic is to help measure a characteristic relating to the supply voltage based at least in part on... Agent: Blakely Sokoloff Taylor & Zafman

20070075702 - Insert having independently movable latch mechanism for semiconductor package: In an example embodiment, an insert having an independently movable latch mechanism for loading a semiconductor package may include an insert body having a pocket, latch units installed at opposite sides of the pocket, and a press plate elastically installed above the insert body. The latch units prevent a loaded... Agent: Harness, Dickey & Pierce, P.L.C

20070075703 - Sensor for measuring the rotational speed of a turboshaft: A sensor for measuring the rotational speed of a turboshaft of a turbocharger includes a sensor housing and a sensor element which is positioned in the sensor housing and which senses a variation of a magnetic field caused by the rotation of the turboshaft. In order to provide a sensor... Agent: Cohen, Pontani, Lieberman & Pavane

20070075704 - Pulse signal generator: A pulse signal generator using a magnetic device that can cause a large Barkhausen effect, comprises means having a number of pits and projections and generates pulses according to the behavior of these, the means being capable of moving the pits and projections in a first or second direction, the... Agent: Cohen, Pontani, Lieberman & Pavane

20070075705 - Detector having sensor chip and biasing magnet: A rotation detector is positioned to face a rotating object such as a crankshaft of an internal combustion engine. The rotation detector includes a sensor chip mounted on a portion extending from a holder and a magnet for supplying a biasing magnetic field to the sensor chip. Rotation of the... Agent: Posz Law Group, PLC

20070075706 - Method and apparatus for formation evaluation and borehole size determination: The quality factor of a NMR-antenna depends upon mud conductivity, formation resistivity and the borehole size. The Q of the antenna is measured. From measurement of one of formation conductivity or borehole size, the other can be determined.... Agent: Madan, Mossman & Sriram, P.C.

20070075707 - Mr scanning method and mri apparatus: The present invention provides an MR scanning method and an MRI apparatus for decreasing the artifacts while improving the signal from within the blood vessels in the parallel imaging. In the sequence for calibration data acquisition the, RF pulse of the flip angle and the slice gradient are applied, then... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070075708 - Electromagnetic survey system with multiple sources: Multiple sources are provided for a transmitter cable for use in electromagnetic surveying. The transmitter cable includes a dipole antenna comprising a pair of spaced apart electrodes mounted on their respective cables. Two antennas may be powered from each source. Alternatively, the outputs of each source are connected to a... Agent: Schlumberger Oilfield Services

20070075709 - Method and apparatus for detecting minute oscillation and wibro repeater having the same: Disclosed are a method and apparatus for detecting minute oscillation in a WiBro repeater, and the WiBro repeater having the same. The method of detecting minute oscillation in a WiBro repeater includes: calculating an autocorrelation value of an input signal inputted to the repeater; calculating energy of the input signal;... Agent: Cantor Colburn, LLP

20070075710 - Methods and systems for detecting a capacitance using sigma-delta measurement techniques: Methods, systems and devices are described for detecting a measurable capacitance using sigma-delta measurement techniques. According to various embodiments, a voltage is applied to the measurable capacitance using a first switch. The measurable capacitance is allowed to share charge with a passive network. If the charge on the passive network... Agent: Ingrassia Fisher & Lorenz, P.C.

20070075711 - Device for non-dissipative measurement of the current in an inductor: The invention relates to a device for measuring current in an inductor, which device is intended to be connected in parallel with said inductor, comprising two terminals A and B. The device comprises: a network in parallel with the inductor and connected to the terminals A and B having a... Agent: Lowe Hauptman Gilman & Berner, LLP

20070075712 - Apparatus and method for performing a four-point voltage measurement for an integrated circuit: A method and apparatus for determining a voltage, such as a bias voltage, supplied by an integrated circuit. A nominal terminating resistor is connected across a first and a second input/output pads from which the voltage is supplied. The voltage is measured across third and fourth pads connected, respectively, to... Agent: Lester H. Birnbaum

20070075715 - Contact carriers (tiles) for populating larger substrates with spring contacts: An interconnection apparatus and a method of forming an interconnection apparatus. Contact structures are attached to or formed on a first substrate. The first substrate is attached to a second substrate, which is larger than the first substrate. Multiple such first substrates may be attached to the second substrate in... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070075714 - Dual-chamber solution packaging system: A solution packaging system and method of administering a solution are disclosed. One embodiment of the solution packaging system of the present invention comprises a gas-impermeable dual-chamber bag, having a first chamber and a second chamber separated by a frangible (releasable) seal, and an over-wrap member enclosing and containing the... Agent: Alcon

20070075717 - Lateral interposer contact design and probe card assembly: The present invention is directed to an interposer having an interposer substrate with an upper surface and a lower surface and at least one resilient contact element having an upper portion and a lower portion. The upper portion extends in a substantially vertical fashion above the upper surface of said... Agent: Pillsbury Winthrop Shaw Pittman LLP

20070075716 - Probe for testing a device under test: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070075713 - Tester for in-circuit testing bed of nails fixture and testing circuit thereof: In one preferred embodiment, a tester for testing an In-Circuit Testing (ICT) bed of nails fixture includes an interface for connecting a cable, wherein the cable is connected to the ICT bed of nails fixture; a probe connected to one of nails of the ICT bed of nails fixture, wherein... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070075721 - Burn-in testing apparatus and method: An integrated circuit (IC) package testing apparatus integrates a temperature sensor, heater (or cooler), and controller within a single modular unit. The controller is a microprocessor embedded within the modular unit and in communication with the sensor and heater. The controller allows a selected testing temperature to be input by... Agent: Marger Johnson & Mccollom, P.C.

20070075722 - Device and method for isolating a short-circuited integrated circuit (ic) from other ics on a semiconductor wafer: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short... Agent: Trask Britt, P.C./ Micron Technology

20070075723 - Device and method for isolating a short-circuited integrated circuit (ic) from other ics on a semiconductor wafer: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short... Agent: Trask Britt, P.C./ Micron Technology

20070075725 - Device and method for isolating a short-circuited integrated circuit (ic) from other ics on a semiconductor wafer: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short... Agent: Trask Britt, P.C./ Micron Technology

20070075726 - Interposer and test assembly for testing electronic devices: A test apparatus which uses a pair of substrates and housing to interconnect a host substrate (e.g., PCB) to an electronic device (e.g., semiconductor chip) to accomplish testing of the device. The apparatus includes a housing designed for being positioned on the PCB and have one of the substrates oriented... Agent: Lawrence R. Fraley Hinman, Howard & Kattell, LLP

20070075718 - Layout for dut arrays used in semiconductor wafer testing: A layout for devices under test formed on a semiconductor wafer for use in wafer testing includes a first array of devices under test and a first pad set formed adjacent to the first array. The first pad set includes a gate force pad, a source pad, and a drain... Agent: Morrison & Foerster LLP

20070075719 - Method of testing semiconductor devices and handler used for testing semiconductor devices: Example embodiments may provide a method of testing semiconductor devices by identifying units of lots and a test tray such that a plurality of lots having semiconductor devices may be continuously tested by a handler. Example embodiments may also provide a handler used to test the semiconductor devices.... Agent: Harness, Dickey & Pierce, P.L.C

20070075720 - Test pattern of semiconductor device and test method using the same: There are provided a test pattern of a semiconductor device and a test method using the same. The test pattern of the semiconductor device includes a conductive pattern disposed on a semiconductor substrate, and the conductive pattern includes a plurality of line regions, which are aligned in parallel, and spaced... Agent: Mills & Onello LLP

20070075724 - Thermal optical chuck: An accessible optical path to a lower surface of a heatable device under test is provided by a thermal optical chuck comprising a transparent resistor deposited on transparent plate arranged to supporting the device in a probe station.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070075727 - Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel: An inspection method includes an array process of forming a TFT array on a substrate to fabricate an active matrix panel, an inspection process of carrying out a performance test on the fabricated active matrix panel, and a cell process of mounting an OLED on the active matrix panel after... Agent: Louis Paul Herzberg

20070075728 - Ac power supply testing module and method for booting a main board: An AC power supply testing method upon booting a main board is provided. The testing method is applied to a main board, a microprocessor is in connection with the main board, and a relay is connected with the microprocessor, an AC power supply and a system power supply of the... Agent: Bever Hoffman & Harms, LLP Tri-valley Office