Electricity: measuring and testing inventions 03/07

20070069713 - Power source for diagnostic instruments: A power source device for diagnostic instruments is adapted for a connection of different types of illuminating devices and includes an active control unit for controlling an operating state of a power source in dependence on a type of a connected one of the illuminating devices.... Agent: Rothwell, Figg, Ernst & Manbeck, P.C.

20070069715 - High density metering system: A modular metering system comprises a data processing module, a current module and a voltage module. The current and voltage modules include sensor memories characterizing the respective current and voltage sensors facilitating assembly and repair of the metering system.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070069714 - Method for measuring charge pump output current: A method for measuring output current of a charge pump, the method including providing a charge pump including a plurality of n charge pump stages, wherein an output of stage n−1 (Von-1) is output to stage n, an output voltage of stage n being referred to as charge pump voltage... Agent: Eitan Law Group C/o Landonip Inc.

20070069716 - Digital multi-meter: A digital multi-meter (DMM) is described which can be inserted into a peripheral device card expansion slot of a personal digital assistant (PDA) to provide the PDA with DMM functionality. The DMM is configurable by configuration data supplied by application software running on the PDA. Configuration of the DMM may... Agent: Renner Otto Boisselle & Sklar, LLP

20070069717 - Self-shielded electronic components: An electronic component including at least one first conductor for operating at a first voltage applied thereto and at least one second conductor for operating at a second voltage applied thereto. The second voltage is smaller than the first voltage and at least a portion of the second conductor is... Agent: Tarolli, Sundheim, Covell & Tummino L.L.P.

20070069718 - Test fixture for collecting particulate material: A test fixture for collecting particulate matter carried in the exhaust gas stream of an engine has a pair of coaxially aligned mounting plates, each having a filter cartridge holder mounted thereon. One of the mounting plates is moveable with respect to the other along a predefined longitudinal axis of... Agent: Ted D. Lee Gunn & Lee, P.C.

20070069719 - Rotation angle detecting device: A rotation angle detecting device that detects a rotation angle of a rotating object includes a permanent magnet that generates magnetic fields in response to rotation of the rotating object, a magnetic sensor, a first yoke and a second yoke. The magnetic sensor includes a pair of close integrated magnetic... Agent: Nixon & Vanderhye, PC

20070069720 - Material characterization with model based sensors: Nondestructive material condition monitoring and assessment is accomplished by placing, mounting, or scanning magnetic and electric field sensors and sensor arrays over material surfaces. The material condition can be inferred directly from material property estimates, such as the magnetic permeability, dielectric permittivity, electrical property, or thickness, or from a correlation... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20070069721 - Small-sized attitude detection sensor and portable telephone using the small-sized attitude detection sensor: An attitude detection sensor includes three magnetic sensing parts that detect magnetic field strength in respective directions along three axes perpendicular to each other, and two tilt sensing parts that detect tilt angles around two axes perpendicular to each other. The tilt sensing parts each include a cantilever having a... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070069722 - Beam current meter: It is possible to simplify the cooling mechanism of a superconductor, significantly reduce the cost, simplify the measurement work, and reduce the time required for measurement. A beam current meter includes: a cylindrical super conductor beam current sensor arranged in a vacuum vessel in such a manner that the beam... Agent: Birch Stewart Kolasch & Birch

20070069723 - Solenoid magentometer: A magnetometer assembly (22) for a torque transducer (10) includes inner and outer coils (34,38,36,40) wrapped and supported on a bobbin assembly (22). The bobbin assembly (22) includes upper and lower axial portions (21,23) divided by a middle flange (28). The middle flange (28) includes a plurality of notches (32)... Agent: Siemens Corporation Intellectual Property Department

20070069724 - Apparatus and method of simultaneous fat suppression, magnetization transfer contrast, and spatial saturation for 3d time-of-flight imaging: A pulse sequence for time-of-flight (TOF) magnetic resonance angiography (MRA) includes a fatsat segment, a magnetization transfer segment, and a spatial saturation segment that are applied by an MR apparatus to acquire MR data for image reconstruction with improved image quality. The pulse sequence is constructed such that at the... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20070069725 - Configuration for nuclear magnetic resonance imaging (mri) with an mri phantom: An MRI configuration comprising a magnet system for generating a homogeneous magnetic field, a radio frequency (RF) system (105) for generating/detecting an RF field B1, and a gradient system (106) for temporarily superposing defined gradient fields on a magnetic field B0, and an MRI phantom (104) positioned in the volume... Agent: Kohler Schmid Moebus

20070069726 - Mri apparatus: The present invention provides an MRI apparatus with selective saturation without affection to the integral value of gradient magnetic field in 1TR. The MRI apparatus comprises a signal acquisition device for applying static field, gradient magnetic field pulses and RF pulses to an object to acquire magnetic resonance signals therefrom,... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070069727 - Parallel mr imaging method: The invention relates to a parallel magnetic resonance imaging method, in which core magnetization is excited in the examination volume of an MR device by generating at least one HF pulse. Two or more MR signals are then recorded in parallel from the examination volume via two or more receiving... Agent: Philips Intellectual Property & Standards

20070069730 - Assembly for generating magnetic fields in a magnetic resonance tomography apparatus: An assembly for magnetic field generation in a magnetic resonance tomography apparatus has a device for generation of a basic magnetic field, a vacuum vessel surrounding the basic field device and a device for generation of at least one gradient magnetic field. The assembly has a volume with a reduced... Agent: Schiff Hardin, LLP Patent Department

20070069729 - Magnetic resonance imaging apparatus and radio frequency coil unit: A radio frequency coil unit includes a plurality of surface coils and a distributing/combining unit. The plurality of surface coils are arranged in a body-axis direction. The distributing/combining unit distributes and combines reception signals output from the plurality of surface coils to generate a new reception signal.... Agent: Nixon & Vanderhye, PC

20070069728 - Mri system with rf receiver coils fixed to the housing: An MRI system (1) comprises a housing (10) defining an examination space (2) for receiving a body for examination, a patient table (3) being displaceable into and out of the examination space (2), a magnetic field generating system (4) for generating a magnetic field in the examination space (2), and... Agent: Philips Intellectual Property & Standards

20070069731 - Shimming structure and method for a magnetic resonance imaging apparatus: In a magnetic resonance imaging apparatus and a method for shimming such an apparatus, at each of mirror-symmetrical assemblies respectively disposed at opposite faces of a static magnetic field generator, that each include a shimming ring, an additional shimming ring is provided that is adjustable in position relative to the... Agent: Schiff Hardin, LLP Patent Department

20070069732 - Flux orientation locating in a drilling system: An above ground locator includes an apparatus for determining the strength of the locating signal at a selected point relative to the boring tool. The apparatus includes an antenna arrangement configured for measuring the strength of the locating signal at the selected point along first and second orthogonally opposed receiving... Agent: Pritzkau Patent Group, LLC

20070069733 - Method and device for geoelectrical mapping: The invention a method and device for carrying out geoelectric mappings. The device includes electrodes, a power supply and a voltage measuring device, for carrying out the method. The electrodes are disposed apart from one another on ground to be investigated and electric current is supplied by certain electrodes to... Agent: Jordan And Hamburg LLP

20070069734 - Automotive vehicle electrical system diagnostic device: An automotive vehicle electrical system diagnostic apparatus includes first and second electrical connections configured to electrically couple to an electrical system of an automotive vehicle which includes a battery. Digital samples are obtained during operation of the vehicle which are related to the system. The digital samples are stored in... Agent: Westman Champlin & Kelly, P.A.

20070069735 - Battery sensor and method for the operation of a battery sensor: A battery sensor has a current meter, an analytical unit, and a microprocessor. During an idle phase, in which the electrical main user, provided with a battery, is switched off, the following steps are carried out. The microprocessor is switched off. At given intervals the measured signal from the current... Agent: Lerner Greenberg Stemer LLP

20070069736 - Static timing based ir drop analysis: A method for determining a maximum IR drop on a power grid of a circuit is disclosed. The method includes dividing a reference timing signal into multiple bins. Each one of the bins having a corresponding bin duration. The bins being divided by a corresponding fuzzy boundaries. Each one of... Agent: Martine Penilla & Gencarella, LLP

20070069737 - System and method for adaptable testing of backplane interconnections and a test tool incorporating the same: The present invention provides a system for, and method of, adaptable testing of backplane interconnections. In one embodiment, the system includes a board detector configured to determine a relative arrangement of a plurality of hardware boards populating positions associated with the backplane interconnections. Additionally, the system also includes a test... Agent: Hitt Gaines, PC Lucent Technologies Inc.

20070069738 - Circuit board characteristic impedance inspection method and apparatus: A circuit board characteristic impedance inspection method and apparatus is proposed, which is designed for inspecting the characteristic impedance of a circuit board, and which is characterized by the provision of a set of measurement contact points on the circuit board so that during actual inspection, a set of probes... Agent: Edwards & Angell, LLP

20070069739 - Method and apparatus to measure differential phase and frequency modulation distortions for audio equipment: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic... Agent: Ronald Quan

20070069740 - Analysis of variable-depth sample using a sweeping microwave signal: The present invention relates to an apparatus and method for analysing an amount of at least one component in a sample by measuring a microwave signal that has passed at least partially through the sample. The apparatus preferably comprises: a microwave generator that generates a continuous linear sweeping microwave signal... Agent: Biotechnology Law Group C/o Portfolioip

20070069741 - Evanescent microwave microscopy probe and methodology: The present invention generally relates to an evanescent microwave spectroscopy probe and methods for making and using the same. Some embodiments relate to a probe in electrical communication with sapphire tuning capacitors that are arranged in parallel. Some embodiments relate to using capacitors arranged in this manner to achieve higher... Agent: Roetzel And Andress

20070069742 - Determination of equivalent series resistance: A determination of an equivalent series resistance (ESR) effect for high frequency filtering performance of a filtered feed-through assembly is described. A low frequency signal is introduced to a filtered feed-through assembly. ESR limit of the filtered feed-through is determined based on the low frequency signal.... Agent: Medtronic, Inc.

20070069744 - Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method: A photo-fabrication apparatus (1) has a stage (2) for holding a base board (9) thereon, a feeding part (3) for feeding photosensitive material onto the base board (9), a layer forming part (4) for smoothly spreading the fed photosensitive material to form a material layer and a light emitting part... Agent: Mcdermott Will & Emery LLP

20070069748 - Probe assembly: A probe assembly comprises a probe base plate with a plurality of probes to be used for electrical inspection of a plurality of semiconductor chip regions continuously formed in alignment in the directions orthogonal to each other on a substantially circular semiconductor wafer, and capable of contacting the electrical connecting... Agent: Jeffrey J. King, Esq. Black Lowe & Graham PLLC

20070069745 - Probe card for integrated circuits: A probe card for integrated circuit devices comprises a printed circuit board, at least one probe pin positioned on the printed circuit board, and at least one ultrasonic generator configured to generate ultrasonic energy. When the probe pin contacts a pad, the ultrasonic generator emits ultrasonic energy to vibrate the... Agent: Connolly Bove Lodge & Hutz LLP

20070069747 - Probe tile for probing semiconductor wafer: A tile used to hold one or more probes for testing a semiconductor wafer. The tile has one or more sites for inserting one or more probes to test the semiconductor wafer. Each site has one or more holes. Each hole is coupled with a slot forming an angle. A... Agent: Dorsey & Whitney LLP Intellectual Property Department

20070069746 - Probing card and inspection apparatus for microstructure: A probing card and an inspection apparatus which precisely inspect a microstructure having a minute moving section by a simple method are provided. A probing card (6) has a speaker (2), and a circuit substrate (100) which fixes a probe (4), and the speaker (2) is disposed on the circuit... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070069743 - Sheet-like probe, process for producing the same and its application: Disclosed herein are a sheet-like probe capable of surly preventing positional deviation between electrode structures and electrodes to be inspected by temperature changes in a burn-in test, even when the object of inspection is a wafer having a large area of 8 inches or greater in diameter or a circuit... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070069749 - Method for fabricating a plurality of elastic probes in a row: A method of forming a plurality of elastic probes in a row is disclosed. Firstly, a substrate is provided, then, a shaping layer is formed on the substrate so as to offer two flat surfaces in parallel. A photoresist layer is formed on the substrate and on the shaping layer.... Agent: Troxell Law Office PLLC

20070069750 - Method for fabricating a plurality of elastic probes in a row: A method of forming a plurality of elastic probes in a row is disclosed. Firstly, a substrate is provided, then, a shaping layer is formed on the substrate so as to offer two flat surfaces in parallel. A photoresist layer is formed on the substrate and on the shaping layer.... Agent: Troxell Law Office PLLC

20070069751 - Curved spring structure with elongated section located under cantilevered section: A curved spring structure includes a base section extending parallel to the substrate surface, a curved cantilever section bent away from the substrate surface, and an elongated section extending from the base section along the substrate surface under the cantilevered section. The spring structure includes a spring finger formed from... Agent: Bever, Hoffman & Harms, LLP

20070069761 - Automated laser header testing: Systems for automated laser header testing are disclosed. A system can include a base portion, a rotary stage supported by the base portion, at least one testing site supported by the rotary stage, and a plurality of testing stations supported by the base portion and radially arranged about a center... Agent: Workman Nydegger (f/k/a Workman Nydegger & Seeley)

20070069763 - Electrical connecting apparatus: In an electrical connecting apparatus, a first guide is arranged in a plate-shaped lower base in which the contactors are arranged. The first guide has a first space for guiding a device under test so that its electrodes will contact the tips of contactors and for positioning the device under... Agent: Jeffrey J. King, Esq. Black Lowe & Graham PLLC

20070069752 - Electronic device test apparatus: An electronic device test apparatus for testing IC chips (IC) by pushing their input/output terminals (HB) against contact units of a test head, provided with an IC moving system (410) for picking up and moving an IC chip (IC) at the front surface where input/output terminals (HB) are led out,... Agent: Birch Stewart Kolasch & Birch

20070069753 - Gel package structural enhancement of compression system board connections: A MCM system board uses a stiffener arrangement to enhance mechanical, thermo and electrical properties by incorporating an LGA compression connector in a computer system. The present designs of large scale computing systems (LSCS) in IBM use a MCM that is attached to a system board and held together by... Agent: Lynn L. Augspurger IBM Corporation

20070069754 - Gel package structural enhancement of compression system board connections: A MCM system board uses a stiffener arrangement to enhance mechanical, thermo and electrical properties by incorporating an LGA compression connector in a computer system. The present designs of large scale computing systems (LSCS) in IBM use a MCM that is attached to a system board and held together by... Agent: Lynn L. Augspurger IBM Corporation

20070069762 - Input buffer with automatic switching point adjustment circuitry, and synchronous dram device including same: An input buffer is presented for buffering an input signal having a voltage magnitude which alternates between a first voltage level and a second voltage level, where the first and second voltage levels may vary over time. In one embodiment, the input buffer includes a first and second detector circuits,... Agent: Williams, Morgan & Amerson

20070069757 - Inspection method of contact failure of semiconductor device and semiconductor device to which inspection method is applied: A substrate inspection method includes forming, along a route extending from a peripheral portion to a central portion of an inspection area, a conducting path built up by combining a plurality of first conducting elements disposed in a first layer of a substrate, a plurality of second conducting elements disposed... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070069758 - Performance board, test apparatus, board for diagnosis, and diagnosis method: There is provided a test apparatus having a test head containing test modules for sending/receiving signals to/from a device-under-test, a device mounting section having a socket for mounting the device-under-test and a performance board placed on the test head to connect each terminal of the test module with each terminal... Agent: Osha Liang L.L.P.

20070069755 - Pin electronics driver: Circuitry for driving a pin of a device includes a first circuit path terminating in a first impedance, a second circuit path terminating in a second impedance, where the second impedance is less than the first impedance, and a selection circuit to control operation of the second circuit path. When... Agent: Fish & Richardson P.C.

20070069760 - System and method for characterizing silicon wafers: A method and system is provided for characterizing silicon wafers. The method and system provide for measuring a resistance between a pair of points on an epitaxial layer of a wafer's surface. The points may be substantially equidistant from the center of the wafer. The resistance measuring may be repeated... Agent: Kolisch Hartwell, P.C.

20070069759 - Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer: Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer are provided. One system includes a corona source configured to deposit the charge on the wafer and a sensor configured to measure one or more conditions within... Agent: Baker & Mckenzie LLP

20070069756 - Test fixture: A test fixture is adapted to shield a device under test (DUT) from time dependent electromagnetic radiation.... Agent: Agilent Technologies Inc.

20070063688 - Electric circuit tracer: A circuit tracer includes a transmitter that places one of first and second signals on an electrical circuit depending on whether the circuit is energized. A receiver detects the signals imposed on the circuit by the transmitter, with the signal strength indicating the proximity of the receiver to the circuit.... Agent: Cook, Alex, Mcfarron, Manzo, Cummings & Mehler Ltd

20070063689 - Current measuring device: The present invention provides a current measuring device including a probe body having an elongated portion extending outward to a hook-shaped end wherein the hook-shaped end useful for isolating a conductor under test, a U-shaped magnetic core positioned upside down within the probe body and forming the hook-shaped end of... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070063690 - High sensitivity magnetic built-in current sensor: A sensor for contactlessly detecting currents, has a sensor element having a magnetic tunnel junction (MTJ), and detection circuitry, the sensor element having a resistance which varies with the magnetic field, and the detection circuitry is arranged to detect a tunnel current flowing through the tunnel junction. The sensor element... Agent: Philips Intellectual Property & Standards

20070063691 - Temperature compensated and self-calibrated current sensor: A method is described to provide temperature compensation and reduction of drift due to aging for a current sensor based on a plurality of magnetic field sensors positioned around a current carrying conductor. The offset voltage signal generated by each magnetic field sensor is used to correct variations in the... Agent: Fieldmetries, Inc.

20070063692 - Local magnetic susceptometer unit: A local magnetic susceptibility unit is adapted to measure the AC magnetic susceptibility of a surface region of a sample. The unit comprises a sensing element and one or more balancing elements arranged in a circuit. When a sample is placed proximate to the sensing element the sample induces an... Agent: Buchanan, Ingersoll & Rooney PC

20070063694 - Magnetostrictive sensitive element: The invention relates to a sensor element and to a path sensor constructed therefrom. The optical waveguide accommodated inside a supporting body, for example, a tube has to be placed in a defined position with regard to the elements of a board. In order to obtain a design that is... Agent: Mark G. Kachigian Head, Johnson & Kachigian

20070063693 - Magnetic field sensor: The invention relates to a magnetic field sensor, particularly for measuring the rotational speed of a rotating gear component, comprising a Hall probe (3), at least one permanent magnet (4) and a housing (2), said Hall probe (3) being arranged in the influence area of the magnetic field of the... Agent: Siemens Schweiz Ag I-47, Intellectual Property

20070063695 - Method for measurement of very small local magnetic fields, in particular for measurement of local magnetic stray fields produced by magnetic beads, and an associated device for carrying out the method: In a method for measurement of very small local magnetic fields, in particular of local magnetic stray fields produced by magnetic beads, at least one magnetoresistive element is used. The element includes a hard-magnetic reference layer and a soft-magnetic sensor layer, whose magnetization can be rotated to a parallel position... Agent: Harness, Dickey & Pierce, P.L.C

20070063696 - Rotation angle detector and bearing assembly using the same: To provide a rotation angle detecting device capable of achieving a detection of the angle of rotation at a high speed and with high accuracy and a bearing assembly utilizing such rotation angle detecting device, the rotation angle detecting device includes a magnetic generator (4) arranged on a rotatable member... Agent: Staas & Halsey LLP

20070063697 - System and method for temperature independent measurement of standoff distance using an eddy current sensor: An embodiment of the invention generally relates to a temperature-independent method of determining an engine health parameter, namely stand-off distance, between an eddy current sensor and a conductive element. The method includes receiving a signal from the eddy current sensor and demodulating a waveform from the received signal. The method... Agent: Howrey LLP

20070063698 - Method and apparatus for measuring object thickness: A method and apparatus are provided for measuring the thickness of a test object. The apparatus includes an eddy current sensor having first and second sensor heads. The sensor heads are positioned to have a predetermined gap therebetween for passage by at least a portion of the test object through... Agent: (dc) Wilmerhale/applied Materials

20070063699 - Sensing apparatus having fluxgate and control method thereof: A sensing apparatus includes a fluxgate module which outputs an analog signal corresponding to terrestrial magnetism using a fluxgate having a magnetic substance core and a driving coil, and an analog-to-digital (A/D) converter which converts an analog signal output from the fluxgate module into a digital signal. The fluxgate module... Agent: Lee & Morse, P.C.

20070063701 - Method and apparatus for acquiring mr data with a segmented multi-shot radial fan beam encoding order: An MR imaging apparatus is presented and includes a plurality of gradient coils positioned about a bore of a magnet to impress a polarizing magnetic field. An RF transceiver system and an RF switch are controlled by a pulse module to transmit and receive RF signals to and from an... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20070063702 - Nmr characterization of thin films: A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an... Agent: Foley & Lardner LLP

20070063700 - Nmr spectroscopy using spin states with long lifetimes: A nuclear magnetic resonance method and apparatus are disclosed. A sample is provided where the nuclear spin Hamiltonian operator of the component molecules of the sample possess one or more symmetry operations. A quasi equilibrium nuclear spin ensemble state in a sample is created. The quasi equilibrium nuclear spin ensemble... Agent: Wong, Cabello, Lutsch, Rutherford & Brucculeri, L.L.P.

20070063704 - Method and apparatus for fast spin echo (fse) prescan phase correction: A method and apparatus for prescan phase correction analyzes the phase profile of the first echo sampled in a prescan and the phase profile corresponding to the lope echo of an impending FSE acquisition to determine appropriate phase correction settings of the FSE scan.... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20070063703 - Method, system, storage medium and software arrangement for radial prescription of long-axis slices in magnetic resonance imaging examinations: A method, system, and software arrangement for automatically prescribing long-axis magnetic resonance imaging (“MRI”) slices of a target are provided. An MRI image is captured along a short-axis slice of the target. Vectorial components, including slice selection, phase-encoding, and frequency encoding vectors, are extracted from the short-axis slice. Vectorial components... Agent: Dorsey & Whitney LLP Intellectual Property Department

20070063705 - Variable field-of-view gradient coil system for magnetic resonance imaging: The present invention relates to a gradient coil system for magnetic resonance imaging (MRI) systems and to a magnetic resonance imaging (MRI) system comprising such a gradient coil system. Magnetic resonance imaging systems comprise at least a main magnet system, a gradient coil system, a RF system and a signal... Agent: Philips Intellectual Property & Standards

20070063706 - Repair device for decorative light shunt: A repair device for fixing a malfunctioning shunt across a failed filament in a light bulb in a group of series-connected miniature decorative bulbs includes a high-voltage pulse generator producing one or more pulses of a magnitude greater than the standard AC power line voltage. A connector receives the pulses... Agent: Stephen G. Rudisill Jenkens & Gilchrist, A Professional Corporation

20070063707 - Object shape determination method and system therefor: A system employing processing means (12) and electrostatic sensing apparatus (20) is described, the system operating methods in which an unknown object shape is computed from repeated iteration (56) of electrostatic calculations (44,46) on a predetermined shaped object (42,70) and sensed electrostatic measurements (40). The predetermined object shape (70) is... Agent: Philips Electronics North America Corporation Intellectual Property & Standards

20070063708 - Rectifier open diode detection: An open diode detection circuit for use with an auto-transformer rectifier unit includes a plurality of first diodes each connecting one of a plurality of transformer nodes to a detector rail. A comparator compares the detector rail to a rectifier rail, which is also connected by a plurality of diodes... Agent: Carlson, Gaskey & Olds, P.C.

20070063709 - Systems and methods for triggering a partial discharge acquisition: A method for triggering a partial discharge acquisition from an energy generating device is described. The method includes generating a power source sensed signal by sensing electromagnetic energy output from the energy generating device, producing an present flux density trace from the power source sensed signal, and determining a lack... Agent: John S. Beulick (12729) C/o Armstrong Teasdale LLP

20070063710 - Method and an apparatus for measuring the input threshold level of device under test: A signal including at least one group of a group comprised of two slopes having different gradients and a known temporal position relationship is applied to a device under test, the time intervals between the specific transitions of the logic level produced in the output signal of the device under... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20070063711 - Testing loop impedance in an rccb electrical test circuit: A method and apparatus for testing the loop impedance in residual current circuit breaker (RCCB) protected circuits is provided. An alternating test current is applied across the phase earth connections of a supply and a plurality of voltage samples are then taken across the connections. The voltage samples are subsequently... Agent: Bromberg & Sunstein LLP

20070063712 - Blade tip clearance probe holder and a method for measuring blade tip clearance: A blade tip clearance probe holder including: a first housing in operable communication with a first feature of a casing for a rotary machine; a spring rod assembly in operable communication with the first housing; an electrical capacitance clearance meter in operable communication with the spring rod assembly; and a... Agent: Cantor Colburn, LLP

20070063713 - Dcvg-cips measuring apparatus for detecting the results of a pipe line: The present invention relates to a pipeline examination apparatus for Direct Current Voltage Gradient (DCVG) and Closed Interval Potential Survey (CIPS) methods. The pipeline examination apparatus of the present invention detects and analyzes at least one electrode signal while supplying an anticorrosive current to a buried pipeline by switching on... Agent: Fish & Richardson P.C.

20070063721 - Apparatus and method of testing singulated dies: An exemplary die carrier is disclosed. In some embodiments, the die carrier can hold a plurality of singulated dies while the dies are tested. The dies can be arranged on the carrier in a pattern that facilities testing the dies. The carrier can be configured to allow interchangeable interfaces to... Agent: N. Kenneth Burraston Kirton & Mcconkie

20070063718 - Contact assembly and lsi chip inspecting device using the same: A contact assembly and an LSI chip inspecting device using the same are disclosed. The contact assembly is mounted between an electronic device to be tested and a circuit inspecting device to electrically connect them. The contact assembly includes contacts, each of which includes vertical type probes and a ribbon-shaped... Agent: Haynes And Boone, LLP

20070063717 - Electromagnetic wave generation source searching method and current probe used therefor: A junction-current probe is provided which can measure a current flowing in a junction port adapted to connect a circuit board or an electronic apparatus to a chassis under the condition that the circuit board or electronic apparatus is packaged to the chassis. Structurally, the current probe has a circular... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070063714 - High bandwidth probe: A probe head provides an electrical signal to a receiving device. The probe head has a probe tip and a signal-ground transport element and the signal-ground transport element is configured to provide inherent spring properties.... Agent: Agilent Technologies Inc.

20070063715 - High bandwidth probe: A probe head provides an electrical signal to a receiving device. The probe head has a probe tip and a signal-ground transport element and the signal-ground transport element is configured to provide inherent spring properties.... Agent: Agilent Technologies, Inc. Legal Department, Dl429

20070063716 - Optically enhanced probe alignment: A novel probe card that comprises a set of fiducials and a method for using the same are disclosed. The set of fiducials comprises a first fiducial and a second fiducial fixed relative to the probe card substrate. Comparing the relative positions of the fiducials determines whether the probes are... Agent: Manuel F. De La Cerra

20070063719 - Probe card clamp mechanism and probe apparatus: A clamp mechanism includes an insertion ring and a lock ring. The insertion ring includes a cylindrical portion and a flange portion. At the cylindrical portion, first cam followers to be inserted into a groove of the lock ring are arranged at predetermined intervals along a circumferential direction thereof, and... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070063720 - Probe card transfer assist apparatus, and inspection equipment and method using same: A probe card transfer assist apparatus for assisting an operation of transferring a probe card used in an electrical inspection apparatus includes a holder for holding the probe card; a support for supporting the holder in a freely-rotate manner about a point; and an elevation unit for moving the support... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070063722 - Method and apparatus for testing bumped die: An apparatus for testing unpackaged semiconductor dice having raised ball contact locations is disclosed. The apparatus uses a temporary interconnect wafer that is adapted to establish an electrical connection with the raised ball contact locations on the die without damage to the ball contact locations. The interconnect is fabricated on... Agent: Trask Britt, P.C./ Micron Technology

20070063723 - Electrical circuit and method for testing electronic component: The electrical test circuit (5) comprises a first input (51) for receiving a test signal of an integrated circuit (4), a second input (52) for receiving a control signal and a third input (53) for receiving a normalized reference signal, particularly one that is formed to be synchronous with the... Agent: Dicke, Billig & Czaja, P.l.l.c.

20070063725 - Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object: At least one pair of electrode formed on a mounting surface of a stage is in contact with a conductive layer formed on a first surface of an inspection object, and an electrical path is formed between the both by using a fritting phenomenon.... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070063726 - Integrated systems testing: A method of making and testing a system on chip (SOC) comprises providing an integrated system test (IST) module in each one of a plurality of SOC components. At least one of the SOC components communicates with an external interface and at least one other of the SOC components. The... Agent: Harness, Dickey & Pierce P.L.C

20070063724 - Tandem handler system and method for reduced index time: A system for testing with an automated test equipment (ATE) includes a tester having at least one test resource, a tandem handler, and a mux relay that switchably connects the test resource, via parallel connections, to either one of dual sockets at each instant of testing. The handler has first... Agent: H. Dale Langley, Jr. The Law Office Of H. Dale Langley, Jr.

20070063727 - Apparatus and method for measuring tft pixel driving current: A method for measuring the pixel driving current, characterized in that it comprises a first step for measuring the offset current flowing to wiring when multiple pixels are all set to the non-lighted state; a second step for measuring the pixel driving current of a predetermined pixel from the difference... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20070057661 - Sampling apparatus and test apparatus: There is provided a sampling apparatus including a pulse generating circuit and a sampling circuit. The pulse generating circuit includes a step recovery diode and anode side and cathode side input terminals of the diode, and the sampling circuit includes a measured signal wire that inputs the measured signal, anode... Agent: Osha Liang L.L.P.

20070057662 - Temperature compensated and self-calibrated current sensor using reference magnetic field: A method is described to provide temperature compensation and self-calibration of a current sensor based on a plurality of magnetic field sensors positioned around a current carrying conductor. A reference magnetic field generated within the current sensor housing is detected by the magnetic field sensors and is used to correct... Agent: Fieldmetries, Inc.

20070057663 - Reduced power consumption in a communication device: A method for controlling power consumption in a communication device is provided. The method includes powering down a receiver of the communication device for a selected period of time and, when the selected period of time expires, powering up the receiver to check for incoming data.... Agent: Fogg And Associates, LLC

20070057664 - Power detector for mismatched load: A method for measuring the forward power output of an amplifier with improved accuracy with a mismatched load based on probing the amplitude of the AC voltage and current in the final amplifier stage. Amplitudes are combined resulting in a composite reading that is affected less by load mismatch. Variations... Agent: Agilent Technologies, Inc. Legal Department, Dl429

20070057665 - Sensor holder and method for the production thereof: The invention relates to a sensor holder for mounting a sensor component. In one aspect, the sensor holder comprises an elongate holding device, at the first axial end of which the sensor component is mounted and at the second axial end of which a junction cable can be led up,... Agent: Knobbe Martens Olson & Bear LLP

20070057666 - Defect inspection system and method for recording media: This invention provides a recording media defect inspection technique that makes possible high-speed and high-resolution defect inspection using an electron beam. A spindle motor rotates a recording media while an electron beam is being irradiated on a surface of a recording media, and detectors detect secondary electrons produced from the... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070057667 - Magnet device: A magnet device has main coils in a pair positioned facing each other to form a static magnetic field space in between and external magnetic flux shielding coils placed coaxially to the main coils. The external magnetic flux shielding coils have a first coil group having a small coefficient of... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20070057668 - Magneto-optic remote sensor for angular rotation, linear displacements, and evaluation of surface deformations: A system and method to detect angular rotation, linear displacement and/or surface deformations is presented. The method is based on the ability of a linear polarized light to interact with magnetic materials and to change its polarization angle due to Faraday effect. A basic structure of the system consists of... Agent: Reinhart Boerner Van Deuren P.C.

20070057669 - Exciting coil drive circuit of magnetic sensor: An exciting coil drive circuit of a magnetic sensor comprises a D/A converter that receives input of digital data for detecting a magnetic field; a first amplifier that outputs a drive signal P applied to one end of an exciting coil of the magnetic sensor based on the output signal... Agent: SocalIPLaw Group LLP

20070057670 - Signal detection circuit of magnetic sensor: A signal detection circuit of a magnetic sensor is disclosed which comprises a differential amplifier to which an output voltage of a detecting coil of the magnetic sensor is applied; a comparator to which the output of the differential amplifier is input, the comparator outputting a digital signal having one... Agent: SocalIPLaw Group LLP

20070057671 - Imaging and reconstruction of partial field of view in phase contrast mri: Phase contrast magnetic resonance images are produced using interleaved spiral k-space scanning with a bipolar phase contrast gradient. Spiral scanning is configured so that acquisition impulse response defines a central alias free portion in a partial field of view, and signal acquisition is arranged so that moving spins are contained... Agent: Klarquist Sparkman, LLP

20070057673 - Compensating for non-uniformity of excitation field in mri: A method and system are described for compensating for non-uniformity of excitation field B1+ in magnetic resonance imaging (MRI) of an object. The variation in the RF excitation field B1+ is measured over a region of interest (ROI) in the object, the B1+ field causing nuclear spins in the object... Agent: Mcdermott Will & Emery LLP

20070057672 - Multiple acquisition phase-sensitive ssfp for species separation in mri: MRI signals from two species such as fat and water are separated by repeatedly applying a steady state free precession (SSFP) sequence to an object with the phase of each RF excitation pulse in a sequence being increased by 2πn/N radians on each repetition, where acquisition number n ranges from... Agent: Beyer Weaver LLP

20070057674 - While-drilling apparatus for measuring streaming potentials and determining earth formation characteristics and other useful information: Logging-while-drilling apparatus and methodologies for measuring streaming potential in an earth formation are provided. The apparatus and methodologies can be utilized to find information relevant to the drilling operations. In particular, since the streaming potential measurement relates directly to fluid flow, the streaming potential measurements can be used to track... Agent: Schlumberger-doll Research Attn: Intellectual Property Law Department

20070057675 - Oil sensor mounting structure: Of a sensing part and a mounting part of an oil level sensor mounted to a sensor mounting opening at a bottom portion of an oil pan of an engine, an undersurface of the mounting part exposed to the outside of the oil pan is located above the lowest part... Agent: Arent Fox PLLC

20070057676 - Pulse shunt that allows for the use of light emitting diodes in vehicles that have a pulsed lamp check function in their external lighting system and/or trailers connected thereto: The present invention relates to a pulse shunt that allows for the use of Light Emitting Diodes (LEDs) in vehicles that have a pulsed lamp check function in their external lighting system and/or trailers connected thereto. The present invention shunts the short lamp check voltage pulses, which stops the LEDs,... Agent: Lee Alan Bourgeois

20070057678 - Arc fault circuit interrupter system: In order to determine whether arcing is present in an electrical circuit, a sensor signal corresponding to current in said electrical circuit is processed. The sensor signal is filtered to determine the presence of noise in a predetermined frequency range and produce a corresponding filtered signal. The corresponding filtered signal... Agent: Stephen G. Rudisill Jenkens & Gilchrist,

20070057677 - Measuring device, and method for locating a partial discharge: A device and a method for locating partial discharges in a conductor rod of a dynamo-electric machine are provided, the conductor rod being provided with an exterior electrical insulation. A first and a second sensor are embodied so as to detect a signal which is generated by the partial discharge... Agent: Siemens Corporation Intellectual Property Department

20070057679 - Calibration method and system: A system and method of calibration develops a function from which is generated a monotonic time response; a gating period is defined from the monotonic time response and any error in the frequency of a reference signal is determined during the gating period; from that error an error signal is... Agent: Iandiorio & Teska

20070057680 - Impedance measurement system with incorporated internal measurement drift compensation networks: The present technology provides an Impedance Measurement System (ZMS) for measuring the complex impedance of each well of a single well or multiwell microtiter plate utilizing a novel combination of parallel impedance measurement channels, multiplexing, and reference impedance networks, allowing internal correction of impedance measurement drift, maximized measurement accuracy, and... Agent: Kelvan P. Howard Mds Sciex (us) A Division Of

20070057681 - Clamping top plate using magnetic force: A test fixture, for testing an electronic device, includes: a test platform including electrically conductive contacts protruding from a device receiving surface in the test platform; a positioning guide disposed on the device receiving surface; a device retention cover; where the test platform includes a platform magnetic member and the... Agent: Ogilvy Renault LLP

20070057684 - Massively parallel interface for electronic circuit: Several embodiments of massively parallel interface structures are disclosed, which may be used in a wide variety of permanent or temporary applications, such as for interconnecting integrated circuits (ICs) to test and burn-in equipment, for interconnecting modules within electronic devices, for interconnecting computers and other peripheral devices within a network,... Agent: Glenn Patent Group

20070057683 - Method for controlling parallelism between probe card and mounting table, storage medium storing inspection program, and inspection apparatus: In a method for controlling a parallelism between a probe card having a number of probe pins and a mounting table, first, among the probe pins, one or more probe pins corresponding to each of plural distinct locations on an X-Y coordinate system whose origin lies at a probe center... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070057682 - Signal probe and probe assembly: A probe includes a probe head adapted to connect to and disconnect from a target. An apparatus includes a plurality of connection assemblies over a target.... Agent: Agilent Technologies Inc.

20070057685 - Lateral interposer contact design and probe card assembly: An interposer has an interposer substrate with an upper surface and a lower surface and at least one resilient contact element having an upper portion and a lower portion. The upper portion extends in a substantially vertical fashion above the upper surface of the interposer substrate, and the lower portion... Agent: Pillsbury Winthrop Shaw Pittman LLP

20070057686 - Burn-in system: A burn-in system enabling the temperatures of a large number of electronic devices differing in amount of self generated heat to be simultaneously reliably adjusted to a predetermined temperature, that is, a burn-in system bringing heater blocks having heaters, cooling blocks formed with channels able to carry a coolant, and... Agent: Birch Stewart Kolasch & Birch

20070057687 - High current electron beam inspection: A method and apparatus for wafer inspection. The apparatus is capable of testing a sample having a first layer that is at least partly conductive and a second, dielectric layer formed over the first layer, following production of contact openings in the second layer, the apparatus includes: (i) an electron... Agent: Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP

20070057688 - Compensation for electric drifts of mos transistors: An integrated circuit comprising at least one MOS-type transistor, further comprising a system for detecting the variations of the electrical quantities of the at least one transistor, and a biasing device modifying the bias voltage of the bulk of the at least one transistor according to the variations measured by... Agent: Seed Intellectual Property Law Group PLLC

20070057689 - Mother substrate, substrate for display panel and method of manufacturing display panel: In a mother substrate for a lower substrate, a substrate for a display panel and a method of manufacturing a display panel, the substrate for the display panel includes a lower substrate and an upper substrate facing the lower substrate. The lower substrate includes an inspection line that receives a... Agent: Cantor Colburn, LLP

20070052406 - Broadcast receiver having integrated spectrum analysis: A receiver for receiving a broadcast channel comprising a spectrum analyzer physically integrated into the receiver and operative to receive an intermediate frequency signal and process the spectral contents of the receive signal.... Agent: Lerner, David, Littenberg, Krumholz & Mentlik

20070052408 - Current measuring device: A current measuring device for detecting current flowing in a current path includes a magnetic sensor for detecting a magnetic field and a magnetic sensor for detecting earth magnetism, the magnetic field detecting magnetic sensor and the earth magnetism detecting magnetic sensor being disposed along the direction of magnetic flux... Agent: Posz Law Group, Plc

20070052407 - Device and method for measuring a current flowing in an electrical conductor: A device is provided for measuring a current flowing in an electrical conductor with a magnetic circuit for coupling to the electrical conductor. The magnetic circuit has an air gap, and a magnetic field sensitive component is disposed in the air gap. The magnetic field sensitive component measures the magnetic... Agent: Wolf Greenfield & Sacks, Pc

20070052409 - Syringe adapter: A syringe adapter assembly 10 for permitting a front loadable power injector 100 having a pressure jacket 106 with an open front end to attach syringes 70 that do not require pressure jackets for their intended purpose. The syringe adapter assembly comprises a main adapter body 12 having a central... Agent: Hahn Loeser & Parks, LLP

20070052410 - Mems based current sensor using magnetic-to-mechanical conversion and reference components: A micro-electromechanical system (MEMS) current sensor is described as including a first conductor, a magnetic field shaping component for shaping a magnetic field produced by a current in the first conductor, and a MEMS-based magnetic field sensing component including a magneto-MEMS component for sensing the shaped magnetic field and, in... Agent: General Electric Company Global Research

20070052411 - Screening method and apparatus: A method and an apparatus are disclosed, to screen patients or other areas for ferromagnetic objects, particularly for use intra-operatively in an operating room. The device comprises at least one magnetic field source, at least one magnetic gradiometer, and the associated electronics. The field source and the gradiometer are supported... Agent: Gerald W. Spinks

20070052412 - Magnetic-field-measuring device: A device (16) used to measure at least one component of a magnetic field, includes a magnetoresistive sensor (102) and a measuring chain (28). The input of the measuring chain is connected to the magnetoresistive sensor (102), while the output thereof is intended to supply information that is representative of... Agent: Young & Thompson

20070052413 - Device for testing a test specimen for surface faults by magnetization means and by means of induction process as measurement sensors: A device for testing a test specimen for surface faults is equipped for delivering a magnetic flux into the specimen and has induction probes measurement sensors. At least two yoke legs have opposed gap-forming ends with oppositely poled exciter coils between which the test specimen can be guided. Outside ends... Agent: Roberts, Mlotkowski & Hobbes

20070052414 - Monitoring platform: There is a monitoring platform for providing a sensory feed to a musician. There is a base, an electronics module, a reflective coating, an electrical outlet, and a tactile transducer. The base includes a ramping member, an upper surface member, a storage member, first and second clamshell members hingedly coupled,... Agent: Advantia Law Group

20070052416 - Method and apparatus for detection improvement of a weakly-sensitive atomic nucleus type in mr spectroscopy: In a method and apparatus for detection improvement of a weakly-sensitive atomic nucleus type in MR spectroscopy data acquisition using polarization transfer for a weakly-sensitive atomic nucleus type (A) with involvement of an MR-active, strongly-sensitive atomic nucleus type (X), all RF pulses are radiated sequentially, i.e. with defined time interval... Agent: Schiff Hardin, LLP Patent Department

20070052415 - Rf pulse applying method and mri apparatus: The effects of prior pulses are to be enhanced. A pulse string which monotonically decreases the flip angle is inserted between the prior pulse in one round and the imaging pulse in the previous round, and a pulse string which monotonically increases the flip angle is inserted between the prior... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070052417 - Method and apparatus for diffusion magnetic resonance imaging with the effects of eddy currents compensated: A method and a system for acquiring diffusion magnetic resonance images with compensation of the effects of eddy currents induced by the diffusion weighting (DW) gradient pulses. Prescan data are first acquired using the same DW sequence to be used for imaging. The prescan data are used to obtain eddy... Agent: Nixon & Vanderhye, Pc

20070052418 - Magnetic gradient winding system comprising circular solenoid coils: In order to produce field strength gradients (x,y) for a NMR machine, the curve-shaped gradients are substituted by coils arraigned in tubes. Said tubes are distributed on the annular circumference (6) of the examination space of the tunnel NMR machine. Said invention makes it possible to produce at request field... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP

20070052419 - Mri system with variable field of view magnet: A magnetic resonance imaging apparatus includes a first magnetic field coil (30) and a second magnetic field coil (32). A power supply (40, 42) energizes the first magnetic field coil (30) and selectively energizes the second magnetic field coil (32) to selectively generate a first magnetic field defining a first... Agent: Philips Intellectual Property & Standards

20070052420 - Matrix shim system with grouped coils: with N: the total number of current supplies of the matrix shim system, and R: smallest inside radius of any of the annular coils of the matrix shim system. An individual, adjustable electrical current supply is provided for each group Gi of coils. The inventive matrix shim system is both... Agent: Kohler Schmid Moebus

20070052421 - Magnet for nmr analyzer and nmr analyzer using the same: A magnet for an NMR analyzer includes a superconductor coil for generating a magnetic field in a magnetic space surrounded by the superconductor coil. The superconductor coil has a shim coil group disposed at least one of inside and outside of the superconducting coil. The superconducting coil provides a first... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070052422 - One time operating state detecting method and apparatus: A method and apparatus for detecting a change in electrical property between contacts. A one-time operating state detection device includes a member coupling a pair of contacts and a detector for detecting a change in the coupling between the pair of contacts when the member is moved.... Agent: Dla Piper Us LLP

20070052423 - Method and an apparatus for estimating saturated polarization and a method for estimating residual discharge capacity: [MEANS FOR SOLVING PROBLEM] The steps are: measuring a discharge current and a terminal voltage at high rate discharge; finding a quadratic approximation formula expressing the polarization voltage drop corresponding to the increasing discharge current at high rate discharge according to the measured discharge current and the terminal voltage; finding... Agent: Armstrong, Kratz, Quintos, Hanson & Brooks, LLP

20070052424 - Anomaly detection method of battery pack, battery pack and electronic apparatus: A structure of detecting an anomaly of the battery pack (2) including a plurality of battery cells (41a, 41b, 42a, 42b, 43a, 43b) connected in series or in parallel, which detects whether or not an impedance of at least one of battery cells deviates from a stipulated range. Also, a... Agent: Staas & Halsey LLP

20070052425 - Electrostatic discharge event and transient signal detection and measurement device and method: An electrostatic discharge (ESD) event and transient signal detection and measurement device and method are described. The device and method are able to distinguish between an ESD event and other non-ESD events.... Agent: Dla Piper Rudnick Gray Cary Us, LLP

20070052426 - On-line transformer condition monitoring: This invention is used to determine the condition of power transformers using real-time on-line high speed measurements. Specifically, a failure prediction method is described. This provides alerts prior to a catastrophic event that could cause major damage to the transformer and resulting business losses. Real time absolute phase angle and... Agent: Lumen Intellectual Property Services, Inc.

20070052427 - Test apparatus and testing method: There is provided a test apparatus for testing a device-under-test, having a reference clock source for generating reference clock for controlling operations of the device-under-test, a clock regenerating circuit for generating, based on a phase adjusting signal to be inputted, regenerated clock whose frequency is almost equal with the reference... Agent: Osha Liang L.l.p.

20070052428 - Object sensing: An electric field object sensing system (1) and method. The system (1) comprises a transmitter electrode (2), a receiver electrode (4), a switching circuit (32) coupled to the receiver electrode, an alternating voltage source (3) coupled to the transmitter electrode (2) and the switching circuit (32), and an output connection... Agent: Philips Electronics North America Corporation Intellectual Property & Standards

20070052429 - Sensor system and method for its manufacture: A sensor system includes a thin-film sensor provided with at least one contact area on the surface thereof, and a printed circuit board provided with at least one contact pad on the surface thereof. The thin-film sensor is arranged in relation to the surface of the printed circuit board such... Agent: Kenyon & Kenyon LLP

20070052430 - Active sensor circuit with one or more t-network pairs: A sensor circuit is provided that comprises at least one pair of interconnected T-networks. Each pair comprises a first T-network including a first impedance serially connected to a second impedance at a first junction and a first variable resistance sensor element connected to the first junction. Each pair also comprises... Agent: Hunton & Williams LLP Intellectual Property Department

20070052431 - Device for measuring impedance of electronic component: A device measures an impedance of an electronic component with using an impedance measuring apparatus. The impedance measuring device includes first and second probes to be connected to measuring terminals of the impedance measuring apparatus, an anisotropic conductive sheet, and a pressing member for pressing the electronic component toward the... Agent: Ratnerprestia

20070052433 - Coaxial probe, method for production thereof, and device for measuring in the near electromagnetic field on systems at a submicrometric distance: A coaxial probe for near-field measurements including a connection wire of which a first end is connected to a connector, the connection wire covered with a dielectric substrate and a shield to form a waveguide. The probe has a diameter D equal to at least 300 micrometers.... Agent: Seed Intellectual Property Law Group Pllc

20070052432 - Probe card: The invention aims to provide a vertical type probe card in which a probe can scrape an oxide film on a surface of an electrode of the measurement object, thereby ensuring stable contact with the electrode of the measurement object. A probe card A includes: first and second probes 100a... Agent: Armstrong, Kratz, Quintos, Hanson & Brooks, LLP

20070052434 - Cooling apparatus and testing machine using the same: A cooling apparatus includes a cooling device, a baseplate and at least one shock absorber. The cooling device is used for absorbing and dissipating heat. The shock absorber resiliently supports the cooling device on the baseplate. A testing machine, using the cooling apparatus, for testing an electronic product is also... Agent: North America Intellectual Property Corporation

20070052435 - Broadband wireless ad-hoc modem and network testbed: A testbed is provided for testing broadband wireless test units. The testbed includes an enclosure and a plurality of I/O connectors accessible externally of the enclosure. Each of the I/O connectors is for being electrically coupled to a respective test unit. A series of connections within the enclosure serve to... Agent: Mark D. Saralino (general) Renner, Otto, Boisselle & Sklar, LLP

20070052436 - Device design-for-test and burn-in-board with minimal external components and increased testing capacity: The invention includes a design for device design-for-test and a burn-in-board that reduce the number of external components per device on the board. Inputs to the I/Os of a device from input means are inverted between pairs of output pins. A single resister is coupled between an output that is... Agent: Texas Instruments Incorporated

20070052438 - Methods and apparatus for testing electronic circuits: Methods and apparatus are provided for testing to determine the existence of defects and faults in circuits, devices, and systems such as digital integrated circuits, SRAM memory, mixed signal circuits, and the like. In particular, methods and apparatus are provided for detecting faults in circuits, devices, and systems using input... Agent: Kilpatrick Stockton LLP - 46872 J. Steven Gardner

20070052437 - Packaged circuit module for improved installation and operation: An EMI suppressive device. In one embodiment, the EMI suppressive device is electrically connected to an electric motor having a substantially non-conductive shroud and a conductive drive shaft. The EMI suppressive device includes a packaged circuit that suppresses electromagnetic interference and contains one or more signal terminals that connect to... Agent: Michael Best & Friedrich LLP

20070052440 - Directional power detection by quadrature sampling: Power measurement and control in transmission systems are affected by changes in load conditions. A method and system are provided for detecting and controlling power levels independent of such load conditions.... Agent: Thelen Reid Brown Raysman & Steiner LLP

20070052439 - System and method for checking decoupling of power supply in printed wiring board: A checking unit includes a power net extracting means for extracting a power net with power attribution, which is segmented by a power-decoupling element, with reference to circuit design data of the printed wiring board; a parts number extracting means for extracting a parts number of an integrated circuit which... Agent: Wenderoth, Lind & Ponack L.l.p.

20070046277 - Characteristic evaluating system and characteristic evaluating method: The characteristic evaluating system of the present invention includes: a cable-driving transmitter transmitting a signal to one end of a cable to be measured; a load connected to the other end of the cable; a probe detecting a common mode current of the cable; a receiver receiving a signal detected... Agent: Antonelli, Terry, Stout & Kraus, LLP

20070046278 - System and method for improving time domain processed sensor signals: Noise discrimination in signals from a plurality of sensors is conducted by enhancing the phase difference in the signals such that off-axis pick-up is suppressed while on-axis pick-up is enhanced. Alternatively, attenuation/expansion are applied to the signals in a phase difference dependent manner, consistent with suppression of off-axis pick-up and... Agent: Thelen Reid & Priest, LLP

20070046279 - Optical measurement unit for a measurement device and a handheld photoelectric measurement device: A handheld photoelectric measurement device includes a housing (G) which at its underside is provided with a measurement window (F) through which the photoelectric measurement of the surface of the measurement object is carried out. An illumination arrangement is positioned in the housing for impinging the measurement object through the... Agent: Mccarter & English, LLP Attn: Basam E. Nabulsi

20070046280 - Auxiliary element for fixing a current sensor to an electrical conductor: An auxiliary element includes an end plate having an inner face which is intended to be applied against a large surface of a sensor and an outer face which bears two spaced-apart mounting lugs on a first edge thereof, the lugs extending outwards perpendicularly to the outer face. A first... Agent: Young & Thompson

20070046281 - Power metering using current-indicative signal: A power meter receives an output-voltage and a current-indicative signal generated by at least one power supply of an electronic system. The output voltage powers at least one electronic component of the electronic system. The current-indicative signal indicates a percentage of a maximum output current capacity at which the power... Agent: Hewlett Packard Company

20070046284 - Integrated process condition sensing wafer and data analysis system: A process condition measuring device and a handling system may be highly integrated with a production environment where the dimensions of the process condition measuring device are close to those of a production substrate and the handling system is similar to a substrate carrier used for production substrates. Process conditions... Agent: Parsons Hsue & De Runtz LLP

20070046282 - Method and apparatus for semi-automatic generation of test grid environments in grid computing: Generating a description of a test grid environment for use in a grid computing environment. A database containing a number of test snapshots is generated. Each test snapshot reflects a previously used grid test environment, and each test snapshot includes a grid configuration used to implement a particular test scenario... Agent: Ibm Corp (ya) C/o Yee & Associates PC

20070046283 - Solder material test apparatus, and method of controlling the same: A solder material test apparatus includes a control unit and a storage unit which stores master data in advance in which a printing process time when a printing process is performed by using a test-sample solder material is associated with deterioration degree data of the test-sample solder material at the... Agent: Foley And Lardner LLP Suite 500

20070046285 - Sample observation method and observation device: A sample observation method and sample observation device of the present invention are for observing variation in surface potential of a sample due to variation in the Hall effect based on variation in an applied current or applied magnetic field to the sample, and allow the variation in the Hall... Agent: Kubovcik & Kubovcik

20070046286 - Magnetic head tester and method of manufacturing magnetic disk drive: Embodiments of the invention provide an inexpensive magnetic head tester employing component parts of a production HDD and capable of exercising functions very close to those of a production HDD. In one embodiment, a magnetic head tester employs the VCM actuator and the control circuit of a production HDD and... Agent: Townsend And Townsend And Crew LLP

20070046287 - Method and apparatus for detecting spatially varying and time-dependent magnetic fields: Certain inventive aspects provide local field imaging with high spatial, time and field resolution by using an array of Hall effect sensors that can be individually read out. The design combines semiconductor Hall sensors and switches that isolate the addressed Hall sensor from the rest of the array. The compact... Agent: Knobbe Martens Olson & Bear LLP

20070046288 - Hybrid-technology metal detector: A hybrid-technology metal detector, using pulse-induction and sine-wave excitation of the transmitter coil alternately, in rapid succession. The energy stored in the transmitter coil, in the pulsed mode, is used to shock-excite a high-Q circuit formed by the coil and a parallel capacitor into oscillations in the sine-wave mode. The... Agent: Allan Westersten

20070046289 - Methods, systems, and computer program products for determining a property of construction material: Methods, systems, and computer program products for determining a property of construction material. According to one aspect, a material property gauge operable to determine a property of construction material is disclosed. The gauge may include an electromagnetic sensor operable to measure a response of construction material to an electromagnetic field.... Agent: Jenkins, Wilson, Taylor & Hunt, P. A.

20070046290 - High resolution resistivity earth imager: Phase-sensitive measurements are made by a resistivity imaging tool in a borehole having non-conductive mud in a conductive earth formation at a plurality of frequencies. From the phase sensitive measurements, the formation resistivity can be determined with higher sensitivity than is possible with the single frequency measurements. Tool standoff can... Agent: Madan, Mossman & Sriram, P.C.

20070046291 - Method and apparatus for borehole wall resistivity imaging in the presence of conductive mud and rugose borehole: A resistivity imaging tool is used in a borehole having a conductive fluid. Second differences between axially spaced apart electrodes are used in the imaging. A calibration compensates for the effects of borehole rugosity.... Agent: Madan, Mossman & Sriram, P.C.

20070046292 - System and method for estimating a state vector associated with a battery: A system and a method for estimating a state vector associated with a battery are provided. The method includes determining a time interval that the battery has been electrically decoupled from a load circuit. The time interval starts at a first time. The method further includes obtaining a first state... Agent: Cantor Colburn, LLP

20070046293 - Connector, connector testing apparatus and method: A female connector (F) has a housing (10) with a front end and cavities (11) extend to the front end. Terminal fittings (40) are mounted in the cavities (11). A front wall (50) is mounted on the front end of the housing (10) and is formed with tab insertion holes... Agent: Casella & Hespos

20070046294 - Method and apparatus to select a parameter/mode based on a time measurement: Techniques are disclosed to select functional parameters and/or operating modes of a circuit based on a time measurement are disclosed. One example integrated circuit includes a threshold detection and timing circuit that is coupled to measure a signal during an initialization period of the integrated circuit from a multifunction capacitor... Agent: Blakely Sokoloff Taylor & Zafman

20070046296 - Partial discharge sensor: A RF current transformer sensor includes a first sensor portion and a second sensor portion. The first and second sensor portions are configured to define a fixed opening for receiving a test object. The RF current transformer sensor is capable of detecting current pulses between the first sensor portion and... Agent: Kinney & Lange, P.A.

20070046295 - System and method for performing online partial discharge testing: A partial discharge sensing system and method for conducting testing inside an enclosure includes a partial discharge sensor, an access port, and a signal cable. The partial discharge sensor is permanently installed at a test location inside the enclosure. The access port is configured so that an analyzer can be... Agent: Kinney & Lange, P.A.

20070046297 - Measurement of point contact andreev-reflection characteristics of half-metallic thin films: An apparatus for measuring spin polarization via Point Contact Andreev Reflection (PCAR) at a magnet-superconductor junction, with variable magnetic fields and temperature control. A cryostat probe investigates superconducting energy gap and Andreev reflection in superconductor-half metal junctions, in a wide range of magnetic fields and temperature from 2K-300K. The cryostat... Agent: Smith Hopen, Pa

20070046298 - System and method for microwave non-destructive inspection: A system and method for inspecting a composite structure, such as to assess thermal degradation or resin curing, are provided in which the dielectric constant of the composite structure is determined using a microwave inverse scattering technique. The dielectric constant of the composite structure may be compared to the dielectric... Agent: Alston & Bird LLP

20070046299 - Methods and systems for detecting a capacitance using sigma-delta measurement techniques: Methods, systems and devices are described for detecting a measurable capacitance using sigma-delta measurement techniques. According to various embodiments, a voltage is applied to the measurable capacitance using a first switch. The measurable capacitance is allowed to share charge with a passive network. If the charge on the passive network... Agent: Ingrassia Fisher & Lorenz, P.C.

20070046300 - Sensor-emulator evaluation module and method: A bridge sensor emulator includes a first emulation circuit programmable to emulate an output signal of the bridge circuit under 11 conditions each including a different combination of applied stimulus and temperature. A second emulation circuit is programmable to emulate the temperature-sensing device for 3 temperatures. An excitation signal is... Agent: Texas Instruments Incorporated

20070046301 - System and method for modulation mapping: An apparatus for providing modulation mapping is disclosed. The apparatus includes a laser source, a motion mechanism providing relative motion between the laser beam and the DUT, signal collection mechanism, which include a photodetector and appropriate electronics for collecting modulated laser light reflected from the DUT, and a display mechanism... Agent: Sughrue Mion, PLLC

20070046302 - Apparatus for testing electric cables: In one preferred embodiment, an apparatus for testing a cable includes an interface for connecting to a connector of the cable, many resistors, a socket, and a meter for testing resistance of the resistors. The interface has many pins, the resistors respectively connected to the pins in series, and the... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070046304 - Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies: Several embodiments of integrated circuit probe card assemblies are disclosed, which extend the mechanical compliance of both MEMS and thin-film fabricated probes, such that these types of spring probe structures can be used to test one or more integrated circuits on a semiconductor wafer. Several embodiments of probe card assemblies,... Agent: Glenn Patent Group

20070046303 - Probe card, apparatus and method for inspecting an object: A probe card, an apparatus and a method of inspecting an object. In the example method, a first inspection current may be divided into a plurality of first divided inspection currents. Each of