Electricity: measuring and testing inventions 02/07

20070040544 - High-voltage measuring device: The present invention provides a high-voltage measuring device capable of providing sufficient electric isolation between resistors and between resistors and a voltage measurement circuit without necessity of enlarging a size of a substrate for carry thereon the circuit. A high-voltage measuring device mounted on a substrate, comprising a high-voltage input... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20070040545 - Distance detection system: There proposed are a distance detection system that can enhance with a simple configuration the accuracy of distance detection, an electric-field forming apparatus, and an electric-field forming method. A quasi-electrostatic field is formed in such a way that a predetermined intensity is obtained at the respective distances corresponding to a... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070040546 - Device for comparing an input signal with a set value and corresponding electronic circuit: This disclosure relates to a comparison device that receives an analogue input signal and a set value, and outputs a digital output signal. The device comprises a one-threshold comparator receiving the input signal and the set value, and the comparator generates a resultant signal that depends on the result of... Agent: Westman Champlin & Kelly, P.A.

20070040547 - Mems based current sensor using magnetic-to-mechanical conversion and reference components: A micro-electromechanical system (MEMS) current sensor is described as including a first conductor, a magnetic field shaping component for shaping a magnetic field produced by a current in the first conductor, and a MEMS-based magnetic field sensing component including a magneto-MEMS component for sensing the shaped magnetic field and, in... Agent: General Electric Company Global Research

20070040548 - Active matrix panel inspection device, inspection method, and active matrix oled panel manufacturing method: An inspection method includes an array process of forming a TFT array on a substrate to fabricate an active matrix panel, an inspection process of carrying out performance inspection of the fabricated active matrix panel, and a cell process of mounting an OLED on the active matrix panel judged as... Agent: Louis Paul Herzberg

20070040549 - Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object: An inspection method including measuring a height of a load cell of a load detecting mechanism using a laser length measuring mechanism, obtaining a first rise amount of the load detecting mechanism from a measuring position of the load detecting mechanism up to a contact starting position, measuring a height... Agent: Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070040550 - Magnetic detector arrangement and method for obtaining a symmetric magnetic field: A magnetic detector arrangement includes two equally polarised magnets positioned next to each other with the polarisation in the same direction, and a magnetic detector element, wherein the magnets are arranged at a predefined distance apart such that the magnetic field from the magnets will superimpose. A magnetic detector arrangement... Agent: White, Redway & Brown LLP

20070040551 - Magnetic anomaly detector and method using the microwave giant magnetoimpedence effect: A high sensitivity magnetic anomaly detector for geomagnetic exploration comprises a shorted coaxial transmission line having as central conductor an amorphous magnetic wire. A static magnetic field is applied along the transmission line. A transverse electromagnetic wave also propagates along the transmission line and excites a ferromagnetic resonance of the... Agent: Baker & Daniels LLP 111 E. Wayne Street

20070040552 - Spin stand: A spin stand for testing a head or disk, comprising a base and a stage connected to the base through a rolling bearing. In the spin stand, the stage can be rapidly and stably fixed to the base. A fixing device is sucked to be connected to the base and... Agent: Ohlandt, Greeley, Ruggiero & Perle, LLP

20070040553 - Spectral-scanning magnetic resonance imaging: Spectral scanning magnetic resonance imaging methods and systems. In preferred methods and systems of the invention, to measure the resonance spectrum of the target object, a plurality of excitation signals in different frequencies and/or waveform shapes are introduced simultaneously to the imaging volume through one or more excitation coils, and... Agent: Greer, Burns & Crain

20070040554 - Magnetic shielding apparatus and magnetic field measuring apparatus using same: A magnetic shielding apparatus having a high shielding effect. With the magnetic shielding apparatus having an opening (for example, a cylindrical magnetic shielding apparatus provided with a door), the door covering the opening is electrically and/or magnetically connected to a main body by means of electrically and/or magnetically connecting members.... Agent: Stanley P. Fisher Reed Smith LLP

20070040555 - Surface coil arrangement for magnetic resonance tomographs: A surface coil arrangement of a gradient system for an MR tomography apparatus has coil elements mounted on a first antenna, the antenna being extendable by at least one further antenna that likewise includes an arrangement of at least one coil element, and which is detachably or movably fastened to... Agent: Schiff Hardin, LLP Patent Department

20070040556 - Q-factor switching method and apparatus for detecting nuclear quadrupole and nuclear magnetic resonance signals: s

20070040557 - Device for monitoring of oil-water interface: A device for monitoring the position of an oil/water contact (OWC, 22) between an oil-continuous fluid (2o) overlying a water-continuous fluid (2w) inside a casing pipe (7), comprising the following features: a transmitter (5) for a generating an electro-magnetic signal (ST), said transmitter (5) provided with electrical energy (GT) from... Agent: Wenderoth, Lind & Ponack, L.L.P.

20070040558 - Method and apparatus for digital detection of electronic markers using frequency adaptation: An electronic marker locator with a digital architecture for providing accurate and consistent estimation of the signal strength is presented. The marker locator includes a Digital Phase-Locked Loop (DPLL) structure. The electronic marker locator transmits known and adjustable frequency bursts corresponding to the markers to be located while synchronously capturing... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070040559 - Filtering and measuring apparatus for oils: Disclosed is a method for measuring at least one state characteristic of oil or fat in a device that uses oil or fat and is provided with a filtering apparatus (1; 101) comprising a filter housing (2) and at least one filter element (7) which is inserted thereinto. According to... Agent: Fish & Richardson P.C.

20070040560 - Search coil mount for facilitating inspection of a generator rotor in situ: A mount is for installing a probe, such as for example, a search coil, in a variety of locations and orientations within an electrical generator, without requiring the rotor of the generator to be removed. The mount includes a block having a longitudinal hole and a plurality of transverse slots... Agent: Siemens Corporation Intellectual Property Department

20070040561 - Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics: Two ends of a transmission line whose electrical characteristics per unit length are known are connected to associated measurement ports of a network analyzer 2. A short standard is shunt-connected to at least three points in the longitudinal direction of the transmission line, and electrical characteristics are measured in a... Agent: Ostrolenk Faber Gerb & Soffen

20070040562 - Self-adaptive output buffer based on charge sharing: A self-adaptive output buffer for an output terminal of an electronic circuit suitable to be connected to a load is proposed. The self-adaptive output buffer includes means for sensing an indication of the capacitance of the load and means for driving the load according to the sensing, wherein the means... Agent: Graybeal Jackson Haley LLP

20070040563 - Method for burning chips: A method for burning a BIOS chip (108) and a network card chip (107) that are attached on a motherboard (106), includes the steps of: storing a plurality of MAC addresses in a burning device (102); loading a BIOS file and a network card file into the burning device; sending... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070040564 - Circuit card synchronization within a standardized test instrumentation chassis: Precise timing control within a standardized chassis such as PXI is obtained by providing several control signals over PXI_LOCAL. A Least Common Multiple (LCM) signal enables all clocks to have coincident clock edges occurring at every LCM edge. A start sequence allows all PXI expansion cards in the test system... Agent: Morrison & Foerster, LLP

20070040565 - Compliant probes and test methodology for fine pitch wafer level devices and interconnects: A compliant interposer sheet probe card and a method for testing a wafer or a wafer level package using the probe card are described. Test electronic circuits are connected on one side of a multi-layer substrate. A top side of a compliant interposer sheet is connected to an opposite side... Agent: Stephen B. Ackerman

20070040567 - Method for test strip manufacturing and test card analysis: A method of manufacturing a plurality of test strips is described where a web is formed containing conductive and base layers. A plurality of test strips are formed on the web by electrically isolating a first group of conductive components. Subsequently, a second group of conductive components are electrically isolated... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20070040570 - Method for testing semiconductor devices and an apparatus therefor: A method for testing integrated circuit devices and loading such devices into a test board for further testing and an apparatus therefor is disclosed. The method allows for selection between two modes of operation. In a first mode, the integrated circuit devices are subjected to an electrical test before being... Agent: Lerner, David, Littenberg, Krumholz & Mentlik

20070040569 - Method for testing semiconductor devices and an apparatus therefor: A method for testing integrated circuit devices and loading such devices into a test board for further testing and an apparatus therefor is disclosed. The method allows for selection between two modes of operation. In a first mode, the integrated circuit devices are subjected to an electrical test before being... Agent: Lerner, David, Littenberg, Krumholz & Mentlik

20070040568 - Semiconductor device, driving method and inspection method thereof: For an inspection of a display device which incorporates a driver circuit around pixels, a start pulse and a clock pulse are required to be inputted as inspection signals. The more complex the driver circuit is, the more complexity the start pulse and the clock pulse tend to have, which... Agent: Eric Robinson

20070040566 - Testing assembly for electric test of electric package and testing socket thereof: A testing assembly for an electric package is suitable for electric testing of an electric package. The electric package has many contacts on a contact surface of the electric package. The contacts are arranged along an alignment line. The testing assembly for an electric package includes a testing board and... Agent: J.c. Patents, Inc.

20070040572 - Electrical inspection method and method of fabricating semiconductor display devices: A method of electrically inspecting semiconductor display devices, which is capable of inspecting whether a signal is normally input to the pixels and whether an electric charge is normally held by the holding capacitors without using the video signal line as a passage for reading the electric charge and without... Agent: Nixon Peabody, LLP

20070040571 - Method and apparatus for testing power mosfet devices: Characteristics of a power MOSFET gate charge test waveform are evaluated to yield a highly reliable and uniform testing methodology that replaces the inconsistent and inefficient dv/dt immunity testing currently performed. The invention utilizes the ratio of QGD over QGS1 to replace traditional dv/dt immunity testing in order to perform... Agent: Fulwider Patton Lee & Utecht, LLP

20070035288 - Test apparatus and testing method: There is provided a test apparatus for testing a device-under-test, having a reference clock source for generating reference clock for controlling operations of the device-under-test, a clock regenerating circuit for generating, based on a phase adjusting signal to be inputted, regenerated clock whose frequency is almost equal with the reference... Agent: Osha Liang L.L.P.

20070035289 - Test apparatus and testing method: There is provided a test apparatus for testing a device-under-test, having a reference clock source for generating reference clock for controlling operations of the device-under-test, a clock regenerating circuit for generating, based on a phase adjusting signal to be inputted, regenerated clock whose frequency is almost equal with the reference... Agent: Osha Liang L.L.P.

20070035290 - Device for covering the peak load: A device for covering the peak load of an electrical consumer (VB) that is connected to an alternating current terminal of a public electricity network (ENT). A power inverter (WR) is fed from a direct current accumulator (BAT) and is connected in parallel at the output thereof to the electricity... Agent: Monte & Mcgraw, PC

20070035291 - Ic sorter: Provided are an IC sorter, a method for sorting a burn-in IC, an IC sorted using the method. The IC sorter according to one embodiment of the present invention includes a board table onto which a burn-in board is loaded, a tray loader and a tray unloader which are spaced... Agent: Fleshner & Kim, LLP

20070035292 - Vacuum circuit interrupter including circuit monitoring leakage or loss of vacuum and method of monitoring a vacuum interrupter for leakage or loss of vacuum: A method monitors a vacuum interrupter for leakage or loss of vacuum. The vacuum interrupter includes a line side, a load side and separable contacts electrically connected therebetween. The line side has a line side voltage and the load side has a load side voltage. The method includes determining whether... Agent: Martin J. Moran Eaton Electrical Inc.

20070035293 - Moving body detecting apparatus: A moving body detecting apparatus including at least a gear 1 as a magnetic moving body including at least one of a projected portion or a recessed portion, a bias magnet 5 for applying a bias magnetic field thereto, and two pairs of spin valve type giant magneto resistive elements... Agent: C. Irvin Mcclelland Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20070035294 - Integrated three-dimensional magnetic sensing device and method to fabricate an integrated three-dimensional magnetic sensing device: An integrated three-dimensional magnetic or any field sensing device and a method to fabricate an integrated three-dimensional magnetic sensing device is presented. An integrated three-dimensional magnetic sensing device comprises an apparatus that defines at least a first surface area and at least one sloped surface which is sloped with respect... Agent: Honeywell International Inc.

20070035295 - Metal shield alarm in a nuclear quadrupole resonance/x-ray contraband detection system: This invention relates to a combined nuclear quadrupole resonance and X-ray contraband detection system with a metal shield alarm that is activated when the area of the metal in the object being scanned as determined by the resonance frequency shifts of the NQR sensors exceeds the area of the metal... Agent: E I Du Pont De Nemours And Company Legal Patent Records Center

20070035296 - Method for measuring nuclear magnetic resonance longitudinal axis relaxation time of blood and apparatus using the same: Disclosed are a method and apparatus for accurately measuring nuclear magnetic resonance (NMR) longitudinal axis relaxation time by minimizing the influence of the amount of blood. The method includes applying a first magnetic field MO to a living body portion into which the blood flows magnetizing the blood in a... Agent: Sughrue Mion, PLLC

20070035297 - Magnetic resonance imaging apparatus and magnetic field forming apparatus: Occurrence of noise is to be prevented, and image quality improved. Dynamic dampers which damp vibration attributable to the gradient coil unit are arranged in positions which are extending areas of a gradient coil unit extending to protrude out of an accommodating space, and are different in positions from the... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070035299 - Magnetic resonance imaging method and apparatus with application of the truefisp sequence and sequential acquisition of the mr images of multiple slices of a measurement subject: and the measurement of all segments S of all slices N is implemented such that the time duration TRelax is TRelax=(N−1)·TSeg [msec] for the relaxation of the magnetization MZ with the relaxation constant T1 in a slice N that corresponds to the time span from the end of the measurement... Agent: Schiff Hardin, LLP Patent Department

20070035298 - Method for correcting inhomogeneities of the static magnetic field, particularly of the static magnetic field generated by the magnetic structure of a machine for acquiring mri image: Method for correcting inhomogeneities of the static magnetic field particularly of the static magnetic field generated by the magnetic structure of a machine for acquiring nuclear magnetic resonance images provides to determine the number, the position and the magnetic moment of dipoles compensating inhomogeneities of the magnetic field to be... Agent: Buchanan, Ingersoll & Rooney PC

20070035301 - Magnetic resonance imaging apparatus: A coil support unit for use in a magnetic resonance imaging apparatus provided with a top board for placing thereon a subject, and a radio frequency coil provided on an upper surface of the top board, the magnetic resonance imaging apparatus imaging the subject utilizing the radio frequency coil, the... Agent: Nixon & Vanderhye, PC

20070035300 - Shim board system: In a shim board system with at least one shim board formed by an insulating substrate and at least one conductor trace on the substrate for generation of a shim magnetic field, in particular for homogenization of the basic magnetic field of a magnetic resonance apparatus, the insulating substrate is... Agent: Schiff Hardin, LLP Patent Department

20070035302 - Phase unwrapping evolution method and magnetic resonance imaging apparatus using the method: In a phase unwrapping evolution method according to the invention, steps of grouping phase data first, phase unwrapping evolution targeting groups is performed, and, then, merging of the target groups is performed are repeatedly applied. As unwrapping evolution processing proceeds, groups increase and information on a phase difference among the... Agent: Nixon & Vanderhye, PC

20070035303 - Electroacoustic cable for magnetic resonance applications: A transmission cable for use in a magnetic resonance apparatus is provided. The transmission cable includes a plurality of cable segments (200n). The cable also includes a plurality of couplers each of which transforms a first signal carried by a first cable segment into an acoustic signal and from the... Agent: Philips Intellectual Property & Standards

20070035304 - Aerial electronic detection of surface and underground threats: An aerial electronic system for detection of surface and underground threats comprises an electromagnetic (EM) gradiometer flown aloft over the possible ground and underground threats to a convoy. The EM gradiometer is disposed in a Styrofoam torpedo shaped pod that is towed in flight behind an airplane. An illumination transmitter... Agent: Patents Pending

20070035305 - High resolution resistivity earth imager: Impedance measurements made by a galvanic resistivity tool in a borehole in an earth formation are corrected by a factor that depends on the mud conductivity and the mud dielectric constant. Standoff measurements are not necessary.... Agent: Madan, Mossman & Sriram, P.C.

20070035306 - Method and apparatus for enhancing formation resistivity images obtained with downhole galvanic tools: The average current at a plurality of measure electrodes of a resistivity imaging tool is determined and subtracted from the individual measure currents to give a resistivity image with improved dynamic range.... Agent: Madan, Mossman & Sriram, P.C.

20070035307 - State variable and parameter estimator comprising several partial models for an electrical energy storage device: A state variable and parameter estimator for determining state variables and parameters of a mathematical energy storage model, especially of a battery model, which calculates the state variables and the parameters from operating variables of an energy storage device. A particularly simple estimation of the state variables and the parameters... Agent: Kenyon & Kenyon LLP

20070035308 - Electric current measuring instrument having artificial lipid double-membrane: The current measuring device includes an upper solution chamber (3) and a lower solution chamber (8) whose bottom has a support layer (5) and measures a current flowing via an artificial lipid bilayer membrane (2) formed on a small hole (4) of the upper solution chamber (3), wherein the lower... Agent: Harness, Dickey & Pierce, P.L.C

20070035309 - Method and device for detecting physical-chemical states on measuring electrodes of a flowmeter: A method and device for detecting physical-chemical states on measuring electrodes (4a, 4b) of a flowmeter, through the measuring tube (1) of which a flowable medium (2) flows which, in doing so, passes through a magnetic field generated by a magnetic arrangement (3), wherein, for detecting the measurement voltage induced... Agent: Abb Inc. Legal Dept. -4u6

20070035310 - Actuator device with a microwave position detecting device: An actuator or servo device comprises an actuator member adapted to move linearly in the motion space of an actuator housing, a microwave position detecting device for detecting the position of the actuator member in the motion space, the actuator member being capable of producing a pressure wave acting on... Agent: Hoffmann & Baron, LLP

20070035311 - Power tool with measurement of a penetration depth of a working tool: A power tool (1) for driving a working tool (3) that penetrates at least axially into a to-be-machined material (2), and including a signal processor (6, 6′), and a transducer (5) which is suitable for exciting and detecting a high-frequency electromagnetic wave (4) propagating axially along the working tool (3)... Agent: Abelman, Frayne & Schwab

20070035312 - Touch sensing apparatus: A touch sensing apparatus includes a signal source for generating an alternating current signal, a conductor connected to the signal source, a sensor for receiving a noise generated by a contact of an object. The sensor together with the conductor form a simulated capacitor that results in alternating current signal... Agent: North America Intellectual Property Corporation

20070035313 - Wall detector: A wall detector (1) for detecting an object (3) embedded in a substrate (2) includes a detection antenna (5) for introducing broadband, high-frequency alternating electric fields (9) of a measurement frequency (fM) in the substrate (2); a measurement system (6) connected to the detection antenna (5) for measuring the delayed... Agent: Abelman, Frayne & Schwab

20070035314 - Sensing device for sensing a physical parameter: The sensing device for sensing a physical parameter such as radiation, temperature or the like, comprises an analogue sensor element sensitive for the physical parameter to be sensed and outputting an analogue signal and an analogue two-digital converter (ADC) having an MOS input stage for receiving the analogue output signal... Agent: Shumaker & Sieffert, P. A.

20070035315 - Methods and systems for automated pipeline testing: A method for testing effectiveness of a cathodic protection device configured to apply at least one voltage across an underground structure and a reference point is described. The method includes providing a sample of the material from which the underground structure is fabricated, placing the sample proximate the underground structure,... Agent: Patrick W. Rasche Armstrong Teasdale LLP

20070035316 - Method for identifying analog measuring sensors and associated assembly: Individual measuring sensors each have a different specific signal type and must therefore be appropriately connected to the analog measuring inputs. An adjustable voltage with adjustable current limitation, or an adjustable current with adjustable voltage clamping is used. The voltage or current is connected to the measuring sensors and the... Agent: Staas & Halsey LLP

20070035318 - Donut-type parallel probe card and method of testing semiconductor wafer using same: A donut-type parallel probe card comprises a main substrate and a plurality of probing blocks installed on a surface of the main substrate, wherein each probe block comprises a plurality of probes. The probing blocks are arranged to fill a first region having an oval shape and surrounding a second... Agent: Volentine Francos, & Whitt PLLC

20070035317 - Multimeter having off-device display device and selection device: A probe comprising a display device or a selection device attached thereto and a multimeter having a probe port to attach the probe are disclosed.... Agent: Blakely Sokoloff Taylor & Zafman

20070035319 - Electrical connector: An electrical connector comprising: a stationary base (6) with a plurality of passageways (5) therein, a plurality of terminals (5) respectively received within the corresponding passageways, a moveable cover (7) slidably mounted upon the connector and defining a plurality of passages in alignment with the corresponding passageways, respectively, a bottom... Agent: Wei Te Chung Foxconn International, Inc.

20070035320 - Semiconductor integrated circuit which can be burn-in-tested even when packaged and method of burn-in-testing semiconductor integrated circuit even when the semiconductor integrated circuit is packaged: A semiconductor integrated circuit and method for burn-in-testing are provided that uniformly apply stress to elements of the semiconductor integrated circuit in a burn-in test mode, even when packaged. The semiconductor integrated circuit may include a transmission control unit that transmits an operation signal in a normal operating mode and... Agent: Mills & Onello LLP

20070035321 - Device and method for testing mixed-signal circuits: A method and circuit for expanding boundary scan testing capability to mixed-signal electronic circuit boards and to mixed-signal functional integrated circuit (IC) cores. The integrated circuit may include, for example, a pin selection coder circuitry and a pin multiplexing circuitry and may be provided with, for example, two serially connected... Agent: Pearl Cohen Zedek, LLP Pearl Cohen Zedek Latzer, LLP

20070035324 - Integrated circuit having electrically isolatable test circuitry: Special test circuitry in an IC for wafer level testing selectively connects the specialized test circuitry to the functional circuitry during wafer test. Following wafer test the special test circuitry is electrically isolated from the functional circuitry and power supplies such that it does not load functional circuit signals nor... Agent: Texas Instruments Incorporated

20070035323 - Method for fabricating electronic circuit module and integrated circuit device: An electronic circuit module and its fabricating method are provided. The electronic circuit module includes a first board and a second board having printed circuit patterns formed on the respective surfaces, and an electronic device disposed between the first board and the second board and having electrodes connected to the... Agent: Cha & Reiter, LLC

20070035322 - Testing method detecting localized failure on a semiconductor wafer: A method and system for testing a wafer comprising semiconductor chips are disclosed. A determination of whether or not the wafer is defective is made in relation to a spatially related group of filtered failed semiconductor chips on the wafer, where the spatially related group corresponds to a localized failure... Agent: Volentine Francos, & Whitt PLLC

20070035325 - Directional power detection by quadrature sampling: Power measurement and control in transmission systems are affected by changes in load conditions. A method and system are provided for detecting and controlling power levels independent of such load conditions.... Agent: Thelen Reid Brown Raysman & Steiner LLP

20070029988 - Method and structure for variable pitch microwave probe assembly: A coplanar waveguide (CPW) probe includes at least one center probe element, each having a respective center probe contact point and at least one peripheral probe element, each having a respective peripheral contact point. The pitch between the at least one center contact point and the at least one peripheral... Agent: Mcginn Intellectual Property Law Group, PLLC

20070029989 - Error factor acquisition device, method, program, and recording medium: It is possible to calibrate a measurement system for circuit parameters of a DUT (device under test) by reducing the number of attachments and detachments of calibration kits. An error factor acquisition device includes: a first calibrator (100) connected to ports (18, 28) of a network analyzer and having a... Agent: Greenblum & Bernstein, P.L.C

20070029990 - Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics: A signal conductor whose first end is an open end, and a ground conductor are connected to associated measurement ports of a network analyzer. A short standard is connected between the signal conductor and the ground conductor at least three points in the longitudinal direction of the signal conductor, and... Agent: Ostrolenk Faber Gerb & Soffen

20070029991 - Vibration transducer using changes in polarization of light passing through an optical fiber: An acoustic microphone includes a diaphragm attached to one part a detection coil portion of an optical fiber with another part attached to a fixed base member so that vibrations in the diaphragm cause twisting of parts of the fiber on either side of the coil to change polarization of... Agent: Ade & Company Inc.

20070029992 - Current sensor for electric machine control: The disclosed apparatus relates to a current sensing electrical energy generation system comprising, an electric machine, a conductor electrically connected to the electric machine, and a current sensor responsive to current flow in the conductor.... Agent: Cantor Colburn, LLP

20070029993 - Automatic electric discharge tool: The present invention is to provide an automatic electric discharge tool, which comprises a control unit and an energy consuming module, wherein the control unit electrically coupled to a plurality of energy storage devices to receive information signals sent and obtain the remaining power capacity, remaining power supply time and... Agent: Bacon & Thomas, PLLC

20070029994 - Semiconductor device and inspection method of semiconductor device and wireless chip: The invention provides an inspection method of a semiconductor device which receives a test program wirelessly. As an inspection method of the semiconductor device, a test program is transmitted as a communication signal for every test. By transmitting a test program as a communication signal wirelessly in the case of... Agent: Eric Robinson

20070029995 - Rotor for rotation sensor: A rotor for a rotation sensor may be mounted on a bearing that supports a wheel on an automotive vehicle so that it can detect the number of revolutions for the wheel. The rotor for a rotation sensor 1 includes a reinforcing ring 2 formed like an L-shape in cross... Agent: Wenderoth, Lind & Ponack, L.L.P.

20070029996 - Contactless hall-effect angular position sensor: An example angular position sensor assembly includes a sector member that rotates within a ring including a permanent magnet disposed centrally within the ring and a Hall-effect sensor adjacent the permanent magnet on an opposite side of the permanent magnet from the sector member.... Agent: Siemens Corporation Intellectual Property Department

20070029997 - Test circuit with drive windings and sense elements: Magnetic field based eddy-current sensing arrays measure the near surface properties conducting and magnetic materials. The arrays have a drive winding for imposing the magnetic field in a test material and at least two sense elements for sensing the response of the test material to the magnetic field. Each sense... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20070029998 - Sensor for detecting the direction of a magnetic field in a plane: A sensor for detecting the direction of a magnetic field in a plane, the direction of which is defined by a polar angle φ, has a number n of magnetic field sensors. A measuring axis is assigned to each magnetic field sensor in such a way that the absolute value... Agent: Mccormick, Paulding & Huber LLP

20070029999 - Method and apparatus for measuring a magnetic field by using a hall-sensor: Method and apparatus for measuring an entity of a magnetic field using a Hall sensor which is provided with at least one Hall plate (101, 102, 103, 104) which has a pair of terminals (A1, A2, B1, B2) for supplying an excitation signal and a pair of terminals (A1, A2,... Agent: Hoffmann & Baron, LLP

20070030000 - Sensor: A magnetic sensor that is inexpensive and suppresses changes in offset voltage caused by wear. The magnetic sensor includes magnetoresistance elements having electrical resistances that change in accordance with magnetism changes. The magnetic sensor detects magnetism based on changes in the electrical resistances. The magnetoresistance elements are covered by a... Agent: Patterson, Thuente, Skaar & Christensen, P.A.

20070030001 - Resonant magnetometer device: A resonant magnetometer (20) is described that comprises a substrate having an member (26) and means for passing an alternating current (AC) through said oscillatory member (26). The magnetometer is characterised in that driving means (46,48) are also provided to impart a magnetic field independent oscillatory force to said oscillatory... Agent: Nixon & Vanderhye, PC

20070030002 - Method, computer program, and system for intrinsic timescale decomposition, filtering, and automated analysis of signals of arbitrary origin or timescale: A method and system for intrinsic timescale decomposition, filtering, and automated analysis of signals of arbitrary origin or timescale including receiving an input signal, determining a baseline segment and a monotonic residual segment with strictly negative minimum and strictly positive maximum between two successive extrema of the input signal, and... Agent: Donald R. Schoonover

20070030004 - Magnetic resonance imaging scanner with molded fixed shims: A magnetic resonance imaging scanner includes a generally cylindrical main magnet assembly (10) that defines a cylinder axis (16). A first set of shims (60) are rigidly positioned inside the magnet assembly (10) at about a first distance (d1) relative to the cylinder axis (16). A second set of shims... Agent: Philips Intellectual Property & Standards

20070030003 - Rf surface coil for use in mri with reduce sensitivity close to the conductors: The invention relates to a radio-frequent (RF) coil system (17, 17′) for use in a magnetic resonance imaging (MRI) system. The RF coil system comprises at least one main coil (35) for transmitting an RF magnetic field (B1) into and/or receiving an RF magnetic field (B1′) from an examination volume... Agent: Philips Intellectual Property & Standards

20070030005 - Probe head for nuclear magnetic resonance measurements: A probe head for nuclear magnetic resonance measurements comprises a sample holder having a stator and a rotor. The rotor is journalled for rotation about an axis of rotation within the stator. It is adapted for receiving a sample substance. The axis of rotation is inclined by an angle with... Agent: Law Offices Of Paul E. Kudirka

20070030006 - Position and orientation locator/monitor: The present invention provides a locator/monitor capable of locating a boring tool and monitoring the progress of the tool for control purposes. The locator/monitor may be used in expedited locating methodology and straightforward calibration techniques of the present invention. A durable and cost effective pitch sensor is also provided by... Agent: Pritzkau Patent Group, LLC

20070030007 - Measurement tool for obtaining tool face on a rotating drill collar: An apparatus for obtaining tool face angles on a rotating drill collar in substantially real time is disclosed. In one exemplary embodiment the apparatus includes a magnetoresistive magnetic field sensor deployed in a tool body. The apparatus further includes a programmed processor configured to calculate tool face angles in substantially... Agent: W-h Energy Services, Inc.

20070030008 - Method and apparatus for imaging earth formation: The invention concerns an apparatus for investigating the wall of a borehole filled with non-conductive mud, said apparatus comprising: a pad having an inside face and an outside face for pressing against the wall of the borehole; a set of measurement electrodes mounted on the outside face of the pad,... Agent: Schlumberger Oilfield Services

20070030009 - Sensor for measuring the position of an actuating element: In the case of a sensor for measuring the position of an actuating element, which is operated electromotively via a drive connection, of an internal combustion engine, at least one position sensor being arranged in the housing of the actuating element, which position sensor detects the position at the drive... Agent: Siemens Schweiz Ag I-47, Intellectual Property

20070030010 - Connector crosstalk and return loss cancellation: A device for testing data communications cabling. The device consists of a signal generator that can generate a test signal to test the data communications cabling and a receiving component that can receive a reflected signal produced by reflection of the test signal from the data communications cabling including any... Agent: Conley Rose, P.C.

20070030011 - Apparatus for testing cables: An apparatus is provided for testing a cable having a plurality of conductors. The apparatus includes a power supply terminal, a grounded test probe, an interface having a plurality of pins thereon, a plurality of indicators, and a plurality of control circuits, each of the indicators corresponding to a pin... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20070030012 - Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics: A plurality of signal conductors and ground conductors are connected to associated measurement ports of a network analyzer. A short standard is connected between each of the signal conductors and the ground conductor at at least three points in the longitudinal direction of each of the signal conductors, and an... Agent: Ostrolenk Faber Gerb & Soffen

20070030013 - Noise measurement semiconductor apparatus: A noise measurement semiconductor apparatus for measuring 1/f noise characteristics generated by a device includes a device to be measured of 1/f noise, a control circuit for providing a control signal to a control terminal of the device, in which the device and the control circuit are formed on the... Agent: Mcginn Intellectual Property Law Group, PLLC

20070030014 - Multi-jack cable adapter for multi-cable testing and alien cross-talk cable testing: A cable testing system employs a cable tester and a multi-jack cable adapter, which includes a switch matrix and a switch controller. In operation, the switch matrix is in electrical communication with the cable tester and a plurality of cables to establish a plurality of signal paths between the cable... Agent: Agilent Technologies Inc.

20070030015 - Modeling and calibrating a three-port time-domain reflectometry system: A three-port TDR front end comprises numerous components. An exemplary three-port TDR front end is a DSL modem. Information-bearing TDR signals are distorted as they pass through these components. With a perfect model of the response of its front-end, a TDR system usually can compensate for the effects of its... Agent: Sheridan Ross P C

20070030016 - Device and method for monitoring at least one energy reserve capacitor in a restraint system: A method and a device are provided for monitoring an energy reserve capacitor, in which monitoring of the internal resistance is provided in addition to monitoring of the capacitance. This is achieved by a time sequence of charging operations and an interruption of those charging operations.... Agent: Kenyon & Kenyon LLP

20070030017 - Needle alignment verification circuit and method for semiconductor device: A needle alignment verification circuit includes a sensor pad, a first transmission line, a control element, a data pad, a second transmission line, and a response element. The sensor pad includes an insulation part and a conduction part. The first transmission line is electrically connected to the conduction part and... Agent: F. Chau & Associates, LLC

20070030018 - Docking device actuated by pressure means: With a docking device for the coupling of a handler or prober to a test head for electronic components, at least one locking unit (4) is provided, which has an axially displaceable ball element clamping sleeve (21). This ball element clamping sleeve (21) is surrounded by an annular pressure chamber... Agent: Nixon & Vanderhye, PC

20070030019 - Power sink for ic temperature control: The use of a power sink function in IC testing results in a simple and rapid method for testing ICs, and assembled modules, at elevated temperature profiles without the use of environmental ovens. Testing IC devices at elevated temperatures may be useful for ‘burn-in’, for ‘hot sort’ performance testing that... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.

20070030020 - Power sink for ic temperature control: The use of a power sink function in IC testing results in a simple and rapid method for testing ICs, and assembled modules, at elevated temperature profiles without the use of environmental ovens. Testing IC devices at elevated temperatures may be useful for ‘burn-in’, for ‘hot sort’ performance testing that... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.

20070030021 - Probe station thermal chuck with shielding for capacitive current: To reduce noise in measurements obtained by probing a device supported on surface of a thermal chuck in a probe station, a conductive member is arranged to intercept current coupling the thermal unit of the chuck to the surface supporting the device. The conductive member is capacitively coupled to the... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070030022 - Device for defeating reverse engineering of integrated circuits by optical means: An integrated circuit chip (IC) is equipped with a device for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in a circuit located in the IC. The device emits extraneous randomized light emissions in substantial close proximity to the transistors to hide a... Agent: Fleit, Kain, Gibbons, Gutman, Bongini & Bianco Pl

20070030023 - Method and apparatus for inspecting flexible display medium layer: A method provides for inspecting flexible display medium layer, on which a driving electrode structure to be formed is not complete or there is no driving electrode structure. The flexible display medium layer passes an inspection area. Then, the inspected method is applied to inspect a performance of the flexible... Agent: J.c. Patents, Inc.

20070024266 - Bi-modal voltage limit control to maximize ultra-capacitor performance: An electrical system that is operable to selectively provide electrical power to power a load includes an ultra-capacitor that selectively stores and discharges electrical power and a control module that determines an operating ratio based an ON power state and an OFF power state of the ultra-capacitor. The control module... Agent: General Motors Corporation Legal Staff

20070024267 - Constant slope ramp circuits for sample-data circuits: A sample-data analog circuit includes a level-crossing detector. The level-crossing detector controls sampling switches to provide a precise sample of the output voltage when the level-crossing detector senses the predetermined level crossing of the input signal. A multiple segment ramp waveform generator is used in the sample-data analog circuits. The... Agent: Gauthier & Connors, LLP

20070024265 - Systems and methods for measuring an rms voltage: An embodiment of a method for measuring an RMS voltage of an arbitrary time-varying waveform includes: a) coupling said arbitrary time-varying waveform to said thermally sensitive device; b) decoupling said arbitrary time-varying waveform from said thermally sensitive device; c) coupling said thermally sensitive device to said controlled DC voltage source;... Agent: Paparella & Associates, PLC

20070024268 - Multi-channel radiometer imaging system: A radiometer includes a housing and an RF board carried by the housing. A hybrid and amplifier circuit receives an unknown signal and a known reference signal. A switch receives signals as inputs from the hybrid and amplifier circuit and switches between the inputs. A detection circuit receives and detects... Agent: Richard K. Warther Allen, Dyer,doppelt,milbrath & Gilchrist P.A.

20070024269 - Magnetic bridge electric power sensor: A magnetic bridge power sensor including a magnetic bridge that includes: a magnetic circuit 1 having two ends; magnetic circuits 21a and 21b each having two ends, one of the two ends of each of the magnetic circuits 21a and 21b being connected to one of the two ends of... Agent: Duane Morris

20070024270 - Method of voltage measurement and apparatus for same: The present invention is to provide a method of voltage measurement and an apparatus for the same having an improved accuracy and low cost. The apparatus for voltage measurement of a voltage supply includes: a charging unit for charging a capacitor for a prescribed period of time of charging; a... Agent: Armstrong, Kratz, Quintos, Hanson & Brooks, LLP

20070024271 - Integrated systems testing: A hard disk drive system includes an external interface that receives test configuration data, that transmits test result data, and that transmits and receives application data. The hard disk drive system includes a system on chip (SOC) that includes a controller and a read/write channel that communicates with the controller... Agent: Harness, Dickey & Pierce P.L.C

20070024272 - Voltage injector and detector for printed circuit board testing: One embodiment includes an injector pixel array having injector pixels each coupled to the bottom surface of a conductive material having a directional electrical conductivity only in a direction corresponding to a path between the bottom surface and top surface of the conductive material. Each injector pixel includes a semiconductor... Agent: Varian/blakely

20070024273 - Sealing device: To provide a sealing device in which a magnetic encoder can be protected so as to improve detecting precision and reliability, without increasing the number of parts and assembling man-hour and without enlarging a setting space, the sealing device is structured such that a detected portion is arranged in the... Agent: Jacobson Holman PLLC

20070024274 - Measurement configuration: A movement distance sensor operates as a differential transformer with a primary coil, at least two secondary coils. A circuit configuration is connected to the secondary coils in order to determine a movement distance. The circuit configuration includes a multiplexer, an A/D converter, and a digital logic module. The multiplexer... Agent: Lerner Greenberg Stemer LLP

20070024275 - Segmented core for an inductive proximity sensor: An inductive proximity sensor for sensing the presence of target based on a change of inductance in the sensor. The sensor includes a coil and a core formed of a permeable material so as to form an electromagnetic field when the coil is electrically driven. The core has a base,... Agent: Alston & Bird LLP

20070024276 - System, method, and apparatus for detecting signal-to-noise ratio decay in perpendicular magnetic recording: A magnetic test module runs on a spin stand to detect amplitude decay and noise evolution at the same time. Signal-to-noise ratio (SNR) decay is directly measured. The recording performance is correlated better with SNR instead of signal only. The thermal stability of the system is evaluated more accurately with... Agent: Bracewell & Giuliani LLP

20070024277 - Magnetic crash sensor: At least one time-varying signal is applied to a plurality of coil elements in cooperative relationship with and spanning different portions of a vehicle. The coil elements generate an associated plurality of magnetic field components that interact with the vehicle. At least one detection circuit generates a detected signal responsive... Agent: Raggio & Dinnin, P.C.

20070024278 - Methods and apparatus for inspecting materials: Apparatus and methods for inspecting materials such as cylindrical and tubular members are disclosed. One apparatus includes a frame that supports a magnetic coil and a detector assembly, the detector assembly having one or more magnetic detectors adapted to be spaced a first distance from the material being inspected by... Agent: The Wendt Firm, P.C.

20070024279 - Magnetic element: A magnetic element in a flat-plate shape includes a linearly-extending first flat plate being made of one of a magnetic material and a conductive material and a helical second flat plate being made of the other of the magnetic material and the conductive material, and the first flat plate is... Agent: Reed Smith, LLP Attn: Patent Records Department

20070024280 - Magnetic field-sensitive sensor: The invention relates to a sensor, preferably for magnetic rotary or linear sensor systems, having a scale situated at a specified distance from the sensor, and having at least one magnetic field-sensitive GMR sensor element provided in a housing, the housing also having one magnetic field source respectively associated with... Agent: Alleman Hall Mccoy Russell & Tuttle LLP

20070024281 - Adaptive image homogeneity correction for high field magnetic resonance imaging: An apparatus for producing a corrected reconstructed image from magnetic resonance imaging data acquired by a magnetic resonance imaging scanner (10) includes a reconstruction processor (44) that reconstructs a corrected reconstructed image from acquired magnetic resonance imaging data. A parameters calculation processor (52) determines at least one characteristic of the... Agent: Philips Intellectual Property & Standards

20070024282 - Method of monitoring a magnetic field drift of a magnetic resonance imaging apparatus: The invention enables to monitor a magnetic field drift of a magnetic resonance imaging apparatus on the basis of the magnetic resonance signals, which are acquired during magnetic resonance image data acquisition, such as by single shot EPI or by a gradient echo sequence. The phases of at least two... Agent: Philips Intellectual Property & Standards

20070024283 - Method, device and magnetic resonance tomography system for monitoring emitted rf energy: In a method, device and magnetic resonance tomography system for monitoring a radio-frequency apparatus in which radio-frequency pulses are emitted at temporal intervals and in which measurement values representing the power of the radio-frequency pulses are measured at temporal intervals, the measurement values are used to determine exposure values that... Agent: Schiff Hardin, LLP Patent Department

20070024284 - Magnetic resonance apparatus wit pressure reservoir: A magnetic resonance apparatus comprising a superconducting magnet coil which is disposed in a cryostat, and a refrigerator for cooling the magnet coil, which comprises a compressor for compressing a working gas, and a high-pressure line and a low-pressure line between the compressor and a control valve, which periodically connects... Agent: Kohler Schmid Moebus

20070024286 - Compensation for tool disposition in lwd resistivity measurements: A logging tool having an axial transmitter antenna and a transverse receiver antenna is provided with a bucking coil that compensates for the environmental effects including tool-bending and eccentricity.... Agent: Madan, Mossman & Sriram, P.C.

20070024285 - Method of generating a deep resistivity image in lwd measurements: A pseudo-image is produced by combining deep-reading azimuthally sensitive resistivity measurements with azimuthally insensitive resistivity measurements made by a multiple propagation resistivity tool. This image is useful in reservoir navigation. Features on the azimuthally sensitive measurements such as saddle-points and mid-points are diagnostic of bed geometry relative to the borehole.... Agent: Madan, Mossman & Sriram, P.C.

20070024287 - Apparatus and method for measuring liquid conductivity and electrode series capacitance: A device for measuring liquid conductivity or resistivity also quantifies series capacitance and compensates for parallel capacitance to achieve accuracy over a range of several orders of magnitude. A first signal of known frequency is applied to a conductivity cell and reference resistors, and the voltage drop across the cell... Agent: Dorr, Carson & Birney, P.C. One Cherry Center

20070024288 - Apparatus and method for detecting an error in a power signal: An error detection apparatus for detecting an error in a power signal output by an external device switchable by a switching signal has a comparing unit for comparing the power signal with a reference signal to yield a comparison signal, a switching unit for providing the switching signal dependent on... Agent: Baker Botts, L.L.P.

20070024289 - Radio frequency particulate sensing system: A particulate sensing system for a particulate trap including a radio frequency transmit circuit and a radio frequency receive circuit is disclosed. The transmit circuit may include a wideband signal generator configured to produce a wideband radio frequency signal and a wideband radio frequency amplifier, coupled to the wideband signal... Agent: Caterpillar/finnegan, Henderson, L.L.P.

20070024290 - Semiconductor device: An infrared radiation image pickup apparatus, the image pickup elements of which are each formed by a bolometer, is disclosed. The resistance value of the bolometer outside a preset range in a given readout circuit associated with a given image pickup element does not affect other readout circuits performing parallel... Agent: Young & Thompson

20070024291 - Programmable pin electronics driver: Apparatus that provides an output voltage to a device under test (DUT) includes a reference waveform generator to provide a waveform having a predefined swing, where the waveform is an analog signal that is based on data, a digital-to-analog converter (DAC) to receive the waveform, to scale the waveform using... Agent: Fish & Richardson P.C.

20070024292 - On-die heating circuit and control loop for rapid heating of the die: An integrated circuit includes a heating circuit configured to heat the integrated circuit under the control of a controller. A transfer function with adjustable pole, zero and overall gain is implemented in the controller such that a temperature response of the integrated circuit can be changed by adjusting one or... Agent: Townsend And Townsend And Crew LLP

20070024293 - Method and apparatus of electromagnetic measurement: In order to direct a probe having directivity that a received band is widened in accordance with a measurement distance, toward a DUT, shift the received band of the probe in sequence, receive electromagnetic, and measure electromagnetic interference, a plurality of long and short measurement distances between the probe and... Agent: Steptoe & Johnson LLP

20070024294 - Apparatus to inspect tft substrate and method of inspecting tft substrate: An apparatus to inspect a TFT substrate including a gate line, a data line crossed with the gate line and insulated from the gate line, a TFT disposed at an intersection of the gate line and the data line, and a pixel electrode connected to the TFT includes a vacuum... Agent: Stanzione & Kim, LLP

20070024299 - Body for keeping a wafer and wafer prober using the same: According to the invention, there is provided a wafer holding member for use in a wafer prober for inspecting a semiconductor wafer, including a chuck top and a supporting member for supporting the chuck top, wherein the supporting member has a bottom portion facing to the chuck top, a cavity... Agent: Mcdermott Will & Emery LLP

20070024301 - Electrical feedback detection system for multi-point probes: An electrical feedback detection system for detecting electrical contact between a multi-point probe and an electrically conducting material test sample surface. The electrical feedback detection system comprises an electrical detector unit connected to a multitude of electrodes in the multi-point probe, and optionally directly to the test sample surface. The... Agent: Michael B. Lasky Altera Law Group

20070024302 - Low-current pogo probe card: A low-current pogo probe card for measuring currents down to the femtoamp region includes a laminate board having a layer of conductive traces interposed between to dielectric layers. A plurality of probing devices, such as ceramic blades, are edge-mounted about a central opening so that the probing needles or needles... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20070024300 - Method for manufacturing integrated circuit, measurement apparatus for integrated circuit, and wafer: A method for manufacturing an integrated circuit, a measurement apparatus of an integrated circuit, and a wafer that reduces damages inflicted on bonding pads while enabling a probe test to be accurately performed. A sensor cell is arranged on a wafer between chip formation regions. The sensor cell has a... Agent: Freescale Semiconductor, Inc. Law Department

20070024303 - Method of electrical testing: A method of electrical testing devices such as integrated circuits that include conductive pads formed on the surface. A material having a desired bulk resistivity and viscosity is applied to either the device or the electrical probe prior to testing. The application of the material has been found to substantially... Agent: Lester H. Birnbaum

20070024296 - Portable manipulator for stackable semiconductor test system: This invention provides a manipulator for positioning a test head relative to a prober or other reference. The manipulator has a frame; a linkage coupled to the frame and including first and second links having freedom of rotation about respective pivots and a third link coupled to the first and... Agent: Edward N. Bachand Dorsey & Whitney LLP

20070024297 - Post and tip design for a probe contact: The present invention relates to A microfabricated tip and post structure comprising a post having a rough top surface that diffuses incident light and a cross-section, and a tip, lithographically plated on the rough top surface of the post, having a smooth reflective surface appropriate for automatic vision recognition, and... Agent: Pillsbury Winthrop Shaw Pittman LLP

20070024295 - Probe for an atomic force microscope: A probe for an atomic force microscope is adapted such that, as a sample is scanned, it experiences a biasing force urging the probe towards the sample. This improves probe tracking of the sample surface and faster scans are possible. This is achieved by either including a biasing element which... Agent: Gardner Carton & Douglas LLP Attn: Patent Docket Dept.

20070024298 - Torsion spring probe contactor design: The present invention relates to a probe for making electrical connection to a contact pad on a microelectronic device. A foot having a length, a thickness, a width, a proximal end, and a distal end, is connected to a substrate. The length of the foot is greater than its width.... Agent: Pillsbury Winthrop Shaw Pittman LLP

20070024304 - Wafer holder, heater unit used for wafer prober and having wafer holder, and wafer prober: Noise leakage from a heater body can be reduced by a wafer holder including a chuck top for mounting a semiconductor wafer, provided with the heater body, and a supporter supporting the chuck top, at least partially covered with a metal member, and by a heater unit for a wafer... Agent: Mcdermott Will & Emery LLP

20070024305 - Apparatuses for inspecting pogo pins of an electrical die sorting system and a method for performing the same: Apparatuses for inspecting pogo pins of an electrical die sorting (EDS) system are provided and a method for performing the same are provided. Apparatuses for inspecting pogo pins that delivers electrical signals between a tester and a probe when dies on a substrate are electrically tested are also provided. The... Agent: Harness, Dickey & Pierce, P.L.C

20070024307 - Connection unit, a board for mounting a device under test, a probe card and a device interfacing part: A connection unit for electrically connecting a DUT mounting board, on which an IC socket is mounted, with a testing apparatus for testing an electronic device inserted into the IC socket, the connection unit has a holding substrate provided to face the DUT mounting board and a connection-unit-side connector, which... Agent: Yasuo Muramatsu Muramatsu & Associates

20070024306 - Integrated circuit load board and method having on-board test circuit: An integrated circuit load board includes a substrate on which a plurality of integrated circuit sockets and an integrated test circuit are mounted. The integrated test circuit generates test signals that are applied to the integrated circuit sockets. The integrated test circuit also receives response signals from the integrated circuit... Agent: Edward W. Bulchis, Esq. Dorsey & Whitney LLP

20070024313 - Chuck top, wafer holder having the chuck top, and wafer prober having the chuck top: A chuck top allowing reliable recognition of a wafer mounted on a wafer-mounting surface or on a chuck top conductive layer by a camera such as a CCD and hence allowing wafer inspection without problem is provided. The chuck top is used for a wafer prober mounting a wafer on... Agent: Mcdermott Will & Emery LLP

20070024312 - Device and method for the testing of integrated semiconductor circuits on wafers: A device for testing a plurality of integrated semiconductor circuits on wafers is disclosed. The device includes a support device for taking in and temperature control, particularly heating or cooling, of the wafer, a measuring board with electronic circuit units for a function check of the integrated semiconductor circuits disposed... Agent: Mcgrath, Geissler, Olds & Richardson, PLLC

20070024308 - Integrated systems testing: A system on chip (SOC), comprises an external interface that receives test configuration data, transmits test result data, and that transmits and receives application data. A plurality of SOC components, each including an integrated system test (IST) module, wherein at least one of the SOC components includes a controller that... Agent: Harness, Dickey & Pierce P.L.C

20070024309 - Integrated systems testing: A system comprises a printed circuit board (PCB). A system on chip (SOC) mounted on the PCB includes a controller that communicates with an external interface that receives test configuration data, transmits test result data, and transmits and receives application data. At least one chip mounted to the PCB, wherein... Agent: Harness, Dickey & Pierce P.L.C

20070024310 - Open offset canceling method and an impedance measuring apparatus using the method: A method for finding the impedance of a device under test using an impedance measuring apparatus having a modem-type auto-balancing bridge, two or more measurement signals, each of which has a different phase with respect to the reference signals supplied to the modem inside said auto-balancing bridge, are applied to... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20070024311 - Semiconductor test apparatus: Good device PASS/FAIL determination is realized by measuring timings of a cross point of differential clock signals CLK and a data signal DATA output from a DUT, and obtaining a relative phase difference between both signals. A semiconductor test apparatus comprises differential signal timing measurement means for outputting cross point... Agent: Yasuo Muramatsu Muramatsu & Associates

20070024314 - Test system and single-chip tester capable of testing a plurality of chips simultaneously: The present invention relates to a test system, and in particular relates to a test system capable of testing a plurality of chips simultaneously. The test system comprises a single-chip tester and a handler. The single-chip tester further comprises a pattern memory and a micro-processor. The pattern memory comprises a... Agent: Birch Stewart Kolasch & Birch

20070024315 - Method and apparatus for testing liquid crystal display: A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and... Agent: Birch Stewart Kolasch & Birch