|Electricity: measuring and testing patents - Monitor Patents|
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Electricity: measuring and testing January USPTO class patent listing 01/07Below are recently published patent applications awaiting approval from the USPTO. Recent week's RSS XML file available below.
Listing for abstract view: USPTO application #, Title, Abstract excerpt,Patent Agent. Listing format for list view: USPTO National Class full category number, title of the patent application. 01/25/2007 > 49 patent applications in 30 patent subcategories. USPTO class patent listing
20070018632 - Detector for detecting a buried current carrying conductor: A detector 1 for detecting a buried current carrying conductor comprises a digital homodyne receiver. The receiver processes field strength signals induced in a pair of vertically spaced antennae 3, 5. The analogue to digital converter is an audio-grade stereo CODEC 11.... Agent: Baker & Hostetler LLP
20070018633 - Probe use in electric test: A probe comprises a body member having a front end area and supported on a support member in a cantilever state, and a tip member combined with the front end area of the body member. The tip member includes a base portion with at least a part of the tip... Agent: Bacon & Thomas, PLLC
20070018634 - Method and device for measuring electric field distribution of semiconductor device: It comprises a voltage-application apparatus 2 for applying a predetermined voltage to a semiconductor device 1, and holding it therein; a laser apparatus 3 for generating a laser beam 4 having a predetermined wavelength; an irradiation apparatus 5 for irradiating the laser beam 4 onto the two-dimensional circuit of the... Agent: Sughrue Mion, PLLC
20070018637 - Apparatus and method for testing circuit characteristics by using eye mask: A test apparatus capable of detecting input/output (I/O) circuit characteristics of a semiconductor device by analyzing an eye mask generated in the test apparatus and the waveform of a test signal output from the I/O circuit of the semiconductor device. The test apparatus includes an eye mask generator that generates... Agent: F. Chau & Associates, LLC
20070018638 - Electrical test circuit with active-load and output sampling capability: An electrical test circuit includes a bridge configuration having two paths between two nodes, a buffer, and a capacitor. An output of the buffer is coupled to one of the paths, the buffer is adapted to either provide a defined potential or a high impedance, the capacitor is connected to... Agent: Perman & Green
20070018636 - Method and program for controlling an apparatus for measurement of characteristics of a semiconductor device under test: When first and second measuring means connected to switching means are switched to measure multiple types of electronic characteristics of a device under test which is a semiconductor device, the device under test is disconnected from the second measuring means and is connected to the first measuring means. Thereafter, the... Agent: Paul D. Greeley, Esq. Ohlandt, Greeley, Ruggiero & Perle, L.L.P.
20070018635 - Optical reflectometry analysis with a time-adjustment of partial responses: Determining a physical property of a device under test—DUT—includes receiving an optical scatter signal returning from the DUT in response to a probe signal launched into the DUT, wavelength dependent separating a first response signal and a second response signal from the scatter signal, determining a first power information of... Agent: Perman & Green
20070018639 - Methods, systems, and devices for evaluation of thermal treatment: Methods, Systems, and Devices for Evaluation of Thermal Treatment. A magnetically detectable particle and related methods, systems, and devices are provided for generating a temperature measurement for a batch or a continuous stream of material. The particle can include a first and second magnet each comprising a positive and negative... Agent: Jenkins, Wilson, Taylor & Hunt, P. A.
20070018640 - Vacuum chuck spinstand for testing magnetic heads and disks: A spinstand having a vacuum chuck clamping mechanism for securing magnetic discs includes a cap (9) and a base (10). A disk-to-be-clamped is held between the cap (9) and the base (10). Vacuum, applied through a port (4) in a mounting screw (12) of the base, provides the clamping force.... Agent: Greenberg Traurig, LLP
20070018641 - Magnetic bias film and magnetic sensor using the same: A magnetic bias film 9 includes a magnetic bias magnet 11 that has magnetic layers and generates a magnetic field within a plane perpendicular to a lamination direction of the magnetic layers, which is manufactured in the shape of substantially a rectangular prism having a long side, a short side,... Agent: Wenderoth, Lind & Ponack L.L.P.
20070018642 - Magnetic sensor: The magnetic sensor is fabricated such that a magnetic sensor chip, having a one-chip structure in which MRE bridges and a comparator are included, is mounted onto a lead frame using an adhesive material, and then the magnetic sensor chip mounted on the lead frame is encapsulated by molding in... Agent: Posz Law Group, PLC
20070018643 - Squid detected nmr and mri at ultralow fields: Nuclear magnetic resonance (NMR) signals are detected in microtesla fields. Prepolarization in millitesla fields is followed by detection with an untuned dc superconducting quantum interference device (SQUID) magnetometer. Because the sensitivity of the SQUID is frequency independent, both signal-to-noise ratio (SNR) and spectral resolution are enhanced by detecting the NMR... Agent: Lawrence Berkeley National Laboratory
20070018645 - Method and apparatus for mapping and correcting geometric distortion in mri: A three-dimensional grid (10) is used as a phantom for mapping geometric distortion in magnetic resonance imaging (MRI) apparatus. This phantom provides an array of densely distributed control points in three-dimensional space. These points are each defined by three orthogonal planes. In the phantom image, the planes are determined by... Agent: Nixon & Vanderhye, PC
20070018646 - Nmr leak test: Testing integrity of a barrier or a container uses NMR analysis. This is non-destructive and based on physical principles rather than chemical conversion or by signal suppression. It can use many alternative material forms, including solids, liquids, vapours and gases as appropriate to the application. Direct transfer into and accumulation... Agent: Barnes & Thornburg LLP
20070018644 - Signal processing for detection of nqr signals: A method for analysing signals received from an object. The method initially comprises deriving the parameters of frequency and phase of said signals in either the time domain or frequency domain. It then comprises identifying whether the signals conform to a linear relationship between the two parameters to ascertain whether... Agent: Pillsbury Winthrop Shaw Pittman, LLP
20070018647 - Nuclear magnetic resonance apparatus with a gradient shielding configuration having reduced coupling to the resonator system: from each other and are disposed on planes parallel to the xy plane, wherein the regions are geometrically positioned in such a manner that they have opposite inductive couplings for part of the eigenmodes of the shielding configuration. In this manner, coupling of energy from the resonator/coil system into the... Agent: Kohler Schmid Moebus
20070018648 - Multi-layer magnet: A shielded superconducting MRI magnet system uses a multi-layer shielded coil design. By splitting the magnet coils into a plurality of coil layers, an increased number of degrees of freedom is achieved which, in turn, permits minimization of the overall length of the magnet while nevertheless avoiding excessive magnet field... Agent: Kohler Schmid Moebus
20070018649 - Compact self-tuned electrical resonator for buried object locator applications: A self-tuning resonator for use in a transmitter apparatus for inducing alternating currents in a buried conductor. The resonator is dynamically tuned at frequencies below 500 kHz by exploiting the inherent voltage-variability of net capacitance in multilayer ceramic capacitors. The transmitter apparatus provides improved efficiency and induced output power suitable... Agent: Michael H Jester
20070018650 - Mems based conductivity-temperature-depth sensor for harsh oceanic environment: A MEMS-based silicon CTD sensor for ocean environment is presented. The sensor components are a capacitive conductivity sensor, a gold doped silicon temperature sensor, and a multiple diapghram piezoresistive pressure sensor. The sensor elements have further been packaged to protect them from harsh marine menvironment. The sensor components showed good... Agent: Smith Hopen, Pa
20070018651 - Broad-band low-inductance cables for making kelvin connections to electrochemical cells and batteries: A broad-band technique for reducing the distributed inductance of a four-conductor Kelvin cable is disclosed. A special inductance-canceling cable section is connected in tandem with the cable section contacting the cell/battery. Connections between the two cable sections are transposed such that conductors in each conductor pair of the canceling section... Agent: Judson K. Champlin Westman, Champlin & Kelly
20070018652 - Micro sensor system for liquid conductivity, temperature and depth: In accordance with the present invention is a miniature planar oceanographic conductivity, temperature pressure (CTD) system based on a thin film material fabricated on a Liquid Crystalline Polymer (LCP). The micro-CTD system in accordance with the present invention analyzes water for salinity by measuring conductivity, temperature and depth.... Agent: Smith Hopen, Pa
20070018653 - Apparatus and method for testing system board: An apparatus for testing a system board includes a sensing unit that detects a predetermined signal output from the system board, and a control-signal-output unit that outputs a predetermined control signal to the system board in correspondence with the predetermined signal detected by the sensing unit. A method for testing... Agent: Stein, Mcewen & Bui, LLP
20070018655 - Concept for compensating piezo-influences on an integrated semiconductor circuit: A compensation signal, which derives the mechanical stress, which acts on an integrated semiconductor circuit, from two partial compensation signals, which are generated by semiconductor elements with different stress characteristics, can be determined in more detail when the temperature dependence of a ratio of the partial compensation signals is also... Agent: Baker Botts, L.L.P.
20070018654 - Device and method for determining at least one variable associated with the electromagnetic radiation of an object being tested: The invention relates to an arrangement for measuring the radiation of an electromagnetic device, said arrangement essentially comprising a support (20) for positioning said device, an arc (10), a network of measuring probes that are distributed over the arc (10), essentially describing a circle which is centred on the support,... Agent: Lerner, David, Littenberg, Krumholz & Mentlik
20070018656 - Short-circuit detection in electric path connecting drive device and load: A control device controls a drive signal supplied from a drive device to a load apparatus along an electric path connecting the drive device and the load apparatus. The drive device receives a PWM (pulse width modulation) signal to PWM-control the drive signal, detects information about a short circuit in... Agent: Nixon & Vanderhye, PC
20070018657 - Method and device for measuring moisture content: A method of measuring moisture content, wherein, as an example, a microwave cavity resonator with two holed iris plates that are arranged vertically in tube axis at the mid point of a wave guide is used. A specimen is disposed in a slit formed at a resonator portion between the... Agent: Armstrong, Kratz, Quintos, Hanson & Brooks, LLP
20070018658 - Measurement instrument: A measuring instrument has a phase signal transmitter (400) that transmits, in accordance with a rotation of the spindle (300), a phase signal that differs corresponding to the rotation angle of the spindle (300), and an arithmetic processor (500) that arithmetically processes the phase signal to obtain the absolute position... Agent: Oliff & Berridge, PLC
20070018659 - Apparatus and method to measure fluid resistivity: An apparatus for measuring fluid resistivity includes a flow line adapted to be in fluid communication with formation fluids, wherein the flow line includes a first section comprising a first conductive area, a second section comprising a second conductive area, and an insulating section disposed between the first section and... Agent: Schlumberger Oilfield Services
20070018660 - Sensor device: A sensor device is disclosed that includes a sensor, in which a resistance value is changed in accordance with a change in an environment of the sensor. The sensor device also includes a beat oscillator having plural oscillators of different oscillating frequencies. The beat oscillator generates a beat signal of... Agent: Nixon & Vanderhye, PC
20070018661 - Apparatus and method for detecting state of heat exchanger tube: Provided is an apparatus for concurrently detecting a defect occurring in a heat exchanger tube and a geometric transition of the heat exchanger tube. The apparatus for detecting the state of a heat exchanger tube, including: the first detection unit detecting a defect of the heat exchanger tube; and the... Agent: Ladas & Parry LLP
20070018662 - Condition assessment method for a structure including a semiconductor material: An improved condition testing system and method includes a structure including a semiconductor material with a target portion and a second portion. The target portion has a first feature when at least one of the following occurs: an external force is received by the second portion of the structure and... Agent: Davis Wright Tremaine, LLP
20070018663 - Method and apparatus for manufacturing and probing test probe access structures on vias: One or more test probe access structures for accessing vias on a printed circuit assembly and method of fabrication thereof is presented. Each test probe access structure is conductively connected to a via at a test probe access location above an exposed surface of a via to be accessible for... Agent: Agilent Technologies, Inc. Legal Department, Dl 429
20070018664 - Probe card, test apparatus having the probe card, and test method using the test apparatus: Provided are a probe card, a test apparatus having the probe card, and a test method using the test apparatus. The probe card includes a probe substrate having a signal line, a probe needle connected to the signal line and fixed to the probe substrate, and a cooling unit for... Agent: Mills & Onello LLP
20070018665 - Probe station with low noise characteristics: A cable includes an inner conductor, an inner dielectric, and a guard conductor, where the inner dielectric is between the inner conductor and the guard conductor. The cable also includes an outer dielectric, and a shield conductor, where the outer dielectric is between the guard conductor and the shield conductor.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel
20070018667 - Lsi test socket for bga: There is provided an LSI socket containing a pogo-pin type decoupling capacitor for reducing the potential fluctuation of power supplies and GNDs at the time of testing LSI incorporated in a BGA package. The LSI socket comprises a printed board 102 containing decoupling capacitors 113 corresponding to one or more... Agent: Foley And Lardner LLP Suite 500
20070018666 - Spring contact pin for an ic chip tester: A spring contact for IC chip test sockets, contactors, and the like is comprised of a barrel casing and two spring-loaded plungers, and an inward indentation formed at one end of the barrel casing, which pushes into the base end of one of the plungers for reducing the contact resistance... Agent: Beeson Skinner Beverly, LLP
20070018668 - Testing system and testing method for a link control card: A system and method for testing a link control card (LCC) includes a host, a middle plane (MP), and an array having a plurality of testing devices. The host is connected to the LCC for transmitting signals, and the host is connected to the array for sending out commands and... Agent: Morris Manning Martin LLP
20070018674 - Apparatus and method for testing semiconductor device: An apparatus and related method for testing a semiconductor device are provided. The apparatus includes a unit depositing charge on an insulating layer formed on a semiconductor substrate, a unit measuring leakage current from the bottom surface of the semiconductor substrate, and a unit measuring surface voltage associated with the... Agent: Volentine Francos, & Whitt PLLC
20070018676 - Apparatus for testing semiconductor circuits: An apparatus is disclosed for testing integrated semiconductor circuits on wafers, having a measurement card with electronic circuitry for functional verification of the integrated semiconductor circuits on the wafers, and having, connected to the measurement card, a test head with contact needles, which establishes an electrical contact between the measurement... Agent: Mcgrath, Geissler, Olds & Richardson, PLLC
20070018673 - Electronic component testing apparatus: The present invention discloses an electronic testing apparatus, which includes multiple test areas, each area possesses respective pick and place module. The apparatus includes multiple shuttles located between the test area and input/output trays. Moreover, a further pick and place module is utilized, between the shuttles and the input/output trays,... Agent: Genus Law Group PLLC Raymond J. Ho David B. Dort
20070018670 - Electrostatic discharge testing: The present invention provides a system and method for electrostatic discharge (ESD) testing. The system includes a circuit that has a switch coupled to an input/output (I/O) circuit of a device under test (DUT), a charge source coupled to the switch, and a control circuit coupled to the switch, wherein... Agent: Sandeep Jaggi Lsi Logic Corporation
20070018672 - Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boards: A method and apparatus is presented for gaining socket testability through the use of a capacitive interposer engineered to create capacitive coupling between signal nodes of a circuit assembly that the tester has access to and nodes of the socket that would not otherwise have any coupling to a testable... Agent: Agilent Technologies Inc.
20070018677 - Methods for wafer level burn-in: A method, circuit and system for determining burn-in reliability from wafer level burn-in are disclosed. The method includes recording the number of failures in each IC die in nonvolatile elements on-chip at points in time over the duration of wafer level burn-in testing. Methods may also include using a supervoltage... Agent: Trask Britt, P.C./ Micron Technology
20070018675 - Semiconductor wafer examination method and semiconductor chip manufacturing method: A semiconductor wafer examination method that includes: preparing a wafer formed with a chip area for use as a semiconductor chip; firstly examining the wafer by probing; pressing an electrode of the wafer with a pressure member having a flat surface; and secondly examining the wafer by probing.... Agent: Harness, Dickey & Pierce, P.L.C
20070018671 - System and method for early qualification of semiconductor devices: According to one embodiment of the invention, a method for early qualification of semiconductor device includes performing initial testing on a semiconductor device, receiving fail data on the semiconductor device, determining a solution model for the semiconductor device based on the fail data, storing the solution model, performing subsequent testing... Agent: Texas Instruments Incorporated
20070018669 - Testing with high speed pulse generator: An integrated circuit, where a hard macro is resident within the integrated circuit. The hard macro receives a clock signal at a frequency that is below the operational frequency of the integrated circuit, and produces a clock signal having a frequency that is at least equal to the operational frequency... Agent: Lsi Logic Corporation
20070018678 - Method and circuit for reducing degradation in a regulated circuit: A regulated circuit having a number of metal-oxide-semiconductor field effect transistors (MOS FETS) and a method for using the same are provided to reduce Negative Bias Temperature Instability degradation of the MOS FETs on the circuit. In one embodiment, the method involves steps of: (i) detecting degradation in performance of... Agent: William Nuttle
20070018679 - Semiconductor test device using leakage current and compensation system of leakage current: The present invention relates to a semiconductor test device which may use a leakage current and/or a compensation system of leakage current. The semiconductor test device, according to exemplary embodiments of the present invention, may include MOS transistors which may be fabricated in processes similar to those of the semiconductor... Agent: Harness, Dickey & Pierce, P.L.C
20070018680 - Liquid crystal display panel and testing and manufacturing methods thereof: A liquid crystal display (LCD) panel simplifying its testing and manufacturing. The LCD panel includes (formed on a substrate) gate lines, data lines, and pixels including pixel transistors. The LCD panel further includes a plurality test transistors (e.g., data test transistors for driving the odd and even data lines) formed... Agent: F. Chau & Associates, LLC01/18/2007 > 51 patent applications in 34 patent subcategories. USPTO class patent listing
20070013359 - Integrated circuit and circuit board: An integrated circuit has an analog output circuit for outputting an analog signal and a leadless terminal for connecting an output line of the analog output circuit to a circuit board by soldering, and measures and transfers an analog output voltage of the leadless terminal in a state in which... Agent: Greer, Burns & Crain
20070013360 - Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics: Spectrum analyzer circuits and methods are provided which implement “zero-IF” (direct conversion) or “near-zero IF” (or very low IF) architectures that enable implementation of integrated (on-chip) spectrum analyzers for measuring the frequency spectrum of internal chip signals. An integrated spectrum analyzer circuit, which comprises a zero IF or near-zero IF... Agent: F. Chau & Associates, LLC
20070013361 - Semiconductor device having an integrated, self-regulated pwm current and power limiter and method: A method includes receiving an activation signal at a semiconductor device and generating an output power signal at the semiconductor device in response to receiving the activation signal. The output power signal has a duty cycle. The method also includes providing the output power signal to a load. The output... Agent: Lisa K. Jorgenson, Esq. Stmicroelectronics, Inc.
20070013362 - Framework that maximizes the usage of testhead resources in in-circuit test system: A method and apparatus for maximizing the usage of a testhead of an in-circuit tester is presented. A testhead execution supervisor interfaces between a testhead controller and a graphical user interface used to enter manual tests. The testhead execution supervisor adds tests to be submitted to the testhead to one... Agent: Agilent Technologies Inc.
20070013364 - Internal sensor with disturbing current reduced by compensation branches: The inertial sensor comprises a piezoelectric plate having a vibrator member defined therein carrying excitation electrodes connected to an excitation circuit including conductor tracks carried by the piezoelectric plate the excitation circuit including a disturbing circuit portion in which the excitation circuit has compensation branches associated with corresponding disturbing conductor... Agent: Birch Stewart Kolasch & Birch
20070013363 - Test structure design for reliability test: A flexible semiconductor test structure that may be incorporated into a semiconductor device is provided. The test structure may include a plurality of test pads designed to physically stress conductive lines to which they are attached during thermal cycling. By utilizing test pads with different dimensions (lengths and/or widths), the... Agent: Patterson & Sheridan, LLP
20070013365 - Turbo machinery speed monitor: This invention relates to a speed monitor apparatus for monitoring speed and acceleration of rotating turbine equipment (turbomachinery) and for operating an overspeed trip to shut down the equipment in the event that the speed or acceleration exceed predetermined thresholds. The invention provides a speed monitor module having an output... Agent: Bourque & Associates Intellectual Property Attorneys, P.A.
20070013366 - Magnetic encoder including magnetic ring having roughness: A magnetic encoder includes a metallic reinforcing ring and a magnetic ring attached to the metallic reinforcing ring, and is composed of a mixture of an elastic element and a magnetic material. A front side of the magnetic ring is formed into a roughly uneven surface having a roughness of... Agent: Wenderoth, Lind & Ponack, L.L.P.
20070013367 - Magnetic sensor having spin valve type electro-magnetic transformation device: A magnetic sensor for detecting an object includes: a detection portion including one half bridge, which has two spin valve type electro-magnetic transformation devices disposed on a substrate; and a magnet near the detection portion having a magnetic field changeable in accordance with influence of the object. The spin valve... Agent: Posz Law Group, PLC
20070013368 - Rotary control for a communication device: A rotary control assembly (400) for a communication device includes a magnetic sensor (410) integrated within a housing (406) and a magnet (404) integrally coupled to a rotary control (402) for controlling the magnetic sensor. User rotation of the rotary control (402) and integral magnet (404) controls resistance of the... Agent: Motorola, Inc Intellectual Property Section
20070013369 - Magnetic head slider testing apparatus and magnetic head slider testing method: In the present invention, a coil generating DC magnetic field applied to a magnetic head is divided into two in that a first coil and a second coil, which are provided on a frame shape core. An distance of an air gap is shortened, a slider head is held on... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.
20070013370 - Magnetic material detecting apparatus: A pair of cores are arranged such that first end portions thereof face to each other with a gap via a conveying path through which a medium to be detected passes. Coils wound at the first end portions of the cores, respectively, are connected in series to each other, thereby... Agent: Pillsbury Winthrop Shaw Pittman, LLP
20070013371 - Magnetic field response sensor for conductive media: A magnetic field response sensor comprises an inductor placed at a fixed separation distance from a conductive surface to address the low RF transmissivity of conductive surfaces. The minimum distance for separation is determined by the sensor response. The inductor should be separated from the conductive surface so that the... Agent: National Aeronautics And Space Administration Langley Research Center
20070013372 - Magnetic screening system: A magnetic screening system uses directional gradiometers with high resolution and accuracy to measure magnetic field signatures of target objects (e.g., gun, knife, cell phone, keys) in a volume of interest. The measured signatures can be compared to signatures of known objects stored in a local database. Various mathematical processes... Agent: Hamilton, Brook, Smith & Reynolds, P.C.
20070013373 - Quadrupolar nuclei nmr using residual dipolar splittings in solids: A method for obtaining NMR (=nuclear magnetic resonance) spectra of quadrupolar nuclei having spin l>½ using magic angle spinning (=MAS) in solid powders and transfer of coherences from a neighboring nucleus with spin S= 1/2 to single- or double-quantum transitions of quadrupolar nuclei having spin l>½, is characterized in... Agent: Kohler Schmid Moebus
20070013375 - Method and apparatus for adaptive channel reduction for parallel imaging: The subject invention pertains to method and apparatus for parallel imaging. The subject method can be utilized with imaging systems utilizing parallel imaging techniques. In a specific embodiment, the subject invention can be used in magnetic resonance imaging (MRI). A specific embodiment of the subject invention can reduce parallel reconstruction... Agent: Saliwanchik Lloyd & Saliwanchik A Professional Association
20070013374 - Method and apparatus for improved transmission-side accelerated ppa-based volume-selective magnetic resonance imaging: In a method for determining transmission coil-specific RF excitation pulses for component coils of a transmission coil array for accelerated, PPA-based volume-selective magnetic resonance excitation of a tissue region of a patient, and a magnetic resonance tomography apparatus operating according to the method, a first series of volume-selective RF excitation... Agent: Schiff Hardin, LLP Patent Department
20070013376 - Method, examination apparatus and antenna array for magnetic resonance data acquisition: In a method for implementation of a magnetic resonance examination, and a magnetic resonance apparatus, and an array for acquisition of magnetic resonance signals, and a magnetic resonance signal at a magnetic resonance frequency are acquired from an examination region with an array of frequency conversion units after an RF... Agent: Schiff Hardin, LLP Patent Department
20070013378 - Nmr probe: An NMR probe which has a multi-element switching mechanism. The NMR probe has a rotary tuner block, a contact unit, a rotationally driving unit for rotating the rotary tuner block. The rotary tuner block has an NMR probe body, a rotary body, and plural pairs of tuning elements disposed on... Agent: The Webb Law Firm, P.C.
20070013377 - Superconducting array of surface mri probes: An array of resonators for use in MRI and NMR is disclosed where the resonators are solid state constructs including a pair of resonating elements formed on both sides of a dielectric substrate and cooperate to form a resonator and where each resonator includes at least one discontinuity and the... Agent: Robert W Strozier, P.l.l.c
20070013379 - Locator with removable antenna portion: A locator is disclosed that includes a base module and an antenna module. The base module and antenna module are coupled both mechanically and electrically at a joint. Such an arrangement allows for easy stowage and shipment of the locator as well as the ability, by interchanging antenna modules, to... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
20070013380 - Circuit breaker with integrated ammeter: An integrated circuit breaker and ammeter device includes a generally conventional electrical circuit breaker with an enclosing case and a primary current carrying conductor running through the case, and an ammeter circuit mounted with the case and operatively connected to the primary conductor so as to read and display the... Agent: Ronald B. Sefrna
20070013381 - In-situ water analysis method and system: An electronic system for use in a body of fluid is disclosed. The electronic system includes a first housing element and a second housing element. The second housing element is hermetically sealed to the first housing element, forming a first chamber there between. An electronic circuit is mounted within the... Agent: Haverstock & Owens LLP
20070013382 - Method for detection and diagnosis of isolation faults in fuel cell hybrid vehicles: An isolation fault detection system for detecting isolation faults in a fuel cell system associated with a fuel cell hybrid vehicle. The isolation fault detection system measures a stack voltage potential, a positive fuel cell voltage potential, a negative fuel cell voltage potential, a positive battery voltage potential, and an... Agent: Cary W. Brooks General Motors Corporation
20070013383 - Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devices: A method and apparatus for detecting open defects on grounded nodes of an electrical device using capacitive lead frame technology is presented. In accordance with the method of the invention, an accessible signal node that is capacitively coupled the grounded node is stimulated with a known source signal. A capacitive... Agent: Agilent Technologies Inc.
20070013384 - Method for single ended line testing and single ended line testing device: A single ended line testing method for qualifying an electrically conducting line, including the steps of sending a plurality of randomized excitation signals from a first end of the line towards a second end of the line, subsequently taking measurements, at the first end of the line, of each reflection... Agent: Sughrue Mion, PLLC
20070013385 - Apparatus and method for controlling die force in a semiconductor device testing assembly: A semiconductor device test assembly includes a heat sink having a surface configured to support a device under test, an inner bellow, an outer bellow at least partially surrounding the inner bellow, and a fluid channel within the inner bellow for providing a fluid to the heat sink. The semiconductor... Agent: Foley And Lardner LLP Suite 500
20070013386 - Device for probe card power bus voltage drop reduction: Noise reduction for application of structural test patterns to a Device Under Test (DUT) is accomplished with a capacitor “booster” bypass network on the probe card in which the capacitors are charged to a much higher voltage Vboost than the DUT power supply voltage VDD. Charging the capacitors to a... Agent: Whitham, Curtis & Christofferson, P.C.
20070013387 - Means of detecting faults in alternators: A method and apparatus is disclosed for detecting one or more faults in a multi-phase alternator, wherein a phase sensing unit, comprising a star wound resistor assembly, senses each phase of the alternator and provides an indirect phase measure; further wherein a comparing unit, comprising an op amp, receives and... Agent: Ogilvy Renault LLP (pwc)
20070013388 - Method and system for calibrating measurement tools for semiconductor device manufacturing: A method and system for calibrating a plurality of measurement systems. The method includes obtaining a first plurality of calibration standards. The first plurality of calibration standards is associated with a plurality of predetermined values. Additionally, the method includes measuring the first plurality of calibration standards by a plurality of... Agent: Townsend And Townsend And Crew, LLP
20070013389 - Adjusting analog electric circuit outputs: Electro-thermal trimming of thermally-trimmable resistors is used to trim one or more of the plurality of resistors in or associated with an analog electric circuit. The TCR of each of a subset of a plurality of electro-thermally-trimmable resistors can be trimmed independently from the resistance in order to adjust the... Agent: Ogilvy Renault LLP
20070013390 - Contactor, contact structure provided with contactors, probe card, test apparatus, method of production of contact structure, and production apparatus of contact structure: A probe card having a plurality of silicon finger contactors contacting pads provided on a tested semiconductor wafer and a probe board mounting the plurality of silicon finger contactors on its surface, wherein each silicon finger contactor has a base part on which a step difference is formed, a support... Agent: Greenblum & Bernstein, P.L.C
20070013392 - Interposer including air gap structure, methods of forming the same, semiconductor device including the interposer, and multi-chip package including the interposer: Example embodiments of the present invention relate to an interposer of a semiconductor device having an air gap structure, a semiconductor device using the interposer, a multi-chip package using the interposer and methods of forming the interposer. The interposer includes a semiconductor substrate including a void, a metal interconnect, provided... Agent: Harness, Dickey & Pierce, P.L.C
20070013391 - Semiconductor integrated circuit device: Wiring is routed to assure insulation between wiring traces in a semiconductor integrated circuit device. The device includes a first wiring trace to which a prescribed voltage is supplied; a second wiring trace that takes on a voltage that exceeds the prescribed voltage; and a third wiring trace that only... Agent: Mcginn Intellectual Property Law Group, PLLC
20070013393 - Test probe and tester, method for manufacturing the test probe: A test probe having a conductive part electrically connected to terminals of a test-object device, including: a silicon substrate; a protrusion made of resin provided on the silicon substrate; a first conductive part which is provided on the protrusion and comes in contact with the terminals; and a second conductive... Agent: Harness, Dickey & Pierce, P.L.C
20070013394 - Dual feedback control system for maintaining the temperature of an ic-chip near a set-point: A dual feedback control system maintains the temperature of an IC-chip near a set-point while the IC-chip dissipates a varying amount of electrical power. The first feedback circuit sends electrical power to an electric heater with a variable magnitude that compensates for changes in the IC-chip power. The second feedback... Agent: Foley And Lardner LLP Suite 500
20070013395 - On-die impedance calibration: One exemplary device has a plurality of leads with termination impedances, and a standard impedance. Among the termination impedances are master impedances arranged to be calibrated by comparison with the standard impedance and slave impedances arranged to be calibrated in accordance with an associated master impedance.... Agent: Hewlett Packard Company
20070013397 - Inspection system, inspection method, and method for manufacturing semiconductor device: The present invention provides an inspection system of ID chips that can supply a signal or power supply voltage to an ID chip without contact, and can increase throughput of an inspection process and an inspection method using the inspection system. The inspection system according to the present invention includes... Agent: Cook, Alex, Mcfarron, Manzo, Cummings & Mehler Ltd
20070013396 - Universal pcb and smart card using the same: A smart card is provided including a body with a cavity, an IC chip inserted into the cavity, and a universal PCB on which the IC chip can be mounted and electrically contacted regardless of its size, type and bonding structure. The universal PCB comprises groups of contact pads suitable... Agent: Marger Johnson & Mccollom, P.C.
20070013403 - Apparatus for analyzing fault of semiconductor integrated circuit, method for the same, and computer readable medium for the same: A fault on a measuring point and information about a driving circuit of the fault are extracted. A signal value of the portion related to the fault on the measuring point and an input value of the driving circuit of the portion are obtained in case that a fault is... Agent: Banner & Witcoff, Ltd., Attorneys For Reserve Attorneys For Client No. 000449, 001701
20070013404 - Apparatus, customer tray, and method for testing semiconductor packages: Provided is electrical test equipment and method for testing semiconductor packages in an in-tray state. The equipment may include a loading site configured to receive a customer tray having a plurality of semiconductor packages therein, a test site configured to align the customer tray, and also configured to test all... Agent: Harness, Dickey & Pierce, P.L.C
20070013398 - Method of monitoring a semiconductor manufacturing trend: A parametric parameter is selected, which has an upper specification limit and a lower specification limit. A storage percentile is determined. The storage percentile is equal to a product yield percentage if the number of the set of measurements greater than the upper specification limit exceeds the number of the... Agent: Barry Dove Patent Services, Inc.
20070013399 - Method of monitoring a semiconductor manufacturing trend: A parametric parameter is selected, which has an upper specification limit and a lower specification limit. A storage percentile is determined. The storage percentile is equal to a product yield percentage if the number of the set of measurements greater than the upper specification limit exceeds the number of the... Agent: Barry Dove Patent Services, Inc.
20070013402 - Shared memory bus architecture for system with processor and memory units: A system is provided for testing a first integrated circuit associated with at least a second integrated circuit in a semiconductor device, wherein at least some external terminals for the semiconductor device are to be shared by the first and second integrated circuits, and wherein the first integrated circuit is... Agent: Carr & Ferrell LLP
20070013405 - Test head docking system and method: A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance... Agent: Ratnerprestia
20070013400 - Wafer level ac and/or dc testing: AC and/or DC testing of an optoelectronic device at the wafer level. In one example embodiment, a method of testing one or more devices at a wafer level includes generating a test signal; supplying the test signal to a single device on a wafer; providing an output of the single... Agent: Workman Nydegger (f/k/a Workman Nydegger & Seeley)
20070013401 - Wafer-level burn-in and test: Techniques for performing wafer-level burn-in and test of semiconductor devices include a test substrate having active electronic components such as ASICs mounted to an interconnection substrate or incorporated therein, metallic spring contact elements effecting interconnections between the ASICs and a plurality of devices-under-test (DUTs) on a wafer-under-test (WUT), all disposed... Agent: N. Kenneth Burraston Kirton & Mcconkie
20070013406 - System and method for reading a test strip: A system and method is disclosed which relates to reading test strips. The method may include reading and storing initial values of a front photodiode and a rear photodiode, reading current values of the front and rear photodiodes, detecting at least one change between initial and current values in the... Agent: Duckor Spradling Metzger
20070013407 - Method for measuring fet characteristics: A coefficient indicating the relationship between a measurement voltage of voltage measuring unit and a voltage drop in a drain bias voltage due to drain current is determined based on an S parameter of a bias tee and an input impedance of the measuring unit. A voltage drop at the... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.L.P.
20070013408 - Inspection device for display panel and interface used therein: An interface 100, which connects a prober 14 having a contact probe 15 which contacts an electrode pad on a display panel 12 with a test head 13 which applies a test signal to the electrode pad and detects an output signal from the electrode pad. The interface 100 includes... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.L.P.
20070013409 - Digitally controlled high-voltage power supply and method therefor: A digitally controlled high-voltage power supply and a method thereof are provided. The high-voltage power supply includes an output unit having a primary winding connected in parallel with a capacitor and a secondary winding inducing a voltage by current flowing in the primary winding. A switching unit switches on and... Agent: Roylance, Abrams, Berdo & Goodman, L.L.P.01/11/2007 > 51 patent applications in 34 patent subcategories. USPTO class patent listing
20070007940 - Method and apparatus for measuring circularly polarized rotating electromagnetic wave using magnetic field: A method and apparatus for measuring a circularly polarized rotating electromagnetic wave using a magnetic field are provided. The method and apparatus are used to measure properties of a circularly polarized rotating electromagnetic wave occurring in nature by using a phenomenon that energy is intensified or attenuated when circularly polarized... Agent: Nixon & Vanderhye, PC
20070007941 - Apparatus for improving stability and lock time for synchronous circuits: Delay-locked loops, signal locking methods and devices and system incorporating delay-locked loops are described. A delay-locked loop includes a forward delay path, a feedback delay path, a phase detector and a timer circuit. The forward delay path alternatively couples to an external clock signal and to an internal test signal.... Agent: Trask Britt, P.C.
20070007942 - Automatic non-linear phase response calibration and compensation for a power measurement device: Phase delay compensation sweep may be used in determining correct phase delay compensation of measured currents for substantially matching a measured apparent power to an expected apparent power over an operating range of current values of a current transformer (CT). A frequency sweep may also be used in determining correct... Agent: Baker Botts, LLP
20070007943 - Compensated current differential relaying method and system for protecting transformer: Disclosed is a compensated current differential relaying method and system for protecting a transformer more correctly by calculating and estimating an exciting current including a core-loss current and a magnetizing current, and, in particular, to a compensated current differential relaying method and system which can protect the transformer correctly irrespective... Agent: Richard L. Byrne Webb Ziesenheim Logsdon Orkin & Hanson, P.C.
20070007945 - Automatic non-linear phase response calibration and compensation for a power measurement device: Phase delay compensation sweep may be used in determining correct phase delay compensation of measured currents for substantially matching a measured apparent power to an expected apparent power over an operating range of current values of a current transformer (CT). A frequency sweep may also be used in determining correct... Agent: Baker Botts, LLP
20070007944 - Configurable utility meter connection interface: A configurable buss element for an electricity meter includes a conductive piece of metal formed into a series of contact connectors and a network of elongate conductors extending between and among the series of contact connectors. Each of the plurality of contact connectors is configured to contact a circuit element... Agent: Harold C. Moore Maginot, Moore & Bowman
20070007948 - Electrical connection device: Inspection is performed without applying an excessive pressure to an inspection object to thereby resolve inspection failure caused by excessive pressure application. An electrical connection device electrically connects a signal wiring formed on a wiring board to an electrode part of the inspection object. A contact is provided which electrically... Agent: Bacon & Thomas, PLLC
20070007947 - Impedance conversion circuit and integrated circuit including thereof: An impedance conversion circuit including: a first voltage-to-current converter and a second voltage-to-current converter supplied with differential input signal voltages; an inverting amplifier; and a third voltage-to-current converter for feedback; wherein a first resistance and a second resistance are connected in series with each other between an input terminal and... Agent: Robert J. Depke Lewis T. Steadman
20070007946 - Process for handling semiconductor devices and transport media in automated sorting equipment: A method for sorting devices in automated handling equipment, including placing a plurality of input trays containing a plurality of devices and a plurality of empty trays into a handler; sorting the plurality of devices in the plurality of input trays into the plurality of empty trays according to a... Agent: Foley And Lardner LLP Suite 500
20070007949 - Piston-cylinder device with position sensing means: A pressure activated piston-cylinder device includes a cylinder barrel with a cylinder bore, a piston with a piston rod movably guided in the cylinder bore, and a piston position sensing and indicating device. The piston position sensing and indicating device includes a magnetic activating element carried on the piston and... Agent: Frishauf, Holtz, Goodman & Chick, PC
20070007950 - Relative rotational position-detection device: First and second shafts (1, 2) are interconnected via a torsion bar (3) for torsional (or rotational) movement relative to each other, and first and second magnetic body sections (10, 20) are provided to rotate in interlocked relation to the rotation of the first and second shafts, respectively. The first... Agent: Rossi, Kimms & Mcdowell LLP.
20070007951 - Magnetic sensing apparatus: A magnetic sensing apparatus includes a first magnetic transducer separated spatially from a second magnetic transducer and proximate to a target and a direction decoding circuit associated with the first and second magnetic transducers, wherein the direction decoding circuit produces output pulses that provide data indicative of a rotation of... Agent: Kris T. Fredrick Honeywell International, Inc.
20070007952 - Micro magnetic proximity sensor: A system that senses proximity includes a magnet producing a magnetic field and a sensor having a switch. The switch includes a cantilever supported by a supporting structure. The cantilever has a magnetic material and a longitudinal axis. The magnetic material makes the cantilever sensitive to the magnetic field, such... Agent: Sterne, Kessler, Goldstein & Fox PLLC
20070007953 - Apparatus and method for establishing the positions of metal objects in an input stream: Apparatus (10) for establishing the positions of metal objects in a mixed input stream of both metal and non-metal objects, the apparatus comprising a differential metal-detecting coil (14A) having a first coil portion wound in a first sense and a second coil portion of generally similar shape and size to... Agent: Nixon & Vanderhye, PC
20070007954 - Test device for metal detector portal structure: This invention relates to a test device for metal detector portal structure, characterised by the fact that it comprises a removable rack (10) comprising support and guide means (300) for displacement of a panel (400) capable of carrying a reference sample.... Agent: Blakely Sokoloff Taylor & Zafman
20070007955 - Fastener and fitting based sensing methods: Damage and usage conditions in the vicinity of fasteners in joined structures are nondestructively evaluated using the fasteners themselves. Sensors or sensor conductors are embedded in the fasteners or integrated within the fastener construct, either in the clearance gap between the fastener and the structure material or as an insert... Agent: Hamilton, Brook, Smith & Reynolds, P.C.
20070007956 - Ultra sensitive in-situ magnetometer system: The present invention relates to an ultra sensitive in-situ magnetometer system, and more particularly to an ultra sensitive in-situ magnetometer system that can in-situ monitor a magnetic moment of a magnetic thin film with sub-monolayer precision while depositing and growing the magnetic thin film in an ultra high vacuum (UHV)... Agent: Roberts, Mlotkowski & Hobbes
20070007958 - Method and system of mr imaging with simultaneous fat suppression and t1 inversion recovery contrast: A method and system for fat suppression with T1-weighted imaging includes a pulse sequence generally constructed to have a non-spectrally selective IR pulse that is played out immediately before a spectrally selective IR tip-up pulse. Thereafter, a fat suppression RF pulse is played out followed by the acquisition of fat-suppressed... Agent: Ziolkowski Patent Solutions Group, Sc (gems)
20070007957 - Method and system of tracking an intracorporeal device with mr imaging: A system and method for tracking or otherwise determining positioning of an intracorporeal device is provided. The invention includes a device that may be inserted into a subject and tracked based on an imageable tag included with the device. The imageable tag is at least partially formed of a substance... Agent: Ziolkowski Patent Solutions Group, Sc (gems)
20070007959 - Simultaneous phase cycling for nuclear magnetic resonance spectroscopy: The present invention discloses a method of simultaneously conducting more than one step of a radiofrequency phase cycle in a nuclear magnetic resonance (NMR) experiment. The method first involves providing a sample. Next, one or more radiofrequency pulses are applied to a plurality of spatially discrete slices of the sample... Agent: Nixon Peabody LLP - Patent Group
20070007960 - Method and system of mr imaging with reduced fse cusp artifacts: Coil sensitivity of a receive coil to a gradient null location is measured and, from the measurements, a coil calibration value is determined and used to modify the MR data acquired with that receive coil to reduce the adverse effects of gradient nulling on MR images. Coil sensitivity values are... Agent: Ziolkowski Patent Solutions Group, Sc (gems)
20070007961 - Nmr.esr antennas and spectrometers using these: An NMR/ESR antenna is inserted into a magnet device for generating a static magnetic field, and irradiates a sample with an electromagnetic wave to detect a signal generated from the sample. The NMR/ESR antenna comprises a sample tube, an NMR solenoid coil, an ESR microwave cavity, and a microwave guide.... Agent: Antonelli, Terry, Stout & Kraus, LLP
20070007962 - Cryostat configuration with thermally compensated centering: Cryostat configuration for keeping cryogenic fluids in at least one cryocontainer (1) which is suspended on thermally insulating suspension tubes (2) and/or suspension devices which are connected to an outer jacket (3) of the cryostat configuration, wherein the at least one cryocontainer (1) is centered relative to a container disposed... Agent: Kohler Schmid Moebus
20070007963 - Nmr probe: The invention reduces a flow of a heat making an intrusion into an NMR probe, and uniformizes a spatial temperature generated in a sample pipe. A temperature modulated gas is supplied to a thermal anchor temperature modulated gas flow path constituted by a sample pipe insertion port around a sample... Agent: Antonelli, Terry, Stout & Kraus, LLP
20070007964 - Rf coil for imaging system: An RF coil suitable for use in imaging systems is provided which coil has a dielectric filled cavity formed by a surrounding conducting enclosure, the conducting enclosure preferably being patterned to form continuous electrical paths around the cavity, each of which paths may be tuned to a selected resonant frequency.... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.
20070007965 - Method and apparatus for detection and logging of buried objects and subterranean anomalies: A method and apparatus for the detection of buried objects and subterranean anomalies using detector technology including, for example, existing metal detector technology is provided. A grid having defined coordinates is established over a desired search area, and a survey is conducted over the desired search area using a metal... Agent: Ted M. Anthony
20070007966 - Active geophysical prospecting system: An active system and method for determining the physical characteristics and geological composition of subterranean formations is described. Plane polarized electromagnetic waves at specific frequencies are transmitted by a mobile transmitting antenna held stationary in the far-field about a prospecting point. The plane polarized electromagnetic waves penetrate the Earth and... Agent: Lee G. Meyer, Esq. Meyer & Associates, LLC
20070007967 - High resolution resistivity earth imager: Measurements made by a resistivity imaging tool in a borehole having non-conductive mud in a conductive earth formation are corrected using the tool standoff. The correction involves removing a calibration signal determined in a medium of high conductivity from the measured impedance. The magnitude and/or the real part of the... Agent: Madan, Mossman & Sriram, P.C.
20070007968 - Power monitoring system including a wirelessly communicating electrical power transducer: A system for monitoring an electrical power system includes one or more transducer units, each of which has a current measuring device and a voltage measuring device coupled to a respective one of the phase conductors of the power system, and a transducer wireless communications device. The transducer wireless communications... Agent: Martin J. Moran, Esq. Eaton Electrical, Inc.,
20070007969 - Circuit and system for detecting dc component in inverter device for grid-connection: A DC component detecting circuit (18) detects a small DC component contained in the AC output power of a grid-connection inverter device (12), accurately within a short period of time, and has a simple, small-size, and lightweight configuration. The DC component detecting circuit (18) comprises separators (21, 22) for separating... Agent: C. Irvin Mcclelland Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.
20070007970 - System and method for measuring on-chip supply noise: A method and system for measuring noise of an on-chip power supply. In an embodiment, the system comprises a delay line that receives as an input a signal such as a square wave. The delay line may comprise a series of inverters connected to the power supply. The output of... Agent: Mcandrews Held & Malloy, Ltd
20070007971 - Circuit for detecting difference in capacitance: A circuit for detecting a difference in capacitance between a first capacitor and a second capacitor provided in a sensor includes an oscillator configured to generate an oscillating signal, a phase comparator coupled to the oscillator to output a signal responsive to a phase difference between the oscillating signal delayed... Agent: Arent Fox PLLC
20070007972 - Measurement bias tee: A bias tee for connecting a measurement device to a DUT, where the measurement device has a guard output, includes a DC port; a HF port; and a measurement port. The HF input port is guarded with the guard output during operation of the bias tee.... Agent: Pearne & Gordon LLP
20070007973 - Electroimpedance tomograph with common-mode signal suppression: An electroimpedance tomograph is provided with a plurality of electrodes (1), which can be placed on the body of a patient and are connected to a control and evaluating unit (20) via a selector switch (60). The control and evaluating unit (20) cooperates with the selector switch (60) such that... Agent: Mcglew & Tuttle, PC
20070007976 - Circuit board storage bag and storage rack: A circuit board storage bag and a storage rack are disclosed. The stock in process, of the printed circuit boards between processes, is reduced while at the same time saving the space otherwise required for the stock, and the inward and outward delivery of the printed circuit boards are facilitated.... Agent: Arent Fox PLLC
20070007978 - Method and apparatus for non-contact testing and diagnosing electrical paths through connectors on circuit assemblies: A device for enabling testing of electrical paths through a circuit assembly is presented. The device may include a non-contact connector test probe for a testing a connector of the circuit assembly. A method for testing continuity of electrical paths through a circuit assembly is presented. In the method, one... Agent: Agilent Technologies, Inc. Legal Department, Dl429
20070007974 - Method for reducing integral stress of a vertical probe with specific structure: A method for reducing integral stress of a vertical probe with specific structure is disclosed. The vertical probe includes a probe tip, an insert part and a bent part. The bent part has a first circular arc and a second circular arc and the second circular arc is provided with... Agent: G. Link Co. Ltd.
20070007977 - Probe card assembly with an interchangeable probe insert: A probe card assembly can include an insert holder configured to hold a probe insert, which can include probes disposed in a particular configuration for probing a device to be tested. The probe card assembly can provide an electrical interface to a tester that can control testing of the device,... Agent: N. Kenneth Burraston Kirton & Mcconkie
20070007979 - Probe device capable of being used for plural kinds of testers: A probe device includes a tester; a probe card; a base card holder; an auxiliary card holder for adaptively mounting the probe card to the base card holder; and a conversion ring for allowing the auxiliary card holder to be fitted to the base card holder. In the probe device,... Agent: C. Irvin Mcclelland Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.
20070007975 - Scanned impedance imaging system method and apparatus: The resolution and contrast of impedance measurements and scans are improved by using a non-contact impedance probe comprising an inner conductor configured to bear a measurement signal and an outer conductor configured to bear a shielding signal. The measurement signal and shielding signal are selected to increase the directionality of... Agent: Utah Valley Patent Services, LLC
20070007980 - High density planar electrical interface: An apparatus including a substrate having a plurality of through holes and a plurality of cables, including wires and/or coaxial cables, extending through respective ones of the plurality of through holes of the substrate. Each of the cables comprises a conductor and terminates about a surface of the substrate such... Agent: N. Kenneth Burraston Kirton & Mcconkie
20070007986 - Apparatus for hot-probing integrated semiconductor circuits on wafers: An apparatus for hot-probing integrated semiconductor circuits on wafers is disclosed that includes a support device for accommodating the wafer, a measurement card with electronic circuitry for functional verification of the integrated semiconductor circuits on the wafers, and a test head with contact needles which establishes an electrical contact between... Agent: Mcgrath, Geissler, Olds & Richardson, PLLC
20070007988 - Lsi inspection method and defect inspection data analysis apparatus: The present invention provides an LSI inspection method and a defect inspection data analysis apparatus capable of shortening a time needed for a wafer test. In a first database 11 is stored inspection data obtained when each defect inspection apparatus 20 inspects a wafer for defects in the front-end process.... Agent: Crowell & Moring LLP Intellectual Property Group
20070007981 - Optimize parallel testing: Parallel dies testing, mostly implemented on memory ICs—Integrated Circuits, significantly reduced overall test time. In order to minimize the need for physical probing, wafer probe card technology to allow simultaneous probing, ATE—Automated Test Equipment with enough channels and CPU power to handle the parallel testing. While new devices are designed... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw
20070007985 - Semiconductor integrated circuit device: Provided are external input/output signal terminals, an interface circuit including a plurality of unit input/output circuits accompanying the respective signal terminals, a memory macro, a BIST (built-in self-test) circuit for performing a self test of the memory macro, and a logic circuit including a plurality of circuit blocks for generating... Agent: Mcdermott Will & Emery LLP
20070007983 - Semiconductor wafer tester: A test head is described for simultaneous test and/or burn-in of all of the chips on a semiconductor product wafer. The test head is suitable for testing wafers containing high powered chips such as microprocessors. A stimulus wafer is supported on a base with connections for power plus an interface... Agent: Edward N. Bachand Dorsey & Whitney LLP
20070007984 - Socket for inspection apparatus: A socket for an inspection apparatus for connecting an inspection circuit board and an inspected device includes: a plate-like housing including a first surface opposed to a surface on which a terminal of the inspected device is disposed and a second surface opposed to a surface on which an electrode... Agent: Osha Liang L.L.P.
20070007989 - System for measuring signal path resistance for an integrated circuit tester interconnect structure: Resistances of signal paths within a interconnect structure for linking input/output (I/O) ports of an integrated circuit (IC) tester to test points of an IC are measured by the IC tester itself. To do so the interconnect structure is used to link the tester's I/O ports to a similar arrangement... Agent: N. Kenneth Burraston Kirton & Mcconkie
20070007987 - System for testing semiconductor components: A system for testing semiconductor components includes an interconnect, an alignment system for aligning a substrate to the interconnect, a bonding system for bonding the component to the interconnect, and a heating system for heating the component and the interconnect for separation. The interconnect includes interconnect contacts configured for bonding... Agent: Stephen A Gratton The Law Office Of Steve Gratton
20070007982 - Test head for semiconductor integrated circuit tester: A test head for a semiconductor integrated circuit tester includes a main support structure defining a device interface board location, and a contact support frame that is displaceable relative to the main support structure for engaging a device interface board at the device interface board location. The contact support frame... Agent: Smith-hill And Bedell, P.C.
20070007990 - Testing device with plural lenses: An exemplary testing device (2) includes plural lenses (22) for inspecting a display of a liquid crystal display (LCD) display (90), and analyzing devices (25) for receiving data obtained by the lenses and analyzing the data. The testing device including the plural lenses can collect a group of data simultaneously,... Agent: Wei Te Chung Foxconn International, Inc.01/04/2007 > 51 patent applications in 34 patent subcategories. USPTO class patent listing
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