Electricity: measuring and testing inventions 12/06

20060290338 - Device for determining constant of rotating machine: A device for determining a constant of a rotating machine according to the invention includes: test number selecting means 1 for outputting a test number n, selected from 1 to N (N≧2), and outputting a phase signal q determined by a predetermined condition previously set based on the test number... Agent: Leydig Voit & Mayer, Ltd

20060290339 - Measuring a capacitive property of a communication line: A method measures at least one capacitive property of a communication line. The communication line includes a first line and a second line. The method includes applying at least a first voltage ramp to at least one of the first line and the second line, measuring at least a first... Agent: Dicke, Billig & Czaja, P.l.l.c.

20060290340 - Solenoidal hall effects current sensor: A device for measuring anode tube current or filament current in an X-ray tube, comprising a coil of wire wrapped around an insulating tube to generate a solenoidal magnetic field, one or more pieces of magnetic material and insulating material located within the tube (which magnetic elements may have their... Agent: James G. Coplit, Esq. Grimes & Battersby, LLP

20060290341 - Method and device for measuring a current flowing in an electrical conductor: A device for measuring a current flowing in an electrical conductor having a sensor disposed in the region of the electrical conductor for measuring the magnetic field surrounding the electrical conductor. The sensor includes a magnetic circuit having a first and a second section. A magnetizing device for the saturation... Agent: Wolf Greenfield & Sacks, PC

20060290344 - Measurement method using solar simulator: This invention provides a solar simulator measurement method capable of high-accuracy measurements with fast-response photovoltaic devices as well as with slow-response photovoltaic devices, and a solar simulator for implementing the method. A flash having a pulse waveform with a flattened peak is generated from a xenon lamp 1. The flash... Agent: Smith Patent Office

20060290345 - Measuring cell holding mechanism and biosensor: A measuring cell holding mechanism, comprising a measuring cell which is configured to include a dielectric block in which a flat face on which a ligand to be attached is formed, and a flow path member which constitutes a flow path between it and this flat face; a dielectric block... Agent: Sughrue Mion, PLLC

20060290342 - Multi-mode switch for plasma display panel: A claimed multiple mode switch includes an input signal interface for receiving first and second input signals and producing a combined input signal; a driving circuit for receiving the combined input signal and producing driving signals accordingly; a resistor mode circuit electrically connected to a first output of the driving... Agent: North America Intellectual Property Corporation

20060290343 - Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures: A wafer-scale probe card for temporary electrical contact to a sample wafer or other device, for burn-in and test. The card includes a plurality of directly metallized single-walled or multi-walled nanotubes contacting a pre-arranged electrical contact pattern on the probe card substrate. The nanotubes are arranged into bundles for forming... Agent: Heslin Rothenberg Farley & Mesiti PC

20060290346 - Sensor unit with staggered actuation faces: An inductive sensor for detecting the position of a vehicle seat or for a gate shifting unit of an automatic transmission is described. The inductive sensor unit has a plurality of sensor coils that are disposed in planar fashion on a printed circuit board A conductive actuation element is guided,... Agent: Miles & Stockbridge PC

20060290347 - Printed circuit card-based proximity sensor and associated method of detecting a proximity of an object: A proximity sensor assembly includes a multilayer printed wiring board proximity sensor, the proximity sensor being operable as either a variable-reluctance sensor or an eddy current loss sensor. The proximity sensor includes a plurality of layers configured to form at least one wound coil disposed about at least a portion... Agent: Alston & Bird LLP

20060290348 - Magnetic sensor, and method of compensating temperature-dependent characteristic of magnetic sensor: A magnetic sensor 10 includes GMR elements 11-18, and heating coils 21-24 serving as heat generating elements. The elements 11-14 and 15-18 are bridge-interconnected to constitute X-axis and Y-axis sensors, respectively. The heating coils 21, 22, 23, and 24 are disposed adjacent to the elements 11 and 12, the elements... Agent: Dickstein Shapiro Morin & Oshinsky, LLP

20060290349 - Magnetoresistive sensor based eddy current crack finder: An apparatus for nondestructive detecting of cracks in lapped electrically conductive upper and lower plates characterized by a probe having a square shape drive coil and a magnetoresistor sensor aligned with the longitudinal axis of the drive coil. The drive coil is intended to extend across the lap joint above... Agent: Arthur Freilich

20060290350 - Method and apparatus for reservoir fluid characterization in nuclear magnetic resonance logging: A method and apparatus for obtaining a parameter of interest relating to a region proximate a nuclear magnetic resonance (NMR) logging tool suitable for subterranean well logging is disclosed. The nuclei of the region are subjected to a pulsed NMR technique and are productive of NMR logging data, the nuclei... Agent: Cantor Colburn LLP- Baker Atlas

20060290351 - Superconducting magnet apparatus for mri: In a superconducting magnets for MRI configured to generate a homogeneous magnetic field and a gradient magnetic field in a space between a top superconducting magnet and a bottom superconducting magnet, the bottom superconducting magnet is provided with a supporting member that supports a helium vessel, and the supporting member... Agent: Buchanan, Ingersoll & Rooney PC

20060290352 - Probe head for nuclear magnetic resonance measurements: A probe head for nuclear magnetic resonance measurements in an area of a surface of a measuring object is disclosed. The probe head comprises first means for generating a static magnetic field extending at least partially parallel to the surface, second means for generating a radio frequency magnetic field having... Agent: Rissman Jobse Hendricks & Oliverio, LLP

20060290354 - Highly integrated logging tool: An apparatus for logging a formation traversed by a borehole includes a plurality of logging tools adapted for conveyance inside the borehole. The plurality of logging tools includes a tool body, a sensing pad responsive to a density property of the formation coupled to the tool body, a current emitting... Agent: Schlumberger Oilfield Services

20060290353 - Pad assembly for logging tool: An apparatus for logging a formation traversed by a borehole includes a tool adapted for conveyance inside the borehole, a tool bias mechanism comprising a flexible member coupled to a first side of the tool body and adapted to urge a second side of the tool body into contact with... Agent: Schlumberger Oilfield Services

20060290355 - Method and apparatus of detecting voltage for battery pack: Disclosed is a method and apparatus of detecting voltage of a battery cell in consideration of impedance of conductive wires connecting a plurality of battery cells constituting the battery pack. The method of detecting voltage of at least one battery cell in a battery pack, in which the battery cell... Agent: Cantor Colburn, LLP

20060290356 - Cable diagnostics using time domain reflectometry and application using the same: A system and method are used to determine connectivity and/or cable faults of a cable. A signal transmitting and receiving system is coupled to the cable. An analog-to-digital converter (ADC) coupled to the signal transmitting and receiving system. A TDR system coupled to the ADC and a memory, and a... Agent: Sterne, Kessler, Goldstein & Fox PLLC

20060290357 - Wideband active-passive differential signal probe: A wideband differential signal probe includes separate paths to respectively convert lower and higher frequency components of a differential signal to lower and higher frequency single ended signals that are combined for the probe's output.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20060290358 - Method and circuit for measuring characteristic parameters of intermodulation distortion: An arrangement is for measuring characteristic parameters of intermodulation distortion of a device under test. The arrangement may include a generator of at least two tones at different test frequencies, and an attenuation path feeding the device with a replica of the two tones attenuated of a factor equal to... Agent: Allen, Dyer, Doppelt, Milbrath & Gilchrist P.A.

20060290359 - Operating element with a proximity sensor and shield: An operating element, in particular for a motor vehicle component, includes an actuating element that is movably supported in a carrier element and acts, in particular, on a switch element. To detect an approach of a user to the operating element, but at the same time to prevent a misdetection... Agent: Cohen, Pontani, Lieberman & Pavane

20060290360 - Capacitive soil moisture sensor: A capacitive soil moisture sensor that is easy to install, does not require complex calibration, can sense moisture at a particular depth, can accommodate soils of different composition, does not alter soil densities, provides fast response to changes in moisture and provides stable long term use. The sensor comprising of... Agent: Fu Ching Lee

20060290361 - A semiconductor integrated circuit tester channel with selective bypass circuitry: A tester channel including a selective bypass circuit. The selective bypass circuit includes a capacitor, two ferrite beads, and a solid-state relay. The capacitor is connected between a pin electronics circuit and an I/O terminal. One ferrite bead is connected between the pin electronics side of the capacitor and one... Agent: Smith-hill And Bedell, P.C.

20060290364 - Cable terminal with flexible contacts: A cable assembly connector has a body with a number of contact elements connected to the body. Each of the contact elements is an elongated conductor formed into a serpentine shape, and has a contact end portion protruding from the body. The contact end portion of each contact element includes... Agent: Langlotz Patent Works, Inc.

20060290363 - Micro kelvin probes and micro kelvin probe methodology: A micro Kelvin probe assembly and method of accomplishing a micro Kelvin measurement that determines the resistance or impedance of a device under test (DUT) that has two spaced contacts. An ammeter is used to flow current through the DUT, and a voltmeter is used to measure the voltage drop... Agent: Brian M. Dingman, Esquire Mirick, O'connell, Demallie & Lougee, LLP

20060290362 - Probe for use in determining an attribute of a coating on a substrate: A probe provides electrical communication between a coating and a processing system. One optional feature includes an outwardly projecting, electrically conductive engaging member that is held in a captivation structure releasably retained in a housing and engages a contact that is inside the probe and connected with the processing system.... Agent: Wood, Phillips, Katz, Clark & Mortimer

20060290366 - Monitoring multiple electronic devices under test: An apparatus and method for monitoring temperatures of multiple electronic devices under test are described herein.... Agent: Schwabe, Williamson & Wyatt

20060290365 - System and method for testing a processor: A processor comprises a chip, a temperature sensing device, a processor core, and a controller. The temperature sensing device, the processor core, and the controller are integrated on the chip. The controller is configured to set, based on the temperature sensing device, the processor core to a plurality of specified... Agent: Hewlett Packard Company

20060290367 - Method and apparatus for adjusting a multi-substrate probe structure: A probe card assembly comprises multiple probe substrates attached to a mounting assembly. Each probe substrate includes a set of probes, and together, the sets of probes on each probe substrate compose an array of probes for contacting a device to be tested. Adjustment mechanisms are configured to impart forces... Agent: N. Kenneth Burraston Kirton & Mcconkie

20060290368 - Circuit board test device comprising contact needles which are driven in diagonally protruding manner: The invention relates to printed circuit board test devices (1) comprising a support (4) receiving a circuit board (5) by said board's edges, said board being designed to be fitted as needed with electrical or electronic components (20), said devices further comprising at least one needle (15) which is connected... Agent: Rankin, Hill, Porter & Clark LLP

20060290369 - Electronic part test device: An electronic device test apparatus for testing IC chips (IC) by pushing their input/output terminals (HB) against contact units of a test head, provided with a test plate (110) compraised holders (113) for holding back surfaces of IC chips (IC) where no input/output terminals (HB) are led out with substantially... Agent: Birch Stewart Kolasch & Birch

20060290372 - Packaging reliability super chips: A test chip module for testing the integrity of the flip chip solder ball interconnections between chip and substrate. The interconnections are thermally stressed through an array of individual heaters formed in a layer of chip metallurgy to provide a uniform and ubiquitous source of heat. Current is passed through... Agent: John A. Jordan, Esq.

20060290373 - Semiconductor integrated circuit apparatus, measurement result management system, and management server: An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors. A semiconductor integrated circuit that is an object of measurement, and a measurement... Agent: Sughrue Mion, PLLC

20060290370 - Temperature control in ic sockets: A system and method are provided which provides more accurate temperature control of integrated circuits. A system for testing integrated circuit (IC) packages comprises a plurality of IC testing socket bases arranged on a testing board and configured to receive a plurality of IC packages. A plurality of IC testing... Agent: Marger Johnson & Mccollom, P.C.

20060290371 - Testing apparatus and testing method using the same: An exemplary testing apparatus (200) for testing electronic device (280) includes a workbench (210), a conveyance board (221) for supporting the electronic device to be tested and a testing device (270). The conveyance board is slidably positioned on the workbench. The testing apparatus further includes an automatic detection device (250),... Agent: Wei Te Chung Foxconn International, Inc.

20060290374 - Ultra-thin alphanumeric display: An alphanumeric display includes a substrate that has top and bottom surfaces, a plurality of electrical contacts on the top surface, a plurality of light-emitting electronic devices mounted on the top surface, and a plurality of electrical pads on the bottom surface. The electrical contacts are connected to at least... Agent: Drinker Biddle & Reath Attn: Intellectual Property Group

20060284610 - Method of and apparatus for determining if a buried current carrying conductor is buried above predetermined minimum depth: A detector 1 for detecting a current carrying conductor has a pair of vertically spaced antennae 3, 5 to detect the magnetic radiation produced by a current carrying conductor as a result of one or both of the mains power supply or an electromagnetic signal which is induced in the... Agent: Baker & Hostetler LLP

20060284611 - Current sensor having hall element: A current sensor includes: a current path; a semiconductor substrate; and a Hall element on the substrate. The Hall element detects a magnetic flux in a magnetic field caused by a detection object current. The Hall element generates a Hall voltage corresponding to the magnetic flux when a driving current... Agent: Posz Law Group, PLC

20060284613 - Magnetic flux concentrator anti-differential current sensor: A system and method for current sensing includes a conductor configured to receive current flow therethrough and generate magnetic flux thereabout. The current sensor system also includes an anti-differential current sensor configured to monitor magnetic flux about the conductor. The anti-differential current sensor includes a pair of current sensors in... Agent: Ziolkowski Patent Solutions Group, Sc (eaton)

20060284612 - Method for testing a hall magnetic field sensor on a wafer: A method for testing a Hall magnetic field sensor on a wafer includes generating a current flow in a Hall plate of the Hall magnetic field sensor. At least one voltage value across first and second nodes is measured and a measured voltage signal is provided indicative thereof. An electrical... Agent: O'shea, Getz & Kosakowski, P.C.

20060284614 - Method and apparatus of controlling for charging/discharging voltage of battery: Disclosed is an apparatus and method for controlling the discharge or charge power of a battery, capable of preventing over-charge and over-discharge of battery cells according to states of the battery cells, and solving a problem that the lifetime of a conventional battery pack is rapidly reduced due to the... Agent: Cantor Colburn, LLP

20060284615 - Method for spectrally selective b1 insensitive t2 preparation contrast enhancement for high field magnetic resonance imaging: A T2 preparation sequence uses a segmented BIR-4 adiabatic pulse with two substantially equal delays and is insensitive to B1 field variations and can simultaneously suppress fat signals with low specific absorption rate (SAR). An adiabatic reverse half passage pulse is applied followed by a predetermined delay. An adiabatic full... Agent: Klarquist Sparkman, LLP

20060284616 - Method of and apparatus for detecting a current carrying conductor: A detector 1 for detecting a current carrying conductor determines the presence of a current carrying conductor one or more of passive or active modes. In the passive modes, the detector 1 detects either very low frequency radio signals re-radiated from a conductor or electromagnetic radiation produced by a conductor... Agent: Baker & Hostetler LLP

20060284617 - Model-based predictive diagnostic tool for primary and secondary batteries: An apparatus for determining a condition parameter of a battery, receives measurement signals related to the battery, determines input data such as electrical impedance from the measurement signals, and provides the input data to a plurality of different prediction algorithms, wherein each prediction algorithm provides a condition parameter estimate. A... Agent: Gifford, Krass, Groh, Sprinkle & Citkowski, P.c

20060284618 - Method and apparatus for estimating maximum power of battery by using internal resistance of the battery: Disclosed is a method for estimating the maximum power of a battery, which can inexpensively perform an estimation of the maximum power of a battery in a relatively simple manner of using the internal resistance of the battery, which has a correlation with and a largest effect on the maximum... Agent: Cantor Colburn, LLP

20060284619 - Battery management system with predictive failure analysis: The invention relates to the management of large stationary batteries. The invention is a comprehensive system and process for the management of stationary batteries that are used for backup power and are deployed in widely dispersed locations. The system is comprised of Mega-Tags, a battery testing and data acquisition device,... Agent: Peter S. Canelias Law Offices Of Peter S. Canelias

20060284620 - Simultaneous measurement of contact potential and slider body clearance in a magnetic disk drive: A method for simultaneously measuring contact potential and slider body clearance in a hard disk drive. In embodiments of the present invention, a plurality of direct current (DC) pulses are applied between a slider body and a hard disk of a magnetic disk drive. The contact potential voltage between the... Agent: Wagner, Murabito & Hao, LLP

20060284621 - Method for calibrating timing clock: A method for calibrating a timing clock is provided. The method includes: calibrating a shift amount of an edge of a shift clock by using a period of the timing clock as a reference by detecting an edge of the timing clock more than once while changing the shift amount... Agent: Osha Liang L.L.P.

20060284622 - Capacitively coupled position encoder: One embodiment of the present invention comprises a sensor with a face having several tracks spaced apart from one another. One of these tracks has a first electrode and a second electrode separated by an electrically nonconductive gap. Also included is a detection device extending across the tracks to receive... Agent: Krieg Devault LLP

20060284624 - Bar code interrogation system: Presented is a system and method for reading a microwave readable barcode formed from a pattern of dielectric material. The dielectric pattern creates a strong microwave contrast with the surrounding media selectively resonating with or scattering an interrogating microwave signal. Dielectric bars can be fabricated by inkjet printing, injection, spraying,... Agent: Darby & Darby P.C.

20060284623 - Method of interrogating a barcode: Presented is a system and method for reading a microwave readable barcode formed from a pattern of dielectric material. The dielectric pattern creates a strong microwave contrast with the surrounding media selectively resonating with or scattering an interrogating microwave signal. Dielectric bars can be fabricated by inkjet printing, injection, spraying,... Agent: Darby & Darby P.C.

20060284625 - Method and system for measuring laser induced phenomena changes in a semiconductor device: A method and system for measuring laser induced phenomena changes of at least one of a resistance, a capacitance and an inductance in a semiconductor device. The method comprises interconnecting an electrical bridge circuit across the semiconductor device, the semiconductor device being connected as one of at least four circuit... Agent: Townsend And Townsend And Crew, LLP

20060284626 - Protection against the effects of condensate bridges: Apparatus for measuring and/or monitoring a process variable of a medium. The apparatus includes: an oscillatable unit; a driver/receiver unit, which excites the oscillatable unit to oscillate, and/or which receives its oscillations; a control/evaluation unit, which controls the driver/receiver unit, and/or which evaluates the oscillations of the oscillatable unit; and... Agent: Bacon & Thomas, PLLC

20060284627 - Apparatus for correcting electrical signals: A novel electrical circuit is disclosed that corrects for at least one undesired characteristic in an incoming electrical signal. In one embodiment, the apparatus reduces the number of wires heretofore required to correct electrical signals in a circuit. The apparatus also corrects for one or more of a second-order error... Agent: Jaquez & Associates Suite 100d

20060284628 - Super element for the prediction of viscosity effect on crystal plate: A technique to calculate or predict the electric impedance and motional capacitance of resonating crystal plate using a “super element” enables significantly more accurate determination of these characteristics. A set of successively high-order two-dimensional equations is first derived from the three-dimensional equations of linear piezoelectricity with structural viscosity taken into... Agent: Epson Research And Development Inc Intellectual Property Dept

20060284630 - Membrane probing system: A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal conductor located between a pair... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20060284629 - Wafer-level tester with magnet to test latching micro-magnetic switches: A method, system, and apparatus for testing one or more micro-magnetic switches on a wafer is described. A magnet is positioned adjacent to a first switch on the wafer. A probe card is positioned adjacent to the first switch. The probe card mounts a first set of probes and a... Agent: Sterne, Kessler, Goldstein & Fox PLLC

20060284631 - Imaging test socket, system, and method of testing an image sensor device: A test socket, a test system and methods of testing an image sensor or other optically interactive device. The test system may include a light source for illuminating the image sensor device. A diffuser may be provided to scatter the light. A test socket may include an area configured for... Agent: Trask Britt, P.C.

20060284636 - Adjustment and display of stored parameters: The invention relates to a digital control circuit for an electrical machine. The digital control circuit comprises a processor arranged to execute a control or protection algorithm for the electrical machine. The circuit has an output to enable a value of at least one digital parameter of the algorithm to... Agent: Hamre, Schumann, Mueller & Larson, P.C.

20060284637 - Circuit for compression and storage of circuit diagnosis data: A compactor includes test data inputs that are connectable to circuit outputs of an electrical circuit, test comparison inputs, and test data outputs. The compactor further includes a number of H matrix XOR gates arranged as a switching mechanism between the test data inputs and the test data outputs such... Agent: Edell, Shapiro & Finnan, LLC

20060284638 - Continuity tester adaptors: An electrical continuity tester adaptor for attaching to a conventional continuity tester comprising first, second and third members. The first member is operably configured to engage a female F-type connector. The second member is operably configured to engage a female RJ series type connector. The third member includes a plurality... Agent: Gross & Associates

20060284643 - Method for inspecting array substrates: A method for inspecting array substrates, which includes a first array substrate having first pads and first electrodes, and a second array substrate having second pads and second electrodes, the method comprising connecting the first pads to terminals formed an array of inspection pad groups and disposed in a predetermined... Agent: C. Irvin Mcclelland Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20060284642 - Method of inspecting array substrate and method of manufacturing array substrate: A method of inspecting an array substrate which comprises a substrate, a plurality of scanning lines formed on the substrate and extending in a row direction, a plurality of signal lines extending in a columnar direction to intersect the scanning lines, and a plurality of pixel portions formed on the... Agent: C. Irvin Mcclelland Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20060284639 - Methods and systems for guarding a charge transfer capacitance sensor for proximity detection: Methods, systems and devices are described for determining a measurable capacitance for proximity detection in a sensor having a plurality of sensing electrodes and at least one guarding electrode. A charge transfer process is executed for at least two executions. The charge transfer process includes applying a pre-determined voltage to... Agent: Ingrassia Fisher & Lorenz, P.C.

20060284641 - Multi-signal input testing apparatus: An exemplary multi-signal input testing apparatus (2) includes a testing table (20), a transfer table (21) slidably positioned on the testing table, and a pair of multi-signal input devices (25) arranged on the transfer table. Each multi-signal input device includes a pair of connect ends (251, 252). One of the... Agent: Wei Te Chung Foxconn International, Inc.

20060284632 - Portable multi-purpose toolkit for testing computing device hardware and software: A testing device for determining the condition of hardware and/or software components of a computing (target) device is disclosed. The testing device includes a memory component, at least one connector and I/O software suitable for enabling the testing device to communicate with a target device as though the testing device... Agent: Christensen, O'connor, Johnson, Kindness, PLLC

20060284635 - Re-routing method and the circuit thereof: A re-routing method and the circuit thereof, used to rearrange the external circuit coupled with the integrated circuit (IC), comprises the steps of providing a plurality of first conductive plate on the substrate of the IC to form an isolation layer; providing a plurality of second conductive plates on the... Agent: Rosenberg, Klein & Lee

20060284640 - Structure of circuit board and method for fabricating the same: A structure of a circuit board and a method for fabricating the same are proposed. A first and a second dielectric layers are formed on a first and a second carrier boards respectively, and a first and a second circuit layers are formed on the first and second dielectric layer... Agent: Mr. Joseph A. Sawyer, Jr. Sawyer Law Group LLP

20060284634 - Testing assembly for electrical test of electronic package and testing socket thereof: A testing assembly for an electrical test of an electronic package is provided. The testing assembly includes a testing circuit board and a testing socket mounted thereon. The testing socket includes an insulating body and a plurality of pins. The insulating body has a holding surface for supporting a contact... Agent: J.c. Patents, Inc.

20060284633 - Thin film transistor array panel with improved connection to test lines: A thin film transistor (TFT) array panel with improved contact between the display signal lines and test lines is presented. The TFT array panel includes: gate lines and data lines intersecting each other, switching elements connected to the gate lines and the data lines, and at least one test line... Agent: Dla Piper Rudnick Gray Cary Us, LLP

20060284644 - Collecting information to identify defective locations of a display monitor: Indications of user inputs with respect to a diagnostic image displayed on a display monitor are received to identify defective locations of the display monitor. Information is collected based on the received user inputs that identify defective locations of the display monitor.... Agent: Hewlett Packard Company

20060284645 - Liquid crystal display panel test apparatus: A liquid crystal display (LCD) panel test apparatus includes a testing table on which an LCD panel is positioned for testing. A photographing unit disposed over the testing table photographs the LCD panel, enabling an evaluation of the alignment state of the LCD panel. A jig pin in the testing... Agent: Brinks Hofer Gilson & Lione

20060284646 - Liquid-crystal display device, defective pixel examination method, defective pixel examination program, and storage medium: A defective pixel examination method includes the steps of applying different voltages to a capacitive element of a first pixel section and a capacitive element of a second pixel section among the plurality of pixel sections; turning on a switch provided between an input electrode of a pixel transistor in... Agent: Rader Fishman & Grauer PLLC

20060284647 - Sensor apparatus: A sensor apparatus for measuring power parameters on a power conductor, such as a high voltage transmission line may include a corona structure, an electronics assembly and a conductor mountable device. The corona structure may define an outer boundary surrounding the electronics assembly and the conductor mountable device. The corona... Agent: Brinks Hofer Gilson & Lione/pml Indianapolis Office

20060279271 - Electric field sensor with electrode interleaving vibration: An electric field sensor comprising: a substrate having a hole; a shielding electrode and a sensing electrode, disposed in the hole of the substrate; a piezoelectric bar having one end connected to the center of the shielding electrode, the other end fixed on the substrate. Present invention provides several electric... Agent: Westman Champlin & Kelly, P.A.

20060279272 - Method for determining the frequency response of an electrooptical component: The aim of the invention is to provide a method for determining the frequency response of an electrooptical component, particularly, for example, of a light-generating or light-modulating component, which is easy to carry out. To this end, the invention provides a method during which optical pulses with a pulse frequency... Agent: Rothwell, Figg, Ernst & Manbeck, P.C.

20060279273 - Measuring method for electromagnetic field intensity and apparatus therefor, measuring method for electromagnetic field intensity distribution and apparatus therefor, measuring method for current and voltage distributions and apparatus therefor: A measuring method for electromagnetic field intensity capable of easily and accurately measuring, with a compact and simple facility, each of the electric field component and the magnetic field component of an electromagnetic field formed in space is to be provided. By simultaneously measuring output currents O1 and O2 from... Agent: Lowe Hauptman Berner, LLP

20060279274 - Sampling apparatus, and testing apparatus: Each channel comprises: an AD converter which converts a signal value of a corresponding input signal into a digital value in response to a received sampling clock; a counter which counts the pulses of the sampling clock; memory which sequentially stores the digital values at addresses corresponding to the counted... Agent: Osha Liang L.L.P.

20060279275 - Signal measurement systems and methods: Signal measuring systems, and measurement methods are disclosed.... Agent: Law Offices Of Larry K. Roberts, Inc.

20060279277 - Inductor-type resolver: An inductor-type resolver capable of reducing a residual voltage by providing a correction winding inside the resolver is provided. Two magnetic pole portions 11 and 15 include winding portions W11 and W12, respectively, which constitute a first signal detecting winding W1. Two magnetic pole portions 13 and 17 include winding... Agent: Rankin, Hill, Porter & Clark LLP

20060279276 - Calibration of a hall effect sensor: An actuator having an output shaft, a motor for rotating the output shaft between a first position and a second position, and an electronic control module having a controller and a sensor. The sensor is configured to output a signal to the controller indicative of the position of the output... Agent: Macmillan, Sobanski & Todd, LLC

20060279278 - Determining of the absolute angular position of a steering wheel by means of an incremental measurement and the measurement of the differential velocity of wheels: The system for determining the absolute angular position θ of a steering wheel (1) of a motor vehicle with respect to the chassis thereof comprises a device for incrementally measuring the relative angular position δ of the steering wheel, a device (2) for measuring the differential velocity Δ V/V of... Agent: Arent Fox PLLC

20060279279 - Rotation sensing: A compact arrangement which enables rotation of a component (4) of an apparatus to be sensed is provided. A component adapted for use in such an arrangement comprises a body having an axis of rotation (6) and a plurality of discrete magnetised regions (8) thereon, each formed in a layer... Agent: Barnes & Thornburg LLP

20060279280 - Long magnetic sensor: A plurality of magnetosensitive portions of a plurality of magnetic resistance elements and a plurality of magnets are aligned substantially linearly to be perpendicular to a moving direction of a detection object, and directions of magnetic poles of the magnets are alternately inversed, such that directions of magnetic fluxes, which... Agent: Murata Manufacturing Company, Ltd. C/o Keating & Bennett, LLP

20060279281 - Mri/nmr side-by-side magnets for parallel analysis and industrial process and quallity control analysis: An industrial quality and process control (QPC) system, includes inter alia at least one packed array of MRI/NMR devices of substantially no fringing magnetic fields, adapted to analyze adjacent lines of goods simultaneously.... Agent: Gottlieb Rackman & Reisman PC

20060279282 - System and method for magnetic resonance imaging: The invention relates to a system and method for magnetic resonance imaging. In order to achieve high resolution imaging a magnetic resonance imaging system and method is proposed, wherein magnetic resonance signals using a first resonance frequency are used for a central portion of k-space and magnetic resonance signals using... Agent: Philips Intellectual Property & Standards

20060279285 - Gradient coil apparatus for magnetic resonance imaging system: A gradient coil apparatus for magnetic resonance imaging system comprising plurality of gradient coils 11a, 11b and 11c for applying a gradient magnetic field to a test object and an internal heat exchanger 14 to be immersed in insulation oil 13 in a container 12. A pump 16 is disposed... Agent: Mattingly, Stanger, Malur & Brundidge, P.C.

20060279283 - Magnetic resonance system with suppression of capacitive coupling between an rf source and the subject: An examination subject arranged in an examination volume of a magnetic resonance system can be excited to magnetic resonance by an RF transmission antenna. The RF transmission antenna is fashioned as a resonant structure that surrounds a central axis of the magnetic resonance system running within the examination volume. The... Agent: Schiff Hardin, LLP Patent Department

20060279284 - Wirelessly coupled magnetic resonance coil: This document discusses, among other things, a radio frequency magnetic coil is coupled to a wireless communication circuit. The wireless communication circuit allows control or monitoring of individual channels or other functions of a coil.... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.

20060279286 - Safety-protective changeover switch of a high voltage tester: A safety-protective changeover switch of a high voltage tester includes a start switch and a stop switch for controlling passage and cutting-off of high voltage. Both the switches have respectively two sets of connection points, which, through a reference voltage, pass a voltage signal to a control circuit, which then... Agent: Toxell Law Office PLLC Suite 1404

20060279288 - Apparatus and method for simulating a battery tester with a fixed resistance load: A method and apparatus for simulating a battery tester with a fixed resistance load, such as a widely used Japanese load tester that rates the strength of Japanese batteries that are categorized under the Japanese Industrial Standard (JIS), are provided. This invention simulates such a device without invoking large current... Agent: Westman Champlin & Kelly, P.A.

20060279287 - Query based electronic battery tester: An electronic battery tester for testing a storage battery provides a test output indicative of a condition of the battery. Electronic measurement circuitry provides a measurement output related to a condition of the battery. The battery condition is determined based upon one or more responses to one or more queries... Agent: Westman Champlin & Kelly, P.A.

20060279289 - Battery gas gauge: Full capacity determination in a battery gas gauge. Operations include measuring instantaneous open circuit voltage levels during an open circuit time interval for a specific battery cell and correlating such measurements to estimate values. Such estimated values may then be correlated to associated relative state of charge levels. Finally, a... Agent: Grossman, Tucker, Perreault & Pfleger, PLLC

20060279290 - Electric-field meter having current compensation: An electric-field meter provided with a housing, an electrode assembly, a shield assembly, a movement assembly, a position detection assembly, a charge measurement circuit, and a leakage current compensation circuit. The electric-field meter can be characterized as a field mill, an induction voltmeter, an electrostatic fluxmeter or an agrimeter. The... Agent: Dunlap, Codding & Rogers P.C.

20060279291 - Mobile testing device: A portable testing device is provided to verify the operational status, as either functional or non-functional, of lights and brake equipment on a vehicle. The mobile testing device 10 for testing a lighting and brake system of a vehicle, comprising means for coupling the mobile testing device 10 to said... Agent: John W. Goldschmidt, Jr. Esquire Dilworth Paxon LLP

20060279292 - Method and apparatus for measuring a dielectric response of an electrical insulating system: Method and device for measuring a dielectric response of an electrical insulating system, wherein a first measurement result is determined by a frequency domain method and a second measurement result is determined by a time domain method, whereupon the first measurement result and the second measurement result are combined to... Agent: Edwards & Angell, LLP

20060279293 - Apparatus for current sensing: Apparatus for sensing a current across a known resistor comprising a switched capacitor network and an amplifier having an input coupled to an output of the switched capacitor network. The switched capacitor network is configured to sample first and second reference potentials indicating the current. The amplifier is configured to... Agent: Ingrassia, Fisher & Lorenz, P.C.

20060279294 - Method for alerting physical approach: A method and apparatus is described to detect the physical approach. The method is useful for passively detecting the presence of people, pets, or robots in proximity to a sensor. It is portable, and functions while being carried or placed inside objects.... Agent: Thomas G. Cehelnik

20060279295 - Probe based information storage for probes used for opens detection in in-circuit testing: Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory.... Agent: Agilent Technologies, Inc. Legal Department, Dl429

20060279296 - Backlight unit for flat panel display and flat panel display apparatus having the same: A backlight unit for a flat panel display and a flat panel display apparatus having the same. The backlight unit for a flat panel display includes a light source emitting light, a light guide panel having an incident surface facing the light source and totally reflecting light incident through the... Agent: Sughrue Mion, PLLC

20060279297 - Contactless area testing apparatus and method utilizing device switching: A probe is locatable adjacent a selected region of a device under test (DUT), the selected region having a plurality of contacts. A generator is capable of establishing a plume of a ionized gas between the probe and the selected region of the DUT, the plume having sufficient cross-sectional area... Agent: Agilent Technologies Inc.

20060279301 - Electrical contact probe with compliant internal interconnect: A compliant electrical interconnect having a first component and a second component interlockingly engaged with the first component. Each component has two cantilever arms lockingly engaged and continuously biased against each other. Contact springs are captivated by the cantilever arms providing a contact force for the first and second components.... Agent: Christie, Parker & Hale, LLP

20060279299 - High frequency probe: A high frequency probe has contact tips located within the periphery of a terminal section of a coaxial cable and shielded by a ground conductor of the coaxial cable.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20060279298 - Measurement method for compensation and verification: A measurement method for compensation for short-circuit compensation or load compensation or a measurement method for verification uses a device for measuring impedance by probing an impedance standard substrate using contact probes, and comprises a step whereby contact sites for probing the impedance standard substrate are input and an alarm... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20060279302 - Probe card and method for using probe card, wafer prober utilizing same: An apparatus for use with a wafer prober and a probe card comprising a stiffening member having a feature defining a first plane. The stiffening member is mountable atop the central portion of the probe card. A reference member is provided to mount to the wafer prober and has an... Agent: Edward N. Bachand Dorsey & Whitney LLP

20060279300 - Probe card assembly and kit: In a probe card assembly, a series of probe elements can be arrayed on a silicon space transformer. The silicon space transformer can be fabricated with an array of primary contacts in a very tight pitch, comparable to the pitch of a semiconductor device. One preferred primary contact is a... Agent: N. Kenneth Burraston Kirton & Mcconkie

20060279303 - Manufacturing method for semiconductor device: A Manufacturing method for a semiconductor device is provided and includes examining a semiconductor element on a semiconductor wafer, by an on-wafer test, storing on-semiconductor-wafer coordinate position data of the semiconductor devices and a result of the on-wafer test, and incorporating the semiconductor element, divided as individual pieces by dicing... Agent: Sughrue Mion, PLLC

20060279304 - Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus: A contact terminal for measurement is provided, for transmitting a signal between a desired probe pin among a plurality of probe pins arranged in parallel at a predetermined distance in a predetermined direction on the surface of a probe substrate and an external measurement apparatus. The contact terminal for measurement... Agent: Osha Liang L.L.P.

20060279307 - Automatic testing apparatus and method: An automatic testing apparatus (200) includes a transmission floor (210), a board (220), a stopping unit (230), and a testing device (260) beside the transmission floor. The transmission floor includes a plurality of rollers (211) positioned at two sides thereof. The board positioned on the rollers includes an I/O (input/output)... Agent: Wei Te Chung Foxconn International, Inc.

20060279305 - Semiconductor test interface: The present invention relates to a semiconductor test interface for interfacing a DUT (Device Under Test) to a pin card using a cable comprising a DUT board including one or more first connectors for electrically connecting one or more test sockets for mounting the DUT to the one or more... Agent: Sughrue Mion, PLLC

20060279306 - Test equipment of semiconductor devices: An test equipment includes a tester board that can be housed in a chamber, a plurality of sockets that are attached on a first main surface of the tester board and mounted respectively with semiconductor devices to be tested, a plurality of device testing units that are attached on a... Agent: Mcdermott Will & Emery LLP

20060279319 - Electronic component test system: A system for testing a die (or chip) of a semiconductor wafer is disclosed. It features measuring the temperature of the die according to a light beam radiated from the die. The temperature so measured functions as part of test record and/or the basis for controlling the temperature of the... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20060279308 - Electronic device having an interface supported testing mode: A system is provided for testing a first integrated circuit chip associated with at least a second integrated circuit chip in a semiconductor device, wherein at least some external terminals for the semiconductor device are to be shared by the first and second integrated circuit chips, and wherein the first... Agent: Carr & Ferrell LLP

20060279309 - Method and storage device for testing a v-chip: A method and storage device for testing a V-Chip is disclosed. The storage device is operated with a reading device and a display device configured with the V-Chip. The storage device stores a plurality of testing frames and each of the testing frames includes a testing control signal. Thus, when... Agent: Bacon & Thomas, PLLC

20060279310 - Method and system for monitoring test signals for semiconductor devices: A semiconductor device tester includes a parametric measurement unit (PMU) driver circuit that provides a DC test signal for testing a semiconductor device, and a feedback circuit that senses the DC test signal at an output of the PMU driver circuit and sends the sensed DC test signal to an... Agent: Fish & Richardson P.C.

20060279312 - Mini wave soldering system and method for soldering wires and pin configurations: A mini wave solder system includes a dielectric substrate having a hole defined therethrough, a conductive heat transfer pad, and a conductive retention pad. A conductive material is associated with the hole. The heat transfer pad and retention pad are disposed adjacent to the hole and the retention pad has... Agent: Jones Day

20060279320 - Non-abrasive electrical test contact: A hybrid non-abrasive electrical test contact element of a test socket is taught. Unlike cantilever contact elements of the prior art, the contact element of the present invention is able to contact a lead of an integrated circuit device under test without abrading the plating on the lead. This is... Agent: Lawrence Y.d. Ho & Associates Pte Ltd

20060279315 - Semiconductor device and method for manufacturing semiconductor device: A semiconductor device includes a semiconductor chip and a wiring substrate. The wiring substrate is configured to be electrically connected to the semiconductor chip, and have a plurality of terminals arranged on an surface opposite to a surface on which the semiconductor chip is mounted. The plurality of terminals includes... Agent: Sughrue Mion, PLLC

20060279318 - Semiconductor device for reducing soft error rate with reduced power consumption: A semiconductor device is composed of a first circuit receiving a first power supply voltage; and a second circuit receiving a second power supply voltage. The second power supply voltage is higher than the first power supply voltage. Such device arrangement is effective for reducing the soft error rate, when... Agent: Sughrue Mion, PLLC

20060279311 - Semiconductor wafer metrology apparatus and methods: The invention relates to the use of the metrology methods and the related apparatus disclosed herein that incorporate thermal treatment devices and methods that improve defect detection. Specifically, in one aspect the invention relates to method of thermally treating a semiconductor wafer such that an acceleration of interstitial defect migration... Agent: Kirkpatrick & Lockhart Nicholson Graham LLP

20060279316 - Surface-mounted electrical connector: A contactor (20) has a joint portion (27) which is jointed to each contactor pad (32) of one wiring board (30) by using a solder at one end portion thereof and a connecting portion (24) which is dip-soldered in each through hole (35) of the other wiring board (33) at... Agent: Takeuchi & Kubotera, LLP

20060279317 - Test apparatus capable of accurately connecting a test object to a substrate: In a test apparatus for testing a test object, a connector is held by an inner frame of the test apparatus and electrically connected to a substrate. A pusher is slidably held by the inner frame. The pusher has an insertion slot for receiving the test object. The pusher and... Agent: William Collard Collard & Roe, P.C.

20060279313 - Test circuit, electro-optical device, and electronic apparatus: A test circuit for detecting an output signal from a driving circuit includes a judging circuit which outputs a detection signal when the output signal output from the driving circuit has one polarity, but does not output the detection signal when the output signal has the other polarity, and an... Agent: Oliff & Berridge, PLC

20060279314 - Test supporting device and method of testing using the same: Provided are example embodiments of a test supporting device including a radio frequency (RF) line adapted to transmit an RF signal from an RF terminal to test equipment, a direct current (DC) line connected to the RF line at a first end and adapted to connect to the test equipment... Agent: Harness, Dickey & Pierce, P.L.C

20060279321 - Control system and control method for checking the function of liquid crystal displays: The invention proposes a method and a measuring system for testing the function of LCD displays comprising individual display segments, based on the difference in the electrical capacitance Cseg of defective and intact display segments. The method is based on the direct determination of the capacitance of the display segments... Agent: Baker & Daniels LLP

20060279322 - Testing circuit and testing method for liquid crystal display device: This invention discloses a testing circuit and a test method for a liquid crystal display device. The testing circuit for the liquid crystal display device comprises: a substrate, a plurality of pixels, a plurality of signal paths, and numbers of p shorting bars, wherein the plurality of pixels are formed... Agent: Rosenberg, Klein & Lee

20060279323 - Power apparatus for dividing high voltage: A power apparatus and method of use is provided for dividing a high voltage for a device such as a laser printer and a laser multifunctional peripheral device, and includes a dividing unit which divides an input voltage of a high voltage signal into a predetermined ratio and outputs the... Agent: Roylance, Abrams, Berdo & Goodman, L.L.P.

20060273779 - Method for determining the moment of closure of a circuit breaker on a high voltage line: P

20060273781 - Compensating for loss in a transmission path: An apparatus to compensate for loss in a transmission path includes a circuit block that incorporates time constants into a signal transmitted via the transmission path. The time constants counteract at least part of inherent time constants that contribute to loss in the transmission path. The circuit block includes a... Agent: Teradyne, Inc

20060273782 - Method of, and apparatus for, measuring the quality of a printed image: A method of measuring the quality of a printed image, including the steps of: providing a substrate with a printed image thereon; obtaining a digital image of a part of the printed image using an image obtaining apparatus; and measuring one or more physical characteristics of the obtained digital image... Agent: Macmillan Sobanski & Todd, LLC

20060273780 - Statistical method for identifying microcracks in insulators: One embodiment of the invention is a method for evaluating a material such as low-k dielectric, by a stress-generating test tool such as a needle. The evaluation object is shaped as a stack of adhering layers: low-k dielectric, first metal (preferably copper), barrier metal (preferably tantalum nitride), and second metal... Agent: Texas Instruments Incorporated

20060273783 - Dual load tester: The apparatus relates to a dual load tester that is hand held and highly portable. The dual load tester includes two resistive loads, and the two resistive loads may be used in series or one of the resistive loads may be used individually to test batteries, charging systems and starter... Agent: Posinelli Shalton Welte Suelthaus PC

20060273784 - Rotary position sensor: A robust, low cost, compact and highly accurate rotary position sensor is disclosed for measuring the relative angular position (within a range≦180°) of a housing or stator and a rotor. The housing carries a galvanomagnetic sensing element and is adapted for fixation to a relatively fixed portion of a host... Agent: Delphi Technologies, Inc.

20060273785 - Magnetic field sensing device: The invention is directed to a magnetic field sensing device (FSD) capable of visually indicating exposure to a magnetic field with a strength that exceeds a threshold value. The magnetic FSD comprises a magnetic layer magnetized in a pattern and a material positioned adjacent the magnetic layer to render the... Agent: Imation Corp.

20060273786 - Method of and apparatus for nuclear quadrupole resonance testing a sample: A method of nuclear quadrupole resonance testing a sample is disclosed in which the excitation applied to the sample is arranged so that phase and amplitude information may be obtained from the response signal, and in which the signal is resolved into two components. Particularly if a parameter such as... Agent: Pillsbury Winthrop Shaw Pittman, LLP

20060273787 - Correction of nmr artifacts due to axial motion and spin-lattice relaxation: NMR spin echo signals are corrected for axial motion of the borehole logging tool. The correction is applied to an averaged echo train using an average velocity determined from surface measurements over the duration of averaging of the echo trains. An additional correction may be applied to correct for excess... Agent: Madan, Mossman & Sriram, P.C.

20060273788 - Pore-scale geometric models for interpretation of downhole formation evaluation data: The grain size of a pore-scale geometric model of a clastic earth formation are adjusted so that the NMR relaxation time distribution output of the model matches a measured NMR distribution. Fluid drainage and imbibing can be simulated. Additional properties of the earth formation are predicted using the pore-scale model.... Agent: Madan, Mossman & Sriram, P.C.

20060273789 - Method of reconstructing an mr image: The invention relates to a method of reconstructing an MR image (14) from MR signals (1, 2, 3, 4) that are acquired in parallel by a plurality of receiving coils (5, 6, 7, 8) with incomplete sampling of the spatial frequency space, the reconstructed MR image (14) being calculated iteratively... Agent: Philips Intellectual Property & Standards

20060273790 - Mr. imaging method: The invention relates to a method for generating an MR image of an object situated in an examination volume of an MR apparatus. The method begins with the acquisition of a plurality of echo signals having at least two different echo-time values (ti, t2, t3), the echo signals being generated... Agent: Philips Intellectual Property & Standards

20060273791 - Randomized ordered k-space sub-sets for shared pre-pulses in mri: A magnetic resonance imaging scanner (10) includes a main magnet (12), magnetic field gradient coils (16), and one or more radio frequency coils (18). A sequence generator (60, 62, 64, 66) generates an anti-ghosting imaging sequence by dividing k-space into a plurality of profile sub-sets. The sequence generator (60, 62,... Agent: Philips Intellectual Property & Standards

20060273792 - Systems and methods for image reconstruction of sensitivity encoded mri data: Methods and systems in a parallel magnetic resonance imaging (MRI) system utilize sensitivity-encoded MRI data acquired from multiple receiver coils together with spatially dependent receiver coil sensitivities to generate MRI images. The acquired MRI data forms a reduced MRI data set that is undersampled in at least a phase-encoding direction... Agent: Knobbe Martens Olson & Bear LLP

20060273797 - Automated projection spectroscopy (apsy): A method of projection spectroscopy for N-dimensional NMR experiments with the following steps. Data recording comprising: a) selection of N-dimensional NMR experiments out of a group of N-dimensional experiments, selection of the dimensionalities (Di) of the projections and unconstrained selection of j sets of projection angles, with j≧2; b) recording... Agent: Kohler Schmid Moebus

20060273798 - Coil arrangement for magnetic resonance imaging apparatus: A coil arrangement is provided that is configured to be used with a magnetic resonance imaging system. The arrangement can include a first coil element and a second coil element positioned adjacent to the first coil element. The second coil element may be different in size from the first coil... Agent: Dorsey & Whitney LLP Intellectual Property Department

20060273796 - Magnetic resonance imaging apparatus: A magnetic resonance apparatus has a transmission and reception coil system and a gradient coil system that is designed to generate a gradient field that is periodic in one spatial direction. The gradient field and/or the examination subject can be displaced in the spatial direction of the periodicity to generate... Agent: Schiff Hardin, LLP Patent Department

20060273793 - Magnetic resonance imaging device with sound-absorbing means: The invention provides a magnetic resonance imaging (MRI) device (21), comprising a diagnostic space (25), a main magnetic system (22) for generating a main magnetic field in said diagnostic space, a gradient magnetic coil system (23) comprising a gradient coil for generating at least one gradient of the main magnetic... Agent: Philips Intellectual Property & Standards

20060273795 - Magnetic resonance imaging having radiation compatible radiofrequency coils: Improved compatibility of MRI with radiation imaging is provided by MRI RF coils having transmissive coil sections. The transmissive coil sections are substantially transparent to the penetrating radiation employed by the radiation imaging system. Thus the transmissive coil sections can be disposed in a field of view of the radiation... Agent: Lumen Intellectual Property Services, Inc.

20060273794 - Method and apparatus for high resolution nuclear magnetic resonance imaging and spectroscopy: A probe, device, and methods for performing nuclear magnetic resonance (NMR) measurements on a suitable sample are provided. The probe includes a hyperpolarized tip positioned to cause a dipolar interaction between the tip and sample. The nuclear magnetic spin of a selected portion of the sample induces a modulation of... Agent: Hoffmann & Baron, LLP

20060273799 - Side entry leak protection for downhole tools: A connector for a downhole tool includes a body with one or more conductors positioned at least partially axially adjacent to an axial bore that extends at least partially through the body. In embodiments, one or more seals surrounding the body prevent fluid from flowing from a lateral opening into... Agent: Madan, Mossman & Sriram, P.C.

20060273800 - Simulated battery logic testing device: A simulated battery test device and method that is capable of testing a battery charging circuit and logic circuit to determine proper operation. An operational amplifier is used that can both source and sink current to simulate the operation of the battery. A battery low signal can be generated using... Agent: Lsi Logic Corporation

20060273801 - Semiconductor integrated circuit and controlling method thereof: A semiconductor integrated circuit includes: a power supply circuit; a voltage-current conversion circuit connected with an output of the power supply circuit, the voltage-current conversion circuit having an output terminal; a current-voltage conversion circuit connected with the output terminal of the voltage-current conversion circuit, the current-voltage conversion circuit having an... Agent: C. Irvin Mcclelland Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20060273802 - Secondary battery voltage correcting method and unit and battery residual capacity estimating method and unit: The present invention provides an apparatus for correcting a voltage of a secondary battery, wherein accuracy in measurement of battery voltages between battery blocks in different voltage measurement systems. In a battery ECU (101), the following components are disposed: a first voltage measuring part (102-1), a second voltage measuring part... Agent: Hamre, Schumann, Mueller & Larson, P.C.

20060273803 - Method and apparatus for measuring transfer characteristics of a semiconductor device: A method and apparatus is provided for measuring alternating current (AC) and direct current (DC) characteristics of a plurality of semiconductor devices. A ring oscillator generates pulses to drive the plurality of semiconductor devices under test. Current/Voltage (IV) and transfer characteristics of the plurality of semiconductor devices are measured using... Agent: Ryan, Mason & Lewis, LLP

20060273804 - Capacitive measuring sensor and associated ,measurement method: The invention relates to a capacitive measuring sensor including at least one measuring capacitor (Cm) and means (I1, I2, I3) for applying, in a measuring phase, an actuation voltage to at least one plate of the measuring capacitor.... Agent: C. Irvin Mcclelland Oblon, Spivak, Mcclelland, Maier & Neustadt, P.C.

20060273806 - Operator sensing circuit for disabling motor of power equipment: An electrical characteristic in an operator-sensing circuit having a microcontroller that commands a charge sensor to send a sensor charge signal to a capacitive sensing element. The charge sensor outputs a corresponding raw data signal to the microcontroller that in turn sends a signal that disables the motor of a... Agent: Lipsitz & Mcallister, LLC

20060273805 - System and method for sensing capacitance change of a capacitive sensor: The present invention relates to systems and methods for sensing capacitance change of a capacitive sensor and for optimizing a capacitive sensing circuit. In an exemplary embodiment, a capacitive sensor may be coupled to an amplifier at floating node. A programming circuit is connected to the floating node for controlling... Agent: Troutman Sanders LLP

20060273807 - System for measuring fet characteristics: An FET-characteristic measuring system applies a pulse output from a pulse generator to the gate of an FET in order to measure drain current flowing through the FET. The pulse has a voltage based on a set voltage. The measuring system includes a divider for dividing the pulse output from... Agent: Paul D. Greeley Ohlandt, Greeley, Ruggiero & Perle, L.L.P.

20060273808 - Automated position control of a surface array relative to a liquid microjunction surface sampler: A system and method utilizes an image analysis approach for controlling the probe-to-surface distance of a liquid junction-based surface sampling system for use with mass spectrometric detection. Such an approach enables a hands-free formation of the liquid microjunction used to sample solution composition from the surface and for re-optimization, as... Agent: Michael E. Mckee Attorney At Law

20060273809 - Method of designing an application specific probe card test system: A method is provided for design and programming of a probe card with an on-board programmable controller in a wafer test system. Consideration of introduction of the programmable controller is included in a CAD wafer layout and probe card design process. The CAD design is further loaded into the programmable... Agent: Fliesler Meyer, LLP

20060273810 - Silicon wafer with solderable coating on its wafer rear side, and process for producing it: A silicon wafer with a solderable coating on its wafer rear side and a process for producing it is disclosed. The silicon wafer has integrated circuits on its wafer top side. The rear side coating is free of silver constituents in the immediate vicinity of an adapted gold coating on... Agent: Dicke, Billig & Czaja, P.l.l.c.

20060273812 - Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured: A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed... Agent: Brinks Hofer Gilson & Lione

20060273811 - Using an active load as a high current output stage of a precision pin measurement unit in automatic test equipment systems: A pin electronics circuit for use in automatic testing equipment that includes a load for testing a pin of a device under test. The load of the pin electronics circuit is electrically coupled to a precision parametric measurement unit. In this embodiment, the precision pin measurement unit provides a forcing... Agent: Bromberg & Sunstein LLP

20060273814 - 3 dimensional layered flex circuit electronic assembly designed to maximize the cooling of electronics that are contained within the assembly such that the component density within said electronic assembly can be maximized: A 3 dimensional electronic assembly comprised of a series or plurality of electronic Flex circuit sub-assemblies that form a layered Flex circuit assembly. Each Flex circuit sub-assembly is electronically connected to one or more other Flex circuits forming a multi-layer electronic Flex circuit assembly where various layers are separated by... Agent: Robert James Rapp

20060273813 - Electronic circuit protection device: A device for protecting an electronic circuit comprising a support to which are attached at least two circuit portions, each comprising at least one integrated circuit chip. The device comprises a wafer of a semiconductor material covered with a conductive layer arranged parallel to the support, the wafer being connected... Agent: Seed Intellectual Property Law Group PLLC

20060273816 - Circuit board having a reverse build-up structure: A circuit board having a reverse build-up structure includes a supporting carrier formed with a through cavity; a dielectric layer having a first surface and a second surface opposite to the first surface and being extended into the through cavity, one end of the through cavity being sealed by the... Agent: Mr. Joseph A. Sawyer, Jr. Sawyer Law Group LLP

20060273815 - Substrate support with integrated prober drive: A method and apparatus for testing a plurality of electronic devices on a large area substrate is described. The apparatus includes a prober positioning assembly coupled to a substrate support within a testing chamber. The substrate support is a testing table capable of movement in X, Y and Z axes... Agent: Patterson & Sheridan, LLP

20060273818 - Test apparatus: There is provided a test apparatus that tests a plurality of device under tests. The test apparatus includes a signal output section that outputs a test signal based on a common test pattern, a first switch that is provided between the signal output section and a terminal of the first... Agent: Osha Liang L.L.P.

20060273817 - Wireless transmission device with a built-in antenna and a connector: The invention provides a wireless transmission device, including a first circuit board, a second circuit board and a third circuit board. The first circuit board at least disposes more than one electronic elements. The second circuit board has an antenna, and the antenna is electrically connected to the first circuit... Agent: Bacon & Thomas, PLLC