Electricity: measuring and testing inventions 08/06

20060192545 - Voltage detection pole: An elongate probe of at least 2 feet in length for alerting a user to the presence of electrical energy includes an antenna to sense radiated electrical energy and an indicator to alert a user when activated. Circuitry determines when the sensed electrical energy meets a user adjustable threshold and...

20060192546 - Track-and-hold circuit: A track-and-hold circuit comprising a switch (10) and a capacitor (12). A first bootstrap switch (14a) has as its inputs a clock signal clkin and an input signal Vin. The clock signal clkboot output from the first bootstrap switch (14a) is applied to the gate of the switch (10). The...

20060192547 - Automatic ranging current shunt: A range-changing circuit includes an array of graduated impedances in serial relationship, and a voltage sensing and limiting switch across one of said impedances. The switch limits the voltage across said one of the impedances in response to a voltage sensed by the switch....

20060192548 - Current sensor with magnetic toroid: A current sensor for sensing current in a primary source, including a primary conductor forming at least one winding on a first portion of a toroid formed from a magnetic material. A secondary source of electrical current from a signal forms a plurality of winding on a second portion of...

20060192549 - Current sensor with magnetic toroid dual frequency detection scheme: A sensor device comprising a magnetic material having nonlinear magnetic properties within an ambient magnetic flux. The device includes a signal conductor carrying a compound applied electric signal having two frequencies f1 and f2 and coupled to the magnetic material with the ambient magnetic flux to produce a resulting signal....

20060192550 - Current sensor with magnetic toroid single frequency detection scheme: A sensor device primarily for sensing current in a primary source, including a primary conductor forming at least one winding on a magnetic material toroid. A secondary source of electrical current from a signal having a frequency f1 forms a plurality of winding on the toroid. An output reader measures...

20060192551 - Linear variable differential transformers for high precision position measurements: A linear variable transformer (LVDT) for use in a transducer. The LVDT has a non-ferromagnetic core which may eliminate Barkhausen noise and thereby improve the sensitivity of the resulting measurements. In one aspect, this system may be used in an atomic force microscope....

20060192552 - Systems for recording position information in a magnetic layer on a piston rod: Described are system for recording piston rod position information in a magnetic layer on the piston rod. A piston rod has a magnetically hard layer formed thereon to provide a recording medium. A magnetic pattern is recorded in the magnetically hard layer. A magnetic field sensor disposed adjacent to the...

20060192553 - Compact single magnet linear position sensor: A sensor assembly is disclosed for measuring the position of a target object as it traverses a linear path of travel within a defined range of measurement. The sensor assembly comprises a ferromagnetic magnetic flux concentrator assembly. The flux concentrator assembly is configured as a generally u-shaped structure including a...

20060192554 - Downhole high resolution nmr sprectroscopy with polarization enhancement: An apparatus and method is discussed for characterizing a fluid sample downhole of aliphatic hydrocarbon compounds, aromatic hydrocarbon compound, or connate mud filtrates containing carbon-13 isotopes using an enhanced nuclear magnetic resonance (NMR) signal on a measurement-while-drilling device. To enhance the carbon-13 NMR signal these nuclei are being hyperpolarized. Either...

20060192555 - Mr ductography: A magnetic resonance system and method are described for performing an improved magnetic resonance ductography which gives better resolution and higher signal to noise ratio than known systems and methods. Use is made of a small coil together with a post processing technique addressed to the improvement of the sensitivity...

20060192557 - Apparatus and probe head for determining a quantitative property of a sample substance by means of magnetic resonance: An apparatus for determining a quantitative property of a sample substance by means of magnetic resonance is disclosed. The apparatus comprises a conveyor for conveying sample containers containing the sample substance through a measuring station. The measuring station comprises a magnet system for generating a constant magnetic field of high...

20060192556 - Mri system having a gradient magnet system with a gyroscope: The invention relates to an MRI system (1) comprising an examination volume (11), a main magnet system (13) for generating a main magnetic (field (B0) in the examination volume, a gradient magnet system (19) for generating gradients of the main magnetic field, and an anti-vibration system (39) for reducing vibrations...

20060192558 - Magnetic resonance imaging method and system: A magnetic resonance imaging method comprising a step for applying one or more gradient magnetic field pulses continuously, a step for calculating a residual magnetic field being generated from a magnet by an gradient magnetic field pulse based on a residual magnetic field response function representing the relation between the...

20060192559 - Methods and devices for polarized nmr samples: The present invention relates to devices and methods for melting a solid polarised sample while retaining a high level of polarisation. In an embodiment of the present invention a sample is polarised in a sample-retaining cup in a strong magnetic field in a polarising means in a cryostat and then...

20060192560 - Well placement by use of differences in electrical anisotropy of different layers: Cross-component measurements made with a dual-transmitter configuration are processed to estimate a distance to an interface in an anisotropic earth formation. Distance to a boundary having an anisotropy contrast may be determined for reservoir navigation. Optionally, measurements may be made with two receivers, also in the dual transmitter configuration....

20060192562 - Extra bucking coils as an alternative way to balance induction arrays: An electromagnetic logging tool is disclosed that includes a support; and at least one four-coil array disposed on the support, wherein the at least one four-coil array comprises: a transmitter, a bucking coil, a receiver, and a trim coil. A method for balancing an induction array is disclosed that includes...

20060192561 - Selectable tap induction coil: An electromagnetic logging tool includes a support configured for disposal in a well; at least one antenna mounted on the support; and a plurality of coils mounted on the support proximate the at least one antenna, wherein the plurality of the coils are configured for selective connection with the at...

20060192563 - Measurement of cn emissions from engine spark igniter for characterization of spark igniter energy: A method and system for measuring the amount of energy released by a spark ignition system. This energy can be quantified spectroscopically by measuring the emission of cyanogen radicals in the presence of a ignition event and a known A/F ratio....

20060192564 - Centrally monitored sales of storage batteries: Methods and systems are provided for monitoring replacing of a previously purchased storage battery with a replacement storage battery. A battery tester is coupled to the replacement storage battery. A replacement storage battery identifier is entered into the battery tester that identifies the replacement storage battery. The battery tester performs...

20060192565 - Micromechanical potential sensor: A potential sensor (101) including first and second detection electrodes (121 a, b) opposed to an object of which a potential is to be measured, and a movable shutter (125) so positioned between the detection electrodes and the potential-measured object with gaps thereto; wherein the movable shutter can assume a...

20060192566 - Continuity tester with magnetic ground and method therefor: A continuity testing device has a probe element for contacting a conductor. A continuity testing circuit is coupled to the probe element. The continuity testing circuit will indicate continuity when a resistance level below a predetermined set-point is monitored. The continuity testing circuit has at least one of a vibrating...

20060192567 - Finite impulse response filter: A system for determining the depth of a fluid in a storage tank. The depth of the fluid is determined after the detection of a pulsed wave that is reflected from the top surface of the fluid. The system includes a transducer, an analog-to-digital converter, and a filter. The transducer...

20060192568 - Multi-frequency capacitive measurement device and a method of operating the same: A method and a system is provided that includes a multifrequency generator supplying signals of at least three different frequencies to an electrode assembly, the capacitance of which is detected for a plurality of different frequency points. In this way, the capacitance of the electrode assembly, which is influenced by...

20060192569 - Low-cost linear and liquid position transducers: Cost-effective methods and apparatus are disclosed for measuring both absolute position and fluctuations using a moving dielectric medium between fixed electrodes. A position sensor according to the invention includes a pair of spaced-apart electrodes, an elongated dielectric that moves between the electrodes, and electrical circuitry interconnected to the electrodes to...

20060192570 - Apparatus for monitoring consumable parts: An apparatus for monitoring wearing or consumable parts 18, especially parts of internal combustion engines, in which monitoring verifies that the consumable part 18 is functioning and also ensures that a consumable part 18 conforming to specifications is used. The device has a maintenance switch 10, which is provided with...

20060192572 - Method and structure for measuring a bonding resistance: A structure and a method for measuring the bonding resistance are provided. The structure for measuring a bonding resistance between a first object and a second object is provided, wherein the first object has a plurality of first pins and a reference pin, and the second object has a plurality...

20060192571 - Source measure circuit: A circuit for alternatively controlling a current through a device and permitting measurement of a voltage across the device or controlling a voltage across the device and permitting measurement of a current through the device includes a sense impedance in series combination with the device, an error amplifier selectable to...

20060192573 - Method and device for determining a characteristic of a semicondctor sample: The invention relates to a method for determining a characteristic of a semiconductor sample forming a surface. The method comprises the steps: simultaneously illuminating an area on the surface of a semiconductor sample with superimposed exciting light beams with a plurality of wavelengths, modulating the light beam of the different...

20060192574 - Probe navigation method and device and defect inspection device: A probe navigation method, a navigation device, and a defect inspection device wherein in a charged particle beam system provided with probes for electrical characteristics evaluation, probing can be easily carried out regardless of the equipment user's level of skill are provided. To attain this object, probes and a test...

20060192577 - Anisotropically conductive sheet: An anisotropic conductivity sheet (10) comprising an insulating sheet (11) having a number of through-holes (12) and a number of conductive bodies is provided. The insulating sheet (11) has an inner layer (11A) of a heat resistant fuloro-elastomer and surface thin layers (11B, 11C) of heat-resistant engineering plastics. Each of...

20060192575 - Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method: A probe card, and a probe sheet used for the method of testing (producing) a semiconductor device using the probe card, include first contact terminals in electrical contact with the electrodes of a test object formed at a narrow pitch, wires connected with and led from the first contact terminals,...

20060192576 - Wafer prober for enabling efficient examination: A control unit of a wafer prober for implementing wafer examination, using a probe card including a multiple number of probes, executes a multiple number of measuring operations by bringing the probes of the probe card into contact with bonding pads formed on a wafer and by measuring the electric...

20060192578 - Inspection method and inspection apparatus: Disclosed is an inspection method for inspecting the electrical characteristics of a device by bringing an inspecting probe into electrical contact with an inspection electrode. An insulating film formed on the surface of the inspection electrode is broken by utilizing a fritting phenomenon so as to bring the inspection electrode...

20060192579 - Method and apparatus for determining probing locations for a printed circuit board: Techniques for automating probing location selection during printed circuit board (PCB) and corresponding PCB tester fixture design are presented. The invention includes a system and algorithm for selecting a probe layout comprising a set of probing locations for a printed circuit board design having a plurality of nets, at least...

20060192580 - Thermal transferring member, test board and test apparatus: There is provided a heat transferring object for transferring heat generated by a object to be cooled to a cooling unit, having a plurality of thermal transferring plates each having elasticity and provided in lamination and adhesive materials having thermal conductivity and provided between the thermal transferring plates so as...

20060192581 - Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby: Disclosed is an electrical contact element used to test an electronic device. The electrical contact element has a beam portion and a tip portion attached to an end of the beam portion. In representative embodiments, a part of the beam portion is bent, e.g., such that the beam portion is...

20060192582 - Device and method for isolating a short-circuited integrated circuit (ic) from other ics on a semiconductor wafer: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short...

20060192584 - Test semiconductor device and method for determining joule heating effects in such a device: Method and test structures for determining heating effects in a test semiconductor device (10) are provided. The test device may include a first conductive metal structure (151-156) for accepting a flow of electric current that causes a heating effect. The test device may further include a second conductive metal structure...

20060192583 - Test tray for handler for testing semiconductor devices: A test tray for a handler for testing semiconductor devices is disclosed which is capable of reducing the costs and time taken for replacement of carrier modules, and achieving an enhancement in workability. The test tray includes a frame, pockets mounted to the frame while being uniformly spaced apart from...

20060192585 - System and method for display test: The system for display test includes a driving circuit having integrated circuit (IC) pads on the substrate and the IC pads are electrically connected to the signal lines, respectively. And the first switches are between the first test pads and the IC pads, wherein the number of the first test...

20060186871 - Performance measurement of device dedicated to phase locked loop using second order system approximation: A method, system and program product to measure performance of a device dedicated to a phase locked loop (PLL). A resistor-inductor-capacitor (RLC) model is produced to simulate the PLL. The RLC model and the device to be measured are mapped together into a test circuit and the characteristics of the...

20060186872 - Electric field detector: The present invention relates to an improved method to detect electric field intensity. It is a generational improvement on free body field detectors and uses a ferrite sensor element to increase detector capacitance and hence signal output. This configuration also provides reduced detector volume, increased stability and a reduction in...

20060186873 - Method for mounting a gradient coil in a cylindrical magnet of a magnetic resonance system and associated magnetic resonance system: Method for mounting a gradient coil in a cylindrical magnet of a magnetic resonance system and associated magnetic resonance system, wherein the exterior of the gradient coil is foam-bonded flat against the inner wall of the magnet at least in sections, at least one element being foamed in place during...

20060186874 - System and method for mechanical testing of freestanding microscale to nanoscale thin films: Method and device for measuring mechanical properties of microscale and nanoscale thin film membranes. A testing system comprises a unitary material load cell, including a substrate, a beam supported to the substrate at its ends and otherwise substantially free from the substrate, a test-probe extending from the substrate and connected...

20060186875 - Apparatus and method for determining an engine speed: A removable sensor assembly for non-intrusively sensing instantaneous speed of an engine comprising a crankshaft having a respective end equipped with an externally accessible bolt, the removable sensor assembly comprising: a housing comprising a recess configured to removably receive and engage a portion of the externally accessible bolt; and a...

20060186876 - Linear variable differential transformers for high precision position measurements: A linear variable transformer (LVDT) for use in a transducer. The LVDT has a non-ferromagnetic core which may eliminate Barkhausen noise and thereby improve the sensitivity of the resulting measurements. In one aspect, this system may be used in an atomic force microscope....

20060186877 - Linear variable differential transformers for high precision position measurements: A linear variable transformer (LVDT) for use in a transducer. The LVDT has a non-ferromagnetic core which may eliminate Barkhausen noise and thereby improve the sensitivity of the resulting measurements. In one aspect, this system may be used in an atomic force microscope....

20060186878 - Linear variable differential transformers for high precision position measurements: A linear variable transformer (LVDT) for use in a transducer. The LVDT has a non-ferromagnetic core which may eliminate Barkhausen noise and thereby improve the sensitivity of the resulting measurements. In one aspect, this system may be used in an atomic force microscope....

20060186879 - Position sensor with compensated magnetic poles: The object of the invention relates to an encoder for a rotary position sensor, including a multipolar magnetic ring driven into rotation around its axis, and provided at its circumference with magnetic poles of a given sign, alternately positioned with magnetic poles of an opposite sign, so as to form...

20060186880 - Automated drawing tool and method for drawing a sensor layout: An automated drawing tool and a method for drawing a sensor layout. A sensor is drawn by selecting a sensor family, each sensor of the sensor family having at least one drive element to impose a magnetic field in a test material when driven by an electric signal, and at...

20060186881 - Method and apparatus for magnetic field detection: A method and device for field detection are provided, in which one or more gradiometers (31, 32, 33) are positioned in the field and rotated about their axes. Rotation of a single gradiometer allows an output signal of the gradiometer to be analysed in the Fourier domain, which allows particular...

20060186882 - Multicoil nmr data acquisition and processing methods: A multicoil NMR data acquisition apparatus and processing method for performing three-dimensional magnetic resonance imaging in a static magnetic field without the application of controlled static magnetic field gradients. A preferred application relates specifically to the detection and localization of groundwater using the Earth's magnetic field. Multicoil arrays are used...

20060186883 - System, method and apparatus for tuning an rf volume coil: A method for tuning a radio frequency coil of a magnetic resonance imaging system includes disposing a plurality of probes at selected portions of a fixture, disposing the fixture proximate to the radio frequency coil at a first location, and obtaining a first set of measurements of an output of...

20060186885 - Nuclear magnetic resonance apparatus probe: A nuclear magnetic resonance apparatus comprises a superconducting magnet that produces a static magnetic field, a probe having a probe coil that irradiates an RF pulse magnetic field and receives a free induction decay signal (FID signal) emitted therefrom, an RF power source that supplies the probe with an RF...

20060186884 - Shielding for mobile mr systems: A trailer for housing a mobile MRI system has magnetic shielding in the form of a plurality of sheets of magnetic material which are supported within the trailer, by a rigid supporting structure or frame. The layers are arranged in a stacked or laminar configuration with the laterally longest layer...

20060186886 - Nuclear magnetic resonance spectrometer for liquid-solution: In a nuclear magnetic resonance spectrometer, the shape of a detection coil is changed from a conventional cage type to a solenoid type of higher sensitivity. Accordingly, differing from the conventional superconductive magnet of multilayer air core solenoids, a superconductive magnet is right and left divided to split magnets for...

20060186887 - Method for identifying subsurface features from marine transient controlled source electromagnetic surveys: A method for identifying features in the Earth's subsurface below a body of water using transient controlled source electromagnetic measurements includes acquiring a plurality of transient controlled source electromagnetic measurements. Each measurement represents a different value of an acquisition parameter. Each measurement is indexed with respect to a time at...

20060186888 - Method and apparatus for directional resistivity measurement while drilling: A measurement-while-drilling or logging while drilling method and apparatus for determining the azimuth of providing magnetic field in a remote formation layer in the vicinity of a down hole resistivity tool. A cross-component magnetic field with substantially orthogonal transmitter and receiver coils is provided. The coil planes are either substantially...

20060186889 - Electromagnetic surveying for resistive or conductive bodies: A method of analyzing electromagnetic survey data from an area of seafloor 6 that is thought or known to contain a resistive or conductive body, for example a subterranean hydrocarbon reservoir 12, is described. The method includes providing horizontal electromagnetic field data obtained by at least one receiver 125 from...

20060186890 - Method for determining deterioration of accumulator battery, method for measuring internal impedance of secondary battery, equipment for measuring internal impedance of secondary battery, equipment for determining deterioration of secondary battery, and p: A method for determining deterioration of accumulator battery hooked up with loads in a system based on results of measuring internal resistances of an accumulator battery, the method comprising the steps of; predetermining as a specified temperature a temperature at which the deterioration of the accumulator battery is determined; calculating...

20060186891 - Non-redundant safety monitoring for an electric drive mechanism (with a sensor): The invention relates to a method for detecting undesired operating conditions of a driving device. A sensor (50) that is transformer-coupled between a stator side and a rotor side is triggered by a control circuit (40) for detecting a position value or a rotational speed value of the drive mechanism....

20060186892 - Open-phase detecting method and apparatus: An open-phase detecting method wherein a simple hardware structure is used to achieve a reduced cost: the IRQ member is reduced to reduce the load on a CPU; the open phase detection is performed in two items, that is, a phase difference and a voltage sign to reduce the possibility...

20060186893 - Systems and methods for testing wireless devices: Systems and methods are disclosed for parallel testing one or more wireless devices using a single wireless command, each device including a processor and memory coupled to the processor. The system includes a tester adapted to exercise the wireless devices, including: a transceiver adapted to communicate with each wireless device;...

20060186894 - Voltage measurement device: A voltage measurement device includes a first group of switches Q1, Q2, a second group of switches Q7, Q8 and a third groups of switches Q5, Q6. By turning on the third group of switches Q5, Q6, the first group of switches Q1, Q2 are turned on, so that a...

20060186895 - Bridge type phase detection device: A bridge type phase detection device comprises one or more than one transformer, a plurality of tubes, a voltage-detecting protection circuit and a first, second and third impedance, wherein a first tube of said plurality of tubes has a phase opposite to that of a second tube of said plurality...

20060186896 - Test apparatus with low-reflection signal distribution: A test apparatus includes a signal source that generates a radio-frequency test signal and is connected to the input connection of an arrangement. The arrangement simultaneously supplies an electrical radio-frequency signal to a plurality of receivers and via a plurality of distribution lines. Each distribution line includes an end with...

20060186897 - Method and device for detecting two parameters of a fluid: An oscillator is excited by a primary oscillator, and the excited oscillator is immersed in a fluid having two parameters, the first parameter of the fluid damping the excited oscillator via a first phase delay, and the second parameter damping the excited oscillator via a second phase delay. The oscillation...

20060186898 - Electric potential measuring device and image forming apparatus: An electric potential measuring device comprises a detection electrode of a conductive material disposed in opposition to an object and a movable structure comprised of a first solid material portion of another dielectric and a second solid material portion of another dielectric or a conductive material. A charge induced on...

20060186899 - Particle analyzer with specimen tube fluid detector: A particle analyzer that includes a specimen source, a flow cell, a pump and delivery tube for transporting specimen fluid from the specimen source to the flow cell, a dispensing valve for injecting stain from a stain source into the specimen fluid in the delivery tube, and a mixing device...

20060186900 - Detector with capacitance sensor for detecting object being caught by door: A detector for detecting an object that may be feared to or about to be caught by a closing door such as a slide door of a vehicle incorporates a capacitance sensor with a directionality characteristic in the direction of its detection surface. The detector has a main body enclosing...

20060186901 - Moisture sensor device and self-diagnosing method therefor: A moisture sensor device includes a sensor portion having a capacitance that is varied in accordance with surrounding humidity, a signal processor for processing a detection signal of the sensor portion and outputting the signal corresponding to the humidity, a heating portion for heating the sensor portion, and a controller...

20060186902 - Device for monitoring the contact integrity of a joint: The invention relates to a device that can be used to monitor the contact integrity of a joint that is of an impervious contact surface between two parts (4 and 5). The inventor device comprises a set of conductive patterns (8) which are distributed over the two contact surfaces (1...

20060186903 - Apparatus and method for terminating probe apparatus of semiconductor wafer: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric...

20060186905 - Contactor for electronic parts and a contact method: A contactor for electronic parts can provide an appropriate and uniform contact with respect to a plurality of electrode terminals in an electronic part such as an IC. Each of a plurality of contact members has a first contact portion on one end thereof and a second contact portion on...

20060186906 - High density interconnect system for ic packages and interconnect assemblies: An improved interconnection system is described, such as for electrical contactors and connectors, electronic device or module package assemblies, socket assemblies, and/or probe card assembly systems. An exemplary connector comprises a first connector structure comprising a contactor substrate having a contact surface and a bonding surface, and one or more...

20060186904 - Wafer holder for wafer prober and wafer prober equipped with the same: The invention provides a wafer-prober wafer holder that allows positional precision and temperature uniformity to be increased, and also allows the chip to be heated and cooled rapidly, and a wafer prober device provided with the same. The wafer-prober wafer holder of the invention is constituted by a chuck top...

20060186907 - Method and apparatus for semiconductor testing utilizing dies with integrated circuit: A method and apparatus for testing semiconductor wafers in which certain contact areas of dies not used in the testing and required to be at a predetermined voltage during testing are connected to the predetermined voltage via an integrated circuit in the die....

20060186908 - Probe card: The present probe card comprises a circuit board, a platform fixed on the circuit board, a tunable stage positioned on the platform, a probe carrier positioned on the tunable stage and at least one probe positioned on the probe carrier. The tunable stage comprises a stationary part positioned on the...

20060186909 - Method and apparatus for temporary thermal coupling of an electronic device to a heat sink during test: A method, system and apparatus for testing an electronic device. The method including: (a) forming a temporary liquid heat transfer layer on a surface of the electronic device; after step (a), (b) placing a surface of a heat sink into physical contact with a surface of the heat transfer layer;...

20060186911 - Apparatus and methods for self-heating burn-in processes: A method includes installing a device under test (DUT) into each of a plurality of burn-in boards. The method further includes docking each of the burn-in boards to a respective docking location, each of the burn-in boards with a single respective DUT installed therein. The method further includes subjecting the...

20060186912 - Apparatus and methods for self-heating burn-in processes: A method includes installing a device under test (DUT) into each of a plurality of burn-in boards. The method further includes docking each of the burn-in boards to a respective docking location, each of the burn-in boards with a single respective DUT installed therein. The method further includes subjecting the...

20060186910 - Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit: A method includes providing an integrated circuit (IC) having a plurality of oscillators at distributed locations in the IC, determining a respective rate of oscillation of each of the oscillators, and detecting variations in local temperature in the IC based on the determined rates of oscillation. Other embodiments are described...

20060186913 - Liquid crystal display and test method thereof: A liquid crystal display includes a plurality of pixel electrodes arranged in a matrix and having first and second sub-pixel electrodes differentiated in size from each other. First and second switching elements are connected to the first and second sub-pixel electrodes, respectively. First and second gate lines are connected to...

20060186914 - Phase-loss detection for rotating field machine: A method for detecting a loss of a phase in a multiphase rotating field machine, the method comprising providing a first electrical current into the machine windings to cause the current vector to assume a first current vector position, sensing a first current in at least one selected phase winding...

20060181261 - Method and circuit arrangement for monitoring the mode of operation of one or more load circuits, especially of a domestic appliance: A method and a circuit configuration monitor a mode of operation of one or more load circuits, especially of a domestic appliance, which contains a controlled semiconductor switch, such as a triac, and an electric consumer. The switches are supplied by at least one alternating voltage source that supplies an...

20060181262 - Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects: A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and phase angle measurements at...

20060181263 - Current sensor: An integrated circuit current sensor includes a lead frame having at least two leads coupled to provide a current conductor portion, and a substrate having a first surface in which is disposed one or more magnetic field sensing elements, with the first surface being proximate to the current conductor portion...

20060181264 - Surface-mounted integrated current sensor: Described herein is a surface-mounted integrated current sensor for use in a printed circuit having a track along which there flows, in use, the electric current to be measured. The current sensor comprises a package having a bottom face facing, in use, the printed circuit, and on which there is...

20060181268 - Apparatus and method for detecting photon emissions from transistors: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by...

20060181265 - Electronic device test system: An electronic device testing apparatus for conducting a test by pressing input/output terminals of an IC to be tested against sockets (50), comprising a pusher (30) provided at least with a pusher base (34) provided to be able to approach and separate with respect to said sockets (50), a lead...

20060181266 - Flat panel display inspection system: A substrate inspection system includes a plurality of load-lock-less inspection chambers, which are share a single pump unit. A plurality of valves are configured to selectively couple the pump unit to a selected one of the plurality of inspection chambers. The pump unit is configured to pump air out of...

20060181267 - Vacuum circuit interrupter including circuit monitoring leakage or loss of vacuum and method of monitoring a vacuum interrupter for leakage or loss of vacuum: A method monitors a vacuum interrupter for leakage or loss of vacuum. The vacuum interrupter includes a line side, a load side and separable contacts electrically connected therebetween. The line side has a line side voltage and the load side has a load side voltage. The method includes determining whether...

20060181269 - Wheel speed sensor assembly: A wheel speed sensor assembly includes a rotor formed with first and second protrusions arranged circumferentially on the outer periphery thereof in two separate rows at an equal angular pitch. The first protrusions are angularly displaced from the respective second protrusions by half the angular pitch of the first or...

20060181271 - Method and device for magnetic measurement of the position and orientation of a mobile object relative to a fixed structure: A method and device for magnetic measurement of the position and orientation of a mobile object relative to a fixed structure are described. The device comprises, integral with the structure, a magnetic fields emitter assembly having three orthogonal emission coils defining a reference frame and a sensor assembly, integral with...

20060181270 - Asynchronous generator with galvano-magnetic-thermal effect: at least one element (2; 14) having thermoelectric conversion properties, disposed in a plane substantially perpendicular to the direction of the temperature gradient (∇T). The magnetic field generated is a field of traveling waves moving in the second direction. Each element having thermoelectric conversion properties has a continuous form in...

20060181272 - Integrated fluxgate-induction sensor: An integrated fluxgate-induction sensor is formed of a combined fluxgate sensor and induction sensor using a common core. The sensor may be in serial operation where it switches between a fluxgate mode for measuring static magnetic fields and an induction mode for measuring alternating magnetic fields. Additionally, the sensor may...

20060181273 - Oscillating-beam magnetometer: In one embodiment, an integrated magnetometer has a deformable, electrically conducting beam that is mounted on a substrate and adapted to oscillate with respect to the substrate. When the oscillating beam is exposed to a magnetic field, the magnetic field induces an oscillating electromotive force that generates an oscillating electrical...

20060181274 - Combining nmr, density, and dielectric measurements for determining downhole reservoir fluid volumes: A method for evaluating formation fluids includes measuring a nuclear magnetic resonance property related to a total volume of the formation fluids, measuring a dielectric property related to an electromagnetic wave travel time, measuring a bulk density, and solving a set of linear response equations representing a reservoir fluid model...

20060181275 - Brorc-s2pd: Systems, methodologies, media, and other embodiments associated with a block-by-block off-resonance frequency estimation method are described. One exemplary method embodiment includes calculating a field map from local B0 off resonance frequency estimates. The example method may also include performing water-fat decomposition and signal de-blurring based on the calculated map....

20060181276 - Magnetic field generator for mri and method of covering magnetic field generator for mri: A magnetic field generator for MRI comprises a generator main body and a covering member for covering the whole generator main body, and the covering member is made of a non-magnetic material, for example a closely woven fabric of stainless steel, aluminum, copper, nylon, cotton, hemp, flax, rubber or plastics,...

20060181278 - Magnetic resonance imaging apparatus and its control method: A magnetic resonance imaging apparatus includes a phased array coil including a plurality of local coils, a pre-scanning unit which pre-scans, before image scanning, an area including at least part of an image scanning area, a determination unit which determines whether each of the local coils is abnormal, based on...

20060181279 - Rf coil and magnetic resonance imaging apparatus: A magnetic resonance imaging apparatus acquires magnetic resonance signals by the PI method using an RF coil unit having basic coils serving as surface coils which are arrayed with at least two coils along a static magnetic field direction (Z direction) and and at least two coils along each of...

20060181277 - Rf coil for a highly uniform b1 amplitude for high field mri: An array coil to achieve more uniform RF excitation for high field magnetic resonance imaging. In the preferred embodiment, the array coil has a plurality of transmit-composite elements distributed around the object to be imaged. A composite element comprises up to three current loops preferably orthogonal to each another. The...

20060181280 - Digital locating system and device for underground object detection: An underground digital locating system includes a receiver capable of acquiring a signal produced by an underground object and displaying a digital representation of the orientation of underground object and of its depth. The system includes a carrying case for the digital locating receiver, the carrying case further including a...

20060181281 - Loop antenna circuit useful in subterranean tool: A loop antenna useful, for example, in investigation of earth formations. Embodiments of the invention provide a loop antenna circuit comprising a loop antenna disposed to generate, in response to an electromagnetic wave, a pick-up signal on an output node. Loop antenna circuit further includes a tuning network coupled to...

20060181282 - Method and circuit arrangement for the self-testing of a reference voltage in electronic components: To provide a method for the self-testing of a reference voltage in electronic components, by means of which method there is defined a circuit arrangement for a self-test of the reference voltage that can be implemented in the form of an on-chip test, i.e. for which no external reference-voltage source...

20060181283 - Apparatus for and method of cable diagnostics utilizing time domain reflectometry: A novel mechanism for performing high accuracy cable diagnostics. The mechanism utilizes time domain reflectometry (TDR) to detect and identify cable faults, perform estimations of cable length, identify cable topology, identify load and irregular impedance on metallic paired cable, such as twisted pair and coaxial cables. The TDR mechanism transmits...

20060181284 - Method and apparatus for the location and indication of cable splices and cable faults: A method and apparatus for the location and indication of cable splices and cable faults is disclosed. An audio frequency generator can be coupled to a cable under test and the magnetic field generated by the cable can be monitored by a receiver. A receiver includes at least two antenna...

20060181285 - Method for differentiating between burdened and cracked ultrasonically tuned blades: A method for differentiating between ultrasonically tuned blades which are broken or cracked, and blades which are gunked by evaluating measured impedance differences when a system is first excited with a low displacement signal and then with a high displacement signal. The method is performed irrespective of the age of...

20060181286 - Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device path: A method and system of calibrating first and second adapters comprises the steps of calibrating coaxial ports of a vector network analyzer to traceable standards and connecting a symmetrical through circuit path between the coaxial ports. The through circuit path comprises a cascaded combination of the first and second adapters....

20060181287 - Testing method: A testing method for measuring electromagnetic interference of a noise on a to-be-tested printed circuit board, has the steps of: a) injecting a signal simulating an expected noise of a predetermined device mounted on the to-be-tested printed circuit board, into the to-be-tested printed circuit board, in a condition in which...

20060181288 - Direct resistance measurement corrosion probe: A direct resistance measurement probe for measuring corrosion levels and material loss. The probe includes a hollow body having a resistive element that is exposed to the environment. The probe can have an internal or external power source that is electrically connected to the resistive element. A meter measures the...

20060181289 - Circuit configuration having a load transistor and a current measuring configuration, method for ascertaining the load current in a load transistor, semiconductor component, and measuring configuration: A circuit configuration has a load transistor and a current measuring configuration. A method ascertains a load current through a load transistor. The circuit configuration includes a first and a second current sensor with a current measuring transistor in each case. Each of the current sensors provide a current measurement...

20060181290 - Apparatus and method for contacting of test objects: The invention relates to methods for positioning of a substrate and contacting of the test object for testing with a test apparatus with an optical axis and corresponding devices. Thereby, the substrate is put on the holder. The substrate is positioned relative to the optical axis. A contact unit is...

20060181293 - Low impedance test fixture for impedance measurements: A test fixture couples with a test instrument to measure impedance of a device. An upper layer of the test fixture has (a) a first and a second solder pad for electrical connection to the device, (b) a first, second, third and fourth multi-solder pad for electrical connection to four...

20060181291 - Method and apparatus for locating and testing a chip: A probe apparatus includes a nest element operable to precisely locate a chip having a plurality of exposed interconnects on a face of the chip to permit conductive connection to the chip through the interconnects. The nest element includes a pocket dimensioned to locate the chip within a tolerance of...

20060181292 - Probe card assembly and method of attaching probes to the probe card assembly: A probe card assembly is provided. The probe card assembly includes a substrate layer defining a plurality of apertures and a plurality of probes. Each of the probes has a base and a tip. The base of each probe is configured to be at least partially inserted within one of...

20060181294 - System for testing semiconductor components having interconnect with variable flexure contacts: A test system for testing semiconductor components includes an interconnect having a substrate and contacts on the substrate for electrically engaging terminal contacts on the components. The interconnect also includes one or more cavities in the substrate which form flexible segments proximate to the interconnect contacts. The flexible segments permit...

20060181295 - Method for fabricating an interconnect for semiconductor components: A method for fabricating an interconnect for testing a semiconductor component includes the steps of providing a substrate, and forming interconnect contacts on the substrate configured to electrically engage component contacts on the component. The interconnect contacts include flexible spring segments defined by grooves in the substrate, shaped openings in...

20060181296 - Method and apparatus for non-invasively testing integrated circuits: The preferred embodiments of the present invention provide non-invasive approaches of testing ICs that use photon emission from semiconductor devices to provide results of various testing procedures. For example, instead of reading the results from the built-in-self-test (BIST) circuitry using micro-mechanical probes, the results from BIST may be represented using...

20060181297 - Method and apparatus for non-invasively testing integrated circuits: The preferred embodiments of the present invention provide non-invasive approaches of testing ICs that use photon emission from semiconductor devices to provide results of various testing procedures. For example, instead of reading the results from the built-in-self-test (BIST) circuitry using micro-mechanical probes, the results from BIST may be represented using...

20060181300 - Method for testing a circuit unit and test apparatus: A test apparatus comprises a receptacle unit for holding a circuit unit to be tested and for making contact with contact-making units of the circuit unit, a test system for generating input data to be applied to the circuit unit and for analysing output data generated by the circuit unit...

20060181298 - Method, interconnect and system for testing semiconductor components: A method for testing a semiconductor component includes the steps of bonding an interconnect to the component to form bonded electrical connections, applying test signals through the bonded electrical connections, and then separating the interconnect from the component. The bonding step can be performed using metallurgical bonding, and the separating...

20060181301 - System and method for testing devices utilizing capacitively coupled signaling: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at...

20060181299 - Tab tape and method of manufacturing the same: Input test pads of an adjacent pattern area are placed in a vacant area of a layout area of output test pads, optimizing the layout area of test pads for use in inspection of a semiconductor chip. Thus, it is possible to miniaturize a semiconductor package....

20060176044 - Device, method and system for estimating the termination to a wired transmission-line based on determination of characteristic impedance: A system and method for measuring a characteristic impedance of a transmission-line comprises transmitting energy to the line, and shortly after measuring the voltage/current involved and thus measuring the equivalent impedance. The measured characteristic impedance may then be used in order to determine the termination value required to minimize reflections....

20060176045 - Plasma reactor and method of determining abnormality in plasma reactor: A plasma reactor is provided which does not require a high power supply voltage and can form a plasma with a necessary and sufficient average current density over the whole region between a pair of electrodes to efficiently modify a gas flowing between the electrodes. The plasma reactor comprises first...

20060176046 - Power meter for biasing an audio amplifier: An improved diagnostic meter, of the type used to measure the conduction of a vacuum tube in an audio power amplifier, which provides a display of the average value of instantaneous power dissipated by the tube. A probe containing a current sense resistor and a voltage attenuator interfaces between the...

20060176049 - Dynamic silicon characterization observability using functional clocks for system or run-time process characterization: A method and system for dynamic characterization observability using functional clocks for system or run-time process characterization. Silicon characterization circuitry may be read after silicon chips have been assembled in a package and installed in a system. A characterization circuit comprising one or more oscillators generates signal pulses, wherein the...

20060176047 - Electric current sensor: An electric current sensor comprises a housing, a magnetic circuit comprising a magnetic core, and a magnetic field detector with a detection cell, positioned in an air gap between ends of said core. The core is made of a non-laminated magnetic material, and the magnetic circuit has a strap made...

20060176048 - Generation and use of calibration data for automated test equipment: In one embodiment, a request to perform a calibration process for automated test equipment (ATE) is received. The request is associated with one or more test setups. After receiving the request, a number of calibration padding points based on the test setups are identified. Calibration data is then generated for...

20060176051 - Resolver unit and resolver using same: A resolver unit having a structure in which the axial length is shortened to prevent the magnetic coupling characteristic between the rotary and stationary sides from being impaired, a winding generates more magnetic fluxes, and multiplexing is easily conducted, and also a resolver using such a resolver unit are provided....

20060176050 - Rotary position sensor: A rotary magnetic position sensor including a housing, a sensor coupled to the housing, a rotor rotatably mounted to the housing, and a magnet coupled to the rotor and positioned adjacent the sensor. The sensor may be configured to provide a sensor output in response to a rotational position of...

20060176052 - Temperature sensor capable of controlling sensing temperature: A temperature sensor includes a reference voltage generator, a sensing temperature controller and a first differential amplifier. The reference voltage generator generates a reference voltage having a first slope that varies in accordance with variations of a peripheral temperature, and a temperature sensing voltage having a second slope that varies...

20060176053 - Extremely low frequency (elf) or low frequency (lf) magnetic field distribution measuring system: Disclosed herein is an ELF or LF magnetic field measuring system, which can easily measure each magnetic field component existing in a free space generated by electric appliances or in a human body phantom filled with a specific fluid. A 3-axes magnetic field probe for use in the magnetic field...

20060176054 - Squid detected nrm and mri at ultralow fields: Nuclear magnetic resonance (NMR) signals are detected in microtesla fields. Prepolarization in millitesla fields is followed by detection with an untuned dc superconducting quantum interference device (SQUID) magnetometer. Because the sensitivity of the SQUID is frequency independent, both signal-to-noise ratio (SNR) and spectral resolution are enhanced by detecting the NMR...

20060176055 - Magnetic resonance imaging apparatus and its control method: Collecting first and second echoes and third or fourth echoes, controlling a unit to supply a coil with a base pulse during a period of collecting the echoes, and to further supply the coil with a unit pulse before the period of collecting the third or fourth echoes, measuring an...

20060176056 - Nmr cryomas probe for high-field wide-bore magnets: An MAS probe is disclosed for obtaining a substantial improvement in signal to noise (S/N) in triple-resonance high-resolution (HR) magic-angle-spinning (MAS) NMR of samples near room temperature (RT) in high-field magnets where the magnet's RT shim bore is greater than 60 mm. All critical circuit components, including the sample coils,...

20060176057 - Nmr probe circuit with nodal impedance bridge: A nuclear magnetic resonance (NMR) probe circuit is used with a sample coil tuned to a primary frequency f1. The circuit is arranged to have a plurality of points of electric field minima at the f1 frequency. One or more additional frequencies may be coupled to the circuit at these...

20060176058 - Device and method for testing the seal tightness of a fuel tank system of a motor vehicle: A device and method for testing seal tightness of a fuel tank system of a motor vehicle, wherein excess pressure is built up in the fuel tank system by an electrically operated pump and electric current consumption of the pump is compared to reference values in order to determine whether...

20060176059 - Motor phase current measurement using a single dc bus shunt sensor: A method and system for obtaining motor current measurements from a DC bus current of an inverter that drives a pulse width modulated electric machine is disclosed. The method may include sensing a DC bus current in a sensor located on a bus of an inverter; sampling the DC bus...

20060176060 - Method and circuit arrangement for the detection of ground faults on electronic trips for low-voltage circuit breakers comprising serially connected measuring amplifiers: One problem during the detection of ground faults resides in the fact that the measuring amplifiers have a great amount of tolerance regarding the amplification factor thereof, resulting in a substantial error when errors are handled by means of software. According to the disclosure, the output signals of the measuring...

20060176061 - Fluid detection cable: A fluid detection cable is described for use in detecting the presence of leaks in areas where a particular fluid is not desired. Sensing leads in the fluid detection cable have a center conductor that may be surrounded with a non-porous conductive polymer coating that protects the conductors from corrosive...

20060176062 - Security scanners with capacitance and magnetic sensor arrays: Security scanning devices based on electrical tomography, including tomography systems based on the measurement of capacitance (ECT) and electromagnetic tomography (EMT), in combination with knowledge-based image analysis and understanding. Each device includes a sensing head or transducer, sensing electronics, image reconstruction and image analysis microprocessor, a display unit and accompanying...

20060176063 - Capacitive sensor: A capacitive sensor for simultaneously sensing radial movement and axial movement of a rotary body. The capacitive sensor includes a sensor housing having a pocket disposed in a radial direction and provided with one side surface opened in an axial direction; a plurality of sensor electrodes inserted into the pocket;...

20060176064 - Connector for measurement of electric resistance, connector device for measurement of electric resistance and production process thereof, and measuring apparatus and measuring method of electric resistance for circuit board: Disclosed herein are a connector for measurement of electric resistance and a connector device for measurement of electric resistance, by which necessary electrical connection can be surely achieved even when a circuit board to be inspected is large in area and has a great number of small-sized electrodes to be...

20060176065 - Probe assembly with multi-directional freedom of motion and mounting assembly therefor: An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed...

20060176066 - Device for measurement and analysis of electrical signals of an integrated circuit component: According to the invention, one or more external test connection contact points (pads; pins; balls), are provided in an integrated circuit component (chip) (1), through which signals (4, 5, 6) that are to be measured or analyzed are selectively fed, e.g. by means of a multiplex circuit (7,8), and wherein...

20060176067 - Method and system for detecting potential reliability failures of integrated circuit: A method and system for detecting a potential reliability problem cause by electrical bridging in an integrated circuit. A voltage difference is created between two conducting lines in the integrated circuit to accelerate the bridging effect for a predetermined period of time. The conducting lines are detected to determine whether...

20060176068 - Methods used in a secure memory card with life cycle phases: A secure memory card with encryption capabilities comprises various life cycle states that allow for testing of the hardware and software of the card in certain of the states. The testing mechanisms are disabled in certain other of the states thus closing potential back doors to secure data and cryptographic...

20060176070 - Semiconductor chip and method of testing the same: A semiconductor chip includes a plurality of pads; a plurality of interface circuits connected with the plurality of pads, respectively; an internal circuit connected with the plurality of interface circuits; and a transfer circuit connecting the plurality of interface circuits with each other in response to a test mode signal....

20060176069 - Wired circuit board and producing method thereof: A wired circuit board that can provide improved reliability on connection between the terminal portions and the external terminals while ensuring high productivity and cost reduction, and a production method thereof. After a conductive pattern 3 including terminal portions 6 to connect with external terminals 22 of an electronic component...

20060176071 - Inspection probe, inspection device for optical panel and inspection method for the optical panel: An inspection probe for inspecting characteristics of an electronics device having a plurality of signal lines and a drawing portion to which the plurality of signal lines are drawn to be disposed substantially in parallel with each other, the inspection probe being temporarily connected with the signal lines in inspecting...

20060176072 - Method and apparatus for testing liquid crystal display device: A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal...

20060170408 - Method for activating and deactivating electronic circuit units and circuit arrangement for carrying out the method: The invention provides an electronic circuit arrangement having an electronic circuit module (100) constructed from one or more electronic circuit units (101a-101n), a select signal generating unit (105) for generating a select signal (103), and a connecting line (106) for connecting each electronic circuit unit (101a-101n) to the select signal...

20060170409 - Test pulses for enabling revenue testable panel meters: A panel meter including an energy test pulse device that enables the panel meter to be used for revenue applications and eliminates the need for two separate meters, one for panel indication, and the other for energy and revenue applications. The electrical panel meter including at least one sensor configured...

20060170410 - Compensation of simple fiber optic faraday effect sensors: A monitoring system for detecting earth faults in an electrical power supply grid providing a power signal includes a plurality of monitoring devices, each of the monitoring devices including a detector for detecting the level of harmonics in the power signal, wherein the level of harmonics is detected in a...

20060170411 - Capacitance detection apparatus: A capacitance detection apparatus includes a detection electrode for detecting approach of an object on the basis of a change of capacitance, a calculating circuit for calculating a value associated with the capacitance change, a judging circuit for judging whether the calculated value is a normal or initial value calculated...

20060170412 - Sokcet assembly for testing semiconductor device: The present invention relates to a socket assembly for testing semiconductor device comprising a socket board electrically connected to an outside testing device wherein a plurality of connection pins connected to leads of a semiconductor is provided; a socket guide mounted to cover the socket board, with an open part...

20060170413 - Apparatuses and methods for monitoring rotation of a conductive microfeature workpiece: Apparatuses and methods for monitoring microfeature workpiece rotation during processing, such as brushing, by monitoring characteristics corresponding to a state of a magnetic field proximate to the rotating microfeature workpiece are disclosed herein. The characteristic can depend on the relative motion between the magnetic field and the conductive material of...

20060170414 - Encoder for rolling contact bearings: Encoder for rolling contact bearings provided with a support portion which is interference-mounted onto a rotating race of the rolling contact bearing, and with a control portion which is integral with the support portion in order to emit a signal in relation to the angular speed of the rotating race;...

20060170415 - Device for recording a rotational movement in a vehicle steering system: A device is for measuring an angular movement in a vehicle steering system. A shaft, whose angular movement is to be measured, is rotationally mounted in a frame. Positioned on the shaft is an axially displaceable element, which is connected to the shaft via a geared connection that converts the...

20060170416 - Non-contact position sensor: Without utilizing a clearance between a moving magnet and a stator as a magnetic path, a length of the magnet in a moving direction is utilized in detection of the magnet effectively. In accordance with a percentage of a slider 110 having the magnet 111 that enters a movable area...

20060170417 - Distributed array magnetic tracking: Magnetic tracking systems and methods confine source(s)/sensor(s) to a compact region, thereby facilitating enhanced precision without the need for distortion compensation or mapping. Several sensors placed in accurately known (or determined through algorithms within the tracker processor) locations allow a single small magnetic field source to be tracked by all...

20060170418 - Drive unit provided with position detecting device: A drive unit in accordance with the present invention is provided with a magnetic field generating member generating a magnetic field, a magnetic field detecting device constituted by first, second and third magnetic field detecting elements detecting the magnetic field, and a piezoelectric actuator moving the magnetic field generating member....

20060170419 - Rotation angle detector: A rotation angle detector for detecting change in the magnetic flux has a magnetic sensor being disposed at a position in a space between an outer surface of a shaft and a periphery of the magnetic flux generation means. A supplementary magnet is also used in a space that is...

20060170420 - Eddy current testing probe and eddy current testing apparatus: An eddy current testing probe has a flexible substrate adapted to face to a surface of a test article, a plurality of coils which are fixed to the flexible substrate and energized one of which is capable of being changed sequentially, a pressing member for pressing the substrate toward the...

20060170421 - Moving-target magnetic resonance imaging system and method: A system and method for imaging an object that takes into account movement of the object in producing an MR image. A system may include a target volume location sensor for determining a location of an object being imaged. A moving-target algorithm may use the location information and other image...

20060170422 - Optimized channel controller for nmr apparatus: A controller for apparatus assuming a sequence of precisely synchronized states in accordance with a lengthy event stream is realized in an architecture comprising a register layer comprising a plurality of latched registers for receiving event descriptors and parameters from a bus and a computational/logical layer for operations on/among certain...

20060170423 - Buried meter and structure measurement system: A buried type measuring instrument has a sensing unit 10A which is formed in part of a case 10 and senses a physical value pertaining to a change of state of a structure. This case 10 accommodates a transducer 11 for converting the physical value sensed by the sensing unit...

20060170424 - Subsurface imagery for temperature measurement and fluid flow for oil recovery using electromagnetic impedance tomography (emit): A new application of electromagnetic tomography is described directly related to the efficient recovery of oil and gas as well the removal of unwanted liquids from subsurface formations. The process involves the deployment of both surface and a single borehole magnetic dipole structures used for both transmitting and receiving low...

20060170425 - Method and apparatus for demagnetizing a borehole: A demagnetizing sub having an electromagnet or a rotating magnet is used for demagnetizing magnetized material in a wellbore....

20060170426 - Method for determining state of charge of lead-acid batteries of various specific gravities: In accordance with various embodiments, there is a method for determining the state of charge of a battery. Various embodiments include the steps of determining the specific gravity of the battery and measuring an open circuit voltage of the battery at rest. The open circuit voltage at rest can be...

20060170427 - Exterior lamp check for motor vehicles: An automated system for cycling vehicle lamps on and off allows direct inspection by one person of operability of the lamp bulbs while doing a walk around of the vehicle. The system is switch operated. Interlocks to operation are based upon the status of the vehicle's service brake, its park...

20060170428 - Electrical safety cord: An electric cable which can be used with a shock hazard protector to provide arc fault and ground fault protection at a minimum cost. The electric cable includes a first insulated conductor for coupling to a phase terminal of a protector, a second insulated conductor for coupling to a neutral...

20060170429 - Connector, connector testing apparatus and method: A female connector (F) has a housing (10) with a front end and cavities (11) extend to the front end. Terminal fittings (40) are mounted in the cavities (11). A front wall (50) is mounted on the front end of the housing (10) and is formed with tab insertion holes...

20060170430 - Method for determining the rf shielding effectiveness of a shielding structure: Determining the RF shielding effectiveness of a shielding structure including measuring RF isolation between a first and a second element of a directional coupler and providing a first measurement result, placing a shielding structure so that a part of the shielding structure is substantially between the first element and the...

20060170431 - Method of estimating channel bandwidth from a time domain reflectometer (tdr) measurement: Bandwidth of a test channel is determined from a single port Time Domain Reflectometer (TDR) measurement with the channel terminated in a short or an open circuit. Bandwidth is estimated by: (1) making a TDR measurement of a channel terminated in a short or open circuit; (2) determining a maximum...

20060170432 - Method and a device for voltage measurement in a high-voltage conductor: Measuring equipment for forming a measured value for voltage representing an ac voltage on a high-voltage conductor. The measuring equipment includes capacitor equipment with a known capacitance for connection between the high-voltage conductor and ground potential. The measuring equipment further includes a current-measurer for sensing a capacitor current flowing through...

20060170433 - Semiconductor test circuit: A semiconductor test circuit operates without a predetermined delay time and is capable of selecting an electrical signal to be tested even after assembly of a semiconductor device has been completed. The semiconductor test circuit is installed inside the semiconductor device to measure the state of at least one electrical...

20060170434 - Method and apparatus for verifying planarity in a probing system: An apparatus for determining a planarity of a first structure configured to hold a probing device to the planarity of a second structure configured to hold a device to be probed is disclosed. In one example of the apparatus, a plurality of moveable push rods are disposed in a substrate,...

20060170438 - Probe card: Provided is a probe card including: a printed circuit board comprising a ground electrode; at least one dielectric disposed below the ground electrode; and a plurality of needles, each of which comprises: a first end portion contacting a wafer pad of a semiconductor device, a second end portion electrically connected...

20060170437 - Probe card for testing a plurality of semiconductor chips and method thereof: A probe card for that may be used to test a plurality of semiconductor chips formed on a wafer. The probe card may include a substrate; a plurality of probe blocks that form a pattern corresponding to the pattern formed by the plurality of semiconductor chips formed on the wafer;...

20060170439 - Probe for testing a device under test: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies....

20060170435 - Programmable devices to route signals on probe cards: A probe card of a wafer test system includes one or more programmable ICs, such as FPGAs, to provide routing from individual test signal channels to one of multiple probes. The programmable ICs can be placed on a base PCB of the probe card, or on a daughtercard attached to...

20060170436 - Radio frequency identification labels and systems and methods for making the same: Systems and methods are provided for generating customized labels having electronic circuitry such as RFID circuitry. A printing system generates the label by selectively transfer printing elements (e.g., electronic circuitry, physical components, etc.) and donor layers (e.g., conductive materials, non-conductive materials, etc.) from a ribbon to a receiver (e.g., an...

20060170440 - Vertical probe card, probes for vertical probe card and method of making the same: A vertical probe card includes a circuit board and a probe set having a base and a plurality of probes provided at the base and electrically connected to the circuit board. Each probe has a foot, a tip and a middle body portion connected between the foot and the tip....

20060170441 - Interface for testing semiconductors: A system that includes an imaging device for effectively positioning a probe for testing a semiconductor wafer....

20060170442 - Protection devices for integrated circuit boards: A protection device for protecting an integrated circuit board (30) includes an upper cover (10) and a lower cover (20). The lower cover includes a body portion (22), a pair of end portions (24) and an edge portion (26) interconnecting the end portions. The body portion, the pair of end...

20060170443 - Avalanche testing at final test of top and bottom fets of a buck converter: An avalanche test circuit for applying an avalanche test signal to a device under test, comprising a series combination of a voltage source and an inductance; a switching device connected in parallel with said series combination; a diode for being connected to a test terminal of said device under test,...

20060170445 - Method for testing the sensitive input range of byzantine filters: A Byzantine filter tester including a feedback loop, a pseudo random waveform generator and an output tester. The feedback loop is coupled between an output of a device under test and an input of the device under test. The feedback loop is further adapted to have an odd number of...

20060170444 - Novel fluorescent and photoemission apparatus and method for submicron ic failure analysis: A single integrated fault detection apparatus and method for detecting heat-related and non-heat-related integrated circuit defects is disclosed. In one embodiment, the present invention is an apparatus comprising a first portion for detecting non-heat-related integrated circuit defects. In this embodiment, the present invention further comprises a second portion for detecting...

20060170446 - System and method for testing devices utilizing capacitively coupled signaling: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at...

20060170447 - Electronics device, optical panel, inspection probe, inspection device for the optical panel and inspection method for the optical panel: An electronics device includes: a plurality of signal lines; and a drawing portion to which the plurality of signal lines are drawn to be disposed substantially in parallel with each other, in which the drawing portion has an inspection terminal allocating layer in which predetermined ones out of the signal...

20060170448 - Method of sensing motor winding current in integrated stepper motor buffer: A method and motor controller for sensing motor winding current. An FET drive transistor has its ON resistance periodically increased to about five times the normal ON resistance for short sensing intervals during motor drive. An analog-to-digital converting senses the voltage across this FET during the sensing intervals. The resulting...