Electricity: measuring and testing inventions 07/06

20060164062 - Distinguishing network interface card from short circuit condition in power over ethernet system: Novel system and methodology for distinguishing a Network Interface Card (NIC) from a short circuit condition in a Power over Ethernet (PoE) system. A system for providing power to a powered device (PD) includes a PD probing circuit that generates a detection signal supplied to a device being probed and...

20060164063 - Atmospheric refractivity profiling apparatus and methods: Apparatus and methods for characterizing atmospheric refractivity and its evolution in time and space utilizing passive radiation emission measurement devices are disclosed. Based on an instrument such as a passive microwave radiometer, ancillary meteorological measurements and other information and observations, the apparatus and methods provide useful signatures for characterizing atmospheric...

20060164064 - Multi-channel radiometer imaging system: A radiometer system includes a housing and an RF board contained within the housing. Balanced radiometer channels receive an unknown signal and known reference. Each balanced radiometer channel includes at least one quadrature hybrid and amplifier circuit to provide distributed gain and an amplified output signal. A detection circuit receives...

20060164065 - System and method for tracking a variable characteristic through a range of operation: An analog control circuit is coupled to an apparatus having a variable characteristic over an operating range. A sensing circuit is coupled to the apparatus and the control circuit during the range of operation of the apparatus and is operative to sense the variable characteristic. The operating parameter of the...

20060164066 - Apparatus and method for measuring transmission delay time of a signal propagation path between printed circuit boards: Transmission delay time measurement is performed on a signal propagation path between respective points of two printed circuit boards connected by a coaxial cable. Measurement is made of a frequency-domain response of the cable and a first time-domain response of the propagation path at its sending point and a second...

20060164067 - Pll loop filter capacitor test circuit and method for on chip testing of analog leakage of a circuit: A test circuit within an existing design to enable the test circuit to test directly within the circuit. This invention provides a way to test and measure the leakage of the PLL loop filter capacitor leakage during test with a simple digital tester using existing pins. The test PLL circuit...

20060164068 - Passive indicator of voltage presence: The subject of the invention is a passive indicator of voltage presence used to indicate voltage in electrical conductors, electrically powered devices, power distribution devices and transmission lines of high, medium and low voltage. The indicator according to the invention is characterized in that it has form of a multilayer...

20060164069 - Method and circuit arrangement for current measurement: A method with corresponding circuit arrangement is disclosed, whereby for evaluation of a measured signal arising as an analogue value with a potential greater than zero potential in a measuring device requiring a supply current, the measured information therefrom is transmitted as a digital signal to an analytical unit lying...

20060164070 - Method and device for voltage measurement of an ac power supply: In an electronic device having an electrical circuit connected to live and neutral lines of an AC power supply via a bridge rectifier for the provision of DC power, a method for ascertaining the AC power supply voltage includes providing a corrected voltage signal comprising a differential between signals representative...

20060164072 - Design for test for a high speed serial interface: Detecting a connection between two circuits utilizing a high-speed interface. Interface circuitry internal to a computing device performs an initialization process between two processors automatically to determine the state of the interface connection. Test circuitry retrieves the interface state from the interface circuitry. Neither the configuration process, the interface circuitry...

20060164071 - Slidable mounting plate: A mounting plate (1) having one or more parts for indirectly or directly attaching a tester (2) for electronic components on the one side and a handler (3) for electronic components on the other side, comprising at least a single plate (4) on the side of the tester’ and a...

20060164073 - Device for calibration of magnetic sensors in three dimensions: The invention refers to a magnetic calibration device comprising a mounting means designed to support at least one magnetic sensor card being detachably attached and comprising at least one magnetic sensor, in particular in form of a Hall sensor, to be calibrated and connected to a first analog electronic circuit...

20060164074 - Magnetic sensor for determining the location of controlled magnetic leakages: e

20060164075 - Displacement detector: A displacement detector is provided, which can compensate a change in temperature coefficient of impedance of a coil to a displacement of a core. The detector comprises a constant-current supply unit for outputting a constant current including an alternating current, a coil portion, to which the constant current is supplied,...

20060164076 - Magnetoresistive sensor: What is described is a magnetoresistive sensor for operation with a magnetized encoder, which is equipped with a zone with magnetic north and south poles arranged alternately along a direction of motion, comprising a Wheatstone bridge configuration with a first bridge arm between a first supply terminal and a first...

20060164077 - Position detector: The invention pertains to a position detector which, in its simplest form of embodiment, has two induction coils but only one individual pulse wire. All information required, for example for a count, is simultaneously available from the triggering direction of the magnetic reversal and the magnetic reversal direction of the...

20060164078 - Control system and method for the operation thereof: The invention provides for a controller with a control circuit, which contains a feedback path coupled back to the feedback input of the control circuit, a sensor (S) that is arranged in the control circuit and emits a sensor signal at its output, which is converted into a feedback signal...

20060164079 - Magnetic sensor, and method of compensating temperature-dependent characteristic of magnetic sensor: A magnetic sensor 10 includes GMR elements 11-18, and heating coils 21-24 serving as heat generating elements. The elements 11-14 and 15-18 are bridge-interconnected to constitute X-axis and Y-axis sensors, respectively. The heating coils 21, 22, 23, and 24 are disposed adjacent to the elements 11 and 12, the elements...

20060164080 - Magnetic field sensor and method for operating the magnetic field sensor: A magnetic field sensor for the measurement of at least one component of a magnetic field comprises a ferromagnetic core that serves as a magnetic field concentrator, an excitation coil and a read-out sensor. The read-out sensor preferably comprises two sensors arranged in the vicinity of the outer edge of...

20060164081 - System having unmodulated flux locked loop for measuring magnetic fields: A system (10) for measuring magnetic fields, wherein the system (10) comprises an unmodulated or direct-feedback flux locked loop (12) connected by first and second unbalanced RF coaxial transmission lines (16a,16b) to a superconducting quantum interface device (14). The FLL (12) operates for the most part in a room-temperature or...

20060164082 - Shimming of mri scanner involving fat suppression and/or black blood preparation: In a method for shimming a magnetic resonance imaging scanner (10), at least one of fat suppression and blood suppression is performed to suppress magnetic resonance from a corresponding at least one of fat and blood. First and second magnetic resonance echoes emanating from a generally columnar volume are measured....

20060164084 - Method and system for enabling adaptive measurement of spin-lattice and spin-spin relaxation times: A method and system for adaptive acquisition of magnetic resonance imaging (MRI) data by initially performing an analysis of a set of samples using a wide range of spin-lattice relaxation time (T1) times, and spin-spin relaxation time (T2) times of the sample under magnetic resonance imaging, and ranking the level...

20060164085 - Method for filtering spurious resonances from an nmr dataset: A method for filtering spurious resonances from an NMR dataset comprises the steps of: (a) creating a first, non-oscillating magnetic field of a predetermined field strength across a sample, (b) intermittently exposing the sample to a second, oscillating magnetic field orthogonal to the first to generate an NMR signal, (c)...

20060164086 - Method for planning and performing a magnetic resonance examination, magnetic resonance appliance and coil unit: The invention relates to a method for planning and performing a magnetic resonance examination using a magnetic resonance appliance, in which at least one coil unit is arranged on the patient and at least two areas are examined. The coil unit comprises an input panel and possibly an optical coil-specific...

20060164083 - Method of monitoring a magnetic field drift of a magnetic resonance imaging apparatus: The invention enables to monitor a magnetic field drift of a magnetic resonance imaging apparatus on the basis of the magnetic resonance signals, which are acquired during magnetic resonance image data acquisition, such as by single shot EPI or by a gradient echo sequence. The phases of at least two...

20060164087 - Magnetic resonance method and device: The invention relates to a method for magnetic resonance imaging (MRI) of at least a portion of a body placed in a stationary and substantially homogeneous main magnetic field. According to this method, the portion of the body is initially subjected to a T2-preparation sequence (T2PRE). Thereafter, a 2D navigator...

20060164088 - Nmr apparatus for concurrent analysis of multiple samples using a receiver coil array: Apparatus is provided for causing nuclear magnetic resonance in a plurality of samples. The apparatus comprises a magnetic system for generating a magnetic field including a working volume in which the magnetic field is substantially homogeneous. A sample holder is adapted to hold the plurality of samples within the working...

20060164089 - Magnetic resonance imaging receive circuit: A magnetic resonance imaging receive circuit, for use e.g. within the body of a patient during an MR imaging procedure, includes a balanced MR coil (50) connected to balanced matching and decoupling circuitry (110, 120). Signal transfer passes along two micro-coaxial cables (52, 54) to signal combination circuitry (300) with...

20060164090 - Inspection apparatus: The present invention relates to inspection reports for certifying that a particular event has actually taken place at a particular date or time, and, where appropriate, at a particular place. The invention provides an inspection apparatus (100) including, in a secure casing, a central processing unit (1), a digital audiovisual...

20060164091 - Rotating magnet-induced current pipeline inspection tool and method: Disclosed are an apparatus and method for integrity monitoring of tubular components and, in particular, pipe walls. The apparatus comprises a configuration of permanent magnets arranged to rotate circumferentially within the pipe, whereby uniform low-frequency currents are generated within the pipe wall which, in turn, generate fields detectable with, for...

20060164092 - Borehole conductivity simulator verification and transverse coil balancing: Calibration of the arrays of a multicomponent induction logging tool is achieved by positioning the tool horizontally above ground. The upper and lower housings of the tool are connected by a borehole conductivity simulator which as a resistance comparable to that of a borehole. Axial and radial positioning of the...

20060164093 - Ion eluting unit and device loaded with same: In an ion elution unit, a drive circuit applies a voltage between electrodes to elute metal ions from the electrodes. Polarities of the electrodes are reversed cyclically with a voltage application halt period placed in-between. A current detection circuit detects the current flowing between the electrodes. A check of operation...

20060164094 - Particle detection: Particle detection and characterizing apparatus has an insulating tube along which the particles flow. Five electrodes spaced along the outside of the tube are connected via amplifiers to a processor arranged to measure the charge on the particles. The apparatus also includes a laser and photomultiplier tube arranged to measure...

20060164095 - Method for determining the voltage sensitivity of the distance between the mirrors of a fabry-perot interferometer: This publication discloses a method for determining the voltage sensitivity of the distance between the mirrors of a Fabry-Perot interferometer in a measuring device, which is intended to measure a predefined gas (e.g., CO2), of which at least one absorption maximum (ABS) or minimum is known. According to the method,...

20060164096 - Circuit for detecting electric current: A circuit for detecting an electric current by which a loss portion of a forward current caused by a backward leakage current of a diode generated by the influence of temperature increase can be compensated such that error in the peak value of a load current detected by surrounding high...

20060164097 - Electrical switching apparatus and method including fault detection employing acoustic signature: A circuit breaker detects a fault, such as an arc fault or glowing contact, of a power circuit. The circuit breaker includes a first lug and a second acoustic lug adapted to be electrically connected to the power circuit. Separable contacts are electrically connected in series between the first lug...

20060164098 - Utilization of power delivered to powered device during detection and classification mode: A powered device for receiving power from a power supply device over a communication link has operation support circuitry responsive to power provided by the power supply device in a detection or classification mode to enable the power supply device to operate in the detection or classification mode, and auxiliary...

20060164100 - Method and system for measuring partial discharge: In the measurement of partial discharge, a voltage detected by the antenna is input into a spectrum analyzer and a phase difference between an operating voltage and a power supply of the spectrum analyzer is obtained by phase domain analysis using the spectrum analyzer. Based on the phase difference and...

20060164099 - Method and system for transmitting an information signal over a power cable: The invention relates to a method for inputting an information signal into a power cable which is connected to a voltage supply and which comprises at least one or more conductors, a dielectric provided around the conductors and a conductive earth sheath arranged wholly or partially around the dielectric, the...

20060164101 - Test method and apparatus for in-house wiring problems: To test for in-house wiring problems, upstream transmission profiles are tuned automatically and remotely, and reactive downstream parameter modifications indicative for in-house wiring problems are measured....

20060164102 - Intermediate circuit capacitor short-circuit monitoring: The electronic monitoring circuit for monitoring one of a group of series-connected capacitor units in an intermediate circuit in order to detect short-circuiting of one of the capacitor units includes a device for deriving a reference voltage (14) from an intermediate-circuit voltage (L(+), L(−)) applied across the series-connected capacitor units...

20060164103 - Gauge calibration: A method of calibrating a gauge in particular for the measurement of film thickness, uses a calibration variable to compensate for short term changes in probe tip condition, instead of a constant value. A calibration constant is based only on the dielectric constant for a coating such as lacquer, and...

20060164104 - Measuring apparatus: The present invention relates to a measuring apparatus for measuring a thickness or the like of a thin film formed on a surface of a substrate such as a semiconductor wafer. The measuring apparatus includes a microwave emission device (40) for emitting a microwave to a substance, a microwave generator...

20060164105 - Metal detector with improved receiver coil: A pulse-induction-type metal detector in which the receiver coil comprises bifilar windings that are connected in series, opposing during the coil pulse and in series, aiding, following the coil pulse. Pick-up of energy by the receiver coil during the coil pulse is thereby minimized and the duration of oscillations is...

20060164106 - An apparatus and method for monitoring and determining the moisture content in elastomer materials: An apparatus and method for determining and monitoring the moisture content of an elastomer material used as a closure or stopper for containers holding lyophilized pharmaceutical products, comprising a parallel capacitance circuit formed by supplying a source of AC voltage to a reference elastomer closure and a sample elastomer closure....

20060164107 - Image sensor: An image sensor has a plurality of pixels, each pixel having a photodiode (12), a voltage amplifier (16) having gain greater than 1 and a sampling capacitor (18) charged by the voltage amplifier. In this arrangement, each pixel provides gain through voltage amplification. This enables the sampling capacitor (18) to...

20060164108 - System for providing power over communication cable having mechanism for determining resistance of communication cable: Novel system and methodology for determining resistance of wires in a communication cable having at least two pairs of wires used for providing power from a power supply device to a powered device. A measuring mechanism may determine DC resistance of the wires before the power supply device applies power...

20060164109 - Laser beam inspection equipment: The present invention relates to a laser beam inspection apparatus for inspecting a defect on a sample such as semiconductor integrated circuits by using a laser beam. The laser beam inspection apparatus irradiates a laser beam to a sample supplied with a constant current or applied by a constant voltage,...

20060164110 - Semiconductor device and method of fabricating the same: A highly-reliable semiconductor device and a method of fabricating the semiconductor device, while stably carrying out IC test, are proposed. A pad portion after an IC test using a probe is covered with a second passivation film. It is therefore made possible to protect the pad, which has partially been...

20060164111 - Temperature sensing and prediction in ic sockets: An apparatus and method are provided which preferably combines temperature sensing and prediction for more accurate temperature control of integrated circuits. An IC temperature sensing and prediction device includes a current sensing device that measures current passing through an IC, and a temperature control apparatus that measures a surface temperature...

20060164112 - Low-current pogo probe card: A low-current pogo probe card for measuring currents down to the femtoamp region includes a laminate board having a layer of conductive traces interposed between two dielectric layers. A plurality of probing devices, such as ceramic blades, are edge-mounted about a central opening so that the probing needles or needles...

20060164113 - Method and apparatus for light-controlled circuit characterization: Light-controlled circuit characterization techniques are disclosed. For example, a technique for testing an integrated circuit includes the following steps/operations. At least a portion of the integrated circuit is stimulated with a light source so as to affect one or more electrical characteristics associated with the integrated circuit. By way of...

20060164115 - Defect analyzing device for semiconductor integrated circuits, system therefor, and detection method: The present invention aims at performing a semiconductor integrated circuit defect analysis with a simplified analysis apparatus and simplifying a defect analysis work. A defect analysis apparatus for a semiconductor integrated circuit is characterized in that a presence/absence of a defect is detected by irradiating an electromagnetic field from a...

20060164116 - Internal reference voltage generation for integrated circuit testing: For one or more disclosed methods, a supply voltage is supplied to an integrated circuit, the integrated circuit is placed in a test mode to select one of a plurality of reference voltage generators on the integrated circuit to supply to another voltage generator on the integrated circuit a reference...

20060164114 - Reduced chip testing scheme at wafer level: r

20060164117 - Gate drive circuit for an insulated gate power transistor: The invention relates to a gate drive circuit for, and in combination with, an insulated gate power transistor. The drive circuit is connected to the gate terminal of the transistor for the purpose of supplying a gate drive signal and being combined with the power transistor in the same chip...

20060164118 - Inspection method of array board and inspection equipment thereof: The present invention provides an inspection method of an array board and an inspection equipment thereof, which can detect a disconnection failure of a gate line even if electric potentials are applied from both ends of the gate line....

20060158172 - Cable detection apparatus and method: A cable detection apparatus is disclosed having a filter, the filter transmitting components of a signal detected substantially at certain harmonics of a first frequency. The filter may also attenuate the signal at certain even harmonics thereof. A method of detecting and/or locating cables in the same manner is also...

20060158173 - Gait waveform feature extracting method and individual identification system: A gait waveform feature extracting method and an individual identification system extract features of the gait waveform. A one-step waveform corresponding to one step of a walking movement is specified using, as an index, a peak amplitude corresponding to a state where substantially a whole bottom surface of one foot...

20060158174 - Triggered narrow-band method for making pulsed-rf networking measurements: A method of measuring a device under test (“DUT”) includes applying a pulsed-RF input signal to the DUT and coupling an output of the DUT to a receiver having an output bandwidth selected to measure a center tone in an RF pulse response spectrum from the output of the DUT....

20060158175 - Data transmitting and receiving apparatus: Inverters 28, 30 and zener diodes 32, 34 connected in parallel between the TEDS memory and a data driver of the apparatus are provided. Data transmitted from the TEDS memory to an apparatus 18 side is logically inverted by the inverter 28, and the logical voltage attenuates by a predetermined...

20060158176 - Measuring method and measuring arrangement for measuring currents with a large dynamic range: A measuring method for measuring currents with a large dynamic range by means of a magnetic measuring module has the steps of switching into a high-current mode when a current threshold value is exceeded, and switching into a low-current mode otherwise, wherein the low-current mode has the following steps:—Feeding a...

20060158177 - Electricity meter with power supply load management: An electricity meter for monitoring electric power consumed from a service line is disclosed. The electricity meter includes a power consumption metering system for measuring the amount of power consumed from the service line, a peripheral device providing a non-critical function, a power converter, and a load management system. The...

20060158179 - Apparatus for testing un-moulded ic devices using air flow system and the method of using the same: An apparatus minimizes stress on un-moulded IC devices (4) by use of an airflow system. A vacuum urges the DUT's into contact with the pivoted test fingers, thereby reducing damage to the IC (4). A fitting (5) is connected to a vacuum pump which draws out air and creates a...

20060158178 - Parametric measuring circuit for minimizing oscillation effect: A parametric measuring circuit for minimizing an oscillation effect is provided. The parametric measuring circuit comprises an input detection circuit, an oscillation effect eliminating logic circuit and an output selection circuit. The input detection circuit receives an input signal from an external input terminal and outputs the detection signal. The...

20060158180 - Non-contact rotation angle detecting sensor: A stationary yoke surrounds an outer peripheral surface of a ring-shaped permanent magnet in a certain distance. The ring-shaped permanent magnet is fixed to a rotor and has two poles of N, S poles in a diameter direction. The stationary yoke includes a first outside yoke and a second outside...

20060158181 - Eddy-current probe: An eddy-current probe according to the present invention comprises: a substrate having a first surface facing to a subject to be tested and a second surface opposite to said first surface; an exciting coil formed on the second surface, having a pair of current lines in parallel with each other...

20060158182 - Magnetic sensor circuit and semiconductor device: A magnetic sensor circuit supplying an excitation current to an MI device, and having a detection signal supplied thereto corresponding to a magnetic field intensity from the MI device based on the excitation current, the magnetic sensor circuit includes a pulse current supplying circuit supplying a pulse current to the...

20060158183 - System and method for characterizing a sample by low-frequency spectra: A method and apparatus for interrogating a sample that exhibits molecular rotation are disclosed. In practicing the method, the sample is placed in a container having both magnetic and electromagnetic shielding, and Gaussian noise is injected into the sample. An electromagnetic time-domain signal composed of sample source radiation superimposed on...

20060158184 - Multiple echo train inversion: A method for inversion of multiple echo trains with different wait times uses a cutoff times for each of the echo trains for full polarization. Simultaneous inversion is carried out for T2 bins where full polarization exists...

20060158185 - Method and apparatus for accelerated spiral-coded imaging in magnetic resonance tomography: In a method and apparatus for accelerated spiral-coded imaging (scanning k-space with a spiral trajectory) in magnetic resonance tomography, the user-defined sequence forming the basis of the spiral scanning is modified such that the k-matrix forming the basis of the sequence is scanned only in a sub-region, the sub-region being...

20060158186 - Nmr measurement method and apparatus for same: In an NMR measurement method using an NMR apparatus which converts a received signal to digital data using an analog/digital converter and performs a spectral analysis, a folding and aliasing count is decided from a variation in a peak frequency and frequency discrimination is performed. More specifically, a Nyquist frequency...

20060158189 - High field head coil for dual-mode operation in magnetic resonance imaging: Embodiments of the subject invention can utilize a single coil structure for dual-mode operation. In a specific embodiment, a single coil structure can be used as a volume coil in the transmitting phase and as a phase array in the receiving phase. In an embodiment, a transmit coil array in...

20060158190 - High-field mode-stable resonator for magnetic resonance imaging: Embodiments of the invention pertain to a resonator for use in magnetic resonance imaging. Embodiments of the subject invention pertain to a high-field mode-stable resonator for use in magnetic resonance imaging. Embodiments also pertain to a method of generating and/or receiving rf magnetic fields in a field of view (FOV)...

20060158191 - Microstrip coil design for mri apparatus: A microstrip-based RF coil for use in an MRI apparatus constructed to perform human head imaging is provided and includes (a) a cylindrical non-magnetic core module having an outer surface and a longitudinal axis, a cylindrical bore extending through the core module along the longitudinal axis and defining an inner...

20060158188 - Nmr rf coils with improved low-frequency efficiency: According to one aspect, the low-frequency (e.g. lock channel) performance of a nuclear magnetic resonance (NMR) saddle-shaped, distributed-capacitance radio-frequency (RF) coil is improved by connecting a pair of auxiliary inductors across a plurality of leads extending upward from the coil upper ring. The upward-extending leads can be formed from the...

20060158187 - Phased array mri coil with controllable coupled ring resonator: A coil for magnetic resonance imaging operates in a transmit mode with multiple loops locked together in a phase relationship like a birdcage coil to provide a uniform transmission field, but in a receive mode like a phased array coil, each coil operating independently to produce a separate signal for...

20060158192 - Device for characterizing the flow of a multiphase fluid in a tubing: The invention relates to a device for integrating electrodes (12) characterizing the flow of a multiphase fluid in a tubing (10). The device includes a tube section (14) made out of an electrically insulating material and bearing the electrodes on its external surface. A metal compensation sheath (16) encircles the...

20060158193 - Flux orientation locating in a drilling system: An above ground locator includes an apparatus for determining the strength of the locating signal at a selected point relative to the boring tool. The apparatus includes an antenna arrangement configured for measuring the strength of the locating signal at the selected point along first and second orthogonally opposed receiving...

20060158194 - Boring technique using locate point measurements for boring tool depth prediction: A method is disclosed as part of an overall process in which a boring tool is moved through the ground within a given region along a particular path in an orientation which includes pitch. A locating signal is transmitted from the boring tool which signal exhibits a field defined forward...

20060158195 - Ion current detecting device in internal combustion engine: An ion current detecting device includes an ion current detecting unit which detects ion current based on combustion ion generated after an ignition which is performed in a combustion chamber and an amplifier unit which amplifies ion current detected by the ion current detecting unit. The amplifier unit has an...

20060158196 - Electric potential measuring apparatus, and image forming apparatus: An electric potential measuring apparatus including a substrate disposed facing a measurement object, a detecting electrode provided insulated from the substrate, and a capacity modulating unit for modulating a coupling capacity between the detecting electrode and the measurement object. In the electric potential measuring apparatus, a region with a dielectric...

20060158197 - Insulation resistance deterioration detection method and insulation resistance deterioration detection device for motor, and motor driver: The drive of the motor is stopped, the electromagnetic switch contacts are switched OFF, and thereafter the first and second contact points are closed to form a closed circuit of the smoothing capacitor, second contact point, first and second resistors, motor coil, ground 1, ground 2, first contact point, and...

20060158198 - Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit: To decrease the circuit scale necessary for the calibration of the output circuit and to decrease the time required for the calibration operation. The invention includes a first output buffer and a second output buffer that are connected to a data pin, and a calibration circuit that is connected to...

20060158199 - Integrated capacitive sensor system for the measurement of resistivity and dielectric constant in geophysical, environmental, groundwater and related applications: The invention relates to a capacitive sensor system for measuring environmental parameters by activating a capacitive array and causing fringe electric fields to intersect the surrounding environment. An oscillator is coupled to the capacitive array and the frequency of oscillation depends upon the capacitance of the array, which represents an...

20060158200 - Capacitance measuring circuit: In a capacitance measuring circuit 1, comprising an oscillator circuit, the sensor capacitance Ct forms a link of two or more series connected impedances Rt, Ct, which is connected to the capacitance measuring circuit only at the end terminals of the series connection. One terminal of the series connection, which...

20060158201 - Semiconductor integrated circuit device and method for testing the same: A semiconductor integrated circuit device includes a semiconductor layer formed on a support substrate so as to be insulated from the support substrate; plural circuit blocks formed in the semiconductor layer so as to be insulated from one another; and at least one pair of power supply terminals provided in...

20060158202 - Capacitance detecting circuit and method, and fingerprint sensor using the same: In a capacitance detecting circuit, changes in capacitances at intersections between a plurality of column lines and a row line are detected as voltages. The capacitance detecting circuit includes a code generator for generating code having orthogonality in chronological order. A column-line driver drives the plurality of column lines based...

20060158203 - Allocating device testing resources: Systems and methods of allocating device testing resources are described. In one aspect, a system for allocating m resources for testing devices to n sites of a probe card configured to electrically connect to respective test site locations on a substrate, where m and n are integers and m<n, is...

20060158205 - Method for testing standby current of semiconductor package: A system and method for testing standby current of a semiconductor package is provided. The method includes testing semiconductor chips formed on a wafer having a predetermined wafer run number, collecting measured values of standby current of the semiconductor chips, and storing the measured values of standby current in a...

20060158206 - Probe card for high speed testing: Epoxy probe cards are modified by mounting passive and/or active electronic components on the insulating surface of the probe card and connecting those components to the probe wires with short, electrically conductive lines that are formed on the probe card surface by printed circuit techniques. Ordinary wire probes may be...

20060158204 - Test apparatus: The present invention provides a test apparatus which comprises: a test head which applies a test pattern to the electronic device; a main frame which includes multiple frame-side connectors and which supplies control signals to the test head via the frame-side connectors; and a cable unit which provides optical connection...

20060158207 - Method and apparatus for testing semiconductor wafers by means of a temperature-regulated chuck device: The present invention provides a method for testing semiconductor wafers (5) by means of a temperature-regulated chuck device (1), comprising the following steps: controlling the temperature of the chuck device (1) to a predetermined measurement temperature by means of a heating device (HE) having a predefined heating power (PW) and...

20060158208 - Prober tester: A continuity test system adapted for testing individual contact pins within a flat panel test system is disclosed. The method and apparatus is designed to test continuity of individual contact pins via connection of a contact test pad assembly to a plurality of pins within a user defined pin arrangement....

20060158209 - System and method for testing one or more dies on a semiconductor wafer: A testing system or method compares read data from one or more dies in a semiconductor wafer with the original data written onto the one or more dies The testing system includes one or more write registers connected to one or more dies on the semiconductor wafer. One or more...

20060158210 - Method of predicting high-k semiconductor device lifetime: A preferred embodiment of the invention provides a method for testing a MISFET to determine the effect of hot carrier injection (HCI) on integrated circuit lifetime. The method comprises applying a positive stress voltage to a gate having a high-k dielectric, while simultaneously holding a drain voltage equal to the...

20060158212 - System for testing semiconductor devices: A testing system for testing semiconductor devices, in particular for testing the functioning of BGA semi-conductor devices incorporated in a semiconductor module, comprising an analyzer and at least one measuring adaptor for establishing the electric connections between the analyzer and the semiconductor device, wherein the measuring adaptor comprises a region...

20060158211 - Test system of semiconductor device having a handler remote control and method of operating the same: A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test...

20060152207 - Electrical connection system for an electrochemical analysis system: The invention relates to an electrical connection system for an analysis system and a method for analysis of a liquid sample on an analytical test element using the described analysis system. The analysis system comprises an evaluation appliance for evaluation of electrical signals, a test element holder for holding and...

20060152208 - Time limit function utilization apparatus: A time limit function utilization apparatus includes a first function block, a second function block, a signal line which connects the first and second function blocks and allows using a desired function that is generated by accessing the first and second function blocks with each other, and a semiconductor time...

20060152209 - Electric field sensor and adjustment method thereof: The present invention relates to an electric field sensor including: a light source (1); an electro optic crystal (7) which is applied with an electric field based on a signal under test, in which a birefringent index changes according to the electric field, and which changes a polarization state of...

20060152210 - Current sensor: An integrated circuit current sensor includes a lead frame having at least two leads coupled to provide a current conductor portion, and a substrate having a first surface in which is disposed one or more magnetic field sensing elements, with the first surface being proximate to the current conductor portion...

20060152211 - Transfer system and transfer method of object to be processed: A transfer method employs a transfer system including a semiconductor handling device and an automatic transfer device. The semiconductor handling device includes a first transfer mechanism and a first optically coupled parallel I/O communications interface. The automatic transfer device includes a second transfer mechanism and a second optically coupled parallel...

20060152212 - Detection of revolutions of a tire and wheel assembly by means of the earth's magnetic field: The present invention relates to an autonomous device which is intended to be carried by a tire and wheel assembly in order to detect revolutions of said assembly, comprising at least one sensor which produces signals and an interpreter device which is connected to the sensor in order to interpret...

20060152213 - Apparatus for detecting the presence of electrically-conductive debris: Apparatus for detecting the presence of electrically-conductive debris in a flow passageway has a bridge circuit with four arms. One arm of the bridge has a coil arranged to monitor the flow passageway. Operating circuitry provides alternating current across one diagonal of the bridge, monitoring circuitry monitors imbalance in the...

20060152215 - Rotation angle detection device: A rotation angle detection device has a magnetism detection unit, a magnetic flux generation unit for applying magnetic flux to the magnetism detection unit, and a magnetic flux alteration unit provided for the magnetic flux generation unit. The magnetic flux generation unit is rotated relatively to the magnetism detection unit....

20060152214 - Rotation angle detector: Disclosed here is a rotation angle detector capable of detecting unusual value as a rotation angle so as not to output incorrect data. According to the rotation angle detector of the present invention, the first detector, the second detector, and the auxiliary detector rotate at a different speed. Receiving each...

20060152216 - Flaw detection method and flaw detection apparatus: A flaw detection apparatus comprises: a coil for producing an alternating-current magnetic field for flowing eddy currents in a magnetic material as a member to be flaw-detected; a magneto-optical element disposed at the center of an inner peripheral portion of the coil and having a reflective film at an end...

20060152217 - Method and system for electronic compass calibration and verification: A method and system for calibrating a magnetic compass and/or verifying a compass calibration, using a calibration magnetic field produced by a field-generating coil within the magnetic compass is described. The field-generating coil is located near magnetometers within the magnetic compass. Passing a self-trimming current through the coil produces a...

20060152218 - Magnetoresistive sensor element and method for reducing the angular error of a magnetoresistive sensor element: A magnetoresistive sensor element is provided, having a magnetoresistive layer system which, in top view, is at least regionally striated. The sensor element operates on the basis of the GMR effect and is constructed according to the spin valve principle, the striated layer system featuring a reference layer having a...

20060152220 - Coil element selection method and magnetic resonance imaging apparatus: To visually, readily and positively performing the selection of a coil element and a combination of coil elements most suitable for the MRI scan, a low resolution imaging step for imaging at a low resolution by using a plurality of coil elements A to H, an imaging coil element selection...

20060152219 - Method for detection and imaging of synchronous spin and charged particle motion: A method of nuclear magnetic resonance (NMR) imaging is proposed for the rapid detection of oscillatory motion of spins or charged particles to generate shear waves or oscillating electrical currents to induce alternating magnetic fields to the object being imaged, subjected to a fast train of radio-frequency (RF) pulses to...

20060152221 - Nmr mas probe with cryogenically cooled critical circuit components: An NMR probe contains a metallic dewar for use in a high field magnet, the dewar characterized as having a major fraction of its inner wall made from an alloy whose weight composition includes at least 70% copper, less than 20% zinc, less than 10% nickel, less than 8% Cr,...

20060152222 - Precision gradient amplifier with multiple output voltage levels: A controlled power supply (201, 222) drives a magnetic field gradient coil (161) of a magnetic resonance imaging apparatus (10). A gradient amplifier (201) includes a plurality of switching power regulators (50, 52, 54, 56) which are electrically connected in series. A bipolar circuit (70) receives power from the series...

20060152223 - Method and apparatus for predicting seismic events: The method for predicting seismic events includes supplying electricity by means of a detection unit (3) fitted with current electrodes (A, B) and potential probes (M, N) arranged in the ground and detecting electrical current and induced potentials by means of said electrodes (A, B) and said reception probes (M,...

20060152224 - Diagnosis for expected life of emergency power apparatus: This invention measures the exact value of impedance voltage (Vis) from AC actual waveform (VSM) which includes ripple noise voltage, and suggests the inventive circuits and softwares capable of acquiring the effective resistance of battery internal impedance and the operational algorithm of the diagnosis for the expected life of battery...

20060152225 - Foam detecting conductance control: A method and apparatus is provided for detecting and responding to foaming of a fluid being heated, and more particularly, for operating a device having a container with fluid therein, wherein a resistance of an electrical path from a probe is measured through the fluid to a ground resistance. In...

20060152226 - Diagnostic method for a sensor: The invention relates to a method for diagnosis of a sensor in a motor vehicle having an internal combustion engine, wherein during operation of the motor vehicle, an output signal of the sensor is monitored for whether a maximum value of the output signal undershoots a first threshold value and/or...

20060152227 - Method and arrangement for measuring conductive component content of a multiphase fluid flow and uses thereof: The present invention relates to a method and an arrangement of measuring conductive component content of a multiphase fluid flow and uses thereof. The claimed device comprises two coils arranged around the pipe containing the fluid to be measured, where the induced power loss in the mixture is determined, thereby...

20060152228 - Microwave resonator, textile machine comprising such a resonator and dielectric for such a resonator: A microwave resonator for or on a textile machine, in particular a carding, drawing or combing machine is disclosed, for connection to a measuring device for measuring the thickness and or the dampness of fibre material (FB), continuously passing through the resonator chamber (31; 331). Said microwave resonator is characterised...

20060152229 - Noncontact conductivity measuring instrument: The present invention relates to measurement of conductivity, particularly to the noncontact measurement of the conductivity using a microwave. A microwave oscillated by an oscillator (110) using a Gunn diode is applied through an isolator (120), a circulator (130), and a horn antenna (140) to a silicon wafer (150). The...

20060152230 - Method and circuit arrangement for detecting the level of a liquid: A method for detecting the level of a liquid in a container. The method includes applying a predetermined voltage to a level measuring electrode, disposed within the container, for a predetermined first period of time; then, discontinuing the application of the voltage and waiting a predetermined second period of time;...

20060152231 - Apparatus and method for capacitive measurement of materials: Method for measuring thicknesses of a film, a foil or a material layer with a measuring head which is spaced away from the film and with which a capacitive thickness measurement is performed, in which an optical distance measurement is performed with a distance measuring device and a distance determined...

20060152232 - Method and apparatus for inspection of high frequency and microwave hybrid circuits and printed circuit boards: The invention relates to a method and apparatus for the inspection of high frequency and microwave circuits such as printed test circuit boards. The invention uses a probe or antenna (3) which is separated from the device under test (DUT) (2). The invention provides a relatively long central protruding conductor...

20060152233 - Contact-type film probe: A contact-type film probe including a plastic substrate and multiple signal lines arranged on one face of the substrate. A contact conductive layer is disposed at one end of each signal line. A buffer layer is disposed between the contact conductive layer and the substrate. The other section of the...

20060152234 - Method and apparatus for increasing operating frequency of a system for testing electronic devices: A test system includes a communications channel that terminals in a probe, which contacts an input terminal of an electronic device to be tested. A resistor is connected between the communications channel near the probe and ground. The resistor reduces the input resistance of the terminal and thereby reduces the...

20060152235 - Probing apparatus: A probing apparatus includes a mechanism apparatus. The mechanism apparatus includes a base body, a vibration absorber, a shifting mechanism, and a stage connected via the base body to a ground terminal. A probe, positioned over the stage, is connected to a measurement terminal of a measuring apparatus via a...

20060152236 - On-chip self test circuit and self test method for signal distortion: There is provided an on-chip test circuit that is capable of measuring validity of an output signal within a chip without any external measuring device. The on-chip self test circuit implemented on the same chip as a test semiconductor device includes: a test load block for receiving a test target...

20060152237 - Functional and stress testing of lga devices: Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment includes isolating and adjusting external loads...

20060152238 - System, apparatus and method for controlling temperature of an integrated circuit under test: A system, apparatus and method for controlling temperature of an integrated circuit in a chip tester is disclosed. Embodiments include supplying a chilled fluid to a cold plate at a first flowrate, where the first flowrate is associated with a first valve setting based on at least a desired temperature...

20060152239 - Wafer burn-in system with probe cooling: The present disclosure relates to a wafer burn-in system having a device cooling a probe card and thereby restraining heat accumulation in the probe card. The disclosed wafer burn-in system includes a probe station and a tester. The probe station includes a burn-in chamber, a probe head, and a wafer...

20060152240 - Probe device with micro-pin inserted in interface board: Disclosed is a probe device for testing a semiconductor integrated circuit including a micro-pin adapted to make direct contact with the semiconductor integrated circuit and transmit an electric current to the semiconductor integrated circuit; a retaining block enclosing the micro-pin; an interface board having a groove, the micro-pin being inserted...

20060152242 - Method of performing parallel test on semiconductor devices by dividing voltage supply unit: Provided is a method of performing a parallel test on semiconductor devices, the method including coupling a power signal line to a set of at least two semiconductor devices through a switching device, performing at least one part of a parallel test on the set of semiconductor devices, and disconnecting...

20060152241 - Shared bond pad for testing a memory within a packaged semiconductor device: A system is provided for communicating with a device within a packaged semiconductor device through a shared external terminal thereof. As one example, the system provides for testing a memory within the package. In addition to the device and the shared external terminal, the system includes a command register that...

20060152243 - System and method for testing devices utilizing capacitively coupled signaling: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at...

20060152244 - System and method for testing devices utilizing capacitively coupled signaling: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at...

20060152245 - Tft substrate and testing method of thereof: The present invention relates to a thin film transistor substrate including a shift register disposed at a first side of a non-display area, a gate line disposed to traverse a display area of the TFT substrate, a data line disposed to traverse the display area and cross the gate line,...

20060145681 - Auto-adjustment of rc cells within a circuit: The invention is an integrated circuit comprising a first component couple R and C, at least a second component couple R1—R3 and C′1-C′2 and a calibration circuit 106. The component couples are RC cells. The invention corrects the errors in the values of the components of the RC cells of...

20060145682 - Phase detector and method of phase detection: In order to provide a phase detector and a method of phase detection which are distinguished by greater sensitivity and simple implementability, at least one differential signal of two input signals (Ua; Ub) may be formed over at least one predefined period by means of a first subtracter (12), at...

20060145683 - Transmission measuring system: The transmission measuring system of the present invention comprises a subject for transmission measurement 1 for outputting in response to a signal 2 from the central processing unit 6 an output signal 3 including an information on the transmission time to be measured, an analog-digital converter 4 for converting the...

20060145684 - Measuring transformer utilizing a reference current: A measuring transformer compares a current flowing through a conductor to a reference current. In one embodiment, the measuring transformer includes a magnetic circuit formed by a toroidal core, a conductor through which the current to be measured flows and which is enclosed by the toroidal core, a secondary winding...

20060145685 - Electricity meter with power supply load management: An electricity meter for monitoring electric power consumed from a service line is disclosed. The electricity meter includes a power consumption metering system for measuring the amount of power consumed from the service line, a peripheral device providing a non-critical function, a power converter, and a load management system. The...

20060145686 - Rolling bearing unit with rotational speed detecting device: An inner diameter-side cylindrical member 37 of a supporting ring 36 is externally fitted on a shoulder 35 of an inner ring 3 constituting a hub. An encoder 29a is supported on the outer peripheral surface of an outer diameter-side cylindrical portion 38 constituting the supporting ring 36. Further, to...

20060145687 - Rotor for rotation sensor: A rotor for a rotation sensor may be mounted on a bearing that supports a wheel on an automotive vehicle so that it can detect the number of revolutions for the wheel. The rotor for a rotation sensor 1 includes a reinforcing ring 2 formed like an L-shape in cross...

20060145689 - Electromagnetic sensor systems and methods of use thereof: Sensor circuits including an oscillator circuit....

20060145688 - Transducer of angular quantities for a cycle: A transducer comprising a fixed part and a mobile part which are mounted for relative motion about a given axis. On the shaft of the rotor part there is fitted a magnetized element consisting, for example, of an annular element diametrically magnetized at a single pair of poles. Mounted on...

20060145690 - Current sensor: The present invention provides a current sensor capable of sensing a current to be detected with high precision while realizing a compact configuration. The current sensor includes a first MR element including element patterns disposed at a first level, a second MR element including element patterns disposed at a second...

20060145691 - Ferromagnetic detection pillar and variable aperture portal: A ferromagnetic detection pillar having one or more applied magnetic field sources and one or more magnetic field sensors, with the magnets and sensors arranged and adapted to detect a ferromagnetic threat object on any side of the pillar. A single free-standing pillar can be used to provide protection in...

20060145692 - Magnetostrictive transducer using tailed patches and apparatus for measuring elastic wave using the magnetostrictive transducer: Provided is a magnetostrictive transducer generating a torsional wave in a subject having a predetermined section and measuring a torsional wave propagating in the subject. In the magnetostrictive transducer having a ferromagnetic patch attached to a predetermined position of a subject, a cylindrical insulator installed around the periphery of the...

20060145693 - Detecting failures of flexible multistrand steel structures: A flexible elongate structure, such as a flexible riser (10), comprising at least one layer (20) of steel wires near the surface which extend at least partly along the length of the structure, can be monitored by inducing a small, alternating magnetic field in the steel wires using an electromagnetic...

20060145694 - Superconducting quantum antenna: An antenna for electromagnetic waves including a quantum interference filter, at least one low-temperature transistor and primary antenna structures, means for deriving an electromagnetic wave from the circuit, cooling elements and insulating means. The interference filter and the transistor act as active components, the primary antenna structure is connected up...

20060145695 - Method for fitting a sum of exponentials to experimental data by linearization using a numerical integration approximation, and its application to well log data: A method for analyzing formations using measurements from a detector in response to energy imparted therein. The measurements have characteristics which exponentially reduce in magnitude with time. The method includes (a) determining, an N-th order integral of the value of each measurement from an initial time to the time of...

20060145696 - Moving table mri with subsampling: A novel magnetic resonance imaging method is described, for forming an image of an object from a plurality of signals sampled in a restricted homogeneity region of a main magnet field of a magnetic resonance imaging apparatus. A patient disposed on a table is moved continuously through the bore of...

20060145697 - Probe coil for detecting nqr-responsive materials in large volumes: A coil assembly (11) comprising two coil sections (13a and 13b). Each of the sections (13) consists of a combination of a spiral coil (15) having a variable coil pitch arranged in a saddle shape configuration. The saddle shape has a central portion (17) and a pair of outer coextending...

20060145698 - Apparatus for use in nmr system: Apparatus for use in a NMR system comprises a magnetic field generator (1) surrounding a bore (3), for generating a magnetic field in a working volume (9) located in the bore. A sample support (11) can be removably inserted into a first end of the bore (3) so as to...

20060145699 - Compensation of magnetic field disturbances due to vibrations in an mri system: The invention relates to a magnetic resonance imaging (MRI) system comprising an examination volume (9), a main magnet system (17) for generating a main magnetic field (Bo) in the examination volume, a gradient magnet system (25) for generating gradients of the main magnetic field, and a control system (37) for...

20060145700 - Apparatus for electromagnetic logging of a formation: A tool for electromagnetic logging of a formation includes a tool body configured to move in a borehole penetrating the formation; an antenna array disposed on the tool body; and an electronic unit configured to control operation of the antenna array, wherein the antenna array comprises at least one transmitter...

20060145701 - Method and apparatus for testing and calibrating a small-signal electronic battery tester: Exemplary methodologies and apparatuses for testing and calibrating small-signal battery testers are provided. An exemplary apparatus includes one or more capacitors electrically coupled to one or more conductive elements, and a power supply. The one or more conductive elements include one or more connection points for connecting the small-signal battery...

20060145702 - Method and device for determining the charge that can be drawn from an energy accumulator: A device for ascertaining the charge able to be drawn from an energy store, in particular a battery, up to a specified cutoff, is provided. A particularly precise charge prediction may be achieved if a mathematical energy store model is used, which mathematically represents the electrical properties of the energy...

20060145703 - Automatic component testing: A method of testing a component, wherein the component is sensed using a test sensor whose position is tested and an apparatus for the carrying out of the method....

20060145704 - Systems and methods for testing conductive members employing electromagnetic back scattering: A system or method of analyzing a conductive member for the presence an anomaly. A test source signal is applied to a first test location on the elongate conductive member remote from the corrosion to cause the test source signal to travel along the pipe through the anomaly. At least...

20060145705 - Antenna for detection of partial discharges in a chamber of an electrical instrument: A sensor for picking up partial discharges in an electrical equipment tank filled with a dielectric fluid includes an antenna responsive to the electromagnetic waves generated by such partial discharges. In the sensor, the antenna is formed by two electrodes that are separated from each other by a dielectric resonator....

20060145706 - Calibration circuit and method thereof: A calibration circuit and method thereof. In the example method, a common-mode voltage may be detected at an output port of a mixer. At least one common-mode feedback voltage may be generated (e.g., at one or more common-mode feedback circuits) based on the detected common-mode voltage. A loop gain may...

20060145707 - Device for generating electrical signal corresponding to change in position or posture: [Means for Resolution] A device for generating an electrical signal corresponding to a change in posture includes: a container which is formed of an electrical insulating material and is fixed to an electrode holder formed of an electrical insulating material and in which a fluid dielectric is sealed with a...

20060145708 - Method for measuring characteristics of fets: In an FET-characteristic measuring method, a predetermined bias voltage output from an output terminal of a bias tee is applied to the drain of an FET, and a pulse output from a pulse generator is applied to the gate thereof to thereby cause drain current to be generated. The drain...

20060145709 - Method of determining the composition of a multiphase fluid: A method of determining the composition of a multiphase fluid, such as a flowing petroleum effluent, an emulsion of water and oil, or a foam of oil and gas is disclosed. A first part comprises determining a model expressing the attenuation and the phase shift of a microwave beam as...

20060145710 - Method and system for testing rfid devices: A method and system for testing a plurality of RFID devices disposed on a common carrier. In one embodiment, the RFID devices are evenly spaced along the length of the carrier, and the system comprises a short-range tester, a long-range tester and a computer, the short-range tester being coupled to...

20060145717 - Apparatus and method for testing electrical characteristics of semiconductor workpiece: An apparatus for testing electrical characteristics of a semiconductor workpiece includes a probe card having probes and signal pads electrically connected to the probes, wherein the probes are in contact with a workpiece during a test process; a test head electrically connected with a performance board having signal pads; and...

20060145712 - Contact-type film probe: A contact-type film probe including a plastic substrate and multiple signal lines arranged on one face of the substrate. A silver conductive layer is disposed corresponding to each signal line. A contact conductive layer is further disposed at one end of each signal line for contacting with the wires of...

20060145714 - Energizable electrical test device for measuring current and resistance of an electrical circuit: Provided is an electrical test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters. The electrical test device comprises a conductor probe element, a power supply, a processor and a display device. The power supply is...

20060145716 - Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object: At least one pair of electrode formed on a mounting surface of a stage is in contact with a conductive layer formed on a first surface of an inspection object, and an electrical path is formed between the both by using a fritting phenomenon....

20060145711 - Probe device and probe method: A probe device 20 having a contact load monitoring device 10. This contact load monitoring device measures the displacement of a loading table caused by a contact load exerted on the mounting table from a probe in an overdrive by means of a displacement sensor 11 disposed in the space...

20060145713 - Probe head arrays: A probe head for testing devices formed on a semiconductor wafer includes a plurality of probe DUT (device under test) arrays. Each device under test includes pads that are urged into pressure contact with probes in a corresponding probe DUT array. The probe arrays patterns have discontinuities such as indentations,...

20060145715 - Wafer level test head: A test head is described for simultaneous test and/or simultaneous burn-in of all of the chips on a semiconductor wafer, including high powered microprocessor chips. A test execution wafer is attached to a test pedestal with connections for power plus an interface to a test support computer. Mounted on the...

20060145718 - Burn-in testing apparatus and method: An integrated circuit (IC) package testing apparatus integrates a temperature sensor, heater (or cooler), and controller within a single modular unit. The controller is a microprocessor embedded within the modular unit and in communication with the sensor and heater. The controller allows a selected testing temperature to be input by...

20060145719 - Pogo pin and test socket including the same: A POGO pin that can measure low frequency products as well as RF products and also have a long life span, and a test socket including the POGO pin are provided. The POGO pin includes a metal plunger formed of a conductive metal so as to electrically contact the semiconductor...

20060145720 - Testing device for printed circuit board: A testing device for testing a printed circuit board includes a testing signal converting module for receiving testing signals from the printed circuit board and outputting the testing signals and a plurality of I/O control signals to a plurality of testing circuits. The testing signals include a BIOS signal, an...

20060145721 - Testing printed circuit boards of disk drives and servo track writers: One embodiment of the present invention is method for testing a reading function of a printed circuit board of a disk drive or a servo track writer that includes: (a) providing a test pattern; (b) processing the test pattern to generate a digital signal series; (c) differentiating the digital signal...