Electricity: measuring and testing inventions 06/06

20060139023 - Delay-locked loop and a method of testing a delay-locked loop: A delay-locked loop (DLL) of an integrated circuit (IC) with testing circuitry and a method for testing a DLL. During test mode, a phase comparator of the DLL receives a test clock in place of the reference clock and determines the phase difference between the test clock and the clock...

20060139024 - Multimeter with filtered measurement mode: A multimeter with a filtered measurement mode. By pressing a single button or key, a low-pass filter is switched into the signal path to filter voltage spikes, noise, and switching transients from pulse-width modulated pulses, or lower frequency sinusoidal signals with higher frequency components, and at the same time an...

20060139025 - Saturation-resistant magnetoresistive sensor for ferromagnetic screening: An MRI pre-screening apparatus having an applied field source and a saturation-resistant magnetoresistive sensor, wherein the applied field source is sufficiently strong to magnetize any anticipated ferromagnetic threat object but the sensor is not saturated by the applied magnetic field. The sensor can be made saturation-resistant by being constructed of...

20060139026 - Magnetic field generator device for magnetic force microscope: The magnetic field generator device comprises a plurality of magnetic field generator units, which generate distinct magnetic fields in different locations, and at least two or more of these magnetic field generator units have different external shape, configuration or size. The magnetic field formed by such a magnetic field generator...

20060139027 - Spectroscopic imaging method, device comprising elements for carrying out said method and use of said imaging method for charctering materials: In a spectroscopic magnetic resonance imaging method and apparatus, one or both of an SSFP-RF FID-like signal and an SSFP-RF echo-like signal are read out in one or two readout windows. The readout of this signal or these signals can take place with or without the presence of a magnetic...

20060139028 - Superparamagnetic field sensing devices: A ferromagnetic thin-film based magnetic field sensor having an electrically insulative intermediate layer with two major surfaces on opposite sides thereof with an initial film of an anisotropic ferromagnetic material on one of those intermediate layer major surfaces and a superparamagnetic thin-film on the remaining one of said intermediate layer...

20060139029 - Nmr gyroscope: An NMR gyroscope in one example comprises a support structure affixed within an enclosure, an NMR cell affixed to the support structure, a plurality of permanent magnets disposed about the NMR cell to produce a magnetic field within the cell, and a field coil disposed proximate the cell to produce...

20060139030 - System and method for diagnosing manufacturing defects in a hearing instrument: In accordance with the teachings described herein, systems and methods are provided for diagnosing manufacturing defects in a digital hearing instrument. A system may include a hearing instrument component that is electrically connected to a hearing instrument integrated circuit. A diagnostic program may be stored in a memory location on...

20060139032 - Method for sensing an electric field: A method for sensing an electric field includes processing digitized electric field signals, e.g., from an electric field sensing probe. The processing may include performing a Fast Fourier Transform of the digitized electric field signals to provide an indication of the magnitude of the electric field, and may include processing...

20060139031 - Sensor for sensing an electric field: A sensor for sensing an electric field includes a movable sensor probe including one or more pair, typically three pair, of electrically conductive electrodes, and may include one or more pair of selectively switchable auxiliary electrodes. The probe is movable and may be mounted on a vehicle or trailer. A...

20060139033 - Apparatus and method for performing eye scan: There is provided a method and apparatus for performing an eye scan. Said apparatus comprises: a receiver for receiving input signals; an equaliser for processing said input signals; a data sampler for sampling said processed input signals at certain sampling points to produce a data output, said data sampler being...

20060139034 - System and method for detecting the proximity of a body: A system and method for sensing the proximity of an electronic device, in particular, a radio frequency mobile communication device such as a mobile telephone, wireless modem equipped portable computer, or the like to a body employs an antenna capable of altering its impedance for changing the amount of radio...

20060139035 - Capacitive sensor for non-contacting gap and dielectric medium measurement: A non-contact capacitive sensor including: a sensor plate configured to be displaced from a surface and to measure a capacitance of a gap between the surface and sensor plate; an active shield plate over the sensor plate and insulated from said sensor plate, wherein a high frequency input signal is...

20060139036 - Sensor measuring by capacitance and detection device with capacitive sensors for the detection of a trapping situation: A sensor measuring by capacitance, in particular for the detection of an obstruction of objects or body parts by motor driven devices, comprising an arrangement of a multitude of electrodes on a support and means to measure a capacitance or a capacitance change, is disclosed. The sensor is of a...

20060139037 - Soil probe device and method of making same: A device for measuring one or more different properties of soil or a soil-related substance is provided. The device includes a probe that is inserted into the soil or soil-related substance. The probe includes a tip. The tip is electrically insulative and defines apertures. Electrodes are fitted into the apertures....

20060139045 - Device and method for testing unpackaged semiconductor die: An apparatus and method for testing singulated unpackaged semiconductor die....

20060139038 - Hollow microprobe using a mems technique and a method of manufacturing the same: The present invention relates to a hollow microprobe using an MEMS technique and a method of manufacturing the same. A method of manufacturing a hollow microprobe using an MEMS technique according to the present invention comprises: a step of forming a protection film pattern on a substrate; a step of...

20060139040 - Non-contact electrical probe utilizing charged fluid droplets: There present invention is directed to a system and method which a liquid dispensing head is positioned above the contact area of the device under test (DUT). Liquid droplets are dispensed form the head and these droplets are charged with an electrical charge so that when the drops form a...

20060139042 - Semiconductor inspection apparatus and manufacturing method of semiconductor device: When electrical properties of semiconductor chips of a semiconductor wafer are inspected by bringing plural contact terminals disposed on the principal surface of a probe sheet of a probe cassette constituting a semiconductor inspection apparatus into contact with plural electrodes of the plural semiconductor chips on the principal surface of...

20060139041 - System and method of testing and utilizing a fluid stream: There are disclosed systems and methods in which a liquid dispensing head is positioned above the contact area of the device under test (DUT). A stream of liquid is dispensed from the head such that a continuous column of liquid extends from the head to the contact area of the...

20060139039 - Systems and methods for a contactless electrical probe: There is disclosed a contactless test probe using an ionized gas discharge for making electrical contact with the device under test (DUT). In one embodiment the ionized gas discharge is at or below atmospheric pressure thereby reducing the complexity of the control environment. In one embodiment, the atmospheric gas discharge,...

20060139043 - Test unit to test a board having an area array package mounted thereon: A test unit to test a board having an area array package mounted therein includes the board, the area array package having an electronic component, a plurality of package pins including a plurality of contact pins connected with the electronic component and a plurality of no-contact pins not connected with...

20060139044 - Test unit usable with a board having an electronic component: A test unit usable with a board having, an electronic component includes at least one testing point provided in each electronic component to test electric properties and a connection state of the plurality of electronic components connected to the board. The test unit usable with a PCB having the electronic...

20060139046 - Apparatus for reducing deflection of a mobile member in a chamber: In one embodiment, an apparatus for reducing deflection of a mobile member in a chamber includes at least one receiver projecting from a base member in the chamber and at least one engager projecting from the mobile member. Each engager is matable with a receiver when the mobile member is...

20060139048 - Pin electronics with high voltage functionality: In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer connected to the output of the PE driver and the pin. The first voltage...

20060139047 - Testing system and testing method for duts: A device characteristic testing system for testing a first DUT (device under test), a second DUT, a third DUT and a fourth DUT on a wafer, each of the DUTs includes a first end and a second end, the device characteristic testing system includes: a device characteristic testing circuit formed...

20060139049 - Planar view tem sample preparation from circuit layer structures: A method of preparing a planar view TEM sample of a planar portion of a circuit layer structure, the method comprising polishing the circuit layer structure until a cross-sectional polishing face of the circuit structure has substantially reached a first side face of the planar portion; forming a trench structure...

20060132115 - Integrated circuit test probe: A method and apparatus for testing integrated circuits by subjecting the circuits to an electromagnetic disturbance. A probe is provided, equipped with a horn cover designed to be applied to a printed circuit on which an integrated circuit is mounted. Within this horn cover, a core shield channels the electrical...

20060132116 - Waveform analyzer: A method and system for removing the effect of intersymbol interference (ISI) from a data record indicating times of logic level transitions exhibited by a data signal that has been distorted by ISI exhibited by a system having a particular step response may perform the following acts. The data record...

20060132118 - Electromagnetic wave analysis apparatus and design support apparatus: A design support apparatus of the present invention includes the following: an antenna electromagnetic field distribution input portion that inputs data indicating an antenna electromagnetic field distribution in the vicinity of electronic equipment; a board near electromagnetic field distribution input portion that inputs data indicating a board near electromagnetic field...

20060132117 - Systems and methods for evaluating electromagnetic interference: Systems and methods for evaluating electromagnetic interference that may be employed, for among other things, to evaluate electronic system immunity to radiated electromagnetic fields and/or to identify particular electronic system areas that are susceptible to electromagnetic radiation....

20060132119 - Configurable test interface device: The configurable interface device (CID) is a modular, high-density, high-performance electronic test interface that includes a circuit card assembly and mechanical interface. The mechanical interface provides proper alignment to an interface test adapter (ITA), and electrical engagement, or disengagement. The circuit card assembly routes external high-speed electrical stimulus and response...

20060132120 - Inductive sensor unit: An inductive sensor unit for detecting the position of a vehicle seat or for a gate-shifting unit of an automatic transmission, is described. The inductive sensor unit has a plurality of sensor coils that are disposed in planar fashion on a printed circuit board. A conductive actuation element which is...

20060132121 - Methods for measuring magnetostriction in magnetoresistive elements: A system for directly measuring a magnetostriction value of a magnetoresistive element includes a fixture for receiving a substrate carrying one or more magnetoresistive elements. A magnet assembly applies a first magnetic field parallel to the substrate, and a magnetic alternating field perpendicular to the substrate and parallel to magnetoresistive...

20060132122 - Magnetic characteristic inspecting apparatus and inspecting method using it: A magnetic characteristic inspecting apparatus including a plurality of disk rotating devices or a plurality of magnetic heads include a unit for switching output signals of write signal production units or allocating the output signals to the magnetic heads, a unit for switching signals read from the magnetic heads or...

20060132123 - Eddy current array probes with enhanced drive fields: Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating...

20060132124 - Eddy current probe and inspection method: An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis...

20060132125 - High resolution and low power magnetometer using magnetoresistive sensors: A magnetometer is disclosed that enables high resolution magnetometry using magnetoresistive sensors that consume less power. The magnetometer exploits the ability of the sensor to alter or modulate sensitivity via external means. This modulation effectively transfers the signal of interest from the noisy DC domain to the AC domain by...

20060132126 - Magnetic field sensor: A magnetic field sensor, in particular an rpm sensor and/or rotational direction sensor and/or position sensor for the drive train of a motor vehicle, has a sensor array, with a sensor element that responds to a magnetic field, and optionally with a permanent magnet, the latter being sheathed with plastic...

20060132127 - Parametric nuclear quadrupole resonance spectroscopy system and method: A system and method for probing a specimen to determine one or more components by utilizing a first signal to excite the specimen at a nuclear quadrupole resonant frequency and observing changes in a specimen property. One exemplary property may be dielectric constant. Another exemplary property may be magnetic permeability....

20060132129 - Azimuthal nmr imaging while drilling: NMR measurements are made with a MWD tool having azimuthal sensitivity. The permanent magnet may be a U-shaped magnet or may have an opposed pair of magnets with axial orientation. The tool is designed for pulsing with short sequences for estimating BVI and CBW and minimizes the effect of tool...

20060132128 - Method for determining borehole corrections for well-logging tools: A method for producing borehole-compensated values from non-borehole-compensated measurement signals taken with a logging device in a borehole in earth formations, includes the following steps: producing a database that includes a multiplicity of data points, each data point representing a combination of formation parameters and borehole parameters, database input vectors...

20060132130 - Micro-cell for nmr gyroscope: A cell in one example comprises an alkali metal and a coating of parylene on an interior surface of the cell. In one implementation, the alkali metal may be an optically pumped gaseous phase of an alkali metal. The parylene coating minimizes interaction of the excited state of the alkali...

20060132131 - Method of measuring rock wettability by means of nuclear magnetic resonance: The method essentially comprises determining the water wet pore surface and the oil wet pore surface when the sample is saturated with water and oil, by measurements of relaxation times (T1, T2) of the sample placed in a nuclear magnetic resonance device, previously brought to various water or oil saturation...

20060132132 - Method and system for mr scan acceleration using selective excitation and parallel transmission: A radio frequency (RF) transmit coil array assembly for use in a magnetic resonance imaging (MRI) system is provided. The RF transmit coil comprises a plurality of coils arranged around an object and coupled to a pulse generator module. The pulse generator module is configured to drive the coils to...

20060132134 - Cryogenically cooled radiofrequency coil array for magnetic resonance imaging: A cryogenically cooled radiofrequency (RF) coil structure for use in Magnetic Resonance Imaging (MRI) and method for cryogenically cooling RF coils are provided. The cryogenically cooled RF coil structure comprises a sealed structure constructed of non-conducting material and adapted for containing a cooling substance and at least one RF coil...

20060132133 - Method and system for spatial-spectral excitation by parallel rf transmission: A magnetic resonance imaging (MRI) system and method is provided. The MRI system comprises a plurality of transmit coils arranged spatially distinct from each other and configured for inducing a nuclear magnetic resonance (NMR) excitation. The NMR excitation is selective both in spatial dimensions and in a chemical shift spectrum....

20060132135 - Superconductor probe coil for nmr apparatus: A probe coil for an NMR apparatus including a superconductor coil formed form a superconductor made of magnesium 2-boride formed on the surface of a substrate, and a coil bobbin around which the superconductor coil is wound, wherein the substrate is made of a material that contains no hydrogen atoms....

20060132136 - Bore location system: A system and method for locating a horizontal bore below a ground surface includes a transmitting source configured to radiate from the bore a dipole magnetic field aligned with the bore. A receiver is located remote from the transmitting source and has a first coil and a second coil. Each...

20060132137 - Electromagnetic surveying for hydrocarbon reservoirs: An electromagnetic survey method for surveying an area that potentially contains a subterranean hydrocarbon reservoir. The method comprises detecting a detector signal in response to a source electromagnetic signal, resolving the detector signal along at least two orthogonal directions, and comparing phase measurements of the detector signal resolved along these...

20060132138 - Two loop calibrator: Misalignment of the transmitter and receiver coils of an induction logging tool is determined by positioning the logging tool with a coil axially encompassing the transmitter coil and/or the receiver coil, and activating the transmitter at a plurality of rotational angles....

20060132139 - Apparatus for measuring voltage: An apparatus measures a voltage of a cell while scanning a group of cells in a cell stack, in which a plurality of cells is electrically connected in series. The apparatus has a first switching device and a voltage detecting device. The first switching device is connected in series with...

20060132140 - Circuit to measure vehicle battery voltage: A system for measuring a battery voltage is provided. The system includes a battery, a time encoding circuit, and a controller. The time encoding circuit is in electrical communication with the battery to receive the battery voltage. The time encoded circuit is configured to generate a time encoded signal corresponding...

20060132141 - Battery monitoring system and method: A battery monitoring system includes a component for determining the magnitude of current flowing through a battery cable based on a magnetic field produced by the current. The component is configured to provide an output signal representative of the magnitude of current for use in characterizing the battery. A method...

20060132142 - Power supply device and electric circuit: An FET for malfunction check is connected between the gate and source of an FET for power-source output control, which is connected in series in a power output line from a battery used as a power source for a load. A malfunction determination circuit determines whether the FET for power-source...

20060132143 - Power tester for electrical outlets: A power tester apparatus for testing an electrical outlet. The power tester apparatus includes multiple indicators for identifying the condition of the electrical outlet....

20060132144 - Method and system for monitoring partial discharge in gas-insulated apparatus: A gas-insulated apparatus is equipped inside with multiple sensors for sensing a partial discharge signal caused by a foreign substance, and a frequency analyzing section for analyzing the frequency of the sensed partial discharge signal. A defect type judging section estimates the defect type of the foreign substance from the...

20060132145 - Failure detecting apparatus: The failure detecting apparatus includes an input circuit 13 connected to a temperature sensor 53 to detect various changes, for detecting the resistance of the temperature sensor 53, a monitor circuit 14 connected in parallel to the input circuit 13 for monitoring the failure of the input circuit 13, and...

20060132146 - Millivolt output circuit for use with programmable sensor compensation integrated circuits: An output sensor apparatus, system, and method are disclosed, including a circuit comprising a plurality of bridge resistors and one or more connecting resistors coupled to the plurality of bridge resistors. Additionally, a programmable amplifier can be coupled to the connecting resistor, wherein the circuit produces an output signal that...

20060132147 - System and method for measuring clearance between two objects: A system for measuring clearance between a first object and a second object is provided. The system includes a sensor configuration to generate a first signal representative of a first sensed parameter and a second signal representative of a second sensed parameter. The system also includes a clearance measurement unit...

20060132148 - Via etch monitoring: A method for monitoring the depth of at least one via (11) in a wafer comprising the steps of arranging the via (11) as a capacitive plate (21), providing a corresponding capacitive plate (23), applying an electrical potential difference to the via (11) and the corresponding capacitive plate (23), measuring...

20060132149 - System for on-line assessment of the condition of thermal coating on a turbine vane: Aspects of the invention relate to a system for assessing the condition of a thermal barrier coating on a turbine vane during engine operation. According to embodiments of the invention, one or more wires can be passed along the airfoil portion of the vane. The wires can extend over, within,...

20060132150 - Transducer: A transducer in the form of a potentiometer provides an output signal indicative of a position of a component. The potentiometer comprises a body, a member moveable relative to the body and having an end portion for coupling to the component, and a resistor mounted to the body. A wiper...

20060132153 - Assembly with a detachable member: A structure is fabricated in a generally two-dimensional orientation. The structure includes a detachable member or members. The structure is assembled into a three-dimensional orientation. The detachable member or members are attached to another object and released from the structure....

20060132151 - Contact-type film probe: A contact-type film probe including a plastic substrate. Multiple signal transmission lines are arranged on one face of the substrate. Each signal transmission line penetrates through a section of the substrate near one end thereof. Each signal transmission line is coated with an insulating layer. A conductive layer is disposed...

20060132152 - Contact-type film probe: A contact-type film probe including a plastic substrate. Multiple signal lines are arranged on one face of the substrate. A contact conductive layer is disposed at one end of each signal line. The contact conductive layers serve to contact with the wires of the liquid crystal display. The contact conductive...

20060132156 - Device and method for testing electronic components: A test device includes first and second testers each having at least one testing contact for making contact with at least one external contact of an electronic component; and a conveying device that conveys electronic components to the first and second testers in a synchronized manner such that the external...

20060132155 - Probe card, method of manufacturing the probe card and alignment method: A probe card for a wafer level test of electrical characteristics of a plurality of semiconductor integrated circuit devices formed on a semiconductor wafer. The card has a thin film with bumps on which a plurality of bumps to be respectively brought into contact with all of inspection electrodes of...

20060132154 - Wafer burn-in and test employing detachable cartridge: A cartridge (10) includes a chuck plate (12) for receiving a wafer (74) and a probe plate (14) for establishing electrical contact with the wafer. In use, a mechanical connecting device (90) locks the chuck plate and the probe plate fixed relative to one another to maintain alignment of the...

20060132157 - Wafer probe station having environment control enclosure: A wafer probe station is equipped with an integrated environment control enclosure substantially surrounding a supporting surface for holding a test device, such enclosure limiting fluid communication between the interior and exterior of the enclosure and preferably also providing EMI shielding and a dark environment. The limited communication between the...

20060132158 - Bi-directional buffer for interfacing test system channel: An emitter follower or source follower transistor is provided in the channel of a wafer test system between a DUT and a test system controller to enable a low power DUT to drive a test system channel. A bypass resistor is included between the base and emitter of the emitter...

20060132159 - Burn-in apparatus: A radiating portion of each semiconductor laser element held by a holding portion contacts a heat sink, and therefore heat generated by operation of the semiconductor laser element is transmitted to the heat sink. A heat pipe is provided along an array direction of the semiconductor laser element held by...

20060132160 - Lsi test socket for bga: There is provided an LSI socket containing a pogo-pin type decoupling capacitor for reducing the potential fluctuation of power supplies and GNDs at the time of testing LSI incorporated in a BGA package. The LSI socket comprises a printed board 102 containing decoupling capacitors 113 corresponding to one or more...

20060132167 - Contactless wafer level burn-in: A method and apparatus for performing a wafer-level burn-in. The method comprises the steps of providing the wafer into a burn-in chamber; and outputting a power and a test initiation signal to a wafer via a wireless signal. The apparatus includes a test chamber, a transport mechanism in the test...

20060132166 - Method and system for producing signals to test semiconductor devices: A method of and system for producing signals to test semiconductor devices includes a pin electronic (PE) stage for providing a parametric measurement unit (PMU) current test signal to a semiconductor device under test. The PE stage also senses a response from the semiconductor device under test....

20060132165 - Method and system for testing semiconductor devices: A semiconductor device tester includes a parametric measurement unit (PMU) stage for producing a DC test signal and a pin electronics (PE) stage for producing an AC test signal to test a semiconductor device. A driver circuit is capable of providing a version of the DC test signal and a...

20060132162 - Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipment: In one embodiment, a mock wafer for calibrating automated test equipment includes a printed circuit board having a number of interconnect areas, with each interconnect area having a pair of mock die pads that are coupled via a connecting trace. In another embodiment, a method for calibrating automated test equipment...

20060132161 - Remote test facility with wireless interface to local test facilities: A central test facility transmits wirelessly test data to a local test facility, which tests electronic devices using the test data. The local test facility transmits wirelessly response data generated by the electronic devices back to the central test facility, which analyzes the response data to determine which electronic devices...

20060132164 - Using a parametric measurement unit to sense a voltage at a device under test: Circuitry for use in testing a device includes a first measurement unit to apply a forced voltage to the device, and a second measurement unit having functionality that is disabled. The second measurement unit includes a sense path to receive a sensed voltage from the device, where the sense path...

20060132163 - Using parametric measurement units as a source of power for a device under test: An apparatus for providing current to a device under test includes a first parametric measurement unit configured to provide current to the device, and a second parametric measurement unit configured to provide current to the device. The current from the second parametric measurement unit augments the current from the first...

20060125464 - Connecting sleeve for a bus bar connection in a gas-insulated switchboard system: A connecting sleeve generally used for a bus bar connection is produced from an insulating elastic material, often an elastomer material, having insulating properties which are deteriorated by partial discharges and decrease over the operating time of the switchboard system. According to the invention, so-called partial discharge measuring methods must...

20060125465 - Evanescent microwave probe with enhanced resolution and sensitivity: Novel systems of an evanescent microwave probe (EWP) are disclosed, which enable measurements of physical properties of a sample with enhanced sensitivity and resolution, simultaneously. In one embodiment, new shielding features are added to the probe (which may be of either a sharpened tip or loop configuration) to reduce the...

20060125467 - Current-measuring circuit arrangement: The circuit arrangement for measuring current flowing through a high-resistance consumer (R1) contains a current mirror circuit (1), in the first branch (T1) of which the high-resistance consumer is connected in series and in the second branch of which an evaluation circuit (3, 4, 5) is connected. The high-resistance consumer...

20060125466 - Lsi, test pattern generating method for scan path test, lsi inspecting method, and multichip module: Registers 119 and 120 for power control or power-off signals in an LSI are set as a dedicated chain and a control signal can be controlled desirably from the outside so that the states of the registers 119 and 120 can be monitored easily. In a test pattern generating method...

20060125468 - Method and device for graphically illustrating the filling of a cigarette: The method according to the invention comprises elaborating a sinusoidal mathematical model representing the density y versus the axial position x, conducting experimental measurements of density and of moisture at a plurality of points along the longitudinal axis of the cigarette, calculating a regression determination coefficient from the measured values,...

20060125469 - Monitoring system and device for an electric power line network: A device is provided for monitoring an electric overhead line, which device is constituted by an independently operating real time multisensor for mounting in a position on a span of the overhead line. The device has a built-in transmitter for transmitting sensor signals to a remote central, and comprises a...

20060125471 - Planarity diagnostic system, e.g., for microelectronic component test systems: Maintaining proper planarity of elements of a microelectronic component test system helps ensure reliable operation of the test system. Aspects of the invention provide test systems and methods for verifying planarity of, for example, a head and a support surface of a microelectronic component test system. In one exemplary method,...

20060125470 - System and method for iddq measurement in system on a chip (soc) design: System and method for detecting transistor failure in large-scale integrated circuits by measuring IDDQ. A preferred embodiment comprises a switch structure for an integrated circuit made up of a plurality of main switches (such as main switch 410) selectively coupling a power sub-domain to a power source pin, a plurality...

20060125472 - Position sensing apparatus and method: There is described an inductive position sensor in which a signal generator applies a excitation signal to an excitation winding formed on a first member, the excitation winding being electromagnetically coupled to at least two resonant circuits formed on a second member which are spaced from each other along a...

20060125473 - Variable reluctance position sensor: A variable reluctance analog position device designed to determine the position variation of a target made from a ferromagnetic material. The device includes at least one magnet, the target and the magnet defining a gap therebetween. A magnetosensitive element detects induction variation produced in the gap by relative movement of...

20060125474 - While-drilling methodology for estimating formation pressure based upon streaming potential measurements: Logging-while-drilling apparatus and methodologies for measuring streaming potential in an earth formation are provided. The apparatus and methodologies can be utilized to find information relevant to the drilling operations. In particular, since the streaming potential measurement relates directly to fluid flow, the streaming potential measurements can be used to track...

20060125475 - Radio frequency impedance mapping: Methods and apparatus for determining dielectric properties such as conductivity, permittivity and/or permeability of a body are provided. An array of resonant coils (950) capable of generating electromagnetic radiation are provided proximate a body (950) to imaged. Properties of the array of coils are influenced by the loading effect of...

20060125476 - Eddy current compensation with n-average ssfp imaging: A method according to the technique of a steady state free precession (SSFP) gradient echo method, in particular, of nuclear magnetic resonance (NMR) tomography, wherein a regular sequence of radio frequency pulses with flip angle α is applied at temporally constant intervals TR, wherein the phase of these pulses is...

20060125478 - Nmr magnet device for solution analysis and nmr apparatus: A superconducting magnet device configured for an NMR spectrometer includes a split type superconducting magnet having left and right solenoid superconducting magnets, wherein the split type superconducting magnet has a center space around a vertical center axis between the left and right solenoid superconducting magnets, a sample tube placed in...

20060125477 - Sample inspection apparatus for combining nmr with esr or icr-mass spectroscopy: Sample inspection apparatus comprises a pair of magnet assemblies (28A, 28B) located in a common cryostat (10) and surrounding respective bores (24, 26) at room temperature so as to define corresponding working regions (30, 32) in the bore. A first, NMR probe (6) can be inserted in one of the...

20060125479 - Method for signal enhancement in azimuthal propagation resistivity while drilling: Cross-component measurements made at a plurality of toolface angles are processed to remove bias. The amplitude of the resulting sinusoid is used to estimate a distance to an interface in an earth formation....

20060125480 - Embeddable corrosion rate meters for remote monitoring of structures susceptible to corrosion: An embeddable corrosion rate meter (ECRM) for detecting and measuring corrosion in metal and concrete structures is provided. The system comprises an electrochemical cell with at least one working electrode evenly separated from a counter electrode, wherein a separation distance between electrodes determines an electrolyte medium resistance and the electrolyte...

20060125482 - Apparatus and method for predicting battery capacity and fitness for service from a battery dynamic parameter and a recovery voltage differential: A method and apparatus for testing a storage battery is provided in which a battery is measured to obtain a battery dynamic parameter value such as conductance. The battery is measured to obtain an open circuit voltage, a resistance and a recovery voltage differential. A condition of the battery is...

20060125483 - Battery tester that calculates its own reference values: A battery tester that is capable of calculating its own reference values is provided. The battery tester includes test circuitry that is configured to obtain dynamic parameter values for batteries, and to compute at least one reference value based on the dynamic parameter values....

20060125481 - Method and device for monitoring a reference half cell: A method for monitoring a reference half cell, which forms with a measuring half cell a potentiometric measuring point for determining and/or monitoring an ion concentration of a medium. The ion concentration of the mediums determined on the basis of at least one measurement signal determined in a measuring circuit,...

20060125484 - Sensor plug-in head, particularly for a potentiometric sensor and potentiometric sensor comprising a sensor plug-in head: For simplified supply of potentiometric sensors with a reference electrolyte, a sensor plug head for connecting to a cable connection piece of a potentiometric sensor is provided. The sensor plug head including, besides the usual electric connections, a supply connection for connecting to a reference container of the potentiometric sensor....

20060125485 - Accelerating pcb development and debug in advance of platform asic prototype samples: A system and method are provided for accelerating development and debug of a printed circuit board (PCB) designed for use with a platform ASIC in advance of availability of a prototype sample of the platform ASIC. Aspects of the invention include a pin-out adapter card that implements a predefined pin-out...

20060125486 - System and method of locating ground fault in electrical power distribution system: A method for locating a ground fault in an electrical power distribution system includes providing a plurality of current sensors at a plurality of locations in the electrical power distribution system. The method further includes detecting a ground fault in the electrical power distribution system. Current is monitored at a...

20060125487 - Oil condition sensor: An oil condition sensor is proposed which can stably check the degree of contamination of oil with metallic powder. The oil condition sensor includes a cup-shaped electrode and rod-shaped electrodes provided opposite to the cup-shaped electrode. The rod-shaped electrodes are connected to a first power supply through first fixed resistors...

20060125488 - Two wire resistive sensor: A circuit with two terminals that receive an input current. The circuit includes a sensor, and a controller to generate a modulated signal. The circuit also includes a flyback circuit that receives the modulated signal. The flyback circuit generates a first output voltage based on the modulated signal, shunts or...

20060125489 - Device and method for detecting a substance: A device for detecting at least one substance of a fluid includes at least one piezo-acoustic resonator with at least one piezo layer, an electrode arranged on the piezo-electric layer, at least one other electrode arranged on the piezo-electric layer and a surface section used for sorption of the substance...

20060125490 - Electrostatic capacitance detecting device: The invention provides an electrostatic capacitance detection device. The electrostatic capacitance detection device can be formed of M individual power supply lines, N individual output lines, arranged in a matrix of M rows×N columns, and electrostatic capacitance detection elements provided on the crossing points of the individual power supply lines...

20060125491 - Microwave readable dielectric barcode: Presented is a system and method for reading a microwave readable barcode formed from a pattern of dielectric material. The dielectric pattern creates a strong microwave contrast with the surrounding media selectively resonating with or scattering an interrogating microwave signal. Dielectric bars can be fabricated by inkjet printing, injection, spraying,...

20060125492 - Sensor systems and methods of operation: A technique for operating a sensor system is provided. The method includes exciting a first sensor with a first excitation signal at a first frequency and exciting a second sensor with a second excitation signal at a second frequency. The technique also includes combining a first measurement signal generated from...

20060125493 - Corrosion sensor and method of monitoring corrosion: A method of monitoring corrosion and corrosion sensor includes a first element including a corrodible element to be exposed to a corrosive or corrosion-suspect environment, and a second element including a corrosion sensing circuit coupled with the corrodible element for generating a wireless signal based on the corrosion of the...

20060125494 - Electromigration test device and electromigration test method: The invention relates to an electromigration test apparatus having a direct-current source 101 and an AC voltage source 102. Furthermore, it has a circuit 104 having a conductive structure 100, which is electrically coupled to the direct-current source 101 and the AC voltage source 102, and a measuring device for...

20060125495 - Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam: A charge amount measurement method comprises: interposing a measurement subject between a first substance and a second substance having a through hole; measuring a first collision position where a charged beam passed through the through hole and vicinity of the measurement subject collides against the first substance, in a state...

20060125500 - Compliant contact structure: A compliant contact structure and contactor card for operably coupling with a semiconductor device to be tested includes a substantially planar substrate with a compliant contact formed therein. The compliant contact structure includes a portion fixed within the substrate and at least another portion integral with the fixed portion, laterally...

20060125496 - Method and system for implicitly encoding preferred probing locations in a printed circuit board design for use in tester fixture build: Techniques for automating test pad insertion in a printed circuit board (PCB) design and fixture probe insertion in a PCB tester fixture are presented. A probe location algorithm predictably determines respective preferred probing locations from among respective sets of potential probing locations associated with a number of respective nets in...

20060125498 - Modularized probe card for high frequency probing: A modularized probe head for high frequency probing is provided. The probe head mainly includes a probe head, a mounting board and an interposer between the probe head and the mounting board. The probe head has a plurality of cavities on its back surface. A plurality of decoupling components are...

20060125497 - Sanitary probe seal: The present invention is an elastic seal for use with a sanitary probe. The elastic seal forms a layer between the probing member and the coating member to eliminate the formation of voids between the two. The elastic seal may include an elastic substance, such as silicon or rubber, to...

20060125499 - Test apparatus: A test apparatus for testing electronic devices, comprising a control section for generating control signals based on a test program set in advance to test the electronic devices, a plurality of test modules for generating test signals to be supplied to the electronic devices on the basis of the control...

20060125501 - Modularized probe head: A modularized probe head assembly mainly includes a probe head, an interposer and a probe head carrier with guide pins. The probe head has a plurality of first through holes. The interposer has a plurality of second through holes corresponding in location to the first through holes. The probe head...

20060125502 - System for testing and burning in of integrated circuits: A system for testing integrated circuits is described. A contactor board of the system has pins with ends that contact terminals on a power and signal distribution board. Opposing ends of the pins make contact with die terminals on an unsingulated wafer. The distribution board also carries a plurality of...

20060125503 - Interleaved mems-based probes for testing integrated circuits: In one embodiment, a probe card includes a substrate and a plurality of probes. Each of the probes may have a supported portion and an unsupported portion that meet at a base. The unsupported portion may have a non-uniform (e.g. triangular) cross-section along a length that begins at the base....

20060125509 - Dynamically adaptable semiconductor parametric testing: An apparatus, method, system, and signal-bearing medium may provide multiple maps, which may include multiple probing sequences to be called upon at run-time based on statistical thresholds or other selected criteria. Each map may include a series of locations on a wafer, the tests to perform at each location, and...

20060125508 - On wafer testing of rfid tag circuit with pseudo antenna signal: An RFID tag circuit is described having a pair of signal paths that flow to an input of a demodulator of the RFID tag circuit. A first of the signal paths couple the demodulator to an antenna port of the RFID tag circuit. A second of the signal paths couple...

20060125504 - Printed circuit board for burn-in testing: A burn-in PCB comprising an adapter socket for receiving at least one program card; a plurality of test sockets for receiving test components; wherein one or more of the test sockets are electrically connected to the adapter socket by way of the printed circuit of the burn-in PCB; and wherein...

20060125505 - Rfid tag design with circuitry for wafer level testing: Technologies suitable for on-wafer testing in the ubiquitous computing era are disclosed. Among the inventive features disclosed are: 1) clustering of wafer test probe landing area sites for parallel test sequencing; 2) on wafer test wiring that runs along the wafer's scribe regions; 3) on-wafer test wiring that can be...

20060125506 - Rfid tag with bist circuits: Technologies suitable for on-wafer testing in the ubiquitous computing era are disclosed. Among the inventive features disclosed are: 1) clustering of wafer test probe landing area sites for parallel test sequencing; 2) on wafer test wiring that runs along the wafer's scribe regions; 3) on-wafer test wiring that can be...

20060125507 - Wafer level testing for rfid tags: Technologies suitable for on-wafer testing in the ubiquitous computing era are disclosed. Among the inventive features disclosed are: 1) clustering of wafer test probe landing area sites for parallel test sequencing; 2) on wafer test wiring that runs along the wafer's scribe regions; 3) on-wafer test wiring that can be...

20060125511 - Image test method, program thereof and recording medium storing the program: An image test method for a game machine display device provided with a display unit that displays a predetermined image, a game image information storing unit that stores game image information, a control unit that instructs the display unit to display a game image based on the game image information,...

20060125510 - Line short localization in lcd pixel arrays: A method and apparatus for identifying a location of a short between two or more signal lines on a substrate having a plurality of thin film transistors and a plurality of pixels associated with the thin film transistors. The method includes locating the two or more signal lines having the...

20060125512 - Method and apparatus for inspecting array substrate: A method for inspecting an active-matrix-display-panel array substrate includes: a first step of applying a voltage V1 to the data terminal of a transistor while the transistor conducts, bringing the transistor into a non-conductive state, applying a voltage V1+ΔV to the data terminal, bringing the transistor into a conductive state,...

20060125513 - Current sensing in a two-phase motor: A method and apparatus for measuring current by a single sensor for two motor phases driven by first and second set of switches to drive respective first and second phases of a motor under control of PWM signals. A first step 100 includes reading a duty cycle of each winding...

20060113984 - Phase identification system and method: A system and method for determining the relative phase between current-carrying conductors. A reference unit samples and digitizes a voltage waveform at a reference location and transmits the digitized voltage waveform. A field sampling unit is placed on or directly adjacent a field conductor at a field location and transmits...

20060113985 - Retractable belt clip for hand-held tool: A retractable belt clip is disposed on an electronic hand-held tool, such as a stud finder, a laser level, or an electronic tape measure, and is moveable from a stowed position, in which the belt clip is disposed within or flush to a housing of the tool, to a deployed...

20060113986 - Apparatus and method for measuring voltage: An apparatus for measuring voltage is provided which measures output voltage between at least one pair of detecting terminals provided on an object under measurement. The apparatus for measuring voltage includes a first connecting terminal connected to one of the at least one pair of detecting terminals, a second connecting...

20060113987 - Apparatus for measuring an a.c. current in a cable: An apparatus for measuring alternating current in a conductor comprises first and second coils a1x, d1x having substantially the same turns-area product and substantially parallel axes and located on the circumference of a circle with the first coil having its axis tangential to the circle and the second coil having...

20060113988 - Co-located sensing elements for quadrature sensor: Sensor systems and methods are disclosed, including first and second sensing elements element co-located on a leadframe structure with respect to a particular target. In general, target-specific sensing applications can be determined by varying the distance between the first and second sensing elements on the leadframe structure with respect to...

20060113989 - Redundant pedal position sensor: A pedal position sensor provides a redundant pair of output signals that are indicative of the pedal position by providing a pair of shaped plates that are mounted on a pedal shaft. A single magnet generates a magnetic field that is changed depending on a position of at least on...

20060113990 - Linear position sensor: The linear position sensor has a permanent magnet and a magnetic field sensor, which generates an output signal dependent on the direction of the magnetic field. The permanent magnet and the magnetic field sensor are moveable relative to each other along the linear movement path. An evaluation circuit converts the...

20060113991 - Printed circuit card-based proximity sensor and associated method of detecting a proximity of an object: A proximity sensor assembly includes a multilayer printed wiring board proximity sensor, the proximity sensor being operable as either a variable-reluctance sensor or an eddy current loss sensor. The proximity sensor includes a plurality of layers configured to form at least one wound coil disposed about at least a portion...

20060113992 - Superconducting quantum interference device: A superconducting magnetic field detection element (10) comprising at least one superconducting pick-up loop (12) formed on a common flexible substrate (11), wherein the common flexible substrate (11) is in a non-planar position, such that the at least one superconducting pick-up loop (12) is operable to detect magnetic fields of...

20060113993 - Magnetizing jib: A magnetizing jig used in cooperation with a magnetizing yoke formed with a circular magnetizing face, for fixing a ring-like magnetic encoder base plate to be magnetized thereto and magnetizing it by exciting a multi-pole magnetizing coil provided on the magnetizing yoke. The magnetizing yoke has holding portion to which...

20060113994 - Practical pulse synthesis via the discrete inverse scattering transform: The discrete inverse scattering (DIST) approach is used to design selective RF pulses. As in SLR, a hard pulse approximation is used to actually design the pulse. Unlike SLR, the pulse is designed using the full inverse scattering data (the reflection coefficient and the bound states) rather than the flip...

20060113996 - Gradient coil apparatus and method of assembly thereof: A gradient coil assembly and a method for manufacturing the gradient coil assembly is provided. The gradient coil assembly includes an insulator sheet formed into a tube extending along an axis. The assembly further includes a first electrically conductive sheet disposed on a first surface of the insulator sheet including...

20060113997 - Magnet system and mri system: The present invention is intended to provide a magnet apparatus obviating the necessity of shield coils designed to suppress eddy currents. The magnet apparatus has gradient coils disposed in a bore of a cylindrical superconducting magnet, and includes a cylindrical structure that is realized with a combination of tiles made...

20060113995 - Magnetic field generating apparatus and method for magnetic resonance imaging: A magnetic field generating apparatus for use in magnetic resonance imaging (MRI) is disclosed. The apparatus includes an annular magnet field generator defining a patient bore, a gradient coil disposed between the magnetic field generator and the patient bore, a first set of shim elements, and a second set of...

20060113998 - Mine detector with nqr-squid: A portable small mine detecting device for detecting a mine by transmitting a radio wave and detecting the NQR of nitrogen 14 atoms (14N) contained in the mine by means of a high-sensitivity, high-temperature superconducting SQUID magnetic sensor. The mine detecting device can be applied to non-metal mines and can...

20060113999 - Precision timing light for internal combustion engine and method of use: An ignition timing device for measuring ignition timing that includes a focused light source, a securing member, an ignition indication sensor, and a control box. The focused light source permanently or removably attaches to an engine or engine compartment in close proximity to a rotating portion of the engine having...

20060114000 - Arrangement for detecting a leakage current or defect current: The invention is based on a circuit arrangement for the detection of a leakage current or defect current, by means of which the power supply of an electronic circuit can be switched off. It is suggested that a track conductor connected with a signal line or an insulation-layer-free conductor connected...

20060114001 - Process and device of high voltage test with detecting function for short/open circuit: This invention relates to a process and a device of high voltage test with detecting function for short or open circuits comprises carying out test of short or open circuits with low voltage for an object prior to a high voltage test, checking forrner step properly and then carrying out...

20060114002 - Method of evaluating connected portions, method of connecting electrical winding conductors and apparatus therefor: A method of connecting hollow conductors with a brazing alloy employs a measuring mechanism 10 for measuring a connecting state of a connecting portion after brazing hollow conductors. The measuring mechanism comprises a scanner 101 and a holder 19, which are separated in advance, so that the mechanism can be...

20060114003 - Specific absorption rate measuring system, and a method thereof: A specific absorption rate measuring system, a method thereof, and a biological tissue equivalent phantom unit are disclosed. The biological tissue equivalent phantom unit to be used by the specific absorption rate measuring system for evaluating absorption of electromagnetic wave energy includes a biological tissue equivalent phantom for absorbing an...

20060114004 - Method for calibrating and de-embedding, set of devices for de-embedding and vector network analyzer: Consistent with an example embodiment, there is a method for calibrating an N terminal microwave measurement network. The method comprising the measurement of network parameter values of a load device depends on the knowledge of the parasitic impedance of the load device. According to the example embodiment, the accuracy of...

20060114005 - Circuit and method for predicting dead time: A circuit for predicting the dead time is provided. The circuit comprises a plurality of integrators, a plurality of comparators, and a logic circuit. Based on a reference signal provided externally, a first charging operation is delayed by a predetermined delay time during one period of the reference signal, such...

20060114006 - Apparatus for determining the electric properties of a sample: An apparatus for determining the electric properties of a sample. The apparatus comprises a probe having an input, an output, and an effective resistance, inductance and/or capacitance dependent upon the properties of the sample; a pulse generator for producing pulses connected to the input of the probe, each pulse having...

20060114007 - Apparatus, a method, and measuring sensors for scanning states of engine oil: The present invention relates to an apparatus, a method, and a sensor for scanning engine oil of a vehicle. An apparatus for scanning engine oil according to an exemplary embodiment of the present invention includes an oil property measuring part for measuring physical and chemical properties of engine oil; a...

20060114010 - Method to prevent damage to probe card: Probe cards are configured with protective circuitry suitable for use in electrical testing of semiconductor dice without damage to the probe cards. Protective fuses are provided in electrical communication with conductive traces and probe elements (e.g., probe needles) of a probe card. The fuses may be active or passive fuses...

20060114011 - Method to prevent damage to probe card: Probe cards are configured with protective circuitry suitable for use in electrical testing of semiconductor dice without damage to the probe cards. Protective fuses are provided in electrical communication with conductive traces and probe elements (e.g., probe needles) of a probe card. The fuses may be active or passive fuses...

20060114008 - Probe card for testing semiconductor element, and semiconductor device tested by the same: An apparatus which reduces a contact resistance by appropriately overdriving a measuring probe of a probe card to ensure a stable contact pressure. The probe card comprises a measuring probe configured to contact a terminal of a semiconductor element formed in a semiconductor wafer, and a base plate to which...

20060114009 - Shielded probe apparatus for probing semiconductor wafer: A shielded probe apparatus is provided with a shielded probe and a tri-axial cable that are electrically connected within a shielded chassis. The shielded probe apparatus is capable of electrically testing a semiconductor device at a sub 100 fA operating current and an operating temperature up to 300 C....

20060114012 - Method and apparatus for testing semiconductor wafers by means of a probe card: The present invention provides a method for testing semiconductor wafers (5) by means of a probe card (7; 7′, 7′a; 7″), comprising the following steps: providing a temperature-controlled chuck device (1); laying the rear side (R) of a semiconductor wafer (5) on a supporting side (AF) of the temperature-controlled chuck...

20060114013 - Miniature fluid-cooled heat sink with integral heater: A temperature control device that includes a miniature liquid-cooled heat sink with integral heater and sensing elements is used as part of a system to provide a controlled temperature surface to an electronic device, such as a semiconductor device, during the testing phase. The temperature control device includes an interface...

20060114014 - Automatic mode setting and power ramp compensator for system power on conditions: A GPS receiver with automatic mode-setting and power ramping circuitry is disclosed. AGPS receiver in accordance with the present invention comprises a first switch network, comprising a plurality of transistors, a first plurality of circuit components, coupled to the first switch network, wherein the switch network selects paths through the...

20060114015 - Test apparatus and test method: A test apparatus for testing switching speed of a circuit, which includes a pre-stage logic element outputting a first or second level voltage and a post-stage logic element to which the output signal of the pre-stage logic element is input, is provided, wherein the post-stage logic element includes the post-stage...