Electricity: measuring and testing inventions 05/06

20060108995 - Low power and proximity ac current sensor: Disclosed herein is a low-power proximity AC current sensor. A low-power proximity AC current sensor according to the present invention includes a magnetic material having a location that changes depending on the intensity of a magnetic field formed outside the magnetic material; a piezoelectric film disposed at a location adjacent...

20060108996 - Digital power meter apparatus and method for the same: A digital power meter apparatus and the method for the same are proposed. The input voltage signal and input current signal through dual channels are processed at a first stage to obtained a first digital signal. The first digital signal is sent to a third low-pass filter. The input voltage...

20060108997 - Apparatus and method for detecting photon emissions from transistors: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by...

20060108998 - Magnetic resonance imaging system with a plurality of transmit coils: The invention relates to an MRI system (1) for nuclear magnetic resonance imaging which comprises a plurality of transmit coils (11, 12). Each coil receives a coil drive signal (SD1, SD2). The respective coil drive signals have the same shape, but may have a different amplitude and phase, controlled by...

20060108999 - Magnetism metric controller: A precise, consistent, reliable, and high resolution magnetism metric controller applied in electronic and information devices is comprised of a scrolling wheel mechanism to drive by rotation a permanent magnet to retrieve signals of changed magnetic field due to displacement of magnetic poles of the permanent magnet....

20060109000 - Defect inspection method for perpendicular magnetic recording medium, magnetic disk device, and method of registering defects in magnetic disk device having a perpendicular magnetic recording medium therein: Because of its characteristics, a perpendicular magnetic recording medium has the inconvenience that since sections with low signal stability due to magnetic defects are not easily detectible in advance, these sections are detected after mounting of the medium in a magnetic disk device or after product shipping. According to one...

20060109001 - Methods and apparatus for testing a component: A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes positioning an eddy current probe proximate to a surface of the component to generate a first position indication, positioning the eddy current probe proximate to the surface of...

20060109002 - Ultrasound control device for inspecting a workpiece: The invention relates to an ultrasound control device for non-destructively inspecting a workpiece. The inventive ultrasound control device comprises a transmitting-receiving sensor provided with an element for connecting to the input surface of a controlled workpiece, a transmitter which is connected to the sensor and sends pulses produced thereby to...

20060109003 - Method and apparatus for eddy current-based quality inspection of dry electrode structure: A system for non-destructive non-contact quality inspection of dry electrode units of energy storage includes an eddy current-based inspection system having a conveyor belt, and a hollow dielectric shell. An outer surface of the shell has a plurality of spaced apart measuring transducers. Each of the transducers include a feed-through...

20060109004 - Reduction of blurring in view angle tilting mri: Magnetic resonance imaging utilizes view angle tilting to correct for in-plane distortions with each RF excitation pulse being followed by a plurality of signal readouts to reduce image blurring. Each image readout is in the presence of a frequency select gradient (Gx) and a slice select gradient (Gz), and at...

20060109005 - Method and apparatus to generate a circular polarized rf field independent of subject asymmetry: An RF coil assembly is presented that incorporates balun networks to eliminate standing waves from cables used to apply a voltage to multiple drive ports of the coil. Each drive port is driven by an applied voltage that is shifted 90 degrees in the tangential direction. Further, all drive ports...

20060109006 - Magnet for nmr analyzer and nmr analyzer using the same: A magnet for an NMR an analyzer includes a superconductor coil which is operated under a permanent current mode so as to generate a magnetic field in a space surrounded by the superconductor coil, and which enables a sample to be inserted into a measurement space in the magnetic space...

20060109007 - Soil and time modeling for improved electromagnetic locators for underground utilities: A method for locating an object buried in soil in which at least one electromagnetic signal is imparted onto the buried object, thereby generating an electromagnetic field around the buried object. The electromagnetic field as well as at least one electromagnetic property of the soil surrounding the buried object, such...

20060109008 - Power control unit: A power control apparatus for controlling charging and discharging of a plurality of storage means (101a, . . . ) has voltage measuring means (102a, . . . ) for measuring voltages of said storage means respectively, current measuring means (103a, . . . ) for measuring currents flowing through...

20060109009 - Method and device for the detection of fault current arcing in electric circuits: The invention is directed to a method and a device for detecting fault current arcing in electric circuits for consumers with relatively constant power consumption, particularly in onboard aircraft power supplies. The object of the invention is to find a novel possibility for detecting arc faults in electric lines of...

20060109010 - Antenna device for level gauging: An antenna device for determining the filling level of a filling material in a container (tank) is disclosed. The antenna device comprises an essentially flat array antenna with an emitting area for emitting measuring signals towards the surface of the filling material and means for holding the array antenna over...

20060109011 - Device and method for measuring toner current: The toner current measuring device having provided therein a toner deposit capacitor c1 including an electrode 11 and an electrode 12 disposed in opposition, a reference capacitor c2 having a mechanism for adjusting a capacitance thereof; a power supply unit 4; and a measuring unit 10 for measuring, when a...

20060109012 - Corrosion monitoring system: A system for monitoring corrosion in metal by comparing a test sample exposed to a corrosion causing environment and a reference sample exposed to a protected environment. An AC voltage source generates a square wave signal oscillating between ground and voltage Vcc and a filter is positioned to filter the...

20060109013 - Vessel inspection method and vessel inspection device: The object of the invention is to provide a container inspection method and a container inspection device which is not container quality inspection by individual and operator's empirical approach, not influenced by operator's skillfulness, can eliminate human error such as missing when recording and error in writing, not based on...

20060109018 - Arrangement for contacting an integrated circuit in a package: An arrangement is provided for contacting an integrated circuit in a package by a contact plate arranged on a circuit carrier, wherein the package has contact locations on the contact plate side. In this context, the contact plate has contact vanes, which are formed such that they have a spring...

20060109016 - Microprobe tips and methods for making: Multilayer test probe structures are electrochemically fabricated via depositions of one or more materials in a plurality of overlaying and adhered layers. In some embodiments each probe structure may include a plurality of contact arms or contact tips that are used for contacting a specific pad or plurality of pads...

20060109017 - Probe card having deeply recessed trench and method for manufacturing the same: The present invention relates to a probe card that a probe of the probe card is movable only in a vertical direction using a trench to improve a electrical or a mechanical characteristic and to automatically limit the vertical movement thereof within a predetermined range. A pitch may be reduced...

20060109015 - Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication: Probe modules, methods of use of probe modules, and methods of preparing probe modules, are disclosed....

20060109014 - Test pad and probe card for wafer acceptance testing and other applications: A probe card having a member for sending and receiving electrical signals for operational testing of a semiconductor integrated circuit, and a plurality of probe pins extending from the member in a manner which causes free ends of the pins to contact wafer test pads substantially across a maximum dimension...

20060109019 - On-die monitoring device power grid: An embodiment of the present invention is a technique to monitor on-die device power grid. A sensor circuit generates a ground reference (GR) signal and N power reference (PR) signals forming a ladder according to a programmable configuration. The GR signal tracks a device ground signal of a device and...

20060109020 - Method for capacitance measurement in silicon: A method for testing a partially fabricated wafer is provided that comprises the following steps: providing a plurality of selectable devices under test (DUT) overlying a substrate of the wafer; biasing a second structure located in proximity to the DUT to have a first electrical state such that a first...

20060109021 - Method for modeling inductive effects on circuit performance: A method for testing a partially fabricated wafer is provided that comprises the following steps: providing a device under test (DUT) and three reference oscillators overlying a substrate of the wafer; measuring the frequencies of the reference oscillators as influenced by transistor characteristics, intra structure parasitics, resistive, capacitive and inductive...

20060109023 - T-coil apparatus and method for compensating capacitance: A passive matching network is connected to an input/output line for an automatic test equipment drive channel to compensate for capacitances associated with a receiver circuit connected to the line, and also an optional current-mode driver circuit. The matching circuit preferably comprises a T-coil circuit that can include a bridging...

20060109022 - Test structure design for reliability test: A flexible semiconductor test structure that may be incorporated into a semiconductor device is provided. The test structure may include a plurality of test pads designed to physically stress conductive lines to which they are attached during thermal cycling. By utilizing test pads with different dimensions (lengths and/or widths), the...

20060109024 - Method for measuring thin film transistor array of active matrix display panel: A method for measuring the holding properties of a TFT array of an active matrix display panel comprising multiple pixel circuits with holding capacitors, this measuring method being characterized in that the multiple pixel circuits comprise at least a first pixel circuit and a second pixel circuit, and the method...

20060109025 - Testing method for array substrate: A testing method for an array substrate is disclosed which includes a first measuring step of operating a line electrode driver circuit 15 and a row electrode driver circuit 16 like in a normal display mode while implementing writing in/reading out of a test video signal to and from supplemental...

20060103367 - Method and apparatus for measuring and adjusting the duty cycle of a high speed clock: An apparatus, a method, and a computer program are provided to measure the duty cycle of a clocking signal in a processor. Traditionally, variations in the duty cycles of clocks within microprocessors have been of considerable concern. By employing frequency dividers and AND gates, the duty cycles of clocks can...

20060103368 - Rechargeable powering system in an electricity meter: A polyphase electricity meter comprising a metering system allowing to measure a flow of electricity through a plurality of phases of a portion of an electricity network. The electricity meter further comprises a rechargeable powering system allowing to power at least the metering system. The rechargeable powering system is charged...

20060103369 - Apparatus and method for making ground connection: An apparatus for enabling connection to a ground plane of a test board during the testing of contacts on the board, comprising a conductive ground plate overlying said ground plane having at least one opening which overlies contacts on the board to be tested, the ground plate having a top...

20060103370 - Apparatus for testing processing electronics: An apparatus is disclosed for testing the processing electronics of a detector module for an X-ray computer tomograph. To provide a measurement environment which is as noise-free as possible, the processing electronics to be tested are tested when they are DC decoupled from a current source and a measurement and...

20060103371 - Testing system for solar cells: A testing system for optical and electrical monitoring of a production quality and/or for determining optical and electrical properties of solar cells, comprising a first conveyor device for conveying the solar cells to a test region, a second conveyor device for moving the solar cells through the test region, a...

20060103372 - Method of non-intrusive inductive proximity sensing through a conductive barrier: A method of non-intrusive, inductive proximity sensing of a target through a conductive barrier comprises the steps of: disposing an inductive proximity sensor on one side of a barrier of conductive material; disposing a target on the other side of the barrier; determining an appropriate drive frequency for operating the...

20060103373 - Anglular position detection utilizing a plurality of rotary configured magnetic sensors: A magnetic sensing method and system include a die comprising a central location thereof. A group of magnetoresistive bridge circuits are located and configured upon the die. A magnetic biasing component is then utilized to bias the plurality of magnetoresistive bridge circuits with a magnetic field rotating about an axis...

20060103374 - Magnetic position detecting apparatus: A magnetic position detecting apparatus 1 of the present invention includes one and the other magnetic resistance circuits each having multiple magnetic resistance elements arranged to be opposite to a magnetized surface, wherein one and the other magnetic resistance circuits are arranged in such a way that the resistance elements...

20060103375 - Position detection utilizing an array of magnetic sensors with irregular spacing between sensing elements: A magnetoresistive sensor system includes a plurality of chip carriers, such that each integrated circuit among the plurality of chip carriers is associated with a respective magnetoresistive sensing components. A plurality of magnetoresistive sensing components can be arranged in an array, wherein each magnetoresistive component among the plurality of magnetoresistive...

20060103376 - Magnetic displacement measurement device: This invention relates to a magnetic displacement measurement device, which comprises a ruler body and a vernier, wherein a magnetic main ruler is fixed on the ruler body, and a secondary ruler is fixed on the vernier; the secondary ruler comprises a magnetic sensor and a measurement circuit thereon; said...

20060103377 - Rotation detecting sensor: Disclosed is a rotation detecting sensor suitable for use under a vibration-abundant condition as e.g. a sensor disposed in an automobile body for detecting rotation of an engine or ABS. The sensor includes a detecting element for detecting rotation of a rotary body as a change in a magnetic flux...

20060103378 - Apparatus and method for dynamic diagnostic testing of integrated circuits: Systems and methods consistent with principles of the present invention allow contactless measuring of various kinds of electrical activity within an integrated circuit. The invention can be used for high-bandwidth, at speed testing of various devices on a wafer during the various stages of device processing, or on packaged parts...

20060103379 - Magnetic sensor, and method of compensating temperature-dependent characteristic of magnetic sensor: A magnetic sensor 10 includes GMR elements 11-18, and heating coils 21-24 serving as heat generating elements. The elements 11-14 and 15-18 are bridge-interconnected to constitute X-axis and Y-axis sensors, respectively. The heating coils 21, 22, 23, and 24 are disposed adjacent to the elements 11 and 12, the elements...

20060103380 - Magneto-optical resonant waveguide sensors: A waveguide magneto-optic sensor provides a signal indicative of the value and/or direction of a detected magnetic field by a spectral shift of the characteristic resonant spectral feature of the sensor is disclosed. The sensor does not suffer from vibrations, fiber bending or other light intensity noise and provides an...

20060103381 - Gmr sensor element and its use: A GMR sensor element is proposed, having a rotationally symmetrical positioning of especially eight GMR resistor elements which are connected to each other to form two Wheatstone's full bridges. This GMR sensor element is especially suitable for use in an angle sensor for the detection of the absolute position of...

20060103382 - Spin stand having hydrodynamic bearing motor and head/disc test device: There is provided a compact, lightweight, inexpensive head/disk test device. A spin stand is provided that supports a magnetic head to enable attaching and removal and comprises a fluid dynamic bearing motor that continues rotating even when the magnetic head is attached or removed. Alternatively, the spin stand comprises a...

20060103384 - Magnetic apparatus, installation method for magnetic apparatus, and magnetic resonance imaging diagnosis system: The present invention has been made in order to decrease vibrations of gradient-magnetic-field coils in a magnetic apparatus for a magnetic resonance imaging diagnosis system so as to improve the image quality of magnetic resonance images. The magnetic apparatus includes: a superconductive electromagnet having pairs of superconductive coils for generating...

20060103383 - Magnetic resonance imaging system: A magnetic resonance imaging system is provided in which the two contradictory requirements, i.e., enhancing the feeling of being not confined by enlarging the subject-insertion space and decreasing magnetomotive force of the superconductive coils by bringing the superconductive coils as close as possible to a subject, can be met in...

20060103385 - Method and apparatus for field drift compensation of a superconducting magnet: A method and apparatus for magnetic field drift compensation for a superconducting magnet system includes electrically coupling a micro-flux injection system to a secondary B0 superconducting coil in a secondary compensation circuit; magnetically coupling the secondary compensation circuit to the superconducting magnet via the secondary B0 superconducting coil; switching the...

20060103386 - Mr receiver assembly having readout cables capable of multiple channel transmissions: An RF receiver apparatus for translating multiple channels of MR data across a single readout cable is disclosed. The RF receiver apparatus is designed to separately translate In-phase and Quadrature components of an MR signal to a data acquisition system for signal processing. Moreover, multiple channels of In-phase and Quadrature...

20060103387 - System and method for electromagnetic wavefield resolution: A method of processing an electromagnetic wavefield response in a seabed logging operation. The wavefield is resolved into upgoing and downgoing components. The downgoing component represents reflections from the sea surface while the upgoing component represents reflections and refractions from subterranean strata. The upgoing component is then subjected to analysis....

20060103389 - High-frequency induction imager with concentric coils for mwd and wireline applications: An induction logging tool having concentric transmitter and receiver antennas can be used to make measurements of earth formations at frequencies up to 500 MHz. The antennas may be mounted on the mandrel of a bottomhole assembly for MWD applications, or may be pad mounted for wireline applications. Litz winding...

20060103388 - Method for compensating dielectric attenuation in downhole galvanic measurements: A method for estimating resistivity of a formation includes exciting an alternating current in the formation through non-conductive mud within a bore hole in the formation using a circuit. The circuit includes a known inductor and the non-conductive mud. A circuit response is measured. The complex impedance of the circuit...

20060103390 - Afci circuit test module: An arc fault circuit interrupter (AFCI) module includes a plug portion, a probe receiving portion and an AFCI test actuator for initiating a test of an AFCI protected circuit. More specifically, the plug portion includes a plurality of prongs configured to matingly engage with a standard three-prong receptacle. With this...

20060103391 - Methods and apparatus for non-contact testing and diagnosing of inaccessible shorted connections: A method and apparatus for detecting shorts between accessible and inaccessible signal nodes (e.g., integrated circuit pins) of an electrical device (e.g., an integrated circuit), using capacitive lead frame technology is presented. In accordance with the method of the invention, an accessible node under test is stimulated with a known...

20060103392 - Calibration techniques for simplified high-frequency multiport differential measurements: Embodiments of the present invention are directed towards systems, methods, and computer readable media for performing multiport vector network analysis. Embodiments of the present invention relate to a multiport network analysis that is derived from a family of two port calibration techniques including Thru/Reflect/Line(TRL), Thru/Reflect/Match(TRM), Line/Reflect/Line (LRL), Line/Reflect/Match (LRM) and...

20060103393 - Sensor device for determining a fluid property: A sensor device (10) for making at least one determination regarding a selected characteristic of a fluid includes a support post (32) that is adapted to be exposed to the fluid. A capacitor has electrodes (66, 68) that are supported near one end of the support post (32). A housing...

20060103394 - Resistivity detector and resistivity detection apparatus: A resistivity detector comprises a main detector and an auxiliary detector for measuring the resistance value of a solution. Contamination of the detection elements of the main and auxiliary detectors is detected by the output signals Ew1, Ew2 of the main and auxiliary detectors. The settings are such that the...

20060103395 - Electrical measurements in samples: A method and device are presented for measuring the electrical properties of a specimen. The specimen is excited with high energy radiation to cause emission of internal charged particles from the specimen. Electrical power is supplied to a circuit, that is formed by the specimen and any added component connected...

20060103396 - Method and apparatus for non-contact testing of microcircuits: A non-contact test method and apparatus is disclosed that can be used to test OLED flat panel TFTs. An ionized gas is used to supply current to the device under test....

20060103399 - Apparatus and method for testing conductive bumps: Apparatus and method for testing conductive bumps. The apparatus for testing a plurality of conductive bumps with a single electrical pathway comprises a support substrate and a first probe, a second probe and a plurality of dual-probe sets respectively disposed in the support substrate, wherein each of the dual-probe sets...

20060103397 - Method and apparatus for a twisting fixture probe for probing test access point structures: A twisting fixture probe for cleaning oxides, residues or other contaminants from the surface of a solder bead probe and probing a solder bead probe on a printed circuit board during in-circuit testing....

20060103400 - Method and apparatus for probe tip contact: The invention is a method and apparatus for a probe tip contact for electrically coupling a substrate to a probe tip. The apparatus, in one embodiment, comprises a wrap-around contact that is precision formed utilizing a hydroform tool and brazed to a surface of a substrate. In another embodiment, the...

20060103401 - Method for full wafer contact probing, wafer design and probe card device: A technique to simplify the cost and complexity of performing a full wafer test or probe of semiconductor wafers. A probe card connection layer is disposed on a surface of the wafer. The probe card connection layer comprises a plurality of probe contact connection points on a top surface of...

20060103402 - Semiconductor apparatus: A semiconductor apparatus according to the present invention comprises a semiconductor wafer, a plurality of semiconductor chips provided on the semiconductor wafer, a dicing lane provided between the adjacent two semiconductor chips and representing a region to be cut off when the semiconductor wafer is cut for each of the...

20060103403 - System for evaluating probing networks: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can...

20060103398 - Systems and methods for etching and plating probe cards: Systems and methods for etching probe cards are described. In particular, a fixture device is used in facilitating an electrical charge to the base of probe card needles during etching of the probe card needles. The fixture device includes an electrically conductive base having an electrically conductive rod and a...

20060103404 - System and method for testing dynamic resistance during thermal shock cycling: A system includes a temperature chamber (100), a text fixture (402), a test coupon (400), a data acquisition unit (404), an ohmmeter (406) and a computer (410). The temperature chamber (100) provides temperature extremes to the test coupon (400). The test coupon (400) includes a substrate (314), one or more...

20060103405 - Method and apparatus for a wobble fixture probe for probing test access point structures: A method and apparatus for a wiping fixture probe for cleaning oxides, residues or other contaminants from the surface of a solder bead probe and probing a solder bead probe on a printed circuit board during in-circuit testing....

20060103406 - Cantilever: A cantilever having a support portion, a lever portion extended from the support portion, and a probe portion formed in the vicinity of a free end of the lever portion, in which a carbon nano-tube controlled in direction is attached to the probe portion in a manner jutting out from...

20060103407 - Method and an apparatus for testing transmitter and receiver: A method and an apparatus for testing transmitter and receiver have been disclosed. One embodiment of the apparatus includes a plurality of multiplexers to select one of a positive and a negative transmitter pins, and a first comparator to compare a voltage of the selected pin with a first reference...

20060103408 - Semiconductor wafer and testing method therefor: Circuits under electrode terminals and a nonconductor layer of the electrode terminals in semiconductor devices are prevented from being damaged during a test, such as a burn-in test, on the semiconductor devices formed on a wafer. Alignment patterns provided on the semiconductor wafer have detector electrode terminals and conductor electrode...

20060103409 - Current sensing method and current sensing device, power conversion device using this current sensing device, and vehicle using this power conversions device: A current sensing device for sensing current flowing through a MOSFET has a voltage divider circuit composed of a series circuit of a first resistor and a second resistor having different resistance temperature coefficients, with a voltage division ratio designed to change depending on temperature. The sensing device is connected...

20060103413 - Array substrate inspecting method: A method of inspecting an array substrate comprising charging an arbitrary pixel electrode with an electrical charge, maintaining the electrical charge for a time period longer than at least one frame period while maintaining the switching element connected to the charged pixel electrode in an off state, and irradiating an...

20060103415 - Array substrate inspecting method and array substrate inspecting device: A method of inspecting an array substrate comprising inspecting the drive circuit unit by supplying an electric signal to the drive circuit unit while the array substrate is placed in a tester chamber, and by detecting the electric signal that flowed through the drive circuit unit, and irradiating an electron...

20060103417 - Current sensing in a two-phase motor: A method and apparatus for measuring current by a single sensor for two motor phases driven by first and second set of switches to drive respective first and second phases of a motor under control of PWM signals. A first step 100 includes reading a duty cycle of each winding...

20060103412 - Display device: There is disclosed a display device comprising an effective display section constituted of a plurality of system pixels, an inspection wiring line to which a signal for inspection is supplied in inspecting the effective display section, and a conductive layer having a discharge inducing section which is disposed in such...

20060103411 - Method for measuring thin film transistor array of active matrix display panel: A measurement method, wherein a TFT array, which comprises multiple pixel circuits having a holding capacitor, a switching transistor for connecting data lines to the circuits, and gate lines for controlling the transistor and wherein there are at least first, second, third, and fourth pixel circuits, is subjected to measurement...

20060103414 - Method of inspecting array substrate: A method of inspecting an array substrate comprising supplying the driving circuit section with an electrical signal to drive the driving circuit section and electrically charge the pixel electrode, irradiating the electrically charged pixel electrode with an electron beam, and inspecting the pixel electrode based on information of a secondary...

20060103410 - Panel and test method for display device: A panel for a display device includes a display area and a peripheral area. The display area comprises a plurality of pixels each comprising a switching element and gate lines and data lines connected to the pixels. The peripheral area comprises a plurality of gate driving integrated circuit regions, a...

20060103416 - Substrate inspecting method: A method of inspecting a substrate comprising forming the common terminal that is connected to a part of wirings formed in the first array region and a part of wirings formed in the second array region on the substrate, supplying an electric signal from the common terminal to both of...

20060097713 - Orthogonal field magnetic dc current sensor: A DC current sensor has a core comprising a magnetically permeable material. A permeability measurement winding is formed around at least a portion of the core. The core is placed within a magnetic field of a conductor such that measurement of a permeability of the core via the permeability measurement...

20060097714 - Connector insertion apparatus for connecting a testing apparatus to a unit under test: A device for holding one or more connectors and inserting the connectors into one or more receptacles of a unit for testing. The device comprises a base movable toward the receptacles, a connector holder holding the connectors that is movable with the base and movable relative to the base, and...

20060097716 - Arrangement for determining position: A description is given of an arrangement for determining the position of a magnetic-field-sensitive sensor unit in the magnetic field of a magnet arrangement having an at least substantially bar-shaped contour along an at least substantially rectilinear motion coordinate that extends parallel to a longitudinal axis of the at least...

20060097715 - Vertical hall device and method for adjusting offset voltage of vertical hall device: A vertical Hall device includes: a semiconductor substrate including a magnetic field detection portion, a current portion and an output portion. The output portion includes a pair of output terminals. The current portion is capable of supplying the current to the magnetic field detection portion and retrieving the current from...

20060097717 - Rotation detecting device: A rotation detecting device for detecting a rotating object includes a housing having a bearing and an mounting surface, a rotor member having magnetic peripheral portion and a rotary shaft that is supported by the bearing, a biasing permanent magnet for providing magnetic field around the mounting surface and the...

20060097718 - Local feature characterization using quasistatic electromagnetic sensors: Local features such as cracks in materials are nondestructively characterized by measuring a response with an electromagnetic sensor and converting this response into a selected property using a database. The database is generated prior to data acquisition by using a model to generate a baseline response or field distribution for...

20060097719 - Inspection carriage for turbine blades: An inspection carriage provides for remote inspection of the Z-shroud and snubber regions of the blades of a steam turbine, while the blades remain in the turbine. The carriage includes a non-destructive inspection probe such as a meandering wave magnetometer probe or eddy current probe mounted on a slider, so...

20060097721 - Magnetic sensor, and method of compensating temperature-dependent characteristic of magnetic sensor: A magnetic sensor 10 includes GMR elements 11-18, and heating coils 21-24 serving as heat generating elements. The elements 11-14 and 15-18 are bridge-interconnected to constitute X-axis and Y-axis sensors, respectively. The heating coils 21, 22, 23, and 24 are disposed adjacent to the elements 11 and 12, the elements...

20060097720 - Sensor and method for detecting a deformation: A sensor has a substrate having a mechanically deformable region, a magnetostrictive spin-valve sensor element being arranged to detect a mechanical deformation of the mechanically deformable region. On the substrate, there is a device for generating a controllable magnetic field by which a performance of the sensor element is influenced....

20060097722 - Downhole nmr flow and formation characterization while sampling fluids: A method of measuring characteristics of a flowing fluid is described including: (a) providing a flowing fluid; (b) applying a static field gradient to the flowing fluid; (c) applying a series of nuclear magnetic resonance pulses to the flowing fluid; (d) detecting signals from the flowing fluid, wherein the signals...

20060097723 - Mri apparatus: For the purpose of providing an MRI apparatus which gives rise to no phase deviation due to frequency alteration of the RF magnetic field and signals for detection use, the MRI apparatus includes: signal collecting means which detects and collects magnetic resonance signals generated by applying a magnetostatic field, a...

20060097724 - Methods, systems, circuits, and computer program products for determining polarization of a gas: A system for determining polarization of a gas comprises a container that contains the polarized gas. An oscillator circuit comprises an NMR coil that is positioned adjacent to the container. A pulse generator circuit is configured to generate an electrical pulse that may be transmitted to the optical cell through...

20060097725 - Nmr apparatus: A magnetic assembly for a nuclear magnetic resonance apparatus includes a number of primary permanent magnets 1 disposed in an array about a longitudinal axis, the arrangement and/or characteristics of the plurality of magnets being such so as to create a zone of homogeneous magnetic field at some location along...

20060097726 - Detection of malfunctioning bulbs in decorative light strings: A system for locating a malfunctioning bulb in a decorative light string uses an antenna that produces an output signal corresponding to the strength of the electric field produced by a portion of the light string near the antenna. An amplifier is coupled to the antenna to receive the antenna...

20060097727 - Micromechanical positional state sensing apparatus method and system: A micromechanical device may include one or more piezoresistive elements whose electrical resistance changes in response to externally or internally induced strain. The present invention leverages the piezoresistive properties of such devices to sense the positional state of the device. A sensing circuit may be integrated into the device that...

20060097728 - Fault location using measurements of current and voltage from one end of a line: m

20060097729 - Method for detecting defects that exhibit repetitive patterns: A method for detecting defects in devices that are fabricated in repetitive patterns upon the surface of a substrate by the, repetitive utilization of masks and similar devices. A mask flaw will become manifest in a series of defective devices as the mask is successively utilized. The detection of repetitive...

20060097730 - Time-frequency domain reflectometry apparatus and method: An apparatus and method for high-resolution reflectometry that operates simultaneously in both the time and frequency domains, utilizing time-frequency signal analysis and a chirp signal multiplied by a Gaussian time envelope. The Gaussian envelope provides time localization, while the chirp allows one to excite the system under test with a...

20060097731 - Accurate and efficient sensing method for bi-directional signals: An exemplary method and circuit for sensing bi-directional current through a resistive element comprises a sampling unit, a charge transfer unit, and an amplifier. The sampling unit is switchably coupled to the resistive element and samples and stores a voltage corresponding to a current flowing through the resistive element. The...

20060097732 - Position and electromagnetic field sensor: A position and electromagnetic field sensor is provided. The sensor relies upon an oscillator such as a Robinson marginal oscillator to generate an rf or microwave electromagnetic field. As an inhomogeneously-shaped object, such as a metallic toothed wheel, for example, moves through the resultant field, the field experiences a change...

20060097735 - Electrostatic capacitance detection device: An electrostatic capacitance detection device, includes: an electrostatic capacitance detection element arranged in a matrix form; a row line arranged in each row for selecting a relevant electrostatic capacitance detection element arranged in a relevant row; an output line arranged in each column for outputting a signal from a relevant...

20060097734 - Proximity detector comprising capacitive sensor: A proximity detector employs a capacitive sensor, having: at least one detection antenna including numerous capacitive proximity sensors which each include a measuring electrode, the antenna being positioned close to an object or body; electronic elements for exciting the electrodes and processing the distance measurement signals originating from the capacitive...

20060097733 - System and method for capacitive measuring: A system (S′) for non-contact measurement of a relative displacement or relative position of a first object relative to a second object, has: a sensor module including a transmitter plate fixed to the first object and a receiver plate connected to the second object, arranged substantially facing each other and...

20060097737 - Method and apparatus for manufacturing and probing printed circuit board test access point structures: A test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. Each test access point structure is conductively connected to a trace at a test access point and above an exposed surface of the printed circuit board to be accessible...

20060097736 - Rapid fire test board: A test board for testing a packaged integrated circuit has a set of contacts matching counterpart contacts on a socket. The contacts are each connected to a first voltage plane containing power, a second voltage plane carrying ground, and a set of terminals that will be connected to a tester...

20060097738 - Universal test fixture: A universal fixture for testing a device, such as a bare printed circuit board, includes a plurality of addressable contact points. Each of the contact points includes a switch connected to a conductor capable of creating an electrical connection to the device. To obtain a measurement of a target on...

20060097739 - Support for a receptacle block of a unit under test: Apparatuses and methods for supporting a receptacle block in a device testing a unit under test. The unit under test includes the receptacle block, which has one or more receptacles electrically coupled to components of the unit under test. A support includes a plurality of supporting surfaces that are respectively...

20060097740 - In-situ wafer and probe desorption using closed loop heating: A semiconductor wafer is tested by heating an electrical contact to a temperature sufficient to desorb water vapor and/or organic material from a surface thereof. The semiconductor wafer is also heated to a temperature sufficient to desorb water vapor and/or organic material from a top surface thereof. The heated surface...

20060097742 - Apparatus and method for single die backside probing of semiconductor devices: An apparatus for facilitating single die backside probing of semiconductor devices includes a chip holder configured for receiving a single integrated circuit die attached thereto, the chip holder maintained in flexible engagement in an X-Y orientation with respect to a lift plate. A lift ring is coupled to the lift...

20060097743 - Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object: An inspection method including measuring a height of a load cell of a load detecting mechanism using a laser length measuring mechanism, obtaining a first rise amount of the load detecting mechanism from a measuring position of the load detecting mechanism up to a contact starting position, measuring a height...

20060097741 - Method of and apparatus for testing for integrated circuit contact defects: Various tester configurations are provided that injects test signals into nets (e.g. 24). Non-linear characteristics of the response are detected (e.g. harmonics, do offset) and used to assess the adequacy or otherwise of device connections in the net....

20060097744 - Apparatus and method for inspecting thin film transistor active matrix substrate: A method for inspecting a thin film transistor active matrix substrate comprises a step for opposing a probe to the substrate, a step for supplying a dielectric fluid between the substrate and the probe, a step for supplying power to a closed circuit containing the substrate and the probe, and...

20060097745 - Thin film transistor tester and corresponding test method: To test electrical characteristics of a Thin Film Transistor (TFT) with a source or drain terminal left open and exposed, using a non-contact current source and protecting the TFTs from adverse effects, such as contamination, destruction, and the like. A tester 100 is provided to test a TFT array substrate...

20060091876 - Leak detection method and system in nonmetallic underground pipes: A method for locating leaks in nonmetallic pipes on the principal of measuring and graphing the intensity of electric fields. Leaks are located by creating a closed circuit with a negatively charged metallic electrode submersed in water inside a manhole connected to the nonmetallic pipe and several positively charged metallic...

20060091877 - Method and apparatus for an electric meter: An improved meter and its operation is described. The meter can be a part of a larger automated meter reading process that allows for remote reading of the meter though power line communication. Using a microcomputer core, the meter processes incoming analog data and can calculate several relevant data values...

20060091878 - Radio frequency process control: A method and apparatus of providing and improving process controls when using RF power sources in medical, industrial, or scientific processes. A further improvement results in sampling RF energy in the fundamental frequency and its related harmonic frequencies. The process control employs sampling, splitting, filtering and subsequently measuring differences between...

20060091879 - Two-wire type current output sensor and ic therefor: A two-wire type current output sensor includes two external connection terminals to one of which a power supply flows from an outside and from the other one of which the power supply flows to the outside, a detecting element capable of outputting a detection signal, a signal processing circuit for...

20060091880 - Method for detecting substructure: A method for detecting substructure includes the steps of: nondestructively scanning an assembly using a substructure scanning system including a precision motion carriage and a nondestructive scanning sensor, positioning the assembly under the substructure scanning system, positioning the scanning sensor on the outer skin, moving the scanning sensor over the...

20060091881 - Nmr and mri apparatus and method: Nuclear magnetic resonance (NMR) signals are detected in microtesla fields. Prepolarization in millitesla fields is followed by detection with an untuned dc superconducting quantum interference device (SQUID) magnetometer. Because the sensitivity of the SQUID is frequency independent, both signal-to-noise ratio (SNR) and spectral resolution are enhanced by detecting the NMR...

20060091882 - Keyhole echo-planar imaging with double (t1 and t2*) contrast (dc-epic): The invention relates to a method for examining at least one object during which properties of the object are detected at different times within a spatial frequency space formed by spatial frequencies. According to the invention, the method is carried out in such a manner that temporally consecutive recordings ensue...

20060091884 - Magnetic resonance imaging device: An MRI apparatus suitable for realizing selective excitation utilizing multiple RF transmitting coils (parallel transmission) is provided. This MRI apparatus is provided with, as an RF receiving coil or RF transmitting coil, an RF transmitting coil 104 comprising a loop coil 210, primary differential coil 220 and secondary differential coil...

20060091883 - Pulse sequences for exciting nuclear quadrupole resonance: An apparatus and a method for producing a multi-pulse sequence for irradiating a substance provided with quadrupole nuclei with either integer or half-integer spins to detect an NQR signal emitted therefrom. The apparatus has pulse sequence generating means adapted to produce a combination of two or more pulse sequences, arranged...

20060091885 - Nmr spectrometer with flowthrough sample container: A flow-through sample container, or flow cell, according to the present invention resides with the channel of magnetic resonance probe without being fixed thereto. The flow cell is removable from the spectrometer while leaving the probe in place, allowing easy cleaning of the probe channel and replacement of the flow...

20060091886 - Low esr switch for nuclear resonance measurements: A low equivalent series resistance (ESR) switch for selectively adding to a coil-capacitor circuit of a nuclear or electron resonance system. The switch comprises a pair of physically and electrically contacting members having mutually large contact surface areas. The members are movable between a quiescent position where the contact surface...

20060091887 - Low cost detectible pipe and electric fencing manufactured from conductive loaded resin-based materials: Detectable pipe and electric fence are formed of a conductive loaded resin-based material. The conductive loaded resin-based material comprises micron conductive powder(s), conductive fiber(s), or a combination of conductive powder and conductive fibers in a base resin host. The percentage by weight of the conductive powder(s), conductive fiber(s), or a...

20060091888 - Motion and position measuring for buried object detection: A hand-held, wand-type buried object detector includes a motion and position sensor that provides data about the sensor head of the buried object detector. An inertial measuring device including three accelerometers and three gyroscopes is one example of a motion and position sensor. The buried object detector includes a processor/communicator...

20060091889 - Method and apparatus for determining the nature of subterranean reservoirs: A system for detecting or determining the nature of a subterranean reservoir. An electromagnetic field is applied using a dipole antenna transmitter and this is detected using a dipole antenna receiver. The measurements are taken with the antenna both in-line and parallel and the difference between the two sets of...

20060091890 - Underground exploration apparatus: A current to be applied to a ground is defined as the sum of two sinusoidal waves having first and second frequency components. A signal to be used at the time of synchronous detection is defined as a difference between the sinusoidal waves having the first and second frequency components....

20060091891 - Member for measurement of cell voltage and temperature in battery pack: A member for measurement of cell voltage and temperature in a battery pack comprises temperature measuring elements (a) attached to the surfaces of unit cells, and a printed circuit board (b) having protrusions formed at the upper end thereof such that the protrusions are connected to electrode lead connection members...

20060091892 - Method of determining the impedance of an electrochemical system: The invention relates to a method of determining the complex impedance Z(fm) of a non-steady electrochemical system, comprising the following steps consisting in: bringing the system to a selected voltage condition and applying a sinusoidal signal with frequency fm thereto; immediately thereafter, measuring successive values for voltage and current at...

20060091893 - Process for the relative locating of two electrical appliances: A process allows the relative locating of a first electrical appliance and a second electrical appliance by the measurement of a first number of alternations or of electrical periods by the first electrical appliance from the energizing of the said first part and up to transmission of a signal by...

20060091894 - Ultra-wide band pulse dispersion spectrometry method and apparatus providing multi-component composition analysis: Embodiments cause interaction of an ultra-wide band signal with a substance over a broad range of frequencies simultaneously to obtain a response signal whose distortion is indicative of a composition of the substance....

20060091895 - Method for determining the wall thickness of a metal tube: A method for determining the wall thickness of a metal tube is described. This method has the following features: (a) preparation of a metal tube of a determined length; (b) arrangement of two clamp contacts on the metal tube with an exactly defined distance of separation; (c) connection of the...

20060091896 - Method and apparatus for measuring coil current: A method is described that comprises flowing current from one region of a coil to another region of the coil. The flowing induces—through flux linkage—a voltage across a second coil. A second current substantially does not flow through the second coil. The method also includes measuring the current with a...

20060091897 - Electronic apparatus with driving power having different voltage levels: The present invention relates to an electronic apparatus comprising a plurality of electronic components, further comprising a connection detector to detect whether an external device is connected to a connector, and a regulator module to supply driving power having one of first and second voltage levels different from each other...

20060091898 - Unknown: To limit the current in heavy current testing of semiconductor components with test needles, upstream of each needle a circuit is connected which has low resistance in the range of allowable currents and has high resistance above a given limit current in order to limit the current. The current source...