Electricity: measuring and testing inventions 04/06

20060087306 - Gem tester using electrical photo conductivity: Diamond look-alikes like cubic zirconium, moissanite and other synthetic stones, are distinguishable from natural diamonds based on their thermal and/or electrical conductivities. Gem testers that are on the market are capable of evaluating these two parameters as is the present invention. Electrical resistance of moissanites reaches hundreds of thousands megohms....

20060087305 - Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe: By using techniques for near field probes to measure dielectric values of blanket films, the measure of the sidewall damage of the patterned structure is calculated. The interaction between the near field probe and the etched structure is modeled to obtain the model total capacitance. The near field microwave probe...

20060087307 - Single pin multilevel integrated circuit test interface: An integrated circuit comprises one or more integrated circuit elements which may interact with other circuitry via one or more input/output pins. In the present invention the circuit elements include and interface element for interfacing with external test circuitry. The interface element communicates with the external test circuitry via a...

20060087308 - Timing generator and test device: There is provided a timing generator for generating a timing signal based on a given reference clock, having a delaying circuit section for outputting each pulse of the reference clock by delaying by a value of delay given per each of the pulse and a pulse selecting and outputting section...

20060087310 - Electric apparatus having plural electric parts: In an electric apparatus having a bus bar, a plurality of electric parts and a number of terminals connected to external terminals are mounted on the bus bar. The terminals are arranged in two or more lines, plural terminals are arranged in each line. Therefore, a stability and strength in...

20060087312 - Handler for testing semiconductor device: Handler for testing a semiconductor device including a carrier unit for detachably holding, and carrying a plurality of devices, a test board having a plurality of test sockets for respectively coming into contact with the devices held at the carrier unit for testing the devices, a press unit for respectively...

20060087311 - Manual actuator for loading leadless microcircuit packages in a circuit tester: An actuator for pressing a plurality of circuit contacts carried on a microcircuit package against a plurality of test contacts has a frame having a top surface and a bottom surface facing away from the top surface. The frame has first and second end slots each intersecting the top surface...

20060087309 - Programmable power personality card: An apparatus for routing power between a set of power supply taps of an automated tester and power connections on an integrated circuit under test, where the integrated circuit belongs to a family of integrated circuits that have a common power connection layout and different power connection voltage requirements. An...

20060087313 - System and method for detecting the axial position of a shaft or a member attached thereto: In accordance with one embodiment of the invention, a method and system for detecting the position of a shaft comprises providing a shaft with defined hardened metallic regions. The shaft has a first hardened metallic region from a surface of the shaft to a first radial depth from the surface...

20060087314 - Displacement sensor: Sensors and methods for measuring displacement are disclosed. In one embodiment, among others, a resistive element is configured to receive an alternating voltage between a first electrical terminal and a second electrical terminal, the first and second electrical terminals defining a length of the resistive element. A signal pickup is...

20060087316 - Position sensor and assembly: Disclosed herein, in an exemplary embodiment, is a position sensor assembly including a circular-shaped or rhombus-shaped magnet and at least one magnetic flux density sensor, such as a Hall effect sensor, wherein rotation of the magnet is detected by the at least one sensor. The magnet may be positioned coaxially...

20060087315 - Rolling bearing unit with sensor: An outer ring 3 is provided with the stator 7 of a resolver 2, and a ring member 4 with the rotor 8 of the resolver 2. The stator 7 comprises an annular core 9 and a winding 10 provided around the core 9. The ring member 4 is provided...

20060087317 - Unified s-wave gravitational component detection instrument: An instrument which detects the gravitational field component of a standing or traveling transverse electromagnetic wave, as described by a symmetrically modified energy flux vector. The present modification of the general form of the Poynting energy flux vector S first notices the internal transverse expansion-restoring force of the electric and...

20060087318 - Magnetic sensor with offset magnetic field: A method, a magnetic field sensor, and an electronic device measure and determine the magnitude and/or the direction of a magnetic field. The magnetic sensor is based on at least a first magnetoresistive-layered structure having an electric resistance depending on the magnitude of the magnetic field. The magnetic sensor generates...

20060087319 - Magnetic resonance system response method: An imaging system includes an exciter generating a series of radio frequency pulses for dividing a frequency band having a sampled band defined by an upper folding frequency and a lower folding frequency. The system also includes a receiver receiving and digitizing the radio frequency pulse after the radio frequency...

20060087320 - Parallel mr imaging with use of multi-coil made of plural element coils: A magnetic resonance imaging system includes an MR signal reception apparatus comprising a receiving multi-coil and a switchover member. The receiving multi-coil receives MR signals and is composed of a plurality of element coils. The switchover member is configured to switch reception states of the MR signals received by the...

20060087321 - Method and apparatus for repairing defective pixel of liquid crystal display: An defective-pixel repairing method is applicable to a liquid crystal display. A defective pixel of the liquid crystal display is scanned with a pulse laser beam having a repetition frequency of not lower than 1 kHz. The defective pixel is repaired in the state where an air bubble is present...

20060087322 - Method and apparatus for a remote electric power line conductor faulted circuit current, conductor temperature, conductor potential and conductor strain monitoring and alarm system.: An electric power line characteristic apparatus and monitoring method allows automatic conductor faulted circuit data logging of average nominal and maximum magnitudes of conductor current, voltage, temperature, and strain. Additionally an alarm is implemented to enunciate a faulted condition of the power line. Parametric data storage is provided for later...

20060087323 - Apparatus and method for testing a signal path from an injection point: The invention includes an apparatus and method for testing an electronic signal path. The apparatus includes a signal generator (102) configured to inject a test signal into the electronic signal path at an injection point when coupled to the signal path. The apparatus further includes a detector (104) coupled to...

20060087324 - E-field mapping: The present invention provides a sensor device for measuring an electric field in a charge carrying medium. To this end, the sensor device defines a sensor space that is arranged to receive the charge carrying medium, and that comprises terminals for applying an electric field across the sensor space. Furthermore,...

20060087325 - Apparatus for making high-sensitivity measurements of various parameters, and sensors particularly useful in such apparatus: A sensor for sensing a predetermined parameter having a known relationship with respect to the transit time of an energy wave through a medium, includes a body of soft elastomeric material having high transmissivity and low attenuation properties with respect to the energy waves; and a transmitter and receiver carried...

20060087326 - Resistive sensing element circuit: A resistive sensing element circuit arrangement includes first and second variable resistance sensing elements R1 and R2 connected in series to form a resistive sensing element set having a first centre connection, first and second fixed resistors Rb1 and Rb2 connected in series and having a second centre connection, and...

20060087328 - Amplitude varying driver circuit and test apparatus: There is provided an amplitude varying driver circuit operable to output an output signal, which is an amplified input signal being supplied. The amplitude varying driver circuit includes: a plurality of differential amplifiers provided in parallel with one another, wherein a signal corresponding to the input signal is input into...

20060087327 - Probe device and display substrate testing apparatus using same: A plasma having a certain density is generated between a test electrode and an electrode on a display substrate comprising a TFT array which is a circuit under test, and a test signal is transmitted between the electrode and the test electrode via the plasma. With this technique, a probe...

20060087329 - Voltage measurement device: A voltage measurement device includes: a charging circuit 100 having a first switch group of semiconductor elements P1, P2 for connecting voltages of respective blocks, into which a plurality of voltage sources VCn are divided, to a charging condenser Cn and a second switch groups of semiconductor elements N3, N4...

20060087330 - Defect inspecting apparatus: A defect inspecting apparatus in which a plurality of probes to measure electric characteristics of a sample including a fine wiring pattern are combined with a charged-particle beam unit includes graphic user interfaces (GUI) to simply control the plural probes. The apparatus includes a probe image processing unit to display...

20060087333 - Electrical test device having isolation slot: The invention relates to an electrical test device having isolation slot. The electrical test device comprises a substrate and a plurality of test pads. The test pads are disposed on a second surface of the substrate. Each test pads has a test hole, a first isolation slot and a second...

20060087331 - System and method for a multisite, integrated, combination probe card and spider card: System and method for a multisite, integrated combination probe card and spider card. A preferred embodiment comprises a series of signal pins configured to mate with test equipment, a socket region coupled to a plurality of integrated circuits, and an open electrical connections block coupled to the series of signal...

20060087332 - Using an interposer to facilate capacitive communication between face-to-face chips: One embodiment of the present invention provides a system that improves communications between capacitively coupled integrated circuit chips. The system operates by situating an interposer over capacitive communication pads on a first integrated circuit chip, wherein the interposer is made up of material that is anisotropic with respect to transmitting...

20060087334 - Dual tip probe: A locking mechanism and method for selectively fixing and allowing movement of a tip portion of a probe relative to a rigid portion of the probe are provided. The mechanism comprises a locking ball joint for selectively locking and allowing relative movement between the tip portion and the rigid portion...

20060087335 - Curved spring structure with elongated section located under cantilevered section: A curved spring structure includes a base section extending parallel to the substrate surface, a curved cantilever section bent away from the substrate surface, and an elongated section extending from the base section along the substrate surface under the cantilevered section. The spring structure includes a spring finger formed from...

20060087336 - Semiconductor device including chips with electrically-isolated test elements and its manufacturing method: In a semiconductor device including a semiconductor substrate and an electrode pad formed over the semiconductor substrate, at least one of test element is formed in a region of the semiconductor substrate beneath the electrode pad. The test element is electrically isolated from upper conductive layers outside of the region...

20060087337 - Method and apparatus for layout independent test point placement on a printed circuit board: A layout independent test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. Each test access point structure is conductively connected to various locations along a trace at a test access point and above an exposed surface of the printed...

20060082355 - Test pulses for enabling revenue testable panel meters: A panel meter including an energy test pulse device that enables the panel meter to be used for revenue applications and eliminates the need for two separate meters, one for panel indication, and the other for energy and revenue applications....

20060082356 - Flexible current sensor: A method and a current sensor for measuring a current in a conductor. The sensor comprises a non-magnetic, flexible core member having a first end and a second end. A locking head having a channel therethrough is coupled to the first end of the core member. A first sensor conductor...

20060082357 - Bus bar current detecting apparatus: A current detecting portion A includes a magnetic shield attached to a bus bar BU, a magnetic shield attached to a bus bar BV, and a magnetic shield attached to a bus bar BW. On bus bars BV, BU and BW arranged in parallel, current sensors SU, SV and SW...

20060082358 - Interface apparatus for semiconductor device tester: A signal interface to connect a semiconductor tester to a device under test. The Interface includes a generic component and customized component. The generic component includes multiple copies of electronic elements that can be connected in signal paths between the tester and the device under test. The customized component is...

20060082359 - Precision measurement unit having voltage and/or current clamp power down upon setting reversal: A precision measurement unit (PMU) includes a force amplifier selectively providing either a forcing voltage or a forcing current to a device under test via an output force terminal. A low limit voltage clamp and a high limit voltage clamp are operatively coupled to the output force terminal. The low...

20060082360 - Apparatus and method for use with a seat of a vehicle: A vehicle seat occupancy detector 30 provides an output indicative of whether or not the vehicle seat 12 is occupied. The seat occupancy detector 30 includes a Hall effect device 82 which is exposed to a magnetic field provided by a magnet 80....

20060082361 - Relative position detection device for motor vehicle: A relative position detection device is designed with multiple Hall Effect sensors. In one embodiment, the multiple Hall Effect sensors comprise two different types of Hall Effect sensors. The two different types can be linear and digital. The output of the sensors is used to determine the position an accelerator...

20060082362 - Relative position detection device for motor vehicle: A relative position detection device is designed with multiple Hall Effect sensors. In one embodiment, the multiple Hall Effect sensors comprise two different types of Hall Effect sensors. The two different types can be linear and digital. The output of the sensors is used to determine the position an accelerator...

20060082363 - Position detection apparatus and method for linear and rotary sensing applications: A position detection system and method for linear and rotary sensing applications are disclosed herein, including a plurality of magnetoresistive sensing components for linear and rotary detection sensing, and an integrated circuit for amplifying and calibrating signals generated by the magnetoresistive sensing components in order to provide a full digital...

20060082364 - Rotation detecting device: A rotation detecting device includes a rotary member having teeth, a biasing magnet, a magnetic sensor unit and a differential amplifier circuit for providing an output signal Vd. The sensor unit includes four bridge circuits of magnetoresistive elements that provide voltage signals V1, V2, V3, V4. The differential amplifier circuit...

20060082365 - Toothed shell on a variable reluctance speed sensor: An improved variable reluctance speed sensor configuration yields increased signal strength for a given sensor element diameter and/or sensor-to-speed wheel spacing. The improved sensor according to various embodiments of the invention comprises a plurality of passages containing pole pieces. The surface of the housing facing the speed wheel has thereon...

20060082366 - Surface mounted and scanning spatially periodic eddy-current sensor arrays: Inductive sensors measure the near surface properties of conducting and magnetic material. A sensor may have primary windings with parallel extended winding segments to impose a spatially periodic magnetic field in a test material. Those extended portions may be formed by adjacent portions of individual drive coils. Sensing elements provided...

20060082367 - Nuclear magnetic resonance method and apparatus for evaluating a characteristic of a region: A method of evaluating a characteristic of a fluid in a region, and a nuclear magnetic resonance (NMR) well logging apparatus for the implementation thereof, is disclosed. A magnetic field gradient is applied to the region, and first and second sequences of magnetic field gradient is applied to the region,...

20060082370 - Gradient bore cooling and rf shield: A magnetic resonance imaging (MRI) device for imaging a volume includes a main magnet for generating a magnetic field, an insulator sheet formed into a tube extending along an axis, a gradient coil disposed on an outside surface defining the tube for manipulating the magnetic field generated by the main...

20060082369 - Magnet apparatus and magnetic resonance imaging system therewith: In order to suppress fringe field due to the magnetic field generated from shield coils along the center axis of main coils and the shield coils that are disposed with their center axes being identical, when reducing fringe field to the outside of a magnet apparatus using the shield coils,...

20060082368 - Q-damping of a high temperature superconductor self-resonant coil in a nuclear quadrupole resonance detection system: The use of a high temperature superconductor single loop or coil in the Q-damping circuit for a high temperature superconductor transmit, receive, or transmit and receive self-resonant coil in a nuclear quadrupole resonance system results in improved performance of the nuclear quadrupole resonance detection system....

20060082371 - Nmr mas inflow bernoulli bearing: An improved axial gas bearing for a gas-driven NMR MAS sample rotor is disclosed that utilizes inward flow with a low rotational component over a rotor conical end. A conical flow region is formed between the rotor conical end and a conical stator bearing surface such that the included angle...

20060082372 - Nmr systems employing inverted variable capacitors: According to some embodiments, NMR (nuclear magnetic resonance) circuits include one or more variable capacitors each having two concentric cylindrical conductors. The inner conductor is connected to an upper external contact disposed closer to the NMR sample coil than the outer conductor. The inner conductor and upper contact are generally...

20060082373 - Detector for non-ferrous metals with reduced false positive responses: A metal detector for detecting objects that are composed of non-ferrous metals. The metal detector provides for a reduced rate of false positive responses to objects composed of ferrous metals. A preferred metal detector according to the invention includes a transmitter for transmitting a time-varying electromagnetic signal and a receiver...

20060082374 - Minimizing the effect of borehole current in tensor induction logging tools: Logging tools, methods, and computer programs for use in borehole logging are described. The logging tool includes three or more tensors, each tensor including one or more coils. Each coil is characterized by coil parameters including an axis orientation, a cross-sectional area, a number of turns, and a location. At...

20060082375 - Apparatus and method for identification of a failing battery: In order to determine when a battery is failing, the internal resistance is measured periodically. Because as a battery ages, the internal resistance increases, a table is maintained of periodic measurements of the battery internal resistance. Based on previous experience, an indicia can be identified from the table that permits...

20060082376 - Integrated fault detector circuit: According to one embodiment, an integrated fault detector circuit is used to detect one or more of the open circuit and short circuit of a load connected to an integrated circuit power MOSFET driver by directly detecting the level of current flowing in a floating current source....

20060082377 - Apparatus and method for communications testing: A communications connector tester for quickly and accurately analyzing communications connectors at production to determine whether the connectors are fit for use in certain communications applications is disclosed. Test signals at several discrete frequencies are sequentially inputted into pairs of conductors in the communications connector under test, and output signals...

20060082380 - Inspection probe, method for preparing the same, and method for inspecting elements: An inspection probe comprises resilient probe pins having electric contacts disposed in positions corresponding to electrodes of an external terminal of a semiconductor device, a base substrate including pitch-expansion wiring layers of the probe pins, and a backup substrate, the base substrate, and a flexible substrate, wherein at least one...

20060082379 - Parallel, individually addressable probes for nanolithography: A microfabricated probe array for nanolithography and process for designing and fabricating the probe array. The probe array consists of individual probes that can be moved independently using thermal bimetallic actuation or electrostatic actuation methods. The probe array can be used to produce traces of diffusively transferred chemicals on the...

20060082378 - Test system for device characterization: Device characterization performed with a test system including a fixture and multiple frequency dependent test boards. In one embodiment, testing is performed with multiple sets of input and output test boards wherein each set is frequency dependent at different frequencies. In some examples, the test board includes an impedance transformer...

20060076944 - Electrical-energy meter adaptable for optical communication with various external devices: An example embodiment of an electrical-energy meter comprises a transformer for producing an electrical output proportional to an electrical current in a conductor of electrical energy, a circuit board electrically coupled to the transformer for facilitating the calculation and displaying of a cumulative amount of electrical energy passing through the...

20060076945 - Magnetic material detecting device: A magnetic material detecting device which detects a magnetic material by applying a magnetic field to the magnetic material and detecting a magnetic field generated from the magnetic material by the applied magnetic field, and which includes a magnetizing coil which emits a magnetic field that excites the magnetic material,...

20060076947 - Micro-electromechanical system (mems) based current & magnetic field sensor having improved sensitivities: A micro-electromechanical system (MEMS) based current & magnetic field sensor includes a MEMS-based magnetic field sensing component a structural component comprising a silicon substrate and a compliant layer comprising a material selected from the group consisting of silicon dioxide and silicon nitride, a magnetic-to-mechanical converter coupled to the structural component...

20060076946 - Self-powered power bus sensor employing wireless communication: A sensor apparatus is for a power bus including a plurality of characteristics. The sensor apparatus includes a housing; one or more sensors each adapted to sense a characteristic of the power bus; and a circuit adapted to transmit or receive a wireless signal. A processor includes a low-power mode...

20060076948 - System and method for process measurement: Process measurement may be achieved by systems and techniques generating output signals based on the measured process. In certain implementations, process measurement systems and techniques may include the ability to generate a magnetic field and successively change the orientation of the magnetic field. The systems and techniques may also include...

20060076949 - Induction type displacement detector: The invention provides an induction type displacement detector capable of achieving an improved resolution and high precision. The induction type displacement detector comprises a scale, and a sensor head movable along a measurement axis. A plurality of flux coupling windings are arranged on the scale along the measurement axis. A...

20060076950 - Sensitizing ring for sensors: A sensitizing ring for sensors having a reduced manufacturing cost and an improved profile shape manufacture with a diameter of 120 mm or less. The sensitizing ring of the present invention is used to measure the rate of rotation and position of a rotating element. The sensitizing ring of the...

20060076951 - Pipeline inspection apparatus and method: A apparatus for pipeline integrity monitoring comprising a magnetically permeable backing bar and at least three magnets comprising a relatively medium-strength magnet positioned at one end of the backing bar, a relatively low-strength magnet positioned at the other end of the backing bar, and a relative high-strength magnet positioned between...

20060076952 - Segmented field sensors: Apparatus and methods are described for assessing material condition through magnetic field measurements that provide material property information at multiple depths into the material. The measurements are obtained from sense elements located at different distances from an excitation drive winding, with the area of each sense element adjusted so that...

20060076953 - Method for the acquisition of moving objects through nuclear magnetic resonance tomography: A nuclear magnetic resonance (NMR) tomography method for investigating a target object, wherein radio frequency (RF) pulses are irradiated into a target volume and/or RF pulses from the target volume are detected, wherein the target volume is determined by the frequency of the RF pulses and/or through magnetic field gradients,...

20060076955 - Method and apparatus for discrete shielding of volume rfcoil arrays: The subject invention pertains to a technique and device that can isolate and separate resultant electromagnetic fields of volume coils at high frequency. In an embodiment, an RF shield can be used to isolate and separate resultant electromagnetic fields. In an embodiment, the shield can have a cylindrical shape that...

20060076954 - Method for compensating for a magnetic field disturbance affecting a magnetic resonance device, and a magnetic resonance device: The invention relates to a method for compensating for a magnetic field disturbance affecting a magnetic resonance device, whereby the magnetic field disturbance is caused by a deflection of a component of the magnetic resonance device. To this end, the deflection or a variable causing the deflection is acquired in...

20060076956 - Tracing injected fluids: Method for recognizing one or more properties of a geological formation by the injection of a fluid into at least one borehole within the formation. The injection fluid either has a different resistivity to the formation and/or formation fluids or has the capacity to change the resistivity of the formation...

20060076957 - Method of measuring in-medium dielectric constant for electromagnetic prober, and electromagnetic prober: An electromagnetic prober comprising a transmission antenna, a reception antenna, a reception signal processing section for generating an analytic signal on the basis of a detection signal of the reception antenna, and an analytic processing section for performing a predefined analytic process on the basis of the analytic signal, wherein...

20060076958 - Protective relay test device: A test device for testing relays is provided. The test device includes a chassis and a plurality of generator components removably coupled to the chassis. Each of the plurality of generator components have a signal generator, a CPU to promote test signal generation by the signal generator, and an amplifier...

20060076959 - Capacitive sensor measurement method for discrete time sampled system for in-circuit test: Disclosed is a novel method and apparatus for acquiring multiple capacitively sensed measurements from a circuit under test. Multiple digital sources are respectively connected to stimulate multiple respective first ends of multiple respective nets of interest. Respective second ends of the multiple respective nets of interest are capacitively sensed. The...

20060076960 - Capacitive sensor measurement method for discrete time sampled system for in-circuit test: Disclosed is a novel method and apparatus for acquiring multiple capacitively sensed measurements from a circuit under test. Multiple digital sources are respectively connected to stimulate multiple respective first ends of multiple respective nets of interest. Respective second ends of the multiple respective nets of interest are capacitively sensed. The...

20060076961 - Test fixture for assembled wireless devices: A fixture for radio frequency (“RF”) testing of an assembled wireless device, the wireless device having a removable casing concealing one or more RF spring connectors, the fixture comprising: a retainer for receiving the wireless device with the removable casing removed; a coaxial connector mounted through the retainer, the coaxial...

20060076962 - Fluorescent light bulb test apparatus and method of use: An apparatus for testing a fluorescent light bulb is disclosed. The apparatus includes a circular housing including a pair of contact receptacles operable to receive two conductive elements of a fluorescent light bulb. A lamp housing is coupled to a portion of an outside surface of the housing and extending...

20060076963 - Electrostatic capacitance detection device: An electrostatic capacitance detection device reading surface contours of a target object by detecting electrostatic capacitance that changes according to a distance from the target object, the electrostatic capacitance detection device including: an electrostatic capacitance detection element arranged in M rows and N columns; and a power supply line supplying...

20060076964 - Fuel measuring cell: A single cell fuel sensor (10) has a housing (12) including only two laterally spaced apart chambers, a first of the chambers (14) being a fuel inlet chamber (15), and a second of the chambers (16) having a fuel mixing portion (18) and a fuel outlet portion (20). The fuel...

20060076965 - Contact-free test system for semiconductor device: The present invention provides a contact-free test system for testing a semiconductor device. The contact-free test system comprises a test signal member applying a test signal to the semiconductor device, an electronic beam radiator generating a first electronic beam and radiating it to an area of the semiconductor device, a...

20060076967 - Membrane with bumps, method of manufacturing the same, and method of testing electrical circuit: Provided is membrane with bumps whose variations in shape are minimized to the least and which are capable of supporting a micro electrical circuit. A membrane with bumps includes: a plurality of bumps, each of which is made up of a probe and an electrode, the probe having a diameter...

20060076966 - Probe card and contactor of the same: The present invention relates to a probe card which measures electrical characteristics of a semiconductor device such as an LSI chip and it is an object to provide a mounting structure of a contactor which comes in contact with the semiconductor device. The probe card has a contactor mounting substrate...

20060076968 - Probe, printed circuit board testing device and printed circuit board testing method: A probe is mountable to a printed circuit board testing device which performs a test on a predetermined land and/or a predetermined via hole of a printed circuit board. The probe includes a probe tip and a protrusion. The probe tip is contactable with the land and/or the via hole...

20060076969 - Current switch and method of driving the same: A method and apparatus for driving a current switch with a differential drive signal monitors both the temperature of the switch and the current through the switch. The method and apparatus dynamically control the amplitude of the drive signal as a function of the switch temperature and the current through...

20060076971 - System and method for accurate negative bias temperature instability characterization: Methods and systems are provided for characterizing the negative temperature bias instability of a transistor. A bias voltage is maintained at a drain terminal of the transistor during a test period. A stress voltage is maintained at a gate terminal of the transistor during the test period, such that the...

20060076970 - Test apparatus, test method, electronic device, and electronic device manufacturing method: A test apparatus for testing an electronic device provided with a field effect transistor, which operates in response to a given test pattern, is provided, wherein the test apparatus includes a power supply for providing electric power which drives the electronic device, a pattern generating unit for generating a plurality...

20060076972 - Reliability circuit for applying an ac stress signal or dc measurement to a transistor device: An integrated circuit is provided, which includes a transistor device under test, an AC drive circuit, an AC bias circuit and a DC bias circuit. The AC drive circuit generates an AC drive signal. The AC bias circuit biases the transistor device under AC bias conditions in response to the...

20060076973 - Test apparatus and test method: A test apparatus for testing switching speed of a circuit, which includes a pre-stage logic element outputting a first or second level voltage and a post-stage logic element to which the output signal of the pre-stage logic element is input, is provided, wherein the post-stage logic element includes the post-stage...

20060071653 - Integrated circuit testing methods using well bias modification: Methods for testing a semiconductor circuit (10) including testing the circuit and modifying a well bias (14, 18) of the circuit during testing. The methods improve the resolution of voltage-based and IDDQ testing and diagnosis by modifying well bias during testing. In addition, the methods provide more efficient stresses during...

20060071652 - Power measuring apparatus, power control apparatus, radio communication apparatus and power measuring method: A power measuring apparatus capable of accurate power measurement through segment averaging of a signal obtained by code division multiplexing a plurality of channels having different periods or timings at which their power levels change, a power control apparatus and radio communication apparatus provided with this power measuring apparatus and...

20060071654 - Activation signal output circuit and determining circuit: A start signal output circuit having an RF/DC conversion circuit to which radio frequency power (RF) of specified frequency is inputted and from which a direct current potential (DC) is outputted, comprises a detection/amplification circuit 210 which includes a voltage doubler wave-detector circuit 10 configured including a sensing diode Q1...

20060071655 - Current sensor: The present invention provides a current sensor capable of adjusting an offset value at a zero magnetic field more easily and detecting a current magnetic field generated by a current to be detected with high sensitivity and high precision. The current sensor has: first and second magnetoresistive elements disposed along...

20060071656 - Insert block for testing semiconductor device: The present invention relates to an insert block for testing semiconductor devices. The insert block comprises one or more pushers, installed in a block body having a loading space to accommodate a semiconductor device under test, including a first push rod to apply force to one of adjacent sides of...

20060071657 - Integrated circuit with speed measurement circuitry: An integrated circuit having a speed measurement circuit that generates an indicator of a speed of the integrated circuit in response to a test signal. The speed measurement circuit obviates the need to repeatedly apply test signals at different clock frequencies to an integrated circuit or to externally measure delay...

20060071658 - Method and device for determining motion parameters of a conductive, profiled surface: A method and a device for determining motion parameters of a conductive, profiled surface (22) relative to a sensor (3), with the sensor (3) comprising at least one coil for generating an electromagnetic alternating field, which is subjected, because of the feedback resulting from position changes between the surface (22)...

20060071659 - Method for determining the angular position of a rotating object and rotary encoder: A method for determining the angular position of a rotating object and rotary encoder is disclosed. In one embodiment, the method includes a method for determining the angular position of an object rotating about a rotation axis in a rotation direction and having a coding pattern, using a sensor that...

20060071660 - Magnetism detecting device and electronic azimuth meter using the same: A voltage generating section applies first and second voltages having inverted polarities to a sensor section. The sensor section outputs a voltage value corresponding to a change in geomagnetism. A bias magnetic field generating section applies an alternating current bias magnetic field to the sensor section. A detecting section detects...

20060071661 - Measurement apparatus and method: The invention relates to a method of determining the flow characteristics of a multiphase fluid along a flow path. The method involves applying a primary magnetic field to the flow of fluid in order to align the nuclei of the flow with the direction of this magnetic field, imparting a...

20060071662 - Integrated ewp-stm spin resonance microscope: A novel spin resonance microscope is disclosed, the microscope design comprising an integrated evanescent wave probe and scanning tunneling microscope tip. The probe and tip may be either the same structure, or they may be separate structures. The integrated design allows for coherent excitation of precessing electron spin states in...

20060071663 - Caliper apparatus: The present invention generally relates to an apparatus and method for detecting the physical condition of a tubular. In one aspect, an apparatus for use in a tubular is provided. The apparatus includes a body and a drive member for urging the apparatus through the tubular. The apparatus further includes...

20060071664 - Method of measuring in-medium dielectric constant for electromagnetic prober, and electromagnetic prober: An electromagnetic prober comprising a transmission antenna, a reception antenna, a reception signal processing section for generating an analytic signal on the basis of a detection signal of the reception antenna, and an analytic processing section for performing a predefined analytic process on the basis of the analytic signal, wherein...

20060071665 - System and method for preparative mass spectrometry: A preparative mass spectrometer system includes an ionizer which converts the mixture into gas phase ions of the molecules in the mixture, and a separator which separates the ions according to their mass to charge ratio or mobility. The separator is a linear ion trap mass analyzer that accumulates the...

20060071666 - Detection of pump cavitation/blockage and seal failure via current signature analysis: A system and method is provided for monitoring the operating condition of a pump by evaluating fault data encoded in the instantaneous current of the motor driving the pump. The data is converted to a frequency spectrum which is analyzed to create a fault signature having fault attributes relating to...

20060071667 - Method and system for measuring partial discharge: In the measurement of partial discharge, a voltage detected by an antenna is input to a spectrum analyzer and a phase difference between an operating voltage and a power supply of the spectrum analyzer is obtained by phase domain analysis using the spectrum analyzer. Based on the phase difference and...

20060071668 - 3d acoustic imaging using sensor array, longitudinal wave and algebraic reconstruction: A mobile platform is provided which has at least one component having an array of distributed piezoelectric transmitters and an associated array of distributed receivers. The receivers are configured to receive ultrasonic transmissions from the transmitters. Data from the receivers is stored in memory and processed through an algebraic reconstruction...

20060071669 - Method of measuring electric field distribution and electric field distribution measuring instrument: A method and apparatus for measuring an electric field distribution according to the present invention calculates a distribution of electric field intensity and its direction at arbitrary positions on the surface of the electronic apparatus or its circumference with use of data of measurement positions and measurement results of a...

20060071670 - Device comprising a microwave resonator for or on a spinner preparation machine: A device is disclosed, comprising a microwave resonator, for or on a spinner preparation machine with drawing gear (2) for drawing fibre material (FB), in particular a carding, drawing or combing machine, whereby the resonator (30) is embodied for connection to a measuring device (16) for measuring the strip density...

20060071671 - Capacitive sensing techniques: One embodiment of the present invention comprises a sensor with a face having several tracks spaced apart from one another. One of these tracks has a first electrode and a second electrode separated by an electrically nonconductive gap. Also included is a detection device extending across the tracks to receive...

20060071672 - Capacitively coupled position encoder: One embodiment of the present invention comprises a sensor with a face having several tracks spaced apart from one another. One of these tracks has a first electrode and a second electrode separated by an electrically nonconductive gap. Also included is a detection device extending across the tracks to receive...

20060071673 - Capacitive sensor device and installations comprising a sensor device this type: A water supply for sanitary devices has a sensor, is activatable without contact, has a first capacitor with first and second conductive layers and a dielectric layer positioned there-between. A second capacitor having a first and second electrically conductive layers and a dielectric layer there-between. An AC voltage generator is...

20060071674 - Apparatus, system and methods for collecting position information over a large surface using electrical field sensing devices: An apparatus, system and methods are provided for collecting information on the geographic positions of several moving or immobile objects simultaneously. A plurality of large scale printed circuits having charge transfer capacitance sensing properties are linked by a communication network in order to form a coherent sensing surface for the...

20060071675 - Loop impedance meter: A loop impedance meter for testing A.C. electrical mains supplies, comprises an electronic control circuit for connecting a load resistance intermittently between the A.C. mains supply terminal and the earth terminal to measure the potential difference between those terminals and to provide an indication of the loop impedance of the...

20060071676 - Non-destructive evaluation of microstructure and interface roughness of electrically conducting lines in semiconductor integrated circuits in deep sub-micron regime: Novel structures and methods for evaluating lines in semiconductor integrated circuits. A first plurality of lines can be formed on a wafer each of which comprises multiple line sections. All the line sections are of the same length. The electrical resistances of the line sections are measured. Then, a first...

20060071677 - Flexible circuit with micro-sized probe tips and a method of making the same: A flexible circuit includes a plurality of electrical traces and a plurality of probe tips directly formed thereto. The electrical traces are made of a first electrically conductive material and the probe tips are made of a second electrically conductive material that is harder than the first electrically conductive material....

20060071678 - Apparatus and methods for self-heating burn-in processes: A method includes installing a device under test (DUT) into each of a plurality of burn-in boards. The method further includes docking each of the burn-in boards to a respective docking location, each of the burn-in boards with a single respective DUT installed therein. The method further includes subjecting the...

20060071681 - Semiconductor device characteristics measurement apparatus and connection apparatus: A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under...

20060071679 - System and method for the probing of a wafer: According to one embodiment of the invention, a method for probing a wafer includes positioning a testhead relative to a prober supporting a wafer in a testing position. The method also includes receiving at least one prober signal identifying the angular position of the prober and at least one testhead...

20060071680 - Tester interface module: In one embodiment, a tester interface module for connecting a plurality of signal paths from at least one electronic assembly to at least one other electronic assembly is provided. The interface module includes a capture board having center conductor vias with center conductor holes extending through the capture board. Axial...

20060071682 - Current measurement device and test device: A current measuring apparatus for measuring a power supply current received by an electronic device includes: a first current supplying unit for outputting a first current which is a part of the power supply current; a smoothing capacitor for smoothing the first current output by the first current supplying unit...