Electricity: measuring and testing inventions 03/06

20060066289 - Method and apparatus for measuring a digital device: A method and apparatus for characterizing a non-linear device stimulates the device with a repetitive digital signal and uses relative phase measurements made with a vector network analyzer to measure the device response to the digital stimulus....

20060066290 - Method and apparatus for zero-mixing spectrum analysis with hilbert transform: a resolution filter (4) for filtering the base band signal (z(t)) to produce a filtered base band signal (y(t)) and envelope reconstruction means (27) for reconstructing the envelope (E(ω)) of the spectrum of the input signal (x(t)) by using an estimated amplitude (ŷx) at an estimated center frequency ({circumflex over...

20060066291 - Test circuit for delay lock loops: A method of testing a delay lock loop circuit is provided which comprises receiving an input signal and configuring the delay lock loop to generate a delay lock loop output signal based on the input signal. The method further comprises generating a test output signal from the input signal and...

20060066292 - Magnetic bridge type current sensor, magnetic bridge type current detecting method, and magnetic bridge for use in that sernor and detecting method: A current sensor and a current detecting method in which a sensitivity in at least 100 μA region and a dynamic range of 80 dB are achieved through a simple structure. The current sensor comprises one middle leg magnetic circuit(1) having opposite ends, two outer leg magnetic circuit(2a,2b) being connected...

20060066293 - Method for testing semiconductor devices and an apparatus therefor: A method for testing integrated circuit devices and loading such devices into a test board for further testing and an apparatus therefor is disclosed. The method allows for selection between two modes of operation. In a first mode, the integrated circuit devices are subjected to an electrical test before being...

20060066294 - Pulser ring mounting structure: In a motorcycle, to prevent an increase in the diameter of a hub in association with the mounting of a pulser ring and for increasing the flexibility when arranging a wheel speed sensor. An annular groove is formed on a side surface of an annular rear brake disk in an...

20060066295 - Control method of controlling magnetic-field sensor, control device, and mobile terminal device: A control device 200 calibrates a magnetic-field sensor 100 by computation. A computation unit 210 calculates the magnetic-field intensity based upon the outputs of X-axis, Y-axis, and Z-axis magnetic-field detection devices of the magnetic-field sensor 100. Such calculation is performed for four or more different points. The calculation is performed...

20060066296 - Rotational angle detecting device: A rotational angle detecting device includes a sensor portion disposed on a shaft. The sensor portion includes longitudinal hall elements disposed perpendicular to each other for outputting a hall voltage proportional to a magnetic flux induced by a magnet disposed on the shaft. The device also includes an engagement mechanism...

20060066297 - Magnetic position sensor: What is described is a configuration for determining the position of a body on an at least largely linear motion coordinate, along which two magnetic configurations are disposed, each equipped with at least one pair of magnetic north and south poles, and disposed between the magnetic configurations is a magnetoresistive...

20060066300 - Full track profile derivative method for read and write width measurements of magnetic recording head: A method for measuring a magnetic read width MRW of a magnetic read sensor directly from the derivative of a full track profile, with better accuracy and more advantages than the micro-track method was invented and also there is no need to use a separate wide write head. The magnetic...

20060066299 - Reverse magnetic reset to screen for weakly pinned heads: A method is disclosed for testing pinned layers of magnetic disk drive read heads having at least one pinned layer, where the magnetic orientation of the pinned layers has been set in an initial direction. The method includes applying a large magnetic test field at a reverse canted reset angle....

20060066298 - System, method, and apparatus for use of micro coils within a single slider test nest: A precisely machined test nest holds a single hard disk drive slider. The test nest is fabricated to contain a micro pickup coil that is positioned to be able to detect magnetic flux from a write element of the slider. The micro pickup coil has highly repeatable and controllable positioning...

20060066301 - Extended range emf antenna: A measuring while drilling system typically has a metal pipework extending underground connected to an antenna. The metal pipework and the antenna are both connected to a type of downhole equipment. The antenna transmits or receives signals to/from a transceiver located on the surface, and the transceiver is connected to...

20060066302 - Mechanism for and method of biasing magnetic sensor: A magnetic sensor package having a biasing mechanism involving a coil-generated, resistor-controlled magnetic field for providing a desired biasing effect. In a preferred illustrated embodiment, the package broadly comprises a substrate; a magnetic sensor element; a biasing mechanism, including a coil and a first resistance element; an amplification mechanism; a...

20060066303 - Sensor, and method for measuring physical quantity by use of the sensor: A sensor includes a first X-axis GMR element to a fourth X-axis GMR element fixed on a substrate, and a movable coil movably supported on the substrate. When electric current flows through the movable coil, a magnetic field is generated around the movable coil. The generated magnetic field is applied...

20060066304 - Electric/magnetic field sensor: A UNLV novel electric/magnetic dot sensor comprises: a loop of conductor having two ends to the loop, a first end and a second end; the first end of the conductor seamlessly secured to a first conductor within a first sheath; the second end of the conductor seamlessly secured to a...

20060066305 - Method for measuring rotational speed of molecule of fullerenes: Disclosed is a method for measuring the molecular rotation speed (the number of rotations or the rotation frequency) of a fullerene or a fullerene derivative in a relatively simple and inexpensive manner, for the evaluation of the fullerenes. The method comprises having a thin film of the fullerene or the...

20060066306 - Magnetic resonance imaging with dual velocity encoded projection reconstruction acquisition: A phase contrast image is produced using a 3D projection reconstruction pulse sequence. A high velocity-to-noise image is produced by using a LOW VENC motion encoding gradient. Phase wrap errors caused by high velocity flow is corrected using phase information in a HIGH VENC image produced from highly undersampled data...

20060066307 - Method and system for image artifact reduction using nearest-neighbor phase correction for echo planar imaging: A nearest neighbor phase correction technique is implemented to reduce image artifacts due to phase errors in data acquired in an EPI scan. Image quality for EPI applications, such as DWI, DTI, and fMRI, is improved....

20060066308 - Method and system of mr imaging with variable readout gradient filtering: A method and system of MR imaging where variable readout gradient filtering (VRGF) is carried out after MR data acquired during gradient field transitions has been phase-corrected. Thus, phase errors can be removed prior to VRGF re-sampling of the MR data. As such, image artifacts due to phase errors can...

20060066310 - Sensor for unilateral nuclear magnetic resonance and method for making same: A unilateral NMR sensor comprising a ferromagnetic yoke; a permanent magnet arranged on the yoke; a pole piece on the magnet; the pole piece including an air-pole piece interface surface whose shape corresponds to an equipotential contour of magnetic scalar potential...

20060066309 - Thermal management system and method for mri gradient coil: A thermal management system and method for cooling Magnetic Resonance Imaging gradient coils. The system includes least one first header tube positioned adjacent to said gradient coils and configured to transport a coolant fluid; at least one set of cooling tubes connected to said header tube at inlet ends and...

20060066312 - Magnetic resonance detector and method: A magnetic resonance (MR) system and method for generating information about an object is provided. The MR system comprises at least one MR detector configured to sense a plurality of signals within a shielded environment and a digitizing circuit configured for digitizing the analog signals to generate digital signals. The...

20060066311 - Magnetic resonance system and method: A magnetic resonance (MR) system and method for generating information about an object is provided. The MR system comprises at least one MR detector configured to sense a plurality of electromagnetic signals and a modulator coupled to the MR detector and configured to modulate optical signals with the electromagnetic signals...

20060066313 - Method and apparatus for measuring mud resistivity: A sensor for measuring mud resistivity in a borehole includes a transmitter having a magnetic moment in a first direction; and a receiver having a magnetic moment in a second direction, wherein the first direction and the second direction are substantially different, wherein the transmitter and the receiver are disposed...

20060066314 - Capacitive monitors for detecting metal extrusion during electromigration: A method and apparatus for detecting metal extrusion associated with electromigration (EM) under high current density situations within an EM test line by measuring changes in capacitance associated with metal extrusion that occurs in the vicinity of the charge carrying surfaces of one or more capacitors situated in locations of...

20060066316 - Device and a method for biasing a transistor that is connected to a power converter: A device and a method for biasing a transistor connected to a voltage converter, the method includes: (i) providing at least one bias voltage to at least one well of at least one transistor of a test circuitry; (ii) measuring at least one parameter of a test circuitry representative of...

20060066315 - Normalizing circuit with reduced error voltage: A circuit for calibrating a voltage signal. The circuit includes a first voltage-to-current converter receiving the signal to be calibrated and a reference voltage, and providing a current proportional to the voltage difference between the voltage of the signal to be calibrated and the reference voltage, a first current amplifier...

20060066317 - Method and device for determining the time response of a digital circuit: A method and a device determine a time response of a digital circuit. The time response is determined as a time difference between a data delay of a data path of the digital circuit, and a clock delay of a clock signal, which causes storage of a data item on...

20060066319 - Area-change sensing through capacitive techniques: An area-change sensing through capacitive techniques is disclosed. In one embodiment, a first conductive surface is substantially parallel to a second conductive surface. The first conductive surface may be moveable relative to the second conductive surface in a direction substantially parallel to the second conductive surface. A processing module may...

20060066318 - Sensor system and method of operating the same: A sensor system comprising a sensor operable to provide an output signal representative of a sensed parameter is provided. The sensor system also comprises a control system coupled to the sensor, wherein the control system is operable to change a physical characteristic of the sensor based on the output signal...

20060066321 - Ac power line impedance monitoring method and system: A technique is disclosed for determining inductive and resistive components of power line impedance. A measurement circuit switches a burden or drain resistor between power line conductors to cause a droop or sag in a voltage waveform. The voltage waveform is sampled prior to inclusion of the resistor in the...

20060066320 - Technique for measurement of programmable termination resistor networks on rapidchip and asic devices: A measurement technique which allows the error components of the testing process to be eliminated by performing a differential-style measurement of the programmable termination resistor network. Since for any given DUT pin which is to be tested, there are multiple possible resistances to be measured, the test process provides that...

20060066322 - Semiconductor testing: A method of testing a semiconductor circuit including a pair of contact pads, a biasing circuit for applying a voltage to the pair of contact pads, and a sensing circuit for providing a signal indicative of the voltage applied across the contact pads. The method includes determining a voltage gain...

20060066323 - Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer: To determine a concentration of defects and/or impurities in a semiconductor wafer, a first value of current is caused to flow in the semiconductor wafer having a substrate of semiconducting material. The semiconductor wafer is exposed to a pulse of light whereupon electron-hole pairs generated in the semiconductor wafer in...

20060066324 - Method for measuring impurity metal concentration: There is provided a method for calculating a more accurate metal impurity concentration contained in a silicon wafer by correcting measured values with a calibration based on a dependent relationship of the minority carrier diffusion length with a period of time elapsing from the activation to the actual measurement, an...

20060066325 - Laser-induced critical parameter analysis of cmos devices: A technique is described for performing critical parameter analysis (CPA) of a semiconductor device (DUT) by combining the capabilities of conventional automated test equipment (ATE) with a focused optical beam scanning device such as a laser scanning microscope (LSM). The DUT is provided with a fixture such that it can...

20060066326 - Non-contact tester for electronic circuits: A non-contact tester for electronic circuits consists of an electronic circuit and independent scanning head, in combination. The electronic circuit includes a micro-fabricated wireless i/o cell and means for sending and receiving signals via the wireless i/o cell. The independent scanning head has a wireless i/o cell that is compatible...

20060066328 - Buckling beam probe test assembly: A hybrid-buckling beam probe assembly is disclosed for probing semiconductor chips. The probe assembly includes an upper and lower die. A template is attached to a boss on the lower die. This template improves the reliability, time, and cost of assembling the hybrid-buckling beam probe assembly. In addition, the template...

20060066332 - High performance probe system: A probe system for providing signal paths between an integrated circuit (IC) tester and input/output, power and ground pads on the surfaces of ICs to be tested includes a probe board assembly, a flex cable and a set of probes arranged to contact the IC's I/O pads. The probe board...

20060066330 - Inspection unit: A conductive member has a first face adapted to be mounted on a board on which an inspection circuit is arranged and a second face adapted to be opposed to a device to be inspected. The conductive member is formed with a plurality of first through holes having a first...

20060066331 - Inspection unit: A conductive member has a first face adapted to be mounted on a board on which an inspection circuit is arranged and a second face adapted to be opposed to a device to be inspected. The conductive member being formed with a first through hole having a first diameter and...

20060066329 - Method and apparatus for providing pcb layout for probe card: An effective and easy to fabricate method to test multiple integrated circuit device designs using a single, probe card design is provided. A universal, probe card design is disclosed herein to test a plurality of integrated circuit devices at the wafer level. Integrated circuit probe pads and probe card probe...

20060066327 - Method and structures for testing a semiconductor wafer prior to performing a flip chip bumping process: An interface assembly (20) and method for testing a semiconductor wafer prior to performing a flip chip bumping process are provided. The interface assembly includes a flip chip bonding pad (24) having a region (28) for performing the bumping process. A test pad (22) is integrally constructed with the bonding...

20060066334 - Fiducial alignment masks on microelectronic spring contacts: Microelectronic spring contacts with fiducial alignment marks for use on a semiconductor wafer contactor or similar apparatus, and methods for making such marks, are disclosed. Each alignment mark is placed on a pad adjacent to a contact tip. The alignment mark is positioned on the pad so that it will...

20060066333 - System and method for aligning wafers: Systems and methods for aligning wafers. A first method provides for placing a wafer carrier comprising a mis-aligned wafer into an acceptance port. A wafer alignment fixture is moved relative to the wafer carrier and perpendicular to the plane of the mis-aligned wafer. The wafer alignment fixture comprises a spring...

20060066336 - Method for testing a contact region of a semiconductor module: A method for testing a contact region of a semiconductor module having a circuit arrangement is disclosed. In one embodiment, the semiconductor module is heated by an electrical heating current flow and the electrical and/or thermal quality of a plurality of contacts provided in the contact region is determined in...

20060066335 - Semiconductor test device with heating circuit: A semiconductor test device includes a test circuit having contacts for applying an electrical signal and measuring electrical parameters of the test circuit. The semiconductor test device also includes an integrally formed heating circuit comprising at least one circuit meander positioned adjacent the test circuit for raising a temperature within...

20060066339 - Determining and analyzing integrated circuit yield and quality: Methods, apparatus, and systems for computing, analyzing, and improving integrated circuit yield and quality are disclosed herein. For example, in one exemplary method disclosed herein, information is received from processing test responses of integrated circuits designed for functional use in electronic devices. In this embodiment, the information is indicative of...

20060066338 - Fault dictionaries for integrated circuit yield and quality analysis methods and systems: Methods, apparatus, and systems for testing, analyzing, and improving integrated circuit yield and quality are disclosed herein. For example, in one exemplary embodiment, one or more fault dictionaries are generated for identifying one or more defect candidates from corresponding observation point combinations. In this exemplary method, the observation point combinations...

20060066341 - Lsi testing apparatus: AN LSI testing apparatus includes a power source unit for supplying the direct source current to an electronic device, a detecting unit for detecting the source current supplied to the electronic device and a judging unit for judging the quality of the electronic device, wherein the power source unit includes...

20060066340 - Method for burn-in test and measurement program for burn-in test: A method for a burn-in test includes steps (a) and (b). In the step (a), an operation test of a first semiconductor device is executed through first probes provided on a probe card. In the step (b), a stress is applied to a second semiconductor device through second probes provided...

20060066343 - Semiconductor device characteristics measurement apparatus and connection apparatus: A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under...

20060066337 - Test semiconductor device and method for determining joule heating effects in such a device: Method and test structures for determining heating effects in a test semiconductor device (10) are provided. The test device may include a first conductive metal structure (151-156) for accepting a flow of electric current that causes a heating effect. The test device may further include a second conductive metal structure...

20060066342 - Utilizing clock shield as defect monitor: Disclosed is a shielded clock tree that has one or more clock signal buffers and clock signal splitters, with clock signal wiring connecting the clock signal buffers to the clock signal splitters. Shielding is adjacent the clock signal wiring, where ground wiring connects the shielding to ground. The shielding comprises...

20060066344 - Pallet and method for transferring the same: A pallet capable of fixing display panels having various sizes substantially normal to the pallet, a method of fixing the display panels using the pallet, and a method of transferring the pallet are provided. The pallet includes a first supporting unit and a second supporting unit for fixing a display...

20060055392 - Remotely communicating, battery-powered nanostructure sensor devices: A portable sensor device incorporates a low-power, nanostructure sensor coupled to a wireless transmitter. The sensor uses a nanostructure conducting channel, such as a nanotube network, that is functionalized to respond to a selected analyte. A measurement circuit connected to the sensor determines a change in the electrical characteristic of...

20060055393 - Method for monitoring lateral encroachment of spacer process on a cd sem: A process implementing steps for determining encroachment of a spacer structure in a semiconductor device having thick and thin spacer regions, including a transition region formed therebetween. The method steps comprise: obtaining a line width roughness (LWR) measurement at at least one location along each thick, thin and transition spacer...

20060055394 - Network analyzer including automatic port extension calibration and method of operation: In one embodiment, a method of automatically calibrating a network analyzer for measuring devices under test (DUTs) using a test fixture comprises generating a stimulus signal on a respective port that is coupled to the test fixture; measuring reflection of the stimulus signal on the respective port to generate measurement...

20060055395 - Diagnosis method for an antenna connection: A method for testing a reliable connection of an antenna includes a coil (L) or something similar connected to a reference potential on one side and to the output of an amplifier on the other side, a first capacitor (C2) arranged in a parallel position to the coil (1) and...

20060055396 - Alignment compensator for magnetically attracted inspecting apparatus and method: An apparatus and method aligning magnetically coupled inspection probes are provided. In this regard, a tracking probe may be magnetically coupled to a driven probe and move in coordination therewith. An alignment compensator for magnetically coupled inspection probes offsets misalignments between a driven probe and a tracking probe. Misalignments between...

20060055397 - Angular displacement encoder with two magnetic tracks: What is described is a configuration for determining the position of a body along a movement direction, wherein the body is in the form of a magnetized encoder with two magnetic tracks extending, on one surface of the body, along the movement direction, at least essentially in parallel with one...

20060055398 - Rotation sensor: A rotation sensor has a sensor and a processing circuit that are provided as an integrated circuit chip (IC chip). The sensor has a magnetic resistance element. The rotation sensor senses an angular change of a magnetic vector as a change of resistance. The rotation sensor is located to face...

20060055399 - Magnetically attracted inspecting apparatus and method using a ball bearing: An apparatus and method for inspecting a structure are provided which include probes with sensing elements and are disposed proximate the opposite surfaces of a structure, where only one of the probes need be driven. A tracking probe may be magnetically coupled to a driven probe and move in coordination...

20060055400 - Real-time x-ray scanner and remote crawler apparatus and method: For inspecting a structure with non-destructive x-ray inspection, probes are magnetically coupled to opposing surfaces of the structure. An inspection device may be autonomous with a feedback-controlled motor and/or a positional encoder. An inspection device may include wireless operation for at least one probe. A display may be included to...

20060055401 - Method of inspecting a pressure vessel: A pressure vessel penetration sidewall adjacent a tube installed in the penetration by a clearance fit is inspected by passing an eddy current probe having a pair of circumferential coils through the tube. Eddy currents are induced in the pressure vessel as the probe passes through the penetration tube and...

20060055402 - Magnetic shielding apparatus and biomagnetism measuring device: The object of the invention is to provide a biomagnetism measuring device using a high-performance cylindrical shielding apparatus provided with a flange-type plate having an opening formed on a circumferential face, an auxiliary cylinder in which one or plural cylindrical members are connected so that the central axis of the...

20060055403 - Method for determining characteristics of earth formations: A method for determining a characteristic of earth formations from measurements taken on the formations, includes the following steps: producing a data base that includes a multiplicity of data points, each data point representing a stored formation characteristic output related to a stored input measurement; deriving, from the data base,...

20060055404 - Imaging nmr method and nmr device: The invention is characterized in that said stationary magnetic polarization field is provided with at least one spatially limited volume region inside said object, said spatially limited volume region having a greater magnetic flux density than the remaining region of said object so that said nuclear resonant processes are induced...

20060055405 - Method and apparatus for enhanced multiple coil imaging: The subject invention pertains to a method and apparatus for enhanced multiple coil imaging. The subject invention is advantageous for use in imaging devices, such as MRIs where multiple images can be combined to form a single composite image. In one specific embodiment, the subject method and apparatus utilize a...

20060055407 - Nuclear magnetic resonance system: An NMR system that enables multiplex resonance measurement includes a superconductivity reception coil, a transmission coil, and four electric current loops. The NMR system also includes an additional coil in which directions of currents that flow in an inner loop and an outer loop are opposite to each other. The...

20060055406 - Systems, methods and apparatus for specialized magnetic resonance imaging with dual-access conical bore: An apparatus for magnetic resonance imaging is described having a casing with an inner bore which in some embodiments is substantially frustoconical shape for receiving a subject. The apparatus contains devices disposed in the casing to create a uniform field within an inner bore. The apparatus employs dual access since...

20060055408 - Balun arrangement and an installation method thereof for a magnetic resonance apparatus: A balun arrangement for a magnetic resonance apparatus which in some embodiments further comprises a cable member comprising at least one first ground end and at least one second ground end. A first capacitive element is electrically coupled to said first ground end and second ground end, wherein the cable...

20060055409 - Circuit arrangement for transferring signals from local mr coils to evaluation units: A circuit arrangement for connection of at least two local coils of a magnetic resonance apparatus with at least two evaluation units has at least two sheath wave barriers arranged so that magnetic fields caused by them substantially cancel one another....

20060055410 - Transmitter loops in series for geophysical surveys: The invention relates to a transmitter loop configuration used for ground and downhole electromagnetic geophysical surveys. The loop wire is spread out on the ground surface in such a way as to form several subset loops in series. Each subset loop can be juxtaposed to each other or separated by...

20060055411 - System and method for locating an anomaly: A method and a system are provided for allowing determination of a direction and distance from a tool to anomaly in a formation. The apparatus for performing the method includes at least one transmitter and at least one receiver. An embodiment of the method includes transmitting electromagnetic signals from the...

20060055412 - Device for triggering ignition circuits: A device for triggering ignition circuits is provided, a coupling being provided between a positive output stage and negative output stage of different pairs. Each positive and each negative output stage is assigned a diagnostic unit and a drive circuit....

20060055413 - Circuit pattern inspection instrument and pattern inspection method: Disclosed is a circuit pattern inspection apparatus for inspecting a conductive pattern of a circuit board which includes first and second comb-shaped conductive patterns 15a, 15b each having a plurality of terminal portions arranged substantially parallel to each other and a base portion connecting respective anchor ends of the terminal...

20060055414 - Matched delay line voltage converter: A method and apparatus for measuring or converting voltage, the method comprising: applying an input voltage to a primary delay line; applying a reference voltage to a timer delay line; propagating a delay signal through the primary delay line; propagating a timer signal through the timer delay line; establishing a...

20060055416 - Capacitance measuring apparatus and method, and program: Whether a human body is touching or not is detected highly accurately at high speed. Switch SW1 is turned on to charge condenser Ca by power supply Vcc. The switch SW1 is turned off to transfer the electric charge charged in the condenser Ca to condensers Cs and Cx. The...

20060055415 - Environmentally compensated capacitive sensor: A capacitive sensor provides a high level of precision (potentially accurate within fractions of a nanometer) by taking the effects of environmental changes into consideration and compensating for any and all changes to the plate area and to the value of the dielectric constant before determining an accurate measurement. Such...

20060055417 - Method and ic for detecting capacitance variation: A method and an integrated circuit (IC) for detecting capacitance variation are disclosed. In order to resolve the prior art problem that sensitivity of detecting capacitance variation is decreased by a time delay component td of a charging/discharging unit, the present invention employs two time divided frequencies. More specifically, the...

20060055418 - Systems and methods for resistivity measurement: Disclosed is a measurement system for measuring subsurface resistivity. The surfaces of interest are, for example, engineered surfaces such as roads and dams, and non-engineered surfaces such as greenfield sites. The measurement system may also be used on biological materials. The system includes signal input electrodes for inputting an input...

20060055419 - System and method for detecting motor coil-to-coil faults: A system and method detects coil-to-coil faults in an electric motor having a plurality of coils. The method includes applying a square wave signal to a first coil of the motor, connecting a capacitor and a resistor between ground potential and a second coil of the motor, applying the coil...

20060049819 - Phase determination system: A phase determination system for power measurement....

20060049820 - Method and apparatus for remotely buffering test channels: A system is provided to enable leakage current measurement or parametric tests to be performed with an isolation buffer provided in a channel line. Multiple such isolation buffers are used to connect a single signal channel to multiple lines. Leakage current measurement is provided by providing a buffer bypass element,...

20060049821 - Displacement encoder, device comprising such an encoder and method of manufacturing such an encoder: Displacement encoder for a moving shaft, having a sleeve intended to be clamped on the shaft and an encoding zone having polarized magnetic mark. The encoding zone has permanent magnet disposed against the sleeve and a layer of elastomer is overmolded and adherized on the magnet and on the sleeve....

20060049822 - Wireless, passive wheel-speed and cadence detection system: A wireless, passive wheel-speed and detection system is provided for measuring the rate of rotation of a rotating component of a bicycle. The detection system includes a sensor arrangement having a first portion mounted on the bicycle and a second portion mounted on the rotating component. The sensor arrangement generates...

20060049823 - Probe card and method for testing magnetic sensor: A probe card comprises a plurality of coils for impressing a magnetic field in changeable directions to a magnetic sensor and a group of probes for detecting an output signal of the magnetic sensor. A manufacturing cost of the magnetic sensor can be decreased....

20060049826 - Optical cross-connect system: An optical cross-connect switch comprises a base (216), a flap (211) and one or more electrically conductive landing pads (222) connected to the flap (211). The flap (211) has a bottom portion that is movably coupled to the base (216) such that the flap (211) is movable with respect to...

20060049825 - Electromagnetic wave transceiver apparatus and nuclear magnetic resonance analyzing apparatus using it: An electromagnetic transceiver apparatus for a NMR apparatus has an intermediate frequency generator for preparing an intermediate wave, a transmission frequency converter for preparing, on the basis of an intermediate frequency of the intermediate wave, an electromagnetic wave to be radiated from a transmitter coil, a reception frequency converter for...

20060049824 - Sensor with low bulkiness for detecting determined position of a mobile:

20060049827 - Sensor and method: An apparatus includes a first circuit, a second circuit, and a capacitor. The first circuit includes a sense element. The capacitor couples the first circuit to the second circuit. The first feedback path couples the second circuit to the first circuit. And the second feedback path couples the second circuit...

20060049828 - Device for detecting magnetic fields and related detecting methods: A device for detecting magnetic fields, of the type comprising at least one element made of hard magnetic material (12) and an element made of soft magnetic material (13) associated to an element made of semiconductor material (11), means (15) for forcing a current (I) in said semiconductor material (11),...

20060049829 - Magnetic resonance imaging device: A first pulse sequence is executed on an imaging portion of an object to be examined using a multiple receiving coils including a plurality of receiving coils to obtain sensitivity images 701 to 703, each of n in number, which is smaller than the number of examination image. When those...

20060049830 - Magnetic sensor for detecting location of short circuit between lead wires of high-density micro-patterns: The present invention relates to a sensor, which detects the short circuit between high-density integrated lead wires formed on various boards, such as used in a flat panel display, in a non-contact manner, wherein an electric field is blocked by a conductor. According to the present invention, the present invention...

20060049831 - Detection and suppression of electrical arcing: Method and apparatus for detecting or suppressing electrical arcing or other abnormal change in the electrical impedance of a load connected to a power source. Preferably the load is a plasma chamber used for manufacturing electronic components such as semiconductors and flat panel displays. Arcing is detected by monitoring one...

20060049832 - Process for the connection of electrical loads to the terminals of an amplifier, and for detection of a possible defect of connection of these loads: A process and circuit for the connection of electrical loads to the terminals of an amplifier, and for detection of a possible connection defect of said electrical loads. An electrical load is connected to two terminals of the amplifier according to a complete-bridge mounting. At least one second electrical load...

20060049833 - System and method for monitoring piezoelectric material performance: A system and method are provided for monitoring performance capacity of a piezoelectric material that may form part of an actuator or sensor device. A switch is used to selectively electrically couple an inductor to the piezoelectric material to form an inductor-capacitor circuit. Resonance is induced in the inductor-capacitor circuit...

20060049834 - Capacitance detection circuit and capacitance detection method: A capacitance detection circuit in which detection wirings are arranged in such a manner as to intersect a plurality of driving wirings, and detection electrodes forming capacitances between the driving wirings and the detection wiring that intersect each other are formed within a sensor plane includes a column wiring driving...

20060049835 - Capacitive sensor: An improved two loop capacitive sensor oscillator circuit converts a transducer capacitance to a frequency and includes a first loop to create an oscillatory waveform having a frequency related to a capacitance of the capacitive transducer. The first loop includes a resistor. The resistor is electrically coupled to a capacitor....

20060049836 - Capacitive sensor: Capacitance element electrodes (E1 to E5) and a grounded reference electrode (E0) are formed on a substrate (20). A displacement electrode (40) that is Z-axially displaced in accordance with a Z-axial movement of a detective member (30) externally operated, is disposed so as to be opposed to the above electrodes...

20060049837 - Test apparatus for evaluating electrical properties of liquid toner and test method for the same: A test apparatus to evaluate the electrical properties of a liquid toner in which a printing quality of the liquid toner may be predicted by evaluating the electrical properties of the liquid toner without performing printing. The test apparatus to evaluate the electrical properties of a liquid toner includes a...

20060049838 - Pattern evaluation method, manufacturing method of semiconductor device, correction method of mask pattern and manufacturing method of exposure mask: A pattern evaluation method using a circuit arrangement provided with N (N is a natural number of 2 or greater) circuit groups having wiring whose widths are different to each other, each circuit group including first to Mth circuits having first to Mth (M is a natural number of 2...

20060049839 - Dynamic signal injection microscopy: Methods and system for sensing dynamic failures in an electronic circuit. An exemplary system includes a drive source, a radiant energy source, and a signal comparator. The drive source supplies a dynamic input signal to the electronic circuit, thereby causing the electronic circuit to output a signal. The radiant energy...

20060049841 - Replaceable probe apparatus for probing semiconductor wafer: A probe apparatus for probing a device on a semiconductor wafer to be tested by a testing equipment is provided. The probe apparatus includes a replaceable probe tile removably mounted in a probing location on a base plate. The probe tile is configured into a self-contained assembly which includes a...

20060049840 - Test probe and tester, method for manufacturing the test probe: A test probe having a conductive part electrically connected to terminals of a test-object device, including: a silicon substrate; a protrusion made of resin provided on the silicon substrate; a first conductive part which is provided on the protrusion and comes in contact with the terminals; and a second conductive...

20060049844 - Method for testing an electric circuit: In a method for testing an electric circuit, a first electric circuit is produced by a predetermined first process sequence. A data stream is applied to the first electric circuit and a signal being indicative if the first electric circuit is defective is generated by comparing the data stream with...

20060049842 - System and method for accurate negative bias temperature instability characterization: Methods and systems are provided for characterizing the negative temperature bias instability of a transistor. A bias voltage is maintained at a drain terminal of the transistor during a test period. A stress voltage is maintained at a gate terminal of the transistor during the test period, such that the...

20060049843 - System and method using locally heated island for integrated circuit testing: A test system and method for integrated circuits includes an energy source having an adjustable energy rate, and a feedback device, which measures a physical quantity at a discrete position on an integrated circuit. A control circuit adjusts the power source to externally apply energy to the integrated circuit at...

20060043958 - Beam current measurement: The display apparatus comprises a picture tube (CRT) with an electron gun which generates an electron beam (BB) directed towards a display screen. The electron gun comprises a first and a second electrode (CA, G1). The electron beam (EB) originates from the first electrode (CA). The voltage between the first...

20060043959 - Combined test instrument probe and voltage detector: A voltage detector is combined with a test instrument probe to provide an indication of the presence of a.c. voltage when the test instrument probe approaches or comes in contact with a source of a.c. voltage....

20060043960 - High precision current sensor: A current sensor for measuring an electric current flowing through a current bus bar includes: a magnetic core with an opening, through which the current bus bar passes with a predetermined interval; and a first magnetic sensor for detecting magnetic flux density in the magnetic core, the magnetic flux density...

20060043961 - Electrical-energy meter: A presently-preferred embodiment of an electrical-energy meter comprises a base adapted to be mounted on a supporting surface, a current sensor assembly comprising a plurality of contact blades extending through the base and adapted to electrically contact a conductor of electrical energy, and a current transformer mechanically coupled to the...

20060043962 - Double sided probing structures: A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test....

20060043963 - Magnetic motion sensor: A magnetic motion sensor has: two magnetic sensors aligned in a direction along which changes in a magnetic field shift for detecting an appearance of the changes; a differential means for taking out a differential signal of output signals from these two magnetic sensors; and a timing detection means for...

20060043964 - Angle detector with self-calibration capability: An angle detector with self-calibration capability has a number of first scale read heads and one second scale read head around the periphery of a single scale disk and includes means for performing self-calibration by determining measurement differences between the second scale read head and the individual first scale read...

20060043966 - Comparator circuit and rotation detector: The comparator circuit includes an amplifier amplifying a voltage signal inputted from outside, a voltage dividing circuit dividing down a power supply voltage supplied from outside, thereby producing a reference voltage, a waveform dull circuit dulling the reference voltage, and a comparator comparing a voltage of the input voltage signal...

20060043965 - Resolver: Plurality of air gaps are formed in a torus-shaped stator body of the resolver. If a straight line were drawn from a center point of the stator body toward the outside in the radial direction of the stator body and the straight line were rotated 360 degrees about the center...

20060043967 - Disk pack swap process for evaluating magnetic recording performance: A method for testing electromagnetic characteristics of magnetic media while maintaining consistent performance of a read/write head and recording channel is disclosed. The disclosed method is performed such that reduced statistical sampling is achieved. The method includes recording a first set of baseline measurements utilizing a first magnetic media with...

20060043968 - Distributed electromagnetic field analyzing apparatus and method of divided electromagnetic field analysis with electromagnetic field analysis calculations divided and allotted to a plurality of computers: A distributed process control unit divides, in time and space, a main problem of finding a full time response of an analytic region into a plurality of sub-problems, allots the sub-problems to those of a plurality of calculating units which are capable of calculating a new sub-problem, to have the...

20060043969 - Integrated circuit for use with an external hall sensor, and hall sensor module: An integrated circuit for use with an external Hall sensor that permits to at least substantially cancel out the temperature drifts of the Hall sensor, as caused by the temperature drift of the current supplied to the Hall sensor, and the gain of the Sigma-Delta modulator. Specifically, the circuit provides...

20060043971 - Measuring method of spatially resolved frequency selective images: The present invention describes a magnetic resonance imaging method wherein spatially resolved frequency sensitive image data are collected by means of free precession sequences employing very small radio frequency (RF) excitation pulses per unit time which result in highly frequency selective steady-state signals dominated by linear properties of the system,...

20060043970 - Method and apparatus of background suppression in mr imaging using spin locking: The present invention is directed to a method and system of tissue or background suppression for the acquisition of image data from blood flow or tissue perfusion. Background suppression with minimal effects upon inflowing spins is achieved through a series of spin locking low level RF pulses that cause adiabatic...

20060043972 - Subterranean magnetic field protective shield: Downhole mechanical or electrical equipment that possess, induce or supply large electromagnetic interference or magnetic fields are sometimes placed in subterranean wells, usually as part of or attached to wellbore tubulars. These magnetic fields can interfere with the efficient operation of some electronic, gyroscopic or magnetic well tools that pass...

20060043973 - Co-located antennas: Techniques for implementing antenna configurations with substantially co-located axes are disclosed. A method for constructing co-located antennas includes winding a first antenna on a support, the first antenna having a first magnetic dipole in a first orientation; and winding a second antenna on the support through a first set of...

20060043974 - Repair device for decorative light shunt: A repair device for fixing a malfunctioning shunt across a failed filament in a light bulb in a group of series-connected miniature decorative bulbs includes a high-voltage pulse generator producing one or more pulses of a magnitude greater than the standard AC power line voltage. A connector receives the pulses...

20060043975 - System and method for nondestructive testing of thermal batteries: The present invention generally relates to a thermal battery testing apparatus and a method for testing a thermal battery. The method includes one or more of the following steps: connecting the thermal battery in series with a resistance; connecting the thermal battery and resistance in series with a sinusoidal voltage...

20060043976 - Wireless portable automated harness scanner system and method therefor: A method for testing an installed wiring harness is provided. The method comprises providing a signal source testing module at a first node in the wiring harness and a measurement termination testing module at a second node in the wiring harness. A central management module for controlling the testing modules...

20060043977 - Method and device for detecting touching points on rotating machines: A method and a device for detecting a touching point (i.e. contact point) on a machine having a rotating shaft, in which the touching point (i.e. contact point) on the shaft is determined during operation. This is performed by measuring the grounding state of the shaft by measuring a characteristic...

20060043978 - Method of calibrating a network analyzer: A method for calibrating a network analyzer having at least two test ports is described in which a completely known, transmitting first calibration standard, is designed as a two-port standard and is connected between two test ports of the network analyzer, is measured. Also measured is a second calibration standard...

20060043979 - Emi measuring method and its system: An electromagnetic interference (EMI) measuring method and its system for diagnosing EMI of various electronic devices and instructing user to improve design to satisfy Electromagnetic Compatibility (EMC) criterion. The measuring method according to the present invention includes acquiring a set of time domain signal waveforms from a group of uniformly...

20060043980 - Controllable two layer birefringent optical component: An optical component (181) comprises a first birefringent layer (203) connected to a second birefringent layer (170) by a curved interface (206). An optical axis (19) passes through the first and the second layer. The second birefringent layer (170) has molecules movable between a first orientation and a second orientation...

20060043981 - Voltage isolated detection apparatus and method: A high-isolation call cord switch includes connectivity for a standard hospital-style push-button call cord while using low voltage alternating current to isolate detection circuitry from static electricity. An alternating current signal is used to permit transformer coupling, with its intrinsic isolation capability, between the call cord switch and the detection...

20060043982 - Method and apparatus for inspecting integrated circuit pattern: A circuit pattern inspection method and an apparatus therefor, in which the whole of a portion to be inspected of a sample to be inspected is made to be in a predetermined charged state, the portion to be inspected is irradiated with an image-forming high-density electron beam while scanning the...

20060043983 - Anisotropic conductivity connector, probe member, wafer inspecting device, and wafer inspecting method: Disclosed herein are an anisotropically conductive connector, by which good conductivity is retained over a long period of time even when it is used repeatedly over many times or repeatedly used under a high-temperature environment, and applications thereof. The anisotropically conductive connector is an anisotropically conductive connector having an elastic...

20060043984 - Bottom side stiffener probe card: A probe card for production testing of semiconductor imaging die includes a stiffener supported on a bottom side of the probe card. The top of the stiffener is substantially flush with a top surface of the probe card. A light passage through the stiffener features non-reflective surfaces. Surfaces surrounding the...

20060043985 - Method of designing a probe card apparatus with desired compliance characteristics: A probe card apparatus is configured to have a desired overall amount of compliance. The compliance of the probes of the probe card apparatus is determined, and an additional, predetermined amount of compliance is designed into the probe card apparatus so that the sum of the additional compliance and the...

20060043987 - Methods for measuring parasitic capacitance and inductance of i/o leads on an electrical component using a network analyzer: Methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of...

20060043988 - Methods of making a resilient contact apparatus and resilient contact probes: Carriers comprising a carrier body having a plurality of openings holding a plurality of resilient contact probes are disclosed. A number of different embodiments for the resilient contact probes are also disclosed. The carriers of the present invention may be secured to an interface board (i.e., a printed circuit board...

20060043986 - Pin-in elastomer electrical contactor and methods and processes for making and using the same: A contactor card assembly for use with a semiconductor substrate. An upper keeper plate and a lower keeper plate each include a number of conductive pins extending therethrough, situated in vias filled with an elastomeric material and extending beyond the keeper plates to contact a substrate for testing. An intermediate...

20060043989 - Film-type testing jig and testing method: A film type testing jig and a testing method are suitable for an electronic element to be tested having electrical contacts. At least one movable member whose surface is provided with a testing film is prepared. After the electronic element to be tested is fixed in position, conductive circuits on...

20060043990 - Method of mounting and demounting a semiconductor device, device for mounting and demounting a semiconductor device using the same, and socket for a semiconductor device: A cover member 34 is moved upward when a semiconductor device 26 disposed in a positioning member 44 is held by an absorption pad 24 to pinch an electrode portion 26a of the semiconductor device 26 with movable contact portions 46M and 46F of a contact terminal 46ai....

20060043991 - Circuit board checker and circuit board checking method: The present invention provides an inspection apparatus for circuit board for conducting electrical inspection by electrically connecting inspection object electrodes of the circuit board to a plurality of inspection electrodes formed in accordance with a pattern corresponding to the inspection object electrodes through an anisotropically conductive sheet, wherein each of...

20060043992 - Semiconductor device, method and apparatus for testing same, and method for manufacturing semiconductor device: The semiconductor device according to an aspect of the present invention is a semiconductor device having an electrode pad to be contacted a test probe for performing probe testing, a bonding area mark for defining a bonding area which performs wire boding on the electrode pad, and a probe area...

20060043993 - Test probe with side arm: The present invention discloses an electrical test probe having a side arm member attached to a main probe element at an angle less than 90 degrees. The length of the side arm is such that the end of the side arm does not make contact with surfaces being probed by...

20060043994 - Test probe with thermally activated grip and release: An electrical test probe has a thermally activated, configurable shape probe tip. At low temperatures, the probe tip is in a generally hooked configuration. Upon heating, the probe tip is converted to a generally straight configuration. The probe tip is composed of a spring component bonded to a shape memory...

20060043995 - Stacked tip cantilever electrical connector: A probe for a probe card assembly is provided. The probe includes a beam element having a tip end portion. The probe also includes a tip structure on the tip end portion of the beam element. The tip structure includes a plurality of conductive bumps arranged in a stacked configuration....

20060043996 - Construction and use of dielectric plate for mating test equipment to a load board of a circuit tester: An article of manufacture may include a dielectric having a top surface and a bottom surface. The top surface provides a planar surface corresponding to a mating surface of test equipment. The bottom surface has a relief pattern that is formed to straddle components extending above a surface of a...

20060043997 - Enhanced sampling methodology for semiconductor processing: The present invention improves wafer sampling methods by partitioning a semiconductor wafer into a set of sampling regions and calculating yield of a sampling region(s) of the semiconductor wafer....

20060044002 - Enhanced sampling methodology for semiconductor processing: The present invention improves wafer sampling methods by partitioning a semiconductor wafer into a set of sampling regions and calculating yield of a sampling region(s) of the semiconductor wafer....

20060044000 - Method and apparatus for evaluating semiconductor device: Gate voltage sweeping is performed on a semiconductor element using a multilayer insulating film including a lower insulating film whose thickness is to be obtained. A low voltage peak current mode is extracted from the resultant current-voltage characteristic, so that a peak voltage and a peak current amount in this...

20060043998 - Method of increasing reliability of packaged semiconductor integrated circuit dice: Semiconductor dice are electrically tested prior to final assembly. Dice failing the test are identified and not packaged. However, “good dice” (i.e., those dice that passed testing) in proximity to the failed dice frequently fail prematurely in the field. Therefore, in one embodiment, a method to identify those dice having...

20060043999 - Semiconductor circuit, method of monitoring semiconductor-circuit performance, method of testing semiconductor circuit, equipment for testing semiconductor circuit, and program for testing semiconductor circuit: A semiconductor circuit is disclosed, including a DLL circuit for supplying a desired signal-delay amount. The DLL circuit includes detecting means for detecting variations of a signal-delay amount, and delay-amount control means for generating a delay-amount control signal for controlling, depending on the variations of the signal-delay amount detected by...

20060044001 - Semiconductor device testing: An apparatus and method to test components in a semiconductor test structure. On a semiconductor wafer, a test module implemented in one or more scribe lines between a plurality of semiconductor dies is used to test components in the semiconductor test structure. The test module may, for example, test electrical...

20060044003 - Measuring bi-directional current through a field-effect transistor by virtue of drain-to-source voltage measurement: A method and apparatus for measuring current, and particularly bi-directional current, in a field-effect transistor (FET) using drain-to-source voltage measurements. The drain-to-source voltage of the FET is measured and amplified. This signal is then compensated for variations in the temperature of the FET, which affects the impedance of the FET...

20060044004 - Method and apparatus for measuring transfer characteristics of a semiconductor device: A method and apparatus for measuring alternating current (AC) and direct current (DC) characteristics of a plurality of semiconductor devices. A ring oscillator generates pulses to drive the plurality of semiconductor devices under test. Current/Voltage (IV) and transfer characteristics of the plurality of semiconductor devices are measured using only DC...

20060044005 - System of simulating resistive loads: A system of simulating resistive loads adapted for testing working characteristics of power supplies includes a power supply (100), a linking apparatus (10) and a resistance loading apparatus (40). The power supply has a plurality of outputs (120). The linking apparatus is electrically connected to the outputs of the power...