Electricity: measuring and testing inventions 12/05

20050285587 - Apparatus and method thereof for measuring output current from primary side of power converter: An apparatus and method thereof for measuring an output current from a primary side of a power converter are provided. A peak detector is designed to sample a peak value of a converted voltage of a primary-side switching current. A zero-current detector detects a discharge-time of a secondary-side switching current...

20050285588 - Method and apparatus for testing material integrity: In accordance with one embodiment, the present technique provides a testing apparatus for testing material integrity in an object. The testing apparatus includes an electrical conductor and a sensing device. In the exemplary testing device, the electrical conductor extends in a generally linear direction and is configured to route current...

20050285591 - Ac magnetic tracking system employing wireless field source: A small, lightweight field source acts as a “pseudo-sensor” in an AC magnetic tracking system, facilitating wireless operation. Upon activation, the source sends out three continuous low-power magnetic signals, a separate frequency from each of three resonant orthogonal coils, without the need for switching to a receive mode or detecting...

20050285590 - Ac magnetic tracking system with non-coherency between sources and sensors: In an AC magnetic tracker one or more multi-axis field sources, each operating at a different frequency, or frequency set, are detected and tracked in three-dimensional space, even when wireless or otherwise not physically connected to the tracking system. Multiple sources can be tracked simultaneously as they each operate with...

20050285589 - Characteristic measurement of an actuation drive coil and associated damping mechanism: A system and method for analyzing a coil actuator of a type having a coil and a magnet. A current source selectively applies a first current to a coil of a coil actuator for setting a moveable part of the coil actuator to a first position. A recording system captures...

20050285592 - Magnetic type angle sensor: A magnetic type angle sensor includes a rotary body having a first sensed part provided on a circumferential surface thereof with projecting parts and recessed parts at equal intervals in a circumferential direction thereof and a second sensed part provided on a circumferential surface thereof with a projecting parts at...

20050285593 - Magnetic sensor with pointing control circuit: A configuration comprising a magnetic sensor and a pointing control circuit, for implementing a pointing device, is rendered compact in size. To that end, the pointing control circuit is formed in the central part of an IC chip, substantially square in shape, and Hall elements are provided in four corners...

20050285595 - Movable patient support with spatial locating feature: A magnetic resonance imaging system having a patient support arranged for pivoting movement about a pivot axis and linear or sliding motion along a support axis transverse to the pivot axis is provided with a device for measuring the location of a patient feature to be imaged. The measured location...

20050285594 - Mri system having a gradient magnet system with a balance member: The invention relates to a magnetic resonance imaging (MRI) system (1) comprising an examination volume (111), a main magnet system (13) for generating a main magnetic field (B0) in the examination volume in a Z-direction, a gradient magnet system (19) for generating gradients of the main magnetic field, and an...

20050285596 - Magnetic resonance imaging apparatus: In the MRI apparatus of the present invention, a reinforcing member is firmly provided so as to enhance the rigidity strength of two connecting tubes connecting upper and lower cryostats, thereby suppression of vibration caused by a gradient magnetic field coil and suppression of variation of static magnetic field can...

20050285597 - Apparatus for generating homogeneous magnetic field: At least one superconducting shim coil is wound around a cylinder member disposed approximately coaxially with a group of superconducting main coils, and the positions in the winding center locus in an axial direction change approximately in accordance with a function where a sine or cosine function with a cycle...

20050285598 - Remote sensing electric field exploration system: An airborne exploration system used with an aircraft for shallow and deep exploration for oil and gas, mineral deposits and aquifers. The survey system uses natural electromagnetic EM fields as an energy source. The exploration system includes a pair of aerodynamic housing pods adapted for mounting on wing tips of...

20050285599 - Polarographic densitometer: Disclosed is a polarographic densitometer, comprising: a voltage applying circuit; a sensor unit; an impedance reduction circuit; and a current/density conversion unit. According to the present invention, said voltage applying circuit applies specified voltage, and said sensor unit includes a group of electrodes to produce a current output in response...

20050285600 - Method and apparatus for implementing direct attenuation measurement through embedded structure excitation: A method and apparatus are provided for implementing direct attenuation loss measurement in an electronic package. A sinusoidal voltage source signal of a selected frequency is coupled to an embedded transmission line test structure in the electronic package. Receive circuitry is coupled to the transmission line test structure for detecting...

20050285601 - Physical quantity sensing device with bridge circuit and temperature compensating method: A physical quantity sensing device includes an AC voltage generator for generating an AC voltage and a bridge circuit that has first and second input points, to which the AC voltage is applied, and first and second output points connected to a differential amplifier. The bridge circuit includes a first...

20050285602 - Use of magnetic noise compensation in localization of defect in flat plate structure: The noise associated with induced Emf in a flat plate structure is significantly reduced by using a compensation coil or other magnetic detector. Additional noise reduction is provided by using a second magnetic detector, preferably another coil with many turns, combined with analog or digital signal processing. The lower noise...

20050285603 - A/c generator rotor test apparatus: An assembly is provided for testing a circuit of a rotor of an AC generator. The assembly includes a base, a rack, a coil housing, one or more coils, and a rotor stand. The rack is coupled to the base and the coil housing is coupled to the rack. The...

20050285604 - Partial discharge detecting sensor and gas insulated electric apparatus provided with a partial discharge detecting sensor: A thin film detection electrode is formed on an insulating substrate. The resulting detection electrodes are light-weight, and have a very high dimensional accuracy so that the number of the parts supporting the detection electrodes is small and the size of the detection electrodes becomes very small. By an increase...

20050285605 - Delay lock circuit having self-calibrating loop: A delay lock circuit includes a measuring path, a forward path, and a feedback path. The measuring path samples a pulse with a reference signal in a measurement to obtain a measured delay. The forward path delays the reference signal based on the measured delay to generate an internal signal....

20050285606 - Delay lock circuit having self-calibrating loop: A delay lock circuit includes a measuring path, a forward path, and a feedback path. The measuring path samples a pulse with a reference signal in a measurement to obtain a measured delay. The forward path delays the reference signal based on the measured delay to generate an internal signal....

20050285607 - Instrumentation current loop: An instrumentation current loop, including a transducer having transducer output terminals. A power source is connected in series to the transducer. A bridge has a first arm and a second arm extending between a pair of input terminals, where the input terminals of the bridge are connected to the transducer...

20050285608 - Electrostatic capacity type liquid state detecting sensor: An electrostatic capacity type liquid state detecting sensor includes an outer tubular electrode, and an inner electrode disposed within the outer tubular electrode and having an insulation layer at an outer surface portion to be brought into contact with liquid contained in a container for detection of a state of...

20050285609 - Probe unit and its manufacturing method: A probe unit comprises a substrate and a lead formed on the substrate and having a tip part projecting from an edge of the substrate and contacting to an electrode of a sample, and a thick part of which thickness is thicker than the tip part. The probe unit can...

20050285610 - Test circuitry wafer: Method and apparatus for testing a plurality of devices on a device wafer. One embodiment provides a test circuitry wafer having a first surface and a second surface, the test circuitry wafer comprising a plurality of contact pads disposed on the first surface for contacting a plurality of device pads...

20050285612 - Apparatus for measuring dc parameters in a wafer burn-in system: The present invention relates to an apparatus for measuring DC parameters which has a simplified hardware constitution of a DC block by simplifying the connection relationship of the DC block and DUTs for measuring DC parameters in a wafer burn-in system, and which can cause the processing time for measuring...

20050285613 - Mechanism to stabilize power delivered to a device under test: According to one embodiment a system is disclosed. The system includes a tester having a power supply, an integrated circuit device under test (DUT) and a transient compressor (TC) coupled between the tester and the power supply to stabilize power delivered to the DUT by injecting current into the path...

20050285615 - System lsi: On a clock supply route to a specified block such as a ROM, there are provided a clock delay circuit which includes a plurality of delay elements connected in series and a selector, such that a delay clock signal is selected and output in accordance with a delay control signal....

20050285611 - Utilizing clock shield as defect monitor: Disclosed is a shielded clock tree that has one or more clock signal buffers and clock signal splitters, with clock signal wiring connecting the clock signal buffers to the clock signal splitters. Shielding is adjacent the clock signal wiring, where ground wiring connects the shielding to ground. The shielding comprises...

20050285614 - Wafer probecard interface: Apparatus and method for testing a device wafer having a plurality of devices formed thereon. One embodiment of the invention provides an interface wafer comprising a plurality of contact pads disposed on a first surface for contacting a plurality of device pads on the device wafer and a plurality of...

20050285616 - Overvoltage detection apparatus, method, and system: A transistor may have degraded characteristics because of an overvoltage condition. The degraded characteristics may be sensed to determine that the transistor has previously been subjected to an overvoltage condition....

20050285618 - Method for analyzing organic light-emitting device: Provided is a method for analyzing the performance of an OLED through activation in-situ. The method includes placing the OLED in an in-situ chamber, driving the OLED, and analyzing a dark spot and/or thermal degradation of the OLED, such that performance of the OLED can be analyzed while driving the...

20050285617 - System and method for inspecting an lcd panel: A system for inspecting a liquid crystal display (LCD) panel (10) includes a magnifier (11) for magnifying an image of the inspected LCD panel, a charge coupled device (CCD) camera (12) for capturing the magnified image of the inspected LCD panel, an image acquisition card (13) for converting analog signals...

20050285619 - System and method for detecting an operational fault condition in a power supply: A system and a method for detecting an operational fault condition in a power supply are provided. The power supply has a controller operably coupled to first and second switches. The first and second switches are connected in series between a voltage source and a ground node, wherein a first...

20050280406 - Pll filter leakage sensor: The present invention provides a method, apparatus, and computer program for measuring the current leakage in a Low Pass Filter (LPF) capacitor of a Phased Locked Loop (PLL). As a result of thinner and thinner film capacitors in Complementary Metal-Oxide Semiconductor (CMOS) technology, leakage current, which causes a PLL to...

20050280407 - Delay-locked loop and a method of testing a delay-locked loop: A delay-locked loop (DLL) of an integrated circuit (IC) with testing circuitry and a method for testing a DLL. During test mode, a phase comparator of the DLL receives a test clock in place of the reference clock and determines the phase difference between the test clock and the clock...

20050280408 - Multi-element smart gas sensor: An electronic gas sensor signal conditioner which can automatically adapt to a wide variety of commercial off-the-shelf sensors and provide a digital output in a standard, easily used format. The signal conditioner has analog and digital sections. The analog section includes a sensor excitation sub-section and a signal amplification sub-section....

20050280409 - Device for the reading of direct and/or alternating currents: The present invention is related to a device (1) for the detection of direct and/or alternating current to be used in the realisation of highly sensitive amperometric measuring instruments or for the detection of differential faults along with automatic switches. The inventive device comprises a magnetic core (5) disposed in...

20050280410 - Test apparatus and method for testing circuit units to be tested: The invention provides a test apparatus for testing a circuit unit (101) to be tested having a test system (100), a control bus (102) for transferring control data (106), an address bus (103) for transferring addressing data (107) and a data bus (104) for exchanging test data (108) between the...

20050280411 - Gmr sensor with flux concentrators: A proximity sensor that is capable of producing a relatively larger output signal than past proximity sensors, and in some cases, an output signal that is relatively independent of the speed at which a target passes the sensor. In one illustrative embodiment, the proximity sensor includes a first magnetoresistive resistor...

20050280412 - Blade detection sensor having an active cooling system: A passive blade detection sensor exploits the electrically conductive trait of typical turbo machinery components such as fan, compressor and turbine blades. A permanent magnet is placed strategically adjacent to a wire coil to generate a single pulse/antipulse signal when a blade passes in front of the sensor. The electrically...

20050280413 - Eddy-current probe: An eddy-current probe according to the present invention comprises: a substrate having a first surface facing to a subject to be tested and a second surface opposite to said first surface; an exciting coil formed on the second surface, having a pair of current lines in parallel with each other...

20050280414 - Methods and devices for analysis of sealed containers: This invention provides methods, NMR probes, and NMR systems for the analysis of the contents of sealed food and beverage containers and the like....

20050280416 - Method for introducing a liquid sample into an nmr spectrometer: A method for introducing a liquid sample into an NMR spectrometer to measure an NMR spectrum of the liquid sample, wherein the liquid sample is injected into a supply line and wherein further liquids are supplied into the supply line following the liquid sample, which are separated from each other...

20050280415 - Nmr apparatus: The invention concerns an NMR apparatus (1) comprising an NMR spectrometer (2) for sequential investigation of several samples in sample containers (6) of substantially identical geometrical design, at a measuring position (10) in the NMR spectrometer (2) comprising a supply line (8) for pneumatic supply of the sample containers (6)...

20050280417 - Multifrequency power circuit and probe and nmr spectrometer comprising such a circuit: A multifrequency power circuit of an NMR coil, includes two power or transmission line segments called principal line segments, each including a segment of a conductor that is attached to the coil, which attached segments together with the coil constitute a first oscillating circuit that exhibits a determined resonance frequency....

20050280418 - Power circuit of a coil and probe and nmr spectrometer comprising such a circuit: A power circuit of a coil, includes two power or transmission line segments that are each connected to one of two ends of this coil, the line segments forming with the coil an oscillating circuit exhibiting a determined resonance frequency. The circuit has two line segments each including at least...

20050280419 - While-drilling apparatus for measuring streaming potentials and determining earth formation characteristics: Earth formations are characterized by using an array of electrodes which can measure streaming potentials in the formation, and by interpreting the data obtained by the electrodes. The electrodes are placed on a wireline tool, a LWD tool, or in a fixed manner about a completed wellbore. The measured streaming...

20050280420 - Boring technique using locate point measurements for boring tool depth prediction: A method is disclosed as part of an overall process in which a boring tool is moved through the ground within a given region along a particular path in an orientation which includes pitch. A locating signal is transmitted from the boring tool which signal exhibits a field defined forward...

20050280421 - Earthquarke prediction method and system thereof: Vehicles (1-1) or ships (1-2) each carry a magnetic force line sensor (11), a GPS position detector (12), and a data transmitter (13) and travel within an observation area transmitting magnetic field data and position data of each point to an earthquake prediction center (4). A telluric current induction field...

20050280422 - Electric leakage detection system: An electric leakage detection system having: a detection point forming circuit which forms a detection point being connected through three resistors which are star-connected to a three-phase output line of an AC generator; a voltage detection circuit which detects a voltage across the detection point and ground; an electric leakage...

20050280423 - Method and apparatus for measuring voltage in a power switching device: A method and apparatus for determining a voltage potential in a power switching device. The method and apparatus uses a conductive shield surrounding a coil positioned around a connector in a power switching device. The coil is used to provide a current measuring device within the power switching device. The...

20050280424 - Device and method for measuring capacitance and device for determing the level of a liquid using one such device: The invention relates to a device (5) for measuring capacity, said device comprising an electrode arrangement consisting of a plurality of electrodes (E1, E2, . . . , En) which are adjacently and/or successively arranged on a carrier (6), an intrinsic measuring device (8) for measuring the capacitance between a...

20050280425 - Electronic multi-depth object locator with self-illuminating optical element warning and detection: An embodiment of the invention provides a sensing device that includes a sensing circuit and a mode selection input device. The sensing circuit senses the presence of an object beneath a surface. The mode selection input device allows a user to select, using a single button, a desired mode from...

20050280426 - Characteristics of a plasma or the methods for evaluating effects of a plasma on a substrate: A method for evaluating characteristics of a plasma or the effects of the plasma on a substrate includes introducing a plasma probe into a reaction chamber. The plasma probe may be introduced into the chamber with or without a substrate. The plasma probe is exposed to substantially the same conditions...

20050280427 - Apparatus for probing multiple integrated circuit devices: The present probing apparatus includes a platform with a rectangular opening, two slides positioned at two sides of the opening in a parallel manner, at least one non-circular beam and at least one tunable stage positioned on the non-circular beam. The non-circular beam is preferably a rectangular beam with two...

20050280429 - Method and apparatus for magnetically achieving electrical continuity: A method and apparatus for achieving electrical conductivity that can, for instance, obviate the need for the use of two hands to make a measurement of electrical properties across two contacts that do not lend themselves to the acceptance of clip-on leads, or across contacts that are located where access...

20050280428 - Probe card and the production method: m

20050280430 - Test method for electronic modules using movable test contactors: A pass through test system for testing an electronic module includes an interface board, and test contactors movably mounted to the interface board for electrically engaging terminal contacts on the module with a zero insertion force on the modules. The interface board is configured for mounting to an automated or...

20050280431 - Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober: A probe card transporting apparatus includes a truck and transporting mechanism. The truck can move on a floor surface freely. The transporting mechanism is arranged above the truck to be able to separate from and come into contact with it. The transporting mechanism transports a probe card between the truck...

20050280433 - Electrical test probes, methods of making, and methods of using: Disclosed herein is an electronic test probe including a compression spring disposed in the housing in engagement with a plunger, the compression spring including a first section of coils including a first centerline and a second section of coils including a second centerline spaced apart from and parallel to the...

20050280432 - Test probe for semiconductor package: An embodiment may comprise a test probe to measure electrical properties of a semiconductor package having ball-shaped terminals. The probe may include a signal tip and a ground tip. The signal tip may have a spherical lower surface allowing good contact with a ball-shaped signal terminal. The ground tip may...

20050280434 - Method and apparatus for die testing on wafer: Integrated circuit die on wafer are tested individually, without probing any of the die, using circuitry (TC1-8, BC1-8, LR1-8, RR1-8, PA1-PA4) provided on the wafer....

20050275395 - Independent measurement of complicated transfer functions: A first test signal from a test signal source is provided to a spectrum analyzer to produce first measurement data. The test signal source is expressed by a first transfer function G(w) and the spectrum analyzer is expressed by second transfer function F(w). A second test signal is provided to...

20050275396 - Sample analyzer and external memory for use in sample analyzer: A sample analyzer including an internal memory installed within a device body and which includes a storage region including a sector for storing predetermined type of information related to an analysis of sample; and an external memory removably installed from outside the device body, for storing a program used in...

20050275397 - Non-intrusive power monitor: Systems and methods for monitoring power in a conductor. A flex circuit may include multiple layers including a voltage sensing layer, a coil layer, and a ground layer. The coil layer includes traces that form a coil structure around a conductor when the flex circuit is wrapped around the conductor....

20050275398 - Pressing member and electronic device handling apparatus: A first spring 54 is provided between a support member 51 driven in the Z-axis direction and a heat block 53, and biases the support member 51 and the heat block 53 in the direction of separating them from each other. A second spring 57 is provided between a first...

20050275399 - Method and apparatus for sensing angle of rotation: An angular position sensor including a magnetic field generator means and a magnetic sensor means. The magnetic field generator means produces a magnetic field. The magnetic sensor means has a first magnetic sensor element, a second magnetic sensor element, and a third magnetic sensor element each for providing an output...

20050275400 - Load detector and transport equipment including the same: A load detector is constructed so as to stabilize an output voltage responding to an input load. The load detector includes a magnetostrictive sensor which includes a hollow case, a coil housed in the case, and a rod-like magnetic member located at an axial center of the coil, magnetized by...

20050275401 - Phase-alternated carr-purcell nmr echo sequence: A phase alternated Carr Purcell (PACP) sequence is effective in removing DC offset from spin echo signals in earth formations. Modifications of PACP sequences, possibly in combination with other pulse sequences, can remove both DC offset and ringing. Such sequences may be used where the ringing is non-repeatable....

20050275402 - Method and control device for operating a magnetic resonance tomography apparatus to select appropriate local coils: In a method for generation of magnetic resonance exposures and a control device for a magnetic resonance tomography apparatus, a number of coils are available in the apparatus, the coils being are positioned at various locations relative to the examination subject. Initially a radio-frequency signal is emitted and a spatially-resolved...

20050275403 - Transceive surface coil array for magnetic resonance imaging and spectroscopy: A surface coil array comprises a surface coil support and an arrangement of non-overlapping magnetically decoupled surface coils mounted on the support. The surface coils encompass a volume into which a target to be imaged is placed. Magnetic decoupling circuits act between adjacent surface coils. Impedance matching circuitry couples the...

20050275404 - High fidelity, high power switched amplifier: A gradient amplifier arrangement is described that comprises a gradient amplifier power stage. The device may be employed to provide a current to a gradient coil, as in a MRI system. The circuitry disclosed includes a series coupling of a first bridge amplifier operating at a first voltage, a second...

20050275405 - Switching matrix apparatus for semiconductor characteristic measurement apparatus: A switching matrix apparatus includes relay switches for opening/closing the electrical connections between input lines and output lines and an LED matrix in which LEDs are arranged in a matrix so as to correspond to the respective relay switches. Each LED distinctively indicates a status, defined by the combination of...

20050275406 - Apparatus and method of dynamic usage profile acquisition and utilization in a wireless mobile device: An apparatus comprising a usage analysis engine may be capable of receiving data on the environment of the apparatus, the data used to create a profile. The usage analysis engine may be further capable of correlating a present profile with previous profiles. The apparatus may take some action or prohibits...

20050275407 - Available input-output power estimating device for secondary battery: An available input-output power estimating device for a secondary battery includes a parameter estimating section substituting a measured current value I and a measured voltage value V into an adaptive digital filter using an equivalent circuit model of the secondary battery for thereby collectively estimating values of parameters in the...

20050275408 - Method and apparatus for detecting impedance: A method and apparatus for detecting an impedance across a pair of terminals. A sensing circuit is AC coupled to the terminals which produces an output related to a time constant associated with the impedance....

20050275409 - 240 volt outlet tester: A 240 volt outlet tester is described. The 240 volt outlet tester includes a housing with three or four prongs extending outwardly from a base of the housing. The prongs are designed so that they can be inserted into either a three or four wire 240 volt outlet. Indicator lights...

20050275410 - Phase difference detection circuit and optical disk device: A phase difference detection circuit is disclosed that is formed by digital circuits having a small circuit area. In the phase difference detection circuit, the circuits for generating a tracking error signal are structured by digital circuits, and a digital tracking error signal TE is generated from digital signals output...

20050275411 - Device and method for testing for a wiring fault condition: A device for testing for a wiring fault condition is disclosed. The device includes an electrical connector, a first signal generator, a second signal generator, and a user interface. The electrical connector includes first and second contacts that are configured to establish an electrical connection to the wiring. The first...

20050275412 - Cable power indicator: A cable power indicator for indicating the power of a power cable is presented or not, which comprises: a power cable, having at least one connector and a cable, wherein, the cable comprises at least one positive wire and a ground wire, and the positive wire and ground wire is...

20050275413 - Very precise resistance measurement: A circuit and a related method to measure very precisely the resistance Rm of a small resistor independent from process and temperature variations. This resistor may be the RON resistance of an external sensor or e.g. the resistance of a safety device as a squib. A constant current source provides...

20050275414 - Double-mirror short-circuit detection: Circuits and related methods to detect efficiently a short-circuit condition of a pad of an IC device efficiently using a comparator and a current mirror configuration have been achieved. The IC device to be tested is free floating. The current mirror configuration comprises four branches, a biasing branch, a first...

20050275415 - Electrostatic detection apparatus and method, and coordinate detection program: A shielding member is provided as an electrostatic protection device in extension lines that extend from a sensing area to switching devices via extension areas correspondingly. As a result, even if a body to be detected such as a finger contacts the extension area, it is possible to reduce the...

20050275416 - Garment incorporating embedded physiological sensors: A system for unobtrusively measuring bioelectric signals developed by an individual includes multiple sensors, one or more of which constitutes a capacitive sensor attached to a holding device. The holding device serves as a mounting structure that holds sensors in place within a wearable garment. The holding device and sensors...

20050275417 - Micro probe 2: Described are methods of using probes, for making electrical contact to high-density chips or similar electronic devices. Two groups of probes are covered. The first group includes probes that are moved laterally, parallel to the surface of the contact pads of the device under test, after the initial contact has...

20050275418 - High density interconnect system having rapid fabrication cycle: An improved interconnection system and method is described, such as for connectors, socket assemblies and/or probe card systems. An exemplary system comprises a probe card interface assembly (PCIA) for establishing electrical connections to a semiconductor wafer mounted in a prober. The PCIA comprises a motherboard parallel to the semiconductor wafer...

20050275419 - Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis: A micro-spray cooling system beneficial for use in testers of electrically stimulated integrated circuit chips is disclosed. The system includes micro-spray heads disposed about a probe head. The spray heads and probe head are disposed in a sealed manner inside a spray chamber that, during operation, is urged in a...

20050275420 - Method and apparatus for managing aligning and coupling of a land grid array interposer for a field replacement unit: An apparatus adapted for use in a field replacement unit that is to be coupled to an electronic module. Included in the apparatus are a cover assembly; a biasing assembly disposed within the cover assembly; and, an aligning and coupling mechanism retained in the cover assembly in juxtaposed relation with...

20050275422 - Integrated circuit device with compliant bumps and testing method for testing the integrated circuit device: A testing method for testing an integrated circuit device includes the steps of forming compliant bumps on bonding pads on a substrate of the device such that each of the compliant bumps has a polymeric body formed on a corresponding one of the bonding pads and a metal layer formed...

20050275423 - System and method for checking a layout of circuit traces on a pcb: A system for checking a layout of circuit traces on a printed circuit board (PCB) includes a computer (1) and a database (2). The database stores information generated and used by the system. The computer includes: a checking area creating module (101) for creating checking areas; a layout determining module...

20050275421 - System and method for the probing of a wafer: According to one embodiment of the invention, a method for resuming the probing of a wafer includes identifying a data set associated with a wafer. The data set identifies at least one unprobed die supported on the surface of the wafer. The method also includes determining that the data set...

20050270012 - Bi-directional current sensing by monitoring vs voltage in a half or full bridge circuit: An apparatus and method for determining the output current in a bridge-connected switched transistor output circuit including high-side and low-side transistor switches, typically MOSFETS. The voltage at a common node between the high and low side switches is sensed, and offset in a first circuit by a fixed amount so...

20050270013 - Mems based current sensor using magnetic-to-mechanical conversion and reference components: A micro-electromechanical system (MEMS) current sensor is described as including a first conductor, a magnetic field shaping component for shaping a magnetic field produced by a current in the first conductor, and a MEMS-based magnetic field sensing component including a magneto-MEMS component for sensing the shaped magnetic field and, in...

20050270014 - Micro-electromechanical system (mems) based current & magnetic field sensor having capacitive sense components: A micro-electromechanical system (MEMS) based current & magnetic field sensor includes a MEMS-based magnetic field sensing component having a capacitive magneto-MEMS component, a compensator and an output component for sensing magnetic fields and for providing, in response thereto, an indication of the current present in a respective conductor to be...

20050270015 - Method and apparatus for electronic meter testing: An electronic energy meter senses input voltage and current signals and processes the input voltage and current signals to generate measurements of multiple types of power. The meter comprises a processing system for selecting one of the multiple types of power and defining the same as the selected type of...

20050270016 - Electronic residential electricity meter: An electronic residential electricity meter includes a base assembly having a main body and the base assembly includes a current transformer mounted to the main body. A first conductor is mounted through a window of the current transformer. The first conductor and the current transformer are configured to measure a...

20050270017 - System and method for automatically comparing test points of a pcb: A system for automatically comparing test points of a PCB includes an application server (1) and a database (6). The application server includes: a PCB file selecting module (10) for selecting a target file and a source file from the database; a test point data extracting module (12) for extracting...

20050270018 - Magnetic detector: The invention provides a magnetic detector that exerts no influence on detection accuracy of a magnetic movable body, being a detected body, even if relative positions of magnetic resistance elements and a magnet are out of alignment due to variation occurred in manufacturing process. A magnetic detector includes: a magnetic...

20050270019 - Rotation information detecting apparatus: There is provided a rotation information detecting apparatus which suppresses noise superimposed on an output line and can prevent detection of erroneous rotation information. A periodic changing magnetic field is applied to a detection element according to the rotation of a rotation object, and rotation information is detected. A signal...

20050270020 - Integrated three-dimensional magnetic sensing device and method to fabricate an integrated three-dimensional magnetic sensing device: An integrated three-dimensional magnetic or any field sensing device and a method to fabricate an integrated three-dimensional magnetic sensing device is presented. An integrated three-dimensional magnetic sensing device comprises an apparatus that defines at least a first surface area and at least one sloped surface which is sloped with respect...

20050270021 - Hall switch arrangement: The Hall switch arrangement comprises a plurality of Hall switch elements connected in series with a first Hall switch element, wherein the first Hall switch element is formed to provide a first output signal, which has information about a switching state of the first Hall switch element and with a...

20050270022 - Magnetoresistive layer system and sensor element having this layer system: A magnetoresistive layer system, in an environment of a magnetoresistive layer stack that works particularly on the basis of the GMR effect or the AMR effect, a layer array being provided which generates a magnetic field which acts upon the magnetoresistive layer stack, and the layer array having at least...

20050270023 - Method and apparatus for using pulsed field gradient nmr measurements to determine fluid properties in a fluid sampling well logging tool: A method for determining a formation fluid property includes acquiring a suite of nuclear magnetic resonance (NMR) measurements of a fluid sample using a pulse sequence that includes pulsed field gradient pulses for encoding diffusion information, wherein each NMR measurement in the suite is acquired with a different value in...

20050270025 - Magnetic resonance imaging apparatus and magnetic resonance imaging data processing method: A magnetic resonance imaging apparatus 20 includes a phase difference calculation unit 44 configured to perform a one-dimensional Fourier transform on complex data not phase-encoded extracted from complex data of a nuclear resonant signal collected by dynamic scanning, and determining a phase difference in time of data obtained by performing...

20050270026 - Method for determining the content of at least one component of a sample by means of a nuclear magnetic resonance pulse spectrometer: A method is described for determination of the content of at least one component of a sample by means of a nuclear magnetic resonance pulse spectrometer, with the magnetization of the sample being influenced by a sequence of radio-frequency pulses such that the signal amplitudes to be observed can be...

20050270024 - Method for parallel image reconstruction using automatic regularization: The invention relates to a method of parallel imaging reconstruction in parallel magnetic resonance imaging reconstruction. Magnetic resonance data is acquired in parallel by an array of separate RF receiver coils. A reconstruction method based on Tikhonov regularization is presented to reduce the SNR loss due to geometric correlations in...

20050270027 - Magnetic resonance imaging system and method: An method for producing magnetic resonance imaging data is disclosed. An example embodiment of the method includes acquiring a series of M images at a plurality of echo times using a multi-echo pulse sequence. A compensation gradient is added as a blipped gradient in the slice direction before the first...

20050270028 - Decoupling high temperature superconductor sensor arrays in nuclear quadrupole resonance detection systems: The decoupling of an array of two or more closely spaced high temperature superconductor sensors can be accomplished by introducing a capacitive decoupling circuit....

20050270030 - Magnetic resonance imaging apparatus and method of judging presence or absence of resonance in magnetic resonance imaging apparatus: A magnetic resonance imaging apparatus comprises a gradient magnetic unit that generates a gradient magnetic field, an obtention unit that obtains an oscillation characteristic of an magnetic resonance imaging apparatus according to a change of the gradient magnetic field caused by imaging plural slices and a judgment unit that judges...

20050270029 - Pressure activated driver for magnetic resonance elastography: A driver for use in applying an oscillating stress to a subject undergoing a magnetic resonance elastography (MRE) examination includes a passive actuator located in the bore of the magnet and in contact with the subject. A remotely located acoustic driver produces acoustic energy in response to an applied current...

20050270031 - Antenna amplifier, in particular for a magnetic resonance antenna: An antenna amplifier, in particular for a magnetic resonance antenna, has a sheath wave barrier integrated into the signal path of the antenna amplifier in the form of a component designed exclusively for transfer of a differential signal....

20050270032 - Malleable capacitive sensing device: A capacitive sensing device is provided including a flexible base sheet and a plurality of capacitive sensors arranged on an exterior surface of the flexible base sheet. Each capacitive sensor includes a top conductor layer, a middle dielectric layer, and a bottom conductive layer, the top conductor layer and bottom...

20050270033 - Method and apparatus for automatic determination of lead-acid battery specific gravity: In accordance with various embodiments, there is a method for determining the specific gravity of a battery. Various embodiments include the steps of applying an increasing current ramp to a battery and measuring a response voltage of the battery when the increasing current ramp is applied to the battery. When...

20050270034 - Short circuit detecting circuit and abnormality monitoring signal generating circuit: In order to drive an L load, FETs are disposed so as to be mirror-paired with FETs disposed at the power source side and the ground side respectively, and currents corresponding to mirrored currents of first and second currents flowing in FETs are made to flow in current mirror circuits,...

20050270035 - Short detection circuit and short detection method: A circuit and method for judging short-circuit defect with time passing in the case of a high voltage system. A detection-dedicated wiring for detecting a short-circuit defect is provided between a first high voltage system wiring and a second high voltage wiring. A power supply and a ammeter is connected...

20050270036 - Method and apparatus for monitoring integrity of wires or electrical cables: An apparatus for monitoring the integrity of a wire is provided, which includes a TDR instrument for generating a pulse waveform for transmission through the wire. The apparatus also includes a function generator for generating an electrical or non-electrical forcing waveform for transmission through the wire. The pulse waveform is...

20050270037 - Method and system for non-destructive evaluation of conducting structures: Method and system for non-destructive evaluation for a conducting structure by measuring the electrical impulse response thereof including applying a PRBS test input signal to the conducting structure, detecting an output signal from the conducting structure and processing the data to assess the condition of the conducting structure via changes...

20050270038 - Test apparatus and control method: A testing device that tests an electronic device includes: a pattern generator operable to generate a test pattern to be supplied to the electronic device and an expectation signal sequence to be output from the electronic device when the test pattern is supplied to the electronic device; a comparison unit...

20050270039 - One layer capacitive sensing apparatus having varying width sensing elements: One embodiment in accordance with the invention includes a two-dimensional capacitive sensor apparatus. The two-dimensional capacitive sensor can include a first sensing element having varying width, a second sensing element having varying width, and a third sensing element having varying width. Additionally, the first sensing element, second sensing element, and...

20050270040 - Redundant compact encoders: A position transducer for a rotary member such as the rotor of a motor has a rotating encoder disc and flat, disc-shaped elements interacting with the encoder disc to produce position dependent signals. The encoder disc has at least one active element such as metal surfaces configured so that signals...

20050270041 - Non-contact capacitive sensor and cable with dual layer active shield: A non-contact capacitive sensor probe including a metallic sensor having a first surface opposite a dielectric medium to be sensed; a plurality of active metallic shields adjacent to the metallic sensor, each of the active metallic shields having a pattern of grooves inhibiting eddy currents on a surface of the...

20050270042 - System and method for measuring electrical characteristics of a capacitor: Disclosed are a system and method for measuring electrical characteristics of a capacitor. A measurement assembly can include a constant current assembly for selectively charging and discharging the capacitor and a counter incremented during a measurement period of a selected one of the charging and discharging. A display is used...

20050270043 - Digital potentiometer with resistor binary weighting decoding: A digital potentiometer includes a string of impedance units in series. The string includes identical first and second sets of impedance units whose individual impedance values increment by a power of two. One of a plurality of switches is coupled in parallel with each respective impedance unit. The switches that...

20050270044 - Contact probe for a testing head: A contact probe for a testing head effective to test a plurality of semiconductor-integrated electronic devices comprises a rod-like probe body having a cross section of prefixed contour and provided in correspondence with at least one end with an eccentric contact tip. The contact tip is positioned within the contour...

20050270045 - Electrical contact: In a test system, a silicon interconnect is provided that can accommodate a packaged part, such as a Land Grid Array (LGA) package. The interconnect can be made by etching a silicon substrate to form projections therefrom; forming an insulation or passivation layer through deposition or growth; depositing a seed...

20050270046 - Plasma probe: A plasma probe includes a substrate having substantially the same properties as those of a substrate to be processed, a bottom electrode layer located over the substrate and electrically isolated therefrom, a dielectric layer positioned over the bottom electrode layer including apertures through which one or more electrodes of the...

20050270047 - Plasma probe systems: A plasma probe system includes a plasma probe, at least one meter, and a diagnostic apparatus. The probe may include a substrate having substantially the same properties as those of a substrate to be processed, a bottom electrode layer located over the substrate and electrically isolated therefrom, a dielectric layer...

20050270048 - Spring-loaded, removable test fixture for circuit board testers: A circuit board tester that uses an axial translation to bring a unit under test (UUT) into physical and electric contact with a series of electrical probes. The element on the tester that comes into contact with the UUT, on the side opposite the probes, is both spring-loaded and removable....

20050270051 - Integrated circuit (ic) test assembly including phase change material for stabilizing temperature during stress testing of integrated circuits and method thereof: A testing apparatus and method for testing integrated circuits is disclosed wherein a device under test is continuously maintained at a desired set point temperature by an included thermal body. The thermal body has an enclosed phase change material which provides latent heat to the device under test such that...

20050270049 - Semiconductor device: A semiconductor device 100 comprises a temperature sensor portion 110 for detecting a temperature to output a heat generation instruction when the temperature is equal to or lower than T degree and to output a heat generation stop instruction when the temperature is equal to or higher than T′ degree,...

20050270050 - Semiconductor facility: A semiconductor facility. The semiconductor facility comprises a printed circuit board (PCB), a heat source, and an adjusting device. The PCB comprises a first surface and a second surface. The heat source provides heat for a first fluid around the PCB to steadily heat up the PCB. The temperature of...

20050270053 - Method and system for monitoring module power information in a communication device: Methods and systems for monitoring operating status of a device are provided. Aspects of the method may include receiving within a chip, a signal indicative of a power information of an on-chip device. An output signal indicative of the power information may be generated from within the chip, while the...

20050270052 - Method and system for monitoring module power status in a communication device: Methods and systems for monitoring operating status of a device are provided. Aspects of the method may include receiving within a chip, a signal indicative of a power status of an on-chip device. An output signal indicative of the power status may be generated from within the chip, while the...

20050270054 - Method and apparatus for iddq measuring: An IDDQ test is applied to an electronic circuit (16). A power supply unit supplies power supply current to the electronic circuit. The output impedance of the power supply unit is adjusted to a value selected for the electronic circuit, the value having been selected so that a resonance circuit...

20050270058 - System for testing integrated circuit devices: A voltage generating circuit for generating internal voltage for a packaged integrated circuit memory device, is controllable to provide incremental adjustments in the voltage for testing of the memory device. The voltage generating circuit permits internally generated voltages of the memory device, such as the substrate voltage Vbb, the DVC2...

20050270055 - Systems and methods for testing microelectronic imagers and microfeature devices: Systems and methods for testing microelectronic imagers and microfeature devices are disclosed herein. In one embodiment, a method includes providing a microfeature workpiece including a substrate having a front side, a backside, and a plurality of microelectronic dies. The individual dies include an integrated circuit and a plurality of contact...

20050270057 - Test arrangement including anisotropic conductive film for testing power module: A testing apparatus and method for testing a semiconductor device, and more particularly a test arrangement for measuring a guaranteed power loss of a semiconductor module, not requiring the module to have on-board decoupling capacitors for the power loss test. The conventional pogo-pin array and test socket are replaced by...

20050270056 - Thermal optical chuck: An accessible optical path to a lower surface of a heatable device under test is provided by a thermal optical chuck comprising a transparent resistor deposited on transparent plate arranged to supporting the device in a probe station....

20050270059 - Display apparatus and inspection method: The test circuit of a display apparatus according to the invention detect short-circuiting in each of the data lines Dn by inputting the electric potential Vd of the data line Dn connected to the corresponding one of high resistance first short-circuiting detecting resistors Trln connecting a predetermined electric potential and...

20050264274 - Electrical conductor locating device: An electrical conductor locating device comprises a pulse generator and a detector. The pulse generator includes a transformer with outputs for connecting to two positions along the electrical conductor to define a closed loop. The current in the closed loop produces an electromagnetic field around the conductor. The detector is...

20050264275 - Doppler radar sensing system for monitoring turbine generator components: The invention provides a sensing system and a method for monitoring the damage to turbine components in a turbine generator. The sensing system comprises an electromagnetic wave generator that generates an electromagnetic wave; a transmitter that transmits the generated electromagnetic wave from a first turbine component; a second turbine component...

20050264276 - Attachable/detachable variable spacing probing tip system: An attachable/detachable variable spacing probing tip system has a housing that receives pivoting probing arms. Each probing arm has a support member and a probing arm portion of a flexible substrate having a conductive trace thereon. One end of each conductive trace is coupled to a probing contact and the...

20050264278 - Device for releasable connecting an interface with a test equipment: Disclosed is a device for releasable connecting an interface with a load board for providing a mechanically pressing of the components against each other. The device comprises a toroidal lock, which is operated by at least one lever to transmit the lock from a releasing position to a locking position....

20050264277 - Method and apparatus to probe bus signals using repeaters: An assembly including a processor socket having a cut region. The assemble further including a probe board having a repeater positioned in alignment with the cut region. The repeater is to receive at least a first signal. The repeater is to tap the first signal. The tapped first signal is...

20050264279 - Wafer test equipment and method of aligning test equipment: Wafer test equipment comprises a probe station having a wafer chuck for supporting a wafer, a test head disposed on the probe station, a manipulator for moving the test head to and from an upper surface of the probe station, and an alignment monitoring member for monitoring an alignment of...

20050264280 - Magnetic field forming device and displacement sensor using same: In a displacement sensor (10), a shaft (24) of a movable member (14) comprises a tubular part (26) having an opening (26c) at one end. A rod-form permanent is inserted into the tubular part (26) through the opening (26c) . A spacer (32) is fitted over a narrow portion of...

20050264281 - Magnetic sensor: A magnetic sensor that prevents offset voltage from changing as time elapses. The magnetic sensor detects change in the direction of the magnetic field when the electric resistances of magnetic resistors change. The magnetic resistors of the magnetic sensor each include a heat treatment section formed by performing a pre-trimming...

20050264283 - High resolution hall effect position sensor with a high immunity against electromagnetic noise: The present invention concerns an absolute position sensor based on the use of Hall effect sensors applied to the control of electric motors and mechanical shafts...

20050264282 - Rotation angle detecting device: A rotation angle detecting device includes a magnet, a magnetic flux concentrator, a first magnetic sensor, and a second magnetic sensor. The magnet is provided in a rotary member and is substantially coaxially aligned with a rotational axis thereof. The magnet has a magnetic flux generation section and a magnetic...

20050264284 - Omnidirectional eddy current probe and inspection system: An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to...

20050264285 - Method of detecting, quantifying and correcting borehole contaminations from multi-frequency, multi-sensitive-volume nmr logging data: Spin echo signals measured with a multifrequency NMR logging tool are analyzed to determine if one or more of the regions of examination associated with each of the frequencies has signal contamination from borehole fluids. A variety of different methods can be used for analysis. Corrected spin echo signals can...

20050264286 - Method for acquiring magnetic resonance data from a large examination region: In a method for data acquisition from an examination region with a magnetic resonance apparatus, the examination region being larger than a maximum acquisition region of the magnetic resonance apparatus, a planning data set is generated and the examination region is established using the planning data set. The examination region...

20050264287 - Magnetic resonance imaging method using a partial parallel acquisition technique with non-cartesian occupation of k-space: In a method for magnetic resonance imaging using a partial parallel acquisition technique with a non-Cartesian occupation of k-space, a number of antennas disposed around an imaging volume for reception of magnetic resonance signals and the magnetic resonance signals in the imaging volume are spatially coded by magnetic gradient fields,...

20050264288 - Method for implementation of a magnetic resonance examination of a patient: In a method for implementation of a magnetic resonance examination of a patient with an imaging medical magnetic resonance apparatus with a movable patient bed, for of an examination volume of the patient that is larger than an acquisition volume of the magnetic resonance apparatus, anatomical patient information and second...

20050264289 - Methods and apparatus for scanning a band of frequencies using an array of high temperature superconductor sensors: The methods of the invention for scanning a band of frequencies using a nuclear quadrupole resonance detection system with an array of high temperature superconductor sensors to detect nuclear quadrupole resonance signals improve the nuclear quadrupole resonance detection system performance....

20050264291 - Multi-current elements for magnetic resonance radio frequency coils: A current unit having two or more current paths allows control of magnitude, phase, time, frequency and position of each of element in a radio frequency coil. For each current element, the current can be adjusted as to a phase angle, frequency and magnitude. Multiple current paths of a current...

20050264292 - Rf coil and magnetic resonance imaging apparatus: A magnetic resonance imaging apparatus acquires magnetic resonance signals by the PI method using an RF coil unit having basic coils serving as surface coils which are arrayed with at least two coils along a static magnetic field direction (z direction) and at least two coils along each of two...

20050264290 - Rf shield and mri system: An eddy current induced in an RF shield by an X-axis gradient coil, a Y-axis gradient coil, and a Z-axis gradient coil respectively is homogeneously released to an earth ground simultaneously with induction. An RF shield is connected to a magnet via capacitors at four points whose angles are different...

20050264293 - Downhole signal source: A signaling apparatus comprises a magnet and a shield moveable relative to the magnet. The shield is moveable relative to the magnet between a first position in which the magnet is relatively exposed and a second position in which the magnet is relatively shielded. The apparatus can include a synchronization...

20050264294 - Method and system for seafloor geological survey using vertical electric field measurement: A system for mapping electrical conductivity of the seafloor incorporates a plurality of data logging units, where each unit (100) is an assembly adapted for deployment at a location on the seafloor for measurement of horizontal electric and magnetic fields. Rigidly attached and extending vertically from the unit assembly is...

20050264295 - System for measuring earth formation resistivity through an electrically conductive wellbore casing: An instrument is disclosed for measuring resistivity of Earth formations from within a conductive pipe inside a wellbore drilled through the formations. The instrument includes a plurality of housings connected end to end and adapted to traverse the wellbore. At least one electrode is disposed on each housing. Each electrode...

20050264296 - Battery tester capable of identifying faulty battery post adapters: An electronic battery tester for testing a storage battery. The tester includes a first connector configured to electrically couple to a first terminal of the battery via a first battery post adapter and a second connector configured to electrically couple to a second terminal of the battery via a second...

20050264297 - Characterizing analog and digital telephone circuits and other types of wiring systems using frequency domain reflectometry (fdr): The structural and termination characteristics of a telephone or other wiring circuit can be determined by generating a continuous stream of low-energy electrical signals, injecting these into the circuit under test, and analyzing the energy reflected at impedance changes in the frequency domain. Standing waves occurring in the circuit can...

20050264298 - Partial discharge detection test link, partial discharge detection system and methods for detecting partial discharge on a power cable: A partial discharge detection test link and system is disclosed to detect partial discharge of a power cable accessory. The power cable accessory includes a first accessory component and a second accessory component connected to each other. The partial discharge detection test link is a permanent or temporary substitute for...

20050264299 - Method and apparatus for measuring insertion loss of a conductor: A method and apparatus for determining the insertion loss of a conductor. The method includes introducing a test signal into a first signal transmission path and a second signal transmission path. The conductor is included in the first path but at least partially excluded from the second path. The method...

20050264300 - Impedance calibration circuit and method thereof: The present invention discloses an impedance calibration circuit and method for calibrating an equivalent impedance of a semiconductor circuit element. The disclosed impedance calibration circuit includes a reference circuit, a second circuit element, and a controlling circuit. The reference circuit receives a test signal and outputs a first signal. The...

20050264301 - Scattering parameter travelling-wave magnitude calibration system and method: A calibration system and method determines magnitudes of traveling-waves at a non-coaxial plane of a scattering (S) parameter measurement device that includes an adapter link between the non-coaxial plane and a coaxial plane. A calibration is conducted at an interface between the adapter link and the coaxial plane to derive...

20050264302 - Device for determining the composition of a fluid mixture: A method and apparatus are disclosed for determining the concentration of individual components within a fluid mixture by determining the permittivity of the individual components. The method and apparatus use a reference sensor and at least one measurement sensor positioned inside the same sensor device that is immersed in the...

20050264303 - Radiation monitoring of body part sizing and use of such sizing for person monitoring: A person monitoring system that may determine personal characteristics and compare them to other characteristics without necessarily recognizing a specific individual corresponding to those characteristics. An embodiment may use a first array of focused microwave transmitting antennas driven by a microwave transmitting electronics, producing microwave signals for the first array....

20050264304 - Electrical capacitance proximity sensor: An electrical capacitance proximity sensor with high detector sensitivity has an insulating substrate, a detector electrode and an earth electrode formed in a fixed pattern on one face of the insulating substrate, and a detector circuit which detects an object approaching the detector electrode and the earth electrode by detecting...

20050264305 - Physical quantity sensing device with bridge circuit and zero point adjusting method: A physical quantity sensing device includes a bridge circuit that has first and second input points, to which an AC voltage is applied, and first and second output points connected to a differential amplifier. The bridge circuit includes a first bridge arm for electrically connecting the first input point to...

20050264306 - Apparatus for detecting defect in circuit pattern and defect detecting system having the same: Provided is an apparatus for detecting a defect of a circuit pattern which includes a resonator, a first power supply unit connected to one end of the resonator to apply power to the resonator, a probe connected to the other end of the resonator to contact one end of the...

20050264307 - Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method: Disclosed herein are an anisotropically conductive connector that conductivity of all conductive parts for connection is good, and insulating property between adjacent conductive parts for connection is surely achieved even when the pitch of electrodes as objects of connection is small, and good conductivity is retained over a long period...

20050264309 - Test apparatus having auto probe and test method using the same: A test apparatus having an auto probe and a test method using the same reduces difficulties in defect detection which are caused by a manual test by operators. The test apparatus includes an auto probe unit that contacts a panel of a display device. A test pattern is input to...

20050264308 - Test board locking device including stiffener: A test board locking device includes a stiffener having a plurality of spaced-apart fix bars. A test board has first fix holes each corresponding to the fix bars adapted for coupling to the stiffener. A lid has second fix holes each corresponding to the fix bars, the lid adapted for...

20050264310 - Method for evaluating at least one electrical conducting structure of an electronic component: An apparatus and method for evaluating the integrity of each contact pin of an electronic component having multiple contact pins. In one embodiment, the apparatus includes a test device and a measuring instrument. The test device comprises a component fixture configured to hold an electronic component under test and opposing...

20050264311 - Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment: A clamping assembly is described for connecting a first plurality of contacts to a second plurality of contacts on a circuit board. The circuit board has a first outer face at an end and on one side of the circuit board, and a second outer face at the end and...

20050264312 - Test device for electrical testing of a unit under test, as well as a method for production of a test drive: The invention relates to a test device for electrical testing of a unit under test, in particular for the testing of wafers, having a contact head which can be associated with the unit under test and is provided with contact elements which are in the form of pins and form...

20050264313 - Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe: There is provided a contact probe that is smaller than 50 μm in a pitch between a signal electrode and a ground electrode and can correctly conduct a high-speed high-frequency measurement, a measuring pad used for the contact probe, and a method of manufacturing the contact probe. The contact probe...

20050264314 - Built-in self test technique for programmable impedance drivers for rapidchip and asic drivers: A circuit which includes the addition of test points and analog circuitry required to perform a four-point measurement technique. Test points are fed to an analog multiplexer which is under control of test logic added to the design to facilitate the testing. The output of the analog multiplexer is fed...

20050264315 - Test device for electrical testing of a unit under test: A test device for electrical testing of a unit under test, the device having a contact head which can be associated with the unit under test and is provided with contact elements pins in a contact pin arrangement, having an electrical connecting apparatus, including contact surfaces which make touching contact...