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David R. Resnick patents

Recent bibliographic sampling of David R. Resnick patents listed/published in the public domain by the USPTO (USPTO Patent Application #,Title):



11/20/14 - 20140344644 - Error correction in multiple semiconductor memory units
Various embodiments include apparatus and methods to store data in a first semiconductor memory unit and to store error correction information in a second semiconductor memory unit to recover the data. The error correction information has a value equal to at least the value of the data store in the...
Inventors: David R. Resnick

08/14/14 - 20140229762 - Failure recovery memory devices and methods
Memory devices and methods are described that include serially chained memory devices. In one or more of the configurations shown, a serial chain of memory devices includes a number of memory devices, and an error recovery device at an end of the chain. In one configuration shown, the serial chain...
Inventors: David R. Resnick (Micron Technology, Inc.)

06/26/14 - 20140181574 - Error correction and recovery in chained memory architectures
Electronic apparatus, systems, and methods to construct and operate the electronic apparatus and/or systems include a memory unit configured to receive data flow from two directions. The memory unit can be configured serially in a chain with other memory units. The chain can include an error check and correcting unit...
Inventors: David R. Resnick (Micron Technology, Inc.)

06/12/14 - 20140164667 - Flexible and expandable memory architectures
Memory system architectures, memory modules, processing systems and methods are disclosed. In various embodiments, a memory system architecture includes a source configured to communicate signals to a memory device. At least one memory cube may coupled to the source by a communications link having more than one communications path. The...
Inventors: David R. Resnick (Micron Technology, Inc.)

02/20/14 - 20140053045 - Extended single-bit error correction and multiple-bit error detection
Some embodiments include apparatus and methods to prevent at least one of misidentifying and ignoring multiple-bit errors if the multiple-bit errors include a plurality of erroneous data bits that belong to only one specific group of a plurality of groups of data bits and if none of the other groups...
Inventors: David R. Resnick (Micron Technology, Inc.)

01/30/14 - 20140032701 - Memory network methods, apparatus, and systems
Apparatus and systems may include a first node group include a first network node coupled to a memory, the first network node including a first port, a second port, a processor port, and a hop port. Network node group may include a second network node coupled to a memory, the...
Inventors: David R. Resnick (Micron Technology, Inc.)

07/25/13 - 20130188430 - Systems and methods for voltage sensing and reporting
Semiconductor devices comprising at least one voltage sensor for sensing an operating voltage associated with an operational circuit of the semiconductor device. The at least one voltage sensor is configured to generate a signal indicative of a state of the operating voltage. Methods of monitoring a voltage in a semiconductor...
Inventors: David R. Resnick (Micron Technology, Inc.)

06/06/13 - 20130145207 - Error correction and recovery in chained memory architectures
Electronic apparatus, systems, and methods to construct and operate the electronic apparatus and/or systems include a memory unit configured to receive data flow from two directions. The memory unit can be configured serially in a chain with other memory units. The chain can include an error check and correcting unit...
Inventors: David R. Resnick (Micron Technology, Inc.)

02/21/13 - 20130047054 - Extended single-bit error correction and multiple-bit error detection
Some embodiments include apparatus and methods to prevent at least one of misidentifying and ignoring multiple-bit errors if the multiple-bit errors include a plurality of erroneous data bits that belong to only one specific group of a plurality of groups of data bits and if none of the other groups...
Inventors: David R. Resnick

07/12/12 - 20120176847 - Methods and apparatus for voltage sensing and reporting
Semiconductor devices comprising at least one voltage sensor for sensing an operating voltage associated with an operational circuit of the semiconductor device. The at least one voltage sensor is configured to generate a signal indicative of a state of the operating voltage. Methods of monitoring a voltage in a semiconductor...
Inventors: David R. Resnick (Micron Technology, Inc.)

02/16/12 - 20120042201 - Failure recovery memory devices and methods
Memory devices and methods are described that include serially chained memory devices. In one or more of the configurations shown, a serial chain of memory devices includes a number of memory devices, and an error recovery device at an end of the chain. In one configuration shown, the serial chain...
Inventors: David R. Resnick

01/12/12 - 20120011409 - Devices, methods, and apparatuses for detection, sensing, and reporting functionality for semiconductor memory
Methods, apparatuses and systems are disclosed involving a memory device. In one embodiment, a memory device is disclosed that includes a command error module of the memory device operably coupled to at least one of a command signal and an address signal and configured to detect and report a parity...
Inventors: David R. Resnick (Micron Technology, Inc.)

08/18/11 - 20110202813 - Error correction and recovery in chained memory architectures
Electronic apparatus, systems, and methods to construct and operate the electronic apparatus and/or systems include a memory unit configured to receive data flow from two directions. The memory unit can be configured serially in a chain with other memory units. The chain can include an error check and correcting unit...
Inventors: David R. Resnick

04/28/11 - 20110099341 - System, apparatus, and method for modifying the order of memory accesses
Systems and methods for controlling memory access operations are disclosed. The system may include one or more requestors performing requests to memory devices. Within a memory controller, a request queue receives requests from a requestor, a bank decoder determines a destination bank, and the request is placed in an appropriate...
Inventors: David R. Resnick (Micron Technology, Inc.)

12/09/10 - 20100313067 - Failure recovery memory devices and methods
Memory devices and methods are described that include serially chained memory devices. In one or more of the configurations shown, a serial chain of memory devices includes a number of memory devices, and an error recovery device at an end of the chain. In one configuration shown, the serial chain...
Inventors: David R Resnick (Micron Technology, Inc.)

09/02/10 - 20100223512 - System, apparatus, and method for memory built in self testing using microcode sequencers
Apparatuses, systems, and methods are disclosed for performing Built-In Self Tests (BIST) on memories. One such BIST includes loading microcode instructions into a main microcode sequencer and loading subroutine instructions into a subroutine microcode sequencer on the memory. The microcode instructions generate subroutine calls to the subroutine microcode sequencer. The...
Inventors: Inventors: David R. ResnickDavid R. Resnick, David R. Resnick (Micron Technology, Inc.)

08/19/10 - 20100211721 - Memory network methods, apparatus, and systems
Apparatus and systems may include a first node group include a first network node coupled to a memory, the first network node including a first port, a second port, a processor port, and a hop port. Network node group may include a second network node coupled to a memory, the...
Inventors: David R. Resnick (Micron Technology, Inc)

04/29/10 - 20100107036 - Error correction in multiple semiconductor memory units
Various embodiments include apparatus and methods to store data in a first semiconductor memory unit and to store error correction information in a second semiconductor memory unit to recover the data. The error correction information has a value equal to at least the value of the data store in the...
Inventors: David R. Resnick (Micron Technology, Inc.)

02/18/10 - 20100039097 - Methods and apparatus for voltage sensing and reporting
Semiconductor devices comprising at least one voltage sensor for sensing an operating voltage associated with an operational circuit of the semiconductor device. The at least one voltage sensor is configured to generate a signal indicative of a state of the operating voltage. Methods of monitoring a voltage in a semiconductor...
Inventors: David R. Resnick (Micron Technology, Inc.)

02/11/10 - 20100036994 - Flexible and expandable memory architectures
Memory system architectures, memory modules, processing systems and methods are disclosed. In various embodiments, a memory system architecture includes a source configured to communicate signals to a memory device. At least one memory cube may coupled to the source by a communications link having more than one communications path. The...
Inventors: David R. Resnick (Micron Technology, Inc.)

06/11/09 - 20090150624 - System, apparatus, and method for modifying the order of memory accesseses
Systems and methods for controlling memory access operation are disclosed. The system may include one or more requestors performing requests to memory devices. Within a memory controller, a request queue receives requests from a requestor, a bank decoder determines a destination bank, and the request is placed in an appropriate...
Inventors: David R. Resnick (Micron Technology, Inc.)

02/26/09 - 20090055698 - System, apparatus, and method for memory built-in self testing using microcode sequencers
Apparatuses, systems, and methods are disclosed for performing Built-In Self Tests (BIST) on memories. One such BIST includes loading microcode instructions into a main microcode sequencer and loading subroutine instructions into a subroutine microcode sequencer on the memory. The microcode instructions generate subroutine calls to the subroutine microcode sequencer. The...
Inventors: David R. Resnick (Micron Technology, Inc.)

02/05/09 - 20090037778 - Devices, methods, and apparatuses for detection, sensing, and reporting functionality for semiconductor memory
Methods, apparatuses and systems are disclosed for a memory device. In one embodiment, a memory device is disclosed that may include a command error module operably coupled to a mode register, a command input, and an address input. The command error module may be configured to detect an invalid command...
Inventors: David R. Resnick (Micron Technology, Inc.)

02/05/09 - 20090034354 - Method, system, and apparatus for voltage sensing and reporting
A method, apparatus and system are disclosed for sensing and reporting voltage levels in a semiconductor device. One such voltage sensor and reporting device is configured to sense and compare a reference voltage and an operating voltage. In one or more embodiments we voltage sensor is also configured to generate...
Inventors: David R. Resnick (Micron Technology, Inc.)

Micron Technology, Inc., Micron Technology, Inc

Archived*
(*May have duplicates - we are upgrading our archive.)

20120176847 - Methods and apparatus for voltage sensing and reporting


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The bibliographic references displayed about David R. Resnick's patents are for a recent sample of David R. Resnick's publicly published patent applications. The inventor/author may have additional bibliographic citations listed at the USPTO.gov. FreshPatents.com is not associated or affiliated in any way with the author/inventor or the United States Patent/Trademark Office but is providing this non-comprehensive sample listing for educational and research purposes using public bibliographic data published and disseminated from the United States Patent/Trademark Office public datafeed. This information is also available for free on the USPTO.gov website. If David R. Resnick filed recent patent applications under another name, spelling or location then those applications could be listed on an alternate page. If no bibliographic references are listed here, it is possible there are no recent filings or there is a technical issue with the listing--in that case, we recommend doing a search on the USPTO.gov website.

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