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Browse: A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | 1 | 3 | Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patentsThe following is a sampling of recent Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patent applications (USPTO Patent Application #, Patent Title) sorted by month.October 2008 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20080259326 - Die column registration September 2008 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20080231845 - High resolution wafer inspection system 20080234962 - Method and system for providing a compensated auger spectrum 20080212081 - High speed laser scanning inspection system July 2008 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20080183323 - System, method and computer program product for evaluating an actual structural element of an eletrical circuit 20080166038 - Method and system for evaluating an evaluated pattern of a mask June 2008 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20080152212 - Simulation of aerial images 20080152234 - Simulation of aerial images 20080142689 - High throughput multi beam detection system and method 20080144017 - High throughput multi beam detection system and method May 2008 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20080116362 - One-dimensional phase contrast microscopy April 2008 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20080092088 - Process monitoring system and method March 2008 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20080074659 - Method and system for defect detection 20080075355 - Method and system for defect detection January 2008 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20080024798 - System and method for measuring thin film thickness variations and for compensating for the variations 20080011964 - Method and system for focusing a charged particle beam December 2007 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20070280527 - Method for defect detection using computer aided design data November 2007 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20070267632 - Apparatus and method for test structure inspection 20070257191 - Contact opening metrology October 2007 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20070228274 - High throughput multi beam detection system and method September 2007 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20070222978 - Multiple optical head inspection system and a method for imaging an article August 2007 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20070201180 - Electrostatic chuck and method of its manufacture 20070195315 - Method and system for detecting defects June 2007 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20070133077 - Optical spot grid array scanning system May 2007 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20070109546 - Scanning microscopy February 2007 - Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP patents 20070034773 - Inspection system with auto-focus 20070022831 - Integrated in situ scanning electronic microscope review station in semiconductor wafers and photomasks optical inspection system ### This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Applied Materials, Inc. C/o Sonnenschein Nath & Rosenthal LLP with additional patents listed. Browse our Agent directory for other possible listings. ### FreshPatents.com Support |