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Inspection apparatus and method for producing image for inspection

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Inspection apparatus and method for producing image for inspection


In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming...
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USPTO Applicaton #: #20140210988
Inventors: Kenji Nakahira, Atsushi Miyamoto, Naoki Hosoya, Minoru Yoshida



The Patent Description & Claims data below is from USPTO Patent Application 20140210988, Inspection apparatus and method for producing image for inspection.

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stats Patent Info
Application #
US 20140210988 A1
Publish Date
07/31/2014
Document #
14227630
File Date
03/27/2014
USPTO Class
348 82
Other USPTO Classes
International Class
/
Drawings
25


Your Message Here(14K)


Camera
Video Camera
Optic
Local Alignment
Optical
Inspect


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