newTOP 200 Companies
filing patents this week



    Free Services  

  • MONITOR KEYWORDS
  • Enter keywords & we'll notify you when a new patent matches your request (weekly update).

  • ORGANIZER
  • Save & organize patents so you can view them later.

  • ARCHIVE
  • View the last few months of your Keyword emails.

  • COMPANY DIRECTORY
  • Patents sorted by company.

Follow us on Twitter
twitter icon@FreshPatents

Browse patents:
Next →
← Previous

Method and apparatus for determining a measure of a thickness of a polishing pad of a polishing machine


Title: Method and apparatus for determining a measure of a thickness of a polishing pad of a polishing machine.
Abstract: An apparatus for determining a measure of a thickness of a polishing pad of a polishing machine includes a detector and a determiner. The detector is configured to detect a position of a carrier of an element to be polished in a pressing direction while the element is pressed by the carrier in the pressing direction against the polishing pad with a defined pressure. The detector is further configured to output a signal indicative of the position of the carrier. The determiner is configured to determine the measure of the thickness of the polishing pad based on the signal indicative of the position of the carrier. ... Browse recent Infineon Technologies Ag patents
USPTO Applicaton #: #20130017762
Inventors: Christian Thaldorf, Sven Hildebrandt



The Patent Description & Claims data below is from USPTO Patent Application 20130017762, Method and apparatus for determining a measure of a thickness of a polishing pad of a polishing machine.




← Previous       Next → Advertise on FreshPatents.com - Rates & Info


You can also Monitor Keywords and Search for tracking patents relating to this Method and apparatus for determining a measure of a thickness of a polishing pad of a polishing machine patent application.
###
monitor keywords

Browse recent Infineon Technologies Ag patents

Keyword Monitor How KEYWORD MONITOR works... a FREE service from FreshPatents
1. Sign up (takes 30 seconds). 2. Fill in the keywords to be monitored.
3. Each week you receive an email with patent applications related to your keywords.  
Start now! - Receive info on patent apps like Method and apparatus for determining a measure of a thickness of a polishing pad of a polishing machine or other areas of interest.
###


Previous Patent Application:
Method for detecting and/or preventing grind burn
Next Patent Application:
Wafer polishing method
Industry Class:
Abrading
Thank you for viewing the Method and apparatus for determining a measure of a thickness of a polishing pad of a polishing machine patent info.
- - -

Results in 0.03411 seconds


Other interesting Freshpatents.com categories:
Computers:  Graphics I/O Processors Dyn. Storage Static Storage Printers

###

Data source: patent applications published in the public domain by the United States Patent and Trademark Office (USPTO). Information published here is for research/educational purposes only. FreshPatents is not affiliated with the USPTO, assignee companies, inventors, law firms or other assignees. Patent applications, documents and images may contain trademarks of the respective companies/authors. FreshPatents is not responsible for the accuracy, validity or otherwise contents of these public document patent application filings. When possible a complete PDF is provided, however, in some cases the presented document/images is an abstract or sampling of the full patent application for display purposes. FreshPatents.com Terms/Support
-g2-0.2962

66.232.115.224
Next →
← Previous

stats Patent Info
Application #
US 20130017762 A1
Publish Date
01/17/2013
Document #
13184338
File Date
07/15/2011
USPTO Class
451/5
Other USPTO Classes
International Class
24B49/00
Drawings
9


Your Message Here(14K)




Follow us on Twitter
twitter icon@FreshPatents

Infineon Technologies Ag

Browse recent Infineon Technologies Ag patents

Abrading   Precision Device Or Process - Or With Condition Responsive Control   Computer Controlled  

Browse patents:
Next →
← Previous